Quality detection method for dustproof electronic product

Abstract

The application relates to the technical field of electronic product detection, and discloses a quality detection method for dustproof electronic products. The dustproof performance of the electronic product to be detected is detected by placing the electronic product to be detected in a dustproof test box. The electronic product to be detected with qualified dustproof performance is placed on a drop test device to perform drop test. After one drop test, the electronic product to be detected is placed in the dustproof test box again to detect the dustproof performance of the electronic product to be detected. The above method helps the manufacturers to judge and adjust the workmanship and quality of different parts of the dustproof electronic products. In the drop test process, the two T-shaped clamps can perform free fall motion together with the electronic product to be detected. The electronic product to be detected is fixed during the falling process, so that the electronic product to be detected is prevented from deflecting. The impact point of the electronic product to be detected and the drop detection plate is consistent with the initially set impact point, so that the test precision can be greatly improved.

Description

Technical Field

[0001] This invention relates to the field of electronic product testing technology, and in particular to a quality testing method for dustproof electronic products. Background Technology

[0002] Dustproof electronic products typically refer to electronic devices such as mobile phones and action cameras that have waterproof and dustproof functions. These electronic devices are widely used in daily life. Compared with ordinary electronic devices, the quality testing of electronic products with dustproof and waterproof functions is particularly important, especially the drop resistance test. This is because the processing precision requirements for these electronic products are higher. If the drop resistance is not good, a single accidental drop may cause these products to lose their dustproof and waterproof performance. The drop resistance of electronic products is usually measured through drop tests.

[0003] For example, the drop testing machine disclosed in Chinese Patent Publication No. CN113848031A includes a support frame. The support frame includes a feeding mechanism, a clamping mechanism located on one side of the feeding mechanism, a receiving frame located on one side of the clamping mechanism, a camera recognition mechanism located above the receiving frame, a precision positioning mechanism located on one side of the clamping mechanism, a drop mechanism located on one side of the receiving frame, and a discharging mechanism located on one side of the precision positioning mechanism. The beneficial effects of this invention are that the feeding mechanism, clamping mechanism, camera recognition mechanism, precision positioning mechanism, drop mechanism, and discharging mechanism work together to effectively complete the feeding, clamping, camera recognition, precision positioning, drop testing, camera re-recognition, and discharging of products. It is convenient to use and can perform drop tests on products from multiple angles according to user needs, facilitating better testing of the product's structural robustness and resulting in high efficiency.

[0004] Existing drop testing equipment lifts the electronic product under test to a certain height and then releases it, allowing it to fall freely. During the fall, the electronic product will deflect due to the different position of its center of gravity. Drop tests usually require testing different parts of the electronic product separately. This results in the impact point of the electronic product under test not matching the initially adjusted impact point, leading to test errors and making it difficult to obtain accurate drop test data.

[0005] Therefore, we propose a quality inspection method for dustproof electronic products to solve the above problems. Summary of the Invention

[0006] The purpose of this invention is to provide a quality inspection method for dustproof electronic products to solve the problems mentioned in the background art.

[0007] To achieve the above objectives, the present invention provides the following technical solution: a quality inspection method for dustproof electronic products, comprising the following steps:

[0008] S1: The dustproof performance of electronic products is tested by placing them in a dustproof test chamber.

[0009] S2: The electronic product under test that has passed the dustproof performance test is placed on the drop test device and subjected to drop test.

[0010] S3: After one drop test, the electronic product under test is placed in the dustproof test chamber again to test the dustproof performance of the electronic product under test after the drop damage.

[0011] S4: Change the clamping position of the electronic product under test and perform drop tests on the four corners of the electronic product under test.

[0012] S5: The electronic product under test, whose four corners have been subjected to drop tests, is placed in the dustproof test chamber again to test the dustproof performance of the electronic product under test after different parts are damaged by drops.

[0013] The above technical solution can be used to further test the dustproof performance of electronic products after drop testing, which helps manufacturers to judge and adjust the workmanship and quality of dustproof electronic products.

[0014] Furthermore, the drop test device includes a test platform, a mounting column on the top of the test platform, a guide rail vertically mounted on the top of the mounting column, a clamping assembly on the guide rail, the clamping assembly including a drive slider, a connecting block, a guide rail, a pushing block, and two T-shaped grippers, the drive slider being slidably connected to the guide rail, the connecting block being located beside the drive slider, the guide rail being located on the side of the connecting block away from the drive slider, the pushing block being slidably connected to the guide rail, the pushing block being drively connected to the two T-shaped grippers, the pushing block being used to control the opening and closing of the two T-shaped grippers, and a trapezoidal trigger block being mounted on the top of the mounting column, the trapezoidal trigger block being structurally compatible with the pushing block;

[0015] It also includes a switching component, which includes a rotating table and a driving component. The rotating table is rotatably connected to the detection table. The top of the rotating table has several mounting slots, and a drop detection plate is detachably connected to each mounting slot. Each drop detection plate is made of a different material.

[0016] Through the above technical solution, during the drop test, the two T-shaped grippers can move freely with the electronic product under test. During the fall, the electronic product under test is always fixed, which prevents the electronic product under test from deflecting due to different center of gravity during the fall, so as to avoid the impact point between the electronic product under test and the drop detection board not matching the initially set impact point, thereby improving the test accuracy.

[0017] At the same time, by rotating the rotary table, the drop test plate that the electronic product under test is impacted during the drop test can be quickly switched, thereby quickly obtaining the drop test results of the electronic product under test under different materials.

[0018] Furthermore, the clamping assembly also includes an I-shaped block and an adjusting plate. The I-shaped block is disposed on the side of the guide rail away from the connecting block. The ends of the two T-shaped jaws are rotatably connected to the two sides of the I-shaped block, and a connecting rod is disposed on the side of each T-shaped jaw away from the I-shaped block. Each connecting rod is hinged to the T-shaped jaw, and the end of each connecting rod away from the T-shaped jaw is hinged to the pushing block. The adjusting plate is disposed on the top of the pushing block.

[0019] Furthermore, a plurality of telescopic slide rods are provided between the push block and the connecting block, and a compression spring is provided on the outer side of each telescopic slide rod. One end of each compression spring is fixedly connected to the connecting block, and the other end of each compression spring is fixedly connected to the push block.

[0020] Furthermore, a limit block is provided on the side of the drive slider near the connecting block, and an L-shaped slide rod is slidably connected to the limit block. A connecting slide rod is provided at the bottom of the push block. An arc-shaped slide groove is opened at the end of the L-shaped slide rod near the connecting slide rod. The arc-shaped slide groove is movably hinged to the connecting slide rod. A triangular trigger block is provided at the bottom of the side of the L-shaped slide rod away from the connecting slide rod. The triangular trigger block is structurally matched with the trapezoidal trigger block.

[0021] With the above technical solution, just before the electronic product under test collides with the drop test board, the triangular trigger block will contact the trapezoidal trigger block. The triangular trigger block will quickly move towards the side closer to the drive slider, thereby causing the two T-shaped grippers to open quickly and separate rapidly from the electronic product under test. This allows the electronic product under test to collide with the drop test board in a completely free state, while also ensuring that the electronic product under test can obtain an ideal impact angle, thereby improving the accuracy of the drop test.

[0022] Furthermore, the driving component also includes a servo motor and a drive gear. The interior of the detection table is hollow. The servo motor is located inside the detection table, and the drive gear is located on the output shaft of the servo motor. A gear ring is provided on the outer wall of the rotary table, and the gear ring meshes with the drive gear.

[0023] Through the above technical solution, the servo motor drives the rotary table to rotate through the drive gear, thereby enabling rapid switching between multiple drop detection plates.

[0024] Furthermore, a height adjustment component is provided on the side of the clamping assembly. The height adjustment component includes a lead screw slide, a fixed base, and an electric cylinder. The lead screw slide is vertically arranged on the side of the guide slide rail. The fixed base is fixedly connected to the slider of the lead screw slide. The electric cylinder is arranged on the fixed base. A lifting block is provided on the output end of the electric cylinder. A lifting groove is provided at the bottom of the drive slider. The lifting groove cooperates with the lifting block structure.

[0025] The above technical solution allows for free adjustment of the initial drop height in drop tests.

[0026] Furthermore, a plurality of buffer dampers are provided on the top of the mounting column, and buffer blocks are provided on the top of the plurality of buffer dampers.

[0027] Through the above technical solution, the setting of multiple buffer dampers and buffer blocks can buffer the impact force generated when the drive slider and clamping components fall, avoid damage to the drive slider and clamping components after multiple tests, and improve the service life of the device.

[0028] Furthermore, an angle adjustment assembly is provided between the connecting block and the driving slider. The angle adjustment assembly includes a rotating shaft, a rotating disk, a mounting bracket, a threaded rod, a limiting rod, and an adjusting slider. The rotating shaft is disposed on the outer wall of the driving slider, the rotating disk is rotatably connected to the rotating shaft, and the side of the rotating disk away from the rotating shaft is fixedly connected to the connecting block. The mounting bracket is disposed on the driving slider, the threaded rod is rotatably connected to the mounting bracket, the limiting rod is fixedly connected to the mounting bracket, the adjusting slider is slidably connected to the limiting rod, and the adjusting slider is threadedly connected to the threaded rod.

[0029] Furthermore, a connecting push rod is hinged to the adjusting slider, and the end of the connecting push rod away from the adjusting slider is hinged to the outer wall of the rotating disk. An adjusting knob is provided at the end of the threaded rod.

[0030] The above technical solution enables rapid adjustment of the drop angle of the electronic product under test, making the drop test range of the electronic product under test wider and more applicable.

[0031] Compared with the prior art, the beneficial effects of the present invention are:

[0032] Firstly, this invention primarily targets the testing of dustproof performance of electronic products after drop impact. It addresses the shortcomings of existing technologies where, during drop tests, the electronic product under test deflects due to differences in its center of gravity, causing the impact point between the product and the drop test board to misalign with the initially set impact point. This invention improves upon existing technologies by further testing the dustproof performance of the electronic product after the drop test, helping manufacturers assess and adjust the workmanship and quality of their dustproof electronic products. In particular, the drop testing device in this invention allows two T-shaped grippers to move freely with the electronic product during the drop test, maintaining its fixation throughout the descent and preventing deflection. This significantly improves testing accuracy and yields more precise drop test data.

[0033] Secondly, in this invention, just before the electronic product under test collides with the drop test board, the triangular trigger block will come into contact with the trapezoidal trigger block. The triangular trigger block will quickly move towards the side closer to the drive slider, and then drive the push block to slide along the guide rail through the L-shaped slide rod. When the push block slides along the guide rail, it continues to drive the two T-shaped grippers to open quickly through the two connecting rods, and quickly separate from the electronic product under test. This allows the electronic product under test to collide with the drop test board in a completely free state, and also ensures that the electronic product under test can obtain an ideal impact angle, further improving the accuracy of the drop test.

[0034] Thirdly, in this invention, the servo motor drives the rotary table to rotate through the drive gear, thereby enabling rapid switching between multiple drop test plates. The drop test plate that the electronic product under test impacts during the drop test can be switched, thereby quickly obtaining the drop test results of the electronic product under test under different materials.

[0035] Fourthly, in this invention, by setting a height adjustment component, the initial drop height of the drop test can be freely adjusted according to the different needs of electronic products.

[0036] Fifth, in this invention, by setting multiple buffer dampers and buffer blocks, the impact force generated when the drive slider and clamping assembly fall can be buffered, avoiding damage to the drive slider and clamping assembly after multiple tests, and improving the service life of this device.

[0037] Sixth, this invention also allows for rapid adjustment of the drop angle of the electronic product under test. Specifically, after the operator fixes the electronic product under test, they can rotate the adjustment knob to adjust the drop angle of the electronic product under test, thus making the drop test range of the electronic product under test wider and its applicability stronger. Attached Figure Description

[0038] Figure 1 This is a schematic diagram of the overall structure of the present invention;

[0039] Figure 2 This is a schematic diagram of the structure of the driving slider in this invention;

[0040] Figure 3 for Figure 2 Enlarged view of point A in the middle;

[0041] Figure 4 This is a schematic diagram of the drop detection plate in this invention;

[0042] Figure 5 This is a schematic diagram of the guide rail structure in this invention;

[0043] Figure 6 for Figure 5 Enlarged view at point B in the middle;

[0044] Figure 7 This is a schematic diagram of the T-shaped gripper structure in this invention;

[0045] Figure 8 This is a schematic diagram of the guide rail structure in this invention;

[0046] Figure 9 for Figure 8 Enlarged view at point C;

[0047] Figure 10 This is a schematic diagram of the lifting block structure in this invention;

[0048] Figure 11 This is a schematic diagram of the drop test process in this invention;

[0049] Figure 12 This is a schematic diagram of the connecting push rod in this invention.

[0050] In the diagram: 1. Testing table; 2. Protective cover; 3. Trapezoidal trigger block; 4. Guide rail; 5. Drive slider; 6. Clamping assembly; 7. Rotary table; 8. Lead screw slide; 9. Electric cylinder; 10. Fixed base; 11. Lifting block; 12. Lifting slot; 13. Servo motor; 14. Gear ring; 15. Drive gear; 16. Drop detection plate; 17. Mounting slot; 18. Mounting column; 19. Electronic product under test; 20. T-shaped gripper; 21. Connecting rod; 22. Adjustment. 23. Plate; 24. Connecting block; 25. Compression spring; 26. Telescopic slide rod; 27. Guide rail; 28. I-shaped block; 29. ​​Push block; 30. Limiting block; 31. L-shaped slide rod; 32. Triangular trigger block; 33. Connecting slide rod; 34. Arc-shaped slide groove; 35. Rotating disk; 36. Mounting bracket; 37. Threaded rod; 38. Limiting rod; 39. Rotating shaft; 40. Adjusting slider; 41. Connecting push rod; 42. Adjusting knob; 43. Buffer block; 44. Buffer damper. Detailed Implementation

[0051] In the description of this invention, it should be understood that the terms "center," "longitudinal," "lateral," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," and "outer," etc., indicating orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, are only for the convenience of describing the invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of the invention. Furthermore, the terms "first," "second," etc., are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features. Thus, a feature defined with "first," "second," etc., may explicitly or implicitly include one or more of that feature. In the description of this invention, unless otherwise stated, "a plurality of" means two or more.

[0052] In the description of this invention, it should be noted that, unless otherwise explicitly specified and limited, the terms "installation," "connection," and "linking" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art will understand the specific meaning of the above terms in this invention based on the specific circumstances.

[0053] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0054] Example 1

[0055] In this embodiment of the invention, a quality inspection method for dustproof electronic products includes the following steps:

[0056] S1: The dustproof performance of the electronic product 19 is tested by placing it in a dustproof test chamber;

[0057] S2: The dustproof electronic product 19 is placed on the drop test device for drop test;

[0058] S3: After one drop test, the electronic product under test 19 is placed in the dustproof test chamber again to test the dustproof performance of the electronic product under test 19 after the drop damage.

[0059] S4: Change the clamping position of the electronic product under test 19 and perform drop tests on the four corners of the electronic product under test 19 respectively;

[0060] S5: The electronic product under test 19, whose four corners have been subjected to drop tests, is placed in the dustproof test chamber again to test the dustproof performance of the electronic product under test 19 after different parts are damaged by drops.

[0061] The above methods can be used to further test the dustproof performance of electronic products after drop testing, which helps manufacturers to judge and adjust the workmanship and quality of different parts of dustproof electronic products.

[0062] For details, please refer to Figures 1-11 The drop test device includes a test platform 1, a mounting column 18 on the top of the test platform 1, a protective cover 2 on the side of the mounting column 18, a guide rail 4 vertically mounted on the top of the mounting column 18, a clamping assembly 6 mounted on the guide rail 4, the clamping assembly 6 including a drive slider 5, a connecting block 23, a guide rail 26, a push block 28 and two T-shaped grippers 20, the drive slider 5 is slidably connected to the guide rail 4, the connecting block 23 is located on the side of the drive slider 5, the guide rail 26 is located on the side of the connecting block 23 away from the drive slider 5, the push block 28 is slidably connected to the guide rail 26, the push block 28 is connected to the two T-shaped grippers 20 in a transmission connection, the push block 28 is used to control the opening and closing of the two T-shaped grippers 20, and a trapezoidal trigger block 3 is mounted on the top of the mounting column 18, the trapezoidal trigger block 3 and the push block 28 are structurally matched;

[0063] For details, please refer to Figures 6-9 The clamping assembly 6 also includes an I-shaped block 27 and an adjusting plate 22. The I-shaped block 27 is located on the side of the guide rail 26 away from the connecting block 23. The ends of two T-shaped grippers 20 are rotatably connected to the two sides of the I-shaped block 27. Each T-shaped gripper 20 has a connecting rod 21 on the side away from the I-shaped block 27. Each connecting rod 21 is hinged to the T-shaped gripper 20, and the end of each connecting rod 21 away from the T-shaped gripper 20 is hinged to the pushing block 28. The adjusting plate 22 is located on the top of the pushing block 28. Two telescopic slide rods 25 are provided between the pushing block 28 and the connecting block 23. Each telescopic slide rod 25 has a [missing information - likely a typo or missing element]. A compression spring 24 is provided, with one end of each compression spring 24 fixedly connected to a connecting block 23 and the other end of each compression spring 24 fixedly connected to a push block 28. A limit block 29 is provided on the side of the drive slider 5 near the connecting block 23, and an L-shaped slide rod 30 is slidably connected to the limit block 29. A connecting slide rod 32 is provided at the bottom of the push block 28. An arc-shaped slide groove 33 is provided at the end of the L-shaped slide rod 30 near the connecting slide rod 32. The arc-shaped slide groove 33 is movably hinged to the connecting slide rod 32. A triangular trigger block 31 is provided at the bottom of the side of the L-shaped slide rod 30 away from the connecting slide rod 32. The triangular trigger block 31 is structurally matched with the trapezoidal trigger block 3.

[0064] In this invention, during the drop test, the two T-shaped grippers 20 can fall freely along with the electronic product under test 19. During the fall, the electronic product under test 19 is always fixed, preventing the electronic product under test 19 from deflecting due to different centers of gravity during the fall, which would cause the impact point between the electronic product under test 19 and the drop detection plate 16 to not match the initially set impact point, thereby improving the test accuracy. Specifically, the operator first moves the adjustment plate 22 to open the two T-shaped grippers 20, and under the elastic force of the compression spring 24, clamps and fixes the electronic product under test 19.

[0065] Next, just before the electronic product under test 19 collides with the drop detection plate 16, the triangular trigger block 31 will come into contact with the trapezoidal trigger block 3. The triangular trigger block 31 will quickly move towards the side closer to the drive slider 5, and then drive the push block 28 to slide along the guide rail 26 through the L-shaped slide rod 30. When the push block 28 slides along the guide rail 26, it will continue to drive the two T-shaped grippers 20 to open quickly through the two connecting rods 21, and quickly separate from the electronic product under test 19. This allows the electronic product under test 19 to collide with the drop detection plate 16 in a completely free state, and also ensures that the electronic product under test 19 can obtain the ideal impact angle, thereby improving the accuracy of the drop test.

[0066] Please see Figures 4-5The switching component includes a rotating platform 7 and a drive component. The rotating platform 7 is rotatably connected to the testing platform 1. The top of the rotating platform 7 has several mounting slots 17, and each mounting slot 17 is detachably connected to a drop detection plate 16. Each drop detection plate 16 is made of a different material, such as concrete, wood flooring, marble, tile, carpet, etc., which are different ground materials that electronic products encounter in daily use. The drive component also includes a servo motor 13 and a drive gear 15. The interior of the testing platform 1 is hollow. The servo motor 13 is located inside the testing platform 1, and the drive gear 15 is located on the output shaft of the servo motor 13. A gear ring 14 is provided on the outer wall of the rotating platform 7, and the gear ring 14 meshes with the drive gear 15.

[0067] The servo motor 13 drives the rotary table 7 to rotate through the drive gear 15, thereby enabling rapid switching between multiple drop test plates 16. The drop test plate 16 that the electronic product under test 19 impacts during the drop test can be switched, thereby quickly obtaining the drop test results of the electronic product under test 19 under different materials.

[0068] For details, please refer to Figures 1-3 A height adjustment component is provided on the side of the clamping component 6. The height adjustment component includes a lead screw slide 8, a fixed base 10, and an electric cylinder 9. The lead screw slide 8 is vertically arranged on the side of the guide slide rail 4. The fixed base 10 is fixedly connected to the slider of the lead screw slide 8. The electric cylinder 9 is arranged on the fixed base 10. A lifting block 11 is provided on the output end of the electric cylinder 9. A lifting groove is provided at the bottom of the drive slider 5. The lifting groove and the lifting block 11 are structurally matched.

[0069] In this invention, the initial drop height of the drop test can be freely adjusted according to the different needs of electronic products.

[0070] For details, please refer to Figure 10 Figure 11 Multiple buffer dampers 43 are provided on the top of the mounting column 18, and buffer blocks 42 are provided on the top of the multiple buffer dampers 43.

[0071] By setting multiple buffer dampers 43 and buffer blocks 42, the impact force generated when the drive slider 5 and clamping assembly 6 fall can be buffered, avoiding damage to the drive slider 5 and clamping assembly 6 after multiple tests, and improving the service life of the device.

[0072] Example 2

[0073] Based on Embodiment 1, the present invention provides a technical solution, please refer to... Figure 12An angle adjustment assembly is provided between the connecting block 23 and the driving slider 5. The angle adjustment assembly includes a rotating shaft 38, a rotating disk 34, a mounting bracket 35, a threaded rod 36, a limiting rod 37, and an adjusting slider 39. The rotating shaft 38 is located on the outer wall of the driving slider 5. The rotating disk 34 is rotatably connected to the rotating shaft 38. The side of the rotating disk 34 away from the rotating shaft 38 is fixedly connected to the connecting block 23. The mounting bracket 35 is located on the driving slider 5. The threaded rod 36 is rotatably connected to the mounting bracket 35. The limiting rod 37 is fixedly connected to the mounting bracket 35. The adjusting slider 39 is slidably connected to the limiting rod 37. The adjusting slider 39 is threadedly connected to the threaded rod 36. A connecting push rod 40 is hinged to the adjusting slider 39. The end of the connecting push rod 40 away from the adjusting slider 39 is hinged to the outer wall of the rotating disk 34. An adjusting knob 41 is provided at the end of the threaded rod 36.

[0074] In this invention, the drop angle of the electronic product 19 under test can also be quickly adjusted. Specifically, after the operator fixes the electronic product 19 under test, he rotates the adjustment knob 41, so that the adjustment slider 39 is driven to slide along the limit rod 37 through the threaded rod 36. The adjustment slider 39 continues to drive the rotating disk 34 to rotate through the connecting push rod 40, thereby quickly adjusting the angle of the two T-shaped grippers 20, thus adjusting the drop angle of the electronic product 19 under test, making the drop test range of the electronic product 19 under test wider and the applicability stronger.

[0075] Example 3

[0076] Unlike Examples 1 and 2, this invention also discloses a method for a drop test apparatus, comprising the following steps:

[0077] S1: The electronic product to be tested 19 is clamped on two T-shaped jaws 20. Then, the lead screw slide 8 drives the electric cylinder 9 to descend, so that the lifting block 11 can be smoothly inserted into the lifting slot 12.

[0078] S2: The lead screw slide 8 lifts the electronic product under test 19 to an appropriate height through the lifting block 11, in preparation for drop testing;

[0079] S3: The staff can adjust the clamping angle of the electronic product under test 19 by rotating the adjustment knob 41, thereby freely changing the impact point when the electronic product under test 19 collides with the drop detection plate 16 during the drop test.

[0080] S4: Servo motor 13 starts and drives rotary table 7 to rotate through drive gear 15, so that drop detection plate 16 of the corresponding material moves to the under test electronic product 19. The position of multiple drop detection plates 16 can be quickly switched by rotating rotary table 7.

[0081] S5: The output end of the electric cylinder 9 retracts until the lifting block 11 is completely disengaged from the lifting slot 12. The electronic product under test 19 will then undergo free fall along with the two T-shaped grippers 20. Before the electronic product under test 19 contacts the drop detection plate 16, the two T-shaped grippers 20 will automatically and quickly open, thus ensuring that the impact point between the electronic product under test 19 and the drop detection plate 16 matches the initially set impact point.

[0082] The working principle of this invention is as follows: In this invention, during the drop test, the two T-shaped grippers 20 can move freely along with the electronic product under test 19. During the fall, the electronic product under test 19 is always fixed, so as to avoid the electronic product under test 19 from deflecting due to the different center of gravity during the fall, which would cause the impact point of the electronic product under test 19 and the drop detection plate 16 to not match the initially set impact point, thereby improving the test accuracy. Specifically, the operator first moves the adjustment plate 22 to open the two T-shaped grippers 20, and clamps and fixes the electronic product under test 19 under the elastic force of the compression spring 24.

[0083] Next, just before the electronic product under test 19 collides with the drop detection plate 16, the triangular trigger block 31 will come into contact with the trapezoidal trigger block 3. The triangular trigger block 31 will quickly move towards the side closer to the drive slider 5, and then drive the push block 28 to slide along the guide rail 26 through the L-shaped slide rod 30. When the push block 28 slides along the guide rail 26, it will continue to drive the two T-shaped grippers 20 to open quickly through the two connecting rods 21, and quickly separate from the electronic product under test 19. This allows the electronic product under test 19 to collide with the drop detection plate 16 in a completely free state, and can also ensure that the electronic product under test 19 can obtain the ideal impact angle, thereby improving the accuracy of the drop test.

[0084] The servo motor 13 drives the rotary table 7 to rotate through the drive gear 15, thereby enabling rapid switching between multiple drop test plates 16. The drop test plate 16 that the electronic product under test 19 impacts during the drop test can be switched, thereby quickly obtaining the drop test results of the electronic product under test 19 under different materials.

[0085] In this invention, by setting a height adjustment component, the initial drop height of the drop test can be freely adjusted according to the different needs of electronic products.

[0086] By setting multiple buffer dampers 43 and buffer blocks 42, the impact force generated when the drive slider 5 and clamping assembly 6 fall can be buffered, avoiding damage to the drive slider 5 and clamping assembly 6 after multiple tests, and improving the service life of the device.

[0087] In this invention, the drop angle of the electronic product 19 under test can also be quickly adjusted. Specifically, after the operator fixes the electronic product 19 under test, he rotates the adjustment knob 41, so that the adjustment slider 39 is driven to slide along the limit rod 37 through the threaded rod 36. The adjustment slider 39 continues to drive the rotating disk 34 to rotate through the connecting push rod 40, thereby quickly adjusting the angle of the two T-shaped grippers 20, thus adjusting the drop angle of the electronic product 19 under test, making the drop test range of the electronic product 19 under test wider and the applicability stronger.

[0088] Furthermore, it should be understood that although this specification describes embodiments, not every embodiment contains only one independent technical solution. This narrative style is merely for clarity. Those skilled in the art should consider the specification as a whole, and the technical solutions in each embodiment can also be appropriately combined to form other embodiments that can be understood by those skilled in the art.

Claims

1. A quality inspection method for dustproof electronic products, characterized in that, Includes the following steps: S1: The dustproof performance of the electronic product (19) is tested by placing it in a dustproof test chamber; S2: The electronic product under test (19) with qualified dustproof performance is placed on the drop test device and subjected to drop test; S3: After a drop test, the electronic product under test (19) is placed in the dustproof test chamber again to test the dustproof performance of the electronic product under test (19) after the drop damage. S4: Change the clamping position of the electronic product under test (19) and perform drop tests on the four corners of the electronic product under test (19); S5: The electronic product under test (19) that has undergone drop testing on its four corners is placed in the dustproof test chamber again to test the dustproof performance of the electronic product under test (19) after different parts are damaged by drop. The drop test device includes a test platform (1), a mounting column (18) is provided on the top of the test platform (1), a guide rail (4) is vertically provided on the top of the mounting column (18), and a clamping assembly (6) is provided on the guide rail (4). The clamping assembly (6) includes a drive slider (5), a connecting block (23), a guide rail (26), a push block (28), and two T-shaped grippers (20). The drive slider (5) is slidably connected to the guide rail (4), and the connecting block (23) is... The guide rail (26) is located on the side of the drive slider (5) and the connecting block (23) is located away from the drive slider (5). The push block (28) is slidably connected to the guide rail (26). The push block (28) is connected to two T-shaped grippers (20) in a transmission manner. The push block (28) is used to control the opening and closing of the two T-shaped grippers (20). A trapezoidal trigger block (3) is provided on the top of the mounting column (18). The trapezoidal trigger block (3) is structurally matched with the push block (28). It also includes a switching component, which includes a rotating table (7) and a driving component. The rotating table (7) is rotatably connected to the detection table (1). The top of the rotating table (7) is provided with several mounting slots (17). Each mounting slot (17) is detachably connected to a drop detection plate (16). Each drop detection plate (16) is made of a different material.

2. The quality inspection method for dustproof electronic products according to claim 1, characterized in that, The clamping assembly (6) also includes an I-shaped block (27) and an adjusting plate (22). The I-shaped block (27) is located on the side of the guide rail (26) away from the connecting block (23). The ends of two T-shaped jaws (20) are rotatably connected to the two sides of the I-shaped block (27). Each T-shaped jaw (20) is provided with a connecting rod (21) on the side away from the I-shaped block (27). Each connecting rod (21) is hinged to the T-shaped jaw (20). The end of each connecting rod (21) away from the T-shaped jaw (20) is hinged to the pushing block (28). The adjusting plate (22) is located on the top of the pushing block (28).

3. The quality inspection method for dustproof electronic products according to claim 2, characterized in that, Multiple telescopic slide rods (25) are provided between the push block (28) and the connecting block (23). Each telescopic slide rod (25) is provided with a compression spring (24) on its outer side. One end of each compression spring (24) is fixedly connected to the connecting block (23), and the other end of each compression spring (24) is fixedly connected to the push block (28).

4. The quality inspection method for dustproof electronic products according to claim 3, characterized in that, A limiting block (29) is provided on the side of the driving slider (5) near the connecting block (23). An L-shaped slide rod (30) is slidably connected to the limiting block (29). A connecting slide rod (32) is provided at the bottom of the pushing block (28). An arc-shaped slide groove (33) is provided at the end of the L-shaped slide rod (30) near the connecting slide rod (32). The arc-shaped slide groove (33) is movably hinged to the connecting slide rod (32). A triangular trigger block (31) is provided at the bottom of the side of the L-shaped slide rod (30) away from the connecting slide rod (32). The triangular trigger block (31) is structurally matched with the trapezoidal trigger block (3).

5. The quality inspection method for dustproof electronic products according to claim 1, characterized in that, The driving component also includes a servo motor (13) and a drive gear (15). The interior of the detection table (1) is hollow. The servo motor (13) is located inside the detection table (1). The drive gear (15) is located on the output shaft of the servo motor (13). A gear ring (14) is provided on the outer wall of the rotary table (7). The gear ring (14) meshes with the drive gear (15).

6. The quality inspection method for dustproof electronic products according to claim 5, characterized in that, A height adjustment component is provided on the side of the clamping component (6). The height adjustment component includes a lead screw slide (8), a fixed seat (10), and an electric cylinder (9). The lead screw slide (8) is vertically arranged on the side of the guide slide rail (4). The fixed seat (10) is fixedly connected to the slider of the lead screw slide (8). The electric cylinder (9) is arranged on the fixed seat (10). A lifting block (11) is provided on the output end of the electric cylinder (9). A lifting groove is provided at the bottom of the drive slider (5). The lifting groove is structurally matched with the lifting block (11).

7. The quality inspection method for dustproof electronic products according to claim 6, characterized in that, The top of the mounting column (18) is provided with a plurality of buffer dampers (43), and the top of the plurality of buffer dampers (43) is provided with a buffer block (42).

8. The quality inspection method for dustproof electronic products according to claim 2, characterized in that, An angle adjustment assembly is provided between the connecting block (23) and the driving slider (5). The angle adjustment assembly includes a rotating shaft (38), a rotating disk (34), a mounting bracket (35), a threaded rod (36), a limiting rod (37), and an adjusting slider (39). The rotating shaft (38) is located on the outer wall of the driving slider (5). The rotating disk (34) is rotatably connected to the rotating shaft (38). The side of the rotating disk (34) away from the rotating shaft (38) is fixedly connected to the connecting block (23). The mounting bracket (35) is located on the driving slider (5). The threaded rod (36) is rotatably connected to the mounting bracket (35). The limiting rod (37) is fixedly connected to the mounting bracket (35). The adjusting slider (39) is slidably connected to the limiting rod (37). The adjusting slider (39) is threadedly connected to the threaded rod (36).

9. The quality inspection method for a dustproof electronic product according to claim 8, characterized in that, A connecting push rod (40) is hinged to the adjusting slider (39). The end of the connecting push rod (40) away from the adjusting slider (39) is hinged to the outer wall of the rotating disk (34). An adjusting knob (41) is provided at the end of the threaded rod (36).

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