Processing device control method and control apparatus, processing device

Abstract

The application discloses a processing equipment control method and device and processing equipment, and relates to the technical field of material processing and detection. The processing equipment control method outputs image capturing position information to a driving device. When the driving device drives a workpiece to an AOI detection mechanism, the AOI detection mechanism triggers the image capturing of the workpiece. The AOI detection mechanism captures the image of the workpiece based on the triggering of the AOI detection mechanism, processes the captured image to obtain an image processing result, and determines the processing yield information of the workpiece according to the image processing result. In this way, the application can continuously obtain the image of the workpiece at the corresponding position of the AOI detection mechanism during the movement of the workpiece driven by the driving device, process the image, and obtain the processing yield information of the workpiece, thereby improving the AOI detection efficiency of the workpiece, meeting the efficient production requirements of the processing equipment, and further improving the production efficiency of the processing equipment.

Description

Technical Field

[0001] The present application relates to the technical field of material processing and detection, and in particular to a processing equipment control method and control device, and processing equipment. Background Art

[0002] In modern manufacturing, automation and intelligent processes are key factors in improving production efficiency and product quality. Real-time inspection and quality control of workpieces are particularly important in high-volume production lines. Traditional manual inspection methods are not only inefficient but also difficult to ensure consistency and accuracy. Especially on high-speed stamping production lines, manual inspections often rely solely on sampling, which increases the risk of defective products, potentially leading to waste of raw materials and reduced production efficiency.

[0003] Existing AOI (Automatic Optical Inspection) technology typically uses a fixed-cycle parallel processing model to meet the continuous inspection needs of production lines. However, as the production efficiency of processing equipment continues to improve, this traditional fixed-cycle parallel processing model has gradually become unable to meet the high-efficiency production needs of processing equipment, thereby reducing production efficiency of processing equipment.

[0004] The above content is only used to assist in understanding the technical solution of this application and does not constitute an admission that the above content is prior art. Summary of the Invention

[0005] The main purpose of this application is to provide a processing equipment control method and control device, and processing equipment, aiming to improve the AOI inspection efficiency of processed parts.

[0006] To achieve the above objectives, the present application proposes a method for controlling a processing device, wherein the processing device includes a drive device and an AOI inspection mechanism, wherein the drive device is used to drive a processed workpiece to move to the AOI inspection mechanism, and the method includes:

[0007] outputting imaging position information to the driving device;

[0008] When the driving device drives the workpiece to the AOI inspection mechanism, the driving device triggers the AOI inspection mechanism to capture an image of the workpiece;

[0009] The AOI detection mechanism captures an image of the workpiece based on the triggering of the AOI detection mechanism, and processes the captured image to obtain an image processing result;

[0010] The processing yield information of the workpiece is determined according to the image processing result.

[0011] In one embodiment, after the step of determining the processing yield information of the workpiece according to the image processing result, the method further includes:

[0012] The processing yield information of the workpiece is received, and the duration from outputting the imaging position information to receiving the processing yield information of the workpiece is recorded as a first duration.

[0013] In one embodiment, after the step of outputting the imaging position information to the driving device, the method further includes:

[0014] The driving device drives the workpiece to move toward the direction of the AOI detection mechanism at a corresponding first movement speed according to the imaging position information.

[0015] In one embodiment, the method further comprises:

[0016] According to the first time duration and the first movement speed, a speed adjustment control instruction is output to the driving device to control the driving device to adjust the movement speed of the workpiece toward the direction of the AOI detection mechanism.

[0017] In one embodiment, the driving device is capable of driving a plurality of workpieces after processing to move; the AOI inspection mechanism captures an image of the workpiece based on the triggering of the AOI inspection mechanism, and processes the captured image to obtain an image processing result, the steps comprising:

[0018] The AOI detection mechanism sequentially captures images of the plurality of workpieces based on the triggering of the AOI detection mechanism, and when the first image of the workpiece is acquired, sequentially processes the acquired images of the plurality of workpieces to obtain image processing results of each workpiece.

[0019] In one embodiment, a preset number of processing yield information of the workpieces is received in sequence, and a time duration from outputting the imaging position information to receiving the last processing yield information of the preset number is recorded as a second time duration;

[0020] According to the second time duration and the first movement speed, a speed adjustment control instruction is output to the driving device to control the driving device to adjust the movement speed of the workpiece in the direction of the AOI detection mechanism.

[0021] In one embodiment, the step of outputting a speed adjustment control instruction to the driving device based on the second duration and the first movement speed to control the driving device to adjust the movement speed of the workpiece in the direction of the AOI inspection mechanism includes:

[0022] Determining an average duration for obtaining the yield information of the workpiece according to the second duration;

[0023] determining a target movement speed according to a preset distance between each of the workpieces and an average time duration for obtaining yield information of the workpieces;

[0024] Output a speed adjustment control instruction to the driving device to control the driving device to adjust the first movement speed to the target movement speed to drive the workpiece to move in the direction of the AOI detection mechanism.

[0025] In one embodiment, the step of outputting the image capture position information to the driving device includes:

[0026] Outputting the image capture position information to the driving device using a unilateral communication protocol;

[0027] The step of receiving the processing yield information of the workpiece and recording the time from outputting the imaging position information to receiving the processing yield information of the workpiece as a first time includes:

[0028] A unilateral communication protocol is used to receive the processing yield information of the workpiece, and a time duration from outputting the imaging position information to receiving the processing yield information of the workpiece is recorded as a first time duration.

[0029] In addition, to achieve the above-mentioned purpose, the present application also proposes a processing equipment control device, which includes: a memory, a processor, and a processing equipment control program stored on the memory and executable on the processor, and the processing equipment control program is configured to implement the steps of the processing equipment control method.

[0030] In addition, to achieve the above-mentioned purpose, the present application also proposes a processing equipment, which includes a transmission mechanism, a stamping mechanism and an AOI detection mechanism. The processing equipment uses the processing equipment control method, or the processing equipment includes the processing equipment control device.

[0031] The processing equipment control method of the present application is applied to processing equipment, and the processing equipment includes a driving device and an AOI detection mechanism. The driving device is used to drive the processed workpiece to move to the AOI detection mechanism. The processing equipment control method outputs imaging position information to the driving device. When the driving device drives the workpiece to the AOI detection mechanism, it triggers the AOI detection mechanism to capture an image of the workpiece. The AOI detection mechanism captures the workpiece based on the triggering of the AOI detection mechanism, and processes the captured image to obtain an image processing result, and then determines the processing yield information of the workpiece based on the image processing result. In this way, the present application can continuously capture the image of the workpiece at the corresponding position of the AOI detection mechanism while the driving device drives the workpiece to move, and process it to obtain the processing yield information of the workpiece, thereby improving the AOI detection efficiency of the workpiece, so that it meets the efficient production requirements of the processing equipment, and thus improving the production efficiency of the processing equipment. BRIEF DESCRIPTION OF THE DRAWINGS

[0032] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present application and, together with the description, serve to explain the principles of the present application.

[0033] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, for ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0034] Figure 1 A flow chart illustrating an embodiment of a method for controlling processing equipment according to the present application;

[0035] Figure 2 A flow chart illustrating another embodiment of the processing equipment control method of the present application;

[0036] Figure 3 A flow chart illustrating another embodiment of the processing equipment control method of the present application;

[0037] Figure 4 A flow chart illustrating another embodiment of the processing equipment control method of the present application;

[0038] Figure 5 A flow chart illustrating another embodiment of the processing equipment control method of the present application;

[0039] Figure 6 A flow chart illustrating another embodiment of the processing equipment control method of the present application;

[0040] Figure 7A flow chart illustrating another embodiment of the processing equipment control method of the present application;

[0041] Figure 8 A flow chart illustrating another embodiment of the processing equipment control method of the present application;

[0042] Figure 9 This is a timing diagram of the operation of the processing equipment provided in an embodiment of the processing equipment control method of this application.

[0043] Description of the drawings: 10. Processing equipment control device; 20. Driving device; 21. Driver; 22. Transmission mechanism; 30. AOI inspection mechanism; 40. Workpiece.

[0044] The purpose, features and advantages of this application will be further explained in conjunction with the embodiments and with reference to the accompanying drawings. DETAILED DESCRIPTION

[0045] It should be understood that the specific embodiments described herein are merely used to explain the technical solutions of the present application and are not intended to limit the present application.

[0046] In order to better understand the technical solution of the present application, a detailed description will be given below in conjunction with the accompanying drawings and specific implementation methods.

[0047] The main solution of the embodiment of the present application is: the processing equipment includes a driving device 20 and an AOI detection mechanism 30, the driving device 20 is used to drive the processed workpiece 40 to move to the AOI detection mechanism 30, and the method includes:

[0048] Outputting imaging position information to the driving device 20;

[0049] When the driving device 20 drives the workpiece 40 to the AOI inspection mechanism 30 , the driving device 20 triggers the AOI inspection mechanism 30 to capture an image of the workpiece 40 ;

[0050] The AOI detection mechanism 30 captures an image of the workpiece 40 based on the triggering of the AOI detection mechanism 30 and processes the captured image to obtain an image processing result;

[0051] The processing yield information of the workpiece 40 is determined according to the image processing result.

[0052] In this embodiment, for ease of description, the following description will be made with the identification processing equipment control device 10 as the execution entity.

[0053] In modern manufacturing, automation and intelligent processing are key factors in improving production efficiency and product quality. Real-time inspection and quality control of workpieces 40 are particularly important in high-volume production lines. Traditional manual inspection methods are not only inefficient but also difficult to ensure consistency and accuracy. Especially on high-speed stamping production lines, manual inspections often rely solely on sampling, which undoubtedly increases the risk of defective products, potentially leading to waste of raw materials and reduced production efficiency.

[0054] Existing AOI (Automatic Optical Inspection) technology typically uses a fixed-beat parallel processing mode to meet the continuous inspection requirements of the production line. Specifically, the fixed-beat parallel processing mode first controls the drive device 20 to drive the processed workpiece 40 to the corresponding position of the AOI inspection mechanism 30. Here, the drive device 20 is controlled to stop moving and send a signal to the AOI inspection mechanism 30 to interact with it. After the interaction is completed, the AOI inspection mechanism 30 is then prompted to obtain an image of the workpiece 40. While performing the above process, the image already obtained by the AOI inspection mechanism 30 is processed to identify defects in the workpiece 40 and obtain processing yield information. By repeating the above steps, the workpiece 40 can be continuously inspected for defects using the fixed-beat parallel processing mode.

[0055] It is understandable that in the process of continuously inspecting defects on the workpiece 40 using the above-mentioned fixed-beat parallel method, the AOI inspection mechanism 30 needs to wait until the drive device 20 stops moving before it can acquire an image of the workpiece 40, so as to perform subsequent image processing and determine the processing yield information. Although this method can achieve continuous inspection of the workpiece 40, each inspection requires waiting for the drive device 20 to stop moving before triggering the AOI inspection mechanism 30 to take an image, which undoubtedly increases the inspection time interval and reduces the inspection efficiency. This loss of efficiency may be more significant, especially in high-output production lines. At the same time, the frequent interaction between the processing equipment control device 10 and the AOI inspection mechanism 30 also consumes a lot of time, resulting in a decrease in the inspection efficiency of the AOI inspection mechanism 30, thereby reducing the production efficiency of the processing equipment. Therefore, with the continuous improvement of the production efficiency of processing equipment, the traditional fixed-beat parallel processing mode has gradually failed to meet the efficient production requirements of processing equipment, thereby reducing the production efficiency of processing equipment.

[0056] The present application provides a solution in which a processing device includes a drive device 20 and an AOI inspection mechanism 30. The drive device 20 is used to drive a processed workpiece 40 to move to the AOI inspection mechanism 30. The processing device control method outputs imaging position information to the drive device 20. When the drive device 20 drives the workpiece 40 to the AOI inspection mechanism 30, it triggers the AOI inspection mechanism 30 to capture an image of the workpiece 40. Based on the triggering of the AOI inspection mechanism 30, the AOI inspection mechanism 30 captures an image of the workpiece 40 and processes the captured image to obtain an image processing result. The processing yield information of the workpiece 40 is then determined based on the image processing result. In this way, the present application can continuously capture images of the workpiece 40 at the corresponding position of the AOI inspection mechanism 30 while the drive device 20 drives the workpiece 40 to move, and process the images to obtain the processing yield information of the workpiece 40, thereby improving the AOI inspection efficiency of the workpiece 40, so that it meets the efficient production requirements of the processing equipment, and thus improving the production efficiency of the processing equipment.

[0057] It should be noted that the execution subject of this embodiment can be a computing service device with data processing, network communication, and program execution functions, such as a tablet computer, personal computer, mobile phone, etc., or an electronic device capable of implementing the above functions, such as the processing equipment control device 10. The processing equipment control device 10 is used as an example to illustrate this embodiment and the following embodiments.

[0058] Based on this, an embodiment of the present application provides a processing equipment control method, which is applied to processing equipment. The processing equipment includes a driving device 20 and an AOI detection mechanism 30. The driving device 20 is used to drive the processed workpiece 40 to move to the AOI detection mechanism 30.

[0059] In this embodiment, reference Figure 8The driving device 20 may include a driver 21 and a transmission mechanism 22, wherein the driver 21 and the transmission mechanism 22 are electrically connected. The transmission mechanism 22 can move according to the driving signal output by the driver 21, thereby driving the workpiece 40 to move within the processing equipment. The transmission mechanism 22 may include components such as a motor, a transmission belt, a chain, and a gear. The driver 21 receives the driving signal output by the processing equipment control device 10, and outputs a corresponding driving current or driving voltage to the motor according to the driving signal. The motor rotates accordingly according to the received driving current or driving voltage, thereby driving the transmission belt, chain, or gear and other components to move, thereby achieving the movement of the workpiece 40 within the processing equipment. The driving device 20 may also include a transmission mechanism 22 and an amplifier, wherein the amplifier is electrically connected to the transmission mechanism 22. The transmission mechanism 22 can move according to the amplified signal output by the amplifier, thereby driving the workpiece 40 to move within the processing equipment. The amplifier receives the driving signal output by the processing equipment control device 10, amplifies the driving signal, and outputs the amplified driving signal to the transmission mechanism 22. The transmission mechanism 22 performs corresponding movement according to the received amplified driving signal, thereby driving the processing workpiece 40.

[0060] In this embodiment, the workpiece 40 can be a workpiece formed by stamping, cutting or other processing techniques of the material to be processed. After the workpiece 40 is processed on the processing equipment, it needs to be quality inspected to ensure that it meets the preset quality standards. In particular, when the workpiece 40 is a stamped part formed by stamping the material to be processed, since the punch for the stamping process is a wearing part, poor quality will occur under long-term use, so that the workpiece 40 may have various types of defects such as burrs, scratches, deformation, etc. Because the processing efficiency of the processing equipment is generally very high, manual inspection can only adopt sampling processing methods, which may cause the batch of the workpiece 40 stamping parts to be defective. For this reason, the present application uses the AOI detection mechanism 30 to check the size and appearance of the stamped parts in real time, so as to achieve the purpose of improving product quality, reducing raw material loss and ineffective work output.

[0061] In this embodiment, the AOI inspection mechanism 30 may include an image acquisition device and an image processing device. The image acquisition device may be an industrial camera or CCD camera with high resolution and high speed, used to capture images of the workpiece 40 in real time. The image processing device may include a high-performance computer or a dedicated image processing chip for rapid processing and analysis of the captured images. The image processing device may perform image preprocessing, such as filtering and denoising, to improve image quality. It then uses algorithms such as feature extraction and pattern recognition to detect defects on the workpiece 40 and determine the processing yield.

[0062] Reference Figure 1In this embodiment, the processing equipment control method includes steps S100 to S400:

[0063] In step S100 , the image capturing position information is output to the driving device 20 .

[0064] It should be noted that the imaging position information includes the imaging position, which can be a position coordinate or coordinate range corresponding to the image acquisition device of the AOI detection mechanism 30, and is used to instruct the drive device 20 to drive the workpiece 40 to the position corresponding to the AOI detection mechanism 30 for imaging. By outputting the imaging position information to the drive device 20 by the processing equipment control device 10, the drive device 20 can drive the workpiece 40 to the position corresponding to the AOI detection mechanism 30 according to the imaging position information, thereby performing image acquisition and processing. In this embodiment, the processing equipment control device 10 can use a unilateral communication protocol to output the imaging position information to the drive device 20, for example, using a network communication protocol such as TCP / IP to send the imaging position information to the drive device 20, thereby improving the interaction efficiency and stability between the processing equipment control device 10 and the AOI detection mechanism 30.

[0065] In step S200 , when the driving device 20 drives the workpiece 40 to the AOI inspection mechanism 30 , the driving device 20 triggers the AOI inspection mechanism 30 to capture an image of the workpiece 40 .

[0066] In this embodiment, after receiving the imaging position information, the drive device 20 begins to move the workpiece 40 according to a preset motion trajectory and speed to the position coordinates or coordinate range corresponding to the image acquisition device of the AOI inspection mechanism 30. When the workpiece 40 moves to the imaging position corresponding to the AOI inspection mechanism 30, the drive device 20 triggers the AOI inspection mechanism 30 to capture an image of the workpiece 40.

[0067] In this embodiment, the driver 21 includes an encoder capable of monitoring the rotation angle, position, and speed of the motor shaft in real time. When the motor drives the conveyor belt or product to a preset imaging position detected by the encoder, the driver 21 receives a signal transmitted by the encoder, converts the signal into a control instruction, and sends it to the AOI detection mechanism 30. Upon receiving the control instruction, the AOI detection mechanism 30 immediately activates its image acquisition device, such as an industrial camera or a CCD camera, to perform high-speed, high-resolution image acquisition of the workpiece 40 at the imaging position. In other words, through a hard trigger, the AOI detection mechanism 30 automatically performs image acquisition when the workpiece 40 reaches the specified position. This hard trigger method is immediate, reliable, and unaffected by software delays, ensuring the accuracy and real-time nature of image acquisition and improving the efficiency of AOI inspection.

[0068] In this embodiment, in addition to using a hard trigger to enable the AOI inspection mechanism 30 to automatically capture images when the workpiece 40 reaches a specified position, the present application can also implement this function by using a motion state trigger. Specifically, the processing equipment control device 10 can monitor the motion state of the drive device 20 in real time. When it is determined that the workpiece 40 has moved to the imaging position corresponding to the AOI inspection mechanism 30, it triggers the AOI inspection mechanism 30 to perform image capture through software control. In addition, the present application can also trigger the AOI inspection mechanism 30 to perform image capture at preset intervals, thereby achieving continuous or periodic inspection of the workpiece 40.

[0069] In step S300 , the AOI inspection mechanism 30 captures an image of the workpiece 40 based on the triggering of the AOI inspection mechanism 30 , and processes the captured image to obtain an image processing result.

[0070] In this embodiment, upon receiving a trigger signal, the AOI inspection mechanism 30 immediately activates its image acquisition device, such as a high-resolution industrial camera or CCD camera, to capture high-speed, high-resolution images of the workpiece 40 at the designated location. The captured images are then transmitted to an image processing device for further processing and analysis. The image processing device can perform pre-processing on the images, such as filtering and denoising, to improve image quality and reduce the impact of noise and interference on subsequent processing. Then, using algorithms such as feature extraction and pattern recognition, it performs edge detection and contour extraction on the workpiece 40 in the image, thereby identifying various defects on the workpiece 40, such as burrs, scratches, and deformations. Furthermore, the image processing device can accurately measure the dimensions of the workpiece 40 and compare them with preset standard dimensions to determine whether the workpiece 40 meets dimensional requirements. Finally, the image processing device outputs the processing results as images or data for use by operators or subsequent processes.

[0071] Step S400 : determining the processing yield information of the workpiece 40 according to the image processing result.

[0072] In this embodiment, when determining the processing yield information of the workpiece 40, the image processing results must first be analyzed and evaluated. The image processing results may include dimensional measurement results and defect identification results of the workpiece 40. The dimensional measurement results can be compared with preset standard dimensions. If the measurement results are within the allowable error range, the dimensions are considered acceptable; otherwise, the dimensions are considered unacceptable. For defect identification results, corresponding defect rating standards can be set based on factors such as the type, number, and severity of the identified defects to rank the workpiece 40.

[0073] In this embodiment, the processing yield of workpiece 40 can be comprehensively determined based on the dimensional measurement results and defect identification results. Specifically, a yield threshold can be set. When the dimensions of workpiece 40 are acceptable and the defect rating is below the threshold, the yield is determined to be acceptable; otherwise, the yield is determined to be unacceptable. The yield information can be expressed as a percentage or simply marked as pass / fail to facilitate subsequent processing and statistics.

[0074] In this embodiment, the processing equipment includes a drive device 20 and an AOI inspection mechanism 30. The drive device 20 is used to drive the processed workpiece 40 to move to the AOI inspection mechanism 30. The processing equipment control method outputs imaging position information to the drive device 20. When the drive device 20 drives the workpiece 40 to the AOI inspection mechanism 30, it triggers the AOI inspection mechanism 30 to capture an image of the workpiece 40. Based on the triggering of the AOI inspection mechanism 30, the AOI inspection mechanism 30 captures an image of the workpiece 40 and processes the captured image to obtain an image processing result. Then, based on the image processing result, the processing yield information of the workpiece 40 is determined. In this way, the present application can continuously capture images of the workpiece 40 at the corresponding position of the AOI inspection mechanism 30 while the drive device 20 drives the workpiece 40 to move, and process the images to obtain the processing yield information of the workpiece 40, thereby improving the AOI inspection efficiency of the workpiece 40, so that it meets the efficient production requirements of the processing equipment, thereby improving the production efficiency of the processing equipment.

[0075] In one possible implementation, reference Figure 2 After determining the processing yield information of the workpiece 40 according to the image processing result in step S400, the method further includes:

[0076] In step S500 , the processing yield information of the workpiece 40 is received, and the duration from outputting the imaging position information to receiving the processing yield information of the workpiece 40 is recorded as a first duration.

[0077] In this embodiment, after receiving the processing yield information of the workpiece 40 from the AOI inspection mechanism 30, the processing equipment control device 10 records the entire duration from outputting the imaging position information to receiving the processing yield information, i.e., the first duration. This step allows for a quantitative assessment of the processing equipment's inspection efficiency to facilitate subsequent performance optimization or adjustment. By recording the first duration, the entire process from triggering imaging to obtaining the processing yield information can be intuitively understood, providing data support for subsequent adjustments to the operating speed of the drive device 20 and improving the production efficiency of the processing equipment.

[0078] In this embodiment, a unilateral communication protocol is used to receive the processing yield information of the workpiece 40, and the time from outputting the imaging position information to receiving the processing yield information of the workpiece 40 is recorded and recorded as the first time. For example, a network communication protocol such as TCP / IP is used to receive the processing yield information of the workpiece 40, thereby improving the interaction efficiency and interaction stability between the processing equipment control device 10 and the AOI detection mechanism 30.

[0079] In one possible implementation, reference Figure 3 After the step of outputting the image capturing position information to the driving device 20 in step S100, the method further includes:

[0080] In step S1000 , the driving device 20 drives the workpiece 40 to move toward the direction of the AOI inspection mechanism 30 at a corresponding first movement speed according to the imaging position information.

[0081] In this embodiment, after the drive device 20 receives the imaging position information, it can select a corresponding first motion speed to drive the workpiece 40 to move in the direction of the AOI detection mechanism 30 according to a preset correspondence or control strategy. The selection of the first motion speed should ensure that the workpiece 40 can reach the AOI detection mechanism 30 smoothly and accurately, while taking into account the overall production efficiency of the processing equipment and the characteristics of the workpiece 40. By reasonably setting the first motion speed, it can be ensured that the workpiece 40 has a suitable speed and position when it reaches the AOI detection mechanism 30, thereby improving the accuracy and real-time performance of image acquisition. In addition, the first speed can also be the motion speed of the drive device 20 in the normal working mode, which can be set and adjusted according to the performance of the processing equipment, the characteristics of the workpiece 40, and the actual needs of the production line.

[0082] In one possible implementation, reference Figure 4 The processing equipment control method also includes step S600, outputting a speed adjustment control instruction to the driving device 20 based on the recorded first time length and the first movement speed, so as to control the driving device 20 to adjust the movement speed of the workpiece 40 to move in the direction of the AOI detection mechanism 30.

[0083] In this embodiment, after completing the recording and evaluation of the processing yield information of the workpiece 40, the processing equipment control device 10 can also output a speed adjustment control instruction to the drive device 20 based on the recorded first time period and the first motion speed used by the drive device 20 during the first time period. By adjusting the motion speed of the drive device 20, the inspection efficiency and production performance of the processing equipment can be further optimized. Specifically, if the first time period is too long, it may mean that the motion speed of the drive device 20 is too slow, resulting in low inspection efficiency of the workpiece 40. In this case, the speed adjustment control instruction can be increased to increase the motion speed of the drive device 20 to shorten the inspection time. Conversely, if the first time period is too short, it may mean that the motion speed of the drive device 20 is too fast. Although this can improve inspection efficiency, it may cause an excessive number of images to be processed in the image processing queue of the AOI inspection device, resulting in the real-time and accuracy of image processing being affected and the inability to capture a complete and clear image of the workpiece 40, affecting the quality and accuracy of image acquisition. In this case, the speed adjustment control instruction can be reduced to reduce the motion speed of the drive device 20 to ensure the accuracy of image acquisition and processing. In addition, the output of speed adjustment control instructions can be based on preset rules or algorithms, or dynamically adjusted based on real-time monitoring data and feedback information, to achieve more refined control and management. At the same time, since the processing time of the AOI inspection mechanism for different images acquired may vary, for example, the AOI inspection mechanism will take longer to process images of workpieces with poor image quality or many defects, while the processing time for images of workpieces with good image quality or few defects will be relatively short.

[0084] Therefore, by continuously adjusting and optimizing the movement speed of the driving device 20 , the production performance of the processing equipment and the detection efficiency of the AOI detection mechanism 30 can be adapted, thereby further improving the overall production efficiency of the processing equipment.

[0085] In a feasible embodiment, the driving device 20 can drive the processed workpiece 40 to move. Figure 5 In step S300, the AOI detection mechanism 30 captures an image of the workpiece 40 based on the triggering of the AOI detection mechanism 30, and processes the captured image to obtain an image processing result, including step S310, the AOI detection mechanism 30 captures images of the plurality of workpieces 40 in sequence based on the triggering of the AOI detection mechanism 30, and when the first image of the workpiece 40 is acquired, the acquired images of the plurality of workpieces 40 are processed in sequence to obtain an image processing result for each of the workpieces 40.

[0086] In this embodiment, when the driving device 20 drives multiple workpieces 40 to the position of the AOI detection mechanism 30 in sequence, the detection mechanism will receive a trigger signal. Subsequently, the AOI detection mechanism 30 will perform precise imaging operations on each workpiece 40 one by one in a predetermined order. After acquiring the image of the first workpiece 40, the AOI detection mechanism 30 will not wait for the arrival of images of other workpieces 40, but will immediately start the image processing program to identify possible defects or abnormalities in the workpiece 40. At the same time, the detection mechanism will continue to receive images of subsequent workpieces 40 and perform the same processing on them. In this way, the AOI detection mechanism 30 can fully utilize its performance advantages, reduce waiting time, and improve detection efficiency. During the entire detection process, the imaging and image processing of the workpiece 40 are carried out in parallel, thereby avoiding waste of resources and time delays. In addition, this continuous processing method also helps to maintain the stability and consistency of the detection results, thereby improving the reliability of the detection results.

[0087] In this embodiment, please refer to Figure 9 , Figure 9 The timing diagram of the processing equipment operation is provided for applying for an embodiment of the processing equipment control method. The processing equipment is used to generate four workpieces as an example to illustrate the timing diagram.

[0088] In this embodiment, the processing equipment control device 10 outputs a driving signal to the driving device 20. The driver 21 of the driving device 20 receives the driving signal and drives the transmission mechanism 22 to start accelerating motion. After performing the accelerated motion for a distance d1 at time t01, the transmission mechanism 22 starts to move at a uniform speed. After performing the uniform motion for a distance d2 at time t02, the workpiece 40 is driven at a uniform speed to the corresponding position of the AOI detection mechanism 30. At this time, the AOI detection mechanism 30 is triggered to capture the image of the workpiece 40. Based on the triggering of the AOI detection mechanism 30, the AOI detection mechanism 30 completes the imaging of the workpiece 40 within time t1. While the AOI detection mechanism 30 is capturing the image, the driving device 20 continues to move until it moves a distance d3 and drives the next workpiece 40. Upon reaching the corresponding position of the AOI inspection mechanism 30, which has already completed the previous imaging, it takes another image of the current workpiece 40, completing it within time t2. This process is repeated three times, i.e., after the drive device 20 continues to move for distances d4 and d5, respectively, the AOI inspection mechanism 30 completes the third and fourth imaging within time t3 and t4, respectively. During the final imaging process, the transmission mechanism 22 maintains a uniform speed for a distance d6, decelerates after the imaging is completed, and stops after decelerating for a distance d7 at time t03. After completing the first imaging, the AOI inspection mechanism 30 sequentially processes the four images of the workpiece 40 within time t1', t2', t3', and t4', respectively, to obtain image processing results for the four workpieces 40. In this way, throughout the entire inspection process, imaging and image processing of the workpiece 40 are performed in parallel. The AOI inspection mechanism 30 can fully utilize its performance advantages, reduce waiting time, avoid waste of resources and time delays, and improve inspection efficiency. Moreover, this continuous processing method helps to maintain the stability and consistency of the test results, thereby improving the reliability of the test results.

[0089] It can be understood that after the processing yield information of the workpiece 40 is determined based on the image processing results, the processing yield information is fed back to the processing equipment control device 10, so that the processing equipment control device 10 receives the processing yield information of the workpiece 40. This process can also be carried out in parallel when the AOI inspection equipment processes the captured image, so that the processing equipment control device 10 can obtain the processing yield information of the workpiece 40 in real time, without the AOI inspection equipment spending extra time interacting with the processing equipment control device 10 after the image processing is completed, thereby further improving the production efficiency of the processing equipment.

[0090] In one possible implementation, reference Figure 6 The processing equipment control method further includes steps S710 to S720:

[0091] In step S710 , a preset number of processing yield information of the workpieces 40 are sequentially received, and a time period from outputting the imaging position information to receiving the last processing yield information of the preset number is recorded as a second time period.

[0092] In this embodiment, after completing the recording and evaluation of the processing yield information of a single workpiece 40, the processing equipment control device 10 can further expand its scope of application to group multiple workpieces 40 to achieve monitoring of the production efficiency and quality of each group. Specifically, the processing equipment control device 10 can set the workpieces 40 in each group to a preset number to determine the number of workpieces 40 that need to be continuously monitored. Whenever the drive device 20 drives the workpiece 40 to the AOI detection mechanism 30 for imaging and image processing, the processing equipment control device 10 will receive and record the corresponding processing yield information in real time. Once the preset number of workpieces 40 is reached, the time from the output of the first imaging position information to the receipt of the last processing yield information is calculated and recorded as the second time. This second time can be used as an indicator to evaluate the stability and efficiency of the AOI detection of each group of workpieces 40.

[0093] In step S720 , a speed adjustment control instruction is output to the driving device 20 according to the second duration and the first movement speed, so as to control the driving device 20 to adjust the movement speed of the workpiece 40 moving toward the direction of the AOI inspection mechanism 30 .

[0094] In this embodiment, after completing the monitoring of the production efficiency and quality of a group of workpieces 40, the processing equipment control device 10 can output a speed adjustment control instruction to the drive device 20 based on the recorded second time period and the first movement speed used by the drive device 20 during the first time period. Similar to the case of a single workpiece 40, by adjusting the movement speed of the drive device 20, the overall detection efficiency and production performance of the processing equipment can be further optimized. If the second time period is too long, it may mean that the detection efficiency of the entire production batch or production line is low. In this case, the speed adjustment control instruction can be increased to increase the movement speed of the drive device 20 to shorten the detection time. On the contrary, if the second time period is too short, it may mean that the movement speed of the drive device 20 is too fast. Although it can improve the detection efficiency, it may affect the quality of image acquisition and processing. In this case, the speed adjustment control instruction can be reduced to reduce the movement speed of the drive device 20 to ensure the accuracy of image acquisition and processing. Furthermore, the AOI inspection mechanism may require different processing times for different images captured. For example, images of workpieces with poor image quality or a high number of defects may require longer processing time, while images of workpieces with good image quality or a low number of defects may require a relatively shorter processing time. Therefore, by continuously adjusting and optimizing the motion speed of the drive device 20, the production performance of the processing equipment and the inspection efficiency of the AOI inspection mechanism 30 can be matched, thereby further improving the overall production efficiency of the processing equipment.

[0095] In one possible implementation, reference Figure 7 The step S720 outputs a speed adjustment control instruction to the driving device 20 according to the second time duration and the first movement speed, so as to control the driving device 20 to adjust the movement speed of the workpiece 40 in the direction of the AOI inspection mechanism 30, including steps S721 to S723:

[0096] Step S721 : determining an average duration for obtaining the yield information of the workpiece 40 according to the second duration.

[0097] In this embodiment, after receiving the processing yield information for a preset number of workpieces 40, the processing equipment control device 10 can further process and analyze this data. Specifically, based on the second time duration, the processing equipment control device 10 can calculate the average time duration for obtaining the yield information for each workpiece 40, thereby reflecting the average inspection efficiency of the entire production batch or production line.

[0098] In step S722 , a target movement speed is determined according to a preset distance between each of the workpieces 40 and an average time duration for obtaining yield information of the workpieces 40 .

[0099] In this embodiment, after calculating the average time required to obtain yield information for workpieces 40, the processing equipment control device 10 can determine a target motion speed based on a preset distance between each workpiece 40. The target motion speed is intended to optimize the inspection efficiency of the entire production batch or production line, thereby ensuring that the AOI inspection mechanism 30 has sufficient time to accurately capture and process each workpiece 40 while avoiding excessive inspection times due to the slow movement of the drive device 20. The processing equipment control device 10 can calculate the optimal target motion speed by comprehensively considering the average time and the distance between workpieces 40 using a preset algorithm or model.

[0100] In step S723 , a speed adjustment control instruction is output to the driving device 20 to control the driving device 20 to adjust the first motion speed to the target motion speed, thereby driving the workpiece 40 to move toward the direction where the AOI inspection mechanism 30 is located.

[0101] In this embodiment, after determining the target motion speed, the processing equipment control device 10 outputs a corresponding speed adjustment control instruction to the drive device 20. Upon receiving the instruction, the drive device 20 adjusts its current motion speed to match the target motion speed. This allows for precise control of the motion speed of the workpiece 40, aligning it with the production performance of the processing equipment and the inspection efficiency of the AOI inspection mechanism 30, thereby further improving the overall production efficiency of the processing equipment.

[0102] In this embodiment, the processing equipment includes a drive device 20 and an AOI inspection mechanism 30. The drive device 20 is used to drive the processed workpiece 40 to move to the AOI inspection mechanism 30. The processing equipment control method outputs imaging position information to the drive device 20. When the drive device 20 drives the workpiece 40 to the AOI inspection mechanism 30, it triggers the AOI inspection mechanism 30 to capture an image of the workpiece 40. Based on the triggering of the AOI inspection mechanism 30, the AOI inspection mechanism 30 captures an image of the workpiece 40 and processes the captured image to obtain an image processing result. Then, based on the image processing result, the processing yield information of the workpiece 40 is determined. In this way, the present application can continuously capture images of the workpiece 40 at the corresponding position of the AOI inspection mechanism 30 while the drive device 20 drives the workpiece 40 to move, and process the images to obtain the processing yield information of the workpiece 40, thereby improving the AOI inspection efficiency of the workpiece 40, so that it meets the efficient production requirements of the processing equipment, thereby improving the production efficiency of the processing equipment.

[0103] The present application also provides a processing equipment control device 10, which includes: a memory, a processor, and a processing equipment control program stored in the memory and executable on the processor, wherein the processing equipment control program is configured to implement the steps of the processing equipment control method.

[0104] The processing equipment control device 10 provided in this application, employing the processing equipment control method of the above-described embodiment, can improve the efficiency of AOI inspection of the workpiece 40. Compared with the prior art, the beneficial effects of the processing equipment control device 10 provided in this application are the same as those of the processing equipment control method provided in the above-described embodiment. Other technical features of the processing equipment control device 10 are the same as those disclosed in the above-described embodiment and are not further described here.

[0105] The present application also provides a processing equipment, which includes a transmission mechanism 22, a stamping mechanism and an AOI detection mechanism 30. The processing equipment uses the processing equipment control method, or includes the processing equipment including the processing equipment control device 10.

[0106] The processing equipment control device 10 provided in this application, which utilizes the processing equipment control method of the above-described embodiment, or includes the processing equipment including the processing equipment control device 10, can improve the AOI inspection efficiency of the workpiece 40. Compared with the prior art, the beneficial effects of the processing equipment provided in this application are the same as those of the processing equipment control method or processing equipment control device 10 provided in the above-described embodiment, and other technical features of the processing equipment are the same as those disclosed in the above-described embodiment and method, and are not further described here.

[0107] The above description is only part of the embodiments of the present application and does not limit the patent scope of the present application. All equivalent structural transformations made by using the contents of the present application specification and drawings under the technical concept of the present application, or direct / indirect application in other related technical fields are included in the patent protection scope of the present application.

Claims

1. A processing equipment control method, characterized in that: The processing equipment includes a driving device and an AOI detection mechanism, wherein the driving device is used to drive the processed workpiece to move to the AOI detection mechanism, and the method includes: outputting imaging position information to the driving device; When the driving device drives the workpiece to the AOI inspection mechanism, the driving device triggers the AOI inspection mechanism to capture an image of the workpiece; The AOI detection mechanism captures an image of the workpiece based on the triggering of the AOI detection mechanism, and processes the captured image to obtain an image processing result; Determining processing yield information of the workpiece according to the image processing result; The driving device is capable of driving the plurality of processed workpieces to move; the AOI detection mechanism captures images of the workpieces based on the triggering of the AOI detection mechanism, and processes the captured images to obtain image processing results, including the following steps: The AOI detection mechanism sequentially captures images of the plurality of workpieces based on the triggering of the AOI detection mechanism, and when the first image of the workpiece is acquired, sequentially processes the acquired images of the plurality of workpieces to obtain image processing results of each workpiece.

2. The method according to claim 1, wherein After the step of determining the processing yield information of the workpiece according to the image processing result, the method further includes: The processing yield information of the workpiece is received, and the duration from outputting the imaging position information to receiving the processing yield information of the workpiece is recorded as a first duration.

3. The method according to claim 2, wherein After the step of outputting the imaging position information to the driving device, the method further includes: The driving device drives the workpiece to move toward the direction of the AOI detection mechanism at a corresponding first movement speed according to the imaging position information.

4. The method according to claim 3, wherein The method further comprises: According to the first time duration and the first movement speed, a speed adjustment control instruction is output to the driving device to control the driving device to adjust the movement speed of the workpiece toward the direction of the AOI detection mechanism.

5. The method according to claim 3, wherein The method further comprises: receiving a preset number of processing yield information of the workpieces in sequence, and recording the time from outputting the imaging position information to receiving the last processing yield information of the preset number as a second time; According to the second time duration and the first movement speed, a speed adjustment control instruction is output to the driving device to control the driving device to adjust the movement speed of the workpiece in the direction of the AOI detection mechanism.

6. The method according to claim 5, wherein The step of outputting a speed adjustment control instruction to the driving device according to the second time duration and the first movement speed to control the driving device to adjust the movement speed of the workpiece in the direction of the AOI inspection mechanism includes: Determining an average duration for obtaining the yield information of the workpiece according to the second duration; determining a target movement speed according to a preset distance between each of the workpieces and an average time duration for obtaining yield information of the workpieces; Output a speed adjustment control instruction to the driving device to control the driving device to adjust the first motion speed to the target motion speed, thereby driving the workpiece to move toward the direction where the AOI detection mechanism is located.

7. The method according to claim 2, wherein The step of outputting the image capturing position information to the driving device comprises: Outputting the image capture position information to the driving device using a unilateral communication protocol; The step of receiving the processing yield information of the workpiece and recording the time from outputting the imaging position information to receiving the processing yield information of the workpiece as a first time includes: A unilateral communication protocol is used to receive the processing yield information of the workpiece, and a time duration from outputting the imaging position information to receiving the processing yield information of the workpiece is recorded as a first time duration.

8. A processing equipment control device, characterized in that: The processing equipment control device includes: a memory, a processor, and a processing equipment control program stored in the memory and executable on the processor, wherein the processing equipment control program is configured to implement the steps of the processing equipment control method according to any one of claims 1 to 7.

9. A processing equipment, characterized in that, The processing equipment includes a transmission mechanism, a stamping mechanism and an AOI detection mechanism. The processing equipment uses the processing equipment control method described in any one of claims 1 to 7, or the processing equipment includes the processing equipment control device described in claim 8.

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