Sample information inspection method and device

Abstract

The invention relates to the technical field of sample information detection, and provides a sample information inspection method and device.The sample information inspection method comprises the steps that a sample object is preprocessed, so that a fluorescent complex is formed on a sample on the sample object; and irradiating the sample object by using the vortex light beam so as to enable the fluorescent complex to emit fluorescent light. According to the arrangement, when the sample information is checked on the sample object, the vortex light beam is utilized to irradiate the preprocessed sample object, and the existence and distribution condition of the sample on the sample object can be determined according to the fluorescence formed on the sample object. The vortex light beam is used, orbital angular momentum is introduced, polarization characteristics of different substances can be better utilized, the contrast ratio of the position of a sample and other positions (called backgrounds) on a sample object is increased, the sample and the backgrounds are conveniently distinguished, the display effect of sample information is improved, and the display definition of the sample information is improved.

Description

Technical Field

[0001] The present invention relates to the technical field of sample information detection, and in particular to a sample information inspection method and device. Background Art

[0002] In many fields, such as forensic science, biomedicine, environmental monitoring and security systems, the collection and analysis of sample information is of great significance. Sample information can be, but is not limited to, fingerprints, sweat, urine, blood, etc. The accurate collection and analysis of these sample information is crucial for scientific research, disease diagnosis, environmental pollution monitoring and public safety.

[0003] Optical instruments such as lasers have been widely used in sample information inspection as an effective lighting inspection tool. Using the principle of photoluminescence, when the laser beam emitted by the laser is directly irradiated on the surface of an object where sample information may be left, the naturally existing or attached substances on the sample will absorb the external excitation light and radiate fluorescence with a longer wavelength, forming a brightness contrast with the surface of the object, thereby showing traces. The above-mentioned fluorescence radiated by the sample is called the signal of the sample light, while irrelevant stray light from the illumination light source, ambient light, etc. is called noise. When the noise is greater than the signal, the sample information is not clear due to the interference of the background light, and even the sample light will be annihilated in the background light, resulting in invisible sample information. The laser beam emitted by the laser used in the related art is generally a Gaussian beam. The beam intensity of the Gaussian beam presents a Gaussian distribution in space, with high light intensity in the center and gradually decreasing light intensity along the Gaussian contour outward, resulting in unclear sample information at the edge of the Gaussian beam. Summary of the invention

[0004] The present invention provides a sample information checking method and device to at least solve the above technical problems.

[0005] The present invention provides a sample information checking method, comprising: Pre-treating the sample object so that the sample on the sample object forms a fluorescent complex; The sample object is irradiated with a vortex beam to make the fluorescent complex emit fluorescence.

[0006] According to a sample information inspection method provided by the present invention, the vortex beam includes a polarized vortex beam and a phase vortex beam, and irradiating the sample object with the vortex beam includes: irradiating the sample object with one of the polarized vortex light beam and the phase vortex light beam, and observing the fluorescence effect of the fluorescent complex; If the fluorescence effect of the fluorescent complex is lower than an expected effect, the sample object is irradiated with the other of the polarized vortex beam and the phase vortex beam.

[0007] According to a sample information inspection method provided by the present invention, the polarized vortex light beam is formed by a laser light beam passing through a polarization device, a half wave plate and a vortex wave plate; When the sample object is irradiated with the polarized vortex light beam, the angle of the half wave plate is adjusted and / or the type of the vortex wave plate is replaced until the fluorescence effect of the fluorescent complex is higher than the expected effect.

[0008] According to a sample information inspection method provided by the present invention, the phase vortex beam is formed by a laser beam passing through a polarizing device, a half wave plate, a quarter wave plate and a vortex wave plate; When the sample object is irradiated with the phase vortex light beam, the angle of the half wave plate is adjusted and / or the type of the vortex wave plate is replaced until the fluorescence effect of the fluorescent complex is higher than the expected effect.

[0009] According to a sample information inspection method provided by the present invention, the vortex beam can be switched between the polarization vortex beam and the phase vortex beam by adding or removing the quarter-wave plate.

[0010] A sample information checking method provided by the present invention further includes: Image information of the fluorescence on the sample object is collected.

[0011] The present invention also provides a sample information inspection device, comprising: A light source module, adapted to emit a laser beam; a vortex light generating module, adapted to perform polarization modulation and phase modulation on the laser beam, so as to convert the laser beam into a vortex light beam, wherein the vortex light beam is adapted to irradiate a sample object; The beam expansion module is suitable for collimating and expanding the laser beam and / or the vortex beam.

[0012] According to a sample information inspection device provided by the present invention, the vortex light generation module includes: A polarizing device, adapted to polarize the laser beam to obtain a linearly polarized beam; A half wave plate, adapted to adjust the polarization direction of the linearly polarized light beam to obtain a modulated linearly polarized light beam; The vortex wave plate is suitable for performing phase modulation on the modulated linearly polarized light beam to convert the modulated linearly polarized light beam into the vortex light beam.

[0013] According to a sample information inspection device provided by the present invention, the vortex light generation module further includes: A quarter wave plate is arranged between the half wave plate and the vortex wave plate, wherein the quarter wave plate is suitable for modulating the modulated linearly polarized light beam into a circularly polarized light beam, and the vortex wave plate is suitable for phase modulating the circularly polarized light beam to convert the circularly polarized light beam into the vortex light beam.

[0014] A sample information inspection device provided by the present invention further includes: The image acquisition module is suitable for acquiring image information of fluorescence on the sample object.

[0015] In the sample information inspection method provided by the present invention, the sample object is first pre-treated so that the sample on the sample object forms a fluorescent complex; then the sample object is irradiated with a vortex light beam, and the fluorescent complex on the sample object will emit fluorescence under the excitation of the vortex light beam. With such an arrangement, when inspecting the sample information on the sample object, the pre-treated sample object is irradiated with a vortex light beam, and the presence and distribution of the sample on the sample object can be determined based on the fluorescence formed on the sample object. The use of a vortex light beam introduces orbital angular momentum, which can better utilize the polarization characteristics of different substances, increase the contrast between the position of the sample and the rest of the position on the sample object (called the background), facilitate the distinction between the sample and the background, improve the display effect of the sample information, and improve the display clarity of the sample information. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] In order to more clearly illustrate the technical solutions in the present invention or the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0017] Figure 1 It is a flow chart of the sample information checking method provided by the present invention.

[0018] Figure 2 It is a schematic diagram of the sample information inspection device provided by the present invention.

[0019] Figure 3 It is a structural schematic diagram of the sample information inspection device provided by the present invention.

[0020] Figure 4 It is a schematic diagram of the polarization vortex beam forming process provided by the present invention.

[0021] Figure 5 It is a schematic diagram of the phase vortex beam forming process provided by the present invention.

[0022] Reference numerals: 1. Light source module; 2. Vortex light generation module; 3. Sample object; 4. Polarizer; 5. Half wave plate; 6. Vortex wave plate; 7. Quarter wave plate; 8. Image acquisition module; 9. Filter; 10. Camera; 11. First beam expander; 12. Second beam expander; 13. First-order vortex wave plate; 14. Second-order vortex wave plate; 15. Horizontal linear polarized beam; 16. Vertical linear polarized beam; 17. Right-handed circularly polarized beam; 18. Left-handed circularly polarized beam; 19. Left-handed phase vortex beam; 20. Right-handed phase vortex beam; 21. Radially polarized vortex beam; 22. Angularly polarized vortex beam; 23. Anisotropic high-order polarized vortex beam; 24. Fluorescent complex; 25. Computer. DETAILED DESCRIPTION

[0023] In order to make the purpose, technical solution and advantages of the present invention clearer, the technical solution of the present invention will be clearly and completely described below in conjunction with the drawings of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0024] Combine the following Figures 1 to 5 The sample information checking method of the present invention is described.

[0025] like Figure 1 and Figure 5 As shown, the sample information checking method provided by the embodiment of the present invention mainly includes the following steps.

[0026] Step 110 : pre-treating the sample object so that the sample on the sample object forms a fluorescent complex.

[0027] Step 120: irradiate the sample object with the vortex light beam to make the fluorescent complex emit fluorescence.

[0028] That is, when checking the sample information on the sample object 3, the pre-processed sample object 3 is irradiated with the vortex beam, and the fluorescent complex 24 on the sample object 3 emits fluorescence under the excitation of the vortex beam. According to the fluorescence formed on the sample object 3, the presence and distribution of the sample on the sample object 3 can be determined.

[0029] The equiphase surface of the vortex beam is a spiral phase wavefront, the central light intensity is zero, and the light intensity is distributed in a ring shape. The use of vortex beams introduces orbital angular momentum, which can better utilize the polarization characteristics of different substances, increase the contrast between the sample location and the rest of the sample object (called the background), facilitate the distinction between the sample and the background, improve the display effect of the sample information, and improve the display clarity of the sample information.

[0030] It should be noted that, when pre-treating the sample object 3, a reagent for targeted discovery of biological traces, such as an amino acid sensitive reagent, can be selected. Biological traces include sample information such as fingerprints, sweat, urine, and blood. For fingerprints, when the sweat latent fingerprint contacts the sample object 3, the amino acids carried by the fingerprint ridges will penetrate into the interior of the sample object 3 with the sweat. When checking the sample information, the amino acid sensitive reagent is sprayed on the sample object 3, and the amino acid molecules derived from the human body react chemically with the indanedione in the amino acid sensitive reagent to form a fluorescent complex 24.

[0031] When the sample object 3 is irradiated with the vortex beam, the fluorescent complex 24 will emit fluorescence. In some embodiments, the inspector can directly observe the fluorescence effect on the sample object 3 using a filter, which is conducive to quickly locking the position of the sample information on the sample object 3. In other embodiments, the fluorescence position can also be photographed by a camera 10 with a filter element to lock the position of the sample information on the sample object 3 and collect the image information of the fluorescence on the sample object 3. After the camera 10 collects the image information of the fluorescence, the camera 10 can be connected to the computer 25 to display, save, and process the image information of the fluorescence. The computer 25 can further enhance the edge of the collected image information to obtain a clear original appearance of the sample.

[0032] The above-mentioned filter and filter element can filter out laser noise in the echo light, eliminate background light and stray light, and improve the signal-to-noise ratio.

[0033] Vortex beams include polarized vortex beams and phase vortex beams. Different types of vortex beams have different optical properties. When the type of vortex beam is a polarized vortex beam, the polarized vortex beam contains rich polarization states, and each point in the cross section of the beam has polarization states of different orientations, which can better utilize the polarization characteristics of different materials, distinguish samples from backgrounds, and expand image information. When the type of vortex beam is a phase vortex beam, the light introduces orbital angular momentum during transmission, which can resist the influence of scattering media, stimulate brighter fluorescence, and improve the signal-to-noise ratio.

[0034] In this embodiment, when the sample object 3 is irradiated with the vortex beam, the sample object 3 can be irradiated with one of the polarized vortex beam and the phase vortex beam, and the fluorescence effect of the fluorescent complex 24 can be observed. If the fluorescence effect of the fluorescent complex 24 is lower than the expected effect, the sample object 3 is irradiated with the other of the polarized vortex beam and the phase vortex beam.

[0035] The polarized vortex beam is divided into a radially polarized vortex beam 21, an angularly polarized vortex beam 22, and an anisotropic high-order polarized vortex beam 23. Specifically, when the polarized vortex beam is used to irradiate the sample object 3, the radially polarized vortex beam 21, the angularly polarized vortex beam 22, and the anisotropic high-order polarized vortex beam 23 can be used to irradiate the sample object 3, and the corresponding fluorescence effects can be observed respectively to obtain the best fluorescence effect.

[0036] In this embodiment, a polarized vortex beam is formed by a laser beam passing through a polarizer 4, a half wave plate 5 and a vortex wave plate 6. When the polarized vortex beam is used to irradiate the sample object 3, the angle of the half wave plate 5 can be adjusted and / or the type of the vortex wave plate 6 can be replaced until the fluorescence effect of the fluorescent complex 24 is higher than the expected effect.

[0037] The types of vortex wave plates 6 include first-order vortex wave plates 13 and second-order vortex wave plates 14 classified according to topological charge numbers. The vortex beam generated by the vortex wave plate 6 is a Laguerre-Gaussian beam.

[0038] When a radially polarized vortex light beam 21 is required whose polarization direction oscillates radially on the light field cross section, the angle of the half wave plate 5 can be adjusted so that the linearly polarized light beam generated by the half wave plate 5 is a horizontal linearly polarized light beam 15. At this time, it is necessary to select a first-order vortex wave plate 13, and make the angle between the zero-degree fast axis of the first-order vortex wave plate 13 and the horizontal linearly polarized light beam 15 zero degrees.

[0039] When an angularly polarized vortex light beam 22 with a polarization direction that oscillates vertically and radially on the light field cross section is required, the angle of the half wave plate 5 can be adjusted so that the linearly polarized light beam generated by the half wave plate 5 is a vertical linearly polarized light beam 16. At this time, it is necessary to select a first-order vortex wave plate 13, and make the angle between the zero-degree fast axis of the first-order vortex wave plate 13 and the vertical linearly polarized light beam 16 90 degrees.

[0040] When a high-order polarized vortex beam 23 with anisotropy in polarization direction on the light field cross section is required, the angle of the half wave plate 5 can be adjusted so that the linearly polarized beam generated by the half wave plate 5 is a horizontal linearly polarized beam 15. At this time, a second-order vortex wave plate 14 needs to be selected so that the angle between the zero-degree fast axis of the second-order vortex wave plate 14 and the horizontal linearly polarized beam 15 is an arbitrary angle.

[0041] The phase vortex beam is divided into a left-handed phase vortex beam 19 and a right-handed phase vortex beam 20. Specifically, when the phase vortex beam is used to irradiate the sample object 3, the left-handed phase vortex beam 19 and the right-handed phase vortex beam 20 can be used to irradiate the sample object 3 respectively, and the corresponding fluorescence effects can be observed respectively to obtain the best fluorescence effect.

[0042] In this embodiment, a phase vortex beam is formed by a laser beam passing through a polarizer 4, a half wave plate 5, a quarter wave plate 7 and a vortex wave plate 6; when the phase vortex beam is used to irradiate the sample object 3, the angle of the half wave plate 5 can be adjusted and / or the type of the vortex wave plate 6 can be replaced until the fluorescence effect of the fluorescent complex 24 is higher than the expected effect.

[0043] When a left-handed phase vortex beam 19 is needed, the angle of the half wave plate 5 can be adjusted so that the angle between the linearly polarized beam generated by the half wave plate 5 and the fast axis of the quarter wave plate 7 is negative 45 degrees, so that the circularly polarized beam generated by the quarter wave plate 7 is a right-handed circularly polarized beam 17. At this time, the first-order vortex wave plate 13 or the second-order vortex wave plate 14 can be selected.

[0044] When a right-handed phase vortex beam 20 is needed, the angle of the half wave plate 5 can be adjusted so that the angle between the linearly polarized beam generated by the half wave plate 5 and the fast axis of the quarter wave plate 7 is positive 45 degrees, so that the circularly polarized beam generated by the quarter wave plate 7 is a left-handed circularly polarized beam 18. At this time, the first-order vortex wave plate 13 or the second-order vortex wave plate 14 can be selected.

[0045] In a further embodiment, the optical element required to generate a polarized vortex beam and the optical element required to generate a phase vortex beam differ by only a quarter wave plate 7. During the inspection process, the vortex beam can be flexibly switched between the polarized vortex beam and the phase vortex beam by adding or removing the quarter wave plates 7, thereby changing the phase distribution of the light field.

[0046] In a specific implementation, for the sample information inspection device, the quarter wave plate 7 can be set in a plug-in manner, and the switching between the polarization vortex beam and the phase vortex beam can be achieved through a simple plug-in operation, which is simple to operate and is conducive to improving the inspection efficiency of the sample information.

[0047] In summary, the sample information inspection method provided by the embodiment of the present invention utilizes the difference in the response of the sample and the background to the incident light, improves the signal-to-noise ratio of the sample echo light signal, enhances the contrast between the sample and the background, improves the display effect of the sample information, and obtains rich sample information. Moreover, by using a variety of different types of vortex light beams to irradiate the sample object 3, a better fluorescence display effect can be obtained for sample objects 3 and samples of different materials, and the display clarity of the sample information is improved, which has strong versatility.

[0048] On the other hand, based on the same general inventive concept, an embodiment of the present invention further provides a sample information checking device. The sample information checking device described below and the sample information checking method described above can refer to each other.

[0049] like Figures 1 to 5As shown, an embodiment of the present invention provides a sample information inspection device, including a light source module 1, a vortex light generating module 2 and a beam expanding module.

[0050] Specifically, the light source module 1 is used to emit a laser beam, and the wavelength of the laser beam should be selected according to the fluorescence characteristics of the sample information to be detected.

[0051] The vortex light generating module 2 is used to perform polarization modulation and phase modulation on the laser beam so as to convert the laser beam into a vortex light beam. The vortex light beam is used to irradiate the sample object 3 so as to inspect the sample information.

[0052] The beam expansion module can collimate and expand the laser beam and / or vortex beam to increase the diameter of the vortex beam irradiated on the sample object 3, increase the size of the light spot formed on the sample object 3, and expand the irradiation area of ​​the sample information inspection device on the sample object 3 to increase the inspection efficiency.

[0053] When checking sample information on the sample object 3, the sample object 3 is first pre-processed so that the sample on the sample object 3 forms a fluorescent complex 24. Then, the pre-processed sample object 3 is irradiated with the vortex light beam emitted by the sample information inspection device provided in the embodiment of the present invention, and the fluorescent complex 24 on the sample object 3 will emit fluorescence under the excitation of the vortex light beam. According to the fluorescence formed on the sample object 3, the existence and distribution of the sample on the sample object 3 can be determined. The equiphase surface of the vortex light beam is a spiral phase wavefront, the central light intensity is zero, and the light intensity is distributed in a ring shape. The use of the vortex light beam introduces orbital angular momentum, which can better utilize the polarization characteristics of different substances, increase the contrast between the position of the sample and the rest of the position of the sample object 3 (called the background), facilitate the distinction between the sample and the background, improve the display effect of the sample information, and improve the display clarity of the sample information.

[0054] When the sample object 3 is irradiated with the vortex light beam, the fluorescent complex 24 will emit fluorescence. In some embodiments, the inspector can directly observe the fluorescence effect on the sample object 3 using a filter, which is helpful for quickly locking the position of the sample information on the sample object 3.

[0055] In some other embodiments, the sample information inspection device further includes an image acquisition module 8, which is used to lock the position of the sample information on the sample object 3 and acquire the image information of the fluorescence on the sample object 3. After the image acquisition module 8 acquires the image information of the fluorescence, the image acquisition module 8 can be connected to the computer 25 to display, save, and process the image information of the fluorescence. The computer 25 can further perform edge enhancement processing on the acquired image information to obtain a clear original appearance of the sample.

[0056] The image acquisition module 8 includes a filter 9 and a camera 10, and the filter 9 is located between the camera 10 and the sample object 3. The filter 9 is used to filter out laser noise in the echo light, eliminate background light and stray light, and improve the signal-to-noise ratio.

[0057] The camera 10 is used to collect fluorescence images. The camera 10 may be a charge-coupled device camera (full name: Charge-Coupled Device, abbreviated as CCD camera).

[0058] The light source module 1 is a laser, and the laser beam it emits is a Gaussian beam. The light source module 1 can be, but is not limited to, a semiconductor laser, a dye laser, a quantum cascade laser, a solid laser, a gas laser, etc. The laser can adjust the wavelength of the laser beam it emits, and the peak wavelength can be selected according to the excitation spectrum of the formed fluorescent complex, thereby determining the wavelength of the laser beam that the laser needs to emit.

[0059] In some embodiments, the beam expansion module can be configured to expand only the vortex beam, or the beam expansion module can be configured to expand both the laser beam and the vortex beam.

[0060] In this embodiment, the beam expansion module includes a first beam expander 11 and a second beam expander 12. The first beam expander 11 is arranged between the vortex light generating module 2 and the light source module 1. The first beam expander 11 can be used to collimate and expand the laser beam emitted by the light source module 1. The second beam expander 12 is arranged on the exit side of the vortex light generating module 2. The second beam expander 12 can be used to expand the vortex light beam.

[0061] In the embodiment of the present invention, the vortex light generating module 2 includes a polarizer 4 , a half wave plate 5 and a vortex wave plate 6 .

[0062] The polarization device 4 is used to polarize the laser beam to obtain a linearly polarized beam. The polarization device 4 may be, but is not limited to, a polarization beam splitter or a polarizer.

[0063] The half wave plate 5 is used to adjust the polarization direction of the linearly polarized light beam to obtain a modulated linearly polarized light beam. The vortex wave plate 6 is used to perform phase modulation on the modulated linearly polarized light beam to convert the modulated linearly polarized light beam into a vortex light beam.

[0064] By adjusting the angle of the half wave plate 5 and / or replacing the type of the vortex wave plate 6, the vortex wave plate 6 can be made to emit a radially polarized vortex light beam 21 whose polarization direction oscillates radially on the light field cross section, an angularly polarized vortex light beam 22 whose polarization direction oscillates perpendicularly to the radial direction on the light field cross section, and a high-order polarized vortex light beam 23 whose polarization direction is anisotropic on the light field cross section.

[0065] When the polarized vortex beam is used to irradiate the sample object 3, the radially polarized vortex beam 21, the angularly polarized vortex beam 22 and the anisotropic high-order polarized vortex beam 23 can be used to irradiate the sample object 3 respectively, and the corresponding fluorescence effects can be observed respectively to obtain the best fluorescence effect.

[0066] The types of vortex wave plates 6 include first-order vortex wave plates 13 and second-order vortex wave plates 14 , which are classified according to topological charges.

[0067] Specifically, when a radially polarized vortex beam 21 is required whose polarization direction oscillates radially on the light field cross section, the angle of the half wave plate 5 can be adjusted so that the linearly polarized beam generated by the half wave plate 5 is a horizontal linearly polarized beam 15. At this time, it is necessary to select a first-order vortex wave plate 13, and make the angle between the zero-degree fast axis of the first-order vortex wave plate 13 and the horizontal linearly polarized beam 15 zero degrees.

[0068] When an angularly polarized vortex light beam 22 with a polarization direction that oscillates vertically and radially on the light field cross section is required, the angle of the half wave plate 5 can be adjusted so that the linearly polarized light beam generated by the half wave plate 5 is a vertical linearly polarized light beam 16. At this time, it is necessary to select a first-order vortex wave plate 13, and make the angle between the zero-degree fast axis of the first-order vortex wave plate 13 and the vertical linearly polarized light beam 16 90 degrees.

[0069] When a high-order polarized vortex beam 23 with anisotropy in polarization direction on the light field cross section is required, the angle of the half wave plate 5 can be adjusted so that the linearly polarized beam generated by the half wave plate 5 is a horizontal linearly polarized beam 15. At this time, a second-order vortex wave plate 14 needs to be selected so that the angle between the zero-degree fast axis of the second-order vortex wave plate 14 and the horizontal linearly polarized beam 15 is an arbitrary angle.

[0070] Specifically, the half wave plate 5 can be rotatably disposed between the polarization device 4 and the vortex wave plate 6. The angle of the half wave plate 5 can be adjusted by rotating the half wave plate 5.

[0071] The vortex wave plate 6 includes a first-order vortex wave plate 13 and a second-order vortex wave plate 14, and the topological charge of the first-order vortex wave plate 13 is different from the topological charge of the second-order vortex wave plate 14. At this time, any one of the first-order vortex wave plate 13 and the second-order vortex wave plate 14 can be detachably arranged on the side of the half wave plate 5 away from the polarizer 4. One of the first-order vortex wave plate 13 and the second-order vortex wave plate 14 can be installed on the side of the half wave plate 5 away from the polarizer 4 as needed.

[0072] In the embodiment of the present invention, the vortex light generating module 2 further includes a quarter wave plate 7, which is disposed between the half wave plate 5 and the vortex wave plate 6. The quarter wave plate 7 is used to modulate the modulated linearly polarized light beam into a circularly polarized light beam, and the vortex wave plate 6 is used to perform phase modulation on the circularly polarized light beam to convert the circularly polarized light beam into a vortex light beam.

[0073] When a quarter wave plate 7 is arranged between the half wave plate 5 and the vortex wave plate 6, by adjusting the angle of the half wave plate 5 and / or replacing the type of the vortex wave plate 6, the vortex wave plate 6 can emit a left-handed phase vortex light beam 19 and a right-handed phase vortex light beam 20.

[0074] When the phase vortex beam is used to irradiate the sample object 3, the left-handed phase vortex beam 19 and the right-handed phase vortex beam 20 can be used to irradiate the sample object 3 respectively, and the corresponding fluorescence effects can be observed respectively to obtain the best fluorescence effect.

[0075] Specifically, when a left-handed phase vortex beam 19 is needed, the angle of the half wave plate 5 can be adjusted so that the angle between the linearly polarized beam generated by the half wave plate 5 and the fast axis of the quarter wave plate 7 is negative 45 degrees, so that the circularly polarized beam generated by the quarter wave plate 7 is a right-handed circularly polarized beam 17. At this time, the first-order vortex wave plate 13 or the second-order vortex wave plate 14 can be selected.

[0076] When a right-handed phase vortex beam 20 is needed, the angle of the half wave plate 5 can be adjusted so that the angle between the linearly polarized beam generated by the half wave plate 5 and the fast axis of the quarter wave plate 7 is positive 45 degrees, so that the circularly polarized beam generated by the quarter wave plate 7 is a left-handed circularly polarized beam 18. At this time, the first-order vortex wave plate 13 or the second-order vortex wave plate 14 can be selected.

[0077] The optical elements required to generate a polarized vortex beam and the optical elements required to generate a phase vortex beam differ only by a quarter wave plate 7. During the inspection process, the vortex beam can be switched between a polarized vortex beam and a phase vortex beam by adding or removing a quarter wave plate 7.

[0078] In this embodiment, the quarter wave plate 7 is detachably arranged between the half wave plate 5 and the vortex wave plate 6. Specifically, the quarter wave plate 7 can be arranged in a plug-in structure, and the switching between the polarized vortex beam and the phase vortex beam can be realized through a simple plug-in operation, which is simple to operate and is conducive to improving the inspection efficiency of the sample information.

[0079] In summary, the sample information inspection device provided by the embodiment of the present invention utilizes the difference in the response of the sample and the background to the incident light, improves the signal-to-noise ratio of the sample echo light signal, enhances the contrast between the sample and the background, improves the display effect of the sample information, and obtains rich sample information. Moreover, through adjustment, a variety of different types of vortex light beams can be used to irradiate the sample object 3, and a better fluorescence display effect can be obtained for sample objects 3 and samples of different materials, thereby improving the display clarity of the sample information, and having strong versatility.

[0080] Specifically, the sample information checking method and the method for using the sample information checking device are described by taking the collection of sweat latent fingerprint images as an example.

[0081] When the latent fingerprint of sweat contacts the surface of the object, the amino acids carried by the fingerprint ridges penetrate into the interior of the object with the sweat. Spray the amino acid sensitive reagent on the surface of the sample object 3, and the amino acid molecules derived from the human body react chemically with the indanedione in the reagent to obtain the fluorescent complex 24. According to the excitation spectrum of the fluorescent complex 24, the peak wavelength is selected to determine the wavelength of the laser beam required to be emitted by the laser. If the wavelength of the required laser beam is 532 nanometers, a 532 nanometer laser can be selected as the light source module 1. By rotating the half wave plate 5, changing the type of the vortex wave plate 6, and disassembling the quarter wave plate 7, modulation of vortex beams of different modes can be achieved, and the generated vortex beams are irradiated onto the surface of the sample object 3. The sample object 3 is usually permeable, such as various types of paper, wood, stone, brick, etc. The fluorescent complex 24 on the sample object 3 radiates fluorescence under the irradiation of external excitation light. Due to the Stokes shift, the wavelength of the fluorescence is longer than the excitation light source. A long-wave filter 9 is set at the receiving end of the fluorescence image information to cut off the laser noise and pass the fluorescence signal to form a brightness contrast. The fingerprint fluorescence image can be recorded and saved using a camera 10.

[0082] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A sample information inspection method, characterized in that: include: Pre-treating the sample object so that the sample on the sample object forms a fluorescent complex; The sample object is irradiated with a vortex beam to make the fluorescent complex emit fluorescence.

2. The sample information checking method according to claim 1, characterized in that: The vortex beam includes a polarized vortex beam and a phase vortex beam, and irradiating the sample object with the vortex beam includes: irradiating the sample object with one of the polarized vortex light beam and the phase vortex light beam, and observing the fluorescence effect of the fluorescent complex; If the fluorescence effect of the fluorescent complex is lower than an expected effect, the sample object is irradiated with the other of the polarized vortex beam and the phase vortex beam.

3. The sample information checking method according to claim 2, characterized in that: The polarized vortex beam is formed by a laser beam passing through a polarization device, a half wave plate and a vortex wave plate; When the sample object is irradiated with the polarized vortex light beam, the angle of the half wave plate is adjusted and / or the type of the vortex wave plate is replaced until the fluorescence effect of the fluorescent complex is higher than the expected effect.

4. The sample information checking method according to claim 2, characterized in that: The phase vortex light beam is formed by a laser light beam passing through a polarizing device, a half wave plate, a quarter wave plate (7) and a vortex wave plate; When the sample object is irradiated with the phase vortex light beam, the angle of the half wave plate is adjusted and / or the type of the vortex wave plate is replaced until the fluorescence effect of the fluorescent complex is higher than the expected effect.

5. The sample information checking method according to claim 4, characterized in that: By adding or removing the quarter wave plate, the vortex beam can be switched between the polarization vortex beam and the phase vortex beam.

6. The sample information checking method according to any one of claims 1 to 5, characterized in that: Also includes: Image information of the fluorescence on the sample object is collected.

7. A sample information inspection device, characterized in that: include: A light source module (1) adapted to emit a laser beam; A vortex light generating module (2) adapted to perform polarization modulation and phase modulation on the laser light beam so as to convert the laser light beam into a vortex light beam, wherein the vortex light beam is adapted to irradiate a sample object (3); The beam expansion module is suitable for collimating and expanding the laser beam and / or the vortex beam.

8. The sample information inspection device according to claim 7, characterized in that: The vortex light generating module (2) comprises: A polarizing device (4) adapted to perform polarization processing on the laser beam to obtain a linearly polarized beam; A half wave plate (5) adapted to adjust the polarization direction of the linearly polarized light beam to obtain a modulated linearly polarized light beam; A vortex wave plate (6) is suitable for performing phase modulation on the modulated linearly polarized light beam to convert the modulated linearly polarized light beam into the vortex light beam.

9. The sample information inspection device according to claim 8, characterized in that: The vortex light generating module (2) further comprises: A quarter wave plate (7) is arranged between the half wave plate (5) and the vortex wave plate (6), wherein the quarter wave plate (7) is suitable for modulating the modulated linearly polarized light beam into a circularly polarized light beam, and the vortex wave plate (6) is suitable for performing phase modulation on the circularly polarized light beam to convert the circularly polarized light beam into the vortex light beam.

10. The sample information inspection device according to any one of claims 7 to 9, characterized in that: Also includes: The image acquisition module (8) is suitable for acquiring image information of fluorescence on the sample object (3).

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