Method and device for predicting the lifetime of a circuit breaker contact, circuit breaker and medium

Abstract

The application provides a life prediction method and device of a circuit breaker contact, a circuit breaker and a medium, and relates to the technical field of low-voltage electrical apparatuses. The method comprises: obtaining an impedance correction coefficient of a contact group in the circuit breaker; obtaining a current thermal capacity of the contact group according to the impedance correction coefficient and a breaking current of the circuit breaker, the breaking current being a current of a closed loop before the circuit breaker performs a breaking operation; and determining a residual life parameter of the contact group according to an initial thermal capacity and a current thermal capacity of the contact group, so that the residual life parameter of the contact group can be determined according to the initial thermal capacity and the current thermal capacity of the contact group based on the impedance correction coefficient of the contact group, and compared with the prior art, the life prediction method can reduce the prediction cost without making great changes to the structure of the circuit breaker.

Description

Technical Field

[0001] This application relates to the field of low-voltage electrical technology, and in particular to a method, device, circuit breaker, and medium for predicting the lifespan of circuit breaker contacts. Background Technology

[0002] Circuit breakers are crucial electrical devices in low-voltage power distribution systems, and their service life directly impacts the safe and reliable operation of these systems. Under the premise of no major structural failures, the service life of a circuit breaker primarily depends on the lifespan of its contacts.

[0003] In the prior art, when predicting the life of circuit breaker contacts, the remaining life of the contacts is generally obtained by calculating the wear of the contact group.

[0004] However, existing methods for predicting the lifespan of circuit breaker contacts require significant modifications to the structural design, resulting in high prediction costs. Summary of the Invention

[0005] The purpose of this application is to address the shortcomings of the prior art by providing a method, device, circuit breaker, and medium for predicting the lifespan of circuit breaker contacts, which can reduce the prediction cost of the lifespan prediction method.

[0006] To achieve the above objectives, the technical solutions adopted in the embodiments of this application are as follows:

[0007] In a first aspect, the present invention provides a method for predicting the lifespan of circuit breaker contacts, comprising:

[0008] Obtain the impedance correction coefficient for the contact group in the circuit breaker;

[0009] The current thermal capacity of the contact group is obtained based on the impedance correction coefficient and the breaking current of the circuit breaker, wherein the breaking current is the current of the closed circuit before the circuit breaker performs the breaking operation;

[0010] The remaining life parameters of the contact group are determined based on the initial heat capacity and the current heat capacity of the contact group.

[0011] In an optional implementation, obtaining the impedance correction coefficient of the contacts in the circuit breaker includes:

[0012] Obtain the temperature rise parameters of the contact group;

[0013] Based on the temperature rise parameters, obtain the current contact resistance of the contact group;

[0014] The impedance correction coefficient is obtained based on the initial contact resistance and the current contact resistance of the contact group.

[0015] In an optional implementation, obtaining the temperature rise parameters of the contact group includes:

[0016] The first temperature of the internal environment of the circuit breaker and the second temperature of the target device connected to the stationary contact in the contact group are obtained respectively.

[0017] The temperature rise parameters of the contact group are calculated based on the temperature difference between the second temperature and the first temperature.

[0018] In an optional embodiment, the circuit breaker includes a temperature sensor, which comprises a first temperature sensor and a second temperature sensor. The step of acquiring a first temperature of the internal environment of the circuit breaker and a second temperature of the target device connected to the stationary contact in the contact group, respectively, includes:

[0019] The first temperature of the internal environment of the circuit breaker is obtained by the first temperature sensor.

[0020] The second temperature of the copper busbar connected to the stationary contact in the contact group is obtained by the second temperature sensor.

[0021] In an optional implementation, determining the remaining lifespan parameter of the contact group based on the initial heat capacity and the current heat capacity of the contact group includes:

[0022] Calculate the heat capacity difference between the initial heat capacity and the current heat capacity;

[0023] The remaining life parameters of the contact group are determined based on the heat capacity difference and the initial heat capacity.

[0024] In an optional implementation, obtaining the current contact resistance of the contact group based on the temperature rise parameter includes:

[0025] The thermal conductivity and electrical conductivity of the contact group were obtained respectively.

[0026] The current contact resistance of the contact group is calculated based on the temperature rise parameter, the thermal conductivity, the electrical conductivity, and the current parameter flowing through the contact group.

[0027] In an optional implementation, the method further includes:

[0028] If the remaining lifespan parameter of the contact group is determined to meet the preset threshold, an alarm signal is issued.

[0029] In an optional embodiment, the temperature sensor is any one of an infrared temperature sensor, an integrated chip temperature sensor, a positive temperature coefficient thermistor, or a negative temperature coefficient thermistor.

[0030] In a second aspect, the present invention provides a lifespan prediction device for low-voltage electrical appliances, comprising:

[0031] The first acquisition module is used to acquire the impedance correction coefficient of the contact group in the circuit breaker;

[0032] The second acquisition module is used to acquire the current thermal capacity of the contact group based on the impedance correction coefficient and the breaking current of the circuit breaker, wherein the breaking current is the current of the closed circuit before the circuit breaker performs the breaking operation;

[0033] The determination module is used to determine the remaining life parameters of the contact group based on the initial heat capacity and the current heat capacity of the contact group.

[0034] In an optional implementation, the first acquisition module is specifically used to acquire the temperature rise parameters of the contact group;

[0035] Based on the temperature rise parameters, obtain the current contact resistance of the contact group;

[0036] The impedance correction coefficient is obtained based on the initial contact resistance and the current contact resistance of the contact group.

[0037] In an optional implementation, the first acquisition module is specifically used to acquire the first temperature of the internal environment of the circuit breaker and the second temperature of the target device connected to the stationary contact in the contact group, respectively.

[0038] The temperature rise parameters of the contact group are calculated based on the temperature difference between the second temperature and the first temperature.

[0039] In an optional embodiment, the circuit breaker includes a temperature sensor, which includes a first temperature sensor and a second temperature sensor. The first acquisition module is specifically used to acquire a first temperature of the internal environment of the circuit breaker through the first temperature sensor.

[0040] The second temperature of the copper busbar connected to the stationary contact in the contact group is obtained by the second temperature sensor.

[0041] In an optional implementation, the determining module is specifically used to calculate the heat capacity difference between the initial heat capacity and the current heat capacity;

[0042] The remaining life parameters of the contact group are determined based on the heat capacity difference and the initial heat capacity.

[0043] In an optional implementation, the first acquisition module is specifically used to acquire the thermal conductivity and electrical conductivity of the contact group respectively;

[0044] The current contact resistance of the contact group is calculated based on the temperature rise parameter, the thermal conductivity, the electrical conductivity, and the current parameter flowing through the contact group.

[0045] In an optional implementation, the determining module is further configured to issue an alarm signal if it is determined that the remaining lifespan parameter of the contact group meets a preset threshold.

[0046] In an optional embodiment, the temperature sensor is any one of an infrared temperature sensor, an integrated chip temperature sensor, a positive temperature coefficient thermistor, or a negative temperature coefficient thermistor.

[0047] Thirdly, the present invention provides a circuit breaker for performing the steps of the life prediction method for circuit breaker contacts described in any of the foregoing embodiments.

[0048] Fourthly, the present invention provides a computer-readable storage medium storing a computer program, which, when executed by a processor, performs the steps of the circuit breaker contact life prediction method as described in any of the foregoing embodiments.

[0049] The beneficial effects of this application are:

[0050] The circuit breaker contact life prediction method, apparatus, circuit breaker, and medium provided in this application include: obtaining the impedance correction coefficient of the contact group in the circuit breaker; obtaining the current thermal capacity of the contact group based on the impedance correction coefficient and the breaking current of the circuit breaker, wherein the breaking current is the current of the closed circuit before the circuit breaker performs the breaking operation; and determining the remaining life parameters of the contact group based on the initial thermal capacity and the current thermal capacity of the contact group. This enables the determination of the remaining life parameters of the contact group based on the impedance correction coefficient and the initial and current thermal capacity of the contact group. Compared with the prior art, it does not require significant modifications to the circuit breaker in terms of structural design, thus reducing the prediction cost of the life prediction method. Attached Figure Description

[0051] To more clearly illustrate the technical solutions of the embodiments of this application, the accompanying drawings used in the embodiments will be briefly introduced below. It should be understood that the following drawings only show some embodiments of this application and should not be regarded as a limitation of the scope. For those skilled in the art, other related drawings can be obtained based on these drawings without creative effort.

[0052] Figure 1 A flowchart illustrating a method for predicting the lifespan of circuit breaker contacts provided in this application embodiment;

[0053] Figure 2 A flowchart illustrating another method for predicting the lifespan of circuit breaker contacts provided in this application embodiment;

[0054] Figure 3A flowchart illustrating another method for predicting the lifespan of circuit breaker contacts provided in this application embodiment;

[0055] Figure 4 A flowchart illustrating another method for predicting the lifespan of circuit breaker contacts provided in this application embodiment;

[0056] Figure 5 A flowchart illustrating another method for predicting the lifespan of circuit breaker contacts provided in this application embodiment;

[0057] Figure 6 A flowchart illustrating another method for predicting the lifespan of circuit breaker contacts provided in this application embodiment;

[0058] Figure 7 A schematic diagram of the functional modules of a circuit breaker contact life prediction device provided in an embodiment of this application;

[0059] Figure 8 This is a schematic diagram of an electronic device structure provided in an embodiment of this application. Detailed Implementation

[0060] To make the objectives, technical solutions, and advantages of the embodiments of this application clearer, the technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. The components of the embodiments of this application described and shown in the accompanying drawings can generally be arranged and designed in various different configurations.

[0061] Therefore, the following detailed description of the embodiments of this application provided in the accompanying drawings is not intended to limit the scope of the claimed application, but merely to illustrate selected embodiments of the application. All other embodiments obtained by those skilled in the art based on the embodiments of this application without inventive effort are within the scope of protection of this application.

[0062] It should be noted that similar labels and letters in the following figures indicate similar items. Therefore, once an item is defined in one figure, it does not need to be further defined and explained in subsequent figures.

[0063] In existing technologies, the remaining life of circuit breaker contacts is generally predicted by calculating the wear of the contact group, which can be divided into direct measurement and indirect measurement. Direct measurement involves testing the remaining life of the contact group through structural design. However, this method requires significant modifications to the structural design and cannot reflect the contact condition of the contact group, such as misjudgments of wear caused by particle adhesion. Therefore, this method suffers from high improvement costs and inaccurate prediction results. Indirect measurement typically uses Hall effect position sensors to measure the relative positional offset between the moving and stationary contacts to reflect the wear. However, Hall effect position sensors have relatively complex structures and high costs, and the routing of power supply and signal lines must be considered. Therefore, this method suffers from high improvement costs and poor applicability.

[0064] In view of this, embodiments of this application provide a method for predicting the lifespan of circuit breaker contacts. Applying this method can reduce the prediction cost of lifespan prediction methods and improve the accuracy and applicability of lifespan prediction.

[0065] Figure 1 This is a flowchart illustrating a method for predicting the lifespan of circuit breaker contacts provided in an embodiment of this application. The executing entity of this method can be a circuit breaker, or an electronic device such as a computer, server, or processor that is communicatively connected to the circuit breaker; no limitation is made herein. Figure 1 As shown, the method includes:

[0066] S101. Obtain the impedance correction coefficient of the contact group in the circuit breaker.

[0067] A circuit breaker's contact group includes stationary and moving contacts. By controlling the contact and separation of these contacts, the circuit breaker can connect and disconnect the circuit. The impedance correction factor of the contact group characterizes the change in the current contact resistance relative to the initial contact resistance. Experiments have shown that after multiple contacts and separations between the moving and stationary contacts, the contact resistance of the contact group will change. Therefore, in practical applications, this impedance correction factor can be used to reflect the real-time changes in the contact resistance of the contact group.

[0068] Optionally, the impedance correction coefficient of the contact group can be calculated based on the initial contact resistance and the current contact resistance of the contact group. The initial contact resistance, i.e., the contact circuit when the contact group has not experienced wear, can be obtained by reading the initial setting parameters of the contact group. The current contact resistance, i.e., the contact resistance of the contact group at the current time, can be obtained by real-time measurement of the contact group. If the initial contact resistance of the contact group is R, the current contact resistance is r, and the impedance correction coefficient of the contact group is kr, then the impedance correction coefficient of the contact group can be expressed as kr = r / R.

[0069] S102. Based on the impedance correction factor and the breaking current of the circuit breaker, obtain the current thermal capacity of the contact group. The breaking current is the current of the closed circuit before the circuit breaker performs the breaking operation.

[0070] The current heat capacity of the contact group can characterize the heat capacity parameter of the contact group at the current time, which is related to the wear condition of the contact group. Optionally, a controller can be installed inside the circuit breaker, which can collect the current of the closed circuit before the circuit breaker performs the breaking operation in real time as the breaking current of the circuit breaker.

[0071] It should be noted that, as verified by experiments, the electrical wear of the contact group affects the remaining life parameters of the contact group. The electrical wear of the contact group depends on the arc energy, i.e., the breaking current and the arcing time. Furthermore, experiments have shown that the electrical wear of the contact group is related to the contact resistance of the contact group. In addition, from the perspective of the cumulative electrical wear of the circuit breaker, although the arcing time is random for a single breaking, the average arcing time tends to be similar for multiple breaking. In other words, the electrical wear of the circuit breaker contact group can be calculated based on the breaking current of the circuit breaker.

[0072] Based on the above description, in some embodiments, the current heat capacity of the contact group can be calculated based on the product of the impedance correction factor and the square of the breaking current. Optionally, let the impedance correction factor of the contact group be Kr, the breaking current of the circuit breaker be Ia, and the current heat capacity of the contact group be Q1. Then, the current heat capacity of the contact group can be expressed as: Q1 = Kr × Ia 2 .

[0073] S103. Determine the remaining life parameters of the contact group based on the initial heat capacity and current heat capacity of the contact group.

[0074] The initial heat capacity of the contact group can characterize the heat capacity parameter corresponding to the contact group when no wear occurs. It can be calculated based on the preset coefficient and the operating short-circuit current of the circuit breaker. The operating short-circuit current of the circuit breaker is used to characterize the short-circuit current corresponding to the circuit breaker when performing contact and separation operations, without damage to the contact group.

[0075] In some embodiments, the preset coefficient can be 3, the initial heat capacity of the contact group is Q2, and the operating breaking short-circuit current is I. CS The initial heat capacity of the contact assembly can be expressed as: Q2 = 3 × I CS 2 .

[0076] Based on the calculated current heat capacity of the contact group, the relationship between the current heat capacity and the initial heat capacity can be calculated. The remaining lifespan parameter of the contact group can then be determined based on this relationship. It is understood that a larger difference between the current and initial heat capacity indicates a smaller remaining lifespan parameter, meaning a shorter remaining lifespan; conversely, a smaller difference indicates a larger remaining lifespan parameter, meaning a longer remaining lifespan. It can be seen that this calculation process does not require significant modifications to the circuit breaker's structural design, nor does it require consideration of the Hall effect position sensor's location. Therefore, it reduces the prediction cost of the lifespan prediction method and improves its applicability.

[0077] In summary, this application provides a method for predicting the lifespan of circuit breaker contacts, comprising: obtaining the impedance correction coefficient of the contact group in the circuit breaker; obtaining the current thermal capacity of the contact group based on the impedance correction coefficient and the breaking current of the circuit breaker, wherein the breaking current is the current of the closed circuit before the circuit breaker performs a breaking operation; and determining the remaining lifespan parameters of the contact group based on the initial thermal capacity and the current thermal capacity of the contact group. This method enables the determination of the remaining lifespan parameters of the contact group based on the impedance correction coefficient and the initial and current thermal capacities of the contact group. Compared with the prior art, it does not require significant modifications to the structural design of the circuit breaker, thus reducing the prediction cost of the lifespan prediction method. Furthermore, it eliminates the need to consider the placement of the Hall position sensor, thereby improving the applicability of the lifespan prediction method.

[0078] Figure 2 This is a flowchart illustrating another method for predicting the lifespan of circuit breaker contacts provided in an embodiment of this application. Optionally, considering that it is difficult to obtain the current contact resistance of the contact group in certain scenarios, such as... Figure 2 As shown, the steps for obtaining the impedance correction coefficient of the contacts in the circuit breaker may include:

[0079] S201. Obtain the temperature rise parameters of the contact group.

[0080] S202. Obtain the current contact resistance of the contact group based on the temperature rise parameters.

[0081] The temperature rise parameter of the contact group can characterize the temperature change of the contact group when current flows through the contact surfaces of the stationary and moving contacts. For a circuit breaker, when the circuit breaker trips due to a short-circuit fault current, the generated arc heat is high due to the extremely large short-circuit current, causing the contacts to burn out. Therefore, the temperature rise parameter of the contact group is related to the current contact circuit of the contact group, and thus, the current contact resistance of the contact group can be calculated.

[0082] S203. Obtain the impedance correction coefficient based on the initial contact resistance and the current contact resistance of the contact group.

[0083] As mentioned above, the impedance correction factor for the contact group can be determined based on the ratio between the initial contact resistance and the current contact resistance of the contact group. Therefore, after calculating the current contact resistance of the contact group, the impedance correction factor can be further calculated.

[0084] Figure 3 This is a flowchart illustrating another method for predicting the lifespan of circuit breaker contacts provided in this application. Optionally, as... Figure 3 As shown, the above-mentioned methods for obtaining the temperature rise parameters of the contact group include:

[0085] S301. Obtain the first temperature of the internal environment of the circuit breaker and the second temperature of the target device connected to the stationary contact in the contact group.

[0086] S302. Calculate the temperature rise parameters of the contact group based on the temperature difference between the second temperature and the first temperature.

[0087] The first temperature of the internal environment of the circuit breaker can characterize the reference temperature inside the circuit breaker. The target device connected to the stationary contact in the contact group can be a magnetic trip unit, a wiring device, etc., which is not limited here. Optionally, the wiring device can be a copper busbar.

[0088] Experiments have shown that when the circuit breaker contacts are closed, due to the contact resistance of the contact group, Joule heating will inevitably occur when current flows through the contact surface of the stationary and moving contacts, causing a temperature rise in the contact surface. According to the temperature transfer law, under relatively stable internal environment conditions of the circuit breaker, the second temperature of the target device connected to the stationary contact can well reflect the temperature of the contact group. Therefore, by measuring the temperature difference between the second temperature of the target device connected to the stationary contact in the contact group and the first temperature of the internal environment of the circuit breaker, the temperature rise parameters of the contact group when current flows through the contact surface of the stationary and moving contacts can be obtained.

[0089] Optionally, the circuit breaker may include a temperature sensor, which includes a first temperature sensor and a second temperature sensor. The steps described above, namely obtaining the first temperature of the internal environment of the circuit breaker and the second temperature of the target device connected to the stationary contact in the contact group, may include:

[0090] The first temperature of the circuit breaker's internal environment is obtained through the first temperature sensor, and the second temperature of the copper busbar connected to the stationary contacts in the contact group is obtained through the second temperature sensor.

[0091] Optionally, the first temperature sensor can be placed at any location inside the circuit breaker to measure the initial temperature of the internal environment. For example, it can be placed inside the circuit breaker housing or at the center of the circuit breaker. There is no limitation on this, and the choice can be made flexibly according to the actual application scenario. The second temperature sensor can be placed on the copper busbar connecting the stationary contacts in the contact group to measure the temperature parameters of the contact surfaces between the stationary and moving contacts in the contact group. It should be noted that the placement of the second temperature sensor is not limited to this. In some embodiments, while ensuring the normal operation of the circuit breaker and the second temperature sensor, the placement location of the second temperature sensor can be flexibly selected based on installation efficiency.

[0092] As can be seen, the configuration of the first and second temperature sensors is relatively simple when applying the embodiments of this application. When improving the original circuit breaker, it has the characteristics of simple operation, low configuration cost, and strong applicability.

[0093] Figure 4 This is a schematic flowchart illustrating another method for predicting the lifespan of circuit breaker contacts provided in an embodiment of this application. Optionally, as... Figure 4 As shown, the steps for determining the remaining life parameters of the contact group based on its initial and current heat capacity may include:

[0094] S401. Calculate the heat capacity difference between the initial heat capacity and the current heat capacity.

[0095] S402. Determine the remaining life parameters of the contact group based on the heat capacity difference and the initial heat capacity.

[0096] The heat capacity difference characterizes the change in heat capacity of the contact assembly due to wear. The remaining life parameter of the contact assembly can be determined based on the ratio between the heat capacity difference and the initial heat capacity. A larger ratio indicates a smaller remaining life parameter and a shorter remaining life, while a smaller ratio indicates a larger remaining life parameter and a longer remaining life.

[0097] In some embodiments, when determining the remaining life parameter of the contact group, the remaining life parameter of the contact group can also be determined based on the ratio between the heat capacity difference and the initial heat capacity and the initial number of times the contact group can be closed or broken. The initial number of times the contact group can be closed represents the number of times the contact group can be closed when it has not worn down (e.g., a new contact group). Based on this description, the product of this ratio and the initial number of times the contact group can be closed or broken can be calculated, and this product is taken as the remaining number of times the contact group can be closed or broken.

[0098] Figure 5 This is a flowchart illustrating another method for predicting the lifespan of circuit breaker contacts provided in this application. Optionally, as... Figure 5 As shown, the steps for obtaining the current contact resistance of the contact group based on the temperature rise parameter may include:

[0099] S501. Obtain the thermal conductivity and electrical conductivity of the contact group respectively.

[0100] Optionally, the thermal conductivity of the contact group can be obtained by reading a preset thermal conductivity configuration table, and the electrical conductivity of the contact group can be obtained by reading a preset electrical conductivity configuration table. The preset thermal conductivity configuration table may include the thermal conductivity of various contact materials, and the preset electrical conductivity may include the electrical conductivity of various contact materials.

[0101] Based on the above explanation, the thermal conductivity of the contact group will be used as an example. In practice, the target contact material type of the contact group in the circuit breaker can be obtained. Based on the target contact material type, the corresponding thermal conductivity can be obtained by querying the preset thermal conductivity mapping table, and the thermal conductivity can be used as the thermal conductivity of the contact group.

[0102] Of course, the specific acquisition method is not limited to this. In some embodiments, the circuit breaker may include a communication unit. The circuit breaker can read its attribute parameters to obtain the target contact material type of the contact group, and send a thermal conductivity acquisition request to the user terminal through the communication unit to request the thermal conductivity corresponding to the target contact material type. For the user terminal, after receiving the thermal conductivity acquisition request, it can return the thermal conductivity corresponding to the target contact material type to the circuit breaker. Then, the circuit breaker can use the thermal conductivity corresponding to the target contact material type as the thermal conductivity of the contact group. The acquisition method can be flexibly selected according to the actual application scenario.

[0103] S502. Calculate the current contact resistance of the contact group based on the temperature rise parameters, thermal conductivity, electrical conductivity, and current parameters flowing through the contact group.

[0104] In some embodiments, the current contact resistance of the contact group can be calculated using the following formula:

[0105]

[0106] Where r represents the current contact resistance of the contact group; T represents the temperature rise parameter of the contact group; γ represents the thermal conductivity of the contact group; ρ represents the electrical conductivity of the contact group; and I represents the current parameter flowing through the contact group.

[0107] By applying the embodiments of this application, since the contact state of the contact group can be comprehensively reflected by the temperature rise parameters, thermal conductivity, electrical conductivity and current parameters flowing through the contact group, a more accurate current contact resistance can be obtained, and based on this, a more accurate remaining life parameters of the contact group can be obtained.

[0108] Figure 6 This is a schematic flowchart illustrating another method for predicting the lifespan of circuit breaker contacts provided in an embodiment of this application. Optionally, as... Figure 6 As shown, the above method also includes:

[0109] S601. If it is determined that the remaining life parameters of the contact group meet the preset threshold, an alarm signal is issued.

[0110] The preset threshold, also known as the remaining life threshold of the contact group, represents the critical point in the contact group's lifespan. If the remaining life parameter of the contact group is determined to be less than or equal to the preset threshold, it indicates that the wear of the contact group is already quite severe, and continued use would pose a certain safety hazard. In this case, the circuit breaker can optionally issue audible and / or visual alarms to alert maintenance personnel to the circuit breaker's operating status and promptly replace the contact group, thereby improving the reliability of the circuit breaker. For example, an alarm can be triggered by flashing indicator lights on the circuit breaker.

[0111] Of course, in some embodiments, a communication unit can also be provided inside the circuit breaker. If it is determined that the remaining life parameter of the contact group is less than or equal to the preset threshold, an alarm signal can be sent to the user terminal through the communication unit. Optionally, the user terminal can be a computer, smartphone, tablet, wearable device, LCD screen, etc. The alarm signal can be displayed in the form of SMS, email, pop-up window, etc., without limitation, and can be flexibly selected according to the actual application scenario. For example, when an alarm is triggered, the circuit breaker can send an alarm signal to the LCD screen through the communication unit. The LCD screen can generate alarm information and display it based on the alarm signal. The alarm information can include the alarm reason, alarm time, alarm frequency, etc., without limitation, and can vary according to the actual application scenario.

[0112] Optionally, the temperature sensor mentioned above can be any one of the following: an infrared temperature sensor, an integrated chip temperature sensor, a positive temperature coefficient thermistor, or a negative temperature coefficient thermistor.

[0113] The principle of infrared temperature sensors is based on the radiative thermal effect, which causes the detection device to receive radiant energy, resulting in an increase in temperature and thus changes in the temperature-dependent performance of the sensor.

[0114] Integrated chip temperature sensors integrate integrated circuits and sensors into one unit. These integrated chip temperature sensors can integrate various units, including temperature-sensitive devices, signal amplification circuits, temperature compensation circuits, and reference power supply circuits. There are no limitations on this, and each unit can be added or removed depending on the actual application scenario.

[0115] Positive temperature coefficient (PTC) thermistors and negative temperature coefficient (NTC) thermistors are semiconductor resistors classified according to the relationship between temperature and resistance. PTC thermistors have a higher resistance at higher temperatures, while NTC thermistors have a lower resistance at higher temperatures.

[0116] Depending on the actual application scenario of the circuit breaker, any of the above-mentioned types of temperature sensors can be selected to predict the lifespan of the contact group in the circuit breaker. Of course, the types of the first and second temperature sensors can be the same or different, and can be flexibly selected according to the actual application scenario. For example, the first temperature sensor can be an infrared temperature sensor, and the second temperature sensor can be a positive temperature coefficient thermistor.

[0117] It is worth noting that the type of temperature sensor is not limited to the types shown above. Depending on the actual application scenario, thermocouple temperature sensors, platinum resistance temperature sensors, etc. can also be selected, and no limitation is made here.

[0118] Figure 7 This is a functional module diagram of a circuit breaker contact life prediction device provided in this application embodiment. The basic principle and technical effects of this device are the same as those of the corresponding method embodiment described above. For the sake of brevity, parts not mentioned in this embodiment can be referred to the corresponding content in the method embodiment. Figure 7 As shown, the lifetime prediction device 100 includes:

[0119] The first acquisition module 110 is used to acquire the impedance correction coefficient of the contact group in the circuit breaker;

[0120] The second acquisition module 120 is used to acquire the current thermal capacity of the contact group based on the impedance correction coefficient and the breaking current of the circuit breaker, wherein the breaking current is the current of the closed circuit before the circuit breaker performs the breaking operation.

[0121] The determining module 130 is used to determine the remaining life parameters of the contact group based on the initial heat capacity and the current heat capacity of the contact group.

[0122] In an optional implementation, the first acquisition module 110 is specifically used to acquire the temperature rise parameters of the contact group;

[0123] Based on the temperature rise parameters, obtain the current contact resistance of the contact group;

[0124] The impedance correction coefficient is obtained based on the initial contact resistance and the current contact resistance of the contact group.

[0125] In an optional implementation, the first acquisition module 110 is specifically used to acquire the first temperature of the internal environment of the circuit breaker and the second temperature of the target device connected to the stationary contact in the contact group; and to calculate the temperature rise parameter of the contact group based on the temperature difference between the second temperature and the first temperature.

[0126] In an optional embodiment, the circuit breaker includes a temperature sensor, which includes a first temperature sensor and a second temperature sensor. The first acquisition module 110 is specifically used to acquire a first temperature of the internal environment of the circuit breaker through the first temperature sensor.

[0127] The second temperature of the copper busbar connected to the stationary contact in the contact group is obtained by the second temperature sensor.

[0128] The temperature rise parameters of the contact group are determined based on the first temperature and the first temperature.

[0129] In an optional implementation, the determining module 130 is specifically used to calculate the heat capacity difference between the initial heat capacity and the current heat capacity;

[0130] The remaining life parameters of the contact group are determined based on the heat capacity difference and the initial heat capacity.

[0131] In an optional implementation, the first acquisition module 110 is specifically used to acquire the thermal conductivity and electrical conductivity of the contact group respectively;

[0132] The current contact resistance of the contact group is calculated based on the temperature rise parameter, the thermal conductivity, the electrical conductivity, and the current parameter flowing through the contact group.

[0133] In an optional implementation, the determining module 130 is further configured to issue an alarm signal if it is determined that the remaining lifespan parameter of the contact group meets a preset threshold.

[0134] In an optional embodiment, the temperature sensor is any one of an infrared temperature sensor, an integrated chip temperature sensor, a positive temperature coefficient thermistor, or a negative temperature coefficient thermistor.

[0135] The above-described device is used to execute the method provided in the foregoing embodiments, and its implementation principle and technical effect are similar, so they will not be described again here.

[0136] These modules can be one or more integrated circuits configured to implement the above methods, such as one or more Application Specific Integrated Circuits (ASICs), one or more microprocessors, or one or more Field Programmable Gate Arrays (FPGAs). Alternatively, when a module is implemented using processing element scheduler code, the processing element can be a general-purpose processor, such as a Central Processing Unit (CPU) or other processor capable of calling program code. Furthermore, these modules can be integrated together as a system-on-a-chip (SOC).

[0137] Figure 8 This is a schematic diagram of an electronic device structure provided in an embodiment of this application. This electronic device can be integrated into a circuit breaker. Figure 8 As shown, the electronic device may include a processor 210, a storage medium 220, and a bus 230. The storage medium 220 stores machine-readable instructions executable by the processor 210. When the electronic device is running, the processor 210 communicates with the storage medium 220 via the bus 230, and the processor 210 executes the machine-readable instructions to perform the steps of the above method embodiment. The specific implementation and technical effects are similar and will not be described in detail here.

[0138] Optionally, this application also provides a storage medium storing a computer program, which, when run by a processor, executes the steps of the above-described method embodiments. The specific implementation and technical effects are similar and will not be repeated here.

[0139] In the several embodiments provided in this application, it should be understood that the disclosed apparatus and methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative; for instance, the division of units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be through some interfaces; the indirect coupling or communication connection between apparatuses or units may be electrical, mechanical, or other forms.

[0140] The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.

[0141] Furthermore, the functional units in the various embodiments of this application can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated unit can be implemented in hardware or in a combination of hardware and software functional units.

[0142] The integrated units implemented as software functional units described above can be stored in a computer-readable storage medium. These software functional units, stored in a storage medium, include several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) or processor to execute some steps of the methods of the various embodiments of this application. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0143] It should be noted that, in this document, relational terms such as "first" and "second" are used merely to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Unless otherwise specified, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes the element.

[0144] The above are merely preferred embodiments of this application and are not intended to limit this application. Various modifications and variations are possible for those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the protection scope of this application. It should be noted that similar reference numerals and letters in the following figures indicate similar items; therefore, once an item is defined in one figure, it does not need further definition and explanation in subsequent figures. The above are merely preferred embodiments of this application and are not intended to limit this application. Various modifications and variations are possible for those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the protection scope of this application.

Claims

1. A method for predicting the lifespan of circuit breaker contacts, characterized in that, include: Obtain the impedance correction coefficient for the contact group in the circuit breaker; The current thermal capacity of the contact group is obtained based on the impedance correction coefficient and the breaking current of the circuit breaker, wherein the breaking current is the current of the closed circuit before the circuit breaker performs the breaking operation; The remaining life parameters of the contact group are determined based on the initial heat capacity and the current heat capacity of the contact group.

2. The method according to claim 1, characterized in that, The process of obtaining the impedance correction coefficient of the contacts in the circuit breaker includes: Obtain the temperature rise parameters of the contact group; Based on the temperature rise parameters, obtain the current contact resistance of the contact group; The impedance correction coefficient is obtained based on the initial contact resistance and the current contact resistance of the contact group.

3. The method according to claim 2, characterized in that, The acquisition of the temperature rise parameters of the contact group includes: The first temperature of the internal environment of the circuit breaker and the second temperature of the target device connected to the stationary contact in the contact group are obtained respectively. The temperature rise parameters of the contact group are calculated based on the temperature difference between the second temperature and the first temperature.

4. The method according to claim 3, characterized in that, The circuit breaker includes a temperature sensor, which comprises a first temperature sensor and a second temperature sensor. The step of acquiring a first temperature of the internal environment of the circuit breaker and a second temperature of the target device connected to the stationary contact in the contact group includes: The first temperature of the internal environment of the circuit breaker is obtained by the first temperature sensor. The second temperature of the copper busbar connected to the stationary contact in the contact group is obtained by the second temperature sensor.

5. The method according to claim 1, characterized in that, The step of determining the remaining life parameters of the contact group based on the initial heat capacity and the current heat capacity of the contact group includes: Calculate the heat capacity difference between the initial heat capacity and the current heat capacity; The remaining life parameters of the contact group are determined based on the heat capacity difference and the initial heat capacity.

6. The method according to claim 2, characterized in that, The step of obtaining the current contact resistance of the contact group based on the temperature rise parameter includes: The thermal conductivity and electrical conductivity of the contact group were obtained respectively. The current contact resistance of the contact group is calculated based on the temperature rise parameter, the thermal conductivity, the electrical conductivity, and the current parameter flowing through the contact group.

7. The method according to claim 1, characterized in that, The method further includes: If the remaining lifespan parameter of the contact group is determined to meet the preset threshold, an alarm signal is issued.

8. The method according to claim 4, characterized in that, The temperature sensor is any one of the following: an infrared temperature sensor, an integrated chip temperature sensor, a positive temperature coefficient thermistor, or a negative temperature coefficient thermistor.

9. A lifespan prediction device for low-voltage electrical appliances, characterized in that, include: The first acquisition module is used to acquire the impedance correction coefficient of the contact group in the circuit breaker; The second acquisition module is used to acquire the current thermal capacity of the contact group based on the impedance correction coefficient and the breaking current of the circuit breaker, wherein the breaking current is the current of the closed circuit before the circuit breaker performs the breaking operation; The determination module is used to determine the remaining life parameters of the contact group based on the initial heat capacity and the current heat capacity of the contact group.

10. A circuit breaker, characterized in that, The circuit breaker is used to perform the steps of the life prediction method for the circuit breaker contacts of any one of claims 1-8.

11. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores a computer program that, when executed by a processor, performs the steps of the life prediction method for circuit breaker contacts as described in any one of claims 1-8.

Images