Electric connector production and test integrated equipment

By designing an integrated electrical connector production and testing equipment, the principle of thermal expansion and contraction is used to improve assembly accuracy, and simulate different environments in the equipment for testing, the problems of low assembly accuracy of electrical connectors and inaccurate test results are solved, and higher assembly accuracy and testing accuracy are achieved.

CN119651311APending Publication Date: 2025-03-18安徽鸿崎电子技术有限公司
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Patent Information

Application Number
CN202411841561.4
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-12-13
Publication Date
2025-03-18

AI Technical Summary

Technical Problem

The electrical connector assembly accuracy is low, which leads to poor contact in subsequent tests, and there is a significant difference between the test performance and the actual application performance, and the test results are inaccurate.

Method used

Design an integrated electrical connector production and testing equipment, and use the hot bin and the cold bin to cool the metal parts and heat the shell respectively, and realize the plug assembly through the principle of thermal expansion and contraction, and simulate high and low temperature environments during the test to detect the performance of the electrical connector in different usage environments.

Benefits of technology

It improves the accuracy of plug assembly, ensures that the metal parts and the shell can fit tightly, effectively reduces the failure rate of the electrical connector, and improves the accuracy and reliability of the test results.

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Abstract

The invention discloses production and test integrated equipment for an electric connector. The production and test integrated equipment comprises a base, a first feeder, a second feeder and a workbench, a hot bin and a cold bin are fixedly installed on the base, a semiconductor chilling plate is fixedly installed between the adjacent end faces of the hot bin and the cold bin, the semiconductor chilling plate comprises a cold end and a hot end, and the hot end of the semiconductor chilling plate is located in the hot bin and fixedly provided with a first fin. The cold end of the semiconductor chilling plate is located in the cold bin and fixedly provided with a second fin. Compared with the prior art, according to the principle of expansion with heat and contraction with cold, it is ensured that the metal piece and the shell can be tightly attached, and the plug-in assembly precision is effectively improved; according to the invention, the hot bin and the cold bin can respectively simulate high and low temperature environments in the testing process after the electric connector is assembled, so that the performance of the electric connector in different use environments can be detected, and the accuracy and reliability of the testing result can be improved.
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