A method, device, medium and equipment for correcting slab width measurement value

By linearly fitting the slab centerline measurement data, calculating the deflection angle and correcting the slab width measurement value, the width measurement deviation caused by slab deflection is solved, and the width control accuracy and production efficiency of hot-rolled products are improved.

CN117000784BActive Publication Date: 2026-06-26BEIJING SHOUGANG CO LTD +2

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
BEIJING SHOUGANG CO LTD
Filing Date
2023-08-29
Publication Date
2026-06-26

AI Technical Summary

Technical Problem

In hot rolling production, the width measurement deviation caused by slab deflection affects the width control accuracy of hot-rolled products, resulting in product width deviation and reduced production efficiency.

Method used

By linearly fitting the measurement data of the slab centerline, the deflection angle is calculated, and the slab width measurement value is corrected using the deflection angle, thereby improving the width control accuracy.

Benefits of technology

This solved the problem of width measurement deviation caused by slab deflection, improved the width control accuracy and production efficiency of hot-rolled products, reduced resource waste, and improved production quality and efficiency.

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Abstract

The application provides a slab width measurement correction method, device, medium and equipment, wherein the method comprises: obtaining a slab first width measurement sequence and a slab first center line measurement sequence; performing linear fitting on the slab first center line measurement sequence to obtain a center line slope k; calculating a deflection angle of the slab according to the center line slope k; and correcting the slab first width measurement sequence according to the deflection angle to obtain an ideal width measurement sequence. The application solves the problem of slab deflection by performing linear fitting on the slab center line measurement data to obtain a linear fitting formula, calculating the slab deflection angle, and finally correcting the slab width measurement using the deflection angle, thereby improving the width control precision of hot-rolled products and ensuring the production quality and production efficiency of hot-rolled products.
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Description

Technical Field

[0001] This application relates to the field of hot rolling technology, and in particular to a method, apparatus, medium and equipment for correcting slab width measurement values. Background Technology

[0002] To reduce the number of slab blanks in the continuous casting process, slab blanks often appear at the limits of hot rolling's widening or narrowing capabilities during hot rolling production. In this case, the accuracy of the slab width is extremely important for hot rolling width control. When the actual slab width exceeds the range of hot rolling widening and narrowing capabilities, it is inevitable that the width of the hot-rolled product will exceed tolerances, resulting in a large number of defective products.

[0003] In existing systems, many hot rolling lines install measuring instruments at the roughing mill inlet to measure slab width and control hot rolling width. Due to the short length of the slab, it is prone to deflection during roller conveyor operation. In this case, the width measured by the width measuring instrument will be greater than the actual width, thus affecting hot rolling width control. The narrower and shorter the slab, the larger the maximum deflection angle and the greater the width deviation. Calculations show that a 10m long, 1000mm wide slab can exhibit a maximum width deviation of up to 10mm. Therefore, it is essential to correct the measured slab width before applying it to width model control.

[0004] Therefore, how to solve the problem of slab deflection, improve the width control accuracy of hot-rolled products, and ensure the production quality and efficiency of hot-rolled products are urgent technical problems to be solved. Summary of the Invention

[0005] The purpose of this application is to provide a method, apparatus, medium, and equipment for correcting slab width measurement values. By linearly fitting the slab centerline measurement data, a linear fitting formula is obtained, and then the slab deflection angle is calculated. Finally, the deflection angle is used to correct the slab width measurement value, which solves the problem of slab deflection influence, improves the width control accuracy of hot-rolled products, and ensures the production quality and efficiency of hot-rolled products.

[0006] Specifically, this application adopts the following technical solution:

[0007] According to one aspect of the embodiments of this application, a method for correcting slab width measurement values ​​is provided. The method includes: acquiring a first slab width measurement value sequence and a first slab centerline measurement value sequence; performing linear fitting on the first slab centerline measurement value sequence to obtain a centerline slope k; calculating the deflection angle of the slab based on the centerline slope k; and correcting the first slab width measurement value sequence based on the deflection angle to obtain an ideal width measurement value sequence.

[0008] In some embodiments of this application, based on the foregoing scheme, before the method obtains the first width measurement value sequence and the first center line measurement value sequence of the slab, it includes: installing a measuring instrument at the slab rolling inlet to measure the slab width data and the slab center line data.

[0009] In some embodiments of this application, based on the foregoing scheme, before obtaining the first width measurement value sequence and the first center line measurement value sequence of the slab, the method further includes: obtaining the second width measurement value sequence and the second center line measurement value sequence of the slab.

[0010] In some embodiments of this application, based on the foregoing scheme, obtaining the first width measurement value sequence and the first center line measurement value sequence of the slab includes: statistically analyzing the second width measurement value sequence and the second center line measurement value sequence of the slab; filtering the second width measurement value sequence and the second center line measurement value sequence of the slab; removing abnormal data measured at the head and tail of the slab to obtain the first width measurement value sequence and the first center line measurement value sequence of the slab.

[0011] In some embodiments of this application, based on the foregoing scheme, the linear fitting of the measured value sequence of the first centerline of the slab to obtain the centerline slope k, the fitting polynomial is:

[0012] c = k·x + b

[0013] Where b represents the intercept, c is the ordinate value of at least one point in the measurement value sequence of the first center line of the slab, and x is the abscissa value of at least one point in the measurement value sequence of the first center line of the slab.

[0014] In some embodiments of this application, based on the foregoing scheme, the calculation of the deflection angle of the slab includes:

[0015] The deflection angle of the slab is calculated using the following formula:

[0016] α=actank

[0017] Where α is the deflection angle of the slab, actan() is the arctangent trigonometric function, and k = tanα.

[0018] In some embodiments of this application, based on the foregoing scheme, the correction of the first width measurement sequence of the slab includes:

[0019] The sequence of measured values ​​for the first width of the slab is corrected using a correction formula, which is:

[0020] w i ′=w i cosα

[0021] Among them, w i ′ represents the corrected slab width value, w i The width of the slab measured before correction is α, which is the deflection angle of the slab.

[0022] According to one aspect of the embodiments of this application, a device for correcting slab width measurements is provided. The device includes: an acquisition unit for acquiring a first slab width measurement sequence and a first slab centerline measurement sequence; a calculation unit for linearly fitting the second slab centerline measurement sequence to obtain a centerline slope k, and calculating the deflection angle of the slab based on the centerline slope k; and a correction unit for correcting the second slab width measurement sequence based on the deflection angle to obtain an ideal width measurement sequence.

[0023] According to one aspect of the embodiments of this application, a computer-readable storage medium is provided, characterized in that the computer-readable storage medium stores at least one piece of program code, the at least one piece of program code being loaded and executed by a processor to implement the operations performed by the method for correcting the slab width measurement value as described above.

[0024] According to one aspect of the embodiments of this application, an electronic device is provided, characterized in that the electronic device includes one or more processors and one or more memories, wherein the one or more memories store at least one piece of program code, the at least one piece of program code being loaded by the one or more processors and executing the operations performed by the slab width measurement correction method as described above.

[0025] As can be seen from the above technical solution, this application has at least the following advantages and positive effects:

[0026] On the one hand, the proposed solution in this application obtains a linear fitting formula by linearly fitting the slab centerline measurement data, then calculates the slab deflection angle, and finally uses the deflection angle to correct the slab width measurement value, thus solving the problem of slab deflection influence and improving the width control accuracy of hot-rolled products.

[0027] On the other hand, the solution proposed in this application can solve the problem of excessive width of hot-rolled products due to slab deflection, thus ensuring the production quality and efficiency of hot-rolled products. Attached Figure Description

[0028] The accompanying drawings, which are incorporated in and form part of this specification, illustrate embodiments consistent with this application and, together with the description, serve to explain the principles of this application. It is obvious that the drawings described below are merely some embodiments of this application, and those skilled in the art can obtain other drawings based on these drawings without any inventive effort. In the drawings:

[0029] Figure 1 A flowchart illustrating a method for correcting slab width measurements in one embodiment of this application is shown;

[0030] Figure 2 A diagram showing the slab deflection angle in one embodiment of this application is illustrated.

[0031] Figure 3 A block diagram of a slab width measurement correction device according to one embodiment of this application is shown;

[0032] Figure 4 A schematic diagram of a computer system suitable for implementing an electronic device according to embodiments of the present application is shown. Detailed Implementation

[0033] Exemplary embodiments will now be described more fully with reference to the accompanying drawings. However, these exemplary embodiments can be implemented in many forms and should not be construed as limited to the examples set forth herein; rather, these embodiments are provided to make this application more comprehensive and complete, and to fully convey the concept of the exemplary embodiments to those skilled in the art.

[0034] Furthermore, the described features, structures, or characteristics can be combined in any suitable manner in one or more embodiments. Numerous specific details are provided in the following description to give a thorough understanding of embodiments of this application. However, those skilled in the art will recognize that the technical solutions of this application can be practiced without one or more of the specific details, or other methods, components, apparatuses, steps, etc., can be employed. In other instances, well-known methods, apparatuses, implementations, or operations are not shown or described in detail to avoid obscuring various aspects of this application.

[0035] The flowcharts shown in the accompanying drawings are merely illustrative and do not necessarily include all content and operations / steps, nor do they necessarily have to be performed in the described order. For example, some operations / steps can be broken down, while others can be combined or partially combined; therefore, the actual execution order may change depending on the specific circumstances.

[0036] It should be noted that the terms "first," "second," etc., in the specification, claims, and accompanying drawings of this application are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that such uses of these terms can be interchanged where appropriate so that the embodiments of this application described herein can be implemented in orders other than those illustrated or described.

[0037] The implementation details of the technical solutions in the embodiments of this application are described in detail below:

[0038] According to this application, a method for correcting slab width measurements is provided, referring to... Figure 1 This is a flowchart of a method for correcting the measurement value of a slab width according to this application. The method includes:

[0039] S1, obtain the sequence of first width measurement values ​​and the sequence of first center line measurement values ​​of the slab.

[0040] S2, perform linear fitting on the sequence of measured values ​​of the first centerline of the slab to obtain the slope k of the centerline.

[0041] S3, the deflection angle of the slab is calculated based on the slope k of the center line.

[0042] S4, the first width measurement value sequence of the slab is corrected according to the deflection angle to obtain the ideal width measurement value sequence.

[0043] In existing technologies, due to the short length of the slab, the slab is prone to deflection during the operation of the roller table due to vibrations from the rolling mill or roller table, as well as other factors. The shorter the slab, the larger the deflection angle. The deflection angle will affect the width deviation of the slab. When the width of the slab deviates, it will affect the subsequent hot rolling process. When the actual width of the slab exceeds the range of hot rolling widening and narrowing capabilities, the width of the hot-rolled products will inevitably exceed the tolerance, resulting in a large number of defective products, which seriously affects the quality and production efficiency of hot-rolled products.

[0044] In this application, a method for correcting slab width measurements is employed, which involves first obtaining a sequence of first slab width measurements (x... i ,w i ) and the sequence of measured values ​​of the first centerline of the slab (x i ,c i), where i = 1, 2, 3, ..., N, and N is the number of roughing mill entry slab width measurement data and centerline measurement data; then, the first centerline measurement value sequence of the slab is linearly fitted to obtain the centerline slope k; then, based on the centerline slope k, the deflection angle of the slab is calculated; finally, based on the deflection angle, the first width measurement value sequence of the slab is corrected to obtain the ideal width measurement value sequence (x i ,w i ′).

[0045] In one embodiment of this application, before obtaining the sequence of first width measurements and the sequence of first centerline measurements of the slab, the following steps are included:

[0046] Measuring instruments are installed at the slab rolling inlet to measure slab width and centerline data.

[0047] In this application, the measuring instrument is installed at the slab rolling inlet. The measuring instrument can be a width flow meter or other measuring instruments. This application does not impose any special restrictions on the measuring instrument, and a suitable measuring instrument can be selected according to actual needs.

[0048] In one embodiment of this application, before obtaining the sequence of measurement values ​​for the first width of the slab and the sequence of measurement values ​​for the first centerline of the slab, the method further includes:

[0049] Obtain the sequence of measurement values ​​for the second width of the slab and the sequence of measurement values ​​for the second centerline of the slab.

[0050] In this application, since the data at the head and tail of the slab may be abnormal, in order not to affect the slab width measurement value, the abnormal values ​​at the head and tail of the slab will be removed. First, the second width measurement value sequence and the second center line measurement value sequence of the slab are obtained (the second width measurement value sequence and the second center line measurement value sequence of the slab contain the abnormal values ​​at the head and tail of the slab). Since the abnormal values ​​at the head and tail of the slab are narrower than the width value of the slab body, these abnormal values ​​can be removed through statistics to obtain the first width measurement value sequence of the slab (x). i ,w i ) and the sequence of measured values ​​of the first centerline of the slab (x i ,c i (The sequence of slab width measurements and the sequence of slab centerline measurements obtained after removing outliers from the head and tail of the slab), where i = m, m+1, m+2, ..., n-2, n-1, n (m and n are the slab head and tail sequence numbers after removing the head and tail lengths).

[0051] In one embodiment of this application, obtaining the sequence of measurement values ​​for the first width of the slab and the sequence of measurement values ​​for the first centerline of the slab includes the following steps S21 to S23:

[0052] Step S21: Statistical analysis is performed on the second width measurement sequence and the second centerline measurement sequence of the slab.

[0053] Step S22: Filter the second width measurement sequence and the second centerline measurement sequence of the slab.

[0054] Step S23: Remove the abnormal data measured at the head and tail of the slab to obtain the first width measurement value sequence and the first center line measurement value sequence of the slab.

[0055] In one embodiment of this application, the linear fitting of the measured value sequence of the first centerline of the slab to obtain the centerline slope k is performed, and the fitting polynomial is:

[0056] c = k·x + b

[0057] Where b represents the intercept, c is the ordinate value of at least one point in the measurement value sequence of the first center line of the slab, and x is the abscissa value of at least one point in the measurement value sequence of the first center line of the slab.

[0058] In one embodiment of this application, the calculation of the deflection angle of the slab includes:

[0059] The deflection angle of the slab is calculated using the following formula:

[0060] α=actank

[0061] Where α is the deflection angle of the slab, actan() is the arctangent trigonometric function, and k = tanα.

[0062] In one embodiment of this application, the correction of the first width measurement sequence of the slab includes:

[0063] The sequence of measured values ​​for the first width of the slab is corrected using a correction formula, which is:

[0064] w i ′=w i cosα

[0065] Among them, w i ′ represents the corrected slab width value, w i The width of the slab measured before correction is α, which is the deflection angle of the slab.

[0066] To enable those skilled in the art to better understand this application, the following will be combined with Figure 2 The following is an illustration using a specific example.

[0067] See Figure 2 The diagram shows the slab deflection angle in one embodiment of this application.

[0068] like Figure 2 As shown in this specific embodiment, a steel company's 2250mm hot rolling production line uses a method for correcting the measurement value of the slab width. The slab specifications are: 8000mm*1500mm*230mm (length*width*thickness). The method for correcting the measurement value of the slab width can be executed according to the following steps S31 to S34:

[0069] Step S31: Obtain the slab width measurement value sequence and centerline measurement value sequence, and remove 1m lengths of measurement values ​​from both ends (as abnormal measurement values). The new slab width measurement value sequence (x) obtained after removing the abnormal measurement values ​​from the beginning and end is obtained. i ,w i ) and centerline measurement sequence (x i ,c i ), where i = m, m+1, m+2, ..., n-2, n-1, n (m and n are the head and tail sequence numbers after removing the head and tail lengths), as shown in the first column x / mm, the second column c / mm and the third column w / mm in Table 1 below.

[0070] Step S32: Perform linear fitting on the new slab centerline measurement data obtained after removing abnormal head and tail data to obtain the centerline slope k = 0.022959.

[0071] Step S33: Based on the obtained centerline slope k, calculate the deflection angle of the slab. The formula for calculating the deflection angle of the slab is: α = actank = 1.31°.

[0072] Step S34: Based on the obtained slab deflection angle, the new slab width measurement value sequence obtained in step S31 (as shown in the third column w / mm in Table 1 below) is corrected to obtain the ideal width measurement value sequence (as shown in the fifth column w` / mm in Table 1 below). The correction formula is: w i ′=w i cosα, where w i ′ represents the corrected slab width, and the sequence of corrected slab width measurements is (x i ,w i ′), i=m, m+1, m+2,..., n-2, n-1, n.

[0073] x / mm c / mm w / mm α w` / mm 1205 12.6953 1499.39 1.315223 1498.995 1806.3 26.50062 1498.022 1.315223 1497.628 2412 40.40697 1496.704 1.315223 1496.31 3015 54.25132 1496.875 1.315223 1496.481 3615.9 68.04746 1499.805 1.315223 1499.41 4199.4 81.44411 1496.509 1.315223 1496.115 4923.2 98.06193 1496.606 1.315223 1496.212 5559 112.6593 1497.876 1.315223 1497.481 6054.6 124.0379 1497.192 1.315223 1496.798 6409 132.1746 1496.826 1.315223 1496.432 6707.7 139.0325 1498.218 1.315223 1497.823 6991.7 145.5529 1496.069 1.315223 1495.675

[0074] Table 1

[0075] On the other hand, this application also provides a device for correcting the measurement value of the slab width, referring to Figure 3 As shown, a slab width measurement correction device 300 according to an embodiment of this application includes: an acquisition unit 301, a calculation unit 302 and a correction unit 303.

[0076] The acquisition unit 301 is used to acquire the first width measurement value sequence and the first centerline measurement value sequence of the slab; the calculation unit 302 is used to perform linear fitting on the second centerline measurement value sequence of the slab to obtain the centerline slope k, and calculate the deflection angle of the slab based on the centerline slope k; the correction unit 303 is used to correct the second width measurement value sequence of the slab based on the deflection angle to obtain the ideal width measurement value sequence.

[0077] In this application, it should be noted that the computer-readable medium shown in the embodiments of this application can be a computer-readable signal medium or a computer-readable storage medium, or any combination of the two. A computer-readable storage medium can be, for example,—but not limited to—an electrical, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any combination thereof. More specific examples of a computer-readable storage medium may include, but are not limited to: an electrical connection having one or more wires, a portable computer disk, a hard disk, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM), flash memory, optical fiber, portable compact disc read-only memory (CD-ROM), optical storage device, magnetic storage device, or any suitable combination thereof. In this application, a computer-readable storage medium can be any tangible medium containing or storing a program that can be used by or in conjunction with an instruction execution system, apparatus, or device. In this application, a computer-readable signal medium can include a data signal propagated in baseband or as part of a carrier wave, carrying computer-readable program code. Such transmitted data signals can take various forms, including but not limited to electromagnetic signals, optical signals, or any suitable combination thereof. The computer-readable signal medium can also be any computer-readable medium other than a computer-readable storage medium, which can send, propagate, or transmit a program for use by or in connection with an instruction execution system, apparatus, or device. The program code contained on the computer-readable medium can be transmitted using any suitable medium, including but not limited to wireless, wired, etc., or any suitable combination thereof.

[0078] Figure 4A schematic diagram of the structure of a computer system suitable for implementing the electronic device of the present application is shown.

[0079] It should be noted that, Figure 4 The computer system 400 of the electronic device shown is merely an example and should not impose any limitation on the functionality and scope of use of the embodiments of this application.

[0080] like Figure 4 As shown, the computer system 400 includes a Central Processing Unit (CPU) 401, which can perform various appropriate actions and processes based on programs stored in Read-Only Memory (ROM) 402 or programs loaded from storage portion 408 into Random Access Memory (RAM) 403, such as performing the methods described in the above embodiments. The RAM 403 also stores various programs and data required for system operation. The CPU 1101, ROM 402, and RAM 403 are interconnected via a bus 404. An Input / Output (I / O) interface 405 is also connected to the bus 404.

[0081] The following components are connected to I / O interface 405: an input section 406 including a keyboard, mouse, etc.; an output section 407 including a cathode ray tube (CRT), liquid crystal display (LCD), etc., and speakers, etc.; a storage section 1108 including a hard disk, etc.; and a communication section 409 including a network interface card such as a LAN (Local Area Network) card, modem, etc. The communication section 409 performs communication processing via a network such as the Internet. A drive 410 is also connected to I / O interface 405 as needed. A removable medium 411, such as a disk, optical disk, magneto-optical disk, semiconductor memory, etc., is installed on drive 410 as needed so that computer programs read from it can be installed into storage section 408 as needed.

[0082] Specifically, according to embodiments of this application, the processes described above with reference to the flowcharts can be implemented as computer software programs. For example, embodiments of this application include a computer program product comprising a computer program carried on a computer-readable medium, the computer program containing program code for performing the methods shown in the flowcharts. In such embodiments, the computer program can be downloaded and installed from a network via communication section 409, and / or installed from removable medium 411. When the computer program is executed by central processing unit (CPU) 401, it performs various functions defined in the system of this application.

[0083] In another aspect, this application also provides a computer-readable storage medium storing at least one piece of program code, which is loaded and executed by a processor to implement the operations performed by the method for correcting the slab width measurement value as described above.

[0084] In another aspect, this application also provides an electronic device comprising one or more processors and one or more memories, wherein at least one piece of program code is stored in the one or more memories, the at least one piece of program code being loaded and executed by the one or more processors to implement the operations performed by the method for correcting the slab width measurement value as described above.

[0085] It should be noted that although several modules or units for the device used to perform actions have been mentioned in the detailed description above, this division is not mandatory. In fact, according to the embodiments of this application, the features and functions of two or more modules or units described above can be embodied in one module or unit. Conversely, the features and functions of one module or unit described above can be further divided and embodied by multiple modules or units.

[0086] As can be seen from the above technical solution, this application has at least the following advantages and positive effects:

[0087] On the one hand, the proposed solution in this application obtains a linear fitting formula by linearly fitting the slab centerline measurement data, then calculates the slab deflection angle, and finally uses the deflection angle to correct the slab width measurement value, thus solving the problem of slab deflection influence and improving the width control accuracy of hot-rolled products.

[0088] On the other hand, the solution proposed in this application can solve the problem of excessive width of hot-rolled products due to slab deflection, ensuring the production quality and efficiency of hot-rolled products. The improvement of the production quality and efficiency of hot-rolled products reduces resource waste, increases production volume, and greatly improves profits.

[0089] Other embodiments of this application will readily occur to those skilled in the art upon consideration of the specification and practice of the embodiments disclosed herein. This application is intended to cover any variations, uses, or adaptations of this application that follow the general principles of this application and include common knowledge or customary techniques in the art not disclosed herein.

[0090] Although this application has been described with reference to several typical embodiments, it should be understood that the terminology used is descriptive and exemplary, and not restrictive. Since this application can be embodied in many forms without departing from the spirit or substance of the application, it should be understood that the above embodiments are not limited to any of the foregoing details, but should be interpreted broadly within the spirit and scope defined by the appended claims. Therefore, all variations and modifications falling within the scope of the claims or their equivalents should be covered by the appended claims.

Claims

1. A method for correcting the measurement value of slab width, characterized in that, The method includes: Obtain the sequence of measurement values ​​for the first width of the slab and the sequence of measurement values ​​for the first centerline of the slab; The slope k of the centerline is obtained by linearly fitting the sequence of measured values ​​of the first centerline of the slab. The deflection angle of the slab is calculated based on the slope k of the centerline. The ideal width measurement sequence is obtained by correcting the first width measurement sequence of the slab based on the deflection angle. A linear fit was performed on the sequence of measured values ​​of the first centerline of the slab to obtain the centerline slope k. The fitting polynomial is: Where b represents the intercept. The ordinate value is the ordinate value of at least one point in the sequence of measured values ​​of the first centerline of the slab. The x-coordinate value of at least one point in the sequence of measured values ​​of the first centerline of the slab; The step of calculating the deflection angle of the slab based on the slope k of the centerline includes: Calculation formula: arctank is used to obtain the deflection angle of the slab, where, The deflection angle of the slab. For the arctangent trigonometric function, k = .

2. The method according to claim 1, characterized in that, Before obtaining the sequence of measurement values ​​for the first width of the slab and the sequence of measurement values ​​for the first centerline of the slab, the following steps are included: Measuring instruments are installed at the slab rolling entry point to measure slab width and centerline data.

3. The method according to claim 1, characterized in that, Before obtaining the sequence of measurement values ​​for the first width of the slab and the sequence of measurement values ​​for the first centerline of the slab, the method further includes: Obtain the sequence of measurement values ​​for the second width of the slab and the sequence of measurement values ​​for the second centerline of the slab.

4. The method according to claim 3, characterized in that, The acquisition of the first width measurement sequence and the first centerline measurement sequence of the slab includes: Statistical analysis was performed on the sequence of second width measurements and the sequence of second centerline measurements of the slab. The second width measurement sequence and the second centerline measurement sequence of the slab are filtered; Abnormal data measured at the head and tail of the slab are removed to obtain the first width measurement sequence and the first centerline measurement sequence of the slab.

5. The method according to claim 1, characterized in that, The correction of the first width measurement sequence of the slab includes: The sequence of measured values ​​for the first width of the slab is corrected using a correction formula, which is: in, This is the corrected slab width value. The value of the slab width measured before correction. The deflection angle of the slab is given.

6. A device for correcting the measurement value of a slab width, characterized in that, The device includes: The acquisition unit acquires the sequence of measurement values ​​for the first width of the slab and the sequence of measurement values ​​for the first centerline of the slab. The calculation unit performs linear fitting on the sequence of measured values ​​of the first centerline of the slab to obtain the centerline slope k, and calculates the deflection angle of the slab based on the centerline slope k. The correction unit corrects the first width measurement value sequence of the slab according to the deflection angle to obtain an ideal width measurement value sequence; A linear fit was performed on the sequence of measured values ​​of the first centerline of the slab to obtain the centerline slope k. The fitting polynomial is: Where b represents the intercept. The ordinate value is the ordinate value of at least one point in the sequence of measured values ​​of the first centerline of the slab. The x-coordinate value of at least one point in the sequence of measured values ​​of the first centerline of the slab; The step of calculating the deflection angle of the slab based on the slope k of the centerline includes: Calculation formula: arctank is used to obtain the deflection angle of the slab, where, The deflection angle of the slab. For the arctangent trigonometric function, k = .

7. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores at least one piece of program code, which is loaded and executed by a processor to perform the operations of the slab width measurement correction method as described in claim 1.

8. An electronic device, characterized in that, The electronic device includes one or more processors and one or more memories, wherein at least one piece of program code is stored in the one or more memories, and the at least one piece of program code is loaded and executed by the one or more processors to perform the operations performed by the method for correcting the slab width measurement value as described in claim 1.