A method, device, equipment and medium for characterizing pore structure of a tight reservoir

By performing edge removal and equidistant segmentation on tight reservoir samples, combined with nanoscale X-ray CT scanning and ultrasonic measurement, reservoir pressure conditions were constructed, and a relationship model between sensitive properties and pore structure parameters was established. This solved the limitations of tight reservoir pore structure characterization and improved diversity and accuracy.

CN117851715BActive Publication Date: 2026-06-09CHINA PETROLEUM & CHEMICAL CORP +1
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Patent Information

Authority / Receiving Office
CN Β· China
Patent Type
Patents(China)
Current Assignee / Owner
CHINA PETROLEUM & CHEMICAL CORP
Filing Date
2022-09-30
Publication Date
2026-06-09

AI Technical Summary

Technical Problem

Existing technologies cannot effectively characterize the pore structure of tight reservoirs, leading to limitations in evaluation and increased exploration risks, and a lack of attention to the geophysical response characteristics of different pore structures.

Method used

Tight reservoir samples were collected, edge removal and equidistant segmentation were performed, reservoir pressure conditions were constructed, porosity and transverse and longitudinal wave velocities were measured using nanoscale X-ray CT scanning and ultrasonic probes, cross-sectional images of elastic parameters and attenuation properties were constructed, and a relationship model between sensitive properties and pore structure parameters was established.

Benefits of technology

By using multi-angle measurements and depth probing, the limitations of pore structure characterization are reduced, the diversity and accuracy of pore structure in tight reservoirs are improved, and the ability to describe the pore structure characteristics of samples is enhanced.

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Abstract

The present application relates to the field of rock physics, and discloses a method and device for characterizing pore structure of a tight reservoir, an electronic device and a storage medium. The method comprises: performing edge removal processing on a tight reservoir sample, and performing equidistant segmentation processing on the edge-removed sample; constructing a reservoir pressure condition of the equidistant segmented sample, and measuring sample porosity of the equidistant segmented sample; detecting a pore type of the equidistant segmented sample, performing non-destructive scanning on the equidistant segmented sample, obtaining a gray scale frequency distribution of the equidistant segmented sample, and identifying pore structure parameters; calculating P and S wave velocities and waveform images, extracting elastic parameters, and extracting attenuation attributes of the equidistant segmented sample; constructing an intersection image, identifying sensitive attributes of the equidistant segmented sample, constructing a relationship model, performing pore structure characterization processing on the tight reservoir sample, and obtaining pore structure characterization results of the tight reservoir sample. The present application can reduce the limitations of pore structure characterization of the tight reservoir.
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