Tester evaluation method and device, electronic equipment and storage medium

Abstract

The invention discloses a tester evaluation method and device, electronic equipment and a storage medium, and relates to the field of financial science and technology, and the method comprises the steps: obtaining an assessment index score of each tester; wherein the assessment index score comprises a test progress score, a test quality score and a test workload score; according to the assessment index score of each tester, acquiring a total assessment score of each tester; and obtaining an evaluation result and a sorting result of each tester through a tester evaluation model according to the assessment index score and the total assessment score of each tester. According to the technical scheme provided by the embodiment of the invention, multi-dimensional assessment index score acquisition is realized, comprehensive quantitative index processing is performed on each test task of a tester, the accuracy of an evaluation result of the tester is improved, the fairness of a ranking result is ensured, and the existence of an evaluation error under a single data dimension is avoided.

Description

Technical Field

[0001] The present invention relates to the field of financial technology, and in particular to a tester evaluation method, device, electronic device and storage medium. Background Art

[0002] With the continuous development of software technology, the testing needs in the software project development process are increasing. The accurate evaluation of each tester has become an important issue in the field of software testing.

[0003] In the prior art, the evaluation of testers is usually carried out by setting a few simple quantitative statistical indicators, such as the number of bottlenecks and serious problems, the number of risks and the number of production problems, etc., and performing qualitative evaluation on the above quantitative indicators as the evaluation result of each tester.

[0004] However, the above evaluation method only counts the various test tasks of testers from a single quantitative dimension, lacks comprehensive quantitative evaluation indicators, and is unable to make an accurate evaluation of the actual test work of testers, resulting in large errors in the evaluation results. Summary of the invention

[0005] The present invention provides a tester evaluation method, device, electronic equipment and storage medium to solve the problem of large errors in tester evaluation results.

[0006] According to one aspect of the present invention, there is provided a tester evaluation method, comprising:

[0007] Obtaining the assessment index scores of each tester; wherein the assessment index scores include test progress scores, test quality scores, and test workload scores;

[0008] According to the assessment index scores of the testers, the total assessment scores of the testers are obtained;

[0009] According to the assessment indicator score and the total assessment score of each tester, the evaluation result and ranking result of each tester are obtained through the tester evaluation model.

[0010] The test progress score includes a personal timeliness score; obtaining the assessment indicator score of each tester includes: obtaining the R&D timeliness score based on the average time interval of the tester's handling of R&D issues, and obtaining the adaptability timeliness score based on the average time interval of the tester's handling of adaptability issues; obtaining the tester's personal timeliness score based on the R&D timeliness score, the proportion of the number of R&D issues, the adaptability timeliness score and the proportion of adaptability issues.

[0011] The test progress score includes a supervision timeliness score and a collaborative timeliness score; the method of obtaining the assessment index score of each tester includes: obtaining a supervision timeliness score based on the overdue workload of the tester's supervision object and the total amount of work of the supervision object; wherein the overdue workload of the supervision object and the number of overdue times of the current test task are nonlinearly correlated; obtaining a collaborative timeliness score based on the overdue workload of the collaborative group to which the tester belongs and the total amount of work of the collaborative group; wherein the overdue workload of the collaborative group and the number of overdue times of the current test task are nonlinearly correlated.

[0012] The test quality score includes an adaptability problem defect density score and an R&D problem detection rate score; the step of obtaining the assessment indicator score for each tester includes: obtaining an adaptability problem defect density score based on the number of adaptability problems re-detected in software projects delivered by the tester and the total amount of work of the tester; obtaining an R&D problem detection rate score based on the number of R&D problems before delivery in software projects delivered by the tester and the total number of problems before and after delivery in software projects delivered by the tester.

[0013] After obtaining the total assessment score of each tester according to the assessment indicator score of each tester, it also includes: allocating a matching target tester to the target test task through a demand allocation model according to the assessment indicator score and the total assessment score of each tester and the demand label of the target test task.

[0014] After obtaining the evaluation results and ranking results of each tester through the tester evaluation model according to the assessment indicator scores and total assessment scores of each tester, it also includes: allocating a matching target tester to the target test task through the demand allocation model according to the assessment indicator scores, evaluation results and ranking results of each tester and the demand label of the target test task.

[0015] According to another aspect of the present invention, there is provided a tester evaluation device, comprising:

[0016] The indicator score acquisition module is used to obtain the assessment indicator score of each tester; wherein the assessment indicator score includes the test progress score, the test quality score and the test workload score;

[0017] The assessment total score acquisition module is used to obtain the assessment total score of each tester according to the assessment indicator score of each tester;

[0018] The evaluation result acquisition module is used to obtain the evaluation results and ranking results of each tester through the tester evaluation model according to the evaluation indicator score and total evaluation score of each tester.

[0019] According to another aspect of the present invention, an electronic device is provided, the electronic device comprising:

[0020] at least one processor; and

[0021] a memory communicatively connected to the at least one processor; wherein,

[0022] The memory stores a computer program executable by the at least one processor, and the computer program is executed by the at least one processor so that the at least one processor can execute the tester evaluation method described in any embodiment of the present invention.

[0023] According to another aspect of the present invention, a computer-readable storage medium is provided, wherein the computer-readable storage medium stores computer instructions, and the computer instructions are used to enable a processor to implement the tester evaluation method described in any embodiment of the present invention when executed.

[0024] According to another aspect of the present invention, a computer program product is provided, comprising a computer program, wherein when the computer program is executed by a processor, the tester evaluation method according to any embodiment of the present invention is implemented.

[0025] The technical solution of the embodiment of the present invention obtains the test progress score, test quality score and test workload score of each tester; obtains the total assessment score of each tester based on the assessment indicator score of each tester; obtains the evaluation result and ranking result of each tester through the tester evaluation model based on the assessment indicator score and the total assessment score of each tester; thereby, multi-dimensional assessment indicator score acquisition is realized, and comprehensive quantitative indicator processing is performed on various test tasks of the testers, thereby improving the accuracy of the testers' evaluation results, ensuring the fairness of the ranking results, and avoiding the existence of evaluation errors under a single data dimension.

[0026] It should be understood that the contents described in this section are not intended to identify the key or important features of the embodiments of the present invention, nor are they intended to limit the scope of the present invention. Other features of the present invention will become easily understood through the following description. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0028] Figure 1 is a flow chart of a tester evaluation method provided according to Embodiment 1 of the present invention;

[0029] Figure 2 is a flow chart of another tester evaluation method provided according to Embodiment 2 of the present invention;

[0030] Figure 3 is a flow chart of another tester evaluation method provided according to Embodiment 3 of the present invention;

[0031] Figure 4 is a flow chart of another tester evaluation method provided according to Embodiment 4 of the present invention;

[0032] Figure 5 is a schematic diagram of the structure of a tester evaluation device provided according to Embodiment 5 of the present invention;

[0033] Figure 6 It is a schematic diagram of the structure of an electronic device for implementing the tester evaluation method according to an embodiment of the present invention. DETAILED DESCRIPTION

[0034] In order to enable those skilled in the art to better understand the scheme of the present invention, the technical scheme in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work should fall within the scope of protection of the present invention.

[0035] It should be noted that the terms "first", "second", etc. in the specification and claims of the present invention and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the data used in this way can be interchanged where appropriate, so that the embodiments of the present invention described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions, for example, a process, method, system, product or device that includes a series of steps or units is not necessarily limited to those steps or units that are clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.

[0036] Embodiment 1

[0037] Figure 1This is a flowchart of a tester evaluation method provided in the first embodiment of the present invention. This embodiment is applicable to the situation where the tester evaluation results are obtained by scoring multi-dimensional assessment indicators. The method can be executed by the tester evaluation device in any embodiment of the present invention. The tester evaluation device can be implemented in the form of hardware and / or software. The tester evaluation device can be configured in an electronic device such as a server. Figure 1 As shown, the method includes:

[0038] S101. Obtain the assessment index score of each tester; wherein the assessment index score includes a test progress score, a test quality score, and a test workload score.

[0039] A tester can refer to each member of one or more testing teams, that is, each person in the above testing teams is regarded as an independent tester; a tester can also refer to the leading member of each testing team (for example, a testing manager), that is, each testing team actually includes only one tester; in addition, a tester can also refer to a testing group, for example, each testing team is regarded as having one tester.

[0040] The test progress score is based on the timeliness of the tester's solution to the test problem as the evaluation basis, which reflects the tester's efficiency in solving the test problem. Obviously, the more timely the tester handles each test problem and the faster the test problem is solved, the higher the test progress score of the tester. The test progress score of the tester can be calculated based on the average time spent by the current tester on each test problem within the preset detection cycle. The shorter the average time, the higher the test progress score, and the longer the average time, the lower the test progress score.

[0041] The test quality score uses the test quality of the software project as the evaluation basis. It reflects the number of problems detected by the testers during the testing process of the software project, that is, the number of problems detected before the software project is delivered, and the number of problems detected by other means or by other personnel after the software project testing is completed and delivered, that is, the number of problems detected after the software project is delivered. Obviously, the more problems detected before the software project is delivered, the higher the test quality and the higher the test quality score. The more problems detected after the software project is delivered, the worse the test quality and the lower the test quality score. The test quality score can be calculated based on the number of problems detected by the current tester in the delivered software project within the preset detection cycle, and the number of problems not detected by the current tester.

[0042] The test workload score uses the test workload of the tester as the evaluation basis, which reflects the workload of the tester during the testing process of the software project; the measurement unit of the test workload can be set to "person / day"; the average workload of all testers can be used as the benchmark score (for example, 80 points), and the workload of each tester can be compared with the average workload. If the current tester's workload is greater than the average workload, the score will be increased on the basis of the benchmark score. The greater the difference between the two, the more points will be increased; if the current tester's workload is less than the average workload, the score will be reduced on the basis of the benchmark score. The greater the difference between the two, the more points will be reduced.

[0043] In addition, you can also pre-set a workload evaluation threshold, subtract the current tester's workload from the average workload, divide the subtraction result by the workload evaluation threshold, use the division result as the evaluation step, and then calculate the current tester's test workload score through the following equation:

[0044] C = C1 + C2 * D;

[0045] Among them, C is the test workload score; C1 is the benchmark score, C2 is the evaluation step, and D is the unit step score; taking the above technical solution as an example, if the current tester's workload is "40 people / day" and the average workload is "30 people / day", the subtraction result of the two is "10 people / day". Assuming that the workload evaluation threshold is "5 people / day", the evaluation step is 2; assuming that the unit step score is 5 points, based on the benchmark score of 80 points, the current tester's test workload score can be calculated to be 90 points.

[0046] S102: Obtain the total assessment score of each tester according to the assessment indicator score of each tester.

[0047] According to the importance of each assessment indicator, different weights are assigned to different assessment indicators in advance, and the score of each assessment indicator is multiplied by its corresponding weight, and then the results of each product operation are summed up. The sum result is the total assessment score of the current tester. Specifically, the total assessment score of the current tester can be calculated by the following equation:

[0048] D = A*E1+B*E2+C*E3;

[0049] Among them, D is the total assessment score, A, B, and C are the test progress score, test quality score, and test workload score respectively; E1, E2, and E3 are the test progress score weight, test quality score weight, and test workload score weight respectively.

[0050] In particular, if an assessment indicator also includes multiple sub-assessment indicators, the specific score of each assessment indicator can be calculated based on the above calculation method through the scores of each sub-assessment indicator and the weights of the sub-assessment indicator scores; in addition, the weights of the scores of each assessment indicator can be configured as dynamic values ​​based on the historical test records of all testers. For example, for a certain assessment indicator, the average assessment indicator score of all testers is low, and the weight of the assessment indicator is increased accordingly. That is, the weight of the current assessment indicator is positively correlated with the average assessment indicator score of the current assessment indicator.

[0051] S103. According to the assessment indicator score and the total assessment score of each tester, the evaluation result and ranking result of each tester are obtained through the tester evaluation model.

[0052] The tester evaluation model is a pre-built evaluation model based on a big model and machine learning (for example, artificial neural network) technology. It is trained according to pre-configured training samples so that it has the tester evaluation function; the scores of various assessment indicators of each tester and the total assessment score are input into the tester evaluation model, and the evaluation results of the tester are obtained through the model; the evaluation results may include the evaluation results of various evaluation indicators, as well as the strengths and weaknesses of the current tester, and improvement suggestions for the current tester.

[0053] In addition, the tester evaluation model effectively combines the scores of each tester's various assessment indicators and the total assessment score, and ranks them according to their comprehensive abilities and the ability shortcomings of each assessment indicator. Compared with the single-dimensional ranking based on the total assessment score, it pays more attention to the comprehensive testing ability of each tester, especially when the score of a certain assessment indicator is extremely low. Even if the total assessment score is high, it may still be a lower ranking due to the existence of test shortcomings, thus ensuring the fairness of the ranking results.

[0054] Optionally, in an embodiment of the present invention, after obtaining the total assessment score of each tester based on the assessment indicator score of each tester, it also includes: allocating a matching target tester to the target test task through a demand allocation model based on the assessment indicator score and the total assessment score of each tester and the requirement label of the target test task.

[0055] Specifically, when there are test tasks to be assigned (i.e., target test tasks), the assessment index scores and total assessment scores of each tester, as well as the requirement labels of the target test tasks, can be input into the requirement allocation model; wherein the requirement labels may include whether it is a key business requirement, whether it is a key technical requirement, high schedule requirements or general schedule requirements, high quality requirements or general quality requirements; and they can be pre-marked by project developers or project managers.

[0056] The demand allocation model is a classification model pre-built based on machine learning technology. It is trained according to pre-configured training samples, so that it has the function of allocating testers; for example, test tasks for key business needs and key technical transformation needs are given priority to testers with higher total assessment scores; test tasks with higher construction period requirements are given priority to testers with higher test progress scores; test tasks with higher quality requirements are given priority to testers with higher test quality scores; and other test tasks are given priority to testers with less current workload.

[0057] Therefore, by combining the demand allocation model with general allocation rules (for example, setting a maximum workload for each tester), the allocation management of testers is achieved, which not only improves the matching degree between testers and target test tasks, ensures the smooth execution of target test tasks, but also avoids high-load work for testers.

[0058] Optionally, in an embodiment of the present invention, after obtaining the evaluation results and ranking results of each tester through a tester evaluation model based on the assessment indicator scores and total assessment scores of each tester, it also includes: allocating a matching target tester to the target test task through a demand allocation model based on the assessment indicator scores, evaluation results and ranking results of each tester and the requirement label of the target test task.

[0059] Specifically, the above tester evaluation model and demand allocation model can also be combined, and the output result of the tester evaluation model can be used as the input parameter of the demand allocation model, thereby taking the tester's assessment index score, evaluation result and ranking result as input data and inputting them into the demand allocation model, thereby enhancing the diversity of the input data of the demand allocation model, providing more characteristic parameters for the demand allocation model, and improving the accuracy of the output result of the demand allocation model.

[0060] The technical solution of the embodiment of the present invention obtains the test progress score, test quality score and test workload score of each tester; obtains the total assessment score of each tester based on the assessment indicator score of each tester; obtains the evaluation result and ranking result of each tester through the tester evaluation model based on the assessment indicator score and the total assessment score of each tester; thereby, multi-dimensional assessment indicator score acquisition is realized, and comprehensive quantitative indicator processing is performed on various test tasks of the testers, thereby improving the accuracy of the testers' evaluation results, ensuring the fairness of the ranking results, and avoiding the existence of evaluation errors under a single data dimension.

[0061] Embodiment 2

[0062] Figure 2 This is a flow chart of a tester evaluation method provided by Embodiment 2 of the present invention. The relationship between this embodiment and the above embodiment is that the test progress score includes a personal timeliness score. Figure 2 As shown, the method includes:

[0063] S201. Obtain a research and development timeliness score based on the average time interval of the time spent by testers on handling research and development issues, and obtain an adaptability timeliness score based on the average time interval of the time spent by testers on handling adaptability issues.

[0064] The objects that testers deal with during the software testing process mainly include software R&D issues and adaptability issues; among them, R&D issues refer to various obstacles encountered in the software development process, such as functional testing, performance testing, security testing, and compatibility testing; adaptability issues refer to the ability of software to adapt to different environments and changes in requirements, such as code, data structure, input and output methods, and storage media, which change or adjust according to different environments, requirements, and internal and external compatibility.

[0065] Personal timeliness score, that is, the efficiency score of the tester in handling test problems. The timeliness score of each problem can be determined based on the time interval in which the problem is handled. The smaller the value of the time interval, the more timely the tester handles the problem, and the higher the timeliness score. Among them, different time intervals and corresponding score values ​​can be configured for research problems and adaptability problems respectively.

[0066] For example, if the current problem is handled within 24 hours, the timeliness score of the current problem is 100 points; if the current problem is handled within 24 to 36 hours, the timeliness score of the current problem is 80 points; if the current problem is handled within 36 to 48 hours, the timeliness score of the current problem is 60 points; if the current problem is handled within 48 to 72 hours, the timeliness score of the current problem is 40 points; if it is handled within 72 hours or more, the timeliness score of the current problem is 0 points.

[0067] S202. Obtain the tester's personal timeliness score based on the R&D timeliness score, the proportion of the number of R&D issues, the adaptability timeliness score, and the proportion of adaptability issues.

[0068] After obtaining the timeliness scores of all the problems of the current tester within the preset detection cycle, the timeliness scores of R&D problems and adaptability problems can be calculated separately; then, based on the sum of R&D problems and adaptability problems, the proportion of the number of R&D problems and the proportion of the number of adaptability problems can be calculated respectively; finally, the personal timeliness score of the current tester can be calculated by the following equation:

[0069] M1=L1N1+L2N2;

[0070] Among them, M1 is the personal timeliness score, L1 is the timeliness score of R&D problems, N1 is the proportion of the number of R&D problems, L2 is the timeliness score of adaptability problems, and N2 is the proportion of the number of adaptability problems. Therefore, by obtaining the time spent by the tester on R&D problems and adaptability problems, the personal timeliness score of the current tester is obtained, which reflects the tester's ability and efficiency in handling different types of test problems, ensuring the comprehensiveness and accuracy of the calculation results of the personal timeliness score.

[0071] Assume that tester A completed multiple testing tasks on the last day, and the number of tests and the test workload values ​​were both high, but his processing progress would actually affect the processing progress of upstream and downstream personnel in the software development project. Therefore, for tester A, his test workload score may still be a high value, but the test progress score is a low value, which accurately reflects the tester's test progress performance.

[0072] S203. Obtain the total assessment score of each tester according to the individual timeliness score, test quality score and test workload score of each tester.

[0073] S204: According to the assessment indicator score and the total assessment score of each tester, the evaluation result and ranking result of each tester are obtained through the tester evaluation model.

[0074] The technical solution of the embodiment of the present invention obtains the personal timeliness score of the current tester by obtaining the time consumed by the tester in processing R&D problems and adaptability problems, which reflects the tester's processing ability and efficiency for different types of test problems, thereby ensuring the comprehensiveness and accuracy of the calculation results of the personal timeliness score.

[0075] Embodiment 3

[0076] Figure 3 This is a flowchart of a tester evaluation method provided by Embodiment 3 of the present invention. The relationship between this embodiment and the above embodiments is that the test progress score includes the supervision timeliness score and the collaborative timeliness score. Figure 3 As shown, the method includes:

[0077] S301. Obtain a supervision timeliness score according to the overdue workload of the supervised object of the tester and the total workload of the supervised object; wherein the overdue workload of the supervised object and the number of overdue times of the current test task are nonlinearly correlated.

[0078] S302. Obtain a collaborative timeliness score based on the overdue workload of the collaborative group to which the tester belongs and the total workload of the collaborative group; wherein the overdue workload of the collaborative group and the number of overdue times of the current test task are nonlinearly correlated.

[0079] Specifically, for testers, in addition to completing part of the testing tasks by themselves, they often need to collaborate with other people to complete one or more testing tasks; in addition, testers sometimes need to supervise each other's testing progress, especially the leadership role in the testing team, who needs to supervise the testing progress of other members of the team; the supervision timeliness score, that is, the efficiency score of the tester's supervision object in handling test issues; the collaborative timeliness score, that is, the efficiency score of the collaborative group to which the tester belongs in handling test issues.

[0080] Each test task is pre-configured with a test progress benchmark value by the management personnel or developers. For example, the daily progress value to be completed is set for each test task in units of natural days. For each delay, that is, one day, the delayed workload is accumulated accordingly. In particular, the delayed workload is not linearly related to the number of delays of the current test task. The more delays there are, the greater the overall impact on the test task, and the more the calculated result of the delayed workload will increase. For example, the current test task is delayed once, and the delay weight is 1; if it is delayed twice, the delay weight rises to 1.2, and the actual delayed workload is calculated to be 2.4; if it is delayed three times, the delay weight rises to 1.3, and the actual delayed workload is calculated to be 3.9.

[0081] The ratio of delayed workload to total workload can be recorded as the lag rate. The larger the lag rate, the worse the test timeliness of the supervised personnel, and the lower the corresponding timeliness score; the smaller the lag rate, the better the test timeliness of the supervised personnel, and the higher the corresponding timeliness score; for example, when the lag rate is 0, the timeliness score can be 100 points; according to the actual value of the lag rate or the value range it is in, the corresponding timeliness score can be calculated.

[0082] Therefore, the average value is calculated based on the timeliness scores of each supervision object of the current tester, and this average value can be used as the supervision timeliness score of the current tester; the average value is calculated based on the timeliness scores of each collaborative group in which the current tester is located, and this average value can be used as the collaborative timeliness score of the current tester; the supervision timeliness score and the collaborative timeliness score are obtained based on this, which respectively reflect the supervision ability of the current tester and the overall collaboration ability of the team he is in, ensuring the comprehensiveness of the test progress scoring results, and more accurately reflecting the overall test progress of the tester under all related test tasks.

[0083] S303. Obtain the total assessment score of each tester based on the supervision timeliness score, coordination timeliness score, test quality score and test workload score of each tester.

[0084] S304: According to the assessment indicator score and the total assessment score of each tester, the assessment result and ranking result of each tester are obtained through the tester evaluation model.

[0085] The technical solution of the embodiment of the present invention ensures the comprehensiveness of the test progress scoring results by obtaining the supervision timeliness score and the collaboration timeliness score that reflect the current tester's supervision ability and the overall collaboration ability of the team, and more accurately reflects the overall test progress of the tester under all related test tasks.

[0086] Embodiment 4

[0087] Figure 4 This is a flowchart of a tester evaluation method provided by Embodiment 4 of the present invention. The relationship between this embodiment and the above embodiments is that the test quality score includes the adaptability problem defect density score and the R&D problem detection rate score. Figure 4 As shown, the method includes:

[0088] S401. Obtain an adaptability problem defect density score based on the number of adaptability problems re-detected in software projects delivered by the tester and the total amount of work of the tester.

[0089] S402. Obtain a R&D problem detection rate score based on the number of R&D problems before delivery in the software projects delivered by the tester and the total number of problems before and after delivery in the software projects delivered by the tester.

[0090] Specifically, as described in the above technical solution, the number of adaptability problems re-detected in the software project delivered by the tester refers to the number of adaptability problems detected by other means or other personnel after the software project is delivered. This value reflects the degree of defects in the delivered software project. The ratio of this value to the current workload of the tester is the defect density. The defect density is negatively correlated with the defect density score. The larger the defect density, the lower the defect density score. Specifically, the defect density score of the adaptability problem can be calculated by the following equation:

[0091] M2 = (1-K) * 100;

[0092] Where M2 is the adaptability problem defect density score; K is the defect density.

[0093] As described in the above technical solution, the number of R&D problems before delivery in the software project delivered by the tester refers to the number of problems detected by the tester during the testing process of the software project. This value reflects the degree of defects in the software project before the test; the ratio of this value to the total number of problems is the R&D problem detection rate; wherein the total number of problems includes the number of R&D problems and adaptability problems detected by the current tester during the testing process of the software project, and the number of R&D problems and adaptability problems detected by other means or by other personnel after the delivery of the software project. The R&D problem detection rate is positively correlated with the R&D problem detection rate score. The larger the R&D problem detection rate, the higher the R&D problem detection rate score; the R&D problem detection rate score can be calculated by the following equation:

[0094]

[0095] Among them, M3 is the R&D problem detection rate score; T is the number of R&D problems before delivery in the delivered software projects; S is the total number of problems before and after delivery in the delivered software projects.

[0096] Based on this, according to the number of adaptability issues detected again in the software projects delivered by the testers, as well as the number of R&D issues and adaptability issues in the software projects delivered by the testers before and after delivery, the defect density score and the R&D problem detection rate score were calculated, reflecting the specific work quality of the testers in the software project testing process, ensuring the comprehensiveness of the test quality score results, and more accurately reflecting the overall test quality of the software projects delivered by the testers.

[0097] S403. Obtain the total assessment score of each tester according to the test progress score, adaptability problem defect density score, R&D problem detection rate score and test workload score of each tester.

[0098] S404: According to the assessment indicator score and the total assessment score of each tester, the evaluation result and ranking result of each tester are obtained through the tester evaluation model.

[0099] The technical solution of the embodiment of the present invention calculates and obtains the defect density score and the R&D problem detection rate score based on the number of adaptability problems re-detected in the software projects delivered by the testers, as well as the number of R&D problems and the number of adaptability problems in the software projects delivered by the testers before and after delivery, reflecting the specific work quality of the testers in the software project testing process, ensuring the comprehensiveness of the test quality scoring results, and more accurately reflecting the overall test quality of the software projects delivered by the testers.

[0100] Embodiment 5

[0101] Figure 5 : is a structural block diagram of a tester evaluation device provided by Embodiment 5 of the present invention, and the device specifically includes:

[0102] The indicator score acquisition module 501 is used to obtain the assessment indicator score of each tester; wherein the assessment indicator score includes the test progress score, the test quality score and the test workload score;

[0103] The assessment total score acquisition module 502 is used to acquire the assessment total score of each tester according to the assessment indicator score of each tester;

[0104] The evaluation result acquisition module 503 is used to acquire the evaluation result and ranking result of each tester through the tester evaluation model according to the evaluation indicator score and the total evaluation score of each tester.

[0105] The technical solution of the embodiment of the present invention obtains the test progress score, test quality score and test workload score of each tester; obtains the total assessment score of each tester based on the assessment indicator score of each tester; obtains the evaluation result and ranking result of each tester through the tester evaluation model based on the assessment indicator score and the total assessment score of each tester; thereby, multi-dimensional assessment indicator score acquisition is realized, and comprehensive quantitative indicator processing is performed on various test tasks of the testers, thereby improving the accuracy of the testers' evaluation results, ensuring the fairness of the ranking results, and avoiding the existence of evaluation errors under a single data dimension.

[0106] Optionally, the test progress score includes a personal timeliness score;

[0107] The indicator score acquisition module 501 is specifically used to obtain the R&D timeliness score based on the average time interval of the tester's handling of R&D issues, and to obtain the adaptability timeliness score based on the average time interval of the tester's handling of adaptability issues; and to obtain the tester's personal timeliness score based on the R&D timeliness score, the proportion of the number of R&D issues, the adaptability timeliness score and the proportion of adaptability issues.

[0108] Optionally, the test progress score includes a supervision timeliness score and a coordination timeliness score;

[0109] The indicator score acquisition module 501 is specifically used to obtain a supervision timeliness score based on the overdue workload of the supervised object of the tester and the total amount of work of the supervised object; wherein the overdue workload of the supervised object is non-linearly correlated with the number of overdue times of the current test task; and to obtain a collaborative timeliness score based on the overdue workload of the collaborative group to which the tester belongs and the total amount of work of the collaborative group; wherein the overdue workload of the collaborative group is non-linearly correlated with the number of overdue times of the current test task.

[0110] Optionally, the test quality score includes an adaptability problem defect density score and an R&D problem detection rate score;

[0111] The indicator score acquisition module 501 is specifically used to obtain an adaptability problem defect density score based on the number of adaptability problems re-detected in the software projects delivered by the tester and the total amount of work of the tester; and to obtain an R&D problem detection rate score based on the number of R&D problems before delivery in the software projects delivered by the tester and the total number of problems before and after delivery in the software projects delivered by the tester.

[0112] Optionally, the tester evaluation device is also used to allocate a matching target tester to the target test task through a demand allocation model based on the assessment indicator score and total assessment score of each tester and the demand label of the target test task.

[0113] Optionally, the tester evaluation device is also used to assign a matching target tester to the target test task through a demand allocation model based on the assessment indicator score, evaluation result and ranking result of each tester, as well as the demand label of the target test task.

[0114] The above device can execute the tester evaluation method provided by any embodiment of the present invention, and has the corresponding functional modules and beneficial effects of the execution method. For technical details not described in detail in this embodiment, please refer to the tester evaluation method provided by any embodiment of the present invention.

[0115] Embodiment 6

[0116] Figure 6 A schematic diagram of the structure of an electronic device 10 that can be used to implement an embodiment of the present invention is shown. The electronic device is intended to represent various forms of digital computers, such as laptop computers, desktop computers, workstations, personal digital assistants, electronic devices, blade electronic devices, mainframe computers, and other suitable computers. The electronic device can also represent various forms of mobile devices, such as personal digital processing, cellular phones, smart phones, wearable devices (such as helmets, glasses, watches, etc.) and other similar computing devices. The components shown herein, their connections and relationships, and their functions are merely examples and are not intended to limit the implementation of the present invention described and / or required herein.

[0117] like Figure 6 As shown, the electronic device 10 includes at least one processor 11, and a memory connected to the at least one processor 11, such as a read-only memory (ROM) 12, a random access memory (RAM) 13, etc., wherein the memory stores a computer program that can be executed by at least one processor, and the processor 11 can perform various appropriate actions and processes according to the computer program stored in the read-only memory (ROM) 12 or the computer program loaded from the storage unit 18 to the random access memory (RAM) 13. In the RAM 13, various programs and data required for the operation of the electronic device 10 can also be stored. The processor 11, the ROM 12, and the RAM 13 are connected to each other through a bus 14. An input / output (I / O) interface 15 is also connected to the bus 14.

[0118] A number of components in the electronic device 10 are connected to the I / O interface 15, including: an input unit 16, such as a keyboard, a mouse, etc.; an output unit 17, such as various types of displays, speakers, etc.; a storage unit 18, such as a disk, an optical disk, etc.; and a communication unit 19, such as a network card, a modem, a wireless communication transceiver, etc. The communication unit 19 allows the electronic device 10 to exchange information / data with other devices through a computer network such as the Internet and / or various telecommunication networks.

[0119] The processor 11 may be a variety of general and / or special processing components with processing and computing capabilities. Some examples of the processor 11 include, but are not limited to, a central processing unit (CPU), a graphics processing unit (GPU), various special artificial intelligence (AI) computing chips, various processors running machine learning model algorithms, a digital signal processor (DSP), and any appropriate processor, controller, microcontroller, etc. The processor 11 executes the various methods and processes described above, such as the tester evaluation method.

[0120] In some embodiments, the tester evaluation method may be implemented as a computer program, which is tangibly contained in a computer-readable storage medium, such as a storage unit. In some embodiments, part or all of the computer program may be loaded and / or installed on a heterogeneous hardware accelerator via a ROM and / or a communication unit. When the computer program is loaded into RAM and executed by a processor, one or more steps of the tester evaluation method described above may be performed. Alternatively, in other embodiments, the processor may be configured to perform the tester evaluation method by any other appropriate means (e.g., by means of firmware).

[0121] Various implementations of the systems and techniques described above herein can be implemented in digital electronic circuit systems, integrated circuit systems, field programmable gate arrays (FPGAs), application specific integrated circuits (ASICs), application specific standard products (ASSPs), systems on chips (SOCs), load programmable logic devices (CPLDs), computer hardware, firmware, software, and / or combinations thereof. These various implementations can include: being implemented in one or more computer programs that can be executed and / or interpreted on a programmable system including at least one programmable processor, which can be a special purpose or general purpose programmable processor that can receive data and instructions from a storage system, at least one input device, and at least one output device, and transmit data and instructions to the storage system, the at least one input device, and the at least one output device.

[0122] Computer programs for implementing the methods of the present invention may be written in any combination of one or more programming languages. These computer programs may be provided to a processor of a general-purpose computer, a special-purpose computer, or other programmable data processing device, so that when the computer program is executed by the processor, the functions / operations specified in the flow chart and / or block diagram are implemented. The computer program may be executed entirely on the machine, partially on the machine, partially on the machine and partially on a remote machine as a stand-alone software package, or entirely on a remote machine or electronic device.

[0123] In the context of the present invention, a computer-readable storage medium may be a tangible medium that may contain or store a computer program for use by or in combination with an instruction execution system, device or equipment. A computer-readable storage medium may include, but is not limited to, electronic, magnetic, optical, electromagnetic, infrared, or semiconductor systems, devices or equipment, or any suitable combination of the foregoing. Alternatively, a computer-readable storage medium may be a machine-readable signal medium. A more specific example of a machine-readable storage medium may include an electrical connection based on one or more lines, a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.

[0124] To provide interaction with a user, the systems and techniques described herein may be implemented on a heterogeneous hardware accelerator having: a display device (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor) for displaying information to a user; and a keyboard and pointing device (e.g., a mouse or trackball) through which a user can provide input to the heterogeneous hardware accelerator. Other types of devices may also be used to provide interaction with a user; for example, the feedback provided to the user may be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user may be received in any form (including acoustic input, voice input, or tactile input).

[0125] The systems and techniques described herein may be implemented in a computing system that includes backend components (e.g., as a data electronic device), or a computing system that includes middleware components (e.g., an application electronic device), or a computing system that includes frontend components (e.g., a user computer with a graphical user interface or a web browser through which a user can interact with implementations of the systems and techniques described herein), or a computing system that includes any combination of such backend components, middleware components, or frontend components. The components of the system may be interconnected by any form or medium of digital data communication (e.g., a communication network). Examples of communication networks include: a local area network (LAN), a wide area network (WAN), a blockchain network, and the Internet.

[0126] The computing system may include a client and an electronic device. The client and the electronic device are generally remote from each other and usually interact through a communication network. The relationship between the client and the electronic device is generated by computer programs running on corresponding computers and having a client-electronic device relationship with each other. The electronic device may be a cloud electronic device, also known as a cloud computing electronic device or a cloud host, which is a host product in the cloud computing service system to solve the defects of difficult management and weak business scalability in traditional physical hosts and VPS services.

[0127] It should be understood that the various forms of processes shown above can be used to reorder, add or delete steps. For example, the steps described in the present invention can be executed in parallel, sequentially or in different orders, as long as the desired results of the technical solution of the present invention can be achieved, and this document does not limit this.

[0128] The above specific implementations do not constitute a limitation on the protection scope of the present invention. It should be understood by those skilled in the art that various modifications, combinations, sub-combinations and substitutions can be made according to design requirements and other factors. Any modification, equivalent substitution and improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims

1. A tester evaluation method, characterized in that: include: Obtaining the assessment index scores of each tester; wherein the assessment index scores include test progress scores, test quality scores, and test workload scores; According to the assessment index scores of the testers, the total assessment scores of the testers are obtained; According to the assessment indicator score and the total assessment score of each tester, the evaluation result and ranking result of each tester are obtained through the tester evaluation model.

2. The method according to claim 1, characterized in that: The test progress score includes an individual timeliness score; The obtaining of the assessment index scores of each tester includes: According to the time interval in which the testers take an average time to deal with R&D issues, the R&D timeliness score is obtained; according to the time interval in which the testers take an average time to deal with adaptability issues, the adaptability timeliness score is obtained; Obtain the tester's personal timeliness score based on the R&D timeliness score, the proportion of R&D issues, the adaptability timeliness score, and the proportion of adaptability issues.

3. The method according to claim 1, characterized in that The test progress score includes a supervision timeliness score and a coordination timeliness score; The obtaining of the assessment index scores of each tester includes: Obtain a supervision timeliness score according to the overdue workload of the supervised object of the tester and the total workload of the supervised object; wherein the overdue workload of the supervised object and the number of overdue times of the current test task are nonlinearly correlated; A collaborative timeliness score is obtained based on the overdue workload of the collaborative group to which the tester belongs and the total workload of the collaborative group; wherein the overdue workload of the collaborative group and the number of overdue times of the current test task are nonlinearly correlated.

4. The method according to claim 1, characterized in that: The test quality score includes an adaptability problem defect density score and an R&D problem detection rate score; The obtaining of the assessment index scores of each tester includes: Obtain an adaptability problem defect density score based on the number of adaptability problems that have been re-detected in software projects delivered by the tester and the total amount of work of the tester; The R&D problem detection rate score is obtained based on the number of R&D issues before delivery in the software projects delivered by the tester and the total number of issues before and after delivery in the software projects delivered by the tester.

5. The method according to claim 1, characterized in that After obtaining the total assessment score of each tester according to the assessment indicator score of each tester, the method further includes: According to the assessment indicator score and the total assessment score of each tester, as well as the requirement label of the target test task, a matching target tester is assigned to the target test task through a requirement allocation model.

6. The method according to claim 1, characterized in that After obtaining the evaluation results and ranking results of each tester through the tester evaluation model according to the evaluation index scores and the total evaluation scores of each tester, the method further includes: According to the assessment indicator scores, evaluation results and ranking results of each of the testers, and the requirement labels of the target test tasks, a matching target tester is assigned to the target test task through a requirement allocation model.

7. A tester evaluation device, characterized in that: include: The indicator score acquisition module is used to obtain the assessment indicator score of each tester; wherein the assessment indicator score includes the test progress score, the test quality score and the test workload score; The assessment total score acquisition module is used to obtain the assessment total score of each tester according to the assessment indicator score of each tester; The evaluation result acquisition module is used to obtain the evaluation results and ranking results of each tester through the tester evaluation model according to the evaluation indicator score and total evaluation score of each tester.

8. An electronic device, characterized in that: The electronic device comprises: at least one processor; and a memory communicatively connected to the at least one processor; wherein, The memory stores a computer program executable by the at least one processor, and the computer program is executed by the at least one processor so that the at least one processor can perform the tester evaluation method according to any one of claims 1 to 6.

9. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores computer instructions, and the computer instructions are used to enable a processor to implement the tester evaluation method according to any one of claims 1 to 6 when executed.

10. A computer program product, comprising a computer program, wherein when the computer program is executed by a processor, the tester evaluation method according to any one of claims 1 to 6 is implemented.

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