A method and device for testing electrical signal quality of an optical communication interface of a switch, and a medium

Abstract

The application discloses a switch optical communication interface electric signal quality test method and device, and a medium. The method comprises the following steps: based on an error code instrument, a first variable ISI board and an oscilloscope, a standard electric signal generation link is constructed, and a standard electric signal conforming to a preset eye diagram specification is constructed through the standard electric signal generation link; a second variable ISI board is combined, and based on a maximum insertion loss value corresponding to a first optical communication interface of a switch, a worst receiving link is constructed; a second optical communication interface of the switch is connected to a test link, and a signal of a standard test code type is sent through the second optical communication interface; a receiving error code rate corresponding to the first optical communication interface is counted through the worst receiving link, and the electric signal quality of the optical communication interface of the switch is determined according to the counting result. The method is helpful for discovering and solving potential performance problems in time, and ensures the stability and reliability of the switch in actual application.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of testing, in particular to a switch optical communication interface electrical signal quality testing method, device and medium. BACKGROUND

[0002] Currently, in the field of high-speed communication technology, the signal quality of the switch optical communication interface is crucial. In order to ensure the stability and reliability of signal transmission, it must be strictly tested. The traditional testing method usually relies on an oscilloscope to measure the eye diagram parameters of the electrical signal emitted by the interface, such as eye height and eye width, to evaluate the signal quality. However, with the continuous increase of communication rate and the increasing number of interfaces, the traditional testing method faces many challenges.

[0003] Firstly, as a precision testing instrument, the oscilloscope has limited resources and high cost. When testing multiple switch optical communication interfaces, it needs to occupy the oscilloscope for a long time, which greatly reduces the testing efficiency and increases the testing cost. Secondly, the traditional testing method mainly focuses on the sending end of the signal, ignoring the influence of the receiving end on the signal quality. In practical applications, the performance of the receiving end is also important because the receiving end needs to be able to accurately and reliably receive and decode the signal from the sending end.

[0004] In order to solve the above problems, the industry has begun to explore new testing methods and technologies. One of the feasible solutions is to measure the electrical signal transmission quality of the switch optical communication interface by constructing the worst receiving link. The core idea of this method is to simulate the worst-case signal transmission environment to evaluate the performance of the interface under extreme conditions. However, how to effectively construct the worst receiving link and accurately measure the electrical signal transmission quality of the interface is a technical problem that needs to be solved urgently. SUMMARY

[0005] The embodiments of the present application provide a switch optical communication interface electrical signal quality testing method, device and medium to solve the above technical problems.

[0006] In one aspect, the embodiments of the present application provide a switch optical communication interface electrical signal quality testing method, comprising:

[0007] Based on the error code instrument, the first variable ISI board and the oscilloscope, a standard electrical signal generation link is constructed, and a standard electrical signal conforming to the preset eye diagram specification is constructed through the standard electrical signal generation link;

[0008] Combined with the second variable ISI board, and based on the maximum insertion loss value corresponding to the first optical communication interface of the switch, the worst receiving link is constructed;

[0009] connecting a second optical communication interface of the switch to the test link, and sending a signal of a standard test pattern through the second optical communication interface;

[0010] statistically counting a bit error rate corresponding to the first optical communication interface through the worst receiving link, and determining the electrical signal quality of the optical communication interface of the switch according to the statistical result.

[0011] In an implementation of the present application, a standard electrical signal generation link is constructed based on a bit error instrument, a first variable ISI board and an oscilloscope, and specifically includes:

[0012] The bit pattern generator in the bit error instrument sends a signal of a standard test pattern, and the signal of the standard test pattern is sent to the oscilloscope through the first variable ISI board.

[0013] In an implementation of the present application, a standard electrical signal conforming to a preset eye diagram specification is constructed through the standard electrical signal generation link, and specifically includes:

[0014] The bit error instrument in the standard electrical signal generation link is adjusted in parameters, and the insertion loss value of the first variable ISI board in the standard electrical signal generation link is adjusted.

[0015] The oscilloscope is used to measure eye diagram data corresponding to the parameter adjustment and the insertion loss value adjustment; the parameters include random jitter parameters, sinusoidal jitter parameters and noise parameters, and the eye diagram data includes an eye width and an eye height.

[0016] In the case where the eye width and the eye height in the eye diagram data conform to the preset eye diagram specification, it is determined that the signal at the test point is the constructed standard electrical signal.

[0017] In an implementation of the present application, before the worst receiving link is constructed in combination with the second variable ISI board and based on the maximum insertion loss value corresponding to the first optical communication interface of the switch, the method further includes:

[0018] The bit error counting function corresponding to the first optical communication interface of the switch is started;

[0019] The insertion loss of the second variable ISI board is adjusted, and the bit error rate corresponding to the first optical communication interface received under different insertion losses is recorded.

[0020] In an implementation of the present application, the worst receiving link is constructed in combination with the second variable ISI board and based on the maximum insertion loss value corresponding to the first optical communication interface of the switch, and specifically includes:

[0021] gradually increase the insertion loss of the second variable ISI board until the bit error rate received by the first optical communication interface equals a preset bit error rate threshold, and determine a maximum insertion loss value of the first optical communication interface when receiving a corresponding maximum bit error rate;

[0022] insert the standard electrical signal into the second variable ISI board and send to the first optical communication interface of the switch via the HCB fixture when the insertion loss of the second variable ISI board is the maximum insertion loss value;

[0023] determine that the link between the standard electrical signal and the first optical communication interface is the worst receiving link of the configuration.

[0024] In an implementation manner of the present application, the second optical communication interface of the switch is connected to a test link, and a signal of a standard test pattern is sent through the second optical communication interface, specifically including:

[0025] The second optical communication interface of the switch is connected to a test link, and a signal of a standard test pattern is sent through the second optical communication interface based on a pattern generator;

[0026] The signal of the standard test pattern is sent to the worst receiving link via the HCB fixture, and the standard electrical signal is inserted between the HCB fixture and the worst receiving link.

[0027] In an implementation manner of the present application, the receiving bit error rate corresponding to the first optical communication interface is counted through the worst receiving link, specifically including:

[0028] The standard electrical signal inserted into the worst receiving link is sent to the first optical communication interface of the switch via the second variable ISI board and the HCB fixture;

[0029] The receiving bit error rate corresponding to the standard electrical signal at the first optical communication interface is counted based on the bit error counting function of the first optical communication interface and via the worst interface link, and a corresponding counting result is obtained.

[0030] In an implementation manner of the present application, the electrical signal quality of the optical communication interface of the switch is determined according to the counting result, specifically including:

[0031] In the case that the bit error rate in the counting result is less than a preset bit error rate threshold, it is determined that the electrical signal quality of the second optical communication interface of the switch meets the preset specification standard;

[0032] In the case that the bit error rate in the counting result is greater than the preset bit error rate threshold, it is determined that the electrical signal quality of the second optical communication interface of the switch does not meet the preset specification standard.

[0033] In another aspect, the embodiments of the present application also provide a switch optical communication interface electrical signal quality testing device, the device comprises:

[0034] at least one processor;

[0035] and a memory in communication connection with the at least one processor;

[0036] wherein the memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor to enable the at least one processor to perform the above-mentioned switch optical communication interface electrical signal quality testing method.

[0037] In another aspect, the embodiments of the present application also provide a non-volatile computer storage medium, which stores computer executable instructions, and the computer executable instructions, when executed, implement the above-mentioned switch optical communication interface electrical signal quality testing method.

[0038] The embodiments of the present application provide a switch optical communication interface electrical signal quality testing method, device and medium, at least including the following beneficial effects:

[0039] By constructing a standard electrical signal generation link, the generated signal can be ensured to have high precision and stability, thereby improving the accuracy and reliability of the test, by constructing a standard electrical signal conforming to the preset eye diagram specification, the quality of the test signal can be ensured to meet the industry standard, and the comparability and effectiveness of the test results are enhanced; by constructing the worst receiving link, the worst communication conditions in actual use can be simulated, and the performance of the switch optical communication interface under extreme conditions can be effectively verified; by the second optical communication interface sending a signal of a standard test code type, the consistency and repeatability of the signal in the test process can be ensured, which is convenient for subsequent data analysis and problem positioning; by the worst receiving link, the receiving bit error rate corresponding to the first optical communication interface is counted, which can directly reflect the data transmission quality of the switch optical communication interface under harsh conditions, and provide an objective basis for evaluating the interface performance; according to the statistical result, the electrical signal quality of the switch optical communication interface is determined, which helps to discover and solve potential performance problems in time, and ensures the stability and reliability of the switch in actual application. BRIEF DESCRIPTION OF DRAWINGS

[0040] The accompanying drawings, which are included to provide a further understanding of the present application, constitute a part of the present application, the schematic embodiments of the present application and the description thereof serve to explain the present application, and do not constitute an improper limitation on the present application. In the drawings:

[0041] Figure 1 A flowchart of a switch optical communication interface electrical signal quality testing method provided by the embodiments of the present application is shown.

[0042] Figure 2 An internal structure schematic diagram of a switch optical communication interface electrical signal quality test device provided by an embodiment of the present application. DETAILED DESCRIPTION

[0043] In order to make the objectives, technical solutions and advantages of the present application clearer, the technical solutions of the present application will be described below in detail with the embodiments of the present application and the corresponding drawings. Obviously, the described embodiments are only some of the embodiments of the present application, but not all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative work fall within the scope of protection of the present application.

[0044] The technical solutions provided by the embodiments of the present application will be described in detail below with reference to the drawings.

[0045] Figure 1 A flowchart of a switch optical communication interface electrical signal quality test method provided by an embodiment of the present application.

[0046] The implementation of the analysis method involved in the embodiments of the present application can be a terminal device or a server, and the present application does not make special limitations on this. In order to facilitate understanding and description, the following embodiments are described in detail with the server as an example.

[0047] It should be noted that the server can be a single device, or a system composed of multiple devices, i.e., a distributed server, and the present application does not make specific limitations on this.

[0048] As shown in the method for testing the electrical signal quality of the switch optical communication interface provided by the embodiments of the present application, the method comprises the following steps. Figure 1

[0049] 101. Based on the error code instrument, the first variable ISI board and the oscilloscope, a standard electrical signal generation link is constructed, and a standard electrical signal conforming to a preset eye diagram specification is constructed through the standard electrical signal generation link.

[0050] Specifically, in an embodiment of the present application, based on the error code instrument, the first variable ISI board and the oscilloscope, a standard electrical signal generation link is constructed, specifically comprising the following steps.

[0051] Based on the code generator in the error code instrument, a signal of a standard test code type is sent, and the signal of the standard test code type is sent to the oscilloscope via the first variable ISI board.

[0052] ​In one embodiment, the error code instrument is prepared, and it is ensured that the code type generator of the error code instrument can generate the required standard test code type signal, and the first variable ISI board is prepared, and it is ensured that the first variable ISI board is in good working condition. According to the predetermined order and connection mode, the error code instrument, the first variable ISI board and the oscilloscope are connected in turn to form a standard electrical signal generation link.

[0053] The parameters of the code type generator in the error code instrument are set to generate a standard test code type signal that meets the test requirements, and it is ensured that the generated signal quality is good and can meet the requirements of subsequent tests. Start the code type generator of the error code instrument to start sending standard test code type signals, which will pass through the first variable ISI board and finally be captured and displayed by the oscilloscope. Observe the captured signal waveform on the oscilloscope, and pay attention to the key parameters such as amplitude, frequency and phase of the signal.

[0054] In one embodiment of the present application, a standard electrical signal conforming to a preset eye diagram specification is constructed through a standard electrical signal generation link, specifically including:

[0055] The parameters of the error code instrument in the standard electrical signal generation link are adjusted, and the insertion loss value of the first variable ISI board in the standard electrical signal generation link is adjusted;

[0056] Through the oscilloscope, the eye diagram data corresponding to the parameter adjustment and the insertion loss value adjustment is measured; the parameters include random jitter parameters, sinusoidal jitter parameters and noise parameters, and the eye diagram data includes eye width and eye height;

[0057] In the case where the eye width and eye height in the eye diagram data conform to the preset eye diagram specification, the signal at the test point is determined to be the constructed standard electrical signal.

[0058] In one embodiment, it is ensured that all devices in the standard electrical signal generation link (including the error code instrument, the first variable ISI board, the MCB fixture, the oscilloscope, etc.) are correctly connected and in good working condition. A high-performance oscilloscope is prepared to ensure that it can accurately measure eye diagram data. According to the test requirements and industry standards, a set of eye diagram specifications are preset, including ideal eye width and eye height values.

[0059] In the bit error instrument, initial random jitter parameters, sinusoidal jitter parameters and noise parameters are set. These parameters will affect the quality of the generated electrical signal, especially its eye diagram characteristics. Start the bit error instrument, generate an electrical signal containing random jitter, sinusoidal jitter and noise, and adjust the insertion loss value of the first variable ISI board in the standard electrical signal generation link, so as to send the signal to the oscilloscope through the standard electrical signal generation link. On the oscilloscope, set appropriate measurement parameters, insertion loss values and trigger conditions to accurately capture and measure the eye diagram of the electrical signal, that is, measure and record the eye width and eye height values of the eye diagram. According to the comparison result of the measured eye diagram data and the preset eye diagram specification, the parameters in the bit error instrument and the insertion loss value of the first variable ISI board are fine-tuned. Repeat the generation, transmission and measurement steps until the eye width and eye height in the eye diagram data meet the preset eye diagram specification.

[0060] After multiple parameter adjustments and iterations, a set of parameter settings that make the eye diagram data meet the preset specification is finally obtained. At this time, the eye diagram displayed on the oscilloscope should have clear contours, and the eye width and eye height values should fall within the preset specification range. After confirming that the eye diagram data meets the preset specification, it can be determined that the signal at the current test point is the constructed standard electrical signal. This signal will be used for subsequent testing or evaluation work.

[0061] 102、Combine the second variable ISI board and construct the worst receiving link based on the maximum insertion loss value corresponding to the first optical communication interface of the switch.

[0062] Specifically, in one embodiment of the present application, before combining the second variable ISI board and constructing the worst receiving link based on the maximum insertion loss value corresponding to the first optical communication interface of the switch, it further includes:

[0063] Turn on the bit error statistics function corresponding to the first optical communication interface of the switch;

[0064] Adjust the insertion loss of the second variable ISI board and record the bit error rate received by the first optical communication interface under different insertion losses.

[0065] In one embodiment, in the management interface of the switch, find the configuration option corresponding to the first optical communication interface. Turn on the bit error statistics function corresponding to the interface to ensure that the switch can record and count the received bit errors in real time.

[0066] The second variable ISI board is inserted into the optical communication link, ensuring stable and error-free connection. The optical signal source is set to emit optical signals that meet the testing requirements and are transmitted through the second variable ISI board to the first optical communication interface of the switch. By adjusting the relevant parameters or physical structure on the second variable ISI board, the insertion loss is gradually changed. After each adjustment, the optical power meter is used to measure the optical signal power after passing through the second variable ISI board to ensure the accuracy of the adjustment.

[0067] After each change in the insertion loss of the second variable ISI board, the bit error rate corresponding to the received by the first optical communication interface of the switch is observed and recorded. The bit error tester can be connected to the switch to more accurately measure and record the bit error rate data. The recorded bit error rate data and the corresponding insertion loss values are sorted to form a clear data table or chart. Analyze the data to observe the effect of insertion loss on bit error rate and whether the bit error rate meets the preset testing standards or industry specifications.

[0068] In an embodiment of the present application, in combination with the second variable ISI board and based on the maximum insertion loss value corresponding to the first optical communication interface of the switch, the worst receiving link is constructed, specifically including:

[0069] The insertion loss of the second variable ISI board is gradually increased until the bit error rate received by the first optical communication interface equals the preset bit error rate threshold, and the maximum insertion loss value of the first optical communication interface when receiving the corresponding maximum bit error rate is determined;

[0070] In the case where the insertion loss of the second variable ISI board is the maximum insertion loss value, the standard electrical signal is inserted into the second variable ISI board and sent to the first optical communication interface of the switch via the HCB clamp;

[0071] The link between the standard electrical signal and the first optical communication interface is determined as the constructed worst receiving link.

[0072] In an embodiment, it is ensured that the switch, the second variable ISI board, the optical signal source, the optical power meter, the bit error tester, and the HCB clamp are correctly connected and in good working condition. The switch should be configured with the first optical communication interface for receiving optical signals and the bit error counting function should be turned on. According to the testing requirements and industry standards, a bit error rate threshold is preset as the basis for judging whether the receiving performance of the first optical communication interface meets the standards.

[0073] Insert the second variable ISI board into the optical communication link and set its initial insertion loss to a low value. Gradually increase the insertion loss of the second variable ISI board, observing and recording the bit error rate (BER) received by the first optical communication interface after each increase. Use a BER tester to monitor the BER changes in real time to ensure data accuracy. When the BER received by the first optical communication interface equals the preset BER threshold, stop increasing the insertion loss and record the insertion loss value of the second variable ISI board at this point as the maximum insertion loss value.

[0074] The insertion loss of the second variable ISI board is adjusted to the previously determined maximum insertion loss value. A standard electrical signal is sent to the second variable ISI board via an optical signal source to ensure signal stability and accuracy. The standard electrical signal passing through the second variable ISI board is transmitted through the HCB fixture and finally sent to the first optical communication interface of the switch. The reception of the standard electrical signal at the first optical communication interface is observed to confirm that, under these conditions, the link between the standard electrical signal and the first optical communication interface is the constructed worst-case reception link. Performance tests are performed on the constructed worst-case reception link, including bit error rate testing and signal quality assessment, to ensure that the link meets testing requirements and industry standards.

[0075] 103. Connect the second optical communication interface of the switch to the test link and send out a standard test code signal through the second optical communication interface.

[0076] Specifically, in one embodiment of this application, the second optical communication interface of the switch is connected to the test link, and a standard test code signal is emitted through the second optical communication interface, specifically including:

[0077] Connect the second optical communication interface of the switch to the test link, and based on the code generator, send out a standard test code signal through the second optical communication interface;

[0078] The standard test code signal is sent to the worst-case reception link via the HCB fixture, and a standard electrical signal is inserted between the HCB fixture and the worst-case reception link.

[0079] In one embodiment, a standard test pattern is preset according to testing requirements and industry standards, serving as the basis for the pattern generator to generate signals. The second optical communication interface of the switch is connected to the test link, ensuring a stable and error-free connection. The pattern generator is started, generating an optical signal according to the preset standard test pattern, and then transmitting the generated optical signal through the second optical communication interface of the switch.

[0080] The standard test pattern signal emitted from the second optical communication interface of the switch is transmitted through the HCB fixture, and it is ensured that the HCB fixture is stably connected and can accurately transmit the optical signal. A standard electrical signal prepared in advance is inserted between the HCB fixture and the worst receiving link, and it is ensured that the insertion of the standard electrical signal does not interfere with the transmission of the standard test pattern signal.

[0081] 104、Through the worst receiving link, the receiving bit error rate corresponding to the first optical communication interface is counted, and the electrical signal quality of the optical communication interface of the switch is determined according to the counting result.

[0082] Specifically, in an embodiment of the present application, the receiving bit error rate corresponding to the first optical communication interface is counted through the worst receiving link, specifically including:

[0083] The standard electrical signal inserted into the worst receiving link is sent to the first optical communication interface of the switch via the second variable ISI board and the HCB fixture.

[0084] Based on the bit error counting function of the first optical communication interface, the receiving bit error rate corresponding to the standard electrical signal at the first optical communication interface is counted through the worst interface link, and the corresponding counting result is obtained.

[0085] In an embodiment, a standard electrical signal meeting the test requirements is prepared to ensure its stability and accuracy. The standard electrical signal is transmitted through the second variable ISI board and the HCB fixture. The stability and accuracy of the signal during transmission are ensured to avoid interference and loss. The first optical communication interface of the switch receives the standard electrical signal transmitted through the second variable ISI board and the HCB fixture. It is ensured that the receiving port is stably connected and can accurately receive the optical signal.

[0086] It is confirmed that the first optical communication interface of the switch has started the bit error counting function and can record and count the received bit error in real time. Based on the bit error counting function of the first optical communication interface, the receiving bit error rate corresponding to the received standard electrical signal is counted. The counting result is verified and calibrated using a bit error tester to ensure the accuracy of the data. The counting result is obtained and recorded, including the receiving bit error rate, the number of bit errors, the test time, etc. The counting result is analyzed to evaluate the transmission performance and stability of the link.

[0087] In an embodiment of the present application, the electrical signal quality of the optical communication interface of the switch is determined according to the counting result, specifically including:

[0088] In the case where the bit error rate in the counting result is less than the preset bit error rate threshold, it is determined that the electrical signal quality of the second optical communication interface of the switch meets the preset specification standard;

[0089] In a case where the error code rate in the statistical result is greater than the preset error code rate threshold, it is determined that the quality of the electrical signal sent by the second optical communication interface of the switch does not conform to the preset specification standard.

[0090] In one embodiment, the statistical result, including the error code rate, the number of error codes, and other key indicators, is obtained from the error code tester. The error code rate in the statistical result is compared with the preset error code rate threshold. If the error code rate in the statistical result is less than the preset error code rate threshold, it is determined that the quality of the electrical signal sent by the second optical communication interface of the switch conforms to the preset specification standard. If the error code rate in the statistical result is greater than the preset error code rate threshold, it is determined that the quality of the electrical signal sent by the second optical communication interface of the switch does not conform to the preset specification standard.

[0091] The test result is recorded in detail, and a test report is written, including the test process, the statistical result, the quality judgment, and possible improvement suggestions. If the quality of the electrical signal does not conform to the preset specification standard, the switch, the code generator, the second variable ISI board, and other equipment should be checked and optimized to improve the signal quality. The optimized system is retested to verify whether the quality of the electrical signal has met the preset specification standard.

[0092] The above is a method embodiment of the present application. Based on the same inventive concept, the present application embodiment also provides a switch optical communication interface electrical signal quality test device, the structure of which is shown in Figure 2 .

[0093] Figure 2 The internal structure of a switch optical communication interface electrical signal quality test device provided by the present application embodiment is shown in Figure 2 . The device includes:

[0094] at least one processor;

[0095] and a memory in communication connection with the at least one processor;

[0096] The memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor to enable the at least one processor to:

[0097] Based on the error code instrument, the first variable ISI board, and the oscilloscope, a standard electrical signal generation link is constructed, and a standard electrical signal conforming to the preset eye diagram specification is constructed through the standard electrical signal generation link;

[0098] In combination with the second variable ISI board and based on the maximum insertion loss value corresponding to the first optical communication interface of the switch, a worst-case receiving link is constructed;

[0099] The second optical communication interface of the switch is connected to the test link, and a signal of a standard test code type is sent through the second optical communication interface;

[0100] statistically process the receiving error rate corresponding to the first optical communication interface through the worst receiving link, and determine the electrical signal quality of the optical communication interface of the switch according to the statistical result.

[0101] The embodiment of the present application further provides a nonvolatile computer storage medium, which stores computer executable instructions, and the computer executable instructions can realize the following when executed:

[0102] a standard electrical signal generation link is constructed based on the error code instrument, the first variable ISI board and the oscilloscope, and a standard electrical signal conforming to the preset eye pattern specification is constructed through the standard electrical signal generation link;

[0103] The second variable ISI board is combined, and the worst receiving link is constructed based on the maximum insertion loss value corresponding to the first optical communication interface of the switch.

[0104] The second optical communication interface of the switch is connected to the test link, and a signal of a standard test code type is sent through the second optical communication interface.

[0105] statistically process the receiving error rate corresponding to the first optical communication interface through the worst receiving link, and determine the electrical signal quality of the optical communication interface of the switch according to the statistical result.

[0106] Each of the embodiments of the present application is described in a progressive manner, and the same or similar parts of each of the embodiments can be referred to each other, and each of the embodiments mainly describes the difference from other embodiments. Especially, the device and medium embodiments are described simply because they are basically similar to the method embodiments, and the related parts can be referred to the part of the description of the method embodiments.

[0107] The above describes specific embodiments of the present application. Other embodiments are within the scope of the appended claims. In some cases, the acts or steps recited in the claims can be performed in a different order than the order in which they are recited and still accomplish desirable results. In addition, the processes depicted in the accompanying figures do not necessarily require the particular order shown, or sequential order, to achieve the desired results. In certain implementations, multitasking and parallel processing can be advantageous.

[0108] The device and medium provided by the embodiment of the present application are one-to-one corresponding to the method, and therefore, the device and medium also have the similar beneficial technical effects as the method, and since the beneficial technical effects of the method have been described in detail above, the beneficial technical effects of the device and medium will not be described here.

[0109] Those skilled in the art will appreciate that embodiments of the application can be readily used as software, hardware, or a combination of software and hardware. In a typical configuration, a computing device includes one or more processors (CPUs), input / output interfaces, network interfaces, and memory.

[0110] The present application is described in reference to the flowchart illustrations and / or block diagrams according to the embodiments of the application. It will be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general purpose computer, special purpose computer, embedded processing system, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in the flowchart illustrations and / or block diagrams. Figure 1 one or more functions specified in the flowchart illustrations and / or block diagrams. Figure 1 one or more functions specified in the flowchart illustrations and / or block diagrams.

[0111] These computer program instructions can also be stored in a computer- readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instructions which implement the functions specified in the flowchart illustrations and / or block diagrams. Figure 1 one or more functions specified in the flowchart illustrations and / or block diagrams. Figure 1 one or more functions specified in the flowchart illustrations and / or block diagrams.

[0112] These computer program instructions can also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart illustrations and / or block diagrams. Figure 1 one or more functions specified in the flowchart illustrations and / or block diagrams. Figure 1 one or more functions specified in the flowchart illustrations and / or block diagrams.

[0113] In a typical configuration, a computing device includes one or more processors (CPUs), input / output interfaces, network interfaces, and memory.

[0114] The memory can include non-persistent memory, random access memory (RAM), and / or non-volatile memory, such as read only memory (ROM) or flash memory, among others. The memory is an example of computer-readable media.

[0115] Computer-readable media includes permanent and non-permanent, movable and non-movable media that can be implemented by any method or technology to store information. The information can be computer-readable instructions, data structures, program modules or other data. Examples of computer storage media include, but are not limited to, phase-change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technology, compact disc read-only memory (CD-ROM), digital versatile disc (DVD) or other optical storage, magnetic cassette, magnetic tape disk storage or other magnetic storage devices, or any other non-transmission medium that can be used to store information accessible to a computing device. According to the definition herein, computer-readable media does not include transitory media such as modulated data signals and carriers.

[0116] It should also be noted that the terms "comprising", "containing", or any other variant thereof are intended to cover non-exclusive inclusions, so that a process, method, article or apparatus that includes a list of elements not only includes those elements, but also includes other elements not explicitly listed, or inherent to such a process, method, article or apparatus. Without more limitations, the element defined by the statement "comprising a" does not exclude the presence of additional identical elements in the process, method, article or apparatus that includes the element.

[0117] The above only describes the embodiments of the present application and is not intended to limit the present application. For those skilled in the art, the present application can have various modifications and changes. Any modification, equivalent replacement, improvement, etc. within the spirit and principle of the present application shall be included in the scope of claims of the present application.

Claims

1. A method for testing the quality of electrical signals of a switch optical communication interface, characterized in that, The method comprises: Based on the error code instrument, the first variable ISI board and the oscilloscope, a standard electrical signal generation link is constructed, and a standard electrical signal conforming to a preset eye diagram specification is constructed through the standard electrical signal generation link; In combination with the second variable ISI board and based on the maximum insertion loss value corresponding to the first optical communication interface of the switch, a worst reception link is constructed; The second optical communication interface of the switch is connected to the test link, and a signal of a standard test code type is sent through the second optical communication interface; Through the worst reception link, the reception error rate corresponding to the first optical communication interface is counted, and the electrical signal quality of the optical communication interface of the switch is determined according to the statistical result.

2. The method of claim 1, wherein the method further comprises: Based on the error code instrument, the first variable ISI board and the oscilloscope, a standard electrical signal generation link is constructed, specifically comprising: Based on the code generator in the error code instrument, a signal of a standard test code type is sent, and the signal of the standard test code type is sent to the oscilloscope via the first variable ISI board.

3. The method of claim 1, wherein the method further comprises: Through the standard electrical signal generation link, a standard electrical signal conforming to a preset eye diagram specification is constructed, specifically comprising: The error code instrument in the standard electrical signal generation link is adjusted in parameters, and the insertion loss value of the first variable ISI board in the standard electrical signal generation link is adjusted; Through the oscilloscope, eye diagram data corresponding to the parameter adjustment and the insertion loss value adjustment is measured; the parameters include random jitter parameters, sinusoidal jitter parameters and noise parameters, and the eye diagram data includes eye width and eye height; In the case that the eye width and the eye height in the eye diagram data conform to the preset eye diagram specification, it is determined that the signal at the test point is the constructed standard electrical signal.

4. The method of claim 1, wherein the method further comprises: Before the construction of the worst reception link in combination with the second variable ISI board and based on the maximum insertion loss value corresponding to the first optical communication interface of the switch, the method further comprises: The error code counting function corresponding to the first optical communication interface of the switch is started; The insertion loss of the second variable ISI board is adjusted, and the error rate received by the first optical communication interface under different insertion losses is recorded.

5. The method of claim 4, wherein the method further comprises: In combination with the second variable ISI board and based on the maximum insertion loss value corresponding to the first optical communication interface of the switch, a worst reception link is constructed, specifically comprising: The insertion loss of the second variable ISI board is gradually increased until the error rate received by the first optical communication interface is equal to a preset error rate threshold, and the maximum insertion loss value of the first optical communication interface when receiving the corresponding maximum error rate is determined; In the case that the insertion loss of the second variable ISI board is the maximum insertion loss value, the standard electrical signal is inserted into the second variable ISI board, and is sent to the first optical communication interface of the switch via the HCB clamp; It is determined that the link between the standard electrical signal and the first optical communication interface is the constructed worst reception link.

6. The method of claim 1, wherein the method further comprises: The second optical communication interface of the switch is connected to the test link, and a signal of a standard test code type is sent through the second optical communication interface, specifically comprising: The second optical communication interface of the switch is connected to the test link, and a signal of a standard test code type is sent through the second optical communication interface based on the code generator; The signal of the standard test pattern is sent to the worst receiving link via the HCB fixture, and the standard electrical signal is inserted between the HCB fixture and the worst receiving link.

7. The method of claim 1, wherein the method further comprises: The receiving error rate corresponding to the first optical communication interface is counted through the worst receiving link, specifically including: The standard electrical signal inserted into the worst receiving link is sent to the first optical communication interface of the switch via the second variable ISI board and the HCB fixture; Based on the error counting function of the first optical communication interface, the receiving error rate of the standard electrical signal at the first optical communication interface is counted through the worst receiving link, and the corresponding statistical result is obtained.

8. The method of claim 1, wherein the method further comprises: According to the statistical result, the electrical signal quality of the optical communication interface of the switch is determined, specifically including: In the case that the error rate in the statistical result is less than a preset error rate threshold, it is determined that the electrical signal quality of the second optical communication interface of the switch meets the preset specification standard; In the case that the error rate in the statistical result is greater than the preset error rate threshold, it is determined that the electrical signal quality of the second optical communication interface of the switch does not meet the preset specification standard.

9. A switch optical communication interface electrical signal quality test device, characterized in that, The device comprises: at least one processor; and a memory connected in communication with the at least one processor; wherein the memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor to enable the at least one processor to perform the method of testing the electrical signal quality of the optical communication interface of the switch according to any one of claims 1-8.

10. A non-transitory computer storage medium storing computer-executable instructions that, when executed, cause a computer to perform: The computer executable instructions, when executed, implement the method of testing the electrical signal quality of the optical communication interface of the switch according to any one of claims 1-8.

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