LED linear constant current control chip high voltage and reference voltage test system and method

Abstract

The application belongs to the technical field of chip testing, and discloses a high-voltage and reference voltage test system and method for an LED linear constant-current control chip. The IC test machine system receives test instructions from a computer host, generates test signals according to the test instructions, and controls the DUT board according to the control signals obtained from the test signals. The voltage and current source module obtains voltage and current signals according to the test signals, and provides voltage or current to the chip under test according to the voltage and current signals to enable the chip under test to be tested. The measurement module obtains the data type to be measured according to the test signals, acquires the test data of the chip under test according to the data type, and feeds back the test data to the IC test machine system to generate test results. When the test results are abnormal, the IC test machine system generates a stop test instruction to stop the test. Through the above modules, the chip under test can be precisely controlled, the damage of the chip under test can be detected, and the quality of the chip can be ensured.

Description

Technical Field

[0001] This invention relates to the field of chip testing technology, and in particular to a high voltage and reference voltage testing system and method for LED linear constant current control chips. Background Technology

[0002] In the process of testing LED linear constant current control chips, it is inevitable that there will be poor contact between the gold fingers and the chip. When the gold fingers clamp the chip, causing poor contact or misalignment and resulting in discharge, the high voltage will instantly reach the clamping voltage of 1000V and break down the constant current control chip. This system can detect the damage to the constant current control chip in the first instance and issue a stop test command to the equipment in the first instance. At the same time, the reference voltage test of the chip can ensure that each port of the chip can output current within the standard range.

[0003] The above content is only used to help understand the technical solution of the present invention and does not represent an admission that the above content is prior art. Summary of the Invention

[0004] The main objective of this invention is to provide a high voltage and reference voltage testing system and method for LED linear constant current control chips, aiming to solve the technical problem that existing technologies cannot promptly handle damaged chips during chip testing.

[0005] To achieve the above objectives, the present invention provides a high-voltage and reference voltage testing system for LED linear constant current control chips. The system includes: a computer host, an IC testing machine system, a DUT board, and the LED linear constant current control chip under test. The computer host is connected to the IC testing machine system, which includes a voltage and current source module, a measurement module, and a control module. The DUT board integrates the voltage and current source module, the measurement module, and the control module to form a DUT board interface. The LED linear constant current control chip under test is connected to the corresponding interface of the DUT board.

[0006] The IC testing machine system is used to receive test commands from the computer host and generate test signals according to the test commands;

[0007] The control module is used to obtain a control signal based on the test signal, and to control the DUT board based on the control signal;

[0008] The voltage and current source module is used to obtain voltage and current signals based on the test signal, and to provide voltage or current to the LED linear constant current control chip under test based on the voltage and current signals, so that the LED linear constant current control chip under test can be tested based on the voltage or current.

[0009] The measurement module is used to obtain the data type to be measured based on the test signal, acquire the relevant test data of the LED linear constant current control chip under test based on the data type, and feed the relevant test data back to the IC testing machine system to generate test results;

[0010] When the test result is abnormal, the IC testing machine system is also used to generate a stop test command to stop the test.

[0011] Optionally, the DUT board includes several relays, one end of which is connected to the corresponding interface of the DUT board, and the other end is connected to the corresponding pin of the linear constant current control chip of the LED under test.

[0012] Optionally, the voltage and current source module includes a high-voltage voltage and current source unit and a voltage and current source unit, and the control module includes a relay control unit;

[0013] The high voltage and current source unit is connected to the high voltage and current source interface. The high voltage and current source interface is connected to the power input and constant current output port of the LED linear constant current control chip under test through a corresponding relay.

[0014] The voltage and current source unit is connected to the voltage and current source interface, and the voltage and current source interface is connected to the REXT output current value setting port of the linear constant current control chip of the LED under test through a corresponding relay.

[0015] The relay control unit is connected to the relay control interface and is used to control the on / off state of the relay.

[0016] Optionally, the voltage and current source module further includes a low-voltage current source unit and a power voltage and current source unit;

[0017] The low voltage current source unit is connected to the low voltage current source interface, and the low voltage current source interface is connected to the REXT output current value setting port of the linear constant current control chip of the LED under test.

[0018] The power voltage and current source unit is connected to the power voltage and current source interface, which is connected to one end of the alarm, and the other end of the alarm is grounded.

[0019] Optionally, the voltage and current source module includes a voltage and current source unit and a low voltage and current source unit, the control module includes a relay control unit, and the measurement module includes a digital DC voltmeter unit;

[0020] The voltage and current source unit is connected to the corresponding relays through the voltage and current source interface of the DUT board, and the relays are connected to the constant current output port of the linear constant current control chip of the LED under test.

[0021] The low voltage current source unit is connected to the corresponding relay through the low voltage current source unit of the DUT board, and the relay is connected to the power input and constant current output port of the VIN pin of the chip under test.

[0022] The digital DC voltmeter unit is connected to the digital DC voltmeter interface of the DUT board. The digital DC voltmeter interface is connected to the REXT output current value setting port of the linear constant current control chip of the LED under test through a corresponding relay.

[0023] The digital DC voltmeter interface is also connected to one end of a resistor via a relay, and the other end of the resistor is grounded.

[0024] Optionally, the computer host includes a PCI card, and the computer host controls the voltage and current source unit, measurement unit, and control unit of the IC test machine system through the PCI card.

[0025] Furthermore, to achieve the above objectives, this invention also proposes a method for testing high voltage and reference voltage of an LED linear constant current control chip. This method is applied to the aforementioned LED linear constant current control chip high voltage and reference voltage testing system. The LED linear constant current control chip high voltage and reference voltage testing system includes: a computer host, an IC testing machine system, a DUT board, and the LED linear constant current control chip under test. The computer host is connected to the IC testing machine system. The IC testing machine system includes a voltage and current source module, a measurement module, and a control module. The DUT board integrates the voltage and current source module, the measurement module, and the control module to form a DUT board interface. The LED linear constant current control chip under test is connected to the corresponding interface of the DUT board.

[0026] The high voltage and reference voltage testing methods for the LED linear constant current control chip include:

[0027] The IC testing machine system is used to receive test commands from the computer host and generate test signals according to the test commands;

[0028] The control module obtains a control signal based on the test signal, and controls the DUT board according to the control signal;

[0029] The voltage and current source module obtains voltage and current signals based on the test signal, and provides voltage or current to the LED linear constant current control chip under test based on the voltage and current signals, so that the LED linear constant current control chip under test can perform testing based on the voltage or current.

[0030] The measurement module obtains the data type to be measured based on the test signal, acquires the relevant test data of the LED linear constant current control chip under test based on the data type, and feeds the relevant test data back to the IC testing machine system to generate test results;

[0031] When the test result is abnormal, the IC testing machine system is also used to generate a stop test command to stop the test.

[0032] Optionally, the voltage and current source module includes a voltage and current source unit and a high voltage and current source unit. The voltage and current source module obtains a voltage and current signal based on the test signal, and provides voltage or current to the LED linear constant current control chip under test based on the voltage and current signal, so that the LED linear constant current control chip under test performs testing based on the voltage or current, including:

[0033] The high-voltage current source unit obtains a high-voltage current signal based on the test signal, and provides a target high current to the pin of the linear constant current control chip of the LED under test connected to the high-voltage current source unit;

[0034] The voltage and current source unit obtains voltage and current signals based on the test signal, and provides a target voltage to the pin of the LED linear constant current control chip connected to the voltage and current source unit, so that the LED linear constant current control chip under test can be tested according to the target voltage and target current.

[0035] Optionally, the voltage and current source module further includes a low-voltage current source unit and a power voltage and current source unit. The voltage and current source module obtains voltage and current signals based on the test signal, and provides voltage or current to the LED linear constant current control chip under test based on the voltage and current signals. After the LED linear constant current control chip under test is tested based on the voltage or current, the module further includes:

[0036] During the test, when the test voltage is higher than the preset voltage, the low voltage current unit obtains a low voltage current signal according to the test signal, and provides a target low current to the REXT output current value setting port of the LED linear constant current control chip connected to the low voltage current unit, and measures the voltage of the REXT output current value setting port.

[0037] If the voltage at the REXT output current setting port is higher than the ignition voltage, the power voltage supply unit obtains the power voltage current signal based on the test signal and provides the target power voltage current to the alarm connected to the power voltage current unit, causing the alarm to sound.

[0038] Optionally, the voltage and current source module includes a voltage and current source unit and a low voltage and current source unit; the control module includes a relay control unit; the measurement module includes a digital DC voltmeter unit; the measurement module obtains the data type to be measured based on the test signal, acquires relevant test data of the LED linear constant current control chip under test based on the data type, and feeds back the relevant test data to the IC testing machine system to generate test results, including:

[0039] The relay control unit obtains a relay control signal based on the test signal, and controls the corresponding relay to turn on and off according to the relay control signal;

[0040] The low voltage and current unit generates a low test voltage and current signal according to the test signal, and provides a target low test voltage to the power input and constant current output ports of the VIN pin of the LED linear constant current control chip connected to the low voltage and current unit.

[0041] The digital DC voltmeter unit obtains a measurement signal based on the test signal, sets the voltage of the port connected to the REXT output current value based on the measurement signal and the digital DC voltmeter unit, and feeds the voltage back to the IC test machine system, so that the IC test machine system can determine the voltage and generate a test result based on the determination result.

[0042] This invention utilizes an IC testing machine system to receive test commands from a computer host and generate test signals based on these commands. A control module is used to obtain control signals based on the test signals and control the DUT board accordingly. A voltage and current source module is used to obtain voltage and current signals based on the test signals and provide voltage or current to the LED linear constant current control chip under test, enabling the chip to be tested. A measurement module is used to obtain the data type to be measured based on the test signals, acquire relevant test data of the LED linear constant current control chip, and feed the test data back to the IC testing machine system to generate test results. If the test results are abnormal, the IC testing machine system also generates a stop test command to stop the test. These modules enable precise control of the chip under test, detection of chip damage, and ensure chip quality. Attached Figure Description

[0043] Figure 1 This is a system connection diagram of the first embodiment of the LED linear constant current control chip high voltage and reference voltage testing system of the present invention;

[0044] Figure 2 This is a schematic diagram of component connections in an embodiment of the LED linear constant current control chip high voltage and reference voltage testing system of the present invention;

[0045] Figure 3 This is a schematic diagram of the high-voltage test circuit connection of an embodiment of the high-voltage and reference voltage test system for an LED linear constant current control chip according to the present invention.

[0046] Figure 4 This is a schematic diagram showing the connection of the high voltage test circuit and the measurement and detection circuit of an embodiment of the high voltage and reference voltage test system for an LED linear constant current control chip according to the present invention.

[0047] Figure 5 This is a schematic diagram of the chip reference voltage testing and detection circuit connection of an embodiment of the LED linear constant current control chip high voltage and reference voltage testing system of the present invention;

[0048] Figure 6 This is a flowchart illustrating the high voltage and reference voltage testing method for the LED linear constant current control chip of the present invention.

[0049] Explanation of icon numbers:

[0050] label name label name 10 Computer host 20 IC testing system 30 DUT board 40 LED linear constant current control chip under test 20a Voltage and current source modules 20b Measurement module 20c Control module 30a Voltage and current source module interface 30b Measurement module interface 30c Control module interface 101 Computer host 305 DVM Digital DC Voltmeter Interface 102 IC Test System Control Software 306 TMU time measurement interface 103 PCI Card - Connectivity IC Test System 307 HVIS High Voltage and Current Source Interface 201 IC testing system 308 UR relay control interface 202 PVIS power voltage and current source unit 401 Golden Finger 203 VIS voltage and current source unit 402 High power factor LED linear constant current control chip 204 LVIS low voltage current source unit PIN1 VIN pin is the power input and constant current output port. 205 DVM Digital DC Voltmeter Unit PIN2 GND pin ground 206 TMU Time Measurement Unit PIN3 NC suspended foot 207 HVIS High Voltage and Current Source Unit PIN4 REXT output current setting port 208 UR relay control unit PIN5 OUT4 constant current output port 301 DUT board interface group PIN6 OUT3 constant current output port 302 PVIS power voltage and current source interface PIN7 OUT2 constant current output port 303 VIS voltage and current source interface PIN8 OUT1 constant current output port 304 LVIS Low Voltage Current Source Interface K1-K12 Relay control positions UR1-UR6 K13 Relay control grounding R Precision resistors D1 LED alarm light

[0051] The realization of the objective, functional features and advantages of the present invention will be further explained in conjunction with the embodiments and with reference to the accompanying drawings. Detailed Implementation

[0052] It should be understood that the specific embodiments described herein are for illustrative purposes only and are not intended to limit the scope of the invention.

[0053] This invention provides a high-voltage and reference voltage testing system for LED linear constant current control chips, referring to... Figure 1 , Figure 1 This is a schematic diagram of the system connection of the first embodiment of the LED linear constant current control chip high voltage and reference voltage testing system of the present invention.

[0054] In this embodiment, the LED linear constant current control chip high voltage and reference voltage testing system includes:

[0055] The system comprises a computer host 10, an IC testing machine system 20, a DUT board 30, and a linear constant current control chip for the LED under test 40. The IC testing machine system further includes a voltage and current source module 20a, a measurement module 20b, and a control module 20c. The DUT board 30 integrates the voltage and current source module 20a, the measurement module 20b, and the control module 20c into a DUT board interface. The DUT board interface includes a voltage and current source module interface 30a, a measurement module interface 30b, and a control module interface 30c, and is connected to the linear constant current control chip for the LED under test 40 through the DUT board interface.

[0056] The IC testing machine system 20 is used to receive test commands from the computer host 10 and generate test signals according to the test commands;

[0057] The control module 20c is used to obtain a control signal based on the test signal and control the DUT board 30 based on the control signal;

[0058] The voltage and current source module 20a is used to obtain voltage and current signals based on the test signal, and to provide voltage or current to the LED linear constant current control chip 40 under test based on the voltage and current signals, so that the LED linear constant current control chip 40 under test can perform tests based on the voltage or current.

[0059] The measurement module 20b is used to obtain the data type to be measured according to the test signal, acquire the relevant test data of the LED linear constant current control chip 40 under test according to the data type, and feed the relevant test data back to the IC test machine system 20 to generate test results;

[0060] When the test result is abnormal, the IC test machine system 20 is also used to generate a stop test command to stop the test.

[0061] It should be noted that the computer host 10 can generate test instructions and send the test instructions to the IC testing machine system 20. The test instructions include test modes, test conditions requiring time, and hardware connection status. The IC testing machine system 20 can receive the test instructions sent by the computer host 10 and analyze them to obtain test signals. The voltage and current source module 20a can obtain the corresponding voltage and current signals based on the test signals and obtain the corresponding voltage and current values ​​based on the voltage and current signals, providing the corresponding voltage or current to the LED linear constant current control chip 40 under test. The control module 20c can obtain control signals based on the test signals and perform corresponding control on the DUT board based on the control signals. The test module 20b can obtain the data type to be tested based on the test signals, including the pin voltage or pin current of the LED linear constant current control chip 40 under test.

[0062] In the specific implementation, refer to Figure 1 As shown, after the computer host 10 sends the test command to the IC testing machine system 20, the IC testing machine system 20 can generate a test signal according to the test command. The test command and the test signal are corresponding. The IC testing machine system 20 includes three modules: a voltage and current source module 20a, a control module 20b, and a measurement module 20c. Each module can analyze the test signal to obtain the corresponding signal. For example, the voltage and current source module 20a can obtain voltage and current signals according to the test signal, the control module 20b can obtain control signals according to the test signal, and the measurement module 20c can obtain the data type to be measured according to the test signal.

[0063] When the IC testing machine system 20 receives a test command sent by the computer host 10, it processes the test command accordingly, converting it into a test signal that can be recognized by the corresponding module in the IC testing machine system 20, and sends the test signal to the working module of the IC testing machine system, so that the working module works according to the test signal. The control module 20b can control the DUT board according to the control signal, so that the DUT board 30 and the LED linear constant current control chip 40 under test are connected in the connection method required for measurement and testing, and the voltage and current module 20a provides the corresponding voltage or current to the LED linear constant current control chip 40 under test, so that the LED linear constant current control chip 40 under test can generate the corresponding voltage or current, thereby enabling the measurement module 20c to measure the LED linear constant current control chip 40 under test, and feed back the measured relevant data to the IC testing machine system 20, so that the IC testing machine system generates the corresponding test result. If the test result is abnormal, the IC testing machine system 20 stops the test operation.

[0064] Reference Figure 2 , Figure 2 This is a schematic diagram of component connections in an embodiment of the LED linear constant current control chip high voltage and reference voltage testing system of the present invention.

[0065] In the LED linear constant current control chip high voltage and reference voltage test system, the computer host 10 includes a computer host 101, IC test system control software 102, and PCI card 103. The IC test machine system 20 includes an IC test machine system 201, a PVIS power voltage and current source unit 202, a VIS voltage and current source unit 203, an LVIS low voltage voltage and current source unit 204, a DVM digital DC voltmeter unit 205, a TMU time measurement unit 206, an HVIS high voltage voltage and current source unit 207, and a UR relay control unit 208. Among them, the PVIS power voltage and current source unit 202, VIS voltage and current source unit 203, LVIS low voltage voltage and current source unit 204, and HVIS high voltage voltage and current source unit 207 belong to the voltage and current source module 20a, the UR relay control unit 208 belongs to the control module 20b, and the DVM digital DC voltmeter unit 205 and TMU time measurement unit 206 belong to the measurement module 20c. Among them, the VIS voltage and current source unit 203 has a working voltage range of ±50V and a current range of ±350mA; the LVIS low voltage current source unit 204 has a working voltage range of ±24V and a current range of ±250mA; the PVIS power voltage and current source unit 202 has a working voltage range of ±50V and a current range of ±5A; the DVM digital DC voltmeter unit 205 has a measurement range of ±50V; and the HVIS high voltage voltage and current source unit 207 has a working voltage range of ±1000V and a current range of ±10mA. The DUT board 30 integrates the aforementioned units to form a DUT board interface group 301. This DUT board interface group includes a PVIS power voltage and current source unit interface 302, a VIS voltage and current source unit interface 303, an LVIS low-voltage voltage and current source unit interface 304, a DVM digital DC voltmeter unit interface 305, a TMU time measurement unit interface 306, an HVIS high-voltage voltage and current source unit interface 307, and a UR relay control unit interface 308. These interface groups connect to the high power factor LED linear constant current control chip 40 under test. The high power factor LED linear constant current control chip 40 is held by gold fingers 401 for high voltage and reference voltage testing of the LED linear constant current control chip.

[0066] In the specific implementation process, the computer host 101 serves as a window for information exchange with external devices. Based on actual testing needs, it can control the generation of corresponding test commands through the IC test machine system control software 102. With the help of the PCI card 103, the IC test machine system 201 is connected to the computer host 101, enabling data exchange. It can send test commands to the IC test machine system 201 or receive measurement data from the IC test machine system 201. Simultaneously, the DUT board 30 also includes several relays. One end of each relay is connected to a corresponding interface on the DUT board 30, and the other end is connected to a pin of the LED linear constant current control chip under test. By applying corresponding voltage or current to the chip under test and observing the conduction and cutoff states of the relays, the chip pins are measured, and the measurement results are determined. If the measurement result is normal, the test can continue; if the measurement result is abnormal, the test program will notify the test system to stop the test.

[0067] Furthermore, referring to Figure 3 , Figure 3 This is a schematic diagram of a high-voltage test circuit connection in one embodiment. The high power factor LED linear constant current control chip 40 under test includes 8 pins, which are named PIN1, PIN4, PIN5, PIN6, PIN7, and PIN8 respectively. These 8 pins correspond to the following functions: PIN1~PIN8 are the VIN power input and constant current output ports, GND is grounded, NC is a floating pin, REXT is the output current value setting port, OUT4 is the constant current output port, OUT3 is the constant current output port, OUT2 is the constant current output port, and OUT1 is the constant current output port. The HVIS high-voltage and current source interface 307 is connected to the normally open contacts K5, K4, K3, K2, and K1 of the relays on the DUT board. These normally open contacts K5, K4, K3, K2, and K1 are also connected to pins 1, 8, 7, 6, and 5 of the LED linear constant current control chip 40. The VIS voltage and current source interface is connected to the normally open contact K6 of the relays on the DUT board. The normally open contact K6 of the relays is connected to pin 4 of the LED linear constant current control chip 40. The relays are switched on and off by U... The R relay control unit 208 is controlled via the UR relay control interface 308. Test conditions are applied, and relay K6 is closed. The VIS voltage and current source unit 203 is controlled via test commands to apply 0.8V to pin 4. Relays K1, K2, K3, K4, and K5 are closed respectively. The HVIS high-voltage voltage and current source unit 207 is controlled via test commands to apply 200uA current to pins 8, 7, 6, 5, and 1 respectively to test the voltage of the current pin. At this point, the voltage is approximately 700V, and a high-voltage test is performed.

[0068] Furthermore, referring to Figure 4 , Figure 4 This is a schematic diagram showing the connection of a high-voltage test circuit and a measurement and detection circuit according to one embodiment. The high-voltage test circuit and the measurement and detection circuit are in... Figure 3 This is based on the high-voltage test circuit shown. Figure 3 Based on the high-voltage test circuit shown, an LVIS low-voltage and current source interface 304 and a PVIS power voltage and current source unit interface 302 are added. The LVIS low-voltage and current source interface 304 is connected to the REXT output current setting port of the LED linear constant current control chip 40 under test. The PVIS power voltage and current source unit interface 302 is connected to the alarm D1, with the other end of the alarm D1 grounded. When the voltage test value exceeds 900V, two situations may occur: First, the chip itself is faulty, which can be directly filtered out by controlling the range; second, the chip has poor contact with the gold fingers, and due to the high voltage, arcing occurs, causing the high voltage to momentarily reach the clamping voltage of 1000V, breaking down the constant current control chip.

[0069] Furthermore, referring to Figure 5 , Figure 5 This is a schematic diagram of a chip reference voltage test and detection circuit connection according to an embodiment. In the chip reference voltage test and detection circuit, pin 4 is connected to the normally open contact of relay K13. The common terminal of K13 is connected to a precision resistor R to GND, wherein the resistance value of the precision resistor R is preferably 30Ω. It is also connected to the normally open contact of relay K12. The common terminal of K12 is connected to the LVIS low-voltage current source interface 304. Pins 8, 7, 6, and 5 are connected to the normally open contacts of K7, K8, K9, and K10 respectively. The common terminals of K7, K8, K9, and K10 are connected to the VIS voltage and current source interface 303 respectively. IN1 is connected to the normally open contact of K11. The common terminal of K11 is connected to the LVIS low voltage current source interface 304. The circuit's on / off state is controlled by the UR relay control unit 208 through the UR relay control interface 308. When test conditions are applied, voltage can be applied to PIN1, and voltage can also be applied to PIN8, PIN7, PIN6, and PIN5. The voltage on PIN4 is measured by the DVM digital DC voltmeter unit 205. The determination of the voltage on PIN4 determines whether a standard current can be output.

[0070] This embodiment utilizes an IC testing machine system to receive test commands from a computer host and generate test signals based on these commands. A control module obtains control signals based on the test signals and controls the DUT board accordingly. A voltage and current source module obtains voltage and current signals based on the test signals and provides voltage or current to the LED linear constant current control chip under test, enabling the chip to be tested. A measurement module obtains the data type to be measured based on the test signals, acquires relevant test data of the LED linear constant current control chip based on the data type, and feeds the relevant test data back to the IC testing machine system to generate test results. If the test results are abnormal, the IC testing machine system also generates a stop test command to stop the test. These modules enable precise control of the chip under test, detection of chip damage, and ensure chip quality.

[0071] Reference Figure 6 , Figure 6 This is a flowchart illustrating the high voltage and reference voltage testing method for the LED linear constant current control chip of the present invention.

[0072] In this embodiment, the method for testing the high voltage and reference voltage of the LED linear constant current control chip includes the following steps:

[0073] Step S10: The IC testing machine system is used to receive test instructions from the computer host and generate test signals according to the test instructions.

[0074] Step S20: The control module obtains a control signal based on the test signal, and controls the DUT board according to the control signal.

[0075] Step S30: The voltage and current source module obtains voltage and current signals based on the test signal, and provides voltage or current to the LED linear constant current control chip under test based on the voltage and current signals, so that the LED linear constant current control chip under test performs testing based on the voltage or current.

[0076] Step S40: The measurement module obtains the data type to be measured based on the test signal, acquires the relevant test data of the LED linear constant current control chip under test based on the data type, and feeds the relevant test data back to the IC testing machine system to generate test results.

[0077] Step S50: When the test result is abnormal, the IC test machine system is also used to generate a stop test command to stop the test.

[0078] It should be noted that the LED linear constant current control chip high voltage and reference voltage testing method is applied to the LED linear constant current control chip high voltage and reference voltage testing system. The computer host can generate test instructions and send the test instructions to the IC testing machine system. The test instructions include test mode, test conditions requiring time, and hardware connection status, etc. The IC testing machine system can receive the test instructions sent by the computer host and analyze them to obtain test signals. The voltage and current source module can obtain the corresponding voltage and current signals based on the test signals and obtain the corresponding voltage and current values ​​based on the voltage and current signals, providing the corresponding voltage or current to the LED linear constant current control chip under test. The control module can obtain control signals based on the test signals and perform corresponding control on the DUT board based on the control signals. The testing module can obtain the data type to be tested based on the test signals, including the pin voltage or pin current of the LED linear constant current control chip under test.

[0079] In its implementation, the computer host includes IC tester system control software and a PCI card. The PCI card is used to connect to the IC tester system, which runs on the computer host. The computer host sends test commands generated by the IC tester system control software to the IC tester system. Based on the voltage and current source module, measurement module, and control module of the IC tester system, the corresponding test signals, control signals, and measurement signals are transmitted through the corresponding interfaces of the DUT board to the chip under test connected to the DUT board interface. This provides the chip under test with the corresponding voltage or current, acquires relevant current or voltage data of the chip under test, and feeds the obtained data back to the IC tester system. The IC tester system then performs test analysis based on the measured data to obtain test results. If an abnormal test result is found, the IC tester system can generate a stop test command to stop subsequent test operations.

[0080] Furthermore, during the high-voltage test, step S30 also includes the following steps:

[0081] The high-voltage current source unit obtains a high-voltage current signal based on the test signal, and provides a target high current to the pin of the linear constant current control chip of the LED under test connected to the high-voltage current source unit;

[0082] The voltage and current source unit obtains voltage and current signals based on the test signal, and provides a target voltage to the pin of the LED linear constant current control chip connected to the voltage and current source unit, so that the LED linear constant current control chip under test can be tested according to the target voltage and target current.

[0083] In the specific implementation, pins PIN1, PIN4, PIN5, PIN6, PIN7, and PIN8 of the chip under test are connected to the normally open contacts of relays K6, K5, K4, K3, K2, and K1, respectively. The common terminal of the relays is connected to the VIS voltage and current source interface and the HVIS high voltage and current source interface. The conduction and disconnection of the relays are controlled by the UR relay control unit through the UR relay control interface. When test conditions are applied, relay K6 is closed, and the VIS voltage and current source unit is controlled by the test command to apply a voltage of 0.8V to pin PIN4. Relays K1, K2, K3, K4, and K5 are closed respectively, and the HVIS high voltage and current source unit is controlled by the test command to apply a current of 200uA to pins PIN8, PIN7, PIN6, PIN5, and PIN1 respectively to test the voltage of the current pin. At this time, the voltage is about 700V. At this time, the chip under test can generate the corresponding test voltage and test current according to the current voltage and current.

[0084] Furthermore, when performing high-voltage testing, the method also includes the following steps:

[0085] During the test, when the test voltage is higher than the preset voltage, the low voltage current unit obtains a low voltage current signal according to the test signal, and provides a target low current to the REXT output current value setting port of the LED linear constant current control chip connected to the low voltage current unit, and measures the voltage of the REXT output current value setting port.

[0086] If the voltage at the REXT output current setting port is higher than the ignition voltage, the power voltage supply unit obtains the power voltage current signal based on the test signal and provides the target power voltage current to the alarm connected to the power voltage current unit, causing the alarm to sound.

[0087] In the specific implementation, pin 4 is connected to the LVIS low-voltage current source interface, and the PVIS power voltage and current source interface is connected to the alarm to GND. The alarm can be any type of alarm, preferably an LED alarm light. When the test value exceeds 900V, two situations may occur: First, the chip itself is faulty, which can be directly screened out by controlling the range; second, the chip has poor contact with the gold fingers, causing arcing due to the high voltage. This will cause the high voltage to momentarily reach the clamping voltage of 1000V, breaking down the constant current control chip. A detection circuit is added to distinguish between these two abnormal phenomena and promptly detect failures caused by arcing. The method is as follows: First, the LVIS low-voltage current source unit is controlled by the test command to apply a -100uA current to pin 4 for voltage testing. If the measured value is within the voltage range of -1V to -0.3V, high voltage tests can be performed on pins 8, 7, 6, 5, and 1. The HVIS high-voltage current source unit then applies a current of -100uA to pin 8. A 200uA current is applied to pins PIN1, PIN7, PIN6, PIN5, and PIN1 to test the voltage of the current pin. The voltage value at this time is not immediately judged by the program. The detection circuit applies a measurement command to the LVIS low voltage current source unit for detection. A -100uA current is applied to test the voltage of pin PIN4. If the measured voltage value is greater than -0.3V, it is judged as arcing. An alarm prompt box is output through the test command to stop the test. At the same time, the PVIS power voltage and current source unit applies 5V voltage and 500mA current to control the LED alarm light to flash continuously. If the measured value is within the range of -1V to -0.3V, the voltage judgment of pins PIN8, PIN7, PIN6, PIN5, and PIN1 can continue to continue the subsequent chip test.

[0088] Furthermore, the reference voltage test also includes the following steps:

[0089] The relay control unit obtains a relay control signal based on the test signal, and controls the corresponding relay to turn on and off according to the relay control signal;

[0090] The low voltage and current unit generates a low test voltage and current signal according to the test signal, and provides a target low test voltage to the power input and constant current output ports of the VIN pin of the LED linear constant current control chip connected to the low voltage and current unit.

[0091] The digital DC voltmeter unit obtains a measurement signal based on the test signal, sets the voltage of the port connected to the REXT output current value based on the measurement signal and the digital DC voltmeter unit, and feeds the voltage back to the IC test machine system, so that the IC test machine system can determine the voltage and generate a test result based on the determination result.

[0092] In the specific implementation, pin 4 is connected to the normally open contact of relay K13. The common terminal of K13 is connected to resistor R to GND, and also to the normally open contact of relay K12. The common terminal of K12 is connected to the LVIS low-voltage current source interface. Pins 8, 7, 6, and 5 are connected to the normally open contacts of K7, K8, K9, and K10 respectively. The common terminals of K7, K8, K9, and K10 are connected to the VIS voltage and current source interface respectively. Pin 1 is connected to the normally open contact of K11. The common terminal of K11 is connected to the LVIS low-voltage current source interface. The circuit's on / off state is controlled by the UR relay control unit through the UR relay control interface. When test conditions are applied, relay K13 is closed, resistor R is connected to GND; when relay K11 is closed, pin 1... The LVIS low-voltage current source unit is connected to the pin 1. A test command controls the LVIS low-voltage current source unit to apply 15V to pin 1. Relays K7, K8, K9, and K10 are closed respectively. The test command then controls the LVIS voltage and current source unit to apply 15V to pins 8, 7, 6, and 5 respectively. Relay K12 is closed. The DVM digital DC voltmeter unit measures the voltage on pin 4. The center values ​​of these voltages are 0.94V, 0.865V, 0.695V, and 0.55V respectively. By judging the voltage on pin 4 within ±3%, it can be ensured that pins 8, 7, 6, and 5 can output standard current. Any value exceeding this range is considered a failure.

[0093] In this embodiment, the IC testing machine system receives test commands from the computer host and generates test signals based on the test commands. The control module obtains control signals based on the test signals and controls the DUT board according to the control signals. The voltage and current source module obtains voltage and current signals based on the test signals and provides voltage or current to the LED linear constant current control chip under test according to the voltage and current signals, so that the LED linear constant current control chip under test is tested according to the voltage or current. The measurement module obtains the data type to be measured based on the test signals, acquires relevant test data of the LED linear constant current control chip under test based on the data type, and feeds back the relevant test data to the IC testing machine system to generate test results. When the test results are abnormal, the IC testing machine system generates a stop test command to stop the test. Through the above modules, precise control of the chip under test can be achieved, the damage of the chip under test can be detected, and the quality of the chip can be guaranteed.

[0094] It should be understood that the above are merely illustrative examples and do not constitute any limitation on the technical solutions of the present invention. In specific applications, those skilled in the art can make settings as needed, and the present invention does not impose any restrictions on this.

[0095] It should be noted that the workflow described above is merely illustrative and does not limit the scope of protection of this invention. In practical applications, those skilled in the art can select some or all of the workflow to achieve the purpose of this embodiment according to actual needs, and no restrictions are imposed here.

[0096] Furthermore, it should be noted that, in this document, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or system that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or system. Unless otherwise specified, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or system that includes that element.

[0097] The sequence numbers of the above embodiments of the present invention are for descriptive purposes only and do not represent the superiority or inferiority of the embodiments.

[0098] Through the above description of the embodiments, those skilled in the art can clearly understand that the methods of the above embodiments can be implemented by means of software plus necessary general-purpose hardware platforms. Of course, they can also be implemented by hardware, but in many cases the former is a better implementation method. Based on this understanding, the technical solution of the present invention, or the part that contributes to the prior art, can be embodied in the form of a software product. This computer software product is stored in a storage medium (such as read-only memory (ROM) / RAM, magnetic disk, optical disk) and includes several instructions to cause a terminal device (which may be a mobile phone, computer, server, or network device, etc.) to execute the methods described in the various embodiments of the present invention.

[0099] The above are merely preferred embodiments of the present invention and do not limit the scope of the patent. Any equivalent structural or procedural transformations made based on the description and drawings of the present invention, or direct or indirect applications in other related technical fields, are similarly included within the scope of patent protection of the present invention.

Claims

1. A high-voltage and reference voltage testing system for an LED linear constant current control chip, characterized in that, The LED linear constant current control chip high voltage and reference voltage test system includes: a computer host, an IC test machine system, a DUT board, and the LED linear constant current control chip under test. The computer host is connected to the IC test machine system. The IC test machine system includes a voltage and current source module, a measurement module, and a control module. The DUT board integrates the voltage and current source module, the measurement module, and the control module to form a DUT board interface. The LED linear constant current control chip under test is connected to the corresponding interface of the DUT board. The IC testing machine system is used to receive test commands from the computer host and generate test signals according to the test commands; The control module is used to obtain a control signal based on the test signal, and to control the DUT board based on the control signal; The voltage and current source module is used to obtain voltage and current signals based on the test signal, and to provide voltage or current to the LED linear constant current control chip under test based on the voltage and current signals, so that the LED linear constant current control chip under test can be tested based on the voltage or current. The measurement module is used to obtain the data type to be measured based on the test signal, acquire the relevant test data of the LED linear constant current control chip under test based on the data type, and feed the relevant test data back to the IC testing machine system to generate test results; When the test result is abnormal, the IC test machine system is also used to generate a stop test command to stop the test; The voltage and current source module includes a voltage and current source unit and a high-voltage and current source unit. The voltage and current source module obtains a voltage and current signal based on the test signal, and provides voltage or current to the LED linear constant current control chip under test based on the voltage and current signal, enabling the LED linear constant current control chip under test to perform testing based on the voltage or current, including: The high-voltage current source unit obtains a high-voltage current signal based on the test signal, and provides a target high current to the pin of the linear constant current control chip of the LED under test connected to the high-voltage current source unit; The voltage and current source unit obtains voltage and current signals based on the test signal, and provides a target voltage to the pin of the LED linear constant current control chip connected to the voltage and current source unit, so that the LED linear constant current control chip under test can be tested according to the target voltage and target current. The voltage and current source module further includes a low-voltage current source unit and a power voltage and current source unit. The voltage and current source module obtains voltage and current signals based on the test signal, and provides voltage or current to the LED linear constant current control chip under test based on the voltage and current signals. After the LED linear constant current control chip under test performs testing based on the voltage or current, the module further includes: During the test, when the test voltage is higher than the preset voltage, the low voltage current source unit obtains a low voltage current signal according to the test signal, and provides a target low current to the REXT output current value setting port of the LED linear constant current control chip connected to the low voltage current source unit, and measures the voltage of the REXT output current value setting port. If the voltage at the REXT output current setting port is higher than the ignition voltage, the power voltage and current source unit obtains the power voltage and current signal based on the test signal and provides the target power voltage and current to the alarm connected to the power voltage and current unit, causing the alarm to sound.

2. The system as described in claim 1, characterized in that, The DUT board includes several relays. One end of each relay is connected to the corresponding interface of the DUT board, and the other end is connected to the corresponding pin of the linear constant current control chip of the LED under test.

3. The system as described in claim 2, characterized in that, The voltage and current source module includes a high voltage and current source unit and a voltage and current source unit; the control module includes a relay control unit. The high voltage and current source unit is connected to the high voltage and current source interface. The high voltage and current source interface is connected to the power input and constant current output port of the LED linear constant current control chip under test through a corresponding relay. The voltage and current source unit is connected to the voltage and current source interface, and the voltage and current source interface is connected to the REXT output current value setting port of the linear constant current control chip of the LED under test through a corresponding relay. The relay control unit is connected to the relay control interface and is used to control the on / off state of the relay.

4. The system as described in claim 3, characterized in that, The voltage and current source module also includes a low voltage and current source unit and a power voltage and current source unit; The low voltage current source unit is connected to the low voltage current source interface, and the low voltage current source interface is connected to the REXT output current value setting port of the linear constant current control chip of the LED under test. The power voltage and current source unit is connected to the power voltage and current source interface, which is connected to one end of the alarm, and the other end of the alarm is grounded.

5. The system as described in claim 2, characterized in that, The voltage and current source module includes a voltage and current source unit and a low voltage and current source unit; the control module includes a relay control unit; and the measurement module includes a digital DC voltmeter unit. The voltage and current source unit is connected to the corresponding relays through the voltage and current source interface of the DUT board, and the relays are connected to the constant current output port of the linear constant current control chip of the LED under test. The low voltage current source unit is connected to the corresponding relay through the low voltage current source unit of the DUT board. The relay is connected to the power input and constant current output port of the VIN pin of the linear constant current control chip of the LED under test. The digital DC voltmeter unit is connected to the digital DC voltmeter interface of the DUT board. The digital DC voltmeter interface is connected to the REXT output current value setting port of the linear constant current control chip of the LED under test through a corresponding relay. The digital DC voltmeter interface is also connected to one end of a resistor via a relay, and the other end of the resistor is grounded.

6. The system as described in claim 1, characterized in that, The computer host includes a PCI card, and the computer host controls the voltage and current source unit, measurement unit, and control unit of the IC test machine system through the PCI card.

7. A method for testing high voltage and reference voltage of an LED linear constant current control chip, characterized in that, The LED linear constant current control chip high voltage and reference voltage testing method is applied to the LED linear constant current control chip high voltage and reference voltage testing system as described in any one of claims 1-6. The LED linear constant current control chip high voltage and reference voltage testing system includes: a computer host, an IC testing machine system, a DUT board, and an LED linear constant current control chip under test. The computer host is connected to the IC testing machine system. The IC testing machine system includes a voltage and current source module, a measurement module, and a control module. The DUT board integrates the voltage and current source module, the measurement module, and the control module to form a DUT board interface. The LED linear constant current control chip under test is connected to the corresponding interface of the DUT board. The high voltage and reference voltage testing methods for the LED linear constant current control chip include: The IC testing machine system is used to receive test commands from the computer host and generate test signals according to the test commands; The control module obtains a control signal based on the test signal, and controls the DUT board according to the control signal; The voltage and current source module obtains voltage and current signals based on the test signal, and provides voltage or current to the LED linear constant current control chip under test based on the voltage and current signals, so that the LED linear constant current control chip under test can perform tests based on the voltage or current. The measurement module obtains the data type to be measured based on the test signal, acquires the relevant test data of the LED linear constant current control chip under test based on the data type, and feeds the relevant test data back to the IC testing machine system to generate test results; When the test result is abnormal, the IC test machine system is also used to generate a stop test command to stop the test; The voltage and current source module includes a voltage and current source unit and a high-voltage and current source unit. The voltage and current source module obtains a voltage and current signal based on the test signal, and provides voltage or current to the LED linear constant current control chip under test based on the voltage and current signal, enabling the LED linear constant current control chip under test to perform testing based on the voltage or current, including: The high-voltage current source unit obtains a high-voltage current signal based on the test signal, and provides a target high current to the pin of the linear constant current control chip of the LED under test connected to the high-voltage current source unit; The voltage and current source unit obtains voltage and current signals based on the test signal, and provides a target voltage to the pin of the LED linear constant current control chip connected to the voltage and current source unit, so that the LED linear constant current control chip under test can be tested according to the target voltage and target current. The voltage and current source module further includes a low-voltage current source unit and a power voltage and current source unit. The voltage and current source module obtains voltage and current signals based on the test signal, and provides voltage or current to the LED linear constant current control chip under test based on the voltage and current signals. After the LED linear constant current control chip under test performs testing based on the voltage or current, the module further includes: During the test, when the test voltage is higher than the preset voltage, the low voltage current source unit obtains a low voltage current signal according to the test signal, and provides a target low current to the REXT output current value setting port of the LED linear constant current control chip connected to the low voltage current source unit, and measures the voltage of the REXT output current value setting port. If the voltage at the REXT output current setting port is higher than the ignition voltage, the power voltage and current source unit obtains the power voltage and current signal based on the test signal and provides the target power voltage and current to the alarm connected to the power voltage and current unit, causing the alarm to sound.

8. The method as described in claim 7, characterized in that, The voltage and current source module includes a voltage and current source unit and a low voltage and current source unit. The control module includes a relay control unit. The measurement module includes a digital DC voltmeter unit. The measurement module obtains the data type to be measured based on the test signal, acquires relevant test data of the LED linear constant current control chip under test based on the data type, and feeds back the relevant test data to the IC testing machine system to generate test results, including: The relay control unit obtains a relay control signal based on the test signal, and controls the corresponding relay to turn on and off according to the relay control signal; The low voltage current source unit generates a low test voltage current signal according to the test signal, and provides a target low test voltage to the power input and constant current output ports of the LED linear constant current control chip connected to the low voltage current source unit. The digital DC voltmeter unit obtains a measurement signal based on the test signal, sets the voltage of the port connected to the REXT output current value based on the measurement signal and the digital DC voltmeter unit, and feeds the voltage back to the IC test machine system, so that the IC test machine system can determine the voltage and generate a test result based on the determination result.

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