System and method for performing quality control

Abstract

Techniques for performing quality control in the production of electrical components are provided. Technologies include obtaining electrical characteristic data by measuring an electrical response of an electrical component using a test device and processing the electrical characteristic data using at least one processor to determine quantile statistics for the electrical characteristic data. The techniques additionally include generating, using at least one processor, a graphical user interface containing visualization information of the determined quantile statistics, and displaying, using a display device, the generated graphical user interface.

Description

[0001] Cross-Related Applications

[0002] This application claims priority under 35 U.S.C. §119(e) to U.S. Provisional Patent Application No. 63 / 520,474, filed on August 18, 2023, entitled “SYSTEMS AND METHODS FOR PERFORMING QUALITY CONTROL,” the entirety of which is incorporated herein by reference. Background Art

[0003] Quality control is a process by which a business maintains and / or improves product or service quality. Historically, quality control was implemented in conjunction with the increase in batch production and could be performed, for example, by comparing the final product to a drawing of the product. Modern quality control may be implemented using tolerance limits or controls on acceptable quality levels. Summary of the invention

[0004] Some embodiments provide a method for performing quality control in the production of multiple electrical components. The method includes: obtaining electrical characteristic data by measuring the electrical response of multiple electrical components using a test device; using at least one processor to process the electrical characteristic data to determine quantile statistics for the electrical characteristic data; using at least one processor to generate a graphical user interface, the graphical user interface including visualization information of the determined quantile statistics; and causing a display device to display the generated graphical user interface.

[0005] Some embodiments provide a system for performing quality control in the production of multiple electrical components. The system includes: a test device configured to measure electrical responses of multiple electrical components; a display device; and at least one processor. The at least one processor is configured to perform: obtaining electrical characteristic data by causing the test device to measure the electrical responses of the multiple electrical components; processing the electrical characteristic data to determine quantile statistics for the electrical characteristic data; generating a graphical user interface, the graphical user interface containing visualization information of the determined quantile statistics; and causing the display device to display the generated graphical user interface.

[0006] In some embodiments, the technique further includes identifying a quality control action to be performed based on information in a graphical user interface including visualization information of the determined quantile statistics.

[0007] In some embodiments, the technique also includes performing the identified quality control action.

[0008] In some embodiments, identifying the quality control action includes identifying a maintenance action to perform maintenance on a tool used in the production of the plurality of electrical components.

[0009] In some embodiments, identifying the quality control action includes identifying a selection of a manufacturing process for producing the plurality of electrical components.

[0010] In some embodiments, identifying the quality control action includes identifying a maintenance action to perform maintenance on the test equipment.

[0011] In some embodiments, identifying the quality control action includes identifying a selection of suppliers of parts used in producing the plurality of electrical components.

[0012] In some embodiments, identifying the quality control action includes identifying feedback provided to a supplier of a part used in producing the plurality of electrical components.

[0013] In some embodiments, measuring an electrical response of an electrical component of the plurality of electrical components includes: generating an electrical excitation signal using a test device; providing the electrical excitation signal as an input to the electrical component; and measuring a reflected or transmitted signal output by the electrical component using the test device.

[0014] In some embodiments, measuring an electrical response of an electrical component of the plurality of electrical components includes measuring an electrical response of a discrete function including a parameter, the discrete function including a set of data points including pairs of measurement values ​​and parameter values.

[0015] In some embodiments, the pairs of measured values ​​and parameter values ​​include pairs of measured signal amplitude values ​​and time values, pairs of measured signal amplitude values ​​and frequency values, and / or pairs of measured impedance values ​​and time values.

[0016] In some embodiments, determining quantile statistics for the electrical characteristic data includes calculating, for each parameter value of the measured electrical response, a median of the measured values ​​associated with the same parameter value.

[0017] In some embodiments, determining quantile statistics for the electrical characteristic data includes calculating, for each parameter value of the measured electrical response, a quartile of the measured values ​​associated with the same parameter value.

[0018] In some embodiments, determining quantile statistics for the electrical characteristic data includes calculating, for each parameter value of the measured electrical response, a decile of measured values ​​associated with the same parameter value.

[0019] In some embodiments, generating a graphical user interface includes generating a graph that includes one or more shaded areas or lines representing the determined quantile statistics.

[0020] In some embodiments, determining quantile statistics for the electrical characterization data includes determining median statistics; and generating the graph includes generating a line representing the determined median statistics.

[0021] In some embodiments, generating the graph includes assigning a first color to illustrate a first shaded area representing a first quantile; and assigning a second color to illustrate a second shaded area representing a second quantile, the first color being different from the second color.

[0022] In some embodiments, the electrical components of the plurality of electrical components include a cable assembly comprising one or more differential pairs of conductors; and obtaining electrical characteristic data includes using a test device to measure one of the following: impedance, insertion loss, return loss, far-end crosstalk, near-end crosstalk, far-end component contribution to integrated crosstalk noise, near-end component contribution to integrated crosstalk noise, impedance mixed mode parameters, and / or delay skew of the cable assembly.

[0023] In some embodiments, obtaining the electrical characteristic data includes measuring an impedance of the cable assembly by performing time domain reflectometry.

[0024] In some embodiments, performing the time domain impedance method includes: transmitting a differential electrical signal from a first side of the cable assembly to a second side of the cable assembly through a differential pair of conductors of the cable assembly, the differential electrical signal including a step stimulus having a rise time that is the same as a data rate Nyquist frequency; and measuring a reflected electrical signal as a function of time at the first side of the cable assembly.

[0025] In some embodiments, obtaining electrical characteristic data includes measuring the insertion loss of a cable assembly by transmitting a differential electrical signal from a first side of the cable assembly to a second side of the cable assembly through a differential pair of conductors of the cable assembly, the differential electrical signal having a frequency that changes over time; and measuring the transmitted electrical signal as a function of the frequency at the second side of the cable assembly.

[0026] In some embodiments, obtaining electrical characteristic data includes measuring the return loss of the cable assembly by transmitting a differential electrical signal from a first side of the cable assembly to a second side of the cable assembly through a differential pair of conductors of the cable assembly, the differential electrical signal having a frequency that changes over time; and measuring the reflected electrical signal as a function of the frequency at the first side of the cable assembly.

[0027] In some embodiments, obtaining electrical characteristic data includes measuring far-end crosstalk of a cable assembly by transmitting a differential electrical signal from a first side of the cable assembly to a second side of the cable assembly through a first differential pair of conductors of the cable assembly, the differential signal having a frequency that changes over time, and the first differential pair of conductors being adjacent to a second differential pair of conductors; and measuring the transmitted electrical signal as a function of frequency at the second side of the cable assembly and from the second differential pair of conductors.

[0028] In some embodiments, obtaining electrical characteristic data includes measuring near-end crosstalk of a cable assembly by transmitting a differential electrical signal from a first side of the cable assembly to a second side of the cable assembly through a first differential pair of conductors of the cable assembly, the differential electrical signal having a frequency that changes over time, and the first differential pair of conductors being adjacent to a second differential pair of conductors; and measuring the transmitted electrical signal as a function of frequency at the first side of the cable assembly and from the second differential pair of conductors.

[0029] In some embodiments, obtaining electrical characteristic data includes measuring mixed-mode parameters by transmitting a differential electrical signal from a first side of a cable assembly to a second side of the cable assembly through a first differential pair of conductors of the cable assembly, the differential electrical signal having a frequency that changes over time; and measuring the transmitted common-mode electrical signal as a function of frequency at the second side of the cable assembly.

[0030] In some embodiments, obtaining electrical characteristic data includes measuring the delay difference by performing an inter-pair delay difference measurement as a function of time or as a function of frequency.

[0031] In some embodiments, obtaining the electrical signature data includes selecting a subset of the electrical signature data based on a serial number associated with the plurality of electrical components, a production date of the plurality of electrical components, a batch number associated with the plurality of electrical components, and / or a manufacturing shift associated with a production time of the plurality of electrical components. BRIEF DESCRIPTION OF THE DRAWINGS

[0032] Various aspects and embodiments will be described with reference to the following drawings. It should be clear that the drawings are not drawn to scale. In the drawings, each identical or approximately identical component shown in each figure is represented by the same reference numeral. For the purpose of clarity, not every component may be marked in every drawing.

[0033] Figure 1 is a schematic diagram of an electrical test unit according to some embodiments of the techniques described herein.

[0034] Figure 2AA cable assembly according to some embodiments of the technology described herein is shown.

[0035] Figure 2B The principle of a differential signaling mechanism according to some embodiments of the technology described herein is shown.

[0036] Figure 3 is a schematic diagram illustrating the calculation of the interquartile range according to some embodiments of the techniques described herein.

[0037] Figure 4 is a schematic diagram illustrating the calculation of interquartile and sixteenth quartile ranges according to some embodiments of the techniques described herein.

[0038] Figure 5A is a graph showing representative measurements of insertion loss according to some embodiments of the techniques described herein.

[0039] Figure 5B is a graph showing statistical visualization of measured insertion losses for a plurality of tested electrical devices according to some embodiments of the techniques described herein.

[0040] Fig. 6A is a graph illustrating representative measurements of return loss measured from near-end to near-end of an electrical device under test according to some embodiments of the techniques described herein.

[0041] Figure 6B is a graph showing statistical visualization of measured near-end to near-end return losses for a plurality of tested electrical devices according to some embodiments of the techniques described herein.

[0042] Fig. 7A is a graph illustrating representative measurements of return loss measured from a far end to a far end of an electrical device under test, according to some embodiments of the techniques described herein.

[0043] Figure 7B is a graph showing statistical visualization of measured far-end to far-end return losses for a plurality of tested electrical devices according to some embodiments of the techniques described herein.

[0044] Fig. 8A is a graph illustrating representative measurements of near-end crosstalk according to some embodiments of the techniques described herein.

[0045] Figure 8B is a graph showing statistical visualization of measured near-end crosstalk for a plurality of tested electrical devices according to some embodiments of the techniques described herein.

[0046] Fig. 9Ais a graph illustrating representative measurements of far-end crosstalk according to some embodiments of the techniques described herein.

[0047] Fig. 9B is a graph showing statistical visualization of measured far-end crosstalk for a plurality of tested electrical devices according to some embodiments of the techniques described herein.

[0048] Fig. 10A is a graph showing representative measurements of impedance according to some embodiments of the techniques described herein.

[0049] Fig. 10B is a graph showing statistical visualization of measured impedance for a plurality of tested electrical devices according to some embodiments of the techniques described herein.

[0050] Fig.11 is a flow chart of a process 1100 for performing quality control in the production of a plurality of electrical components according to some embodiments of the techniques described herein.

[0051] Fig.12 is a diagram of an illustrative computer system, according to some embodiments. DETAILED DESCRIPTION

[0052] When electrical components are produced in high volumes, quality control can be performed to ensure that each manufactured electrical device meets production specifications. Such quality control can be implemented by performing one or more electrical measurements on each produced component to determine whether the electrical characteristics of each produced component fall within the desired performance limits. However, the electrical characteristics of each electrical device or a subset of the produced electrical devices often generate a large amount of data that may not be easily synchronized to inform quality control decisions. In fact, each electrical measurement may be stored separately, so that production trends may not be easily inferred from individual electrical measurements.

[0053] The inventors have recognized and appreciated that data generated in the process of performing quality control (for batch production) can be unwieldy and unhelpful in making business and / or production decisions. The inventors have further recognized and appreciated that overlaying multiple measurements (e.g., from a production batch, date, shift, or other time period) in a single graphical representation can provide greater insight into the production process and / or improved product quality. Therefore, the inventors have developed techniques for performing quality control by determining and graphically representing quantile statistics that utilize electrical measurements that characterize multiple produced electrical components.

[0054] In some embodiments, the technology described herein includes obtaining electrical characteristic data describing the electrical characteristics of multiple electrical components. The electrical characteristic data can be obtained by measuring electrical parameters for each electrical component using a test device. For example, in order to obtain measurement from an electrical component, the test device can generate an electrical signal, which is provided to the electrical component as an input, and the test device can measure the output electrical signal received from the electrical component. The output electrical signal can be a transmitted electrical signal, a reflected electrical signal, and / or an electrical signal generated by crosstalk within the electrical component. The output electrical signal can be measured as a function of a parameter (e.g., frequency, amplitude, and / or phase (e.g., as in spectroscopy) or time). The measurement obtained can be a discrete function, which includes a set of data points as paired measured values ​​and parameter values.

[0055] In some embodiments, the electrical signature data obtained may be a subset of all available electrical signature data. The electrical signature data obtained may be selected to provide an understanding of the electrical characteristics of a subset of the components produced. For example, the electrical signature data obtained may be selected based on a serial number associated with the electrical component, a production date of the electrical component, a batch number, and / or a production shift during the time the electrical component was produced.

[0056] In some embodiments, the techniques described herein include determining quantile statistics for the obtained electrical characteristic data. For example, the quantile statistics can be a median. The median can be calculated using measured values ​​determined by measuring electrical characteristics of the electrical component. For example, for each parameter value in a group of data points, the median can be calculated by determining the middle value using the corresponding measured values.

[0057] In some embodiments, determining the quantile statistics may include one or more quantiles. For example, each quantile may include a lower quantile, which defines a point set below a set percentage of the data. The statistics may also include an upper quantile, which defines a point set above a set percentage of the data. For example, the quantile may be one or more of a tertile, a quartile, a quintile, a sextile, a nintile, an octave, a decimal, a twelfth quantile, a sixteenth quantile, a percentile, and / or any other suitable quantile value.

[0058] In some embodiments, the lower quantile and the upper quantile can be calculated using the obtained measurements and the calculated median. For example, the lower quantile can include a quartile so that the lower quantile can be calculated by determining the middle value between the minimum value of the measured values ​​of the obtained measurements and the median of the measured values. As another example, the upper quantile can include a quartile so that the upper quantile can be calculated by determining the middle value between the median and the maximum value of the measured values ​​of the obtained measurements.

[0059] In some embodiments, the technique includes generating a graphical user interface that includes visualization of the determined quantile statistics of the electrical signature data. The graphical representation can be generated using the calculated quantile statistics (e.g., median and / or other quantile values, including but not limited to tertiles, quartiles, quintiles, sextiles, nintiles, octiles, deciles, twelfth quantiles, sixteenth quantiles, percentiles, and / or any other suitable quantile values).

[0060] In some embodiments, generating a graphical user interface includes generating a graph containing one or more shaded areas and / or lines representing determined quantile statistics. For example, the graph may include a line representing a median value and one or more shaded areas or lines representing other quantile statistics (e.g., tertiles, quartiles, quintiles, sextiles, nintiles, octiles, deciles, twelfth quantiles, sixteenth quantiles, percentiles and / or any other suitable quantile values). Alternatively or additionally, the graph may include a first shaded area extending between a lower quantile value and an upper quantile value, a second shaded area extending between a lower quantile value and a minimum value of a measured value, and a third shaded area extending between an upper quantile value and a maximum value of a measured value. The first shaded area may be drawn using a first color, and the second and third shaded areas may be drawn using a second color different from the first color.

[0061] In some embodiments, the techniques may also include identifying quality control actions to be performed based on information in a graphical user interface containing visualization information of the determined quantile statistics. In some embodiments, visualization of quantile statistics of measured electrical characteristics of electrical components may be performed concurrently with the production process (e.g., in real time, at the beginning and / or end of each shift, and / or daily) to provide feedback as production progresses. Such concurrent feedback may enable identification of maintenance actions to maintain or repair tools used in the production of multiple electrical components. For example, the measured impedance may be one that migrates over time as a hot bar used to perform welding degrades, such that the migrated impedance may be used to determine when to perform maintenance on the hot bar.

[0062] As another example, in some embodiments, identifying a quality control action may include identifying a maintenance action to maintain or repair the test equipment. The measured electrical characteristics may drift over time because the connectors used to couple the test equipment to the electrical components wear over time. The drift of the electrical characteristics may be used to determine when to replace inaccurate test equipment so that the test data provided to the customer accurately reflects the quality of the produced electrical components.

[0063] In some embodiments, identifying a quality control action includes identifying a preferred manufacturing process for producing a plurality of electrical components. In some embodiments, identifying a quality control action includes identifying a preferred supplier of parts used in producing a plurality of electrical components. For example, a first batch of electrical components may be produced using a first production technology or parts obtained from a first supplier, while a second batch of electrical components may be produced using a second production technology or parts obtained from a second supplier. Quantifying and visualizing quantile statistics describing the electrical characteristics of the first and second batches may help identify differences in the quality of produced components due to different production technologies or suppliers of parts. By identifying differences in components of the first and second batches of finished products, a witnessed decision may be made regarding the implementation of a particular production technology or the supplier from which the parts were purchased.

[0064] In some embodiments, identifying a quality control action includes identifying feedback to be provided to a supplier of parts used in the production of a plurality of electrical components. For example, when electrical components are produced using cable reels, the electrical characteristics of the cable may differ along its length due to production changes. An electrical component produced from one end of the cable using the cable may have different electrical characteristics than an electrical component produced from the other end of the cable using the cable, and these differences can be identified by visualizing quantile statistics describing the electrical characteristics of those different groups of electrical components. By identifying such changes in electrical behavior, feedback can be provided to the cable supplier to mitigate the changed characteristics of the cable.

[0065] The following is a more detailed description of various contents related to visualization statistics and embodiments of methods and devices for visualization statistics, which describe electrical characteristics of various electrical devices. It should be clear that the various aspects described herein can be implemented in any number of ways. For the purpose of illustrative illustration, examples of specific embodiments are provided herein. In addition, the various aspects described below in the embodiments can be used alone or in any combination, and are not limited to the combinations explicitly described herein.

[0066] Figure 11 is a schematic diagram of an electronic test unit 100 according to some embodiments of the technology described herein. The electronic test unit 100 includes a test device 102 coupled to a first test board 104a and a second test board 104b via a connection 103. The connection 103 can be, for example, a cable (e.g., a coaxial cable, a twisted pair cable, a heliax cable, a twinax cable, etc.) that couples the test device 102 to the first test board 104a and the second test board 104b. The first test board 104a and the second test board 104b can be, for example, a printed circuit board (PCB) configured to couple electrical signals between the connection 103 and an electrical component 106.

[0067] In some embodiments, the electrical component 106 can be coupled between the first test board 104a and the second test board 104b via a connection 105. The connection 105 can be, for example, a complementary socket and / or plug connector that interfaces with the electrical component 106 and is coupled to the first test board 104a and the second test board 104b. Alternatively or additionally, in some embodiments, the connection 105 can include a cable (e.g., a coaxial cable, a twisted pair cable, a spiral cable, a two-core cable, etc.).

[0068] In some embodiments, the test device 102 may be configured to measure one or more electrical parameters of an electrical component 106 coupled to the first test board 104a and the second test board 104b via the connection 105. The test device 102 may transmit electrical signals to both the first test board 104a and the second test board 104b via the connection 103 and receive electrical signals from both the first test board 104a and the second test board 104b, so that the test device 102 may measure the signals transmitted through the electrical component 106 and the signals reflected by the electrical component 106. For example, the test device 102 may be configured to measure one or more of the following of the electrical component 106, namely: scattering parameters (S-parameters), admittance parameters (Y-parameters), impedance parameters (Z-parameters), mixing parameters (H-parameters), inverse mixing parameters (G-parameters), and / or chain parameters (ABCD-parameters, also known as cascade parameters or transmission parameters). In some embodiments, the test device 102 may be, for example, a network analyzer such as a vector network analyzer (VNA).

[0069] In some embodiments, the test equipment 102 may be configured to acquire electrical measurements of the characterized electrical component 106 and to generate one or more files storing raw data describing the acquired electrical measurements. For example, the test equipment 102 may include a computing device (e.g., such as a computer program product) in conjunction with Fig.12As described), the computing device is configured to store the acquired electrical measurements in a computer memory. Alternatively or additionally, the test device 102 can be configured to transmit the acquired electrical measurements to a separate computing device (not shown) for storage and / or analysis.

[0070] In some embodiments, the electrical component 106 may be a cable assembly. Figure 2A A schematic cable assembly 200 is shown, which is configured for high-speed data transmission. The cable assembly 200 includes a first connector 202, which is coupled to a second connector 204 via a cable 206. When the cable assembly 200 is tested using the electronic test unit 100, the first connector 202 can be coupled to the first test board 104a and the second connector 204 can be coupled to the second test board 104b, so that the first connector 202 can correspond to the "first end" of the cable assembly 200 and the second connector 204 can correspond to the "second end" of the cable assembly 200.

[0071] In some embodiments, the cable 206 can be formed of a plurality of differential conductor pairs 208 that are terminated in the first connector 202 and the second connector 204 at either end of the cable assembly 200. The plurality of differential conductor pairs 208 can be arranged in the cable 206 in two rows that are stacked (e.g., a first group of the plurality of differential conductor pairs 208 can be arranged in a row in a first plane, and a second group of the plurality of differential conductor pairs 208 can be arranged in a row in a second plane that is parallel to the first plane).

[0072] In some embodiments, the cable assembly 200 can be configured to operate using differential signaling (transmitting information) techniques. Figure 2B 2 is a schematic circuit diagram 220 illustrating the principle of differential signaling. In differential signaling, an electrical signal is transmitted using two complementary electrical signals (known as a differential pair of signals). Figure 2B As shown, an input signal 222 may be provided to a differential pair of conductors having a first conductor 223a and a second conductor 223b. In the first conductor 223a, the input signal 222 may be inverted to form a signal 224. In the second conductor 223b, the input signal 222 may remain non-inverted to form a signal 226. At the output of the differential pair of conductors 223a and 223b, the signals 224 and 226 are recombined (e.g., by sensing a voltage difference between the signals 224 and 226), resulting in an output signal 228 having a greater amplitude than the input signal 222.

[0073] In some embodiments, when characterizing a cable assembly such as cable assembly 200, electronic test unit 100 can measure one or more electrical characteristics of cable assembly 200. For example, electronic test unit 100 can be configured to measure one or more of impedance, insertion loss, return loss, far-end crosstalk, near-end crosstalk, far-end component contribution integrated crosstalk noise, near-end component contribution integrated crosstalk noise, impedance mixed mode parameters, and / or delay difference of the cable assembly, such as in combination with Figures 5A to 10B As described in more detail. For each measurement, the electronic test unit 100 can generate a data series of measurement values, each measurement value being associated with a fixed measurement point within the measurement interval of the parameter. The generated data series can be graphically represented as a curve showing the measurement values ​​as a function of the parameter.

[0074] For example, when measuring the insertion loss of a cable assembly, the electronic test unit 100 can generate a data series of measurement values ​​of signal amplitude associated with fixed measurement points within a frequency interval (e.g., the measurement values ​​are discrete functions of frequency). As another example, when measuring the impedance of a cable assembly, the electronic test unit 100 can generate a data series of measurement values ​​of resistance in Ohms, which are associated with fixed measurement points in time (e.g., the measurement values ​​are discrete functions of time). It should be appreciated that the measurement values ​​can be discrete functions of other parameters (e.g., phase, amplitude, temperature, or any other suitable parameter) in addition to frequency or time, as aspects of the technology described herein are not limited in this regard.

[0075] In some embodiments, the electronic test unit 100 can be used to characterize a large number of cable assemblies (e.g., tens, hundreds, thousands, tens of thousands, etc.). The electronic test unit 100 can accordingly generate multiple data series of measurement values ​​associated with fixed measurement points within the measurement interval of the parameter. Graphically representing statistics associated with multiple data series can provide additional information compared to graphically representing multiple individual measurements side by side or overlapping.

[0076] In particular, graphically representing quantile statistics of multiple acquired data series may be helpful to manufacturers and / or customers. Figure 3 3 is a schematic diagram 300 that illustrates an exemplary interquartile range calculation according to some embodiments of the techniques described herein. For each measurement point, the measured values ​​obtained for all tested electrical components may range from a minimum value V0 to a maximum value V N. As an example, for a time point t=1.0 ns within the measurement interval, all measured values ​​of the signal amplitude can be arranged in sequence from the minimum value to the maximum value of the signal amplitude. Based on these arranged measured values, the median M can be calculated. The median is the value that separates the upper 50% of the measured values ​​from the lower 50% of the measured values. For a set of arranged measured values ​​with an odd number of measured values, M can be calculated by determining the middle value. For a set of arranged measured values ​​with an even number of measured values, M can be calculated by averaging the two middle values.

[0077] In some embodiments, after calculating the median M, the lower quantile value LQ and the upper quantile value UQ can be calculated using the arranged measurement values ​​and the median M. Figure 3 As shown in the example of , the lower quartile value LQ and the upper quartile value UQ can be the lower quartile and the upper quartile, respectively. The lower quartile value separates the lower 25% of the arranged measurements (as shown in area 302) from the upper 75% of the arranged measurements. The upper quartile separates the upper 25% of the arranged measurements (as shown in area 306) from the lower 75% of the arranged measurements. The central 50% of the arranged measurements (as shown in area 304) are located between the lower and upper quartile values. It should be clear that the lower quartile value LQ and the upper quartile value UQ can be quantiles different from the quartiles (e.g., one or more of the third quartile, the fourth quartile, the fifth quartile, the sixth quartile, the ninth quartile, the eighth quartile, the tenth quartile, the twelfth quartile, the sixteenth quartile, the percentile; and / or any other suitable quartile value), because the aspects of the technology described herein are not limited thereto.

[0078] return Figure 3 For example, the lower and upper quartile values ​​can be calculated according to one of a variety of methods. In a first method, the median M is used to divide the arranged measurements into two halves. If there are an odd number of data points in the arranged measurements, the median is not included in either half. If there are an even number of data points in the arranged measurements, the data can be divided exactly in half. The lower quartile value can then be calculated by determining the median of the lower half of the data (e.g., the half of the data between the minimum value V0 and the median M). The upper quartile value can then be calculated by determining the median of the upper half of the data (e.g., the half of the data between the median M and the maximum value V0). N The median is calculated by taking the half of the data between them.

[0079] In some embodiments, a second method may be used to calculate lower and upper quartile values. The median M is used to divide the arranged measurements into two halves. If there is an odd number of data points in the arranged measurements, the median is contained in both halves of the data. If there is an even number of data points in the arranged measurements, the data can be divided exactly in half. The lower quartile value can then be calculated by determining the median of the lower half of the data (e.g., the half of the data between the minimum value V0 and the median M). The upper quartile value can then be calculated by determining the upper half of the data (e.g., the half of the data between the median M and the maximum value V0). N The median is calculated by taking the half of the data between them.

[0080] In some embodiments, a third method may be used to calculate the lower and upper quartile values. The median M is used to divide the arranged measurements into two halves. If there are an even number of data points in the arranged measurements, the arranged measurements can be exactly divided into two halves. If there are an odd number of data points, the median M may or may not be included as a data point in each half of the data. If the median M is included in each half of the data, then:

[0081] 1. If there are (4n+1) data points, the lower quartile value LQ is 25% of the nth data value plus 75% of the (n+1)th data value, and the upper quartile value UQ is 75% of the (3n+1)th data value plus 25% of the (3n+2)th data value.

[0082] 2. If there are (4n+3) data points, the lower quartile value LQ is 75% of the (n+1)th data value plus 25% of the (n+2)th data value, and the upper quartile value UQ is 25% of the (3n+2)th data value plus 75% of the (3n+3)th data value.

[0083] In some embodiments, a fourth method may be used to calculate the lower and upper quartile values. N For a sorted data set, interpolation can be done between the data points to find the pth empirical quantile (if V0 is within the i / (n+1) quantile). The integer part of the number a is represented as The empirical quantile function is given as follows:

[0084]

[0085] in, and Using this framework, the calculation of the lower quartile value LQ, the median M, and the upper quartile value UQ can be performed by evaluating q(0.25), q(0.5), and q(0.75) respectively.

[0086] It should be understood that the techniques described herein are not limited to the calculation and visualization of quartile statistics, as aspects of the techniques described herein are not limited thereto. Indeed, the techniques described herein may be implemented using tertiles, quartiles, quintiles, sextiles, nonquantiles, octants, deciles, twelfth quantiles, sixteenth quantiles, percentiles; and / or any other suitable quantile values. As another example, Figure 4 4 is a schematic diagram 400 showing the calculation of quartile and decile statistics according to some embodiments of the techniques described herein. Calculating smaller quantile statistics can be helpful in determining the impact of outliers (outliners) on the distribution of electrical components, which in turn can provide useful information in determining how many products to discard if the outliers fail to meet quality standards.

[0087] Figure 4 Examples include the same median M, lower quantile value LQ, and upper quantile value UQ, as combined herein Figure 3 However, Figure 4 Examples of also include a lower decile value LD and an upper decile value UD. The lower decile value separates the lowest 10% of the arranged measurements (as shown in area 402) from the upper 90% of the arranged measurements. The upper decile value separates the upper 10% of the arranged measurements (as shown in area 410) from the lower 90% of the arranged measurements. Figure 3 As shown in the example of , the middle 50% of the measured values ​​of the arrangement (as shown in area 406) are located between the lower and upper quartile values. Additional areas 404 and 408 define areas containing the lowest 10% to the lowest 25% and the highest 25% to the highest 10% of the measured values ​​of the arrangement, respectively.

[0088] In some embodiments, and as combined Figure 1 As discussed in the examples of and 2, the produced electrical component can be a cable assembly comprising a plurality of differential pairs of conductors. The cable assembly can be configured to support high-speed data transmission (e.g., 10Gbps, 12Gbps, 24Gbps, or other speeds with a frequency in the GHz range). In order to characterize such cable assemblies or other electrical components configured to support high-speed data transmission, a plurality of electrical characteristics can be measured. For example, a test device can be utilized to measure the insertion loss, return loss, far-end crosstalk, near-end crosstalk, far-end component contribution integrated crosstalk noise, near-end component contribution integrated crosstalk noise, impedance mixed mode parameters, and / or delay difference of the cable assembly.

[0089] Figure 5A 5 is a graph 500a illustrating a representative measurement 502 of insertion loss according to some embodiments described herein. Insertion loss is a parameter that describes the degradation of a signal transmitted from a first end ("near end") of an electrical component to a second end ("far end") of the electrical component. To measure insertion loss in a cable assembly comprising a differential pair of conductors, a differential electrical signal may be provided as an input to the cable assembly and transmitted from the first end of the cable assembly to the second end of the cable assembly through the differential pair of conductors. The input differential electrical signal may include two electrical signals that are in differential mode (e.g., 180 degrees out of phase with each other), each of the two electrical signals being provided to a separate conductor in the differential pair of conductors.

[0090] In some embodiments, the test equipment can perform frequency-based spectroscopy to measure insertion loss, so that the measured signal amplitude can be a function of frequency. For example, during the insertion loss measurement, the frequency of the input differential electrical signal can be increased (or decreased) at a fixed frequency step size. In some embodiments, the frequency of the input differential electrical signal can be changed at a constant interval (1 MHz, 10 MHz, 20 MHz, and / or 25 MHz). The amplitude of the transmitted signal is then measured at the second side of the cable assembly for each frequency value.

[0091] Figure 5B 5 is a graph 500b showing quantile statistics of insertion loss measured in multiple cable assemblies according to multiple embodiments of the technology described herein. Graph 500b includes curve 510, which indicates the median of the measured amplitude. Shaded area 512 indicates the middle 50% of the measured amplitude data (e.g., from the lower quartile value to the upper quartile value). Shaded area 514 indicates the lower 25% of the measured amplitude data (e.g., from the lower quartile value to the minimum value) and the upper 25% of the measured amplitude data (e.g., from the upper quartile value to the maximum value).

[0092] Fig. 6A6 is a graph 600a showing a representative measurement 602 of return loss according to some embodiments of the technology described herein. Return loss is a parameter that describes how much energy is returned to the source as the main signal travels forward through the electrical component. Return loss is thus measured by providing an input differential electrical signal at a first end (the "near end") of the cable assembly and measuring the reflected signal at the same first end of the cable assembly. The input differential electrical signal may include two electrical signals that are in differential mode (e.g., 180 degrees out of phase with each other), each of the two electrical signals being provided to a separate conductor in a differential pair of conductors.

[0093] In some embodiments, the test equipment can perform frequency-based spectroscopy to measure the return loss, so that the amplitude of the measured reflected signal can be a function of frequency. For example, during the return loss measurement, the frequency of the input differential electrical signal can be increased (or decreased) at a fixed frequency step size. In some embodiments, the frequency of the input differential electrical signal is changed at a constant interval (1 MHz, 10 MHz, 20 MHz, and / or 25 MHz). The amplitude of the reflected signal is then measured at the first side of the cable assembly for each frequency value.

[0094] Figure 6B 6 is a graph 600b showing quantile statistics of return loss measured in multiple cable assemblies according to some embodiments of the technology described herein. Graph 600b includes curve 610, which represents the median of the measured amplitude. Shaded area 612 represents the middle 50% of the measured amplitude data (e.g., from the lower quartile value to the upper quartile value). Shaded area 614 represents the lower 25% of the measured amplitude data (e.g., from the lower quartile value to the minimum value) and the upper 25% of the measured amplitude data (e.g., from the upper quartile value to the maximum value).

[0095] Fig. 7A 700a, which shows a representative measurement 702 of far-end return loss according to some embodiments of the technology described herein. Far-end return loss is a parameter that describes how much energy is returned to a receiver as the main signal travels forward through the electrical components away from the receiver. Far-end return loss is thus measured by providing an input differential electrical signal at a second end (the "far end") of the cable assembly and measuring the reflected signal at the same second end of the cable assembly. The input differential electrical signal may include two electrical signals that are in differential mode (e.g., 180 degrees out of phase with each other), each of the two electrical signals being provided to a separate conductor in a differential pair of conductors.

[0096] In some embodiments, the test equipment can perform frequency-based spectroscopy to measure the far-end return loss, so that the amplitude of the measured reflected signal can be a function of frequency. For example, during the far-end return loss measurement, the frequency of the input differential electrical signal can be increased (or decreased) at a fixed frequency step size. In some embodiments, the frequency of the input differential electrical signal can be changed at a constant interval (1 MHz, 10 MHz, 20 MHz, and / or 25 MHz). The amplitude of the reflected signal is then measured at the second side of the cable assembly for each frequency value.

[0097] Figure 7B 7 is a graph 700b showing quantile statistics of far-end return loss measured in multiple cable assemblies according to some embodiments of the technology described herein. Graph 700b includes curve 710, which represents the median of the measured amplitude. Shaded area 712 represents the middle 50% of the measured amplitude data (e.g., from the lower quartile value to the upper quartile value). Shaded area 714 represents the lower 25% of the measured amplitude data (e.g., from the lower quartile to the minimum value) and the upper 25% of the measured amplitude data (e.g., from the upper quartile to the maximum value).

[0098] Fig. 8A 800a, which shows a representative measurement 802 of near-end crosstalk according to some embodiments of the technology described herein. Near-end crosstalk is a parameter that describes how much energy is radiated to adjacent non-energized differential pairs of conductors as an electrical signal travels forward through an energized differential pair of conductors. Near-end crosstalk is therefore measured in the following manner: by providing an input differential electrical signal at a first end ("near end") of a cable assembly and to a first differential pair of conductors. Near-end crosstalk is then measured at the first end of the cable assembly on a second differential pair of conductors positioned adjacent to the first differential pair of conductors (e.g., in a parallel row of differential pairs of conductors). The input differential electrical signal may include two electrical signals that are in differential mode (e.g., 180 degrees out of phase with each other), each of the two electrical signals being provided to a separate conductor in the first differential pair of conductors.

[0099] In some embodiments, the test equipment can perform frequency-based spectroscopy to measure near-end crosstalk, so that the measured signal amplitude can be a function of frequency. For example, during the near-end crosstalk measurement, the frequency of the input differential electrical signal can be increased (or decreased) with a fixed frequency step size. In some embodiments, the frequency of the input differential electrical signal can be changed at a constant interval (1MHz, 10MHz, 20MHz, and / or 25MHz). The amplitude of the radiated signal is then measured for each frequency value in the second non-energized differential pair of the conductor at the first side of the cable assembly.

[0100] Figure 8B 800b, which shows quantile statistics of near-end crosstalk measured in multiple cable assemblies according to some embodiments of the technology described herein. Graph 800b includes curve 810, which represents the median of the measured amplitude. Shaded area 812 represents the central 50% of the measured amplitude data (e.g., from the lower quartile value to the upper quartile value). Shaded area 814 represents the lower 25% of the measured amplitude data (e.g., from the lower quartile value to the minimum value) and the upper 25% of the measured amplitude data (e.g., from the upper quartile value to the maximum value).

[0101] Fig. 9A 900a, showing a representative measurement 902 of far-end crosstalk according to some embodiments of the technology described herein. Far-end crosstalk is a parameter that describes how much energy is radiated to adjacent non-energized differential pairs of conductors as an electrical signal travels forward through an energized differential pair of conductors. Far-end crosstalk is thus measured by providing an input differential electrical signal at a first end ("proximal end") of a cable assembly and to a first differential pair of conductors. The far-end crosstalk is then measured at a second end of the cable assembly on a second differential pair of conductors positioned adjacent to the first differential pair of conductors (e.g., in a parallel row of differential pairs of conductors). The input differential electrical signal may include two electrical signals that are in differential mode (e.g., 180 degrees out of phase with each other), each of the two electrical signals being provided to a separate conductor in the first differential pair of conductors.

[0102] In some embodiments, the test equipment can perform frequency-based spectroscopy to measure far-end crosstalk, so that the measured signal amplitude can be a function of frequency. For example, during the far-end crosstalk measurement, the frequency of the input differential electrical signal can be increased (or decreased) with a fixed frequency step size. In some embodiments, the frequency of the input differential electrical signal can be changed at a constant interval (1MHz, 10MHz, 20MHz, and / or 25MHz). The amplitude of the radiated signal is then measured for each frequency value in the second non-energized differential pair of conductors at the first side of the cable assembly.

[0103] Fig. 9B9 is a graph 900b showing quantile statistics of far-end crosstalk measured in multiple cable assemblies according to some embodiments of the technology described herein. Graph 900b includes curve 910, which represents the median of the measured amplitude. Shaded area 912 represents the central 50% of the measured amplitude data (e.g., from the lower quartile value to the upper quartile value). Shaded area 914 represents the lower 25% of the measured amplitude data (e.g., from the lower quartile value to the minimum value) and the upper 25% of the measured amplitude data (e.g., from the upper quartile value to the maximum value).

[0104] Fig. 10A 1000a, which shows a representative measurement 1002 of impedance according to some embodiments of the technology described herein. Impedance is a parameter that describes the effective resistance of a cable assembly and provides a measure of the imbalance in the electromagnetic field coupling around a differential pair of conductors. Impedance can be measured using time domain reflectometry. Thus, impedance can be measured by providing an input differential electrical signal at a first end ("near end") of the cable assembly. Impedance is then measured by measuring a reflected signal received at the first end of the cable assembly on the same differential pair of conductors as used to transmit the input differential electrical signal. The input differential electrical signal can include two electrical signals that are in differential mode (e.g., 180 degrees out of phase with each other), each of the two electrical signals being provided to a separate conductor in a first differential pair of conductors. To measure impedance, the input differential electrical signal can have a fixed frequency that is equal to the Nyquist frequency of the data rate associated with the electrical component when the electrical component is to operate.

[0105] Fig. 10B 1 is a graph 1000b showing quantile statistics of impedance measured in multiple cable assemblies according to some embodiments of the technology described herein. Graph 1000b includes curve 1010, which represents the median of the measured amplitude. Shaded area 1012 represents the central 50% of the measured amplitude data (e.g., from the lower quartile value to the upper quartile value). Shaded area 1014 represents the lower 25% of the measured amplitude data (e.g., from the lower quartile value to the minimum value) and the upper 25% of the measured amplitude data (e.g., from the upper quartile value to the maximum value).

[0106] In some embodiments, in addition to the electrical measurements described above, the test equipment may alternatively or additionally measure mixed mode parameters (not shown). The mixed mode parameters describe the relationship between the input differential energy and the output common mode energy, which may increase if the two electrical signals that form the differential electrical signal are no longer 180 degrees out of phase with each other when measured (e.g., due to the difference in the electrical lengths of the two conductors of the differential pair). Therefore, in order to measure the mixed mode parameters of the cable assembly, the test equipment may provide an input differential electrical signal at the first end ("near end") of the cable assembly. The mixed mode parameters are then measured at the second end of the cable assembly by measuring the common mode signal. The input differential electrical signal may include two electrical signals that are in differential mode (e.g., 180 degrees out of phase with each other).

[0107] In some embodiments, the test equipment may alternatively or additionally measure a delay difference parameter (not shown). The delay difference parameter describes whether the two conductors of a differential pair of conductors have the same physical and / or electrical length, so that the two transmitted signals are still synchronized during the transmission process. In some embodiments, the delay difference parameter can be measured in the time domain using time domain reflectometry (TDR) or using time domain transmission (TDT). In some embodiments, the delay difference parameter can be measured in the frequency domain.

[0108] Fig.11 1 is a flow chart of a process 1100 for performing quality control in the production of a plurality of electrical components according to some embodiments of the techniques described herein. The process 1100 may be performed using any suitable computing device. For example, in some embodiments, the process 1100 may be performed by a computing device that is included in a test device (e.g., the test device 102) that is used to measure electrical characteristics of the electrical components. In some embodiments, the process 1100 may be performed by a computing device that is communicatively coupled to the test device locally (e.g., via a local access network or through a direct connection to the test device) or remotely (e.g., via a cloud computing environment).

[0109] In some embodiments, process 1100 may begin at act 1102, where electrical characteristic data may be obtained by measuring electrical responses of a plurality of electrical components using a test device. The test device may be configured to generate an electrical excitation signal, provide the electrical excitation signal to the electrical component under test, and measure a reflected or transmitted signal output by the electrical component.

[0110] In some embodiments, the electrical component can be a cable assembly that includes a differential pair of conductors. The test equipment can therefore be configured to generate a differential electrical signal that is provided as an input to the cable assembly under test. In some embodiments, the test equipment can be configured to measure one of the impedance, insertion loss, return loss, integrated return loss, far-end crosstalk, near-end crosstalk, far-end component contribution to integrated crosstalk noise, near-end component contribution to integrated crosstalk noise, mixed mode parameters, noise suppression, and / or delay difference of the cable assembly. These electrical parameters can be used in conjunction with the present invention. Figures 5A to 10B The described technique is measured.

[0111] In some embodiments, the measured electrical response of the electrical component can be a discrete function of a parameter (e.g., frequency, time, phase, temperature, etc.), the discrete function comprising a set of data points, the set of data points comprising pairs of measurement values ​​and parameter values. In some embodiments, the pairs of measurement values ​​and parameter values ​​include pairs of measurement signal amplitude values ​​and time values, pairs of measurement signal amplitude values ​​and frequency values, and / or pairs of measurement impedance values ​​and time values.

[0112] In some embodiments, obtaining the electrical signature data further comprises selecting a subset of the measured electrical signature data. For example, the subset of the measured electrical signature data may be selected based on: a serial number associated with the plurality of electrical components, a production date of the plurality of electrical components, a batch number associated with the plurality of electrical components, a machine used to produce the plurality of electrical components, a supplier of one or more components used to assemble the plurality of electrical components, an operator who produced the plurality of electrical components, a customer name, a tester, a test date, a test device, and / or a production shift associated with a production time of the plurality of electrical components.

[0113] In some embodiments, the electrical signature data can be stored in a suitable data structure and / or file format for subsequent processing. For example, the electrical signature data can be stored as a comma separated value (.csv) file, an Excel (.xls or .xlsx) file, and / or a Snapshot (.snp) file.

[0114] In some embodiments, after act 1102, process 1100 may proceed to act 1104, in which at least one processor of the computing device processes the electrical feature data to determine quantile statistics for the electrical feature data. The at least one processor of the computing device may determine the quantile statistics for the electrical feature data by arranging the measured values ​​from a minimum value to a maximum value for each parameter value (e.g., each frequency step, each time point) to obtain arranged measurement data. Using the arranged measurement values, the at least one processor may perform processing to determine the quantile statistics for the electrical feature data in combination with the arrangement of the measured values. Figure 3 and 4The quantile statistics described. For example, at least one processor may calculate the median, quartiles, deciles, or any other suitable quantile of the measured values ​​as a function of the parameter value.

[0115] In some embodiments, at least one processor may further calculate additional statistics related to the measured values. For example, at least one processor may calculate maximum and / or minimum limits for the measured values ​​for subsequent display next to the quantile statistics in the following act 1106 (e.g., the limits may be displayed as horizontal or vertical lines next to the quantile statistics). As another example, at least one processor may calculate a process capability index (CPK) based on the measured values ​​and a provided lower specification limit (LSL) and a provided upper specification limit (USL) using any suitable methodology.

[0116] In some embodiments, after act 1104, process 1100 may proceed to act 1106, in which at least one processor of the computing device may generate a graphical user interface that includes visualization information of the determined quantile statistics. Generating a graphical user interface may include generating a graph that includes one or more shaded areas or lines representing the determined quantile statistics from act 1104. For example, if at least one processor determines a median statistic, the graphical user interface may be generated in the following manner, namely by generating a line representing the determined median statistic. As another example, if at least one processor determines quantile statistics other than the median statistic, the graphical user interface may be generated in the following manner, namely by generating one or more shaded areas representing the determined quantile statistics. In some embodiments, a first color may be assigned to a first shaded area representing a first quantile, and a second different color may be assigned to a second shaded area representing a second quantile.

[0117] In some embodiments, generating a graphical user interface containing visualization information of determined quantile statistics may include generating visualization information of median statistics and quartile statistics. For example, the visualization information may include a line representing the determined median statistics, a first shaded area representing the area between the lower quartile and the upper quartile (e.g., the central 50% of the electrical characteristic data), and a second shaded area representing the area between the lower quartile and the minimum value of the electrical characteristic data and the upper quartile and the maximum value of the electrical characteristic data (e.g., the lower 25% and the upper 25% of the electrical characteristic data). A first color may be assigned to the first shaded area representing the first quartile, and a second different color may be assigned to the second shaded area representing the second quartile.

[0118] In some embodiments, after act 1106, process 1100 may proceed to act 1108, in which a display device is used to display the generated graphical user interface. The display device may be any suitable electronic display, including but not limited to a computer monitor, a desktop screen, a mobile display (e.g., a mobile display of a mobile device including a tablet computer), and / or a smart phone display. In some embodiments, the displayed graphical user interface may be configured to be scalable so that a user can enlarge or reduce the size of a portion of the displayed visualization information of the quantile statistics.

[0119] In some embodiments, after act 1108, process 1100 may optionally proceed to act 1110, where a quality control action to be performed may be identified based on information in a graphical user interface containing visualization information of the determined quantile statistics. In some embodiments, identification of the quality control action may include identification of a maintenance action for maintaining or repairing a tool used in the production of a plurality of electrical components. For example, a measured impedance may migrate over time as a hot bar used to perform soldering degrades, and the migrated impedance may be used to determine when to perform maintenance on the hot bar.

[0120] As another example, in some embodiments, identifying a quality control action can include identifying a maintenance action for maintaining or repairing a test device. The measured electrical characteristics can drift over time because the connectors used to couple the test device to the electrical component wear over time. The drift of the electrical characteristics can be used to determine when to replace an inaccurate test device so that the test data provided to the customer accurately reflects the quality of the produced electrical components.

[0121] In some embodiments, identifying a quality control action includes identifying a preferred manufacturing process for producing a plurality of electrical components. In some embodiments, identifying a quality control action includes identifying a preferred supplier of parts used in producing a plurality of electrical components. For example, a first batch of electrical components may be produced using a first production technology or parts obtained from a first supplier, while a second batch of electrical components may be produced using a second production technology or parts obtained from a second supplier. Quantifying and visualizing quantile statistics describing the electrical characteristics of the first and second batches can help identify differences in the quality of the components produced due to different production technologies or suppliers of parts. By identifying differences in components of the first and second batches of finished products, informed decisions can be made regarding implementing a particular production technology or supplier from which to purchase parts.

[0122] In some embodiments, identifying a quality control action includes identifying feedback to be provided to a supplier of parts used in the production of a plurality of electrical components. For example, when electrical components are produced using cable reels, the electrical characteristics of the cable may vary along its length due to production variations. Electrical components produced using cable from one end of the cable may have different electrical characteristics than electrical components produced using cable from the other end of the cable, and these differences may be identified by visualizing quantile statistics describing the electrical characteristics of these different groups of electrical components. By identifying such variations in electrical behavior, feedback may be provided to the cable supplier to mitigate the varying characteristics of the cable.

[0123] In some embodiments, after act 1110, process 1100 may optionally proceed to act 1112, in which the identified quality control actions may be performed. For example, maintenance actions may be performed to maintain and / or repair production tools or test equipment. Alternatively or additionally, selection of a production process and / or selection of an external supplier of parts may be completed. Alternatively or additionally, feedback may be provided to the external supplier to improve the quality of purchased parts incorporated into the electrical component.

[0124] Fig.12 is a diagram of an illustrative computer system on which the embodiments described herein may be implemented. Fig.12 1200 that can be used in conjunction with any embodiment of the disclosure provided herein. In some embodiments, any of the processes described herein can be implemented on and / or using computer system 1200. Computer system 1200 may include one or more processors 1210 and one or more finished products including perceptible (e.g., non-transitory) computer-readable storage media (e.g., memory 1220 and one or more non-volatile storage media 1230). Processor 1210 can control writing data to memory 1220 and non-volatile storage media 1230 and reading data from memory 1220 and non-volatile storage media 1230 in any suitable manner. In order to perform any of the functions described herein, processor 1210 can execute one or more processor-executable instructions stored in one or more non-transitory computer-readable storage media (e.g., memory 1220), which can be used as a non-transitory computer-readable storage medium for storing processor-executable instructions for execution by processor 1210.

[0125] After having thus described the multiple aspects and embodiments of the technology proposed in this disclosure, it will be clear that various changes, adjustments and improvements are easily implemented for those skilled in the art. Such changes, adjustments and improvements will be within the spirit and scope of the technology disclosed herein. For example, it will be easy for those skilled in the art to think of various other measures and / or structures in order to perform functions and / or obtain data and / or one or more advantages described herein, and each of such changes and / or modifications will be considered to be within the scope of the embodiments described herein. It will be clear to those skilled in the art or to be able to ascertain (using more than one routine test) multiple equivalents for the specific embodiments described herein. Therefore, it should be understood that the aforementioned embodiments are only given by way of example, and within the scope of the appended claims and their equivalents, embodiments of the present invention can be implemented in a manner different from that specifically described. In addition, any combination of two or more features, systems, articles, materials, kits and / or methods described herein (if such features, systems, articles, materials, kits, and / or methods are not mutually inconsistent) is included within the scope of this disclosure.

[0126] The above-mentioned embodiments can be implemented in any number of ways. One or more aspects and embodiments of the present disclosure related to the execution of a process or method can utilize program instructions executable by a device (e.g., a computer, a processor, or other device) to execute or control the execution process or method. In this aspect, various different inventive contents can be implemented as a computer-readable storage medium (or multiple computer-readable storage media) (e.g., a computer memory, one or more floppy disks, compact disks, optical disks, tapes, flash memory, circuit configurations in the form of Field Programmable Gate Arrays or other semiconductor devices, or other perceptible computer storage media), the computer-readable storage medium is encoded with one or more programs, and the one or more programs are executed when executed on one or more computers or other processors to implement one or more methods in the various embodiments described above. The computer-readable medium or media can be transportable, so that the program stored thereon can be loaded onto one or more different computers or other processors to implement various aspects in the aspects described above. In some embodiments, the computer-readable medium can be a perceptible (e.g., non-transient) computer-readable medium. In some embodiments, the computer-readable medium can include a persistent memory.

[0127] The term "program" or "software" is used herein in a general sense to refer to any type of computer code or computer executable instruction set that can be used to program a computer or other processor to implement the various aspects described above. Additionally, it should be clear that according to one aspect, one or more computer programs that, when executed, perform the methods of the present disclosure need not reside on a single computer or processor, but can be distributed in a modular manner among multiple different computers or processors to perform various aspects of the present disclosure.

[0128] Computer executable instructions may be in various forms, such as program modules, that are executed by one or more computers or other devices. Generally, program modules include routines, programs, objects, components, data structures, etc., which perform specific tasks or implement specific abstract data types. Generally, the functionality of program modules may be combined or distributed as desired in various embodiments.

[0129] In addition, the data structure can be stored in a computer-readable medium in any suitable form. To simplify the description, the data structure can be shown to have fields that are related by their position in the data structure. This type of relationship can also have a position in a computer-readable medium by assigning storage for the field, which transmits the relationship between the fields. However, any suitable mechanism can be used to establish the relationship between the information in the fields of the data structure, including by using pointers, tags or other mechanisms that establish relationships between data elements.

[0130] When implemented in software, the software code can be executed on any suitable processor or collection of processors, whether located in a single computer or distributed among multiple computers.

[0131] Furthermore, it should be understood that the computer can be implemented in any of a variety of forms, such as a rack-mounted computer, a desktop computer, a laptop computer, or a tablet computer, as non-limiting examples. Additionally, the computer can be implemented in devices not generally referred to as computers but with suitable processing capabilities, including personal digital assistants (PDAs), smart phones, or any other suitable portable or fixed electronic devices.

[0132] Likewise, a computer may have one or more input and output devices. These devices may be used, etc., to present a user interface. Examples of output devices that may be used to provide a user interface include a printer or display screen for visual display output and a speaker or other sound emitting device for audible display output. Examples of input devices that may be used for a user interface include a keyboard, and a pointer device, such as a mouse, a touch pad, and a digitizing panel. As another example, a computer may receive input information by voice recognition or in other audible formats.

[0133] Such computers may be interconnected in any suitable form via one or more networks, including local area networks, wide area networks such as enterprise networks, and intelligent networks (IN) or the Internet. Such networks may be based on any suitable technology and may operate according to any suitable protocol and may include wireless networks, wired networks, or fiber optic networks.

[0134] In addition, as described, some aspects can be implemented as one or more methods. The actions performed as part of the method can be ordered in any suitable manner. Therefore, such embodiments can be constructed in which the actions can be performed in a different order than shown, which can include performing some actions simultaneously (even if shown as sequential actions in the illustrative embodiment).

[0135] All definitions, as defined and used herein, should be understood to control over dictionary definitions, definitions in incorporated referenced documents, and / or ordinary meanings of the defined matters.

[0136] As used herein, the indefinite articles "a" or "an" (unless clearly indicated to the contrary) in the specification and claims should be understood to mean "at least one".

[0137] The phrase "and / or" as used herein in the specification and claims should be understood to mean "either or both" of the connected elements, i.e., elements that appear connected in some cases and separately in other cases. Multiple elements listed with "and / or" should be understood in the same way, i.e., "one or more" of the connected elements. Other elements may optionally appear, rather than elements specifically identified by the "and / or" clause, whether or not related to those specifically identified elements. Thus, as a non-limiting example, reference to "A and / or B" (when used in conjunction with open language such as "comprising") refers to only A (optionally including elements other than B) in one embodiment; to only B (optionally including elements other than A) in another embodiment; to both A and B (optionally including other elements) in another embodiment, etc.

[0138] As used herein in the specification and claims, the phrase "at least one" (referring to a list of one or more elements) should be understood to mean at least one element selected from any one or more elements in the list of elements, but not necessarily included in each and every element specifically listed in the list of elements, and does not exclude any combination of elements in the list of elements. This definition also allows for elements to optionally appear other than the elements specifically identified in the list of elements to which the phrase "at least one" refers, whether or not related to the specifically identified elements. Thus, as a non-limiting example, "at least one of A and B" (or equivalently "at least one of A or B", or equivalently "at least one of A and / or B") may refer to at least one A (optionally including more than one) without B appearing (and optionally including elements other than B) in one embodiment; to at least one B (optionally including more than one) without A appearing (and optionally including elements other than A) in another embodiment; to at least one A (optionally including more than one) and at least one B (optionally including more than one) (and optionally including other elements) in another embodiment, etc.

[0139] In the claims and the above-mentioned signature, all transitional phrases such as "comprises", "comprising", "carrying", "having", "involving", "maintaining", "consisting of", etc. shall be understood as open-ended, i.e., meaning inclusive but not limited. Only the transitional phrases "consisting of" and "consisting essentially of" shall be closed or semi-closed transitional phrases, respectively.

[0140] The terms "substantially" and "approximately" may be used to mean within ±20% of a target value in some embodiments, within ±10% of a target value in some embodiments, within ±5% of a target value in some embodiments, and within ±2% of a target value in some embodiments. The terms "substantially" and "approximately" may include a target value.

Claims

1. A method for performing quality control in the production of a plurality of electrical components, the method comprising: obtaining electrical characteristic data by measuring electrical responses of the plurality of electrical components using a test device; processing the electrical characteristic data with at least one processor to determine quantile statistics for the electrical characteristic data; generating, with at least one processor, a graphical user interface including visualization of the determined quantile statistics; as well as The generated graphical user interface is displayed using a display device.

2. The method according to claim 1, further comprising: A quality control action to be performed is identified based on information in a graphical user interface including visualization of the determined quantile statistics.

3. The method according to claim 2, further comprising: The identified quality control actions are performed.

4. The method according to claim 2, characterized in that: Identifying quality control actions includes identifying maintenance actions to perform on a tool used in producing the plurality of electrical components.

5. The method according to claim 2, characterized in that: Identifying the quality control actions includes identifying a selection of a manufacturing process for producing the plurality of electrical components.

6. The method according to claim 2, characterized in that Identifying the quality control action includes identifying a maintenance action for performing maintenance on the test equipment.

7. The method according to claim 2, characterized in that: Identifying quality control actions includes identifying selections of suppliers of parts used in producing the plurality of electrical components.

8. The method according to claim 2, characterized in that: Identifying quality control actions includes identifying feedback to provide to suppliers of parts used in producing the plurality of electrical components.

9. The method according to claim 1, characterized in that: Measuring an electrical response of an electrical component of the plurality of electrical components includes: generating an electrical excitation signal using a test device; providing an electrical excitation signal as an input to the electrical component; and The reflected or transmitted signal output by an electrical component is measured using test equipment.

10. The method according to claim 1, characterized in that Measuring an electrical response of an electrical component of the plurality of electrical components includes measuring the electrical response of a discrete function including a parameter, the discrete function including a set of data points including pairs of measurement values ​​and parameter values.

11. The method according to claim 10, characterized in that The pairs of measured values ​​and parameter values ​​include pairs of measured signal amplitude values ​​and time values, pairs of measured signal amplitude values ​​and frequency values, and / or pairs of measured impedance values ​​and time values.

12. The method according to claim 10, characterized in that Determining quantile statistics for the electrical characteristic data includes calculating, for each parameter value of the measured electrical response, a median of the measured values ​​associated with the same parameter value.

13. The method according to claim 12, characterized in that Determining a quantile statistic for the electrical characteristic data includes calculating, for each parameter value of the measured electrical response, a quartile of the measured values ​​associated with the same parameter value.

14. The method according to claim 12, characterized in that Determining quantile statistics for the electrical characteristic data includes calculating, for each parameter value of the measured electrical response, a sixteenth quantile of the measured values ​​associated with the same parameter value.

15. The method according to claim 1, characterized in that Generating the graphical user interface includes generating a graph including one or more shaded areas or lines representing the determined quantile statistics.

16. The method according to claim 15, characterized in that: Determining quantile statistics for the electrical characteristic data includes determining a median statistic; and Generating the graph includes generating a line representing the determined median statistic.

17. The method according to claim 15, characterized in that: Generating the graph includes assigning a first color to display a first shaded area representing a first quantile, and assigning a second color to display a second shaded area representing a second quantile, the first color being different from the second color.

18. The method according to claim 1, characterized in that: The electrical components of the plurality of electrical components include a cable assembly including one or more differential pairs of conductors; and Obtaining electrical characteristic data includes measuring one of the following: impedance, insertion loss, return loss, far-end crosstalk, near-end crosstalk, far-end component contribution integrated crosstalk noise, near-end component contribution integrated crosstalk noise, impedance mixed mode parameters, and / or delay difference of the cable assembly using test equipment.

19. The method according to claim 18, characterized in that Obtaining electrical characterization data includes measuring the impedance of the cable assembly by performing time domain reflectometry.

20. The method according to claim 19, characterized in that Performing Time Domain Reflectometry involves: transmitting a differential electrical signal from a first side of the cable assembly to a second side of the cable assembly through a differential pair of conductors of the cable assembly, the differential electrical signal comprising a step stimulus having a rise time equal to a Nyquist frequency of the data rate; and A reflected electrical signal is measured as a function of time at a first side of the cable assembly.

21. The method according to claim 18, characterized in that Obtaining electrical characterization data involves measuring the insertion loss of the cable assembly by: transmitting a differential electrical signal from a first side of the cable assembly to a second side of the cable assembly through a differential pair of conductors of the cable assembly, the differential electrical signal having a frequency that varies with time; as well as The transmitted electrical signal is measured as a function of frequency at a second side of the cable assembly.

22. The method according to claim 18, characterized in that Obtaining electrical characterization data involves measuring the return loss of the cable assembly by: transmitting a differential electrical signal from a first side of the cable assembly to a second side of the cable assembly through a differential pair of conductors of the cable assembly, the differential electrical signal having a frequency that varies with time; as well as A reflected electrical signal is measured as a function of frequency at a first side of the cable assembly.

23. The method according to claim 18, characterized in that Obtaining electrical characterization data includes measuring the far-end crosstalk of the cable assembly by: transmitting a differential electrical signal from a first side of the cable assembly to a second side of the cable assembly through a first differential pair of conductors of the cable assembly, the differential electrical signal having a frequency that varies over time, the first differential pair of conductors being adjacent to a second differential pair of conductors; as well as The transmitted electrical signal is measured as a function of frequency at a second side of the cable assembly and from a second differential pair of conductors.

24. The method according to claim 18, characterized in that Obtaining electrical characterization data includes measuring the near-end crosstalk of the cable assembly by: transmitting a differential electrical signal from a first side of the cable assembly to a second side of the cable assembly through a first differential pair of conductors of the cable assembly, the differential electrical signal having a frequency that varies over time, and the first differential pair of conductors being adjacent to a second differential pair of conductors; as well as A transmitted electrical signal is measured as a function of frequency at the first side of the cable assembly and from the second differential pair of conductors.

25. The method according to claim 18, characterized in that Obtaining electrical characterization data includes measuring mixed-mode parameters of the cable assembly by: transmitting a differential electrical signal from a first side of the cable assembly to a second side of the cable assembly through a differential pair of conductors of the cable assembly, the differential electrical signal having a frequency that varies with time; as well as The transmitted common mode electrical signal is measured as a function of frequency at a second side of the cable assembly.

26. The method according to claim 18, characterized in that Obtaining electrical characterization data includes measuring delay difference by performing inter-pair delay difference measurements as a function of time or as a function of frequency.

27. The method according to claim 1, characterized in that Obtaining the electrical signature data includes selecting a subset of the electrical signature data based on serial numbers associated with the plurality of electrical components, production dates of the plurality of electrical components, batch numbers associated with the plurality of electrical components, and / or production shifts associated with production times of the plurality of electrical components.

28. A system for performing quality control in the production of a plurality of electrical components, the system comprising: a test device configured to measure electrical responses of a plurality of electrical components; Display device; as well as at least one processor configured to execute: obtaining electrical characteristic data by causing the test device to measure electrical responses of the plurality of electrical components; processing the electrical characteristic data to determine quantile statistics for the electrical characteristic data; generating a graphical user interface including visualization of the determined quantile statistics; as well as The display device is caused to display the generated graphical user interface.

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