A PLP protection range correction method considering the influence of temperature and humidity

Abstract

The present application discloses a method for correcting the PLP protection range taking into account the influence of temperature and humidity, and relates to the technical field of relay protection control of power systems. The actual temperature, actual relative air humidity, and actual water vapor saturation content in the area where the PLP is installed are obtained; the reference relative air humidity of the reference environment and the actual relative humidity of the current environment are converted into absolute air humidity; the positive ion mobility corresponding to the absolute air humidity in two cases under the target temperature is calculated respectively; the two calculated positive ion mobilities are converted into the positive ion mobilities corresponding to their respective temperatures respectively; the displacement difference of the two positive ion mobilities at different temperatures during the plasma release time of the PLP is calculated, and the PLP protection range is corrected according to the displacement difference, thereby improving the accuracy of the calculation of the PLP protection range, so as to improve the protection reliability of the PLP device.

Description

Technical Field

[0001] The present application relates to the technical field of relay protection control of power systems, and in particular to a method for correcting a PLP protection range taking into account the influence of temperature and humidity. Background Art

[0002] PLP (Plasma Lightning Protector) is a new type of lightning protection device.

[0003] It is different from the traditional way of drawing lightning into the ground. It uses plasma technology to form an ionized gas when lightning occurs, and then guide the lightning current into the air around the equipment instead of directly into the ground. Specifically, the high-concentration plasma emitted by PLP can form a strong and effective neutralization of the opposite polarity charges of the thundercloud, thereby timely destroying the leader of lightning and eliminating the lightning strike phenomenon within the protected range. In addition, PLP also has the advantages of simple structure, strong and reliable, better weather resistance and longer service life than traditional lightning arresters, PLP is a passive device, and can be adaptively adjusted under the excitation of the thundercloud electric field. Furthermore, the protection range of PLP is much larger than that of traditional lightning rods. Its protection range is a cone, and the horizontal protection range reaches 10 times the installation height. In recent years, PLP has been widely used in lightning protection of power systems due to its unique "lightning elimination" principle, the advantage of not needing to draw lightning into the ground, and its other excellent performance.

[0004] However, the PLP device will be affected by temperature and humidity when releasing plasma airflow. Temperature will affect the movement speed of ions, and the increase in humidity will reduce the mobility of ions, thereby changing the actual protection range of PLP.

[0005] Therefore, it is urgently necessary to provide a PLP protection range correction method, a PLP device and a storage medium taking into account the influence of temperature and humidity, so as to improve the protection reliability of the PLP device.

[0006] The above contents are only used to assist in understanding the technical solution of the present application and do not constitute an admission that the above contents are prior art. Summary of the invention

[0007] The present application aims to improve the protection reliability of the PLP device by providing a PLP protection range correction method taking into account the influence of temperature and humidity.

[0008] To achieve the above objectives, the present application provides a method for correcting a PLP protection range taking into account the influence of temperature and humidity, and the method for correcting a PLP protection range taking into account the influence of temperature and humidity includes the following:

[0009] Obtain the actual temperature of the PLP installation area, the actual relative air humidity in the atmosphere, and the actual water vapor saturation content in the atmosphere;

[0010] Calculating a reference absolute air humidity corresponding to the reference relative air humidity in the reference environment according to the actual water vapor saturation content and the reference relative air humidity in the reference environment; and calculating an actual absolute air humidity corresponding to the actual relative air humidity in the current environment according to the actual water vapor saturation content and the actual relative air humidity;

[0011] Calculating the actual reference positive ion mobility corresponding to the reference actual temperature in the reference environment according to the reference absolute air humidity; and calculating the actual positive ion mobility corresponding to the actual temperature in the current environment according to the actual absolute air humidity;

[0012] Calculating the displacement difference between the actual reference positive ion mobility and the actual positive ion mobility during the PLP plasma release time;

[0013] The PLP protection range is corrected according to the displacement difference.

[0014] Optionally, the step of calculating a reference absolute air humidity corresponding to the reference relative air humidity in the reference environment according to the actual water vapor saturation content and the reference relative air humidity in the reference environment comprises:

[0015] Substituting the actual water vapor saturation content and the reference relative air humidity in the reference environment into the absolute air humidity calculation formula, and calculating the reference absolute air humidity corresponding to the reference relative air humidity in the reference environment;

[0016] The step of calculating the actual absolute air humidity corresponding to the actual relative air humidity in the current environment according to the actual water vapor saturation content and the actual relative air humidity comprises:

[0017] Substituting the actual water vapor saturation content and the actual relative air humidity into the absolute air humidity calculation formula to calculate the actual absolute air humidity corresponding to the actual relative air humidity in the current environment;

[0018] Wherein, the absolute air humidity formula is:

[0019]

[0020] Among them, H αi Relative air humidity RH i Corresponding absolute air humidity, RH i is the relative air humidity, and SVC is the saturated water vapor content in the atmosphere.

[0021] Optionally, the step of calculating the actual reference positive ion mobility corresponding to the reference actual temperature in the reference environment according to the reference absolute air humidity comprises:

[0022] Calculating, according to the reference absolute air humidity, a reference positive ion mobility corresponding to the reference absolute air humidity at a target temperature;

[0023] Converting the reference positive ion mobility into the actual reference positive ion mobility corresponding to the reference actual temperature;

[0024] The step of calculating the actual positive ion mobility corresponding to the actual temperature in the current environment according to the actual absolute air humidity comprises:

[0025] Calculating the positive ion mobility corresponding to the actual absolute air humidity at the target temperature according to the actual absolute air humidity;

[0026] The positive ion mobility is converted into the actual positive ion mobility corresponding to the actual temperature.

[0027] Optionally, the step of calculating, according to the reference absolute air humidity, a reference positive ion mobility corresponding to the reference absolute air humidity at the target temperature comprises:

[0028] Substituting the reference absolute air humidity into the positive ion mobility calculation formula associated with the target temperature, and calculating the reference positive ion mobility corresponding to the reference absolute air humidity at the target temperature;

[0029] The step of calculating the positive ion mobility corresponding to the actual absolute air humidity at the target temperature according to the actual absolute air humidity comprises:

[0030] Substituting the actual absolute air humidity into the positive ion mobility calculation formula associated with the target temperature, and calculating the positive ion mobility corresponding to the actual absolute air humidity at the target temperature;

[0031] Wherein, the target temperature is 25°, and the positive ion mobility calculation formula associated with the target temperature is:

[0032]

[0033] Among them, μ i+ is the absolute air humidity at the target temperature H αi The corresponding positive ion mobility, H αi is the absolute air humidity.

[0034] Optionally, the step of converting the reference positive ion mobility into the actual reference positive ion mobility corresponding to the reference actual temperature comprises:

[0035] Substituting the reference positive ion mobility and the reference actual temperature into a positive ion mobility conversion calculation formula to calculate the actual reference positive ion mobility;

[0036] The step of converting the positive ion mobility into the actual positive ion mobility corresponding to the actual temperature comprises:

[0037] Substituting the positive ion mobility and the actual temperature into a positive ion mobility conversion calculation formula to calculate the actual positive ion mobility;

[0038] Wherein, the positive ion mobility conversion calculation formula is:

[0039]

[0040] Among them, μ it+ At temperature T i The positive ion mobility corresponding to the absolute air humidity, μ i+ is the positive ion mobility corresponding to the absolute air humidity at the target temperature.

[0041] Optionally, the step of calculating the displacement difference between the actual reference positive ion mobility and the actual positive ion mobility during the PLP plasma release time comprises:

[0042] Substituting the actual reference positive ion mobility and the actual positive ion mobility into the displacement difference calculation formula, the displacement difference between the actual reference positive ion mobility and the actual positive ion mobility during the PLP plasma release time is calculated;

[0043] Wherein, the displacement difference calculation formula is:

[0044]

[0045] Where Δh is the actual reference positive ion mobility μ 0t+ The actual positive ion mobility μ xt+ The displacement difference during the PLP plasma release time, μ 0t+ is the actual reference positive ion mobility, μ xt+ is the actual positive ion mobility, E0 is the PLP corona starting field strength, and t=1S.

[0046] Optionally, the step of correcting the PLP protection range according to the displacement difference includes:

[0047] Obtaining the current actual altitude of the PLP;

[0048] Calculating the actual height after the PLP correction according to the displacement difference and the current actual height;

[0049] According to the corrected actual height, the corrected protection range radius of the PLP is calculated.

[0050] Optionally, the step of calculating the actual height after the PLP correction according to the displacement difference and the current actual height includes:

[0051] The displacement difference and the current actual height are summed to calculate the actual height after the PLP correction.

[0052] In addition, to achieve the above-mentioned purpose, the present application also provides a PLP device, which includes: a base, a needle holder and an array lightning rod; wherein the height of the PLP device above the ground is the corrected actual height calculated by the PLP protection range correction method taking into account the influence of temperature and humidity described in any of the above embodiments, and the protection range radius of the PLP device is the corrected protection range radius calculated by the PLP protection range correction method taking into account the influence of temperature and humidity described in any of the above embodiments.

[0053] In addition, to achieve the above-mentioned purpose, the present application also provides a computer-readable storage medium, on which is stored a PLP protection range correction program that takes into account the influence of temperature and humidity. When the PLP protection range correction program that takes into account the influence of temperature and humidity is executed by a processor, the steps of the PLP protection range correction method that takes into account the influence of temperature and humidity as described above are implemented.

[0054] Based on this, the present application has at least the following beneficial effects:

[0055] 1) By calculating the displacement difference between the actual reference positive ion mobility corresponding to the reference actual temperature in the reference environment and the actual positive ion mobility corresponding to the actual temperature in the current environment during the PLP plasma release time, the PLP protection range is corrected according to the displacement difference, thereby improving the accuracy of the PLP protection range calculation, thereby improving the protection reliability of the PLP device and making up for the defect of low protection accuracy of the traditional method.

[0056] 2) Through this method, the PLP device can be adapted to working scenarios under different temperature and humidity conditions. BRIEF DESCRIPTION OF THE DRAWINGS

[0057] Figure 1 A flowchart of some embodiments of the method for correcting the PLP protection range taking into account the influence of temperature and humidity in the present application;

[0058] Figure 2 A schematic diagram of the structure of a PLP device in some embodiments of the present application;

[0059] Figure 3 Schematic diagram of the PLP protection scope before and after correction of some embodiments of the present application.

[0060] The realization of the purpose, functional features and advantages of this application will be further explained in conjunction with embodiments and with reference to the accompanying drawings. DETAILED DESCRIPTION

[0061] It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0062] In order to better understand the above technical solution, exemplary embodiments of the present application will be described in more detail below with reference to the accompanying drawings. Although exemplary embodiments of the present application are shown in the accompanying drawings, it should be understood that the present application can be implemented in various forms and should not be limited by the embodiments described herein. On the contrary, these embodiments are provided to enable a more thorough understanding of the present application and to fully convey the scope of the present application to those skilled in the art.

[0063] Reference Figure 1 , Figure 1 The flowchart of some embodiments of the method for correcting the PLP protection range taking into account the influence of temperature and humidity in the present application is shown in FIG. In some embodiments of the method for correcting the PLP protection range taking into account the influence of temperature and humidity in the present application, the method for correcting the PLP protection range taking into account the influence of temperature and humidity includes the following steps S10 to S50:

[0064] Step S10: Acquire the actual temperature of the PLP installation area, the actual relative air humidity in the atmosphere, and the actual water vapor saturation content in the atmosphere;

[0065] In some embodiments, a cone area formed by drawing a circle with the actual height of the PLP as the vertex and a radius less than or equal to the actual protection range of the PLP can be used as the PLP installation area. The cone area is the PLP protection range before correction.

[0066] In some embodiments, the actual temperature, the actual relative air humidity in the atmosphere, and the actual water vapor saturation content in the atmosphere can be measured and obtained in the PLP installation area by using corresponding measurement tools.

[0067] In some embodiments, as an example, the actual temperature, the actual relative air humidity in the atmosphere, and the actual water vapor saturation content in the atmosphere can be measured once at a certain distance in the PLP installation area, and then the average of all measured actual temperatures, actual relative air humidity in the atmosphere, and actual water vapor saturation content in the atmosphere are calculated respectively, and the calculated actual temperature average, actual relative air humidity average, and actual water vapor saturation content average are used as the actual temperature, actual relative air humidity, and actual water vapor saturation content of the PLP installation area. In other embodiments, the actual temperature, actual relative air humidity, and actual water vapor saturation content of the PLP installation location can also be measured as the actual temperature, actual relative air humidity, and actual water vapor saturation content of the PLP installation area. The embodiments of the present application do not specifically limit this. Those skilled in the art can randomly select any of the aforementioned methods for measurement, and can also modify the aforementioned measurement method according to actual needs.

[0068] Step S20: calculating the reference absolute air humidity corresponding to the reference relative air humidity in the reference environment according to the actual water vapor saturation content and the reference relative air humidity in the reference environment; and calculating the actual absolute air humidity corresponding to the actual relative air humidity in the current environment according to the actual water vapor saturation content and the actual relative air humidity;

[0069] In this embodiment, the reference environment refers to an ideal environment. It is understandable that in an ideal environment, the PLP is not affected by temperature and humidity, and its protection range does not change. The current environment refers to the environment where the PLP is installed.

[0070] In some embodiments, the actual water vapor saturation content and the reference relative air humidity in the reference environment may be substituted into the absolute air humidity calculation formula to calculate the reference absolute air humidity corresponding to the reference relative air humidity in the reference environment. The absolute air humidity formula is the following formula (1):

[0071] (1)

[0072] Among them, H αi Relative air humidity RH i Corresponding absolute air humidity, RH i is the relative air humidity, and SVC is the saturated water vapor content in the atmosphere.

[0073] Specifically, assuming that the reference relative air humidity in the reference environment is RH0 and the actual water vapor saturation content is SVC, then substituting RH0 and SVC into the absolute air humidity formula, the reference absolute air humidity H can be calculated. α0 . Reference absolute air humidity H α0 It can be expressed as the following formula (2):

[0074] (2)

[0075] Similarly, assuming that the actual relative air humidity in the current environment is RH x , the actual water vapor saturation content is SVC, then RH x Substituting SVC into the absolute air humidity formula, the actual absolute air humidity H can be calculated. αx . Actual absolute air humidity H αx It can be expressed as the following formula (3):

[0076] (3)

[0077] In some embodiments, the reference relative air humidity in the reference environment may be 95%, ie, RH0=95%.

[0078] In addition, it should be noted that the present embodiment does not specifically limit the execution order of calculating the reference absolute air humidity and the actual absolute air humidity, and they may be executed simultaneously or sequentially.

[0079] Step S30: calculating the actual reference positive ion mobility corresponding to the reference actual temperature in the reference environment according to the reference absolute air humidity; and calculating the actual positive ion mobility corresponding to the actual temperature in the current environment according to the actual absolute air humidity;

[0080] In some embodiments, the reference positive ion mobility corresponding to the reference absolute air humidity at the target temperature can be calculated based on the reference absolute air humidity, and then the reference positive ion mobility can be converted into the actual reference positive ion mobility corresponding to the reference actual temperature. Similarly, the positive ion mobility corresponding to the actual absolute air humidity at the target temperature can be calculated based on the actual absolute air humidity, and then the positive ion mobility can be converted into the actual positive ion mobility corresponding to the actual temperature.

[0081] Specifically, the reference absolute air humidity can be substituted into the positive ion mobility calculation formula associated with the target temperature to calculate the reference positive ion mobility corresponding to the reference absolute air humidity at the target temperature. Similarly, the actual absolute air humidity can be substituted into the positive ion mobility calculation formula associated with the target temperature to calculate the positive ion mobility corresponding to the actual absolute air humidity at the target temperature.

[0082] In some embodiments, as an example, the target temperature may be 25°. The positive ion migration equation associated with the target temperature 25° is the following equation (4):

[0083] (4)

[0084] Among them, μ i+is the absolute air humidity at the target temperature H αi The corresponding positive ion mobility, H αi is the absolute air humidity.

[0085] Specifically, assuming that the reference absolute air humidity is H α0 , then the reference absolute air humidity H at 25° α0 The corresponding reference positive ion mobility is μ 0+ . Reference positive ion mobility μ 0+ It can be expressed as the following formula (5):

[0086] (5)

[0087] Similarly, assuming that the actual absolute air humidity is H αx , then the positive ion mobility corresponding to the actual absolute air humidity at 25° is μ x+ . Positive ion mobility μ x+ It can be expressed as the following formula (6):

[0088] (6)

[0089] In some embodiments, a large amount of temperature data and the actual positive ion mobility corresponding to the temperature data can be used for training in advance to obtain a linear relationship between temperature and actual positive ion mobility. After calculating the positive ion mobility corresponding to different air humidity at the target temperature, the positive ion mobility and the actual temperature are substituted into the linear relationship to obtain the positive ion mobility corresponding to the actual temperature. Specifically, the linear relationship obtained according to the aforementioned method can be called a positive ion mobility conversion calculation formula.

[0090] In view of this, in some embodiments, after calculating the reference positive ion mobility corresponding to the reference absolute air humidity at the target temperature and the positive ion mobility corresponding to the actual relative air humidity at the target temperature, the reference positive ion mobility and the reference actual temperature can be further substituted into the positive ion mobility conversion calculation formula to calculate the actual reference positive ion mobility corresponding to the reference actual temperature. Similarly, the positive ion mobility and the actual temperature can be substituted into the positive ion mobility conversion calculation formula to calculate the actual positive ion mobility corresponding to the actual temperature.

[0091] In some embodiments, the positive ion mobility conversion calculation formula obtained by training according to the aforementioned method can be the following formula (7):

[0092] (7)

[0093] Among them, μ it+ At temperature T iThe positive ion mobility corresponding to the absolute air humidity, μ i+ is the positive ion mobility corresponding to the absolute air humidity at the target temperature.

[0094] Specifically, as an example, assuming that the reference positive ion mobility at the target temperature of 25° is μ 0+ , the reference actual temperature is 30°, then the actual reference positive ion mobility at the reference actual temperature of 30° is μ 0t+ . Actual reference positive ion mobility μ 0t+ It can be expressed as the following formula (8):

[0095] (8)

[0096] Similarly, assuming that the positive ion mobility at the target temperature of 25° is μ x+ , the actual temperature is T, then the actual positive ion mobility at the actual temperature T is μ xt+ . Actual positive ion mobility μ xt+ It can be expressed as the following formula (9):

[0097] (9)

[0098] In addition, it should be noted that this embodiment does not specifically limit the execution order of the actual reference positive ion mobility and the actual positive ion mobility calculation, and they can be executed simultaneously or one after another.

[0099] Step S40: calculating the displacement difference between the actual reference positive ion mobility and the actual positive ion mobility during the PLP plasma release time;

[0100] In some embodiments, the actual reference positive ion mobility and the actual positive ion mobility can be substituted into the displacement difference calculation formula to calculate the displacement difference between the actual reference positive ion mobility and the actual positive ion mobility during the PLP plasma release time. The displacement difference calculation formula can be expressed as the following formula (10):

[0101] (10)

[0102] Where Δh is the actual reference positive ion mobility μ 0t+ The actual positive ion mobility μ xt+ The displacement difference during the PLP plasma release time, μ 0t+ is the actual reference positive ion mobility, μ xt+ is the actual positive ion mobility, E0 is the PLP corona starting field strength, and t=1S.

[0103] Step S50: modifying the PLP protection range according to the displacement difference.

[0104] In this embodiment, the displacement difference is the error value of the height difference of the PLP to the ground. Based on this, according to the relationship between the height difference of the PLP to the ground and the protection range radius, the error value of the PLP protection range radius can be determined, so as to correct the PLP protection range radius. Figure 3 , Figure 3 Schematic diagram of PLP protection scope before and after modification in some embodiments of the present application. Figure 3 As shown, the corrected PLP protection range is a conical area formed by drawing a circle with the actual height of the PLP after correction as the vertex and the radius of the corrected PLP protection range.

[0105] In some embodiments, the current actual height of the PLP can be obtained, and then the actual height of the PLP after correction is calculated based on the displacement difference and the current actual height of the PLP. Further, based on the actual height after correction of the PLP, the radius of the protection range after correction of the PLP is calculated, thereby realizing the correction of the radius of the protection range of the PLP. It should be noted that the height of the PLP described here refers to the height difference of the PLP above the ground.

[0106] Specifically, the displacement difference and the current actual height may be summed to calculate the actual height after PLP correction.

[0107] As an example, assuming that the displacement difference is Δh and the current actual height of the PLP is h, then the actual height of the PLP after correction is h x The actual height after correction is h x It can be expressed as the following formula (11):

[0108] (11)

[0109] Furthermore, the PLP protection range radius after correction can be calculated based on the relationship between the PLP protection range radius and the PLP height. The relationship between the PLP protection range radius and the PLP height is as follows (12):

[0110] (12)

[0111] Among them, r i is the radius of the PLP protection range, h i is the PLP height.

[0112] As an example, assume that the actual altitude after PLP correction is h x , then the radius of the modified PLP protection range is r x The modified PLP protection range radius r x It can be expressed as the following formula (13):

[0113] (13)

[0114] In addition, in some embodiments, after calculating the displacement difference, the displacement difference can be substituted into the relationship between the PLP protection range radius and the PLP height, that is, formula (12), so as to calculate the PLP protection range radius error value corresponding to the displacement difference, and then the PLP protection range radius error value corresponding to the displacement difference is summed with the actual protection range radius of the PLP to calculate the corrected PLP protection range radius.

[0115] To facilitate understanding of a method for correcting a PLP protection range taking into account the influence of temperature and humidity provided in an embodiment of the present application, an example is provided below, but it does not constitute a limitation to the embodiment of the present application.

[0116] Assume that the installation height of PLP is 20m. The actual temperature of the PLP installation area, the relative air humidity in the atmosphere, and the saturated water vapor content in the atmosphere are measured as follows: T=30°C, RH x =60%, SVC=7.9358g / m 2 The reference relative air humidity in the reference environment is RH0=95%, and the reference actual temperature is 30 degrees.

[0117] First, substitute the reference relative air humidity in the reference environment RH0=95% into the absolute air humidity calculation formula: Get the reference absolute air humidity H corresponding to the reference relative air humidity α0 =7.539g / m 3 Similarly, the actual relative air humidity RH x= Substitute 60% into the absolute air humidity calculation formula to obtain the actual absolute air humidity H corresponding to the actual relative air humidity αx =4.7615g / m 3 .

[0118] Then, the calculated reference absolute air humidity is substituted into the positive ion mobility calculation formula associated with the target temperature of 25°C: Get the reference positive ion mobility μ corresponding to the parameter absolute air humidity at the target temperature of 25°C 0+ =1.0043×10 -4 m 2 V -1 s -1 ; Similarly, the calculated actual absolute air humidity is substituted into the positive ion mobility calculation formula to obtain the positive ion mobility μ corresponding to the actual absolute air humidity at the target temperature of 25°C x+ =1.249×10 -4 m 2 V -1 s -1 .

[0119] Furthermore, the calculated reference positive ion mobility μ 0+ Substitute into the positive ion mobility conversion calculation formula: Get the actual reference positive ion mobility μ in the reference environment at the reference actual temperature 0t+ =1.013×10 -4 m 2 V -1 s -1 Similarly, the calculated positive ion mobility μ x+ Substitute into the positive ion mobility conversion calculation formula to obtain the actual positive ion mobility μ at the actual temperature in the current environment xt+ =1.259×10 -4 m 2 V -1 s -1 .

[0120] Then, the calculated reference positive ion mobility μ 0t+ and the actual positive ion mobility μ xt+ Substitute the displacement difference calculation formula: , and obtain the reference positive ion mobility μ 0t+ The actual positive ion mobility μ xt+ The displacement difference Δh during the PLP plasma release time is 0.982m (where E0 is 4000v / m and t is 1s).

[0121] Finally, the actual height h of PLP is compared with the displacement difference To sum: , and obtain the actual height h of the corrected PLP under the influence of temperature and humidity x =20.982m. The corrected actual height h x Substitute the relationship between PLP height and PLP protection range radius into: , the protection range radius of the modified PLP device in the horizontal dimension is r x =209.82m.

[0122] In the technical solution provided in this embodiment, the actual temperature of the PLP installation area, the actual relative air humidity in the atmosphere, and the actual water vapor saturation content in the atmosphere are obtained. Then, according to the actual water vapor saturation content and the reference relative air humidity in the reference environment, the reference absolute air humidity corresponding to the reference relative air humidity in the reference environment is calculated, and according to the actual water vapor saturation content and the actual relative air humidity, the actual absolute air humidity corresponding to the actual relative air humidity in the current environment is calculated. Further, according to the reference absolute air humidity, the actual reference positive ion mobility corresponding to the reference actual temperature in the reference environment is calculated, and according to the actual absolute air humidity, the actual positive ion mobility corresponding to the actual temperature in the current environment is calculated. The displacement difference between the actual reference positive ion mobility and the actual positive ion mobility during the PLP plasma release time can be further calculated, and the PLP protection range is corrected according to the displacement difference, thereby improving the accuracy of the PLP protection range calculation, so as to improve the protection reliability of the PLP device and make up for the defect of low protection accuracy of the traditional method.

[0123] Although the embodiment of the present application is aimed at correcting the PLP protection range of the PLP device, those skilled in the art should know that the PLP protection range correction method taking into account the influence of temperature and humidity provided in the embodiment of the present application is not limited to the PLP protection range correction taking into account the influence of temperature and humidity, but is applicable to any equipment related to ion migration in the atmosphere.

[0124] In some embodiments, see Figure 2 , Figure 2 Schematic diagram of the structure of the PLP device in some embodiments of the present application. Figure 2 As shown, some embodiments of the present application further provide a PLP device, including: a base, a needle holder, and an array lightning rod. In some embodiments, the height of the PLP device above the ground is the corrected actual height calculated by the PLP protection range correction method taking into account the influence of temperature and humidity described in any of the aforementioned embodiments, and the protection range radius of the PLP device is the corrected protection range radius calculated by the PLP protection range correction method taking into account the influence of temperature and humidity described in any of the aforementioned embodiments.

[0125] In addition, to achieve the above-mentioned purpose, the present application also provides a computer-readable storage medium, on which is stored a PLP protection range correction program that takes into account the influence of temperature and humidity. When the PLP protection range correction program that takes into account the influence of temperature and humidity is executed by a processor, the steps of the PLP protection range correction method that takes into account the influence of temperature and humidity as described above are implemented.

[0126] It should be noted that, in this article, the terms "include", "comprises" or any other variations thereof are intended to cover non-exclusive inclusion, so that a process, method, article or system including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or system. In the absence of further restrictions, an element defined by the sentence "comprises a ..." does not exclude the existence of other identical elements in the process, method, article or system including the element.

[0127] The serial numbers of the above-mentioned embodiments of the present application are for description only and do not represent the advantages or disadvantages of the embodiments.

[0128] Through the description of the above implementation methods, those skilled in the art can clearly understand that the above-mentioned embodiment methods can be implemented by means of software plus a necessary general hardware platform, and of course by hardware, but in many cases the former is a better implementation method. Based on this understanding, the technical solution of the present application, or the part that contributes to the prior art, can be embodied in the form of a software product, which is stored in a storage medium (such as ROM / RAM, magnetic disk, optical disk) as described above, and includes a number of instructions for a terminal device (which can be a mobile phone, a computer) to execute the methods described in each embodiment of the present application.

[0129] The above are only preferred embodiments of the present application, and are not intended to limit the patent scope of the present application. Any equivalent structure or equivalent process transformation made using the contents of the present application specification and drawings, or directly or indirectly applied in other related technical fields, are also included in the patent protection scope of the present application.

Claims

1. A method for correcting the PLP protection range taking into account the influence of temperature and humidity, characterized in that: The PLP protection range correction method taking into account the influence of temperature and humidity includes: Obtain the actual temperature of the PLP installation area, the actual relative air humidity in the atmosphere, and the actual water vapor saturation content in the atmosphere; Calculating a reference absolute air humidity corresponding to the reference relative air humidity in the reference environment according to the actual water vapor saturation content and the reference relative air humidity in the reference environment; and calculating an actual absolute air humidity corresponding to the actual relative air humidity in the current environment according to the actual water vapor saturation content and the actual relative air humidity; Calculating the actual reference positive ion mobility corresponding to the reference actual temperature in the reference environment according to the reference absolute air humidity; and calculating the actual positive ion mobility corresponding to the actual temperature in the current environment according to the actual absolute air humidity; Calculating the displacement difference between the actual reference positive ion mobility and the actual positive ion mobility during the PLP plasma release time; Correcting the PLP protection range according to the displacement difference; The step of correcting the PLP protection range according to the displacement difference comprises: Obtaining the current actual altitude of the PLP; Calculating the actual height after the PLP correction according to the displacement difference and the current actual height; Calculate the PLP corrected protection range radius according to the corrected actual height; The step of calculating the actual height after the PLP correction according to the displacement difference and the current actual height comprises: The displacement difference and the current actual height are summed to calculate the actual height after the PLP correction.

2. The method according to claim 1, characterized in that The step of calculating the reference absolute air humidity corresponding to the reference relative air humidity in the reference environment according to the actual water vapor saturation content and the reference relative air humidity in the reference environment comprises: Substituting the actual water vapor saturation content and the reference relative air humidity in the reference environment into the absolute air humidity calculation formula, and calculating the reference absolute air humidity corresponding to the reference relative air humidity in the reference environment; The step of calculating the actual absolute air humidity corresponding to the actual relative air humidity in the current environment according to the actual water vapor saturation content and the actual relative air humidity comprises: Substituting the actual water vapor saturation content and the actual relative air humidity into the absolute air humidity calculation formula to calculate the actual absolute air humidity corresponding to the actual relative air humidity in the current environment; Wherein, the absolute air humidity formula is: ； Among them, H αi Relative air humidity RH i Corresponding absolute air humidity, RH i is the relative air humidity, and SVC is the saturated water vapor content in the atmosphere.

3. The method according to claim 1, characterized in that The step of calculating the actual reference positive ion mobility corresponding to the reference actual temperature in the reference environment according to the reference absolute air humidity comprises: Calculating, according to the reference absolute air humidity, a reference positive ion mobility corresponding to the reference absolute air humidity at a target temperature; Converting the reference positive ion mobility into the actual reference positive ion mobility corresponding to the reference actual temperature; The step of calculating the actual positive ion mobility corresponding to the actual temperature in the current environment according to the actual absolute air humidity comprises: Calculating the positive ion mobility corresponding to the actual absolute air humidity at the target temperature according to the actual absolute air humidity; The positive ion mobility is converted into the actual positive ion mobility corresponding to the actual temperature.

4. The method according to claim 3, characterized in that The step of calculating the reference positive ion mobility corresponding to the reference absolute air humidity at the target temperature according to the reference absolute air humidity comprises: Substituting the reference absolute air humidity into the positive ion mobility calculation formula associated with the target temperature, and calculating the reference positive ion mobility corresponding to the reference absolute air humidity at the target temperature; The step of calculating the positive ion mobility corresponding to the actual absolute air humidity at the target temperature according to the actual absolute air humidity comprises: Substituting the actual absolute air humidity into the positive ion mobility calculation formula associated with the target temperature, and calculating the positive ion mobility corresponding to the actual absolute air humidity at the target temperature; Wherein, the target temperature is 25°, and the positive ion mobility calculation formula associated with the target temperature is: ； Among them, μ i+ is the absolute air humidity at the target temperature H αi The corresponding positive ion mobility, H αi is the absolute air humidity.

5. The method according to claim 3, characterized in that: The step of converting the reference positive ion mobility into the actual reference positive ion mobility corresponding to the reference actual temperature comprises: Substituting the reference positive ion mobility and the reference actual temperature into a positive ion mobility conversion calculation formula to calculate the actual reference positive ion mobility; The step of converting the positive ion mobility into the actual positive ion mobility corresponding to the actual temperature comprises: Substituting the positive ion mobility and the actual temperature into a positive ion mobility conversion calculation formula to calculate the actual positive ion mobility; Wherein, the positive ion mobility conversion calculation formula is: ； Among them, μ it+ At temperature T i The positive ion mobility corresponding to the absolute air humidity, μ i+ is the positive ion mobility corresponding to the absolute air humidity at the target temperature.

6. The method according to claim 1, characterized in that The step of calculating the displacement difference between the actual reference positive ion mobility and the actual positive ion mobility during the PLP plasma release time comprises: Substituting the actual reference positive ion mobility and the actual positive ion mobility into the displacement difference calculation formula, the displacement difference between the actual reference positive ion mobility and the actual positive ion mobility during the PLP plasma release time is calculated; Wherein, the displacement difference calculation formula is: ； Where Δh is the actual reference positive ion mobility μ 0t+ The actual positive ion mobility μ xt+ The displacement difference during the PLP plasma release time, μ 0t+ is the actual reference positive ion mobility, μ xt+ is the actual positive ion mobility, E0 is the PLP corona starting field strength, and t=1S.

7. A PLP device, characterized in that: The PLP device includes: a base, a needle holder and an array lightning rod; wherein the height of the PLP device above the ground is the corrected actual height calculated by the PLP protection range correction method taking into account the influence of temperature and humidity according to any one of claims 1 to 6, and the protection range radius of the PLP device is the corrected protection range radius calculated by the PLP protection range correction method taking into account the influence of temperature and humidity according to any one of claims 1 to 6.

8. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a PLP protection range correction program that takes into account the influence of temperature and humidity. When the PLP protection range correction program that takes into account the influence of temperature and humidity is executed by the processor, the steps of the PLP protection range correction method that takes into account the influence of temperature and humidity as described in any one of claims 1 to 6 are implemented.

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