Solar cell tracing method, system for realizing tracing and solar cell

Abstract

The invention discloses a solar cell tracing method, a system for realizing tracing and a solar cell. The solar cell tracing method comprises the following steps: in a substrate production process, collecting production related data of all substrates, and determining production related data of screened qualified substrates; generating a feature code for the qualified matrix by using the production related data of the qualified matrix; the laser equipment records the feature code to a specific position of the qualified substrate; in each production process of producing a solar cell by using a qualified substrate, cell related data of the solar cell is collected, a first association relationship between the cell related data and production related data of the qualified substrate is established, information included in a feature code is expanded based on the first association relationship, and a terminal device scans the feature code and sends the information to the qualified substrate. And battery related data corresponding to the solar battery and production related data of the substrate used by the solar battery are provided for the terminal equipment. The resistivity of the single crystal silicon rod is accurately regulated and controlled, and the axial resistivity of the single crystal silicon rod is consistent.

Description

Technical Field

[0001] The invention relates to a solar cell tracing method, a system for realizing tracing and a solar cell. Background Art

[0002] The current photovoltaic industry is full of competition, and increasing production and reducing costs are the key issues that all companies are concerned about. Millions of crystalline silicon wafers are often used at the same time on the battery side. The current industry achieves tracking of hundreds of wafers by implanting chips in flower baskets. However, these silicon wafers go through multiple processes such as cleaning, texturing, diffusion, etching, oxidation, and coating. If wafer-level tracking cannot be achieved, the final batch data cannot accurately locate and optimize a single device and a single parameter, making it difficult to quickly improve the output and performance of the battery cells. At the same time, the traceability method used by the production line to assign virtual codes to single silicon wafers has poor response capabilities to special situations such as debris and belt speed fluctuations. Virtual codes often appear misplaced or inverted, and wafer-level tracking cannot be accurately achieved. Summary of the invention

[0003] In view of this, the present invention provides a solar cell tracing method, a system for realizing tracing, and a solar cell, which can realize information tracing using the same characteristic code from the substrate used by the solar cell to the completion of the production of the solar cell and the application of the solar cell in a photovoltaic module, thereby making the solar cell traceable. In addition, the solar cell tracing method marks the substrate with a characteristic code from the hardware level, thereby forming a deep and unique binding between the information and the silicon wafer, thereby realizing accurate tracing.

[0004] In order to solve the above technical problems, the present invention provides the following technical solutions:

[0005] In a first aspect, the present invention provides a solar cell tracing method comprising:

[0006] Step 1: During the production process of the substrate, the production-related data of the substrate is collected, and the production-related data of the screened qualified substrate is determined;

[0007] Step 2: using the production-related data of the qualified substrate to generate a feature code for the qualified substrate;

[0008] Step 3, using a laser device to burn the characteristic code into a specific position of the qualified substrate;

[0009] Step 4. In each production process of producing solar cells using the qualified substrate, battery-related data of the solar cell is collected, and a first association relationship is established between the battery-related data and the production-related data of the qualified substrate, so as to expand the information contained in the feature code based on the first association relationship, and enable a terminal device to scan the feature code to provide the terminal device with the production-related data and the battery-related data corresponding to the solar cell.

[0010] In a second aspect, an embodiment of the present invention provides a system for achieving traceability, including: a laser device and a server system, wherein:

[0011] The server system is used to collect production-related data of the substrate during the substrate production process, and determine the production-related data of the screened qualified substrate; generate a feature code for the qualified substrate using the production-related data of the qualified substrate, and output the feature code to the laser device;

[0012] The laser device is used to burn the characteristic code provided by the server system into a specific position of the qualified substrate;

[0013] The server system is further used to collect battery-related data of the solar cell in each production process of producing solar cells using the qualified substrate, and establish a first association relationship between the battery-related data and the production-related data of the qualified substrate, so as to expand the information contained in the feature code based on the first association relationship, enable the terminal device to scan the feature code, and provide the terminal device with battery-related data and production-related data corresponding to the solar cell.

[0014] In a third aspect, an embodiment of the present invention provides a solar cell, comprising: a feature code engraved on a substrate of the solar cell by laser;

[0015] Preferably, the characteristic code is formed based on the solar cell tracing method provided in the first aspect embodiment above;

[0016] Preferably, the substrate of the solar cell is a silicon substrate;

[0017] Preferably, the depth of the characteristic code on the substrate is 4 μm to 20 μm;

[0018] Preferably, the size of the characteristic code is 0.5mm×0.5mm~5×5mm, the code point diameter is 20μm~60μm, the code point spacing is 50μm~150μm, and the information capacity contained is 10~25 digits / letters;

[0019] Preferably, the feature code is located in the middle of the front side of the solar cell and spans over at least one thin grid line; or, the feature code is located between two adjacent thin grid lines in the middle of the front side of the solar cell; or, the feature code is located on the outside of the grid lines at the edge of the front side of the solar cell; or, the feature code is located at the harpoon position at the edge of the front side of the solar cell.

[0020] The technical solution of the first aspect of the above invention has the following advantages or beneficial effects:

[0021] The technical solution provided by the embodiment of the present invention generates a feature code for a qualified substrate based on the production-related data of the screened qualified substrate during the substrate production process, and burns the feature code to a specific position of the qualified substrate through a laser device, so that the feature code can identify and trace the qualified substrate. Further, in each production process of using a qualified substrate to produce a solar cell, by establishing a first association relationship between the battery-related data and the production-related data of the qualified substrate, and by using the first association relationship to expand the information contained in the feature code, the battery-related data of the solar cell can be further traced based on the feature code. That is to say, the technical solution provided by the embodiment of the present invention can not only trace the battery-related data of the solar cell through a feature code, making the solar cell traceable, but also trace the production-related data of the substrate used to prepare the solar cell, that is, from the substrate used by the solar cell until the solar cell is produced and the solar cell is applied to the photovoltaic module, the same feature code is used to achieve information tracing.

[0022] In addition, the solar cell traceability method provided in the embodiment of the present invention realizes feature code marking of the substrate from the hardware level, so that the information is deeply and uniquely bound to the substrate and the battery-related data of the solar cell prepared by the substrate, thereby realizing accurate tracing of the battery-related data of the solar cell and the production-related data of the substrate used to prepare the solar cell. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] Figure 1 is a schematic diagram of the main process of a solar cell tracing method according to an embodiment of the present invention;

[0024] Figure 2 is a schematic diagram of the position of a feature code set in the middle of the front side of a solar cell according to an embodiment of the present invention;

[0025] Figure 3 is a schematic diagram of the position of setting a characteristic code at the harpoon mouth position on a solar cell according to an embodiment of the present invention;

[0026] Figure 4 is a schematic diagram of a main process of burning a feature code into a specific position of a qualified substrate according to an embodiment of the present invention;

[0027] Figure 5 1. It is a schematic diagram of the main process of identifying the authenticity of a solar cell based on a dot matrix two-dimensional code according to an embodiment of the present invention;

[0028] Figure 6 It is a main structural diagram of a system for realizing traceability according to an embodiment of the present invention. DETAILED DESCRIPTION

[0033] Although the substrate end (such as the silicon wafer end) and the battery end of the current solar cell have been digitally managed, that is, in the production process, relevant information such as the furnace table date, process parameters, quality data, etc. are entered into the MES system (a production information management system for the execution layer of the manufacturing enterprise workshop), but due to the large amount of material input and the long process at the battery end, the various data of the two links (the substrate production-related data and the battery-related data of the solar cell) have not been able to be connected. At present, only the batch information of the battery end can be obtained, and it is impossible to accurately trace the production-related data of the substrate (such as the raw silicon wafer) from a specific battery cell in the photovoltaic module. At present, the virtual code traceability established by the algorithm of EAP (authentication framework) is often used, and the virtual code is stored in the digital system. However, the virtual code will be disturbed by special circumstances such as fragments and shutdowns on site, and there is no way to ensure that the information recorded in the digital system completely corresponds to the actual flow path of the battery, and it is impossible to trace the production-related data of the substrate for the battery cell in the solar cell or photovoltaic module. In order to solve the above-mentioned problems existing in the prior art. The embodiment of the present invention provides a solar cell traceability method, a system for realizing traceability, and a solar cell.

[0034] Embodiments of the present invention are described in detail below, examples of which are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present invention, and cannot be understood as limiting the present invention.

[0035] It should be noted that the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include one or more of the features. In the description of the present invention, the meaning of "plurality" is two or more, unless otherwise clearly and specifically defined.

[0036] in, Figure 1A schematic diagram showing the main flow of a solar cell tracing method provided by an embodiment of the present invention; Figure 3 A schematic diagram exemplarily showing the position of a dot matrix two-dimensional feature code on a solar cell; Figure 4 A schematic diagram showing the main process of burning a feature code into a specific position of a qualified substrate; Figure 5 A schematic diagram showing the main process of identifying the authenticity of solar cells based on dot matrix two-dimensional codes; Figure 6 A main structural diagram of a system for implementing traceability provided by an embodiment of the present invention is shown.

[0037] like Figure 1 As shown, the solar cell tracing method may include the following steps:

[0038] Step S101: During the substrate production process, the production-related data of the substrate is collected, and the production-related data of the screened qualified substrates is determined.

[0039] The substrate may be a glass, transparent material or other substrate required for perovskite cells, or a silicon substrate required for the production of silicon-based solar cells. Preferably, for the production of silicon-based solar cells, the silicon substrate is a P-type or N-type semiconductor doped with one element alone or multiple elements including but not limited to boron, gallium, phosphorus, antimony and arsenic.

[0040] Among them, the above qualified matrix can be screened out from all the matrixes through the inspection of instruments and equipment.

[0041] Among them, the production-related data of the matrix refers to the equipment parameters used to produce the matrix (furnace type, furnace size, furnace number, machine number, production / processing time, etc.), process parameters (power, crucible position, liquid mouth distance, etc.), raw material information, crystal specifications, matrix specifications (dopant type, thickness, size, etc.), crystal quality (oxygen, carbon content, resistivity, minority carrier lifetime, etc.), matrix quality (resistivity, minority carrier lifetime, TTV, line mark value, etc.), and other information.

[0042] The step of determining the production-related data of the screened qualified substrate can be to collect the production data related to the substrate in the previous production process, integrate these production data, and screen the production-related data corresponding to the qualified substrate from the integrated data. Determining the production-related data of the qualified substrate by this step can reduce the amount of data involved in the subsequent process.

[0043] It is worth noting that for silicon substrates, the production process of silicon substrates generally includes silicon rod drawing process, silicon rod squaring and grinding process, knife matching and rod gluing process, slicing and degumming process, silicon wafer cleaning process, sorting and packaging process, etc. (select qualified substrates from the cleaned silicon wafers and burn characteristic marks). The qualified substrates selected in this step are the qualified substrates selected in the screening process.

[0044] Step S102: Generate a feature code for the qualified substrate using production-related data of the qualified substrate.

[0045] Specifically, the production-related data of each production process of the substrate and the serial number assigned to the screened qualified substrate on the screening device are integrated to generate a feature code for the qualified substrate. The feature code can be a barcode, a dot matrix QR code, a QR code with a positioning mark, etc. For example, taking the feature code as a dot matrix QR code, the produced dot matrix QR code can have a variety of different structures and patterns, such as a QR code composed of code points of the same size or different sizes, a QR code composed of black and white blocks in different forms, etc.

[0046] The method for generating the characteristic code is to input the production-related data of each production process and the serial number assigned to the screened qualified substrates on the screening device into a preset characteristic code generation algorithm to obtain the characteristic code layout.

[0047] It is worth noting that the dot matrix two-dimensional code is only an example, for example, the identification code format is QR Code Version 1, and the number of units is 21 × 21. In addition, the above-mentioned feature code can also be a three-dimensional code or other forms of two-dimensional code.

[0048] Furthermore, a dot matrix two-dimensional code containing code points of multiple set sizes is generated for a qualified substrate, wherein the proportion of code points of multiple set sizes is a preset fixed value. For example, the dot matrix two-dimensional code contains large-sized code points and a specific number of small-sized code points and / or the ratio of the number of large-sized code points contained in the dot matrix two-dimensional code to the number of small-sized code points is a fixed value. By taking a picture of the dot matrix two-dimensional code and analyzing the proportion of code points of multiple set sizes in the dot matrix two-dimensional code according to the taken image, if the proportion of code points of multiple set sizes in the dot matrix two-dimensional code in the image is analyzed to be a preset fixed value, it is determined that the dot matrix two-dimensional code is a real dot matrix two-dimensional code. If the dot matrix two-dimensional code in the image is analyzed to be only a fixed size of dot matrix, it means that the dot matrix two-dimensional code is a counterfeit two-dimensional code, indicating that the solar cell is a counterfeit product. Therefore, the proportion of code points of multiple set sizes can be set to a preset fixed value to realize offline identification of whether the solar cell is genuine or counterfeit, so as to improve the anti-counterfeiting property of the solar cell. Among them, for the dot matrix two-dimensional code containing code points of different sizes, the diameter of the smaller code point can be 20μm to 30μm, the diameter of the larger code point can be 50μm to 60μm, and the ratio of the smaller code point to the larger code point is generally controlled between 10:1 and 1:10. For example, the diameter of the smaller code point can be 20μm, 22μm, 25μm, 27μm, 28μm or 30μm, and the diameter of the larger code point can be 50μm, 53μm, 55μm, 57μm, 59μm or 60μm. The ratio of the smaller code point to the larger code point can be 10:1, 9:1, 8:1, 6:1, 5:1, 1:1, 1:3, 1:5, 1:8 or 1:10, etc. By limiting the diameter of smaller code points and the diameter of larger code points for the dot matrix two-dimensional code, it is convenient to quickly and completely mark the dot matrix two-dimensional code on the substrate, so that the rate of generating the feature code and burning the feature code in the subsequent step S103 can meet the production rate requirements of the substrate production line.

[0049] Further, after the above step S101, it may also include: generating a virtual code for the qualified substrate, wherein the generation of the virtual code for the qualified substrate may be completed before the above step S102, or may be performed after the above step S102. The purpose of the virtual code is to facilitate electronic management and search for production-related data of the qualified substrate and battery-related data generated by the subsequent production of solar cells. Specifically, after the virtual code is generated for the qualified substrate, a second association relationship between the virtual code and the feature code is established, the virtual code and the second association relationship are stored, and the production-related data of the qualified substrate is stored based on the virtual code. Wherein, the virtual code may be the same as the feature code, or may be different from the feature code. Preferably, the virtual code is the same as the feature code to facilitate the management of the second association relationship between the virtual code and the feature code. Wherein, the second association relationship refers to a mapping or linking relationship between the feature code and the virtual code, and the virtual code can be automatically searched and located based on the feature code.

[0050] Furthermore, in the case of the virtual code generated for the qualified substrate in the above step S102, the virtual code may also be generated based on a feature code (such as a dot matrix two-dimensional code), and the virtual code may be the same as or different from the feature code.

[0051] Furthermore, the virtual code may be corrected based on a feature code (such as a dot matrix two-dimensional code) to ensure that the established second association relationship is accurate and improve the accuracy of data management.

[0052] Step S103: The characteristic code is engraved into a specific position of the qualified substrate by means of a laser device.

[0053] Specifically, the pattern of the characteristic code in the above step S102 is sent to the laser device, and the laser device then engraves the characteristic code into a specific position of the corresponding qualified substrate.

[0054] The specific position may be a position determined by the user according to the needs. For example, the specific position may correspond to the middle of the front side of the solar cell across at least one fine grid line (that is, the specific position may be covered by at least one fine grid line, as long as most of the area of ​​the feature code is not covered by the fine grid line); the specific position may also correspond to between two adjacent fine grid lines in the middle of the front side of the solar cell, such as Figure 2 The characteristic mark 1 and the characteristic mark 2 shown in the figure; the specific position may also correspond to the outer side of the grid line of the front edge of the solar cell; the specific position may also correspond to the harpoon position of the front edge of the solar cell. Figure 3As shown, when the specific position is the harpoon mouth position, the set feature code can be located inside the harpoon mouth (i.e., the size of the feature code is smaller than the width of the inner side of the harpoon mouth), the feature code edge can also be flush with the inner side of the harpoon mouth (i.e., the length of the feature code is consistent with the width of the inner side of the harpoon mouth), and the feature code edge can also be flush with the outer side of the harpoon mouth (i.e., the length of the feature code is consistent with the width of the outer side of the harpoon mouth). Preferably, the specific position is the harpoon mouth position corresponding to the front edge of the solar cell. The edge of the above feature code can be located inside the harpoon mouth, can be flush with the inner side of the harpoon mouth, and can also be flush with the outer side of the harpoon mouth.

[0055] In addition, the feature code recorded in this step can also be a feature code carrying fluorescent materials. The specific implementation method of the feature code carrying fluorescent materials can be that before step S103, the fluorescent material is sprayed on the above-mentioned specific position of the qualified substrate; accordingly, the specific implementation method of step S103 may include: irradiating the fluorescent material at the specific position with the laser emitted by the laser device, and in the process of recording the feature code, the fluorescent material is synchronously embedded in the feature code. The setting of the fluorescent material can facilitate the subsequent laser device to locate the specific position, and can facilitate the subsequent identification of the small-sized feature code.

[0056] In addition, in this step, a laser device with a laser wavelength of 200nm~1064nm and a power of 500mw~10w can be selected to ensure that the feature code is clearly engraved and avoid the laser device from damaging the substrate. For example, the laser wavelength can be 200nm, 355nm, 380nm, 450nm, 500nm, 620nm, 700nm, 800nm, 880nm, 920nm, 980nm, 1000nm or 1064nm, etc.

[0057] Furthermore, the depth of the characteristic code recorded on the qualified substrate in step S103 is generally 4μm to 20μm, for example, the depth of the recorded characteristic code can be 4μm, 5μm, 5.5μm, 6μm, 6.5μm, 7μm, 8μm, 9μm, 10μm, 12μm, 15μm, 17μm, 18μm or 20μm, etc. Preferably, the depth of the recorded characteristic code is 8μm. By controlling the depth of the characteristic code recorded on the qualified substrate to be within the range of 4μm to 20μm, even after various functional layers of solar cells are subsequently covered on the substrate, the characteristic code can still be clearly and accurately identified, and the depth control of the characteristic code can also prevent the substrate from being damaged.

[0058] Furthermore, the size of the feature code recorded in this step can be 0.5mm×0.5mm~5×5mm, the code point diameter can be 20μm~60μm, the code point spacing can be 50μm~150μm, and the information capacity contained can be 10~25 digits / letters. By controlling the size, code point diameter and code point spacing of the feature code, the recording speed and the code reading speed can be faster, and the recording speed and the subsequent code reading speed can catch up with the production rate of the production line to meet the better production requirements. For example, the size of the feature code can be 0.5mm×0.5mm, 1mm×1mm, 2mm×2mm, 1mm×2mm, 3mm×3mm, 3mm×1mm, 3mm×2mm, 4mm×4mm, 4mm×3mm, 4mm×2mm, 5mm×5mm, 5mm×4mm, 5mm×3mm, etc.; the code point diameter can be 20μm, 30μm, 40μm, 50μm or 60μm, etc., and the code point spacing can be 50μm, 70μm, 80μm, 90μm, 100μm, 120μm, 130μm or 150μm, etc. The information capacity can be 10~25 digits / letters, 13 digits / letters, 15 digits / letters, 18 digits / letters, 20 digits / letters or 25 digits / letters, etc.

[0059] Step S104: In each production process of producing solar cells using a qualified substrate, battery-related data of the solar cell is collected, and a first association relationship is established between the battery-related data and the production-related data of the qualified substrate, so as to expand the information contained in the feature code based on the first association relationship, enable the terminal device to scan the feature code, and provide the terminal device with the battery-related data corresponding to the solar cell and the production-related data of the substrate used for the solar cell.

[0060] Among them, the various production processes of solar cells can be cleaning, texturing, various functional layer preparation processes, electrode preparation processes, etc., and the battery-related data include raw material information, process parameters, production data, battery quality data, etc. For example, the raw material information may include the name of the raw materials used, the main components of the raw materials, the raw material manufacturers, the raw material suppliers, etc., and the process parameters may include the amount of materials used in each process, the solution concentration, the operating parameters of all equipment in the process, etc., such as the amount of cleaning liquid in the cleaning process, the concentration of the cleaning liquid, the amount of texturing liquid in the texturing process, the concentration of the texturing liquid, the model of the equipment used in the texturing process, the equipment operating parameters, etc. Production data refers to the parameters of each functional layer produced by each production process, such as the type of solar cell, the functional layers contained, the thickness of each functional layer, etc. Battery quality data generally refers to the test results of the produced solar cells, the battery IV curve, etc. It is worth noting that after the solar cell is applied to the photovoltaic power station, the information of the photovoltaic power station, the test results of the battery cells from the solar cell during the use of the photovoltaic power station, etc. can also be uploaded based on the feature code, and it is also used as part of the battery-related data.

[0061] The first association relationship refers to the existence of a relationship between the stored battery-related data of the solar cell and the production-related data of the substrate used by the solar cell, through which the battery-related data of a solar cell and the production-related data of the substrate used by the solar cell can be accurately located. The relationship between the battery-related data and the production-related data can be established with the virtual code.

[0062] It is worth noting that the above battery-related data and production-related data can be stored in a database.

[0063] Furthermore, the above step S104 may also include: in each production process, in response to the terminal device scanning the feature code on the qualified substrate, according to the second association relationship, determining the virtual code associated with the feature code; in the case where the virtual code in the established first association relationship is inconsistent with the virtual code associated with the feature code, using the virtual code associated with the feature code to correct the virtual code in the first association relationship. That is, the virtual code is corrected based on the feature code to ensure that the virtual code is determined based on the feature code, so as to solve the problem that the feature code engraved on the substrate is not easy to change, and the correspondence and consistency between the virtual code and the feature code can be ensured, thereby improving the accuracy of subsequent query data for solar cells.

[0064] The above technical solution provided by the embodiment of the present invention generates a feature code for a qualified substrate based on the production-related data of the screened qualified substrate during the substrate production process, and burns the feature code to a specific position of the qualified substrate through a laser device, so that the feature code can identify and trace the qualified substrate. Further, in each production process of using a qualified substrate to produce a solar cell, by establishing a first association relationship between the battery-related data of the solar cell and the production-related data of the qualified substrate used by the solar cell, and by using the first association relationship to expand the information contained in the feature code, the battery-related data of the solar cell can be further traced based on the feature code. That is to say, the technical solution provided by the embodiment of the present invention can not only trace the battery-related data of the solar cell through a feature code, so that the solar cell has traceability, but also can trace the production-related data of the substrate used to prepare the solar cell, that is, from the substrate used by the solar cell until the solar cell is produced and the solar cell is applied to the photovoltaic module, the same feature code is used to achieve information tracing.

[0065] In addition, in the process of tracing solar cell related data, the manufacturing history and quality parameters of the substrate can be traced, which helps to improve production transparency and product quality control. Furthermore, by analyzing the collected solar cell data, potential problems in the production process can be discovered in a timely manner, thereby providing reliable data support for continuous optimization of process flow, improvement of product performance and reduction of production costs.

[0066] Furthermore, a laser device and a high-definition camera are arranged on the screening device of the substrate; wherein the number of the high-definition camera can be one or more, and the number of the laser device can also be one or more. Based on this, if Figure 4 As shown, the specific implementation of the above step S103 may include the following steps:

[0067] Step S1031: positioning the screened qualified substrates through a high-definition camera provided on the substrate screening device.

[0068] The substrate screening device may be an existing screening device in the existing substrate production process. By installing a high-definition camera in the existing screening device, the time when the substrate edge is recognized by the high-definition camera, the distance between the high-definition camera and the laser device, and the conveying speed of the substrate on the screening device are used to calculate the time when a specific position of the substrate reaches the laser device. According to the calculation result, after the specific position of the substrate reaches the laser device, the laser device can accurately locate the specific position and burn the feature code at the specific position.

[0069] Step S1032: When the high-definition camera locates the qualified substrate, the specific position of the qualified substrate is determined for the laser device according to the positioning result of the high-definition camera.

[0070] Step S1033: Control the laser device provided on the substrate screening device to burn the characteristic code at a specific position.

[0071] Preferably, the marking rate of the laser device can be 0.07 seconds per piece to 0.2 seconds per piece. For example, the marking rate of the laser device can be 0.07 seconds per piece, 0.09 seconds per piece, 0.1 seconds per piece, 0.15 seconds per piece, 0.17 seconds per piece or 0.2 seconds per piece.

[0072] Through the above process, it is possible to automatically locate the specific position of the substrate and for the laser device to automatically burn the feature code for the substrate, so that the entire process can be completed automatically, reducing or even avoiding manual operations.

[0073] Furthermore, after the above step S1033, it may further include: blowing air and removing dust from the substrate through a dust removal device. Specifically, the dust removal device has a blowing function and a dust removal function. After the above laser device burns the feature code at a specific position, the silicon powder generated by burning the feature code is blown up through the blowing function of the dust removal device, and then the blown silicon powder is removed through the dust removal function of the dust removal device (specifically, the dust removal function can suck away the blown silicon powder through the dust removal pipe). Through this dust removal process, it is possible to avoid silicon powder from being deposited on the surface of the substrate, thereby preventing the silicon powder generated by burning the feature code from affecting the subsequent substrate transportation and battery production process.

[0074] For the dust removal device, 4 to 16 blowing ports can be evenly opened around the side wall of the device body (for example, the number of the blowing ports can be 4, 8, 10, 12, 14 or 16, etc.), and the horizontal distance between each blowing port and the substrate is 5mm~50mm (wherein, the horizontal distance between the blowing port and the substrate refers to the distance between the projection point of the center of the blowing port on the plane where the substrate is located and the position of the recorded characteristic code. For example, the horizontal distance between the blowing port and the substrate is 5mm, 10mm, 20mm, 25mm, 30mm, 40mm or 50mm, etc.), and the vertical distance between the blowing port and the substrate is 5mm ~20mm (wherein, the vertical distance between the blowing port and the substrate refers to the distance between the center of the blowing port and the projection point on the plane where the substrate is located, for example, the vertical distance between the blowing port and the substrate can be 5mm, 7mm, 8mm, 10mm, 15mm, 18mm or 20mm, etc.), and the angle between the blowing direction and the substrate surface is 10°~45° (wherein, the angle between the blowing direction and the substrate surface refers to the angle between the projection of the blowing direction on the substrate surface and the blowing direction, for example, the angle can be 10°, 15°, 20°, 30° or 45°). It is worth noting that the blowing port blows an inert gas such as argon to the substrate to avoid oxidation on the substrate surface.

[0075] Furthermore, the dust removal device may also include a dust suction device, which is located above the substrate, and the distance between the dust suction device and the substrate is 20 mm to 50 mm (for example, the distance between the dust suction device and the substrate may be 20 mm, 25 mm, 30 mm, 35 mm, 40 mm, 45 mm or 50 mm, etc.), and the dust suction device sucks away the silicon powder dust blown up by the air outlet through the dust removal pipe. The air flow rate of the dust removal device for blowing and dust suction can be set by the system to achieve the best dust removal effect.

[0076] Furthermore, the solar cell traceability method may further include: setting a code reading device in each production process of producing solar cells; accordingly, the specific implementation of the above step S104 may include: each production process is used as the current production process, and a code reading device is set through the current production process to read the feature code on the qualified substrate to obtain production-related data corresponding to the feature code and process parameters of the production process before the current production process; and establishing a first association relationship between the process parameters corresponding to the current production process and the production-related data of the qualified substrate and the process parameters of the production process before the current production process.

[0077] For example, in the texturing process of solar cells, a code reading device provided in the texturing process is used to scan a characteristic code on a substrate to obtain production-related data of the substrate associated with the characteristic code and process parameters generated by a production process before the texturing process. Thus, in the texturing process, an association relationship is established between the process parameters of the texturing process and the production-related data of the substrate and the process parameters of the process before the texturing process, thereby realizing real-time storage of the process parameters in a database and establishing in real time an association relationship between the process parameters generated by each process and the production-related data of the substrate to ensure the accuracy of the data relationship.

[0078] Furthermore, if Figure 5 As shown, after the above step S104, the following steps may be further included:

[0079] Step S105: when the dot matrix two-dimensional code is scanned by a terminal device, the camera parameters of the terminal device, the distance from the camera of the terminal device to the dot matrix two-dimensional code, and the light source angle are determined, and the actual size of the code points contained in the dot matrix two-dimensional code and the proportion of code points of various actual sizes in the dot matrix two-dimensional code are calculated; when the actual size is consistent with the set size and the proportion of code points of various actual sizes is consistent with the preset fixed value, step S106 is executed; when the actual size is inconsistent with the set size and / or the proportion of code points of various actual sizes is inconsistent with the preset fixed value, step S107 is executed;

[0080] Among them, the camera parameters are obtained directly from the terminal device after obtaining the authorization of the terminal device. The distance from the camera of the terminal device to the dot matrix QR code is determined based on the distance test component installed in the terminal device. The light source angle is determined based on the color, roughness and reflectivity of the first light-receiving surface of the silicon wafer, semi-finished battery and finished battery in each link. Based on this, the light source and camera height are set differently in each link to ensure the accuracy and speed of code reading.

[0081] In addition, in the case where the above-mentioned dot matrix two-dimensional code contains a specific ratio of larger-sized code points and smaller-sized code points, the actual size of the code points and the proportion of code points of various actual sizes in the dot matrix two-dimensional code can be calculated according to the pre-established calculation relationship, the size of the image captured by the terminal device and the size of each code point in the feature code in the image. Among them, the calculation relationship can be established based on a variety of test data, and the specific calculation relationship to be used can be determined based on the actual test data, and the calculation relationship is not limited here.

[0082] Step S106: Determine that the solar cell where the dot matrix QR code scanned by the terminal device is located is authentic;

[0083] Step S107: Determine that the solar cell where the dot matrix two-dimensional code scanned by the terminal device is located is a counterfeit.

[0084] Through the above process, when the terminal device is offline, through the application installed on the terminal device, it is possible to identify whether the solar cell is genuine or a counterfeit based on the calculated actual size of the code points contained in the dot matrix two-dimensional code and the proportion of code points of various actual sizes in the dot matrix two-dimensional code, so that it is possible to identify whether the solar cell is genuine even in remote areas without network, and the speed of verifying solar cells can be improved.

[0085] Furthermore, the solar cell traceability method may further include: using a large amount of collected battery-related data of solar cells, statistically analyzing the battery-related data of solar cells produced on the same battery production line and with substrates of different resistivities, and optimizing the production process according to the results of the statistical analysis to determine the dominant resistivity of different production processes or production lines. Specifically, silicon wafers with different resistivity grades can be invested in the same battery production line. Through the above-mentioned first association relationship, scanning the dot matrix QR code can distinguish and query the efficiency of solar cells prepared from silicon wafers with different resistivities, thereby analyzing the dominant resistivity of different production processes or production lines. In addition, by integrating a large amount of battery-related data of solar cells and analyzing the parameter design of each production process, the errors caused by different production lines are avoided, making the evaluation of each production line more objective and accurate.

[0086] Furthermore, the solar cell traceability method may further include: statistically analyzing the cell-related data of solar cells produced on the same cell production line and on substrates with different resistivities, and optimizing the production process based on the results of the statistical analysis. That is, collecting silicon wafer data information of the same quality (resistivity, minority carrier lifetime, square rod oxygen content, even TTV, line marks, etc.) on different cell production lines, and analyzing silicon wafers of the same quality to compare and optimize the processes of different production lines.

[0087] Furthermore, the solar cell traceability method may further include: performing variable analysis on the quality data in the production-related parameters of the substrate based on the collected battery-related data and production-related data on the same battery production line or different battery production lines, determining the degree of influence of the quality data of the substrate on the battery efficiency, and matching the substrate and substrate standards for the battery production line. That is, by performing control variable analysis on the silicon wafer quality data on the same or different battery production lines, determining the degree of influence of each data on the battery efficiency, finding silicon wafers that are suitable for the production line process quality, and helping to set silicon wafer standards.

[0088] Furthermore, an embodiment of the present invention provides a solar cell, which may include: a feature code inscribed on a substrate of the solar cell by laser.

[0089] The characteristic code is formed based on the solar cell tracing method provided in the above embodiment.

[0090] Among them, the substrate of the solar cell is generally a silicon substrate.

[0091] The depth of the feature code on the substrate may be 4 to 20 μm. For example, the depth of the feature code on the substrate may be 4 μm, 5 μm, 5.5 μm, 6 μm, 7 μm, 7.5 μm, 8 μm, 9 μm, 10 μm, 12 μm, 15 μm, 18 μm or 20 μm, etc. Preferably, the depth of the feature code on the substrate may be 8 μm.

[0092] Furthermore, the size of the above-mentioned characteristic code can be 0.5mm×0.5mm~5×5mm, the code point diameter can be 20μm~60μm, the code point spacing can be 50μm~150μm, and the information capacity contained can be 10~25 digits / letters.

[0093] Furthermore, the above-mentioned characteristic code may be located in the middle of the front side of the solar cell and span at least one fine grid line; or, the characteristic code is located between two adjacent fine grid lines in the middle of the front side of the solar cell; or, the characteristic code is located on the outside of the grid lines at the edge of the front side of the solar cell; or, the characteristic code is located at the harpoon mouth position of the front edge of the solar cell.

[0094] The solar cell has a characteristic code engraved on the substrate of the solar cell. The terminal device can scan the characteristic code to trace the battery-related data corresponding to the solar cell and the production-related data of the substrate used for the solar cell.

[0095] Furthermore, an embodiment of the present invention also provides a system for implementing traceability. Figure 6 As shown, the system 600 for implementing traceability may include: a laser device 601 and a server system 602, wherein:

[0096] The server system 602 is used to collect production-related data of the substrate during the substrate production process, and determine the production-related data of the screened qualified substrate; generate a feature code for the qualified substrate using the production-related data of the qualified substrate, and output the feature code to the laser device 601;

[0097] Laser device 601 is used to burn the characteristic code provided by server system 602 into a specific position of the qualified substrate;

[0098] The server system 602 is further used to collect process parameters of the production process and battery-related data of the solar cell in each production process of producing solar cells using a qualified substrate, and to establish a first association relationship between the battery-related data and the production-related data of the qualified substrate, so as to expand the information contained in the feature code based on the first association relationship, enable the terminal device to scan the feature code, and provide the terminal device with battery-related data and production-related data corresponding to the solar cell.

[0099] The laser device 601 is arranged on the screening device of the substrate.

[0100] Furthermore, if Figure 6 As shown, the above-mentioned system 600 for realizing traceability may further include: a high-definition camera 603 disposed on the screening device of the substrate; wherein,

[0101] A high-definition camera 603 is used to locate qualified substrates screened by the substrate screening device and send the positioning result to the server system 602;

[0102] The server system 602 is further used to determine the specific position of the qualified substrate for the laser device 601 according to the positioning result of the high-definition camera 603 when the high-definition camera 603 locates the qualified substrate; and control the laser device 601 to burn the feature code at the specific position.

[0103] Preferably, the marking rate of the laser device can be 0.07 seconds per piece to 0.2 seconds per piece. For example, the marking rate of the laser device can be 0.07 seconds per piece, 0.09 seconds per piece, 0.1 seconds per piece, 0.15 seconds per piece, 0.17 seconds per piece or 0.2 seconds per piece.

[0104] Furthermore, if Figure 6 As shown, the above-mentioned system 600 for realizing traceability may further include: a code reading device 604 provided in each production process of producing solar cells;

[0105] The code reading device 604 at each production process is used to read the characteristic code on the qualified substrate at the production process and send the characteristic code to the server system 602;

[0106] The server system 602 is further used to obtain the production-related data corresponding to the feature code and the process parameters of the production process before the current production process based on the feature code sent by the code reading device 604; and establish a first association relationship between the process parameters corresponding to the current production process and the production-related data of the qualified substrate and the process parameters of the production process before the current production process.

[0107] Preferably, the code reading rate of the code reading device is 0.2 seconds per sheet to 0.5 seconds per sheet. For example, the code reading rate may be 0.2 seconds per sheet, 0.3 seconds per sheet, 0.4 seconds per sheet or 0.5 seconds per sheet.

[0108] Furthermore, the above-mentioned system for realizing traceability may further include: a client (not shown in the figure) and a database (not shown in the figure), wherein the client may be installed on a terminal device so that a user can scan a characteristic code on a solar cell based on the client. The database may store the above-mentioned production-related data and battery-related data, etc. In addition, the database may also store the association relationship between the virtual code and the production-related data and the battery-related data, and the association relationship between the virtual code and the characteristic code, etc.

[0109] By analyzing the data in the database, the solar cell production process can be monitored and optimized. In this process, select appropriate data analysis methods, such as data mining algorithms, statistical analysis software, or custom-developed analysis tools. Next, associate and compare the identification code data with production data and quality inspection results to find potential anomalies or problems. By analyzing the changing trends of identification code data, statistical indicators of production data, or deviations in quality inspection results, anomalies in the production process can be discovered in a timely manner and early warning mechanisms can be triggered. Finally, based on the data analysis results, bottlenecks or problems in the production process can be identified, and process improvements or optimizations can be made to improve product performance, reduce costs, or increase production efficiency.

[0110] Furthermore, the server system 602 can be further used to perform statistical analysis on the battery-related data of solar cells produced on the same battery production line with substrates of different resistivities, and optimize the production process according to the results of the statistical analysis.

[0111] Furthermore, the above-mentioned server system 602 can also be further used to perform variable analysis on the quality data in the production-related parameters of the substrate based on the battery-related data and production-related data collected on the same battery production line or different battery production lines, determine the degree of influence of the quality data of the substrate on the battery efficiency, and match the substrate and substrate standards for the battery production line.

[0112] Furthermore, the system 600 for realizing traceability may further include: a dust removal device (not shown in the figure), which has a blowing function and a dust removal function. After the above-mentioned laser device burns the characteristic code at a specific position, the silicon powder generated by burning the characteristic code is blown up by the blowing function of the dust removal device, and then the blown silicon powder is removed by the dust removal function of the dust removal device (specifically, the dust removal function can suck away the blown silicon powder through the dust removal pipe). Through this dust removal process, it is possible to prevent silicon powder from being deposited on the surface of the substrate, thereby preventing the silicon powder generated by burning the characteristic code from affecting the subsequent substrate transportation and battery production process.

[0113] For the dust removal device, 4 to 16 blowing ports can be evenly opened around the side wall of the device body (for example, the number of the blowing ports can be 4, 8, 10, 12, 14 or 16, etc.), and the horizontal distance between each blowing port and the substrate is 5mm~50mm (wherein, the horizontal distance between the blowing port and the substrate refers to the distance between the projection point of the center of the blowing port on the plane where the substrate is located and the position of the recorded characteristic code. For example, the horizontal distance between the blowing port and the substrate is 5mm, 10mm, 20mm, 25mm, 30mm, 40mm or 50mm, etc.), and the vertical distance between the blowing port and the substrate is 5mm ~20mm (wherein, the vertical distance between the blowing port and the substrate refers to the distance between the center of the blowing port and the projection point on the plane where the substrate is located, for example, the vertical distance between the blowing port and the substrate can be 5mm, 7mm, 8mm, 10mm, 15mm, 18mm or 20mm, etc.), and the angle between the blowing direction and the substrate surface is 10°~45° (wherein, the angle between the blowing direction and the substrate surface refers to the angle between the projection of the blowing direction on the substrate surface and the blowing direction, for example, the angle can be 10°, 15°, 20°, 30° or 45°). It is worth noting that the blowing port blows an inert gas such as argon to the substrate to avoid oxidation on the substrate surface.

[0114] Furthermore, the dust removal device may also include a dust suction device, which is located above the substrate, and the distance between the dust suction device and the substrate is 20 mm to 50 mm (for example, the distance between the dust suction device and the substrate may be 20 mm, 25 mm, 30 mm, 35 mm, 40 mm, 45 mm or 50 mm, etc.), and the dust suction device sucks away the silicon powder dust blown up by the air outlet through the dust removal pipe. The air flow rate of the dust removal device for blowing and dust suction can be set by the system to achieve the best dust removal effect.

[0115] Furthermore, the client can also provide other functional queries, such as querying the performance change curve of solar cells.

[0116] Furthermore, an embodiment of the present invention provides an electronic device, which may include:

[0117] one or more processors;

[0118] a storage device for storing one or more programs,

[0119] When one or more programs are executed by one or more processors, the one or more processors implement the solar cell tracing method provided in any of the above embodiments.

[0120] Furthermore, an embodiment of the present invention provides a computer-readable medium having a computer program stored thereon, and when the program is executed by a processor, the solar cell tracing method provided in any of the above embodiments is implemented.

[0121] In particular, according to the embodiments disclosed in the present invention, the process described above with reference to the flowchart can be implemented as a computer software program. For example, the embodiments disclosed in the present invention include a computer program product, which includes a computer program carried on a computer-readable medium, and the computer program contains program code for executing the method shown in the flowchart. In such an embodiment, the computer program can be downloaded and installed from a network through a communication part, and / or installed from a removable medium. When the computer program is executed by a central processing unit (CPU), the above-mentioned functions defined in the system of the present invention are executed.

[0122] It should be noted that the computer-readable medium shown in the present invention may be a computer-readable signal medium or a computer-readable storage medium or any combination of the above two. The computer-readable storage medium may be, for example, but not limited to, an electrical, magnetic, optical, electromagnetic, infrared, or semiconductor system, device or device, or any combination of the above. More specific examples of computer-readable storage media may include, but are not limited to: an electrical connection with one or more wires, a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the above. In the present invention, a computer-readable storage medium may be any tangible medium containing or storing a program that can be used by or in combination with an instruction execution system, device or device. In the present invention, a computer-readable signal medium may include a data signal propagated in a baseband or as part of a carrier wave, which carries a computer-readable program code. This propagated data signal may take a variety of forms, including but not limited to electromagnetic signals, optical signals, or any suitable combination of the above. Computer-readable signal media may also be any computer-readable medium other than computer-readable storage media, which may send, propagate or transmit a program for use by or in conjunction with an instruction execution system, apparatus or device. The program code contained on the computer-readable medium may be transmitted using any appropriate medium, including but not limited to: wireless, wire, optical cable, RF, etc., or any suitable combination of the above.

[0123] The introduction provided in the above steps is only used to help understand the structure, method and core idea of ​​the present invention. For ordinary technicians in this technical field, without departing from the principle of the present invention, several improvements and modifications can be made to the present invention, and these improvements and modifications also belong to the scope of protection of the claims of the present invention.

Claims

1. A solar cell tracing method, characterized in that: include: Step 1: During the production process of the substrate, the production-related data of the substrate is collected, and the production-related data of the screened qualified substrate is determined; Step 2: using the production-related data of the qualified substrate to generate a feature code for the qualified substrate; Step 3, using a laser device to burn the characteristic code into a specific position of the qualified substrate; Step 4. In each production process of producing solar cells using the qualified substrate, battery-related data of the solar cell is collected, and a first association relationship is established between the battery-related data and the production-related data of the qualified substrate, so as to expand the information contained in the feature code based on the first association relationship, and enable a terminal device to scan the feature code to provide the terminal device with the battery-related data corresponding to the solar cell and the production-related data of the substrate used for the solar cell.

2. The solar cell tracing method according to claim 1, characterized in that: Step 2 includes: The production-related data of each production process of the substrate and the serial number assigned to the screened qualified substrate on the screening device are integrated to generate a feature code for the qualified substrate.

3. The solar cell tracing method according to claim 2, characterized in that: The step of generating a characteristic code for the qualified substrate comprises: A dot matrix two-dimensional code including code points of multiple set sizes is generated for the qualified substrate, wherein the proportions of the laser points of multiple set sizes are preset fixed values.

4. The solar cell tracing method according to claim 1, characterized in that: The solar cell tracing method further comprises: arranging the laser device and the high-definition camera on the screening device of the substrate; Step 3 includes: Step 31, positioning the screened qualified substrates by a high-definition camera provided on the substrate screening device; Step 32: when the high-definition camera locates the qualified substrate, determining a specific position of the qualified substrate for the laser device according to the positioning result of the high-definition camera; Step 33, controlling the laser device provided on the substrate screening device to burn the characteristic mark at the specific position, preferably, the marking rate of the laser device is 0.07 seconds per piece to 0.2 seconds per piece; and / or, The solar cell tracing method further comprises: providing a code reading device in each production process of producing the solar cell; Step 4 includes: each production process is used as the current production process, and the characteristic code on the qualified substrate is read by the code reading device set for the current production process to obtain the production-related data corresponding to the characteristic code and the battery-related data of the production process before the current production process; a first association relationship is established between the battery-related data corresponding to the current production process and the production-related data of the qualified substrate and the battery-related data of the production process before the current production process.

5. The solar cell tracing method according to claim 1, characterized in that: After step 1, it also includes: Generate a virtual code for the qualified substrate, establish a second association relationship between the virtual code and the feature code, store the virtual code and the second association relationship, and store production-related data of the qualified substrate based on the virtual code; Step 4 also includes: In each of the production processes, in response to a terminal device scanning the feature code on the qualified substrate, a virtual code associated with the feature code is determined according to the second association relationship; When the virtual code in the established first association relationship is inconsistent with the virtual code associated with the feature code, the virtual code in the first association relationship is corrected using the virtual code associated with the feature code.

6. The solar cell tracing method according to claim 3, characterized in that: The solar cell tracing method further comprises: Step 5: When the terminal device scans the dot matrix two-dimensional code, determine the camera parameters of the terminal device, the distance from the camera of the terminal device to the dot matrix two-dimensional code, and the angle of the lighting source, and calculate the actual size of the code points contained in the dot matrix two-dimensional code and the proportion of code points of various actual sizes in the dot matrix two-dimensional code; Step 6: When the actual size is consistent with the set size and the code point ratios of various actual sizes are consistent with the preset fixed values, determine that the solar cell where the dot matrix two-dimensional code scanned by the terminal device is located is authentic; Step 7: When the actual size is inconsistent with the set size and / or the code point ratio of various actual sizes is inconsistent with the preset fixed value, it is determined that the solar cell where the dot matrix two-dimensional code scanned by the terminal device is located is a counterfeit; and / or, Before step 3, the solar cell tracing method further includes: spraying fluorescent material at a specific position of the qualified substrate; Step 3 includes: irradiating the fluorescent material at the specific position with laser light emitted by a laser device, and in the process of burning the characteristic code, synchronously embedding the fluorescent material on the characteristic code.

7. The solar cell tracing method according to any one of claims 1 to 6, characterized in that: The substrate is a silicon substrate. Preferably, the silicon substrate is a P-type or N-type semiconductor doped with one element alone or multiple elements including but not limited to boron, gallium, phosphorus, antimony and arsenic; and / or, The laser wavelength of the laser equipment used in step 3 is 200nm~1064nm, and the power is 500mw~10w; and / or, Step 3: the depth of the characteristic code engraved on the qualified substrate is 4 μm to 20 μm; and / or, Step 3: The size of the characteristic code inscribed on the qualified substrate is 0.5 mm × 0.5 mm to 5 × 5 mm, the code point diameter is 20 μm to 60 μm, the code point spacing is 50 μm to 150 μm, and the information capacity contained is 10 to 25 digits / letters; and / or, The specific position of the qualified substrate corresponds to at least one fine grid line across the middle of the front side of the solar cell; or, the specific position of the qualified substrate corresponds to between two adjacent fine grid lines in the middle of the front side of the solar cell; or, the specific position of the qualified substrate corresponds to the outside of the grid line at the edge of the front side of the solar cell; or, the specific position of the qualified substrate corresponds to the harpoon position at the edge of the front side of the solar cell; and / or, The solar cell tracing method further comprises: performing statistical analysis on cell-related data of solar cells produced on the same cell production line and on substrates with different resistivities, and optimizing the production process according to the results of the statistical analysis; and / or, The solar cell traceability method further includes: performing variable analysis on the quality data in the production-related parameters of the substrate based on the battery-related data and production-related data collected on the same battery production line or different battery production lines, determining the degree of influence of the quality data of the substrate on the battery efficiency, so as to match the substrate and substrate standards for the battery production line.

8. A system for achieving traceability, characterized in that: include: Laser equipment and server system, wherein, The server system is used to collect production-related data of the substrate during the substrate production process, and determine the production-related data of the screened qualified substrate; generate a feature code for the qualified substrate using the production-related data of the qualified substrate, and output the feature code to the laser device; The laser device is used to burn the characteristic code provided by the server system into a specific position of the qualified substrate; The server system is further used to collect battery-related data of the solar cell in each production process of producing solar cells using the qualified substrate, and establish a first association relationship between the battery-related data and the production-related data of the qualified substrate, so as to expand the information contained in the feature code based on the first association relationship, enable the terminal device to scan the feature code, and provide the terminal device with battery-related data and production-related data corresponding to the solar cell.

9. The system for realizing traceability according to claim 8, characterized in that: The laser device is arranged on the screening device of the substrate; The system for achieving traceability further comprises: a high-definition camera disposed on the screening device of the substrate; The high-definition camera is used to locate the qualified substrates screened by the substrate screening device and send the positioning results to the server system; The server system is further used to determine the specific position of the qualified substrate for the laser device according to the positioning result of the high-definition camera when the high-definition camera is positioned on the qualified substrate; and control the laser device to burn the feature code at the specific position; and / or, The system for realizing traceability further comprises: a code reading device provided at each production process of producing solar cells; The code reading device on each of the production processes is used to read the characteristic code on the qualified substrate in the production process where it is located, and send the characteristic code to the server system; preferably, the code reading rate of the code reading device is 0.2 seconds / piece to 0.5 seconds / piece; The server system is further used to obtain the production-related data corresponding to the feature code and the process parameters of the production process before the current production process based on the feature code sent by the code reading device; and establish a first association relationship between the process parameters corresponding to the current production process and the production-related data of the qualified substrate and the process parameters of the production process before the current production process.

10. A solar cell, characterized in that: include: Inscribe a characteristic code on the substrate of the solar cell by laser; Preferably, the characteristic code is formed based on the solar cell tracing method according to any one of claims 1 to 7; Preferably, the substrate of the solar cell is a silicon substrate; Preferably, the depth of the characteristic code on the substrate is 4 μm to 20 μm; Preferably, the size of the characteristic code is 0.5mm×0.5mm~5×5mm, the code point diameter is 20μm~60μm, the code point spacing is 50μm~150μm, and the information capacity contained is 10~25 digits / letters; Preferably, the feature code is located in the middle of the front side of the solar cell and spans over at least one thin grid line; or, the feature code is located between two adjacent thin grid lines in the middle of the front side of the solar cell; or, the feature code is located on the outside of the grid lines at the edge of the front side of the solar cell; or, the feature code is located at the harpoon position at the edge of the front side of the solar cell.

Images