A testing system, method, and electronic device applicable to various types of components.

Abstract

This application belongs to the field of electronic component testing technology, specifically disclosing a testing system, method, and electronic device applicable to multiple types of components. The system includes: a data acquisition module, a board under test (DUT), an electronic load, and a controller; both the data acquisition module and the electronic load are connected to the controller; both the data acquisition module and the electronic load are connected to the DUT; the DUT is used to configure switching devices and / or sensor devices; the data acquisition module is used to acquire first voltage test data from each output channel of the switching devices, and / or acquire second voltage test data from the sensor devices; the controller is used to perform functional tests on the switching devices based on the acquired first voltage test data; and / or, based on the acquired second voltage test data and current test data acquired from the electronic load, perform functional tests on the sensor devices. This application can effectively achieve automated testing covering multiple types of components.

Description

Technical Field

[0001] This application belongs to the field of electronic component testing technology, and more specifically, relates to a testing system, method and electronic equipment applicable to multiple types of components. Background Technology

[0002] Currently, when performing functional performance testing on electronic components such as Darlington transistors and Hall sensors, the common testing method is to manually test the components under test using source meters. This process requires setting up source meter circuits, which involves complex test connections, is time-consuming, and can only measure one type of component at a time, making it impossible to test multiple types of components simultaneously. In addition, the test results are also affected by the subjective judgment of the testers, resulting in low testing efficiency and low testing accuracy throughout the entire testing process.

[0003] Therefore, how to better test electronic components has become a technical problem that the industry urgently needs to solve. Summary of the Invention

[0004] In view of the shortcomings of the existing technology, the purpose of this application is to better realize the testing of electronic components, and to solve the problems of low testing efficiency and low testing accuracy in the entire testing process of existing electronic components.

[0005] To achieve the above objectives, in a first aspect, this application provides a testing system applicable to multiple types of components, comprising: Data acquisition module, board under test, electronic load and controller; The data acquisition module and the electronic load are both connected to the controller; the data acquisition module and the electronic load are both connected to the board under test; the board under test is used to house switching devices and / or sensor devices. The data acquisition module is used to acquire the first voltage test data of the multiple output channels of the switching device, and / or to acquire the second voltage test data of the sensor device; The controller is used to perform functional tests on the switching device based on the acquired first voltage test data. And / or, based on the acquired second voltage test data and the current test data acquired from the electronic load, the sensor device is subjected to functional testing.

[0006] Optionally, the system also includes a switch matrix module; The switch matrix module is connected to the data acquisition module, the board under test, and the controller, respectively; each switch branch in the switch matrix module is connected to one output channel of the switching device. The controller is used to control the switch matrix module to sequentially select each switch branch; The data acquisition module is used to sequentially acquire the first voltage test data of each output channel of the switching device through the switch matrix module.

[0007] Optionally, the system also includes a communication module; The controller is connected to the electronic load and the board under test respectively through the communication module; The communication module is used to control the board under test to adjust the switching state of the components under test on it, or to control the operating state of the electronic load, under the instructions issued by the controller. The controller is used to acquire current test data from the electronic load through the communication module.

[0008] Optionally, the switching device includes a Darlington transistor device; The data acquisition module is used to sequentially acquire the first voltage test data of each output channel of the Darlington transistor device through the switch matrix module when the Darlington transistor device is in the on state. The data acquisition module is also used to sequentially acquire the second voltage test data of each output channel of the Darlington transistor device through the switch matrix module when the Darlington transistor device is in the off state; the first voltage test data includes the first voltage test data and the second voltage test data. The controller is used to acquire the first voltage test sub-data and the second voltage test sub-data of each output channel of the Darlington transistor device, and to perform output tests on each output channel of the Darlington transistor device based on the first voltage test sub-data and the second voltage test sub-data of each output channel.

[0009] Optionally, the sensor device includes a Hall sensor device; The controller is used to acquire first current test data from the electronic load through the communication module when the electronic load is in the working state and is in the same current loop as the Hall sensor device. The data acquisition module is used to acquire the third voltage test sub-data of the Hall sensor device; The controller is also used to perform a zero-point offset voltage test on the Hall sensor device based on the acquired first current test data and the third voltage test sub-data.

[0010] Optionally, the controller is further configured to control the electronic load to sequentially adjust the second current test data in constant current mode according to the target current range, so as to adjust the current flowing through the Hall sensor device; The data acquisition module is used to acquire the fourth voltage test data of the Hall sensor device under different currents; The controller is also configured to determine the current-voltage relationship curve of the Hall sensor device based on the various second current test data obtained from the electronic load and the various fourth voltage test sub-data obtained from the data acquisition module, and to perform a linearity error test on the Hall sensor device based on the current-voltage relationship curve.

[0011] Secondly, this application provides a testing method applied to any of the aforementioned testing systems, comprising: Collect the first voltage test data of the multiple output channels of the switching device, and / or collect the second voltage test data of the sensor device; Functional tests are performed on the switching device based on the acquired first voltage test data. And / or, based on the acquired second voltage test data and the current test data acquired from the electronic load, the sensor device is subjected to functional testing.

[0012] Optionally, the switching device includes a Darlington transistor; the acquisition of the first voltage test data of the multiple output channels of the switching device includes: With the Darlington transistor device in the ON state, the first voltage test data of each output channel of the Darlington transistor device are collected sequentially. When the Darlington transistor device is in the off state, the second voltage test data of each output channel of the Darlington transistor device are collected sequentially; the first voltage test data includes the first voltage test data and the second voltage test data. Correspondingly, the functional testing of the switching device based on the acquired first voltage test data includes: The first voltage test data and the second voltage test data of each output channel of the Darlington transistor device are obtained, and output tests are performed on each output channel of the Darlington transistor device based on the first voltage test data and the second voltage test data of each output channel.

[0013] Optionally, the sensor device includes a Hall sensor device; the acquisition of the second voltage test data of the sensor device includes: When the electronic load is in operation and is in the same current loop as the Hall sensor device, the first current test data is obtained from the electronic load through the communication module, and the third voltage test data output by the Hall sensor device is obtained. Correspondingly, the functional testing of the sensor device based on the acquired second voltage test data and the current test data acquired from the electronic load includes: Based on the acquired third voltage test data and the first current test data acquired from the electronic load, the Hall sensor device is subjected to a zero-point offset voltage test. The current test data includes the first current test data, and the second voltage test data includes the third voltage test sub-data.

[0014] Thirdly, this application provides an electronic device, comprising: at least one memory for storing a program; and at least one processor for executing the program stored in the memory, wherein when the program stored in the memory is executed, the processor is configured to execute the method described in the first aspect or any possible implementation thereof.

[0015] Fourthly, this application provides a computer-readable storage medium storing a computer program that, when run on a processor, causes the processor to perform the method described in the first aspect or any possible implementation thereof.

[0016] Fifthly, this application provides a computer program product that, when run on a processor, causes the processor to perform the method described in the first aspect or any possible implementation thereof.

[0017] It is understood that the beneficial effects of the second to fifth aspects mentioned above can be found in the relevant descriptions in the first aspect mentioned above, and will not be repeated here.

[0018] Overall, the technical solutions conceived in this application have the following beneficial effects compared with the prior art: This application provides a testing system, method, and electronic device applicable to various types of components. By rationally designing the test control circuit using a data acquisition module, a board under test, an electronic load, and a controller, the data acquisition module can acquire first voltage test data from each output channel of a switching device and second voltage test data from a sensor device. Based on the acquired first voltage test data, relevant functional tests can be performed on the switching device. Similarly, based on the acquired second voltage test data and current test data from the electronic load, relevant functional tests can be performed on the sensor device. This effectively achieves automated testing covering various types of components, eliminating the need for manual intervention and improving the overall testing efficiency and accuracy. Attached Figure Description

[0019] Figure 1 This is one of the structural schematic diagrams of a test system applicable to multiple types of components provided in the embodiments of this application; Figure 2 This is a second schematic diagram of the structure of a test system applicable to multiple types of components provided in the embodiments of this application; Figure 3 This is the third schematic diagram of the structure of the test system applicable to multiple types of components provided in the embodiments of this application; Figure 4 This is a flowchart illustrating the testing method of the testing system provided in this application embodiment; Figure 5 This is a schematic diagram of the structure of the electronic device provided in the embodiments of this application. Detailed Implementation

[0020] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0021] In this application, the term "and / or" describes the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent three cases: A existing alone, A and B existing simultaneously, and B existing alone. In this application, the symbol " / " indicates that the related objects are in an "or" relationship, for example, A / B means A or B.

[0022] The terms "first" and "second," etc., used in the specification and claims of this application are used to distinguish different objects, not to describe a specific order of the objects. For example, "first voltage test data" and "second voltage test data" are used to distinguish different voltage test data, not to describe a specific order of the voltage test data.

[0023] In the embodiments of this application, the terms "exemplary" or "for example" are used to indicate that something is an example, illustration, or description. Any embodiment or design that is described as "exemplary" or "for example" in the embodiments of this application should not be construed as being more preferred or advantageous than other embodiments or design. Specifically, the use of the terms "exemplary" or "for example" is intended to present the relevant concepts in a specific manner.

[0024] In the description of the embodiments of this application, unless otherwise stated, "multi-channel" means two or more channels. For example, multiple output channels refer to two or more output channels of a switching transistor device.

[0025] The embodiments of this application are described below with reference to the accompanying drawings.

[0026] Figure 1 This is one of the structural schematic diagrams of a test system applicable to multiple types of components provided in the embodiments of this application, such as... Figure 1 As shown, it includes: Data acquisition module 1, board under test 2, electronic load 3, and controller 4; Data acquisition module 1 and electronic load 3 are both connected to controller 4; data acquisition module 1 and electronic load 3 are both connected to board under test 2; board under test 2 is used to set switching device 21 and / or sensor device 22; The data acquisition module 1 is used to acquire the first voltage test data of the multiple output channels of the switching device 21, and / or, acquire the second voltage test data of the sensor device 22; The controller 4 is used to perform functional tests on the switching device 21 based on the acquired first voltage test data; And / or, based on the acquired second voltage test data and the current test data acquired from the electronic load 3, the sensor device 22 is subjected to functional testing.

[0027] Specifically, the switching device described in the embodiments of this application is also called a power switching transistor or semiconductor switch, and its core function is to switch between "on" and "off" in a circuit. This device can achieve precise control of the circuit state by controlling the flow or interruption of current. Specifically, it can include Darlington transistor devices or field-effect transistor devices, etc.

[0028] The sensor devices described in this application refer to any electronic sensor device used to detect the electrical output performance of a device, such as current and voltage. Specifically, they may include Hall sensor devices or current transformer devices.

[0029] The first voltage test data described in the embodiments of this application refers to the voltage test data output by the internal multiple output channels of the switching transistor device when it is working.

[0030] The second voltage test data described in the embodiments of this application refers to the voltage test data output by the output port of the sensor device when it is working.

[0031] It should be noted that an electronic load is a device that consumes electrical energy by controlling the conduction of its internal power devices (such as MOSFETs or transistors) and relying on the power dissipation of the power transistors. It can accurately detect the load voltage and precisely adjust the load current, thereby simulating the response of a real load to an input signal. Electronic loads generally have multiple modes such as constant current, constant voltage, constant resistance, constant power, short circuit, and dynamic load, which can simulate various different load conditions.

[0032] In the embodiments of this application, the magnitude of the current flowing through the sensor device in the same circuit can be changed by adjusting the rated current of the electronic load.

[0033] In the embodiments of this application, the data acquisition module and the electronic load are both connected to the controller, and the data acquisition module and the electronic load are both connected to the board under test, thereby realizing the electrical connection between the controller and the board under test.

[0034] In the embodiments of this application, the board under test can be equipped with switching devices and / or sensor devices. That is, a single type of device under test, such as a switching device or a sensor device, can be set on the board under test for subsequent single-type device testing covering multiple types of components. Furthermore, two types of devices under test can also be set on the board under test simultaneously, such as switching devices and sensor devices, for subsequent parallel testing covering multiple types of components.

[0035] The board under test can also have an FPGA chip pre-integrated to enable connection and control with the controller. The controller can adjust the operating status of the device under test on the board by controlling the FPGA chip.

[0036] More specifically, in the embodiments of this application, the system can perform test tasks under two types of test scenarios on multiple types of devices under test (DUTs) set on the board under test. The first type of test scenario refers to the scenario in which the system performs individual testing on a single type of DUT, and the second type of test scenario refers to the scenario in which the system performs parallel testing on all types of DUTs.

[0037] In the specific implementation of the first type of test scenario, when the system starts working and the board under test is powered on, the data acquisition module can independently collect the voltage test data output by each output channel of the switching device on the board under test, i.e., the first voltage test data; or, the data acquisition module can independently collect the second voltage test data output by the sensor device on the board under test. Through the connection with the data acquisition module, the controller can obtain the voltage test data of each output channel of the switching device or the voltage test data output by the sensor device upon receiving a test command, and obtain the current test data of the circuit from the electronic load.

[0038] Furthermore, the controller can test the output functions of each channel of the switching device based on the acquired first voltage test data; or it can test the relevant output functions of the sensor device based on the acquired second voltage test data and the current test data obtained from the electronic load. Thus, the system can perform testing on a single type of device covering multiple types of components.

[0039] Furthermore, in the specific implementation of the second type of test scenario, when the system starts working and the board under test is powered on, the data acquisition module can simultaneously acquire the first voltage test data output by each output channel of the switching device on the board under test, as well as the second voltage test data output by the sensor device on the board under test. Then, upon receiving a test command, the controller can obtain the voltage test data of each output channel of the switching device from the data acquisition module, the voltage test data output by the sensor device, and the current test data of the circuit from the electronic load.

[0040] Furthermore, the controller can test the output functions of each channel of the switching device based on the acquired first voltage test data; simultaneously, it can test the relevant output functions of the sensor device based on the acquired second voltage test data and current test data. Thus, the system can achieve parallel testing covering multiple types of components.

[0041] The testing system applicable to multiple types of components in this application embodiment, through the rational design of the test control circuit using a data acquisition module, the board under test, an electronic load, and a controller, enables the data acquisition module to acquire first voltage test data of each output channel of the switching device, as well as second voltage test data of the sensor device. Then, based on the acquired first voltage test data, relevant functional tests can be performed on the switching device, and based on the acquired second voltage test data and current test data obtained from the electronic load, relevant functional tests can be performed on the sensor device. This effectively achieves automated testing covering multiple types of components, eliminating the need for manual intervention and improving the testing efficiency and accuracy of the entire device testing process.

[0042] Figure 2 This is a second schematic diagram of the structure of a testing system applicable to multiple types of components provided in the embodiments of this application, as shown below. Figure 2 As shown, the system also includes a switch matrix module 5; The switch matrix module 5 is connected to the data acquisition module 1, the board under test 2, and the controller 4 respectively; each switch branch in the switch matrix module 5 is connected to one output channel of the switch transistor device 21. Controller 4 is used to control the switch matrix module 5 to sequentially select each switch branch; The data acquisition module 1 is used to sequentially acquire the first voltage test data of each output channel of the switching transistor device through the switch matrix module 5.

[0043] Specifically, in the embodiments of this application, the system further includes a switch matrix module, which internally contains a switch branch matrix. The switch matrix module is connected to the data acquisition module, the board under test, and the controller, respectively. Each switch branch in the switch matrix module is connected to one output channel of the switching device, so as to control the data acquisition module to collect the voltage test data of each output channel of the switching device one by one.

[0044] In practical implementation, when the system tests the switching devices, the controller can directly control the operating status of the switch matrix module. After the switch matrix module selects one switch branch, the data acquisition module can collect the voltage test data of the output channel of the switching device connected to that switch branch through the switch matrix module. After testing the voltage test data of that output channel of the switching device, the controller can switch to the next output channel of the switching device through the control switch matrix module to start the voltage test of the next output channel. Similarly, the data acquisition module can sequentially collect the voltage test data of each output channel of the switching device through the switch matrix module to perform voltage testing channel by channel.

[0045] The system in this application embodiment introduces a switch matrix module. By utilizing the on / off control performance of the switch matrix module, the voltage data of each output channel of the switching device can be accurately measured. At the same time, if the voltage data of a certain output channel is abnormal during the test, the specific channel and device can be quickly located, which facilitates the system's fault analysis and helps to improve the efficiency and accuracy of switching device testing.

[0046] Continue to refer to Figure 2 In embodiments of this application, the system further includes a communication module 6; The controller 4 is connected to the electronic load 3 and the board under test 2 via the communication module 6. The communication module 6 is used to control the test board 2 to adjust the switching state of the tested components on it, or to control the operating state of the electronic load 3, under the instructions issued by the controller 4. The controller 4 is used to acquire current test data from the electronic load 3 via the communication module 6.

[0047] Specifically, in the embodiments of this application, the controller is connected to the electronic load and the board under test respectively through the introduced communication module. In this way, through the communication interaction of the communication module, the controller can control the board under test to adjust the switching state of the components under test (such as switching transistors and / or sensor devices) on it, and can also control the operating state of the electronic load to indirectly adjust the output of the sensor device.

[0048] In the specific implementation process, when the system tests the sensor device, the controller first controls the electronic load to turn on through the communication module, so that the sensor device is powered on, thereby forming a current loop. Then, by adjusting the current value of the electronic load, the current flowing through the sensor device is changed. At the same time, the controller obtains the current test data of the loop from the electronic load through the communication module, thereby obtaining the current test data of the sensor device, which is used for subsequent testing of the output performance of the sensor device.

[0049] The system in this application embodiment incorporates a communication module, which allows the controller to remotely control and configure the status of the electronic load and the board under test. This avoids the tediousness and time-consuming nature of traditional manual operation, greatly improving testing efficiency and making the testing process faster and more accurate. At the same time, the communication module also supports multi-channel parallel communication, which can simultaneously control multiple types of components on the board under test for testing, further shortening the testing cycle and improving testing efficiency.

[0050] Figure 3 This is the third schematic diagram of the structure of a test system applicable to multiple types of components provided in the embodiments of this application, as shown below. Figure 3 As shown, in an embodiment of this application, the switching device 21 includes a Darlington transistor device; The data acquisition module 1 is used to sequentially acquire the first voltage test data of each output channel of the Darlington transistor device through the switch matrix module 5 when the Darlington transistor device is in the on state. The data acquisition module 1 is also used to sequentially acquire the second voltage test sub-data of each output channel of the Darlington transistor device through the switch matrix module 5 when the Darlington transistor device is in the off state; the first voltage test data includes the first voltage test sub-data and the second voltage test sub-data. The controller 4 is used to acquire the first voltage test sub-data and the second voltage test sub-data of each output channel of the Darlington transistor device, and to perform output tests on each output channel of the Darlington transistor device based on the first voltage test sub-data and the second voltage test sub-data of each output channel.

[0051] Specifically, in the embodiments of this application, the Darlington transistor device includes multiple output channels, each output channel including one or more Darlington transistors to achieve independent control and drive functions.

[0052] The first voltage test sub-data described in the embodiments of this application refers to the voltage test sub-data obtained by collecting each output channel of the Darlington transistor device when the device is in the on state.

[0053] The second voltage test sub-data described in the embodiments of this application refers to the voltage test sub-data obtained by collecting each output channel of the Darlington transistor device when the device is in the off state.

[0054] In the embodiments of this application, during the testing of the Darlington transistor device, the controller can acquire the first voltage test sub-data and the second voltage test sub-data of each output channel of the Darlington transistor device through the data acquisition module, and perform output tests on each output channel of the Darlington transistor device based on the first voltage test sub-data and the second voltage test sub-data of each output channel, so as to realize the switching function test of the Darlington transistor device.

[0055] like Figure 3 As shown in the embodiments of this application, the test chamber is mainly used to install the circuit board under test (DUT) containing the device under test (DUT), and can meet the requirements of DUT fixation, heat dissipation, and protection. The test chamber is designed with power and communication interfaces, and is powered by an external current source. The power and communication signals of the DUT are led to the test chamber, and convenient interconnection with various external modules is achieved through the various interfaces of the test chamber. Simultaneously, a power module is also installed inside the test chamber, which provides power to the peripheral circuits of the DUT.

[0056] In the embodiments of this application, the system also provides a human-computer interaction platform at the front end for testers to perform test operations and issue and control instructions to the system controller.

[0057] More specifically, in the embodiments of this application, the specific steps for the system to perform switching function testing on the Darlington transistor device are as follows: Step S101: Install the board under test equipped with Darlington transistor devices into the test chamber, and then connect the test chamber and each module in the test system with cables according to the correct connection relationship.

[0058] Step S102: Click the run button of the system test software. The test software calls the controller to send instructions to the communication module through the serial port. The communication module is connected to the test chassis through the communication cable connected on the interface panel. The test chassis is connected to the board under test through the internal cable. After receiving the instructions, the board under test starts to work.

[0059] In step S103, the test software calls the controller to send instructions to the communication module through the PXI interface. The communication module sends instructions to the FPGA chip on the board under test in the test chassis. The FPGA chip controls the Darlington transistor device installed on the board under test to be in an on or off state. The data acquisition module sequentially collects the first voltage test data of each output channel of the Darlington transistor device through the switch matrix module, or sequentially collects the second voltage test data of each output channel of the Darlington transistor device. At the same time, the data acquisition module transmits all the collected test data back to the controller through the USB cable.

[0060] During the process, after testing the voltage data of one channel of the Darlington transistor device, the switch matrix module switches to the next output channel of the Darlington transistor device and starts the voltage test of the next output channel. The test data is transmitted back to the controller through the switch matrix module and the data acquisition module. This process is repeated until the voltage test data of all output channels of the Darlington transistor device has been tested.

[0061] The testing software issues control commands, and the controller performs tests based on criterion data and the returned voltage test data. A consistent interpretation of the command indicates a pass, and the results are displayed on the software panel. The test data is stored locally. Specifically, after acquiring the first and second voltage test data for one output channel of the Darlington transistor device, the controller calculates the difference between them. Based on this difference and a preset criterion (e.g., a difference less than ±0.1V), it determines whether the output voltage data of that channel is normal when the Darlington transistor device is on or off. This process is repeated for each output channel of the Darlington transistor device until the switching function test is complete.

[0062] Step S104: After the test is completed, the test software controls the power off of the board under test via the serial port and exits the test.

[0063] The system in this application embodiment, by performing output channel-by-channel testing on Darlington transistor devices, can promptly detect faults such as short circuits and open circuits inside the transistors, avoiding equipment damage or performance degradation caused by faults in practical applications. At the same time, it can comprehensively evaluate the performance indicators of its switching function and improve testing accuracy.

[0064] Continue to refer to Figure 3 In the embodiments of this application, sensor device 22 includes a Hall sensor device; The controller 4 is used to acquire first current test data from the electronic load via the communication module 6 when the electronic load 3 is in operation and is in the same current loop as the Hall sensor device. Data acquisition module 1 is used to acquire the third voltage test data of the Hall sensor device; Controller 4 is also used to perform zero-point offset voltage testing on the Hall sensor device based on the acquired first current test data and third voltage test sub-data.

[0065] Specifically, the first current test data described in the embodiments of this application refers to the loop current test data obtained from the electronic load when the electronic load is in working state and is in the same current loop as the Hall sensor device.

[0066] The third voltage test sub-data described in the embodiments of this application refers to the voltage test data output by the Hall sensor device, which is acquired simultaneously with the acquisition of the first current test data.

[0067] The zero offset voltage test described in the embodiments of the present application is used to test the offset voltage of the output signal of a Hall sensor device when the current is zero. When the measured current is zero, the sensor should theoretically output a zero value, but there is a certain deviation in practice, and this deviation is the zero offset voltage.

[0068] In the embodiments of the present application, during the test of the Hall sensor device, when the electronic load is in working state and the Hall sensor device is in the same current loop, the controller can obtain the first current test data from the electronic load through the communication module, and obtain the third voltage test sub-data output by the Hall sensor device through the data acquisition module, and then perform zero offset voltage test on the Hall sensor device based on the obtained first current test data and the third voltage test sub-data.

[0069] More specifically, in the embodiments of the present application, the specific steps for the system to perform the zero offset voltage test on the Hall sensor device are as follows: Step S201: install the tested board card provided with the Hall sensor device into the accompanying test chassis, and then connect the accompanying test chassis and each module in the test system with cables according to the correct connection relationship.

[0070] Step S202: correctly connect the data acquisition module and the electronic load to the corresponding detection points on the tested board card in the accompanying test chassis respectively.

[0071] Step S203: the system test software invokes the controller to send a control instruction to the communication module through the PXI interface, and the communication module sends the control instruction to the electronic load and the tested board card through the serial port. The electronic load starts to work in a zero current state, forms a current loop, and the tested board card starts to work.

[0072] Step S204: the controller reads the current test data of the electronic load through the communication module serial port (electrical interface standard RS232), thereby obtaining the first current test data; meanwhile, the data acquisition module reads the voltage test data output by the Hall sensor device on the tested board card through the data cable, thereby obtaining the third voltage test sub-data, and uploads the data to the controller. Step S205: the controller compares the preset criterion in the test software with the test result. For example, the criterion can be set as: if the first current test data ≤ ±0.1A, it is qualified, and if the third voltage test sub-data ≤ ±0.05V, it is qualified. After that, the test result data of the Hall sensor device can be obtained, and the data is stored in the local database, thus completing the zero offset voltage test of the Hall sensor device.

[0073] The system of this application embodiment acquires current test data from the electronic load and collects voltage test data of the Hall sensor device when the electronic load is in working state and in the same current loop as the Hall sensor device. It tests whether the zero-point offset voltage of the Hall sensor device is qualified from both loop current data and device output voltage data. Compared with the traditional method of only measuring device voltage test data, it can more accurately determine the zero-point offset voltage of the device and further improve the test accuracy of the device.

[0074] Continue to refer to Figure 3 In the embodiments of this application, the controller 4 is also used to control the electronic load 3 to adjust the second current test data in constant current mode according to the target current range in order to adjust the current flowing through the Hall sensor device. Data acquisition module 1 is used to acquire the data of each fourth voltage test sub-data of the Hall sensor device under different currents; The controller 4 is also used to determine the current-voltage relationship curve of the Hall sensor device based on the various second current test data obtained from the electronic load 3 and the various fourth voltage test sub-data obtained from the data acquisition module 1, and to perform linearity error test on the Hall sensor device based on the current-voltage relationship curve.

[0075] Specifically, the target current range described in the embodiments of this application refers to the range from zero current to the maximum rated current of the Hall sensor device.

[0076] The second current test data described in the embodiments of this application refers to the loop current test data obtained by sequentially adjusting the set current value in constant current mode according to the target current range of the electronic load.

[0077] The fourth voltage test sub-data described in the embodiments of this application refers to the voltage test data output by the Hall sensor device under different currents after gradually adjusting the current flowing through the Hall sensor device.

[0078] The linearity error test described in this application refers to the degree of nonlinearity between the output voltage of the Hall sensor device and the measured current. Specifically, it can be expressed as the percentage of the maximum deviation between the current-voltage relationship curve of the Hall sensor device and the ideal straight line and its full-scale output.

[0079] In the embodiments of this application, during the testing of the Hall sensor device, the controller can also control the electronic load to sequentially adjust the current test data in constant current mode, i.e., the second current test data, according to the target current range, so as to adjust the current flowing through the Hall sensor device. Thus, the data acquisition module can acquire the voltage test data of the Hall sensor device under different currents, i.e., the fourth voltage test sub-data. Then, based on the acquired second current test data and the fourth voltage test sub-data, the controller can calculate the current-voltage relationship curve of the Hall sensor device, and make a judgment based on the current-voltage relationship curve to realize the linearity error test of the Hall sensor device.

[0080] More specifically, in the embodiments of this application, the specific steps for the system to perform linearity error testing on the Hall sensor device are as follows: Step S301: Install the board under test equipped with the Hall sensor device into the test chamber, and then connect the test chamber and each module in the test system with cables according to the correct connection relationship.

[0081] Step S302: Connect the data acquisition module and the electronic load correctly to the corresponding test points on the board under test in the test chamber.

[0082] In step S303, the system test software calls the controller to send control commands to the communication module through the PXI interface. The communication module sends the commands to the electronic load and the board under test through the serial port. The electronic load starts working, forming a current loop, and the board under test starts working.

[0083] In step S304, the controller controls the electronic load to turn on via the communication module's serial port (electrical interface standard RS232), powering on the test circuit. The electronic load simulates a load and is placed in constant current mode, consuming the output power of the circuit's DC power supply. The current value flowing through the Hall current sensor is changed by adjusting the electronic load current value according to the target current range, specifically controlling the electronic load current value from 0 to the device's maximum rated current value. During this process, the controller can acquire various second current test data from the electronic load. Simultaneously, the data acquisition module can measure the voltage test data output by the Hall sensor device at each current value, i.e., the fourth voltage test sub-data. The controller can read the aforementioned voltage test data measured by the data acquisition module via USB. Afterward, the controller can calculate and determine the current-voltage relationship curve of the Hall sensor device.

[0084] In step S305, the controller compares and calculates the current-voltage relationship curve of the Hall sensor device with the pre-imported criteria to determine whether the test result is qualified, and saves the test result data in the local database, thereby completing the linearity error test of the Hall sensor device.

[0085] It should be noted that the pass / fail criteria for each device under test can be determined based on the device model and the device manual.

[0086] In the embodiments of this application, the controller can also perform output accuracy error testing on the Hall sensor device by combining the output voltage test data of the Hall sensor device measured by the acquired data acquisition module with the preset ideal voltage test data.

[0087] The system in this application embodiment introduces an electronic load into the test system, which can simulate different current operating conditions and load conditions, thereby more comprehensively evaluating the linearity error of the Hall sensor. This ensures that the output signal of the sensor maintains high accuracy under different loads and improves the overall test accuracy of the Hall sensor device.

[0088] The test methods of the test system provided in this application are described below. The test methods of the test system described below can be referred to in correspondence with the test system described above.

[0089] Figure 4 This is a flowchart illustrating the testing method of the testing system provided in this application embodiment, which can be applied to any of the aforementioned testing systems, such as... Figure 4 As shown, the method includes: Step S1: Acquire the first voltage test data of the multiple output channels of the switching device, and / or acquire the second voltage test data of the sensor device; Step S2: Perform functional testing on the switching device based on the acquired first voltage test data; and / or, perform functional testing on the sensor device based on the acquired second voltage test data and the current test data acquired from the electronic load.

[0090] It is understood that detailed embodiments of the above methods can be found in the description of the detailed functional implementation of each unit / module in the aforementioned system embodiments, and will not be repeated here.

[0091] It should be understood that the above method is applied to the system in the above embodiments. The implementation principle and technical effect of the method are similar to the description of the corresponding program modules in the above system. The corresponding process in the method can be referred to the working process of the system, and will not be repeated here.

[0092] The testing method of this application embodiment, through the rational design of the test control circuit using a data acquisition module, the board under test, an electronic load, and a controller, enables the data acquisition module to acquire first voltage test data of each output channel of the switching device, as well as second voltage test data of the sensor device. Then, based on the acquired first voltage test data, relevant functional tests can be performed on the switching device, and based on the acquired second voltage test data and current test data obtained from the electronic load, relevant functional tests can be performed on the sensor device. This effectively achieves automated testing covering multiple types of components, eliminating the need for manual intervention and improving the testing efficiency and accuracy of the entire device testing process.

[0093] Based on the above embodiments, as an optional embodiment, the switching device includes a Darlington transistor device; acquiring the first voltage test data of the multiple output channels of the switching device includes: With the Darlington transistor device in the ON state, the first voltage test data of each output channel of the Darlington transistor device are collected sequentially. With the Darlington transistor device in the off state, the second voltage test data of each output channel of the Darlington transistor device are collected sequentially; the first voltage test data includes the first voltage test data and the second voltage test data. Correspondingly, functional tests are performed on the switching devices based on the acquired first voltage test data, including: Acquire the first voltage test data and the second voltage test data of each output channel of the Darlington transistor device, and perform output tests on each output channel of the Darlington transistor device based on the first voltage test data and the second voltage test data of each output channel.

[0094] Based on the above embodiments, as an optional embodiment, the sensor device includes a Hall sensor device; acquiring the second voltage test data of the sensor device includes: When the electronic load is in operation and is in the same current loop as the Hall sensor device, the first current test data is obtained from the electronic load through the communication module, and the third voltage test data output by the Hall sensor device is also obtained. Correspondingly, based on the acquired second voltage test data and the current test data acquired from the electronic load, functional tests are performed on the sensor device, including: Based on the acquired third voltage test data and the first current test data obtained from the electronic load, the Hall sensor device is subjected to zero-point offset voltage test. The current test data includes the first current test data, and the second voltage test data includes the third voltage test sub-data.

[0095] Based on the methods in the above embodiments, this application provides an electronic device, such as... Figure 5 As shown, the electronic device may include a processor 510, a communications interface 520, a memory 530, and a communication bus 540, wherein the processor 510, the communications interface 520, and the memory 530 communicate with each other via the communication bus 540. The processor 510 can call logical instructions in the memory 530 to execute the methods in the above embodiments.

[0096] Furthermore, the logical instructions in the aforementioned memory 530 can be implemented as software functional units and, when sold or used as independent products, can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or a portion of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of this application.

[0097] Based on the methods in the above embodiments, this application provides a computer-readable storage medium storing a computer program that, when run on a processor, causes the processor to execute the methods in the above embodiments.

[0098] Based on the methods in the above embodiments, this application provides a computer program product that, when run on a processor, causes the processor to execute the methods in the above embodiments.

[0099] It is understood that the processor in the embodiments of this application can be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), or other programmable logic devices, transistor logic devices, hardware components, or any combination thereof. A general-purpose processor can be a microprocessor or any conventional processor.

[0100] The method steps in this application embodiment can be implemented in hardware or by a processor executing software instructions. The software instructions can consist of corresponding software modules, which can be stored in random access memory (RAM), flash memory, read-only memory (ROM), programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), electrically erasable programmable read-only memory (EEPROM), registers, hard disks, portable hard disks, CD-ROMs, or any other form of storage medium known in the art. An exemplary storage medium is coupled to the processor, enabling the processor to read information from and write information to the storage medium. Of course, the storage medium can also be a component of the processor. The processor and the storage medium can reside in an ASIC.

[0101] In the above embodiments, implementation can be achieved entirely or partially through software, hardware, firmware, or any combination thereof. When implemented using software, it can be implemented entirely or partially as a computer program product. The computer program product includes one or more computer instructions. When the computer program instructions are loaded and executed on a computer, all or part of the processes or functions described in the embodiments of this application are generated. The computer can be a general-purpose computer, a special-purpose computer, a computer network, or other programmable device. The computer instructions can be stored in a computer-readable storage medium or transmitted through the computer-readable storage medium. The computer instructions can be transmitted from one website, computer, server, or data center to another website, computer, server, or data center via wired (e.g., coaxial cable, fiber optic, digital subscriber line (DSL)) or wireless (e.g., infrared, wireless, microwave, etc.) means. The computer-readable storage medium can be any available medium that a computer can access or a data storage device such as a server or data center that integrates one or more available media. The available medium can be a magnetic medium (e.g., floppy disk, hard disk, magnetic tape), an optical medium (e.g., DVD), or a semiconductor medium (e.g., solid-state disk (SSD)).

[0102] It is understood that the various numerical designations used in the embodiments of this application are merely for the convenience of description and are not intended to limit the scope of the embodiments of this application.

[0103] It should be understood that expressions such as “comprising” and “may include” used in this application indicate the existence of the disclosed functions, operations, or constituent elements, and do not limit one or more additional functions, operations, and constituent elements. In this application, terms such as “comprising” and / or “having” are to be interpreted as indicating a particular characteristic, number, operation, constituent element, component, or combination thereof, but not to exclude the existence or possibility of adding one or more other characteristics, numbers, operations, constituent elements, components, or combinations thereof.

[0104] Those skilled in the art will readily understand that the above description is merely a preferred embodiment of this application and is not intended to limit this application. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of this application should be included within the scope of protection of this application.

Claims

1. A testing system applicable to multiple types of components, characterized in that, include: Data acquisition module, board under test, electronic load and controller; The data acquisition module and the electronic load are both connected to the controller; the data acquisition module and the electronic load are both connected to the board under test; the board under test is used to house switching transistors and sensor devices. The data acquisition module is used to acquire the first voltage test data of the multiple output channels of the switching device and the second voltage test data of the sensor device; The controller is used to perform functional tests on the switching device based on the acquired first voltage test data. Based on the acquired second voltage test data and the current test data acquired from the electronic load, the sensor device is subjected to functional testing. This also includes a communication module; The controller is connected to the electronic load and the board under test respectively through the communication module; The communication module is used to control the board under test to adjust the switching state of the components under test on it, and to control the operating state of the electronic load, under the instructions issued by the controller. The controller is used to acquire current test data from the electronic load through the communication module; This also includes a switch matrix module; The switch matrix module is connected to the data acquisition module, the board under test, and the controller, respectively; each switch branch in the switch matrix module is connected to one output channel of the switching device. The controller is used to control the switch matrix module to sequentially select each switch branch; The data acquisition module is used to sequentially acquire the first voltage test data of each output channel of the switching transistor device through the switching matrix module; The switching device includes a Darlington transistor device; The data acquisition module is used to sequentially acquire the first voltage test data of each output channel of the Darlington transistor device through the switch matrix module when the Darlington transistor device is in the on state. The data acquisition module is also used to sequentially acquire the second voltage test data of each output channel of the Darlington transistor device through the switch matrix module when the Darlington transistor device is in the off state; the first voltage test data includes the first voltage test data and the second voltage test data. The controller is used to acquire the first voltage test sub-data and the second voltage test sub-data of each output channel of the Darlington transistor device, and to perform output tests on each output channel of the Darlington transistor device based on the first voltage test sub-data and the second voltage test sub-data of each output channel.

2. The testing system according to claim 1, characterized in that, The sensor device includes a Hall sensor device; The controller is used to acquire first current test data from the electronic load through the communication module when the electronic load is in the working state and is in the same current loop as the Hall sensor device. The data acquisition module is used to acquire the third voltage test sub-data of the Hall sensor device; The controller is also used to perform a zero-point offset voltage test on the Hall sensor device based on the acquired first current test data and the third voltage test sub-data.

3. The testing system according to claim 2, characterized in that, The controller is also used to control the electronic load to adjust the second current test data in constant current mode according to the target current range, so as to adjust the current flowing through the Hall sensor device; The data acquisition module is used to acquire the fourth voltage test data of the Hall sensor device under different currents; The controller is also configured to determine the current-voltage relationship curve of the Hall sensor device based on the various second current test data obtained from the electronic load and the various fourth voltage test sub-data obtained from the data acquisition module, and to perform a linearity error test on the Hall sensor device based on the current-voltage relationship curve.

4. A test method applied to the test system as described in any one of claims 1-3, characterized in that, include: Collect the first voltage test data of the multiple output channels of the switching device, and collect the second voltage test data of the sensor device; Functional tests are performed on the switching device based on the acquired first voltage test data. Based on the acquired second voltage test data and the current test data acquired from the electronic load, the sensor device is subjected to functional testing. This also includes a communication module; The controller is connected to the electronic load and the board under test respectively through the communication module; The communication module is used to control the board under test to adjust the switching state of the components under test on it, and to control the operating state of the electronic load, under the instructions issued by the controller. The controller is used to acquire current test data from the electronic load through the communication module; The switching device includes a Darlington transistor; the acquisition of the first voltage test data of the multiple output channels of the switching device includes: With the Darlington transistor device in the ON state, the first voltage test data of each output channel of the Darlington transistor device are collected sequentially. When the Darlington transistor device is in the off state, the second voltage test data of each output channel of the Darlington transistor device are collected sequentially; the first voltage test data includes the first voltage test data and the second voltage test data. Correspondingly, the functional testing of the switching device based on the acquired first voltage test data includes: The first voltage test data and the second voltage test data of each output channel of the Darlington transistor device are obtained, and output tests are performed on each output channel of the Darlington transistor device based on the first voltage test data and the second voltage test data of each output channel.

5. The test method according to claim 4, characterized in that, The sensor device includes a Hall sensor device; the acquisition of the second voltage test data of the sensor device includes: When the electronic load is in operation and is in the same current loop as the Hall sensor device, the first current test data is obtained from the electronic load through the communication module, and the third voltage test data output by the Hall sensor device is obtained. Correspondingly, the functional testing of the sensor device based on the acquired second voltage test data and the current test data acquired from the electronic load includes: Based on the acquired third voltage test data and the first current test data acquired from the electronic load, the Hall sensor device is subjected to a zero-point offset voltage test. The current test data includes the first current test data, and the second voltage test data includes the third voltage test sub-data.

6. An electronic device, characterized in that, include: At least one memory for storing computer programs; At least one processor is configured to execute a program stored in the memory, wherein when the program stored in the memory is executed, the processor is configured to perform the method as described in any one of claims 4-5.

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