A high vacuum light-shielding scintillator imaging sealing structure

Abstract

The present invention belongs to the field of scintillator imaging detection technology, and specifically discloses a high-vacuum light-shielding scintillator imaging sealing structure, including a scintillator high-vacuum cylinder, a light-shielding exhaust multi-stage structure, and a beryllium window pinhole imaging structure; the light-shielding exhaust multi-stage structure includes a light-shielding exhaust cylinder and at least two light-shielding exhaust rings, adjacent light-shielding exhaust rings are spaced and connected inside the light-shielding exhaust cylinder, a plurality of circumferentially distributed exhaust holes are provided on the end faces of the light-shielding exhaust rings, and the two ends of the light-shielding exhaust cylinder are interconnected; one end of the scintillator high-vacuum cylinder passes through the light-shielding exhaust rings in sequence and is located inside the light-shielding exhaust cylinder and is interconnected with the light-shielding exhaust cylinder and the beryllium window pinhole imaging structure; a scintillator is connected to the scintillator high-vacuum cylinder, and an exhaust port is provided on the scintillator high-vacuum cylinder. The present invention can perform multi-layer reflection shielding on visible light stray light, and at the same time realize efficient and rapid exhaust of gas in the high-vacuum cavity, thereby improving the detection efficiency and resolution capability of the scintillator imaging sealing structure under high vacuum conditions.

Description

Technical Field

[0001] The present invention relates to the technical field of scintillator imaging detection, and in particular to a high vacuum light-shielding scintillator imaging sealing structure. Background Art

[0002] In magnetic confinement fusion experiments, soft X-ray radiation primarily arises from bremsstrahlung radiation produced by Coulomb collisions of electrons. Detecting soft X-ray radiation can provide crucial information about the electron density and temperature distribution within the plasma. High-speed soft X-ray imaging diagnostics utilizes a beryllium window, scintillator, fiber-optic image transmission bundle, image intensifier, and high-speed CMOS camera to detect a complete plasma poloidal (perpendicular to the toroidal magnetic field) cross-section. Specifically, it can be arranged tangentially along a large plasma ring (in the direction of the toroidal magnetic field), enabling direct two-dimensional imaging of the soft X-ray radiation distribution and perturbation structure. Due to the need for high-speed, high-resolution detection of soft X-ray radiation, the beryllium window and scintillator imaging components at the forefront of diagnostics must be able to detect soft X-rays of sufficient intensity, efficiently convert them to visible light, and generate visible light signals with a sufficiently high signal-to-noise ratio, ensuring high-gain conversion when the visible light is transmitted to the image intensifier. The beryllium window used for diagnostics is only approximately 5 μm thick, making it very thin and susceptible to damage. The coating thickness of the scintillator is only about 20um, and the output signal is relatively weak, but it responds to both soft X-rays and visible light and is easily interfered by strong stray light. The substrate of the scintillator is a glass plate. If ordinary rubber rings are used to seal the glass plate, the high vacuum sealing performance is unstable and can be easily destroyed within an experimental operation cycle.

[0003] The beryllium window and scintillator built into the vacuum chamber are integrated through a high-vacuum light-shielding scintillator imaging sealing structure, which will complete the shielding of visible light and ultraviolet light, realize the efficient conversion of soft X-rays to visible light imaging, and obtain a high-vacuum (10-5Pa) cavity seal. The following problems need to be solved: (1) efficient shielding of strong stray light, (2) rapid emptying of the gas retained in the cavity after the fusion device is inflated, (3) the tolerance of the beryllium window to high-pressure retained gas, and (4) the reliability and safety of the scintillator sealing surface under high vacuum conditions. Summary of the Invention

[0004] The present invention provides a high vacuum light-shielding scintillator imaging sealing structure, which aims to perform multi-layer reflection shielding on visible light stray light.

[0005] The present invention is achieved through the following technical solutions: a high vacuum light-shielding scintillator imaging sealing structure, comprising a scintillator high vacuum cylinder, a light-shielding exhaust multi-stage structure and a beryllium window pinhole imaging structure;

[0006] The light-shielding exhaust multi-stage structure includes a light-shielding exhaust cylinder and at least two light-shielding exhaust rings. Adjacent light-shielding exhaust rings are connected inside the light-shielding exhaust cylinder at intervals. A plurality of circumferentially distributed exhaust holes are opened on the end faces of the light-shielding exhaust rings. Both ends of the light-shielding exhaust cylinder are connected to each other.

[0007] One end of the scintillator high vacuum cylinder passes through the light-shielding exhaust ring in sequence and is located inside the light-shielding exhaust cylinder and is connected to the light-shielding exhaust cylinder and the beryllium window pinhole imaging structure; a scintillator is connected inside the scintillator high vacuum cylinder to seal it, and an exhaust port is opened on the scintillator high vacuum cylinder at a position inside the light-shielding exhaust cylinder.

[0008] In this solution, the scintillator is the sealing surface of the scintillator high vacuum cylinder, and the exhaust port is the outlet for the retained gas to enter the light-shielding exhaust multi-stage structure.

[0009] In this scheme, the light emitted by the plasma in the vacuum device passes through the beryllium window pinhole imaging structure to filter visible light and ultraviolet light. Then, it passes through the scintillator high vacuum cylinder, where the scintillator converts the soft X-rays entering the scintillator high vacuum cylinder into visible light, completing the transmission and conversion of the X-rays passing through the beryllium window. The converted visible light is then transmitted to equipment outside the device for signal amplification and high-speed detection. When the visible light emitted by the plasma and the stray light within the device pass through the light-shielding exhaust ring at the end of the light-shielding exhaust cylinder in the multi-stage light-shielding exhaust structure, most of the light is blocked by the light-shielding exhaust ring, while a small amount of light enters the light-shielding exhaust cylinder through the exhaust holes on the light-shielding exhaust ring. Since there are at least two light-shielding exhaust rings, the incoming light can be subjected to multi-layer reflective shielding, effectively avoiding interference of visible light on the scintillator and greatly improving the contrast and clarity of scintillator imaging.

[0010] By arranging the multi-stage light-shielding exhaust ring, multi-stage reflection shielding is achieved, which blocks the entry of strong stray light. The multi-stage light-shielding exhaust ring forms a multi-stage cavity. In this way, the arrangement of the multi-stage cavity delays the entry of inflation gas and accelerates the discharge of retained gas.

[0011] Furthermore, the exhaust holes on two adjacent light-shielding exhaust rings are arranged alternately.

[0012] Beneficial effect: In this scheme, the exhaust holes on adjacent light-shielding exhaust rings are staggered, so that each light-shielding exhaust ring can reflect the incoming light source. Compared with when the exhaust holes on adjacent light-shielding exhaust rings are arranged opposite each other, the light source will directly enter from the opposite exhaust hole. In this way, the light-shielding exhaust ring has a poor reflection effect on the light source, and thus has a poor shielding effect on visible light and stray light. The design of this scheme can avoid the incoming light source from directly entering through the opposite exhaust holes on adjacent light-shielding exhaust rings. The staggered exhaust holes in this scheme can make the light source reflected step by step between adjacent light-shielding exhaust rings, thereby achieving a multi-level shielding effect, which can effectively avoid the interference of visible light on the scintillator.

[0013] Furthermore, there are three light-shielding exhaust rings, which are a first-level light-shielding exhaust ring, a second-level light-shielding exhaust ring and a third-level light-shielding exhaust ring. The first-level light-shielding exhaust ring, the second-level light-shielding exhaust ring and the third-level light-shielding exhaust ring are connected in sequence in the light-shielding exhaust tube from the outside to the inside.

[0014] Beneficial effect: The setting of three light-shielding exhaust rings in this solution can achieve three-layer shielding of visible light and stray light, and the shielding effect is better.

[0015] Furthermore, the exhaust port is located between a light-shielding exhaust ring close to the beryllium window pinhole imaging structure and the beryllium window pinhole imaging structure.

[0016] Beneficial effect: Such an arrangement enables the light source to pass through multiple levels of light-shielding exhaust rings in sequence for reflection shielding, thereby reducing or avoiding the situation inside the high vacuum cylinder of the light source scintillator.

[0017] Furthermore, on the path of exhausting air outward from the exhaust port, the cavity volume between the light-shielding exhaust ring located at the innermost side of the light-shielding exhaust tube and one end of the light-shielding exhaust tube close to the beryllium window pinhole imaging structure and the cavity volume formed between adjacent light-shielding exhaust rings decrease successively.

[0018] Beneficial effect: In this scheme, since the cavity volumes between multiple light-shielding exhaust rings and between the light-shielding exhaust ring and the end of the light-shielding exhaust tube are inconsistent, and the cavity volume between the light-shielding exhaust ring and the end of the light-shielding exhaust tube close to the beryllium window pinhole imaging structure and the cavity volume formed between adjacent light-shielding exhaust rings decrease successively, the pressures between the various cavities are different, forming a pressure difference. In this way, the gas that enters the scintillator high vacuum tube through the inflation of the fusion device can be beneficial to the pressure difference change of each cavity when the exhaust system is exhausted in the later stage, so that the gas in the scintillator high vacuum tube is quickly discharged from the exhaust port through the exhaust holes on the multiple light-shielding exhaust rings in sequence.

[0019] Furthermore, the exhaust port and the exhaust hole on the light-shielding exhaust ring are arranged with their axes perpendicular to each other.

[0020] Beneficial effect: Such a setting can change the propagation path of the light source. The exhaust port and the exhaust hole are set vertically, which can reflect the light source again, and the shielding effect is better, which can further reduce or avoid the light source entering the scintillator high vacuum cylinder and causing interference to the scintillator.

[0021] Furthermore, the beryllium window pinhole imaging structure includes a pinhole pressure plate, a support plate and a beryllium window. A groove is provided at one end of the support plate, and the beryllium window is embedded in the groove. A connecting pinhole is provided on the pinhole pressure plate and the support plate. The pinhole pressure plate and the support plate are connected to each other, and the beryllium window is located between the pinhole pressure plate and the support plate.

[0022] Beneficial effect: In this solution, the pinhole pressing plate and the support plate are connected to each other to limit the beryllium window, and the beryllium window is embedded in the groove of the support plate, and the groove can play a positioning role in the installation of the beryllium window.

[0023] Furthermore, the pinhole is trumpet-shaped.

[0024] Beneficial effect: Due to the use of the trumpet-shaped pinhole, the angle of the incident light is expanded and the flux of the incident light is increased.

[0025] Furthermore, there is a gap between the pinhole pressing plate and the support plate.

[0026] Beneficial effect: In this solution, there is a gap between the pinhole pressure plate and the support plate, which provides a buffer space for the beryllium window embedded in the groove when the device is evacuated, which can buffer the destructive force caused by the pressure difference between the inside and outside of the high vacuum chamber and enhance the protection of the beryllium window.

[0027] Furthermore, the scintillator high vacuum cylinder is connected to a beryllium window connecting flange, a device sealing flange and a scintillator sealing flange; the beryllium window connecting flange is connected to the ends of the beryllium window vacuum imaging structure and the light-shielding exhaust multi-stage structure; the device sealing flange is connected to the window flange of the magnetic confinement device; and the scintillator is connected to the scintillator sealing flange.

[0028] Beneficial effects: The setting of the beryllium window connecting flange in this scheme facilitates the connection between the scintillator high vacuum cylinder and the beryllium window vacuum imaging structure and the light-shielding exhaust multi-stage structure, and the device sealing flange is convenient for connection with the magnetic confinement device window flange, thereby facilitating the connection of the entire high vacuum light-shielding scintillator imaging sealing structure in this scheme with the vacuum device; the setting of the scintillator sealing flange facilitates the fixation of the scintillator.

[0029] Compared with the prior art, the present invention has the following advantages and beneficial effects:

[0030] 1. The present invention's high-vacuum light-shielding scintillator imaging seal structure provides multi-layered reflective shielding of visible stray light while simultaneously enabling efficient and rapid exhaust of gases within the high-vacuum cavity. This increases the flux of incident light, enhances the effective protection of the beryllium window, and reduces the safety risks of the high-vacuum sealed optical path. This development of a soft X-ray scintillator imaging detection seal structure expands its application scenarios and enhances the flexibility and reliability of the detection system.

[0031] 2. The scintillator high vacuum cylinder, the light-shielding exhaust multi-stage structure and the beryllium window pinhole imaging structure are interconnected into one. Through this integrated design, the high vacuum light-shielding scintillator imaging sealing structure of the present invention effectively shields strong stray light and realizes efficient conversion of soft X-rays to visible light under high vacuum conditions.

[0032] 3. The beryllium window blocks visible and ultraviolet light. The trumpet-shaped pinhole design increases the flux of incident light. The embedded beryllium window mounting structure enhances protection for the beryllium window. The gap between the support plate and the protrusion on the pinhole pressure plate provides a buffer against subsequent pressure on the beryllium window.

[0033] 4. The multi-stage light-shielding exhaust structure secures the primary, secondary, and tertiary light-shielding exhaust rings within the light-shielding exhaust cavity from the outside in. This multi-stage reflective shielding blocks the entry of visible light and stray light. The multi-stage cavity arrangement slows the entry of inflation gas and accelerates the exhaust of retained gas.

[0034] 5. The scintillator high vacuum cylinder is connected to the beryllium window pinhole imaging structure and the light-shielding exhaust multi-stage structure by a beryllium window connecting flange. The exhaust port discharges the gas in the high vacuum cavity to the light-shielding exhaust multi-stage structure. The device sealing flange connects the scintillator high vacuum cavity to the device window. The scintillator is welded to the scintillator sealing flange. A portion of the scintillator is located inside the scintillator high vacuum cylinder and serves as the sealing surface of the scintillator high vacuum cylinder. The scintillator converts the soft X-rays entering the high vacuum cavity of the scintillator high vacuum cylinder into visible light. By placing the scintillator sealing flange on the outside of the magnetic confinement device window flange, the scintillator can be installed inside the scintillator high vacuum cylinder for sealing, reducing the safety risk of the high vacuum sealed optical path. By placing the scintillator sealing flange on the outside of the magnetic confinement device window flange, the reliability and safety of the scintillator sealing surface under high vacuum conditions are guaranteed.

[0035] 6. The present invention effectively solves the problems encountered in scintillator imaging sealing structures: efficient shielding of visible light stray light, efficient and rapid exhaust of gas in the cavity under high vacuum conditions, increased incident light flux, enhanced beryllium window tolerance to high-pressure retained gas, and reliability and safety of the scintillator sealing surface. It is very suitable for high-speed soft X-ray imaging diagnosis. BRIEF DESCRIPTION OF THE DRAWINGS

[0036] The drawings described herein are used to provide a further understanding of the embodiments of the present invention, constitute a part of this application, and do not constitute a limitation of the embodiments of the present invention. In the drawings:

[0037] Figure 1 This is a structural schematic diagram of an embodiment of a high vacuum light-shielding scintillator imaging sealing structure of the present invention;

[0038] Figure 2This is a structural schematic diagram of a scintillator high vacuum cylinder in an embodiment of a high vacuum light-shielding scintillator imaging sealing structure of the present invention;

[0039] Figure 3 This is a structural schematic diagram of a light-shielding exhaust multi-stage structure in an embodiment of a high vacuum light-shielding scintillator imaging sealing structure of the present invention;

[0040] Figure 4 This is a structural schematic diagram of a first-level light-shielding exhaust ring in an embodiment of a high vacuum light-shielding scintillator imaging sealing structure of the present invention;

[0041] Figure 5 This is a structural schematic diagram of a two-stage light-shielding exhaust ring in an embodiment of a high vacuum light-shielding scintillator imaging sealing structure of the present invention;

[0042] Figure 6 This is a structural schematic diagram of a three-stage light-shielding exhaust ring in an embodiment of a high vacuum light-shielding scintillator imaging sealing structure of the present invention;

[0043] Figure 7 This is a structural schematic diagram of a beryllium window pinhole imaging structure in an embodiment of a high vacuum light-shielding scintillator imaging sealing structure of the present invention;

[0044] Figure 8 This is a structural schematic diagram of a support plate in an embodiment of a high vacuum light-shielding scintillator imaging sealing structure of the present invention;

[0045] Figure 9 This is a structural schematic diagram of a pinhole pressure plate in an embodiment of a high vacuum light-shielding scintillator imaging sealing structure of the present invention;

[0046] Figure 10 This is a schematic diagram of the structure and optical path of a high vacuum light-shielding scintillator imaging sealing structure embodiment of the present invention, which is connected with a magnetic confinement device.

[0047] Markings and corresponding parts names in the accompanying drawings:

[0048] Scintillator high vacuum cylinder 1, scintillator sealing flange 11, scintillator 12, device sealing flange 13, high vacuum cavity 14, exhaust port 15, beryllium window connecting flange 16, light-shielding exhaust multi-stage structure 2, light-shielding exhaust cylinder 21, first-level light-shielding exhaust ring 22, second-level light-shielding exhaust ring 23, third-level light-shielding exhaust ring 24, third-level exhaust hole 25, second-level exhaust hole 26, first-level exhaust hole 27, positioning screw hole 28, beryllium window pinhole imaging structure 3, pinhole pressure plate 31, beryllium window 32, support plate 33, plasma 4, magnetic confinement device window flange 5, magnetic confinement device main vacuum chamber 6, magnetic confinement device high vacuum exhaust port 7, soft X-ray optical path 8, stray light optical path 9. DETAILED DESCRIPTION

[0049] In order to make the objectives, technical solutions and advantages of the present invention more clearly understood, the present invention is further described in detail below in conjunction with examples and drawings. The exemplary embodiments of the present invention and their descriptions are only used to explain the present invention and are not intended to limit the present invention.

[0050] Example

[0051] like Figure 1 As shown, this embodiment provides a high vacuum light-shielding scintillator imaging sealing structure, comprising a scintillator high vacuum cylinder 1, a light-shielding exhaust multi-stage structure 2, and a beryllium window pinhole imaging structure 3;

[0052] Combine Figure 3 As shown, the light-shielding exhaust multi-stage structure 2 includes a light-shielding exhaust tube 21 and at least two light-shielding exhaust rings. Adjacent light-shielding exhaust rings are connected at intervals inside the light-shielding exhaust tube 21. A plurality of circumferentially distributed positioning screw holes 28 are provided on the circumferential side surfaces of the light-shielding exhaust rings. The positioning screw holes 28 are arranged along the radial direction of the light-shielding exhaust rings. The light-shielding exhaust rings and the light-shielding exhaust tube 21 are tightly connected by inserting screws into the positioning screw holes 28. A plurality of circumferentially distributed exhaust holes are provided on the end face of the light-shielding exhaust ring. The two ends of the light-shielding exhaust tube 21 are connected to each other. In this embodiment, a through hole is provided at the left end of the light-shielding exhaust tube 21, and the right end of the light-shielding exhaust tube 21 is an open end.

[0053] Combine Figure 1 As shown, one end of the scintillator high vacuum cylinder 1 passes through the light-shielding exhaust ring in sequence and is located in the light-shielding exhaust cylinder 21 and is interconnected with the light-shielding exhaust cylinder 21 and the beryllium window pinhole imaging structure 3; the light-shielding exhaust ring is connected to the light-shielding exhaust cylinder 21 and tightly surrounds the scintillator high vacuum cylinder 1, and a scintillator 12 is connected to the scintillator high vacuum cylinder 1 to seal it. An exhaust port 15 is provided on the scintillator high vacuum cylinder 1 at a position inside the light-shielding exhaust cylinder 21. In this embodiment, there are six exhaust ports 15, and the six exhaust ports 15 are evenly distributed along the circumference of the scintillator high vacuum cylinder 1.

[0054] Specific: such as Figure 2 As shown, the scintillator high vacuum cylinder 1 is connected to a beryllium window connecting flange 16, a device sealing flange 13, and a scintillator sealing flange 11. The beryllium window connecting flange 16 is located at the left end of the scintillator high vacuum cylinder 1, close to the beryllium window pinhole imaging structure 3. The beryllium window connecting flange 16 is located within the light-shielding exhaust cylinder 21 and is connected to the vacuum imaging structure of the beryllium window 32 and the end of the light-shielding exhaust multi-stage structure 2. The interior of the scintillator high vacuum cylinder 1 is hollow, and the internal cavity of the scintillator high vacuum cylinder 1 is a high vacuum cavity 14.

[0055] The sealing flange 13 of the device is located outside the light-shielding exhaust cylinder 21, and is combined with Figure 10As shown, in this embodiment, a high-vacuum light-shielding scintillator imaging sealing structure is connected to a magnetic confinement device. The device sealing flange 13 in this embodiment is connected to the magnetic confinement device window flange 5 on the magnetic confinement device. A magnetic confinement device high-vacuum exhaust port 7 is provided at both the upper and lower portions of the magnetic confinement device main vacuum chamber 6. Gas is injected into the magnetic confinement device main vacuum chamber 6 through an air supply pipe, and a plasma 4 is generated by an electric field. A scintillator 12 is connected to a scintillator sealing flange 11. In this embodiment, the scintillator sealing flange 11 is positioned externally to the magnetic confinement device window. One end of the scintillator 12 is welded to the scintillator sealing flange 11 and positioned within the scintillator high-vacuum cylinder 1, serving as a sealing surface for the scintillator high-vacuum cylinder 1 and ensuring the sealing of the high-vacuum cavity 14 of the scintillator high-vacuum cylinder 1. An exhaust port 15 is the outlet for retained gas to enter the light-shielding exhaust multi-stage structure.

[0056] Combine Figure 4 、 Figure 5 and Figure 6 As shown, in this embodiment, there are six exhaust holes on the light-shielding exhaust ring, and the six exhaust holes are evenly distributed circumferentially. The exhaust holes on two adjacent light-shielding exhaust rings are staggered with each other. In this embodiment, there are three light-shielding exhaust rings, and the three light-shielding exhaust rings are respectively a first-level light-shielding exhaust ring 22, a second-level light-shielding exhaust ring 23 and a third-level light-shielding exhaust ring 24. The first-level light-shielding exhaust ring 22, the second-level light-shielding exhaust ring 23 and the third-level light-shielding exhaust ring 24 are sequentially connected in the light-shielding exhaust tube 21 from the outside to the inside, that is, the first-level light-shielding exhaust ring 22, the second-level light-shielding exhaust ring 23 and the third-level light-shielding exhaust ring 24 are sequentially spaced inward from the end of the light-shielding exhaust tube 21 away from the beryllium window pinhole imaging structure 3. The exhaust hole on the first-level light-shielding exhaust ring 22 is a first-level exhaust hole 27, the exhaust hole on the second-level light-shielding exhaust ring 23 is a second-level exhaust hole 26, and the exhaust hole on the third-level light-shielding exhaust ring 24 is a third-level exhaust hole 25.

[0057] In this embodiment, one of the primary exhaust holes 27 on the primary light-shielding exhaust ring 22 is offset 30 degrees from its central axis, one of the secondary exhaust holes 26 on the secondary light-shielding exhaust ring 23 is offset 60 degrees from its central axis, and the tertiary exhaust holes 25 on the tertiary light-shielding exhaust ring 24 are offset 90 degrees from their central axis. This results in a 30-degree difference between the primary exhaust holes 27, the secondary exhaust holes 26, and the tertiary exhaust holes 25, resulting in a staggered arrangement of the primary exhaust holes 27, the secondary exhaust holes 26, and the tertiary exhaust holes 25.

[0058] Combine Figure 1 As shown, the exhaust port 15 is located between the light-shielding exhaust ring close to the beryllium window pinhole imaging structure 3 and the beryllium window pinhole imaging structure 3 , that is, the exhaust port 15 is located on the left side of the three-stage light-shielding exhaust ring 24 .

[0059] Combine Figure 3As shown, on the path of exhaust from the exhaust port 15 to the outside, the cavity volume between the light-shielding exhaust ring located at the innermost side of the light-shielding exhaust tube 21 and the end of the light-shielding exhaust tube 21 close to the beryllium window pinhole imaging structure 3 and the cavity volume formed between adjacent light-shielding exhaust rings decrease successively, that is, the cavity volume between the tertiary light-shielding exhaust ring 24 and the light-shielding exhaust tube 21, the cavity between the secondary light-shielding exhaust ring 23 and the tertiary light-shielding exhaust ring 24, and the cavity volume between the primary light-shielding exhaust ring 22 and the secondary light-shielding exhaust ring 23 decreases successively. Specifically: in this embodiment, the high vacuum cavity 14 of the scintillator high vacuum tube 1 where the exhaust port 15 is located and the cavity between the tertiary light-shielding exhaust ring 24 and the light-shielding exhaust tube 21, the cavity between the secondary light-shielding exhaust ring 23 and the tertiary light-shielding exhaust ring 24, and the cavity volume between the primary light-shielding exhaust ring 22 and the secondary light-shielding exhaust ring 23 are 6:3:2:1 in the ratio. There is a relatively large pressure difference in each cavity, which can have a relatively strong acceleration effect on gas discharge.

[0060] like Figure 1 As shown, the exhaust port 15 and the axis of the exhaust hole on the light-shielding exhaust ring are arranged perpendicular to each other, as shown in FIG. Figure 1 In the orientation shown, the exhaust port 15 is arranged perpendicular to the axial direction of the scintillator high vacuum cylinder 1, while the exhaust holes are arranged parallel to the axial direction of the scintillator high vacuum cylinder 1. In this way, incident light entering through the exhaust holes on the light-shielding exhaust ring has difficulty entering the exhaust port 15, thereby effectively blocking the incident light from entering the high vacuum cavity 14 inside the scintillator high vacuum cylinder 1, thereby effectively avoiding interference with the scintillator 12.

[0061] like Figure 7 、 Figure 8 and Figure 9 As shown, the beryllium window pinhole imaging structure 3 includes a pinhole pressure plate 31, a support plate 33 and a beryllium window 32. A groove is provided at one end of the support plate 33. The beryllium window 32 has a thickness of 5 μm. Only X-rays can be emitted, while visible light and ultraviolet light are blocked.

[0062] In this embodiment, the support plate 33 is a circular plate structure, and a groove is opened in the center of the support plate 33. The beryllium window 32 is embedded in the groove. A connected pinhole is opened on the pinhole pressure plate 31 and the support plate 33. The pinhole is trumpet-shaped to expand the angle of the incident light and increase the flux of the incident light.

[0063] The pinhole pressure plate 31 is connected to the support plate 33, and the beryllium window 32 is located between the pinhole pressure plate 31 and the support plate 33. In this embodiment, two inner and outer circles of connecting holes are provided on the support plate 33. There are four connecting holes in the inner and outer circles, and the four connecting holes are evenly distributed circumferentially. The pinhole pressure plate 31 is also provided with four connecting holes evenly distributed circumferentially. The four connecting holes on the pinhole pressure plate 31 correspond to the four connecting holes in the inner circle of the support plate 33, and are fastened by inserting screws, thereby limiting the beryllium window 32 and preventing the beryllium window 32 from falling.

[0064] Combine Figure 1 As shown, the left end of the light-shielding exhaust cylinder 21 is also provided with four circumferentially evenly distributed connection holes. When the scintillator high vacuum cylinder 1, the light-shielding exhaust multi-stage structure 2 and the beryllium window pinhole imaging structure 3 are connected to each other, the four connection holes located on the outer circle of the support plate 33 and the four connection holes on the left end of the light-shielding exhaust cylinder 21 are aligned with the beryllium window connection flange 16 and are fixed by screwing in screws.

[0065] In another embodiment, as shown in combination with FIG7 , there is a gap between the pinhole pressure plate 31 and the support plate 33. Specifically, a protrusion is connected to the side of the pinhole pressure plate 31 facing the beryllium window 32. The protrusion and the pinhole pressure plate 31 are integrally formed. The protrusion is arranged opposite the beryllium window 32, and there is a gap of 1 mm between the protrusion and the support plate 33. In this way, when the pinhole pressure plate 31 and the support plate 33 are connected to each other, the beryllium window 32 embedded in the groove can have a buffer space, which can buffer the destructive force formed by the pressure difference between the inside and outside of the high vacuum chamber 14, and further enhance the protection of the beryllium window 32.

[0066] The specific implementation process is as follows:

[0067] Combine Figure 10 As shown, the light emitted by the plasma 4 in the main vacuum chamber 6 of the magnetic confinement device is filtered by the beryllium window pinhole imaging structure to complete the filtering of visible light and ultraviolet light. Its main light path (i.e., the soft X-ray light path 8) passes through the beryllium window pinhole imaging structure 3 and enters the high vacuum light-shielding scintillator imaging sealing structure, and passes through the scintillator high vacuum cylinder 1 to complete the transmission and conversion of the X-rays passing through the beryllium window 32, and the converted visible light is transmitted to the equipment outside the device for signal amplification and high-speed detection.

[0068] The visible light emitted by the plasma 4 is reflected multiple times on the inner wall of the magnetic confinement device to produce strong stray light. The stray light path will enter from the right side of the light-shielding exhaust multi-stage mechanism 2 and undergo multi-layer shielding through the light-shielding exhaust multi-stage structure 2, effectively avoiding the interference of visible light on the imaging of the scintillator 12 and greatly improving the contrast and clarity of the imaging of the scintillator 12. At the same time, when the vacuum chamber of the fusion device is inflated (the gas left after the plasma discharge ruptures or the gas added by the device wall treatment), the inflation gas entering the high vacuum cavity 14 of the scintillator high vacuum cylinder 1 can be efficiently and quickly discharged through the light-shielding exhaust multi-stage structure 2 and enter the operating exhaust system through the high vacuum exhaust port 7 of the magnetic confinement device.

[0069] The beryllium window pinhole imaging structure 3, with its beryllium window 32 embedded in a groove, can withstand relatively high gas pressures during gas exhaust. The trumpet-shaped pinhole incident structure increases the incident light flux. The external scintillator sealing flange 11 effectively protects against the risk of vacuum leakage on the sealing surface of the scintillator 12 after prolonged and repeated discharges (because the external scintillator sealing flange 11 will later be sealed and connected to other structures on the scintillator 12 located outside the scintillator high vacuum tube 1).

[0070] The visible light emitted by the plasma 4 and the stray light within the magnetic confinement device first pass through the primary light-shielding exhaust ring 22, where most of the light is reflected by the primary light-shielding exhaust ring 22. A small portion of the light passes through the primary exhaust hole 27 and enters the cavity between the primary light-shielding exhaust ring 22 and the secondary light-shielding exhaust ring 23. Since the secondary exhaust hole 26 is rotated 30 degrees relative to the primary exhaust hole 27, most of the light entering from the primary exhaust hole 27 is reflected by the secondary light-shielding exhaust ring 23. The remaining small portion of the light passes through the secondary exhaust hole 26 and enters the cavity where the tertiary light-shielding exhaust ring 24 and the secondary exhaust ring 23 are located.

[0071] Since the tertiary exhaust hole 25 is rotated at a 30-degree angle relative to the secondary exhaust hole 26, most of the light entering from the secondary exhaust hole 26 is reflected by the tertiary light-shielding exhaust ring 24. Very little light passes through the tertiary exhaust hole 25 into the cavity on the left side of the tertiary light-shielding exhaust ring 24, and then enters the high vacuum cavity 14 through the six exhaust ports 15 evenly distributed circumferentially on the scintillator high vacuum cylinder 1.

[0072] Since the exhaust port 15 is at a vertical angle of 90 degrees relative to the third-stage exhaust hole 25 , only extremely weak light enters the high vacuum cavity 14 , which has little impact on the scintillator 12 .

[0073] At the same time, the gas entering the fusion device during the inflation process will instantly diffuse step by step through the first-level exhaust hole 27, the second-level exhaust hole 26, the third-level exhaust hole 25, and the exhaust port 15 and remain in the corresponding cavity. After about 1-10 minutes or 1-2 hours, the gas in the main vacuum chamber 6 of the magnetic confinement device and the high vacuum cavity 14 will be extracted through the external exhaust system.

[0074] Due to the light-shielding exhaust multi-stage structure 2, retained gas is rapidly discharged in the reverse direction through the exhaust port 15, the third-stage exhaust hole 25, the second-stage exhaust hole 26, and the first-stage exhaust hole 27. Since the volume ratio of the cavities containing the exhaust port 15, the third-stage exhaust hole 25, the second-stage exhaust hole 26, and the first-stage exhaust hole 27 is approximately 6:3:2:1, there is a relatively large pressure difference between the cavities, which can strongly accelerate the discharge of gas. The multi-stage exhaust ring structure of the present invention can achieve multi-layer reflective shielding of visible light while simultaneously achieving efficient and rapid discharge of retained gas within the cavity.

[0075] Visible light, ultraviolet light, and X-rays emitted by plasma 4 pass through the trumpet-shaped pinhole pressure plate 31 and are incident on a beryllium window 32, located within a 1mm gap between the trumpet-shaped pinhole pressure plate 31 and the support plate 33. The 5µm thickness of the beryllium window 32 allows only X-rays to escape, while blocking both visible and ultraviolet light. The trumpet-shaped pinhole increases the angle of the incident light and its flux. During vacuuming, the beryllium window 32, embedded within the groove, buffers the destructive force of the pressure differential between the interior and exterior of the high-vacuum chamber 14 due to the gap between the pinhole pressure plate 31 and the support plate 33.

[0076] The X-rays emitted through the beryllium window 32 enter the high vacuum cavity 14 connected by the beryllium window connecting flange 16 and the support plate 33, and finally reach the scintillator 12 to be converted into visible light, and then emitted to the equipment outside the vacuum chamber. Among them, the device sealing flange 13 is connected to the magnetic confinement device window flange 5, and the scintillator sealing flange 11 fixes the scintillator 12. The scintillator 12 is the sealing surface of the high vacuum cavity 14 of the scintillator 12. The exhaust port 15 is the outlet for the retained gas to enter the light-shielding exhaust multi-stage structure 2. By adopting a suitable coating thickness, the scintillator 12 can only convert soft X-ray radiation into visible light and does not respond to higher energy hard X-rays. To complete the conversion imaging of soft X-rays to visible light, the scintillator sealing flange 11 is placed outside the device sealing flange 13, which is conducive to the effective protection of the sealing surface of the scintillator 12.

[0077] It should be noted that the above description of the disclosed embodiments is intended to enable one skilled in the art to implement or use the present application. Various modifications to these embodiments will be readily apparent to one skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the scope of the present application. Therefore, the present application is not limited to the embodiments shown herein, but is intended to conform to the widest scope consistent with the principles and novel features disclosed herein.

[0078] In the description of the present invention, it should be noted that the terms "first", "second", "third", etc. are only used to distinguish the description and cannot be understood as indicating or implying relative importance.

[0079] In the description of this document, the terms "up", "down", "left", "right", "front", "back", "top", "bottom", "inside", "outside", "middle", "vertical", "horizontal", "lateral", "longitudinal", etc., indicating the orientation or position relationship, are based on the orientation or position relationship shown in the accompanying drawings, and are only used to illustrate the relative position relationship between the various components or components, and do not particularly limit the specific installation orientation of the various components or components.

[0080] In the descriptions of this document, some terms may be used to express other meanings besides indicating a position or location. For example, the term "on" may also be used to indicate a dependency or connection in certain circumstances. Those skilled in the art will understand the specific meanings of these terms in this application based on the specific circumstances.

[0081] In this document, the terms "installed," "disposed," "provided with," "connected," and "connected" should be interpreted broadly. For example, they can refer to fixed connections, removable connections, or integral structures; mechanical connections or electrical connections; direct connections, indirect connections through an intermediary, or internal communication between two devices, elements, or components. Those skilled in the art will understand the specific meanings of these terms in this application based on the specific circumstances.

[0082] The structures, proportions, sizes, etc. drawn in the drawings in this application are only used to match the contents disclosed in this technical briefing document for those skilled in the art to understand and read, and are not used to limit the conditions under which this application can be implemented. Therefore, they have no substantive technical significance. Any structural modification, change in proportional relationship or adjustment of size should still fall within the scope of the technical content disclosed in this application without affecting the efficacy and purpose that can be achieved by this application.

[0083] The terms used in this document are those commonly used in the art currently in consideration of the functions of the present disclosure, but these terms may vary according to the intentions of those skilled in the art, precedents, or new technologies in the art. In addition, specific terms may be selected by the applicant, and in such cases, their detailed meanings will be described in the detailed description of the present disclosure. Therefore, the terms used in the document should not be understood as simple names, but rather as a general description based on the meaning of the terms and the present disclosure.

[0084] Flowcharts or text are used in this document to illustrate the operational steps performed according to the embodiments of the present application. It should be understood that the operational steps in the embodiments of the present application are not necessarily performed in the exact order in which they are described. Instead, the various steps may be processed in reverse order or simultaneously, as needed. Furthermore, other operations may be added to these processes, or one or more operations may be removed from these processes.

[0085] The above are only preferred embodiments of the present application and are not intended to limit the present application. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principles of the present application should be included in the scope of protection of the present application.

Claims

1. A high vacuum light-shielding scintillator imaging sealing structure, characterized in that: It includes a scintillator high vacuum cylinder, a light-shielding exhaust multi-stage structure, and a beryllium window pinhole imaging structure; The light-shielding exhaust multi-stage structure includes a light-shielding exhaust cylinder and at least two light-shielding exhaust rings. Adjacent light-shielding exhaust rings are connected inside the light-shielding exhaust cylinder at intervals. A plurality of circumferentially distributed exhaust holes are opened on the end faces of the light-shielding exhaust rings. Both ends of the light-shielding exhaust cylinder are connected to each other. One end of the scintillator high vacuum cylinder passes through the light-shielding exhaust ring in sequence and is located inside the light-shielding exhaust cylinder and is connected to the light-shielding exhaust cylinder and the beryllium window pinhole imaging structure; a scintillator is connected inside the scintillator high vacuum cylinder to seal it, and an exhaust port is opened on the scintillator high vacuum cylinder at a position inside the light-shielding exhaust cylinder.

2. The high vacuum light-shielding scintillator imaging sealing structure according to claim 1, characterized in that: The exhaust holes on two adjacent light-shielding exhaust rings are arranged in a staggered manner.

3. The high vacuum light-shielding scintillator imaging sealing structure according to claim 2, characterized in that: There are three light-shielding exhaust rings, which are a first-level light-shielding exhaust ring, a second-level light-shielding exhaust ring and a third-level light-shielding exhaust ring. The first-level light-shielding exhaust ring, the second-level light-shielding exhaust ring and the third-level light-shielding exhaust ring are sequentially connected in the light-shielding exhaust tube from the outside to the inside.

4. A high vacuum light-shielding scintillator imaging sealing structure according to any one of claims 1 to 3, characterized in that: The exhaust port is located between a light-shielding exhaust ring close to the beryllium window pinhole imaging structure and the beryllium window pinhole imaging structure.

5. The high vacuum light-shielding scintillator imaging sealing structure according to claim 4, characterized in that: On the path of exhausting air outward from the exhaust port, the cavity volume between the light-shielding exhaust ring located at the innermost side of the light-shielding exhaust tube and one end of the light-shielding exhaust tube close to the beryllium window pinhole imaging structure and the cavity volume formed between adjacent light-shielding exhaust rings decrease successively.

6. A high vacuum light-shielding scintillator imaging sealing structure according to any one of claims 1 to 3, characterized in that: The exhaust port and the exhaust hole on the light-shielding exhaust ring are arranged with axes perpendicular to each other.

7. A high vacuum light-shielding scintillator imaging sealing structure according to any one of claims 1 to 3, characterized in that: The beryllium window pinhole imaging structure includes a pinhole pressure plate, a support plate and a beryllium window. A groove is provided at one end of the support plate, and the beryllium window is embedded in the groove. A connecting pinhole is provided on the pinhole pressure plate and the support plate. The pinhole pressure plate and the support plate are connected to each other, and the beryllium window is located between the pinhole pressure plate and the support plate.

8. The high vacuum light-shielding scintillator imaging sealing structure according to claim 7, characterized in that: The pinhole is trumpet-shaped.

9. The high vacuum light-shielding scintillator imaging sealing structure according to claim 7, characterized in that: There is a gap between the pinhole pressing plate and the supporting plate.

10. A high vacuum light-shielding scintillator imaging sealing structure according to any one of claims 1 to 3, characterized in that: The scintillator high vacuum cylinder is connected to a beryllium window connecting flange, a device sealing flange and a scintillator sealing flange. The beryllium window connecting flange is connected to the ends of the beryllium window vacuum imaging structure and the light-shielding exhaust multi-stage structure; the scintillator is connected to the scintillator sealing flange.

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