Opto-coupler performance test method, system, electronic device and storage medium

Abstract

The application discloses a photoelectric coupler performance test method, a test system, an electronic device and a computer readable storage medium. The method comprises the following steps: first, gradually increasing the input voltage applied to the input end of the photoelectric coupler; determining the working voltage of the photoelectric coupler based on the response voltage of the output end of the photoelectric coupler; then, applying the determined working voltage to the input end of the photoelectric coupler; and further obtaining other performance parameters, such as the on response time, the off response time, the response voltage stability and the like. The working voltage and other performance parameters of the photoelectric coupler are tested to further evaluate whether the photoelectric coupler is qualified. Moreover, the other performance parameters are tested under the determined working voltage of the photoelectric coupler, and the test result is more accurate.

Description

Technical Field

[0001] This application relates to the field of optocoupler testing technology, and in particular to an optocoupler performance testing method, system, electronic device and storage medium. Background Technology

[0002] An optocoupler is a device that transmits electrical signals using light as a medium. It typically encapsulates the emitter and receiver within the same housing. When a corresponding electrical signal is applied to the input, the emitter emits light, and the receiver receives the light and generates a photocurrent, which flows out from the output, thus achieving an "electrical-optical-electrical" conversion.

[0003] With the widespread application of optocouplers, the requirements for their reliability are becoming increasingly stringent. Therefore, the measurement techniques for key parameters of optocouplers, such as operating voltage, response speed, and response voltage stability, have become particularly important. Summary of the Invention

[0004] To enable testing of optocouplers, this application provides an optocoupler performance testing method, an optocoupler performance testing system, an electronic device, and a computer-readable storage medium.

[0005] According to one aspect of the embodiments of this application, a method for testing the performance of an optocoupler is disclosed, the method comprising:

[0006] An increasing input voltage is applied to the input terminal of the optocoupler, the response voltage at the output terminal of the optocoupler is obtained, and the operating voltage of the optocoupler is determined based on the response voltage.

[0007] The operating voltage is applied to the input terminal of the optocoupler to obtain at least one of the optocoupler's turn-on response time, turn-off response time, and response voltage stability.

[0008] In one exemplary embodiment, applying the operating voltage to the input terminal of the optocoupler to obtain at least one of the optocoupler's turn-on response time, turn-off response time, and response voltage stability includes:

[0009] The operating voltage is applied to the input terminal of the optocoupler, and the response time required for the output voltage of the optocoupler to rise to a first voltage is obtained, which is taken as the conduction response time; and / or,

[0010] When the operating voltage is applied to the input terminal of the optocoupler, after the response voltage at the output terminal of the optocoupler reaches the rated output voltage value for a preset time, the application of the operating voltage to the input terminal of the optocoupler is stopped, and the response time required for the response voltage at the output terminal of the optocoupler to drop to a second voltage is obtained as the turn-off response time; and / or,

[0011] When the operating voltage is applied to the input terminal of the optocoupler, after the response voltage at the output terminal of the optocoupler reaches the rated output voltage value, the response voltage at the output terminal of the optocoupler at multiple times is obtained, and the response voltage stability of the optocoupler is determined based on the response voltage at the multiple times.

[0012] In one exemplary embodiment, determining the response voltage stability of the optocoupler based on the response voltage at the plurality of times includes:

[0013] Obtain the variance of the response voltage at the multiple time points;

[0014] The response voltage stability of the optocoupler is determined based on the variance.

[0015] In one exemplary embodiment, the operating voltage is the input voltage when the ratio of the difference between the two response voltages at the output terminal of the optocoupler to the difference in the input voltage corresponding to the two response voltages drops to tan40°; and / or, the first voltage is the response voltage when the ratio of the difference between the two response voltages at the output terminal of the optocoupler to the difference in the sampling time corresponding to the two response voltages drops to tan10°; and / or, the second voltage is zero.

[0016] In one exemplary embodiment, the optocoupler performance testing method further includes:

[0017] Plot a voltage curve characterizing the change in the response voltage at the output of the optocoupler as a function of the gradually increasing input voltage; and / or,

[0018] Plot a voltage curve showing the response voltage at the output of the optocoupler as a function of time when the operating voltage is applied to the input of the optocoupler; and / or,

[0019] Plot the voltage curve of the response voltage at the output of the optocoupler as a function of time when the operating voltage is stopped from being applied to the input of the optocoupler.

[0020] According to one aspect of the embodiments of this application, an optocoupler performance testing system is disclosed. The optocoupler performance testing system includes a test socket and a main control module. The test socket is used to connect an optocoupler. The main control module is electrically connected to the test socket and is configured to perform the optocoupler performance testing method as described above.

[0021] In one exemplary embodiment, the test socket includes a base and a plurality of test units disposed on the base. The test unit has a first input connection terminal, a second input connection terminal, a first output connection terminal, and a second output connection terminal. The first input connection terminal is electrically connected to the main control module. The second input connection terminal is connected in series with a first resistor, the other end of which is grounded. The first output connection terminal is connected in series with a second resistor, the other end of which is connected to a power supply. The second output connection terminal is electrically connected to the main control module.

[0022] In one exemplary embodiment, the plurality of test units include a first test unit and a second test unit. The first input connection terminal and the second input connection terminal of the first test unit are positioned opposite to the first output connection terminal and the second output connection terminal. The first input connection terminal and the second input connection terminal of the second test unit are offset from the first output connection terminal and the second output connection terminal. The second test unit also has a power connection terminal, which is connected to a power source.

[0023] In one exemplary embodiment, the optocoupler performance testing system further includes an analog multiplexing unit connected between the main control module and the plurality of test units, for selectively connecting or disconnecting the connection loop between the main control module and each of the test units.

[0024] According to one aspect of the embodiments of this application, an electronic device is disclosed, including one or more processors and a memory, wherein the memory is used to store one or more computer programs, and when the one or more computer programs are executed by the one or more processors, the processors implement the aforementioned optocoupler performance testing method.

[0025] According to one aspect of the embodiments of this application, a computer-readable storage medium is disclosed, the computer-readable storage medium storing computer-readable instructions, which, when executed by a computer's processor, cause the computer to perform the aforementioned optocoupler performance testing method.

[0026] The technical solutions provided by the embodiments of this application have at least the following beneficial effects:

[0027] The technical solution provided in this application first applies a gradually increasing input voltage to the input terminal of the optocoupler, determines the operating voltage of the optocoupler based on the response voltage at the output terminal, and then applies the determined operating voltage to the input terminal of the optocoupler to further obtain other performance parameters, such as turn-on response time, turn-off response time, and response voltage stability. This enables the testing of performance parameters such as the operating voltage of the optocoupler to further evaluate whether the optocoupler is qualified. Moreover, since this application performs the testing of other performance parameters under the determined operating voltage of the optocoupler, the test results are more accurate.

[0028] It should be understood that the above general description and the following detailed description are merely exemplary and do not limit this application. Attached Figure Description

[0029] The accompanying drawings, which are incorporated in and form part of this specification, illustrate embodiments consistent with this application and, together with the specification, serve to explain the principles of this application.

[0030] Figure 1 This is a flowchart illustrating a method for testing the performance of an optocoupler in a first exemplary embodiment.

[0031] Figure 2 This is a graph illustrating the change in output voltage of an optocoupler as a function of input voltage, as shown in one embodiment.

[0032] Figure 3 This is a graph illustrating the change of the output voltage of an optocoupler over time, as shown in one embodiment.

[0033] Figure 4 This is a graph showing the change of the output voltage of an optocoupler over time, as illustrated in another embodiment.

[0034] Figure 5 This is another embodiment showing a graph of the output voltage of an optocoupler changing over time.

[0035] Figure 6 It corresponds to Figure 1 Detailed flowchart of step S102.

[0036] Figure 7 This is a flowchart illustrating a method for testing the performance of an optocoupler in a second exemplary embodiment.

[0037] Figure 8 This is a flowchart illustrating a method for testing the performance of an optocoupler in a third exemplary embodiment.

[0038] Figure 9 This is a flowchart illustrating a method for testing the performance of an optocoupler in a fourth exemplary embodiment.

[0039] Figure 10 This is a flowchart illustrating a method for testing the performance of an optocoupler in the fifth exemplary embodiment.

[0040] Figure 11 This is a block diagram illustrating the composition of an optocoupler performance testing system, as shown in an exemplary embodiment.

[0041] Figure 12 This is a schematic diagram of an optocoupler performance testing system illustrated in an exemplary embodiment.

[0042] Figure 13 This is a schematic diagram of an optocoupler test unit shown in an exemplary embodiment.

[0043] Figure 14 This is a block diagram illustrating an electronic device according to an exemplary embodiment.

[0044] The annotations in the attached figures are explained as follows:

[0045] 11. Base; 12. Test unit; 12a. First test unit; 12b. Second test unit; P1. First input connection terminal; P2. Second input connection terminal; P3. First output connection terminal; P4. Second output connection terminal; P5. Power connection terminal; R1. First resistor; R2. Second resistor; 13. Optocoupler fastener; 14. Microcontroller; 15. Digital-to-analog converter unit; 16. Analog-to-digital converter unit; 17. Analog multiplexing unit; 18. Display unit; 200. Electronic device; 201. Processor; 202. Memory. Detailed Implementation

[0046] Exemplary embodiments will now be described more fully with reference to the accompanying drawings. However, these exemplary embodiments can be implemented in many forms and should not be construed as limited to the examples set forth herein; rather, these embodiments are provided to make this application more comprehensive and complete, and to fully convey the concept of the exemplary embodiments to those skilled in the art.

[0047] Furthermore, the described features, structures, or characteristics can be combined in any suitable manner in one or more embodiments. Numerous specific details are provided in the following description to give a thorough understanding of embodiments of this application. However, those skilled in the art will recognize that the technical solutions of this application can be practiced without one or more of the specific details, or other methods, components, apparatuses, steps, etc., can be employed. In other instances, well-known methods, apparatuses, implementations, or operations are not shown or described in detail to avoid obscuring various aspects of this application.

[0048] The block diagrams shown in the accompanying drawings are merely functional entities and do not necessarily correspond to physically independent entities. That is, these functional entities can be implemented in software, in one or more hardware modules or integrated circuits, or in different network and / or processor devices and / or microcontroller devices.

[0049] The flowcharts shown in the accompanying drawings are merely illustrative and do not necessarily include all content and operations / steps, nor do they necessarily have to be performed in the described order. For example, some operations / steps can be broken down, while others can be combined or partially combined; therefore, the actual execution order may change depending on the specific circumstances.

[0050] An optocoupler, or simply optocoupler, consists of a light source and a light receiver. The light source is typically a light-emitting diode (LED), and the light receiver is typically a photodiode, phototransistor, or similar device. The pins of the light source serve as the input terminals of the optocoupler. Applying an electrical signal to the input terminals causes the light source to emit light. The intensity of the light depends on the magnitude of the input current. When this light shines on the photo receiver, which is packaged together, a photocurrent is generated due to the photoelectric effect. The pins of the photo receiver serve as the output terminals of the optocoupler, and the generated photocurrent is led out from the pins of the photo receiver.

[0051] The parameters of an optocoupler include operating voltage, turn-on response time, turn-off response time, and response voltage stability. Operating voltage refers to the input voltage required for the optocoupler to operate normally. Turn-on response time refers to the turn-on delay of the optocoupler, and correspondingly, turn-off response time refers to the turn-off delay. Response voltage stability refers to the fluctuation of the output voltage after the operating voltage is applied to the input terminal of the optocoupler and rises to the rated output voltage corresponding to the operating voltage. If these parameters are inconsistent with the factory calibration, it may affect the normal operation of the optocoupler or its downstream circuits in the actual circuit.

[0052] If the actual operating voltage of the optocoupler differs from the factory-calibrated operating voltage—for example, if the actual operating voltage is lower than the factory-calibrated operating voltage—using the factory-calibrated operating voltage to power the optocoupler will cause the output voltage of the optocoupler to saturate. Prolonged exposure to saturation voltage will damage the light source. Conversely, if the actual operating voltage is higher than the factory-calibrated operating voltage, using the factory-calibrated operating voltage to power the optocoupler will affect the normal operation of the optocoupler or subsequent circuits. For instance, if the optocoupler is used as a driver circuit to drive subsequent circuits, and the supply voltage does not reach the actual operating voltage of the optocoupler, the drive current / voltage at the output of the optocoupler will not meet the driving requirements of the subsequent circuits, resulting in insufficient drive current / voltage and causing the subsequent circuits to malfunction.

[0053] The turn-on and turn-off response times reflect the response speed of an optocoupler. In some applications, the optocoupler needs to turn on quickly to rapidly power on the corresponding downstream devices. In this case, a short turn-on response time is required. If the turn-on response time is longer than the factory-specified turn-on response time, it will not be able to quickly power on the downstream devices. Similarly, in other applications, the optocoupler needs to turn off quickly to rapidly power off the corresponding downstream devices. In this case, a short turn-off response time is required. If the turn-off response time is longer than the factory-specified turn-off response time, it will not be able to quickly power off the downstream devices.

[0054] It should be noted that the turn-on response time includes the sum of the turn-on time of the light source and the turn-on time of the light receiver; similarly, the turn-off response time includes the sum of the turn-off time of the light source and the turn-off time of the light receiver.

[0055] It should be noted that the rated output voltage refers to the voltage at the output terminal that gradually rises to a certain value and then stabilizes at approximately that value when the operating voltage is applied to the input terminal of the optocoupler.

[0056] When an optocoupler connects to a downstream device, if the output voltage of the optocoupler is unstable, that is, if the voltage applied to the downstream device is unstable, it will affect the normal operation of the downstream device.

[0057] The following detailed description of the optocoupler performance testing method, system, electronic device, and computer-readable medium provided in this application, with reference to specific embodiments, provides a detailed explanation.

[0058] See Figure 1 , Figure 1 This is a flowchart illustrating a method for testing the performance of an optocoupler according to a first exemplary embodiment. The execution subject of this method can be a microcontroller (MCU), etc., and the method mainly includes the following steps S101 to S102.

[0059] Step S101: Apply a gradually increasing input voltage to the input terminal of the optocoupler, obtain the response voltage at the output terminal of the optocoupler, and determine the operating voltage of the optocoupler based on the response voltage.

[0060] When a gradually increasing input voltage is applied to the input terminal of an optocoupler, the optocoupler turns on after reaching its turn-on voltage. A corresponding response voltage is generated at the output terminal of the optocoupler. As the input voltage increases, the response voltage at the output terminal also gradually increases. However, as the input voltage approaches the operating voltage of the optocoupler, the rate of increase in the response voltage slows down, eventually reaching and maintaining a saturation voltage value. Figure 2 As shown.

[0061] In one embodiment of this application, the operating voltage is the input voltage when the ratio of the difference between the two response voltages at the output terminal of the optocoupler to the difference in the input voltage corresponding to the two response voltages drops to tan40°.

[0062] In other words, determining the operating voltage of the optocoupler based on the response voltage means taking the input voltage at which the ratio of the difference between the two response voltages at the output of the optocoupler to the difference in the corresponding input voltage drops to tan40° as the operating voltage of the optocoupler. That is, the input voltage corresponding to the slope of the response voltage curve dropping to tan40° is taken as the operating voltage of the optocoupler. Figure 2 Taking the voltage curve shown as an example, the operating voltage of the optocoupler is the voltage value corresponding to the position of approximately 4 on the horizontal axis.

[0063] When the ratio of the difference between the two response voltages at the output of the optocoupler to the difference between the input voltages corresponding to the two response voltages drops to tan40°, the response voltage at the output of the optocoupler is close to the saturation voltage but has not yet reached the saturation voltage. This point can be estimated as the operating voltage of the optocoupler with a small error.

[0064] Of course, using the ratio of the difference between the two response voltages at the output of the optocoupler to the difference in the input voltage corresponding to those two response voltages as the input voltage when the ratio drops to tan40° as the operating voltage of the optocoupler is merely an example. In other embodiments, it can be flexibly adjusted based on actual conditions. For example, the operating voltage of the optocoupler can be used when the ratio of the difference between the two response voltages at the output of the optocoupler to the difference in the input voltage corresponding to those two response voltages drops to tan39°; or, for another example, the operating voltage of the optocoupler can be used when the ratio of the difference between the two response voltages at the output of the optocoupler to the difference in the input voltage corresponding to those two response voltages drops to tan41°.

[0065] It should be noted that the operating voltage is less than the input voltage corresponding to the output saturation voltage of the optocoupler.

[0066] Step S102: Apply a working voltage to the input terminal of the optocoupler to obtain at least one of the optocoupler's turn-on response time, turn-off response time, and response voltage stability.

[0067] In step S102, one may obtain only the on-response time of the optocoupler; one may obtain only the off-response time of the optocoupler; one may obtain both the on-response time and the off-response time of the optocoupler; one may obtain only the response voltage stability; one may obtain both the response voltage stability and the on-response time; one may obtain both the response voltage stability and the off-response time; or one may obtain all three: the on-response time, the off-response time, and the response voltage stability.

[0068] In one embodiment of this application, in step S102, a working voltage is applied to the input terminal of the optocoupler, and the response time required for the response voltage at the output terminal of the optocoupler to rise to a first voltage is obtained as the conduction response time.

[0069] When a working voltage is applied to the input terminal of an optocoupler, a corresponding response voltage is generated at the output terminal. As the applied voltage duration increases, the response voltage at the output terminal gradually increases, and the rate of increase slows down with increasing applied voltage duration, eventually reaching a maximum voltage value and maintaining approximately at that value. Figure 3 As shown.

[0070] In one embodiment of this application, the first voltage is the response voltage when the ratio of the difference between the two response voltages at the output terminal of the optocoupler to the difference in the sampling time corresponding to the two response voltages drops to tan10°.

[0071] In other words, the response time required for the output voltage of the optocoupler to rise to the first voltage is taken as the turn-on response time. This is equivalent to the time when the ratio of the difference between the two output voltages of the optocoupler to the difference in sampling time corresponding to these two voltages decreases to tan10°. In other words, the turn-on response time of the optocoupler is the time from when the operating voltage is first applied until the slope of the response voltage curve decreases to tan10°.

[0072] It should be noted that a complete response of an optocoupler does not specifically refer to the output voltage reaching its maximum value. When the response voltage is close to the maximum value, the optocoupler can be considered to have a complete response. The time from the initial application of the operating voltage to the complete response of the optocoupler is the conduction response time of the optocoupler.

[0073] When the ratio of the difference between the two response voltages at the output of the optocoupler to the difference in the sampling time corresponding to the two response voltages drops to tan10°, the response voltage at the output of the optocoupler is close to the maximum voltage value but has not yet reached the maximum voltage value. The time from the start of applying the working voltage to when the ratio drops to tan10° is estimated as the conduction response time of the optocoupler, which has high accuracy.

[0074] Of course, using the time when the ratio of the difference between the two response voltages at the output of the optocoupler to the difference in the sampling time corresponding to the two response voltages drops to tan10° as the conduction response time is only an example. In other embodiments, it can be flexibly adjusted based on the actual situation. For example, the time when the ratio of the difference between the two response voltages at the output of the optocoupler to the difference in the sampling time corresponding to the two response voltages drops to tan9° can be used as the conduction response time. Another example is using the time when the response voltage at the output of the optocoupler reaches the maximum voltage value as the conduction response time, that is, using the time when the slope of the response voltage curve drops to 0 as the conduction response time of the optocoupler.

[0075] In one embodiment of this application, in step S102, when a working voltage is applied to the input terminal of the optocoupler, after the response voltage at the output terminal of the optocoupler reaches the rated output voltage value for a preset time, the working voltage applied to the input terminal of the optocoupler is stopped, and the response time required for the response voltage at the output terminal of the optocoupler to drop to the second voltage is obtained as the turn-off response time.

[0076] When a working voltage is applied to the input terminal of the optocoupler, the corresponding response voltage at the output terminal gradually increases. As the applied voltage duration increases, the rate of increase slows down, eventually reaching a maximum voltage value and maintaining approximately at that value, which is also the rated output voltage. After the response voltage reaches a certain value within the rated output voltage range, the working voltage applied to the input terminal of the optocoupler is stopped. At this point, the response voltage at the output terminal of the optocoupler will gradually decrease until it reaches zero. Figure 4 As shown.

[0077] In one embodiment of this application, the second voltage is zero.

[0078] In other words, the turn-off response time is the time required for the response voltage at the output terminal of the optocoupler to drop to the second voltage. This is equivalent to the time it takes for the response voltage at the output terminal of the optocoupler to drop to zero. In other words, the turn-off response time is the time from when the operating voltage is stopped being applied to the input terminal of the optocoupler until the slope of the response voltage curve drops to zero.

[0079] When the response voltage at the output of the optocoupler drops to zero, it can be ensured that the optocoupler is in the off state. The time from when the working voltage is stopped being applied to the input of the optocoupler until the slope of the response voltage curve drops to zero is estimated as the off-response time of the optocoupler, with small error. Of course, in other embodiments, the operating characteristics of the optocoupler can also be considered, and other values ​​besides zero can be set for the second voltage. For example, the time when the ratio of the difference between the two response voltages at the output of the optocoupler to the difference in sampling time corresponding to the two response voltages drops to tan170° can be used as the off-response time.

[0080] In one embodiment of this application, in step S102, when a working voltage is applied to the input terminal of the optocoupler, after the response voltage at the output terminal of the optocoupler reaches the rated output voltage value, the response voltage at the output terminal of the optocoupler at multiple times is obtained, and the stability of the response voltage of the optocoupler is determined based on the response voltage at multiple times.

[0081] When a working voltage is applied to the input terminal of the optocoupler, a corresponding response voltage is generated at the output terminal. As the applied working voltage duration increases, the response voltage at the output terminal of the optocoupler gradually increases, and the rate of increase slows down with increasing applied voltage duration, eventually reaching a maximum voltage value. After the response voltage reaches its maximum value, the magnitude of the response voltage fluctuation reflects the stability of the optocoupler's response voltage. The smaller the fluctuation, the better the stability of the optocoupler's response voltage; conversely, the larger the fluctuation, the worse the stability. In an exemplary embodiment, the response voltage curve is as follows: Figure 5 As shown.

[0082] In one embodiment of this application, the stability of the optocoupler's response voltage is determined based on the variance of the response voltage at multiple times. For details, see [link to relevant documentation]. Figure 6 As shown, step S102 mainly includes the following steps S1021 to S1024.

[0083] Step S1021: Apply a working voltage to the input terminal of the optocoupler.

[0084] Step S1022: After the response voltage at the output terminal of the optocoupler reaches the rated output voltage value, acquire the response voltage at the output terminal of the optocoupler at multiple moments.

[0085] Step S1023: Obtain the variance of the response voltage at these multiple moments.

[0086] Step S1024: Determine the stability of the optocoupler's response voltage based on the variance of the response voltage at these multiple moments.

[0087] Since variance can effectively measure the degree of dispersion between data, determining the stability of the optocoupler's response voltage based on the variance of the response voltage at multiple times yields more accurate results.

[0088] It should be noted that the determination of the response voltage stability of the optocoupler is not limited to the variance of the response voltage at multiple times. In other embodiments, other methods can also be used to determine the response voltage stability of the optocoupler. For example, the response voltage stability of the optocoupler can be determined based on the standard deviation, range, etc. of the response voltage at multiple times.

[0089] Several exemplary embodiments of this application are described below.

[0090] See Figure 7 , Figure 7 This is a flowchart illustrating a method for testing the performance of an optocoupler, as shown in the second exemplary embodiment. Figure 7 In the illustrated embodiment, the method includes the following steps S201 to S203.

[0091] Step S201: Apply a gradually increasing input voltage to the input terminal of the optocoupler, obtain the response voltage at the output terminal of the optocoupler, and determine the operating voltage of the optocoupler based on the response voltage.

[0092] Step S202: Apply a working voltage to the input terminal of the optocoupler and obtain the response time required for the response voltage at the output terminal of the optocoupler to rise to the first voltage, which is taken as the conduction response time.

[0093] Step S203: After the response voltage at the output terminal of the optocoupler reaches the rated output voltage value for a preset time, stop applying the working voltage to the input terminal of the optocoupler, and obtain the response time required for the response voltage at the output terminal of the optocoupler to drop to the second voltage, as the turn-off response time.

[0094] This application first applies a gradually increasing input voltage to the input terminal of the optocoupler, and determines the operating voltage of the optocoupler based on the response voltage at the output terminal. Next, by applying the determined operating voltage to the input terminal of the optocoupler and obtaining the response time required for the response voltage at the output terminal to rise to a first voltage, the conduction response speed of the optocoupler is obtained. Then, after the response voltage at the output terminal of the optocoupler reaches the rated output voltage value for a preset time, the application of the operating voltage to the input terminal of the optocoupler is stopped, and the response time required for the response voltage at the output terminal to drop to a second voltage is obtained, thereby obtaining the turn-off response speed of the optocoupler. This eliminates the need for repeatedly turning the input voltage on and off, resulting in high testing efficiency. Furthermore, this application performs tests on other performance parameters under the determined operating voltage of the optocoupler, leading to higher accuracy in the test results.

[0095] See Figure 8 , Figure 8 This is a flowchart illustrating a method for testing the performance of an optocoupler, as shown in the third exemplary embodiment. Figure 8 In the illustrated embodiment, the method includes the following steps S301 to S304.

[0096] Step S301: Apply a gradually increasing input voltage to the input terminal of the optocoupler, obtain the response voltage at the output terminal of the optocoupler, and determine the operating voltage of the optocoupler based on the response voltage.

[0097] Step S302: Apply a working voltage to the input terminal of the optocoupler and obtain the response time required for the response voltage at the output terminal of the optocoupler to rise to the first voltage, which is taken as the conduction response time.

[0098] Step S303: After the response voltage at the output terminal of the optocoupler reaches the rated output voltage value, the response voltage at the output terminal of the optocoupler at multiple times is obtained, and the response voltage stability of the optocoupler is determined based on the response voltage at multiple times.

[0099] Step S304: Stop applying the operating voltage to the input terminal of the optocoupler and obtain the response time required for the response voltage at the output terminal of the optocoupler to drop to the second voltage, as the turn-off response time.

[0100] This application first applies a gradually increasing input voltage to the input terminal of the optocoupler, and determines the operating voltage of the optocoupler based on the response voltage at the output terminal. Next, by applying the determined operating voltage to the input terminal of the optocoupler and obtaining the response time required for the output voltage to rise to a first voltage, the conduction response speed of the optocoupler is obtained. Then, the stability of the response voltage is tested. After the output voltage reaches the rated output voltage value, the stability of the optocoupler's response voltage is determined based on the response voltage at multiple moments. Finally, the application of the operating voltage to the input terminal of the optocoupler is stopped, and the response time required for the output voltage to drop to a second voltage is obtained, thus obtaining the turn-off response speed of the optocoupler. This eliminates the need for repeatedly turning the input voltage on and off, resulting in high testing efficiency. Furthermore, this application performs tests on other performance parameters under the determined operating voltage of the optocoupler, leading to higher accuracy of the test results.

[0101] See Figure 9 , Figure 9 This is a flowchart illustrating a method for testing the performance of an optocoupler, as shown in the fourth exemplary embodiment. Figure 9 In the illustrated embodiment, the method includes the following steps S401 to S402.

[0102] Step S401: Apply a gradually increasing input voltage to the input terminal of the optocoupler, obtain the response voltage at the output terminal of the optocoupler, and determine the operating voltage of the optocoupler based on the response voltage.

[0103] Step S402: Apply a working voltage to the input terminal of the optocoupler. After the response voltage at the output terminal of the optocoupler reaches the rated output voltage value, obtain the response voltage at the output terminal of the optocoupler at multiple times, and determine the stability of the response voltage of the optocoupler based on the response voltage at multiple times.

[0104] This application tests other performance parameters at the determined operating voltage of the optocoupler, resulting in more accurate test results.

[0105] See Figure 10 , Figure 10 This is a flowchart illustrating a method for testing the performance of an optocoupler, as shown in the fifth exemplary embodiment. Figure 10 In the illustrated embodiment, the method includes the following steps S501 to S503.

[0106] Step S501: Apply a gradually increasing input voltage to the input terminal of the optocoupler, obtain the response voltage at the output terminal of the optocoupler, and determine the operating voltage of the optocoupler based on the response voltage.

[0107] Step S502: Apply a working voltage to the input terminal of the optocoupler and obtain the response time required for the response voltage at the output terminal of the optocoupler to rise to the first voltage, which is taken as the conduction response time.

[0108] Step S503: After the response voltage at the output terminal of the optocoupler reaches the rated output voltage value, the response voltage at the output terminal of the optocoupler at multiple times is obtained, and the response voltage stability of the optocoupler is determined based on the response voltage at multiple times.

[0109] This application tests other performance parameters under the determined operating voltage of the optocoupler, resulting in more accurate test results and eliminating the need to repeatedly switch the input voltage on and off, thus improving test efficiency.

[0110] In one embodiment, after obtaining the operating voltage, turn-on response time, turn-off response time, and response voltage stability of the optocoupler, the tester compares the obtained operating voltage with the operating voltage in the optocoupler's original manual, the obtained turn-on response time with the turn-on response time in the manual, the obtained turn-off response time with the turn-off response time in the manual, and the obtained response voltage stability with the response voltage stability in the manual. Based on the comparison results of each parameter, the optocoupler is judged to be qualified.

[0111] In one embodiment of this application, in the step of determining the operating voltage of the optocoupler, a voltage curve characterizing the change of the response voltage at the output terminal of the optocoupler with a gradually increasing input voltage is also plotted, such as... Figure 2 As shown, this allows testers to visually observe the response voltage and easily determine whether the operating voltage meets the requirements.

[0112] Furthermore, in the step of determining the conduction response time of the optocoupler, a voltage curve is plotted showing the change in the response voltage at the output of the optocoupler over time when an operating voltage is applied to the input of the optocoupler, such as... Figure 3 As shown, this allows testers to visually observe the response voltage and easily determine whether the conduction response time meets the requirements.

[0113] Furthermore, in the step of determining the turn-off response time of the optocoupler, a voltage curve is plotted showing the change in the output voltage of the optocoupler over time from the application of the operating voltage to the cessation of the application of the operating voltage to the input terminal of the optocoupler. For example... Figure 4 As shown, this allows testers to visually observe the response voltage and easily determine whether the turn-off response time meets the requirements. Alternatively, one could simply plot the voltage curve showing the change in the output voltage of the optocoupler over time when the operating voltage is no longer applied to the input.

[0114] Furthermore, in the step of determining the voltage stability of the optocoupler, a voltage curve is plotted showing the change in the response voltage at the output of the optocoupler over time when an operating voltage is applied to the input of the optocoupler, such as... Figure 5 As shown, this allows testers to visually observe the response voltage and easily determine whether the voltage stability meets the requirements.

[0115] Figure 11 and Figure 12 This is an exemplary embodiment illustrating an optocoupler performance testing system, which can be applied to the optocoupler performance testing process to perform... Figure 1 as well as Figures 6 to 10 All or part of the steps of any of the optocoupler performance testing methods shown. The optocoupler performance testing system includes, but is not limited to, a test socket and a main control module.

[0116] The test socket is used for electrically connecting the optocoupler and positioning the optocoupler.

[0117] In detail, the test stand includes a base 11 and a test unit 12 disposed on the base 11. The base 11 can be a PCB board, etc. The structure of the test unit 12 corresponds to that of an optocoupler, having a first input connection terminal P1, a second input connection terminal P2, a first output connection terminal P3, and a second output connection terminal P4. The first input connection terminal P1 and the second input connection terminal P2 are used to connect to the input terminals of the optocoupler, i.e., the two pins of the light source. The first output connection terminal P3 and the second output connection terminal P4 are used to connect to the output terminals of the optocoupler, i.e., the two output pins of the light receiver.

[0118] In one embodiment of this application, an optical coupler fastening seat 13 is provided on the seat 11, such as... Figure 12 As shown in the figure, the top of the optocoupler mounting base 13 has multiple insertion holes (not shown) for inserting and fixing the optocoupler and for conducting electricity. These insertion holes are respectively electrically connected to the first input connection terminal P1, the second input connection terminal P2, the first output connection terminal P3, and the second output connection terminal P4. The optocoupler under test is fixed by the optocoupler mounting base 13, and the input and output terminals of the optocoupler under test are electrically connected to the first input connection terminal P1, the second input connection terminal P2, the first output connection terminal P3, and the second output connection terminal P4.

[0119] Of course, in other embodiments, the optocoupler fastening base 13 may not be provided. The first input connection terminal P1, the second input connection terminal P2, the first output connection terminal P3, and the second output connection terminal P4 may be configured as conductive pins or other structures formed on the base body 11. When the input end and the output end of the optocoupler are respectively plugged into the first input connection terminal P1, the second input connection terminal P2, the first output connection terminal P3, and the second output connection terminal P4, the input end of the optocoupler is electrically connected to the first input connection terminal P1 and the second input connection terminal P2, and the output end of the optocoupler is electrically connected to the first output connection terminal P3 and the second output connection terminal P4.

[0120] Figure 13 This is a schematic diagram of an optocoupler test unit shown in an exemplary embodiment.

[0121] See Figures 11 to 13 The first input terminal P1 is electrically connected to the output terminal of the main control module to receive the input voltage output by the main control module, thereby applying it to the input terminal of the optocoupler. The second input terminal P2 is connected in series with the first resistor R1, and the other end of the first resistor R1 is grounded. The first output terminal P3 is connected in series with the second resistor R2, and the other end of the second resistor R2 is connected to the power supply VCC. The second output terminal P4 is electrically connected to the input terminal of the main control module to feed back the acquired response voltage signal to the main control module.

[0122] That is, the first input connection terminal P1, the second input connection terminal P2, the first output connection terminal P3, the second output connection terminal P4, the first resistor R1, the second resistor R2, and the power supply VCC constitute a test unit 12. When the input and output terminals of the optocoupler are connected to the respective input and output connection terminals, the main control module, the test unit 12, and the optocoupler form a closed loop, thereby enabling performance testing of the optocoupler.

[0123] In one embodiment of this application, the base 11 is provided with multiple test units 12 to enable simultaneous testing of multiple optocouplers, or to test optocouplers with different packaging structures. For example, the base 11 is provided with two test units 12 with identical structures, which can simultaneously test two optocouplers corresponding to the structures of the two test units 12, or test an optocoupler package containing two optocoupler units corresponding to the structures of the two test units 12.

[0124] In one embodiment of this application, a plurality of test units 12 are provided on the base 11, including two types of test units with different structures. For ease of description, these two types of test units with different structures are respectively named the first test unit 12a and the second test unit 12b.

[0125] In this first test unit 12a, the first input connection terminal P1 and the second input connection terminal P2 are located on the same side, while the first output connection terminal P3 and the second output connection terminal P4 are located on the opposite side. Furthermore, the first input connection terminal P1 and the first output connection terminal P3 are positioned opposite each other, and the second input connection terminal P2 and the second output connection terminal P4 are positioned opposite each other. That is, this first test unit 12a is suitable for testing optocouplers with a package structure where the light source and the light receiver are directly opposite each other.

[0126] The first input connection terminal P1 and the second input connection terminal P2 of the second test unit 12b are located on the same side, while the first output connection terminal P3 and the second output connection terminal P4 are located on the opposite side. Furthermore, the positions of the first input connection terminal P1 and the first output connection terminal P3 are offset, and the positions of the second input connection terminal P2 and the second output terminal P4 are also offset. That is, the second test unit 12b is suitable for testing optocouplers with a package structure where the light source and the light receiver are offset.

[0127] Furthermore, the second test unit 12b also has a power connection terminal P5, which is connected to a power source. That is, the second test unit 12b is suitable for testing optocouplers that require an additional power supply.

[0128] In addition, the second test unit 12b is also provided with some reserved connection terminals X.

[0129] See Figure 13 As shown, in one embodiment of this application, four first test units 12a and two second test units 12b are provided on the base 11. The four first test units 12a and two second test units 12b are disposed on the same surface of the base 11, and the four first test units 12a are disposed on one side of the base 11, with equidistant distances between adjacent first test units 12a. The two second test units 12b are disposed on the other side of the base 11. With this design, this application can be applied to the testing of optocouplers with various packaging structures. For example, the four first test units 12a can be applied to the testing of optocoupler packages containing one to four optocoupler units with photodetectors positioned opposite each other; the two second test units 12b can be applied to the testing of optocoupler packages containing one to two optocoupler units with photodetectors positioned offset from each other.

[0130] The main control module is electrically connected to each test unit 12 and is configured to execute all or part of the steps of the optocoupler performance test method.

[0131] See Figure 11As shown in one embodiment of this application, the main control module includes a microcontroller 14, a digital-to-analog converter (DAC) unit 15, and an analog-to-digital converter (ADC) unit 16. The microcontroller 14 is configured to execute all or part of the steps of the optocoupler performance testing method. The DAC unit 15 is connected to the output of the microcontroller 14 and is used to convert the digital input voltage output by the microcontroller 14 into an analog quantity to be applied to the input of the optocoupler. The ADC unit 16 is connected to the input of the microcontroller 14 and is used to convert the acquired analog response voltage into a digital quantity and input it to the microcontroller 14.

[0132] Furthermore, the optocoupler performance testing system also includes an analog multiplexing unit 17, which is connected between the digital-to-analog conversion unit 15 and multiple test units 12. It is used to selectively connect or disconnect the connection loop between the main control module and each test unit 12, thereby selectively testing one or some optocouplers.

[0133] That is, the optocoupler performance testing system includes a base 11, a microcontroller 14, a digital-to-analog converter (DAC) unit 15, an analog multiplexing unit 17, multiple test units 12, and an analog-to-digital converter (ADC) unit 16. The microcontroller 14, DAC 15, analog multiplexing unit 17, multiple test units 12, and ADC unit 16 are all mounted on the base 11. The output of the microcontroller 14 is connected to the input of the DAC 15, the output of the DAC 15 is connected to the analog multiplexing unit 17, the analog multiplexing unit 17 is connected to the input of the multiple test units 12, and the ADC unit 16 is connected between the input of the microcontroller 14 and the output of the multiple test units 12.

[0134] The working process of the optocoupler performance testing system in one embodiment of this application is described below.

[0135] The microcontroller 14 outputs a gradually increasing input voltage, which is applied to the input terminal of the optocoupler through DA_1 / DA_2 / DA_3 / DA_4 / DA_5 / DA_6. The response voltage of the optocoupler's output terminal under different input voltages is obtained through AD_1 / AD_2 / AD_3 / AD_4 / AD_5 / AD_6. The input voltage when the ratio of the difference between the two response voltages to the difference between the corresponding input voltages drops to tan40° is recorded as the operating voltage of the optocoupler.

[0136] The operating voltage obtained from the output of the microcontroller 14 is applied to the input terminal of the optocoupler through DA_1 / DA_2 / DA_3 / DA_4 / DA_5 / DA_6. At the same time, its integrated timing unit is started, and the response voltage of the output terminal of the optocoupler at different times is obtained through AD_1 / AD_2 / AD_3 / AD_4 / AD_5 / AD_6. Timing stops when the ratio of the difference between two response voltages to the difference of the sampling time corresponding to the two response voltages drops to tan10°. This time is recorded as the conduction response time of the optocoupler.

[0137] The operating voltage obtained from the output of the microcontroller 14 is applied to the input terminal of the optocoupler through DA_1 / DA_2 / DA_3 / DA_4 / DA_5 / DA_6, and the response voltage of the output terminal of the optocoupler is obtained through AD_1 / AD_2 / AD_3 / AD_4 / AD_5 / AD_6. After the response voltage of the output terminal of the optocoupler reaches the rated output voltage value, the variance of the response voltage at multiple moments is calculated to obtain the stability of the response voltage of the optocoupler.

[0138] When the microcontroller 14 stops outputting the operating voltage, no voltage is applied to the input terminal of the optocoupler. At the same time, the timing unit is started, and the response voltage of the output terminal of the optocoupler at different times is obtained through AD_1 / AD_2 / AD_3 / AD_4 / AD_5 / AD_6. The timing stops when the response voltage is zero, and the time is recorded as the turn-off response time of the optocoupler.

[0139] In one embodiment of this application, see [link to embodiment]. Figure 11 The optocoupler testing system further includes a display unit 18, which is connected to the output of the microcontroller 14. The display unit 18 can be mounted on the base 11 to display the test status, such as normal test, test completed, and other status information. It can also further display the response voltage curve generated by the microcontroller 14.

[0140] Of course, the display unit 18 can also be independent of the test socket and communicate with the microcontroller 14 via wired or wireless means to obtain and display the response voltage curve generated by the microcontroller 14, as well as display the test status, etc. The display unit 18 can be, for example, an electronic device such as a laptop or desktop computer.

[0141] See Figure 14 As shown, this embodiment provides an electronic device 200, which includes one or more processors 201 and a memory 202. The memory 202 is used to store one or more programs. When one or more programs are executed by one or more processors 201, the processors 201 implement the optocoupler performance testing method of this application.

[0142] The specific manner in which the processor of the electronic device performs operations in this embodiment has been described in detail in the embodiments concerning the performance testing method of optocouplers, and will not be elaborated upon here.

[0143] In detail, a processor may include one or more processing units, such as two CPUs. As one embodiment, an electronic device may include multiple processors, such as two processors. Each CPU in these processors may be a single-core processor or a multi-core processor. Understandably, a processor may refer to one or more devices, circuits, and / or processing cores used to process data (e.g., computer program instructions).

[0144] The memory may be a read-only memory (ROM) or other type of static storage device capable of storing static information and instructions, random access memory (RAM) or other type of dynamic storage device capable of storing information and instructions, or electrically erasable programmable read-only memory (EEPROM), compact disc read-only memory (CD-ROM) or other optical disc storage, optical disc storage (including compressed optical discs, laser discs, optical discs, digital universal optical discs, Blu-ray discs, etc.), magnetic disk storage media or other magnetic storage devices, or any other medium capable of carrying or storing desired program code in the form of instructions or data structures and accessible by a computer, but not limited thereto.

[0145] Understandably, memory can exist independently and be connected to the processor via a bus. Alternatively, memory can be integrated with the processor.

[0146] In one exemplary embodiment, a memory is provided for storing computer execution instructions corresponding to the software program of this application. A processor can implement various functions of an electronic device by running or executing the software program stored in the memory.

[0147] One embodiment of this application also provides a storage medium, which is a computer-readable storage medium, such as a temporary or non-temporary computer-readable storage medium containing instructions. The storage medium stores computer-readable instructions, which, when executed by a computer's processor, cause the computer to perform the aforementioned optocoupler performance testing method.

[0148] An embodiment of this application also provides a computer program product that can be directly loaded into a memory and contains software code. After being loaded and executed by a computer, the computer program product can implement the optocoupler performance testing method provided in the above embodiment.

[0149] Those skilled in the art will recognize that, in one or more of the examples above, the functions described in this application can be implemented using hardware, software, firmware, or any combination thereof. When implemented in software, these functions can be stored in a computer-readable storage medium or transmitted as one or more instructions or code on a computer-readable storage medium.

[0150] Through the above description of the embodiments, those skilled in the art can clearly understand that, for the sake of convenience and brevity, only the division of the above functional modules is used as an example. In actual applications, the above functions can be assigned to different functional modules as needed, that is, the internal structure of the device can be divided into different functional modules to complete all or part of the functions described above.

[0151] In the several embodiments provided in this application, it should be understood that the disclosed apparatus and methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative; for instance, the modular division is only a logical functional division, and other division methods may exist in actual implementation. For example, multiple units or components may be combined or integrated into another apparatus, or some features may be ignored or not executed.

[0152] It should be understood that this application is not limited to the precise structures described above and shown in the accompanying drawings, and various modifications and changes can be made without departing from its scope. The scope of this application is limited only by the appended claims.

Claims

1. A method for testing the performance of an optocoupler, characterized in that, include: An increasing input voltage is applied to the input terminal of the optocoupler, the response voltage at the output terminal of the optocoupler is obtained, and the operating voltage of the optocoupler is determined based on the response voltage. Applying the operating voltage to the input terminal of the optocoupler to obtain the optocoupler's turn-on response time, turn-off response time, and response voltage stability includes: The operating voltage is applied to the input terminal of the optocoupler, and the response time required for the response voltage at the output terminal of the optocoupler to rise to the first voltage is obtained, which is taken as the conduction response time. After the response voltage at the output terminal of the optocoupler reaches the rated output voltage value, the response voltage at the output terminal of the optocoupler at multiple times is obtained, and the response voltage stability of the optocoupler is determined based on the response voltage at the multiple times. Stop applying the operating voltage to the input terminal of the optocoupler, and obtain the response time required for the response voltage at the output terminal of the optocoupler to drop to the second voltage, as the turn-off response time.

2. The method for testing the performance of an optocoupler according to claim 1, characterized in that, Determining the response voltage stability of the optocoupler based on the response voltage at the plurality of times includes: Obtain the variance of the response voltage at the multiple time points; The response voltage stability of the optocoupler is determined based on the variance.

3. The method for testing the performance of an optocoupler according to claim 1, characterized in that, The operating voltage is the input voltage when the ratio of the difference between the two response voltages at the output terminal of the optocoupler to the difference in the input voltage corresponding to the two response voltages drops to tan40°. And / or, The first voltage is the response voltage when the ratio of the difference between the two response voltages at the output terminal of the optocoupler to the sampling time difference corresponding to the two response voltages drops to tan10°. And / or, The second voltage is zero.

4. The optocoupler performance testing method according to claim 1, characterized in that, Also includes: Plot a voltage curve characterizing the change of the response voltage at the output terminal of the optocoupler with the gradually increasing input voltage; And / or, Plot the voltage curve of the response voltage at the output terminal of the optocoupler as a function of time when the operating voltage is applied to the input terminal of the optocoupler; And / or, Plot the voltage curve of the response voltage at the output of the optocoupler as a function of time when the operating voltage is stopped from being applied to the input of the optocoupler.

5. A performance testing system for optocouplers, characterized in that, include: Test socket, used to connect optocouplers; The main control module, electrically connected to the test socket, is configured to perform the optocoupler performance test method as described in any one of claims 1 to 4.

6. The optocoupler performance testing system according to claim 5, characterized in that, The test socket includes: seat body; Multiple test units are arranged on the base. Each test unit has a first input connection terminal, a second input connection terminal, a first output connection terminal, and a second output connection terminal. The first input connection terminal is electrically connected to the main control module. The second input connection terminal is connected in series with a first resistor, the other end of which is grounded. The first output connection terminal is connected in series with a second resistor, the other end of which is connected to a power supply. The second output connection terminal is electrically connected to the main control module.

7. The optocoupler performance testing system according to claim 6, characterized in that, The plurality of test units include: The first test unit has its first input connection terminal and second input connection terminal positioned opposite to its first output connection terminal and second output connection terminal. The second test unit has a first input connection terminal, a second input connection terminal, a first output connection terminal, and a second output connection terminal that are offset from each other. The second test unit also has a power connection terminal that is connected to a power source. The optocoupler performance testing system also includes: An analog multiplexing unit is connected between the main control module and the plurality of test units, and is used to selectively connect or disconnect the connection loop between the main control module and each of the test units.

8. An electronic device, characterized in that, include: One or more processors; A memory for storing one or more computer programs, which, when executed by one or more processors, cause the processors to implement the optocoupler performance testing method as described in any one of claims 1 to 4.

9. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores computer-readable instructions that, when executed by a computer's processor, cause the computer to perform the optocoupler performance testing method as described in any one of claims 1 to 4.

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