PLC-based adjacent station anti-interference electrical control system

Abstract

The invention relates to the technical field of industrial measurement, and particularly discloses an adjacent station anti-interference electrical control system based on a PLC, and the system comprises a light interference data collection module which collects the production environment data of each station in an adjacent station group, the sensor performance data, and the working time data of each station; the light interference evaluation value compensation parameter analysis module is used for performing comprehensive analysis to obtain light interference evaluation value compensation parameters of the adjacent stations; and the station time sequence adjusting module is used for comprehensively analyzing to obtain the light interference evaluation value of each adjacent station, screening to obtain each interfered station, and adjusting the working time of each interfered station. According to the adjacent station anti-interference electrical control system based on the PLC, the evaluation accuracy can be remarkably improved, the stations with the light interference problem can be screened out, and therefore the working environment and resource configuration are optimized, and measures can be taken in a targeted mode to reduce the light interference degree.

Description

Technical Field

[0001] The invention relates to the technical field of industrial measurement, and in particular to a PLC-based adjacent workstation anti-interference electrical control system. Background Art

[0002] At present, electrical control systems are a very important part of the field of industrial measurement technology. With the advancement of automation technology and the development of artificial intelligence, providing efficient and accurate electrical control systems has become the norm. Efficient and comprehensive anti-interference electrical control systems are of great significance to improving production efficiency and promoting technological innovation.

[0003] For example, the invention patent with announcement number CN108762189B is a PC component mold platform control system based on PLC control, including a touch screen, an S7-300 PLC, a proximity switch, a safety light curtain, a control circuit and a drive motor. The touch screen is used to obtain production parameters and control the movement of the mold platform; the proximity switch detects the position of the mold platform and feeds back to the PLC to adjust the movement speed of the mold platform; the safety light curtain detects people or objects entering the production area and feeds back to the PLC to issue an alarm and suspend the operation of the mold platform; the PLC is used to collect signals from the proximity switch and the safety light curtain, obtain touch screen parameters, and drive the operation of the motor through the control circuit. The PLC also assigns a mold platform number to each mold platform, and the mold platform number is transmitted between various mold platform stations as the mold platform moves.

[0004] For example, the invention patent with the announcement number CN111736546B is a flexible control method, system and modular workstation control device for an assembly line. In the method, the hardware control part includes the whole line control process and the workstation control process; the whole line control process is to control and process data of the actions of the actuators of the entire assembly line independent of the workstation through the whole line control module; the workstation control process is to modularize the workstation into an independently operating workstation control module, so that the workstation control module transmits the operation formula issued by the whole line control module to the workstation PLC through the workstation host controller, and the workstation PLC controls the IO devices in the workstation and collects data in real time; the software control part includes the whole line control software and the workstation control software; the workstation control software includes the modularization of the workstation PLC program and the modularization of the host computer configuration.

[0005] However, in the process of implementing the technical solution of the invention in the embodiments of the present application, it was found that the above technology has at least the following technical problems: in an industrial automation production line, the indicator lights and optical equipment of adjacent workstations will interfere with each other, resulting in difficulty in coordinating the work of multiple workstations, and it is difficult to ensure system stability and production efficiency. Summary of the invention

[0006] In view of the deficiencies in the prior art, the present invention provides a PLC-based adjacent workstation anti-interference electrical control system, which can effectively solve the problems involved in the above-mentioned background technology.

[0007] To achieve the above objectives, the present invention is implemented through the following technical solutions: The first aspect of the present invention provides a PLC-based adjacent workstation anti-interference electrical control system, including: an optical interference data acquisition module, used to obtain an adjacent workstation group, collect production environment data, sensor performance data and working time data of each workstation in the adjacent workstation group, and screen the target workstation and each adjacent workstation according to the working time data of each workstation.

[0008] The light interference evaluation value compensation parameter analysis module is used to process the production environment data of each adjacent workstation to obtain the environmental interference value of each adjacent workstation, process the sensor performance data of each adjacent workstation to obtain the sensor performance evaluation index of each adjacent workstation, and comprehensively analyze to obtain the light interference evaluation value compensation parameters of each adjacent workstation.

[0009] The workstation timing adjustment module is used to turn on the target workstation light source, collect the light intensity of each adjacent workstation, and comprehensively analyze the light interference evaluation value of each adjacent workstation. According to the light interference evaluation value of each adjacent workstation and the light interference evaluation value compensation parameter, each interfered workstation is screened and the working time of each interfered workstation is adjusted.

[0010] As a further method, the production environment data of each adjacent workstation is processed to obtain the environmental interference value of each adjacent workstation. The specific processing process is: the production environment data includes environmental temperature, environmental humidity and electromagnetic radiation power density.

[0011] The allowable deviation ambient temperature, allowable deviation ambient humidity and critical electromagnetic radiation power density are extracted from the PLC database, and the environmental interference value of each adjacent workstation is obtained through comprehensive analysis.

[0012] As a further method, the sensor performance data of each adjacent station is processed to obtain the sensor performance evaluation index of each adjacent station. The specific processing process is: the sensor performance data includes sensitivity and resolution.

[0013] The workstation reference sensitivity and workstation reference resolution are extracted from the PLC database, and the sensor performance evaluation index of each adjacent workstation is obtained through comprehensive analysis.

[0014] As a further method, the comprehensive analysis obtains the light interference evaluation value compensation parameters of each adjacent workstation. The specific analysis process is: based on the environmental interference value of each adjacent workstation and the sensor performance evaluation index of each adjacent workstation, the light interference evaluation value compensation parameters of each adjacent workstation are obtained through comprehensive analysis.

[0015] As a further method, the comprehensive analysis obtains the light interference evaluation value of each adjacent workstation, and the specific analysis process is: extracting the critical light intensity from the PLC database.

[0016] The light intensity and light source interference time of each adjacent workstation are obtained, and the light interference evaluation value of each adjacent workstation is obtained through comprehensive analysis.

[0017] As a further method, the screening obtains each interfered workstation, and the specific screening process is: extracting the light interference assessment threshold from the PLC database, summing the light interference assessment value of each adjacent workstation with the light interference assessment value compensation parameter of each adjacent workstation to obtain the light interference assessment correction value of each adjacent workstation, and comparing the light interference assessment correction value of each adjacent workstation with the light interference assessment threshold; if the light interference assessment correction value of an adjacent workstation is greater than or equal to the light interference assessment threshold, the adjacent workstation is marked as an interfered workstation; if the light interference assessment correction value of an adjacent workstation is less than the light interference assessment threshold, the working time of the adjacent workstation is not interfered with.

[0018] As a further method, the working hours of each disturbed workstation are adjusted, and the specific adjustment process is: extracting the preset adjustment time from the PLC database, postponing the working time of each disturbed workstation according to the preset adjustment time, and analyzing the light interference assessment correction value of each disturbed workstation after the postponement, until the light interference assessment correction value of each disturbed workstation is less than the light interference assessment threshold.

[0019] As a further method, the sensor performance evaluation index of each adjacent station is a quantitative index obtained by analyzing the sensitivity and resolution of each adjacent station, and is used to quantify the sensor performance of each adjacent station.

[0020] As a further method, the environmental interference value of each adjacent workstation is a quantitative index obtained by analyzing the environmental temperature, environmental humidity and electromagnetic radiation power density of each adjacent workstation, and is used to quantify the degree of environmental interference of each adjacent workstation.

[0021] As a further method, the light interference evaluation value compensation parameter of each adjacent workstation is specifically expressed as: ; in, represents the compensation parameter of the light interference evaluation value of the i-th adjacent workstation, represents the environmental interference value of the i-th adjacent workstation, represents the sensor performance evaluation index of the i-th adjacent station, Indicates the compensation parameter influencing factor of the light interference evaluation value corresponding to the set environmental interference value, It represents the light interference evaluation value compensation parameter influencing factor corresponding to the set sensor performance evaluation index, i represents the number of each adjacent station, i=1,2,3,...,m, m represents the total number of adjacent stations.

[0022] Compared with the prior art, the embodiments of the present invention have at least the following advantages or beneficial effects: (1) The present invention provides a PLC-based adjacent workstation anti-interference electrical control system, which helps to improve the accuracy of light interference assessment of adjacent workstations, screen out adjacent areas with light interference problems, thereby optimizing the working environment and resource allocation, and can also more comprehensively reflect the actual situation of light interference, which helps to take targeted measures to reduce the degree of light interference.

[0023] (2) The present invention improves the measurement precision and accuracy by analyzing the environment and sensor performance of adjacent workstations, helps reduce measurement errors and failures caused by environmental changes or sensor performance degradation, enhances the stability and reliability of the system, and can also understand the mutual influence and correlation between different workstations, which helps to optimize the production process and improve production efficiency.

[0024] (3) By analyzing the environment of each adjacent workstation, the present invention can help optimize the layout of the workstations, timely understand the environmental interference situation, help take measures to adjust or repair, reduce downtime or waiting time caused by environmental problems, and thus improve product quality and consistency. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] The present invention is further described using the accompanying drawings, but the embodiments in the accompanying drawings do not constitute any limitation to the present invention. A person skilled in the art can obtain other drawings based on the following drawings without creative work.

[0026] Figure 1 It is a schematic diagram of system module connection of the present invention.

[0027] Figure 2 It is a schematic diagram of the functional relationship between the light interference evaluation value compensation parameter and the sensor performance evaluation index of the present invention. DETAILED DESCRIPTION

[0028] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of the present invention.

[0029] Reference Figure 1As shown, the first aspect of the present invention provides an adjacent workstation anti-interference electrical control system based on PLC, including: an optical interference data acquisition module, used to obtain an adjacent workstation group, collect production environment data, sensor performance data and working time data of each workstation in the adjacent workstation group, and screen the target workstation and each adjacent workstation according to the working time data of each workstation.

[0030] The light interference evaluation value compensation parameter analysis module is used to process the production environment data of each adjacent workstation to obtain the environmental interference value of each adjacent workstation, process the sensor performance data of each adjacent workstation to obtain the sensor performance evaluation index of each adjacent workstation, and comprehensively analyze to obtain the light interference evaluation value compensation parameters of each adjacent workstation.

[0031] The workstation timing adjustment module is used to turn on the target workstation light source, collect the light intensity of each adjacent workstation, and comprehensively analyze the light interference evaluation value of each adjacent workstation. According to the light interference evaluation value of each adjacent workstation and the light interference evaluation value compensation parameter, each interfered workstation is screened and the working time of each interfered workstation is adjusted.

[0032] It should be explained that, in this embodiment, the working time data of each workstation includes the start time, duration and end time of each workstation, and the workstation with the earliest start time is marked as the target workstation. If there are workstations with the same start time, the workstation with the earliest sequence number is marked as the target workstation and the start time of other workstations is postponed, and the other workstations are marked as adjacent workstations. Specifically, the production environment data of each adjacent workstation is processed to obtain the environmental interference value of each adjacent workstation. The specific processing process is: the production environment data includes environmental temperature, environmental humidity and electromagnetic radiation power density.

[0033] The allowable deviation ambient temperature, allowable deviation ambient humidity and critical electromagnetic radiation power density are extracted from the PLC database, and the environmental interference value of each adjacent workstation is obtained through comprehensive analysis.

[0034] It should be explained that, in this embodiment, the ambient temperature of each adjacent workstation can be monitored by a temperature sensor, and the ambient humidity of each adjacent workstation can be monitored by a humidity sensor. The electromagnetic radiation power density refers to a physical quantity that measures the radiation energy of an electromagnetic field at a certain point in space. It reflects the intensity of the electromagnetic field at that point. The electromagnetic radiation power density of each adjacent workstation can be directly monitored by an electromagnetic radiation measuring device. ; in, represents the environmental interference value of the i-th adjacent workstation, represents the ambient temperature of the i-th adjacent station, Indicates reference standard ambient temperature, Indicates the set allowable deviation ambient temperature, represents the ambient humidity of the ith adjacent workstation, Indicates reference standard ambient humidity, Indicates the set allowable deviation ambient humidity, represents the electromagnetic radiation power density of the i-th adjacent workstation, represents the critical electromagnetic radiation power density, Indicates the impact factor of the environmental interference value assessment corresponding to the set ambient temperature. Indicates the impact factor of the environmental interference value assessment corresponding to the set environmental humidity. It represents the environmental interference value assessment impact factor corresponding to the set electromagnetic radiation power density, i represents the number of each adjacent workstation, i=1,2,3,...,m, and m represents the total number of adjacent workstations.

[0035] The algorithm of this embodiment combines the ambient temperature, ambient humidity and electromagnetic radiation power density of each adjacent workstation, and comprehensively analyzes to obtain the environmental interference value of each adjacent workstation. When the water content in the air remains unchanged, when the temperature rises, the water content of the air increases and the relative humidity decreases. When the temperature decreases, the water content of the air weakens and the relative humidity increases. Temperature and humidity are interrelated in the environment. Temperature itself does not directly generate electromagnetic interference, but temperature changes may affect the operating state of the equipment, and then indirectly affect the intensity and spectrum distribution of electromagnetic radiation. For example, high temperature may cause the performance of internal components of electronic equipment to decline, thereby increasing the leakage of electromagnetic radiation or changing its characteristics. The impact of humidity on electromagnetic interference is more direct. In a high humidity environment, water molecules in the air will increase conductivity, which may cause attenuation or distortion of electromagnetic signals. Humidity may also affect the performance of insulating materials, reduce their insulation resistance, and thus increase the risk of electromagnetic leakage. Comprehensive analysis can obtain more comprehensive, accurate and in-depth environmental interference values.

[0036] Table 1 Example of environmental interference value data for each adjacent workstation

[0037] As shown in Table 1, the environmental interference value is jointly determined by the ambient temperature, ambient humidity and electromagnetic radiation power density. In a specific embodiment, the reference standard ambient temperature is 23°C, the allowable deviation ambient temperature is 3°C, the reference standard ambient humidity is 50%, the allowable deviation ambient humidity is 10%, the critical electromagnetic radiation power density is 2W / m², the environmental interference value assessment impact factor corresponding to the set ambient temperature is 0.3, the environmental interference value assessment impact factor corresponding to the set ambient humidity is 0.3, and the environmental interference value assessment impact factor corresponding to the set electromagnetic radiation power density is 0.4. This formula takes into account three key factors, namely ambient temperature, ambient humidity and electromagnetic radiation power density, which can reduce the aging and damage of internal components of the equipment, thereby reducing the probability of failure. At the same time, controlling the electromagnetic radiation power density can prevent the equipment from being interfered by the external electromagnetic field, ensuring the stable operation of the equipment, and stable environmental conditions help to reduce measurement errors caused by environmental changes and improve the detection and measurement accuracy of the equipment. By controlling environmental conditions and electromagnetic radiation power density, downtime caused by equipment failure can be reduced. By standardizing the ambient temperature, ambient humidity, and electromagnetic radiation power density of different workstations, we ensure that they are compared at the same level, thereby improving the fairness and comparability of the evaluation. , and The setting helps to monitor whether there is a significant deviation in the environmental data. By weighting the impact of ambient temperature, ambient humidity and electromagnetic radiation power density, it reflects their relative importance in the evaluation index. The weights of different factors can be adjusted according to different needs, making the model highly adaptable. It is not difficult to see that the greater the deviation of ambient temperature or the greater the deviation of ambient humidity or the greater the electromagnetic radiation power density, the greater the environmental interference value of each adjacent workstation. By evaluating the environmental interference value of each adjacent workstation, it can help optimize the layout of the workstation, improve overall work efficiency, and timely understand the environmental interference situation. Measures can be taken quickly to adjust or repair, reducing downtime or waiting time caused by environmental problems.

[0038] It should be understood that in this embodiment It is the environmental interference value assessment impact factor corresponding to the ambient temperature preset in the PLC database, which represents the numerical value of the influence degree of the ambient temperature on the environmental interference value of each adjacent workstation. When used, the environmental interference value assessment impact factor corresponding to the ambient temperature can be directly obtained from the PLC database, and the corresponding relationship can be a preset mapping relationship. For example, the ambient temperature and the environmental interference value assessment impact factor corresponding to the ambient temperature preset in the PLC database form a mapping set, and the real-time ambient temperature is input into the mapping set to obtain the environmental interference value assessment impact factor corresponding to the ambient temperature. The mapping relationship can be one-to-one or many-to-one. In this example, its value range is between 0 and 1; It is the environmental interference value assessment impact factor corresponding to the environmental humidity preset in the PLC database, which represents the numerical value of the influence degree of the environmental humidity on the environmental interference value of each adjacent workstation. When used, the environmental interference value assessment impact factor corresponding to the environmental humidity can be directly obtained from the PLC database, and the corresponding relationship can be a preset mapping relationship. For example, the environmental humidity and the environmental interference value assessment impact factor corresponding to the environmental humidity preset in the PLC database form a mapping set, and the real-time environmental humidity is input into the mapping set to obtain the environmental interference value assessment impact factor corresponding to the environmental humidity. The mapping relationship can be one-to-one or many-to-one. In this example, its value range is between 0 and 1; It is the environmental interference value assessment impact factor corresponding to the electromagnetic radiation power density preset in the PLC database, which represents the numerical value of the influence degree of the electromagnetic radiation power density on the environmental interference value of each adjacent workstation. When used, the environmental interference value assessment impact factor corresponding to the electromagnetic radiation power density can be directly obtained from the PLC database, and the corresponding relationship can be a pre-set mapping relationship. For example, the electromagnetic radiation power density and the environmental interference value assessment impact factor corresponding to the electromagnetic radiation power density preset in the PLC database form a mapping set, and the real-time electromagnetic radiation power density is input into the mapping set to obtain the environmental interference value assessment impact factor corresponding to the electromagnetic radiation power density. The mapping relationship can be one-to-one or many-to-one. In this example, its value range is between 0 and 1.

[0039] It should be explained that the environmental interference value of each adjacent workstation in this embodiment is a quantitative index obtained by analyzing the ambient temperature, ambient humidity and electromagnetic radiation power density of each adjacent workstation, and is used to quantify the degree of environmental interference of each adjacent workstation.

[0040] Specifically, the sensor performance data of each adjacent station is processed to obtain the sensor performance evaluation index of each adjacent station. The specific processing process is: the sensor performance data includes sensitivity and resolution.

[0041] The workstation reference sensitivity and workstation reference resolution are extracted from the PLC database, and the sensor performance evaluation index of each adjacent workstation is obtained through comprehensive analysis.

[0042] It should be explained that, in this embodiment, sensitivity is a characteristic parameter that describes the sensitivity between the light intensity of the sensor and the electrical signal. It reflects the sensitivity of the sensor to the measured change and is the ratio of the increment of the electrical signal to the corresponding light intensity increment that causes the increment. A highly sensitive sensor can quickly sense the change in light intensity and quickly generate a corresponding output signal, so that the system can respond to external changes more quickly and improve the overall response speed and efficiency. Resolution refers to the minimum change in light intensity that the sensor can detect, and can also be understood as the fineness of the sensor in the quantization process. It reflects the ability of the sensor to distinguish between two adjacent light intensities. A high-resolution sensor can distinguish more subtle differences in light intensity, thereby capturing more detailed information. The sensitivity and resolution of the sensor can be obtained through the sensor test tool; ; in, represents the sensor performance evaluation index of the i-th adjacent station, e represents a natural constant, represents the sensitivity of the ith adjacent station, Indicates the reference sensitivity of the workstation. represents the resolution of the ith adjacent station, Indicates the reference resolution of the workstation. Indicates the sensor performance evaluation influencing factor corresponding to the set sensitivity, It represents the sensor performance evaluation influencing factor corresponding to the set resolution, i represents the number of each adjacent station, i=1,2,3,...,m, and m represents the total number of adjacent stations.

[0043] The algorithm of this embodiment combines the sensitivity and resolution of each adjacent station, and comprehensively analyzes to obtain the sensor performance evaluation index. Sensors with high sensitivity often have higher resolutions, because high sensitivity means that the sensor can respond more sensitively to changes in light intensity, making it easier to distinguish adjacent light intensities, that is, it has a higher resolution; however, high resolution does not directly guarantee high sensitivity, because resolution focuses more on the minimum light intensity that the sensor can detect, while sensitivity focuses on the changing relationship between light intensity and electrical signals. Comprehensive analysis can obtain a more comprehensive, accurate, and in-depth sensor performance evaluation index.

[0044] It should be explained that two key factors, namely sensitivity and resolution, are considered in this embodiment, which can more accurately capture and respond to slight changes in light intensity, thereby providing higher-precision measurement data, and can reduce the unstable factors caused by measurement errors, while reducing the impact of external interference on the measurement results, improving the stability and reliability of the system, and sensors with high sensitivity and high resolution can provide more accurate control signals, so that the system can more accurately control the utilization of various resources, which helps to reduce resource consumption and waste and improve resource utilization efficiency. By standardizing the sensitivity and resolution of different adjacent stations, ensuring that they are compared at the same level, the fairness and comparability of the evaluation are improved. By weighting the impact of sensitivity and resolution, it reflects their relative importance in the evaluation index, and the weights of different factors can be adjusted according to different needs, so that the model has good adaptability. It is not difficult to see that the greater the sensitivity or resolution, the greater the sensor performance evaluation index. By evaluating the sensor performance evaluation index, we can accurately understand the actual performance of the parameters, thereby optimizing the design and manufacturing process of the sensor and improving the performance reliability of the sensor. We can also understand the stability and anti-interference ability of the sensor in complex environments, which is of great significance to improving the overall stability and reliability of the system. It also helps to understand the error of the sensor during the measurement process and take corresponding measures to reduce the error, ensuring that the data collected by the sensor is of high quality and credibility.

[0045] It should be understood that in this embodiment It is the sensor performance evaluation influencing factor corresponding to the sensitivity preset in the PLC database, which represents the numerical value of the influence degree of sensitivity on the sensor performance evaluation index. When used, the sensor performance evaluation influencing factor corresponding to the sensitivity can be directly obtained from the PLC database, and the corresponding relationship can be a preset mapping relationship. For example, the sensitivity and the sensor performance evaluation influencing factor corresponding to the sensitivity preset in the PLC database form a mapping set, and the real-time sensitivity is input into the mapping set to obtain the sensor performance evaluation influencing factor corresponding to the sensitivity. The mapping relationship can be one-to-one or many-to-one. In this example, its value range is between 0 and 1; It is the sensor performance evaluation influencing factor corresponding to the preset resolution in the PLC database, which represents the numerical value of the influence degree of the resolution on the sensor performance evaluation index. When used, the sensor performance evaluation influencing factor corresponding to the resolution can be directly obtained from the PLC database, and the corresponding relationship can be a preset mapping relationship. For example, the resolution and the sensor performance evaluation influencing factor corresponding to the preset resolution in the PLC database form a mapping set, and the real-time resolution is input into the mapping set to obtain the sensor performance evaluation influencing factor corresponding to the resolution. The mapping relationship can be one-to-one or many-to-one. In this example, its value range is between 0 and 1.

[0046] It should be explained that the sensor performance evaluation index of each adjacent station in this embodiment is a quantitative index obtained by analyzing the sensitivity and resolution of each adjacent station, and is used to quantify the sensor performance of each adjacent station.

[0047] Furthermore, a light interference evaluation value compensation parameter of each adjacent workstation is obtained through comprehensive analysis. The specific analysis process is as follows: based on the environmental interference value of each adjacent workstation and the sensor performance evaluation index of each adjacent workstation, a light interference evaluation value compensation parameter of each adjacent workstation is obtained through comprehensive analysis.

[0048] Specifically, the light interference evaluation value compensation parameter of each adjacent workstation is expressed as follows: ; in, represents the compensation parameter of the light interference evaluation value of the i-th adjacent workstation, represents the environmental interference value of the i-th adjacent workstation, represents the sensor performance evaluation index of the i-th adjacent station, Indicates the compensation parameter influencing factor of the light interference evaluation value corresponding to the set environmental interference value, It represents the light interference evaluation value compensation parameter influencing factor corresponding to the set sensor performance evaluation index, i represents the number of each adjacent station, i=1,2,3,...,m, m represents the total number of adjacent stations.

[0049] like Figure 2 As shown, in a specific embodiment, i=1, =0.3, =0.4. =0.9, the functional relationship between the light interference evaluation value compensation parameter and the sensor performance evaluation index is shown in curve a; when =1, the functional relationship between the optical interference evaluation value compensation parameter and the sensor performance evaluation index is shown in curve b; when =1.1, the functional relationship between the light interference evaluation value compensation parameter and the sensor performance evaluation index is shown in curve c.

[0050] The algorithm of this embodiment combines the environmental interference value of each adjacent workstation and the sensor performance evaluation index, and comprehensively analyzes to obtain the light interference evaluation value compensation parameter, wherein the temperature change may cause the physical properties of the internal components of the sensor to change, such as changes in parameters such as resistance and capacitance, thereby affecting the sensitivity and resolution of the sensor. At the same time, in a high humidity environment, water molecules in the air may adhere to the sensor surface or penetrate into the interior, causing the electrical properties of the sensor elements to change, such as reduced insulation resistance, changes in dielectric constant, etc., thereby affecting the sensitivity and resolution of the sensor, and electromagnetic interference may cause noise to be mixed into the sensor signal, reducing the signal-to-noise ratio, thereby affecting the sensitivity and resolution of the sensor. In the case of large environmental interference, the resolution of the sensor needs to be high enough to accurately distinguish between effective signals and interference signals, and the sensitivity must also be high enough to quickly respond to changes in effective signals. Comprehensive analysis can obtain more comprehensive, accurate and in-depth light interference evaluation value compensation parameters.

[0051] It should be explained that two key factors, namely the environmental interference value and the sensor performance evaluation index, are considered in this embodiment. By understanding the environmental interference value, the sensor measurement results can be accurately compensated to eliminate or reduce the impact of environmental factors on the measurement results. At the same time, combined with the sensor performance evaluation index, it can ensure that the sensor works in the best state, thereby improving the accuracy and reliability of the measurement, and can be dynamically adjusted according to the real-time situation to ensure that the sensor can maintain a high measurement accuracy under different environmental conditions. It can also predict and prevent potential problems in advance, reduce failures caused by environmental factors or sensor performance degradation, and help optimize the configuration of the system, such as selecting a suitable sensor model, adjusting the sensor layout, etc., to improve the overall performance and stability of the system. By standardizing the environmental interference values ​​and sensor performance evaluation indexes of different adjacent stations, it is ensured that they are compared at the same magnitude, which improves the fairness and comparability of the evaluation. By weighting the impact of the environmental interference value and the sensor performance evaluation index, it reflects their relative importance in the evaluation index, and the weights of different factors can be adjusted according to different needs, so that the model has good adaptability. It is not difficult to see that when the environmental interference value is larger or the sensor performance evaluation index is smaller, the light interference evaluation value compensation parameter is larger. By evaluating the compensation parameters of the light interference evaluation value, the impact of light interference on the measurement results is effectively reduced, the measurement precision and accuracy are improved, which helps to reduce measurement errors and failures caused by environmental changes or sensor performance degradation, enhances the stability and reliability of the system, and understands the mutual influence and correlation between different workstations, which helps to optimize the production process, improve production efficiency, and ensure the stability and consistency of product quality.

[0052] It should be understood that in this embodiment It is the light interference assessment value compensation parameter influence factor corresponding to the environmental interference value preset in the PLC database, which represents the numerical value of the influence degree of the environmental interference value on the light interference assessment value compensation parameter. When used, the light interference assessment value compensation parameter influence factor corresponding to the environmental interference value can be directly obtained from the PLC database, and the corresponding relationship can be a preset mapping relationship. For example, the environmental interference value and the light interference assessment value compensation parameter influence factor corresponding to the environmental interference value preset in the PLC database form a mapping set, and the real-time environmental interference value is input into the mapping set to obtain the light interference assessment value compensation parameter influence factor corresponding to the environmental interference value. The mapping relationship can be one-to-one or many-to-one. In this example, its value range is between 0 and 1; It is the light interference evaluation value compensation parameter influence factor corresponding to the sensor performance evaluation index preset in the PLC database, which represents the numerical value of the influence degree of the sensor performance evaluation index on the light interference evaluation value compensation parameter. When used, the light interference evaluation value compensation parameter influence factor corresponding to the sensor performance evaluation index can be directly obtained from the PLC database, and the corresponding relationship can be a preset mapping relationship. For example, the sensor performance evaluation index and the light interference evaluation value compensation parameter influence factor corresponding to the sensor performance evaluation index preset in the PLC database form a mapping set, and the real-time sensor performance evaluation index is input into the mapping set to obtain the light interference evaluation value compensation parameter influence factor corresponding to the sensor performance evaluation index. The mapping relationship can be one-to-one or many-to-one. In this example, its value range is between 0 and 1.

[0053] It should be explained that the light interference evaluation value compensation parameter of each adjacent workstation in this embodiment is a quantitative index obtained by analyzing the environmental interference value and sensor performance evaluation index of each adjacent workstation, and is used to quantify the light interference evaluation value compensation parameter of each adjacent workstation.

[0054] Specifically, the light interference evaluation value of each adjacent workstation is obtained by comprehensive analysis, and the specific analysis process is: extracting the critical light intensity from the PLC database.

[0055] The light intensity and light source interference time of each adjacent workstation are obtained, and the light interference evaluation value of each adjacent workstation is obtained through comprehensive analysis.

[0056] It should be explained that in this embodiment, the light source interference time is the duration of the light source of the target workstation, and the light intensity is the light intensity of each adjacent workstation when the light source of the target workstation is turned on, which can be monitored by a sensor; ; in, represents the light interference evaluation value of the i-th adjacent workstation, represents the light intensity of the ith adjacent station, represents the critical light intensity, Indicates the light source interference time, Indicates the time point when the light source interference starts. Indicates the time point when the light source interference ends. , It represents the light interference assessment impact factor corresponding to the set light intensity, i represents the number of each adjacent workstation, i=1,2,3,...,m, and m represents the total number of adjacent workstations.

[0057] The algorithm of this embodiment combines the light intensity of each adjacent workstation and the light source interference time, and comprehensively analyzes to obtain a light interference evaluation value. The light source continues to emit light during the interference time period, and its light intensity will cumulatively affect the workstation over time. Even if the light intensity may not be high at a certain moment, if the interference time is very long, the cumulative light interference may become significant. Therefore, the length of the light source interference time directly affects the cumulative effect of the light interference. The peak light intensity (i.e., the intensity of the light source when it is brightest) and the duration of the peak jointly determine the severity of the light interference. A light source with a high peak value and a long duration will produce more severe light interference. Comprehensive analysis can obtain a more comprehensive, accurate, and in-depth light interference evaluation value.

[0058] It should be explained that in this embodiment, two key factors, namely light intensity and light source interference time, are considered to determine the overall impact of light interference, which can significantly improve the accuracy of the evaluation, avoid the one-sidedness that may be caused by considering only a single factor, and can more comprehensively reflect the actual situation of light interference, which is helpful to take targeted measures to reduce the degree of light interference, and can also timely discover light interference problems and take corresponding improvement measures, thereby improving the quality of the overall working environment. By standardizing the light intensity of different adjacent workstations, it reflects the level of the light intensity of the workstation relative to the critical value, which is the basis for evaluating the degree of light interference. By weighting the impact of light intensity, it reflects its importance in the evaluation index, and the weight of the factor can be adjusted according to different needs, so that the model has good adaptability. It is not difficult to see that the greater the light intensity or the greater the light source interference time, the greater the light interference evaluation value. By evaluating the light interference evaluation value, it reflects the cumulative effect of light interference in the entire interference time period, and can further identify the peak value of light intensity and the duration of the peak value. It can also clarify which workstations have light interference problems and the severity of the problem, thereby optimizing the working environment and resource allocation, and improving overall work efficiency and benefits.

[0059] It should be understood that in this embodiment It is the light interference assessment influence factor corresponding to the light intensity preset in the PLC database, which represents the numerical value of the influence degree of light intensity on the light interference assessment value. When used, the light interference assessment influence factor corresponding to the light intensity can be directly obtained from the PLC database, and the corresponding relationship can be a preset mapping relationship. For example, the light intensity and the light interference assessment influence factor corresponding to the light intensity preset in the PLC database form a mapping set, and the real-time light intensity is input into the mapping set to obtain the light interference assessment influence factor corresponding to the light intensity. The mapping relationship can be one-to-one or many-to-one. In this example, its value range is between 0 and 1.

[0060] It should be explained that the light interference evaluation value of each adjacent workstation in this embodiment is a quantitative index obtained by analyzing the light intensity and the light source interference time, and is used to quantify the degree of light interference of each adjacent workstation.

[0061] In a specific embodiment, each interfered workstation is screened, and the specific screening process is: extracting the light interference evaluation threshold from the PLC database, summing the light interference evaluation value of each adjacent workstation with the light interference evaluation value compensation parameter of each adjacent workstation to obtain the light interference evaluation correction value of each adjacent workstation, and comparing the light interference evaluation correction value of each adjacent workstation with the light interference evaluation threshold; if the light interference evaluation correction value of an adjacent workstation is greater than or equal to the light interference evaluation threshold, the adjacent workstation is marked as an interfered workstation; if the light interference evaluation correction value of an adjacent workstation is less than the light interference evaluation threshold, the working time of the adjacent workstation is not interfered with.

[0062] It needs to be explained that in the present embodiment, the working time of each disturbed workstation is adjusted, and the specific adjustment process is: according to the light interference assessment correction value of each disturbed workstation, the preset adjustment time of each disturbed workstation is matched from the PLC database, the working time of each disturbed workstation is postponed according to the preset adjustment time, and the light interference assessment correction value of each disturbed workstation after the postponement is analyzed, until the light interference assessment correction value of each disturbed workstation is less than the light interference assessment threshold.

[0063] The PLC database is used to store PLC-related data, including allowable deviation ambient temperature, allowable deviation ambient humidity, critical electromagnetic radiation power density, sensor performance evaluation influencing factor corresponding to the set sensitivity, sensor performance evaluation influencing factor corresponding to the set resolution, light interference evaluation value compensation parameter influencing factor corresponding to the set environmental interference value, light interference evaluation value compensation parameter influencing factor corresponding to the set sensor performance evaluation index, critical light intensity and light interference evaluation threshold and other indicators. The data in the PLC database are obtained by collecting multiple PLC experimental data.

[0064] The above contents are merely examples and explanations of the structure of the present invention. The technicians in this technical field may make various modifications or additions to the specific embodiments described or replace them in a similar manner. As long as they do not deviate from the structure of the invention or exceed the scope defined by the present invention, they should all fall within the protection scope of the present invention.

Claims

1. A PLC-based adjacent workstation anti-interference electrical control system, characterized in that: include: The light interference data acquisition module is used to obtain the adjacent workstation group, collect the production environment data, sensor performance data and working time data of each workstation in the adjacent workstation group, and screen the target workstation and adjacent workstations according to the working time data of each workstation; The light interference evaluation value compensation parameter analysis module is used to process the production environment data of each adjacent workstation to obtain the environmental interference value of each adjacent workstation, process the sensor performance data of each adjacent workstation to obtain the sensor performance evaluation index of each adjacent workstation, and comprehensively analyze to obtain the light interference evaluation value compensation parameter of each adjacent workstation; The workstation timing adjustment module is used to turn on the target workstation light source, collect the light intensity of each adjacent workstation, and comprehensively analyze the light interference evaluation value of each adjacent workstation. According to the light interference evaluation value of each adjacent workstation and the light interference evaluation value compensation parameter, each interfered workstation is screened and the working time of each interfered workstation is adjusted.

2. According to the PLC-based adjacent workstation anti-interference electrical control system of claim 1, it is characterized by: The production environment data of each adjacent workstation is processed to obtain the environmental interference value of each adjacent workstation. The specific processing process is: The production environment data includes ambient temperature, ambient humidity and electromagnetic radiation power density; The allowable deviation ambient temperature, allowable deviation ambient humidity and critical electromagnetic radiation power density are extracted from the PLC database, and the environmental interference value of each adjacent workstation is obtained through comprehensive analysis.

3. According to the PLC-based adjacent workstation anti-interference electrical control system of claim 1, it is characterized by: The sensor performance data of each adjacent station is processed to obtain the sensor performance evaluation index of each adjacent station. The specific processing process is: The sensor performance data includes sensitivity and resolution; The workstation reference sensitivity and workstation reference resolution are extracted from the PLC database, and the sensor performance evaluation index of each adjacent workstation is obtained through comprehensive analysis.

4. According to claim 3, the PLC-based adjacent workstation anti-interference electrical control system is characterized in that: The comprehensive analysis obtains the compensation parameters of the light interference evaluation values ​​of each adjacent workstation, and the specific analysis process is as follows: According to the environmental interference value of each adjacent workstation and the sensor performance evaluation index of each adjacent workstation, a comprehensive analysis is performed to obtain the compensation parameters of the light interference evaluation value of each adjacent workstation.

5. The PLC-based adjacent workstation anti-interference electrical control system according to claim 1 is characterized in that: The comprehensive analysis obtains the light interference evaluation value of each adjacent workstation, and the specific analysis process is as follows: Extract critical light intensity from PLC database; The light intensity and light source interference time of each adjacent workstation are obtained, and the light interference evaluation value of each adjacent workstation is obtained through comprehensive analysis.

6. The PLC-based adjacent workstation anti-interference electrical control system according to claim 5 is characterized in that: The screening obtains the disturbed workstations, and the specific screening process is as follows: The light interference assessment threshold is extracted from the PLC database, the light interference assessment value of each adjacent workstation is summed with the light interference assessment value compensation parameter of each adjacent workstation to obtain the light interference assessment correction value of each adjacent workstation, and the light interference assessment correction value of each adjacent workstation is compared with the light interference assessment threshold. If the light interference assessment correction value of an adjacent workstation is greater than or equal to the light interference assessment threshold, the adjacent workstation is marked as an interfered workstation; if the light interference assessment correction value of an adjacent workstation is less than the light interference assessment threshold, the working time of the adjacent workstation is not interfered with.

7. The PLC-based adjacent workstation anti-interference electrical control system according to claim 1 is characterized in that: The working time of each disturbed workstation is adjusted, and the specific adjustment process is as follows: The preset adjustment time is extracted from the PLC database, the working time of each disturbed workstation is postponed according to the preset adjustment time, and the light interference assessment correction value of each disturbed workstation after the postponement is analyzed until the light interference assessment correction value of each disturbed workstation is less than the light interference assessment threshold.

8. The PLC-based adjacent workstation anti-interference electrical control system according to claim 3 is characterized in that: The sensor performance evaluation index of each adjacent station is a quantitative index obtained by analyzing the sensitivity and resolution of each adjacent station, and is used to quantify the sensor performance of each adjacent station.

9. The PLC-based adjacent workstation anti-interference electrical control system according to claim 2 is characterized in that: The environmental interference value of each adjacent workstation is a quantitative index obtained by analyzing the environmental temperature, environmental humidity and electromagnetic radiation power density of each adjacent workstation, and is used to quantify the degree of environmental interference of each adjacent workstation.

10. The PLC-based adjacent workstation anti-interference electrical control system according to claim 4, characterized in that: The light interference evaluation value compensation parameter of each adjacent workstation is specifically expressed as follows: ； in, represents the compensation parameter of the light interference evaluation value of the i-th adjacent workstation, represents the environmental interference value of the i-th adjacent workstation, represents the sensor performance evaluation index of the i-th adjacent station, Indicates the compensation parameter influencing factor of the light interference evaluation value corresponding to the set environmental interference value, It represents the light interference evaluation value compensation parameter influencing factor corresponding to the set sensor performance evaluation index, i represents the number of each adjacent station, i=1,2,3,...,m, m represents the total number of adjacent stations.

Images