Test module communication structure based on on-state tester

Abstract

This invention discloses a communication structure for a test module based on a continuity tester, comprising: a continuity test host, having a host MCU and host data signal output and input terminals connected thereto; a continuity test point board, having multiple communication interfaces, each of which is connected to a test bus via a corresponding first switch and grounded via a corresponding second switch; and multiple communication node modules, each having a module indicator light, a node MCU, and node data signal input and output terminals connected thereto. The module indicator lights, node data signal inputs, and node data signal outputs are all connected to their respective communication interfaces via module indicator light control lines, and the module indicator lights are also connected to the host MCU via indicator light enable signal lines. This structure forms a communication network connecting all test modules, enabling the test host to read and save the test results and parameter settings of the test modules, thus achieving traceability of the tested products.

Description

Technical Field

[0001] This invention relates to the field of wire harness testing system technology, and in particular to a communication structure for a test module based on a continuity tester. Background Technology

[0002] Wiring harness testing involves testing the wiring components that connect various electrical devices in a circuit, as well as the insulation and wrapping materials, to identify potential problems. The parameters that generally need to be tested include the wiring harness's continuity, insulation, withstand voltage, and resistance.

[0003] The wire harness testing system mainly consists of a host computer, a test host, a test point board, and test modules. The data from the sensors in the existing test modules cannot be uploaded to the computer for storage, and the sensor parameters of the test modules cannot be set. The computer also cannot obtain the sensor setting results. Incorrect sensor settings will cause defective products to pass the test. Therefore, the test modules are not actually connected to the network, and the pass / fail status can only be determined based on the pass / fail switch signals output by the test modules.

[0004] In view of this, the inventors have added a communication structure to the existing wire harness testing system and developed a test module communication structure based on a continuity tester. Summary of the Invention

[0005] The purpose of this invention is to provide a communication structure for a test module based on a continuity tester. By adding a communication interface to the test module and using the original module's error indication line as a communication line, each test module is connected to form a communication network without adding wiring. This allows the test host to read the test results and parameter settings of the test modules and save this data, enabling traceability of the tested products.

[0006] To achieve the above-mentioned technical objectives, the present invention adopts the following technical solution:

[0007] The communication structure of the test module based on the continuity tester includes a continuity test host, a continuity test point board, and multiple communication node modules, each of which is a test node;

[0008] The continuity test host has a host MCU and a host data signal output terminal and a host data signal input terminal respectively connected to the host MCU;

[0009] The continuity test point board has multiple communication interfaces. Each communication interface is connected to the test bus through a corresponding first switch and grounded through a corresponding second switch. When the first switch is open, it is in the communication state, and the continuity test host can send and receive data signals to the corresponding test node. In the communication state, the second switch is in the closed state.

[0010] The communication node module has a module indicator light, a node MCU, and a node data signal input terminal, a node data signal output terminal, and a sensor connected to the node MCU. The module indicator light, the node data signal input terminal, and the node data signal output terminal are all connected to the corresponding communication interface through the module indicator light control line. The module indicator light is also connected to the host MCU through the indicator light enable signal line.

[0011] Furthermore, both the first switch and the second switch are MOSFET switching circuits. The first switch and the second switch are controlled by two columns of serial data generated by the continuity test host through the serial-to-parallel integrated circuit on the continuity test point board to control the opening / closing of the first switch and the second switch.

[0012] Furthermore, the host data signal output terminal includes a host inverter and a host signal output switch connected in sequence to the host MCU. The drain of the host signal output switch is connected to the test bus and then connected to the positive terminal of the power supply through a current-limiting resistor. The source of the host signal output switch is grounded, so that the test bus level follows the level change of the host data signal output terminal.

[0013] Furthermore, the host data signal input terminal includes a host comparator, the test bus is connected to one input terminal of the host comparator, the other input terminal of the host comparator is a reference voltage input, and the output terminal of the host comparator is connected to the host MCU.

[0014] Furthermore, the node data signal output terminal includes a node inverter and a node signal output switch that are sequentially connected to the node MCU. The drain of the node signal output switch is connected to the corresponding communication interface through an indicator light control line, and the source of the node signal output switch is grounded.

[0015] Furthermore, the node data signal input terminal includes a node comparator. One input terminal of the node comparator is connected to the corresponding communication interface via a connection indicator control line, the other input terminal of the node comparator is a reference voltage input, and the output terminal of the node comparator is connected to the node MCU.

[0016] Furthermore, the node data signal input terminal includes a first node input MOSFET switch, a second node input MOSFET switch, and a third node input MOSFET switch. The gate of the first node input MOSFET switch is connected to the indicator light enable signal line, the source of the first node input MOSFET switch is connected to the gate of the second node input MOSFET switch, and the drain of the first node input MOSFET switch is connected to the indicator light control line through a Zener diode. The drain of the second node input MOSFET switch is connected to the gate of the third node input MOSFET switch, and the drain of the third node input MOSFET switch is connected to the node MCU. The source of the second node input MOSFET switch and the third node input MOSFET switch are connected to the gate of the indicator light enable signal line. The sources of both nodes are grounded. The drains of the second node input MOSFET switch and the third node input MOSFET switch are connected to the positive power supply via pull-up resistors. The node data signal output terminal includes a first node output MOSFET switch and a second node output MOSFET switch. The gate of the first node output MOSFET switch is connected to the node MCU and then to the positive power supply via a pull-up resistor. The drain of the first node output MOSFET switch is connected to the gate of the second node output MOSFET switch and then to the positive power supply via a resistor. The drain of the second node output MOSFET switch is connected to the indicator light control line via a resistor. The sources of both the first node output MOSFET switch and the second node output MOSFET switch are grounded.

[0017] Furthermore, the indicator light control line connected to the communication interface on the continuity test point board can serve as both a feedback line for module test results and a communication line for sending and receiving data to and from the communication node module. Each communication interface on the continuity test point board can be used to test the continuity, resistance, and capacitance of the line, and can also serve as a communication interface for sending and receiving data to and from the communication node module.

[0018] To achieve the above-mentioned technical objectives, the present invention also proposes the following alternative technical solution:

[0019] The communication structure of the test module based on the continuity tester includes a continuity test host and multiple communication node modules, each of which is a test node;

[0020] The continuity test host has a host MCU and a host data signal output terminal and a host data signal input terminal respectively connected to the host MCU. The host data signal output terminal and the host data signal input terminal are both connected to the communication bus.

[0021] The communication node module has a node MCU, a node data signal input terminal, a node data signal output terminal, and a sensor connected to the node MCU. The node data signal input terminal and the node data signal output terminal are both connected to the communication bus. The node MCU is also connected to the host MCU through a communication enable signal line.

[0022] Furthermore, the host data signal output terminal includes a host inverter and a host signal output switch connected in sequence to the host MCU. The drain of the host signal output switch is connected to the communication bus and then connected to the positive terminal of the power supply through a current-limiting resistor. The source of the host signal output switch is grounded, which causes the communication bus level to change.

[0023] The host data signal input terminal includes a host comparator. The communication bus is connected to one input terminal of the host comparator. The other input terminal of the host comparator is a reference voltage input. The output terminal of the host comparator is connected to the host MCU.

[0024] Furthermore, the node data signal output terminal includes a node inverter and a node signal output switch that are sequentially connected to the node MCU. The drain of the node signal output switch is connected to the communication bus, and the source of the node signal output switch is grounded.

[0025] Furthermore, the node data signal input terminal includes a node comparator. One input terminal of the node comparator is connected to the communication bus, the other input terminal of the node comparator is a reference voltage input, and the output terminal of the node comparator is connected to the node MCU.

[0026] Based on the first technical solution described above, the communication structure of the test module based on the continuity tester of the present invention has the following two working modes:

[0027] Communication Mode: When the continuity test host needs to communicate with a designated communication node module, the continuity test host controls the opening of the first switch connected to the corresponding communication interface. The host MCU of the continuity test host outputs a signal through the signal output terminal, forming a pulse signal on the test bus. These signals pass through the first switch and the module indicator control line, and are then converted into a serial port input signal (i.e., serial port data) acceptable to the node MCU by the node comparator. After the continuity test host finishes sending signals, it waits to receive the serial port signal output by the communication node module. The node MCU acquires test data from the sensor. Each test module (i.e., the communication node module) under the same test bus outputs the data required by the continuity test host through the node signal output terminal according to the set time node. The signal passes through an inverter, the node output switch, and the first switch, forming a pulse signal on the test bus. The pulse signal is then converted into a serial port input signal acceptable to the host MCU by the host comparator.

[0028] Non-communication mode: In this mode, the host MCU of the test host can also control the opening of a designated second switch, that is, the second switch of the test point connected to the module indicator control line of the test module (i.e. the communication node module), thereby connecting the test point to the ground wire and lighting up the module indicator to realize the module indication function.

[0029] By adopting the above solution, the present invention has the following beneficial effects:

[0030] I. This invention adds a communication interface to the test module, utilizing the original test module's error indication line (i.e., test bus and indicator light control line) as a communication line. Without adding wiring, each test module forms a communication network, meaning each test module also functions as a communication node module. This allows the test host to read the test results and parameter settings of the test module and save this data, enabling traceability of the tested products. Furthermore, in non-communication mode, the test module can also be connected to the ground wire, thereby illuminating the module indicator light and realizing the module indication function.

[0031] Second, the communication structure of the present invention can also be applied to other fields to achieve serial communication through a single wire under the condition of unified grounding.

[0032] Third, a continuity test host can connect to tens of thousands of test nodes simultaneously. Each test node can connect to a corresponding communication node module. The continuity test host can turn on the first switch on the test point board in batches to achieve communication with all communication node modules.

[0033] IV. The indicator light control lines connected to the test points (communication interfaces) on the continuity test point board can serve as feedback lines for module test results, used to control module indicator lights, and can also be used as communication lines to send and receive data to and from the communication node module. Each test point on the continuity test point board can not only be used to test the continuity, resistance, and capacitance of the circuit, but also serve as a communication interface to send and receive data to and from the communication node module. Attached Figure Description

[0034] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other modifications can be obtained based on these drawings without creative effort.

[0035] Figure 1 This is a network structure diagram of the communication node through the continuity test point board in Embodiment 1 of the present invention;

[0036] Figure 2This is the communication implementation circuit of the communication node module in Embodiment 1 of the present invention.

[0037] Figure 3 This is a diagram of the direct networking structure of communication nodes in Embodiment 2 of the present invention;

[0038] Label Explanation

[0039] Test host 10, host MCU 11, host inverter 12, host signal output switch 13, host comparator 14;

[0040] Continuity test point board 20, communication interface 21, first switch 22; second switch 23;

[0041] Communication node module 30, module indicator light 31, node MCU 32, node inverter 33, node signal output switch 34, node comparator 35, sensor 36;

[0042] Test bus 40, indicator light control line 50, indicator light enable signal line 51, communication enable signal line 52, communication bus 60. Detailed Implementation

[0043] The technical solutions of the embodiments of the present invention will be clearly described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0044] Example 1

[0045] like Figure 1 As shown, the communication structure of the test module based on the continuity tester disclosed in Embodiment 1 of the present invention includes a continuity test host 10, a continuity test point board 20, and multiple communication node modules 30, each of the communication node modules 30 being a test node;

[0046] The continuity test host 10 has a host MCU 11 and a host data signal output terminal and a host data signal input terminal respectively connected to the host MCU 11;

[0047] The continuity test board 20 has multiple communication interfaces 21. Each communication interface 21 is connected to the test bus 40 through a corresponding first switch 22 and grounded through a corresponding second switch 23. When the first switch 22 is open, it is in communication mode, and the continuity test host can send and receive data signals to the corresponding test node. In communication mode, the second switch 23 is in closed mode. Specifically, in this embodiment, the first switch 22 and the second switch 23 are both MOS transistor switching circuits. The first switch 22 and the second switch 23 are controlled by two columns of serial data generated by the continuity test host 10 through the serial-to-parallel integrated circuit on the continuity test board 20 to control the opening / closing of the first switch 22 and the second switch 23. The indicator light control line 50 connected to the communication interface 21 on the continuity test board 20 can serve as a feedback line for the module test results and as a communication line for sending and receiving data to and from the communication node module. Each communication interface 21 of the continuity test board 20 can be used to test the continuity, resistance, and capacitance of the circuit, and can also serve as a communication interface to send and receive data to and from the communication node module 30.

[0048] The communication node module 30 has a module indicator light, a node MCU, and a node data signal input terminal, a node data signal output terminal, and a sensor connected to the node MCU. The module indicator light, the node data signal input terminal, and the node data signal output terminal are all connected to the corresponding communication interface 21 through the module indicator light control line. The module indicator light is also connected to the host MCU 11 through the indicator light enable signal line.

[0049] In this embodiment, specifically, the host data signal output terminal includes a host inverter 12 and a host signal output switch 13 connected in sequence to the host MCU 11. The drain of the host signal output switch 13 is connected to the test bus 40 and connected to the positive terminal of the power supply through a resistor. The source of the host signal output switch 13 is grounded, so that the level of the test bus 40 follows the level change of the host data signal output terminal. The working process of the host signal output terminal is as follows: After the host data signal output terminal changes phase through the host inverter 12, when the host data signal output terminal is at a high level, it is converted to a low level by the host inverter 12, which cannot drive the host signal output switch 13. The host signal output switch 13 is in the closed state, and the level of the test bus 40 is pulled up to a high level by the positive terminal of the power supply. When the host data signal output terminal is at a low level, it is converted to a high level by the host inverter 12, which drives the host signal output switch 13 to be in the open state, and the level of the test bus 40 is pulled down to a low level by the host signal output switch 13.

[0050] Specifically, the host data signal input terminal includes a host comparator 14, the test bus 40 is connected to one input terminal of the host comparator 14, the other input terminal of the host comparator 14 is a reference voltage input, and the output terminal of the host comparator 14 is connected to the host MCU 11.

[0051] In this embodiment, specifically, the node data signal output terminal includes a node inverter 33 and a node signal output switch 34 connected sequentially to the node MCU 32. The drain of the node signal output switch is connected to the corresponding communication interface 21 through the indicator light control line 50, and the source of the node signal output switch 34 is grounded. The node signal output and host data signal input operation process is as follows: the indicator light control line 50 changes level according to the node data output signal, which in turn affects the level of the input terminal of the host comparator 14 through the first switch 22 in the open state on the corresponding conduction test point board 20 of the node. After comparison with the reference voltage, serial data is formed at the output terminal of the host comparator 14. The specific process of indicator light control line 50 being controlled by node data output signal: After the node data signal output terminal changes phase through an inverter, when the node data signal output terminal is high level, it is converted to low level through an inverter, which cannot drive node signal output switch 34. Node signal output switch 34 is in the closed state, and the level of indicator light control line 50 remains high. When the node data signal output terminal is low level, it is converted to high level through an inverter, which drives node signal output switch 34 to the open state. The level of indicator light control line 50 is pulled low by node signal output switch 34.

[0052] The node data signal input terminal includes a node comparator 35. One input terminal of the node comparator 35 is connected to the corresponding communication interface 21 through the indicator light control line 50. The other input terminal of the node comparator 35 is a reference voltage input. The output terminal of the node comparator 35 is connected to the node MCU 32. The working process of the data signal input terminal at this stage is as follows: the node comparator 35 obtains the level of the test bus 40 from the indicator light control line 50 and obtains the reference voltage from the other line. After comparing the level with the reference voltage, serial data is formed at the comparator output terminal and finally input to the node MCU 32.

[0053] like Figure 2As shown, the communication node module 30 in this embodiment can meet communication requirements through this communication circuit. The communication node module 30 has a module indicator light 31, a node MCU 32, and a node data signal input terminal, a node data signal output terminal, and a sensor 36 connected to the node MCU 32. The module indicator light 31 is connected to the indicator light enable signal line 51. The node data signal input terminal includes a first node input MOSFET switch Q1, a second node input MOSFET switch Q2, and a third node input MOSFET switch Q3. The gate of the first node input MOSFET switch Q1 is connected to the indicator light enable signal line 51, the source of the first node input MOSFET switch Q1 is connected to the gate of the second node input MOSFET switch Q2, and the drain of the first node input MOSFET switch Q1 is connected to the indicator light control line 50 through a Zener diode D1. The drain of the second node input MOSFET switch Q2 is connected to the gate of the third node input MOSFET switch Q3. The drain of the third node input MOSFET switch Q3 is connected to node MCU32. The sources of the second node input MOSFET switch Q2 and the third node input MOSFET switch Q3 are both grounded. The drains of the second node input MOSFET switch Q2 and the third node input MOSFET switch Q3 are connected to the positive power supply via pull-up resistors. The node data signal output terminal includes a first node output MOSFET switch Q4 and a second node input MOSFET switch Q5. The gate of the first node output MOSFET switch Q4 is connected to node MCU32 and then to the positive power supply via a pull-up resistor. The drain of the first node output MOSFET switch Q4 is connected to the gate of the second node input MOSFET switch Q5 and then to the positive power supply via a resistor. The drain of the second node input MOSFET switch Q5 is connected to the indicator light control line 50 via a resistor. The sources of the first node output MOSFET switch Q4 and the second node output MOSFET switch Q5 are both grounded. Based on the above-mentioned electrical communication circuit, its operation is as follows: When the indicator light enable signal line 51 is at a high level, the indicator light control line 50 is reduced in voltage by the Zener diode D1 to eliminate the influence of the indicator light enable signal on the indicator light control line 50. When the indicator light control line 50 is at a high level, the signal passes through the first node input MOSFET switch Q1, opens the second node input MOSFET switch Q2, and closes the third node input MOSFET switch Q3. The node MCU32 receives a high-level signal. When the indicator light control line 50 is at a low level, the second node input MOSFET switch Q2 is closed, the third node input MOSFET switch Q3 is opened, and the node MCU32 receives a low-level signal.When node MCU32 outputs a high-level signal, the first node output MOSFET switch Q4 turns on, thereby turning off the second node output MOSFET switch Q5. The indicator light control line 50 maintains a high-level signal. When node MCU32 outputs a low-level signal, the first node output MOSFET switch Q4 turns off, thereby turning on the second node output MOSFET switch Q5. The indicator light control line 50 is then connected to ground and becomes low-level.

[0054] Based on the technical solution of Embodiment 1, the communication structure of the test module based on the continuity tester of the present invention has the following two working modes:

[0055] Communication Mode: When the continuity test host 10 needs to communicate with the designated communication node module 30, the continuity test host 10 controls the opening of the first switch 22 connected to the corresponding communication interface 21. The host MCU 11 of the continuity test host 10 outputs a signal through the signal output terminal, forming a pulse signal on the test bus 40. These signals pass through the first switch 22 and the module indicator control line 50, and are then converted into a serial port input signal (i.e., serial port data) acceptable to the node MCU 32 by the node comparator 35. After the continuity test host 10 finishes sending the signal, it waits to receive the serial port signal output by the communication node module 30. The node MCU 32 obtains test data from the sensor 36. Each test module (i.e., the communication node module 30) under the same test bus 40 outputs the data required by the continuity test host 10 through the node signal output terminal according to the set time node. The signal passes through the node inverter 33, the node output switch 34, and the first switch 22, forming a pulse signal on the test bus 40. The pulse signal is converted into a serial port input signal acceptable to the host MCU 11 by the host comparator 14.

[0056] Non-communication mode: In this mode, the host MCU11 of the test host 10 can also control the opening of the designated second switch 23, that is, the second switch 23 of the test point connected to the module indicator control line of the test module (i.e. the communication node module 30), thereby connecting the test point to the ground wire and lighting up the module indicator 31 to realize the module indication function.

[0057] Because this invention has the above two working modes, its advantages are as follows: In this embodiment, by adding a communication interface 21 to the test module, the indicator light control line 50 connected to the test point (communication interface 21) on the continuity test point board 20 can serve as a feedback line for the module test results, used to control the module indicator light 31, and can also be used as a communication line to send and receive data to the communication node module 30; Each test point on the continuity test point board 20 can not only be used to test the continuity, resistance, capacitance, etc. of the circuit, but can also serve as a communication interface to send and receive data to the communication node module. Therefore, by using the original error indication line of the test module (i.e., the test bus 40 and the indicator light control line 50) as a communication line, each test module can be connected to a communication network without adding wiring, that is, each test module can also serve as a communication node module 30, so that the continuity test host 10 can read the test results and parameter settings of the test module and save these data to achieve traceability of the test product; In addition, in the non-communication mode, the test module can also be connected to the ground wire, thereby lighting up the module indicator light and realizing the module indication function.

[0058] Example 2

[0059] like Figure 3 As shown in Embodiment 2 of the present invention, a test module communication structure based on a continuity tester is disclosed, including a continuity test host 10 and multiple communication node modules 30, each of the communication node modules 30 being a test node;

[0060] The continuity test host 10 has a host MCU 11 and a host data signal output terminal and a host data signal input terminal respectively connected to the host MCU 11. The host data signal output terminal and the host data signal input terminal are both connected to the communication bus.

[0061] The communication node module 30 has a node MCU 32 and a node data signal input terminal, a node data signal output terminal, and a sensor 36 connected to the node MCU 32. The node data signal input terminal and the node data signal output terminal are both connected to the communication bus 60. The node MCU 32 is also connected to the host MCU 11 through the communication enable signal line 52.

[0062] Specifically, the host data signal output terminal includes a host inverter 12 and a host signal output switch 13 connected in sequence to the host MCU 11. The drain of the host signal output switch 13 is connected to the communication bus 60 and then connected to the positive terminal of the power supply after passing through a resistor. The source of the host signal output switch 13 is grounded, so that the level of the communication bus 60 changes according to the level of the host data signal output terminal. The host data signal input terminal includes a host comparator 14. The communication bus 60 is connected to one input terminal of the host comparator 14, and the other input terminal of the host comparator 14 is a reference voltage input. The output terminal of the host comparator 14 is connected to the host MCU 11.

[0063] Specifically, the node data signal output terminal includes a node inverter 33 and a node signal output switch 34 connected in sequence to the node MCU 32. The drain of the node signal output switch 34 is connected to the communication bus 60, and the source of the node signal output switch 34 is grounded. The node data signal input terminal includes a node comparator 35. One input terminal of the node comparator 35 is connected to the communication bus 60, and the other input terminal of the node comparator 35 is a reference voltage input. The output terminal of the node comparator is connected to the node MCU 32.

[0064] Based on the technical solution of Embodiment 2, the working process of the communication structure of the test module based on the continuity tester of the present invention is as follows:

[0065] When the continuity test host 10 needs to communicate with multiple communication node modules 30, the host MCU 11 of the continuity test host 10 outputs a signal through its signal output terminal, forming a pulse signal on the communication bus 60. This pulse signal is then converted into a serial port input signal (i.e., serial port data) acceptable to the node MCU 32 by the node comparator 35. After the continuity test host 10 finishes sending its signal, it waits to receive the serial port signal output by the communication node module 30. The node MCU 32 acquires test data from the sensor 36. Each test module (i.e., the communication node module 30) under the same communication bus 60 outputs the data required by the continuity test host 10 through its node signal output terminal according to the set time nodes. After passing through the node inverter 33 and the node output switch 34, the signal forms a pulse signal on the communication bus 60. The pulse signal is then converted into a serial port input signal acceptable to the host MCU 11 by the host comparator 14. The technical solution of this embodiment is simpler and has higher communication efficiency than the networking structure of embodiment one.

[0066] In the description of this specification, references to terms such as "an embodiment," "some embodiments," "example," "specific example," or "optional embodiment," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of the invention. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples.

[0067] The embodiments described above do not constitute a limitation on the scope of protection of this technical solution. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of the above embodiments should be included within the scope of protection of this technical solution.

Claims

1. A communication structure for a test module based on a continuity tester, characterized in that: It includes a continuity test host, a continuity test point board, and multiple communication node modules, each of which is a test node; The continuity test host has a host MCU and a host data signal output terminal and a host data signal input terminal respectively connected to the host MCU; The continuity test point board has multiple communication interfaces. Each communication interface is connected to the test bus through a corresponding first switch and grounded through a corresponding second switch. When the first switch is open, it is in the communication state, and the continuity test host sends and receives data signals to the corresponding test node. In the communication state, the second switch is in the closed state. The communication node module has a module indicator light, a node MCU, and a node data signal input terminal, a node data signal output terminal, and a sensor connected to the node MCU. The module indicator light, node data signal input terminal, and node data signal output terminal are all connected to the corresponding communication interface through the module indicator light control line. The module indicator light is also connected to the host MCU through the indicator light enable signal line. The node data signal output terminal includes a node inverter and a node signal output switch that are sequentially connected to the node MCU. The drain of the node signal output switch is connected to the corresponding communication interface through an indicator light control line, and the source of the node signal output switch is grounded. The node data signal input terminal includes a node comparator. One input terminal of the node comparator is connected to the corresponding communication interface through the connection indicator control line. The other input terminal of the node comparator is a reference voltage input. The output terminal of the node comparator is connected to the node MCU. The node data signal input terminal includes a first node input MOSFET switch, a second node input MOSFET switch, and a third node input MOSFET switch. The gate of the first node input MOSFET switch is connected to the indicator light enable signal line, the source of the first node input MOSFET switch is connected to the gate of the second node input MOSFET switch, and the drain of the first node input MOSFET switch is connected to the indicator light control line through a Zener diode. The drain of the second node input MOSFET switch is connected to the gate of the third node input MOSFET switch, and the drain of the third node input MOSFET switch is connected to the node MCU. The sources of both the second and third node input MOSFET switches are... The first node input MOSFET switch is grounded, and the drains of the second node input MOSFET switch and the third node input MOSFET switch are respectively connected to pull-up resistors and then connected to the positive power supply. The node data signal output terminal includes a first node output MOSFET switch and a second node output MOSFET switch. The gate of the first node output MOSFET switch is connected to the node MCU and then connected to the positive power supply through a pull-up resistor. The drain of the first node output MOSFET switch is connected to the gate of the second node output MOSFET switch and then connected to the positive power supply through a resistor. The drain of the second node output MOSFET switch is connected to the indicator light control line through a resistor. The sources of the first node output MOSFET switch and the second node output MOSFET switch are both grounded.

2. The communication structure of the test module based on the continuity tester as described in claim 1, characterized in that: Both the first switch and the second switch are MOSFET switching circuits. The first switch and the second switch are controlled by two columns of serial data generated by the continuity test host through the serial-to-parallel integrated circuit on the continuity test point board to control the opening / closing of the first switch and the second switch.

3. The communication structure of the test module based on the continuity tester as described in claim 1, characterized in that: The host data signal output terminal includes a host inverter and a host signal output switch connected in sequence to the host MCU. The drain of the host signal output switch is connected to the test bus and then connected to the positive terminal of the power supply through a current-limiting resistor. The source of the host signal output switch is grounded, so that the test bus level follows the level change of the host data signal output terminal.

4. The communication structure of the test module based on the continuity tester as described in claim 1, characterized in that: The host data signal input terminal includes a host comparator. The test bus is connected to one input terminal of the host comparator. The other input terminal of the host comparator is a reference voltage input. The output terminal of the host comparator is connected to the host MCU.

5. The communication structure of the test module based on the continuity tester as described in claim 1, characterized in that: The indicator light control line connected to the communication interface on the continuity test point board serves as both a feedback line for the module test results and a communication line for sending and receiving data to and from the communication node module. Each communication interface on the continuity test point board is used to test the continuity, resistance, and capacitance of the line, and also serves as a communication interface for sending and receiving data to and from the communication node module.

6. A communication structure for a test module based on a continuity tester, characterized in that: It includes a continuity test host and multiple communication node modules, each of which is a test node; The continuity test host has a host MCU and a host data signal output terminal and a host data signal input terminal respectively connected to the host MCU. The host data signal output terminal and the host data signal input terminal are both connected to the communication bus. The communication node module has a node MCU and a node data signal input terminal, a node data signal output terminal, and a sensor connected to the node MCU. The node data signal input terminal and the node data signal output terminal are both connected to the communication bus. The node MCU is also connected to the host MCU through a communication enable signal line. The node data signal output terminal includes a node inverter and a node signal output switch that are sequentially connected to the node MCU. The drain of the node signal output switch is connected to the corresponding communication interface through an indicator light control line, and the source of the node signal output switch is grounded. The node data signal input terminal includes a node comparator. One input terminal of the node comparator is connected to the corresponding communication interface through the connection indicator control line. The other input terminal of the node comparator is a reference voltage input. The output terminal of the node comparator is connected to the node MCU. The node data signal input terminal includes a first node input MOSFET switch, a second node input MOSFET switch, and a third node input MOSFET switch. The gate of the first node input MOSFET switch is connected to the indicator light enable signal line, the source of the first node input MOSFET switch is connected to the gate of the second node input MOSFET switch, and the drain of the first node input MOSFET switch is connected to the indicator light control line through a Zener diode. The drain of the second node input MOSFET switch is connected to the gate of the third node input MOSFET switch, and the drain of the third node input MOSFET switch is connected to the node MCU. The sources of both the second and third node input MOSFET switches are... The first node input MOSFET switch is grounded, and the drains of the second node input MOSFET switch and the third node input MOSFET switch are respectively connected to pull-up resistors and then connected to the positive power supply. The node data signal output terminal includes a first node output MOSFET switch and a second node output MOSFET switch. The gate of the first node output MOSFET switch is connected to the node MCU and then connected to the positive power supply through a pull-up resistor. The drain of the first node output MOSFET switch is connected to the gate of the second node output MOSFET switch and then connected to the positive power supply through a resistor. The drain of the second node output MOSFET switch is connected to the indicator light control line through a resistor. The sources of the first node output MOSFET switch and the second node output MOSFET switch are both grounded.

7. The communication structure of the test module based on the continuity tester as described in claim 6, characterized in that: The host data signal output terminal includes a host inverter and a host signal output switch connected in sequence to the host MCU. The drain of the host signal output switch is connected to the communication bus and connected to the positive terminal of the power supply through a current limiting resistor. The source of the host signal output switch is grounded, so that the communication bus level changes according to the level of the host data signal output terminal. The host data signal input terminal includes a host comparator. The communication bus is connected to one input terminal of the host comparator. The other input terminal of the host comparator is a reference voltage input. The output terminal of the host comparator is connected to the host MCU.

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