A pulse current injection system and related device for loop resistance testing

Abstract

The present application discloses a pulse current injection system and related devices for loop resistance testing, the system includes a processing module and a centralized control module, wherein the processing module is used to obtain loop characteristic information of the loop to be tested, and determine the loop type of the loop to be tested according to the loop characteristic information; and generate a test association module and a test plan based on the loop type and loop characteristic information, and upload the information of the association module and the test plan to the centralized control module; the centralized control module is used to control the operation of the association module according to the test plan. Through the above method, it is possible to quickly complete the loop type identification and test plan generation, equip specific association modules for different loop types, and the centralized control module automatically controls the operation of the association module, which greatly shortens the test preparation time and the overall test cycle, and significantly improves the test efficiency.

Description

Technical Field

[0001] The present application relates to the technical field of power detection, and in particular to a pulse current injection system and related devices for loop resistance testing. Background Art

[0002] In the power system, accurate measurement of loop resistance is crucial to ensure the safe and stable operation of power equipment.

[0003] In traditional loop resistance testing, testers are often required to use a unified test strategy to test the resistance of each loop. When faced with a large number of different types of circuit loops, testers need to frequently change test equipment or adjust parameters, which is cumbersome and inefficient. Therefore, how to manage the pulse injection of loop resistance testing is an urgent problem to be solved. Summary of the invention

[0004] The main technical problem solved by the present application is to provide a pulse current injection system and related devices for loop resistance testing, which can match the test scheme and associated modules for the test loop and improve the efficiency of loop resistance testing.

[0005] In order to solve the above technical problems, a technical solution adopted in the present application is: to provide a pulse current injection system for loop resistance testing, the system comprising a processing module and a centralized control module: the processing module is used to obtain loop characteristic information of the loop to be tested, and determine the loop type of the loop to be tested according to the loop characteristic information; the processing module is also used to generate associated modules and test plans for the test based on the loop type and loop characteristic information, and upload the information of the associated modules and the test plan to the centralized control module; the centralized control module is used to control the operation of the associated modules according to the test plan.

[0006] The processing module is further used to obtain the operating status and operating data of the circuit to be tested as circuit characteristic information, and determine the circuit type of the circuit to be tested according to the operating status and operating data of the circuit to be tested.

[0007] The processing module is further used to obtain a component list and a component connection logic of the circuit to be tested as circuit characteristic information, and determine a circuit type of the circuit to be tested according to the component list and the component connection logic of the circuit to be tested.

[0008] The processing module is further used to match the corresponding test scheme and the information of the associated module corresponding to the test scheme from a preset test scheme library according to the loop type.

[0009] Among them, the loop types include resistance loop, inductive loop, capacitive loop and nonlinear complex loop; among them, the associated modules of the resistance loop include a first pulse current generating module and a first data acquisition module; the associated modules of the inductive loop include a second pulse current generating module and a second data acquisition module; the associated modules of the capacitive loop include a third pulse current generating module and a third data acquisition module; the associated modules of the nonlinear complex loop include a fourth pulse current generating module and a fourth data acquisition module.

[0010] Among them, the association module of the resistance loop and the inductive loop also includes a signal amplification module, which is used to amplify the electrical signal collected by the first data acquisition module when the first pulse current generating module executes the test scheme, or the electrical signal collected by the second data acquisition module when the second pulse current generating module executes the test scheme.

[0011] Among them, the association module of the nonlinear complex loop also includes a dynamic compensation module, and the dynamic compensation module is used to compensate for the electrical signal collected by the fourth data acquisition module when the fourth pulse current generation module executes the test plan.

[0012] The processing module is further used to obtain an impedance characterization value of the circuit to be tested, and in response to the impedance characterization value being higher than a preset threshold, the signal amplification module is used as an associated module of the circuit to be tested.

[0013] Among them, the dynamic compensation module is also used to obtain nonlinear element information of the nonlinear complex circuit, match the pre-stored nonlinear element characteristic curve according to the nonlinear element information, and use the nonlinear element characteristic curve to compensate the electrical signal collected by the fourth data acquisition module when the fourth pulse current generating module executes the test scheme.

[0014] In order to solve the above technical problems, another technical solution adopted by the present application is: to provide an electric power system testing device, which includes any of the above-mentioned pulse current injection systems for loop resistance testing.

[0015] The beneficial effects of the present application are as follows: different from the prior art, the present application obtains the loop characteristic information of the loop to be tested through the processing module, determines the specific loop type of the loop to be tested, and for different loop types, the required test equipment and test methods are different. The processing module generates a test plan and a test associated module according to the loop type and sends them to the central control module. After receiving this information, the central control module controls the associated module according to the test plan to quickly complete the loop type identification and test plan generation. The central control module automatically controls the operation of the associated module, which greatly shortens the test preparation time and the overall test cycle, and significantly improves the test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1It is a schematic diagram of the framework of an embodiment of a pulse current injection system for loop resistance testing of the present application.

[0017] Figure 2 It is a method flow chart of an embodiment of a pulse current injection system for loop resistance testing of the present application.

[0018] Figure 3 It is a schematic diagram of the framework of an embodiment of the power system testing device of the present application. DETAILED DESCRIPTION

[0019] In order to make the purpose, technical solution and effect of the present application clearer and more specific, the present application is further described in detail below with reference to the accompanying drawings and examples.

[0020] In the following description, reference is made to "some embodiments", which describe a subset of all possible embodiments, but it is understood that "some embodiments" may be the same subset or different subsets of all possible embodiments, and may be combined with each other without conflict. Unless otherwise defined, all technical and scientific terms used in the embodiments of the present application have the same meaning as those commonly understood by those skilled in the art of the technical field of the embodiments of the present application. The terms used in the embodiments of the present application are only for the purpose of describing the embodiments of the present application and are not intended to limit the present application.

[0021] In addition, the term "more" in this article means two or more than two. In addition, the terms "first" and "second" are used for descriptive purposes only and cannot be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Therefore, the features defined as "first" and "second" may explicitly or implicitly include at least one of the features.

[0022] At present, loop resistance test equipment mostly adopts a single mode of DC or AC current injection. In the DC test mode, a stable DC current is applied to the circuit under test, the voltage drop at both ends of the circuit is measured, and then the resistance value is calculated according to Ohm's law. This mode can obtain relatively accurate measurement results when facing a simple pure resistance circuit. However, in actual power systems, the circuit is often not a simple pure resistance circuit, and usually contains components such as inductance and capacitance. In a circuit containing inductance, DC testing cannot reflect the obstruction of the inductance to the current under AC conditions, which will cause deviations in the measurement results. In the AC test mode, an AC power supply is used to generate an alternating current in the circuit, and the resistance value is also obtained by measuring the voltage drop. However, for a circuit containing a capacitor, the change of the test current during the charging and discharging process of the capacitor will affect the stability and accuracy of the measurement; and when there are nonlinear elements in the circuit, its resistance characteristics change with the current or voltage, and it is difficult to accurately measure the resistance in the AC test. Neither of these two single modes fully considers the differences in electrical characteristics of different types of circuits, and cannot be flexibly adjusted according to the specific conditions of the circuit, resulting in inaccurate test results and low test efficiency.

[0023] To this end, the applicant conceived a pulse current injection system for loop resistance testing, see Figure 1 , Figure 1 It is a schematic diagram of the framework of an embodiment of a pulse current injection system for loop resistance testing of the present application.

[0024] like Figure 1 As shown, the pulse current injection system 10 for loop resistance testing of the present application includes a processing module 11, a centralized control module 12 and an association module 13, wherein the processing module 11 is used to obtain loop characteristic information of the loop to be tested, and determine the loop type of the loop to be tested according to the loop characteristic information; the processing module 11 is also used to generate an association module 13 and a test plan for the test based on the loop type and loop characteristic information, and upload the information of the association module 13 and the test plan to the centralized control module 12; the centralized control module 12 is used to control the operation of the association module 13 according to the test plan.

[0025] Among them, loop characteristic information refers to various information that can reflect the characteristics of the loop to be tested. Specifically, the loop characteristic information includes but is not limited to: electrical parameters of the loop, such as parameter values ​​of resistance, inductance, and capacitance; structural characteristics, such as series connection, parallel connection, number of branches, etc.; component composition, such as the type and quantity of components; and connection logic of components, etc. The association module 13 is a functional module involved in completing a specific loop resistance test task, including but not limited to a pulse current generation module, a data acquisition module, a signal amplification module, a dynamic compensation module, etc. The test plan includes a test process and parameter settings, including the waveform, amplitude, pulse width, repetition frequency, sampling frequency of data acquisition, acquisition time, etc. of the pulse current, as well as amplification and compensation of the collected data.

[0026] In some specific embodiments, the device to which the circuit to be tested belongs is a known device, and the corresponding device circuit information can be obtained from a preset device database, and the circuit characteristic information of the circuit to be tested can be determined in the device circuit information according to the connection end of the circuit to be tested. The preset device database can include device models and circuit information corresponding to each device model.

[0027] In some specific embodiments, if the circuit to be tested is an unknown circuit, the processing module 11 can measure the electrical parameters of the circuit to be tested through a test instrument or device, and record the structural characteristics of the circuit, the component composition and the connection logic of the components, or the characteristic information of the circuit to be tested can be input into the processing module through external input. After obtaining the circuit characteristic information, the processing module 11 can automatically determine the type of the circuit to be tested according to a preset rule.

[0028] In some embodiments, the processing module 11 may also obtain the operating status and operating data of the circuit to be tested as circuit characteristic information, and determine the circuit type of the circuit to be tested according to the operating status and operating data of the circuit to be tested.

[0029] The operating state refers to the various state parameters of the circuit under test during operation, such as current, voltage fluctuation, temperature change, etc. The operating data includes the current, voltage, power factor and other related data of the circuit at different time points. By analyzing this information, the type of circuit can be determined more accurately. For example, if the current change is found to have obvious lag during operation, combined with other parameters, it can be determined that the circuit may be an inductive circuit.

[0030] In some specific embodiments, taking a circuit of a substation as an example, the processing module 11 finds through monitoring that the current of the circuit rises slowly and the voltage fluctuates greatly during operation. After further analysis of the current, voltage data and basic parameters of the circuit, it is determined that it is an inductive circuit.

[0031] In some embodiments, the processing module 11 is further used to obtain a component list and a component connection logic of the circuit to be tested as circuit characteristic information, and determine a circuit type of the circuit to be tested according to the component list and the component connection logic of the circuit to be tested.

[0032] The component list records all components contained in the circuit to be tested, such as resistors, capacitors, inductors, diodes, thyristors, etc. The component connection logic describes the connection between these components, whether it is series, parallel or a complex mixed structure. The circuit type can be determined by analyzing the component list and connection logic.

[0033] In some specific embodiments, if the component list includes a capacitor, an inductor, and multiple resistors, and the connection logic shows that the capacitor is connected in parallel with the inductor and then in series with the resistor, the processing module 11 determines that the circuit is a complex circuit containing an inductor and a capacitor. For example, when testing a power electronic filter circuit, the circuit type is determined based on its component composition and connection method.

[0034] In some embodiments, the processing module 11 is further used to match the corresponding test scheme and the information of the association module 13 corresponding to the test scheme from a preset test scheme library according to the loop type.

[0035] The preset test solution library is a database storing a variety of test solutions for different loop types and corresponding information of associated modules 13. According to the determined loop type, the library is searched for matching test solutions and associated module 13 information to guide the test work.

[0036] In some specific embodiments, after determining that a certain circuit is a capacitive circuit, the processing module 11 finds a test scheme for the capacitive circuit in a preset test scheme library, in which the pulse current generating module needs to generate a pulse current for rapid charging and discharging, and the data acquisition module needs to collect signals at a high-speed sampling frequency.

[0037] In some embodiments, the loop types include resistive loops, inductive loops, capacitive loops and nonlinear complex loops; wherein, the associated module 13 of the resistive loop includes a first pulse current generating module and a first data acquisition module; the associated module 13 of the inductive loop includes a second pulse current generating module and a second data acquisition module; the associated module 13 of the capacitive loop includes a third pulse current generating module and a third data acquisition module; the associated module 13 of the nonlinear complex loop includes a fourth pulse current generating module and a fourth data acquisition module.

[0038] Specifically, the first pulse current generating module is used to generate a stable pulse current to provide a suitable excitation for the resistance loop, and its current amplitude, frequency and other parameters are set according to the characteristics of the resistance loop. The first data acquisition module is responsible for collecting the current and voltage signals in the loop, and the resolution and sampling frequency can meet the resistance loop test requirements. For example, when testing a resistance loop with a resistance value of 10 ohms, the first pulse current generating module generates a pulse current with an amplitude of 1A and a frequency of 1kHz, and the first data acquisition module collects signals at a sampling frequency of 5kHz.

[0039] The second pulse current generating module must be able to output a pulse current with a larger current and a slower rising edge, overcome the resistance of the inductor to the current change, and enable the current to effectively penetrate the inductor. The second data acquisition module must have anti-interference ability to suppress the electromagnetic interference generated by the inductor. For example, when testing an inductive loop with an inductance of 500mH, the second pulse current generating module outputs a pulse current with an amplitude of 5A and a rising edge time of 100μs. The second data acquisition module has a hardware filtering function and collects signals at a sampling frequency of 10kHz. The third pulse current generating module has the ability to charge and discharge quickly to meet the charging and discharging characteristics of the capacitor.

[0040] The third data acquisition module has a high sampling frequency and can capture the rapid signal changes of capacitor charging and discharging. For example, to test a capacitive loop with a capacitance value of 10μF, the third pulse current generation module outputs a large current pulse in a short time, and the third data acquisition module collects signals at a sampling frequency of 5MHz. The fourth pulse current generation module can generate pulse currents of various waveforms and amplitudes to detect the resistance characteristics of nonlinear elements under different working conditions.

[0041] The fourth data acquisition module has high resolution and fast speed, and cooperates with the digital signal processor (DSP) to process data. For example, when testing a nonlinear complex circuit containing thyristors, the fourth pulse current generation module outputs pulse currents of various amplitudes and waveforms. The fourth data acquisition module collects signals at a sampling frequency of 10MS / s, and the digital signal processor analyzes and processes the data.

[0042] In some embodiments, the association module 13 of the resistance circuit and the inductive circuit also includes a signal amplification module, which is used to amplify the electrical signal collected by the first data acquisition module when the first pulse current generating module executes the test scheme, or the electrical signal collected by the second data acquisition module when the second pulse current generating module executes the test scheme.

[0043] Among them, the signal amplification module is used to enhance the strength of the electrical signal collected by the first data acquisition module or the second data acquisition module. When the collected signal is weak, the signal quality is improved through amplification processing to ensure the accuracy of subsequent data processing.

[0044] In some embodiments, the processing module 11 is further used to obtain an impedance characterization value of the circuit to be tested, and in response to the impedance characterization value being higher than a preset threshold, the signal amplification module is used as an association module 13 of the circuit to be tested.

[0045] Among them, the impedance characterization value is a numerical value used to measure the size of the loop impedance, which is calculated by measuring the resistance, inductance, capacitance and other parameters of the loop. The preset threshold is a reference value set based on experience and test requirements. When the impedance characterization value is higher than the threshold, it means that the loop signal may be weak and the signal amplification module is required to enhance the signal. Specifically, if the resistance of the resistance loop is greater than the preset resistance threshold, the processing module 11 uses the amplification module as the associated module 13 of the circuit to be tested, and reports the amplification module to the centralized control module 12, so that the signal amplification module amplifies the current signal collected by the first data acquisition module. When the inductance of the inductive loop is greater than the preset threshold, the signal amplification module also amplifies the current signal collected by the second data acquisition module to ensure measurement accuracy.

[0046] In other embodiments, the centralized control module 12 is also used to determine whether the first data acquisition module or the second data acquisition module collects signals, and in response to the strength of the collected signals being lower than a preset threshold, sets a target amplification factor of the collected signals according to the target signal strength, uses the signal amplification module as an associated module 13 of the circuit to be tested, and controls the signal amplification module to amplify the target collected signals by a target amplification factor.

[0047] In some specific embodiments, when testing a resistance loop with a large resistance value, the voltage signal amplitude collected by the first data acquisition module is small, and the signal amplification module amplifies the signal by 10 times, so that the signal amplitude reaches the range that can be accurately identified by data processing, which is convenient for subsequent resistance value calculation. When testing an inductive loop, if the collected current signal is weak due to the large inductance, the signal amplification module also amplifies the current signal collected by the second data acquisition module to ensure measurement accuracy.

[0048] In some embodiments, the association module 13 of the nonlinear complex loop further includes a dynamic compensation module, and the dynamic compensation module is used to compensate for the electrical signal collected by the fourth data acquisition module when the fourth pulse current generation module executes the test scheme.

[0049] Among them, the dynamic compensation module adjusts and corrects the collected electrical signal in real time according to the characteristics of the nonlinear elements in the nonlinear complex circuit, so as to restore the real resistance characteristics of the circuit and eliminate the influence of the nonlinear elements on the measurement results. Specifically, the dynamic compensation module can obtain the nonlinear element information in the circuit, such as the model of the diode, the model of the thyristor, etc. The dynamic compensation module matches the pre-stored nonlinear element characteristic curve according to the nonlinear element information. After the data acquisition module collects the electrical signal, the dynamic compensation module can calculate the required compensation amount according to the characteristic curve. The compensation amount can be a voltage value, a current value or other parameters. The dynamic compensation module applies the calculated compensation amount to the collected signal to reduce the influence of the nonlinear element on the measurement results.

[0050] In some specific embodiments, when testing a nonlinear complex circuit containing a diode, the dynamic compensation module obtains nonlinear element information such as the model of the diode and matches the characteristic curve of the diode of the model stored in advance. After the fourth data acquisition module acquires the electrical signal, the dynamic compensation module compensates the acquired signal according to the characteristics of the diode under different voltages and currents. For example, at a certain moment, based on the acquired voltage and current values, combined with the diode characteristic curve, the voltage value to be compensated is calculated, and the acquired signal is adjusted so that the measured resistance value more accurately reflects the actual situation of the circuit.

[0051] In some embodiments, the dynamic compensation module is also used to obtain nonlinear element information of the nonlinear complex circuit, match the pre-stored nonlinear element characteristic curve according to the nonlinear element information, and use the nonlinear element characteristic curve to compensate the electrical signal collected by the fourth data acquisition module when the fourth pulse current generating module executes the test scheme.

[0052] The nonlinear element information includes the type of nonlinear element, such as diode, thyristor, etc.; model; main parameters, such as forward conduction voltage, reverse breakdown voltage, etc. The nonlinear element information is used to match the pre-stored nonlinear element characteristic curve, and the collected electrical signal is compensated according to the curve to obtain a more accurate measurement result.

[0053] In some specific embodiments, when testing a nonlinear complex loop containing a thyristor, the dynamic compensation module obtains the model of the thyristor, for example, the thyristor model is KP50-8, and matches the pre-stored characteristic curve according to the model. During the test, the fourth data acquisition module acquires an electrical signal, and the dynamic compensation module searches for corresponding compensation parameters on the characteristic curve according to the voltage and current values ​​at the time of acquisition, and compensates the acquired signal. For example, when it is detected that the thyristor is in a forward conduction state, and the voltage and current values ​​correspond to a compensation point on the characteristic curve, the dynamic compensation module corrects the acquired signal according to the compensation parameters of the point, thereby improving the accuracy of the loop resistance measurement.

[0054] The above scheme uses the processing module 11 to obtain the circuit characteristic information of the circuit to be tested, including electrical parameters, structural characteristics, component composition and connection logic, as well as the operating status and operating data, component list and component connection logic as the circuit characteristic information, so as to accurately determine the circuit type of the circuit to be tested from multiple dimensions. Based on this, the processing module 11 can generate the test association module 13 and the test scheme according to the circuit type and the circuit characteristic information, and upload them to the centralized control module 12, so as to customize the appropriate test strategy for different types of circuits to be tested. The centralized control module 12 controls the operation of the association module 13 according to the test scheme, and realizes the automation and precision operation of the circuit resistance test. The processing module 11 matches the corresponding test scheme and the association module 13 information from the preset test scheme library according to the circuit type, and realizes the efficient calling of the targeted test scheme and the association module 13 to guide the test work. Specific association modules 13 are equipped for different circuit types, such as the first pulse current generation module and the first data acquisition module of the resistance circuit, the second pulse current generation module and the second data acquisition module of the inductive circuit, etc., to meet the test requirements of different circuit types. For the resistance loop and the inductive loop, the signal amplification module in the association module 13 can enhance the strength of the collected electrical signal, improve the signal quality and the accuracy of subsequent data processing. The processing module 11 obtains the impedance characterization value of the loop to be measured, and uses the signal amplification module as the association module 13 when the impedance characterization value is higher than the preset threshold. The centralized control module 12 determines the strength of the collected signal, sets the target amplification factor and controls the operation of the signal amplification module when it is lower than the preset threshold, thereby realizing automatic and flexible configuration and adjustment of the signal amplification degree according to the loop impedance and the actual collected signal strength. In nonlinear complex loops, the dynamic compensation module of the association module 13 obtains nonlinear element information and matches the pre-stored nonlinear element characteristic curve to compensate for the collected electrical signal, thereby realizing real-time adjustment and correction of the collected electrical signal, restoring the true resistance characteristics of the loop, eliminating the influence of nonlinear elements on the measurement results, and further improving the accuracy of loop resistance measurement.

[0055] See also Figure 2 , Figure 2 FIG. 1 is a flow chart of a method of a pulse current injection system for loop resistance testing according to an embodiment of the present application. Figure 2 As shown, the control method of the pulse current injection system for loop resistance testing provided in the embodiment of the present application can be implemented through steps S21 to S23.

[0056] Step S21: Acquire loop characteristic information of the circuit to be tested, and determine the loop type of the circuit to be tested according to the loop characteristic information.

[0057] Specifically, loop characteristic information refers to various information that can reflect the characteristics of the circuit to be tested. Specifically, loop characteristic information includes but is not limited to: electrical parameters of the circuit, such as resistance, inductance, and capacitance; structural features, such as series connection, parallel connection, and number of branches; component composition, such as the type and quantity of components; and component connection logic.

[0058] In some embodiments, loop characteristic information of the circuit to be tested is obtained, and the loop type of the circuit to be tested is determined based on the loop characteristic information, including obtaining the operating status and operating data of the circuit to be tested as the loop characteristic information, and determining the loop type of the circuit to be tested based on the operating status and operating data of the circuit to be tested.

[0059] In other embodiments, loop characteristic information of the circuit to be tested is obtained, and the loop type of the circuit to be tested is determined based on the loop characteristic information, including obtaining a component list and a component connection logic of the circuit to be tested as the loop characteristic information, and determining the loop type of the circuit to be tested based on the component list and the component connection logic of the circuit to be tested.

[0060] Step S22: Generate the associated modules and test plan for the test based on the loop type and loop feature information, and upload the associated module information and the test plan to the centralized control module.

[0061] In some embodiments, generating associated modules and test schemes for a test based on loop type and loop feature information includes, according to the loop type, matching corresponding test schemes and information on associated modules corresponding to the test schemes from a preset test scheme library.

[0062] In some embodiments, the loop types include resistive loops, inductive loops, capacitive loops and nonlinear complex loops; wherein, the associated modules of the resistive loop include a first pulse current generating module and a first data acquisition module; the associated modules of the inductive loop include a second pulse current generating module and a second data acquisition module; the associated modules of the capacitive loop include a third pulse current generating module and a third data acquisition module; the associated modules of the nonlinear complex loop include a fourth pulse current generating module and a fourth data acquisition module.

[0063] In some embodiments, the association module of the resistance loop and the inductive loop also includes a signal amplification module, which is used to amplify the electrical signal collected by the first data acquisition module when the first pulse current generating module executes the test scheme, or the electrical signal collected by the second data acquisition module when the second pulse current generating module executes the test scheme.

[0064] Specifically, generating a test association module and a test scheme based on the loop type and loop characteristic information also includes obtaining an impedance characterization value of the loop to be tested, and in response to the impedance characterization value being higher than a preset threshold, using a signal amplification module as an association module of the loop to be tested.

[0065] In some embodiments, the association module of the nonlinear complex loop further includes a dynamic compensation module, and the dynamic compensation module is used to compensate for the electrical signal collected by the fourth data acquisition module when the fourth pulse current generation module executes the test scheme.

[0066] Specifically, the associated modules and test schemes for generating tests based on loop type and loop characteristic information also include obtaining nonlinear element information of the nonlinear complex loop, matching a pre-stored nonlinear element characteristic curve according to the nonlinear element information, and using the nonlinear element characteristic curve to compensate for the electrical signal collected by the fourth data acquisition module when the fourth pulse current generating module executes the test scheme.

[0067] Step S23: The centralized control module controls the operation of the associated modules according to the test plan.

[0068] After receiving this information, the centralized control module controls the associated module according to the test plan to quickly complete the circuit type identification and test plan generation. The centralized control module automatically controls the operation of the associated module, which greatly shortens the test preparation time and the overall test cycle, and significantly improves the test efficiency. The centralized control module is also used to determine whether the first data acquisition module or the second data acquisition module collects signals. In response to the strength of the collected signal being lower than a preset threshold, the target amplification factor of the collected signal is set according to the target signal strength, the signal amplification module is used as the associated module of the circuit to be tested, and the signal amplification module is controlled to amplify the target collected signal by the target amplification factor.

[0069] The above scheme uses the processing module to obtain the circuit characteristic information of the circuit to be tested, including electrical parameters, structural characteristics, component composition and connection logic, as well as the operating status and operating data, component list and component connection logic, etc. as the circuit characteristic information, so as to accurately determine the circuit type of the circuit to be tested from multiple dimensions. Based on this, the processing module can generate the associated module and test scheme of the test according to the circuit type and circuit characteristic information, and upload them to the centralized control module, so as to customize the appropriate test strategy for different types of circuits to be tested. The centralized control module controls the operation of the associated module according to the test scheme, and realizes the automation and precision operation of the circuit resistance test. The processing module matches the corresponding test scheme and associated module information from the preset test scheme library according to the circuit type, and realizes the efficient calling of targeted test schemes and associated modules to guide the test work. Specific associated modules are equipped for different circuit types, such as the first pulse current generating module and the first data acquisition module of the resistance circuit, the second pulse current generating module and the second data acquisition module of the inductive circuit, etc., to meet the test requirements of different circuit types. For the resistance circuit and the inductive circuit, the signal amplification module in the associated module realizes the enhancement of the strength of the collected electrical signal, improves the signal quality and the accuracy of subsequent data processing. The processing module obtains the impedance characterization value of the circuit to be tested, and uses the signal amplification module as an associated module when the impedance characterization value is higher than the preset threshold. The centralized control module determines the strength of the collected signal, sets the target amplification factor and controls the operation of the signal amplification module when it is lower than the preset threshold, thus realizing automatic and flexible configuration and adjustment of the signal amplification degree according to the circuit impedance and the actual collected signal strength. In nonlinear complex circuits, the dynamic compensation module of the associated module obtains nonlinear element information and matches the pre-stored nonlinear element characteristic curve to compensate for the collected electrical signal, thus realizing real-time adjustment and correction of the collected electrical signal, restoring the true resistance characteristics of the circuit, eliminating the influence of nonlinear elements on the measurement results, and further improving the accuracy of the circuit resistance measurement.

[0070] In the several embodiments provided by the present invention, it should be understood that the disclosed systems and methods can be implemented in other ways. The device implementation described above is only schematic. For example, the division of the modules or units is only a logical function division. There may be other division methods in actual implementation. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, indirect coupling or communication connection of devices or units, which can be electrical, mechanical or other forms.

[0071] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the present embodiment.

[0072] In addition, each functional unit in each embodiment of the present invention may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit. The above-mentioned integrated unit may be implemented in the form of sampling hardware or in the form of sampling software functional unit.

[0073] If the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention is essentially or the part that contributes to the prior art or all or part of the technical solution can be embodied in the form of a software product, and the computer software product is stored in a storage medium, including several instructions for a computer device (which can be a personal computer, a server, or a network device, etc.) or a processor to perform all or part of the steps of the method described in each embodiment of the present invention. The aforementioned storage medium includes: various media that can store program codes, such as a USB flash drive, a mobile hard disk, a read-only memory, a random access memory, a magnetic disk or an optical disk.

[0074] See also Figure 3 , Figure 3 It is a schematic diagram of the framework of an embodiment of an electric power system testing device of the present application. The electric power system testing device 30 includes a pulse current injection system 10 for loop resistance testing according to any of the above embodiments.

[0075] The above scheme uses the processing module to obtain the circuit characteristic information of the circuit to be tested, including electrical parameters, structural characteristics, component composition and connection logic, as well as the operating status and operating data, component list and component connection logic, etc. as the circuit characteristic information, so as to accurately determine the circuit type of the circuit to be tested from multiple dimensions. Based on this, the processing module can generate the associated module and test scheme of the test according to the circuit type and circuit characteristic information, and upload them to the centralized control module, so as to customize the appropriate test strategy for different types of circuits to be tested. The centralized control module controls the operation of the associated module according to the test scheme, and realizes the automation and precision operation of the circuit resistance test. The processing module matches the corresponding test scheme and associated module information from the preset test scheme library according to the circuit type, and realizes the efficient calling of targeted test schemes and associated modules to guide the test work. Specific associated modules are equipped for different circuit types, such as the first pulse current generating module and the first data acquisition module of the resistance circuit, the second pulse current generating module and the second data acquisition module of the inductive circuit, etc., to meet the test requirements of different circuit types. For the resistance circuit and the inductive circuit, the signal amplification module in the associated module realizes the enhancement of the strength of the collected electrical signal, improves the signal quality and the accuracy of subsequent data processing. The processing module obtains the impedance characterization value of the circuit to be tested, and uses the signal amplification module as an associated module when the impedance characterization value is higher than the preset threshold. The centralized control module determines the strength of the collected signal, sets the target amplification factor and controls the operation of the signal amplification module when it is lower than the preset threshold, thus realizing automatic and flexible configuration and adjustment of the signal amplification degree according to the circuit impedance and the actual collected signal strength. In nonlinear complex circuits, the dynamic compensation module of the associated module obtains nonlinear element information and matches the pre-stored nonlinear element characteristic curve to compensate for the collected electrical signal, thus realizing real-time adjustment and correction of the collected electrical signal, restoring the true resistance characteristics of the circuit, eliminating the influence of nonlinear elements on the measurement results, and further improving the accuracy of the circuit resistance measurement.

[0076] The above description is only an implementation method of the present application and does not limit the scope of the present application. Any equivalent structure or equivalent process transformation made using the contents of the present application specification and drawings, or directly or indirectly applied in other related technical fields, are also included in the protection scope of the present application.

Claims

1. A pulse current injection system for loop resistance testing, characterized in that: The system comprises: Processing module: used to obtain loop characteristic information of the circuit to be tested, and determine the loop type of the circuit to be tested according to the loop characteristic information; wherein the loop type includes a resistive loop, an inductive loop, a capacitive loop and a nonlinear complex loop; The processing module is also used to generate a test association module and a test scheme based on the loop type and the loop feature information, and upload the information of the association module and the test scheme to the centralized control module; wherein the association module is a functional module involved in completing the test scheme of the loop to be tested; The centralized control module is used to control the operation of the associated module according to the test scheme; The processing module is also used to obtain the operating state and operating data of the circuit to be tested as the circuit characteristic information, and determine the circuit type of the circuit to be tested according to the operating state and operating data of the circuit to be tested; The processing module is further used to obtain a component list and a component connection logic of the circuit to be tested as the circuit characteristic information, and determine a circuit type of the circuit to be tested according to the component list and the component connection logic of the circuit to be tested.

2. The pulse current injection system for loop resistance testing according to claim 1, characterized in that: The processing module is further used to match the corresponding test scheme and the information of the associated module corresponding to the test scheme from a preset test scheme library according to the loop type.

3. The pulse current injection system for loop resistance testing according to claim 2, characterized in that: The associated modules of the resistance loop include a first pulse current generating module and a first data acquisition module; the associated modules of the inductive loop include a second pulse current generating module and a second data acquisition module; the associated modules of the capacitive loop include a third pulse current generating module and a third data acquisition module; the associated modules of the nonlinear complex loop include a fourth pulse current generating module and a fourth data acquisition module.

4. The pulse current injection system for loop resistance testing according to claim 3, characterized in that: The association module of the resistance loop and the inductive loop also includes a signal amplification module, which is used to amplify the electrical signal collected by the first data acquisition module when the first pulse current generating module executes the test scheme, or the electrical signal collected by the second data acquisition module when the second pulse current generating module executes the test scheme.

5. The pulse current injection system for loop resistance testing according to claim 3, characterized in that: The association module of the nonlinear complex loop also includes a dynamic compensation module, and the dynamic compensation module is used to compensate for the electrical signal collected by the fourth data acquisition module when the fourth pulse current generation module executes the test scheme.

6. The pulse current injection system for loop resistance testing according to claim 4, characterized in that: The processing module is further configured to obtain an impedance characterization value of the circuit to be tested, and in response to the impedance characterization value being higher than a preset threshold, use the signal amplification module as an associated module of the circuit to be tested.

7. The pulse current injection system for loop resistance testing according to claim 5, characterized in that: The dynamic compensation module is also used to obtain nonlinear element information of the nonlinear complex loop, match a pre-stored nonlinear element characteristic curve according to the nonlinear element information, and use the nonlinear element characteristic curve to compensate for the electrical signal collected by the fourth data acquisition module when the fourth pulse current generating module executes the test scheme.

8. A power system testing device, characterized in that: The power system testing device comprises a pulse current injection system for loop resistance testing according to any one of claims 1 to 7.

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