Method and apparatus for measuring crosstalk between image sensor pixels, electronic device

Abstract

The application relates to a method and device for measuring crosstalk between pixels of an image sensor. The method comprises: initial measurement environment establishment, target measurement environment establishment, and target light source position adjustment and pixel crosstalk acquisition. The position of the target light source is adjusted on the plane where the target light source is located, so that the light of the target light source converges on any pixel of a pixel array of the image sensor, and the signal information of a neighboring pixel of the pixel and the signal information of the pixel are acquired to obtain the ratio as the crosstalk of the pixel to the neighboring pixel. The application can measure the crosstalk of any pixel in the pixel array without designing an additional crosstalk measurement structure for measuring the crosstalk, thereby reducing the chip manufacturing cost.

Description

Technical Field

[0001] This invention relates to the field of image sensor technology, and in particular to a method, apparatus, and electronic device for measuring crosstalk between pixels of an image sensor. Background Technology

[0002] Time-of-flight (ToF) technology is a method for accurately measuring the distance to a reference object. There are two types: direct-ToF (dToF) ranging technology, which directly measures the flight time of light to calculate the distance to the reference object, and indirect-ToF (iToF) ranging technology, which calculates the distance to the reference object by periodically modulating and demodulating the light intensity and using phase information.

[0003] ToF image sensors utilize the basic principles of optical imaging to focus reflected light from the surface of a reference object 11 onto the pixel array 13 of the image sensor via the lens 12, ultimately producing an inverted image 14. Figure 1 As shown. Ideally, each pixel should only receive reflected light from its corresponding reference position. The received reflected light generates photoelectrons within the pixel, which are collected and output as a voltage signal. However, in practical applications, because complete optical and electrical isolation between pixels is not possible, some photons or electrons are collected by adjacent pixels, resulting in crosstalk (CTK).

[0004] With the development of Time-of-Flight (ToF) image sensors and consumer demand, high-resolution ToF image sensors have become a goal pursued by many manufacturers and consumers. High resolution means smaller pixel sizes, which increases crosstalk between pixels and affects image quality. Therefore, crosstalk between pixels has become a crucial performance parameter for small-sized pixels, and crosstalk measurement is essential for the development of ToF image sensors.

[0005] Please see Figure 2 This is a schematic diagram of a crosstalk measurement structure used in the prior art for crosstalk measurement. For example... Figure 2 As shown, the prior art designs a separate crosstalk measurement structure 22 outside the pixel array 21 to measure crosstalk. The crosstalk measurement structure 22 blocks adjacent pixels with metal 221 and provides only a window 222 for the central pixel to allow incident light to enter the pixel, thereby measuring the amount of signal crosstalk from the pixel to the adjacent pixels.

[0006] The above approach has two problems. First, it requires designing a separate crosstalk measurement structure, which increases the chip area of ​​the image sensor and raises costs. Second, due to the influence of process stability during chip manufacturing, the crosstalk between each pixel will vary slightly, requiring the measurement results of multiple pixels to evaluate the performance of the entire pixel array. If only one crosstalk measurement structure is designed, the measurement results will be too random; if multiple crosstalk measurement structures are designed, the chip cost of the image sensor will be even higher.

[0007] Therefore, how to effectively measure crosstalk in any one or more pixels in a pixel array without designing additional crosstalk measurement structures and reducing chip manufacturing costs is a technical problem that urgently needs to be solved. Summary of the Invention

[0008] The purpose of this invention is to provide a method, apparatus, and electronic device for measuring crosstalk between pixels of an image sensor, which can measure crosstalk between any pixel in a pixel array without designing an additional crosstalk measurement structure and reducing chip manufacturing costs.

[0009] To achieve the above objectives, the present invention provides a method for measuring crosstalk between pixels of an image sensor, comprising the following steps: initial measurement environment setup, placing a reference object at a preset distance within the field of view of the image sensor, such that a target parameter obtained based on the ratio of the key size of the reference object to the diameter of an aperture, and the number of pixels occupied by the key size of the image of the reference object displayed on the display interface of the image sensor, is substantially equal to a preset parameter; target measurement environment setup, replacing the reference object with a target light source attached to the aperture, and the plane of the target light source being parallel to the plane of the image sensor; and target light source position adjustment and pixel crosstalk acquisition, adjusting the position of the target light source on the plane of the target light source so that the light from the target light source is focused onto any pixel of the pixel array of the image sensor, and acquiring the ratio of the signal information of a neighboring pixel to the signal information of the current pixel as the crosstalk of the current pixel to the neighboring pixel.

[0010] In some embodiments, the method further includes: repeatedly performing the target light source position adjustment and pixel crosstalk acquisition steps to acquire crosstalk of multiple pixels for evaluating the performance of the pixel array of the image sensor.

[0011] To achieve the above objectives, the present invention also provides a measurement device for crosstalk between pixels of an image sensor, comprising: an initial measurement environment setup module, used to place a reference object at a preset distance within the field of view of the image sensor, such that a target parameter obtained based on the ratio of the key size of the reference object to the diameter of an aperture and the number of pixels occupied by the key size of the image of the reference object displayed on the display interface of the image sensor is substantially equal to the preset parameter, thereby completing the initial measurement environment setup; a target measurement environment setup module, used to replace the reference object with a target light source attached to the aperture, and the plane where the target light source is located is parallel to the plane where the image sensor is located, thereby completing the target measurement environment setup; and a position adjustment and pixel crosstalk acquisition module, used to adjust the position of the target light source on the plane where the target light source is located, such that the light from the target light source is focused onto any pixel of the pixel array of the image sensor, and acquire the ratio of the signal information of a neighboring pixel to the signal information of the pixel as the crosstalk of the pixel to the neighboring pixel.

[0012] In some embodiments, the apparatus further includes: a calling module, configured to repeatedly call the position adjustment and pixel crosstalk acquisition module to perform target light source position adjustment and pixel crosstalk acquisition, thereby acquiring crosstalk of multiple pixels for evaluating the performance of the pixel array of the image sensor.

[0013] To achieve the above objectives, the present invention also provides an electronic device, including a memory, a processor, and a computer-executable program stored in the memory and executable on the processor; when the processor executes the computer-executable program, it implements the steps of the method for measuring crosstalk between image sensor pixels as described in the present invention.

[0014] This invention, based on the fundamental principles of image sensor imaging and utilizing optical imaging, can measure crosstalk between any pixel and its neighboring pixels in a pixel array. This facilitates crosstalk analysis and optimization in later product design, improving image quality. Furthermore, this invention eliminates the need for additional crosstalk measurement structures, reducing chip area and manufacturing costs. By moving the target light source and performing crosstalk measurements across multiple pixels, the performance of the entire pixel array can be evaluated using the measurement results from multiple pixels. This reduces the randomness of crosstalk between pixels caused by process instability during chip manufacturing. Crosstalk measurement and analysis can provide valuable guidance for next-generation product design and allow users to intuitively understand the performance of current products. Attached Figure Description

[0015] To more clearly illustrate the technical solutions in the embodiments of the present invention, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0016] Figure 1 This is a schematic diagram of the optical imaging principle;

[0017] Figure 2 This is a schematic diagram of a crosstalk measurement structure used in the prior art for crosstalk measurement;

[0018] Figure 3 A schematic diagram illustrating the steps of the method for measuring crosstalk between pixels of an image sensor provided by the present invention;

[0019] Figure 4 This is a schematic diagram of an optical imaging process provided in an embodiment of the present invention;

[0020] Figure 5 This is a structural block diagram of the image sensor pixel crosstalk measurement device provided by the present invention. Detailed Implementation

[0021] The technical solutions in the embodiments of the present invention will now be clearly and completely described with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of the present invention, and not all of them. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0022] One embodiment of the present invention provides a method for measuring crosstalk between pixels of an image sensor.

[0023] Please refer to the following: Figures 3-4 ,in, Figure 3 This is a schematic diagram illustrating the steps of the method for measuring crosstalk between pixels of an image sensor provided by the present invention. Figure 4 This is a schematic diagram of an optical imaging process provided in an embodiment of the present invention.

[0024] like Figure 3As shown, the method for measuring crosstalk between pixels of an image sensor in this embodiment includes the following steps: S1, initial measurement environment setup: a reference object is placed at a preset distance within the field of view of the image sensor, such that the target parameters obtained based on the ratio of the key size of the reference object to the diameter of an aperture, and the number of pixels occupied by the key size of the image of the reference object displayed on the image sensor's display interface, are approximately equal to the preset parameters; S2, target measurement environment setup: the reference object is replaced with a target light source attached to the aperture, and the plane of the target light source is parallel to the plane of the image sensor; and S3, target light source position adjustment and pixel crosstalk acquisition: the position of the target light source is adjusted on the plane of the target light source so that the light from the target light source converges to any pixel of the pixel array of the image sensor, and the ratio of the signal information of a neighboring pixel to the signal information of the current pixel is obtained as the crosstalk of the current pixel to that neighboring pixel. Detailed explanations are given below.

[0025] Regarding step S1, the initial measurement environment setup, a reference object is placed at a preset distance within the field of view of the image sensor, such that the target parameters obtained based on the ratio of the key dimension of the reference object to the diameter of an aperture, and the number of pixels occupied by the key dimension of the image of the reference object displayed on the image sensor's display interface, are substantially equal to the preset parameters. Specifically, the key dimension is the length or width of the reference object; using the principle of optical imaging, a suitable distance from the reference object to the lens of the image sensor is found, such that the target parameters obtained based on the ratio and the number of pixels are substantially equal to the preset parameters.

[0026] Almost all image sensors involve an optical imaging process, which can be achieved through methods such as... Figure 4 The optical imaging process is described as shown. Specifically, the image 44 of the reference object 41 is formed on the pixel array 43 of the image sensor through the lens 42 of the image sensor, and the focal length of the lens 42 is f.

[0027] Based on the similarity of triangles, we can conclude that:

[0028] d / u=d' / v=k

[0029] Wherein, d is the key dimension of reference object 41; d' is the key dimension of image 44; u is the distance from reference object 41 to lens 42; v is the distance from image 44 to lens 42; and k is the scale. For the same image sensor, the value of the scale k is determined. Key dimensions d and d' can be the length or width of the corresponding reference object or image; in this embodiment, key dimension d is the length of reference object 41, and key dimension d' is the length of image 44.

[0030] When calculating crosstalk, an optical imaging process is required. Light from the target light source is passed through an aperture and finally focused onto a single pixel via a lens. By replacing the reference object with the target light source and focusing its light onto a single pixel, the critical dimensions of the image are known; the diameter of the target light source and the diameter of the aperture are also known; and the distance from the lens to the image is constant. Therefore, by finding a suitable distance between the reference object and the lens, it is possible to focus the light from the target light source onto a single pixel, thus enabling crosstalk measurement.

[0031] An aperture stop is a physical object in an optical system that limits the beam of light. It can be the edge of a lens, a frame, or a specially designed perforated screen. The function of an aperture stop can be twofold: limiting the beam of light or limiting the size of the field of view (imaging range). The aperture stop that limits the beam of light the most in an optical system is called the diameter aperture stop, and the aperture stop that limits the field of view the most is called the field aperture stop. Both diameter and field aperture stops are physical objects. The general rule for determining the diameter aperture stop of an optical system is: the aperture stop or its image viewed from the object point is determined by the angle that is smallest. If the angle that is smallest is the image of an aperture stop, then that aperture stop itself is the diameter aperture stop.

[0032] In some embodiments, the initial measurement environment setup step further includes: 1) providing a reference object and an aperture, and calculating the ratio of the key dimension of the reference object (e.g., the length or width of the reference object) to the diameter of the aperture; 2) placing the reference object within the field of view of the image sensor; 3) adjusting the focal length of the image sensor lens so that the image sensor's display interface displays the image of the reference object, and recording the number of pixels occupied by the key dimension of the image of the reference object; 4) determining whether the target parameter obtained based on the number of pixels and the ratio is substantially equal to the preset parameter (e.g., 1); 5) if the target parameter is substantially equal to the preset parameter, then the initial measurement environment setup is completed. Further, if the target parameter is not substantially equal to the preset parameter, then the distance between the reference object and the image sensor is adjusted within the field of view of the image sensor, and the number of pixels occupied by the key dimension of the image of the reference object is updated before recalculating and determining the target parameter.

[0033] Following the above embodiment, the step of adjusting the distance between the reference object and the image sensor within the field of view of the image sensor further includes: if the target parameter is greater than the preset parameter, then increasing the distance between the reference object and the image sensor; if the target parameter is less than the preset parameter, then decreasing the distance between the reference object and the image sensor.

[0034] In some embodiments, the target parameter is expressed by the following formula:

[0035] M = (A × R) / d;

[0036] Where M is the target parameter, A is the number of pixels occupied by the key dimension of the reference object's image, R is the diameter of the aperture, and d is the key dimension of the reference object. The key dimension d of the reference object can be either the length or the width of the reference object.

[0037] By adjusting the distance between the reference object and the image sensor within the field of view of the image sensor, the target parameter is made to be approximately equal to the preset parameter, thereby finding a suitable distance from the reference object to the lens and completing the initial measurement environment setup.

[0038] Regarding step S2, the target measurement environment setup, the reference object is replaced with a target light source with the aperture attached, and the plane where the target light source is located is parallel to the plane where the image sensor is located.

[0039] Specifically, the aforementioned aperture (an aperture with a known diameter used to calculate the ratio) is attached to the target light source. The reference object is removed, and the target light source is placed in the same position as the reference object. The plane of the target light source is made parallel to the plane of the image sensor, thus completing the target measurement environment setup. Since a suitable distance from the reference object to the lens has been found in step S1, by replacing the reference object with the target light source, the light from the target light source can be focused onto a single pixel using the optical imaging process. The critical dimensions of the image are known, the diameter of the light from the target light source is the diameter of the known aperture, and the distance from the lens to the image is a constant, thus crosstalk measurement can be performed.

[0040] In some embodiments, the target light source is an LED light source. During the crosstalk measurement process, only one target light source is required for the entire test environment, and control must be maintained to prevent other light from entering the test environment.

[0041] Regarding step S3, target light source position adjustment and pixel crosstalk acquisition, the position of the target light source is adjusted on the plane where the target light source is located, so that the light from the target light source is focused onto any pixel of the pixel array of the image sensor, and the ratio of the signal information of a neighboring pixel to the signal information of the current pixel is acquired as the crosstalk of the current pixel to the neighboring pixel.

[0042] Specifically, after the target measurement environment is set up, the position of the target light source is adjusted on the plane where the target light source is located. For example, the up, down, left, and right positions of the target light source are finely adjusted to focus the light from the target light source onto a pixel P1. The signal information Signal_P1 of pixel P1 and the signal information Signal_P2 of a neighboring pixel P2 are recorded. The crosstalk CTK from pixel P1 to pixel P2 can be calculated using the following formula:

[0043] CTK=Signal_P2 / Signal_P1×100%.

[0044] This invention, based on the fundamental principles of image sensor imaging and utilizing the principles of optical imaging, can measure the crosstalk between any pixel in a pixel array and its neighboring pixels. This facilitates the analysis and optimization of crosstalk in later product design, thereby improving image quality. Furthermore, this invention does not require the design of an additional crosstalk measurement structure, which can reduce chip area and manufacturing costs.

[0045] In some embodiments, the method further includes: S4, repeatedly executing the target light source position adjustment and pixel crosstalk acquisition steps to acquire crosstalk of multiple pixels for evaluating the performance of the pixel array of the image sensor. Specifically, on the plane where the target light source is located, by moving the position of the target light source up, down, left, and right, the image of the target light source can be placed on any pixel of the pixel array of the image sensor. Then, the signal information of that pixel and the signal information of a neighboring pixel are recorded, and crosstalk is calculated to obtain the crosstalk of any pixel in the image sensor to its neighboring pixels. By performing crosstalk measurement on multiple pixels and using the measurement results of multiple pixels to evaluate the performance of the entire pixel array, the randomness of crosstalk between pixels caused by process instability during chip manufacturing can be reduced. The measurement and analysis of crosstalk can provide good guidance for the design of next-generation products and allow users to intuitively understand the performance of current products.

[0046] In some embodiments, the image sensor may be an iToF image sensor, a CMOS image sensor, or a CCD image sensor, or other image sensors that achieve imaging through optical imaging principles. That is, the testing method of the present invention is applicable not only to iToF image sensors, but also to other conventional CMOS image sensors, CCD image sensors, or other image sensors that achieve imaging through optical imaging principles.

[0047] The following section uses the measurement of crosstalk between pixels in an iToF image sensor as an example to further explain the flow of the crosstalk measurement method for image sensor pixels of the present invention.

[0048] Step 1: Prepare an aperture with diameter R, a reference object with length a, and an LED light source, and calculate the ratio of the length a of the reference object to the diameter R of the aperture.

[0049] Step 2: Place a reference object of length 'a' within the field of view of the iToF image sensor and at a certain distance from the iToF image sensor; adjust the focal length of the lens of the iToF image sensor to display a complete and clear image of the reference object on its display interface, and record the number of pixels A occupied by the length of the image.

[0050] Step 3: A parameter M can be calculated using the following formula;

[0051] M = (A × R) / a.

[0052] Step 4: If the value of M is greater than 1, increase the distance between the reference object and the iToF image sensor and repeat step 3; if M is less than 1, decrease the distance between the reference object and the iToF image sensor and repeat step 3 until the value of M is equal to or approximately equal to 1.

[0053] Step 5: Attach an aperture with a diameter of R to the LED light source, remove the reference object, and place the LED light source with the aperture of diameter R attached at the same position as the reference object, so that the plane of the LED light source is parallel to the plane of the iToF image sensor.

[0054] Step 6: After the above environment setup is complete, fine-tune the vertical and horizontal positions of the LED light source so that the image of the LED light source on the iToF image sensor falls on a pixel P1. Record the signal information Signal_P1 of pixel P1 and the signal information Signal_P2 of its neighboring pixel P2. The crosstalk CTK from pixel P1 to pixel P2 can be calculated using the following formula:

[0055] CTK=Signal_P2 / Signal_P1×100%.

[0056] Step 7: On the plane where the LED light source is located, move the LED light source up, down, left, and right to ensure that the image of the LED light source falls on any other pixel of the iToF image sensor. Repeat step 6 to obtain the crosstalk information of multiple pixels in the iToF image sensor to their neighboring pixels. During the crosstalk measurement process, only one target light source is needed in the entire test environment, and it is necessary to control the entry of other light into the test environment.

[0057] As can be seen from the above, this invention, starting from the fundamental principles of image sensor imaging and utilizing the principles of optical imaging, can measure the crosstalk between any pixel and its neighboring pixels in a pixel array. This facilitates the analysis and optimization of crosstalk in later product design, improving image quality. Furthermore, this invention eliminates the need for an additional crosstalk measurement structure, reducing chip area and manufacturing costs. By moving the target light source and performing crosstalk measurements across multiple pixels, the performance of the entire pixel array can be evaluated using the measurement results from multiple pixels. This reduces the randomness of crosstalk between pixels caused by process instability during chip manufacturing. The measurement and analysis of crosstalk can provide excellent guidance for the design of next-generation products and allow users to intuitively understand the performance of current products.

[0058] Based on the same inventive concept, the present invention also provides a device for measuring crosstalk between pixels of an image sensor. The provided device for measuring crosstalk between pixels of an image sensor can employ, for example... Figure 3 The method shown is for measuring crosstalk between image sensor pixels.

[0059] Please see Figure 5 This is a structural block diagram of an image sensor pixel crosstalk measurement device provided in an embodiment of the present invention. Figure 5 As shown, the image sensor pixel crosstalk measurement device includes: an initial measurement environment setup module 51, a target measurement environment setup module 52, and a position adjustment and pixel crosstalk acquisition module 53.

[0060] Specifically, the initial measurement environment setup module 51 is used to place a reference object at a preset distance within the field of view of the image sensor, so that the target parameters obtained based on the ratio of the key size of the reference object to the diameter of an aperture and the number of pixels occupied by the key size of the image of the reference object displayed on the display interface of the image sensor are basically equal to the preset parameters, thus completing the initial measurement environment setup. Here, the key size is the length or width of the reference object. The target measurement environment setup module 52 is used to replace the reference object with a target light source attached to the aperture, and the plane where the target light source is located is parallel to the plane where the image sensor is located, thus completing the target measurement environment setup. The position adjustment and pixel crosstalk acquisition module 53 is used to adjust the position of the target light source on the plane where the target light source is located, so that the light from the target light source is focused onto any pixel of the pixel array of the image sensor, and to acquire the ratio of the signal information of a neighboring pixel to the signal information of the current pixel as the crosstalk of the current pixel to the neighboring pixel.

[0061] In some embodiments, the preset parameter can be 1, and the target light source is an LED light source.

[0062] In some embodiments, the apparatus further includes: a calling module 54, configured to repeatedly call the position adjustment and pixel crosstalk acquisition module 53 to perform target light source position adjustment and pixel crosstalk acquisition, thereby acquiring crosstalk of multiple pixels for evaluating the performance of the pixel array of the image sensor.

[0063] In some embodiments, the image sensor may be an iToF image sensor, a CMOS image sensor, or a CCD image sensor, or other image sensors that achieve imaging through optical imaging principles.

[0064] The working method of each module can be referred to Figure 3 The descriptions of the corresponding steps in the method for measuring crosstalk between pixels of the image sensor shown are not repeated here.

[0065] Based on the same inventive concept, the present invention also provides an electronic device, including a memory, a processor, and a computer-executable program stored in the memory and executable on the processor; when the processor executes the computer-executable program, it implements as follows: Figure 3 The steps of the method for measuring crosstalk between pixels of an image sensor are shown.

[0066] Within the scope of this inventive concept, embodiments can be described and illustrated based on modules that perform one or more of the described functions. These modules (also referred to herein as units, etc.) can be physically implemented by analog and / or digital circuitry, such as logic gates, integrated circuits, microprocessors, microcontrollers, memory circuits, passive electronic components, active electronic components, optical components, hardwired circuits, etc., and can optionally be driven by firmware and / or software. The circuitry can, for example, be implemented in one or more semiconductor chips. The circuitry constituting a module can be implemented by dedicated hardware, or by a processor (e.g., one or more programmed microprocessors and associated circuitry), or by a combination of dedicated hardware performing some functions of the module and a processor performing other functions of the module. Without departing from the scope of this inventive concept, each module of an embodiment can be physically divided into two or more interactive and discrete modules. Similarly, without departing from the scope of this inventive concept, the modules of an embodiment can be physically combined into more complex modules.

[0067] It should be noted that the terms "comprising" and "having," and their variations, used in this invention document are intended to cover non-exclusive inclusion. The terms "first," "second," etc., are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence, unless explicitly indicated by the context. It should be understood that such use of data can be interchanged where appropriate. The term "based on" can be understood as not necessarily intended to express an exclusive set of factors, but can instead, at least in part, depending on the context, allow for the presence of other factors that are not necessarily explicitly described. Furthermore, embodiments and features in the embodiments of this invention can be combined with each other without conflict. In addition, descriptions of well-known components and technologies have been omitted in the above description to avoid unnecessarily obscuring the concepts of this invention. In the various embodiments described above, each embodiment focuses on its differences from other embodiments; similar / identical parts between embodiments can be referred to mutually.

[0068] The above description is only a preferred embodiment of the present invention. It should be noted that those skilled in the art can make several improvements and modifications without departing from the principle of the present invention, and these improvements and modifications should also be considered within the scope of protection of the present invention.

Claims

1. A method for measuring crosstalk between pixels of an image sensor, characterized in that, include: The initial measurement environment setup involves placing a reference object at a preset distance within the field of view of the image sensor, such that the target parameters obtained based on the ratio of the key dimension of the reference object to the diameter of an aperture, and the number of pixels occupied by the key dimension of the image of the reference object displayed on the image sensor's display interface, are substantially equal to preset parameters. The initial measurement environment setup further includes: providing the reference object and the aperture, and calculating the ratio of the key dimension of the reference object to the diameter of the aperture; placing the reference object within the field of view of the image sensor, adjusting the focal length of the image sensor's lens so that the image of the reference object is displayed on the image sensor's display interface, and recording the number of pixels occupied by the key dimension of the image of the reference object; determining whether the target parameters obtained based on the number of pixels and the ratio are equal to the preset parameters; if the target parameters are equal to the preset parameters, the initial measurement environment setup is complete, wherein the key dimension is the length or width of the reference object. The target measurement environment is set up by replacing the reference object with a target light source to which the aperture is attached, and the plane of the target light source is parallel to the plane of the image sensor; and Target light source position adjustment and pixel crosstalk acquisition: The position of the target light source is adjusted on the plane where the target light source is located, so that the light from the target light source is focused onto any pixel of the pixel array of the image sensor, and the ratio of the signal information of a neighboring pixel to the signal information of the current pixel is acquired as the crosstalk of the current pixel to the neighboring pixel.

2. The method according to claim 1, characterized in that, The method further includes: if the target parameter is not equal to the preset parameter, adjusting the distance between the reference object and the image sensor within the field of view of the image sensor, updating the number of pixels occupied by the key size of the image of the reference object, and then recalculating and judging the target parameter.

3. The method according to claim 2, characterized in that, The step of adjusting the distance between the reference object and the image sensor within the field of view of the image sensor further includes: if the target parameter is greater than the preset parameter, then increasing the distance between the reference object and the image sensor; if the target parameter is less than the preset parameter, then decreasing the distance between the reference object and the image sensor.

4. The method according to claim 1, characterized in that, The preset parameter is 1, and the target parameter is expressed by the following formula: M = (A × R) / d; where M is the target parameter, A is the number of pixels occupied by the key size of the reference object's image, R is the diameter of the aperture, and d is the key size of the reference object.

5. The method according to claim 1, characterized in that, The method further includes: repeatedly performing the target light source position adjustment and pixel crosstalk acquisition steps to acquire crosstalk of multiple pixels for evaluating the performance of the pixel array of the image sensor.

6. A measuring device for crosstalk between pixels of an image sensor, characterized in that, include: An initial measurement environment setup module is used to place a reference object at a preset distance within the field of view of the image sensor, such that the target parameters obtained based on the ratio of the key dimension of the reference object to the diameter of an aperture, and the number of pixels occupied by the key dimension of the image of the reference object displayed on the display interface of the image sensor, are approximately equal to preset parameters, thus completing the initial measurement environment setup. The initial measurement environment setup further includes: providing the reference object and the aperture, and calculating the ratio of the key dimension of the reference object to the diameter of the aperture; placing the reference object within the field of view of the image sensor, adjusting the focal length of the image sensor lens so that the image of the reference object is displayed on the display interface of the image sensor, and recording the number of pixels occupied by the key dimension of the image of the reference object; determining the base... The system determines whether the target parameter obtained by the ratio of the number of pixels to the preset parameter is equal to the preset parameter; if the target parameter is equal to the preset parameter, the initial measurement environment setup is completed, wherein the key dimension is the length or width of the reference object; the target measurement environment setup module is used to replace the reference object with a target light source with the aperture attached, and the plane where the target light source is located is parallel to the plane where the image sensor is located, thereby completing the target measurement environment setup; and the position adjustment and pixel crosstalk acquisition module is used to adjust the position of the target light source on the plane where the target light source is located, so that the light from the target light source is focused onto any pixel of the pixel array of the image sensor, and to acquire the ratio of the signal information of a neighboring pixel to the signal information of the pixel as the crosstalk of the pixel to the neighboring pixel.

7. The apparatus according to claim 6, characterized in that, The device further includes: a calling module, used to repeatedly call the position adjustment and pixel crosstalk acquisition module to perform target light source position adjustment and pixel crosstalk acquisition, thereby acquiring crosstalk of multiple pixels for evaluating the performance of the pixel array of the image sensor.

8. The apparatus according to claim 6, characterized in that, The target light source is an LED light source, and the image sensor is an iToF image sensor, a CMOS image sensor, or a CCD image sensor.

9. An electronic device, comprising a memory, a processor, and a computer-executable program stored in the memory and executable on the processor; characterized in that, When the processor executes the computer-executable program, it implements the steps of the method for measuring crosstalk between image sensor pixels as described in any one of claims 1 to 5.

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