Verification method and device for quantum state control signal distortion

Abstract

The invention discloses a verification method and device for quantum state control signal distortion, and the method comprises the steps: obtaining connected domains in a first gray-scale image or a first black-and-white image after image processing, and carrying out the fitting processing of the connected domains, and obtaining a fitting function of each connected domain; and directly judging whether the quantum state control signal of the to-be-measured sub-bit is distorted or not according to the result of the fitting function. Moreover, the working frequency of the quantum bit is continuously traversed, and the distortion condition of the quantum state control signal of the to-be-measured sub-bit under the corresponding working frequency is obtained, so that the proper working point range of the to-be-measured sub-bit is determined.

Description

Technical Field

[0001] The present invention relates to the field of quantum computing technology, and in particular to a method and device for verifying quantum state control signal distortion. Background Art

[0002] Quantum computers are physical devices that follow the laws of quantum mechanics to perform high-speed mathematical and logical operations, store and process quantum information. The main characteristics of quantum computers are fast operation speed, strong information processing capabilities, and a wide range of applications. Compared with ordinary computers, the more information is processed, the more advantageous it is for quantum computers to perform operations, and the more accurate the operations can be.

[0003] Quantum chips are to quantum computers what CPUs are to traditional computers. Quantum chips are the core components of quantum computers. With the continuous advancement of research on quantum computing-related technologies, the number of quantum bits on quantum chips is also increasing year by year. It is foreseeable that larger-scale quantum chips will appear in the future, and the number of quantum bits in quantum chips will be greater, and quantum computers will also be equipped with larger-scale quantum chips.

[0004] The signal on the quantum state control line is used to control the quantum state of the qubit. Generally speaking, most of the signals of single-qubit gates are transmitted to the qubit through the quantum state control line. The quantum state control line is usually equipped with components such as attenuators. The existence of these components makes the quantum state control line not an ideal line. Therefore, when the voltage waveform output from the AWG (Arbitrary Waveform Generator) reaches the qubit, waveform distortion occurs. Waveform distortion refers to the distortion of the voltage waveform at t 0 At time t, a waveform with an amplitude of A and a duration of T is applied to the quantum state control line. 0 The waveform ends at +T, but there is still voltage on the quantum state control line for a period of time afterwards. This voltage is the distorted waveform. When the quantum circuit is in execution, if a waveform needs to be applied to the quantum state control line first and then, the waveform distortion of the previous waveform will affect the next waveform, causing errors in the final execution result of the quantum circuit.

[0005] Therefore, it is necessary to propose a solution that can verify whether the quantum state control signal of the quantum bit is distorted.

[0006] It should be noted that the information disclosed in the background technology section of this application is only intended to deepen the understanding of the general background technology of this application, and should not be regarded as an admission or suggestion in any form that the information constitutes prior art already known to those skilled in the art. Summary of the invention

[0007] The purpose of the present invention is to provide a method and device for verifying the distortion of a quantum state control signal, so as to solve the problem in the prior art that there is a lack of a method for verifying whether a quantum state control signal of a quantum bit is distorted.

[0008] In order to solve the above technical problems, the present invention proposes a verification method for quantum state control signal distortion, comprising:

[0009] Obtaining an experimental result view of a first experiment, wherein the first experiment is used to obtain a change in the probability of a subbit to be measured being in a first selected eigenstate as a function of a detuning magnitude and time, wherein the detuning is a frequency difference between a quantum state control signal applied to the subbit to be measured and an X-gate signal;

[0010] Performing image processing on the experimental result view to output a first grayscale image or a first black-and-white image, wherein the first grayscale image is composed of a plurality of pixels with different grayscale values, and the pixels of the first black-and-white image are composed of black and white;

[0011] When the result of the similarity comparison of the first grayscale image or the first black-and-white image reaches a preset value, performing fitting processing on all connected domains in the first grayscale image or the first black-and-white image to obtain a fitting function for each connected domain;

[0012] Based on the fitting function, it is determined whether the quantum state control signal of the sub-bit to be measured is distorted.

[0013] Optionally, the performing fitting processing on all connected domains in the first grayscale image or the first black-and-white image includes:

[0014] Process each connected domain to obtain the average y value corresponding to each x coordinate of each connected domain in the plane rectangular coordinate system;

[0015] The processed connected domain is fitted to obtain a fitting curve.

[0016] Optionally, performing fitting processing on the processed connected domain includes:

[0017] A quadratic function is used to perform fitting processing on all processed connected domains in the first grayscale image or the first black-and-white image.

[0018] Optionally, judging whether the quantum state control signal of the subbit to be measured is distorted based on the fitting function includes:

[0019] When the coefficient of the quadratic term of the fitting function of the connected domain after processing of any one of the first grayscale image or the first black-and-white image is greater than 0, it is determined that the quantum state control signal of the sub-bit to be measured is distorted.

[0020] Optionally, performing fitting processing on the processed connected domain includes:

[0021] A cubic function is used to perform fitting processing on all processed connected domains in the first grayscale image or the first black-and-white image.

[0022] Optionally, judging whether the quantum state control signal of the subbit to be measured is distorted based on the fitting function includes:

[0023] According to the fitting function, obtaining a first difference between the maximum value and the minimum value of the y coordinate of each fitting curve in the plane rectangular coordinate system;

[0024] When the first difference exceeds a first preset threshold, it is determined that the quantum state control signal of the subbit to be measured is distorted.

[0025] Optionally, judging whether the quantum state control signal of the subbit to be measured is distorted based on the fitting function includes:

[0026] According to the fitting function, obtaining a first coordinate corresponding to the minimum value of the y coordinate of the fitting curve in a plane rectangular coordinate system;

[0027] Based on the first coordinates, the fitting curve is divided into a first curve and a second curve, wherein the first curve is a portion that does not include a maximum value point;

[0028] According to a second difference between a maximum value point and a minimum value point of a y coordinate of the first curve in a plane rectangular coordinate system, it is determined whether the quantum state control signal of the subbit to be measured is distorted.

[0029] Optionally, after performing image processing on the experimental result view to output a first grayscale image or a first black-and-white image, the method further includes:

[0030] Determining whether the number of connected domains of the first grayscale image or the first black-and-white image exceeds a second preset threshold;

[0031] If not, it is determined that the quantum state control signal of the subbit to be measured is distorted;

[0032] If so, when the result of the similarity comparison on the first grayscale image or the first black-and-white image reaches a preset value, fitting processing is performed on all connected domains in the first grayscale image or the first black-and-white image to obtain a fitting function for each connected domain.

[0033] Based on the same inventive concept, the present invention also proposes a verification device for quantum state control signal distortion, comprising:

[0034] an experiment result view acquisition unit, configured to acquire an experiment result view of a first experiment, wherein the first experiment is configured to acquire a probability that a subbit to be measured is in a first selected eigenstate as a function of a detuning magnitude and time, wherein the detuning is a frequency difference between a quantum state control signal applied to the subbit to be measured and an X-gate signal;

[0035] An image processing unit, configured to perform image processing on the experimental result view and output a first grayscale image or a first black-and-white image, wherein the first grayscale image is composed of a plurality of pixels with different grayscale values, and the pixels of the first black-and-white image are composed of black and white;

[0036] a fitting processing unit, configured to perform fitting processing on all connected domains in the first grayscale image or the first black-and-white image to obtain a fitting function for each connected domain when a result of similarity comparison on the first grayscale image or the first black-and-white image reaches a preset value;

[0037] A determination unit is used to determine whether the quantum state control signal of the sub-bit to be measured is distorted based on the fitting function.

[0038] Based on the same inventive concept, the present invention also proposes a quantum computing measurement and control system, which uses a verification method for the quantum state control signal distortion described in any one of the above-mentioned characteristic descriptions.

[0039] Based on the same inventive concept, the present invention also proposes a quantum computer, including the quantum computing measurement and control system described in the above feature description.

[0040] Based on the same inventive concept, the present invention also proposes a readable storage medium on which a computer program is stored. When the computer program is executed by a processor, it can implement the verification method of quantum state control signal distortion described in any one of the above-mentioned feature descriptions.

[0041] Compared with the prior art, the present invention has the following beneficial effects:

[0042] The present invention proposes a verification method for quantum state control signal distortion, obtaining an experimental result view of a first experiment, performing image processing on the experimental result view, outputting a first grayscale image or a first black-and-white image, and when the result of similarity comparison of the first grayscale image or the first black-and-white image reaches a preset value, performing fitting processing on all connected domains in the first grayscale image or the first black-and-white image to obtain a fitting function for each connected domain. Finally, based on the fitting function, it is determined whether the quantum state control signal of the sub-bit to be measured is distorted. The solution of the present invention obtains the connected domain in the first grayscale image or the first black-and-white image after image processing, and performs fitting processing on the connected domain to obtain the fitting function of each connected domain. According to the result of the fitting function, it can be directly determined whether the quantum state control signal of the sub-bit to be measured is distorted. In addition, the working frequency of the quantum bit can be continuously traversed, and the distortion of the quantum state control signal of the sub-bit to be measured under the corresponding working frequency can be obtained, so as to determine the appropriate working point range of the sub-bit to be measured.

[0043] The verification device for quantum state control signal distortion, quantum computing measurement and control system, quantum computer and readable storage medium proposed in the present invention belong to the same inventive concept as the verification method for quantum state control signal distortion, and therefore have the same beneficial effects, which will not be elaborated here. BRIEF DESCRIPTION OF THE DRAWINGS

[0044] Figure 1 A schematic flow chart of a method for verifying quantum state control signal distortion proposed in an embodiment of the present invention;

[0045] Figure 2 is an experimental result view of the first experiment in an example;

[0046] Figure 3 A view showing the experimental result of interference phenomenon in the first experiment in another example;

[0047] Figure 4 For Figure 3 The output view after grayscale processing;

[0048] Figure 5 For Figure 4 The view after the connected domain search;

[0049] Figure 6 For the general Figure 5 The y values ​​corresponding to the x positions of the three connected domains are averaged and output as the result;

[0050] Figure 7 To use quadratic function fitting Figure 6 The discrete cluster corresponding to the connected domain 1 in the middle obtains the result view;

[0051] Figure 8 A view of experimental results of the first experiment in another example;

[0052] Fig. 9 This is a simplified schematic diagram of the structure of a verification device for quantum state control signal distortion proposed in another embodiment of the present invention. DETAILED DESCRIPTION

[0053] The specific implementation of the present invention will be described in more detail below in conjunction with the schematic diagram. The advantages and features of the present invention will become clearer from the following description and claims. It should be noted that the drawings are all in a very simplified form and are not in exact proportions, and are only used to facilitate and clearly assist in explaining the purpose of the embodiments of the present invention.

[0054] In the description of the present invention, it is necessary to understand that the terms "center", "up", "down", "left", "right", etc. indicate directions or positional relationships based on the directions or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific direction, be constructed and operated in a specific direction, and therefore cannot be understood as a limitation on the present invention.

[0055] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include one or more of the features. In the description of the present invention, the meaning of "plurality" is at least two, such as two, three, etc., unless otherwise clearly and specifically defined.

[0056] Please refer to Figure 1 , an embodiment of the present invention provides a verification method for quantum state control signal distortion, comprising:

[0057] S100: Acquire an experimental result view of a first experiment, wherein the first experiment is used to obtain a probability that a subbit to be measured is in a first selected eigenstate as a function of a detuning magnitude and time, wherein the detuning is a frequency difference between a quantum state control signal applied to the subbit to be measured and an X-gate signal;

[0058] S200: performing image processing on the experimental result view to output a first grayscale image or a first black-and-white image, wherein the first grayscale image is composed of a plurality of pixels with different grayscale values, and the pixels of the first black-and-white image are composed of black and white;

[0059] S300: When a result of similarity comparison on the first grayscale image or the first black-and-white image reaches a preset value, fitting processing is performed on all connected domains in the first grayscale image or the first black-and-white image to obtain a fitting function for each connected domain;

[0060] S400: Based on the fitting function, determine whether the quantum state control signal of the sub-bit to be measured is distorted.

[0061] The difference from the prior art is that the embodiment of the present invention proposes a verification method for the distortion of the quantum state control signal, obtains the experimental result view of the first experiment, performs image processing on the experimental result view, outputs a first grayscale image or a first black-and-white image, and when the result of the similarity comparison of the first grayscale image or the first black-and-white image reaches a preset value, performs fitting processing on all connected domains in the first grayscale image or the first black-and-white image to obtain the fitting function of each connected domain. Finally, based on the fitting function, it is judged whether the quantum state control signal of the sub-bit to be measured is distorted. The scheme of the embodiment of the present invention obtains the connected domain in the first grayscale image or the first black-and-white image after image processing, and performs fitting processing on the connected domain to obtain the fitting function of each connected domain. According to the result of the fitting function, it can be directly judged whether the quantum state control signal of the sub-bit to be measured is distorted. In addition, it is also possible to determine the appropriate working point range of the sub-bit to be measured by continuously traversing the working frequency of the quantum bit and obtaining the distortion of the quantum state control signal of the sub-bit to be measured at the corresponding working frequency.

[0062] It should be noted that the first experiment mentioned in this embodiment refers to traversing the detuning size of the quantum state control signal within a set range, and a Rabi experiment is performed on the sub-bit to be measured at each detuning. It can be understood by those skilled in the art that the Rabi experiment refers to applying a quantum state control signal of duration t to the quantum state control line of the sub-bit to be measured, applying a frequency control signal to the frequency control line of the sub-bit to be measured, obtaining the probability of the sub-bit to be measured being in an excited state or a ground state as a function of time t, and finally summarizing the experimental results of all Rabi experiments to obtain the experimental result view of the first experiment, please refer to Figure 2 , Figure 2 is an experimental result view of the first experiment in an example, the experimental result view is a three-dimensional graph, Figure 2 The depth information in represents the probability of the measured subbit being in the first selected eigenstate, the horizontal axis is the size of the detuning, and the vertical axis is time. In an ideal case, that is, if the quantum state control signal of the subbit to be measured is not distorted, the experimental result view is a left-right symmetrical image along the center line. If the quantum state control signal of the subbit to be measured is distorted, the experimental result view will be deformed to a level that is not left-right symmetrical along the center line.

[0063] This feature of the experimental result view can be utilized. In order to realize automatic identification of the distortion of the quantum state control signal of the subbit to be measured, the experimental result view can be image processed and a first black-and-white image or a first grayscale image can be output. By comparing the similarity of the first black-and-white image or the first grayscale image with the first image under ideal conditions, it can be directly determined whether the quantum state control signal of the subbit to be measured is distorted. The first image mentioned here refers to the result view in which the experimental results of the first experiment meet the preset requirements, that is, the experimental result view under ideal conditions.

[0064] In this embodiment, when we perform image processing on the experimental result view, we may perform grayscale processing or binarization processing to convert the three-dimensional depth map into a grayscale map or a black-and-white map. When the result of the similarity comparison of the first grayscale map or the first black-and-white map reaches a preset value, it means that the first black-and-white map is compared with the first picture for similarity. Specifically, the first black-and-white map or the first grayscale map is compared with the first picture for similarity using a structural similarity algorithm.

[0065] It can be understood by those skilled in the art that the structural similarity (SSIM, Structure Similarity IndexMeasure) is an index for measuring the similarity between two images. The structural similarity algorithm inputs two pictures, i.e., two pictures requiring structural similarity, one of which is an uncompressed distortion-free image, and the other is a picture that needs to be compared with the distortion-free image. The SSIM index mainly extracts three key features from the image: brightness, contrast, and structure. The comparison between the two images is based on these three features. We process the original experimental result view to output the first black and white image, which can reduce the operating cost of the algorithm to a certain extent and improve the computational efficiency. The range of the SSIM value is [0,1]. In this embodiment, the result of the similarity comparison can be considered to be the SSIM value. In this embodiment, the preset threshold can be set to 0.6. It should be noted that in other embodiments, the preset threshold can be adjusted according to actual needs. For example, for scenes with higher accuracy requirements, the preset threshold can be set to 0.8 or 0.9. For scenes with lower accuracy requirements, the preset threshold can be set to 0.5. They are not described one by one here. It should be noted that the first picture is a black-and-white picture composed of black and white after image processing.

[0066] It should be noted that, in this embodiment, the similarity comparison of the first grayscale image or the first black-and-white image can be performed by comparing the similarity of the first grayscale image or the first black-and-white image with the first image. The result of the similarity comparison can be used to determine whether the quantum state control signal of the quantum bit to be measured is distorted. The first image here refers to the result view of the experimental result of the first experiment that meets the preset requirements, that is, the experimental result view under ideal conditions. It can be understood by those skilled in the art that, since the experimental result views finally obtained by quantum state control signals of different quantum bits and different frequencies are definitely different, it is necessary to prepare in advance a plurality of result views reflecting that the experimental results of the first experiment meet the preset requirements, that is, the number of the first images that need to be prepared is multiple, as long as the similarity between the experimental result view of the first experiment and any one of the multiple first images meets the requirements, it can be considered that the quantum state control signal has not been distorted. Since it is necessary to compare the similarity with multiple standard images, the overall efficiency of this solution is low. In order to improve the efficiency, the processed first grayscale image or the first black-and-white image can be segmented, and the mirror image of the right image can be obtained. The similarity comparison result between the left image and the mirror image can be used to directly determine whether the quantum state control signal of the sub-bit to be measured is distorted. This solution can directly determine whether the quantum state control signal of the sub-bit to be measured is distorted by comparing the similarity with its own mirror image, which effectively improves the overall efficiency of the solution.

[0067] Furthermore, in practical applications, we found that if the quantum state control signal of the quantum bit to be measured is distorted, there is a certain probability that interference will occur in the experimental result view of the first experiment. Figure 3 As shown in the experimental result view, if the left-right symmetry of the experimental result view with interference phenomenon is good, then misjudgment will occur when using the mirror image for similarity comparison, and the distortion will be judged as not having occurred.

[0068] In order to solve the problem of misjudgment in the scheme of using mirror images for similarity comparison, the present application proposes that after the similarity comparison is passed, the connected domain in the first grayscale image or the first black-and-white image after image processing is obtained, and the connected domain is fitted to obtain the fitting function of each connected domain. According to the result of the fitting function, it can be directly judged whether the quantum state control signal of the sub-bit to be measured is distorted. This can effectively avoid the problem of misjudgment. Two example schemes are provided in this embodiment, the first is a quadratic function fitting scheme, and the second is a cubic function fitting scheme.

[0069] It should be noted that a connected domain is a set of pixels consisting of adjacent pixels with the same pixel value. We can use this condition to find the connected domain of an image in an image. For each connected domain found, we give it a unique identifier to distinguish it from other connected domains. For details, please refer to Figure 5 The connected domain 1, the connected domain 2 and the connected domain 3 in the image. Those skilled in the art can understand that the connected domain in the image can generally be obtained by two-pass scanning or seed filling method, which will not be elaborated here.

[0070] After obtaining all connected domains of the first grayscale image or the first black-and-white image, we first determine the average y value corresponding to the x position of each connected domain. The average y value mentioned here refers to the average value of all y coordinates corresponding to the x coordinate of the connected domain in the coordinate system when the first grayscale image or the first black-and-white image is placed in a rectangular coordinate system. Figure 5 and Figure 6 , Figure 6 For the general Figure 5 The y values ​​corresponding to the x positions of the three connected domains in the first grayscale image or the first black-and-white image are averaged and output as the result, and some discrete coordinate points are displayed in the coordinate system. Specifically, in this embodiment, the fitting process for all the connected domains in the first grayscale image or the first black-and-white image includes:

[0071] Process each connected domain to obtain the average y value corresponding to each x coordinate of each connected domain in the plane rectangular coordinate system;

[0072] The processed connected domain is fitted to obtain a fitting curve.

[0073] From the previous description, we can see that we provide two fitting schemes. The first scheme is introduced first.

[0074] Specifically, in this embodiment, the fitting process of the processed connected domain includes:

[0075] A quadratic function is used to perform fitting processing on all processed connected domains in the first grayscale image or the first black-and-white image.

[0076] Those skilled in the art can understand that, in this embodiment, the improved use of a quadratic function to fit all the processed connected domains in the first grayscale image or the first black-and-white image refers to using y=ax 2 +bx+c to fit each processed connected domain, that is, to fit Figure 6 Each connected domain shown corresponds to a discrete cluster. Figure 7 , Figure 7 To use quadratic function fitting Figure 6 The result view is obtained by using the discrete clusters corresponding to the connected domain 1 in Figure 7 For example, it is obvious that the fitting result shows that the coefficient of the quadratic term of the quadratic function is greater than 0. This situation reflects that the experimental results of the first experiment show interference. Therefore, the fitting result can be used to directly determine that the quantum state control signal of the sub-bit to be measured is distorted.

[0077] It should be noted that, in this embodiment, Figure 6 and Figure 7 The units of the horizontal and vertical coordinates are both the number of pixels, that is, Figure 5 The horizontal direction is the X-axis, the vertical direction is the Y-axis, and the position of each connected domain in the entire image is calculated in pixels.

[0078] Specifically, in this embodiment, judging whether the quantum state control signal of the subbit to be measured is distorted based on the fitting function includes:

[0079] When the coefficient of the quadratic term of the fitting function of any connected domain in the first grayscale image or the first black-and-white image is a value greater than 0, it is determined that the quantum state control signal of the sub-bit to be measured is distorted.

[0080] In practical applications, we also found that sometimes the connected domain cannot be accurately fitted by the quadratic function. Figure 8 The results shown in , for this reason, the present application proposes that each connected domain can also be fitted by a cubic function. Specifically, in this embodiment, the fitting process of the processed connected domain includes:

[0081] A cubic function is used to perform fitting processing on all connected domains in the first grayscale image or the first black-and-white image.

[0082] Specifically, in this embodiment, judging whether the quantum state control signal of the subbit to be measured is distorted based on the fitting function includes:

[0083] According to the fitting function, obtaining a first difference between the maximum value and the minimum value of the y coordinate of each fitting curve in the plane rectangular coordinate system;

[0084] When the first difference exceeds a first preset threshold, it is determined that the quantum state control signal of the sub-bit to be measured is distorted.

[0085] Specifically, in this embodiment, judging whether the quantum state control signal of the subbit to be measured is distorted based on the fitting function includes:

[0086] According to the fitting function, obtaining a first coordinate corresponding to the minimum value of the y coordinate of the fitting curve in a plane rectangular coordinate system;

[0087] Based on the first coordinates, the connected domain is divided into a first curve and a second curve, wherein the first curve is a portion that does not include a maximum value point;

[0088] According to a second difference between a maximum value point and a minimum value point of a y coordinate of the first curve in a plane rectangular coordinate system, it is determined whether the quantum state control signal of the subbit to be measured is distorted.

[0089] Specifically, in this embodiment, after performing image processing on the experimental result view and outputting a first grayscale image or a first black-and-white image, the method further includes:

[0090] Determining whether the number of connected domains of the first grayscale image or the first black-and-white image exceeds a second preset threshold;

[0091] If not, it is determined that the quantum state control signal of the subbit to be measured is distorted;

[0092] If so, when the result of the similarity comparison on the first grayscale image or the first black-and-white image reaches a preset value, fitting processing is performed on all connected domains in the first grayscale image or the first black-and-white image to obtain a fitting function for each connected domain.

[0093] It should be noted that, in this embodiment, the first curve is the part that does not contain the maximum value point. Figure 8 For example, Figure 8 The fitted curve of the right part of the first connected domain in can be considered as the first curve, that is, the first curve analyzes the interference part that may exist in the curve.

[0094] Based on the same invention concept, please refer to Fig. 9 The embodiment of the present invention further provides a verification device for quantum state control signal distortion, comprising:

[0095] An experiment result view acquisition unit 100 is used to acquire an experiment result view of a first experiment, wherein the first experiment is used to acquire a probability that a subbit to be measured is in a first selected eigenstate as a function of a detuning magnitude and time, wherein the detuning is a frequency difference between a quantum state control signal applied to the subbit to be measured and an X-gate signal;

[0096] An image processing unit 200 is used to perform image processing on the experimental result view and output a first grayscale image or a first black-and-white image, wherein the first grayscale image is composed of a plurality of pixels with different grayscale values, and the pixels of the first black-and-white image are composed of black and white;

[0097] A fitting processing unit 300 is used to perform fitting processing on all connected domains in the first grayscale image or the first black-and-white image to obtain a fitting function for each connected domain when a result of similarity comparison on the first grayscale image or the first black-and-white image reaches a preset value;

[0098] The determination unit 400 is used to determine whether the quantum state control signal of the sub-bit to be measured is distorted based on the fitting function.

[0099] It can be understood that the experimental result view acquisition unit 100, the image processing unit 200, the fitting processing unit 300 and the determination unit 400 can be combined in one device, or any one of the modules can be split into multiple sub-modules, or at least part of the functions of one or more modules of the experimental result view acquisition unit 100, the image processing unit 200, the fitting processing unit 300 and the determination unit 400 can be combined with at least part of the functions of other modules and implemented in one functional module. According to an embodiment of the present invention, at least one of the experimental result view acquisition unit 100, the image processing unit 200, the fitting processing unit 300 and the determination unit 400 can be at least partially implemented as a hardware circuit, such as a field programmable gate array (FPGA), a programmable logic array (PLA), a system on a chip, a system on a substrate, a system on a package, an application specific integrated circuit (ASIC), or can be implemented in hardware or firmware in any other reasonable way of integrating or packaging the circuit, or in a suitable combination of software, hardware and firmware. Alternatively, at least one of the experiment result view acquisition unit 100, the image processing unit 200, the fitting processing unit 300 and the determination unit 400 may be at least partially implemented as a computer program module, and when the program is executed by a computer, the function of the corresponding module may be executed.

[0100] Based on the same inventive concept, an embodiment of the present invention further proposes a quantum computing measurement and control system, which uses a verification method for the quantum state control signal distortion described in any one of the above-mentioned characteristic descriptions.

[0101] Based on the same inventive concept, an embodiment of the present invention also proposes a quantum computer, including the quantum computing measurement and control system described in the above feature description.

[0102] Based on the same inventive concept, an embodiment of the present invention further proposes a readable storage medium having a computer program stored thereon, which, when executed by a processor, can implement a method for verifying the distortion of a quantum state control signal as described in any one of the above-mentioned feature descriptions.

[0103] The readable storage medium can be a tangible device that can keep and store the instructions used by the instruction execution device, such as but not limited to an electrical storage device, a magnetic storage device, an optical storage device, an electromagnetic storage device, a semiconductor storage device or any suitable combination of the above. The more specific example (non-exhaustive list) of the readable storage medium includes: a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), a static random access memory (SRAM), a portable compact disk read-only memory (CD-ROM), a digital versatile disk (DVD), a memory stick, a floppy disk, a mechanical encoding device, such as a punch card or a convex structure in a groove on which instructions are stored, and any suitable combination of the above. The computer program described here can be downloaded from the readable storage medium to each computing / processing device, or downloaded to an external computer or external storage device through a network, such as the Internet, a local area network, a wide area network and / or a wireless network. The network can include copper transmission cables, optical fiber transmission, wireless transmission, routers, firewalls, switches, gateway computers and / or edge servers. The network adapter card or network interface in each computing / processing device receives the computer program from the network and forwards the computer program for storage in a readable storage medium in each computing / processing device. The computer program for performing the operation of the present invention may be an assembly instruction, an instruction set architecture (ISA) instruction, a machine instruction, a machine-dependent instruction, a microcode, a firmware instruction, a state setting data, or a source code or object code written in any combination of one or more programming languages, including object-oriented programming languages ​​such as Smalltalk, C++, etc., and conventional procedural programming languages ​​such as "C" language or similar programming languages. The computer program may be executed entirely on the user's computer, partially on the user's computer, as an independent software package, partially on the user's computer and partially on a remote computer, or entirely on a remote computer or server. In the case of a remote computer, the remote computer may be connected to the user's computer through any type of network, including a local area network (LAN) or a wide area network (WAN), or may be connected to an external computer (e.g., using an Internet service provider to connect through the Internet). In some embodiments, by utilizing the state information of a computer program to personalize an electronic circuit, such as a programmable logic circuit, a field programmable gate array (FPGA), or a programmable logic array (PLA), the electronic circuit can execute computer-readable program instructions to implement various aspects of the present invention.

[0104] Here, various aspects of the present invention are described with reference to the flowchart and / or block diagram of the method, system and computer program product according to the embodiment of the present invention. It should be understood that each square frame of the flowchart and / or block diagram and the combination of the square frames in the flowchart and / or block diagram can be realized by a computer program. These computer programs can be provided to the processor of a general-purpose computer, a special-purpose computer or other programmable data processing device, so as to produce a machine, so that these programs, when executed by the processor of a computer or other programmable data processing device, produce a device for realizing the function / action specified in one or more square frames in the flowchart and / or block diagram. These computer programs can also be stored in a readable storage medium, and these computer programs make the computer, programmable data processing device and / or other equipment work in a specific way, so that the readable storage medium storing the computer program includes a manufactured product, which includes instructions for realizing various aspects of the function / action specified in one or more square frames in the flowchart and / or block diagram.

[0105] The computer program may also be loaded onto a computer, other programmable data processing apparatus, or other device so that a series of operational steps are executed on the computer, other programmable data processing apparatus, or other device to produce a computer-implemented process, thereby causing the computer program executed on the computer, other programmable data processing apparatus, or other device to implement the functions / actions specified in one or more boxes in the flowchart and / or block diagram.

[0106] In the description of this specification, the description with reference to the terms "one embodiment", "some embodiments", "example" or "specific example" etc. means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described may be combined in any one or more embodiments in a suitable manner. In addition, those skilled in the art may combine and combine different embodiments or examples described in this specification.

[0107] The above is only a preferred embodiment of the present invention and does not limit the present invention in any way. Any technician in the relevant technical field, without departing from the scope of the technical solution of the present invention, makes any form of equivalent replacement or modification to the technical solution and technical content disclosed in the present invention, which does not depart from the content of the technical solution of the present invention and still falls within the protection scope of the present invention.

Claims

1. A method for verifying quantum state control signal distortion, characterized in that: include: Obtaining an experimental result view of a first experiment, wherein the first experiment is used to obtain a change in the probability of a subbit to be measured being in a first selected eigenstate as a function of a detuning magnitude and time, wherein the detuning is a frequency difference between a quantum state control signal applied to the subbit to be measured and an X-gate signal; Performing image processing on the experimental result view to output a first grayscale image or a first black-and-white image, wherein the first grayscale image is composed of a plurality of pixels with different grayscale values, and the pixels of the first black-and-white image are composed of black and white; When the result of the similarity comparison of the first grayscale image or the first black-and-white image reaches a preset value, performing fitting processing on all connected domains in the first grayscale image or the first black-and-white image to obtain a fitting function for each connected domain; Based on the fitting function, it is determined whether the quantum state control signal of the sub-bit to be measured is distorted.

2. The method according to claim 1, characterized in that The fitting process of all connected domains in the first grayscale image or the first black-and-white image includes: Process each connected domain to obtain the average y value corresponding to each x coordinate of each connected domain in the plane rectangular coordinate system; The processed connected domain is fitted to obtain a fitting curve.

3. The method according to claim 2, characterized in that The fitting process of the processed connected domain includes: A quadratic function is used to perform fitting processing on all processed connected domains in the first grayscale image or the first black-and-white image.

4. The method according to claim 3, characterized in that The step of judging whether the quantum state control signal of the subbit to be measured is distorted based on the fitting function includes: When the coefficient of the quadratic term of the fitting function of the connected domain after processing of any one of the first grayscale image or the first black-and-white image is greater than 0, it is determined that the quantum state control signal of the sub-bit to be measured is distorted.

5. The method according to claim 2, characterized in that The fitting process of the processed connected domain includes: A cubic function is used to perform fitting processing on all processed connected domains in the first grayscale image or the first black-and-white image.

6. The method according to claim 5, characterized in that The step of judging whether the quantum state control signal of the subbit to be measured is distorted based on the fitting function includes: According to the fitting function, obtaining a first difference between a maximum value and a minimum value corresponding to the y coordinate of each fitting curve in a plane rectangular coordinate system; When the first difference exceeds a first preset threshold, it is determined that the quantum state control signal of the subbit to be measured is distorted.

7. The method according to claim 5, characterized in that The step of judging whether the quantum state control signal of the subbit to be measured is distorted based on the fitting function includes: According to the fitting function, obtaining a first coordinate corresponding to the minimum value of the y coordinate of the fitting curve in a plane rectangular coordinate system; Based on the first coordinates, the fitting curve is divided into a first curve and a second curve, wherein the first curve is a portion that does not include a maximum value point; According to a second difference between a maximum value point and a minimum value point of a y coordinate of the first curve in a plane rectangular coordinate system, it is determined whether the quantum state control signal of the subbit to be measured is distorted.

8. The method according to claim 1, characterized in that After performing image processing on the experimental result view and outputting a first grayscale image or a first black-and-white image, the method further includes: Determining whether the number of connected domains of the first grayscale image or the first black-and-white image exceeds a second preset threshold; If not, it is determined that the quantum state control signal of the subbit to be measured is distorted; If so, when the result of the similarity comparison on the first grayscale image or the first black-and-white image reaches a preset value, fitting processing is performed on all connected domains in the first grayscale image or the first black-and-white image to obtain a fitting function for each connected domain.

9. A verification device for quantum state control signal distortion, characterized in that: include: an experiment result view acquisition unit, configured to acquire an experiment result view of a first experiment, wherein the first experiment is configured to acquire a probability that a subbit to be measured is in a first selected eigenstate as a function of a detuning magnitude and time, wherein the detuning is a frequency difference between a quantum state control signal applied to the subbit to be measured and an X-gate signal; An image processing unit, configured to perform image processing on the experimental result view and output a first grayscale image or a first black-and-white image, wherein the first grayscale image is composed of a plurality of pixels with different grayscale values, and the pixels of the first black-and-white image are composed of black and white; a fitting processing unit, configured to perform fitting processing on all connected domains in the first grayscale image or the first black-and-white image to obtain a fitting function for each connected domain when a result of similarity comparison on the first grayscale image or the first black-and-white image reaches a preset value; A determination unit is used to determine whether the quantum state control signal of the sub-bit to be measured is distorted based on the fitting function.

10. A quantum computing measurement and control system, characterized in that: A verification method for controlling signal distortion using a quantum state as described in any one of claims 1 to 8.

11. A quantum computer, characterized in that: Including the quantum computing measurement and control system as described in claim 10.

12. A readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, it can implement the verification method of quantum state control signal distortion described in any one of claims 1-7.

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