A chip analog quantity gear value determination method, device and controller

Abstract

The application provides a chip analog quantity gear value determination method and device and a controller. In the application, an initial gear value is first obtained, then a gear value of a measured chip is set to the initial gear value, an analog quantity output value of the measured chip is obtained, in a case where the analog quantity output value is not located in a preset analog quantity interval, an output difference value between a center value of the preset analog quantity interval and the analog quantity output value is determined, in a case where a difference value between adjacent gear values is a fixed difference value, a gear difference value corresponding to the output difference value is determined, and an actual gear value of the measured chip is determined according to the initial gear value and the gear difference value. That is, in the application, the final actual gear value can be directly determined according to the initial gear value, the output difference value between the center value of the preset analog quantity interval and the analog quantity output value corresponding to the initial gear value, compared with a traversal mode, the number of adjustment times can be reduced, and the adjustment efficiency is improved.

Description

Technical Field

[0001] This invention relates to the field of wafer testing, and more specifically, to a method, apparatus, and controller for determining the level values ​​of analog signals for chips. Background Technology

[0002] During the manufacturing process of chips used to output analog signals, there may be manufacturing errors, causing the analog signals output by the chip to be outside the set analog signal range. In this case, it is necessary to adjust the actual range value of the analog signal output by the chip so that the analog signal output by the chip is within the set analog signal range.

[0003] When adjusting the actual range value of a chip, it is generally done by iterating through the range values ​​in order and determining whether the output analog quantity corresponding to each range value is within the set analog quantity range. The range value adjustment time is long and the adjustment efficiency is low. Summary of the Invention

[0004] In view of this, the present invention provides a method, apparatus and controller for determining the level value of analog signals of a chip, so as to solve the problem that the adjustment time of the level value is long and the adjustment efficiency is low when adjusting the actual level value of the chip.

[0005] To solve the above-mentioned technical problems, the present invention adopts the following technical solution:

[0006] A method for determining the gear value of an analog signal in a chip, applied to a controller, the method comprising:

[0007] Obtain the initial gear value; the initial gear value is the gear value that is used a number of times during wafer testing to meet a preset rule;

[0008] Set the gear value of the chip under test to the initial gear value, and obtain the analog output value of the chip under test;

[0009] If the analog output value is not within a preset analog range, determine the output difference between the center value of the preset analog range and the analog output value.

[0010] When the difference between adjacent gear values ​​is a fixed difference, the gear difference corresponding to the output difference is determined, and the actual gear value of the chip under test is determined based on the initial gear value and the gear difference.

[0011] Optionally, determining the gear difference corresponding to the output difference includes:

[0012] Calculate the ratio of the output difference to the fixed difference, and perform a preset processing operation on the ratio to obtain the gear difference.

[0013] Optionally, determining the actual gear value of the chip under test based on the initial gear value and the gear difference includes:

[0014] Determine the relationship between the analog output value and the preset analog range;

[0015] If the analog output value is less than the minimum value of the preset analog range, the sum of the initial gear value and the gear difference value shall be taken as the actual gear value of the chip under test.

[0016] If the analog output value is greater than the maximum value of the preset analog range, the difference between the initial gear value and the gear difference value is taken as the actual gear value of the chip under test.

[0017] Optionally, when the difference between adjacent gear values ​​is not a fixed difference, it also includes:

[0018] Obtain the difference between values ​​at different gear levels;

[0019] If the analog output value is less than the minimum value of the preset analog range, determine the range value where the sum of the analog output value and the difference falls within the preset analog range, and use this range value as the actual range value of the chip under test.

[0020] Optionally, if the analog output value is greater than the maximum value of the preset analog range, the method further includes:

[0021] The range value is determined to be within the preset analog range where the difference between the analog output value and the difference falls, and this range value is taken as the actual range value of the chip under test.

[0022] Optionally, if the analog output value is within a preset analog range, the method further includes:

[0023] The initial gear value is used to determine the actual gear value of the chip under test.

[0024] Optionally, setting the gear value of the chip under test to the initial gear value includes:

[0025] The initial gear value is written into the memory of the chip under test, so that the chip under test reads the initial gear value in the memory and adjusts the gear value to the initial gear value.

[0026] Optionally, after determining the actual gear value of the chip under test based on the initial gear value and the gear difference, the method further includes:

[0027] Set the gear value of the chip under test to the actual gear value, and obtain the new analog output value of the chip under test;

[0028] If the new analog output value is within the preset analog range, the system outputs a message indicating that the chip under test has completed adjustment.

[0029] A device for determining the range value of a chip analog signal, applied to a controller, the device comprising:

[0030] The gear value acquisition module is used to acquire the initial gear value; the initial gear value is the gear value that has been used a number of times during the wafer testing process, which meets the preset number of times rule;

[0031] The data acquisition module is used to set the gear value of the chip under test to the initial gear value and acquire the analog output value of the chip under test.

[0032] The difference determination module is used to determine the output difference between the center value of the preset analog quantity range and the analog quantity output value when the analog quantity output value is not within the preset analog quantity range.

[0033] The gear value determination module is used to determine the gear difference corresponding to the output difference when the difference between adjacent gear values ​​is a fixed difference, and to determine the actual gear value of the chip under test based on the initial gear value and the gear difference.

[0034] A controller includes: a memory and a processor;

[0035] The memory is used to store programs;

[0036] The processor calls the program and executes the above-mentioned method for determining the level value of the analog signal of the chip.

[0037] Compared with the prior art, the present invention has the following beneficial effects:

[0038] This invention provides a method, apparatus, and controller for determining the range value of a chip's analog signal. First, an initial range value is obtained. Then, the range value of the chip under test is set as the initial range value, and the analog output value of the chip under test is obtained. If the analog output value is not within a preset analog range, the output difference between the center value of the preset analog range and the analog output value is determined. If the difference between adjacent range values ​​is a fixed difference, the range difference corresponding to the output difference is determined. Finally, based on the initial range value and the range difference, the actual range value of the chip under test is determined. In other words, this invention can directly determine the final actual range value based on the initial range value, the center value of the preset analog range, and the output difference between the analog output value corresponding to the initial range value. Compared to a traversal method, this reduces the number of adjustments and improves adjustment efficiency. Attached Figure Description

[0039] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on the provided drawings without creative effort.

[0040] Figure 1 A flowchart illustrating a method for determining the level value of a chip analog signal according to an embodiment of the present invention;

[0041] Figure 2 This is a schematic diagram of a gear value scenario provided by an embodiment of the present invention;

[0042] Figure 3 A flowchart illustrating another method for determining the level value of a chip analog quantity provided in an embodiment of the present invention;

[0043] Figure 4 This is a schematic diagram illustrating another gear value provided in an embodiment of the present invention;

[0044] Figure 5 A flowchart illustrating another method for determining the level value of a chip analog quantity provided in an embodiment of the present invention;

[0045] Figure 6 This is a schematic diagram of a chip analog quantity level determination device provided in an embodiment of the present invention. Detailed Implementation

[0046] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0047] During the manufacturing process of chips used to output analog signals, there may be manufacturing errors, causing the analog signals output by the chip to be outside the set analog signal range. In this case, it is necessary to adjust the actual range value of the analog signal output by the chip so that the analog signal output by the chip is within the set analog signal range.

[0048] When adjusting the actual range value of a chip, the range values ​​are typically iterated sequentially, and it is determined whether the output analog quantity corresponding to each range value is within the set analog quantity range. This process is time-consuming and inefficient.

[0049] For example, in wafer testing, the analog signal traversal method involves writing analog signal levels sequentially into the chip's special function registers, arranged from largest to smallest or smallest to largest. By measuring the output value corresponding to each level, the level value within the target range is determined and recorded, thus completing the analog signal level traversal. For analog signals with a particularly large number of levels, this traversal can consume a very long testing time, reducing testing efficiency and increasing production costs.

[0050] For a 4-byte analog signal, the traditional method requires traversing 16 levels, and each level needs to be measured and output during the traversal. If multiple chips are mass-produced and tested in parallel, the chip that has reached the appropriate level still needs to wait for the chips that have not yet reached the appropriate level to complete their testing, making the entire testing cycle long and inefficient.

[0051] To address the aforementioned inefficiency issue, the inventors, through research, have developed a method, apparatus, and controller for determining the range value of a chip's analog signal. First, an initial range value is acquired. Then, the range value of the chip under test is set to the initial range value, and the analog output value of the chip under test is acquired. If the analog output value is not within a preset analog range, the output difference between the center value of the preset analog range and the analog output value is determined. If the difference between adjacent range values ​​is a fixed difference, the range difference corresponding to the output difference is determined. Finally, based on the initial range value and the range difference, the actual range value of the chip under test is determined. In other words, this invention can directly determine the final actual range value based on the initial range value, the center value of the preset analog range, and the output difference between the analog output value corresponding to the initial range value. Compared to a traversal method, this reduces the number of adjustments and improves adjustment efficiency.

[0052] Based on the above, this embodiment of the invention provides a method for determining the level value of a chip analog signal, applied to a controller. In this embodiment, the controller can be a controller on a test bench. (Refer to...) Figure 1 The method for determining the level value of analog signals in a chip can include:

[0053] S11. Obtain the initial gear value.

[0054] The initial gear value is the gear value that is used a number of times during wafer testing that meets a preset rule. The preset rule can be the maximum number of times the gear is used, meaning the gear value with the highest number of uses during wafer testing is used as the initial gear value.

[0055] In practical applications, the initial gear value can be set manually based on experience, such as by setting it to... Figure 2The left-hand image shows the 0100 gear setting. Then, with continuous testing and a certain amount of wafer test data, the operator can determine the gear setting value used most frequently based on this data, and use this value as the revised initial gear setting value. For example, the revised initial gear setting value could be... Figure 2 The 0011 gear position in the right-hand image.

[0056] S12. Set the gear value of the chip under test to the initial gear value, and obtain the analog output value of the chip under test.

[0057] Specifically, the initial gear value is written into the memory of the chip under test, so that the chip under test reads the initial gear value in the memory and adjusts the gear value to the initial gear value.

[0058] In this embodiment, the memory can be a special function memory (SFR data memory), which is a type of flip-flop in the chip. The value of the flip-flop directly affects the corresponding analog address. Modifying the value of the SFR data memory will change the value of the measured analog quantity, thereby allowing the analog output value of the chip under test to be obtained through a test bench.

[0059] S13. If the analog output value is not within the preset analog range, determine the output difference between the center value of the preset analog range and the analog output value.

[0060] In this embodiment, the preset analog quantity range can be 560-590mV. This preset analog quantity range is the range of analog quantity output by the chip under test in theory. If it is within the preset analog quantity range, it means that the initial gear value is the target gear value that the analog quantity needs to traverse. The initial gear value is used to determine the actual gear value of the chip under test, and the traversal is completed.

[0061] If it is not within the preset analog range, it means that the range value of the chip under test needs to be adjusted. At this time, it is necessary to determine the actual range value of the chip under test.

[0062] When determining the actual gear value of the chip under test, the initial gear value is adjusted based on the output difference between the center value of the preset analog quantity interval and the analog quantity output value to obtain the actual gear value. Therefore, the output difference between the center value of the preset analog quantity interval and the analog quantity output value is determined first. In this embodiment, the difference is an absolute difference.

[0063] Taking a preset analog quantity range of 560-590mV as an example, the center value of the preset analog quantity range is 575mV. If the analog quantity output value is 600mV, the output difference between the center value of the preset analog quantity range and the analog quantity output value is 600mV-575mV=25mV.

[0064] S14. When the difference between adjacent gear values ​​is a fixed difference, determine the gear difference corresponding to the output difference, and determine the actual gear value of the chip under test based on the initial gear value and the gear difference.

[0065] In this embodiment, the difference between adjacent gear values ​​can be fixed or variable, such as... Figure 2 As shown in the left-hand diagram, the values ​​at adjacent gear positions differ by 25mV. Figure 2 The design range values ​​in the left-hand diagram are the center values ​​of each analog quantity range.

[0066] When the difference between adjacent gear values ​​is a fixed difference, the gear difference corresponding to the output difference can be determined first. Specifically, the ratio of the output difference to the fixed difference is calculated, and the ratio is subjected to a preset processing operation to obtain the gear difference.

[0067] For example, if the output difference is 25mV and the fixed difference is also 25mV, then the ratio of the output difference to the fixed difference is 25mV / 25mv = 1.

[0068] After obtaining the ratio, you can perform preset processing operations on the ratio (rounding, or adding 0.5 to the ratio and then taking the integer value) to make the obtained ratio an integer, which is the gear difference.

[0069] Then, based on the initial gear value and the gear difference, the actual gear value of the chip under test is determined. For details, refer to... Figure 3 It can include:

[0070] S21. Determine the relationship between the analog output value and the preset analog range.

[0071] In practical applications, refer to Figure 2 In the diagram on the left, the output value corresponding to the gear value increases as the gear value increases. In other words, the larger the gear value, the larger the output value should be.

[0072] Therefore, when determining the actual gear value, the relationship between the analog output value and the preset analog range should be judged.

[0073] The size relationships include:

[0074] The analog output value is either less than the minimum value of the preset analog range or greater than the maximum value of the preset analog range.

[0075] S22. If the analog output value is less than the minimum value of the preset analog range, the sum of the initial gear value and the gear difference value shall be taken as the actual gear value of the chip under test.

[0076] If the analog output value is less than the minimum value of the preset analog range, the analog output value should be increased. In this case, the initial gear value should be increased, and the sum of the initial gear value and the gear difference value is taken as the actual gear value of the chip under test.

[0077] S23. If the analog output value is greater than the maximum value of the preset analog range, the difference between the initial gear value and the gear difference value shall be taken as the actual gear value of the chip under test.

[0078] If the analog output value is greater than the maximum value of the preset analog range, the magnitude of the analog output value should be reduced. In this case, the initial gear value should be reduced, and the difference between the initial gear value and the gear difference value is taken as the actual gear value of the chip under test.

[0079] After obtaining the actual gear value, it should be verified to ensure accuracy. At this point, the gear value of the chip under test is set to the actual gear value, and the new analog output value of the chip under test is obtained. If the new analog output value is within a preset analog range, a message indicating that the adjustment of the chip under test is complete is output. Subsequently, the same adjustment can be performed on other chips under test.

[0080] If the new analog output value of the chip under test is not within the preset analog range, the above steps should be followed to redetermine the new actual gear value and verify the new actual gear value until the analog output value corresponding to the new actual gear value is within the preset analog range.

[0081] This invention allows for the completion of wafer testing by traversing analog input bits and measurements in just 1-2 steps. Compared to the traditional bit-by-bit traversal method, this significantly improves traversal efficiency and greatly reduces testing time.

[0082] For example, in an experiment involving the simulation of a product with 16 different price levels, 256 chips were tested in parallel. Using the traditional method, this test took 3.86 seconds. After applying the method of this invention, the test time was reduced to 1.25 seconds. This represents a 67.6% reduction in test time, a very significant improvement.

[0083] In this embodiment, an initial gear value is first obtained. Then, the gear value of the chip under test is set as the initial gear value, and the analog output value of the chip under test is obtained. If the analog output value is not within a preset analog range, the output difference between the center value of the preset analog range and the analog output value is determined. If the difference between adjacent gear values ​​is a fixed difference, the gear difference corresponding to the output difference is determined. Finally, based on the initial gear value and the gear difference, the actual gear value of the chip under test is determined. That is, in this invention, the final actual gear value can be determined directly based on the initial gear value, the center value of the preset analog range, and the output difference between the analog output value corresponding to the initial gear value. Compared with the traversal method, this reduces the number of adjustments and improves adjustment efficiency.

[0084] Furthermore, the embodiments of the present invention can effectively reduce the production cost of wafer testing. Wafer testing accounts for a large proportion of the entire chip manufacturing process, and the cost reduction effect is more significant for products with more chips.

[0085] Furthermore, this invention can effectively increase mass production capacity.

[0086] Finally, this invention has a wide range of applications. Due to fluctuations in chip manufacturing processes, the appropriate settings for all critical analog quantities need to be determined through a process of iteration, thus making it suitable for wafer testing of all chip products.

[0087] It should be noted that the data collected and calculated in this embodiment can be recorded as variable values ​​in the SFR data storage.

[0088] The above embodiments describe the process of determining the actual gear value when the difference between adjacent gear values ​​is a fixed difference. However, the difference between adjacent gear values ​​can also vary, such as... Figure 4 As shown, the values ​​of adjacent gears can differ by 15, 25mV, etc., and the specific difference can be set according to the actual scenario.

[0089] In another implementation of the present invention, reference is made to... Figure 5 When the difference between adjacent gear values ​​is not a fixed difference, it also includes:

[0090] S31. Obtain the difference between different gear values.

[0091] Specifically, refer to Figure 4 First, calculate the difference between adjacent gear values. For example, the difference between gear 0010 and gear 0011 is 45mV.

[0092] Then calculate the difference between any non-adjacent gear values, such as the difference between gear 0010 and gear 0100, which is 60mV.

[0093] In practical applications, in order to reduce the amount of calculation, only the initial gear value and the gear difference between other gear values ​​can be calculated, so as to determine the actual gear value based on the initial gear value and the gear difference.

[0094] S32. If the analog output value is less than the minimum value of the preset analog range, determine the range value where the sum of the analog output value and the difference falls within the preset analog range, and use this range value as the actual range value of the chip under test.

[0095] Specifically, if the analog output value is less than the minimum value of the preset analog range, the analog output value should be increased. At this time, the sum of the analog output value and each difference is calculated, and the gear value that is within the preset analog range is taken as the actual gear value.

[0096] In addition, the sum can be calculated in ascending order of distance from the analog output value to reduce the amount of computation.

[0097] For example, if the initial gear value is 0100 and the preset analog range is 560-590mV, and the analog output value is 550mV, the difference between the 0101 gear and the initial gear is 25mV. Since 550mV + 25mV = 575mV, which falls within the preset analog range, the 0101 gear is the actual gear value.

[0098] S33. When the analog output value is greater than the maximum value of the preset analog range, determine the range value where the difference between the analog output value and the difference falls within the preset analog range, and use this range value as the actual range value of the chip under test.

[0099] The process of processing the analog output value being greater than the maximum value of the preset analog range is the opposite of the process of processing the analog output value being less than the minimum value of the preset analog range. At this time, it is determined that the difference between the analog output value and the difference falls within the preset analog range, and this range value is taken as the actual range value of the chip under test.

[0100] This embodiment provides a process for determining the actual gear value when the difference between adjacent gear values ​​is not a fixed difference, thereby enabling the determination of the actual gear value when the difference between adjacent gear values ​​is not a fixed difference.

[0101] Optionally, based on the above embodiments of the method for determining the level value of analog signals in a chip, another embodiment of the present invention provides a device for determining the level value of analog signals in a chip, applied to a controller, with reference to... Figure 6 The gear position determination device includes:

[0102] The gear value acquisition module 11 is used to acquire an initial gear value; the initial gear value is the gear value that has been used a number of times during wafer testing to meet a preset rule.

[0103] The data acquisition module 12 is used to set the gear value of the chip under test to the initial gear value and acquire the analog output value of the chip under test.

[0104] The difference determination module 13 is used to determine the output difference between the center value of the preset analog quantity range and the analog quantity output value when the analog quantity output value is not within the preset analog quantity range.

[0105] The first gear value determination module 14 is used to determine the gear difference corresponding to the output difference when the difference between adjacent gear values ​​is a fixed difference, and to determine the actual gear value of the chip under test based on the initial gear value and the gear difference.

[0106] Furthermore, when the first gear value determination module 14 is used to determine the gear difference corresponding to the output difference, it is specifically used for:

[0107] Calculate the ratio of the output difference to the fixed difference, and perform a preset processing operation on the ratio to obtain the gear difference.

[0108] Furthermore, when the first gear value determination module 14 determines the actual gear value of the chip under test based on the initial gear value and the gear difference, it is specifically used for:

[0109] Determine the relationship between the analog output value and the preset analog range; if the analog output value is less than the minimum value of the preset analog range, take the sum of the initial gear value and the gear difference as the actual gear value of the chip under test; if the analog output value is greater than the maximum value of the preset analog range, take the difference between the initial gear value and the gear difference as the actual gear value of the chip under test.

[0110] Furthermore, it also includes:

[0111] The second gear value determination module is used to obtain the difference between different gear values; when the analog output value is less than the minimum value of the preset analog range, it determines the gear value where the sum of the analog output value and the difference falls within the preset analog range, and uses this gear value as the actual gear value of the chip under test.

[0112] Furthermore, the second gear value determination module is also used for:

[0113] If the analog output value is greater than the maximum value of the preset analog range, determine the range value where the difference between the analog output value and the difference falls within the preset analog range, and use this range value as the actual range value of the chip under test.

[0114] Furthermore, when the data acquisition module 12 sets the gear value of the chip under test to the initial gear value, it is specifically used for:

[0115] The initial gear value is written into the memory of the chip under test, so that the chip under test reads the initial gear value in the memory and adjusts the gear value to the initial gear value.

[0116] Furthermore, it also includes:

[0117] The data acquisition module 12 is further configured to: set the gear value of the chip under test to the actual gear value, acquire the new analog output value of the chip under test, and output the chip under test adjustment completion information when the new analog output value is within the preset analog range.

[0118] In this embodiment, an initial gear value is first obtained. Then, the gear value of the chip under test is set as the initial gear value, and the analog output value of the chip under test is obtained. If the analog output value is not within a preset analog range, the output difference between the center value of the preset analog range and the analog output value is determined. If the difference between adjacent gear values ​​is a fixed difference, the gear difference corresponding to the output difference is determined. Finally, based on the initial gear value and the gear difference, the actual gear value of the chip under test is determined. That is, in this invention, the final actual gear value can be determined directly based on the initial gear value, the center value of the preset analog range, and the output difference between the analog output value corresponding to the initial gear value. Compared with the traversal method, this reduces the number of adjustments and improves adjustment efficiency.

[0119] It should be noted that the specific implementation process of each module in this embodiment is described in the corresponding descriptions in the above embodiments, and will not be repeated here.

[0120] Optionally, based on the above embodiments of the method and apparatus for determining the level value of analog chip signals, another embodiment of the present invention provides a controller, including: a memory and a processor;

[0121] The memory is used to store programs;

[0122] The processor calls the program and executes the above-mentioned method for determining the level value of the analog signal of the chip.

[0123] Specifically, the method for determining the gear value includes:

[0124] Obtain the initial gear value; the initial gear value is the gear value that is used a number of times during wafer testing to meet a preset rule;

[0125] Set the gear value of the chip under test to the initial gear value, and obtain the analog output value of the chip under test;

[0126] If the analog output value is not within a preset analog range, determine the output difference between the center value of the preset analog range and the analog output value.

[0127] When the difference between adjacent gear values ​​is a fixed difference, the gear difference corresponding to the output difference is determined, and the actual gear value of the chip under test is determined based on the initial gear value and the gear difference.

[0128] Further, determining the gear difference corresponding to the output difference includes:

[0129] Calculate the ratio of the output difference to the fixed difference, and perform a preset processing operation on the ratio to obtain the gear difference.

[0130] Further, based on the initial gear value and the gear difference, the actual gear value of the chip under test is determined, including:

[0131] Determine the relationship between the analog output value and the preset analog range;

[0132] If the analog output value is less than the minimum value of the preset analog range, the sum of the initial gear value and the gear difference value shall be taken as the actual gear value of the chip under test.

[0133] If the analog output value is greater than the maximum value of the preset analog range, the difference between the initial gear value and the gear difference value is taken as the actual gear value of the chip under test.

[0134] Furthermore, when the difference between adjacent gear values ​​is not a fixed difference, it also includes:

[0135] Obtain the difference between values ​​at different gear levels;

[0136] If the analog output value is less than the minimum value of the preset analog range, determine the range value where the sum of the analog output value and the difference falls within the preset analog range, and use this range value as the actual range value of the chip under test.

[0137] Furthermore, if the analog output value is greater than the maximum value of the preset analog range, the method further includes:

[0138] The range value is determined to be within the preset analog range where the difference between the analog output value and the difference falls, and this range value is taken as the actual range value of the chip under test.

[0139] Furthermore, if the analog output value is within a preset analog range, the method further includes:

[0140] The initial gear value is used to determine the actual gear value of the chip under test.

[0141] Furthermore, setting the gear value of the chip under test to the initial gear value includes:

[0142] The initial gear value is written into the memory of the chip under test, so that the chip under test reads the initial gear value in the memory and adjusts the gear value to the initial gear value.

[0143] Furthermore, after determining the actual gear value of the chip under test based on the initial gear value and the gear difference, the method further includes:

[0144] Set the gear value of the chip under test to the actual gear value, and obtain the new analog output value of the chip under test;

[0145] If the new analog output value is within the preset analog range, the system outputs a message indicating that the chip under test has completed adjustment.

[0146] In this embodiment, an initial gear value is first obtained. Then, the gear value of the chip under test is set as the initial gear value, and the analog output value of the chip under test is obtained. If the analog output value is not within a preset analog range, the output difference between the center value of the preset analog range and the analog output value is determined. If the difference between adjacent gear values ​​is a fixed difference, the gear difference corresponding to the output difference is determined. Finally, based on the initial gear value and the gear difference, the actual gear value of the chip under test is determined. That is, in this invention, the final actual gear value can be determined directly based on the initial gear value, the center value of the preset analog range, and the output difference between the analog output value corresponding to the initial gear value. Compared with the traversal method, this reduces the number of adjustments and improves adjustment efficiency.

[0147] The above description of the disclosed embodiments enables those skilled in the art to make or use the invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the invention. Therefore, the invention is not to be limited to the embodiments shown herein, but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A method for determining the level value of analog signals in a chip, characterized in that, Applied to a controller, the method for determining the gear value includes: Obtain an initial gear value; the initial gear value is a gear value that meets a preset number of usage rules during wafer testing; the preset number of usage rules are the maximum number of usages during wafer testing; Set the gear value of the chip under test to the initial gear value, and obtain the analog output value of the chip under test; If the analog output value is not within a preset analog range, determine the output difference between the center value of the preset analog range and the analog output value. When the difference between adjacent gear values ​​is a fixed difference, determine the gear difference corresponding to the output difference, and determine the actual gear value of the chip under test based on the initial gear value and the gear difference. Determining the gear difference corresponding to the output difference includes: Calculate the ratio of the output difference to the fixed difference, and perform a preset processing operation on the ratio to obtain the gear difference; the preset processing operation is a rounding operation. Determining the actual gear value of the chip under test based on the initial gear value and the gear difference includes: Determine the relationship between the analog output value and the preset analog range; If the analog output value is less than the minimum value of the preset analog range, the sum of the initial gear value and the gear difference value shall be taken as the actual gear value of the chip under test. If the analog output value is greater than the maximum value of the preset analog range, the difference between the initial gear value and the gear difference value shall be taken as the actual gear value of the chip under test. When the difference between adjacent gear values ​​is not a fixed difference, it also includes: Calculate the difference between the initial gear value and other gear values; If the analog output value is less than the minimum value of the preset analog range, determine the range value where the sum of the analog output value and the difference falls within the preset analog range, and use this range value as the actual range value of the chip under test. If the analog output value is greater than the maximum value of the preset analog range, the method further includes: Determine the range value at which the difference between the analog output value and the difference falls within the preset analog range, and use this range value as the actual range value of the chip under test; When the analog output value is within a preset analog range, the method further includes: The initial gear value is used to determine the actual gear value of the chip under test.

2. The method for determining gear position value according to claim 1, characterized in that, Setting the gear value of the chip under test to the initial gear value includes: The initial gear value is written into the memory of the chip under test, so that the chip under test reads the initial gear value in the memory and adjusts the gear value to the initial gear value.

3. The method for determining gear position value according to claim 1, characterized in that, After determining the actual gear value of the chip under test based on the initial gear value and the gear difference, the method further includes: Set the gear value of the chip under test to the actual gear value, and obtain the new analog output value of the chip under test; If the new analog output value is within the preset analog range, the system outputs a message indicating that the chip under test has completed adjustment.

4. A device for determining the level value of a chip analog signal, characterized in that, Applied to a controller, the gear value determining device includes: The gear value acquisition module is used to acquire an initial gear value; the initial gear value is a gear value that meets a preset number of times it is used during wafer testing; the preset number of times rule is the maximum number of times it is used during wafer testing; The data acquisition module is used to set the gear value of the chip under test to the initial gear value and acquire the analog output value of the chip under test. The difference determination module is used to determine the output difference between the center value of the preset analog quantity range and the analog quantity output value when the analog quantity output value is not within the preset analog quantity range. The gear value determination module is used to determine the gear difference corresponding to the output difference when the difference between adjacent gear values ​​is a fixed difference, and to determine the actual gear value of the chip under test based on the initial gear value and the gear difference. The first gear value determination module is used to determine the gear difference corresponding to the output difference when the difference between adjacent gear values ​​is a fixed difference, and to determine the actual gear value of the chip under test based on the initial gear value and the gear difference. Furthermore, when the first gear value determination module determines the gear difference corresponding to the output difference, it is specifically used for: Calculate the ratio of the output difference to the fixed difference, and perform a preset processing operation on the ratio to obtain the gear difference; Furthermore, when the first gear value determination module determines the actual gear value of the chip under test based on the initial gear value and the gear difference, it is specifically used for: Determine the relationship between the analog output value and the preset analog range; if the analog output value is less than the minimum value of the preset analog range, take the sum of the initial gear value and the gear difference as the actual gear value of the chip under test; if the analog output value is greater than the maximum value of the preset analog range, take the difference between the initial gear value and the gear difference as the actual gear value of the chip under test. Furthermore, it also includes: The second gear value determination module is used to calculate the difference between the initial gear value and other gear values; when the analog output value is less than the minimum value of the preset analog range, it determines the gear value where the sum of the analog output value and the difference falls within the preset analog range, and uses this gear value as the actual gear value of the chip under test. Furthermore, the second gear value determination module is also used for: If the analog output value is greater than the maximum value of the preset analog range, determine the range value where the difference between the analog output value and the difference falls within the preset analog range, and use this range value as the actual range value of the chip under test.

5. A controller, characterized in that, include: Memory and processor; The memory is used to store programs; The processor calls the program and executes the chip analog quantity level value determination method as described in any one of claims 1-3.

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