Testing tool of annular light spot laser

Abstract

The embodiment of the invention discloses a testing tool for an annular light spot laser. The test tool of the annular light spot laser comprises an automatic test circuit, a microcontroller unit, a first light emitting control circuit and a second light emitting control circuit. The first input end, the first output end, the second output end and the third output end of the microcontroller unit are electrically connected with the automatic test circuit, the first light emitting control circuit and the second light emitting control circuit respectively, and the first light emitting control circuit and the second light emitting control circuit are electrically connected with the first input end and the second input end of the annular light spot laser respectively. The automatic test circuit is configured to request the microcontroller unit to control the annular light spot laser to emit light, and the first light emitting control circuit and the second light emitting control circuit are configured to control outer ring light emitting and center light emitting of the annular light spot laser respectively, so that one-key automatic test on the annular light spot laser can be realized. And the test efficiency of the laser is greatly improved.

Description

Technical Field

[0001] The present application relates to the field of laser testing technology, and in particular to a testing tool for an annular spot laser. Background Art

[0002] In the related art, the laser electrical test tooling can only manually input control signals by dialing the code one by one. Not only are there many dial switches, which places certain requirements on the testers, the test process takes a long time, and it is not compatible with the test of annular spot lasers. Summary of the invention

[0003] In view of the deficiencies in the prior art, the present application provides a testing tool for an annular spot laser, which can not only realize the testing of the annular spot laser, but also perform one-key automatic testing of the annular spot laser, greatly improving the testing efficiency of the laser.

[0004] In order to solve the above problems, the present application provides a testing tool for an annular spot laser, which includes: Automatic testing circuits; A microcontroller unit, wherein a first input end of the microcontroller unit is electrically connected to the automatic test circuit, and a first output end of the microcontroller unit is electrically connected to a control end of the annular spot laser; A first light output control circuit is electrically connected to a first input end of the annular spot laser and a second output end of the microcontroller unit respectively; A second light output control circuit is electrically connected to the second input end of the annular spot laser and the third output end of the microcontroller unit respectively; The automatic test circuit is configured to request the microcontroller unit to control the annular spot laser to emit light, the first light emission control circuit is configured to control the outer ring light emission of the annular spot laser, and the second light emission control circuit is configured to control the center light emission of the annular spot laser.

[0005] The test fixture of the annular spot laser provided in the present application comprises an automatic test circuit, a microcontroller unit, a first light emission control circuit and a second light emission control circuit. The first input end, the first output end, the second output end and the third output end of the microcontroller unit are electrically connected to the automatic test circuit, the first light emission control circuit and the second light emission control circuit respectively. The first light emission control circuit and the second light emission control circuit are electrically connected to the first input end and the second input end of the annular spot laser respectively. The automatic test circuit is configured to request the microcontroller unit to control the light emission of the annular spot laser. The first light emission control circuit is configured to control the outer ring light emission of the annular spot laser. The second light emission control circuit is configured to control the center light emission of the annular spot laser. Not only the test of the annular spot laser is realized, but also the annular spot laser can be automatically tested with one key, which greatly improves the test efficiency of the laser. BRIEF DESCRIPTION OF THE DRAWINGS

[0006] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0007] Figure 1 A schematic block diagram of a test fixture for an annular spot laser provided in an embodiment of the present application; Figure 2 A circuit diagram of a control circuit provided in an embodiment of the present application; Figure 3 A circuit diagram of a state detection circuit provided in an embodiment of the present application; Figure 4 A circuit diagram of an automatic test circuit provided in an embodiment of the present application; Figure 5 A circuit diagram of a first light output control circuit provided in an embodiment of the present application; Figure 6 A circuit diagram of a second light output control circuit provided in an embodiment of the present application; Figure 7 A circuit diagram of a power regulation circuit provided in an embodiment of the present application; Figure 8 A circuit diagram of a power feedback circuit provided in an embodiment of the present application; Fig. 9 A circuit diagram of a copy machine control circuit provided in an embodiment of the present application; Fig.10 A circuit diagram of a channel detection circuit provided in an embodiment of the present application; Fig.11 A circuit diagram of a display circuit provided in an embodiment of the present application; Fig.12 A schematic flow chart of a method for testing an annular spot laser provided in an embodiment of the present application.

[0008] Reference numerals: 10. Ring spot laser; 20. Automatic test circuit; 30. Microcontroller unit; 40. First light output control circuit; 50. Second light output control circuit; 60. Control circuit; 70. Status detection circuit; 80. Power regulation circuit; 90. Channel detection circuit; 100. Power feedback circuit; 110. Copy machine control circuit 60; 120. Display circuit. DETAILED DESCRIPTION

[0009] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0010] It should be understood that when used in this specification and the appended claims, the terms "include" and "comprises" indicate the presence of described features, integers, steps, operations, elements and / or components, but do not exclude the presence or addition of one or more other features, integers, steps, operations, elements, components and / or combinations thereof.

[0011] It should also be understood that the terms used in this application specification are only for the purpose of describing specific embodiments and are not intended to limit the application. As used in this application specification and the appended claims, unless the context clearly indicates otherwise, the singular forms "a", "an" and "the" are intended to include plural forms.

[0012] It should be further understood that the term “and / or” used in the specification and appended claims refers to any combination and all possible combinations of one or more of the associated listed items, and includes these combinations.

[0013] In addition, in this application, unless otherwise clearly specified or limited in the embodiments, the terms "installed", "connected", "connected" and "fixed" etc. appearing in the embodiments should be understood in a broad sense. For example, the connection can be a fixed connection, a detachable connection, or an integrated connection. It can be understood that it can also be a mechanical connection, an electrical connection, etc.; of course, it can also be a direct connection, or an indirect connection through an intermediate medium, or it can be the internal connection of two elements, or the interaction relationship between two elements. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to the specific implementation situation.

[0014] The embodiment of the present application provides a testing method and a testing system for an annular spot laser 10. The testing system includes a testing fixture for the annular spot laser 10, and the testing method for the annular spot laser 10 uses the testing fixture to execute the testing method for the annular spot laser 10.

[0015] For ease of understanding, a test fixture of the annular spot laser 10 is first introduced, and then a test method and a test system of the annular spot laser 10 are described in detail based on the test fixture of the annular spot laser 10 .

[0016] See also Figure 1 , Figure 1 A schematic block diagram of a test fixture for the annular spot laser 10 provided in an embodiment of the present application.

[0017] like Figure 1 As shown, the present application provides a testing tool for a ring spot laser 10, which includes: Automatic test circuit 20; A microcontroller unit 30, wherein a first input end of the microcontroller unit 30 is electrically connected to the automatic test circuit 20, and a first output end of the microcontroller unit 30 is electrically connected to a control end of the annular spot laser 10; A first light output control circuit 40 is electrically connected to a first input end of the annular spot laser 10 and a second output end of the microcontroller unit 30; The second light output control circuit 50 is electrically connected to the second input end of the annular spot laser 10 and the third output end of the microcontroller unit 30; The automatic test circuit 20 is configured to request the microcontroller unit 30 to control the annular spot laser 10 to emit light, the first light emission control circuit is configured to control the outer ring light emission of the annular spot laser 10, and the second light emission control circuit is configured to control the center light emission of the annular spot laser. The ring spot laser 10 is also called a dual-beam continuous laser. It is a laser made based on the ring spot laser welding technology. Its output spot consists of a central Gaussian spot and an outer ring spot. The ring spot laser 10 has the advantages of high output power, good consistency, no spatter in welding, and efficient cutting. It is widely used in many fields such as automobile manufacturing, power batteries, electronic components, aerospace, and shipbuilding.

[0018] In this embodiment, when the annular spot laser 10 needs to be tested, it is only necessary to request the microcontroller unit 30 to control the annular spot laser 10 to emit light through the automatic test circuit 20. After receiving the request of the automatic test circuit 20, the microcontroller unit 30 can output a signal to control the annular spot laser 10. After receiving the output signal of the microcontroller unit 30, the annular spot laser 10 outputs a status bit so that the microcontroller unit 30 can detect whether the annular spot laser 10 can respond normally, and then the first light output control circuit and the second light output control circuit can be controlled to control the annular spot laser 10 to emit outer ring light and center light.

[0019] Among them, a switch can be set in the automatic test circuit 20 to enable the microcontroller unit 30 to control the annular spot laser 10 to emit outer ring light and center light. The microcontroller unit 30 (MCU) is a highly integrated single-chip microcomputer, which usually integrates resources such as CPU, ROM, RAM, FLASH, timer, I / O interface on a chip to form a chip-level computer. The microcontroller unit 30 can be a 144PIN single-chip microcomputer of the GD32F407 series.

[0020] The test fixture of the annular spot laser 10 provided in the present application includes an automatic test circuit 20, a microcontroller unit 30, a first light emission control circuit 40 and a second light emission control circuit 50. The first input end, the first output end, the second output end and the third output end of the microcontroller unit 30 are electrically connected to the automatic test circuit 20, the first light emission control circuit 40 and the second light emission control circuit 50 respectively. The first light emission control circuit 40 and the second light emission control circuit 50 are electrically connected to the first input end and the second input end of the annular spot laser 10 respectively. The automatic test circuit 20 is configured to request the microcontroller unit 30 to control the light emission of the annular spot laser 10, the first light emission control circuit is configured to control the outer ring light emission of the annular spot laser 10, and the second light emission control circuit is configured to control the center light emission of the annular spot laser. Not only the test of the annular spot laser 10 is realized, but also the annular spot laser 10 can be automatically tested with one key, which greatly improves the test efficiency of the laser.

[0021] In some embodiments, Figure 1 As shown, the test fixture further includes a control circuit 60 ; wherein one end of the control circuit 60 is electrically connected to the first output end of the microcontroller unit 30 , and the other end of the control circuit 60 is electrically connected to the control end of the annular spot laser 10 .

[0022] In this embodiment, the control circuit 60 is arranged between the first output end of the microcontroller unit 30 and the control end of the annular spot laser 10. After receiving the request of the automatic test circuit 20, the microcontroller unit 30 can output a signal for controlling the annular spot laser 10 to the control circuit 60, and the control circuit 60 can output the control signal of the annular spot laser 10, so that the annular spot laser 10 outputs a status bit, thereby facilitating the microcontroller unit 30 to detect whether the annular spot laser 10 can respond normally, and then the first light output control circuit and the second light output control circuit can be controlled to control the annular spot laser 10 to emit outer ring light and center light.

[0023] Furthermore, in some embodiments, Figure 2 As shown, the control circuit 60 includes: A first optical coupler U1, wherein a first input terminal of the first optical coupler U1 is electrically connected to a first output terminal AI-XP1 of the microcontroller unit 30, and a first output terminal of the first optical coupler U1 is grounded GND; A first switch K1, wherein a first end of the first switch K1 is electrically connected to a second input end of the first optical coupler U1, a second end of the first switch K1 is electrically connected to a second output end of the first optical coupler U1, and a third end of the first switch K1 is electrically connected to a control end of the annular spot laser 10; The first light emitting diode LED1 has an anode electrically connected to the third end of the first switch K1 , and a cathode of the first light emitting diode LED1 is grounded GND.

[0024] In this embodiment, a first optical coupler U1 may be provided in the control circuit 60, and electrical isolation between the microcontroller unit 30 and the annular spot laser 10 may be achieved, so that the signal output by the microcontroller unit 30 can be stably transmitted between the microcontroller unit 30 and the annular spot laser 10. A resistor R1 is provided between the first input end of the first optical coupler U1 and the first output end AI-XP1 of the microcontroller unit 30. Two triodes may be provided in the first optical coupler U1 to enhance its driving capability and improve the transmission efficiency of the signal, thereby achieving higher driving capability and better signal transmission effect.

[0025] Specifically, the first switch K1 may be a dial switch to realize manual dialing, and the on and off of the first switch K1 may also be controlled by the microcontroller unit 30. At the same time, a first light-emitting diode LED1 and a resistor R2 connected in series may be provided at the connection point between the third end of the first switch K1 electrically connected to the control end of the annular spot laser 10, so as to accurately know whether the annular spot laser 10 detects the corresponding signal and outputs the status bit.

[0026] In addition, the first end of the first switch K1 is electrically connected to the second input end of the first optical coupler U1 and can also be connected to a 24V power supply provided by the power port 24VIN, so that the first light-emitting diode LED1 is in a continuous light-emitting state during the test.

[0027] In some embodiments, Figure 1 As shown, the test fixture further includes a state detection circuit 70 ; wherein one end of the state detection circuit 70 is electrically connected to the state output end of the annular spot laser 10 , and the other end of the state detection circuit 70 is electrically connected to the second input end of the microcontroller unit 30 .

[0028] In this embodiment, the state detection circuit 70 is arranged between the second input end of the microcontroller unit 30 and the state output end of the annular spot laser 10. After the microcontroller unit 30 outputs the state signal, it can be transmitted to the second input end of the microcontroller unit 30 through the state detection circuit 70, so that the microcontroller unit 30 can detect whether the annular spot laser 10 can respond normally, and then control the first light output control circuit and the second light output control circuit to control the annular spot laser 10 to emit outer ring light and center light.

[0029] In some embodiments, Figure 3 As shown, the state detection circuit 70 includes: A second optical coupler U2, wherein a first input end of the second optical coupler U2 is electrically connected to a state output end XP1_OLT_B1 of the annular spot laser 10, a first output end of the second optical coupler U2 is grounded GND, a second input end of the second optical coupler U2 is connected to a first power supply, and a second output end of the second optical coupler U2 is electrically connected to a second input end XP1_B1 of the microcontroller unit 30; The first filter circuit has one end electrically connected to the second output end of the second optical coupler U2 and the second input end XP1_B1 of the microcontroller unit 30 , and the other end of the first filter circuit is grounded GND.

[0030] In this embodiment, a second optical coupler U2 may be provided in the state detection circuit 70 to achieve electrical isolation between the microcontroller unit 30 and the annular spot laser 10, so that the state signal output by the annular spot laser 10 can be stably transmitted to the microcontroller unit 30. A resistor R4 is provided between the first input end of the second optical coupler U2 and the state output end XP1_OLT_B1 of the annular spot laser 10.

[0031] Specifically, a first filtering circuit may be provided between the second output end of the second optical coupler U2 and the second input end XP1_B1 of the microcontroller unit 30 , so that the state signal output by the annular spot laser 10 can be further stably transmitted to the second input end XP1_B1 of the microcontroller unit 30 .

[0032] Among them, the first filtering circuit may include a parallel resistor R3 and a capacitor C1, one end of the parallel resistor R3 and the capacitor C1 are electrically connected to the second output end of the second optocoupler U2 and the second input end XP1_B1 of the microcontroller unit 30 respectively, and the other end of the parallel resistor R3 and the capacitor C1 are grounded GND.

[0033] In addition, the second input terminal of the second optical coupler U2 can be connected to a 3.3V first power supply and connected to the ground GND through the capacitor C2.

[0034] In some embodiments, Figure 4 As shown, the automatic test circuit 20 includes: A second switch K2, one end of the second switch K2 is connected to a second power supply; A third optical coupler U3, wherein a first input end of the third optical coupler U3 is electrically connected to the other end of the second switch K2, a first output end of the third optical coupler U3 is grounded GND, a second input end of the third optical coupler U3 is connected to a third power supply, and a second output end of the third optical coupler U3 is electrically connected to a first input end Hard Wire Auto Test of the microcontroller unit 30; A second filter circuit, one end of which is electrically connected to the first input end Hard Wire Auto Test of the microcontroller unit 30 and the second output end of the third optical coupler U3, and the other end of the second filter circuit is grounded GND.

[0035] In this embodiment, a third optical coupler U3 may be provided in the automatic test circuit 20 to achieve isolation between the second power supply and the microcontroller unit 30, so that the microcontroller unit 30 can stably receive the test signal for testing the annular spot laser 10. A resistor R6 is provided between the first input end of the third optical coupler U3 and the second switch K2.

[0036] Specifically, the second switch K2 may be a dial switch to realize manual dialing, and the on and off of the second switch K2 may also be controlled by the microcontroller unit 30. A second filter circuit may be provided between the second output end of the third optical coupler U3 and the first input end Hard Wire Auto Test of the microcontroller unit 30, so that the microcontroller unit 30 can stably receive the test signal for testing the annular spot laser 10.

[0037] Among them, the second filtering circuit may include a parallel resistor R5 and a capacitor C3, one end of the parallel resistor R5 and the capacitor C3 are electrically connected to the second output end of the third optical coupler U3 and the first input end Hard Wire Auto Test of the microcontroller unit 30 respectively, and the other end of the parallel resistor R5 and the capacitor C3 are grounded GND.

[0038] In addition, the second input terminal of the third optical coupler U3 can be connected to a 3.3V second power supply and grounded GND through a capacitor C4. One end of the second switch K2 can be connected to a 24V third power supply, which can be provided by a power port 24VIN.

[0039] In some embodiments, Figure 5 As shown, the first light output control circuit 40 includes: A third switch K3, one end of the third switch K3 is connected to the fourth power supply, and the other end of the third switch K3 is electrically connected to the first input end of the annular spot laser 10; A second light emitting diode LED2, wherein the anode of the second light emitting diode LED2 is electrically connected to the other end of the third switch K3 and the first input end of the annular spot laser 10, and the other end of the second light emitting diode LED2 is grounded GND; A fourth optical coupler U4, wherein a first input end of the fourth optical coupler U4 is electrically connected to a second output end MOD_R of the microcontroller unit 30, a first output end of the fourth optical coupler U4 is grounded GND, a second input end of the fourth optical coupler U4 is connected to a fifth power supply, and a second output end of the fourth optical coupler U4 is electrically connected to a first input end of the annular spot laser 10; A third filtering circuit, one end of the third filtering circuit is electrically connected to the second output end of the fourth optical coupler U4 and the first input end of the annular spot laser 10, and the other end of the third filtering circuit is grounded GND.

[0040] In this embodiment, a fourth optical coupler U4 can be provided in the first light output control circuit 40 to achieve electrical isolation between the microcontroller unit 30 and the annular spot laser 10, so that the signal output by the microcontroller unit 30 can be stably transmitted between the microcontroller unit 30 and the annular spot laser 10.

[0041] A resistor R8 is provided between the first input terminal of the fourth optical coupler U4 and the second output terminal MOD_R of the microcontroller unit 30, and a resistor R8 can be provided between the first input terminal and the first output terminal of the fourth optical coupler U4. Two transistors can be provided in the fourth optical coupler U4 to enhance its driving capability and improve the transmission efficiency of the signal, thereby achieving higher driving capability and better signal transmission effect.

[0042] Specifically, the third switch K3 can independently control the annular spot laser 10 to emit light in the outer ring, and the microcontroller unit 30 can independently control the annular spot laser 10 to emit light in the outer ring through the fourth optical coupler U4; the microcontroller unit 30 can also control the third switch K3 to independently control the annular spot laser 10 to emit light in the outer ring. The third switch K3 can be a dial switch to realize manual dialing, and the on and off of the third switch K3 can also be controlled by the microcontroller unit 30. One end of the third switch K3 can be connected to a fourth power supply of 24V, which can be provided by the power port 24VIN.

[0043] The third filtering circuit may include a parallel resistor R25 and a capacitor C10, one end of the parallel resistor R25 and the capacitor C10 are electrically connected to the second output end of the fourth optical coupler U4 and the first input end of the annular spot laser 10 respectively, and the other end of the parallel resistor R25 and the capacitor C10 are grounded GND.

[0044] Meanwhile, a second light emitting diode LED2 and a resistor R9 connected in series may be provided at the connection point where the other end of the third switch K3 is electrically connected to the first input end of the annular spot laser 10, so as to accurately know whether the annular spot laser 10 is continuously emitting outer ring light.

[0045] In addition, the second input terminal of the fourth optical coupler U4 can be connected to a fifth power supply of 24V, which can be provided by the power port 24VIN.

[0046] In some embodiments, Figure 6 As shown, the second light output control circuit 50 includes: A fourth switch K4, one end of the fourth switch K4 is connected to the sixth power supply, and the other end of the fourth switch K4 is electrically connected to the second input end of the annular spot laser 10; A third light emitting diode LED3, wherein the anode of the third light emitting diode LED3 is electrically connected to the other end of the fourth switch K4 and the second input end of the annular spot laser 10, respectively, and the other end of the third light emitting diode LED3 is grounded GND; A fifth optical coupler U5, wherein a first input end of the fifth optical coupler U5 is electrically connected to a third output end MOD_C of the microcontroller unit 30, a first output end of the fifth optical coupler U5 is grounded GND, a second input end of the fifth optical coupler U5 is connected to a seventh power supply, and a second output end of the fifth optical coupler U5 is electrically connected to a second input end of the annular spot laser 10; A fourth filter circuit, one end of which is electrically connected to the second output end of the fifth optical coupler U5 and the second input end of the annular spot laser 10, and the other end of which is grounded GND.

[0047] In this embodiment, a fifth optical coupler U5 can be provided in the second light output control circuit 50 to achieve electrical isolation between the microcontroller unit 30 and the annular spot laser 10, so that the signal output by the microcontroller unit 30 can be stably transmitted between the microcontroller unit 30 and the annular spot laser 10.

[0048] A resistor R10 is provided between the first input terminal of the fifth optical coupler U5 and the third output terminal MOD_C of the microcontroller unit 30, and a resistor R11 can be provided between the first input terminal and the first output terminal of the fifth optical coupler U5. Two triodes can be provided in the fifth optical coupler U5 to enhance its driving capability and improve the transmission efficiency of the signal, thereby achieving higher driving capability and better signal transmission effect.

[0049] Specifically, the fourth switch K4 can independently control the annular spot laser 10 to emit light from the center, and the microcontroller unit 30 can independently control the annular spot laser 10 to emit light from the center through the fifth optical coupler U5; the microcontroller unit 30 can also control the fourth switch K4 to independently control the annular spot laser 10 to emit light from the center. The fourth switch K4 can be a dial switch to realize manual dialing, and the on and off of the fourth switch K4 can also be controlled by the microcontroller unit 30. One end of the fourth switch K4 can be connected to a 24V sixth power supply, which can be provided by the power port 24VIN.

[0050] The fourth filtering circuit may include a resistor R26 and a capacitor C11 connected in parallel, one end of the resistor R26 and the capacitor C11 connected in parallel are electrically connected to the second output end of the fifth optical coupler U5 and the second input end of the annular spot laser 10, respectively, and the other end of the resistor R26 and the capacitor C11 connected in parallel are grounded GND.

[0051] At the same time, a third light-emitting diode LED3 and a resistor R12 connected in series may be provided at the connection point between the other end of the fourth switch K4 and the second input end of the annular spot laser 10, so as to accurately know whether the annular spot laser 10 is continuously emitting light in the outer ring. In addition, the second input end of the fifth optical coupler U5 may be connected to a seventh power supply of 24V, which may be provided by the power port 24VIN.

[0052] In some embodiments, Figure 1 As shown, the test fixture also includes a power regulating circuit 80; wherein one end of the power regulating circuit 80 is connected to the eighth power supply, and the other end of the power regulating circuit 80 is electrically connected to the power regulating end of the annular spot laser 10 and the third input end of the microcontroller unit 30 respectively.

[0053] In this embodiment, the power adjustment circuit 80 can output a power adjustment signal to the microcontroller unit 30 and the annular spot laser 10 at the same time. After receiving the power adjustment signal, the annular spot laser 10 can emit light in the outer ring and in the center at the corresponding power. After receiving the power adjustment signal, the microcontroller unit 30 can display the adjusted output power of the annular spot laser 10.

[0054] In some embodiments, Figure 7 As shown, the power regulation circuit 80 includes: a fifth switch K5, one end of which is connected to an eighth power source; A potentiometer R13, one end of the potentiometer R13 is electrically connected to the other end of the fifth switch K5; A first voltage follower U6, a first input end of the first voltage follower U6 is electrically connected to the other end of the potentiometer R13, a second input end of the first voltage follower U6 is electrically connected to the output end of the voltage follower, and the output end of the first voltage follower U6 is electrically connected to the power adjustment end of the annular spot laser 10 and the third input end ADIn_R of the microcontroller unit 30 respectively.

[0055] In this embodiment, the output power of the annular spot laser 10 can be adjusted by the potentiometer R13, the potentiometer R13 can be an adjustable resistor, a resistor R16 can be arranged between the potentiometer R13 and the fifth switch K5, the second input end of the first voltage follower U6 can be electrically connected to the output end of the voltage follower through the resistor R17, the first power supply end of the first voltage follower U6 can be connected to the 12V power supply and grounded GND through the capacitor C5, the first power supply end of the second voltage follower U7 is grounded GND, and the output end of the first voltage follower U6 is electrically connected to the power adjustment end of the annular spot laser 10, and is also electrically connected to the third input end ADIn_R of the microcontroller unit 30 through the resistor R15. Among them, the eighth power supply can be a 12V power supply.

[0056] In some embodiments, Figure 7 As shown, the power regulator also includes a fifth filtering circuit; wherein one end of the fifth filtering circuit is electrically connected to the output end of the first voltage follower U6 and the power regulating end of the annular spot laser 10, respectively, and the other end of the fifth filtering circuit is electrically connected to the third input end ADIn_R of the microcontroller unit 30.

[0057] In this embodiment, in order to ensure that the microcontroller unit 30 can stably receive the power adjustment signal output by the power adjustment circuit 80, a fifth filter circuit can be set between the output end of the first voltage follower U6 and the third input end ADIn_R of the microcontroller unit 30, so that the microcontroller unit 30 can accurately display the adjusted power of the annular spot laser 10.

[0058] Specifically, the fifth filtering circuit includes a parallel resistor R14 and a capacitor C4, one end of the parallel resistor R14 and the capacitor C4 are electrically connected to the output end of the first voltage follower U6 and the third input end ADIn_R of the microcontroller unit 30 respectively, and the other end of the parallel resistor R14 and the capacitor C4 are grounded GND.

[0059] In some embodiments, Figure 1As shown, the test fixture also includes a copy machine control circuit 60; wherein, one end of the copy machine control circuit 60 is connected to the ninth power supply, and the other end of the copy machine control circuit 60 is electrically connected to the fourth input terminal of the microcontroller unit 30.

[0060] Specifically, the present application can also implement a copy test on the annular spot laser 10, and the copy control circuit 60 can be arranged between the annular spot laser 10 and the microcontroller unit 30. When the annular spot laser 10 needs to be copied, the copy control circuit 60 can control the annular spot laser 10 to perform the copy test, and the microcontroller unit 30 can detect the corresponding signal from the copy control circuit 60 to determine whether the annular spot laser 10 is in the copy test.

[0061] In some embodiments, Fig. 9 As shown, the copy machine control circuit 60 includes: A sixth switch K6, one end of which is connected to a ninth power source; a sixth optical coupler U8, wherein a first input end of the sixth optical coupler U8 is electrically connected to the other end of the sixth switch K6, a first output end of the sixth optical coupler U8 is grounded GND, a second input end of the sixth optical coupler U8 is connected to a tenth power supply, and a second output end of the sixth optical coupler U8 is electrically connected to a fourth input end BeamSwtich Auto Test of the microcontroller unit 30; A sixth filter circuit, one end of the sixth filter circuit is electrically connected to the second output end of the sixth optical coupler U8 and the fourth input end BeamSwtich Auto Test of the microcontroller unit 30, and the other end of the sixth filter circuit is grounded GND.

[0062] In this embodiment, the sixth switch K6 may be a shutter copy switch of the annular spot laser 10 , which may be a dial switch to implement manual dialing. The on and off of the sixth switch K6 may also be controlled by the microcontroller unit 30 .

[0063] At the same time, a sixth optical coupler U8 can be set between the sixth switch K6 and the fourth input terminal BeamSwtich Auto Test of the microcontroller unit 30, a resistor R20 can be set between the sixth switch K6 and the sixth optical coupler U8, the second input terminal of the sixth optical coupler U8 can be connected to the tenth power supply of 3.3V and grounded GND through the capacitor C8, and a sixth filtering circuit can be set between the second output terminal of the sixth optical coupler U8 and the fourth input terminal BeamSwtich Auto Test of the microcontroller unit 30, thereby realizing stable detection of the automatic copying signal of the optical gate machine of the annular spot laser 10.

[0064] Among them, the sixth filtering circuit may include a parallel resistor R19 and a capacitor C7, one end of the parallel resistor R19 and the capacitor C7 are respectively electrically connected to the second output end of the sixth optical coupler U8 and the fourth input end BeamSwtich Auto Test of the microcontroller unit 30, and the other end of the parallel resistor R19 and the capacitor C7 are grounded GND.

[0065] In some embodiments, Figure 1 As shown, the test fixture further includes a power feedback circuit 100 ; wherein one end of the power feedback circuit 100 is electrically connected to the feedback end of the annular spot laser 10 , and the other end of the power feedback circuit 100 is electrically connected to the fifth input end of the microcontroller unit 30 .

[0066] Specifically, the power feedback circuit 100 can be arranged between the feedback end of the annular spot laser 10 and the fifth input end of the microcontroller unit 30. The feedback end of the annular spot laser 10 can feed back its power to the microcontroller unit 30 through the power feedback circuit 100, so that the microcontroller unit 30 can feed back the power of the central light and the outer ring light of the annular spot laser 10.

[0067] In some embodiments, Figure 8 As shown, the power feedback circuit 100 includes: A seventh filter circuit, one end of the seventh filter circuit is electrically connected to the feedback end, and the other end of the seventh filter circuit is grounded GND; The second voltage follower U7, the first input end of the second voltage follower U7 is electrically connected to one end of the seventh filter circuit, the second input end of the second voltage follower U7 is electrically connected to the feedback end LaserPowerFk-R of the annular spot laser 10, and the output end of the second voltage follower U7 is electrically connected to the fifth input end PowerFk-R of the microcontroller unit 30.

[0068] In this embodiment, the second voltage follower U7 is arranged between the fifth input terminal PowerFk-R of the microcontroller unit 30 and the feedback terminal LaserPowerFk-R of the annular spot laser 10, and at the same time, a seventh filter circuit can be arranged between the second input terminal of the second voltage follower U7 and the feedback terminal of the spot laser, thereby ensuring that the power feedback signal output by the feedback terminal LaserPowerFk-R of the annular spot laser 10 can be stably input into the second voltage follower U7, and stably input into the microcontroller unit 30 through the second voltage follower U7.

[0069] The seventh filter circuit may include a resistor R18 and a capacitor C6 connected in parallel, one end of the resistor R18 and the capacitor C6 connected in parallel are respectively electrically connected to the feedback end LaserPowerFk-R of the annular spot laser 10 and the fifth input end PowerFk-R of the microcontroller unit 30, and the other end of the resistor R18 and the capacitor C6 connected in parallel are connected to the ground GND. The first power supply end of the second voltage follower U7 can be connected to a 12V power supply, and the second power supply end of the second voltage follower U7 is connected to the ground GND.

[0070] In some embodiments, Figure 1 As shown, the test fixture further includes a display circuit 120 ; wherein the display circuit 120 is electrically connected to the fourth output terminal of the microcontroller unit 30 , and is configured to display the outer ring light and the center light of the annular spot laser 10 respectively.

[0071] In this embodiment, the display circuit 120 can display the test status information, power information and power feedback information of the annular spot laser 10 , thereby realizing a visual test of the annular spot laser 10 .

[0072] In some embodiments, Fig.11 As shown, the display circuit 120 may include a resistor R23 and a light emitting diode LED4 connected in series, one end of the resistor R23 and the light emitting diode LED4 connected in series is connected to the pin MCU_LEDRED of the microcontroller unit 30, and the other end of the resistor R23 and the light emitting diode LED4 is grounded GND, so as to display the successful test of the annular spot laser 10; the display circuit 120 may also include a resistor R24 ​​and a light emitting diode LED5 connected in series, one end of the resistor R24 ​​and the light emitting diode LED5 connected in series is connected to the pin MCU_LEDGREEN of the microcontroller unit 30, and the other end of the resistor R24 ​​and the light emitting diode LED5 is grounded GND, so as to display the failed test of the annular spot laser 10.

[0073] In some embodiments, Figure 1 As shown, the test fixture also includes a channel detection circuit 90; wherein, one end of the channel detection circuit 90 is electrically connected to the channel signal output end of the annular spot laser 10, and the other end of the channel detection circuit 90 is electrically connected to the sixth input end of the microcontroller unit 30; the channel detection circuit 90 is configured to detect the channel lens state of the annular spot laser 10.

[0074] In this embodiment, the channel detection circuit 90 can be arranged between the channel lens of the annular spot laser 10 and the sixth input terminal of the microcontroller unit 30. When the shutter copy machine switch of the annular spot laser 10 is closed, the microcontroller unit 30 detects that the annular spot laser 10 performs a copy machine test. At this time, the microcontroller unit 30 also needs to obtain whether the channel lens of the annular spot laser 10 is turned on to further determine whether the annular spot laser 10 performs a copy machine test.

[0075] In some embodiments, Fig.10 As shown, the channel detection circuit 90 includes: A seventh optical coupler U9, a first input end of the seventh optical coupler U9 is electrically connected to the channel signal output end of the annular spot laser 10, a first output end of the seventh optical coupler U9 is grounded GND, a second input end of the seventh optical coupler U9 is connected to a twelfth power supply, and a second output end of the seventh optical coupler U9 is electrically connected to a sixth input end BS1 MirrorOFF of the microcontroller unit 30; An eighth filtering circuit, one end of the eighth filtering circuit is electrically connected to the second output end of the seventh optical coupler U9 and the sixth input end BS1 Mirror OFF of the microcontroller unit 30, and the other end of the eighth filtering circuit is grounded GND.

[0076] In this embodiment, the seventh optical coupler U9 is provided between the channel lens of the annular spot laser 10 and the sixth input terminal BS1 Mirror OFF of the microcontroller unit 30, which can realize electrical isolation between the microcontroller unit 30 and the annular spot laser 10, so that the signal output by the microcontroller unit 30 can be stably transmitted between the microcontroller unit 30 and the annular spot laser 10. Among them, a resistor R22 is provided between the first input terminal of the seventh optical coupler U9 and the channel signal output terminal BS-Mirror OFF-2 of the annular spot laser 10.

[0077] The eighth filter circuit may include a resistor R21 and a capacitor C9 connected in parallel, one end of the resistor R21 and the capacitor C9 connected in parallel are respectively electrically connected to the second output end of the seventh optical coupler U9 and the sixth input end BS1Mirror OFF of the microcontroller unit 30, and the other end of the resistor R21 and the capacitor C9 connected in parallel are connected to the ground GND. The second input end of the seventh optical coupler U9 may be connected to the twelfth power supply of 3.3V and connected to the ground GND through the capacitor C10.

[0078] The test fixture of the annular spot laser 10 provided in the present application includes an automatic test circuit 20, a microcontroller unit 30, a first light emission control circuit 40 and a second light emission control circuit 50. The first input end, the first output end, the second output end and the third output end of the microcontroller unit 30 are electrically connected to the automatic test circuit 20, the first light emission control circuit 40 and the second light emission control circuit 50 respectively. The first light emission control circuit 40 and the second light emission control circuit 50 are electrically connected to the first input end and the second input end of the annular spot laser 10 respectively. The automatic test circuit 20 is configured to request the microcontroller unit 30 to control the light emission of the annular spot laser 10, the first light emission control circuit is configured to control the outer ring light emission of the annular spot laser 10, and the second light emission control circuit is configured to control the center light emission of the annular spot laser. Not only the test of the annular spot laser 10 is realized, but also the annular spot laser 10 can be automatically tested with one key, which greatly improves the test efficiency of the laser.

[0079] It can be understood that the test fixture of the annular spot laser 10 provided in the above embodiment is only an example. The test fixture of the annular spot laser 10 described in the embodiment of the present application is to more clearly illustrate the technical solution of the test method of the annular spot laser 10 provided in the embodiment of the present application, and does not constitute a limitation on the technical solution provided in the embodiment of the present application. A person of ordinary skill in the art can know that with the evolution of the system and the emergence of new business scenarios, the technical solution provided in the embodiment of the present application is also applicable to similar technical problems. The test method of the annular spot laser 10 is described in detail below.

[0080] It should be noted that the description order of the following embodiments is not intended to limit the preferred order of the embodiments. The test method of the annular spot laser 10 is described in detail below. At the same time, the test method of the annular spot laser 10 provided in the present application can be executed by the microcontroller unit 30, that is, the application corresponding to the test method of the annular spot laser 10 can be burned into the microcontroller unit 30.

[0081] like Fig.12 As shown, the present application also provides a testing method for the annular spot laser 10, which is applied to a testing tool for the annular spot laser 10, the testing tool including an automatic testing circuit 20, a microcontroller unit 30, a first light output control circuit 40 and a second light output control circuit 50; the testing method includes: steps S110, S120, S130 and S140.

[0082] S110, initializing the test fixture of the annular spot laser; S120, generating a first light emission control instruction and a second light emission control instruction according to an automatic test signal sent by an automatic test circuit; S130, controlling the first light output control circuit 40 to output a first light output modulation signal according to the first light output control instruction, and controlling the second light output control circuit 50 to output a second light output modulation signal according to the second light output control instruction; S140, controlling the outer ring light emission of the annular spot laser 10 according to the first light emission modulation signal, and controlling the center light emission of the annular spot laser 10 according to the second light emission modulation signal.

[0083] In this embodiment, after the test fixture of the annular spot laser is powered on, the microcontroller unit 30 configures the peripheral interfaces such as ADC, DAC, IIC, TIMER, etc. in the test fixture of the annular spot laser, and performs initialization settings on the OLED electronic screen display.

[0084] Specifically, after receiving the automatic test signal sent by the automatic test circuit, a first light output control instruction and a second light output control instruction can be generated, and the first light output control circuit 40 can be controlled to output a first light output modulation signal according to the first light output control instruction, and the second light output control circuit 50 can be controlled to output a second light output modulation signal according to the second light output control instruction. The annular spot laser 10 can then emit outer ring light according to the first light output modulation signal, and emit center light according to the second light output modulation signal.

[0085] At the same time, the microcontroller unit 30 collects external analog quantities in real time and displays them on the OLED screen, monitors external automatic test signals and external light gate automatic copying signals in real time, executes corresponding functions upon receiving commands, performs tests according to established procedures, and displays the test results on the OLED screen and indicator lights.

[0086] In some embodiments, the test tool also includes a control circuit 60; wherein, a first light output control instruction and a second light output control instruction are generated according to an automatic test signal sent by the automatic test circuit, including: controlling the control circuit to generate a control signal of the annular spot laser according to the automatic test signal to obtain a status signal output by the annular spot laser; generating a first light output control instruction and a second light output control instruction according to the status signal.

[0087] In this embodiment, after receiving the automatic test signal sent by the automatic test circuit, the microcontroller unit 30 needs to output a signal for controlling the annular spot laser 10 to the control circuit 60, so as to control the control circuit 60 to output a control signal to the annular spot laser 10, so that the annular spot laser 10 outputs a status bit, that is, outputs a status signal, so that the microcontroller unit 30 can detect whether the annular spot laser 10 can respond normally, so as to generate a first light emitting control instruction and a second light emitting control instruction, so as to control the first light emitting control circuit and the second light emitting control circuit to control the annular spot laser 10 to emit outer ring light and center light.

[0088] In some embodiments, the control circuit 60 includes a first switch K1; wherein, the control circuit is controlled to generate a control signal of the annular spot laser according to the automated test signal to obtain a status signal output by the annular spot laser, including: controlling the first switch to close, and outputting a first signal to the control circuit according to the automated test signal to generate a control signal; and obtaining a status signal output by the annular spot laser to the microcontroller unit according to the control signal.

[0089] In this embodiment, the first switch K1 can be controlled by the microcontroller unit 30. After controlling the first switch K1 to close, the microcontroller unit 30 can output a first signal to the control circuit, so that the control circuit outputs a control signal to the annular spot laser 10, so as to control the annular spot laser 10 to output a state signal.

[0090] In some embodiments, the test tool also includes a state detection circuit; wherein, generating a first light control instruction and a second light control instruction according to a state signal includes: obtaining a second signal output by the state detection circuit; wherein the second signal is generated by the state detection circuit according to the state signal; and generating a first light control instruction and a second light control instruction according to the second signal.

[0091] In this embodiment, the annular spot laser 10 can output a state signal to the state detection circuit, and the state detection circuit can output a second signal to the microcontroller unit 30 according to the state signal. After receiving the second signal, the microcontroller unit 30 can determine the state of the annular spot laser 10, and then generate a first light output control instruction and a second light output control instruction.

[0092] In some embodiments, the first light output control circuit 40 includes a third switch K3, and the second light output control circuit 50 includes a fourth switch K4; wherein, the first light output control circuit 40 is controlled to output a first light output modulation signal according to a first light output control instruction output by the microcontroller unit 30, and the second light output control circuit 50 is controlled to output a second light output modulation signal according to a second light output control instruction output by the microcontroller unit 30, including: determining the light output mode of the annular spot laser 10; if the light output mode is a preset first mode, controlling the third switch K3 and the fourth switch K4 to be closed respectively to generate a first light output modulation signal and a second light output modulation signal; if the light output mode is a preset second mode, disconnecting the third switch K3 and the fourth switch K4 respectively; generating a first light output modulation signal and a second light output modulation signal respectively according to the first light output control instruction and the second light output control instruction.

[0093] In some embodiments, the test tool also includes a power regulation circuit 80; wherein the test method also includes: obtaining a power regulation signal of the power regulation circuit 80; controlling the outer ring light emission of the annular spot laser 10 according to the power regulation signal and the first light emission modulation signal, and controlling the center light emission of the annular spot laser 10 according to the power regulation signal and the second light emission modulation signal.

[0094] In this embodiment, after the microcontroller unit 30 receives the automatic test signal sent by the automatic test circuit, if it receives the power adjustment signal output by the power adjustment circuit 80, the microcontroller unit 30 can generate the first light emission control instruction and the second light emission control instruction according to the power adjustment signal, thereby causing the annular spot laser 10 to emit outer ring light and center light according to the first light emission control instruction and the second light emission control instruction.

[0095] At the same time, when the annular spot laser 10 is already in the state of outer ring light emission and center light emission, if it receives a power adjustment signal output by the power adjustment circuit 80, the annular spot laser 10 can emit outer ring light and center light of corresponding power according to the power adjustment signal output by the power adjustment circuit 80.

[0096] In some embodiments, the power regulation circuit 80 includes a fifth switch K5 ; before obtaining the power regulation signal of the power regulation circuit 80 , the method further includes: controlling the fifth switch K5 to close to generate the power regulation signal.

[0097] In this embodiment, a potentiometer is further provided in the power regulating circuit 80. When the annular spot laser 10 is required to emit outer ring light and center light of corresponding power, the potentiometer can be adjusted in advance. After the potentiometer is adjusted, the fifth switch K5 can be closed to generate a power regulating signal.

[0098] In some embodiments, the power regulating circuit 80 includes a fifth switch K5 ; wherein, after obtaining the power regulating signal of the power regulating circuit 80 , it also includes: sending the power regulating signal to the microcontroller unit 30 to display the light output power of the annular spot laser 10 .

[0099] In this embodiment, the microcontroller unit 30 can also collect the light output power of the annular spot laser 10 from the power regulation circuit 80, and input the collected light output power into the OLED screen for display, so as to visualize the light output power of the annular spot laser 10.

[0100] In some embodiments, the test tooling also includes a copy machine control circuit 60 and a first channel detection circuit and a second channel detection circuit; wherein the test method also includes: if a copy machine signal input by the copy machine control circuit is received, obtaining the first state information input by the first channel detection circuit and the second state information input by the second channel detection circuit; if the first state information is the preset first information, determining whether the second state information is the preset second information; if the second state information is the second information, generating a third light output control instruction and a fourth light output control instruction; according to the third light output control instruction and the fourth light output control instruction, respectively controlling the first light output control circuit to output a third light output modulation signal and a fourth light output modulation signal; according to the third light output modulation signal and the fourth light output modulation signal, respectively controlling the outer ring light output and the center light output of the annular spot laser to perform a copy machine test on the annular spot laser.

[0101] In this embodiment, the test tool can also perform a copy test on the annular spot laser 10. When the copy test is required for the annular spot laser 10, a copy signal can be output through the copy control circuit 60. After the microcontroller unit 30 receives the copy signal, it is necessary to first close the channel corresponding to the current channel lens of the optical shutter of the annular spot laser 10. The closed state can be determined by obtaining the first state information input by the first channel detection circuit. After determining that the first state information is the preset first information, it can be determined that the channel corresponding to the current channel lens of the optical shutter of the annular spot laser 10 is in a closed state. At this time, the channel corresponding to the channel lens where the copy machine test is located can be turned on, and the second state information input by the second channel detection circuit can be obtained to determine that after determining that the second state information is the preset second information, it can be determined that the channel lens where the copy machine test is located is in the turned-on state, and then the third light output control instruction and the fourth light output control instruction can be generated to control the first light output control circuit to output the third light output modulation signal and the fourth light output modulation signal, so that the outer ring light output and the center light output of the annular spot laser can be controlled according to the third light output modulation signal and the fourth light output modulation signal, respectively, to perform a copy machine test on the annular spot laser. Among them, the first channel detection circuit and the second channel detection circuit can be implemented using the channel detection circuit provided by the present application.

[0102] In some embodiments, the test tool also includes a power feedback circuit 100 and a display circuit 120; after controlling the outer ring light output of the ring spot laser 10 according to the first light output modulation signal, and controlling the center light output of the ring spot laser 10 according to the second light output modulation signal, it also includes: according to the power feedback signal output by the ring spot laser 10, obtaining the output power of the ring spot laser 10 from the power feedback circuit 100; inputting the output power of the ring spot laser 10 into the display circuit 120 to display the outer ring light output power and the center light output power of the ring spot laser 10.

[0103] In this embodiment, the test fixture is also provided with a power feedback circuit and a display circuit. When the annular spot laser 10 emits outer ring light and center light, the outer ring light output power and center light output power of the annular spot laser 10 can be output to the microcontroller unit 30 through the power feedback circuit 100. After the microcontroller unit 30 receives the outer ring light output power and center light output power of the annular spot laser 10, the outer ring light output power and center light output power of the annular spot laser 10 can be displayed through the display circuit.

[0104] The test method of the annular spot laser 10 provided in the present application initializes the test fixture of the annular spot laser, and generates a first light emission control instruction and a second light emission control instruction according to an automatic test signal sent by an automatic test circuit; controls the first light emission control circuit to output a first light emission modulation signal according to the first light emission control instruction, and controls the second light emission control circuit to output a second light emission modulation signal according to the second light emission control instruction; controls the outer ring light emission of the annular spot laser according to the first light emission modulation signal, and controls the center light emission of the annular spot laser according to the second light emission modulation signal, which not only realizes the test of the annular spot laser, but also can perform one-key automatic test on the annular spot laser, greatly improving the test efficiency of the laser.

[0105] In some embodiments, the present application also provides a testing system for an annular spot laser, comprising: An initialization unit, used to initialize the test fixture of the annular spot laser; A generating unit, used for generating a first light emitting control instruction and a second light emitting control instruction according to an automatic test signal sent by an automatic test circuit; A first control unit, used to control the first light output control circuit to output a first light output modulation signal according to a first light output control instruction, and to control the second light output control circuit to output a second light output modulation signal according to a second light output control instruction; The second control unit is used to control the outer ring light emission of the annular spot laser according to the first light emission modulation signal, and to control the center light emission of the annular spot laser according to the second light emission modulation signal.

[0106] The test system for the annular spot laser provided in the embodiment of the present application is used to execute the test tooling for initializing the annular spot laser mentioned above, and generate a first light emission control instruction and a second light emission control instruction according to an automated test signal sent by an automatic test circuit; control the first light emission control circuit to output a first light emission modulation signal according to the first light emission control instruction, and control the second light emission control circuit to output a second light emission modulation signal according to the second light emission control instruction; control the outer ring light emission of the annular spot laser according to the first light emission modulation signal, and control the center light emission of the annular spot laser according to the second light emission modulation signal.

[0107] It should be noted that those skilled in the art can clearly understand that the specific implementation process of the test system and each unit of the annular spot laser can refer to the corresponding description in the aforementioned method embodiment, and for the convenience and brevity of description, it will not be repeated here.

[0108] It should also be noted that the above-mentioned ring spot laser testing system can be burned into the microcontroller unit 30 in the form of an application program, and the microcontroller unit 30 is used to execute the testing method of the ring spot laser 10 provided in this application.

[0109] The above is only a specific implementation of the present application, but the protection scope of the present application is not limited thereto. Any technician familiar with the technical field can easily think of various equivalent modifications or replacements within the technical scope disclosed in the present application, and these modifications or replacements should be included in the protection scope of the present application. Therefore, the protection scope of the present application shall be based on the protection scope of the claims.

Claims

1. A test fixture for annular spot laser, characterized in that: include: Automatic testing circuits; A microcontroller unit, wherein a first input end of the microcontroller unit is electrically connected to the automatic test circuit, and a first output end of the microcontroller unit is electrically connected to a control end of the annular spot laser; A first light output control circuit is electrically connected to the first input end of the annular spot laser and the second output end of the microcontroller unit; A second light output control circuit is electrically connected to the second input end of the annular spot laser and the third output end of the microcontroller unit; The automatic test circuit is configured to request the microcontroller unit to control the light emission of the annular spot laser, the first light emission control circuit is configured to control the outer ring light emission of the annular spot laser, and the second light emission control circuit is configured to control the center light emission of the annular spot laser.

2. The test fixture for the annular spot laser according to claim 1, characterized in that: The test fixture also includes a control circuit; Wherein, one end of the control circuit is electrically connected to the first output end of the microcontroller unit, and the other end of the control circuit is electrically connected to the control end of the annular spot laser; or / and, The test fixture also includes a state detection circuit; Wherein, one end of the state detection circuit is electrically connected to the state output end of the annular spot laser, and the other end of the state detection circuit is electrically connected to the second input end of the microcontroller unit.

3. The test fixture for the annular spot laser according to claim 2, characterized in that: The control circuit comprises: A first optical coupler, wherein a first input terminal of the first optical coupler is electrically connected to a first output terminal of the microcontroller unit, and a first output terminal of the first optical coupler is grounded; a first switch, wherein a first end of the first switch is electrically connected to a second input end of the first optical coupler, a second end of the first switch is electrically connected to a second output end of the first optical coupler, and a third end of the first switch is electrically connected to a control end of the annular spot laser; a first light emitting diode, wherein an anode of the first light emitting diode is electrically connected to a third end of the first switch, and a cathode of the first light emitting diode is grounded; or / and, The state detection circuit comprises: A second optical coupler, wherein a first input end of the second optical coupler is electrically connected to a state output end of the annular spot laser, a first output end of the second optical coupler is grounded, a second input end of the second optical coupler is connected to a first power supply, and a second output end of the second optical coupler is electrically connected to a second input end of the microcontroller unit; A first filter circuit, one end of which is electrically connected to the second output end of the second optical coupler and the second input end of the microcontroller unit, and the other end of the first filter circuit is grounded.

4. The test fixture for the annular spot laser according to claim 1, characterized in that: The automatic test circuit comprises: a second switch, one end of which is connected to a second power source; a third optical coupler, wherein a first input end of the third optical coupler is electrically connected to the other end of the second switch, a first output end of the third optical coupler is grounded, a second input end of the third optical coupler is connected to a third power supply, and a second output end of the third optical coupler is electrically connected to a first input end of the microcontroller unit; a second filtering circuit, one end of which is electrically connected to the first input end of the microcontroller unit and the second output end of the third optical coupler, and the other end of which is grounded; or / and, The first light output control circuit comprises: a third switch, one end of the third switch being connected to a fourth power supply, and the other end of the third switch being electrically connected to the first input end of the annular spot laser; A second light emitting diode, wherein the anode of the second light emitting diode is electrically connected to the other end of the third switch and the first input end of the annular spot laser, and the other end of the second light emitting diode is grounded; a fourth optical coupler, wherein a first input end of the fourth optical coupler is electrically connected to a second output end of the microcontroller unit, a first output end of the fourth optical coupler is grounded, a second input end of the fourth optical coupler is connected to a fifth power supply, and a second output end of the fourth optical coupler is electrically connected to a first input end of the annular spot laser; a third filtering circuit, one end of which is electrically connected to the second output end of the fourth optical coupler and the first input end of the annular spot laser, and the other end of which is grounded; or / and, The second light output control circuit comprises: a fourth switch, one end of the fourth switch being connected to a sixth power supply, and the other end of the fourth switch being electrically connected to a second input end of the annular spot laser; A third light emitting diode, wherein the anode of the third light emitting diode is electrically connected to the other end of the fourth switch and the second input end of the annular spot laser, and the other end of the third light emitting diode is grounded; a fifth optical coupler, wherein a first input end of the fifth optical coupler is electrically connected to a third output end of the microcontroller unit, a first output end of the fifth optical coupler is grounded, a second input end of the fifth optical coupler is connected to a seventh power supply, and a second output end of the fifth optical coupler is electrically connected to a second input end of the annular spot laser; A fourth filter circuit, one end of which is electrically connected to the second output end of the fifth optical coupler and the second input end of the annular spot laser, and the other end of which is grounded.

5. The test fixture for the annular spot laser according to claim 1, characterized in that: The test fixture also includes a power regulation circuit; Wherein, one end of the power regulating circuit is connected to the eighth power supply, and the other end of the power regulating circuit is electrically connected to the power regulating end of the annular spot laser and the third input end of the microcontroller unit respectively; or / and, The test fixture also includes a copy machine control circuit; Wherein, one end of the copy machine control circuit is connected to the ninth power supply, and the other end of the copy machine control circuit is electrically connected to the fourth input end of the microcontroller unit; or / and, The test fixture also includes a power feedback circuit; Wherein, one end of the power feedback circuit is electrically connected to the feedback end of the annular spot laser, and the other end of the power feedback circuit is electrically connected to the fifth input end of the microcontroller unit.

6. The test fixture for the annular spot laser according to claim 5, characterized in that: The power regulation circuit comprises: a fifth switch, one end of which is connected to an eighth power source; a potentiometer, one end of which is electrically connected to the other end of the fifth switch; A first voltage follower, wherein a first input terminal of the first voltage follower is electrically connected to the other terminal of the potentiometer, a second input terminal of the first voltage follower is electrically connected to an output terminal of the voltage follower, and an output terminal of the first voltage follower is electrically connected to a power adjustment terminal of the annular spot laser and a third input terminal of the microcontroller unit, respectively.

7. The test fixture for the annular spot laser according to claim 5, characterized in that: The copy machine control circuit comprises: a sixth switch, one end of which is connected to the ninth power supply; a sixth optical coupler, wherein a first input end of the sixth optical coupler is electrically connected to the other end of the sixth switch, a first output end of the sixth optical coupler is grounded, a second input end of the sixth optical coupler is connected to a tenth power supply, and a second output end of the sixth optical coupler is electrically connected to a fourth input end of the microcontroller unit; a sixth filtering circuit, one end of which is electrically connected to the second output end of the sixth optical coupler and the fourth input end of the microcontroller unit, and the other end of which is grounded; or / and, The power feedback circuit comprises: a seventh filter circuit, one end of the seventh filter circuit being electrically connected to the feedback end, and the other end of the seventh filter circuit being grounded; A second voltage follower, wherein the first input end of the second voltage follower is electrically connected to one end of the seventh filter circuit, the second input end of the second voltage follower is electrically connected to the feedback end of the annular spot laser, and the output end of the second voltage follower is electrically connected to the fifth input end of the microcontroller unit.

8. The test fixture for annular spot laser according to claim 1, characterized in that: The test fixture also includes a display circuit; The display circuit is electrically connected to the fourth output terminal of the microcontroller unit and is configured to respectively display the outer ring light and the center light of the annular spot laser.

9. The test fixture for annular spot laser according to claim 1, characterized in that: The test fixture also includes a channel detection circuit; Among them, one end of the channel detection circuit is electrically connected to the channel signal output end of the annular spot laser, and the other end of the channel detection circuit is electrically connected to the sixth input end of the microcontroller unit; the channel detection circuit is configured to detect the channel lens state of the annular spot laser.

10. The test fixture for annular spot laser according to claim 9, characterized in that: The channel detection circuit comprises: a seventh optical coupler, wherein a first input end of the seventh optical coupler is electrically connected to a channel signal output end of the annular spot laser, a first output end of the seventh optical coupler is grounded, a second input end of the seventh optical coupler is connected to a twelfth power supply, and a second output end of the seventh optical coupler is electrically connected to a sixth input end of the microcontroller unit; An eighth filtering circuit, one end of the eighth filtering circuit is electrically connected to the second output end of the seventh optical coupler and the sixth input end of the microcontroller unit, and the other end of the eighth filtering circuit is grounded.

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