Zero sample sketch retrieval method based on mask and matching
By using mask and matching methods in zero-sample sketch retrieval, Vision Transformer and visual-cross-language sampler for feature processing and semantic matching, the problem of semantic alignment mismatch between sketches and natural images is solved, and efficient and accurate sketch image retrieval is achieved.
Patent Information
- Application Number
- CN202411815334.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-11
- Publication Date
- 2025-04-18
- Estimated Expiration
- 2044-12-11
AI Technical Summary
The semantic alignment mismatch between sketches and natural images leads to distracting and semantic blurring of the model, making it difficult to achieve effective zero-sample sketch retrieval.
The zero-sample sketch retrieval method based on mask and matching is adopted, feature embedding is performed through the Vision Transformer encoder, semantic mask is generated using the visual-cross-language sampler, feature reconstruction is purified, and cross-domain semantic interaction is performed through the Transformer decoder, and model training is performed based on triple loss, reconstruction loss and interaction loss.
Effectively reduce semantic noise, enhance fine semantic matching between sketches and images, and improve the accuracy and efficiency of zero-sample sketch retrieval.
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Figure CN119848283A_ABST
Abstract
Citation Information
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