Base station radio frequency channel calibration method and device
Through the one-time sweep full power calibration method, the link attenuator gain value is calculated using the linear relationship between ambient temperature and power backoff degree, which solves the problem of excessive calibration time of the radio frequency channel of the 5G base station and improves production efficiency.
Patent Information
- Application Number
- CN202411865127.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-18
- Publication Date
- 2025-04-01
AI Technical Summary
When calibrating the base station radio frequency channel of 5G signals, the prior art needs to traverse all frequency points and frequencies, resulting in too long calibration time, especially multi-mode and multi-channel equipment, which reduces production efficiency.
Through the one-time sweep full power calibration method, the ambient temperature and the target frequency interval of the signal to be calibrated and the power fallback degree and the power fallback degree are obtained. The gain value of the link attenuator is calculated to reduce the calibration time by using the predetermined linear relationship between the temperature and the gain change value and the linear relationship between the power fallback degree and the gain change value.
It greatly reduces the time of production calibration, can flexibly handle the calibration requirements of the base station in various modes and carriers, and improves production efficiency.
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Figure CN119743214A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the fields of base stations, radio frequency and calibration, and in particular to a method and device for calibrating a radio frequency channel of a base station. Background Art
[0002] For RF channel calibration, the existing technology is to send a single-mode carrier signal, test all frequency points and power level signals, and test all of them once, so as to test the corresponding table of the RF hardware's transmission power in this working mode. When the base station is actually working, the corresponding power correspondence table is called according to the on-site configuration requirements to configure the power of each channel of each device. This solution is relatively simple and effective in 2G, 3G, and 4G, because in terms of carrier bandwidth, 2G GSM has only 600kHz, 3G WCDMA 5MHz, and 4G has 5Mhz, 10Mhz, 15Mhz, 20Mhz, and multi-carrier 3*20MHz. Relatively speaking, the time for calibration is acceptable.
[0003] For 5G signals, bandwidth can be configured according to technical standards and frequency ranges (FR1 and FR2). The bandwidth range of FR1 (Sub-6GHz) varies from 5MHz to 100MHz, including 5Mhz, 10Mhz, 15Mhz, 20Mhz, 25Mhz, 30Mhz, 40Mhz, 50Mhz, 60Mhz, 80Mhz and 100Mhz. The bandwidth of FR2 (millimeter wave) is higher, including 50Mhz, 100Mhz, 200Mhz and 400Mhz. In addition, there are multi-carrier situations, which undoubtedly takes a long time to calibrate all signal bandwidths and combinations at all frequencies. If it is a multi-mode device with multiple channels (for example, 4 channels, 8 channels and 16 channels), the calibration time is particularly long, which undoubtedly reduces production efficiency. Summary of the invention
[0004] The embodiment of the present invention provides a method and device for calibrating a base station radio frequency channel. The method greatly reduces the time of the production calibration link by using a calibration signal to perform a full-power calibration of a frequency sweep. In actual use, according to actual needs, the ambient temperature of the current base station is obtained, and based on the stored parameters affecting the gain and their relationship, the value of the current link attenuator is calculated, and finally the appropriate base station power is obtained.
[0005] In a first aspect, an embodiment of the present application proposes a base station radio frequency channel calibration method, comprising:
[0006] Obtain the current ambient temperature, the target frequency range of the signal to be calibrated, and the power fallback degree;
[0007] According to pre-dividing the working frequency band of the base station into different frequency intervals, a first linear relationship between temperature and gain change value is determined by testing different test frequency points in each frequency interval, and determining a first gain change value corresponding to a target test frequency point in the target frequency interval at the ambient temperature, wherein the first gain change value is a change value corresponding to a gain value at a preset reference temperature;
[0008] Determine, based on a predetermined second linear relationship between different preset power backoff levels and gain change values, a second gain change value corresponding to the current power backoff level, where the second gain change value is a change value corresponding to the gain value when the power backoff level is zero;
[0009] Determine the gain value corresponding to each target test frequency point based on the predetermined standard gain value corresponding to the reference temperature at each test frequency point, and the first gain change value and the second gain change value;
[0010] Based on the gain values corresponding to the target test frequency points, according to the target frequency interval of the signal to be calibrated, the interval average gain value of the signal to be calibrated is calculated, and the link attenuator gain value of the signal to be calibrated is determined.
[0011] In some possible embodiments, the first linear relationship between the temperature and the gain change value determined by testing different test frequency points in each frequency interval is determined in the following manner:
[0012] Select a reference temperature and transmit test signals at various test frequencies through the base station;
[0013] For each test frequency point of the test signal, record the standard output power of the test signal at the reference temperature;
[0014] Adjust the current ambient temperature to different preset ambient temperatures, and record the output power of the test signal at each preset ambient temperature;
[0015] Based on the standard output power and the output power at each preset ambient temperature, the gain change value of each test frequency point at each preset ambient temperature is calculated to obtain a first linear relationship.
[0016] In some possible embodiments, determining a first gain change value corresponding to a target test frequency point in the target frequency interval at the ambient temperature includes:
[0017] If the ambient temperature is a preset ambient temperature, determining a first gain change value corresponding to the ambient temperature based on the gain change value corresponding to the preset ambient temperature;
[0018] If the ambient temperature is within two adjacent preset ambient temperature intervals, a linear interpolation method is used to determine a first gain change value corresponding to the target test frequency at the ambient temperature based on the gain change values corresponding to the two adjacent preset ambient temperatures;
[0019] If the ambient temperature exceeds the boundary corresponding to the minimum preset ambient temperature and the maximum preset ambient temperature, a linear extension line is fitted based on the gain change values corresponding to the two adjacent preset ambient temperatures near the boundary, and the first gain change value corresponding to the target test frequency at the ambient temperature is determined based on the fitted linear extension line.
[0020] In some possible embodiments, the second linear relationship between the predetermined different preset power backoff degrees and the gain change value is determined in the following manner:
[0021] Transmitting a test signal through the base station and setting a gain value of a link attenuator, and when the output power is the rated power, recording the gain value of the link attenuator as a standard gain value;
[0022] The power backoff degree is changed by modifying the link attenuator gain value, and when the output power reaches each of the preset power backoff degrees, the gain value of the link attenuator at this time is recorded;
[0023] Based on the standard gain value and the gain values at different preset power backoff levels, the gain change value of the base station at different preset power backoff levels is calculated to obtain a second linear relationship.
[0024] In some possible embodiments, determining the second gain change value corresponding to the current power backoff degree includes:
[0025] If it is determined that the current power backoff degree is within two adjacent preset power backoff degree intervals, a second gain change value corresponding to the current power backoff degree is determined using a linear interpolation method based on the gain change values corresponding to the preset power backoff degrees.
[0026] In some possible embodiments, the predetermined standard gain value corresponding to the reference temperature at each test frequency point is determined in the following manner:
[0027] Transmitting calibration signals of various test frequency points at ambient temperature by the base station;
[0028] According to the calibration signal of each test frequency point, the gain value of the link attenuator is adjusted, and when the output power is the rated power, the reference gain value of the link attenuator under the ambient temperature is recorded;
[0029] Determine, based on the link attenuator input level at the ambient temperature and the reference gain value, a calibration gain value at which the output power of the base station is the rated power at the ambient temperature;
[0030] Based on the ambient temperature, the calibration gain value and the first linear relationship, a standard gain value of the calibration signal of each test frequency point at the reference temperature is calculated.
[0031] In some possible embodiments, the step of calculating the standard gain value of the calibration signal at each test frequency point at a reference temperature based on the ambient temperature, the calibration gain value, and the first linear relationship comprises at least one of the following steps:
[0032] Based on the ambient temperature of each test frequency point and the first linear relationship, determining a gain change value of the calibration signal of each test frequency point at the ambient temperature;
[0033] Based on the gain change value and the calibration gain value, the standard gain value of the calibration signal at each test frequency point at a reference temperature is calculated.
[0034] In some possible embodiments, determining the gain change value of the calibration signal of each test frequency point at the ambient temperature based on the ambient temperature and the first linear relationship includes any one of the following steps:
[0035] If the ambient temperature is a preset ambient temperature, determining the gain change value corresponding to the ambient temperature based on the gain change value corresponding to the preset ambient temperature;
[0036] If the ambient temperature is within two adjacent preset ambient temperature intervals, a linear interpolation method is used to determine the gain change value corresponding to the calibration signal of each test frequency point at the ambient temperature based on the gain change values corresponding to the two adjacent preset ambient temperatures;
[0037] If the ambient temperature exceeds the boundary corresponding to the minimum preset ambient temperature and the maximum preset ambient temperature, a linear extension line is fitted based on the gain change values corresponding to the two adjacent preset ambient temperatures near the boundary, and the gain change value corresponding to the calibration signal of each test frequency point at the ambient temperature is determined based on the fitted linear extension line.
[0038] In some possible embodiments, determining the link attenuator gain value of the signal to be calibrated includes:
[0039] The rated power of the base station and the input level of the link attenuator are obtained, and the link attenuator gain value of the signal to be calibrated is calculated based on the interval average gain value of the signal to be calibrated.
[0040] In a second aspect, an embodiment of the present application also proposes a base station radio frequency channel calibration device, comprising at least one processor; and a memory communicatively connected to the at least one processor; wherein the memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor so that the at least one processor can execute a base station radio frequency channel calibration method as described in any one of the first aspects above.
[0041] This application proposes a base station radio frequency channel calibration method and device, which greatly reduces the time of the production calibration link by performing a sweep frequency full power calibration, and can also flexibly handle the base station in various modes and various carriers. In actual use, according to actual needs, the current base station ambient temperature is obtained, and based on the stored parameters affecting the gain and their relationship, the value of the current link attenuator is calculated, and finally the appropriate base station power is obtained.
[0042] Other features and advantages of the present application will be described in the following description, and partly become apparent from the description, or be understood by practicing the present application. The purpose and other advantages of the present application can be realized and obtained by the structures specifically pointed out in the written description, claims, and drawings. BRIEF DESCRIPTION OF THE DRAWINGS
[0043] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings required for use in the embodiments of the present application will be briefly introduced below. Obviously, the drawings introduced below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.
[0044] Figure 1 This is a schematic diagram of the structure of a frequency division duplex FDD in an embodiment of the present application;
[0045] Figure 2 A flow chart of a method for calibrating a base station radio frequency channel in an embodiment of the present application;
[0046] Figure 3 This is a schematic diagram of a process for determining a first linear relationship between temperature and gain change value in an embodiment of the present application;
[0047] Figure 4 A schematic diagram of a flow chart for determining a second linear relationship between different preset power backoff levels and gain change values in an embodiment of the present application;
[0048] Figure 5 This is a schematic diagram of a process for determining a standard gain value corresponding to a reference temperature of each base station device at each test frequency point in an embodiment of the present application;
[0049] Figure 6 This is a schematic diagram of a flow chart of calculating the standard gain value of the calibration signal at each test frequency point at a reference temperature in an embodiment of the present application;
[0050] Figure 7 This is a schematic diagram of a transmission channel in an embodiment of the present application;
[0051] Figure 8 This is a schematic diagram of a calculation process of an attenuator gain value in an embodiment of the present application;
[0052] Fig. 9 A schematic diagram of a carrier continuity in an embodiment of the present application;
[0053] Fig.10 A schematic diagram of a discontinuous carrier wave in an embodiment of the present application;
[0054] Fig.11 This is a schematic diagram of a process of performing temperature compensation on the base station device in an embodiment of the present application;
[0055] Fig.12 This is a schematic diagram of the structure of a base station radio frequency channel calibration device in an embodiment of the present application. DETAILED DESCRIPTION
[0056] To further illustrate the technical solution provided by the embodiments of the present application, a detailed description is given below in conjunction with the accompanying drawings and specific implementation methods.
[0057] Take the transmission channel in FDD (Frequency Division Duplexing) as an example. Figure 1 As shown in the figure, the transmission link is from the digital signal processor to the transceiver transmitter, and then to the power amplifier module and duplexer. The entire link involves many devices, and the consistency, high and low temperature characteristics of each device, etc., result in that if the base station does not perform RF power calibration before leaving the factory, the antenna port output power cannot be within the normal range of the rated power, and the deviation will be very large. Therefore, each base station device needs to be gain calibrated within its working frequency band before leaving the factory.
[0058] In the prior art, a single-mode carrier signal is sent, and the power level signals of all frequencies are tested, and all are traversed and tested once, so as to test the transmission power correspondence table of the RF hardware in this working mode. When the base station is actually working, the corresponding power correspondence table is called according to the on-site configuration requirements to configure the power of each channel of each device. This solution is relatively simple and effective in 2G, 3G, and 4G, while for 5G signals, the bandwidth can be configured according to technical standards and frequency ranges (FR1 and FR2). The bandwidth range of FR1 (Sub-6GHz) ranges from 5MHz to 100MHz, and the bandwidth of FR2 (millimeter wave) is higher. In addition, there are multi-carrier situations. This undoubtedly takes a long time to calibrate all signal bandwidths and combinations at all frequencies. If it is a multi-mode device and a multi-channel device, the calibration time is particularly long, which undoubtedly reduces production efficiency.
[0059] In view of the above-mentioned 5G signal and multi-carrier situation, the calibration time of channel calibration using the existing technology is particularly long, which reduces the production efficiency. The embodiment of the present application proposes a base station radio frequency channel calibration method, such as Figure 2 As shown, including:
[0060] Step 201, obtaining the current ambient temperature, the target frequency range of the signal to be calibrated, and the power back-off degree.
[0061] Step 202, based on pre-dividing the working frequency band of the base station into different frequency intervals, the first linear relationship between temperature and gain change value is determined by testing different test frequency points in each frequency interval, and the first gain change value corresponding to the target test frequency point in the target frequency interval at the ambient temperature is determined, and the first gain change value is a change value corresponding to the gain value at a preset reference temperature.
[0062] In the embodiment of the present application, the working frequency band of the base station is mainly divided into different frequency intervals, different test frequency points are selected for each frequency interval, a series of test frequency points are obtained, and parameter calibration is performed based on these test frequency points, which can save the calibration time of the base station equipment before leaving the factory. At the same time, by testing to determine the gain change value of each test frequency point under different ambient temperatures, it is also possible to more accurately describe the change law of gain with temperature.
[0063] Step 203, based on a second linear relationship between different preset power backoff levels and gain change values, determine a second gain change value corresponding to the current power backoff level, wherein the second gain change value is a change value corresponding to the gain value when the power backoff level is zero.
[0064] When some base stations perform power backoff, the response curve AM-AM curve of the input signal amplitude and the output signal amplitude is not smooth, and the gain changes with the different degrees of power backoff. The impact of power backoff on the gain change cannot be ignored. Therefore, the embodiment of the present application also tests the impact of the power backoff degree on the gain before the RF equipment leaves the factory.
[0065] Step 204 : determining the gain value corresponding to each target test frequency point based on the predetermined standard gain value corresponding to the reference temperature at each test frequency point, and the first gain change value and the second gain change value.
[0066] The above-mentioned first linear relationship between temperature and gain change value and the second linear relationship between different preset power back-off degrees and gain change value are determined during the research and development stage of the base station equipment. They are determined through hardware solutions, so there is no need to test each base station equipment, which also saves calibration time before leaving the factory.
[0067] Step 205 , based on the gain values corresponding to the target test frequency points and according to the target frequency interval of the signal to be calibrated, the interval average gain value of the signal to be calibrated is calculated, and the link attenuator gain value of the signal to be calibrated is determined.
[0068] In the embodiment of the present application, since the signal to be calibrated transmitted by the base station device is a carrier signal, it is necessary to determine the gain values of all target test frequency points that can be covered by the carrier, and then calculate the interval average gain value of the signal to be calibrated based on the target frequency interval. In actual testing, when the attenuator gain value is calibrated using the interval average gain value, it can also ensure that the output power of the base station operates within the allowable error range.
[0069] Through the method in the embodiment of the present application, the ambient temperature of the current base station can be obtained according to actual needs, and based on the stored first linear relationship between the temperature and the gain change value and the second linear relationship between different preset power back-off degrees and the gain change value, the gain value of the current link attenuator can be calculated, and finally, through calibration, the expected base station RF channel can be obtained.
[0070] Because the gain of amplifiers, filters, duplexers and other devices varies with frequency and the gain of each frequency varies with temperature, temperature compensation calibration and gain calibration of each frequency point are required before RF equipment leaves the factory. Usually manufacturers only perform calibration at the lowest and highest temperatures, and the power change value of the equipment at the two temperature points is used as the temperature coefficient. By assuming that the gain change between the lowest and highest temperatures and between each frequency is linear, the gain change with temperature is expressed.
[0071] Compared with the prior art in which the gain change at the highest temperature and the lowest temperature is detected to determine the change relationship of the entire link at different ambient temperatures, in the embodiment of the present application, the gain change value of each test frequency point at each preset ambient temperature is determined by testing, which can more accurately describe the change law of gain with temperature.
[0072] In some possible embodiments, the first linear relationship between the temperature and the gain change value determined by testing different test frequency points in each frequency interval is as follows: Figure 3 As shown, it is determined as follows:
[0073] Step 301, selecting a reference temperature, and transmitting test signals of various test frequencies through the base station;
[0074] Step 302, for each test frequency point of the test signal, record the standard output power of the test signal at the reference temperature;
[0075] Step 303, adjusting the current ambient temperature to different preset ambient temperatures, and recording the output power of the test signal at each preset ambient temperature;
[0076] Step 304: Based on the standard output power and the output power at each preset ambient temperature, the gain change value at each test frequency point at each preset ambient temperature is calculated to obtain a first linear relationship.
[0077] In an embodiment of the present application, the operating frequency band of the base station is first divided into different frequency intervals, and different test frequencies are selected for each frequency interval to obtain a series of test frequencies. Test signals of each test frequency are transmitted through the base station. For the test signal of each test frequency, the current ambient temperature is adjusted, and the difference between the output power at different preset ambient temperatures and the standard output power at the reference temperature is calculated as the gain change value of the test frequency at different preset ambient temperatures, and stored in the memory of each base station device.
[0078] Through the testing in the research and development stage, each test frequency point will have a gain change value corresponding to each preset ambient temperature, as shown in Table 1 below.
[0079]
[0080]
[0081] In the above Table 1, the first column indicates the ambient temperature Tn of the base station equipment; the second column indicates the temperature value CalTemp[Tn] of the temperature sensor used for temperature compensation in the base station equipment; the third column indicates the change value F1_[Tn] of the output power at the test frequency 1 relative to the reference temperature CalTemp[T0], that is, the gain change value, and so on, the last column indicates the change value Fx_[Tn] of the output power at the test frequency x relative to the reference temperature CalTemp[T0]. For example, if the output power of the test frequency 1 changes by 2dB at CalTemp[T2] relative to the reference temperature, then F1_[T2] is recorded as 2dB.
[0082] In an embodiment of the present application, the current ambient temperature of the base station adopts the temperature value of the temperature sensor used for temperature compensation in the base station device in Table 1 above. The current ambient temperature is adjusted to different preset ambient temperatures by adjusting the ambient temperature of the base station device represented by the first column to adjust the temperature sensor in the base station device. The preset ambient temperature is also the temperature value of the temperature sensor in the preset base station device.
[0083] In the research and development stage, the embodiment of the present application only tests the gain change value of each test frequency point under different preset ambient temperatures. In actual application, there may be many ambient temperatures. Therefore, the embodiment of the present application uses the gain change value measured under different preset ambient temperatures for each test frequency point to fit the ambient temperature and the gain change value to obtain the first linear relationship between the ambient temperature and the gain change value. In actual calibration, the first linear relationship is used to determine the corresponding first gain change value based on the current ambient temperature.
[0084] The above-mentioned first linear relationship can be an interval linear fitting based on the gain change value under two adjacent preset ambient temperatures, one of which is the same as the current ambient temperature, or the two adjacent preset ambient temperatures are the two temperatures closest to the current ambient temperature.
[0085] In some possible embodiments, according to different ambient temperatures, a first gain change value corresponding to a target test frequency point in the target frequency interval at the ambient temperature is determined, and a first linear relationship for interval linear fitting based on gain change values at two adjacent preset ambient temperatures is determined, including the following three cases:
[0086] Case 1: If the ambient temperature is a preset ambient temperature, that is, one of two adjacent preset ambient temperatures is the same as the current ambient temperature, then based on the gain change value corresponding to the preset ambient temperature, a first gain change value corresponding to the ambient temperature is determined;
[0087] Case 2: If the ambient temperature is within two adjacent preset ambient temperature intervals, and the two adjacent preset ambient temperatures are the two temperatures closest to the current ambient temperature, then based on the gain change values corresponding to the two adjacent preset ambient temperatures, a linear interpolation method is used to determine the first gain change value corresponding to the target test frequency at the ambient temperature;
[0088] Case three: If the ambient temperature exceeds the boundary corresponding to the minimum preset ambient temperature and the maximum preset ambient temperature, the two adjacent preset ambient temperatures near the boundary are determined to be the two temperatures closest to the current ambient temperature. A linear extension line is fitted based on the gain change values corresponding to the two adjacent preset ambient temperatures near the boundary, and the first gain change value corresponding to the target test frequency at the ambient temperature is determined based on the fitted linear extension line.
[0089] Specifically, during actual calling, if the ambient temperature is between two adjacent preset ambient temperature intervals and linear difference compensation is used, taking the gain change value of the test frequency F1 stored in Table 1 at different preset ambient temperatures as an example, when the ambient temperature CalTemp[T] is between CalTemp[T1] and CalTemp[T2], CalTemp[T1], CalTemp[T2], F1_[T1], and F1_[T2] need to be used for linear difference compensation. At this time, the gain change value F1_[T] of the test frequency F1 at the ambient temperature CalTemp[T] is calculated using the following formula 1:
[0090]
[0091] Wherein, ΔT=CalTemp[T]-CalTemp[T1].
[0092] If the ambient temperature exceeds the boundary corresponding to the minimum preset ambient temperature and the maximum preset ambient temperature, compensation is performed by fitting the linear extension line based on the gain change values corresponding to the two adjacent preset ambient temperatures near the boundary. The gain change values of the test frequency F1 stored in Table 1 at different preset ambient temperatures are taken as an example, where:
[0093] When the ambient temperature CalTemp[T] read by the temperature sensor is higher than CalTemp[Tn], it is necessary to use the linear extension line of the curve fitted by CalTemp[Tn-1], CalTemp[Tn], F1_[Tn-1], and F1_[Tn] to continue compensation. At this time, the gain change value F1_[T] of the test frequency F1 at the ambient temperature CalTemp[T] is calculated using the following formula 2:
[0094]
[0095] Wherein, ΔT=CalTemp[T]-CalTemp[Tn-1].
[0096] When the ambient temperature CalTemp[T] read by the temperature sensor is lower than CalTemp[T1], it is necessary to use the curve fitted by CalTemp[T1], CalTemp[T2], F1_[T1], and F1_[T2] to continue compensation. At this time, the gain change value F1_[T] of the test frequency F1 at the ambient temperature CalTemp[T] is calculated using the following formula 3:
[0097]
[0098] Wherein, ΔT=CalTemp[T]-CalTemp[T1].
[0099] In the research and development stage, it is also necessary to determine the second linear relationship between different preset power back-off levels and gain change values, such as Figure 4 As shown, including:
[0100] Step 401, transmitting a test signal through the base station and setting a gain value of a link attenuator, and when the output power is the rated power, recording the gain value of the link attenuator as a standard gain value;
[0101] Step 402, changing the power backoff degree by modifying the link attenuator gain value, and when the output power reaches each of the preset power backoff degrees, recording the link attenuator gain value at this time;
[0102] Step 403: Based on the standard gain value and the gain values at different preset power backoff levels, a gain change value of the base station at different preset power backoff levels is calculated to obtain a second linear relationship.
[0103] In micro base stations and pico base stations, there are power backoff applications. For example, the rated output power of a pico base station is 24dBm. In actual network deployment, 17dBm may be commonly used as the output power. The practice in the prior art is to directly attenuate the attenuator in the link by 24-17=7dB to output 17dBm. This is based on the fact that the AM-AM curve of the transmission link is relatively smooth, and the effect of power backoff on gain change is ignored. However, when some base stations perform power backoff, their AM-AM curves are not smooth, and the gain changes with different degrees of power backoff. The effect of power backoff on gain change cannot be ignored. Therefore, the embodiment of the present application also tests the effect of the degree of power backoff on gain before the RF equipment leaves the factory.
[0104] In the embodiment of the present application, the gain change value under different preset power backoff levels is determined by scanning the output power of each test frequency point at a certain temperature. The AM-AM waveform of a base station device under high and low temperatures will not change much. Therefore, it is only necessary to test and record the gain change value under different preset power backoff levels at the same ambient temperature, as shown in Table 2 below.
[0105]
[0106] In the above Table 2, the first column of parameters indicates the degree of power backoff, that is, the power backoff is ndB; the second column indicates the gain difference between the frequency point F1 when the power is backed off by ndB and the rated power, that is, the change value corresponding to the gain value when the power backoff degree is zero, and so on. The fourth column indicates the gain difference between the frequency point Fx when the power is backed off by ndB and the rated power.
[0107] In some possible embodiments, most of the outdoor scenes work at rated power, and even if the power is backed off, it is within 20dB of the rated power, so n is usually within 20. Of course, from a technical point of view, n can be greater than 20, and the embodiments of the present application do not make specific limitations.
[0108] In the research and development stage, the embodiment of the present application only tests the gain change value of each test frequency point under different preset power backoff degrees. In actual application, there may be multiple situations for the power backoff degree. Therefore, the embodiment of the present application uses the gain change value measured under different preset power backoff degrees for each test frequency point to fit the power backoff degree and the gain change value to obtain the second linear relationship between the power backoff degree and the gain change value. In actual calibration, the second linear relationship is used to determine the corresponding second gain change value based on the current power backoff degree.
[0109] The above-mentioned second linear relationship can be an interval linear fitting based on the gain change value under two adjacent preset power backoff levels, one of the two adjacent preset power backoff levels is the same as the current power backoff level, or the two adjacent preset power backoff levels are the two levels closest to the current power backoff level.
[0110] In some possible embodiments, according to different power backoff levels, a second gain change value corresponding to the target test frequency at the power backoff level is determined, and a second linear relationship is determined by performing interval linear fitting on the gain change values at two adjacent preset power backoff levels, including the following two cases:
[0111] Case 1: If the power backoff degree is a preset power backoff degree, that is, one of two adjacent preset power backoff degrees is the same as the current power backoff degree, then based on the gain change value corresponding to the preset power backoff degree, determine the second gain change value corresponding to the power backoff degree;
[0112] Case 2: If the current power backoff level is within the range of two adjacent preset power backoff levels, that is, the two adjacent preset power backoff levels are the two levels closest to the current power backoff level, then based on the gain change values corresponding to the two preset power backoff levels, a linear interpolation method is used to determine the second gain change value corresponding to the current power backoff level.
[0113] Specifically, during actual calling, when the power backoff degree is between two adjacent preset power backoff degree intervals and a linear difference method is used for compensation, taking the gain change value corresponding to the preset power backoff degree of the test frequency point F1 stored in Table 2 as an example, when the power backoff degree Delta_[m] is between Delta_[1] and Delta_[2], Delta_[1], Delta_[2], F1_Delta_1, and F1_Delta_2 are required to be compensated using a linear difference method. At this time, the gain of the test frequency point F1 when the power is backed off mdB and the gain change value F1_Delta_m at the rated power are calculated using the following formula 4:
[0114]
[0115] Among them, ΔDelta=Delta_[m]-Delta_[1].
[0116] In some possible embodiments, different preset power backoff degrees and gain change values obtained from the test can be fitted into a linear curve, and different power backoff degrees and gain change values can be determined by the fitted linear curve, wherein the specific calculation method of the fitting curve is not specifically limited in this application.
[0117] After determining the first linear relationship between temperature and gain change value and the second linear relationship between different preset power fallback levels and gain change value in the research and development stage, each base station device needs to be calibrated before the base station leaves the factory to determine the standard gain value corresponding to the reference temperature of each base station device at each test frequency point, such as Figure 5 As shown, it is determined as follows:
[0118] Step 501, transmitting calibration signals of various test frequency points at ambient temperature by the base station;
[0119] Step 502, adjusting the gain value of the link attenuator according to the calibration signal of each test frequency point, and recording the reference gain value of the link attenuator under the ambient temperature when the output power is the rated power;
[0120] Step 503, determining a calibration gain value at which the output power of the base station is the rated power at the ambient temperature based on the link attenuator input level at the ambient temperature and the reference gain value;
[0121] Step 504: Calculate the standard gain value of the calibration signal at each test frequency point at the reference temperature based on the ambient temperature, the calibration gain value and the first linear relationship.
[0122] In the embodiment of the present application, the calibration gain value of the output power of each test frequency point of the base station at the ambient temperature is G 0 (F i ,T) indicates that G 0 Indicates the calibration gain value, F i represents the test frequency Fi, and T represents the current ambient temperature T. The calibration gain value G 0 (F i ,T) is determined based on the rated power at the ambient temperature, the link attenuator input level and the reference gain value of the link attenuator when the output power is the rated power, and is specifically calculated using the following formula 5:
[0123] G 0 (F i ,T)=P(F i ,T) out_TX -P out_DAC -G ATT_TX Formula 5
[0124] Among them, P(F i ,T) out_TX is the rated power of the base station at the test frequency Fi at the ambient temperature T, in dBm;
[0125] P out_DAC is the input level of the link attenuator, which is the DAC output level, in dBFS;
[0126] G ATT_TX It is the link attenuator gain value, which is determined by directly reading the attenuator gain value at this time. It is usually a negative value (for example, if the attenuator attenuates by 15dB, then it is -15dB here), and the unit is dB.
[0127] It should be noted that although P out_DAC The value of P will vary according to different test frequencies and ambient temperatures, but in the embodiment of the present application, out_DACThe change in G(F i ,T), so P can be ignored in actual operation. out_DAC The changes at different test frequencies and different ambient temperatures are considered to be out_DAC They are all fixed levels, such as -18dBFs.
[0128] When actually calibrating the radio frequency channel of each base station, the standard gain value of the calibration signal of each test frequency point at the reference temperature is calculated based on the ambient temperature, the calibration gain value and the first linear relationship, such as Figure 6 As shown, at least one of the following steps is included:
[0129] Step 601, based on the ambient temperature of each test frequency point and the first linear relationship, determining the gain change value of the calibration signal of each test frequency point under the ambient temperature;
[0130] Step 602: Calculate the standard gain value of the calibration signal at each test frequency point at a reference temperature based on the gain change value and the calibration gain value.
[0131] In practical application, when determining the calibration gain value, the ambient temperature of the base station may exist in various situations. According to different ambient temperatures, the gain change value of the calibration signal of each test frequency point at the ambient temperature is determined, including the following three situations:
[0132] Case 1: If the ambient temperature is the preset ambient temperature, then based on the gain change value corresponding to the preset ambient temperature, the gain change value corresponding to the ambient temperature is determined;
[0133] Case 2: If the ambient temperature is within two adjacent preset ambient temperature intervals, then based on the gain change values corresponding to the two adjacent preset ambient temperatures, a linear interpolation method is used to determine the gain change values corresponding to the calibration signals of each test frequency point at the ambient temperature;
[0134] Case three: If the ambient temperature exceeds the boundary corresponding to the minimum preset ambient temperature and the maximum preset ambient temperature, a linear extension line is fitted based on the gain change values corresponding to the two adjacent preset ambient temperatures near the boundary, and the gain change value corresponding to the calibration signal of each test frequency point at the ambient temperature is determined based on the fitted linear extension line.
[0135] Based on the above calibration gain value G 0 (F i , T) and the first gain change value Fi_[T] corresponding to each test frequency point determined in the research and development stage at the ambient temperature, the standard gain value of the calibration signal of each test frequency point at the reference temperature, with G 0(F i ,T 0 ) is expressed as follows, calculated by the following formula 6:
[0136] G 0 (F i ,T 0 )=G(F i ,T)-Fi_[T] Formula 6
[0137] In the above formula, G 0 (F i ,T 0 ) represents the standard gain value, F i Indicates the test frequency Fi, T 0 Indicates that the current ambient temperature is the reference temperature T0.
[0138] After determining the standard gain value of each test frequency point of each base station device at the reference temperature through the above calculation process, the standard gain value of each test frequency point of each base station device at the reference temperature is stored in the memory of the corresponding base station device, so as to provide data support for the subsequent calibration of the base station in actual application.
[0139] by Figure 7 Taking the transmission channel shown in the figure as an example, a single-tone signal is selected as the calibration signal. When calibrating, the output interface of the device is connected to an instrument such as a spectrum analyzer or a power meter. The digital IQ processor (or a DAC device capable of transmitting a single tone) is controlled by the base station device to transmit a single-tone signal at each test frequency point with a DAC output level of -18dBFS. By adjusting the gain value G of the link attenuator ATT_TX , so that the output power P(F i ,T) out_TX To achieve the rated output power of each test frequency point at the current ambient temperature, the calibration gain value G of each test frequency point at the ambient temperature is obtained by the above formula for calculating the calibration gain value. 0 (F i ,T), and then obtain the current ambient temperature T by reading the temperature sensor in the base station equipment, and query the first gain change value Fi_[T] corresponding to each test frequency point determined in the research and development stage under the ambient temperature T in the memory of the base station, and obtain G by the above formula for calculating the standard gain value 0 (F i ,T 0 ), and finally obtain a standard gain value of each test frequency point of this transmission channel at the reference temperature T0, and store the standard gain value of each test frequency point in the memory of the base station device, as shown in the following Table 3.
[0140] Test frequency F1 Test frequency F1 Test frequency... Test frequency Fx <![CDATA[G 0 (F 1 ,T 0 )]]> <![CDATA[G 0 (F 2 ,T 0 )]]> …… <![CDATA[G 0 (F x ,T 0 )]]>
[0141] In some possible embodiments, the calibration signal uses a single-tone signal, and other modulation signals or simple signals may be selected according to actual conditions, such as GSM, FM and other modulation signals, GSM, CDMA signals, etc. In the embodiments of the present application, only one possible exemplary implementation is given, and no specific limitation is made to the type of the calibration signal.
[0142] In the embodiment of the present application, the amplitude-frequency waveform corresponding to the RF channel can also be obtained through a single frequency sweep. In actual production, the interval of the test frequency points can be set to a narrower threshold range, or the interval of the test frequency points can be set to a different threshold range according to the actual different operating frequency intervals of the base station, and certain equipment abnormality troubleshooting information can be provided to the production department. This avoids the problem that when performing broadband calibration, the existing technology uses broadband signals for direct calibration, and cannot obtain the amplitude-frequency waveform corresponding to the entire RF channel, resulting in a relatively wide threshold value set during production.
[0143] At this time, each base station device stores the first linear relationship between the corresponding temperature and the gain change value, the second linear relationship between the different preset power fallback levels and the gain change value, and the standard gain value G of each test frequency point before leaving the factory. 0 (F i ,T 0 ). When the device is actually used, the processor of the base station needs to obtain the type of the signal to be calibrated, the target frequency range and the power back-off degree of the RF channel, and calculate the attenuator gain value by calling the data in the memory.
[0144] In some possible embodiments, the type of the signal to be calibrated may be a single-mode single-carrier LTE 20MHz signal, a single-mode multi-carrier signal 2*LTE 20MHz signal, a single-mode 5G NR 100MHz signal, or a multi-mode 1 5G NR 100MHz plus 3 4G LTE 20MHz signals, etc.; the power backoff degree may be the rated power or the rated power backoff 7dB; and the target frequency range is the operating frequency range of these calibration signals.
[0145] After receiving the information of the signal to be calibrated, the processor calculates the attenuator gain value by calling the data in the memory, such as Figure 8 As shown, including:
[0146] Step 801, obtaining the current ambient temperature T by reading the temperature of the temperature sensor;
[0147] Step 802, calling a first linear relationship between temperature and gain change value pre-stored in a memory, and determining a first gain change value Fi_[T] corresponding to a target test frequency point Fi in the target frequency interval at the ambient temperature T;
[0148] Step 803, calling the second linear relationship between different preset power backoff levels and gain change values pre-stored in the memory, and determining the second gain change value Fi_Delta_m corresponding to the current power backoff level m;
[0149] Step 804: based on the standard gain value G of each test frequency point 0 (F i ,T 0 ), calculate the attenuator gain value G(F i ,T), calculated using Formula 7:
[0150] G(F i ,T)=G 0 (F i ,T 0 )+Fi_[T]+Fi_Delta_m Formula 7
[0151] Since the base station device transmits a carrier signal, and in the embodiment of the present application, different test frequencies are selected in the base station working frequency band to reduce the calibration time of the base station device before leaving the factory, it is necessary to determine the gain value G(F) of all target test frequencies that can be covered by the carrier. i ,T), and then perform broadband calculation on the gain values in all target frequency intervals to obtain the interval average gain value G avg , but the target frequency interval of the signal is divided into continuous carrier and discontinuous carrier. avg The calculation of is divided into the following two cases:
[0152] Case 1: All carriers are continuous, such as Fig. 9 As shown, the formula 8 is used to calculate:
[0153]
[0154] Among them, F x Indicates the minimum test frequency Fx within the target frequency range, F y represents the test frequency point Fy with the maximum frequency in the target frequency interval, and (yx) represents the average bandwidth of the target frequency interval.
[0155] Case 2: The carrier is discontinuous. For example, there are two discontinuous frequency bands in the target frequency range. Fig.10 As shown, the formula 9 is used to calculate:
[0156]
[0157] Among them, F x1Indicates the minimum test frequency Fx1 in one of the frequency bands of the target frequency range, F y1 Indicates the target frequency interval and F x1 The maximum test frequency in the corresponding frequency band is Fy1, F x2 Indicates the minimum test frequency Fx2 in another frequency band of the target frequency interval, F y2 Indicates the target frequency interval and F x2 The corresponding frequency band has the largest test frequency Fy2.
[0158] (y1-x1+y2-x2) represents the average bandwidth of the target frequency interval.
[0159] The average gain value G of the interval of the signal to be calibrated is obtained. avg Then, based on the rated power of the base station and the input level of the link attenuator, the link attenuator gain value G of the signal to be calibrated is calculated using the following formula 10: ATT_TX :
[0160] G ATT_TX =P out_TX -P out_DAC -G avg Formula 10
[0161] Among them, the link attenuator gain value G ATT_TX Usually negative, P out_TX is the rated power of the base station equipment, P out_DAC is the input level of the link attenuator, which is the DAC output level in dBFS.
[0162] Finally, the calculated G ATT_TX By setting it in the link attenuator, the base station can transmit at the ideal rated power.
[0163] In some possible embodiments, during the actual operation of the base station, as the traffic volume changes and the temperature of the device's surrounding environment changes, the temperature of the temperature sensor in the base station will also change. At this time, it is necessary to perform temperature compensation on the base station device, such as Fig.11 As shown, the following steps are included:
[0164] Step 1101, obtaining the temperature value of the temperature sensor in the current base station;
[0165] Step 1102, when it is determined that the temperature value is greater than a preset temperature change, based on a first linear relationship between temperature and gain change value pre-stored in a memory, determine a first gain change value corresponding to a target test frequency point in a target frequency interval of the signal at the ambient temperature;
[0166] Step 1103, determining a second gain change value corresponding to the current power backoff degree based on a second linear relationship between different preset power backoff degrees and gain change values pre-stored in the memory;
[0167] Step 1104, determining a gain value corresponding to each target test frequency point based on a predetermined standard gain value corresponding to a reference temperature at each test frequency point, and the first gain change value and the second gain change value;
[0168] Step 1105 , based on the gain values corresponding to the target test frequency points and according to the target frequency interval of the signal, the interval average gain value of the signal to be calibrated is calculated, and the link attenuator gain value of the signal to be calibrated is determined.
[0169] The base station radio frequency channel calibration method proposed in the embodiment of the present application greatly reduces the time of the production calibration link by performing a sweep frequency full power calibration, and can also flexibly handle the base station in various modes and various carriers. In actual use, according to actual needs, the ambient temperature of the current base station is obtained, and based on the stored parameters affecting the gain and their relationship, the value of the current link attenuator is calculated, and finally the appropriate base station power is obtained.
[0170] Based on the same inventive concept, an embodiment of the present application also proposes a base station radio frequency channel calibration device, comprising at least one processor; and a memory communicatively connected to the at least one processor; wherein the memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor so that the at least one processor can execute a base station radio frequency channel calibration method as described above in an embodiment of the present application.
[0171] Refer to the following Fig.12 A base station radio frequency channel calibration device 120 according to this embodiment of the present application is described. Fig.12 The device 120 shown is only an example and should not bring any limitation to the functions and scope of use of the embodiments of the present application.
[0172] like Fig.12 As shown, a base station radio frequency channel calibration device 120 is presented in the form of a general electronic device. The components of a base station radio frequency channel calibration device 120 may include but are not limited to: the at least one processor 121, the at least one memory 122, and a bus 123 connecting different system components (including the memory 122 and the processor 121).
[0173] Bus 123 represents one or more of several types of bus structures, including a memory bus or memory controller, a peripheral bus, a processor, or a local bus using any of a variety of bus architectures.
[0174] The memory 122 may include a readable medium in the form of a volatile memory, such as a random access memory (RAM) 1221 and / or a cache memory 1222 , and may further include a read-only memory (ROM) 1223 .
[0175] Memory 122 may also include a program / utility 1225 having a set (at least one) of program modules 1224, such program modules 1224 including but not limited to: an operating system, one or more application programs, other program modules, and program data, each of which or some combination may include a network environment.
[0176] A base station radio frequency channel calibration device 120 may also communicate with one or more external devices 124 (e.g., keyboards, pointing devices, etc.), may also communicate with one or more devices that enable a user to interact with a base station radio frequency channel calibration device 120, and / or communicate with any device that enables the base station radio frequency channel calibration device 120 to communicate with one or more other electronic devices (e.g., routers, modems, etc.). Such communication may be performed via an input / output (I / O) interface 125. In addition, a base station radio frequency channel calibration device 120 may also communicate with one or more networks (e.g., local area networks (LANs), wide area networks (WANs), and / or public networks, such as the Internet) via a network adapter 126. As shown, the network adapter 126 communicates with other modules for a base station radio frequency channel calibration device 120 via a bus 123. It should be understood that, although not shown in the figure, other hardware and / or software modules may be used in conjunction with a base station radio frequency channel calibration device 120, including but not limited to: microcode, device drivers, redundant processors, external disk drive arrays, RAID systems, tape drives, and data backup storage systems.
[0177] In some possible implementations, the embodiments of the present application also propose a computer-readable storage medium, wherein the computer-readable storage medium stores computer-executable instructions, and the computer-executable instructions are used to enable the computer to execute the base station radio frequency channel calibration method as described in any of the above-mentioned implementation examples.
[0178] The program product may employ any combination of one or more readable media. The readable medium may be a readable signal medium or a readable storage medium. The readable storage medium may be, for example, but not limited to, an electrical, magnetic, optical, electromagnetic, infrared, or semiconductor system, device or device, or any combination thereof. More specific examples of readable storage media (a non-exhaustive list) include: an electrical connection with one or more wires, a portable disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the above.
[0179] Obviously, those skilled in the art can make various changes and modifications to the present application without departing from the spirit and scope of the present application. Thus, if these modifications and variations of the present application fall within the scope of the claims of the present application and their equivalents, the present application is also intended to include these modifications and variations.
Claims
1. A base station radio frequency channel calibration method, characterized in that: include: Obtain the current ambient temperature, the target frequency range of the signal to be calibrated, and the power fallback degree; According to pre-dividing the working frequency band of the base station into different frequency intervals, a first linear relationship between temperature and gain change value is determined by testing different test frequency points in each frequency interval, and determining a first gain change value corresponding to a target test frequency point in the target frequency interval at the ambient temperature, wherein the first gain change value is a change value corresponding to a gain value at a preset reference temperature; Determine, based on a predetermined second linear relationship between different preset power backoff levels and gain change values, a second gain change value corresponding to the current power backoff level, where the second gain change value is a change value corresponding to the gain value when the power backoff level is zero; Determine the gain value corresponding to each target test frequency point based on the predetermined standard gain value corresponding to the reference temperature at each test frequency point, and the first gain change value and the second gain change value; Based on the gain values corresponding to the target test frequency points, according to the target frequency interval of the signal to be calibrated, the interval average gain value of the signal to be calibrated is calculated, and the link attenuator gain value of the signal to be calibrated is determined.
2. The method according to claim 1, characterized in that The first linear relationship between the temperature and the gain change value determined by testing different test frequency points in each frequency interval is determined in the following manner: Select a reference temperature and transmit test signals at various test frequencies through the base station; For each test frequency point of the test signal, record the standard output power of the test signal at the reference temperature; Adjust the current ambient temperature to different preset ambient temperatures, and record the output power of the test signal at each preset ambient temperature; Based on the standard output power and the output power at each preset ambient temperature, the gain change value of each test frequency point at each preset ambient temperature is calculated to obtain a first linear relationship.
3. The method according to claim 2, characterized in that Determining a first gain change value corresponding to a target test frequency point within the target frequency interval at the ambient temperature includes: If the ambient temperature is a preset ambient temperature, determining a first gain change value corresponding to the ambient temperature based on the gain change value corresponding to the preset ambient temperature; If the ambient temperature is within two adjacent preset ambient temperature intervals, a linear interpolation method is used to determine a first gain change value corresponding to the target test frequency at the ambient temperature based on the gain change values corresponding to the two adjacent preset ambient temperatures; If the ambient temperature exceeds the boundary corresponding to the minimum preset ambient temperature and the maximum preset ambient temperature, a linear extension line is fitted based on the gain change values corresponding to the two adjacent preset ambient temperatures near the boundary, and the first gain change value corresponding to the target test frequency at the ambient temperature is determined based on the fitted linear extension line.
4. The method according to claim 1, characterized in that: The second linear relationship between the predetermined different preset power backoff degrees and the gain change value is determined in the following manner: Transmitting a test signal through the base station and setting a gain value of a link attenuator, and when the output power is the rated power, recording the gain value of the link attenuator as a standard gain value; The power backoff degree is changed by modifying the link attenuator gain value, and when the output power reaches each of the preset power backoff degrees, the gain value of the link attenuator at this time is recorded; Based on the standard gain value and the gain values at different preset power backoff levels, the gain change value of the base station at different preset power backoff levels is calculated to obtain a second linear relationship.
5. The method according to claim 4, characterized in that The determining a second gain change value corresponding to the current power backoff degree includes: If it is determined that the current power backoff degree is within two adjacent preset power backoff degree intervals, a second gain change value corresponding to the current power backoff degree is determined using a linear interpolation method based on the gain change values corresponding to the preset power backoff degrees.
6. The method according to any one of claims 1 to 5, characterized in that: The standard gain value corresponding to the reference temperature at each predetermined test frequency point is determined in the following manner: Transmitting calibration signals of various test frequency points at ambient temperature by the base station; According to the calibration signal of each test frequency point, the gain value of the link attenuator is adjusted, and when the output power is the rated power, the reference gain value of the link attenuator under the ambient temperature is recorded; Determine, based on the link attenuator input level at the ambient temperature and the reference gain value, a calibration gain value at which the output power of the base station is the rated power at the ambient temperature; Based on the ambient temperature, the calibration gain value and the first linear relationship, a standard gain value of the calibration signal of each test frequency point at the reference temperature is calculated.
7. The method according to claim 6, characterized in that The step of calculating the standard gain value of the calibration signal at each test frequency point at a reference temperature based on the ambient temperature, the calibration gain value and the first linear relationship comprises at least one of the following steps: Based on the ambient temperature of each test frequency point and the first linear relationship, determining a gain change value of the calibration signal of each test frequency point at the ambient temperature; Based on the gain change value and the calibration gain value, the standard gain value of the calibration signal at each test frequency point at a reference temperature is calculated.
8. The method according to claim 7, characterized in that The step of determining the gain change value of the calibration signal at each test frequency point at the ambient temperature based on the ambient temperature and the first linear relationship comprises any one of the following steps: If the ambient temperature is a preset ambient temperature, determining the gain change value corresponding to the ambient temperature based on the gain change value corresponding to the preset ambient temperature; If the ambient temperature is within two adjacent preset ambient temperature intervals, a linear interpolation method is used to determine the gain change value corresponding to the calibration signal of each test frequency point at the ambient temperature based on the gain change values corresponding to the two adjacent preset ambient temperatures; If the ambient temperature exceeds the boundary corresponding to the minimum preset ambient temperature and the maximum preset ambient temperature, a linear extension line is fitted based on the gain change values corresponding to the two adjacent preset ambient temperatures near the boundary, and the gain change value corresponding to the calibration signal of each test frequency point at the ambient temperature is determined based on the fitted linear extension line.
9. The method according to claim 1, characterized in that: The determining of the link attenuator gain value of the signal to be calibrated includes: The rated power of the base station and the input level of the link attenuator are obtained, and the link attenuator gain value of the signal to be calibrated is calculated based on the interval average gain value of the signal to be calibrated.
10. A base station radio frequency channel calibration device, characterized in that: It includes at least one processor; and a memory that is communicatively connected to the at least one processor; wherein the memory stores instructions that can be executed by the at least one processor, and the instructions are executed by the at least one processor so that the at least one processor can execute a base station radio frequency channel calibration method as described in any one of claims 1 to 9.