Hyperspectral imaging device and method based on fourier-on-flip for spectral multiplexing

Abstract

The application discloses a hyperspectral imaging device and method based on Fourier superposition microscopy of spectral multiplexing, and relates to the field of microscopic imaging. The device is composed of a halogen lamp, a beam splitter, a filter, a total reflection prism, a beam combiner, a reflector, a sample to be measured, an x-y plane plate, a microscopic objective, a pupil aperture, a sleeve objective and a CMOS camera. The spectral multiplexing illumination device is coupled with light of different wave bands as a light source to irradiate the sample, and a series of incoherent mixed state low-resolution intensity images are acquired by the CMOS camera. The above images are decoupled and recovered based on a phase recovery Fourier superposition algorithm of spectral multiplexing, a series of discrete spectral images are acquired, an interpolation algorithm is used to interpolate the series of discrete spectral images, and an image with a large field of view, high spatial and high spectral resolution is reconstructed. The device provided by the application can couple multiple beams of known wavelength light, and the low-resolution image captured by the CMOS camera contains spectral information of multiple accurate wavelengths.

Description

Technical Field

[0001] This application relates to the field of microscopic imaging technology, and in particular to a hyperspectral imaging device and method based on Fourier stacked microscopy with spectral multiplexing. Background Technology

[0002] In biomedical fields such as digital pathology and hematology, the demand for examining pathological cells using microscopes is increasing. To obtain more information about biological tissues, optical microscopy is pursuing high spectral resolution, high spatial resolution, and a large field of view. However, a large field of view and high resolution have always been a difficult contradiction to reconcile. Fourier ptychographic microscopy (FPM) is an emerging computational imaging technique that effectively solves the problem of the incompatibility between resolution and field of view in traditional microscopy. This technique combines the concepts of phase retrieval and synthetic aperture. Low-resolution images of samples under different lighting angles are acquired on the microscope platform. These low-resolution images from different angles correspond to different sample spectral information in the frequency domain. Then, using the concepts of phase retrieval and synthetic aperture, this series of low-resolution images is iterated in the frequency domain, expanding the frequency domain to ultimately recover a high-resolution image of the sample with a large field of view.

[0003] However, achieving high-resolution acquisition of spectral dimensional information while maintaining a large field of view and spatial resolution is a key factor driving the acquisition of high-dimensional information in optical microscopy. In traditional Fourier stacked imaging systems, narrow-band LED lights are typically used as illumination sources to acquire low-resolution images. The reconstructed images only reflect sample information in a specific band, resulting in the loss of spectral information. In 2022, Zhang P et al. proposed a hyperspectral image reconstruction strategy based on the FPM system [Zhang P, Zhao J, Lin B, et al. Hyperspectral microscopy imaging based on Fourier ptychographic microscopy[J]. Journal of Optics, 2022, 24(5): 055301.], which can obtain images containing spectral information. However, it requires multiple acquisitions of samples with a single band illumination and reconstruction, resulting in low efficiency and high time cost. Summary of the Invention

[0004] Based on this, this application provides a hyperspectral imaging device and method based on Fourier multiplication for Fourier multiplication microscopy to solve the problem of spectral information loss in Fourier multiplication microscopy imaging technology and to address the high requirements for professional knowledge of imaging results in practical applications.

[0005] This application provides a hyperspectral imaging device based on Fourier layered microscopy with spectral multiplexing, including:

[0006] A horizontal assembly includes a halogen lamp, a beam splitter, a filter, a prism, a beam combiner, and a reflector. The halogen lamp is disposed on one side of the beam splitter, the filter is disposed on the other side of the beam splitter, the beam combiner is disposed between the prism and the reflector, and the filter is disposed on the other side of the prism.

[0007] The vertical assembly includes an xy-plane plate, a sample to be tested, a microscope objective, a pupil aperture, a sleeve lens, and a CMOS camera. The microscope objective is located on top of the sample to be tested, and the xy-plane plate is located at the bottom of the sample to be tested. The pupil aperture is located on top of the microscope objective, and the sleeve lens is located on top of the pupil aperture. The CMOS camera is located on top of the sleeve lens. The outgoing light beam reflected by the mirror passes through a small hole located on the xy-plane plate.

[0008] The halogen lamp emits broadband white light. The center of the beam emitted from the beam splitter coincides with the center of the filter and the center of the beam combiner. The center of the beam emitted after reflection by the mirror coincides with the center of the microscope objective, the pupil aperture, and the sleeve lens.

[0009] This application also provides a hyperspectral imaging method based on Fourier layered microscopy using spectral multiplexing, including:

[0010] The sample is illuminated by a spectral multiplexing illumination device coupled with light of different wavelengths, and the CMOS camera acquires a series of incoherent mixed-state low-resolution intensity images through a Fourier stacked microscopy imaging system.

[0011] The phase retrieval Fourier stack algorithm based on spectral multiplexing is used to decouple and then recover the series of incoherent mixed-state low-resolution intensity images to obtain images with high spatial resolution and large field of view that include the original accurate wavelength spectral information.

[0012] By changing filters of different wavelengths and iterating in a loop, a series of discrete spectral images can be obtained.

[0013] Interpolation algorithms are used to interpolate the series of discrete spectral images to reconstruct images with a large field of view, high spatial and spectral resolution.

[0014] The spectral multiplexing illumination device can expand the optical path, and the number of filters can be several, allowing more wavelengths of light to be coupled at once.

[0015] The imaging steps for the series of incoherent mixed-state low-resolution intensity images include:

[0016] The outgoing light from the spectral multiplexing illumination system propagates to the sample plane of the Fourier stacked microscopy system. The outgoing light passes through the xy plane plate with a small hole in the middle, so that the incident beam containing mixed spectral information illuminates the sample. The light wave illuminating the sample is represented by the spatial function O(x,y), and x and y together constitute the sample plane.

[0017] The light emitted from the sample enters the microscope objective, pupil aperture, and sleeve lens sequentially. When the emitted light reaches the CMOS camera, a series of incoherent mixed-state low-resolution intensity images can be acquired. The calculation of this series of incoherent mixed-state low-resolution intensity images includes...

[0018] I m =|O m,fil (x,y)| 2

[0019] Among them, I m O represents the actual captured low-resolution intensity image. m,fil (x,y) represents the actual captured low-resolution intensity image.

[0020] The acquisition of high spatial resolution and large field-of-view images based on the original accurate wavelength spectral information includes,

[0021] Image intensity I based on target sample function h and wavelength incident plane wave An initial estimate of a target sample function O(x,y) is made, and the target sample function O(x,y) is used to generate low spatial resolution sample functions corresponding to different coherence states.

[0022] The calculation of the target sample function O(x,y) includes,

[0023]

[0024] Where O(x,y) represents the target sample function, I h The image intensity represents the target sample function. Indicates wavelength as The incident plane wave.

[0025] It also includes,

[0026] Incoherent mixing I is obtained based on the intensity component of the target sample. t Incoherent mixture I t The calculations include,

[0027] I t =I c1 +I c2

[0028] Among them, I c1 I represents the intensity component of the first wavelength in the incoherent mixed state. c2 This represents the intensity component of the second wavelength in the incoherent mixed state;

[0029] Using the intensity image I obtained from actual capture m Incoherent mixture I t And the intensity component I of the first wavelength in the incoherent mixed state c1 Update the intensity image of the target sample, and use the updated intensity image of the target sample to modify the estimated corresponding spectral region of the target sample;

[0030] The calculation of the updated intensity image of the target sample includes,

[0031]

[0032] Among them, I m I represents the actual captured low-resolution intensity image. t Indicates incoherent mixing, I c1 I represents the intensity component of the first wavelength in the incoherent mixed state. c ′1 represents the updated intensity image of the target sample;

[0033] The entire process is repeated for all captured low spatial resolution intensity images. Once all captured intensity images have been updated, it is considered an iteration cycle. This process is repeated until the final recovery algorithm converges, thus completing the decoupling recovery and reconstruction of the incoherent mixed-state image and obtaining the original accurate spectral wavelength spectrum.

[0034] The interpolation algorithm is a known cubic spline interpolation, specifically including:

[0035] The spectral curve generated from the spectral data has N segments, each segment is S(x), and a series of spectral data points are x0, x1, x2, ..., xn. N The value corresponding to each point is y0, y1, y2, ..., y N ;

[0036] Let S be a cubic polynomial i (x)=a i +b i (xx i )+c i (xx i ) 2 +d i (xx i ) 3 , where data point x i and xi+1 The interval curve is S i (x), a i b i c i d i All represent coefficients;

[0037] Relation Substituting into the cubic polynomial, we can obtain the relation satisfied by the coefficients;

[0038] Let S i "(x) = 0, and the interpolation value for each segment is obtained.

[0039] Beneficial Effects: Traditional Fourier layered microscopy uses a single narrow-band LED light source, and the reconstructed image only reflects sample information in a specific wavelength band. This invention, however, designs a novel hardware facility that utilizes a series of filters, prisms, and beam combiners to couple light of different wavelengths into a single beam to illuminate the sample. The captured low-resolution image contains spectral information of multiple precise wavelengths. After capturing the image using this device, a spectral multiplexing phase retrieval algorithm decouples the spectral image information containing incoherent mixed states, separating the original large-field-of-view, high spatial resolution images of different wavelength bands. Ultimately, a single reconstruction yields images with accurate spectral information in two wavelength bands, which is significantly more efficient than acquiring and reconstructing images of a single wavelength each time.

[0040] It should be understood that the description in this section is not intended to identify key or essential features of the embodiments of this application, nor is it intended to limit the scope of this application. Other features of this application will become readily apparent from the following description. Attached Figure Description

[0041] The accompanying drawings are provided for a better understanding of this solution and do not constitute a limitation of this application. Wherein:

[0042] Figure 1 This is a flowchart illustrating the specific operation of the method described in this application;

[0043] Figure 2 This is a simplified schematic diagram of the spectral multiplexing illumination optical path device proposed in this application;

[0044] Figure 3 This is a schematic diagram of the Fourier layered microscopy imaging device proposed in this application. Detailed Implementation

[0045] The following description, in conjunction with the accompanying drawings, illustrates exemplary embodiments of this application, including various details to aid understanding. These should be considered merely exemplary. Therefore, those skilled in the art will recognize that various changes and modifications can be made to the embodiments described herein without departing from the scope and spirit of this application. Similarly, for clarity and brevity, descriptions of well-known functions and structures are omitted in the following description.

[0046] Reference Figure 2 , 3 This application provides a hyperspectral imaging device based on Fourier stacked microscopy with spectral multiplexing, comprising:

[0047] The horizontal assembly 100 includes a halogen lamp 101, a beam splitter 102, a filter 103, a prism 104, a beam combiner 105, and a reflector 106. The halogen lamp 101 is disposed on one side of the beam splitter 102, and the filter 103 is disposed on the other side of the beam splitter 102. The beam combiner 105 is disposed between the prism 104 and the reflector 106, and the filter 103 is disposed on the other side of the prism 104.

[0048] The vertical assembly 200 includes an xy-plane plate 201, a sample under test 202, a microscope objective 203, a pupil aperture 204, a sleeve lens 205, and a CMOS camera 206. The microscope objective 203 is located on top of the sample under test 202, and the xy-plane plate 201 is located at the bottom of the sample under test 202. The pupil aperture 204 is located on top of the microscope objective 203, and the sleeve lens 205 is located on top of the pupil aperture 204. The CMOS camera 206 is located on top of the sleeve lens 205. The outgoing light beam reflected by the mirror 106 passes through a small hole provided on the xy-plane plate 201.

[0049] The halogen lamp 101 emits broadband white light. The center of the beam emitted from the beam splitter 102 coincides with the center of the filter 103 and the center of the beam combiner 105. The center of the beam emitted after being reflected by the mirror 106 coincides with the center of the microscope objective 203, the pupil aperture 204, and the sleeve lens 205.

[0050] Specifically, the centers of the two types of lens devices in the horizontal optical path coincide with the center of the beam; the center of the device in the vertical optical path reflected by mirror 106 coincides with the center of the beam, and filter 103 is a replaceable bandpass narrowband filter with a known wavelength.

[0051] Traditional Fourier layered microscopy uses a single narrow-band LED light as the illumination source, and the reconstructed image only reflects sample information in a specific wavelength band. However, this invention designs a new hardware facility that uses a series of filters 103, prisms 104, beam combiners 105, etc., to couple light of different wavelengths into a single light source to illuminate the sample. The captured low-resolution image can contain spectral information of multiple precise wavelengths.

[0052] The xy-plane plate 201 allows the incident light beam containing mixed-state spectral information to irradiate the sample. By controlling the small holes on the xy-plane plate 201, the sample can be moved to different positions on the xy-plane plate 201 to obtain incident light irradiating the sample at different angles.

[0053] Specifically, the xy-plane plate 201 is a movable plane plate. By controlling the movement of the xy-plane plate 201, the small holes on the xy-plane plate 201 are moved to different positions, which is equivalent to the incident light irradiating the sample at different angles, thereby achieving the purpose of scanning the sample information.

[0054] Reference Figure 1 This application also provides a hyperspectral imaging method based on Fourier stacked microscopy using spectral multiplexing, including:

[0055] S1: The sample is illuminated by a spectral multiplexing illumination device coupled with light of different wavelengths. The CMOS camera 206 acquires a series of incoherent mixed-state low-resolution intensity images through a Fourier layered microscopy imaging system. It should be noted that:

[0056] The spectral multiplexing illumination device can expand the optical path, and the number of filters 103 can be several, allowing more wavelengths of light to be coupled at once.

[0057] The following steps illustrate an imaging process using two replaceable filters:

[0058] S1-1: A halogen lamp 101 emits a light source, and a beam splitter 102 splits the light source into two beams, which pass through filters 103 of different wavelengths respectively.

[0059] S1-2: The direction of the two light beams is changed by the reflector 106 so that they are combined by the beam combiner 105.

[0060] S1-3: The outgoing light from the beam combiner 105 is re-injected into the reflector, so that the optical path parallel to the horizontal plane is aligned with the optical axis of the microscope objective 203.

[0061] The emitted light wave from the first filter 103a is denoted as e1(r), and the emitted light wave from the second filter 103b is denoted as e2(r). The total emitted light wave of the spectral multiplexing illumination system can be expressed as the linear superposition of the light intensities of the two filters, i.e., e1(r).m (r)=e c1 (r)+e c2 (r);

[0062] The small hole in the xy-plane plate 201 is used in the iterative algorithm with P. M (r) indicates that its main function is to restrict the range of light illumination. When light shines on the small aperture, only light within the aperture diameter can pass through, while light outside the aperture diameter cannot pass through. Therefore, the light passing through the small aperture is represented as U1 = P. M (r)·e m .

[0063] The xy-plane plate 201 is moved 9×9 positions. For each pair of filters used, 81 low-resolution intensity images are captured by a monochrome CMOS camera. The following steps are illustrated using the first pair of filters:

[0064] The outgoing wave U1 from the aperture propagates over a spatial distance to the surface of the sample under test. The incident wave is represented as U2 = PSF * U1. The sample under test is represented by the spatial function O(x,y). The incident wave interacts with the sample O(x,y) to produce the outgoing wave U3 = U2·O(x,y). Here, PSF is the point spread function, representing the propagation of light waves in space; "*" indicates convolution; and "·" indicates dot product.

[0065] The emitted wave U3 of the sample under test was subjected to Fourier transform through microscope objective 203;

[0066] The light waves passing through the microscope objective 203 are filtered by the pupil function P(x,y) of the pupil aperture 204, so the light waves passing through the pupil aperture 204 only contain the spectrum within the cutoff frequency range;

[0067] The light emitted from the pupil aperture 204 contains only the low-frequency spectral information. This light then undergoes a second Fourier transform via the sleeve lens 205. The light wave after passing through the sleeve lens 205 is denoted as O. m,fil (x,y);

[0068] The steps for imaging a series of incoherent mixed-state low-resolution intensity images include:

[0069] The outgoing light from the spectral multiplexing illumination system propagates to the sample plane of the Fourier stacked microscopy system. The outgoing light passes through the xy plane plate 201 with a small hole in the middle, so that the incident beam containing mixed spectral information illuminates the sample. The light wave illuminating the sample is represented by the spatial function O(x,y), and x and y together constitute the sample plane.

[0070] The light emitted from the sample enters the microscope objective 203, the pupil aperture 204, and the sleeve lens 205 sequentially. When the emitted light from the sample reaches the CMOS camera 206, a series of incoherent mixed-state low-resolution intensity images can be acquired. The calculation of this series of incoherent mixed-state low-resolution intensity images includes...

[0071] I m =|O m,fil (x,y)| 2

[0072] Among them, I m O represents the actual captured low-resolution intensity image. m,fil (x,y) represents the actual captured low-resolution intensity image.

[0073] The light emitted from the sample enters the microscope objective 203, and the light wave undergoes a Fourier transform as it passes through the lens of the microscope objective 203.

[0074] The light emitted through the microscope objective 203 enters the pupil aperture 204, which is equivalent to the sample's spectrum undergoing a low-pass filter in the Fourier domain.

[0075] The light emitted through the pupil aperture 204 contains only the low-frequency spectral information, and then undergoes a second Fourier transform through the sleeve lens 205.

[0076] S2: A phase retrieval Fourier stacked algorithm based on spectral multiplexing is used to decouple and re-recover a series of incoherent mixed-state low-resolution intensity images, resulting in high spatial resolution and a large field of view images that include the original accurate wavelength spectral information. It should be noted that:

[0077] S2-1: Acquisition of high spatial resolution and large field-of-view images with original, accurate wavelength spectral information includes,

[0078] Image intensity I based on target sample function h and wavelength incident plane wave Initialize and estimate a target sample function O(x,y), and use the target sample function O(x,y) to generate low spatial resolution sample functions corresponding to different coherence states.

[0079] The calculation of the target sample function O(x,y) includes,

[0080]

[0081] Where O(x,y) represents the target sample function, I h The image intensity represents the target sample function. Indicates wavelength as The incident plane wave.

[0082] S2-2: Obtaining incoherent mixture I based on the intensity component of the target sample t Incoherent mixture I t The calculations include,

[0083] I t =I c1 +I c2

[0084] Among them, I c1 I represents the intensity component of the first wavelength in the incoherent mixed state. c2 This represents the intensity component of the second wavelength in the incoherent mixed state;

[0085] S2-3: Using the intensity image I obtained from actual capture m Incoherent mixture I t And the intensity component I of the first wavelength in the incoherent mixed state c1 Update the intensity image of the target sample, and use the updated intensity image of the target sample to modify the estimated corresponding spectral region of the target sample;

[0086] The calculation of the updated intensity image of the target sample includes,

[0087]

[0088] Among them, I m I represents the actual captured low-resolution intensity image. t Indicates incoherent mixing, I c1 I represents the intensity component of the first wavelength in the incoherent mixed state. c ′1 represents the updated intensity image of the target sample;

[0089] S2-4: Repeat the entire process for all captured low spatial resolution intensity images. Once all captured intensity images have been updated, it is one iteration cycle. Continue this process until the recovery algorithm converges, thus completing the decoupling recovery and reconstruction of the incoherent mixed-state image and obtaining the original accurate spectral wavelength spectrum.

[0090] S3: Change the filter to different wavelengths, and iterate through S1 to S2 until a series of discrete spectral images are obtained. It should be noted that:

[0091] S4: Interpolation algorithms are used to interpolate a series of discrete spectral images to reconstruct images with a large field of view, high spatial and spectral resolution. It should be noted that:

[0092] The interpolation algorithm is a known cubic spline interpolation, specifically including:

[0093] The spectral curve generated from the spectral data has N segments, each segment is S(x), and a series of spectral data points are x0, x1, x2, ..., xn. N The value corresponding to each point is y0, y1, y2, ..., y N ;

[0094] Let S be a cubic polynomial i (x)=a i +b i (xx i )+c i (xx i ) 2 +d i (xx i ) 3 , where data point x i and x i+1 The interval curve is S i (x), a i b i c i d i All represent coefficients;

[0095] Relation Substituting into the cubic polynomial, we can obtain the relation satisfied by the coefficients;

[0096] Let S i "(x) = 0, and the interpolation value for each segment is obtained.

[0097] The implementation of the present invention will be further described below with reference to the accompanying drawings and embodiments.

[0098] First, a simplified schematic diagram of the spectrum multiplexing illumination optical path device is shown below. Figure 2 As shown, it only demonstrates a design using two replaceable filters (103a, 103b). In practice, the optical path and the number of filters can be expanded to 103c, 103d, etc., based on this principle, allowing for the coupling of more wavelengths of light at once. The device includes a halogen lamp 101, a beam splitter 102, a first filter 103a, a second filter 103b, a first prism 104a, a second prism 104b, a beam combiner 105, and a reflector 106. The Fourier layered microscopy imaging device is as follows... Figure 3 As shown, its incident ray is Figure 2 The emitted light from the device.

[0099] The detailed operation flowchart of the method in this application is as follows: Figure 1 As shown, it includes the following steps:

[0100] ① A halogen lamp 101 emits a light source, and a beam splitter 102 splits the light source into two light paths, which pass through a first filter 103a and a second filter 103b of different wavelengths respectively.

[0101] ② The outgoing light from the first filter 103a and the second filter 103b is incident on the first prism 104a and the second prism 104b at a 45° angle and exits, causing the two outgoing light beams to change their optical path direction.

[0102] ③Use optical path 1 as the transmitted ray and optical path 2 as the reflected ray, both incident at a 45° angle on the beam combiner 105 to achieve beam combining;

[0103] ④ The beam combiner 105 then passes through the mirror 106 to adjust the light path, which is parallel to the horizontal plane, to coincide with the optical axis of the microscope objective.

[0104] ⑤ The outgoing light from the spectral multiplexing illumination system passes through the Fourier stacked microscope system and through a movable xy-plane plate with a small aperture, so that the incident light beam containing incoherent mixed state spectral information illuminates the sample. The aperture is controlled to move to different positions on the xy-plane, and a series of incoherent mixed low-resolution images are captured by a CMOS camera under different wavelength filters.

[0105] ⑥ Apply the spectral multiplexing Fourier stack decoupling phase recovery algorithm to the above images to recover discrete spectral images with a large field of view and high spatial resolution;

[0106] ⑦ Finally, using the existing one-dimensional linear interpolation algorithm, the discrete spectral image above is reconstructed to have a large field of view, high spatial resolution, and high spectral resolution.

[0107] After capturing an image using the device of the present invention, the spectral image information containing incoherent mixed states is decoupled by the spectral multiplexing phase recovery algorithm, and the original large field of view and high spatial resolution images of different bands are separated. Finally, the result of one reconstruction can obtain images with spectral information of two accurate bands, which is more efficient than acquiring and reconstructing a single wavelength each time.

[0108] In the several embodiments provided in this application, it should be understood that the disclosed apparatus and methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative. For instance, the division of modules or units is merely a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another apparatus, or some features may be ignored or not executed.

[0109] The units may or may not be physically separate. The components shown as units can be one or more physical units, meaning they can be located in one place or distributed in multiple different locations. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.

[0110] Furthermore, the functional units in the various embodiments of the present invention can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated unit can be implemented in hardware or as a software functional unit.

[0111] If the integrated unit is implemented as a software functional unit and sold or used as an independent product, it can be stored in a readable storage medium. Based on this understanding, the technical solution of the embodiments of the present invention, essentially, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. This software product is stored in a storage medium and includes several instructions to cause a device (which may be a microcontroller, chip, etc.) or processor to execute all or part of the steps of the methods described in the various embodiments of the present invention. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0112] The above description is merely a specific embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any variations or substitutions within the technical scope disclosed in the present invention should be covered within the scope of protection of the present invention. Therefore, the scope of protection of the present invention should be determined by the scope of the claims.

Claims

1. A method for a hyperspectral imaging device based on Fourier layered microscopy with spectral multiplexing, characterized in that, include: The sample is illuminated by a spectral multiplexing illumination device coupled with light of different wavelengths, and the CMOS camera (206) acquires a series of incoherent mixed-state low-resolution intensity images through a Fourier stacked microscopy system. The phase retrieval Fourier stack algorithm based on spectral multiplexing is used to decouple and then recover the series of incoherent mixed-state low-resolution intensity images to obtain images with high spatial resolution and large field of view that include the original accurate wavelength spectral information. By changing filters of different wavelengths and iterating in a loop, a series of discrete spectral images can be obtained. Interpolation algorithms are used to interpolate the series of discrete spectral images to reconstruct images with a large field of view, high spatial and high spectral resolution; Hyperspectral imaging devices include, A horizontal assembly (100) includes a halogen lamp (101), a beam splitter (102), a filter (103), a prism (104), a beam combiner (105), and a reflector (106). The halogen lamp (101) is disposed on one side of the beam splitter (102), and the filter (103) is disposed on the other side of the beam splitter (102). The beam combiner (105) is disposed between the prism (104) and the reflector (106), and the filter (103) is disposed on the other side of the prism (104). The vertical assembly (200) includes an xy plane plate (201), a sample to be tested (202), a microscope objective (203), a pupil aperture (204), a sleeve lens (205), and a CMOS camera (206). The microscope objective (203) is disposed on the top of the sample to be tested (202), and the xy plane plate (201) is disposed on the bottom of the sample to be tested (202). The pupil aperture (204) is disposed on the top of the microscope objective (203), and the sleeve lens (205) is disposed on the top of the pupil aperture (204). The CMOS camera (206) is disposed on the top of the sleeve lens (205). The outgoing light beam reflected by the mirror (106) passes through a small hole disposed on the xy plane plate (201).

2. The method of the hyperspectral imaging device based on Fourier stacked microscopy with spectral multiplexing according to claim 1, characterized in that: The hyperspectral imaging device also includes, The halogen lamp (101) emits broadband white light. The center of the beam emitted by the beam splitter (102) coincides with the center of the filter (103) and the center of the beam combiner (105). The center of the beam emitted after being reflected by the mirror (106) coincides with the center of the microscope objective (203), the pupil aperture (204), and the sleeve lens (205).

3. The method of the hyperspectral imaging device based on Fourier stacked microscopy with spectral multiplexing according to claim 1 or 2, characterized in that: The spectral multiplexing illumination device can expand the optical path, and the number of filters (103) can be several.

4. The method of the hyperspectral imaging device based on Fourier stacked microscopy with spectral multiplexing according to claim 3, characterized in that: The imaging steps for the series of incoherent mixed-state low-resolution intensity images include: The outgoing light from the spectral multiplexing illumination system propagates to the sample plane of the Fourier layered microscopy system. The outgoing light passes through a perforated xy-plane plate (201), allowing the incident beam containing mixed-state spectral information to illuminate the sample. The light wave illuminating the sample uses a spatial function... This means that x and y together form the plane of the sample to be tested; The emitted light from the sample enters the microscope objective (203), pupil aperture (204), and sleeve lens (205) sequentially. When the emitted light from the sample reaches the CMOS camera (206), a series of incoherent mixed-state low-resolution intensity images can be acquired. The calculation of the series of incoherent mixed-state low-resolution intensity images includes... ； in, This represents the actual low-resolution intensity image captured. This refers to the light wave after passing through the telescopic lens.

5. The method of the hyperspectral imaging device based on Fourier stacked microscopy with spectral multiplexing according to claim 4, characterized in that: The acquisition of high spatial resolution and large field-of-view images based on the original accurate wavelength spectral information includes, Image intensity based on target sampling function and wavelength incident plane wave Initialize and estimate a target sample function and using the target sample function Generate sample functions with low spatial resolution corresponding to different coherence states.

6. The method of the hyperspectral imaging device based on Fourier stacked microscopy with spectral multiplexing according to claim 5, characterized in that: The target sample function The calculations include, ； in, Describe the target sample function. The image intensity represents the target sample function. Indicates wavelength as The incident plane wave.

7. The method of the hyperspectral imaging device based on Fourier stacked microscopy with spectral multiplexing according to claim 6, characterized in that: It also includes, Incoherent mixing is obtained based on the intensity component of the target sample. Incoherent mixing The calculations include, ； in, This represents the intensity component of the first wavelength in the incoherent mixed state. This represents the intensity component of the second wavelength in the incoherent mixed state; Using actual captured low-resolution intensity images Incoherent mixing and the intensity component of the first wavelength in the incoherent mixed state Update the intensity image of the target sample, and use the updated intensity image of the target sample to modify the estimated corresponding spectral region of the target sample; The calculation of the updated intensity image of the target sample includes, ； in, This represents the actual low-resolution intensity image captured. Indicates incoherent mixing. This represents the intensity component of the first wavelength in the incoherent mixed state. This represents the intensity image of the updated target sample; The entire process is repeated for all captured low spatial resolution intensity images. Once all captured intensity images have been updated, it is considered an iteration cycle. This process is repeated until the final recovery algorithm converges, thus completing the decoupling recovery and reconstruction of the incoherent mixed-state image and obtaining the original accurate spectral wavelength spectrum.

8. The method of the hyperspectral imaging apparatus based on Fourier stacked microscopy with spectral multiplexing according to any one of claims 4 to 7, characterized in that: The interpolation algorithm is a known cubic spline interpolation, specifically including: The spectral curve generated from the spectral data is set to have N segments, and each segment is... S ( x A series of spectral data points are The value corresponding to each point is ; Let the cubic polynomial Among them, data points and The interval curve is , , , , All represent coefficients; Relation Substituting into the cubic polynomial, we can obtain the relation satisfied by the coefficients; make This yields the interpolation value for each segment.

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