A magnetoelectric transport performance measurement sample and a preparation method thereof

Abstract

This invention provides a sample for measuring magnetoelectric transport properties, comprising a substrate layer, a liquid metal layer, and an encapsulation layer arranged sequentially from bottom to top. Metal electrodes are disposed on the substrate layer. This invention also provides a method for preparing the sample for measuring magnetoelectric transport properties. Compared with existing technologies, this invention has the following advantages: The sample preparation employs physical deposition, direct-write printing / screen printing, and encapsulation techniques, resulting in a three-layer structure: a substrate layer, a liquid metal layer, and an encapsulation layer. The substrate layer is prepared using a mask or photolithography method, and the required four-terminal measurement metal electrodes are obtained through physical deposition. The liquid metal layer consists of liquid metal lines laid / brushed onto the substrate electrodes using direct-write printing / screen printing. The top layer is a silicone encapsulation layer, primarily used to suppress the flow of the liquid metal lines. Deposited electrodes are led outwards and connected to the test ports to realize the testing of the liquid metal magnetoelectric transport properties.

Description

Technical Field

[0001] This invention relates to the field of measuring the magnetoelectric transport properties of liquid metals, and more specifically, to a sample for measuring magnetoelectric transport properties and a method for preparing the same. Background Technology

[0002] The physical properties of liquid metals have always been an important research topic in the scientific and industrial communities. Studying the alloy structure and properties of liquid metals as a function of temperature is of great significance for the development of materials science and engineering, condensed matter physics, and other disciplines. Studying the changes in physical properties with factors such as composition and temperature also has a profound impact on the optimization of processes such as casting, metallurgy, crystal growth, and glass transition.

[0003] The resistivity of liquid metals, as a sensitive physical quantity related to their structure, is a focus of attention. Obtaining accurate and effective measurement data is crucial for its research. Currently, the commonly used measurement method involves using self-built measuring devices, which can be categorized based on different measurement principles, such as eddy current methods, electromagnetic induction methods, depth difference methods, four-electrode methods, and rotating magnetic field methods. Compared with mature solid-state material measurement equipment, such as the Physical Properties Measurement System (PPMS) and low-temperature high magnetic field systems, these testing devices still have shortcomings in data acquisition efficiency and accuracy. Therefore, achieving compatibility with currently advanced and mature equipment is key to solving this problem. Summary of the Invention

[0004] The main technical problem solved by this invention is to provide a sample for measuring magnetoelectric transport properties. By utilizing the adhesion between liquid metal and electrodes and through a three-layer structure design, a sample for measuring magnetoelectric transport properties that is compatible with solid sample testing devices can be achieved.

[0005] To achieve the above objectives, the present invention provides a sample for measuring magnetoelectric transport performance, comprising a substrate layer, a liquid metal layer and an encapsulation layer arranged sequentially from bottom to top, wherein a metal electrode is disposed on the substrate layer.

[0006] Preferably, the material of the substrate layer is selected from sapphire or surface-oxidized silicon wafers.

[0007] Preferably, the material of the metal electrode is selected from at least one of tungsten alloy, molybdenum alloy, and tungsten-molybdenum alloy.

[0008] Preferably, the material of the encapsulation layer is selected from at least one of thermoplastic elastomer, polydimethylsiloxane, aliphatic aromatic random copolyester, silicone, rubber, hydrogel, polyurethane, and polyethylene octene coelastomer.

[0009] Another object of the present invention is to provide a method for preparing a sample for measuring magnetoelectric transport properties, the preparation method specifically including the following steps:

[0010] S1. Metal electrodes are formed on the surface of the substrate layer using a patterning method;

[0011] S2. Lay the liquid metal onto the substrate layer obtained in step S1;

[0012] S3. The encapsulation layer material is flowed onto the liquid metal obtained in step S2, and then the encapsulation layer material is cured to obtain a sample for measuring magnetoelectric transport performance.

[0013] Preferably, in step S1, the patterning method is selected from coating, deposition, and printing.

[0014] Preferably, the deposition method is selected from thermal evaporation, electron beam evaporation, and magnetron sputtering.

[0015] Preferably, in step S3, the liquid metal placement method is selected from one of printing, solid-liquid transfer, or liquid metal transfer. Printing is suitable for metals and their alloys with low melting points that are liquid at room temperature; solid-liquid transfer is suitable for liquid metals and their alloys with melting points above room temperature that can undergo solid-state conversion at room temperature.

[0016] Compared with existing technologies, this invention has the following advantages: The test sample is prepared using physical deposition, direct-write printing / screen printing, and encapsulation techniques. The obtained sample has a three-layer structure, namely a substrate layer, a liquid metal layer, and an encapsulation layer. The substrate layer is prepared using a mask or photolithography method, and the metal electrodes to be measured by the four-terminal method are obtained through physical deposition. The liquid metal layer is formed by direct-write printing / screen printing of liquid metal lines onto the substrate electrodes. The top layer is a silicone encapsulation layer, which is mainly used to suppress the flow of liquid metal lines. The deposited electrodes are led outwards and connected to the test ports to realize the testing of the magnetoelectric transport performance of liquid metal. Attached Figure Description

[0017] Figure 1 This is a schematic diagram illustrating the preparation process of the sample for measuring the magnetoelectric transport properties of this invention.

[0018] Figure 2 The temperature-resistance curves showing the continuous solid-liquid variation of the magnetoelectric transport performance measurement sample prepared in an embodiment of the present invention are shown.

[0019] Explanation of reference numerals in the attached figures:

[0020] 1-Substrate layer; 2-Liquid metal layer; 3-Encapsulation layer; 11-Metal electrode. Detailed Implementation

[0021] To make the above-mentioned objects, features and advantages of the present invention more apparent and understandable, specific embodiments of the present invention will be described in detail below with reference to the accompanying drawings.

[0022] It should be understood that the terminology used in this invention is merely for describing particular embodiments and is not intended to limit the invention. Furthermore, with respect to numerical ranges in this invention, it should be understood that each intermediate value between the upper and lower limits of the range is also specifically disclosed. Every smaller range between any stated value or intermediate value within a stated range, and any other stated value or intermediate value within said range, is also included in this invention. The upper and lower limits of these smaller ranges may be independently included or excluded from the range.

[0023] Various modifications and variations can be made to the specific embodiments described in this specification without departing from the scope or spirit of the invention, as will be apparent to those skilled in the art. Other embodiments derived from this specification will also be readily apparent to those skilled in the art. This application specification and embodiments are merely exemplary.

[0024] An embodiment of the present invention provides a sample for measuring magnetoelectric transport performance, comprising a substrate layer 1, a liquid metal layer 2 and an encapsulation layer 3 arranged sequentially from bottom to top, and a metal electrode 11 disposed on the substrate layer 1.

[0025] In this embodiment of the invention, the material of the substrate layer 1 is selected from sapphire and surface-oxidized silicon wafers.

[0026] In this embodiment of the invention, the material of the metal electrode 11 is selected from at least one of tungsten alloy, molybdenum alloy and tungsten-molybdenum alloy.

[0027] In this embodiment of the invention, the material of the encapsulation layer 3 is selected from at least one of thermoplastic elastomer, polydimethylsiloxane, aliphatic aromatic random copolyester, silicone, rubber, hydrogel, polyurethane, and polyvinyl octene coelastomer.

[0028] like Figure 1 As shown in the figure, this embodiment of the invention also provides a method for preparing a sample for measuring magnetoelectric transport properties, which specifically includes the following steps:

[0029] S1. A metal electrode 11 is formed on the surface of the substrate layer 1 by a patterning method, wherein the patterning method is selected from coating, deposition, and printing, and the deposition method is selected from thermal evaporation, electron beam evaporation, and magnetron sputtering.

[0030] S2. Liquid metal is deposited onto the substrate layer 1 obtained in step S1 by printing, printing or solid-liquid transfer.

[0031] S3. The encapsulation layer 3 material is flowed onto the liquid metal obtained in step S2, and then the encapsulation layer 3 material is cured to obtain a semi-finished sample for measuring magnetoelectric transport performance.

[0032] The technical effects of the present invention will be described below with reference to specific embodiments.

[0033] Example 1

[0034] This embodiment provides a sample for measuring magnetoelectric transport performance, including a substrate layer 1, a liquid metal layer 2 and an encapsulation layer 3 arranged sequentially from bottom to top. A metal electrode 11 is disposed on the substrate layer 1. The material of the substrate layer 1 is sapphire, the material of the metal electrode 11 is tungsten alloy, and the material of the encapsulation layer 3 is thermoplastic elastomer.

[0035] The preparation method of the sample for measuring magnetoelectric transport properties in this embodiment includes the following steps:

[0036] S1. A metal electrode 11 is formed on the surface of the substrate layer 1 by a patterning method, wherein the patterning method is coating and the deposition method is thermal evaporation;

[0037] S2. Liquid metal is deposited onto the substrate layer 1 obtained in step S1 using a specific method;

[0038] S3. The encapsulation layer 3 material is flowed onto the liquid metal obtained in step S2, and then the encapsulation layer 3 material is cured to obtain a sample for measuring magnetoelectric transport performance.

[0039] Example 2

[0040] This embodiment provides a sample for measuring magnetoelectric transport performance, including a substrate layer 1, a liquid metal layer 2, and an encapsulation layer 3 arranged sequentially from bottom to top. A metal electrode 11 is disposed on the substrate layer 1. The material of the substrate layer 1 is selected from a silicon wafer with surface oxidation. The material of the metal electrode 11 is selected from tungsten alloy and molybdenum alloy. The material of the encapsulation layer 3 is selected from polydimethylsiloxane and aliphatic aromatic random copolyester.

[0041] The preparation method of the sample for measuring magnetoelectric transport properties in this embodiment includes the following steps:

[0042] S1. A metal electrode 11 is formed on the surface of the substrate layer 1 by a patterning method, wherein the patterning method is selected from printing and the deposition method is selected from magnetron sputtering.

[0043] S2. Liquid metal is printed onto the substrate layer 1 obtained in step S1.

[0044] S3. The encapsulation layer 3 material is flowed onto the liquid metal obtained in step S2, and then the encapsulation layer 3 material is cured to obtain a sample for measuring magnetoelectric transport performance.

[0045] Example 3

[0046] This embodiment provides a sample for measuring magnetoelectric transport performance, including a substrate layer 1, a liquid metal layer 2, and an encapsulation layer 3 arranged sequentially from bottom to top. A metal electrode 11 is disposed on the substrate layer 1. The material of the substrate layer 1 is selected from surface-oxidized silicon wafers. The material of the metal electrode 11 is selected from molybdenum alloy and tungsten-molybdenum alloy. The material of the encapsulation layer 3 is selected from rubber and hydrogel.

[0047] The preparation method of the sample for measuring magnetoelectric transport properties in this embodiment includes the following steps:

[0048] S1. A metal electrode 11 is formed on the surface of the substrate layer 1 by a patterning method, wherein the patterning method is selected from printing and the deposition method is selected from electron beam evaporation;

[0049] S2. Liquid metal is printed onto the substrate layer 1 obtained in step S1.

[0050] S3. The encapsulation layer 3 material is flowed onto the liquid metal obtained in step S2, and then the encapsulation layer 3 material is cured to obtain a sample for measuring magnetoelectric transport performance.

[0051] Example 4

[0052] This embodiment provides a sample for measuring magnetoelectric transport performance, including a substrate layer 1, a liquid metal layer 2, and an encapsulation layer 3 arranged sequentially from bottom to top. A metal electrode 11 is disposed on the substrate layer 1. The material of the substrate layer 1 is selected from sapphire. The material of the metal electrode 11 is selected from tungsten alloy and tungsten-molybdenum alloy. The material of the encapsulation layer 3 is selected from polyurethane and polyethylene octene co-elastomer.

[0053] The preparation method of the sample for measuring magnetoelectric transport properties in this embodiment includes the following steps:

[0054] S1. A metal electrode 11 is formed on the surface of the substrate layer 1 by a patterning method, wherein the patterning method is selected from coating and the deposition method is selected from thermal evaporation;

[0055] S2. Liquid metal is printed onto the substrate layer 1 obtained in step S1.

[0056] S3. The encapsulation layer 3 material is flowed onto the liquid metal obtained in step S2, and then the encapsulation layer 3 material is cured to obtain a sample for measuring magnetoelectric transport performance.

[0057] Example 5

[0058] This embodiment provides a sample for measuring magnetoelectric transport performance, including a substrate layer 1, a liquid metal layer 2, and an encapsulation layer 3 arranged sequentially from bottom to top. A metal electrode 11 is disposed on the substrate layer 1. The material of the substrate layer 1 is selected from a silicon wafer with surface oxidation. The material of the metal electrode 11 is selected from a molybdenum alloy. The material of the encapsulation layer 3 is selected from silicone.

[0059] The preparation method of the sample for measuring magnetoelectric transport properties in this embodiment includes the following steps:

[0060] S1. A metal electrode 11 is formed on the surface of the substrate layer 1 by a patterning method, wherein the patterning method is selected from coating and the deposition method is selected from magnetron sputtering;

[0061] S2. Liquid metal is deposited onto substrate layer 1 obtained in step S1 using a solid-liquid transfer method;

[0062] S3. The encapsulation layer 3 material is flowed onto the liquid metal obtained in step S2, and then the encapsulation layer 3 material is cured to obtain a sample for measuring magnetoelectric transport performance.

[0063] The metal electrode 11 on the magnetoelectric transport performance measurement sample prepared in Example 1 was connected to the test port via a lead wire, and then the magnetoelectric transport performance of the liquid metal was tested. The resulting temperature-resistance relationship curve of the solid-liquid continuous change is shown in the figure. Figure 2 As shown.

[0064] The test sample preparation of this invention employs physical deposition, direct-write printing / screen printing, and encapsulation techniques. The resulting sample has a three-layer structure: a substrate layer 1, a liquid metal layer 2, and an encapsulation layer 3. The substrate layer 1 is prepared using a mask or photolithography method, and the metal electrode 11 required for the four-terminal method measurement is obtained through physical deposition. The liquid metal layer 2 consists of liquid metal lines laid / brushed onto the substrate electrode using direct-write printing / screen printing. The top layer is a silicone encapsulation layer 3, primarily used to suppress the flow of the liquid metal lines. The deposited electrode is led outwards and connected to the test port to achieve the testing of the magnetoelectric transport performance of the liquid metal.

[0065] While the disclosure is as stated above, its scope of protection is not limited thereto. Those skilled in the art can make various changes and modifications without departing from the spirit and scope of this disclosure, and all such changes and modifications will fall within the protection scope of this invention.

Claims

1. A sample for measuring magnetoelectric transport properties, characterized in that, It includes a substrate layer (1), a liquid metal layer (2) and an encapsulation layer (3) arranged sequentially from bottom to top, and a metal electrode (11) is disposed on the substrate layer (1); The material of the substrate layer (1) is selected from sapphire and surface-oxidized silicon wafer; The material of the metal electrode (11) is selected from at least one of tungsten alloy, molybdenum alloy and tungsten-molybdenum alloy; The material of the encapsulation layer (3) is selected from at least one of thermoplastic elastomer, polydimethylsiloxane, aliphatic aromatic random copolyester, silicone, rubber, hydrogel, polyurethane, and polyethylene octene coelastomer.

2. A method for preparing a sample for measuring magnetoelectric transport properties as described in claim 1, characterized in that, The preparation method specifically includes the following steps: S1. A metal electrode (11) is formed on the surface of the substrate layer (1) by a patterning method; S2. Lay the liquid metal onto the substrate layer (1) obtained in step S1; S3. The encapsulation layer (3) material is flowed onto the liquid metal obtained in step S2, and then the encapsulation layer (3) material is cured to obtain a sample for measuring magnetoelectric transport performance.

3. The method for preparing a sample for measuring magnetoelectric transport properties as described in claim 2, characterized in that, In step S1, the patterning method is selected from coating, deposition, and printing.

4. The method for preparing a sample for measuring magnetoelectric transport properties as described in claim 3, characterized in that, The deposition method is selected from one of thermal evaporation, electron beam evaporation, and magnetron sputtering.

5. The method for preparing a sample for measuring magnetoelectric transport properties as described in claim 2, characterized in that, In step S3, the liquid metal laying method is selected from one of printing, printing, and solid-liquid transfer.

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