Analog-to-digital conversion device internal parameter group debugging system and debugging method

Abstract

The application provides a debugging system and method for internal parameter groups of analog-digital conversion devices, which comprises one standard analog-digital conversion device with debugged internal parameter groups, one or more to-be-debugged analog-digital conversion devices and a control device; an external standard voltage is connected to an external reference voltage port of the standard analog-digital conversion device; a plurality of channel voltage input ports of the to-be-debugged analog-digital conversion device are connected to an external adjustable voltage source; the control device communicates with the standard analog-digital conversion device and the to-be-debugged analog-digital conversion device through a preset interface; an LDO port and a reference voltage port of the to-be-debugged analog-digital conversion device are connected to two channel voltage input ports of the standard analog-digital conversion device; and the rest channel voltage input ports of the standard analog-digital conversion device are connected to the external adjustable voltage source. The debugging system can adjust parameters, realize the adjustment of the internal parameter groups of each analog-digital conversion device in the batch, reduce manual operation and greatly improve the efficiency.

Description

Technical Field

[0001] This invention relates to the field of device parameter calibration technology, and in particular to a debugging system and method for debugging internal parameter groups of analog-to-digital converter devices. Background Technology

[0002] High-precision analog-to-digital converters (ADCs) require specific internal parameters to correct for DC offset and gain errors due to manufacturing processes and other factors. Each ADC has a unique set of internal parameters, which must be determined through debugging. Currently, the primary method involves applying a preset voltage value to the input channel of each ADC under test and calculating the conversion value to debug its internal parameters. This method requires determining the internal parameter set of each device individually, resulting in low debugging efficiency and high labor costs.

[0003] How to conveniently and efficiently correct the internal parameter set of an analog-to-digital converter is an urgent problem to be solved. Summary of the Invention

[0004] In view of this, the present invention provides a debugging system and method for the internal parameter group of an analog-to-digital converter to overcome the shortcomings of the prior art.

[0005] This application provides a debugging system for the internal parameter group of an analog-to-digital converter (ADC), including: a standard ADC with its internal parameter group already debugged, one or more ADCs to be debugged, and a control device;

[0006] The external reference voltage port of the standard analog-to-digital converter is connected to an external standard voltage; the multi-channel voltage input port of the analog-to-digital converter under test is connected to an external adjustable voltage source.

[0007] The control device communicates with the standard analog-to-digital converter and the analog-to-digital converter under test through a preset interface;

[0008] The LDO port and reference voltage port of the analog-to-digital converter under test are connected to the two-channel voltage input ports of the standard analog-to-digital converter; the remaining few channel voltage input ports of the standard analog-to-digital converter are connected to an external adjustable voltage source.

[0009] When the number of analog-to-digital converters (ADCs) to be tested is greater than one, the circuit further includes: a first selector and a second selector; the first selector is connected between the control device and the ADC under test; under the control of the control device, the first selector enables the control device to communicate with the specified ADC under test; the second selector is connected between the standard ADC and the ADC under test; under the control of the control device, the second selector inputs the signals output from the LDO port and the reference voltage port of the specified ADC under test to the two-channel voltage input port of the standard ADC.

[0010] Furthermore, both the first selector and the second selector are mounted on a circuit board, which is also provided with a power strip for mounting analog-to-digital converter devices.

[0011] This application also provides a method for debugging an internal parameter group of an analog-to-digital converter, applied to the debugging system described above. The method includes the following steps:

[0012] The control device sends an external reference voltage operating mode setting command to the standard analog-to-digital converter, setting the standard analog-to-digital converter to the external reference voltage operating mode;

[0013] The control device sends a parameter debugging mode setting command and preset parameter group data to the analog-to-digital converter under test, sets the analog-to-digital converter under test to parameter debugging mode, and selects the preset parameter group data as the initial parameters of the analog-to-digital converter under test.

[0014] The voltage of the analog-to-digital converter under test (ADC) is measured using a standard ADC device, and the corresponding parameters are adjusted to correct the LDO voltage value and reference voltage value of the ADC device under test.

[0015] By measuring the voltage of an external adjustable voltage source using a standard analog-to-digital converter (ADC) and the ADC under test (DUT) respectively, the error of the measured conversion values ​​of the standard ADC and the DUT is calculated. By measuring the voltage of the DUT using the standard ADC, the corresponding parameters are adjusted to correct the offset error, gain error, and high and low temperature compensation of the DUT, and the final internal parameter set data after adjustment is obtained.

[0016] The control device sends the programming mode setting command and the final internal parameter set data to the analog-to-digital converter under test, and programs the final internal parameter set into the analog-to-digital converter under test.

[0017] Furthermore, adjusting the corresponding parameters to correct the LDO voltage and reference voltage values ​​of the analog-to-digital converter under test specifically includes:

[0018] Adjust the LDO voltage of the analog-to-digital converter under test to the first preset value;

[0019] The LDO voltage output of the analog-to-digital converter under test is used as one channel input of the standard analog-to-digital converter. The voltage conversion value of this channel is obtained and compared with the first preset value. The first parameter affecting the LDO voltage value is adjusted until the absolute difference between the voltage conversion value of this channel and the first preset value is less than the preset threshold. The first parameter corresponding to this time is used as the final parameter and the initial parameter value for subsequent debugging.

[0020] Adjust the internal reference voltage of the analog-to-digital converter under test to the second preset value;

[0021] The reference voltage output of the analog-to-digital converter under test is used as another channel input of the standard analog-to-digital converter. The voltage conversion value of this channel is obtained and compared with the second preset value. The second parameter affecting the reference voltage value is adjusted until the absolute difference between the voltage conversion value of this channel and the second preset value is less than the preset threshold. The corresponding second parameter at this time is used as the initial parameter value for subsequent debugging.

[0022] Furthermore, adjusting the corresponding parameters to correct the offset error, gain error, and high / low temperature compensation of the analog-to-digital converter under test specifically includes:

[0023] An external adjustable voltage source simultaneously inputs voltage to several input channels of both the analog-to-digital converter (ADC) under test (DUT) and the standard ADC. The voltage conversion values ​​of the corresponding channels of the DUT and the standard ADC are read, and the sum of the DC offset errors of the DUT is calculated. The third parameter affecting the DC offset error is adjusted until the sum of the DC offset errors of the DUT meets a preset condition. This third parameter is then used as the initial parameter value for subsequent debugging. Similarly, the sum of the gain errors of the DUT is calculated, and the fourth parameter affecting the gain error is adjusted until the sum of the gain errors of the DUT meets a preset condition. This fourth parameter is then used as the initial parameter value for subsequent debugging.

[0024] Adjust the internal reference voltage of the analog-to-digital converter under test to the second preset value;

[0025] Under preset ambient temperature, high temperature and low temperature conditions, the fifth parameter affecting high and low temperature compensation is traversed; the reference voltage output of the analog-to-digital converter under test is used as one channel input of the standard analog-to-digital converter, the voltage conversion value of the channel is obtained, and the reference voltage values ​​corresponding to the traversal of the fifth parameter are recorded.

[0026] Find the parameter with the smallest voltage conversion value fluctuation under high and low temperature conditions and use it as the fifth parameter; and use the corresponding fifth parameter as the final parameter and the initial parameter value for subsequent debugging.

[0027] After measuring the output voltage of the external adjustable voltage input to the analog-to-digital converter device under test again, calculate the DC offset error and gain error of the analog-to-digital converter device under test at this time. Adjust the third parameter affecting the DC offset error and the fourth parameter affecting the gain error until the sum of the DC offset error and the sum of the gain error of the analog-to-digital converter device under test meet the preset conditions. Then, take the corresponding third parameter and fourth parameter as the final parameter set.

[0028] Furthermore, the first preset value is 1.8V; the second preset value is 2.5V.

[0029] Furthermore, the preset high temperature, normal temperature, and low temperature are selected within the extreme temperature range of the operating environment of the analog-to-digital converter device under test.

[0030] Furthermore, the first parameter affecting the LDO voltage value is a reverse adjustment parameter, and the second parameter affecting the reference voltage value is a positive adjustment parameter.

[0031] Furthermore, the third parameter affecting the direct offset error and the fourth parameter affecting the gain error are positive adjustment parameters.

[0032] Furthermore, the internal parameter sets are all multi-bit binary values ​​within a finite range.

[0033] The technical solution proposed in this invention involves outputting the LDO voltage and reference voltage of the ADC under test (DUT) to the input channel of the standard ADC. An external adjustable voltage is simultaneously input to the input channels of both the DUT and the standard ADC. A control device controls both the DUT and the standard ADC through a specified interface protocol. Following a designed automatic parameter tuning process for the DUT, the internal parameters are tuned to correct measurement errors. The correct parameters are then written into the DUT, achieving automatic tuning. This solution is a fully automated method for tuning internal parameter groups. By adjusting parameters, the internal parameter groups of each analog-to-digital converter (ADC) within a batch can be adjusted in batches, significantly reducing tedious manual operations and greatly improving efficiency. Furthermore, the tuning process fully considers device compensation under various high and low temperature conditions, greatly improving the reliability of the ADC. Attached Figure Description

[0034] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0035] Figure 1 An adjustment system for the internal parameter group of an analog-to-digital converter is provided in an embodiment of the present invention;

[0036] Figure 2 Another debugging system for the internal parameter group of an analog-to-digital converter provided in this embodiment of the invention;

[0037] Figure 3 This invention provides a method for debugging the internal parameter group of an analog-to-digital converter. Detailed Implementation

[0038] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0039] like Figure 1 , Figure 2 As shown, the present invention proposes a debugging system for the internal parameter set of an analog-to-digital converter (ADC), comprising: a standard ADC with its internal parameter set already debugged, one or N (N>1 integer) ADCs to be debugged (ADCs under test), and a control device.

[0040] The external reference voltage port VREF of the standard analog-to-digital converter is connected to an external standard voltage of 3.3V; the eight channel (ch0-ch7) voltage input ports of the analog-to-digital converter under test are connected to an external adjustable voltage source.

[0041] The control device communicates with standard analog-to-digital converters (ADCs) and ADCs under test (DUTs) via a preset interface. The control device can be an industrial computer, PC, laptop, etc.

[0042] The LDO port (LDO) and reference voltage port (VREF) of the analog-to-digital converter under test are connected to the two-channel (ch0, ch1) voltage input ports of the standard analog-to-digital converter; the remaining channels (ch2-ch7) voltage input ports of the standard analog-to-digital converter are connected to an external adjustable voltage source.

[0043] like Figure 2As shown, when the number of analog-to-digital converters (ADCs) to be tested is greater than one, the circuit further includes: a first selector and a second selector; the first selector is connected between the control device and the ADC under test; under the control of the control device, the first selector enables the control device to communicate with the specified ADC under test; the second selector is connected between the standard ADC and the ADC under test; under the control of the control device, the second selector inputs the signals output from the LDO port and the reference voltage port of the specified ADC under test to the two-channel (ch0, ch1) voltage input ports of the standard ADC.

[0044] Both the first and second selectors are common data selectors used in digital circuits. The appropriate selector size is chosen based on the number of analog-to-digital converters (ADCs) under test. Both selectors are soldered onto a PCB board, which also has chip connectors for connecting the ADCs. The ADCs can be easily inserted into the chip connectors for debugging. After debugging, the successfully debugged ADC can be removed from the chip connectors and replaced with the next batch of ADCs for further debugging, greatly improving debugging efficiency.

[0045] A method for debugging an internal parameter group of an analog-to-digital converter, the method comprising:

[0046] The control device sends an external reference voltage operating mode setting command to the standard analog-to-digital converter, setting the standard analog-to-digital converter to the external reference voltage operating mode.

[0047] The control device sends a parameter debugging mode setting command and preset parameter group data to the analog-to-digital converter under test, sets the analog-to-digital converter under test to parameter debugging mode, and selects the preset parameter group data as the initial parameters of the analog-to-digital converter under test.

[0048] The voltage of the analog-to-digital converter under test (ADC) is measured using a standard ADC device, and the corresponding parameters are adjusted to correct the LDO voltage value and reference voltage value of the ADC device under test.

[0049] Specifically, the LDO voltage of the ADC under test is measured through the ch0 channel of the standard ADC, and the reference voltage of the ADC under test is measured through the ch1 channel of the standard ADC.

[0050] like Figure 3 As shown, adjusting the corresponding parameters to correct the LDO voltage and reference voltage values ​​of the analog-to-digital converter under test specifically includes:

[0051] Adjust the LDO voltage of the analog-to-digital converter (ADC) under test to a first preset value of 1.8V. Use the LDO voltage output of the ADC under test as the input of one channel (ch0) of the standard ADC, obtain the voltage conversion value of that channel, and compare the voltage conversion value with the first preset value. Adjust the first parameter affecting the LDO voltage value until the voltage conversion value of that channel approaches the first preset value, and use the corresponding first parameter as the final parameter and the initial parameter value for subsequent adjustments. The first parameter affecting the LDO voltage value is a reverse adjustment parameter. If the voltage conversion value of the channel is greater than the first preset value, the first parameter needs to be increased. Since the first parameter is a reverse adjustment parameter, the voltage conversion value of the channel will decrease so that the absolute difference between the voltage conversion value of that channel and the first preset value is less than a preset threshold.

[0052] The internal reference voltage of the analog-to-digital converter (ADC) under test is adjusted to the second preset value of 2.5V. The reference voltage output of the ADC under test is used as the input of another channel (ch1) of the standard ADC, and the voltage conversion value of this channel is obtained. This voltage conversion value is compared with the second preset value. The second parameter affecting the reference voltage value is adjusted until the voltage conversion value of this channel approaches the second preset value, and the corresponding second parameter is used as the initial parameter value for subsequent adjustments. The second parameter affecting the reference voltage value is a positive adjustment parameter. If the voltage conversion value of the channel is greater than the second preset value, the second parameter needs to be reduced. Since the second parameter is a positive adjustment parameter, the voltage conversion value of the channel will decrease so that the absolute difference between the voltage conversion value of this channel and the second preset value is less than a preset threshold.

[0053] By measuring the voltage of an external adjustable voltage source using a standard analog-to-digital converter (ADC) and the ADC under test (DUT), respectively, the errors in the measured conversion values ​​of the standard ADC and the DUT are calculated. Furthermore, by measuring the voltage of the DUT using the standard ADC, the corresponding parameters are adjusted to correct the offset error, gain error, and high / low temperature compensation of the DUT.

[0054] like Figure 3 As shown, adjusting the corresponding parameters to correct the offset error, gain error, and high / low temperature compensation of the analog-to-digital converter under test specifically includes:

[0055] An external adjustable voltage source can simultaneously input several different voltages to several input channels of both the analog-to-digital converter (ADC) under test (DUT) and the standard ADC. The voltage conversion values ​​of the corresponding channels of the DUT and the standard ADC are read, and the sum of the DC offset errors of the DUT is calculated. The third parameter affecting the DC offset error is adjusted until the sum of the DC offset error and the sum of the gain error of the DUT both meet preset conditions. This third parameter is then used as the initial parameter value for subsequent debugging. The third parameter affecting the DC offset error is a positive adjustment parameter. Similarly, the sum of the gain errors of the DUT is calculated, and the fourth parameter affecting the gain error is adjusted until the sum of the gain errors of the DUT meets preset conditions. This fourth parameter is then used as the initial parameter value for subsequent debugging. The fourth parameter affecting the gain error is a positive adjustment parameter. The debugging order for the DC offset error and gain error can be interchanged; the parameter affecting the DC offset error can be debugged first, or the parameter affecting the gain error can be debugged first.

[0056] The internal reference voltage of the analog-to-digital converter (ADC) under test is adjusted to a second preset value. The fifth parameter affecting high and low temperature compensation is iterated under preset room temperature, high temperature, and low temperature conditions. The reference voltage output of the ADC under test is used as one channel input of a standard ADC, and the voltage conversion value of that channel is obtained. The reference voltage values ​​corresponding to the traversed fifth parameter are recorded. The parameter with the smallest voltage conversion value fluctuation under high and low temperature conditions is identified as the fifth parameter. Specifically, the parameter with the smallest sum of the conversion differences between room temperature and high temperature, and between room temperature and low temperature, can be identified as the fifth parameter. The corresponding fifth parameter is then used as the final parameter and the initial parameter value for subsequent adjustments. In other embodiments, the parameter with the smallest sum of the squares of the conversion differences between room temperature and high temperature, and between room temperature and low temperature, can also be identified as the fifth parameter.

[0057] The preset high, normal, and low temperatures are selected within the extreme temperature range of the operating environment of the analog-to-digital converter (ADC) device under test. Different temperatures are selected depending on the application scenario of the chip and the required testing standards. For automotive electronic chips, the boundary values ​​of the AEC-Q100 testing standard can be used as the basis for high and low temperature selection. For example, 20 degrees Celsius can be selected for normal temperature, 85 degrees Celsius for high temperature, and -40 degrees Celsius for low temperature. Alternatively, a 10-degree Celsius margin can be reserved at the upper and lower boundaries, with 95 degrees Celsius selected for high temperature and -50 degrees Celsius for low temperature.

[0058] List all possible values ​​of the fifth parameter. For each value, calculate the corresponding voltage conversion value at room temperature, high temperature, and low temperature. Calculate the absolute value of the conversion difference between room temperature and high temperature, and the absolute value of the conversion difference between room temperature and low temperature for each value. Determine the value with the smallest sum of the two as the final fifth parameter.

[0059] By fully considering device compensation under various high and low temperature conditions during the debugging process, the reliability of analog-to-digital converter devices can be greatly improved.

[0060] After measuring the output voltage of the external adjustable voltage input to the analog-to-digital converter device under test again, calculate the DC offset error and gain error of the analog-to-digital converter device under test at this time. Adjust the third parameter affecting the DC offset error and the fourth parameter affecting the gain error until the sum of the DC offset error and the sum of the gain error of the analog-to-digital converter device under test meet the preset conditions. Then, take the corresponding third parameter and fourth parameter as the final parameter set.

[0061] Since the analog-to-digital converter under test has multiple internal parameters and different characteristics of the controller, each parameter needs to be adjusted in the above order in order to obtain the best adjustment and calibration parameters.

[0062] The control device sends a command to set the programming mode and the final internal parameter set data to the analog-to-digital converter under test to be debugged, and programs the final internal parameter set into the analog-to-digital converter under test.

[0063] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of the present invention should be included within the protection scope of the present invention.

Claims

1. A system for debugging internal parameter groups of an analog-to-digital converter, characterized in that, include: One standard analog-to-digital converter with its internal parameter set already debugged, one or more analog-to-digital converters to be debugged, and control equipment; The external reference voltage port of the standard analog-to-digital converter is connected to an external standard voltage; the multi-channel voltage input port of the analog-to-digital converter under test is connected to an external adjustable voltage source. The control device communicates with the standard analog-to-digital converter and the analog-to-digital converter under test through a preset interface; The LDO port and reference voltage port of the analog-to-digital converter under test are connected to the two-channel voltage input port of the standard analog-to-digital converter. The remaining voltage input ports of the standard analog-to-digital converter are connected to an external adjustable voltage source. When the number of analog-to-digital converters (ADCs) to be tested is greater than one, the system further includes: a first selector and a second selector; the first selector is connected between the control device and the ADC under test; under the control of the control device, the first selector enables the control device to communicate with the specified ADC under test; the second selector is connected between the standard ADC and the ADC under test; under the control of the control device, the second selector inputs the signals output from the LDO port and the reference voltage port of the specified ADC under test to the two-channel voltage input port of the standard ADC.

2. The debugging system according to claim 1, characterized in that, Both the first selector and the second selector are mounted on a circuit board, which is also provided with a power strip for mounting analog-to-digital converter devices.

3. A method for debugging the internal parameter group of an analog-to-digital converter, applied to the debugging system described in any one of claims 1-2, characterized in that: The method includes the following steps: The control device sends an external reference voltage operating mode setting command to the standard analog-to-digital converter, setting the standard analog-to-digital converter to the external reference voltage operating mode; The control device sends a parameter debugging mode setting command and preset parameter group data to the analog-to-digital converter under test, sets the analog-to-digital converter under test to parameter debugging mode, and selects the preset parameter group data as the initial parameters of the analog-to-digital converter under test. The voltage of the analog-to-digital converter under test (ADC) is measured using a standard ADC device, and the corresponding parameters are adjusted to correct the LDO voltage value and reference voltage value of the ADC device under test. By measuring the voltage of an external adjustable voltage source using a standard analog-to-digital converter (ADC) and the ADC under test (DUT) respectively, the error of the measured conversion values ​​of the standard ADC and the DUT is calculated. By measuring the voltage of the DUT using the standard ADC, the corresponding parameters are adjusted to correct the offset error, gain error, and high and low temperature compensation of the DUT, and the final internal parameter set data after adjustment is obtained. The control device sends the programming mode setting command and the final internal parameter set data to the analog-to-digital converter under test, and programs the final internal parameter set into the analog-to-digital converter under test.

4. The method according to claim 3, characterized in that, Adjusting the corresponding parameters to calibrate the LDO voltage and reference voltage of the analog-to-digital converter under test specifically includes: Adjust the LDO voltage of the analog-to-digital converter under test to the first preset value; The LDO voltage output of the analog-to-digital converter under test is used as one channel input of the standard analog-to-digital converter. The voltage conversion value of this channel is obtained and compared with a first preset value. The first parameter affecting the LDO voltage value is adjusted until the absolute difference between the voltage conversion value of this channel and the first preset value is less than a preset threshold. The first parameter corresponding to this point is used as the final parameter and the initial parameter value for subsequent debugging. Adjust the internal reference voltage of the analog-to-digital converter under test to the second preset value; The reference voltage output of the analog-to-digital converter under test is used as another channel input of the standard analog-to-digital converter. The voltage conversion value of this channel is obtained and compared with the second preset value. The second parameter affecting the reference voltage value is adjusted until the absolute difference between the voltage conversion value of this channel and the second preset value is less than the preset threshold. The corresponding second parameter at this time is used as the initial parameter value for subsequent debugging.

5. The method according to claim 3, characterized in that, Adjusting the corresponding parameters to correct the offset error, gain error, and high / low temperature compensation of the analog-to-digital converter under test specifically includes: An external adjustable voltage source simultaneously inputs voltage to several input channels of both the analog-to-digital converter (ADC) under test (DUT) and the standard ADC. The voltage conversion values ​​of the corresponding channels of the DUT and the standard ADC are read, and the sum of the DC offset errors of the DUT is calculated. The third parameter affecting the DC offset error is adjusted until the sum of the DC offset errors of the DUT meets a preset condition. This third parameter is then used as the initial parameter value for subsequent debugging. Similarly, the sum of the gain errors of the DUT is calculated, and the fourth parameter affecting the gain error is adjusted until the sum of the gain errors of the DUT meets a preset condition. This fourth parameter is then used as the initial parameter value for subsequent debugging. Adjust the internal reference voltage of the analog-to-digital converter under test to the second preset value; Under preset ambient temperature, high temperature and low temperature conditions, the fifth parameter affecting high and low temperature compensation is traversed; the reference voltage output of the analog-to-digital converter under test is used as one channel input of the standard analog-to-digital converter, the voltage conversion value of the channel is obtained, and the reference voltage values ​​corresponding to the traversal of the fifth parameter are recorded. Find the parameter with the smallest voltage conversion value fluctuation under high and low temperature conditions and use it as the fifth parameter; and use the corresponding fifth parameter as the final parameter and the initial parameter value for subsequent debugging. After measuring the output voltage of the external adjustable voltage input to the analog-to-digital converter device under test again, calculate the DC offset error and gain error of the analog-to-digital converter device under test at this time. Adjust the third parameter affecting the DC offset error and the fourth parameter affecting the gain error until the sum of the DC offset error and the sum of the gain error of the analog-to-digital converter device under test meet the preset conditions. Then, take the corresponding third parameter and fourth parameter as the final parameter set.

6. The method according to claim 4, characterized in that, The first preset value is 1.8V; the second preset value is 2.5V.

7. The method according to claim 5, characterized in that, The preset high temperature, normal temperature, and low temperature are selected within the extreme temperature range of the operating environment of the analog-to-digital converter device under test.

8. The method according to claim 4, characterized in that, The first parameter affecting the LDO voltage value is a reverse adjustment parameter, and the second parameter affecting the reference voltage value is a positive adjustment parameter.

9. The method according to claim 5, characterized in that, The third parameter affecting the direct offset error and the fourth parameter affecting the gain error are positive adjustment parameters.

10. The method according to claim 5, characterized in that, The internal parameter sets are all multi-bit binary values ​​within a finite range.

Images