8E counter-based hardware test method and test system thereof
Through the hardware testing method based on 8E counter, the problems of low efficiency and inconsistent results of traditional testing methods are solved, and efficient and accurate test results and product quality control are achieved.
CN119644117APending Publication Date: 2025-03-18真诺测量仪表(上海)有限公司
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Patent Information
- Application Number
- CN202411927161.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-25
- Publication Date
- 2025-03-18
AI Technical Summary
Technical Problem
The traditional 8E counter hardware testing method relies on manual operations and simple tools, resulting in low testing efficiency, inconsistent results, and difficulty in ensuring continuous improvement of product quality.
Method used
The hardware testing method based on the 8E counter is adopted, including obtaining the electronic parameters of the test item, configuring the test fixture and environment, performing precise positioning and communication connections, performing multiple functional tests, and evaluating the test results through preset standards to obtain the overall hardware test level.
Benefits of technology
提高了8E计数器硬件测试的效率和准确性,确保了测试结果的一致性和可靠性,提供了科学、量化的评估结果,提升了产品质量控制能力。
✦ Generated by Eureka AI based on patent content.
Abstract
The invention discloses a hardware test method and system based on an 8E counter, and relates to the technical field of hardware test.The method comprises the steps that electronic parameters of a tested object are obtained, and a corresponding test jig and a test environment are configured according to the electronic parameters; the tested product is accurately positioned, so that the tested product is located at the same designated position after each feeding, and the test fixture establishes communication connection with the tested product; performing various functional tests on the tested object in the test environment, wherein the various functional tests include but are not limited to a short-circuit power consumption test, a resistance detection test and a liquid crystal display function test; a test result of each test item is obtained based on the functional test, the standard reaching condition of each test item is determined in combination with a preset functional standard, the overall hardware test grade of the tested product is comprehensively evaluated and obtained, and the overall hardware test grade is used for representing the comprehensive performance of the tested product in each functional test terminal; according to the invention, the testing efficiency and accuracy of 8E counter hardware testing are improved.
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