A method and device for testing a resistor

Abstract

The present invention discloses a resistor test method and a test device, which relate to the field of resistor performance testing. The test device includes a control module, a data acquisition module, and a test basic module. When a start signal is received, a target test experiment is determined according to a preset test sequence, and the test basic module is controlled to construct a corresponding target test environment so that the resistor performs a target test in the environment. When the resistor is determined to have passed the target test according to the test parameters collected by the data acquisition module, a new target test is determined according to the preset test sequence, and finally various tests are automatically completed according to the preset test sequence. The present application only needs to be installed once to complete various tests by constructing a target test environment through the test basic module, and the target test is any one or a combination of several of N test tests, and single or multiple combination test tests can be completed, with better test results, which is beneficial to the performance test verification of the resistor.

Description

Technical Field

[0001] The present invention relates to the technical field of resistor performance testing, and in particular to a resistor testing method and a resistor testing device. Background Art

[0002] Resistors, such as shunts, need to pass a series of tests after production before they can be actually shipped out of the factory and applied in various occasions. However, different tests require different test environments. Under the current test scheme, the resistors need to be repeatedly disassembled and installed and tested one by one. The overall efficiency is low, and repeated installation also results in installation errors. In addition, the actual working conditions of resistors are relatively complex. According to the existing single test scheme, it is very likely that the resistors will pass a single test but fail the superposition of several tests. For example, the resistor passes a single vibration test and a single temperature test, but fails a test that applies both vibration and temperature. This makes the current test scheme not very effective and is not conducive to the performance test and verification of resistors. Therefore, how to design a new test scheme is an issue that needs to be solved urgently. Summary of the invention

[0003] The problem solved by the present invention is: to provide a resistor testing method and a testing device, which can complete various test experiments by constructing a target test environment through a test basic module with only one installation, and can complete single-item and multiple-item combined test experiments, with better test effect, which is beneficial to the performance test verification of the resistor and more beneficial to the detection of resistors that meet the actual production requirements.

[0004] In order to solve the above problems, the present invention provides a resistor testing method, which is applied to a control module in a testing device; the testing device also includes a data acquisition module and a test basic module for constructing a test environment required for N kinds of test experiments, where N is an integer greater than 1. The testing method includes:

[0005] When receiving a start signal indicating that the resistor to be tested has been placed in the test device and the test can be started, determining a target test according to a preset test sequence, wherein the target test is any one or a combination of several of the N test;

[0006] Controlling the test basic module to construct a target test environment corresponding to the target test experiment, so that the resistor performs the target test experiment under the target test environment;

[0007] When it is determined that the resistor has passed the target test according to the test parameters collected by the data collection module, a new target test is determined according to the preset test sequence.

[0008] The beneficial effects of the present invention are as follows: the present application does not require repeated disassembly and installation of resistors, and only one installation is required to construct a target test environment through the test basic module to complete various test experiments, and the target test experiment is any one or a combination of several of the N test experiments, and single-item and multiple combination test experiments can be completed, with better test effects, which is beneficial to the performance test verification of resistors and more beneficial to the detection of resistors that meet actual production requirements.

[0009] Further, when the target test is an error stability test; determining whether the resistor passes the target test according to the test parameters collected by the data acquisition module includes:

[0010] Acquire a plurality of first voltages collected by the data collection module, each of the first voltages being a voltage across the resistor when the resistor passes through a rated current provided by the test basic module at each first preset time interval and reaches thermal equilibrium;

[0011] Determining an error accuracy corresponding to each of the first voltages;

[0012] When it is determined that the maximum of the absolute values ​​of the error accuracies is smaller than the first preset accuracy, it is determined that the resistor passes the error stability test.

[0013] In this scheme, the above method can be used to simply and reliably determine whether the resistor to be tested has passed the error stability test, and when it is determined that the maximum of the absolute values ​​of each error precision is greater than the first preset precision, it is determined that the error stability test has not been passed, and the entire test is terminated in time to avoid wasting testing resources.

[0014] Further, the test basic module includes a vibration table, and the resistor is arranged on the vibration table;

[0015] Controlling the test basic module to construct a target test environment corresponding to the target test experiment includes:

[0016] The vibration table is controlled to vibrate to drive the resistor to vibrate, so that the resistor can undergo a vibration test.

[0017] In this solution, the above method is used to facilitate vibration testing of the resistor to be tested, and the next target test experiment is started only when the resistor passes the vibration test.

[0018] Further, when the target test is a thermal balance time test; determining whether the resistor passes the target test according to the test parameters collected by the data acquisition module includes:

[0019] Acquire the second voltages collected by the data collection module according to the first preset collection frequency, each of the second voltages being the voltage across the resistor when the rated current provided by the test basic module passes through the resistor;

[0020] Determine the i-th first voltage deviation value according to the first preset relationship, the i-th second voltage and the i+1-th second voltage, where 1≤i≤M-1 and i is an integer, and M is the total number of the collected second voltages;

[0021] The first preset relationship is:

[0022]

[0023] Where, ΔV i is the i-th first voltage deviation value, V i+1 is the i+1th second voltage, V i is the i-th second voltage;

[0024] When it is determined that the absolute value of any one of the first voltage deviation values ​​is less than the second preset accuracy, it is determined that the resistor passes the thermal balance time test.

[0025] In this solution, the above method can be used to simply and reliably determine whether the resistor to be tested has passed the thermal balance time test, and when it is determined that there is no absolute value of any first voltage deviation value greater than the second preset accuracy, it is determined that the thermal balance time test has not been passed, and the entire test is terminated in time to avoid wasting testing resources.

[0026] Further, when the target test is a thermal balance temperature test; determining whether the resistor passes the target test according to the test parameters collected by the data acquisition module includes:

[0027] Acquire first temperatures collected by the data collection module according to a second preset collection frequency, each first temperature being a temperature corresponding to a preset area when the resistor passes through a rated current provided by the test basic module;

[0028] When it is determined that each of the first temperatures is lower than the preset standard temperature, it is determined that the resistor has passed the thermal balance temperature test.

[0029] In this solution, the above method can be used to simply and reliably determine whether the resistor to be tested has passed the thermal balance temperature test, and when it is determined that any first temperature is greater than the preset standard temperature, it is determined that the thermal balance temperature test has not been passed, and the entire test is terminated in time to avoid wasting testing resources.

[0030] Further, when the target test experiment is a low temperature test; controlling the test basic module to construct a target test environment corresponding to the target test experiment includes:

[0031] Controlling the ambient temperature inside the test device to a preset low temperature value through the test basic module; and controlling the test basic module to output a rated current to the resistor when a second preset time is reached;

[0032] Determining whether the resistor passes the target test according to the test parameters collected by the data collection module includes:

[0033] Determine the measured voltage drop value according to the third voltage and the fourth voltage collected by the data collection module, wherein the third voltage is the voltage across the resistor at the initial moment when the rated current passes through the resistor, and the fourth voltage is the voltage across the resistor after a third preset time has passed from the initial moment;

[0034] The second voltage deviation value is determined according to a second preset relationship; the second preset relationship is:

[0035]

[0036] Where, ΔV low is the second voltage deviation value, V C is the measured voltage drop value, and V is the rated voltage drop value corresponding to the resistor;

[0037] When it is determined that the absolute value of the second voltage deviation value is less than a third preset accuracy, it is determined that the resistor passes the low temperature test.

[0038] In this solution, the above method can be used to simply and reliably determine whether the resistor to be tested has passed the low-temperature test, and when it is determined that the absolute value of the second voltage deviation value is greater than the third preset accuracy, it is determined that the low-temperature test has not been passed, and the entire test is terminated in time to avoid wasting testing resources.

[0039] Further, when the target test experiment is a high temperature test; controlling the test basic module to construct a target test environment corresponding to the target test experiment includes:

[0040] Controlling the ambient temperature inside the test device to a preset high temperature value through the test basic module; and controlling the test basic module to output a rated current to the resistor when a fourth preset time is reached;

[0041] Determining whether the resistor passes the target test according to the test parameters collected by the data collection module includes:

[0042] Acquire fifth voltages collected by the data collection module according to a third preset collection frequency, each of the fifth voltages being a voltage across the resistor when the rated current passes through the resistor;

[0043] The third voltage deviation value is determined according to a third preset relationship; the third preset relationship is:

[0044]

[0045] Among them, V last is the fifth voltage collected last time, ΔV high is the third voltage deviation value;

[0046] When it is determined that the absolute value of the third voltage deviation value is less than a fourth preset accuracy, it is determined that the resistor passes the high temperature test.

[0047] In this solution, the above method can be used to simply and reliably determine whether the resistor to be tested has passed the high temperature test, and when it is determined that the absolute value of the third voltage deviation value is greater than the fourth preset accuracy, it is determined that the high temperature test has not been passed, and the entire test is terminated in time to avoid wasting testing resources.

[0048] Furthermore, the preset test sequence is appearance inspection test, basic error test, error stability test, vibration test, thermal balance time test, thermal balance temperature test, overload test, alternating damp heat test, high temperature test, low temperature test and combination test.

[0049] In this solution, the above test sequence can be used to minimize the loss of the resistor to be tested on the basis of automatically completing multiple tests.

[0050] The present invention also provides a testing device, comprising a box, a control module, a data acquisition module and a test basic module, wherein the control module is connected to the data acquisition module and the test basic module respectively;

[0051] The control module is used to implement the steps of the resistor testing method as described above.

[0052] Further, the box is a temperature box and is mounted on a vibration table in the test basic module through a guide rail, and the vibration table is used to place resistors;

[0053] An opening is provided on one side of the temperature box, and the opening is used for passing a wire to connect the current source in the test basic module and the resistor.

[0054] In this solution, this setting is helpful to provide different test environments for the resistors to be tested. The resistors only need to be installed in sequence to complete single and multiple combination test experiments, which has better test effects and is conducive to the performance test and verification of the resistors. BRIEF DESCRIPTION OF THE DRAWINGS

[0055] Figure 1 A flowchart of a resistor testing method provided by the present invention;

[0056] Figure 2 A schematic diagram of setting a preset test sequence provided by the present invention. DETAILED DESCRIPTION

[0057] In order to make the above-mentioned objects, features and advantages of the present invention more obvious and easy to understand, specific embodiments of the present invention are described in detail below with reference to the accompanying drawings.

[0058] Please refer to Figure 1 , Figure 1 The present invention provides a flow chart of a resistor testing method.

[0059] The present invention provides an embodiment, a resistor testing method, which is applied to a control module in a testing device; the testing device also includes a data acquisition module and a testing basic module for constructing a test environment required for N types of testing experiments, where N is an integer greater than 1. The testing method includes:

[0060] S11: upon receiving a start signal indicating that the resistor to be tested has been placed in the test device and the test can be started, determining a target test according to a preset test sequence, the target test being any one or a combination of several of the N test;

[0061] S12: Control the test basic module to construct a target test environment corresponding to the target test experiment, so that the resistor performs the target test experiment under the target test environment;

[0062] S13: When it is determined that the resistor has passed the target test according to the test parameters collected by the data acquisition module, a new target test is determined according to a preset test sequence.

[0063] In this embodiment, the above-mentioned resistor includes but is not limited to a shunt; the test device is a device integrated by a control module, a data acquisition module and a test basic module. Specifically, the data acquisition module may include a voltage acquisition module for collecting the voltage across the resistor, an infrared sensing module for collecting the surface temperature of the middle area of ​​the resistor, and a visual sensing module for photographing the appearance and size of the resistor (the visual sensing module may be specifically arranged on the top of the box of the test device); the test basic module may include a current source for providing different current outputs and the current source is connected to the resistor through a wire passing through an opening on the box of the test device, a vibration table for placing the resistor to be tested, etc. In order to complete temperature-related tests, the box of the test device can be directly set as a temperature box, and the temperature box is set on the vibration table through a guide rail, and then the control module changes the ambient temperature through the temperature box. Of course, a heating device for heating the ambient temperature and a refrigeration device for cooling the ambient temperature can also be set in the test basic module, and no special limitation is made here.

[0064] It should also be noted that after determining the new target test experiment according to the preset test sequence, step S12 is entered to allow the resistor to undergo a new target test experiment; it can be understood that the test device may also include a display module for displaying the progress of each target test experiment, whether the test is successful, etc. The test device may also include a storage module for storing the test data generated during the target test experiment for viewing and reading by the test personnel.

[0065] When it is determined that the resistor has not passed the target test according to the test parameters collected by the data acquisition module, an alarm signal indicating the failure of the target test can be output. Specifically, the test device can also include an alarm module, which outputs the above alarm signal, and the alarm signal includes but is not limited to sound and light alarm. When the resistor has not passed the target test, the test basic module can also be controlled to stop working to stop the test of the resistor, so as to terminate the entire test in time to avoid wasting test resources.

[0066] In addition, the start signal can be received by the user by clicking on the human-computer interaction interface of the display module in the test device to start the test; when the target test is a combination of several single test items, the test environments corresponding to the single test items in the combination do not conflict with each other. For example, the combination can be low temperature test + vibration test, high temperature test + vibration test, alternating damp heat test + vibration test, overload test + vibration test, etc., but there cannot be a combination of low temperature test + high temperature test that conflicts with the test environment.

[0067] It should also be noted that the regulation module may specifically include a control module and a data analysis module, wherein the control module is used to construct corresponding target test environments, and the data analysis module is used to determine whether the resistor has passed the current target test, so as to avoid one control module performing multiple tasks and causing excessive computing pressure.

[0068] In summary, the present application provides a testing method for resistors, which does not require repeated disassembly and installation of resistors. Various test experiments can be completed by constructing a target test environment through a test basic module with only one installation. The target test experiment is any one or a combination of N test experiments, and single or multiple comprehensive test experiments can be completed. The test effect is better, which is conducive to the performance test verification of the resistor and is more conducive to the detection of resistors that meet the actual production requirements.

[0069] As a preferred embodiment, when the target test is an error stability test, determining whether the resistor passes the target test according to the test parameters collected by the data acquisition module includes:

[0070] Acquire a plurality of first voltages collected by the data collection module, each first voltage being a voltage across the resistor when the resistor passes through a rated current provided by the test basic module at each first preset time interval and reaches thermal equilibrium;

[0071] Determining the error accuracy corresponding to each first voltage;

[0072] When it is determined that the maximum of the absolute values ​​of the respective error accuracies is smaller than the first preset accuracy, it is determined that the resistor passes the error stability test.

[0073] Specifically, each resistor corresponds to some default basic parameters, including rated current, rated voltage drop value and accuracy, and the accuracy is preferably ±0.2%, ±0.3%, ±0.5% and ±1.0%, etc.; the measurement of the first voltage is essentially to test that the basic module outputs the rated current to the resistor, and records the first voltage at this time after the resistor reaches thermal equilibrium, and then stops supplying the rated current. After reaching the first preset time, the basic module is tested to output the rated current to the resistor again. It should be noted that the first preset time includes but is not limited to 24 hours.

[0074] It should also be noted that the first preset accuracy here includes but is not limited to 0.4*accuracy accuracy; it can be seen that the above method can simply and reliably determine whether the resistor to be tested has passed the error stability test, and when it is determined that the maximum of the absolute values ​​of each error accuracy is greater than the first preset accuracy, it is determined that the error stability test has not been passed, and the entire test is terminated in time to avoid wasting test resources.

[0075] As a preferred embodiment, the test basic module includes a vibration table, and the resistor is arranged on the vibration table;

[0076] The control test basic module constructs the target test environment corresponding to the target test experiment, including:

[0077] The vibration of the vibration table is controlled to drive the resistor to vibrate so that the resistor can undergo a vibration test.

[0078] Specifically, when the resistor undergoes a single vibration test, no current flows through it (i.e., the current source does not output current), but it only vibrates along with the vibration table. The vibration parameters obtained by analysis are used to determine whether it has passed the vibration test, and the next target test experiment is started only when the resistor has passed the vibration test.

[0079] As a preferred embodiment, when the target test is a thermal balance time test, determining whether the resistor has passed the target test according to the test parameters collected by the data acquisition module includes:

[0080] Acquire the second voltages collected by the data collection module according to the first preset collection frequency, each second voltage being the voltage across the resistor when the resistor passes through the rated current provided by the test basic module;

[0081] Determine the i-th first voltage deviation value according to the first preset relationship, the i-th second voltage and the i+1-th second voltage, where 1≤i≤M-1 and i is an integer, and M is the total number of the collected second voltages;

[0082] The first preset relationship is:

[0083]

[0084] Where, ΔV i is the i-th first voltage deviation value, V i+1 is the i+1th second voltage, V i is the i-th second voltage;

[0085] When it is determined that the absolute value of any one of the first voltage deviation values ​​is smaller than the second preset accuracy, it is determined that the resistor passes the thermal balance time test.

[0086] Specifically, the first preset acquisition frequency here includes but is not limited to 1min / time; M includes but is not limited to 5; the second preset precision includes but is not limited to 0.1*accuracy precision; it can be seen that the above method can simply and reliably determine whether the resistor to be tested has passed the thermal balance time test, and when it is determined that there is no absolute value of any first voltage deviation value greater than the second preset precision, it is determined that the resistor has not passed the thermal balance time test, and the entire test is terminated in time to avoid wasting test resources.

[0087] As a preferred embodiment, when the target test is a thermal balance temperature test, determining whether the resistor has passed the target test according to the test parameters collected by the data acquisition module includes:

[0088] Acquire first temperatures collected by the data collection module according to a second preset collection frequency, each first temperature being a temperature corresponding to a preset area when the resistor passes through a rated current provided by the test basic module;

[0089] When it is determined that each of the first temperatures is lower than the preset target temperature, it is determined that the resistor has passed the thermal balance temperature test.

[0090] Specifically, the second preset acquisition frequency here includes but is not limited to 1min / time; the first temperature can be specifically collected by the temperature patrol meter in the data acquisition module, and the preset area of ​​the resistor can be specifically the surface of the middle area of ​​the resistor; the number of acquisitions performed according to the second preset acquisition frequency includes but is not limited to 5 times; the preset standard temperature includes but is not limited to 140°C; it can be seen that the above method can simply and reliably determine whether the resistor to be tested has passed the thermal balance temperature test, and when it is determined that any first temperature is greater than the preset standard temperature, it is determined that the thermal balance temperature test has not been passed, and the entire test is terminated in time to avoid wasting test resources.

[0091] As a preferred embodiment, when the target test experiment is a low temperature test; the control test basic module constructs a target test environment corresponding to the target test experiment, including:

[0092] Controlling the ambient temperature inside the test device to a preset low temperature value through the test basic module; and controlling the test basic module to output a rated current to the resistor when a second preset time is reached;

[0093] Determine whether the resistor has passed the target test according to the test parameters collected by the data acquisition module, including:

[0094] Determine the measured voltage drop value according to the third voltage and the fourth voltage collected by the data collection module, the third voltage is the voltage across the resistor at the initial moment when the rated current passes through, and the fourth voltage is the voltage across the resistor after a third preset time has passed from the initial moment;

[0095] The second voltage deviation value is determined according to a second preset relationship; the second preset relationship is:

[0096]

[0097] Where, ΔV low is the second voltage deviation value, V C is the measured voltage drop value, V is the rated voltage drop value corresponding to the resistor;

[0098] When it is determined that the absolute value of the second voltage deviation value is less than the third preset accuracy, it is determined that the resistor passes the low temperature test.

[0099] Specifically, the second preset time length includes but is not limited to 30 minutes, and the third preset time length includes but is not limited to 45s±5s; the third preset accuracy includes but is not limited to the accuracy accuracy mentioned above. It can be seen that the above method can simply and reliably determine whether the resistor to be tested has passed the low-temperature test, and when it is determined that the absolute value of the second voltage deviation value is greater than the third preset accuracy, it is determined that the low-temperature test has not been passed, and the entire test is terminated in time to avoid wasting testing resources.

[0100] As a preferred embodiment, when the target test experiment is a high temperature test; the control test basic module constructs a target test environment corresponding to the target test experiment, including:

[0101] Controlling the ambient temperature inside the test device to a preset high temperature value through the test basic module; and controlling the test basic module to output a rated current to the resistor when a fourth preset time is reached;

[0102] Determine whether the resistor has passed the target test according to the test parameters collected by the data acquisition module, including:

[0103] Acquire a fifth voltage collected by the data collection module according to a third preset collection frequency, each fifth voltage being a voltage across the resistor when a rated current passes through the resistor;

[0104] The third voltage deviation value is determined according to a third preset relationship; the third preset relationship is:

[0105]

[0106] Among them, V last is the fifth voltage collected last time, ΔV high is the third voltage deviation value;

[0107] When it is determined that the absolute value of the third voltage deviation value is less than the fourth preset accuracy, it is determined that the resistor passes the high temperature test.

[0108] Specifically, the fourth preset duration here includes but is not limited to 30 minutes, the third preset acquisition frequency includes but is not limited to 1 min / time, the total number of the fifth voltage collected includes but is not limited to 5, and the fourth preset precision includes but is not limited to the accuracy precision mentioned above; it can be seen that the above method can simply and reliably determine whether the resistor to be tested has passed the high temperature test, and when it is determined that the absolute value of the third voltage deviation value is greater than the fourth preset precision, it is determined that the high temperature test has not been passed, and the entire test is terminated in time to avoid wasting testing resources.

[0109] As a preferred embodiment, the preset test sequence is appearance inspection test, basic error test, error stability test, vibration test, thermal balance time test, thermal balance temperature test, overload test, alternating damp heat test, high temperature test, low temperature test and combination test.

[0110] Specifically, considering that an unreasonable test sequence may increase the test loss of the resistor to be tested, the above preferred test sequence is given, as follows: Figure 2As shown, it is possible to minimize the loss of the resistor to be tested on the basis of automatically completing multiple tests, wherein the combined test here is a combination of several single test tests described in the above embodiments, and the test environments corresponding to the single test tests in the combination do not conflict with each other.

[0111] It should also be noted that when the target test is an appearance inspection test, the visual sensor module in the control test basic module works to take pictures to read the appearance and geometric dimensions of the resistor, and compare them with the stored appearance and standard dimensions of the original qualified products. If the error is within the allowable range, the resistor is considered to have passed the appearance inspection test, and the new target test is determined to be a basic error test, otherwise the entire test is stopped.

[0112] When the target test experiment is a basic error test, multiple sixth voltages collected by the data acquisition module are obtained, and the sixth voltage is the voltage across the resistor when it passes through different first currents provided by the test basic module and reaches thermal equilibrium. When it is determined that the resistor has passed the basic error test based on the voltage value, the new target test experiment is determined to be an error stability test, otherwise the entire test experiment is stopped; it should also be noted that the different first currents here include but are not limited to 0.01*rated current, 0.05*rated current, 0.1*rated current, 0.2*rated current, 0.6*rated current, 0.8*rated current, rated current and 1.2*rated current.

[0113] When the target test is an overload test, the second current is output to the resistor through the test basic module for the fifth preset time. When it is determined that the temperature corresponding to the preset area of ​​the resistor collected by the data acquisition module is <25±3℃, the resistor is controlled to perform the above-mentioned basic error test again. It should be noted that the second current here can be 2.25*rated current, and the fifth preset time can be 1.5 seconds.

[0114] When the target test is an alternating damp heat test, the ambient temperature inside the test device is controlled by the test basic module (of course, when the box of the test device is a temperature box, the ambient temperature can also be controlled by the temperature box). The temperature change is adjusted during the test. The upper limit of the ambient temperature is 60℃±2℃. The ambient temperature is cooled to 25℃±3℃ within 3 to 6 hours. The relative humidity is set to not less than 80%. Six test cycles are carried out in this way. During this process, no current is passed through the resistor to be tested and no special measures are taken to discharge moisture from its surface. After the completion of the six test cycles, the resistor is controlled to undergo the above-mentioned basic error test again after an interval of 24 hours.

[0115] The present invention also provides a testing device, comprising a box, a control module, a data acquisition module and a test basic module, wherein the control module is connected to the data acquisition module and the test basic module respectively;

[0116] The control module is used to implement the steps of the resistor testing method as described above.

[0117] For an introduction to the testing device provided in the present invention, please refer to the embodiment of the above-mentioned resistor testing method, which will not be elaborated here.

[0118] As a preferred embodiment, the box body is a temperature box and is mounted on a vibration table in the test basic module through a guide rail, and the vibration table is used to place the resistor;

[0119] An opening is provided on one side of the temperature box, and the opening is used for passing a wire to connect the current source and the resistor in the test basic module.

[0120] Specifically, the opening on the temperature box is used to pass the wire, and the size of the opening is preferably sufficient for the wire to pass through; the visual sensor module used for the appearance inspection test in the test basic module can be specifically arranged on the top of the temperature box. It can be seen that this setting is conducive to providing different test environments for the resistors to be tested. The resistors only need to be installed in sequence to complete single or multiple combined tests, which has better test effects and is conducive to the performance test verification of the resistors.

[0121] Although the disclosure is disclosed as above, the protection scope of the disclosure is not limited thereto. Those skilled in the art can make various changes and modifications without departing from the spirit and scope of the disclosure, and these changes and modifications will fall within the protection scope of the present invention.

[0122] It should also be noted that, in this specification, relational terms such as first, second, etc. are merely used to distinguish one entity or operation from another entity or operation, and do not imply any actual relationship or order between these entities or operations.

Claims

1. A method for testing a resistor, characterized in that: A control module applied to a test device; the test device also includes a data acquisition module and a test basic module for constructing a test environment required for N types of test experiments, where N is an integer greater than 1. The test method includes: When receiving a start signal indicating that the resistor to be tested has been placed in the test device and the test can be started, determining a target test according to a preset test sequence, wherein the target test is any one or a combination of several of the N test; Controlling the test basic module to construct a target test environment corresponding to the target test experiment, so that the resistor performs the target test experiment under the target test environment; When it is determined that the resistor has passed the target test according to the test parameters collected by the data collection module, a new target test is determined according to the preset test sequence; The preset test sequence is appearance inspection test, basic error test, error stability test, vibration test, thermal balance time test, thermal balance temperature test, overload test, alternating damp heat test, high temperature test, low temperature test and combination test; When the target test is an error stability test; determining whether the resistor passes the target test according to the test parameters collected by the data acquisition module includes: Acquire a plurality of first voltages collected by the data collection module, each of the first voltages being a voltage across the resistor when the resistor passes through a rated current provided by the test basic module at each first preset time interval and reaches thermal equilibrium; Determining an error accuracy corresponding to each of the first voltages; When it is determined that the maximum of the absolute values ​​of the error accuracies is smaller than the first preset accuracy, it is determined that the resistor passes the error stability test.

2. The resistor testing method according to claim 1, characterized in that: The test basic module includes a vibration table, and the resistor is arranged on the vibration table; Controlling the test basic module to construct a target test environment corresponding to the target test experiment includes: The vibration table is controlled to vibrate to drive the resistor to vibrate, so that the resistor can undergo a vibration test.

3. The resistor testing method according to claim 1, characterized in that: When the target test experiment is a thermal equilibrium time test; Determining whether the resistor passes the target test according to the test parameters collected by the data collection module includes: Acquire the second voltages collected by the data collection module according to the first preset collection frequency, each of the second voltages being the voltage across the resistor when the rated current provided by the test basic module passes through the resistor; Determine the i-th first voltage deviation value according to the first preset relationship, the i-th second voltage and the i+1-th second voltage, where 1≤i≤M-1 and i is an integer, and M is the total number of the collected second voltages; The first preset relationship is: Wherein, ΔVi is the i-th first voltage deviation value, Vi+1 is the i+1-th second voltage, and Vi is the i-th second voltage; When it is determined that the absolute value of any one of the first voltage deviation values ​​is less than the second preset accuracy, it is determined that the resistor passes the thermal balance time test.

4. The resistor testing method according to claim 1, wherein: When the target test experiment is a thermal equilibrium temperature test; Determining whether the resistor passes the target test according to the test parameters collected by the data collection module includes: Acquire first temperatures collected by the data collection module according to a second preset collection frequency, each first temperature being a temperature corresponding to a preset area when the resistor passes through a rated current provided by the test basic module; When it is determined that each of the first temperatures is lower than the preset standard temperature, it is determined that the resistor has passed the thermal balance temperature test.

5. The resistor testing method according to claim 1, wherein: When the target test experiment is a low temperature test; controlling the test basic module to construct a target test environment corresponding to the target test experiment, including: The method includes controlling the ambient temperature inside the test device to be a preset low temperature value through the test basic module; and controlling the test basic module to output a rated current to the resistor when a second preset time is reached; and determining whether the resistor has passed the target test according to the test parameters collected by the data acquisition module, including: Determine the measured voltage drop value according to the third voltage and the fourth voltage collected by the data collection module, wherein the third voltage is the voltage across the resistor at the initial moment when the rated current passes through the resistor, and the fourth voltage is the voltage across the resistor after a third preset time has passed from the initial moment; The second voltage deviation value is determined according to a second preset relationship; the second preset relationship is: Among them, ΔVlow is the second voltage deviation value, VC is the measured voltage drop value, and V is the rated voltage drop value corresponding to the resistor; when it is determined that the absolute value of the second voltage deviation value is less than the third preset accuracy, it is determined that the resistor has passed the low temperature test.

6. The resistor testing method according to claim 1, wherein: When the target test experiment is a high temperature test; controlling the test basic module to construct a target test environment corresponding to the target test experiment, including: The method includes controlling the ambient temperature inside the test device to be a preset high temperature value through the test basic module; and controlling the test basic module to output a rated current to the resistor when a fourth preset time is reached; and determining whether the resistor has passed the target test according to the test parameters collected by the data acquisition module, including: Acquire fifth voltages collected by the data collection module according to a third preset collection frequency, each of the fifth voltages being a voltage across the resistor when the rated current passes through the resistor; The third voltage deviation value is determined according to a third preset relationship; the third preset relationship is: Wherein, Vlast is the fifth voltage collected for the last time, and ΔVhigh is the third voltage deviation value; when it is determined that the absolute value of the third voltage deviation value is less than a fourth preset accuracy, it is determined that the resistor has passed the high temperature test.

7. A testing device, characterized in that: It includes a box, a control module, a data acquisition module and a test basic module, and the control module is connected to the data acquisition module and the test basic module respectively; The control module is used to implement the steps of the resistor testing method according to any one of claims 1 to 6.

8. The testing device according to claim 7, characterized in that: The box is a temperature box and is sleeved on a vibration table in the test basic module through a guide rail, and the vibration table is used to place resistors; An opening is provided on one side of the temperature box, and the opening is used for passing a wire to connect the current source in the test basic module and the resistor.

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