Channel controller, control device and test device for multichannel testing

Abstract

A channel controller, control device and test device for multi-channel testing, the channel controller for multi-channel testing comprises a sampling unit, a processing unit and a protection unit; the sampling unit is used for collecting the current flowing through the measured object and outputting a collected signal; the protection unit comprises a driving module and a first switch module; the driving module is used for outputting a state change signal to the first switch module according to the collected signal; the processing unit is used for outputting a first protection control signal to the protection unit according to the state change signal; and the protection unit is used for closing the channel in which the protection unit is located according to the first protection control signal. The current flowing through the measured object is collected in real time by the sampling unit, the first protection mode is triggered when the collected signal of the current reaches a set threshold value, and the test channel is quickly closed through the protection unit, thereby solving the problem of rapid protection when a short circuit occurs due to damage or other abnormalities in the product testing process of a certain channel.

Description

Technical Field

[0001] This application relates to the field of electrical parameter testing technology, and in particular to a channel controller, channel control device, and testing device for multi-channel testing. Background Technology

[0002] Currently, testing the electrical parameters of some products takes a very long time. For example, the withstand voltage test for PTC products involves applying the rated voltage and / or the ultimate voltage to the PTC product under test using a DC power supply and collecting the test parameters. The entire test takes approximately 20 hours. To improve testing efficiency, it is necessary to test multiple products simultaneously.

[0003] The most direct testing method is to test one PTC product with one DC power supply. Testing multiple products requires multiple DC power supplies. This method increases the demand for testing equipment as the number of devices under test increases, resulting in significant costs, increased floor space, and higher energy consumption. How to use a single testing device to simultaneously test multiple devices under test has been a crucial technical problem that the field has been working to solve. Summary of the Invention

[0004] In view of this, the present application provides a channel controller, channel control device, and testing device for multi-channel testing to solve at least one problem existing in the background art.

[0005] In a first aspect, one embodiment of this application provides a channel controller for multi-channel testing, comprising: a sampling unit, a processing unit, and a protection unit; the sampling unit and the protection unit are connected; the processing unit and the protection unit are connected; the sampling unit is used to collect the current flowing through the object under test and output a collection signal; the protection unit includes a driving module and a first switching module; the driving module is used to output a state change signal to the first switching module according to the collection signal; the processing unit is used to output a first protection control signal to the protection unit according to the state change signal; the protection unit is used to close the channel where the protection unit is located according to the first protection control signal.

[0006] In conjunction with the first aspect of this application, in an optional embodiment, the driving module includes a first input terminal, a second input terminal, and a first output terminal; the first input terminal is connected to the sampling unit and is used to receive the acquired signal; the second input terminal is connected to the processing unit and is used to receive a first protection control signal; the driving module is used to continuously output a shutdown signal to the first switch module according to the first protection control signal; the first switch module continuously shuts down the channel where the protection unit is located according to the continuous shutdown signal.

[0007] In conjunction with the first aspect of this application, in an optional embodiment, the protection unit further includes a delay module for reducing the rate of rise of the current flowing through the first switching module, thereby causing the first switching module to change its state.

[0008] In conjunction with the first aspect of this application, in an optional embodiment, the processing unit is further connected to the sampling unit; the processing unit is used to compare the sampled value of the current flowing through the object under test with a first threshold, and output a second protection control signal to the protection unit according to the comparison result, so as to control the channel where the protection unit is located to be closed.

[0009] In conjunction with the first aspect of this application, in an optional embodiment, the sampling unit includes a signal conditioning module; the signal conditioning module is used to perform range conversion and amplification of the current flowing through the measured object so that the processing unit obtains the sampled value.

[0010] In conjunction with the first aspect of this application, in an optional embodiment, the channel controller for multi-channel testing further includes a protection control unit connected to the protection unit, the sampling unit, and the processing unit respectively; the protection control unit is used to receive the acquisition signal and the enable signal of the processing unit to control the protection unit to enter the working state.

[0011] In conjunction with the first aspect of this application, in an optional embodiment, the processing unit is further configured to compare the sampled value of the current flowing through the object under test with a second threshold, and send an enable signal to the protection control unit based on the comparison result.

[0012] In conjunction with the first aspect of this application, in an optional embodiment, the protection control unit includes a second switch module, which is connected to both the protection unit and the processing unit. The second switch module is used to change its own operating state according to the enable signal of the processing unit, so as to control the protection unit to enter the operating state.

[0013] Secondly, embodiments of this application provide a channel control device for multi-channel testing, comprising: at least two channel controllers as described in the first aspect, each channel controller being connected to a different test object; each channel controller being used to independently control the test state of the test object connected to it.

[0014] Thirdly, embodiments of this application provide a multi-channel testing device, comprising: at least two test channels, each test channel including the channel controller described in the first aspect above, and a test power supply connected to the channel controller; each channel controller is used to independently control whether the test channel is turned off or not.

[0015] The channel controller for multi-channel testing provided in this application uses a sampling unit to monitor the current flowing through the object under test in real time. When the current reaches a set threshold, a first protection mode is triggered, and the test channel is quickly shut down by the protection unit. This solves the problem of rapid protection when a product in a certain channel is damaged or other abnormalities cause a short circuit during testing. It quickly cuts off the power supply to that channel without affecting the testing of other channels, realizing the purpose of testing multiple test channels and multiple objects simultaneously, greatly improving testing efficiency and saving testing costs.

[0016] Additional aspects and advantages of this application will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of this application. Attached Figure Description

[0017] The accompanying drawings, which are included to provide a further understanding of this application and form part of this application, illustrate exemplary embodiments of this application and are used to explain this application, but do not constitute an undue limitation of this application. In the drawings:

[0018] Figure 1 A schematic diagram of a channel controller for multi-channel testing provided in an embodiment of this application;

[0019] Figure 2 A partial circuit diagram of a channel controller provided in an embodiment of this application;

[0020] Figure 3 a is a schematic diagram of a sudden change in current in the object under test;

[0021] Figure 3 b is a schematic diagram showing the slow rise of current in the object under test;

[0022] Figure 4 A schematic diagram of a channel controller for multi-channel testing provided in another embodiment of this application;

[0023] Figure 5 A partial circuit diagram of a channel controller including a protection unit is provided for an embodiment of this application;

[0024] Figure 6 The current-voltage characteristic curve of a PTC;

[0025] Figure 7 A schematic diagram of a channel controller for multi-channel testing provided in another embodiment;

[0026] Figure 8 A partial schematic diagram of a channel controller including a protection control unit provided in an embodiment of this application;

[0027] Figure 9This is a schematic diagram of the structure of a multi-channel testing device provided in an embodiment of this application. Detailed Implementation

[0028] To make the technical solutions and beneficial effects of this application more apparent and understandable, the technical solutions in the embodiments of this application are clearly and completely described below by listing specific examples. Obviously, the described embodiments are only a part of the embodiments of this application, and not all of them. Based on the embodiments in this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0029] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used in this specification is for the purpose of describing particular embodiments only and is not intended to be limiting of the application.

[0030] It is understood that the terms “first,” “second,” etc., as used herein may be used to describe various elements, but these elements are not limited by these terms. These terms are used only to distinguish one element from another. For example, without departing from the scope of this application, a first resistor may be referred to as a second resistor, and similarly, a second resistor may be referred to as a first resistor. Both the first resistor and the second resistor are resistors, but they are not the same resistor. When “first” is described, it does not imply the necessary presence of a “second”; and when “second” is discussed, it does not imply the necessary presence of a first element, component, region, layer, or portion. As used herein, the singular forms “a,” “an,” and “the” may also be intended to include the plural forms unless the context clearly indicates otherwise. “A plurality” means two or more, unless otherwise explicitly specified. It should also be understood that the term “comprising,” when used in this specification, identifies the presence of the stated feature but does not exclude the presence or addition of one or more other features. As used herein, the term “and / or” includes any and all combinations of the associated listed items.

[0031] It is understood that in the context of this application, "connection" means that there is an electrical signal or data transmission between the connected end and the connected end, which can be understood as "electrical connection", "communication connection", etc. In the context of this application, "A and B are directly connected" means that there are no other components between A and B except for wires.

[0032] The inventors discovered that when using a single DC power supply to test multiple PTC products, the differences between the products can lead to the following situation: if one PTC product fails during testing, causing a short circuit, the DC power supply enters constant current mode. At this point, due to the short circuit in its load, according to Ohm's law, the output voltage of the DC power supply will be very low. This will cause other channels of PTC products to be unable to maintain their conduction state, interrupting the testing process. To address this problem, the inventors proposed using a channel controller to detect and quickly protect the current during the testing process of each channel. When a short circuit is detected in a channel, the power supply to that channel is quickly cut off without affecting the testing of other channels, thus achieving "one-to-many" testing, i.e., using one power supply to test multiple PTC products. Furthermore, it can expand the maximum number of channels based on the configured DC power supply power.

[0033] This application provides a channel controller 100 for multi-channel testing, such as... Figure 1 As shown, it includes: a sampling unit 110, a processing unit 120, and a protection unit 130. The sampling unit 110 and the protection unit 130 are connected. The processing unit 120 and the protection unit 130 are connected.

[0034] The sampling unit 110 is used to acquire the current flowing through the object under test 140 and output the acquired signal. Optionally, the sampling unit includes a first acquisition module, which is used to acquire the current flowing through the PTC product, convert the acquired current signal into a voltage signal, and output the voltage signal as the acquired signal.

[0035] The protection unit 130 includes a drive module 131 and a first switch module 132; the drive module 131 is used to output a state change signal to the first switch module 132 according to the sampled signal. The first switch module 132 is used to change its own operating state according to the state change signal. For example, the first switch module 132 changes from a conducting state to a cut-off state, thereby temporarily shutting down the test channel.

[0036] The processing unit 120 is used to output a first protection control signal to the protection unit according to the state change signal, so as to control the channel where the protection unit is located to remain closed. The protection unit 130 is used to close the channel where the protection unit 130 is located according to the first protection control signal, so as to stop the testing of the object under test in that channel. The processing unit 120 can be implemented using hardware with computing functions such as a microcontroller, PLC, ARM, CPU, etc. The hardware device can be an embedded or non-embedded system such as a desktop computer, mobile phone, industrial control computer, tablet, etc.

[0037] Optionally, the protection unit also includes a delay module for reducing the rate of change of the current flowing through the first switching module, so that the first switching module has sufficient time to change its state.

[0038] The operation of the channel controller 100 is as follows: The sampling unit 110 collects the current flowing through the object under test 140 and obtains the acquisition signal. When the object under test 140 is damaged or suffers other abnormalities during the test, resulting in a short circuit, the current flowing through the object under test suddenly increases, causing the acquisition signal to suddenly increase. After receiving the suddenly increased acquisition signal, the drive module 131 outputs a state change signal to the first switch module 132, controlling the first switch module 132 to change its working state. The first switch module 132 briefly changes from the on state to the off state. The processing unit 120 receives the output signal from the drive module in real time. When it receives the state change signal, the processing unit 120 continuously outputs a first protection control signal to the drive module 131. The switch module 132 controls the test circuit containing the object under test 140 and the protection unit 130 to be disconnected according to the first protection control signal. The test channel is continuously closed, stopping the test of the object under test 140 in that channel.

[0039] By employing a drive module to rapidly respond to the acquired signals, there is no need for signal conditioning, analog-to-digital conversion, or other sampling operations on the current flowing through the PTC product under test. When a sudden change occurs in the acquired signal, the test channel is quickly and temporarily shut down, achieving rapid protection. Simultaneously, a processing unit monitors the status change signals output by the drive module in real time. Once a status change signal is received, a first protection control signal is continuously sent to the drive module. After receiving the first protection control signal, the drive module continuously outputs status change signals to the first switch module, continuously shutting down the test channel, achieving continuous protection. This protection process is called the first protection mode, or "hardware protection." Thus, this embodiment can quickly shut down a channel when the device under test in a particular channel is damaged or short-circuited due to other abnormalities, without affecting the testing of other channels. When using multiple channel controllers, multiple different test channels can be independently controlled, thereby enabling simultaneous testing of multiple devices under test with a single DC power supply.

[0040] The following is a detailed description using PTC products as the test object.

[0041] Figure 2 This is a partial circuit diagram of the channel controller. (Example:) Figure 2 As shown, HV is connected to the positive terminal of the DC power supply. The object under test is connected between LJ1 and LJ2. The sampling unit 110 includes a voltage sampling resistor R15, used to convert the operating current flowing through the PTC product under test into a voltage signal. The sampling unit also includes an acquisition module. The acquisition module includes resistors R13 and R7 connected in series. The first input terminal SD of the protection unit is connected between resistors R13 and R7. Resistors R13 and R7 are used to divide the voltage across R15 to obtain the acquisition signal, which is then input to the driver module IC3 through the first input terminal. The threshold value for triggering the protection unit to perform "hardware protection" is set by setting the resistance values ​​of resistors R13 and R7.

[0042] The protection unit includes a driver module IC3 and a first switch module Q1. The first switch module Q1 uses a high-voltage transistor. The driver module IC3 uses a driver chip. IC3 includes a first input terminal, a second input terminal 2, a first output terminal 6, and a second output terminal 7. The first output terminal 6 is connected to the base of Q1. The second output terminal 7 is connected to the base of Q1 through a resistor R14. IC3 receives the input signal from the sampling unit through the first input terminal. The second control terminal 2 of the driver module IC3 is connected to the output of the processing unit and is used to receive the first protection control signal output by the processing unit. The base level of Q1 is introduced to the IN input terminal of the processing unit. The processing unit determines whether Q1 is cut off by acquiring the base level of Q1.

[0043] The withstand voltage test for PTC products includes rated withstand voltage testing and ultimate withstand voltage testing. The conventional rated withstand voltage test method applies the rated voltage to the PTC under test using a DC power supply, and determines whether the PTC product is damaged by measuring the current value within a specified time. The conventional ultimate withstand voltage test method applies a gradually increasing voltage to the PTC under test using a DC power supply until the PTC is damaged. This damage often manifests as explosion or short circuit; a sudden increase in current will occur before the explosion.

[0044] Figure 3 Figure 'a' illustrates a sudden current surge in the PTC product under test. The horizontal axis represents time T, and the vertical axis represents the current I flowing through the PTC product and the voltage V applied to it. I is the steady-state operating current of the PTC, V is the voltage applied across the PTC, I2 is the first protection value triggering the "hardware protection," and I1 is the preset second protection value. When the PTC product under test reaches its ultimate withstand voltage value or experiences damage or other abnormalities leading to a short circuit during the withstand voltage test, the operating current flowing through the PTC product experiences a sudden increase, rapidly reaching I2, which will directly trigger the "hardware protection."

[0045] When the operating current flowing through the PTC product under test suddenly increases, the acquisition signal received at the SD terminal also suddenly increases, and the SD terminal inputs a "1 high level". This triggers the first output terminal 6 of the driver module IC3 to turn off Q1 due to the sinking current. The first switch module Q1 is then briefly turned off.

[0046] Meanwhile, the processing unit monitors the base level of the switching module Q1 in real time to determine whether Q1 is cut off. When Q1 is cut off, the processing unit continuously outputs a low level to the second input terminal 2 of the driver unit IC3, i.e., the "K mark" terminal, so that the first output terminal OUTS6 of the driver unit IC3 continuously "drives in" current, causing Q1 to be cut off, thereby closing the test channel. "Drives in" means that the first output terminal OUTS6 of the driver unit IC3 can receive sinking current, thereby outputting a low level to the base of Q1.

[0047] Optionally, the protection unit also includes an inductor L1, connected in series with the PCT under test in the test circuit. The PCT under test is connected to the collector C of the first switching module Q1 via inductor L1. Inductor L1 is used to slow down the rise rate of the current flowing through the PCT under test, giving the first switching module Q1 sufficient time to change from the on state to the off state. Utilizing the characteristic that the current flowing through the inductor cannot change instantaneously, this provides time for Q1 to cut off when a sudden change in the damage current of the PTC under test occurs. The measured operating time is 1μs.

[0048] When the tested PTC reaches its maximum withstand voltage, or when the PTC is damaged and short-circuited, causing a sudden increase in current, the corresponding line current will also increase abruptly. The signal is transmitted to the SD pin of the driver chip via the current sampling voltage divider resistor composed of R13 and R7. By changing the level of the SD pin, the output is turned on and off, thereby driving the high-voltage transistor to shut off the circuit, thus achieving the purpose of turning off the voltage applied across the PTC.

[0049] Understandably, if the response speed of the first switching module Q1 is fast enough, there is no need to use inductor L1.

[0050] In another embodiment, the protection unit further includes a second protection mode, also known as "software protection." During the withstand voltage test of the PCT product under test, the current flowing through the PTC product exhibits a slow, non-abrupt increase. For example... Figure 3 As shown in b, I is the steady-state operating current of the PTC, V is the voltage applied across the PTC, I1 is the user-set protection current value, and I2 is the hardware threshold protection current. When the PTC fails and the current rises slowly, the channel controller has enough time to respond. The response time is T2-T1, and the second protection mode of "software protection" will be adopted.

[0051] The first protection mode and the second protection mode operate in parallel. Because the second protection mode requires sampling the current flowing through the PCT product under test to obtain a sample value, its protection speed is slower than the first protection mode, making it suitable for situations where the current changes slowly. The sampling includes range conversion, amplification, and analog-to-digital conversion after current acquisition.

[0052] like Figure 4 As shown, the processing unit is also connected to the sampling unit. The sampling unit further includes a signal conditioning module for range conversion and amplification of the current flowing through the measured object, so that the processing unit can perform analog-to-digital conversion to obtain the sampled value. Figure 5 As shown, the signal conditioning module includes a second acquisition module and an amplification module IC2A. The second acquisition module includes sampling resistors R2 and R3, which are connected in series to the emitter E of the first switch module Q1 for sampling the current flowing through the PTC under test. IC1 is an analog switch chip. The non-inverting input of the operational amplifier IC2A is connected between resistors R2 and R3. It receives the signal acquired by the second acquisition module, amplifies it after input to the non-inverting input of IC2A, and then outputs the amplified signal from output I of IC2A into the processing unit for A / D conversion to obtain the sampled value of the current flowing through the PTC under test.

[0053] The processing unit compares the sampled value with a first threshold. When the sampled value is greater than the first threshold, a second protection mode, i.e., "software protection," is triggered. The first threshold is the current threshold corresponding to triggering "software protection." The processing unit outputs a second protection control signal to the IN2 terminal of the drive module IC3, causing the first switch module Q1 to remain off, thereby controlling the channel containing the protection unit to close. The method of continuously turning off the first switch module Q1 is the same as that of the first protection mode described above.

[0054] In another embodiment, the channel controller further includes a protection control unit. The protection control unit is used to control the operating state of the protection unit, thereby controlling whether the protection function of the test channel where the protection unit is located is active.

[0055] When performing a withstand voltage test on a PTC resistor, its resistance will decrease first and then increase rapidly around the "Curie temperature" when a voltage is continuously applied to the PTC resistor. The current flowing through the PTC resistor under test reaches its maximum at the "Curie temperature". Figure 6 The graph shows the current-voltage characteristic of a PTC resistor, with the horizontal axis representing the voltage applied to the PTC and the vertical axis representing the current flowing through the PTC. When the PTC resistor is powered on, the current increases rapidly with the applied voltage, reaching its maximum value at the Curie temperature. The withstand voltage test includes rated withstand voltage testing and ultimate withstand voltage testing. Both the rated voltage and breakdown voltage of the PTC occur after the current reaches its maximum value; that is, both tests are performed after the PTC exceeds its Curie temperature. Therefore, when the PTC effect occurs and the current reaches its maximum value, it will exceed the thresholds of both hardware and software protection, triggering the protection function. The test channel will be shut down, and the test process will be terminated before it even begins, resulting in a "false protection" situation.

[0056] A processing unit compares the sampled current flowing through the PTC under test with a second threshold. Based on the comparison result, a protection control unit controls the operation of the protection unit. The system detects current changes to determine if the current flowing through the PTC under test has reached the maximum current corresponding to the Curie temperature. When the sampled value is less than the second threshold, it indicates that the PTC under test has not yet reached the Curie temperature, and the current value has reached the maximum value Imax. At this time, the protection unit is inactive, and the protection function of the test channel is not activated. When the sampled value is greater than or equal to the second threshold, it indicates that the PTC under test has passed the Curie temperature and is in the withstand voltage test stage. At this time, the protection unit is activated, and the protection function of the test channel is activated, thus solving the problem of "false protection".

[0057] like Figure 7 As shown, the protection control unit 150 is connected to the processing unit 120 and the protection unit 130, and is used to receive an enable signal and control the operating state of the protection unit according to the enable signal. When the protection control unit does not receive an enable signal, the protection control unit 150 and the PTC product under test are in the same test circuit, and the protection unit 130 is not connected to this circuit. At this time, the protection unit 130 is not conductive and does not work because it is not connected to the test circuit. When the protection control unit 150 receives an enable signal, it connects the protection unit 130 to the test circuit, making the protection unit work. At this time, the protection unit 130 is electrically connected to the PTC product under test and is in the same test circuit, thereby realizing the protection of the PTC product under test.

[0058] Optionally, the protection control unit 150 includes a second switch module connected to the processing unit 120, used to change its own state according to the activation signal, thereby controlling whether the protection unit is in an operational state. When no activation signal is received, the second switch module is turned on, placing the protection control unit and the PTC product under test in the same test circuit; the protection unit is short-circuited or not selected, and is in a non-operating state. When an activation signal is received, the second switch module is turned off, causing the protection control unit to stop working. At this time, the protection unit is selected and in an operational state, and the protection unit and the PTC product under test are in the same test circuit, thereby achieving protection for the PTC product under test.

[0059] Optionally, the protection control unit 150 includes a second switch and a second switch controller. The second switch controller is connected to the microcontroller and the second switch respectively, and is used to control the second switch to change its own state according to the enable signal, so as to control the protection unit to be in an active state.

[0060] like Figure 8As shown, the second switching module includes a high-voltage relay and a second switching controller BG2. J1A is the coil of the high-voltage relay, and J1B is the contact of the high-voltage relay. Initially, the relay coil is energized, and the DC power supply, the PTC under test, and the protection control unit form a circuit. The protection unit is not connected to the test circuit, and the protection function is not active. The processing unit samples the current flowing through the PTC under test in real time through the second acquisition module of the sampling unit to obtain its sampled value. This sampled value is compared with a second threshold to determine whether the current flowing through the PTC under test has reached the maximum current I at the Curie temperature. max When the current flowing through the PTC product under test does not reach its maximum value, it indicates that the PTC product under test has not yet reached the Curie temperature point and has not yet reached the withstand voltage test stage, so there is no need to activate the protection unit.

[0061] When the current flowing through the PTC product under test reaches its maximum value, or has exceeded its maximum value, it indicates that the PTC product under test has entered the withstand voltage test stage, and the protection unit needs to be activated. The processing unit sends an activation signal to the protection control unit. The JEX terminal of the protection control unit receives this activation signal and is at a low level. At this time, the second switch controller BG2 is cut off due to the low level of its base, and the high-voltage relay coil changes from the energized state to the non-energized state. The protection control unit is disconnected, and the protection unit is connected to the test circuit. At this time, the DC power supply, the PTC under test, and the protection unit form a circuit, and the protection function is activated. The current flows from the positive terminal HV of the DC power supply through the PTC product under test, then through inductor L1, the collector C of the first switch module Q1, and the emitter E of the first switch module Q1, and then branches into three branches to form a circuit. The first branch is the sampling resistor R15. The second branch is the resistors R13 and R7. The third branch is the resistors R2 and R3.

[0062] Optionally, the second threshold is the maximum current Imax of the PTC product under test when it is at the Curie temperature. The processing unit determines whether the PTC product under test needs to activate protection by judging whether the current flowing through it has reached the maximum current. When the current of the PTC product under test reaches the maximum current, it indicates that the PTC product under test is about to enter the withstand voltage test stage. The protection unit is then activated, connected to the test circuit, and the protection function takes effect.

[0063] Optionally, the second threshold is 70% or more of the maximum current Imax, i.e., the second threshold ≥ 70% Imax. Optionally, the second threshold is ≥ 80% Imax. Optionally, the second threshold is ≥ 90% Imax. The processing unit determines whether the PTC product under test has reached its maximum current by counting the number of times the current flowing through it reaches the second threshold. When the current flowing through the PTC product under test reaches the second threshold for the second time, it is known that the PTC product under test has reached its maximum current, indicating that the PTC product under test has entered the withstand voltage test stage. The protection unit is then activated, connected to the test circuit, and the protection function takes effect.

[0064] This application also provides a channel control device for multi-channel testing, such as... Figure 9 As shown, it includes at least two channel controllers, each connected to a different object under test (DUT); each channel controller independently controls the test status of the DUT connected to it. This enables simultaneous testing of multiple DUTs. When a DUT experiences damage or an anomaly causing a short circuit, the test channel for that DUT is quickly shut down, while the testing of other DUTs remains unaffected.

[0065] Another embodiment of this application also provides a multi-channel testing device, such as... Figure 9 As shown, the multi-channel testing device specifically includes: at least two test channels, each test channel including the aforementioned channel controller and a test object connected to the channel controller; each channel controller is used to independently control whether the test channel is turned off or not. The multi-channel testing device also includes a test power supply. Optionally, the multi-channel testing device includes only one test power supply. Optionally, the test power supply is a DC power supply. When performing multi-channel testing, only the channel controller needs to be added to achieve the purpose of multi-channel synchronous testing. By using the aforementioned channel controller, it is possible to complete the simultaneous testing of multiple test objects using only one power supply.

[0066] In addition to providing rapid protection, the embodiments of this application offer a small channel controller, significantly smaller than the DC power supply, resulting in a small overall footprint for the test equipment. The channel controller also boasts low power consumption, in the single-digit watt range, far lower than the additional DC power supply power required for one-to-one testing. It offers the advantages of small size and low power consumption.

[0067] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0068] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the invention patent. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this patent application should be determined by the appended claims.

Claims

1. A channel controller for multi-channel testing, characterized in that, include: The system includes a sampling unit, a processing unit, and a protection unit; the sampling unit and the protection unit are connected; the processing unit and the protection unit are connected. The sampling unit is used to collect the current flowing through the object under test and output the collected signal; The protection unit includes a drive module and a first switch module; the drive module is used to output a state change signal to the first switch module according to the acquired signal, and the first switch module briefly changes from a conducting state to a cut-off state; the processing unit is used to receive the state change signal output by the drive module and output a first protection control signal to the drive module according to the state change signal. The drive module is used to continuously output a shutdown signal to the first switch module according to the first protection control signal; the first switch module continuously shuts down the channel where the protection unit is located according to the continuous shutdown signal.

2. The channel controller for multi-channel testing according to claim 1, characterized in that, The driving module includes a first input terminal, a second input terminal, and a first output terminal; the first input terminal is connected to the sampling unit and is used to receive the acquired signal; the second input terminal is connected to the processing unit and is used to receive a first protection control signal.

3. The channel controller for multi-channel testing according to claim 1, characterized in that, The protection unit further includes a delay module for reducing the rate of rise of the current flowing through the first switching module, thereby causing the first switching module to change its state.

4. The channel controller for multi-channel testing according to claim 1, characterized in that, The processing unit is also connected to the sampling unit; the processing unit is used to compare the sampled value of the current flowing through the object under test with a first threshold, and output a second protection control signal to the protection unit according to the comparison result, so as to control the channel where the protection unit is located to be closed.

5. The channel controller for multi-channel testing according to claim 4, characterized in that, The sampling unit includes a signal conditioning module; the signal conditioning module is used to perform range conversion and amplification of the current flowing through the measured object so that the processing unit can obtain the sampled value.

6. The channel controller for multi-channel testing according to claim 1, characterized in that, It also includes a protection control unit, which is connected to the protection unit, the sampling unit and the processing unit respectively; the protection control unit is used to receive the acquisition signal and the enable signal of the processing unit to control the protection unit to enter the working state.

7. The channel controller for multi-channel testing according to claim 6, characterized in that, The processing unit is also used to compare the sampled value of the current flowing through the object under test with a second threshold, and send an enable signal to the protection control unit according to the comparison result.

8. The channel controller for multi-channel testing according to claim 6, characterized in that, The protection control unit includes a second switch module, which is connected to both the protection unit and the processing unit. The second switch module is used to change its own working state according to the enable signal of the processing unit, so as to control the protection unit to enter the working state.

9. A channel control device for multi-channel testing, characterized in that, include: At least two channel controllers according to any one of claims 1-8, each channel controller being connected to a different test object; each channel controller being used to independently control the test state of the test object connected to it.

10. A multi-channel testing device, characterized in that, include: At least two test channels, each test channel including a channel controller as described in any one of claims 1-8, and a test power supply connected to the channel controller; each channel controller is used to independently control whether the test channel is turned off or not.

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