Testing transceiver ports of network devices using on-chip time domain reflectometer diagnostic testing

Abstract

The disclosure relates to testing transceiver ports of a network device using an on-chip time domain reflectometer diagnostic test. A network device may identify an integrated circuit, a port group number, a port channel, and a port channel associated with a transceiver port of the network device, and may map the integrated circuit, the port group number, the port channel, and the port channel to the transceiver port. The network device may provide a time domain reflectometer pulse of a first voltage at a first time and to a channel of the transceiver port, and may receive a time domain reflectometer pulse reflecting a second voltage at a second time and via the channel. The network device may calculate a distance and an impedance of the channel based on the first time, the second time, the first voltage, and the second voltage, and may determine a state of the channel based on the distance and the impedance. The network device may output a state of the first channel.

Description

Background Art

[0001] There is a need to test the signal quality at the high-speed (e.g., one hundred gigabit) serializer / deserializer (serdes) wide area network (WAN) transceiver ports of network equipment for any impairments before and / or during deployment of the network equipment. Conventional techniques cannot scale to test a large number of transceiver ports and are time consuming and expensive. Summary of the invention

[0002] Some implementations described herein relate to a method. The method may include identifying an integrated circuit, a port group number, a port lane, and a port channel associated with a transceiver port of a network device, and mapping the integrated circuit, the port group number, the port lane, and the port channel to the transceiver port. The method may include providing a first time domain reflectometer pulse of a first voltage to a first channel of a transceiver port at a first time, and receiving a first reflected time domain reflectometer pulse of a second voltage via the first channel at a second time. The method may include calculating a first distance and a first impedance of the first channel based on the first time, the second time, the first voltage, and the second voltage, and determining a state of the first channel based on the first distance and the first impedance. The method may include outputting a state of the first channel. The state may indicate whether the first channel is through or faulty based on whether the first channel meets a programmable threshold.

[0003] Some implementations described herein relate to a network device that may include one or more processors. The one or more processors may be configured to identify an integrated circuit, a port group number, a port channel, and a port channel associated with a transceiver port of the network device, and map the integrated circuit, the port group number, the port channel, and the port channel to the transceiver port, and the one or more processors may be configured to provide a first time domain reflectometer pulse of a first voltage to a first channel of the transceiver port at a first time, and receive a first reflected time domain reflectometer pulse of a second voltage at a second time and via the first channel. The one or more processors may be configured to calculate a first distance and a first impedance of the first channel based on the first time, the second time, the first voltage, and the second voltage, and determine a state of the first channel based on the first distance and the first impedance. The one or more processors may be configured to provide a second time domain reflectometer pulse of a third voltage to a second channel of the transceiver port at a third time, and receive a second reflected time domain reflectometer pulse of a fourth voltage at a fourth time and via the second channel. The one or more processors may be configured to calculate a second distance and a second impedance of the second channel based on the third time, the fourth time, the third voltage, and the fourth voltage, and determine a state of the second channel based on the second distance and the second impedance. The one or more processors may be configured to output the state of the first channel and the state of the second channel.

[0004] Some implementations described herein relate to a non-transitory computer-readable medium storing a set of instructions for a network device. When executed by one or more processors of the network device, the set of instructions may cause the network device to identify a transceiver port of the network device and provide a first time domain reflectometer pulse at a first voltage at a first time and to a first channel of the transceiver port. When executed by one or more processors of the network device, the set of instructions may cause the network device to receive a first reflected time domain reflectometer pulse at a second voltage at a second time and via the first channel, and calculate a first distance and a first impedance of the first channel based on the first time, the second time, the first voltage, and the second voltage. When executed by one or more processors of the network device, the set of instructions may cause the network device to determine a state of the first channel based on the first distance and the first impedance, and provide a second time domain reflectometer pulse at a third voltage at a third time and to a second channel of the transceiver port. When executed by one or more processors of the network device, the set of instructions may cause the network device to receive a second reflected time domain reflectometer pulse at a fourth voltage at a fourth time and via the second channel, and calculate a second distance and a second impedance of the second channel based on the third time, the fourth time, the third voltage, and the fourth voltage. When executed by one or more processors of a network device, a set of instructions may cause the network device to determine a state of a second channel based on the second distance and the second impedance, and output the state of the first channel and the state of the second channel. BRIEF DESCRIPTION OF THE DRAWINGS

[0005] Figures 1A-1H A diagram of an example associated with testing a transceiver port of a network device using an on-chip time domain reflectometry diagnostic test.

[0006] Figure 2 is a diagram of an example environment in which the systems and / or methods described herein may be implemented.

[0007] Figure 3 and 4 for Figure 2 A diagram of example components of one or more devices.

[0008] Figure 5 A flow chart of an example process for testing a transceiver port of a network device using an on-chip time domain reflectometry diagnostic test. DETAILED DESCRIPTION

[0009] The following detailed description of example implementations refers to the accompanying drawings.The same reference numbers in different drawings may identify the same or similar elements.

[0010] The WAN transceiver port of a network device (e.g., a one hundred gigabit (G) WAN) needs to be tested for improperly connected cable connectors, open circuits or short circuits (e.g., which may cause functional failures of the network device), etc. Current diagnostic test equipment requires disassembling the network device, measuring the transmit and receive channels of the WAN transceiver port or the optical transceiver port using an instrument-grade time domain reflectometry (TDR) with a host device adaptability test board (HCB), and analyzing the test results to identify, for example, any open circuits or short circuits. Such test equipment does not scale to test a large number of network devices, is expensive and time-consuming, and requires technical expertise to analyze the test results and identify problems with the network device. Therefore, the current technology for testing the 100G WAN transceiver port of a network device consumes computing resources (e.g., processing resources, memory resources, communication resources, etc.), network resources, etc. associated with disassembling the network device, measuring the WAN transceiver port of the network device using an instrument-grade TDR and using an HCB, analyzing the test results and identifying problems in the network device, etc.

[0011] Some implementations described herein relate to a network device (e.g., an on-chip diagnostic tool of a network device) that uses an on-chip time domain reflectometer diagnostic test to test a transceiver port of the network device. For example, the network device may identify an integrated circuit, a port group number, a port channel, and a port channel associated with a transceiver port of the network device, and may map the integrated circuit, the port group number, the port channel, and the port channel to the transceiver port. The network device may provide a first TDR pulse of a first voltage to a first channel of the transceiver port at a first time, and may receive a first reflected TDR pulse of a second voltage at a second time and via the first channel. The network device may calculate a first distance and a first impedance of the first channel based on the first time, the second time, the first voltage, and the second voltage, and may determine a state of the first channel based on the first distance and the first impedance. The network device may provide a second TDR pulse of a third voltage to a second channel of the transceiver port at a third time, and may receive a second reflected TDR pulse of a fourth voltage at a fourth time and via the second channel. The network device may calculate a second distance and a second impedance of the second channel based on the third time, the fourth time, the third voltage, and the fourth voltage, and may determine a state of the second channel based on the second distance and the second impedance. The network device may output a status of the first channel and a status of the second channel. The method employed by the network device (e.g., by a diagnostic tool) may be used by manufacturing, field testing, and / or the like for eight hundred gigabit (G) WAN port applications, for verifying channels associated with a fiber optic interface (chip-to-chip interface) of the network device, and the like.

[0012] In this way, the network device uses an on-chip time domain reflectometer diagnostic test to test the transceiver port of the network device. For example, the network device may include an on-chip TDR diagnostic tool that detects open circuits, short circuits, matching channels, and mismatching channels on a WAN transceiver (e.g., serdes) port of the network device without interrupting the network device. The on-chip TDR diagnostic tool can be used by manufacturing personnel, engineering personnel, or a field test team to identify problems with a WAN transceiver port (e.g., a WAN transceiver port of 800G per second) of a network device without using expensive and complex devices or experts to analyze the test results. The on-chip TDR diagnostic tool can map the application-specific integrated circuit (ASIC) of the network device to the WAN transceiver port of the network device, and can report the status of each WAN transceiver port. The on-chip TDR diagnostic tool can use logistic regression to determine the optimal programmable threshold for pass / fail determination of each WAN transceiver port. Therefore, the network device saves computing resources, network resources, etc. that should be consumed by disassembling the network device, measuring the WAN transceiver port of the network device using instrument-level TDR and HCB, analyzing the test results, and identifying problems in the network device.

[0013] Figures 1A-1H FIG. 1 is a diagram of an example 100 associated with testing a transceiver port of a network device using an on-chip time domain reflectometer diagnostic test. Figures 1A-1H As shown, example 100 includes a user device and a server device associated with a network of network devices. Additional details of the user device, server device, network, and network devices are provided elsewhere herein.

[0014] like Figure 1A And as shown by reference numeral 105, the network device can receive network traffic. For example, the user device and the server device can utilize the network of the network device to exchange network traffic (e.g., packets). In some implementations, the user device can generate network traffic to the server device and can provide the network traffic to the network via the network device. The network device can receive network traffic and can forward the network traffic to the server device directly or via one or more other network devices.

[0015] like Figure 1B As shown, a network device may include multiple high-speed (e.g., one hundred gigabit) WAN transceiver (serdes) ports that need to be tested before and / or during deployment of the network device. A serdes is an integrated circuit transceiver that converts parallel data to serial data, and vice versa. The transmitter portion is a parallel-to-serial converter, and the receiver portion is a serial-to-parallel converter. The WAN transceiver ports of the network device need to be tested for improperly connected cable connectors, open circuits or short circuits (e.g., which can cause functional failure of the network device), etc. As shown in FIG. Figure 1BAs also shown, the network device may include a processing chip (e.g., an ASIC) having a diagnostic tool. The diagnostic tool of the network device may be connected to one of the WAN transceiver ports of the network device. In some implementations, the diagnostic tool may include an on-chip TDR diagnostic tool that detects open circuits (e.g., breaks in the path), short circuits, matching channels, and mismatching channels on the WAN transceiver port of the network device without interrupting the network device.

[0016] like Figure 1C As shown, the diagnostic tool of the ASIC of the network device can be associated with a transmit (Tx) application specific integrated circuit (ASIC), which can be connected to a first printed circuit board (PCB) trace, a first connector, and a first cable (e.g., a flying cable) of a first channel (e.g., an N channel) and a second channel (e.g., a P channel). The first cable (e.g., the first channel and the second channel) can be connected to a WAN transceiver port including an electrical loopback. The diagnostic tool of the ASIC of the network device can also be associated with a receiver (Rx) ASIC, which can be connected to a second PCB trace, a second connector, and a second cable (e.g., a flying cable) of the first channel and the second channel. The second cable (e.g., the first channel and the second channel) can be connected to the WAN transceiver port. The electrical loopback of the WAN transceiver port can be connected to the first channel and the second channel between the first cable and the second cable. When the transceiver port is a fiber optic (e.g., chip-to-chip) transceiver port, the electrical loopback is unnecessary.

[0017] like Figure 1C And also shown by reference numeral 115, the diagnostic tool can identify the ASIC, port group number, port channel and port channel, and map it to the WAN transceiver port of the network device. For example, the WAN transceiver port can be associated with a port number, and the diagnostic tool can identify the port number of the WAN transceiver port. The Tx ASIC, Rx ASIC, the first and second PCB traces, the first and second connectors, and the first and second cables can be associated with the port group number, port channel (e.g., zero to seven) and port channel (e.g., the first channel and the second channel). The diagnostic tool can identify the port group number, port channel and port channel associated with the Tx ASIC, Rx ASIC, the first and second PCB traces, the first and second connectors, and the first and second cables. The diagnostic tool can map the Tx ASIC, Rx ASIC, port group number, port channel and port channel with the port number of the WAN transceiver port. In this way, the diagnostic tool simplifies the testing process because the user of the diagnostic tool does not need to know the complex port mapping of the network device.

[0018] like Figure 1DAnd as shown by reference numeral 120, the diagnostic tool can provide a TDR pulse of a first voltage at a first time and to a first channel of the WAN transceiver port. For example, the diagnostic tool can generate a TDR pulse of a first voltage (e.g., a fast edge step) at a first time. The TDR measures reflections caused by impedance changes in the path between the time when the TDR pulse is sent and returned. By measuring the time and knowing the propagation speed of the medium (e.g., channel characteristics), the distance to the reflection point can be calculated. The diagnostic tool can provide a TDR pulse of a first voltage at a first time and to a first channel (e.g., N channel) of the WAN transceiver port.

[0019] like Figure 1D And also shown by reference numeral 125, the diagnostic tool can receive a TDR pulse reflecting a second voltage at a second time and via the first channel. For example, the TDR pulse can pass through the first channel and reflect in the first channel. The reflected TDR pulse can be returned to the diagnostic tool and can be received by the diagnostic tool at a second time (e.g., after the first time) and with a second voltage. In some implementations, if there is a problem with the first channel (e.g., an open circuit, a short circuit, etc.), the TDR pulse can pass through a portion of the first channel (e.g., to the position of the open circuit, the short circuit, etc.), and can be reflected back to the diagnostic tool via this portion of the first channel. In such implementations, the second voltage of the reflected TDR pulse can be different from the first voltage. Alternatively, if there is no problem with the first channel, the TDR pulse can pass through the entire first channel and can be reflected back to the diagnostic tool via the first channel. In such implementations, the second voltage of the reflected TDR pulse can be the same or almost the same as the first voltage.

[0020] like Figure 1EAnd as shown by reference numeral 130, the diagnostic tool can calculate the first distance and the first impedance of the first channel based on the first and second times and the first and second voltages. For example, the diagnostic tool can calculate the first distance based on the first time, the second time, and the propagation speed of the medium (e.g., channel characteristics). The diagnostic tool can determine the time difference between the first time and the second time, and can multiply the time difference by the propagation speed of the medium (e.g., channel characteristics) to calculate the first distance. In some implementations, if there is a problem with the first channel (e.g., open circuit, short circuit, etc.), the first distance can be shorter than the entire length of the first channel. Alternatively, if there is no problem with the first channel, the first distance can be equal to the entire length of the first channel. The diagnostic tool can calculate the first impedance by dividing the first voltage by the current of the TDR pulse or by dividing the second voltage by the current of the TDR pulse. If there is a problem with the first channel, the first impedance calculated based on the first voltage may not match or substantially match the first impedance calculated based on the second voltage (e.g., impedance mismatch). Alternatively, if there is no problem with the first channel, the first impedance calculated based on the first voltage can match the first impedance calculated based on the second voltage (e.g., impedance matching).

[0021] like Figure 1E And also shown by reference numeral 135, the diagnostic tool can determine the state of the first channel based on the first distance and the first impedance. For example, when the first distance is equal to the entire length of the first channel and there is an impedance match associated with the first impedance, the diagnostic tool can determine that there is no problem with the first channel. In some implementations, when the first distance is less than the entire length of the first channel and based on the first impedance, the diagnostic tool can determine that there is a break (or open circuit) in the first channel. In some implementations, when the first distance is less than the entire length of the first channel and based on the first impedance, the diagnostic tool can determine that there is a short circuit associated with the first channel. In some implementations, when the first impedance calculated based on the first voltage cannot match the first impedance calculated based on the second voltage, the diagnostic tool can determine that there is an impedance mismatch associated with the first channel.

[0022] In some implementations, when the state of the first channel is an open circuit or a short circuit associated with the first channel, the diagnostic tool can determine the distance to the open circuit or the short circuit associated with the first channel based on the first distance, and can output the distance to the open circuit or the short circuit. In some implementations, the diagnostic tool can determine the location of the discontinuity (e.g., an open circuit or a short circuit) of the ASIC of the WAN transceiver port (e.g., at the Tx ASIC or at the Rx ASIC) based on the distance to the open circuit or the short circuit associated with the first channel. For example, when the distance is short, the diagnostic tool can associate the discontinuity with the Tx ASIC, the first PCB trace, the first connector, and / or the first cable. When the distance is long, the diagnostic tool can associate the discontinuity with the Rx ASIC, the second PCB trace, the second connector, and / or the second cable. In such implementations, the diagnostic tool can provide an indication of whether the discontinuity (e.g., an open circuit, a short circuit, a mismatch, etc.) is located on the Tx side or the Rx side (e.g., for a SiFly connector) or the module connector side.

[0023] like Figure 1F And as shown by reference numeral 140, the diagnostic tool can provide a TDR pulse of a third voltage at a third time and to a second channel of the WAN transceiver port. For example, the diagnostic tool can generate a TDR pulse (e.g., a fast edge step) of a third voltage (e.g., equal to or different from the first voltage) at a third time (e.g., equal to or different from the first voltage). The TDR measurement path reflects the impedance change caused by the time between the time when the TDR pulse is sent and returned. By measuring the time and knowing the propagation speed of the medium (e.g., channel characteristics), the distance to the reflection point can be calculated. The diagnostic tool can provide a TDR pulse of a third voltage at a third time and to a second channel (e.g., P channel) of the WAN transceiver port.

[0024] like Figure 1FAnd also shown by reference numeral 145, the diagnostic tool can receive a TDR pulse reflecting a fourth voltage at a fourth time and via the second channel. For example, the TDR pulse can pass through the second channel and reflect in the second channel. The reflected TDR pulse can be returned to the diagnostic tool and can be received by the diagnostic tool at a fourth time (for example, after the third time) and with a fourth voltage. In some implementations, if there is a problem with the second channel (for example, an open circuit, a short circuit, etc.), the TDR pulse can pass through a portion of the second channel (for example, to the position of the open circuit, the short circuit, etc.), and can be reflected back to the diagnostic tool via this portion of the second channel. In such implementations, the fourth voltage of the reflected TDR pulse can be different from the third voltage. Alternatively, if there is no problem with the second channel, the TDR pulse can pass through the entire second channel and can be reflected back to the diagnostic tool via the second channel. In such implementations, the fourth voltage of the reflected TDR pulse can be the same or almost the same as the third voltage.

[0025] like Figure 1G And as shown by reference numeral 150, the diagnostic tool can calculate the second distance and the second impedance of the second channel based on the third and fourth times and the third and fourth voltages. For example, the diagnostic tool can calculate the second distance based on the third time, the fourth time and the propagation speed of the medium (e.g., channel characteristics). The diagnostic tool can determine the time difference between the third time and the fourth time, and can multiply the time difference by the propagation speed of the medium (e.g., channel characteristics) to calculate the second distance. In some implementations, if there is a problem with the second channel (e.g., open circuit, short circuit, etc.), the second distance can be shorter than the entire length of the second channel. Alternatively, if there is no problem with the second channel, the second distance can be equal to the entire length of the second channel. The diagnostic tool can calculate the second impedance by dividing the third voltage by the current of the TDR pulse or by dividing the fourth voltage by the current of the TDR pulse. If there is a problem with the second channel, the second impedance calculated based on the third voltage may not match the second impedance calculated based on the fourth voltage (e.g., impedance mismatch). Alternatively, if there is no problem with the second channel, the second impedance calculated based on the third voltage can match the second impedance calculated based on the fourth voltage (e.g., impedance matching).

[0026] like Figure 1GAnd also shown by reference numeral 155, the diagnostic tool can determine the state of the second channel based on the second distance and the second impedance. For example, when the second distance is equal to the entire length of the second channel and there is an impedance match associated with the second impedance, the diagnostic tool can determine that there is no problem with the second channel. In some implementations, when the second distance is less than the entire length of the second channel, the diagnostic tool can determine that there is a break (or open circuit) in the second channel. In some implementations, when the second distance is less than the entire length of the second channel, the diagnostic tool can determine that there is a short circuit associated with the second channel. In some implementations, when the second impedance calculated based on the third voltage cannot match the second impedance calculated based on the fourth voltage, the diagnostic tool can determine that there is an impedance mismatch associated with the second channel.

[0027] In some implementations, the diagnostic tool may determine the location of a discontinuity (e.g., an open or short) of an ASIC of a WAN transceiver port (e.g., at a Tx ASIC or at an Rx ASIC) based on a distance to the open or short associated with the second channel. For example, when the distance is shorter, the diagnostic tool may associate the discontinuity with the Tx ASIC, the first PCB trace, the first connector, and / or the first cable. When the distance is longer, the diagnostic tool may associate the discontinuity with the Rx ASIC, the second PCB trace, the second connector, and / or the second cable. In such implementations, the diagnostic tool may provide an indication of whether the discontinuity (e.g., an open, short, mismatch, etc.) is located on the Tx side, the Rx side (e.g., for a SiFly connector), or the module connector side.

[0028] like Figure 1G And also shown by reference numeral 160, the diagnostic tool can output the state of the first and second channels. For example, the diagnostic tool can display the state of the first channel and the state of the second channel as determined by the diagnostic tool and as described above. In some implementations, the diagnostic tool can provide the state of the first channel or the state of the second channel to another device (e.g., user equipment). The user equipment can receive the state of the first channel and the state of the second channel, and can display the state of the first channel and the state of the second channel to the user of the user equipment. In some implementations, the diagnostic tool can store the state of the first channel and the state of the second channel in a data structure (e.g., database, table, list, etc.) associated with the diagnostic tool.

[0029] In this manner, the diagnostic tool can detect open channels, shorted channels, and / or improperly installed connectors for a WAN transceiver port. The diagnostic tool can detect marginal channel impairments (e.g., large impedance discontinuities), can utilize logistic regression to determine optimal threshold levels for determining a pass or fail condition for a WAN transceiver port, can detect opens or shorts in transmit fiber channels (e.g., chip-to-chip) that have difficult access points for instrument-level TDR testers (e.g., which require removal of fiber connectors), and the like.

[0030] Figure 1H Depicting example output of a diagnostic tool. As shown, a first WAN transceiver port can be associated with port number three (3), port group number fifteen (15), and eight port channel pairs (e.g., numbered zero (0) through seven (7)). Each port channel pair can be associated with a first channel (e.g., an N channel) and a second channel (e.g., a P channel). As also shown, the first WAN transceiver port can include a first open circuit associated with a first channel of port channel zero (0), and the first open circuit can occur at a first distance (e.g., a position) of 23.0. The first WAN transceiver port can include a second open circuit associated with a second channel of port channel one (1), and the second open circuit can occur at a second distance (e.g., a position) of 4.0. Based on the calculated first distance, the diagnostic tool can determine that the first open circuit of the WAN transceiver port is located on the Rx ASIC side, and based on the calculated second distance (e.g., which is greater than the first distance), the diagnostic tool can determine that the second open circuit of the WAN transceiver port is located on the Tx ASIC side. As indicated by the impedance matching results, the remaining port channels and channels associated with the first WAN transceiver port may be operational.

[0031] like Figure 1H Also shown, the second WAN transceiver port can be associated with port number thirty-two (32), port group number five (5), and eight port channel pairs (e.g., numbered zero (0) through seven (7)). Each port channel pair can be associated with a first channel (e.g., an N channel) and a second channel (e.g., a P channel). As indicated by the impedance matching results, the port channels and channels associated with the second WAN transceiver port can be operational.

[0032] In this way, the network device uses an on-chip time domain reflectometer diagnostic test to test the transceiver port of the network device. For example, the network device may include an on-chip TDR diagnostic tool that detects open circuits, short circuits, matching channels, and mismatching channels on the WAN transceiver (e.g., serdes) port of the network device without interrupting the network device. The on-chip TDR diagnostic tool can be used by manufacturing personnel, engineering personnel, or a field test team to identify problems with the WAN transceiver port of the network device without using expensive and complex devices or experts to analyze the test results. The on-chip TDR diagnostic tool can map the ASIC of the network device to the WAN transceiver port of the network device, and can report the status of each WAN transceiver port. The on-chip TDR diagnostic tool can provide programmable thresholds to achieve pass / fail determination for each WAN transceiver port or optical fiber (chip-to-chip) transceiver port. Therefore, the network device saves computing resources, network resources, etc. that should be consumed by disassembling the network device, using instrument-level TDR and using HCB to measure the WAN transceiver port of the network device, analyzing the test results, and identifying problems in the network device.

[0033] As indicated above, Figures 1A-1H Provided as an example. Other examples can be found in relation to Figures 1A-1H Described differently. Figures 1A-1H The number and arrangement of devices shown are provided as examples. Figures 1A-1H There may be additional devices, fewer devices, different devices, or differently arranged devices than those shown. Figures 1A-1H Two or more of the devices shown may be implemented in a single device, or Figures 1A-1H The single device shown may be implemented as multiple distributed devices. Additionally or alternatively, Figures 1A-1H The illustrated set of devices (e.g., one or more devices) may perform the operations described as being performed by Figures 1A-1H Another group of devices is shown performing one or more functions.

[0034] Figure 2 FIG. 2 is a diagram of an example environment 200 in which the systems and / or methods described herein may be implemented. Figure 2 As shown, environment 200 may include user device 210, a set of network devices 220 (shown as network device 220-1 through network device 220-N), server device 230, and network 240. The devices of environment 200 may be interconnected via wired connections, wireless connections, or a combination of wired and wireless connections.

[0035] User equipment 210 may include one or more devices capable of receiving, generating, storing, processing, and / or providing information, as described elsewhere herein. User equipment 210 may include a communication device and / or a computing device. For example, user equipment 210 may include a wireless communication device, a mobile phone, a user device, a laptop computer, a tablet computer, a desktop computer, a game console, a set-top box, a wearable communication device (e.g., a smart watch, a pair of smart glasses, a head-mounted display, or a virtual reality headset), or a similar type of device.

[0036] The network device 220 includes one or more devices capable of receiving, processing, storing, routing and / or providing traffic (e.g., packets or other information or metadata) in a manner described herein. For example, the network device 220 may include a router, such as a label switching router (LSR), a label edge router (LER), an ingress router, an egress router, a provider router (e.g., a provider edge router or a provider core router), a virtual router, a route reflector, a regional border router, or another type of router. Additionally or alternatively, the network device 220 may include a gateway, a switch, a firewall, a hub, a bridge, a reverse proxy, a server (e.g., a proxy server, a cloud server, or a data center server), a load balancer, and / or the like. In some implementations, the network device 220 may be a physical device implemented in a housing such as a chassis. In some implementations, the network device 220 may be a virtual device implemented by one or more computer devices in a cloud computing environment or a data center. In some implementations, a group of network devices 220 may be a group of data center nodes for routing traffic through the network 240.

[0037] Server device 230 may include one or more devices capable of receiving, generating, storing, processing, providing and / or routing information, as described elsewhere herein. Server device 230 may include a communication device and / or a computing device. For example, server device 230 may include a server, such as an application server, a client server, a network server, a database server, a host server, a proxy server, a virtual server (e.g., executed on computing hardware) or a server in a cloud computing system. In some implementations, server device 230 may include computing hardware used in a cloud computing environment.

[0038] The network 240 includes one or more wired and / or wireless networks. For example, the network 240 may include a packet-switched network, a cellular network (e.g., a fifth generation (5G) network, a fourth generation (4G) network, such as a long-term evolution (LTE) network and / or a third generation (3G) network), a code division multiple access (CDMA) network, a public land mobile network (PLMN), a local area network (LAN), a wide area network (WAN), a metropolitan area network (MAN), a telephone network (e.g., a public switched telephone network (PSTN)), a private network, an ad hoc network, an intranet, the Internet, a fiber-optic-based network, a cloud computing network, etc., and / or a combination of these or other types of networks.

[0039] Figure 2 The number and arrangement of devices and networks shown are provided as examples. Figure 2 There may be additional devices and / or networks, fewer devices and / or networks, different devices and / or networks, or differently arranged devices and / or networks than those shown. Figure 2 Two or more of the devices shown may be implemented in a single device, or Figure 2 The single device shown may be implemented as multiple distributed devices. Additionally or alternatively, one set of devices (eg, one or more devices) of environment 200 may perform one or more functions described as being performed by another set of devices of environment 200.

[0040] Figure 3 for Figure 2 The example components may be included in device 300, which may correspond to user device 210, network device 220, and / or server device 230. In some implementations, user device 210, network device 220, and / or server device 230 may include one or more devices 300 and / or one or more components of device 300. Figure 3 As shown, device 300 may include a bus 310 , a processor 320 , a memory 330 , an input component 340 , an output component 350 , and a communication interface 360 ​​.

[0041] Bus 310 includes one or more components that enable wired and / or wireless communications between components of device 300. Bus 310 may Figure 3Two or more components of are coupled together, such as via operational coupling, communication coupling, electronic coupling, and / or electrical coupling. Processor 320 includes a central processing unit (CPU), a graphics processing unit (GPU), a microprocessor, a controller, a microcontroller, a digital signal processor (DSP), a field programmable gate array (FPGA), an application specific integrated circuit (ASIC), and / or another type of processing component. Processor 320 is implemented in hardware, firmware, or a combination of hardware and software. In some implementations, processor 320 includes one or more processors that can be programmed to perform one or more operations or processes described elsewhere herein.

[0042] The memory 330 includes volatile and / or non-volatile memory. For example, the memory 330 may include random access memory (RAM), read-only memory (ROM), a hard drive, and / or another type of memory (e.g., flash memory, magnetic memory, and / or optical memory). The memory 330 may include internal memory (e.g., RAM, ROM, or hard drive) and / or removable memory (e.g., removable via a universal serial bus connection). The memory 330 may be a non-transitory computer-readable medium. The memory 330 stores information, instructions, and / or software (e.g., one or more software applications) related to the operation of the device 300. In some implementations, the memory 330 includes one or more memories such as coupled to one or more processors (e.g., processor 320) via bus 310.

[0043] Input components 340 enable device 300 to receive inputs, such as user inputs and / or sensory inputs. For example, input components 340 may include a touch screen, a keyboard, a keypad, a mouse, a button, a microphone, a switch, a sensor, a global positioning system sensor, an accelerometer, a gyroscope, and / or an actuator. Output components 350 enable device 300 to provide outputs, such as via a display, a speaker, and / or a light emitting diode. Communication interface 360 ​​enables device 300 to communicate with other devices via wired connection and / or wireless connection. For example, communication interface 360 ​​may include a receiver, a transmitter, a transceiver, a modem, a network interface card, and / or an antenna.

[0044] Device 300 can perform one or more operations or processes described herein. For example, a non-transitory computer readable medium (e.g., memory 330) can store a set of instructions (e.g., one or more instructions or codes) executed by processor 320. Processor 320 can execute a set of instructions to perform one or more operations or processes described herein. In some implementations, a set of instructions is executed by one or more processors 320 so that one or more processors 320 and / or device 300 perform one or more operations or processes described herein. In some implementations, hard-wired circuitry can be used instead of instructions or in combination with them to perform one or more operations or processes described herein. Additionally or alternatively, processor 320 can be configured to perform one or more operations or processes described herein. Therefore, the implementations described herein are not limited to any particular combination of hardware circuitry and software.

[0045] Figure 3 The number and arrangement of components shown are provided as examples. Figure 3 The device 300 may include additional components, fewer components, different components, or differently arranged components than those shown. Additionally or alternatively, a set of components (e.g., one or more components) of the device 300 may perform one or more functions described as being performed by another set of components of the device 300.

[0046] Figure 4 for Figure 2 4. The example components may be included in device 400. Device 400 may correspond to network device 220. In some implementations, network device 220 may include one or more devices 400 and / or one or more components of device 400. Figure 4 As shown, the device 400 may include one or more input components 410-1 to 410-B (B≥1) (hereinafter collectively referred to as input component 410, and individually referred to as input component 410), a switch component 420, one or more output components 430-1 to 430-C (C≥1) (hereinafter collectively referred to as output component 430, and individually referred to as output component 430) and a controller 440.

[0047] The input component 410 may be one or more attachment points for a physical link and may be one or more entry points for incoming traffic such as packets. The input component 410 may process incoming traffic, such as by performing data link layer encapsulation or decapsulation. In some implementations, the input component 410 may send and / or receive packets. In some implementations, the input component 410 may include an input line card, which includes one or more packet processing components (e.g., in the form of an integrated circuit), such as one or more interface cards (IFCs), packet forwarding components, line card controller components, input ports, processors, memory, and / or input queues. In some implementations, the device 400 may include one or more input components 410.

[0048] The switch component 420 may interconnect the input component 410 with the output component 430. In some implementations, the switch component 420 may be implemented via one or more crossbar switches, via a bus, and / or using a shared memory. The shared memory may act as a temporary buffer to store packets from the input component 410 before they are ultimately scheduled for transmission to the output component 430. In some implementations, the switch component 420 may enable the input component 410, the output component 430, and / or the controller 440 to communicate with each other.

[0049] The output component 430 can store packets and can schedule packets for transmission on an output physical link. The output component 430 can support data link layer encapsulation or decapsulation, and / or various high-level protocols. In some implementations, the output component 430 can send packets and / or receive packets. In some implementations, the output component 430 may include an output line card, which includes one or more packet processing components (e.g., in the form of an integrated circuit), such as one or more IFCs, packet forwarding components, line card controller components, output ports, processors, memories, and / or output queues. In some implementations, the device 400 may include one or more output components 430. In some implementations, the input component 410 and the output component 430 can be implemented by the same set of components (e.g., and the input / output component can be a combination of the input component 410 and the output component 430).

[0050] The controller 440 includes, for example, a processor in the form of a CPU, a GPU, an accelerated processing unit (APU), a microprocessor, a microcontroller, a DSP, an FPGA, an ASIC, and / or another type of processor. The processor is implemented in hardware, firmware, or a combination of hardware and software. In some implementations, the controller 440 may include one or more processors that can be programmed to perform functions.

[0051] In some implementations, controller 440 may include RAM, ROM, and / or another type of dynamic or static storage device (eg, flash memory, magnetic memory, optical memory, etc.) that stores information and / or instructions for use by controller 440 .

[0052] In some implementations, the controller 440 can communicate with other devices, networks, and / or systems connected to the device 400 to exchange information about the network topology. The controller 440 can create a routing table based on the network topology information, can create a forwarding table based on the routing table, and can forward the forwarding table to the input component 410 and / or the output component 430. The input component 410 and / or the output component 430 can use the forwarding table to perform route lookups for incoming and / or outgoing packets.

[0053] The controller 440 may perform one or more processes described herein. The controller 440 may perform these processes in response to executing software instructions stored by a non-transitory computer readable medium. A computer readable medium is defined herein as a non-transitory memory device. A memory device includes memory space within a single physical storage device or memory space distributed on multiple physical storage devices.

[0054] The software instructions may be read into a memory and / or storage component associated with the controller 440 from another computer-readable medium or another device via a communication interface. When executed, the software instructions stored in the memory and / or storage component associated with the controller 440 may cause the controller 440 to perform one or more processes described herein. Additionally or alternatively, hardwired circuitry may be used in place of or in combination with software instructions to perform one or more processes described herein. Therefore, the implementations described herein are not limited to any particular combination of hardware circuitry and software.

[0055] Figure 4 The number and arrangement of components shown are provided as examples. Figure 4 The device 400 may include additional components, fewer components, different components, or differently arranged components than the components shown. Additionally or alternatively, a set of components (e.g., one or more components) of the device 400 may perform one or more functions described as being performed by another set of components of the device 400.

[0056] Figure 5 Flowchart of an example process 500 for testing a transceiver port of a network device using an on-chip time domain reflectometer diagnostic test. In some implementations, Figure 5 One or more process blocks of may be performed by a network device (e.g., network device 220). In some implementations, Figure 5One or more process blocks of may be performed by another device or group of devices separate from or including the network device. Additionally or alternatively, Figure 5 One or more process blocks of may be performed by one or more components of device 300 such as processor 320, memory 330, input component 340, output component 350, and / or communication interface 360. Additionally or alternatively, Figure 5 One or more process blocks of may be performed by one or more components of the device 400 , such as the input component 410 , the switch component 420 , the output component 430 , and / or the controller 440 .

[0057] like Figure 5 As shown, process 500 may include identifying an integrated circuit, a port group number, a port channel, and a port channel associated with a transceiver port of a network device (block 510). For example, as described above, the network device may identify an integrated circuit, a port group number, a port channel, and a port channel associated with a transceiver port of the network device. In some implementations, the transceiver port is a wide area network transceiver port or a fiber optic transceiver port. In some implementations, the network device includes an on-chip time domain reflectometer diagnostic tool.

[0058] like Figure 5 Also shown, process 500 may include mapping integrated circuits, port group numbers, port channels, and port channels to transceiver ports (block 520). For example, as described above, a network device may map integrated circuits, port group numbers, port channels, and port channels to transceiver ports.

[0059] like Figure 5 Also shown, process 500 may include providing a first time domain reflectometer pulse to a first channel of a transceiver port at a first time and at a first voltage (block 530). For example, as described above, a network device may provide a first time domain reflectometer pulse to a first channel of a transceiver port at a first time and at a first voltage.

[0060] like Figure 5 Also shown, process 500 may include receiving a first reflected TDR pulse of a second voltage at a second time and via a first channel (block 540). For example, as described above, a network device may receive a first reflected TDR pulse of a second voltage at a second time and via a first channel.

[0061] like Figure 5 As also shown, process 500 may include calculating a first distance and a first impedance of a first channel based on the first time, the second time, the first voltage, and the second voltage (block 550). For example, as described above, the network device may calculate the first distance and the first impedance of the first channel based on the first time, the second time, the first voltage, and the second voltage.

[0062] like Figure 5 Also shown, process 500 may include determining a state of the first channel based on the first distance and the first impedance (block 560). For example, as described above, the network device may determine the state of the first channel based on the first distance and the first impedance. In some implementations, the state of the first channel includes data identifying one or more of: a break (open circuit) in the first channel, a short circuit associated with the first channel, an impedance match associated with the first channel, or an impedance mismatch associated with the first channel. In some implementations, determining the state of the first channel based on the first distance and the first impedance includes comparing the first impedance to a threshold value, determining whether the first channel is a pass or a fault based on the comparison of the first impedance to the threshold value, and providing an indication of whether the first channel is a pass or a fault.

[0063] like Figure 5 Also shown, process 500 may include outputting a status of the first channel (block 570). For example, as described above, the network device may output the status of the first channel.

[0064] In some implementations, process 500 includes providing a second time domain reflectometer pulse at a third voltage to a second channel of a transceiver port at a third time; receiving a second reflected time domain reflectometer pulse at a fourth voltage and via the second channel at a fourth time; calculating a second distance and a second impedance of the second channel based on the third time, the fourth time, the third voltage, and the fourth voltage; determining a state of the second channel based on the second distance and the second impedance; and outputting the state of the second channel. In some implementations, determining the state of the second channel based on the second distance and the second impedance includes comparing the second impedance to a threshold, determining whether the second channel is a pass or a fail based on the comparison of the second impedance to the threshold, and providing an indication of whether the second channel is a pass or a fail.

[0065] In some implementations, the state of the second channel includes data identifying one or more of: an open circuit in the second channel, a short circuit associated with the second channel, an impedance match associated with the second channel, or an impedance mismatch associated with the second channel. In some implementations, when the state of the second channel is an open circuit or a short circuit associated with the second channel, the process 500 includes determining a distance to the open circuit or the short circuit associated with the second channel based on the second distance, and outputting the distance to the open circuit or the short circuit. In some implementations, the process 500 includes determining whether the integrated circuit is a transmitting integrated circuit or a receiving integrated circuit based on the distance to the open circuit or the short circuit, and providing an indication of whether the integrated circuit is a transmitting integrated circuit or a receiving integrated circuit.

[0066] In some implementations, when the state of the first channel is an open circuit or a short circuit associated with the first channel, process 500 includes determining a distance to the open circuit or the short circuit associated with the first channel based on the first distance, and outputting the distance to the open circuit or the short circuit. In some implementations, process 500 includes determining whether the integrated circuit is a transmitting integrated circuit or a receiving integrated circuit based on the distance to the open circuit or the short circuit, and providing an indication of whether the integrated circuit is a transmitting integrated circuit or a receiving integrated circuit.

[0067] although Figure 5 Example blocks of process 500 are shown, but in some implementations, Figure 5 Process 500 may include additional blocks, fewer blocks, different blocks, or a different arrangement of blocks than those depicted. Additionally or alternatively, two or more of the blocks of process 500 may be performed in parallel.

[0068] The foregoing disclosure provides illustration and description, but is not intended to be exhaustive or to limit the implementations to the precise form disclosed. Modifications may be made in light of the above disclosure or may be acquired from practice of the implementations.

[0069] As used herein, the term "component" is intended to be broadly interpreted as hardware, firmware, or a combination of hardware and software. It is apparent that the systems and / or methods described herein may be implemented in various forms of hardware, firmware, and / or a combination of hardware and software. The actual dedicated control hardware or software code used to implement these systems and / or methods does not limit the implementation. Therefore, the operation and behavior of the systems and / or methods are described herein without reference to specific software code—it should be understood that software and hardware may be used to implement the systems and / or methods based on the description herein.

[0070] Although particular combinations of features are recited in the claims and / or disclosed in the specification, these combinations are not intended to limit the disclosure of various implementations. In fact, many of these features can be combined in ways not specifically recited in the claims and / or disclosed in the specification. Although each dependent claim listed below may directly depend on only one claim, the disclosure of various implementations includes the combination of each dependent claim with every other claim in the claim set.

[0071] Unless explicitly described as such, any element, action or instruction used herein should not be interpreted as critical or necessary. In addition, as used herein, the articles "one" and "an" are intended to include one or more items, and can be used interchangeably with "one or more". In addition, as used herein, the article "said" is intended to include one or more items quoted in conjunction with the article "said", and can be used interchangeably with "one or more". In addition, as used herein, the term "a group" is intended to include one or more items (e.g., related items, unrelated items, combinations of related and unrelated items, etc.), and can be used interchangeably with "one or more". In the case of only intending to use one item, the phrase "only one" or similar language is used. In addition, as used herein, the terms "having", "including", "comprising", etc. are intended to be open terms. In addition, the phrase "based on" is intended to mean "based at least in part", unless otherwise expressly stated. In addition, as used herein, the term "or" is intended to be inclusive when used in series, and can be used interchangeably with "and / or", unless otherwise expressly stated (e.g., if used in combination with "either" or "only one").

[0072] In the foregoing description, various example embodiments have been described with reference to the accompanying drawings. However, it will be apparent that various modifications and changes may be made thereto, and that additional embodiments may be implemented, without departing from the broader scope of the invention as set forth in the appended claims. Accordingly, the description and drawings are to be regarded in an illustrative, rather than a restrictive, sense.

Claims

1. A method comprising: identifying, by the network device, an integrated circuit, a port group number, a port channel, and a port channel associated with a transceiver port of the network device; mapping, by the network device, the integrated circuit, the port group number, the port channel, and the port channel to the transceiver port; providing, by the network device, a first time domain reflectometry pulse at a first voltage to a first channel of the transceiver port at a first time; receiving, by the network device via the first channel, a first reflected time domain reflectometry pulse of a second voltage at a second time; Calculating, by the network device, a first distance and a first impedance of the first channel based on the first time, the second time, the first voltage, and the second voltage; Determining, by the network device, a state of the first channel based on the first distance and the first impedance; as well as The state of the first channel is output by the network device.

2. The method according to claim 1, further comprising: providing a second time domain reflectometry pulse at a third voltage to a second channel of the transceiver port at a third time; receiving a second reflected time domain reflectometry pulse of a fourth voltage via the second channel at a fourth time; calculating a second distance and a second impedance of the second channel based on the third time, the fourth time, the third voltage, and the fourth voltage; determining a state of the second channel based on the second distance and the second impedance; as well as The state of the second channel is output.

3. The method of claim 2, wherein the state of the first channel or the state of the second channel comprises data identifying one or more of: a break in the first channel or in the second channel, a short circuit associated with the first channel or the second channel, an impedance match associated with the first channel or the second channel, or An impedance mismatch associated with the first channel or the second channel.

4. The method according to claim 2, wherein when the state of the first channel or the state of the second channel is an open circuit or a short circuit associated with the first channel or the second channel, the method further comprises: determining a distance to the open circuit or the short circuit associated with the first channel or the second channel based on the first distance or the second distance; as well as The distance to the open circuit or the short circuit is output.

5. The method according to claim 4, further comprising: determining whether the integrated circuit is a transmitting integrated circuit or a receiving integrated circuit based on the distance to the open circuit or the short circuit; as well as An indication is provided as to whether the integrated circuit is a transmitting integrated circuit or a receiving integrated circuit.

6. The method of claim 2, wherein determining the state of the second channel based on the second distance and the second impedance comprises: comparing the second impedance to a threshold; determining a pass or a fail of the second channel based on the comparison of the second impedance with the threshold; as well as An indication of a pass or fail of the second channel is provided.

7. The method of claim 1, wherein the transceiver port is a wide area network transceiver port or a fiber optic transceiver port.

8. A network device comprising: One or more processors to: identifying an integrated circuit, a port group number, a port channel, and a port channel associated with a transceiver port of a network device; mapping the integrated circuit, the port group number, the port channel, and the port channel to the transceiver port; providing a first time domain reflectometry pulse at a first voltage to a first channel of the transceiver port at a first time; receiving a first reflected time domain reflectometry pulse of a second voltage via the first channel at a second time; Calculate a first distance and a first impedance of the first channel based on the first time, the second time, the first voltage, and the second voltage; determining a state of the first channel based on the first distance and the first impedance; providing a second time domain reflectometry pulse at a third voltage to a second channel of the transceiver port at a third time; receiving a second reflected time domain reflectometry pulse of a fourth voltage via the second channel at a fourth time; calculating a second distance and a second impedance of the second channel based on the third time, the fourth time, the third voltage, and the fourth voltage; determining a state of the second channel based on the second distance and the second impedance; as well as The state of the first channel and the state of the second channel are output.

9. The network device according to claim 8, wherein the transceiver port is a wide area network transceiver port or a fiber optic transceiver port.

10. The network device of claim 8, wherein the state of the first channel comprises data identifying one or more of: A circuit breaker in the first channel, a short circuit associated with the first channel, an impedance match associated with the first channel, or An impedance mismatch is associated with the first channel.

11. The network device according to claim 8, wherein when the state of the first channel is an open circuit or a short circuit associated with the first channel, the one or more processors are further configured to: determining a distance to the open circuit or the short circuit associated with the first channel based on the first distance; and The distance to the open circuit or the short circuit is output.

12. The network device of claim 11, wherein the one or more processors are further configured to: determining, based on the distance to the open circuit or the short circuit, whether the integrated circuit is a transmitting integrated circuit or a receiving integrated circuit; and Providing an indication that the integrated circuit is a sending integrated circuit or a receiving integrated circuit.

13. The network device of claim 8, wherein to determine the state of the first channel based on the first distance and the first impedance, the one or more processors are configured to: comparing the first impedance to a threshold value; determining a pass or fail of the first channel based on the comparison of the first impedance with the threshold; and An indication of a pass or fail of the first channel is provided.

14. The network device of claim 8, wherein the network device comprises an on-chip time domain reflectometry diagnostic tool.

15. A non-transitory computer readable medium storing a set of instructions, the set of instructions comprising: One or more instructions, when executed by one or more processors of a network device, cause the network device to: Identify the transceiver port of the network device; providing a first time domain reflectometry pulse at a first voltage to a first channel of the transceiver port at a first time; receiving a first reflected time domain reflectometry pulse of a second voltage via the first channel at a second time; Calculate a first distance and a first impedance of the first channel based on the first time, the second time, the first voltage, and the second voltage; determining a state of the first channel based on the first distance and the first impedance; providing a second time domain reflectometry pulse at a third voltage to a second channel of the transceiver port at a third time; receiving a second reflected time domain reflectometry pulse of a fourth voltage via the second channel at a fourth time; calculating a second distance and a second impedance of the second channel based on the third time, the fourth time, the third voltage, and the fourth voltage; determining a state of the second channel based on the second distance and the second impedance; and The state of the first channel and the state of the second channel are output.

16. The non-transitory computer-readable medium of claim 15, wherein the state of the first channel comprises data identifying one or more of: A circuit breaker in the first channel, a short circuit associated with the first channel, an impedance match associated with the first channel, or An impedance mismatch is associated with the first channel.

17. The non-transitory computer readable medium of claim 15, wherein the transceiver port is a wide area network transceiver port.

18. The non-transitory computer readable medium of claim 15, wherein the transceiver port is a fiber optic transceiver port.

19. The non-transitory computer-readable medium of claim 15, wherein the state of the second channel comprises data identifying one or more of: A circuit breaker in the second channel, a short circuit associated with the second channel, an impedance match associated with the second channel, or An impedance mismatch is associated with the second channel.

20. The non-transitory computer readable medium of claim 15, wherein when the state of the first channel is an open circuit or a short circuit associated with the first channel, the one or more instructions further cause the network device to: determining a distance to the open circuit or the short circuit associated with the first channel based on the first distance; and The distance to the open circuit or the short circuit is output.

Images