Probe device and battery detection equipment

Abstract

A probe device (100) and a battery detection apparatus (10). The probe device (100) comprises: a guide (110) extending in a first direction (x); the plurality of probe modules (120) are arranged on the guide part (110) along the first direction (x), at least part of the probe modules (120) are in sliding connection with the guide part (110), and the guide part (110) is used for guiding at least part of the probe modules (120) to slide in the first direction (x); the connecting rod assembly (130) comprises at least one connecting rod unit (131), the connecting rod unit (131) is connected between two adjacent probe modules (120) in the multiple probe modules (120), and the connecting rod unit (131) can stretch out and draw back in the first direction (x). The probe device (100) enables stepless adjustment of the plurality of probe modules (120) in the first direction (x).

Description

Probe device and battery testing equipment Technical Field

[0001] The present application relates to the technical field of mechanical equipment, and more particularly, to a probe device and a battery testing device. Background Art

[0002] With the rapid development of energy technology, batteries have become an indispensable part of human life. During the production and testing of batteries, various devices and equipment are usually required to assist. Among them, some equipment is equipped with probes that can detect the electrode terminals and other parts of the battery to perform production testing on the battery. When different models of batteries are produced on the same equipment, the size of the battery may change, causing the center distance between the rows and columns of multiple batteries to also change. In this case, the distance between the multiple probes corresponding to the multiple batteries in the equipment needs to be adjusted synchronously, so a lot of resources need to be spent on equipment replacement, which affects the production efficiency of the battery and increases the manufacturing cost of the battery.

[0003] In view of this, how to achieve rapid adjustment of multiple probes in a probe device is a technical problem that needs to be solved urgently.

[0004] Summary of the Invention

[0005] The embodiments of the present application provide a probe device and a battery testing device, which can realize rapid adjustment of multiple probes in the probe device.

[0006] In a first aspect, a probe device is provided, comprising: a guide member extending along a first direction; a plurality of probe modules arranged on the guide member along the first direction, at least some of the plurality of probe modules being slidably connected to the guide member, and the guide member being used to guide at least some of the probe modules to slide in the first direction; a connecting rod assembly comprising at least one connecting rod unit, the connecting rod unit being connected between two adjacent probe modules among the plurality of probe modules, and the connecting rod unit being capable of extension and retraction in the first direction.

[0007] Through the technical solution of the embodiment of the present application, multiple probe modules in the probe device can slide along the guide member in the first direction, and two adjacent probe modules among the multiple probe modules are connected by a retractable connecting rod unit, thereby enabling stepless adjustment of the multiple probe modules in the first direction. The adjustment method is easy to operate and has high reliability, and can more conveniently achieve rapid adjustment of the multiple probe modules. When the probe device is applied to battery testing equipment, it can quickly test different types of batteries, which is conducive to improving the production testing efficiency of batteries.

[0008] In some possible embodiments, the connecting rod unit includes: a first connecting rod and a second connecting rod, the first connecting rod and the second connecting rod are hinged to each other, and the first connecting rod is hinged to the first probe module of the two adjacent probe modules, and the second connecting rod is hinged to the second probe module of the two adjacent probe modules.

[0009] Through the technical solution of this embodiment, the connecting rod unit is designed to include two connecting rods hinged to each other, and the two connecting rods can rotate with each other to achieve extension and retraction in the first direction. The structural design of the connecting rod unit is simple and the manufacturing cost is low. While being able to effectively support the relative displacement between adjacent probe modules, it is conducive to installation and use in the probe device.

[0010] In some possible embodiments, the first probe module is an intermediate module among multiple probe modules; the middle part of the first connecting rod is hinged to the first probe module, and the two ends of the first connecting rod are respectively hinged to one end of two second connecting rods in two adjacent connecting rod units.

[0011] Through the technical solution of this embodiment, the first connecting rod and the two second connecting rods are hingedly connected end to end, which not only realizes the linkage between the first probe module and the two adjacent second probe modules, but also supports the adjustment of the spacing between the first probe module and the two adjacent second probe modules. In this technical solution, the connection method between multiple connecting rods is easy to implement and is also convenient for application in probe devices with a large number of probe modules.

[0012] In some possible embodiments, the second probe module is an intermediate module among multiple probe modules; the first connecting rod is hinged to the first probe module at the center point in the length direction, and the second connecting rod is hinged to the second probe module at the center point in the length direction, and the lengths of the first connecting rod and the second connecting rod are equal.

[0013] Through the technical solution of this embodiment, the distance between every two adjacent first probe modules and second probe modules in the multiple probe modules can be kept equal, thereby achieving equal distance adjustment between the multiple probe modules.

[0014] In some possible implementations, the first probe module is an end module among the plurality of probe modules; and both ends of the first connecting rod are hinged to the first probe module and one end of the second connecting rod, respectively.

[0015] The technical solution of this embodiment can realize the adjustable connection between the probe modules located at the ends and other intermediate probe modules in the multiple probe modules. Combined with the relevant technical solutions for the intermediate probe modules in the multiple probe modules in the above embodiment, the mutual linkage and spacing adjustment of the multiple probe modules in the probe device can be effectively realized.

[0016] In some possible implementations, the second probe module is a middle module among the multiple probe modules; the second connecting rod is hinged to the second probe module at a center point in the length direction, and the length of the first connecting rod is half of the length of the second connecting rod.

[0017] Through the technical solution of this embodiment, the distance between an end probe module and its adjacent middle probe module can be kept equal to the distance between other adjacent middle probe modules, thereby further achieving equal distance adjustment between multiple probe modules.

[0018] In some possible implementations, the distance between two adjacent hinge points in the first link is equal to the distance between two adjacent hinge points in the second link.

[0019] Through the technical solution of this embodiment, the distances between two adjacent hinge points in the first connecting rod and the second connecting rod are designed to be the same, which is conducive to achieving symmetrical movement of the adjacent first probe module and the second probe module, and improving the reliability of distance adjustment between multiple probe modules.

[0020] In some possible implementations, the link unit includes: a plurality of first links and a plurality of second links.

[0021] Through the technical solution of this embodiment, two adjacent probe modules are connected to each other through multiple first connecting rods and multiple second connecting rods, which can improve the stability and reliability of the relative displacement between the two adjacent probe modules, thereby further improving the test performance of the probe device.

[0022] In some possible implementations, a plurality of first connecting rods are hinged to the same position of the first probe module, and / or a plurality of second connecting rods are hinged to the same position of the second probe module.

[0023] Through the technical solution of this embodiment, multiple first links can be hinged to the same position of the first probe module through the same component, and / or multiple second links can be hinged to the same position of the second probe module through the same component, thereby improving the installation efficiency of multiple first links and / or multiple second links on the probe module, and facilitating the disassembly and maintenance of multiple first links and / or multiple second links.

[0024] In some possible implementations, a plurality of first connecting rods are cross-hinged to the first probe module, and / or a plurality of second connecting rods are cross-hinged to the second probe module.

[0025] Through the technical solution of this embodiment, the adjustment stability between the adjacent first probe modules and the second probe modules can be improved, thereby further improving the test performance of the probe device.

[0026] In some possible embodiments, the guide member includes a guide groove extending along the first direction; at least some of the multiple probe modules are provided with guide blocks that cooperate with the guide groove, and at least some of the probe modules are slidably connected to the guide groove through the guide blocks.

[0027] Through the technical solution of this embodiment, the guide member in the probe device is designed as a guide groove, and at least some of the multiple probe modules are provided with a guide block that cooperates with the guide groove. The probe module can achieve a sliding connection with the guide groove through the guide block. The overall technical solution has a simple structure, is easy to implement, and the sliding performance of the probe module is better. The space required for the probe module and the guide member is also small, which is conducive to improving the overall performance of the probe device.

[0028] In some possible embodiments, the probe device further includes: a driving member; a first end probe module located at one end among the multiple probe modules is fixedly connected to the guide member, and a second end probe module located at the other end among the multiple probe modules is connected to the driving member, and the driving member is used to drive the second end probe module and the intermediate probe module to slide along the first direction, wherein the intermediate probe module is a probe module located between the first end probe module and the second end probe module among the multiple probe modules.

[0029] Through the technical solution of this embodiment, the first end probe module located at one end of the multiple probe modules is fixed, and the second end probe module located at the other end of the multiple probe modules is driven by a driving member, so that the middle probe module located between the first end probe module and the second end probe module in the multiple probe modules can be driven to slide, thereby realizing stepless adjustment of the distance between any two adjacent probe modules in the multiple probe modules. Therefore, through this technical solution, there is no need to set up too many additional mechanical structures in the probe device, and no manual intervention is required, and the stepless adjustment of the distance between any two adjacent probe modules in the multiple probe modules can be effectively realized, thereby improving the test performance and test efficiency of the probe device.

[0030] In some possible implementations, the driving member includes a driving rod, an axial direction of the driving rod is parallel to the first direction, and the driving rod is configured to move along the axial direction.

[0031] Through the technical solution of this embodiment, the driving rod is used as a driving member to drive the probe module. Under the premise of providing effective drive, the driving rod does not occupy too much space in the probe device and can be easily installed in the probe device.

[0032] In some possible embodiments, multiple probe modules are arranged in the second direction of the guide member, and the second direction is perpendicular to the first direction; each of the multiple probe modules is provided with an electrical connector, and the electrical connector is located in the third direction of each probe module, and the third direction is perpendicular to the first direction and the second direction.

[0033] Through the technical solution of this embodiment, the electrical connector of the probe module in the probe device is not arranged in the first direction of the probe module, thereby not affecting the stepless spacing adjustment of the adjacent probe module in the first direction. The electrical connector is also not arranged in the second direction of the probe module, thereby not increasing the size of the probe module in the second direction and increasing the thickness of the probe device in the second direction. Placing the electrical connector in the third direction of the probe module can optimize the overall structural design of the probe module, making the overall structure of the probe device more compact and the layout of various components more reasonable.

[0034] In some possible embodiments, the probe device further includes: a first frame; a guide member, a plurality of probe modules and a connecting rod assembly forming a probe mechanism; at least one pair of probe mechanisms are arranged side by side on the first frame, and at least one pair of probe mechanisms are configured to correspond one-to-one to at least one row of batteries, and the probe modules in each pair of probe mechanisms are used to detect the electrode terminals of the corresponding row of batteries.

[0035] Through the technical solution of this embodiment, the probe device can be applied to the battery field to test the battery. The stepless adjustment between multiple probe modules in the probe device can enable the probe device to be applied to batteries of different models and sizes, which is conducive to improving the battery testing efficiency and the production capacity of the battery production line.

[0036] In some possible implementations, the probe device further includes: a heat sink disposed on the first frame, the heat sink being configured to dissipate heat for at least one pair of probe mechanisms.

[0037] Through the technical solution of this embodiment, a heat sink is provided in the probe device, which is beneficial for dissipating heat and cooling the multiple probe modules and other related components in the probe device, thereby improving the operating performance and service life of the multiple probe modules and the probe device in which they are located.

[0038] In some possible implementations, at least one heat sink is provided in a one-to-one correspondence with at least one pair of probe mechanisms.

[0039] The technical solution of this embodiment is beneficial for achieving sufficient heat dissipation and cooling effect on each pair of probe mechanisms in the probe device, thereby further improving the operating performance and service life of multiple probe modules and the probe device in which they are located.

[0040] In some possible implementations, a needle bearing is provided on the first frame, and the probe device is configured to be mounted on the detection equipment through the needle bearing.

[0041] Through the technical solution of this embodiment, the probe device is installed in the detection equipment through the needle bearing, and the probe device can be pulled out as a whole in the detection equipment, which facilitates the replacement and maintenance of components in the probe device.

[0042] In a second aspect, a battery testing device is provided, comprising: a testing platform for placing a battery; and a probe device according to the first aspect or any possible embodiment of the first aspect, wherein the probe device is used to test the battery.

[0043] In some possible implementations, the battery testing device includes a battery formation device.

[0044] Through the technical solution of the embodiment of the present application, multiple probe modules in the probe device can slide along the guide member in the first direction, and two adjacent probe modules among the multiple probe modules are connected by a retractable connecting rod unit, thereby enabling stepless adjustment of the multiple probe modules in the first direction. The adjustment method is easy to operate and has high reliability, and can more conveniently achieve rapid adjustment of the multiple probe modules. When the probe device is applied to battery testing equipment, it can quickly test different types of batteries, which is conducive to improving the production testing efficiency of batteries. BRIEF DESCRIPTION OF THE DRAWINGS

[0045] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the following is a brief introduction to the drawings required for use in the embodiments of the present application. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on the drawings without creative work.

[0046] FIG1 is a schematic structural diagram of a battery testing device disclosed in an embodiment of the present application;

[0047] FIG2 is a schematic structural diagram of a probe device disclosed in an embodiment of the present application;

[0048] FIG3 is a schematic structural diagram of a connecting rod unit disclosed in an embodiment of the present application;

[0049] FIG4 is another schematic structural diagram of a connecting rod unit disclosed in an embodiment of the present application;

[0050] FIG5 is another schematic structural diagram of a connecting rod unit disclosed in an embodiment of the present application;

[0051] FIG6 is another schematic structural diagram of a connecting rod unit disclosed in an embodiment of the present application;

[0052] FIG7 is another schematic structural diagram of a probe device disclosed in an embodiment of the present application;

[0053] FIG8 is another schematic structural diagram of a probe device disclosed in an embodiment of the present application;

[0054] FIG9 is another schematic structural diagram of a probe device disclosed in an embodiment of the present application.

[0055] In the drawings, the drawings are not drawn to scale. DETAILED DESCRIPTION

[0056] The following detailed description of the embodiments of the present application is provided in conjunction with the accompanying drawings and examples. The following detailed description of the embodiments and the accompanying drawings are used to illustrate the principles of the present application, but are not intended to limit the scope of the present application, that is, the present application is not limited to the described embodiments.

[0057] In the description of this application, it should be noted that, unless otherwise specified, "multiple" means more than two; the terms "upper", "lower", "left", "right", "inside", "outside", etc., indicating directions or positional relationships, are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific direction, be constructed and operated in a specific direction, and therefore cannot be understood as a limitation on this application. In addition, the terms "first", "second", "third", etc. are only used for descriptive purposes and cannot be understood as indicating or implying relative importance. "Vertical" is not strictly perpendicular, but is within the allowable error range. "Parallel" is not strictly parallel, but is within the allowable error range.

[0058] The directional words appearing in the following description are all directions shown in the figures, and do not limit the specific structure of this application. In the description of this application, it should also be noted that, unless otherwise clearly specified and limited, the terms "installed", "connected", and "connected" should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral connection; it can be directly connected or indirectly connected through an intermediate medium. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to the specific circumstances.

[0059] The term "and / or" in this application simply describes an association relationship between related objects, indicating that three relationships can exist. For example, A and / or B can mean: A exists, A and B exist at the same time, and B exists. In addition, the character " / " in this application generally indicates that the related objects are in an "or" relationship.

[0060] Unless otherwise defined, all technical and scientific terms used in this application have the same meanings as commonly understood by those skilled in the art to which this application belongs. The terms used in the specification of this application are for the purpose of describing specific embodiments only and are not intended to limit this application. The terms "including" and "having" and any variations thereof in the specification and claims of this application and the above-mentioned drawings are intended to cover non-exclusive inclusions. The terms "first" and "second" in the specification and claims of this application or the above-mentioned drawings are used to distinguish different objects, rather than to describe a specific order or a primary-secondary relationship.

[0061] References to "embodiments" in this application mean that a particular feature, structure, or characteristic described in connection with the embodiment may be included in at least one embodiment of the application. The appearance of this phrase in various places in the specification does not necessarily refer to the same embodiment, nor does it constitute an independent or alternative embodiment that is mutually exclusive of other embodiments. It is understood, both explicitly and implicitly, by those skilled in the art that the embodiments described in this application may be combined with other embodiments.

[0062] This application relates to battery production and testing equipment, such as formation equipment. The equipment is equipped with multiple probes that can probe the electrode terminals of multiple batteries to detect relevant battery performance. After the multiple probes of the formation equipment are connected to multiple batteries, the formation equipment can complete the initial charging process for the multiple batteries, thereby activating the active materials in the batteries and activating the batteries.

[0063] In this application, a battery refers to a physical module that includes one or more battery cells to provide electrical energy. A battery generally includes a housing that encloses one or more battery cells. Optionally, the battery cells may include lithium-ion secondary batteries, lithium-ion primary batteries, lithium-sulfur batteries, sodium-lithium-ion batteries, sodium-ion batteries, or magnesium-ion batteries, although this embodiment of the application is not limited thereto.

[0064] In some specific implementations involving battery production testing, multiple batteries are arranged in a row on a battery tray, and multiple probes in the test equipment are arranged in a row corresponding to the electrode terminals of the multiple batteries, so as to facilitate interconnection with the electrode terminals of the multiple batteries. When different models of batteries are produced in the same test equipment, it is usually necessary to replace the battery tray, and the center distance between the rows and columns of the battery tray and the multiple batteries changes. The center distance between the multiple probes corresponding to the multiple batteries in the test equipment also needs to be adjusted accordingly. In some related technologies, manual intervention is required to adjust the distance between the multiple probes, and a large amount of resources need to be spent on equipment replacement and disassembly and assembly of the multiple probes in the equipment, which not only causes a waste of manpower and material resources, but also affects the production and testing efficiency of the battery, which is not conducive to reducing the manufacturing cost of the battery.

[0065] In view of this, the present application provides a probe device, comprising: a guide member, a plurality of probe modules and a connecting rod assembly. The guide member extends along a first direction, the plurality of probe modules are arranged on the guide member along the first direction, at least some of the probe modules are slidably connected to the guide member, the guide member is used to guide the at least some of the probe modules to slide in the first direction, and the connecting rod assembly includes at least one connecting rod unit, which is connected between two adjacent probe modules in the plurality of probe modules, and the connecting rod unit can be retracted in the first direction. Through the technical solution of the embodiment of the present application, the plurality of probe modules in the probe device can slide along the guide member in the first direction, and the adjacent two probe modules in the plurality of probe modules are connected by a retractable connecting rod unit, thereby enabling the stepless adjustment of the plurality of probe modules in the first direction, that is, the distance between the adjacent probe modules in the plurality of probe modules can be adjusted to any value, and the adjustment method is easy to operate and has high reliability, and can more conveniently achieve rapid adjustment of the plurality of probe modules. When the probe device is applied to battery testing equipment, it can quickly test batteries of different models, which is beneficial to improving the production test efficiency of the battery.

[0066] The probe device involved in this application can be applied to any device equipped with a probe module, including but not limited to battery testing equipment used for battery production testing. As an example, the probe device provided in this application can be applied to battery formation equipment.

[0067] FIG1 shows a schematic structural diagram of a battery testing device 10 provided in an embodiment of the present application.

[0068] As shown in FIG. 1 , the battery testing device 10 may include a testing platform 200 and a probe device 100 , wherein the testing platform 200 is used to place a battery 300 , and the probe device 100 is used to test the battery 300 .

[0069] Optionally, multiple batteries 300 may be placed on the inspection platform 200, and the probe device 100 may be disposed above the multiple batteries 300. The probe device 100 may include multiple probes that may contact electrode terminals of the multiple batteries 300 to inspect the multiple batteries 300.

[0070] In some examples, multiple batteries 300 may be arranged in at least one row and distributed on the inspection platform 200. Each row of batteries 300 may correspond to a probe device 100, and multiple rows of batteries 300 may correspond to multiple probe devices 100. The probe device 100 may include at least one row of probes, which may contact electrode terminals on a row of batteries 300 to inspect the row of batteries 300.

[0071] In some embodiments, the battery testing device 10 may be a battery formation device that performs formation on the battery 300 , activating the positive and negative electrode materials inside the battery 300 through charge and discharge, thereby improving the battery's self-discharge, charge and discharge performance, and storage performance.

[0072] FIG2 shows a schematic structural diagram of a probe device 100 provided in an embodiment of the present application.

[0073] As shown in FIG2 , the probe device 100 includes a guide member 110, a plurality of probe modules 120, and a connecting rod assembly 130. The guide member 110 extends along a first direction x, and the plurality of probe modules 120 are arranged on the guide member 110 along the first direction x. At least some of the plurality of probe modules 120 are slidably connected to the guide member 110. The guide member 110 is used to guide at least some of the probe modules 120 to slide in the first direction x. The connecting rod assembly 130 includes at least one connecting rod unit 131, which is connected between two adjacent probe modules 120 in the plurality of probe modules 120. The connecting rod unit 131 can be extended and retracted in the first direction x.

[0074] Specifically, in the embodiment of the present application, the guide member 110 can be a strip-shaped member extending along the first direction x. When multiple probe modules 120 are arranged on the guide member 110 along the first direction x, the guide member 110 can guide at least some of the multiple probe modules 120.

[0075] As an example, the guide member 110 can be a guide groove or a guide rod. When at least some of the multiple probe modules 120 are slidingly connected to the guide groove or guide rod, at least some of the probe modules 120 can slide along the extension direction of the guide groove or guide rod, that is, the first direction x.

[0076] In an embodiment of the present application, the probe module 120 may be a probe test module, which may be provided with a metal probe for contacting a product to be tested. An external testing organization may use the metal probe to input a test signal into the product to be tested, thereby testing the relevant performance of the product to be tested. As an example, the product to be tested includes, but is not limited to, a battery. The metal probe in the probe module 120 may contact an electrode terminal of the battery, thereby inputting a test electrical signal into the battery.

[0077] Specifically, the probe module 120 may include a probe mounting seat and a metal probe, wherein the metal probe is fixedly mounted in the probe mounting seat, and the probe mounting seat may be slidably connected to the guide member 110 to achieve a sliding connection between the probe module 120 and the guide member 110. Optionally, the probe mounting seat may be a sheet metal part made of metal material, which has high reliability. The probe mounting seat has a hollow structure, which facilitates the installation of the metal probe in the probe mounting seat and the connection with the outside.

[0078] The connecting rod assembly 130 is composed of at least one connecting rod unit 131, each connecting rod unit being connected between two adjacent probe modules 120 among the plurality of probe modules 120. In the case where the connecting rod assembly 130 includes a plurality of connecting rod units 131, the plurality of connecting rod units 131 can be sequentially connected to three or more probe modules 120 to facilitate the linkage sliding of the three or more probe modules 120.

[0079] Specifically, the connecting rod unit 131 is configured to be retractable in a first direction x. When the probe modules 120 are able to slide in the first direction x, the distance between two probe modules 120 connected by the connecting rod unit 131 is adjustable. Furthermore, when three or more probe modules 120 are connected to multiple connecting rod units 131, the distance between each two adjacent probe modules 120 is adjustable. In this embodiment, the distance between two adjacent probe modules 120 can be adjusted to any value, thereby achieving infinite adjustment of the probe modules 120.

[0080] Through the technical solution of the embodiment of the present application, the multiple probe modules 120 in the probe device 100 can slide along the guide member 110 in the first direction x, and two adjacent probe modules 120 in the multiple probe modules 120 are connected by a retractable connecting rod unit 131, thereby enabling the multiple probe modules 120 to be infinitely adjusted in the first direction x. The adjustment method is easy to operate and has high reliability, and can more conveniently achieve rapid adjustment of the multiple probe modules 120 to improve the adjustment efficiency of the multiple probe modules 120. When the probe device 100 is applied to battery testing equipment, it can quickly test batteries of different models, which is conducive to improving the production test efficiency of batteries.

[0081] FIG3 shows a schematic structural diagram of a connecting rod unit 131 provided in an embodiment of the present application.

[0082] As shown in Figure 3, the connecting rod unit 131 includes: a first connecting rod 1311 and a second connecting rod 1312. The first connecting rod 1311 and the second connecting rod 1312 are hinged to each other, and the first connecting rod 1311 is hinged to the first probe module 121 in the two adjacent probe modules 120, and the second connecting rod 1312 is hinged to the second probe module 122 in the two adjacent probe modules 120.

[0083] Specifically, in the embodiment of the present application, after the first link 1311 and the second link 1312 are hinged to each other, the two can rotate relative to each other, that is, the first link 1311 can rotate relative to the hinge point between it and the second link 1312, and the second link 1312 can rotate relative to the hinge point between it and the first link 1311.

[0084] Optionally, the first connecting rod 1311 and the second connecting rod 1312 can be hingedly connected to each other in various ways. As an example, the ends of the first connecting rod 1311 and the second connecting rod 1312 can be hingedly connected to each other via a pin. Specifically, the ends of the first connecting rod 1311 and the second connecting rod 1312 are provided with holes to facilitate the passage of the pin, and the first connecting rod 1311 and the second connecting rod 1312 can rotate around the pin. In other examples, the first connecting rod 1311 and the second connecting rod 1312 can also be hingedly connected to each other via hinges, bearings, etc., which are not specifically limited in this embodiment of the present application.

[0085] Similar to the hinged connection between the first connecting rod 1311 and the second connecting rod 1312, the first connecting rod 1311 is further hinged to the first probe module 121 of the two adjacent probe modules 120, and the second connecting rod 1312 is further hinged to the second probe module 122 of the two adjacent probe modules 120. As an example, as shown in FIG3 , the first connecting rod 1311 and the second connecting rod 1312 can be hinged to the probe mounting base of the first probe module 121 and the probe mounting base of the second probe module 122, respectively, via a pin.

[0086] Through the technical solution of the embodiment of the present application, the connecting rod unit 131 is designed to include two connecting rods hinged to each other, and the two connecting rods can rotate with each other to achieve telescoping in the first direction x. The structural design of the connecting rod unit 131 is simple and the manufacturing cost is low. While being able to effectively support the relative displacement between adjacent probe modules 120, it is conducive to installation and use in the probe device 100.

[0087] FIG4 shows another schematic structural diagram of the connecting rod unit 131 provided in an embodiment of the present application.

[0088] As shown in Figure 4, the first probe module 121 is the middle module among the multiple probe modules 120, that is, the non-end module among the multiple probe modules 120. The middle part of the first connecting rod 1311 is hinged to the first probe module 121, and the two ends of the first connecting rod 1311 are respectively hinged to one end of the two second connecting rods 1312 in the two adjacent connecting rod units 131.

[0089] Specifically, in the embodiment of the present application, the second probe modules 122 are provided on both sides of the first probe module 121 in the first direction x, and the two ends of the first connecting rod 1311 hinged to the first probe module 121 can be respectively hinged to the two second connecting rods 1312, and the two second connecting rods 1312 are respectively hinged to the two second probe modules 122 adjacent to the first probe module 121, thereby realizing the mutual linkage between the first probe module 121 and the two adjacent second probe modules 122 and the adjustment of the distance between them.

[0090] Optionally, the middle portion of the first connecting rod 1311 may be hinged to the first probe module 121, and the middle portion of the first connecting rod 1311 may be the middle region of the first connecting rod 1311 in the longitudinal direction. As an example, the center point of the first connecting rod 1311 in the longitudinal direction may be hinged to the first probe module 121.

[0091] Through the technical solution of the embodiment of the present application, the first connecting rod 1311 and the two second connecting rods 1312 are hingedly connected end to end, which not only realizes the linkage between the first probe module 121 and the two adjacent second probe modules 122, but also supports the adjustment of the spacing between the first probe module 121 and the two adjacent second probe modules 122. In this technical solution, the connection method between multiple connecting rods is easy to implement and is also convenient for application to the probe device 100 with a large number of probe modules 120.

[0092] Continuing to refer to Figure 4, in some embodiments, the first probe module 121 and the second probe module 122 are both intermediate modules among the multiple probe modules 120, the first link 1311 is hinged to the first probe module 121 at the center point in the length direction, the second link 1312 is hinged to the second probe module 122 at the center point in the length direction, and the lengths of the first link 1311 and the second link 1312 are equal.

[0093] Optionally, in this embodiment, the hinged connection manner of the second connecting rod 1312 on the second probe module 122 may be the same as the hinged connection manner of the first connecting rod 1311 on the first probe module 121 in the above embodiment.

[0094] Specifically, the second probe module 122 is provided with a first probe module 121 on both sides in the first direction x (Figure 4 schematically shows a first probe module 121), and the two ends of the second connecting rod 1312 hinged to the second probe module 122 can be respectively hinged to the two first connecting rods 1311, and the two first connecting rods 1311 are respectively hinged to the two first probe modules 121 adjacent to the second probe module 122, thereby realizing the mutual linkage between the second probe module 122 and the two adjacent first probe modules 121 and the adjustment of the distance between them.

[0095] When the first link 1311 is hinged to the first probe module 121 at the center point in the length direction, the second link 1312 is hinged to the second probe module 122 at the center point in the length direction, and the lengths of the first link 1311 and the second link 1312 are equal, the distance between each adjacent two first probe modules 121 and second probe modules 122 in the multiple probe modules 120 can be kept equal, thereby achieving equidistant adjustment between the multiple probe modules 120.

[0096] FIG5 shows another schematic structural diagram of the connecting rod unit 131 provided in an embodiment of the present application.

[0097] As shown in FIG. 5 , the first probe module 121 is an end module among the plurality of probe modules 120 , and both ends of the first connecting rod 1311 are hinged to one end of the first probe module 121 and the second connecting rod 1312 , respectively.

[0098] Specifically, in the embodiment of the present application, the first probe module 121 is only provided with the second probe module 122 on one side in the first direction x, one end of the first connecting rod 1311 is hinged to the first probe module 121, and the other end of the first connecting rod 1311 is hinged to the end of the second connecting rod 1312.

[0099] Through the technical solutions of the embodiments of the present application, adjustable connections can be achieved between the probe modules 120 at the ends and other intermediate probe modules in the plurality of probe modules 120. Combined with the relevant technical solutions for the intermediate probe modules in the plurality of probe modules 120 in the above embodiments, the interconnection and spacing adjustment of the plurality of probe modules 120 in the probe device 100 can be effectively achieved.

[0100] 5 , the second probe module 122 is the middle module among the multiple probe modules 120 , the second connecting rod 1312 is hinged to the second probe module 122 at the center point in the length direction, and the length of the first connecting rod 1311 is half the length of the second connecting rod 1312 .

[0101] In an embodiment of the present application, the length of the connecting rod (i.e., the first connecting rod 1311 in the embodiment shown in Figure 5) hinged to the end probe module (i.e., the first probe module 121 in the embodiment shown in Figure 5) is half the length of the connecting rod (i.e., the second connecting rod 1312 in the embodiment shown in Figure 5) hinged to the middle probe module (i.e., the second probe module 122 in the embodiment shown in Figure 5), which can ensure that the distance between the end probe module and its adjacent middle probe module is equal to the distance between other adjacent middle probe modules, thereby further realizing equidistant adjustment between multiple probe modules 120.

[0102] Continuing to refer to FIG. 3 to FIG. 5 , in some embodiments, the distance between two adjacent hinge points in the first link 1311 is equal to the distance between two adjacent hinge points in the second link 1312 .

[0103] Specifically, two adjacent hinge points in the first link 1311 are hinged to the first probe module 121 and the second link 1312 respectively. Similarly, two adjacent hinge points in the second link 1312 are hinged to the first link 1311 and the second probe module 122 respectively.

[0104] Optionally, when the first connecting rod 1311 is hinged to the first probe module 121 and the second connecting rod 1312 via a pin, the hinge point in the first connecting rod 1311 is the location of the pin. Similarly, when the second connecting rod 1312 is hinged to the second probe module 121 and the first connecting rod 1311 via a pin, the hinge point in the second connecting rod 1312 is the location of the pin.

[0105] Through the technical solution of this embodiment, the distance between two adjacent hinge points in the first connecting rod 1311 and the second connecting rod 1312 is designed to be the same, which is conducive to achieving symmetrical movement of the adjacent first probe modules 121 and the second probe modules 122, and improving the reliability of distance adjustment between multiple probe modules 120.

[0106] FIG6 shows another schematic structural diagram of the connecting rod unit 131 provided in an embodiment of the present application.

[0107] As shown in FIG. 6 , the link unit 131 between two adjacent probe modules 120 includes a plurality of first links 1311 and a plurality of second links 1312 .

[0108] Specifically, each first link 1311 in the plurality of first links 1311 is hinged to the first probe modules 121 in two adjacent probe modules 120, and each second link 1312 in the plurality of second links 1312 is hinged to the second probe modules 122 in two adjacent probe modules 120. The plurality of first links 1311 and the plurality of second links 1312 can be divided into multiple groups, each group of links correspondingly including a first link 1311 and a second link 1312 hinged to each other. The hinge method of the first link 1311 and the second link 1312 in each group of links can be referred to the relevant description of the above embodiment, and will not be elaborated here.

[0109] Through the technical solution of the embodiment of the present application, two adjacent probe modules 120 are connected to each other through multiple first connecting rods 1311 and multiple second connecting rods 1312, which can improve the stability and reliability of the relative displacement between the two adjacent probe modules 120, thereby further improving the test performance of the probe device 100.

[0110] Continuing with FIG. 6 , in some embodiments, a plurality of first links 1311 may be hinged to the same position of the first probe module 121 , and / or a plurality of second links 1312 may be hinged to the same position of the second probe module 122 .

[0111] Optionally, multiple first connecting rods 1311 can be hinged to the same position of the first probe module 121 through the same pin, and / or multiple second connecting rods 1312 can be hinged to the same position of the second probe module 122 through the same pin.

[0112] As an example, as shown in FIG. 6 , the plurality of first links 1311 may be hinged to the center of the side wall of the first probe module 121 , and the plurality of second links 1312 may be hinged to the center of the side wall of the second probe module 122 .

[0113] Through the technical solution of this embodiment, multiple first links 1311 can be hinged to the same position of the first probe module 121 through the same component, and / or multiple second links 1312 can be hinged to the same position of the second probe module 122 through the same component, thereby improving the installation efficiency of multiple first links 1311 and / or multiple second links 1312 on the probe module 120, and also facilitating the disassembly and maintenance of multiple first links 1311 and / or multiple second links 1312.

[0114] Continuing to refer to FIG. 6 , in some embodiments, a plurality of first connecting rods 1311 are cross-hinged to the first probe module 121 , and / or a plurality of second connecting rods 1312 are cross-hinged to the second probe module 122 .

[0115] As an example, FIG6 shows two first links 1311 and two second links 1312, and the two first links 1311 can be cross-hinged to the first probe module 121. Further, the two first links 1311 can be cross-hinged at the same position of the first probe module 121. Similarly, the two second links 1312 can be cross-hinged to the second probe module 122. Further, the two second links 1312 can be cross-hinged at the same position of the second probe module 122.

[0116] As shown in FIG. 6 , the two first connecting rods 1311 and the two second connecting rods 1312 between the adjacent first probe modules 121 and the second probe modules 122 may form a quadrilateral structure, so that the adjacent first probe modules 121 and the second probe modules 122 may have higher adjustment stability.

[0117] Through the technical solution of the embodiment of the present application, multiple first connecting rods 1311 are cross-hinged to the first probe module 121, and / or multiple second connecting rods 1312 are cross-hinged to the second probe module 122, which can improve the adjustment stability between adjacent first probe modules 121 and second probe modules 122, thereby further improving the test performance of the probe device 100.

[0118] FIG7 shows another schematic structural diagram of the probe device 100 provided in an embodiment of the present application.

[0119] As shown in Figure 7, in the probe device 100 provided in an embodiment of the present application, the guide member 110 includes a guide groove 111 extending along the first direction x, and at least some of the multiple probe modules 120 are provided with a guide block 123 that cooperates with the guide groove 111, and at least some of the probe modules 120 are slidably connected to the guide groove 111 through the guide block 123.

[0120] Specifically, the guide groove 111 is arranged toward the plurality of probe modules 120, and the probe mounting seats of the plurality of probe modules 120 can be installed in the guide groove 111. The probe mounting seats of at least some of the plurality of probe modules 120 can be provided with a guide block 123, which can cooperate with the guide groove 111. Under the action of an external force, the guide block 123 can slide in the guide groove 111 along the first direction x.

[0121] In some embodiments, the guide block 123 can be an injection molded guide block provided on the probe mounting seat. The guide block 123 can be a non-metallic part such as plastic. The injection molded guide block formed by the injection molding process can be more maturely applied to the probe module 120, and the injection molded guide block has better wear resistance and smoothness, can be better adapted to the guide groove 111 and has a longer service life. In addition, the non-metallic guide block 123 can have better heat resistance, and even in a higher temperature environment, the guide block 123 will not be heated and melted to produce metal particles, etc., which will interfere with and affect the object to be tested (such as a battery, etc.) of the probe device 100.

[0122] Optionally, the guide block 123 can be fixed to the probe mounting base of the probe module 120 by various fixing connection methods known in the relevant art. As an example, the guide block 123 can be locked and connected to the probe mounting base by a connecting member such as a bolt. The embodiment of the present application does not limit the specific installation method of the guide block 123 in the probe module 120.

[0123] Through the technical solution of the embodiment of the present application, the guide member 110 in the probe device 100 is designed as a guide groove 111, and at least some of the multiple probe modules 120 are provided with a guide block 123 that cooperates with the guide groove 111. The probe module 120 can achieve a sliding connection with the guide groove 111 through the guide block 123. The overall technical solution has a simple structure, is easy to implement, and the sliding performance of the probe module 120 is better. The space required for the probe module 120 and the guide member 110 is also small, which is beneficial to improving the overall performance of the probe device 100.

[0124] Based on the embodiment shown in FIG. 7 , FIG. 8 shows another schematic structural diagram of the probe device 100 provided in an embodiment of the present application.

[0125] As shown in Figure 8, in an embodiment of the present application, the probe device 100 also includes: a driving member 140, a first end probe module 124 located at one end among the multiple probe modules 120 is fixedly connected to the guide member 110 (shown as a guide groove 111 in Figure 8), and a second end probe module 125 located at the other end among the multiple probe modules 120 is connected to the driving member 140, and the driving member 140 is used to drive the second end probe module 125 and the intermediate probe module to slide along the first direction x, wherein the intermediate probe module is a probe module located between the first end probe module 124 and the second end probe module 125 among the multiple probe modules 120.

[0126] Specifically, among the plurality of probe modules 120, a first end probe module 124 located at one end thereof may be fixed to the guide member 110, for example, the first end probe module 124 may be fixed in the guide groove 111. The other probe modules 120 except the first end probe module 124 may be slidably connected to the guide member 110, for example, slidably connected to the guide groove 111.

[0127] The second end probe module 125 located at the other end of the multiple probe modules 120 can be connected to a driving member 140, and the driving member 140 can provide an external force to the second end probe module 125 so that the second end probe module 125 slides along the first direction x in the guide member 110. Furthermore, the second end probe module 125 can be connected to the adjacent middle probe module via the connecting rod unit 131, and the adjacent middle probe modules can also be connected to each other via the connecting rod unit 131. Therefore, when the second end probe module 125 slides along the first direction x in the guide member 110 due to an external force, the second end probe module 125 can drive all the middle probe modules to slide along the first direction x in the guide member 110 through the connecting rod assembly 130, thereby effectively adjusting the distance between the multiple probe modules 120.

[0128] Through the technical solution of the embodiment of the present application, the first end probe module 124 located at one end of the multiple probe modules 120 is fixed, and the second end probe module 125 located at the other end of the multiple probe modules 120 is driven by the driving member 140, so that the middle probe module located between the first end probe module 124 and the second end probe module 125 in the multiple probe modules 120 can be driven to slide, thereby realizing the stepless adjustment of the distance between any two adjacent probe modules 120 in the multiple probe modules 120. Therefore, through this technical solution, there is no need to set too many additional mechanical structures in the probe device 100, and no manual intervention is required, and the stepless adjustment of the distance between any two adjacent probe modules 120 in the multiple probe modules 120 can be effectively realized, thereby improving the test performance and test efficiency of the probe device 100.

[0129] 8 , in some embodiments, the driving member 140 may include a driving rod 141 , the axial direction of the driving rod 141 is parallel to the first direction x, and the driving rod 141 is configured to move along the axial direction.

[0130] Specifically, in this embodiment, one end of the driving rod 141 can be fixedly connected to the second end probe module 125, and the driving rod 141 can move along the first direction x, so that the driving rod 141 can push the second end probe module 125 to slide in the first direction x.

[0131] Optionally, in the embodiment shown in Figure 8, in order to improve the installation stability of the driving rod 141 in the probe device 100, a fixing seat 143 may be configured in the driving member 140, and the driving rod 141 may be connected to the second end probe module 125 through the fixing seat 143. The fixing seat 143 may limit the movement of the driving rod 141 in the radial direction, so that the driving rod 141 only moves in the axial direction.

[0132] In some embodiments, the fixing base 143 can be fixedly connected to the guide member 110. For example, as shown in Figure 8, the fixing base 143 can be fixedly connected to the end of the guide groove 111. In this embodiment, the components of the probe device 100 are compact and relatively stable.

[0133] Through the technical solution of the embodiment of the present application, the driving rod 141 is used as the driving member 140 to drive the probe module 120. Under the premise of providing effective drive, the driving rod 141 will not occupy too much space in the probe device 100 and can be easily installed in the probe device 100.

[0134] 8 , optionally, the driving member 140 may further include a rod driving device 142 in addition to the driving rod 141 and the fixing seat 143. One end of the driving rod 141 is connected to the second end probe module 125, and the other end is connected to the rod driving device 142. The rod driving device 142 can be used to drive the driving rod 141 to move in the axial direction. Optionally, the rod driving device 142 can be a human-powered device, or an electric-powered device.

[0135] In some embodiments, the rod drive device 142 can be fixedly connected to the fixing base 143. For example, as shown in FIG8 , the rod drive device 142 can be fixedly connected to a side of the fixing base 143 away from the second end probe module 125. In this embodiment, the components of the probe device 100 are compact and relatively stable.

[0136] Continuing with reference to FIG7 , in some embodiments, a plurality of probe modules 120 are arranged in the second direction y of the guide member 110 (shown as the guide groove 111 in FIG8 ), and the second direction y is perpendicular to the first direction x. An electrical connector 126 is provided on each of the plurality of probe modules 120, and the electrical connector 126 is located in the third direction z of each probe module 120, and the third direction z is perpendicular to the first direction x and the second direction y.

[0137] Optionally, in some embodiments, the first direction x can be parallel to the horizontal direction, the second direction y can be parallel to the vertical direction, and multiple probe modules 120 are arranged below the guide member 110. When the guide member 110 includes a guide groove 111, the top of the multiple probe modules 120 can be provided with a guide block 123 to facilitate accommodation in the guide groove 111, so that the guide groove 111 can guide the probe modules 120 where the multiple guide blocks 123 are located.

[0138] An electrical connector 126 may be provided on the side of each probe module 120 in the plurality of probe modules 120 (i.e., in the third direction z of the probe module 120). The electrical connector 126 may be connected to a metal probe in the probe module 120 to transmit an electrical signal to the metal probe. As an example, the electrical connector 126 may be a metal busbar, such as a copper busbar. Electrical connectors such as flexible flat cables may be connected to the electrical connectors 126 of adjacent probe modules 120 to enable the use of adjacent probe modules 120 in conjunction with each other. Alternatively, the electrical connectors may be connected to an external power supply or test station and the electrical connectors 126 of the probe module 120 to enable signal transmission between the probe module 120 and an external test module.

[0139] Through the technical solution of the embodiment of the present application, the electrical connector 126 of the probe module 120 in the probe device 100 is not arranged in the first direction x of the probe module 120, and thus does not affect the stepless spacing adjustment of the adjacent probe module 120 in the first direction x. Moreover, the electrical connector 126 is also not arranged in the second direction y of the probe module 120, and thus does not increase the size of the probe module 120 in the second direction y, thereby increasing the thickness of the probe device 100 in the second direction y. By arranging the electrical connector 126 in the third direction z of the probe module 120, the overall structural design of the probe module 120 can be optimized, making the overall structure of the probe device 100 more compact and the layout of each component more reasonable.

[0140] 2 to 7 , the mechanism consisting of the guide member 110 , the plurality of probe modules 120 , and the connecting rod assembly 130 may be referred to as the probe mechanism 101 . Similarly, in the probe device 100 shown in FIG8 , the probe mechanism 101 may further include a driving member 140 .

[0141] Based on the probe mechanism 101 , FIG9 shows another schematic structural diagram of the probe device 100 provided in an embodiment of the present application.

[0142] As shown in Figure 9, the probe device 100 also includes: a first frame 102, at least one pair of probe mechanisms 101 can be arranged side by side on the first frame 102, and the at least one pair of probe mechanisms 101 are configured to correspond one-to-one to at least one row of batteries (not shown in Figure 9), and the probe modules 120 in each pair of probe mechanisms 101 are used to detect the electrode terminals of the corresponding row of batteries.

[0143] Specifically, in the embodiment of the present application, each pair of probe mechanisms 101 in the at least one pair of probe mechanisms 101 may include two probe mechanisms 101, and each probe mechanism 101 may be a structure in any of the embodiments shown in Figures 2 to 8 above. The two probe mechanisms 101 may be arranged side by side. As an example, the guide members 110 in the two probe mechanisms 101 may be arranged side by side along the third direction z.

[0144] The at least one pair of probe mechanisms 101 provided in the embodiment of the present application can be applied to at least one row of batteries. In some embodiments, the two electrode terminals of the battery (i.e., the positive electrode terminal and the negative electrode terminal) are arranged on the same end face of the battery. When a plurality of batteries are arranged in a row along the first direction x, two rows of electrode terminals arranged side by side are formed on the end faces of the plurality of batteries. Thus, the two probe mechanisms 101 in the at least one pair of probe mechanisms 101 can be used to detect the two rows of electrode terminals respectively, and the two rows of probe modules 120 in the two probe mechanisms 101 can correspond one to one to the two rows of electrode terminals.

[0145] Through the technical solution of the embodiment of the present application, the probe device 100 can be applied to the battery field for testing batteries. The stepless adjustment between the multiple probe modules 120 in the probe device 100 can enable the probe device 100 to be applied to batteries of different models and sizes, which is beneficial to improving the battery testing efficiency and the production capacity of the battery production line.

[0146] Continuing to refer to FIG. 9 , in some embodiments, the probe device 100 may further include: a heat sink 103 disposed on the first frame 102 , and the heat sink 103 is used to dissipate heat for at least one pair of probe mechanisms 101 .

[0147] Optionally, in the example shown in Figure 9, at least one pair of probe mechanisms 101 and heat sinks 103 may be arranged on opposite sides of the first frame 102. For example, at least one pair of probe mechanisms 101 may be arranged below the first frame 102, and the heat sink 103 may be arranged above the first frame 102.

[0148] The heat sink 103 includes but is not limited to an air-cooled heat sink. The first frame 102 is a frame-type structure. There may be an air gap between the heat sink 103 and at least one pair of probe mechanisms 101, so that the air-cooled heat sink can dissipate heat from at least one pair of probe mechanisms 101 through air flow.

[0149] Of course, in other embodiments, the heat sink 103 may also be other types of heat sinks, such as a water-cooled heat sink, etc., and this embodiment of the present application does not specifically limit this.

[0150] Through the technical solution of this embodiment, a heat sink 103 is provided in the probe device 100, which is beneficial for dissipating heat and cooling the multiple probe modules 120 and other related components in the probe device 100, thereby improving the operating performance and service life of the multiple probe modules 120 and the probe device 100 in which they are located.

[0151] Optionally, in some embodiments, at least one heat sink 103 is provided in a one-to-one correspondence with at least one pair of probe mechanisms 101 .

[0152] Specifically, in this embodiment, each pair of probe mechanisms 101 in at least one pair of probe mechanisms 101 has its corresponding heat sink 103. For example, in the embodiment shown in Figure 9, a heat sink 103 may include multiple fans, and the multiple fans are arranged in a row along the first direction x to dissipate heat for the probe modules 120 in a pair of probe mechanisms 101.

[0153] The technical solution of this embodiment is beneficial for achieving sufficient heat dissipation and cooling effect on each pair of probe mechanisms 101 in the probe device 100, thereby further improving the operating performance and service life of the multiple probe modules 120 and the probe device 100 in which they are located.

[0154] Continuing to refer to FIG. 9 , optionally, in some embodiments, a needle bearing 104 is provided on the first frame, and the probe device 100 is configured to be mounted on the detection equipment via the needle bearing 104 .

[0155] Specifically, in this embodiment, the needle bearing 104 can be configured with thin, long rollers. Despite its small cross-section, the needle bearing 104 still has a high load-bearing capacity. The probe device 100 is installed in the testing equipment via the needle bearing 104, allowing the probe device 100 to be fully withdrawn from the testing equipment, facilitating replacement and maintenance of components within the probe device 100.

[0156] The present application also provides a battery testing device. The battery testing device may be, for example, the battery testing device 10 shown in FIG1 . In some embodiments, the battery testing device may include a battery formation device.

[0157] The battery testing device provided in the embodiment of the present application may include: a testing platform and the probe device 100 provided in any of the above embodiments, wherein the testing platform may be the testing platform 200 shown in Figure 1 above, the testing platform 200 is used to place the battery 300, and the probe device 100 is used to detect the battery 300.

[0158] As an example, referring back to FIG1 , in the embodiment shown in FIG1 , the probe device 100 may include two pairs of probe mechanisms 101, and thus the two pairs of probe mechanisms 101 may be provided with two heat sinks 103. The two pairs of probe mechanisms 101 can simultaneously test two rows of batteries. It is understood that the probe device 100 may also include only one pair of probe mechanisms 101 or three or more pairs of probe mechanisms 101, thereby testing one row of batteries or three or more rows of batteries.

[0159] Through the technical solution of the embodiment of the present application, a probe device 100 is set in the battery testing equipment 10. On the basis that the multiple probe modules 120 in the probe device 100 can achieve rapid stepless adjustment, the battery testing equipment can quickly test batteries of different models and sizes, which is conducive to improving the production testing efficiency of the battery.

[0160] Although the present application has been described with reference to preferred embodiments, various modifications may be made thereto and components may be substituted with equivalents without departing from the scope of the present application. In particular, the various technical features described in the various embodiments may be combined in any manner as long as there are no structural conflicts. The present application is not limited to the specific embodiments disclosed herein, but encompasses all technical solutions within the scope of the claims.

Claims

1. A probe device, characterized in that: include: A guide member (110) extending along a first direction (x); A plurality of probe modules (120) are arranged on the guide member (110) along the first direction (x); at least some of the probe modules (120) are slidably connected to the guide member (110); and the guide member (110) is used to guide at least some of the probe modules (120) to slide in the first direction (x); The connecting rod assembly (130) comprises at least one connecting rod unit (131), wherein the connecting rod unit (131) is connected between two adjacent probe modules (120) among the plurality of probe modules (120), and the connecting rod unit (131) is capable of extending and retracting in the first direction (x).

2. The probe device according to claim 1, characterized in that The connecting rod unit (131) includes: a first connecting rod (1311) and a second connecting rod (1312), the first connecting rod (1311) and the second connecting rod (1312) are hinged to each other, and the first connecting rod (1311) is hinged to the first probe module (121) of the two adjacent probe modules (120), and the second connecting rod (1312) is hinged to the second probe module (122) of the two adjacent probe modules (120).

3. The probe device according to claim 2, characterized in that: The first probe module (121) is a middle module among the plurality of probe modules (120); The middle part of the first connecting rod (1311) is hinged to the first probe module (121), and the two ends of the first connecting rod (1311) are respectively hinged to one end of two second connecting rods (1312) in two adjacent connecting rod units (131).

4. The probe device according to claim 3, characterized in that: The second probe module (122) is a middle module among the plurality of probe modules (120); The first connecting rod (1311) is hinged to the first probe module (121) at the center point in the length direction, and the second connecting rod (1312) is hinged to the second probe module (122) at the center point in the length direction. The lengths of the first connecting rod (1311) and the second connecting rod (1312) are equal.

5. The probe device according to claim 2, characterized in that: The first probe module (121) is an end module among the plurality of probe modules (120); Two ends of the first connecting rod (1311) are respectively hinged to one end of the first probe module (121) and the second connecting rod (1312).

6. The probe device according to claim 5, characterized in that: The second probe module (122) is a middle module among the plurality of probe modules (120); The second connecting rod (1312) is hinged to the second probe module (122) at a center point in the length direction, and the length of the first connecting rod (1311) is half the length of the second connecting rod (1312).

7. The probe device according to any one of claims 2 to 6, characterized in that: The distance between two adjacent hinge points in the first connecting rod (1311) is equal to the distance between two adjacent hinge points in the second connecting rod (1312).

8. The probe device according to any one of claims 2 to 7, characterized in that: The connecting rod unit (131) includes: a plurality of the first connecting rods (1311) and a plurality of the second connecting rods (1312).

9. The probe device according to claim 8, characterized in that: A plurality of the first connecting rods (1311) are hinged to the same position of the first probe module (121), and / or a plurality of the second connecting rods (1312) are hinged to the same position of the second probe module (122).

10. The probe device according to claim 8 or 9, characterized in that: A plurality of the first connecting rods (1311) are cross-hinged to the first probe module (121), and / or a plurality of the second connecting rods (1312) are cross-hinged to the second probe module (122).

11. The probe device according to any one of claims 1 to 10, characterized in that: The guide member (110) comprises a guide groove (111) extending along the first direction (x); At least some of the probe modules (120) among the plurality of probe modules (120) are provided with guide blocks (123) that cooperate with the guide grooves (111), and at least some of the probe modules (120) are slidably connected to the guide grooves (111) via the guide blocks (123).

12. The probe device according to any one of claims 1 to 11, characterized in that: The probe device further comprises: a driving member (140); A first end probe module (124) located at one end among the multiple probe modules (120) is fixedly connected to the guide member (110), and a second end probe module (125) located at the other end among the multiple probe modules (120) is connected to the driving member (140), and the driving member (140) is used to drive the second end probe module (125) and the middle probe module to slide along the first direction (x), wherein the middle probe module is a probe module located between the first end probe module (124) and the second end probe module (125) among the multiple probe modules (120).

13. The probe device according to claim 12, characterized in that: The driving member (140) comprises a driving rod (141), the axial direction of the driving rod (141) is parallel to the first direction (x), and the driving rod (141) is configured to move along the axial direction.

14. The probe device according to any one of claims 1 to 13, characterized in that: The plurality of probe modules (120) are arranged in a second direction (y) of the guide member (110), and the second direction (y) is perpendicular to the first direction (x); Each probe module (120) among the plurality of probe modules (120) is provided with an electrical connector (126), and the electrical connector (126) is located in a third direction (z) of each probe module (120), and the third direction (z) is perpendicular to the first direction (x) and the second direction (y).

15. The probe device according to any one of claims 1 to 14, characterized in that The probe device also includes: first frame (102); The guide member (110), the plurality of probe modules (120) and the connecting rod assembly (130) form a probe mechanism (101); At least one pair of the probe mechanisms (101) are arranged side by side on the first frame (102), and at least one pair of the probe mechanisms (101) are configured to correspond one-to-one to at least one row of batteries. The probe modules (120) in each pair of the probe mechanisms (101) are used to detect electrode terminals of a corresponding row of batteries.

16. The probe device according to claim 15, characterized in that The probe device further comprises: a heat sink (103) arranged on the first frame (102), the heat sink (103) being used to dissipate heat for at least one pair of the probe mechanisms (101).

17. The probe device according to claim 16, characterized in that At least one of the heat sinks (103) is arranged in a one-to-one correspondence with the at least one pair of probe mechanisms (101).

18. The probe device according to any one of claims 15 to 17, characterized in that A needle bearing (104) is provided on the first frame (102), and the probe device is configured to be installed on the detection equipment through the needle bearing (104).

19. A battery testing device, characterized in that: include: A testing platform for placing batteries; The probe device according to any one of claims 1 to 18, used for detecting the battery.

20. The battery testing device according to claim 19, characterized in that: The battery testing equipment includes a battery formation equipment.

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