A method and device for identifying a rift valley, an electronic device, and a storage medium

Abstract

The application discloses a rift valley identification method and device, electronic equipment and storage medium. The diffraction wave imaging is performed on a to-be-identified stratum to obtain a diffraction wave imaging result; whether a vertical section exists in the diffraction wave imaging result is judged; if it is determined that at least one vertical section exists in the diffraction wave imaging result, the position of the rift valley is determined according to the position of the vertical section. The rift valley spatial distribution position possibly existing in the deep metamorphic rock basement is determined by comparing and analyzing the diffraction wave imaging result and the reflection wave imaging result. The problem that the present technology cannot distinguish the rift valley and the multiple wave "false image" in the layered reflection of the deep metamorphic rock basement stratum is overcome, and the accuracy of the rift valley judgment in the deep metamorphic rock basement stratum is improved.

Description

TECHNICAL FIELD

[0001] The present application relates to the field of geophysical technology, and in particular to a rift identification method and device, an electronic device, and a storage medium. BACKGROUND

[0002] Seismic exploration technology is an important channel for obtaining information about the underground distribution of oil and gas. However, for ultra-deep seismic exploration, the problems of effective signal identification and enhancement and multiple wave suppression are faced. Multiple waves are common interference waves in seismic exploration. For example, a metamorphic rock basement, the inside of the basement appears as a chaotic reflection feature on a seismic profile. Due to the "accumulation" effect of multiple waves produced by the shallow stratum, multiple sets of layered seismic reflection events appear in the originally chaotic basement. If there is an early rift in the basement, there will also be a sedimentary stratum in the local depression area of the rift, and therefore layered reflections will also appear on the seismic profile. The existing seismic exploration technology cannot effectively identify whether the layered reflections in the basement are due to multiple waves or the existence of a rift. SUMMARY

[0003] The present application provides a rift identification method, device, electronic device, and storage medium to accurately identify a basement rift.

[0004] In a first aspect, an embodiment of the present application provides a rift identification method, which includes:

[0005] Performing diffraction wave imaging on the stratum to be identified to obtain a diffraction wave imaging result;

[0006] Determining whether a vertical discontinuity exists in the diffraction wave imaging result;

[0007] If it is determined that at least one vertical discontinuity exists in the diffraction wave imaging result, determining the position of the rift according to the position of the vertical discontinuity.

[0008] In a second aspect, an embodiment of the present application also provides a rift identification device, which includes:

[0009] A diffraction wave imaging result determination module configured to perform diffraction wave imaging on the stratum to be identified to obtain a diffraction wave imaging result;

[0010] A vertical discontinuity determination module configured to determine whether a vertical discontinuity exists in the diffraction wave imaging result;

[0011] A rift position determination module configured to, if it is determined that at least one vertical discontinuity exists in the diffraction wave imaging result, determine the position of the rift according to the position of the vertical discontinuity.

[0012] In a third aspect, an electronic device is provided, which includes a memory, a processor, and a computer program stored in the memory and executable on the processor, and the processor implements the rift valley identification method according to any of the embodiments of the present application when executing the program.

[0013] In a fourth aspect, a storage medium storing computer executable instructions is provided, and the computer executable instructions are used to execute the rift valley identification method according to any of the embodiments of the present application when executed by a computer processor.

[0014] The technical scheme of the embodiments of the present application determines the spatial distribution position of the rift valley possibly existing in the deep metamorphic rock basement by comparing and analyzing the diffraction wave imaging result and the reflection wave imaging result. The problem that the current technology cannot distinguish the "false image" of the rift valley and the multiple wave in the layered reflection of the deep metamorphic rock basement stratum is overcome, and the accuracy of the judgment of the rift valley in the deep metamorphic rock basement stratum is improved.

[0015] It should be understood that the content described in this part is not intended to identify the key or important features of the embodiments of the present application, nor is it used to limit the scope of the present application. Other features of the present application will become apparent from the following description. BRIEF DESCRIPTION OF DRAWINGS

[0016] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed in the embodiment description will be briefly introduced below. Obviously, the drawings in the following description are only some embodiments of the present application, and other drawings can also be obtained by those skilled in the art without creative labor.

[0017] Figure 1 A flow chart of a rift valley identification method provided for the first embodiment of the present application;

[0018] Figure 2 A diffraction wave imaging profile provided for the first embodiment of the present application;

[0019] Figure 3 A two-dimensional velocity model provided for the first embodiment of the present application;

[0020] Figure 4 A diffraction wave seismic imaging diagram provided for the first embodiment of the present application;

[0021] Figure 5 A reflection wave seismic imaging diagram provided for the first embodiment of the present application;

[0022] Figure 6 A structural schematic diagram of a rift valley identification device provided for the second embodiment of the present application;

[0023] Figure 7A structural schematic diagram of an electronic device according to an embodiment of the present application. DETAILED DESCRIPTION

[0024] In order to make the personnel in the technical field better understand the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below in combination with the drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative efforts should fall within the protection scope of the present application.

[0025] It should be noted that the terms "first", "second", and the like in the specification and claims of the present application and the above-described drawings are used to distinguish similar objects, and do not necessarily indicate a specific order or a chronological sequence. It should be understood that the data thus used can be interchanged under appropriate circumstances, so that the embodiments of the present application described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "include" and "have" and any variations thereof are intended to cover non-exclusive inclusion, for example, a process, method, system, product, or device including a series of steps or units does not necessarily have to be limited to those steps or units clearly listed, but can include other steps or units not clearly listed or inherent to the process, method, product, or device.

[0026] Embodiment one

[0027] Figure 1 A flowchart of a rift valley identification method is provided for the first embodiment of the present application. The present embodiment can be applicable to the case of judging the position of a rift valley in a metamorphic rock base stratum. The method can be executed by a rift valley identification device, which can be realized in the form of hardware and / or software, and can be configured in any electronic device with network communication function.

[0028] As shown in Figure 1 , the method comprises:

[0029] S110, diffracted wave imaging is performed on the stratum to be identified to obtain a diffracted wave imaging result.

[0030] The stratum to be identified can be a stratum in which the real position of a rift valley needs to be judged. The stratum to be identified can be a metamorphic rock base stratum. The base inside appears as a chaotic reflection feature on a seismic profile. Due to the "accumulation" effect of multiple waves generated by the shallow stratum, multiple sets of layered seismic reflection events appear in the originally chaotic base. If there is an early rift valley in the base stratum, there will also be a sedimentary stratum in the local depression area of the rift valley, so layered reflection will appear on the seismic profile.

[0031] The diffracted wave can be a wave caused by a severe change in stratum encountered by a seismic wave during propagation, such as a fault point, a fault edge, a stratum pinch-out point, a non-uniform body, an intrusion body, and an edge of an underground reef. The imaging form of the diffracted wave is a horizontal event, and the event can be a line of the same phase (a wave peak or a wave trough) on a seismic record. The horizontal event can be a line of the same horizontal phase on a seismic record.

[0032] Further, the imaging by using the diffracted wave is because the diffracted wave imaging is sensitive to the boundary points in the stratum and rift profile, and thus can better display the boundary points of the stratum and rift profile.

[0033] The diffracted wave imaging method is used to perform diffracted wave imaging on the collected diffracted wave of the to-be-identified stratum, so as to obtain a diffracted wave imaging result. The diffracted wave imaging result can be a three-dimensional seismic data body. The diffracted wave imaging method can be a multiplication imaging condition method and an angle domain picking method, and the method of the diffracted wave imaging is not limited in the application.

[0034] Further, Figure 2 A profile graph of diffracted wave imaging is provided, as shown in Figure 2 As can be seen from the profile graph of the diffracted wave imaging, in addition to the layered reflection, three vertical sections exist in the range of 2 km-6 km.

[0035] Optionally, the stratum depth of the to-be-identified stratum is greater than or equal to 8000 meters and less than or equal to 10000 meters.

[0036] Further, the depth of the to-be-identified stratum is between 8000-10000 meters, because the wave field information of the ultra-deep stratum is complex, and when performing traditional seismic exploration, problems such as complex wave field analysis can occur, so it is difficult to realize the identification and separation of the wave field of the ultra-deep stratum, and the effect is poor, and the method of the application can overcome this problem.

[0037] Illustratively, a to-be-identified stratum model can be established to verify that the method of the application can realize the identification of the real position of the rift. As shown in Figure 3As shown, the model is a stratum model in the vertical direction of the rift opening direction, which is composed of a horizontal layer, a rift depression and an isolated diffraction point. The model has a high-speed layer in the middle part and a horizontal interface at the bottom. The interface inflection point represents the boundary point of the rift in the stratum. From the lateral direction (perpendicular to the rift opening direction), the rift is in the shape of an inverted trapezoid. The model is 8 km long in the lateral direction and 4 km deep in the vertical direction. The grid trace interval in the lateral and vertical directions is 5 m. Seismic data is generated by finite difference forward modeling. The shot points and receiving points are uniformly distributed on the surface, and a total of 401 shots and 801 receiving channels are simulated. Among them, the shot point can be the place where the seismic wave is excited in the field, and the receiving point is the place where the seismic wave is received. A shot point is set every 20 m, and a receiving point is set every 10 m. The principle of finite difference forward modeling is to replace the derivatives of the wave field function with respect to space and time in the wave equation with the corresponding differences.

[0038] Optionally, the stratum to be identified is subjected to diffraction wave imaging to obtain a diffraction wave imaging result, including steps A1-A2:

[0039] Step A1, performing imaging amplitude scanning on the stratum to be identified to obtain a reflection wave Fresnel zone and a horizontal event.

[0040] The Fresnel zone is an elliptical space between a transmitting antenna and a receiving antenna.

[0041] The collected original acquisition shot gather data of the stratum to be identified is analyzed to obtain an angle domain common imaging point gather, and the angle domain common imaging point gather is subjected to imaging scanning to obtain a reflection wave Fresnel zone and a diffraction wave horizontal event.

[0042] Step A2, performing amplitude stacking on the horizontal event to obtain a diffraction wave imaging result.

[0043] As an example, in the process of amplitude stacking of the angle domain common imaging point gather, the Fresnel zone of the reflection wave is avoided, and the identified horizontal event is subjected to full-azimuth angle gather amplitude stacking to avoid leakage of diffraction wave energy, so as to realize diffraction wave amplitude-preserved imaging, as shown in Figure 4 Among them, the full-azimuth angle gather can construct a weight function curve, and the underground dip angle distribution can be reflected by the gather itself. The reflection wave and the diffraction wave can be effectively calculated based on the Fresnel zone, so as to realize targeted high-definition imaging.

[0044] Further, as shown in Figure 4 The black and white dots in the figure are boundary points in the stratum. Among them, the boundary point can be a stratum interface inflection point, that is, a boundary point of the rift and an isolated diffraction point, as shown in Figure 3 .

[0045] Optionally, the rift identification method further comprises:

[0046] The strata to be identified are imaged using reflected waves to obtain the reflected wave imaging results; among them, the reflected wave imaging results contain layered reflections caused by multiple wave interference.

[0047] Layered reflection can be used to image the "artifacts" of strata generated by multiple waves in the strata to be identified in the reflection imaging results, as well as the strata generated by sedimentary strata in rift depressions. Among them, the strata artifacts can be called "false strata", which are strata that are present in the reflected waves but have no response in the diffracted waves.

[0048] Reflected waves are waves that are reflected and refracted at the interface between media of different densities. Multiples occur because certain interfaces with high reflection coefficients at the Earth's surface or underground cause primary reflected waves to be reflected back underground. Multiples are common interference waves in seismic exploration. Their presence and occurrence make seismic imaging inaccurate, distorting the amplitude, frequency, and phase of reflected waves from the target layer, thus affecting the accuracy and reliability of seismic imaging. Reflected wave imaging results can be represented as a three-dimensional seismic data volume. The imaging shape of reflected waves and multiples is a convex pseudo-hyperbola.

[0049] For example, for Figure 3 The model shown is used to perform reflected wave imaging to obtain the reflected wave image as follows: Figure 5 As shown. From Figure 5 As can be seen, layered reflections caused by multiple waves occur within a range of 2-4 km. The shape of their phase axis is very similar to that of the reflected wave, both being downward-convex pseudo-hyperboles. This makes it difficult to distinguish between the reflected wave and the multiple waves in the imaging profile.

[0050] The reflected waves collected from the strata to be identified are imaged using a reflected wave imaging method to obtain the reflected wave imaging results. The reflected wave imaging method can be Kirchhoff migration, one-way wave migration, reverse time migration, or multi-wave multi-component migration, etc. This application does not limit the method used for reflected wave imaging.

[0051] Furthermore, before performing reflected wave imaging and diffraction imaging on the strata to be identified, it is necessary to obtain reflected wave and diffraction wave information. This information can be obtained by analyzing the raw seismic exploration acquisition data. The raw seismic exploration acquisition data can include data required for seismic imaging, such as raw acquisition shot gathers and velocity fields. The raw acquisition shot gather data records contain diffraction and reflected wave information.

[0052] Furthermore, the diffracted and reflected waves in the original acquired shot gather data can be separated because there are differences between the diffracted and reflected waves in terms of time-distance relationship in the data space, wave field dynamics characteristics, and time-distance relationship in the imaging space. Based on these differences, the two can be separated.

[0053] S120. In the diffraction wave imaging results, determine whether there is a vertical cross-section.

[0054] In this embodiment, the cross-sectional view of the diffraction wave imaging is analyzed to determine whether a vertical section exists. A vertical section is presented as a vertical line in the cross-sectional view of the diffraction wave imaging, such as... Figure 2 As shown, the circles drawn with dashed lines represent the three vertical cross-sections.

[0055] S130. If it is determined that there is at least one vertical section in the diffraction wave imaging results, then the location of the rift valley is determined based on the location of the vertical section.

[0056] Based on the analysis of the diffraction wave imaging results, it was determined that there was at least one vertical section, and the location of the rift valley was determined based on the location of the vertical section.

[0057] For example, such as Figure 4 As shown, there is a vertical cross-section in the diffraction wave imaging results. The position of the vertical cross-section in the x-axis direction is between 2-6 km, and the position in the z-axis direction is between 0-2 km. The location of the rift valley can be obtained based on the position of the vertical cross-section.

[0058] Optionally, after determining that at least one upright section exists in the diffraction wave imaging results, step B1 is also included:

[0059] Step B1: Verify the position of the vertical section based on the location of the layered reflections in the reflected wave imaging results.

[0060] For example, such as Figure 5 As shown. From Figure 5 As can be seen, the position of the layered reflection of the rift valley in the x-axis direction is between 2-6 km, and the position in the z-axis direction is between 0-2 km, which coincides with the position of the vertical section in the diffraction wave imaging. Therefore, the position of the vertical section can be determined as the true location of the rift valley.

[0061] Optionally, after determining that at least one upright section exists in the diffraction wave imaging results, step C1 is further included:

[0062] Step C1: The layered reflections in the reflected wave imaging results that do not match the vertical cross-sections in the diffraction wave imaging results are taken as multiple wave interference layered reflections.

[0063] For example, such as Figure 4 , 5 As shown, the strata whose boundary points do not match those in the reflected wave imaging results are between 2-4 km, and these strata are classified as multiple wave interference layered reflections.

[0064] The technical scheme of the embodiment of the present application determines the spatial distribution position of the possible rift valley in the deep metamorphic rock basement by comparing and analyzing the diffraction wave imaging result and the reflection wave imaging result, overcomes the problem that the current technology cannot distinguish the rift valley and the multiple wave 'false image' in the stratified reflection of the deep metamorphic rock basement stratum, and improves the accuracy of the judgment of the rift valley in the deep metamorphic rock basement stratum.

[0065] Embodiment two

[0066] Figure 6 A structural schematic diagram of a rift valley identification device provided for the second embodiment of the present application is shown in FIG. 2. Figure 6 As shown in the figure, the device comprises:

[0067] The diffraction wave imaging result determination module 210 is configured to perform diffraction wave imaging on the to-be-identified stratum to obtain a diffraction wave imaging result.

[0068] The vertical fault judgment module 220 is configured to judge whether there is a vertical fault in the diffraction wave imaging result.

[0069] The rift valley position determination module 230 is configured to, if it is determined that there is at least one vertical fault in the diffraction wave imaging result, determine the position of the rift valley according to the position of the vertical fault.

[0070] Optionally, the stratum depth of the to-be-identified stratum is greater than or equal to 8000 meters and less than or equal to 10000 meters, and the diffraction wave imaging result determination module 210 comprises:

[0071] The imaging amplitude scanning unit is configured to perform imaging amplitude scanning on the to-be-identified stratum to obtain a horizontal event and a Fresnel zone of a reflection wave.

[0072] The imaging result determination unit is configured to perform amplitude stacking on the horizontal event to obtain the diffraction wave imaging result of the to-be-identified stratum.

[0073] Optionally, the vertical fault judgment module 220 is specifically configured to:

[0074] The position verification subunit is configured to verify the position of the vertical fault according to the position of the stratified reflection in the reflection wave imaging result.

[0075] Optionally, the rift valley position determination module 230 is specifically configured to:

[0076] The stratified reflection in the reflection wave imaging result that does not match the vertical fault in the diffraction wave imaging result is taken as a multiple wave interference stratified reflection.

[0077] Optionally, the rift valley identification device further comprises:

[0078] The reflected wave imaging result determination module is configured to perform reflected wave imaging on the to-be-identified stratum to obtain a reflected wave imaging result, wherein the reflected wave imaging result includes layered reflection caused by multiple wave interference.

[0079] The rift valley identification device provided in the embodiments of the present application can perform the rift valley identification method provided in any of the embodiments of the present application, and has the corresponding function modules and beneficial effects of performing the method.

[0080] Embodiment three

[0081] Figure 7 A structural schematic diagram of an electronic device according to an embodiment of the present application. The electronic device is intended to represent various forms of digital computers, such as laptops, desktops, tablets, personal digital assistants, servers, blade servers, mainframes, and other appropriate computers. The electronic device can also represent various forms of mobile devices, such as personal digital processors, cellular telephones, smart phones, wearable devices (e.g., headsets, glasses, watches, etc.), and other similar computing devices. The components shown in the figure, their connections and relationships, and their functions, are meant to be examples only, and are not meant to limit implementations of the present application described and / or claimed in this document.

[0082] As shown in Figure 7 The electronic device 10 includes at least one processor 11, and a memory, such as a read-only memory (ROM) 12, a random access memory (RAM) 13, etc., which is communicatively connected to the at least one processor 11, wherein the memory stores a computer program that can be executed by the at least one processor. The processor 11 can perform various appropriate actions and processes according to the computer program stored in the read-only memory (ROM) 12 or loaded from the storage unit 18 into the random access memory (RAM) 13. In the RAM 13, various programs and data required for the operation of the electronic device 10 can also be stored. The processor 11, the ROM 12, and the RAM 13 are connected to each other through a bus 14. An input / output (I / O) interface 15 is also connected to the bus 14.

[0083] A plurality of components in the electronic device 10 are connected to the I / O interface 15, including: an input unit 16, such as a keyboard, a mouse, etc.; an output unit 17, such as various types of displays, a loudspeaker, etc.; a storage unit 18, such as a magnetic disk, an optical disk, etc.; and a communication unit 19, such as a network card, a modem, a wireless communication transceiver, etc. The communication unit 19 allows the electronic device 10 to exchange information / data with other devices through a computer network, such as the Internet, and / or various telecommunication networks.

[0084] The processor 11 can be various general and / or special purpose processing components with processing and computing capabilities. Some examples of the processor 11 include, but are not limited to, a central processing unit (CPU), a graphics processing unit (GPU), various specialized artificial intelligence (AI) computing chips, various processors running machine learning model algorithms, a digital signal processor (DSP), and any suitable processor, controller, microcontroller, etc. The processor 11 performs various methods and processes described above, such as the rift identification method.

[0085] In some embodiments, the rift identification method can be implemented as a computer program tangibly embodied in a computer readable storage medium, such as the storage unit 18. In some embodiments, part or all of the computer program can be loaded and / or installed onto the electronic device 10 via the ROM 12 and / or the communication unit 19. When the computer program is loaded onto the RAM 13 and executed by the processor 11, one or more steps of the rift identification method described above can be performed. Alternatively, in other embodiments, the processor 11 can be configured to perform the rift identification method by any other suitable means, such as by means of firmware.

[0086] Various implementations of the systems and techniques described above can be realized in digital electronic circuitry, integrated circuitry, a field programmable gate array (FPGA), an application specific integrated circuit (ASIC), a system on a chip (SOC), a programmable logic device (PLD), a computer hardware, firmware, software, and / or combinations thereof. These various implementations can include implementation in one or more computer programs that are executable and / or interpretable on a programmable system including at least one programmable processor, which can be special or general purpose, coupled to receive data and instructions from, and to transmit data and instructions to, a storage system, at least one input device, and at least one output device.

[0087] Computer programs used to implement the methods of the present application can be written in any combination of one or more programming languages. These computer programs can be provided to a processor of a general purpose computer, special purpose computer, or other programmable data processing apparatus to produce a machine, such that the computer program, when executed by the processor of the machine, implements the functions / acts specified in the flowcharts and / or block diagrams. The computer program can be executed entirely on a machine, partially on a machine, partially on a machine and partially on a remote machine or entirely on a remote machine or server.

[0088] In the context of the present application, a computer-readable storage medium can be a tangible medium that can contain or store a computer program for use by or in connection with an instruction execution system, apparatus, or device. A computer-readable storage medium can include, but is not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any suitable combination of the foregoing. Alternatively, a computer-readable storage medium can be a machine-readable signal medium. More specific examples of a machine-readable storage medium will include one or more lines of a program of instructions in a transitory signal, a portable computer diskette, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or Flash memory), an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.

[0089] To provide for interaction with a user, the systems and techniques described here can be implemented on an electronic device having a display device (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor) for displaying information to the user and a keyboard and a pointing device (e.g., a mouse or a trackball) by which the user can provide input to the electronic device. Other kinds of devices can be used to provide for interaction with a user as well; for example, feedback provided to the user can be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user can be received in any form, including acoustic, speech, or tactile input.

[0090] The systems and techniques described here can be implemented in a computing system that includes a back end component (e.g., as a data server), or that includes a middleware component (e.g., an application server), or that includes a front end component (e.g., a user computer having a graphical user interface or a Web browser through which a user can interact with an implementation of the systems and techniques described here), or any combination of such back end, middleware, or front end components. The components of the system can be interconnected by any form or medium of digital data communication (e.g., a communication network). Examples of communication networks include a local area network (LAN), a wide area network (WAN), a blockchain network, and the Internet.

[0091] The computing system can include clients and servers. A client and server are generally remote from each other and typically interact through a communication network. The relationship of client and server arises by virtue of computer programs running on the respective computers and having a client-server relationship to each other. The server can be a cloud server, also known as a cloud computing server or cloud host, which is a host product in the cloud computing service system, to solve the defects of large management difficulty and weak business scalability in traditional physical host and VPS service.

[0092] It should be understood that the various forms of flow shown above can be used to reorder, add or delete steps. For example, each step described in the present application can be executed in parallel, sequentially or in a different order, as long as the desired results of the technical solutions of the present application can be achieved, which is not limited herein.

[0093] The above detailed description does not constitute a limitation on the scope of protection of the present application. Those skilled in the art should understand that various modifications, combinations, sub-combinations and substitutions can be made according to design requirements and other factors. Any modifications, equivalent replacements and improvements made within the spirit and principles of the present application shall be included in the scope of protection of the present application.

Claims

1. A method for identifying rift valleys, characterized in that, include: Diffraction wave imaging was performed on the strata to be identified to obtain the diffraction wave imaging results; In the diffraction wave imaging results, determine whether there is a vertical cross-section; If it is determined that there is at least one vertical section in the diffraction wave imaging results, then the location of the rift valley is determined based on the location of the vertical section; The method for identifying the rift valley further includes: The strata to be identified are subjected to reflected wave imaging to obtain the reflected wave imaging results; Among them, the reflected wave imaging results contain layered reflections caused by multiple wave interference; The method further includes, after determining that at least one upright section exists in the diffraction wave imaging result: The position of the vertical section is verified based on the location of the layered reflections in the reflected wave imaging results; The method further includes, after determining that at least one upright section exists in the diffraction wave imaging result: Layered reflections in the reflected wave imaging results that do not match the vertical cross-sections in the diffraction wave imaging results are considered as multiple wave interference layered reflections.

2. The method according to claim 1, characterized in that, Diffraction wave imaging is performed on the strata to be identified, and the diffraction wave imaging results are obtained, including: The strata to be identified are subjected to imaging amplitude scanning to obtain the horizontal phase axis and Fresnel band of the reflected wave; Amplitude superposition of horizontal phase axes yields diffraction wave imaging results of the strata to be identified.

3. The method according to any one of claims 1-2, characterized in that, The stratum depth to be identified is greater than or equal to 8,000 meters and less than or equal to 10,000 meters.

4. A device for identifying rift valleys, characterized in that, include: Diffraction imaging result determination module: used to perform diffraction imaging on the strata to be identified and obtain the diffraction imaging results; Vertical section determination module: used to determine whether a vertical section exists in the diffraction wave imaging results; Rift Valley Location Determination Module: If it is determined that there is at least one vertical section in the diffraction wave imaging result, then the location of the rift valley is determined based on the location of the vertical section. The rift valley identification device further includes: The reflected wave imaging result determination module is used to perform reflected wave imaging on the strata to be identified and obtain the reflected wave imaging results. Among them, the reflected wave imaging results contain layered reflections caused by multiple wave interference; The vertical section determination module is specifically used for: The position of the vertical section is verified based on the location of the layered reflections in the reflected wave imaging results; The rift valley location determination module is specifically used for: Layered reflections in the reflected wave imaging results that do not match the vertical cross-sections in the diffraction wave imaging results are considered as multiple wave interference layered reflections.

5. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, When the processor executes the computer program, it implements the valley identification method as described in any one of claims 1-3.

6. A storage medium for storing computer-executable instructions, characterized in that, The computer-executable instructions, when executed by a computer processor, are used to perform the valley identification method as described in any one of claims 1-3.

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