Curved mirror design method, curved mirror, test processing method and system

Abstract

The application provides a curved mirror design method, a curved mirror, a test processing method and a system, and relates to the technical field of head-up displays. The curved mirror obtains multiple incident light rays emitted by each to-be-detected point of a backlight module of a head-up display (HUD), and outputs the reflected light rays of the multiple incident light rays to a luminance meter. The multiple incident light rays are incident light rays emitted by each to-be-detected point on the backlight module of the HUD after the backlight module is triggered and is in a lighting state. The luminance meter detects the luminance of each reflected light ray, and determines the uniformity of light emission of the backlight module of the HUD according to the luminance of each reflected light ray. The luminance meter determines whether the backlight module is qualified according to a comparison result of the uniformity of light emission and a set uniformity, without repeatedly disassembling, packaging and testing the backlight module of the HUD from the HUD assembly, thereby saving a large amount of time cost and labor cost, and improving the test efficiency.

Description

Technical Field

[0001] This application relates to the field of head-up display technology, and in particular to a curved reflector design method, a curved reflector, a testing and processing method and system. Background Technology

[0002] Typically, when a driver's gaze is taken off-center while driving (e.g., when checking speed, fuel level, or navigation route on the dashboard), it can lead to a car accident. To mitigate this possibility, existing technology has proposed a head-up display (HUD), which primarily includes a display screen that shows driving data and projects it onto the windshield. This allows the driver to view driving data such as speed, fuel level, or navigation route without taking their eyes off the windshield, thus maintaining driving safety.

[0003] Currently, before a HUD leaves the factory, the brightness uniformity of the light emitted by its backlight module needs to be tested to determine whether the backlight module is qualified. The current testing method for the brightness uniformity of the backlight module is as follows: based on an existing testing system, which includes a simulated windshield and an eyepiece, the HUD's backlight module is integrated into the entire HUD assembly. Using the simulated windshield, the brightness uniformity of the virtual image formed by the HUD is tested at the eyepiece.

[0004] However, when the HUD's backlight module fails to meet requirements, it needs to be disassembled from the HUD assembly. The backlight module then needs to be repaired, debugged, or have the faulty components replaced. Finally, the repaired, debugged, or replaced backlight module is reassembled into the entire HUD assembly until a satisfactory backlight module is determined. Therefore, the existing testing method is quite cumbersome, requiring repeated disassembly, reassembly, and testing of the HUD's backlight module, resulting in significant waste of time and manpower, and relatively low testing efficiency. Summary of the Invention

[0005] This application provides a curved reflector design method, a curved reflector, a testing and processing method and system to solve the problem in the prior art that when testing the backlight module of a HUD, it is necessary to repeatedly disassemble, reassemble and test the backlight module of the HUD from the HUD assembly, which leads to a lot of wasted time and manpower costs and relatively low testing efficiency.

[0006] In a first aspect, this application provides a method for designing a curved reflector, including:

[0007] The controller simulates the backlight module of the HUD to be tested to obtain the corresponding virtual backlight module, and controls the virtual backlight module to be located at the first detection point of the first coordinate in the spatial coordinate system. The controller outputs the first incident light to the first reflection point of the set first sub-surface segment normal plane, so that the first reflection point outputs the first reflected light to the virtual brightness meter at the second coordinate in the spatial coordinate system according to the first incident light.

[0008] The controller determines the next adjacent subsurface segment in sequence based on the normal vector of the current subsurface segment at the current reflection point, so as to obtain a set of subsurface segments; among them, the first subsurface segment in the sequence is the first subsurface segment, and any current reflection point is the intersection point of the vector of the corresponding incident ray and the normal plane of the previous subsurface segment.

[0009] The controller stitches together the sub-surface segments in the set of sub-surface segments in sequence to obtain the shape of the curved reflector.

[0010] In one possible implementation, the controller sequentially determines the next adjacent subsurface segment based on the normal vector of the current subsurface segment at the current reflection point, to obtain a set of subsurface segments, including:

[0011] The controller takes the normal plane corresponding to the normal vector of the first subsurface segment at the first reflection point as the second subsurface segment;

[0012] When there is an undetected point to be detected in the virtual backlight module, the controller determines the vector of the Nth incident light emitted from the Nth point to be detected, where N is an integer and the initial value of N is 2;

[0013] The controller takes the intersection of the vector of the Nth incident ray and the normal plane of the (N-1)th subsurface segment as the Nth reflection point;

[0014] The controller takes the normal plane corresponding to the normal vector of the Nth subsurface segment at the Nth reflection point as the (N+1)th subsurface segment;

[0015] Increment N by 1, return to the step of the execution controller to determine the vector of the Nth incident light emitted from the Nth detection point, until there are no undetected detection points in the virtual backlight module.

[0016] In this way, the set of subsurface segments can be obtained accurately and reliably.

[0017] In one possible implementation, determining the vector of the Nth incident ray emitted from the Nth detection point includes:

[0018] The vector of the Nth incident ray is defined as (cosA, cosB, cosC), where A is the angle between the Nth incident ray and the X-axis of the spatial coordinate system, B is the angle between the Nth incident ray and the Y-axis of the spatial coordinate system, and C is the angle between the Nth incident ray and the Z-axis of the spatial coordinate system.

[0019] Since A is the angle between the Nth incident ray and the X-axis of the spatial coordinate system, B is the angle between the Nth incident ray and the Y-axis of the spatial coordinate system, and C is the angle between the Nth incident ray and the Z-axis of the spatial coordinate system, the data set (A, B, C) can clearly and accurately express the direction of the Nth incident ray, and (cosA, cosB, cosC) can also clearly and accurately express the vector of the Nth incident ray.

[0020] In one possible implementation, the controller uses the normal plane corresponding to the normal vector of the first subsurface segment at the first reflection point as the second subsurface segment, including:

[0021] The controller determines the normal vector of the first subsurface segment at the first reflection point, and the normal plane corresponding to the normal vector of the first reflection point, based on the vector form of Snell's law.

[0022] In this way, the normal vector at the first reflection point and the normal plane corresponding to the normal vector at the first reflection point can be obtained accurately and reliably.

[0023] Secondly, this application also provides a curved reflector, which is obtained based on the method for designing a curved reflector provided in the first aspect.

[0024] Thirdly, this application provides a test processing method applied to a test processing system, which includes: a backlight module of a head-up display (HUD), a luminance meter, and the curved reflector provided in the second aspect. The method provided in this application includes:

[0025] The curved reflector acquires multiple incident light rays emitted from each test point of the head-up display's backlight module, and outputs the reflected light rays of the multiple incident light rays to the luminance meter. Among them, the multiple incident light rays are the incident light rays emitted from each test point on the HUD's backlight module after it is triggered and lit.

[0026] A luminance meter detects the brightness of each reflected light ray and determines the uniformity of light emission of the HUD's backlight module based on the brightness of each reflected light ray.

[0027] The luminance meter determines whether the backlight module is qualified based on the comparison between the uniformity of light emission and the set uniformity.

[0028] In one possible implementation, determining the luminous uniformity of the HUD's backlight module based on the brightness of each reflected light ray includes:

[0029] A luminance meter determines the variance and / or standard deviation of the luminance of each reflected ray, wherein the variance or standard deviation is used to indicate the luminous uniformity of the backlight module of the HUD.

[0030] The luminance meter determines whether the backlight module is qualified based on the comparison between the luminous uniformity and the set uniformity, including:

[0031] If the luminance meter determines that the backlight module is unqualified when the variance or standard deviation is greater than the set threshold, the luminance meter determines that the backlight module is qualified when the variance or standard deviation is less than or equal to the set threshold.

[0032] Understandably, the variance or standard deviation of the brightness of each reflected light ray can accurately express the uniformity of light emission from the HUD's backlight module. Therefore, determining the qualification of a backlight module based on variance or standard deviation is highly reliable.

[0033] In one possible implementation, when multiple incident rays are in a horizontal direction, the curved reflector is shaped like a parabolic reflector, and the luminance meter is located at the optical focus of the parabolic reflector.

[0034] In this way, multiple incident rays in the horizontal direction can be reflected by the parabolic mirror and converged to the brightness meter located at the optical focal point of the parabolic mirror.

[0035] Fourthly, this application also provides a test processing system, which includes: a backlight module of a head-up display (HUD), a luminance meter, and the curved reflector provided in the second aspect of this application, wherein...

[0036] The backlight module of the HUD is used to be lit up after being triggered, so that each detection point on the backlight module of the HUD emits multiple incident light rays.

[0037] Curved reflectors are used to acquire multiple incident light rays emitted from each test point of the HUD backlight module and to converge the reflected light rays of the multiple incident light rays onto the luminance meter.

[0038] A luminance meter is used to detect the brightness of each reflected light beam and determine the uniformity of light emission of the HUD backlight module based on the brightness of each reflected light beam; and determine whether the backlight module is qualified based on the comparison between the uniformity of light emission and the set uniformity.

[0039] In one possible implementation, when multiple incident rays are in a horizontal direction, the curved reflector is shaped like a parabolic reflector, and the luminance meter is located at the optical focus of the parabolic reflector.

[0040] This application provides a curved reflector design method, a curved reflector, a testing and processing method, and a system. When the curved reflector with its designed shape is placed in the testing and processing system, it can acquire various test points on the backlight module of the HUD, emit multiple incident light rays, and converge the reflected light rays from these incident light rays onto a luminance meter. The luminance meter can then detect the brightness of each reflected light ray and determine the luminance uniformity of the HUD's backlight module based on the brightness of each reflected light ray. This way, even if the HUD's backlight module is subsequently determined to be defective based on the luminance uniformity, the backlight module can be directly debugged or repaired without repeatedly disassembling, repackaging, and testing the HUD's backlight module from the HUD assembly, saving significant time and labor costs and improving testing efficiency. Attached Figure Description

[0041] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0042] Figure 1 A schematic diagram illustrating the process of determining the shape of a curved reflector as provided in an embodiment of this application;

[0043] Figure 2 middle Figure 1 The detailed flowchart of S102 in the document;

[0044] Figure 3 A schematic diagram illustrating the process of determining the shape and position of a curved reflector as provided in an embodiment of this application;

[0045] Figure 4 A schematic diagram illustrating the determination of the vector of the Nth reflected ray as provided in an embodiment of this application;

[0046] Figure 5 A flowchart of the test processing method provided in the embodiments of this application;

[0047] Figure 6 This is a schematic diagram of the optical path of the HUD backlight module, curved reflector, and luminance meter provided in the embodiments of this application.

[0048] Figure 7 This is a schematic diagram of the optical path of the HUD backlight module, parabolic reflector, and luminance meter provided in the embodiments of this application. Detailed Implementation

[0049] To make the objectives, technical solutions, and advantages of the embodiments of this application clearer, the technical solutions in the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings in the embodiments of this application. Apparently, the described embodiments are some but not all of the embodiments of this application. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of this application under the inspiration of this embodiment belong to the scope protected by this application.

[0050] The terms "first", "second", "third", "fourth", etc. (if any) in the description and claims of this application and the above-mentioned accompanying drawings are used to distinguish similar objects and do not necessarily need to be used to describe a specific order or sequence. It should be understood that such used data can be interchanged under appropriate circumstances so that the embodiments of this application described here can be implemented in an order different from those illustrated or described here. In addition, the terms "comprising" and "having" and any variations thereof are intended to cover non-exclusive inclusion. For example, a process, method, system, product, or device that includes a series of steps or units does not necessarily have to be limited to those steps or units clearly listed, but may include other steps or units not clearly listed or inherent to these processes, methods, products, or devices.

[0051] Currently, the testing method for the backlight module of HUD is as follows: Based on the existing testing system, where the existing testing system includes a simulated windshield and an eyebox, the backlight module of HUD is installed into the entire HUD assembly, and the simulated windshield is used to test the brightness uniformity of the virtual image formed by HUD at the eyebox.

[0052] However, when the backlight module of HUD is unqualified, it is necessary to disassemble the backlight module of HUD from the HUD assembly. Repair, debug the backlight module of HUD or replace the unqualified components, and then reinstall the repaired, debugged or replaced backlight module of HUD into the entire HUD assembly until it is determined that the backlight module of HUD is qualified. It can be seen that the existing testing method is quite cumbersome, and it is necessary to repeatedly disassemble, package and test the backlight module of HUD from the HUD assembly, resulting in a waste of a large amount of time cost and labor cost, and also making the testing efficiency relatively low.

[0053] Based on the above technical problems, the inventive concept of this application is to provide a method for designing a curved mirror, a curved mirror, a testing processing method and system, which can effectively improve the testing efficiency while saving a large amount of time cost and labor cost.

[0054] The technical solutions of this application and how they solve the aforementioned technical problems will be described in detail below with specific embodiments. These specific embodiments can be combined with each other, and the same or similar concepts or processes may not be repeated in some embodiments. The embodiments of this application will now be described with reference to the accompanying drawings.

[0055] Please see Figure 1 This application also provides a method for designing a curved reflector, including:

[0056] S101: The controller simulates the backlight module of the HUD to be tested to obtain the corresponding virtual backlight module, and controls the virtual backlight module to be located at the first detection point of the first coordinate in the spatial coordinate system, and outputs the first incident light to the first reflection point of the set first sub-surface segment normal plane, so that the first reflection point outputs the first reflected light to the virtual brightness meter at the second coordinate in the spatial coordinate system according to the first incident light.

[0057] S102: The controller determines the next adjacent subsurface segment in sequence based on the normal vector of the current subsurface segment at the current reflection point, so as to obtain a set of subsurface segments.

[0058] Among them, the current subsurface segment with the highest order is the first subsurface segment, and any current reflection point is the intersection of the vector of the corresponding incident ray and the normal plane of the previous subsurface segment.

[0059] like Figure 2 As shown, the specific implementation of S102 may include:

[0060] S201: The controller takes the normal plane corresponding to the normal vector of the first subsurface segment 501 at the first reflection point as the second subsurface segment.

[0061] For example, such as Figure 3 As shown, the controller can determine the normal vector of the first subsurface segment 501 at the first reflection point, and the normal plane 503 corresponding to the normal vector of the first reflection point, according to the vector form of Snell's law. For example, when the coordinates of the first reflection point are (xj, yj, zj), the vector of the outgoing ray corresponding to the incident ray can be expressed as (xt-xj, yt-yj, zt-zj), where (xt, yt, zt) are the coordinates of the geometric center of the virtual luminance meter.

[0062] In this way, the normal vector at the first reflection point and the normal plane 503 corresponding to the normal vector at the first reflection point can be obtained accurately and reliably.

[0063] S202: Does the controller have any undetected points to be detected in the virtual backlight module? If so, execute S203.

[0064] S203: The controller determines the vector of the Nth incident light emitted from the Nth detection point, where N is an integer and the initial value of N is 2.

[0065] In this embodiment, Figure 4 A schematic diagram illustrating the determination of the vector of the Nth reflected ray provided in an embodiment of this application is shown below. Figure 4 As shown, the vector of the Nth incident ray can be determined as (cosA, cosB, cosC). Where A is the angle between the Nth incident ray and the X-axis of the spatial coordinate system, B is the angle between the Nth incident ray and the Y-axis of the spatial coordinate system, and C is the angle between the Nth incident ray and the Z-axis of the spatial coordinate system.

[0066] Since A is the angle between the Nth incident ray and the X-axis of the spatial coordinate system, B is the angle between the Nth incident ray and the Y-axis of the spatial coordinate system, and C is the angle between the Nth incident ray and the Z-axis of the spatial coordinate system, the data set (A, B, C) can clearly and accurately express the direction of the Nth incident ray, and (cosA, cosB, cosC) can also clearly and accurately express the vector of the Nth incident ray.

[0067] For example, when N=2, the controller determines the vector of the second incident ray emitted from the second detection point.

[0068] S204: The controller takes the intersection of the vector of the Nth incident ray and the normal plane of the (N-1)th subsurface segment as the Nth reflection point.

[0069] For example, when N=2, the controller takes the intersection of the vector of the second incident ray and the normal plane of the first subsurface segment 501 as the second reflection point.

[0070] S205: The controller takes the normal plane corresponding to the normal vector of the Nth subsurface segment at the Nth reflection point as the (N+1)th subsurface segment.

[0071] For example, when N=2, the controller takes the normal plane corresponding to the normal vector of the second subsurface segment at the second reflection point as the third subsurface segment.

[0072] S206: Increment N by 1, then return to execute S602.

[0073] In this way, the set of subsurface segments can be obtained accurately and reliably.

[0074] S103: The controller splices the sub-surface segments in the set of sub-surface segments in sequence to obtain the shape of the curved reflector.

[0075] Understandably, the shape of the curved reflector 201, as described above, enables the curved reflector 201 to reflect multiple incident rays emitted from the point to be detected on the virtual backlight module onto the virtual luminance meter, resulting in high reliability.

[0076] In addition, this application embodiment also provides a curved surface reflector, which adopts... Figure 1 The corresponding embodiment provides a curved surface reflector design method.

[0077] Figure 5 This is a flowchart of a test processing method provided in an embodiment of this application. The test processing method is applied to a test processing system, wherein, as... Figure 6 As shown, the test processing system includes: a HUD backlight module 202, a luminance meter 203, and a curved reflector 201. The curved reflector 201 can... Figure 1 The provided curved mirror design method yielded the desired result, and the placement relationship between the HUD backlight module 202, luminance meter 203, and curved mirror 201 in the test processing system was verified. Figure 1 The placement of the virtual backlight module, virtual luminance meter, and the curved mirror under design in the provided curved mirror design method remains consistent. For example... Figure 5 As shown, the test processing method provided in this application embodiment includes:

[0078] S501: The backlight module 202 of the HUD is lit after being triggered, so that each detection point on the backlight module 202 of the HUD emits multiple incident light rays.

[0079] For example, when the user turns on the backlight module 202 of the HUD, the backlight module 202 of the HUD is triggered and put into a lit state, and each detection point on the backlight module 202 of the HUD in the lit state emits multiple incident light rays.

[0080] S502: The curved reflector 201 acquires multiple incident light rays emitted from each detection point of the backlight module 202 of the head-up display, and outputs the reflected light rays of the multiple incident light rays to the luminance meter 203.

[0081] Among them, multiple incident light rays are the incident light rays emitted by each detection point on the HUD backlight module 202 after it is triggered and lit up.

[0082] like Figure 6 As shown, multiple incident light rays emitted from each detection point 204 on the backlight module 202 of the HUD can be incident on the curved reflector 201. Furthermore, the curved reflector 201 can reflect the multiple incident light rays and converge the reflected light rays onto the luminance meter 203.

[0083] Furthermore, such as Figure 7 As shown, when multiple incident rays are in the horizontal direction, the curved mirror 201 is shaped like a parabolic mirror, and the luminance meter 203 is located at the optical focus of the parabolic mirror. In this way, multiple incident rays in the horizontal direction can be reflected by the parabolic mirror and converge to the luminance meter 203 located at the optical focus of the parabolic mirror.

[0084] S503: Luminometer 203 detects the brightness of each reflected light and determines the uniformity of light emission of the HUD backlight module 202 based on the brightness of each reflected light.

[0085] Specifically, S104 can be implemented as follows: the luminance meter 203 determines the variance and / or standard deviation of the luminance of each reflected light, wherein the variance or standard deviation is used to indicate the luminous uniformity of the backlight module 202 of the HUD.

[0086] Understandably, the variance or standard deviation of the brightness of each reflected light ray can accurately express the light emission uniformity of the HUD backlight module 202. Thus, determining whether the backlight module 202 is qualified based on the variance or standard deviation is highly reliable.

[0087] S504: The luminance meter 203 determines whether the backlight module 202 is qualified based on the comparison result between the luminous uniformity and the set uniformity.

[0088] For example, when the variance or standard deviation of the luminance meter 203 is greater than a set threshold, the backlight module 202 is determined to be unqualified; when the variance or standard deviation of the luminance meter 203 is less than or equal to the set threshold, the backlight module 202 is determined to be qualified.

[0089] In summary, the testing and processing method provided in this application allows a pre-designed curved reflector to be positioned within the testing and processing system. The curved reflector can acquire various test points on the HUD's backlight module, emit multiple incident light rays, and converge the reflected light rays from these incident rays onto a luminance meter. The luminance meter can then detect the brightness of each reflected light ray and determine the luminance uniformity of the HUD's backlight module based on the brightness of each reflected light ray. This means that even if the HUD's backlight module is subsequently determined to be defective based on the luminance uniformity, the backlight module can be directly debugged or repaired without repeatedly disassembling, repackaging, and testing it from the HUD assembly. This saves significant time and labor costs and improves testing efficiency.

[0090] In addition, this application embodiment also provides a test processing system, which includes: a backlight module 202 of a HUD, a luminance meter 203, and a curved reflector 201. The curved reflector 201 is based on... Figure 1 The curved reflector design method provided is used. It should be noted that the test processing system provided in this application embodiment has the same basic principle and technical effects as the above embodiments. For the sake of brevity, any parts not mentioned in the embodiments of this application can be referred to the corresponding content in the above embodiments.

[0091] like Figure 6 As shown, the backlight module 202 of the HUD is used to be lit up after being triggered, so that each detection point on the backlight module 202 of the HUD emits multiple incident light rays.

[0092] The curved reflector 201 is used to acquire multiple incident rays and output the reflected rays of the multiple incident rays to the luminance meter 203.

[0093] The luminance meter 203 is used to detect the brightness of each reflected light and determine the light emission uniformity of the backlight module 202 of the HUD based on the brightness of each reflected light; and determine whether the backlight module 202 is qualified based on the comparison result of the light emission uniformity with the set uniformity.

[0094] In one possible implementation, the system also includes a dark box, inside which the head-up display's backlight module 202, the curved reflector 201, and the luminance meter 203 are all located. This allows the multiple incident light rays converging to the luminance meter 203 to be unaffected by ambient light.

[0095] In one possible implementation, when multiple incident rays are in the horizontal direction, the curved reflector 201 is in the shape of a parabolic reflector, and the luminance meter 203 is located at the optical focus of the parabolic reflector.

[0096] For example, the luminance meter 203 is specifically used to determine the variance and / or standard deviation of the brightness of each reflected light ray, wherein the variance or standard deviation is used to indicate the light emission uniformity of the backlight module 202 of the HUD; when the variance or standard deviation is greater than a set threshold, the backlight module 202 is determined to be unqualified; when the variance or standard deviation is less than or equal to the set threshold, the luminance meter 203 determines that the backlight module 202 is qualified.

[0097] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this application, and are not intended to limit them. Although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some or all of the technical features therein. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of this application.

Claims

1. A method for designing a curved surface reflector, characterized in that, The method includes: The controller simulates the backlight module of the HUD under test to obtain the corresponding virtual backlight module, and controls the virtual backlight module to be located at the first detection point of the first coordinate in the spatial coordinate system, and outputs the first incident light to the first reflection point of the set first sub-surface segment normal plane, so that the first reflection point outputs the first reflected light to the virtual brightness meter at the second coordinate in the spatial coordinate system according to the first incident light. The controller sequentially determines the next adjacent subsurface segment based on the normal vector of the current subsurface segment at the current reflection point, thus obtaining a set of subsurface segments; wherein, the first subsurface segment in the sequence is the first subsurface segment, and any current reflection point is the intersection of the vector of the corresponding incident ray and the normal plane of the previous subsurface segment; wherein, the normal vector of the reflection point is determined according to the vector form of Snell's law; The controller sequentially splices together the various sub-surface segments in the set of sub-surface segments to obtain the shape of the curved reflector.

2. The method according to claim 1, characterized in that, The controller sequentially determines the next adjacent subsurface segment based on the normal vector of the current subsurface segment at the current reflection point, to obtain a set of subsurface segments, including: The controller takes the normal plane corresponding to the normal vector of the first sub-surface segment at the first reflection point as the second sub-surface segment; When there is an undetected point to be detected in the virtual backlight module, the controller determines the vector of the Nth incident light emitted from the Nth point to be detected, where N is an integer and the initial value of N is 2; The controller takes the intersection of the vector of the Nth incident ray and the normal plane of the (N-1)th subsurface segment as the Nth reflection point; The controller takes the normal plane corresponding to the normal vector of the Nth subsurface segment at the Nth reflection point as the (N+1)th subsurface segment. Increment N by 1, and return to the step of the controller determining the vector of the Nth incident light emitted by the Nth detection point, until there are no undetected detection points in the virtual backlight module.

3. The method according to claim 2, characterized in that, Determining the vector of the Nth incident ray emitted from the Nth detection point includes: The vector of the Nth incident ray is determined as (cosA, cosB, cosC), where A is the angle between the Nth incident ray and the X-axis of the spatial coordinate system, B is the angle between the Nth incident ray and the Y-axis of the spatial coordinate system, and C is the angle between the Nth incident ray and the Z-axis of the spatial coordinate system.

4. The method according to claim 2, characterized in that, The controller takes the normal plane corresponding to the normal vector of the first sub-surface segment at the first reflection point as the second sub-surface segment, including: The controller determines the normal vector of the first subsurface segment at the first reflection point, and the normal plane corresponding to the normal vector of the first reflection point, according to the vector form of Snell's law.

5. A curved reflector, characterized in that, The curved reflector is obtained based on the method described in any one of claims 1-4.

6. A test processing method, characterized in that, The method is applied to a test processing system, the test processing system comprising: a backlight module of a head-up display (HUD), a luminance meter, and the curved reflector as described in claim 5, the method comprising: The curved reflector acquires multiple incident light rays emitted from each test point of the backlight module of the head-up display, and outputs the reflected light rays of the multiple incident light rays to the luminance meter. The multiple incident light rays are the incident light rays emitted from each test point on the backlight module of the HUD after it is triggered and lit. The luminance meter detects the brightness of each reflected light ray and determines the luminous uniformity of the HUD's backlight module based on the brightness of each reflected light ray. The luminance meter determines whether the backlight module is qualified based on the comparison result between the luminous uniformity and the set uniformity.

7. The method according to claim 6, characterized in that, The luminance meter determines the luminous uniformity of the HUD's backlight module based on the brightness of each reflected light ray, including: The luminance meter determines the variance and / or standard deviation of the luminance of each of the reflected light rays, wherein the variance or standard deviation is used to indicate the luminous uniformity of the backlight module of the HUD. The luminance meter determines whether the backlight module is qualified based on a comparison between the luminous uniformity and a set uniformity level, including: The luminance meter determines that the backlight module is unqualified when the variance or standard deviation is greater than a set threshold; the luminance meter determines that the backlight module is qualified when the variance or standard deviation is less than or equal to the set threshold.

8. The method according to claim 6, characterized in that, When the multiple incident rays are in the horizontal direction, the curved reflector is a parabolic reflector, and the luminance meter is located at the optical focal point of the parabolic reflector.

9. A test processing system, the test processing system comprising: The head-up display (HUD) includes a backlight module, a luminance meter, and the curved reflector as described in claim 5, wherein... The backlight module of the HUD is used to be lit up after being triggered, so that each detection point on the backlight module of the HUD emits multiple incident light rays. The curved reflector is used to acquire multiple incident light rays emitted from each test point of the backlight module of the HUD, and to output and converge the reflected light rays of the multiple incident light rays onto the luminance meter. The luminance meter is used to detect the brightness of each reflected light ray, and to determine the luminous uniformity of the HUD backlight module based on the brightness of each reflected light ray; and to determine whether the backlight module is qualified based on the comparison result of the luminous uniformity and the set uniformity.

10. The test processing system according to claim 9, characterized in that, The system also includes a dark box, in which the HUD, the curved reflector, and the luminance meter are all located.

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