Probe station marker positioning method, device, electronic device and storage medium

Abstract

The present application discloses a probe station marker positioning method, a probe station marker positioning device, an electronic device and a storage medium, which belong to the field of marker positioning technology, wherein the probe station marker positioning method includes: obtaining a binary graph of the probe station marker; judging whether there is a connected domain that meets the circular feature in the binary graph; if so, locating the probe station marker based on the connected domain that meets the circular feature; if not, judging whether there is a connected domain that meets the arc feature in the binary graph, if so, locating the probe station marker based on the connected domain that meets the arc feature. The method is to perform secondary recognition on the circular probe station marker, firstly, the probe station marker with higher integrity can be identified by the circular feature, and secondly, the probe station marker with lower integrity can be identified by the arc feature, and the method can improve the recognition rate of the probe station marker by secondary recognition.

Description

Technical Field

[0001] The present application belongs to the technical field of marker positioning, and specifically relates to a probe station marker positioning method, device, electronic device and storage medium. Background Art

[0002] Probe stations are primarily used in the semiconductor, optoelectronics, and integrated circuit (IC) packaging testing industries. The testing process uses a probe card as a test interface, primarily for probing bare die on wafers. By connecting the tester to the chip, signal transmission is established to test chip parameters. Because the die on the wafer are extremely small, typically at the micron level, the probe station's positioning accuracy is extremely high. This accuracy is affected by many factors, such as mechanical precision and image pixel accuracy. To ensure accurate positioning of the probe station system, the vision system is typically calibrated, involving both pixel and camera calibration. Pixel calibration determines the conversion ratio between image coordinates and physical coordinates. By converting pixel coordinates in the image to physical coordinates, the physical position of the target in the image is determined, ensuring accurate positioning between the vision system and the mechanical system. Camera calibration determines the positional relationship between multiple cameras, ensuring accurate positioning between the vision systems. For example, if one camera captures the wafer surface and another captures the probe, the wafer surface vision system and the probe vision system are separate vision systems, while the probe needs to penetrate the wafer for testing. Camera calibration establishes a connection and ensures accurate positioning between the two vision systems.

[0003] Conventional vision system calibration uses a calibration plate. However, these plates are large and space-consuming, and the calibration calculations are inefficient and inflexible. Adding markers to the camera's optical path and automatically performing marker recognition can effectively increase the flexibility of vision calibration, improving both calibration efficiency and recognition rate. Markers come in many forms, and recognition methods vary depending on their shape. Circular markers are the most commonly used, but there is no publicly available robust method for circular marker recognition. Summary of the Invention

[0004] The purpose of this application is to provide a probe station marker positioning method, device, electronic device and storage medium to solve the problem of low recognition rate of existing probe station markers.

[0005] According to a first aspect of an embodiment of the present application, a method for positioning a probe station marker is provided, which may include:

[0006] Obtain a binary image of the probe station marker;

[0007] Determine whether there is a connected domain that meets the circular feature in the binary graph;

[0008] If so, locating the probe station marker based on the connected domain that meets the circular feature;

[0009] If not, it is determined whether there is a connected domain that meets the arc feature in the binary image. If so, the probe station marker is located based on the connected domain that meets the arc feature.

[0010] In some optional embodiments of the present application, determining whether there is a connected domain in the binary graph that meets the circular feature includes:

[0011] Acquire a first connected region from the binary graph;

[0012] Extracting the convex hull of the first connected domain;

[0013] Performing circle fitting processing on the contour convex hull to obtain a first fitting circle center pixel value and a first fitting radius;

[0014] Determining whether the first fitting circle center pixel value is within a first preset pixel interval to obtain a first determination result;

[0015] Determining whether the first fitting radius is within a first preset radius interval to obtain a second determination result;

[0016] If both the first judgment result and the second judgment result are yes, then the first connected domain meets the circular feature.

[0017] In some optional embodiments of the present application, obtaining the first connected region from the binary graph includes:

[0018] Acquire a first initial connected domain whose pixel area is within a first preset area range from the binary image;

[0019] Obtaining a first minimum bounding moment of the first initial connected domain;

[0020] The first initial connected domain whose aspect ratio of the first minimum bounding moment is smaller than a first preset ratio is used as the first connected domain.

[0021] In some optional embodiments of the present application, determining whether there is a connected domain in the binary graph that meets the arc feature includes:

[0022] Determine whether there is a connected domain that meets the arc position characteristics in the binary image. If so, further determine whether the connected domain that meets the arc position characteristics meets the arc shape characteristics. If so, the connected domain that meets the arc shape characteristics meets the arc characteristics.

[0023] In some optional embodiments of the present application, determining whether there is a connected domain in the binary graph that meets the arc position feature includes:

[0024] Acquire a second connected domain from the binary graph;

[0025] Drawing an arc retrieval graph based on the second connected domain;

[0026] Segmenting the arc search graph along the second connected domain to obtain independent blocks;

[0027] Acquire a center sampling point and corner sampling points from the arc search graph, wherein the corner sampling points include an upper left corner sampling point, a lower left corner sampling point, an upper right corner sampling point, and a lower right corner sampling point;

[0028] Whether the second connected domain meets the arc position feature is determined based on the number of the independent blocks, the position distribution of the central sampling points, and the position distribution of the corner sampling points.

[0029] In some optional embodiments of the present application, judging whether the second connected domain meets the arc position feature based on the number of the independent blocks, the position distribution of the center sampling points, and the position distribution of the corner sampling points includes:

[0030] When the number of the independent blocks is two, the second connected domain meets the arc position feature;

[0031] When the number of the independent blocks is three, the second connected domain meets the arc position feature if the arc search graph satisfies the following conditions at the same time: the largest independent block in the arc search graph contains the center sampling point and no more than one corner sampling point, and the remaining independent blocks each contain one corner sampling point;

[0032] When the number of the independent blocks is four, the second connected domain meets the arc position feature if the arc search graph satisfies the following conditions at the same time: the largest independent block in the arc search graph contains the center sampling point and one corner sampling point, and the remaining independent blocks each contain one corner sampling point;

[0033] When the number of the independent blocks is less than two or greater than four, the second connected domain does not meet the arc position feature.

[0034] In some optional embodiments of the present application, obtaining the second connected domain from the binary graph includes:

[0035] Performing morphological expansion on the binary image to obtain an expanded image;

[0036] Acquire a second initial connected domain whose pixel area is within a second preset area range from the expansion image;

[0037] Obtaining a second minimum bounding moment of the second initial connected domain;

[0038] Obtaining the length of the long side and the length of the short side of the second minimum enclosing moment;

[0039] Obtaining an area ratio of the second initial connected domain to the second minimum bounding moment;

[0040] The second initial connected domain, whose long side length is greater than a preset long side length, whose short side length is greater than a preset short side length, and whose area ratio is greater than a preset area ratio, is used as the second connected domain.

[0041] In some optional embodiments of the present application, further determining whether the connected domain that meets the arc position feature meets the arc morphology feature includes:

[0042] Performing edge detection on the binary image to obtain an edge detection image;

[0043] Mapping the connected domain that meets the arc position feature onto the edge detection map for positioning, and obtaining an edge point set located in the connected domain that meets the arc position feature;

[0044] Performing circle fitting processing on the edge point set to obtain a second fitting circle center pixel value and a second fitting radius;

[0045] Determining whether the second fitting circle center pixel value is within a second preset pixel interval to obtain a third determination result;

[0046] determining whether the second fitting radius is within a second preset radius interval to obtain a fourth determination result;

[0047] If both the third judgment result and the fourth judgment result are yes, then the connected domain that meets the arc position feature meets the arc morphological feature.

[0048] In some optional embodiments of the present application, performing circle fitting processing on the edge point set includes:

[0049] A least squares method is used to obtain a fitting circle function of the edge point set.

[0050] In some optional embodiments of the present application, obtaining a binary image of a probe station marker includes:

[0051] Gray-scale processing is performed on the probe station marker image to obtain a probe station marker grayscale image;

[0052] Threshold segmentation is performed on the probe station marker grayscale image to obtain the binary image.

[0053] In some optional embodiments of the present application, the threshold segmentation adopts any one of the following segmentation methods: local adaptive threshold segmentation method, Otsu method, maximum entropy threshold segmentation method, and iterative threshold segmentation method.

[0054] In some optional embodiments of the present application, before determining whether there is a connected domain that meets the circular feature in the binary graph, the method further includes:

[0055] The noise points in the binary image are filtered out by median filtering.

[0056] According to a second aspect of an embodiment of the present application, a probe station marker positioning device is provided, comprising:

[0057] An acquisition module, used to obtain a binary image of a probe station marker;

[0058] A data processing module is used to determine whether there is a connected domain that meets the circular feature in the binary graph;

[0059] If so, locating the probe station marker based on the connected domain that meets the circular feature;

[0060] If not, it is determined whether there is a connected domain that meets the arc feature in the binary image. If so, the probe station marker is located based on the connected domain that meets the arc feature.

[0061] According to a third aspect of an embodiment of the present application, an electronic device is provided, which may include:

[0062] processor;

[0063] a memory for storing processor-executable instructions;

[0064] The processor is configured to execute instructions to implement the probe station marker positioning method as shown in any one of the embodiments of the first aspect.

[0065] According to the fourth aspect of the embodiments of the present application, a storage medium is provided. When the instructions in the storage medium are executed by the processor of an information processing device or server, the information processing device or server implements the probe station marker positioning method as shown in any one of the embodiments of the first aspect.

[0066] The above technical solution of this application has the following beneficial technical effects:

[0067] The probe station marker positioning method provided in the embodiment of the present application is to perform secondary identification on circular probe station markers. First, the circular features can be used to identify probe station markers with higher integrity, and secondly, the arc features can be used to identify probe station markers with lower integrity. This method can improve the recognition rate of probe station markers through secondary identification. BRIEF DESCRIPTION OF THE DRAWINGS

[0068] Figure 1 This is a flow chart of a probe station marker positioning method in an exemplary embodiment of the present application;

[0069] Figure 2 is a flowchart of step S101 in an exemplary embodiment of the present application;

[0070] Figure 3 is a grayscale image of a probe station marker in an exemplary embodiment of the present application;

[0071] Figure 4 is a probe station marker binary image in an exemplary embodiment of the present application;

[0072] Figure 5 is a flowchart of step S501 in an exemplary embodiment of the present application;

[0073] Figure 6 is a probe station marker binary image after median filtering in an exemplary embodiment of the present application;

[0074] Figure 7 is a flowchart of step S102 in an exemplary embodiment of the present application;

[0075] Figure 8 is the first connected domain in an exemplary embodiment of the present application;

[0076] Figure 9 is the convex hull of the first connected domain in an exemplary embodiment of the present application;

[0077] Figure 10 is a flowchart of step S1021 in an exemplary embodiment of the present application;

[0078] Figure 11 is a flow chart of step S104 in an exemplary embodiment of the present application;

[0079] Figure 12 is a flowchart of step S1042 in an exemplary embodiment of the present application;

[0080] Figure 13 is the second connected domain in an exemplary embodiment of the present application;

[0081] Figure 14 is a negated arc search graph in an exemplary embodiment of the present application;

[0082] Figure 15 is a flowchart of step S10421 in an exemplary embodiment of the present application;

[0083] Figure 16 is a flowchart of step S10425 in an exemplary embodiment of the present application;

[0084] Figure 17 It is a second connected domain that is independently divided into two blocks in an exemplary embodiment of the present application;

[0085] Figure 18 It is a second connected domain with three independent blocks in an exemplary embodiment of the present application;

[0086] Figure 19 It is a second connected domain with four independent blocks in an exemplary embodiment of the present application;

[0087] Figure 20 is a flowchart of step S1042 in an exemplary embodiment of the present application;

[0088] Figure 21 is a connected domain that meets the arc position feature in an exemplary embodiment of the present application;

[0089] Figure 22 is an edge point set in an exemplary embodiment of the present application;

[0090] Figure 23 is a flowchart of step S10423 in an exemplary embodiment of the present application;

[0091] Figure 24 This is a schematic structural diagram of a probe station marker positioning device in an exemplary embodiment of the present application;

[0092] Figure 25 is a schematic structural diagram of an electronic device in an exemplary embodiment of the present application;

[0093] Figure 26 It is a schematic diagram of the hardware structure of an electronic device in an exemplary embodiment of the present application. DETAILED DESCRIPTION

[0094] To make the objectives, technical solutions, and advantages of this application more clearly understood, this application is further described below in conjunction with specific embodiments and with reference to the accompanying drawings. It should be understood that these descriptions are merely illustrative and are not intended to limit the scope of this application. In addition, in the following description, descriptions of well-known structures and technologies are omitted to avoid unnecessary confusion in the concepts of this application.

[0095] The accompanying drawings illustrate schematic diagrams of layer structures according to embodiments of the present application. These figures are not drawn to scale; for clarity, some details are exaggerated and some details may be omitted. The shapes of the various regions and layers shown in the figures, as well as their relative sizes and positional relationships, are merely exemplary and may deviate in practice due to manufacturing tolerances or technical limitations. Furthermore, those skilled in the art may design regions / layers with different shapes, sizes, and relative positions as needed.

[0096] Obviously, the described embodiments are only part of the embodiments of this application, not all of them. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of this application.

[0097] In the description of this application, it should be noted that the terms "first", "second" and "third" are used for descriptive purposes only and should not be understood as indicating or implying relative importance.

[0098] In addition, the technical features involved in the different embodiments of the present application described below can be combined with each other as long as they do not conflict with each other.

[0099] Research has found that the imaging of circular markers is affected by the uniformity of light, and there may be a phenomenon of missing circle edges. Traditional circle recognition methods usually detect the edges of the circle and directly perform circle fitting. Missing circle edges may cause fitting failure and inability to find the circle, which in turn causes marker recognition failure or recognition deviation. At the same time, conventional circular marker recognition only recognizes circles without screening the circles, which may cause incorrect recognition. In order to solve this problem, the present application proposes a probe station marker positioning method, a probe station marker positioning device, an electronic device and a storage medium.

[0100] The probe station marker positioning method, probe station marker positioning device, electronic device and storage medium provided in the embodiments of the present application are described in detail below with reference to specific embodiments and their application scenarios in conjunction with the accompanying drawings.

[0101] like Figure 1 As shown, in a first aspect of an embodiment of the present application, a probe station marker positioning method is provided, which may include:

[0102] Step S101: obtaining a binary image of a probe station marker;

[0103] Step S102: determining whether there is a connected domain that meets the circular feature in the binary graph;

[0104] Step S103: If the judgment result of step S102 is yes, the probe station marker is located based on the connected domain that meets the circular feature;

[0105] Step S104: If the judgment result of step S102 is no, it is determined whether there is a connected domain that meets the arc feature in the binary graph;

[0106] Step S105: If the judgment result of step S104 is yes, the probe station marker is positioned based on the connected domain that meets the arc feature.

[0107] Step S106: If the judgment result of step S104 is no, a positioning failure reminder is returned.

[0108] The probe station marker positioning method provided in the present embodiment is used for probe station camera calibration. When in use, a circular probe station marker is set on the camera optical path, and then the image of the probe station marker is obtained by the camera. The binary image obtained by the image conversion of the probe station marker is composed of a first pixel value and a second pixel value. Wherein, the first pixel value is greater than the second pixel value. The first pixel value can be 255, and the second pixel value can be 0. In the binary image, the pixel value is the first pixel value and the connected pixel points form a connected domain, and the number of connected domains can be multiple. The connected domain in the present embodiment is used to characterize the probe station marker. First, by circular feature recognition, a circular connected domain is screened from the binary image to obtain a probe station marker with a higher degree of integrity, and the coordinates of the center of the circle are output to complete the positioning of the probe station marker. When circular feature recognition fails, it indicates that there is no complete circle in the binary image, and further by circular arc feature recognition, a circular arc-shaped connected domain is screened from the binary image to obtain a probe station marker with a lower degree of integrity, and the coordinates of the center of the circle of the output arc are output to complete the positioning of the probe station marker. The probe station marker positioning method provided in this embodiment improves the robustness of the recognition algorithm through secondary recognition. When there is a circular edge defect in the probe station marker imaging, the probe station marker can still be positioned through the arc feature, thereby enhancing the robustness of the positioning algorithm and improving the success rate of the probe station marker positioning.

[0109] like Figure 2 In some embodiments, step S101 may include:

[0110] Step S1011: grayscale processing is performed on the probe station marker image to obtain a probe station marker grayscale image;

[0111] Step S1012: performing threshold segmentation on the probe station marker grayscale image to obtain a binary image.

[0112] In this embodiment, the circular probe station marker image is obtained by the probe station camera, such as Figure 3 As shown, the probe station marker image is grayed to obtain a probe station marker grayscale image. In this embodiment, the operation of converting a color image into a grayscale image is called image graying. Figure 4As shown, a binary image can be obtained by threshold segmentation. The binary image is used to characterize the outline of the marker, and the binary image is a black and white image. The pixel value of each point in the binary image is 0 or 255. The present embodiment can select any of the following existing threshold segmentation methods according to the actual use scenario, for example, Otsu's method, maximum entropy threshold segmentation method, and iterative threshold segmentation method. The threshold segmentation method in the present embodiment is a local adaptive threshold segmentation method, which uses the local adaptive threshold segmentation method to segment the dark area on the probe station marker image, which helps to improve the adaptability to light changes and the resistance to dirty interference, so that the extracted probe station marker outline is fuller, and the stability and accuracy of probe station marker recognition are improved.

[0113] like Figure 5 As shown, in some embodiments, before step S102, the following steps are further included:

[0114] Step S501: filtering out noise points in the binary image through median filtering.

[0115] The median filter in this embodiment is a nonlinear smoothing technique. Figure 6 As shown, the grayscale value of each pixel in the binary image is set to the median of all pixel grayscale values ​​within a certain neighborhood window of the point, and a binary image after median filtering is obtained. The binary image after median filtering is used as the binary image for subsequent processing. This embodiment can remove noise interference through median filtering, reduce the probability of incorrect recognition of circles or arcs in subsequent processing, improve the recognition accuracy of circles or arcs, and thus improve the positioning accuracy of the probe station marker.

[0116] like Figure 7 As shown, in some embodiments, step S102 may include:

[0117] Step S1021: obtaining a first connected component from the binary graph;

[0118] Step S1022: extracting the convex hull of the first connected domain;

[0119] Step S1023: performing circle fitting processing on the contour convex hull to obtain a first fitting circle center pixel value and a first fitting radius;

[0120] Step S1024: determining whether the first fitting circle center pixel value is within a first preset pixel interval to obtain a first determination result;

[0121] Step S1025: determining whether the first fitting radius is within a first preset radius interval to obtain a second determination result;

[0122] Step S1026: If both the first judgment result and the second judgment result are yes, then the first connected domain meets the circular feature.

[0123] like Figure 8As shown, in this embodiment, the first connected domain is a connected domain that may be circular and is used to represent a circular probe station marker. Figure 9 As shown, the first connected domain is extracted from the contour convex hull, and the meaning of the convex hull is: let S be any subset of Euclidean space, and the minimum convex set containing S is called the convex hull of S. In this embodiment, it is helpful to repair the defect of the circle by extracting the contour convex hull. The points on the contour convex hull are extracted as the calculation points of the fitting circle function, and the radius and center of the fitted circle function are calculated. This embodiment does not limit the method of fitting the circle. The existing fitting circle method can be selected according to the actual use scenario. The optional circle fitting method includes but is not limited to: least squares method, minimum interval method, minimum circumscribed method, maximum inscribed method, fixed radius method, RANSAC. The first preset pixel interval is used to characterize the pixel value of the center of the probe station marker, and the first pixel interval can be less than 180. The first preset radius interval is used to characterize the radius of the probe station marker, and the first preset radius interval can be the radius of the probe station marker ± 4 pixels. If the first judgment result and the second judgment result are both yes, then the first connected domain satisfies both the radius and center pixel identification conditions, and the first connected domain meets the circular feature.

[0124] like Figure 10 As shown, in some embodiments, step S1021 may include:

[0125] Step S10211: obtaining a first initial connected domain whose pixel area is within a first preset area range from the binary image;

[0126] Step S10212: Obtain the first minimum bounding moment of the first initial connected region;

[0127] Step S10213: taking the first initial connected domain whose aspect ratio of the first minimum bounding moment is smaller than the first preset ratio as the first connected domain.

[0128] In the present embodiment, the pixel area is the number of white pixels in the binary image, and the first initial connected domain is the area composed of connected white pixels in the binary image. The first preset area interval is used to characterize the area of ​​the probe station marker. In the present embodiment, the first preset area interval can be 200 ± 10 pixels. Based on the first preset area interval, the interference of discontinuous noise can be eliminated and continuous probe station markers can be extracted. The first minimum enclosing moment in the present embodiment is the minimum rotation enclosing moment, and the longer side of the minimum rotation enclosing moment is obtained as the long side, the shorter side is the short side, and the ratio of the long side to the short side is the aspect ratio. When the long side and the short side are the same length, the aspect ratio is 1. In the present embodiment, the closer the aspect ratio is to 1, the closer the first initial connected domain is to a circle. The first preset ratio can be 1.1. When the aspect ratio is less than the first preset ratio, the first initial connected domain may be a circle. The present embodiment can preliminarily screen out the first initial connected domain that may be a circle based on the aspect ratio of the first minimum enclosing moment, thereby reducing the amount of computation required for subsequent screening and improving the recognition efficiency of the circle.

[0129] like Figure 11 As shown, in some embodiments, step S104 may include:

[0130] Step S1041: determining whether there is a connected domain in the binary graph that meets the arc position feature;

[0131] Step S1042: If the judgment result of step S1041 is yes, then further judging whether the connected domain that meets the arc position feature meets the arc shape feature;

[0132] Step S1043: If the judgment result of step S1042 is yes, the connected domain that meets the arc morphological feature meets the arc feature.

[0133] Step S1044: If the judgment result of step S1041 or step S1042 is no, a positioning failure reminder is returned.

[0134] The probe station marker positioning method provided in this embodiment performs arc recognition in two steps based on arc position features and arc morphology features, and can improve the efficiency and accuracy of arc recognition through secondary screening.

[0135] like Figure 12 As shown, in some embodiments, step S1042 may include:

[0136] Step S10421: obtaining a second connected region from the binary graph;

[0137] Step S10422: drawing an arc search graph based on the second connected component;

[0138] Step S10423: Segment the arc search graph along the second connected domain to obtain independent blocks;

[0139] Step S10424: obtaining a center sampling point and corner sampling points from the arc search graph, wherein the corner sampling points include an upper left corner sampling point, a lower left corner sampling point, an upper right corner sampling point, and a lower right corner sampling point;

[0140] Step S10425: judging whether the second connected component meets the arc position feature based on the number of independent blocks, the position distribution of the center sampling points, and the position distribution of the corner sampling points.

[0141] In this embodiment, Figure 13 As shown in FIG, a connected domain that may be an arc is extracted from the binary image as the second connected domain. The edge of the arc search map is the minimum bounding moment of the second connected domain. The arc search map only includes two pixel values ​​0 and 255, where the second connected domain is a white area with a pixel value of 255. In this embodiment, Figure 14 As shown, the arc search map can be inverted. In the inverted arc search map, the area composed of continuous white pixels is an independent block. In some embodiments, the independent blocks are pre-processed to delete independent blocks with a pixel area less than 100 to obtain pre-processed independent blocks. The pre-processing can eliminate the interference of small noise points. Further, based on the number of independent blocks, the position distribution of the center sampling point and the position distribution of the corner sampling points, it can be determined whether the second connected domain is likely to be an arc.

[0142] like Figure 15 As shown, in some embodiments, step S10421 may include:

[0143] Step S104211: performing morphological dilation on the binary image to obtain a dilated image;

[0144] Step S104212: obtaining a second initial connected domain whose pixel area is within a second preset area range from the expansion image;

[0145] Step S104213: Obtain the second minimum bounding moment of the second initial connected region;

[0146] Step S104214: Obtain the length of the long side and the length of the short side of the second minimum bounding moment;

[0147] Step S104215: obtaining the area ratio of the second initial connected region to the second minimum bounding moment;

[0148] Step S104216: The second initial connected domain with a long side length greater than a preset long side length, a short side length greater than a preset short side length, and an area ratio greater than a preset area ratio is used as the second connected domain.

[0149] In this embodiment, morphological expansion can connect broken arcs as much as possible, achieving arc repair and facilitating subsequent arc recognition. The second preset area interval can be 400±10 pixels. The pixel area is the number of white pixels in the second initial connected domain, which is composed of connected white pixels in the binary image. The longer side of the second minimum bounding moment is the long side, and the shorter side is the short side. The number of pixels in the second initial connected domain is the area of ​​the second initial connected domain, and the product of the long side and the short side is the area of ​​the second minimum bounding moment. In this embodiment, the preset long side length can be 80 pixels, the preset short side length can be 20 pixels, and the preset area ratio can be 0.4. A second initial connected domain whose long side length is greater than the preset long side length, whose short side length is greater than the preset short side length, and whose area ratio is greater than the preset area ratio may be an arc. In this embodiment, by screening the connected domains obtained through morphological expansion according to size and morphology, it is possible to preliminarily screen out second connected domains that may be arcs, reducing the amount of computation required for subsequent screening and improving the efficiency of arc recognition.

[0150] like Figure 16 As shown, in some embodiments, step S10425 may include:

[0151] Step S104251: When the number of independent blocks is two, the second connected domain meets the arc position feature;

[0152] Step S104252: When the number of independent blocks is three, the second connected component meets the arc position feature if the arc search graph satisfies the following conditions: the largest independent block in the arc search graph contains a central sampling point and no more than one corner sampling point, and the remaining independent blocks each contain one corner sampling point;

[0153] Step S104253: When the number of independent blocks is four, the second connected component meets the arc position feature if the arc search graph satisfies the following conditions: the largest independent block in the arc search graph contains a center sampling point and a corner sampling point, and the remaining independent blocks each contain a corner sampling point;

[0154] Step S104254: When the number of independent blocks is less than two or greater than four, the second connected domain does not meet the arc position feature.

[0155] In this embodiment, when the second connected domain is an arc, there are three cases, such as Figure 17 As shown in , when the number of independent blocks is two, the second connected domain can be directly determined to be an arc, where the central sampling point A is located on the larger independent block, each independent block contains one corner sampling point B, and the remaining two corner sampling points B are on the second connected domain. Figure 18As shown in , when the number of independent blocks is three, the central sampling point A is on the largest independent block, the largest independent block has 1 or 0 corner sampling points B, and the other blocks each contain one corner sampling point B. It can be determined that the second connected domain is an arc, and the remaining corner sampling point B is on the second connected domain. Figure 19 As shown in Figure 1, when the number of independent blocks is four, the central sampling point A is on the largest independent block, and each independent block contains a corner sampling point B, the second connected domain can be determined to be an arc. If none of the above three conditions are met, the second connected domain can be determined not to be an arc.

[0156] like Figure 20 As shown, in some embodiments, step S1042 may include:

[0157] Step S10421: performing edge detection on the binary image to obtain an edge detection image;

[0158] Step S10422: Mapping the connected domain that meets the arc position feature onto the edge detection map for positioning, and obtaining the edge point set located in the connected domain that meets the arc position feature;

[0159] Step S10423: performing circle fitting processing on the edge point set to obtain a second fitting circle center pixel value and a second fitting radius;

[0160] Step S10424: determining whether the second fitting circle center pixel value is within a second preset pixel interval to obtain a third determination result;

[0161] Step S10425: determining whether the second fitting radius is within a second preset radius interval to obtain a fourth determination result;

[0162] Step S10426: If both the third judgment result and the fourth judgment result are yes, then the connected domain that meets the arc position feature meets the arc shape feature.

[0163] In this embodiment, Figure 21 As shown in , the connected domain that meets the arc position feature is the expanded arc area. The expanded arc area corresponds to the arc contour coordinates on the edge detection map. Therefore, positioning can be performed based on the connected domain that meets the arc position feature, as shown in Figure 22 As shown, only the edge point set located on the connected domain that meets the arc position feature is extracted, that is, the white pixel point. In this embodiment, the second preset radius interval is used to characterize the probe station marker radius, and the center pixel value is used to characterize the probe station marker center pixel value. The second preset radius interval can be the probe station marker radius ± 4 pixels, and the center pixel value can be 180. When the third judgment result and the fourth judgment result are both yes, it means that a circular probe station marker is identified, and the second fitting center is the probe station marker coordinate.

[0164] like Figure 23 As shown, in some embodiments, step S10423 may include:

[0165] Step S104231: Use the least squares method to obtain the fitting circle function of the edge point set.

[0166] The probe station marker positioning method provided in this embodiment sets judgment rules to detect arcs when preliminary circle recognition fails, re-fits the incomplete arcs, obtains new center and radius, and makes judgments, which significantly improves the success rate and stability of probe station marker recognition.

[0167] In a second aspect of the embodiment of the present application, a probe station marker positioning device is provided, such as Figure 24 Shown, including:

[0168] An acquisition module 241 is used to acquire a binary image of a probe station marker;

[0169] The data processing module 242 is used to determine whether there is a connected domain that meets the circular feature in the binary graph;

[0170] If so, the probe station marker is located based on the connected domain that conforms to the circular feature;

[0171] If not, it is determined whether there is a connected domain that meets the arc feature in the binary image. If so, the probe station marker is located based on the connected domain that meets the arc feature.

[0172] The probe station marker positioning device in the embodiment of the present application may also be a component, an integrated circuit or a chip in a terminal. The device may be a mobile electronic device or a non-mobile electronic device. Exemplary, a mobile electronic device may be a mobile phone, a tablet computer, a notebook computer, a palmtop computer, an on-board electronic device, a wearable device, an ultra-mobile personal computer (ultra-mobile personal computer, UMPC), a netbook or a personal digital assistant (personal digital assistant, PDA) etc., a non-mobile electronic device may be a server, a network attached storage (Network Attached Storage, NAS), a personal computer (personal computer, PC), a television set (television, TV), a teller machine or a self-service machine etc., and the embodiment of the present application is not specifically limited.

[0173] The probe station marker positioning device provided in the embodiment of the present application can implement each process of a probe station marker positioning method provided in any of the above embodiments. To avoid repetition, they will not be described here.

[0174] Alternatively, as Figure 25As shown, an embodiment of the present application also provides an electronic device 1100, including a processor 1101, a memory 1102, and a program or instruction stored in the memory 1102 and executable on the processor 1101. When the program or instruction is executed by the processor 1101, each process of the above-mentioned probe station marker positioning method embodiment is implemented, and the same technical effect can be achieved. To avoid repetition, it will not be repeated here.

[0175] It should be noted that the electronic devices in the embodiments of the present application include the mobile electronic devices and non-mobile electronic devices mentioned above.

[0176] Figure 26 A schematic diagram of the hardware structure of an electronic device implementing an embodiment of the present application.

[0177] The electronic device 1200 includes but is not limited to: a radio frequency unit 1201, a network module 1202, an audio output unit 1203, an input unit 1204, a sensor 1205, a display unit 1206, a user input unit 1207, an interface unit 1208, a memory 1209, and a processor 1210.

[0178] Those skilled in the art will understand that the electronic device 1200 may also include a power source (such as a battery) to power each component, and the power source may be logically connected to the processor 1210 through a power management system, thereby implementing functions such as charging, discharging, and power consumption management through the power management system. Figure 26 The electronic device structure shown in the figure does not constitute a limitation on the electronic device. The electronic device may include more or fewer components than shown in the figure, or combine certain components, or arrange the components differently, which will not be repeated here.

[0179] It should be understood that in an embodiment of the present application, the input unit 1204 may include a graphics processing unit (GPU) 12041 and a microphone 12042, and the graphics processor 12041 processes the image data of a static picture or video obtained by an image capture device (such as a camera) in a video capture mode or an image capture mode. The display unit 1206 may include a display panel 12061, and the display panel 12061 may be configured in the form of a liquid crystal display, an organic light emitting diode, etc. The user input unit 1207 includes a touch panel 12071 and other input devices 12072. The touch panel 12071 is also called a touch screen. The touch panel 12071 may include two parts: a touch detection device and a touch controller. Other input devices 12072 may include but are not limited to a physical keyboard, function keys (such as volume control keys, switch keys, etc.), a trackball, a mouse, and an operating stick, which will not be repeated here. The memory 1209 can be used to store software programs and various data, including but not limited to applications and operating systems. The processor 1210 may integrate an application processor and a modem processor, wherein the application processor mainly processes the operating system, user interface, and application programs, and the modem processor mainly processes wireless communications. It is understood that the modem processor may not be integrated into the processor 1210.

[0180] An embodiment of the present application also provides a readable storage medium, on which a program or instruction is stored. When the program or instruction is executed by a processor, each process of the above-mentioned probe station marker positioning method embodiment is implemented, and the same technical effect can be achieved. To avoid repetition, it will not be repeated here.

[0181] The processor is the processor in the electronic device described in the above embodiment. The readable storage medium includes a computer-readable storage medium, such as a computer read-only memory (ROM), random access memory (RAM), a magnetic disk, or an optical disk.

[0182] An embodiment of the present application further provides a chip, which includes a processor and a communication interface, wherein the communication interface is coupled to the processor, and the processor is used to run programs or instructions to implement the various processes of the above-mentioned probe station marker positioning method embodiment, and can achieve the same technical effect. To avoid repetition, it will not be repeated here.

[0183] It should be understood that the chip mentioned in the embodiments of the present application can also be called a system-level chip, a system chip, a chip system or a system-on-chip chip, etc.

[0184] It should be noted that, in this article, the terms "comprise", "include" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device comprising a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, an element defined by the statement "comprises a ..." does not exclude the presence of other identical elements in the process, method, article or device comprising the element. In addition, it should be noted that the scope of the methods and devices in the embodiments of the present application is not limited to performing functions in the order shown or discussed, and may also include performing functions in a substantially simultaneous manner or in the opposite order according to the functions involved. For example, the described method may be performed in an order different from that described, and various steps may also be added, omitted, or combined. In addition, the features described with reference to certain examples may be combined in other examples.

[0185] Through the description of the above implementation methods, those skilled in the art can clearly understand that the above-mentioned embodiment methods can be implemented by means of software plus the necessary general hardware platform, and of course can also be implemented by hardware, but in many cases the former is a better implementation method. Based on this understanding, the technical solution of the present application is essentially or the part that contributes to the prior art can be embodied in the form of a computer software product, which is stored in a storage medium (such as ROM / RAM, magnetic disk, optical disk), including a number of instructions for enabling a terminal (which can be a mobile phone, computer, server, or network device, etc.) to execute the methods described in each embodiment of the present application.

[0186] The embodiments of the present application are described above in conjunction with the accompanying drawings, but the present application is not limited to the above-mentioned specific implementation methods. The above-mentioned specific implementation methods are merely illustrative and not restrictive. Under the guidance of this application, ordinary technicians in this field can also make many forms without departing from the purpose of this application and the scope of protection of the claims, all of which are within the protection of this application.

Claims

1. A probe station marker positioning method, characterized in that, include: Obtain a binary image of the probe station marker; Determine whether there is a connected domain that meets the circular feature in the binary graph; If so, locating the probe station marker based on the connected domain that meets the circular feature; If not, determining whether there is a connected domain that meets the arc feature in the binary image, and if so, locating the probe station marker based on the connected domain that meets the arc feature; Determining whether there is a connected domain that meets the arc feature in the binary graph includes: Determine whether there is a connected domain that meets the arc position characteristics in the binary image. If so, further determine whether the connected domain that meets the arc position characteristics meets the arc shape characteristics. If so, the connected domain that meets the arc shape characteristics meets the arc characteristics.

2. A probe station marker positioning method according to claim 1, characterized in that, Determining whether there is a connected domain that meets the circular feature in the binary graph includes: Acquire a first connected region from the binary graph; Extracting the convex hull of the first connected domain; Performing circle fitting processing on the contour convex hull to obtain a first fitting circle center pixel value and a first fitting radius; Determining whether the first fitting circle center pixel value is within a first preset pixel interval to obtain a first determination result; Determining whether the first fitting radius is within a first preset radius interval to obtain a second determination result; If both the first judgment result and the second judgment result are yes, then the first connected domain meets the circular feature.

3. A probe station marker positioning method according to claim 2, characterized in that, Acquiring a first connected component from the binary graph includes: Acquire a first initial connected domain whose pixel area is within a first preset area range from the binary image; Obtaining a first minimum bounding moment of the first initial connected domain; The first initial connected domain whose aspect ratio of the first minimum bounding moment is smaller than a first preset ratio is used as the first connected domain.

4. A probe station marker positioning method according to claim 1, characterized in that, Determining whether there is a connected domain in the binary graph that meets the arc position feature includes: Acquire a second connected domain from the binary graph; Drawing an arc retrieval graph based on the second connected domain; Segmenting the arc search graph along the second connected domain to obtain independent blocks; Acquire a center sampling point and corner sampling points from the arc search graph, wherein the corner sampling points include an upper left corner sampling point, a lower left corner sampling point, an upper right corner sampling point, and a lower right corner sampling point; Whether the second connected domain meets the arc position feature is determined based on the number of the independent blocks, the position distribution of the central sampling points, and the position distribution of the corner sampling points.

5. A probe station marker positioning method according to claim 4, characterized in that, Determining whether the second connected domain meets the arc position feature based on the number of the independent blocks, the position distribution of the center sampling points, and the position distribution of the corner sampling points includes: When the number of the independent blocks is two, the second connected domain meets the arc position feature; When the number of the independent blocks is three, the second connected domain meets the arc position feature if the arc search graph satisfies the following conditions at the same time: the largest independent block in the arc search graph contains the center sampling point and no more than one corner sampling point, and the remaining independent blocks each contain one corner sampling point; When the number of the independent blocks is four, the second connected domain meets the arc position feature if the arc search graph satisfies the following conditions at the same time: the largest independent block in the arc search graph contains the center sampling point and one corner sampling point, and the remaining independent blocks each contain one corner sampling point; When the number of the independent blocks is less than two or greater than four, the second connected domain does not meet the arc position feature.

6. A probe station marker positioning method according to claim 4, characterized in that, Acquiring a second connected component from the binary graph includes: Performing morphological expansion on the binary image to obtain an expanded image; Acquire a second initial connected domain whose pixel area is within a second preset area range from the expansion image; Obtaining a second minimum bounding moment of the second initial connected domain; Obtaining the length of the long side and the length of the short side of the second minimum enclosing moment; Obtaining an area ratio of the second initial connected domain to the second minimum bounding moment; The second initial connected domain, whose long side length is greater than a preset long side length, whose short side length is greater than a preset short side length, and whose area ratio is greater than a preset area ratio, is used as the second connected domain.

7. A probe station marker positioning method according to any one of claims 1 to 6, characterized in that: Further determining whether the connected domain that meets the arc position feature meets the arc morphological feature includes: Performing edge detection on the binary image to obtain an edge detection image; Mapping the connected domain that meets the arc position feature onto the edge detection map for positioning, and obtaining an edge point set located in the connected domain that meets the arc position feature; Performing circle fitting processing on the edge point set to obtain a second fitting circle center pixel value and a second fitting radius; Determining whether the second fitting circle center pixel value is within a second preset pixel interval to obtain a third determination result; determining whether the second fitting radius is within a second preset radius interval to obtain a fourth determination result; If both the third judgment result and the fourth judgment result are yes, then the connected domain that meets the arc position feature meets the arc morphological feature.

8. A probe station marker positioning method according to claim 7, characterized in that, Performing circle fitting processing on the edge point set includes: A least squares method is used to obtain a fitting circle function of the edge point set.

9. A probe station marker positioning method according to claim 1, characterized in that, Obtaining a binary image of a probe station marker includes: Gray-scale processing is performed on the probe station marker image to obtain a probe station marker grayscale image; Threshold segmentation is performed on the probe station marker grayscale image to obtain the binary image.

10. A probe station marker positioning method according to claim 9, characterized in that: Threshold segmentation uses any of the following segmentation methods: local adaptive threshold segmentation method, Otsu method, maximum entropy threshold segmentation method, and iterative threshold segmentation method.

11. A probe station marker positioning method according to claim 1, characterized in that: Before determining whether there is a connected region in the binary graph that meets the circular feature, the method further includes: The noise points in the binary image are filtered out by median filtering.

12. A probe station marker positioning device, characterized in that: include: An acquisition module, used to obtain a binary image of a probe station marker; A data processing module is used to determine whether there is a connected domain that meets the circular feature in the binary graph; If so, locating the probe station marker based on the connected domain that meets the circular feature; If not, determining whether there is a connected domain that meets the arc feature in the binary image, and if so, locating the probe station marker based on the connected domain that meets the arc feature; Determining whether there is a connected domain that meets the arc feature in the binary graph includes: Determine whether there is a connected domain that meets the arc position characteristics in the binary image. If so, further determine whether the connected domain that meets the arc position characteristics meets the arc shape characteristics. If so, the connected domain that meets the arc shape characteristics meets the arc characteristics.

13. An electronic device, characterized in that: include: A processor, a memory, and a program or instruction stored in the memory and executable on the processor, wherein when the program or instruction is executed by the processor, a method for locating a probe station marker according to any one of claims 1 to 11 is implemented.

14. A readable storage medium, characterized in that The readable storage medium stores a program or instruction, and when the program or instruction is executed by a processor, a probe station marker positioning method according to any one of claims 1 to 11 is implemented.

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