Method and system for improving the rate of discovery of latent defects in display manufacturing processes

Abstract

The application discloses a method and system for improving the discovery rate of hidden defects in the display manufacturing process. The display includes a display panel and an array of backlight sources. The method includes a first detection method, which involves lighting up the display panel and presenting red, blue, and green three-stage images on the display panel that are separated from each other. The refresh frequency of the three-stage images is controlled to reach a detection frequency that is close to the upper limit that the display panel can withstand, and the three-stage images are maintained at this detection frequency for a predetermined time period. The above technical method provides a method for detecting hidden defects in the display panel at each work station during the manufacturing process. It can quickly trigger functional hidden defects such as vertical lines on the display panel, improve the discovery rate of hidden defects on the display panel, avoid defective products remaining in subsequent work stations or after-sales, and improve user experience with the product.

Description

Technical Field

[0001] This invention relates to the field of display manufacturing process inspection technology, and in particular to a method and system for improving the detection rate of latent defects in the display manufacturing process. Background Technology

[0002] LCD displays are widely used in various electronic devices, such as mobile phones and tablets. Figure 3 The liquid crystal display (LCM) has a multi-layered structure, consisting of, from top to bottom: cover plate, upper polarizer, LCD (display panel), lower polarizer, and backlight. The LCM manufacturing process is relatively complex, generally including cutting, mounting, circuit board assembly, and module assembly. To ensure process quality, inspection processes need to be added at each workstation to identify defective products promptly, preventing them from flowing to subsequent workstations and wasting manpower and materials. Currently, such as... Figure 4 The inspection procedures applied in each workstation include the following 12 illumination inspections: 1. Black screen inspection (targets: bright spots, starry sky, cell foreign objects, yellowing, bluing, murmur); 2. Gray L64 screen inspection (targets: murmur, poor wiring, foreign objects, dirt); 3. Gray L128 screen inspection (murmur, poor wiring, foreign objects, dirt); 4. White screen inspection (targets: dark spots, foreign objects, dirt, yellow spots); 5. Red screen inspection (targets: bright spots, dark spots, cell foreign objects, poor wiring); 6. Green screen inspection (targets: bright spots, dark spots, cell foreign objects, poor wiring); 7. Black screen inspection (targets: bright spots, dark spots, cell foreign objects, poor wiring); 8. White screen inspection (targets: dark spots, foreign objects, yellowing, yellowing); 9. Red screen inspection (targets: bright spots, dark spots, cell foreign objects, poor wiring); 10. Green screen inspection (targets: bright spots, dark spots, cell foreign objects, poor wiring); 11. Black screen inspection (targets: bright spots, poor wiring, foreign objects, yellowing, yellowing, bluish, yellowing); 12. Gray L64 screen inspection (targets: dark spots, poor wiring, foreign objects, yellowing, yellowing, bluish, yellowing); 13. Gray L128 screen inspection (targets: dark spots, poor wiring, foreign objects, yellowing, yellowing, bluish, yellowing); 14. Gray L128 screen inspection (targets: dark spots, poor wiring, foreign objects, yellowing, yellowing, bluish, yellowing); 15. Gray L128 screen inspection (targets: dark spots, poor wiring, foreign objects, yellowing, yellowing, bluish, yellowing); 16. Gray L128 screen inspection (targets: dark spots, poor wiring, foreign objects, yellowing, yellowing, bluish, yellowing); 17. Gray L128 screen inspection (targets: dark spots, poor wiring, foreign objects, poor wiring); 18. Gray L128 screen inspection The targets are: bright spots, dark spots, foreign objects in the cell, and poor lines; 7. Blue screen (the targets are: bright spots, dark spots, foreign objects in the cell, and poor lines); 8. Black flashing screen (the targets are: bright spots, colored dots, and poor lines); 9. White on top and black on the bottom screen (poor lines, abnormalities, horizontal stripes, bright spots, and colored dots); 10. Black on top and white on the bottom screen (poor lines, abnormalities, horizontal stripes, bright spots, and colored dots); 11. Venetian blind forward scan (the targets are: poor lines, abnormalities, and horizontal stripes); 12. Venetian blind reverse scan (the targets are: poor lines, abnormalities, and horizontal stripes).

[0003] Although the above-mentioned testing items are numerous, some latent defects still go undetected. For example, when a micro-short circuit occurs between the data line and signal line in the display board, a large capacitance is formed between them. This is not easily detected by the above testing items, resulting in functional defects such as vertical lines leaking into subsequent workstations in various manufacturing processes, wasting a lot of manpower and materials. In addition, some latent defects will be triggered when the product ages, but due to cost and capacity limitations in the mass production stage, 100% aging testing is not possible, so some defects will flow to after-sales service.

[0004] In summary, it is necessary to detect hidden defects in the display manufacturing process. Summary of the Invention

[0005] The purpose of this invention is to provide a method and system for effectively detecting latent defects during the display manufacturing process to prevent defective products from flowing to subsequent workstations or after-sales service, thereby improving the detection rate of latent defects in the display manufacturing process.

[0006] To achieve the above objectives, this invention discloses a method for improving the detection rate of latent defects in the manufacturing process of a display, wherein the display includes a display panel and backlights arranged in an array, and the method includes a first detection method, the first detection method comprising:

[0007] The display panel is turned on, and three separate red, blue, and green images are displayed on the display panel.

[0008] The refresh rate of the three-dimensional image is controlled to reach the detection frequency, which is close to the upper limit that the display panel can withstand, and the three-dimensional image is controlled to remain at the detection frequency for a preset duration.

[0009] Preferably, the refresh rate of the three-dimensional image is controlled to gradually increase to the detection frequency by a preset increment.

[0010] Preferably, the third-order image is maintained at the detection frequency for 3 to 5 seconds.

[0011] Preferably, the method further includes a second detection method, the second detection method comprising:

[0012] The display panel is turned on, and a grayscale image is displayed on the display panel;

[0013] The transmission frame rate of the grayscale image is controlled to reach the detection frame rate, which is N times the working frame rate of the display panel, 1 / 2B≤N≤B, where B is the number of rows of the backlights arranged in an array on the display panel.

[0014] And control the grayscale image to remain at the detection frame rate for a preset duration.

[0015] Preferably, the grayscale image is maintained at the detection frame rate for 3-5 seconds, and B = 1512.

[0016] Preferably, the manufacturing process of the display includes a cutting process, a bonding process, a circuit board assembly process, and a module assembly process. The cutting process is used to cut and form a single display panel, the bonding process is used to bond a polarizer to the display panel, the circuit board assembly process is used to connect ribbon cables to the display panel, and the module assembly process is used to assemble the display.

[0017] In the cutting process and / or the attaching process, the display panel is inspected using the first detection method.

[0018] Preferably, in the circuit board assembly process and / or the module assembly process, the display board is tested by the first detection method and the second detection method successively.

[0019] The present invention also discloses a system for improving the detection rate of latent defects in the manufacturing process of a display, the display including a display panel and a backlight arranged in an array, characterized in that the system detects the display panel based on the above-described method.

[0020] This invention also discloses a system for improving the detection rate of latent defects in the display manufacturing process, comprising:

[0021] One or more processors;

[0022] Memory;

[0023] And one or more programs, wherein the one or more programs are stored in the memory and configured to be executed by the one or more processors, the programs including instructions for performing the methods described above for improving the detection rate of latent defects in the display manufacturing process.

[0024] The present invention also discloses a computer-readable storage medium comprising a computer program that can be executed by a processor to perform the method described above for improving the detection rate of latent defects in the display manufacturing process.

[0025] Compared with the prior art, the above-mentioned technical solution of the present invention provides a method for detecting latent defects of display panels in various workstations during the manufacturing process of a display. Specifically, when the display panel is lit up, the display panel is controlled to be in an RGB three-level display state, and the refresh rate of the display panel is adjusted to the maximum, thereby quickly activating functional latent defects such as vertical lines on the display panel, so as to improve the detection rate of latent defects on the display panel, avoid defective products from being left in subsequent workstations or after-sales service, and improve the user's experience of using the product. Attached Figure Description

[0026] Figure 1 This is an RGB three-level image displayed on the display panel based on the first detection method in an embodiment of the present invention.

[0027] Figure 2 This is a grayscale image displayed on the display panel based on the second detection method in an embodiment of the present invention.

[0028] Figure 3 This is a process flow diagram of the display in an embodiment of the present invention.

[0029] Figure 4 This is a test screen image used in the prior art for testing display panels. Detailed Implementation

[0030] To illustrate the technical content, structural features, objectives, and effects of the present invention in detail, the following description is provided in conjunction with the embodiments and accompanying drawings.

[0031] This embodiment provides a method for improving the detection rate of latent defects during the display manufacturing process, to detect latent defects that are difficult to detect through traditional detection methods. The display in this embodiment is an LCD display, but it can also be an LED display, so it is not limited thereto. Specifically, the display includes a display panel and backlights arranged in an array.

[0032] This embodiment provides a first detection method for detecting semi-finished products at various workstations in the display manufacturing process. The first detection method includes:

[0033] First, such as Figure 1 The display panel is lit up, and three separate red, blue, and green images, or RGB three-level images, are displayed on the display panel.

[0034] Then, the refresh rate of the three-dimensional image is controlled to reach the detection frequency, which is close to the upper limit that the display panel can withstand. The three-dimensional image is controlled to be maintained at the detection frequency for a preset time. If the three-dimensional image shows an abnormality within the preset time, such as vertical lines or grid lines, it indicates that the current display panel is defective.

[0035] It should be noted that the detection frequency in this embodiment is close to the upper limit that the display panel can withstand, which means that the detection frequency is greater than or equal to 90% of the upper limit that the display panel can withstand.

[0036] The principle of the first detection method in this embodiment for detecting latent defects in the display panel is as follows:

[0037] For most latent defects, their characteristics are not easily apparent when the display panel is in normal working condition. However, when the display panel is adjusted to a special state, the latent defects can be quickly activated and detected. For example, when a micro-short circuit occurs between the data line and the signal line in the display panel, a capacitor C with a large capacitance is formed between them. The capacitive reactance is Xc = 1 / (2π*f*C), where f is the signal frequency across capacitor C. It can be seen that increasing the signal frequency on the display panel can reduce the capacitive reactance, thereby increasing the current value at the micro-short circuit location and accelerating the deterioration of the micro-short circuit point, thus accelerating the appearance of the defect. Therefore, in this embodiment, the refresh rate of the third-order screen is adjusted to the maximum value to quickly activate the latent defects on the display panel.

[0038] On the other hand, after the display panel is turned on, the refresh rate of the three-level screen is gradually increased to the detection frequency by a preset range, which can detect more hidden defects.

[0039] In addition, the third-order image is controlled to remain at the detection frequency for 3 to 5 seconds.

[0040] Another embodiment of the present invention also provides a second detection method for detecting semi-finished or finished products at various workstations in the display manufacturing process. This second detection method includes:

[0041] First, such as Figure 2 The display panel is turned on, and a grayscale image is displayed on the display panel;

[0042] Then, the transmission frame rate of the grayscale image is controlled to reach the detection frame rate, which is N times the operating frame rate of the display panel, where 1 / 2B≤N≤B, and B is the number of rows of the backlights arranged in an array on the display panel. The grayscale image is then controlled to remain at this detection frame rate for a preset duration. In this embodiment, the grayscale image is controlled to remain at this detection frame rate for 3–5 seconds, and B = 1512. Furthermore, since the operating frame rate of the display panel is 60Hz, the detection frame rate is 60*1512Hz.

[0043] The detection principle of the second detection method in this embodiment is similar to that of the first detection method. By significantly increasing the transmission frame rate of the display panel in grayscale, latent defects can be quickly activated, thereby improving the detection rate of latent defects.

[0044] On the other hand, such as Figure 3 The manufacturing process of a display includes a cutting process, a bonding process, a circuit board assembly process, and a module assembly process. The cutting process is used to cut and form a single display panel, the bonding process is used to attach a polarizer to the display panel, the circuit board assembly process is used to connect the ribbon cable to the display panel, and the module assembly process is used to assemble the display into a complete form.

[0045] When using the first and second detection methods described above to detect latent defects in each process of the display manufacturing process, the display panel is inspected using the first detection method during the cutting and / or bonding processes. During the circuit board assembly and / or module assembly processes, the display panel is inspected using both the first and second detection methods sequentially.

[0046] In summary, the above embodiments provide a method for detecting latent defects in the display panels of various workstations during the manufacturing process. Specifically, when the display panel is powered on, it is controlled to display either an RGB three-level image or a grayscale image. When in RGB three-level display mode, the refresh rate of the display panel is adjusted to the maximum; when in grayscale display mode, the frame rate is adjusted to the maximum. This quickly detects latent defects such as vertical lines on the display panel, improving the detection rate of latent defects, preventing defective products from remaining in subsequent workstations or after-sales service, and enhancing the user experience.

[0047] In another preferred embodiment of the present invention, a system for improving the detection rate of latent defects in the manufacturing process of a display is also disclosed. The display includes a display panel and a backlight arranged in an array. The system detects the display panel based on the method provided in the above embodiments.

[0048] This invention also discloses another system for improving the detection rate of latent defects in display manufacturing processes. The system includes one or more processors, a memory, and one or more programs, wherein the one or more programs are stored in the memory and configured to be executed by the one or more processors. The programs include instructions for performing the first and second detection methods disclosed in the above embodiments. The processors may be general-purpose central processing units (CPUs), microprocessors, application-specific integrated circuits (ASICs), or one or more integrated circuits, used to execute the relevant programs to perform the first and second detection methods of the embodiments of this application.

[0049] The present invention also discloses a computer-readable storage medium comprising a computer program, which can be executed by a processor to perform the first and second detection methods described above. The computer-readable storage medium can be any available medium accessible to a computer or a data storage device such as a server or data center integrating one or more available media. The available medium can be read-only memory (ROM), random access memory (RAM), or magnetic media, such as floppy disks, hard disks, magnetic tapes, magnetic disks, or optical media, such as digital versatile discs (DVDs), or semiconductor media, such as solid-state disks (SSDs).

[0050] This application also discloses a computer program product or computer program, which includes computer instructions stored in a computer-readable storage medium. The processor of an electronic device reads the computer instructions from the computer-readable storage medium and executes the computer instructions, causing the electronic device to perform the first and second detection methods described above.

[0051] The above-disclosed embodiments are merely preferred embodiments of the present invention and should not be construed as limiting the scope of the present invention. Therefore, any equivalent variations made in accordance with the claims of the present invention are still within the scope of the present invention.

Claims

1. A method for improving the detection rate of latent defects in the manufacturing process of a display, the display comprising a display panel and backlights arranged in an array, characterized in that, The method includes a first detection method, the first detection method comprising: The display panel is turned on, and three separate red, blue, and green images are displayed on the display panel. The refresh rate of the three-level image is controlled to reach the detection frequency, which is greater than or equal to 90% of the upper limit that the display panel can withstand, and the three-level image is controlled to remain at the detection frequency for a preset duration.

2. The method for improving the detection rate of latent defects in the display manufacturing process according to claim 1, characterized in that, The refresh rate of the three-level image is controlled to gradually increase to the detection frequency by a preset increment.

3. The method for improving the detection rate of latent defects in the display manufacturing process according to claim 1, characterized in that, The third-order image is controlled to remain at the detection frequency for 3 to 5 seconds.

4. The method for improving the detection rate of latent defects in the display manufacturing process according to claim 1, characterized in that, The method further includes a second detection method, the second detection method comprising: The display panel is turned on, and a grayscale image is displayed on the display panel; The transmission frame rate of the grayscale image is controlled to reach the detection frame rate, which is N times the working frame rate of the display panel, 1 / 2B≤N≤B, where B is the number of rows of the backlights arranged in an array on the display panel. And control the grayscale image to remain at the detection frame rate for a preset duration.

5. The method for improving the detection rate of latent defects in the display manufacturing process according to claim 4, characterized in that, The grayscale image is controlled to remain at the detection frame rate for 3-5 seconds, with B=1512.

6. The method for improving the detection rate of latent defects in the display manufacturing process according to claim 1, characterized in that, The manufacturing process of the display includes a cutting process, a bonding process, a circuit board assembly process, and a module assembly process. The cutting process is used to cut and form a single display panel. The bonding process is used to bond a polarizer to the display panel. The circuit board assembly process is used to connect the ribbon cable to the display panel. The module assembly process is used to assemble the display. In the cutting process and / or the attaching process, the display panel is inspected using the first detection method.

7. The method for improving the detection rate of latent defects in the display manufacturing process according to claim 6, characterized in that, The method further includes a second detection method, the second detection method comprising: The display panel is turned on, and a grayscale image is displayed on the display panel; The transmission frame rate of the grayscale image is controlled to reach the detection frame rate, which is N times the working frame rate of the display panel, 1 / 2B≤N≤B, where B is the number of rows of the backlights arranged in an array on the display panel. And control the grayscale image to remain at the detection frame rate for a preset duration; In the circuit board assembly process and / or the module assembly process, the display board is tested successively by the first detection method and the second detection method.

8. A system for improving the detection rate of latent defects in the manufacturing process of a display, the display comprising a display panel and backlights arranged in an array, characterized in that, The system detects the display panel based on the method described in any one of claims 1 to 7.

9. A system for improving the detection rate of latent defects in the manufacturing process of displays, characterized in that, include: One or more processors; Memory; And one or more programs, wherein the one or more programs are stored in the memory and configured to be executed by the one or more processors, the programs including instructions for performing the method for improving the detection rate of latent defects in the display manufacturing process as described in any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that, Includes a computer program that can be executed by a processor to perform the method for improving the detection rate of latent defects in the display manufacturing process as described in any one of claims 1 to 7.

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