Product quality classification method and device, electronic equipment and storage medium

Abstract

The present disclosure relates to a product quality classification method and device, electronic equipment and computer readable storage medium, and relates to the technical field of semiconductor production and manufacturing, and can be applied to the scene of classifying the quality grades of products in the semiconductor production process. The method comprises the following steps: obtaining a target test process of a test site; the target test process is generated based on a newly added failure test process; a test product arriving at the test site is obtained, the test product is tested and processed by using the newly added failure test process, and an initial product category of the test product is determined; the product failure value of the test product under the newly added failure test process is determined under each initial product category; and the test product is classified and processed in quality in combination with the initial product category and the product failure value, so as to obtain a corresponding quality classification grade. The present disclosure provides a product quality classification scheme, which can reduce unnecessary downgraded products and improve product yield.

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