A multi-source dynamic signal unified test system for core machine test

By introducing a combined timing scheme of PTP clock source and NTP server into the core machine test system, the clock synchronization problem of multi-source dynamic signals is solved, and accurate alignment and unified management of steady-state and dynamic data are achieved, improving the scalability and maintenance convenience of the system.

CN118740305BActive Publication Date: 2026-06-30AECC SHENYANG ENGINE RES INST

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
AECC SHENYANG ENGINE RES INST
Filing Date
2024-06-27
Publication Date
2026-06-30

AI Technical Summary

Technical Problem

The clock synchronization accuracy of multi-source dynamic signals in the existing core machine testing system is insufficient, which makes it impossible to meet the requirements for dynamic test time accuracy. Furthermore, the different software platforms and types of equipment make system expansion and maintenance difficult.

Method used

A PTP clock source is used to synchronize the time of the lower-level network, and an NTP server is used to synchronize the time of the upper-level network, so as to achieve accurate synchronization of hardware timestamps and to perform comprehensive analysis of steady-state and dynamic data under the same software platform.

Benefits of technology

It improves the timing accuracy of dynamic testing, ensures the alignment of steady-state and dynamic data acquisition, simplifies system expansion and maintenance, and improves system reliability and efficiency.

✦ Generated by Eureka AI based on patent content.

Smart Images

  • Figure CN118740305B_ABST
    Figure CN118740305B_ABST
Patent Text Reader

Abstract

This application belongs to the field of engine testing, and specifically relates to a unified testing system for multi-source dynamic signals used in core engine testing. The system includes a lower-level network comprising multiple steady-state testing devices and multiple dynamic testing devices. The lower-level network uses a PTP clock source to synchronize the time of each device, adding hardware timestamps to the data collected by each device. An upper-level network, connected to the lower-level network, includes one steady-state testing upper-level computer and multiple dynamic testing upper-level computers. The steady-state testing upper-level computer receives steady-state signals collected by each steady-state testing device in the lower-level network, and the dynamic testing upper-level computers receive dynamic signals collected by each dynamic testing device in the lower-level network. The upper-level network uses an NTP server to synchronize the time of each upper-level operating system within the upper-level network. This application ensures the alignment of steady-state and dynamic data acquisition.
Need to check novelty before this filing date? Find Prior Art

Description

Technical Field

[0001] This application belongs to the field of engine testing technology, and specifically relates to a unified testing system for multi-source dynamic signals for core engine testing. Background Technology

[0002] The core engine consists of three components: a high-pressure compressor, a combustion chamber, and a high-pressure turbine. The importance of core engine technology verification for engine development is becoming increasingly apparent. For the core engine test bench system, achieving the integration and analysis of various signal sources, data clock synchronization, and effective data flow control places high demands on the rationality of the test system architecture design.

[0003] In traditional aero-engine testing systems, steady-state and dynamic test signal acquisition and management are handled separately by separate systems, which is based on the traditional data acquisition architecture.

[0004] The existing core machine testing system consists of the following components: Figure 1 As shown, it mainly consists of steady-state and dynamic testing systems, corresponding to a lower-level steady-state data acquisition system, a dynamic data acquisition system, and a higher-level data acquisition computer system, respectively. Bench tests include steady-state pressure testing, steady-state thermocouple temperature testing, steady-state transmitter signal testing, whole-machine vibration testing, dynamic pressure pulsation testing, dynamic non-contact blade tip vibration displacement testing, dynamic clearance testing, dynamic strain gauge testing, flow field testing, and acoustic testing. These lower-level testing systems are connected to their respective higher-level computers via a network. These testing systems are independent of each other, and data synchronization is managed based on the time of the higher-level computer's operating system. Figure 1 The host computer operating system uses an NTP server for time synchronization and provides timestamps for the collected data.

[0005] The testing system uses NTP-synchronized operating system time for both steady-state and dynamic test data timestamps. In multi-source dynamic signal testing systems, this clock synchronization method has poor accuracy for comprehensive analysis of steady-state and dynamic data. While it's usable for steady-state acquisition with sampling rates below 20Hz, it's unsuitable for dynamic tests above 200kHz or 1MHz. The operating system time accuracy within the local area network is generally at the second level; further increasing the accuracy to milliseconds increases system overhead. All of these factors contribute to the inability to meet the time accuracy requirements for dynamic testing.

[0006] Although the data acquisition devices used in the dynamic testing system have achieved network access, the differences in device types and software platforms lead to difficulties in system expansion and maintenance. For example, when a system device fails, the lack of interchangeability between acquisition devices with the same function due to differences in software platforms and device types increases the system's operational and maintenance costs. Summary of the Invention

[0007] To address the aforementioned issues, this application provides a unified testing system for multi-source dynamic signals in core machine testing, which solves the clock synchronization problem under multi-source dynamic signal access conditions in core machine testing systems, as well as the problem of synchronous analysis of steady-state and dynamic data on the same platform.

[0008] The multi-source dynamic signal unified test system for core machine testing disclosed in this application mainly includes:

[0009] The lower-level network includes multiple steady-state test devices and multiple dynamic test devices. The lower-level network is connected to a PTP clock source, which provides time synchronization to each device in the lower-level network to add hardware timestamps to the data collected by each device in the lower-level network.

[0010] A host computer network is connected to a slave computer network. The host computer network includes one steady-state test host computer and multiple dynamic test host computers. The steady-state test host computer is used to receive steady-state signals collected by each steady-state test device in the slave computer network. The dynamic test host computers are used to receive dynamic signals collected by each dynamic test device in the slave computer network. The host computer network is connected to an NTP server, which performs time synchronization for the operating systems of each host computer in the host computer network.

[0011] Preferably, the dynamic testing equipment in the lower-level network is divided into continuous acquisition equipment and non-continuous acquisition equipment. The dynamic signals acquired by the continuous acquisition equipment are connected to the dynamic unified testing system. The dynamic unified testing system is externally synchronized through a PTP clock source and internally synchronized between the dynamic testing equipment through an independent data clock synchronization bus. The non-continuous acquisition equipment is directly synchronized through the PTP clock source.

[0012] Preferably, the continuous acquisition equipment includes whole-machine vibration testing equipment, dynamic pressure pulsation testing equipment, dynamic strain gauge testing equipment, flow field testing equipment, and acoustic testing equipment, and the non-continuous acquisition equipment includes dynamic non-contact blade tip vibration displacement testing equipment and dynamic gap testing equipment.

[0013] Preferably, the dynamic test host computer in the host computer network is divided into a continuous dynamic signal processing system architecture and a non-continuous dynamic signal processing system architecture. The continuous dynamic signal processing system architecture includes a dynamic test master control server and multiple dynamic test host computer slave computers whose tasks are scheduled by the dynamic test master control server. The dynamic test master control server is used to collect dynamic signals uploaded by the dynamic unified test system in the slave computer network. The non-continuous dynamic signal processing system architecture includes multiple dynamic test host computers, which are used to collect and process dynamic signals collected by non-continuous acquisition devices in the slave computer network.

[0014] Preferably, the dynamic test master control server is also used to transmit the steady-state data periodically parsed by the steady-state test host computer and the dynamic data periodically parsed by each dynamic test host computer within the non-continuous dynamic signal processing system architecture to the dynamic test host computer slave computer for comprehensive data analysis.

[0015] Preferably, the dynamic testing host computer and slave computers include at least three units.

[0016] This application ensures the alignment of steady-state and dynamic acquisition data, and realizes the functions of synchronous acquisition, display, analysis and management of multi-source dynamic signal data under the same software platform. Attached Figure Description

[0017] Figure 1 This is a schematic diagram of the existing core machine test system architecture.

[0018] Figure 2 This is a schematic diagram of the core machine test system architecture of a preferred embodiment of the multi-source dynamic signal unified test system for core machine testing in this application. Detailed Implementation

[0019] To make the objectives, technical solutions, and advantages of this application clearer, the technical solutions in the embodiments of this application will be described in more detail below with reference to the accompanying drawings. In the drawings, the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The described embodiments are only some, not all, of the embodiments of this application. The embodiments described below with reference to the accompanying drawings are exemplary and intended to explain this application, and should not be construed as limiting this application. All other embodiments obtained by those skilled in the art based on the embodiments of this application without creative effort are within the scope of protection of this application. The embodiments of this application will be described in detail below with reference to the accompanying drawings.

[0020] This application provides a unified testing system for multi-source dynamic signals for core machine testing, such as... Figure 2 As shown, it mainly includes:

[0021] The lower-level network includes multiple steady-state test devices and multiple dynamic test devices. The lower-level network is connected to a PTP clock source, which provides time synchronization to each device in the lower-level network to add hardware timestamps to the data collected by each device in the lower-level network.

[0022] A host computer network is connected to a slave computer network. The host computer network includes one steady-state test host computer and multiple dynamic test host computers. The steady-state test host computer is used to receive steady-state signals collected by each steady-state test device in the slave computer network. The dynamic test host computers are used to receive dynamic signals collected by each dynamic test device in the slave computer network. The host computer network is connected to an NTP server, which performs time synchronization for the operating systems of each host computer in the host computer network.

[0023] This application adds a PTP clock source as the master clock source to the lower-level network of the test system to provide time synchronization for the lower-level devices. At the same time, the original NTP server is retained and only provides time synchronization for the operating systems of each upper-level device in the upper-level network. In the lower-level network, the PTP time synchronization accuracy can reach the nanosecond level, and it can simultaneously synchronize the time of two groups of slave devices, that is, simultaneously synchronize the steady-state test devices and dynamic test devices in the lower-level network. In this way, the data collected by the lower-level devices can be timestamped with hardware, which is more accurate than the operating system timestamping in the original architecture, ensuring the alignment of steady-state and dynamic data acquisition.

[0024] In some optional implementations, the dynamic testing devices in the lower-level network are divided into continuous acquisition devices and non-continuous acquisition devices. The dynamic signals acquired by the continuous acquisition devices are connected to the dynamic unified testing system. The dynamic unified testing system is externally synchronized through a PTP clock source and internally synchronized between the dynamic testing devices through an independent data clock synchronization bus. The non-continuous acquisition devices are directly synchronized through the PTP clock source.

[0025] In this embodiment, to ensure dynamic data alignment and improve clock synchronization accuracy, the continuous acquisition devices are merged, such as... Figure 2 As shown, a dynamic unified test system is constructed in the lower-level computer network. This system architecture accepts continuously acquired dynamic signals with sampling frequencies of 200kHz or 1MHz. The system consists of multiple subsystems, each capable of continuous acquisition at variable sampling rates. The hardware of each subsystem uses the same variable sampling rate, allowing for interchangeability to ensure system scalability and maintainability. The dynamic unified test system uses a PTP clock source for external timing and an independent data clock synchronization bus for inter-subsystem timing synchronization, maximizing system stability and continuous timing accuracy. For non-continuously acquired dynamic signals in the lower-level computer network, due to the significant difference in sampling rate compared to continuously acquired dynamic test signals (e.g., 20MHz–80MHz counters acquiring leaf tip vibration and gap tests), these signals will not be connected to the dynamic unified test system but will be directly synchronized via PTP, with the data transmitted back to the upper-level computer via the network.

[0026] In some optional embodiments, the continuous acquisition device includes whole-machine vibration testing equipment, dynamic pressure pulsation testing equipment, dynamic strain gauge testing equipment, flow field testing equipment, and acoustic testing equipment, while the non-continuous acquisition device includes dynamic non-contact blade tip vibration displacement testing equipment and dynamic gap testing equipment.

[0027] In some optional implementations, the dynamic test host computer in the host computer network is divided into a continuous dynamic signal processing system architecture and a non-continuous dynamic signal processing system architecture. The continuous dynamic signal processing system architecture includes a dynamic test master control server and multiple dynamic test host computer slave computers whose tasks are scheduled by the dynamic test master control server. The dynamic test master control server is used to collect dynamic signals uploaded by the dynamic unified test system in the slave computer network. The non-continuous dynamic signal processing system architecture includes multiple dynamic test host computers, which are used to collect and process dynamic signals collected by non-continuous acquisition devices in the slave computer network.

[0028] In this embodiment, similar to the division of continuous and discontinuous dynamic signal acquisition in the lower-level network, the upper-level network also uses different upper-level computers to process continuous and discontinuous dynamic signals. A continuous dynamic signal processing system architecture is used to process continuous dynamic signals. A dynamic test master control server is deployed in the upper-level network to manage the analysis and scheduling of dynamic unified test data uploaded by the lower-level computers. Data can be distributed through the dynamic test master control server to multiple dynamic test upper-level slave computers for analysis and real-time display. In some optional embodiments, the dynamic test upper-level slave computers include at least three units, for example, in... Figure 2 The system comprises three host computers (1, 2, and 3) for dynamic testing, each with an analysis interface configured with different combinations of parameters. These computers analyze only one type of dynamic data or extract other types of data for comprehensive analysis and display as needed. The system's efficiency is significantly improved compared to the original system's single analysis function. Since continuously acquired dynamic data is synchronously acquired and analyzed on this platform, the software is actually allocated and deployed through the same platform, which is beneficial for system expansion and data universality. For the non-continuous dynamic signal processing system architecture, the number of host computers configured is consistent with the number of non-continuous acquisition devices in the lower-level network. This includes a dynamic non-contact blade tip vibration displacement host computer, used to receive dynamic data acquired by the dynamic non-contact blade tip vibration displacement testing device in the lower-level network, and a dynamic gap host computer, used to receive dynamic data acquired by the dynamic gap testing device in the lower-level network.

[0029] In some optional implementations, the dynamic test master control server is also used to transmit the steady-state data periodically parsed by the steady-state test host computer and the dynamic data periodically parsed by each dynamic test host computer within the non-continuous dynamic signal processing system architecture to the dynamic test host computer slave computer for comprehensive data analysis.

[0030] In this embodiment, steady-state data and non-continuous acquisition dynamic system (blade tip vibration, gap) host computer data can be parsed and published to the dynamic test master control server at fixed intervals for comprehensive analysis of steady-state and dynamic data, realizing the synchronous acquisition, display, analysis and management of multi-source dynamic signal data under the same software platform.

[0031] The above description is merely a specific embodiment of this application, but the scope of protection of this application is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the technical scope disclosed in this application should be included within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of the claims.

Claims

1. A multi-source dynamic signal unified test system for core machine test, characterized in that, include: The lower-level network includes multiple steady-state test devices and multiple dynamic test devices. The lower-level network is connected to a PTP clock source, which provides time synchronization to each device in the lower-level network to add hardware timestamps to the data collected by each device in the lower-level network. A host computer network is connected to the slave computer network. The host computer network includes one steady-state test host computer and multiple dynamic test host computers. The steady-state test host computer is used to receive steady-state signals collected by each steady-state test device in the slave computer network. The dynamic test host computers are used to receive dynamic signals collected by each dynamic test device in the slave computer network. The host computer network is connected to an NTP server, and the NTP server is used to perform time synchronization for the operating systems of each host computer in the host computer network. The dynamic testing equipment in the lower-level network is divided into continuous acquisition equipment and non-continuous acquisition equipment. The dynamic signals acquired by the continuous acquisition equipment are connected to the dynamic unified testing system. The dynamic unified testing system is synchronized externally through a PTP clock source and internally through an independent data clock synchronization bus for time synchronization between the dynamic testing equipment. The non-continuous acquisition equipment is synchronized directly through the PTP clock source. The continuous acquisition equipment includes whole machine vibration testing equipment, dynamic pressure pulsation testing equipment, dynamic strain gauge testing equipment, flow field testing equipment and acoustic testing equipment; the non-continuous acquisition equipment includes dynamic non-contact blade tip vibration displacement testing equipment and dynamic gap testing equipment. The host computer network is divided into a continuous dynamic signal processing system architecture and a non-continuous dynamic signal processing system architecture. The continuous dynamic signal processing system architecture includes a dynamic test master control server and multiple dynamic test host computer slave computers whose tasks are scheduled by the dynamic test master control server. The dynamic test master control server is used to collect dynamic signals uploaded by the dynamic unified test system in the lower computer network. The non-continuous dynamic signal processing system architecture includes multiple dynamic test host computers, which are used to collect and process dynamic signals collected by non-continuous acquisition devices in the lower computer network. The dynamic test master control server is also used to transmit the steady-state data periodically parsed by the steady-state test host computer and the dynamic data periodically parsed by each dynamic test host computer in the non-continuous dynamic signal processing system architecture to the dynamic test host computer slave computer for comprehensive data analysis.

2. The multi-source dynamic signal unified test system for core test of claim 1, wherein, The dynamic testing host computer and slave computers shall include at least three units.