Testing methods, apparatus, electronic equipment and storage media of testing machines

Abstract

This application provides a testing method, apparatus, electronic device, and storage medium for a drop testing machine. The method includes: acquiring the theoretical time and test time of a package passing through a detection device during a drop test; processing the theoretical time and test time to obtain a deviation rate of the drop testing machine, the deviation rate indicating the error in the free fall of the package during the drop test; and determining a target deviation level of the drop testing machine in a deviation evaluation table based on the deviation rate, the target deviation level being used to adjust the drop testing machine. This method enables the detection of free fall of the package and allows for adjustment of the drop testing machine based on the deviation level, thereby improving the reliability of the drop test.

Description

Technical Field

[0001] This application relates to the field of computer technology, and in particular to a testing method, apparatus, electronic device and storage medium for a testing machine. Background Technology

[0002] A drop tester is a device used to test the impact and damage that a product's packaging can withstand during a drop.

[0003] In existing technologies, companies can use drop testing machines to simulate the impact of external forces on packaged goods during transportation and handling, allowing them to fall freely and thus determine the product's ability to resist accidental impacts. Drop tests can be used to improve product design and packaging. However, during the simulated free fall of packaged goods using a drop testing machine, the influence of the drop testing mechanism can prevent the packaged goods from actually falling freely, resulting in lower reliability of the drop test. Summary of the Invention

[0004] This application provides a testing method, apparatus, electronic equipment, and storage medium for a testing machine to solve the technical problem of low reliability in drop tests caused by the lack of free fall testing on packaged goods.

[0005] Firstly, this application provides a testing method for a testing machine, comprising:

[0006] The theoretical time and test duration of the package passing through the detection device in the drop test are obtained;

[0007] Data processing is performed on the theoretical duration and the test duration to obtain the deviation rate of the drop test machine. The deviation rate is used to indicate the error of the package during free fall in the drop test.

[0008] Based on the deviation rate, a target deviation level for the drop test machine is determined in the deviation evaluation table. The target deviation level is used to adjust the drop test machine.

[0009] In this embodiment, the test duration of the package during the drop process is obtained through a detection device, the deviation rate between the theoretical duration and the test duration is determined, and then the deviation level of the package's free fall during the drop is determined based on the deviation rate, so as to adjust the drop testing machine. This realizes the detection of the package's free fall, and the drop testing machine can be adjusted according to the deviation level, thereby improving the reliability of the drop test.

[0010] Optionally, the method described above, obtaining the theoretical time and test duration of the package passing through the detection device in a drop test, includes:

[0011] The theoretical duration is determined based on the packaging and the detection device.

[0012] The detection device, which includes a transmitter, a receiver, and a timer, is used to obtain the test duration of the package drop.

[0013] In this embodiment of the application, the test duration of the package during the drop test can be directly obtained through the detection device. The theoretical duration of the package falling can be calculated using the package and the detection device in the drop test, eliminating the need for manual testing and improving the efficiency of the testing machine verification.

[0014] Optionally, the method described above, determining the theoretical duration based on the packaging and the detection device, includes:

[0015] The width of the package is obtained, and the width of the package is the length of the package passing through the detection device;

[0016] Determine the theoretical speed at which the package passes through the detection device;

[0017] The theoretical duration is determined by the ratio of the width of the package to the theoretical speed.

[0018] In this embodiment of the application, the theoretical duration of the package falling can be directly calculated during the drop test, so that the test duration can be directly compared and analyzed, which can improve the efficiency of the testing machine verification.

[0019] Optionally, determining the theoretical speed at which the package passes through the detection device using the method described above includes:

[0020] The drop height of the package and the device height of the detection device are obtained, wherein the drop height is greater than the device height;

[0021] Determine a first difference between the drop height and the device height;

[0022] Based on the first difference and gravitational acceleration, the theoretical velocity of the package is determined.

[0023] In this embodiment, the theoretical speed at which the package passes through the detection device can be determined by the drop height of the package and the device height of the detection device, which can improve the efficiency of the testing machine verification.

[0024] Optionally, the method described above, using the detection device, obtains the test duration of the package drop, including:

[0025] The timer is used to obtain multiple drop durations of the package in multiple drop tests, where each drop duration is the time the package passes through the transmitter and receiver.

[0026] The average of the multiple drop durations is determined as the test duration.

[0027] In this embodiment of the application, the test duration is determined by multiple drop durations in multiple drop tests, which can improve the accuracy of determining the test duration and thus improve the accuracy of determining the deviation level of the drop test machine.

[0028] Optionally, the method described above is used to process the theoretical duration and the test duration to obtain the deviation rate of the drop test machine, including:

[0029] Determine a second difference between the test duration and the theoretical duration;

[0030] The ratio of the absolute value of the second difference to the theoretical duration is determined as the deviation rate.

[0031] In this embodiment of the application, a second difference between the test duration and the theoretical duration is determined, and the ratio of the absolute value of the second difference to the theoretical duration is determined as the deviation rate. The deviation rate is used to determine the deviation level of the drop test machine, which can improve the accuracy of determining the deviation level of the drop test machine.

[0032] Optionally, in the method described above, the deviation evaluation table includes multiple deviation intervals and a deviation level corresponding to each deviation interval; based on the deviation rate, a target deviation level for the drop testing machine is determined in the deviation evaluation table, the target deviation level being used to adjust the drop testing machine, including:

[0033] The target deviation interval is determined from the plurality of deviation intervals based on the deviation rate;

[0034] The deviation level corresponding to the target deviation range is determined as the target deviation level;

[0035] Get the preset alarm level;

[0036] If the target deviation level is greater than or equal to the preset alarm level, an alarm is issued to prompt adjustment of the drop test machine.

[0037] In this embodiment, if the target deviation level is greater than or equal to the preset alarm level, an alarm can be triggered. The drop test machine can be adjusted in a timely manner according to the alarm, which can improve the reliability of the drop test.

[0038] Secondly, this application provides an inspection device for a testing machine, comprising an acquisition module, a data processing module, and a determination module:

[0039] The acquisition module is used to acquire the theoretical time and test duration of the package passing through the detection device in the drop test;

[0040] The data processing module is used to process the theoretical duration and the test duration to obtain the deviation rate of the drop test machine. The deviation rate is used to indicate the error of the package during free fall in the drop test.

[0041] The determining module is used to determine the target deviation level of the drop test machine in the deviation evaluation table according to the deviation rate, and the target deviation level is used to adjust the drop test machine.

[0042] Thirdly, embodiments of this application provide an electronic device, including: a memory, and a processor communicatively connected to the memory.

[0043] The memory stores computer-executed instructions;

[0044] The processor executes computer execution instructions stored in the memory, causing the processor to perform the verification method of the testing machine as described in any one of the first aspects.

[0045] Fourthly, embodiments of this application provide a computer-readable storage medium storing computer-executable instructions, which, when executed by a processor, are used to implement the verification method of the testing machine as described in any one of the first aspects.

[0046] Fifthly, this application provides a computer program product, including a computer program that, when executed by a processor, implements the verification method of the testing machine as described in any one of the first aspects.

[0047] The testing method, apparatus, electronic equipment, and storage medium provided in this application can acquire the test duration of the package during the drop test through the detection device. By comparing the deviation rate between the theoretical duration and the test duration, the deviation level of the package's free fall during the drop test can be determined, allowing for adjustment of the drop testing machine. This achieves the detection of the package's free fall and allows for adjustment of the drop testing machine based on the deviation level, improving the reliability of the drop test. Attached Figure Description

[0048] The accompanying drawings, which are incorporated in and form part of this specification, illustrate embodiments consistent with this application and, together with the description, serve to explain the principles of this application.

[0049] Figure 1 A schematic diagram illustrating the application scenarios provided in the embodiments of this application;

[0050] Figure 2 A schematic flowchart illustrating an inspection method for a testing machine provided in an embodiment of this application;

[0051] Figure 3 This is a schematic diagram of the structure of a drop testing machine provided in an embodiment of this application;

[0052] Figure 4 A schematic diagram of the principle of a photoelectric gate provided in an embodiment of this application;

[0053] Figure 5 A flowchart illustrating a method for determining theoretical duration provided in an embodiment of this application;

[0054] Figure 6 This application provides a schematic diagram of a process for obtaining test duration in an embodiment.

[0055] Figure 7 A schematic diagram of the architecture of an inspection method for a testing machine provided in an embodiment of this application;

[0056] Figure 8 This is a schematic diagram of the structure of an inspection device for a testing machine provided in an embodiment of this application;

[0057] Figure 9 This is a schematic diagram of the structure of a terminal device provided in an embodiment of this application.

[0058] The accompanying drawings illustrate specific embodiments of this application, which will be described in more detail below. These drawings and descriptions are not intended to limit the scope of the concept in any way, but rather to illustrate the concept of this application to those skilled in the art through reference to particular embodiments. Detailed Implementation

[0059] Exemplary embodiments will now be described in detail, examples of which are illustrated in the accompanying drawings. When the following description relates to the drawings, unless otherwise indicated, the same numbers in different drawings denote the same or similar elements. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with this application. Rather, they are merely examples of apparatuses and methods consistent with some aspects of this application as detailed in the appended claims.

[0060] Figure 1 This is a schematic diagram illustrating an application scenario provided in an embodiment of this application. Please refer to [link / reference]. Figure 1 It may include a drop test machine 101 and a terminal device 102.

[0061] The drop testing machine 101 is a specialized device for testing the impact resistance of packaging and the protective capability of its contents. The drop testing machine 101 may include a detection device. During the drop test of the packaging through the drop testing machine 101, the packaging can pass through the detection device, which can measure the test duration of the packaging passing through the device. The terminal device 102 can obtain the test duration and the theoretical duration of passing through the detection device.

[0062] Terminal device 102 can process the theoretical duration and test duration data to obtain the deviation rate of the drop testing machine. The deviation rate can be used to indicate the error of the package during free fall in the drop test. Terminal device 102 can determine the deviation level of the drop testing machine in the deviation evaluation table based on the deviation rate. The deviation level can be used to adjust the drop testing machine.

[0063] In existing technologies, companies can use drop testing machines to simulate the free fall of packaged goods during transportation and handling, thereby determining the product's ability to resist accidental impacts. Drop tests can be used to improve product design and packaging. However, during the simulation of free fall of packaged goods using a drop testing machine, the influence of the drop testing mechanism can cause the packaged goods to not actually undergo a free fall, resulting in low reliability of the drop test.

[0064] The testing method for the drop test machine provided in this application can obtain the test duration of the package during the drop process through a detection device. By comparing the deviation rate between the theoretical duration and the test duration, the deviation level of the package's free fall during the drop process can be determined, allowing for adjustments to the drop test machine. This achieves the detection of the package's free fall and allows for adjustment of the drop test machine based on the deviation level, thereby improving the reliability of the drop test.

[0065] The technical solution of this application and how the technical solution of this application solves the above-mentioned technical problems are described in detail below with specific embodiments. These specific embodiments can be combined with each other, and the same or similar concepts or processes may not be described again in some embodiments. The embodiments of this application will now be described with reference to the accompanying drawings.

[0066] Figure 2 This is a schematic flowchart illustrating a testing method for a testing machine provided in an embodiment of this application. Please refer to [link / reference]. Figure 2 The method may include:

[0067] S201. Obtain the theoretical time and test duration of the package passing through the detection device during the drop test.

[0068] The execution subject of this application embodiment can be a terminal device or a testing device of a testing machine installed in the terminal device. The testing device of the testing machine can be implemented by software or by a combination of software and hardware.

[0069] Drop tests can be performed on packaging in a drop testing machine. Drop tests can simulate the free fall that packaging may experience during transportation and handling, and can test the product's ability to resist accidental impacts within the packaging.

[0070] During the drop test, the packaging may be affected by external factors, preventing it from falling freely. For example, the drop tray may fall and get stuck, blocking the free fall of the packaging, or other objects in the drop test environment may obstruct the drop.

[0071] A detection device can be installed in the drop testing machine to obtain the test time of the package passing through the detection device and calculate the theoretical time of the package passing through the detection device. During the drop test, the test time of the package during the drop process can be obtained directly through the detection device. By using the package and the detection device in the drop test, the theoretical time of the package falling can be calculated, eliminating the need for manual testing and improving the efficiency of the testing machine verification.

[0072] The detection device can be a photogate, and the detection device can include a transmitter, a receiver, and a timer.

[0073] To facilitate understanding of this solution, the following will be combined with... Figure 3 A drop testing machine is provided, and the testing process of the testing machine provided in the embodiments of this application is further explained.

[0074] Figure 3 This is a schematic diagram of a drop testing machine provided in an embodiment of this application. Please refer to... Figure 3 The drop testing machine includes a drop object holder, a detection device, and an impact plane. The detection device can be installed between the drop object holder and the impact plane, and the detection device may include a transmitter, a receiver, and a timer, with the receiver connected to the timer.

[0075] The package can be placed on a drop test tray. During the drop test, the tray falls, causing the package to lose its support and fall freely. The time it takes for the package to pass the test using a detection device can be determined.

[0076] It is worth noting that, Figure 3 This is merely one schematic diagram of a drop testing machine; this application applies to other types of drop testing machines.

[0077] Figure 4 This is a schematic diagram illustrating the principle of a photoelectric gate provided in an embodiment of this application. Please refer to [link / reference]. Figure 4 The photogate consists of a transmitter, a receiver, and a timer. The transmitter sends a light beam, the receiver receives the light beam, and the receiver is connected to the timer. When the width of the package is d, during the package's descent, if the bottom edge of the package contacts the light beam, the beam is blocked, the receiver cannot receive the beam, and the timer starts counting. As the package continues to fall, if the top edge of the package leaves the light beam, the beam is blocked, the receiver can receive the beam, the timer stops counting, and the test duration is obtained.

[0078] S202. Process the theoretical duration and test duration to obtain the deviation rate of the drop test machine.

[0079] Deviation rate can be used to indicate the error of a package during free fall in a drop test.

[0080] Furthermore, a second difference between the test duration and the theoretical duration can be determined, and the ratio of the absolute value of the second difference to the theoretical duration can be defined as the deviation rate, as shown in the following formula:

[0081]

[0082] Among them, T 偏差 T represents the deviation rate. 测试 For test duration, T 理论 This is the theoretical duration.

[0083] For example, assuming the test duration is 22 milliseconds and the theoretical duration is 20 milliseconds, the second difference can be determined to be 5 milliseconds, with a deviation rate of 10%.

[0084] Compared to directly determining the deviation level by the second difference between the test duration and the theoretical duration, determining the deviation level of the drop tester by the deviation rate is a more intuitive and standardized way to express the degree of error, which can improve the accuracy of determining the deviation level of the drop tester.

[0085] S203. Based on the deviation rate, determine the target deviation level of the drop tester in the deviation evaluation table.

[0086] A deviation assessment table can be configured, which can include multiple deviation intervals and the deviation level corresponding to each deviation interval.

[0087] For example, suppose the deviation assessment table can include three deviation intervals, namely deviation interval 1, deviation interval 2 and deviation interval 3. The deviation level corresponding to deviation interval 1 can be the ideal level, the deviation level corresponding to deviation interval 2 can be the acceptable level, and the deviation level corresponding to deviation interval 3 can be the restricted level. The deviation assessment table can be as shown in Table 1.

[0088] Table 1

[0089]

[0090] The target deviation level can be used to adjust the drop testing machine. For example, if the deviation level is the limit level, the staff can adjust or repair the drop testing machine.

[0091] Furthermore, based on the deviation rate, a target deviation interval can be determined from multiple deviation intervals; the deviation level corresponding to the target deviation interval can be determined as the target deviation level; a preset alarm level can be obtained; if the target deviation level is greater than or equal to the preset alarm level, an alarm prompt can be issued.

[0092] For example, assuming the deviation rate is 6%, and assuming the deviation assessment table can be as shown in Table 1, then the target deviation range can be determined as deviation range 3, the target deviation level is the restricted level, and assuming the preset alarm level is the restricted level, then an alarm prompt can be issued.

[0093] The alarm prompts can be used to remind the drop tester to make adjustments. Based on the alarm prompts, the drop tester can be adjusted in a timely manner, which can improve the reliability of the drop test.

[0094] Furthermore, the alarm prompts corresponding to each deviation level can be determined. For example, alarm prompts may include pop-up alarms, alarm reports, and message alarms.

[0095] The testing method for the drop test machine provided in this application embodiment can obtain the test duration of the package during the drop process through a detection device. By comparing the deviation rate between the theoretical duration and the test duration, the deviation level of the package's free fall during the drop process can be determined, so as to adjust the drop test machine. This realizes the detection of the package's free fall, and the drop test machine can be adjusted according to the deviation level, thereby improving the reliability of the drop test.

[0096] Based on the above embodiments, the following is combined with Figure 5 The execution process for determining the theoretical duration provided in the embodiments of this application will be further explained.

[0097] Figure 5 This is a flowchart illustrating a method for determining theoretical duration as provided in an embodiment of this application. Please refer to... Figure 5 The method may include:

[0098] S501, Obtain the width of the package.

[0099] When conducting drop tests on each package, the test information can include the basic information of the package. Staff can enter the test information into the system and directly obtain the width of the package from the test information. The width of the package can be the length of the package passing through the detection device.

[0100] S502. Determine the theoretical speed at which the package passes through the detection device.

[0101] In some embodiments, the instantaneous speed at which the package arrives at the detection device can be determined as the theoretical speed at which the package passes through the detection device.

[0102] The drop height of the package and the device height of the detection device can be obtained to determine the first difference between the drop height and the device height; based on the first difference and the gravitational acceleration, the theoretical velocity of the package can be determined.

[0103] Where the drop height is greater than the height of the device, the drop height of the package can be as follows: Figure 3 The dropper bracket shown.

[0104] The drop height of the packaging can be obtained from the test information of the drop test, and the device height of the testing device can be obtained from the basic information of the drop test machine.

[0105] For example, assuming the drop height of the package is 6 meters and the height of the detection device is 1 meter, the first difference can be determined to be 5 meters. Assuming the gravitational acceleration is the square of 10 m / s, the theoretical speed of the package can be determined to be 10 m / s.

[0106] The theoretical duration of the package drop can be directly calculated during any drop test, allowing for direct comparison and analysis after obtaining the test duration without additional inspection, thus improving the efficiency of the testing machine verification.

[0107] In some embodiments, the average of the instantaneous speed at which the package reaches the detection device and the instantaneous speed at which it leaves the detection device can be determined as the theoretical speed at which the package passes through the detection device. The instantaneous speed at which the package reaches the detection device and the instantaneous speed at which it leaves the detection device can be found in the above execution process, and will not be repeated here.

[0108] S503. The ratio of the width of the package to the theoretical speed is determined as the theoretical duration.

[0109] For example, assuming the width of the package is 0.5 meters and the theoretical speed is 10 meters per second, the theoretical duration can be determined to be 0.05 seconds, or 50 milliseconds.

[0110] The testing method for the drop testing machine provided in this application embodiment can obtain the width of the package and the theoretical speed at which the package passes through the detection device. The ratio of the package width to the theoretical speed is determined as the theoretical duration. The theoretical duration and the test duration can be analyzed to determine the deviation level, improving the accuracy of deviation level determination. Furthermore, the drop testing machine can be adjusted based on the deviation level, improving the reliability of the drop test.

[0111] Based on the above embodiments, the following is combined with Figure 5 The execution process for obtaining the test duration in the embodiments of this application will be further explained.

[0112] Figure 6This is a schematic diagram illustrating a process for obtaining test duration as provided in an embodiment of this application. Please refer to [link / reference]. Figure 6 The method may include:

[0113] S601. Obtain multiple drop durations from multiple drop tests using a timer.

[0114] The packaging can be subjected to multiple drop tests using a drop testing machine. Each drop test involves packaging with the same basic parameters, such as the same width.

[0115] The drop duration for each drop test can be obtained, which can be the time it takes for the package to pass through the transmitter and receiver.

[0116] For example, assuming that the packaging is subjected to 5 drop tests, namely drop test 1-5, the drop duration corresponding to each drop test can be obtained, namely drop duration 1-5.

[0117] S602. The average of multiple drop durations is determined as the test duration.

[0118] For example, assuming that the packaging is subjected to 5 drop tests, namely drop test 1-5, the drop duration corresponding to drop test 1 is 30 milliseconds, the drop duration corresponding to drop test 2 is 28 milliseconds, the drop duration corresponding to drop test 3 is 30 milliseconds, the drop duration corresponding to drop test 4 is 29 milliseconds, and the drop duration corresponding to drop test 5 is 28 milliseconds, then the test duration can be determined to be 29 milliseconds.

[0119] The testing method of the testing machine provided in this application embodiment can obtain multiple drop durations through multiple drop tests on the packaging, and determine the average of the multiple drop durations as the test duration, which can improve the accuracy of determining the test duration and thus improve the reliability of the drop test.

[0120] Figure 7 This is a schematic diagram illustrating the architecture of an inspection method for a testing machine provided in an embodiment of this application. Please refer to [link / reference]. Figure 7 After the drop test begins, the test duration of the package can be obtained through the detection device, as well as the width of the package, the drop height, and the device height of the detection device. Based on the drop height of the package and the device height of the detection device, the theoretical speed of the package is determined, and the ratio of the width of the package to the theoretical speed is determined as the theoretical duration.

[0121] The deviation rate of the drop tester can be determined based on the width of the package and the theoretical duration. The target deviation level of the drop tester is determined in the deviation evaluation table based on the deviation rate. If the target deviation level is greater than or equal to the preset alarm level, an alarm is issued to prompt the drop tester to be adjusted. If the target deviation level is less than the preset alarm level, the process ends.

[0122] Figure 8 This is a schematic diagram of the structure of an inspection device for a testing machine provided in an embodiment of this application. Please refer to [link / reference]. Figure 8 The testing device 10 of the testing machine may include an acquisition module 11, a data processing module 12, and a determination module 13.

[0123] The acquisition module 11 is used to acquire the theoretical time and test duration of the package passing through the detection device in the drop test;

[0124] The data processing module 12 is used to process the theoretical duration and the test duration to obtain the deviation rate of the drop test machine. The deviation rate is used to indicate the error of the package during the free fall process in the drop test.

[0125] The determination module 13 is used to determine the target deviation level of the drop tester in the deviation evaluation table based on the deviation rate. The target deviation level is used to adjust the drop tester.

[0126] The testing device of the testing machine provided in this application embodiment can execute the technical solution shown in the above method embodiment. Its implementation principle and beneficial effects are similar, and will not be repeated here.

[0127] Optionally, as described above, module 11 is specifically used for:

[0128] The theoretical duration is determined based on the packaging and testing equipment;

[0129] The test duration of the package drop is obtained through a detection device, which includes a transmitter, a receiver, and a timer.

[0130] Optionally, as described above, module 11 is specifically used for:

[0131] Obtain the width of the package, which is the length of the package as it passes through the detection device;

[0132] Determine the theoretical speed at which the package passes through the detection device;

[0133] The theoretical duration is determined by the ratio of the width of the package to the theoretical speed.

[0134] Optionally, as described above, module 11 is specifically used for:

[0135] The drop height of the package and the height of the detection device are obtained, where the drop height is greater than the device height;

[0136] Determine the first difference between the drop height and the device height;

[0137] Based on the first difference and gravitational acceleration, the theoretical velocity of the package is determined.

[0138] Optionally, as described above, module 11 is specifically used for:

[0139] The timer is used to obtain multiple drop durations of the package in multiple drop tests. The drop duration is the time it takes for the package to pass through the transmitter and receiver.

[0140] The average of multiple drop durations was used to determine the test duration.

[0141] Optionally, as described above, the data processing module 12 is specifically used for:

[0142] Determine the second difference between the test duration and the theoretical duration;

[0143] The ratio of the absolute value of the second difference to the theoretical duration is determined as the deviation rate.

[0144] Optionally, as described above, the deviation assessment table includes multiple deviation intervals and a corresponding deviation level for each deviation interval; the determination module 13 is specifically used for:

[0145] The target deviation interval is determined from multiple deviation intervals based on the deviation rate.

[0146] The deviation level corresponding to the target deviation range is determined as the target deviation level;

[0147] Get the preset alarm level;

[0148] If the target deviation level is greater than or equal to the preset alarm level, an alarm will be issued to prompt adjustments to the drop test machine.

[0149] The testing device of the testing machine provided in this application embodiment can execute the technical solution shown in the above method embodiment. Its implementation principle and beneficial effects are similar, and will not be repeated here.

[0150] Figure 9 This is a schematic diagram of the structure of an electronic device provided in an embodiment of this application. Please refer to... Figure 9 The electronic device 20 may include a processor 21 and a memory 22 communicatively connected to the processor 21. Exemplarily, the processor 21 and the memory 22 are interconnected via a bus 23.

[0151] Memory 22 stores instructions executed by the computer;

[0152] The processor 21 executes computer execution instructions stored in the memory 22, causing the processor 21 to perform the testing method of the testing machine as shown in the above method embodiment.

[0153] Accordingly, this application provides a computer-readable storage medium storing computer-executable instructions, which, when executed by a processor, are used to implement the testing method of the testing machine described in the above method embodiments.

[0154] Accordingly, embodiments of this application may also provide a computer program product, including a computer program, which, when executed by a processor, can implement the testing method of the testing machine shown in the above method embodiments.

[0155] Those skilled in the art will understand that embodiments of the present invention can be provided as methods, systems, or computer program products. Therefore, the present invention can take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, the present invention can take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0156] It should be noted that, for the sake of simplicity, the foregoing method embodiments are all described as a series of actions. However, those skilled in the art should understand that this application is not limited to the described order of actions, as some steps may be performed in other orders or simultaneously according to this application. Furthermore, those skilled in the art should also understand that the embodiments described in the specification are all optional embodiments, and the actions and modules involved are not necessarily essential to this application.

[0157] It should be further noted that although the steps in the flowchart are shown sequentially according to the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless explicitly stated herein, there is no strict order restriction on the execution of these steps, and they can be executed in other orders. Moreover, at least some steps in the flowchart may include multiple sub-steps or multiple stages. These sub-steps or stages are not necessarily completed at the same time, but can be executed at different times. The execution order of these sub-steps or stages is not necessarily sequential, but can be performed alternately or in turn with other steps or at least some of the sub-steps or stages of other steps.

[0158] It should be understood that the above-described device embodiments are merely illustrative, and the device of this application can also be implemented in other ways. For example, the division of units / modules in the above embodiments is only a logical functional division, and there may be other division methods in actual implementation. For example, multiple units, modules, or components may be combined, or integrated into another system, or some features may be ignored or not executed.

[0159] Furthermore, unless otherwise specified, the functional units / modules in the various embodiments of this application can be integrated into one unit / module, or each unit / module can exist physically separately, or two or more units / modules can be integrated together. The integrated units / modules described above can be implemented in hardware or as software program modules.

[0160] In the above embodiments, the descriptions of each embodiment have their own emphasis. For parts not described in detail in a certain embodiment, please refer to the relevant descriptions of other embodiments. The technical features of the above embodiments can be combined arbitrarily. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as these combinations of technical features do not contradict each other, they should be considered within the scope of this specification.

[0161] Other embodiments of this application will readily occur to those skilled in the art upon consideration of the specification and practice of the invention disclosed herein. This application is intended to cover any variations, uses, or adaptations of this application that follow the general principles of this application and include common knowledge or customary techniques in the art not disclosed herein. The specification and examples are to be considered exemplary only, and the true scope and spirit of this application are indicated by the following claims.

[0162] It should also be noted that the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such process, method, article, or apparatus. Unless otherwise specified, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes that element.

[0163] It should be understood that this application is not limited to the precise structure described above and shown in the accompanying drawings, and various modifications and changes can be made without departing from its scope. The scope of this application is limited only by the appended claims.

Claims

1. A testing method for a testing machine, characterized in that, include: The theoretical time and test time of the package passing through the detection device in any drop test are obtained; The detection device is located between the drop object support and the impact plane; the theoretical duration is determined based on the width of the package, the drop height of the package, and the device height of the detection device; wherein, the width of the package is the length of the package passing through the detection device; The theoretical time and test time of the package passing through the detection device are processed to obtain the deviation rate of the drop test machine. The deviation rate is used to indicate the error of the package during free fall in the drop test. Based on the deviation rate, a target deviation level for the drop test machine is determined in the deviation evaluation table. The target deviation level is used to adjust the drop test machine.

2. The method according to claim 1, characterized in that, The theoretical time and test time for the package to pass through the detection device in any drop test are obtained, including: In any drop test, the theoretical duration is determined based on the width of the package, the drop height of the package, and the device height of the detection device. The detection device is used to obtain the test duration of the package drop; the detection device includes a transmitter, a receiver, and a timer.

3. The method according to claim 2, characterized in that, The theoretical duration is determined based on the width of the package, the drop height of the package, and the height of the detection device, including: The width of the package, the drop height of the package, and the height of the detection device are obtained; the drop height is greater than the device height. Determine a first difference between the drop height and the device height; Based on the first difference and gravitational acceleration, the theoretical velocity of the package is determined; The theoretical duration is determined by the ratio of the width of the package to the theoretical speed.

4. The method according to claim 2, characterized in that, The detection device is used to obtain the test duration of the package drop, including: The timer is used to obtain multiple drop durations of the package in multiple drop tests, where each drop duration is the time the package passes through the transmitter and receiver. The average of the multiple drop durations is determined as the test duration.

5. The method according to any one of claims 1-4, characterized in that, Data processing is performed on the theoretical time and test time of the package passing through the detection device to obtain the deviation rate of the drop test machine, including: Determine a second difference between the test time of the package through the detection device and the theoretical time; The ratio of the absolute value of the second difference to the theoretical duration is determined as the deviation rate.

6. The method according to any one of claims 1-4, characterized in that, The deviation assessment table includes multiple deviation intervals and a corresponding deviation level for each deviation interval; Based on the deviation rate, a target deviation level for the drop testing machine is determined in the deviation evaluation table. This target deviation level is used to adjust the drop testing machine, including: The target deviation interval is determined from the plurality of deviation intervals based on the deviation rate; The deviation level corresponding to the target deviation range is determined as the target deviation level; Get the preset alarm level; If the target deviation level is greater than or equal to the preset alarm level, an alarm is issued to prompt adjustment of the drop test machine.

7. An inspection device for a testing machine, characterized in that, It includes an acquisition module, a data processing module, and a determination module: The acquisition module is used to acquire the theoretical time and test time of the package passing through the detection device in any drop test; the detection device is located between the drop object bracket and the impact plane; the theoretical time is determined based on the width of the package, the drop height of the package, and the device height of the detection device; wherein, the width of the package is the length of the package passing through the detection device; The data processing module is used to process the theoretical time and test time of the package passing through the detection device to obtain the deviation rate of the drop test machine. The deviation rate is used to indicate the error of the package during free fall in the drop test. The determining module is used to determine the target deviation level of the drop test machine in the deviation evaluation table according to the deviation rate, and the target deviation level is used to adjust the drop test machine.

8. An electronic device, characterized in that, include: A processor, and a memory communicatively connected to the processor; The memory stores computer-executed instructions; The processor executes computer execution instructions stored in the memory to implement the method as described in any one of claims 1 to 6.

9. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores computer-executable instructions that, when executed by a processor, are used to implement the method as described in any one of claims 1 to 6.

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