Industrial terminal test system, method, equipment and medium

By adding scene management modules and instrument management modules to the industrial terminal testing system, dynamically adjusting the test parameters, the problem of test results deviation in complex industrial environments is solved, and higher testing accuracy and stability are achieved.

CN119883922APending Publication Date: 2025-04-25CHINA UNITED NETWORK COMM GRP CO LTD +2
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Patent Information

Application Number
CN202510039120.0
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-01-09
Publication Date
2025-04-25

AI Technical Summary

Technical Problem

The existing industrial terminal testing system is difficult to meet the testing needs in complex industrial environments, and traditional methods are difficult to adjust the instrument parameters, resulting in a deviation between the simulation test results and the actual industrial scenarios.

Method used

It provides an industrial terminal testing system, with a scene management module and an instrument management module added. By monitoring test data from multiple dimensions in real time, dynamically adjusting scene parameters and instrument parameters to ensure the accuracy and stability of test results.

Benefits of technology

It improves the adaptability and accuracy of simulation tests, reduces errors caused by environmental changes, and improves test accuracy and stability.

✦ Generated by Eureka AI based on patent content.

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Abstract

The embodiment of the invention provides an industrial terminal testing system, method and device and a medium, and relates to the technical field of industrial testing. The system comprises a management plane and a service plane, wherein the management plane is connected with the service plane; the management plane is used for configuring test parameters of the service plane; and the business surface is used for testing the industrial terminal based on the test parameters, collecting and analyzing test data to obtain a test result, and feeding back the test data and the test result to the management surface. The method comprises the steps that a management plane determines test parameters based on a test task and configures test parameters of a business plane, and the test parameters comprise a test environment, a test scene, a test case and a test script; the business side tests the industrial terminal according to the test parameters and collects test data; and the business surface performs data analysis on the test data to obtain a test result. According to the system and the method, the adaptability and the accuracy of simulation testing are improved, errors caused by environmental changes are reduced, and the testing precision is improved.
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Description

Technical Field

[0001] The present application relates to the field of industrial testing technology, and in particular to a testing system, method, equipment and medium for an industrial terminal. Background Art

[0002] With the widespread application of mobile communication technology in the industrial field, mobile communication technology provides technical support for industrial automation, intelligent manufacturing and other scenarios, promoting the development of industrial automation and intelligence.

[0003] At present, the test system of industrial terminals receives physical information and business relationship information input by users, simulates data interaction between industrial terminals, generates test data traffic, performs specific test scenario simulation and performance testing, and provides terminal performance evaluation.

[0004] However, due to the complexity of the industrial environment, the existing industrial terminal testing systems are difficult to meet the testing needs in complex industrial environments; under different simulation test tasks and environmental conditions, traditional methods are difficult to adjust instrument parameters, resulting in deviations between simulation test results and actual industrial scenarios. Summary of the invention

[0005] The test system, method, equipment and medium for industrial terminals provided in the embodiments of the present application improve the adaptability and accuracy of simulation tests, reduce errors caused by environmental changes, and improve test accuracy and stability.

[0006] In a first aspect, an embodiment of the present application provides a testing system for an industrial terminal, including:

[0007] A management plane and a business plane, wherein the management plane is connected to the business plane;

[0008] The management plane is used to configure the test parameters of the business plane, and the test parameters include a test environment, a test scenario, a test case, and a test script;

[0009] The business plane is used to test the industrial terminal based on the test parameters, collect and analyze test data, obtain test results, and feed back the test data and test results to the management plane;

[0010] The management plane includes: an environment management module, a scenario management module, a use case management module, a script management module, an instrument management module and an indicator collection module;

[0011] The environment management module is used to configure basic environment parameters;

[0012] The scenario management module is used to determine the optimal scenario parameters according to the test data of multiple dimensions monitored in real time by the test tasks and the business plane;

[0013] The test case management module is used for test case management;

[0014] The script management module is used for test script management;

[0015] The instrument management module is used to adjust and record instrument parameters of the test instrument in real time;

[0016] The indicator collection module is used to receive test data and test results sent by the business plane.

[0017] In a possible implementation manner, the business plane includes a first industrial computer, an industrial terminal, a test instrument, and a second industrial computer;

[0018] The first industrial computer and the second industrial computer are both connected to the management plane, and the first industrial computer is used to receive test cases and test scripts issued by the management plane, and to feed back test data and test results;

[0019] The second industrial computer is used to configure the test environment, test scenarios and instrument parameters;

[0020] The test instrument is connected to the first industrial computer and the second industrial computer through the industrial terminal, and is used to perform test processing on the industrial terminal based on the test case and the test script.

[0021] In a second aspect, an embodiment of the present application provides a method for testing an industrial terminal, including:

[0022] The management plane determines the test parameters based on the test tasks and configures the test parameters of the business plane. The test parameters include the test environment, test scenarios, test cases, and test scripts.

[0023] The business plane tests the industrial terminal according to the test parameters and collects test data;

[0024] The business side performs data analysis on the test data to obtain test results.

[0025] In a possible implementation, the test data includes feedback data of multiple dimensions, the test task includes multiple test subtasks, and the management plane determines scenario parameters based on the test task and configures a test scenario of the business plane, including:

[0026] For any one of the plurality of test subtasks, the scenario management module generates a corresponding initial parameter cluster, wherein the initial parameter cluster includes a plurality of scenario parameters and a weight corresponding to each scenario parameter;

[0027] Based on the feedback data of the multiple dimensions monitored in real time by the business plane, weight analysis is performed on each scenario parameter, and a weight corresponding to each scenario parameter is adjusted, wherein the dimension is used to indicate a first association relationship between the feedback data and the scenario parameter;

[0028] Based on the adjusted weights, performing iterative optimization processing on the initial parameter cluster until the initial parameter cluster converges, and taking the converged initial parameter cluster as an optimal parameter set;

[0029] Based on the optimal parameter set, a test scenario is determined, and the test scenario of the service plane is configured.

[0030] In a possible implementation, based on the feedback data of the multiple dimensions monitored in real time by the business plane, weight analysis is performed on each scenario parameter, and the weight corresponding to each scenario parameter is adjusted, including:

[0031] Determine a feedback matrix based on the feedback data of the multiple dimensions monitored in real time by the business plane;

[0032] For feedback data of any one dimension among the feedback data of the multiple dimensions, calculating the gradient of the feedback matrix with respect to the feedback data;

[0033] The weight corresponding to each scene parameter is adjusted according to the gradient and a first learning rate, wherein the first learning rate is used to control the magnitude of the weight adjustment.

[0034] In a possible implementation, the test process includes multiple time steps, the test data includes test instrument operation status data corresponding to each time step, and the method further includes:

[0035] Based on the test task, the use case management module determines the test target corresponding to each time step;

[0036] The instrument management module determines the actual output of the test instrument corresponding to each time step according to the test instrument operation status data corresponding to each time step monitored in real time by the business plane;

[0037] The difference between the test target and the actual output corresponding to each time step is taken as the error corresponding to each time step, and the corresponding error change rate is calculated, wherein the error and the error change rate are used to indicate the deviation between the actual output and the target output of the test instrument, and the error change rate is the rate of change of the error over time;

[0038] The instrument parameters are adjusted in real time according to the error and the corresponding second learning rate, the error change rate and the corresponding third learning rate, the second learning rate is used to control the influence of the error on the instrument parameter adjustment, and the third learning rate is used to control the influence of the error change rate on the instrument parameter adjustment.

[0039] In a possible implementation, the method further includes:

[0040] The instrument management module determines an initial second learning rate and an initial third learning rate;

[0041] Adjusting the second learning rate by using the initial second learning rate and the first feedback parameter;

[0042] The third learning rate is adjusted by an initial third learning rate and a second feedback parameter, wherein the first feedback parameter and the second feedback parameter are used to control the adjustment speed of the error and the error change rate, respectively.

[0043] In a possible implementation, the method further includes:

[0044] For feedback data of any one dimension among the feedback data of the multiple dimensions, the instrument management module determines related feedback data of the feedback data in other dimensions, and determines a second association relationship between the feedback data and the feedback data;

[0045] Based on the second association relationship, the feedback data and the related feedback data are jointly processed, and based on the associated feedback data after the joint processing, the weight corresponding to each scene parameter is adjusted.

[0046] In a third aspect, an embodiment of the present application provides a test device for an industrial terminal, including: a memory, a processor;

[0047] The memory stores computer-executable instructions;

[0048] The processor executes the computer-executable instructions stored in the memory, so that the processor executes the above second aspect and / or various possible implementations of the second aspect.

[0049] In a fourth aspect, an embodiment of the present application provides a computer-readable storage medium, in which computer-executable instructions are stored. When the computer-executable instructions are executed by a processor, they are used to implement the above second aspect and / or various possible implementations of the second aspect.

[0050] In a fifth aspect, an embodiment of the present application provides a computer program product, including a computer program, which, when executed by a processor, implements the above second aspect and / or various possible implementations of the second aspect.

[0051] The test system, method, device and medium for industrial terminals provided in the embodiments of the present application, through the scenario management module of the system, determine the optimal scenario parameters in a dynamically changing environment based on the test data of multiple dimensions monitored in real time by the business side, thereby improving the adaptability and accuracy of the simulation test; and also through the instrument management module of the system, adjust and record the instrument parameters of the test instrument in real time, so that the test instrument can maintain stable operation in a complex environment, reduce errors caused by environmental changes, and improve test accuracy and stability. BRIEF DESCRIPTION OF THE DRAWINGS

[0052] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present application and, together with the description, serve to explain the principles of the present application.

[0053] Figure 1 A schematic diagram of a test system for an industrial terminal provided in an embodiment of the present application Figure 1 ;

[0054] Figure 2 A schematic diagram of a test system for an industrial terminal provided in an embodiment of the present application Figure 2 ;

[0055] Figure 3 A schematic diagram of a process for testing an industrial terminal provided in an embodiment of the present application Figure 1 ;

[0056] Figure 4 A schematic diagram of a process for testing an industrial terminal provided in an embodiment of the present application Figure 2 ;

[0057] Figure 5 A schematic diagram of the structure of a test device for an industrial terminal provided in an embodiment of the present application.

[0058] The above drawings have shown clear embodiments of the present application, which will be described in more detail later. These drawings and text descriptions are not intended to limit the scope of the present application in any way, but to illustrate the concept of the present application to those skilled in the art by referring to specific embodiments.

[0059] Description of reference numerals:

[0060] 11-Management side; 12-Business side; 111-Environment management module; 112-Scenario management module; 113-Use case management module; 114-Script management module; 115-Instrument management module; 116-Indicator collection module; 121-First industrial computer; 122-Industrial terminal; 123-Test instrument; 124-Second industrial computer. DETAILED DESCRIPTION

[0061] Exemplary embodiments will be described in detail herein, examples of which are shown in the accompanying drawings. When the following description refers to the drawings, the same numbers in different drawings represent the same or similar elements unless otherwise indicated. The implementations described in the following exemplary embodiments do not represent all implementations consistent with the present application. Instead, they are merely examples of devices and methods consistent with some aspects of the present application as detailed in the appended claims.

[0062] With the widespread application of mobile communication technology in the industrial field, mobile communication technology provides technical support for industrial automation, intelligent manufacturing and other scenarios, promoting the development of industrial automation and intelligence.

[0063] At present, the test system of industrial terminals receives physical information and business relationship information input by users, simulates data interaction between industrial terminals, generates test data traffic, performs specific test scenario simulation and performance testing, and provides terminal performance evaluation.

[0064] However, due to the complexity of the industrial environment, the existing industrial terminal test system is difficult to meet the test requirements in complex industrial environments. The current simulation test system usually relies on preset models and fixed parameters, which limits its ability to adapt to dynamically changing scenarios. In complex environments, when factors such as electromagnetic interference or signal shielding change, fixed parameters cannot effectively respond, resulting in a decrease in the accuracy and reliability of simulation test results; under different simulation test tasks and environmental conditions, traditional methods are difficult to adjust instrument parameters, resulting in deviations between simulation test results and actual industrial scenarios.

[0065] In response to the above problems, the present application provides a test system and test method for industrial terminals. The test system is added with a scenario management module for determining the optimal scenario parameters based on the test data of multiple dimensions monitored in real time by the test task and the business side. The test method performs weight analysis on each scenario parameter based on the feedback data of the multiple dimensions monitored in real time by the business side through the scenario management module, and performs iterative optimization processing on the initial parameter cluster determined based on the test task, so as to automatically adapt to the changes of complex industrial scenarios during the execution of the simulation task, and improve the adaptability and accuracy of the simulation test. The test system is added with an instrument management module for adjusting and recording the instrument parameters of the test instrument in real time. The test method adjusts the instrument parameters through the instrument management module according to the test objectives and actual outputs corresponding to each time step, so that the test instrument can maintain stable operation in a complex environment and reduce errors caused by environmental changes.

[0066] The technical solution of the present application and how the technical solution of the present application solves the above-mentioned technical problems are described in detail below with specific embodiments. The following specific embodiments can be combined with each other, and the same or similar concepts or processes may not be repeated in some embodiments. The embodiments of the present application will be described below in conjunction with the accompanying drawings.

[0067] Figure 1 A schematic diagram of a test system for an industrial terminal provided in an embodiment of the present application Figure 1 ,like Figure 1 As shown, the test system 1 includes: a management plane 11 and a business plane 12, the management plane 11 is connected to the business plane 12, the management plane 11 is used to configure the test parameters of the business plane 12; the business plane 12 is used to test the industrial terminal based on the test parameters, collect and analyze the test data, obtain the test results, and feed back the test data and the test results to the management plane 11;

[0068] The management plane is the part of the test system that manages and controls operations; the business plane is the part of the test system that executes test tasks; the test parameters include the test environment, test scenario, test case, and test script. The test environment is a collection of hardware and software resources required for testing, including operating system, database, network configuration, etc. The test scenario is a simulation of the actual industrial scenario; the test case is determined based on the test task and test scenario, including the purpose, conditions, input, expected results, etc. of the test; the test script is the automation code to implement the test case.

[0069] The management plane 11 configures the test environment, test scenarios, test cases, test scripts and other test parameters of the business plane 12; based on the test environment and test scenarios configured by the management plane 11, the business plane 12 tests the industrial terminals through test cases and test scripts, collects and analyzes the test data, obtains the test results, and feeds back the test data and test results to the management plane 11.

[0070] Among them, the management plane 11 includes: an environment management module 111, a scenario management module 112, a use case management module 113, a script management module 114, an instrument management module 115 and an indicator collection module 116; the industrial terminal can be, for example, a 5G industrial terminal, a 4G industrial terminal, etc.

[0071] The environment management module 111 is used to configure basic environment parameters;

[0072] The environment management module 111 is used to configure basic environment parameters. The test environment needs to be as consistent as possible with the actual operating environment to ensure the accuracy of the test results.

[0073] The scenario management module 112 is used to determine the optimal scenario parameters according to the test data of multiple dimensions monitored in real time by the test tasks and the business plane;

[0074] Among them, the test tasks are used to indicate the test requirements; and the test data in multiple dimensions are used to indicate the dynamic changes of the test scenarios.

[0075] The scenario management module 112 continuously optimizes the test scenario parameters based on the dynamic changes of the test tasks and test scenarios to adapt to the constantly changing external scenario factors and determine the optimal scenario parameters. The external scenario factors may be, for example, electromagnetic interference, signal shielding, etc.

[0076] A test case management module 113, used for test case management;

[0077] The use case management module 113 sends the test case to the business plane 12.

[0078] A script management module 114, used for test script management;

[0079] The script management module 114 sends the test script to the business plane 12 .

[0080] An instrument management module 115, for adjusting and recording instrument parameters of the test instrument in real time;

[0081] During the testing of industrial terminals, the instrument management module 115 records the instrument parameters of the test instrument and adaptively optimizes the instrument parameters based on real-time errors and test instrument operating status data to ensure that the system is closer to the actual industrial operating status in complex simulation scenarios, thereby improving test accuracy.

[0082] The indicator collection module 116 is used to receive the test data and test results sent by the business plane.

[0083] Figure 2 A schematic diagram of a test system for an industrial terminal provided in an embodiment of the present application Figure 2 , in one possible implementation, such as Figure 2 As shown, the business plane 12 includes a first industrial computer 121, an industrial terminal 122, a test instrument 123 and a second industrial computer 124;

[0084] The first industrial computer 121 and the second industrial computer 124 are both connected to the management plane 11. The first industrial computer 121 is used to receive test cases and test scripts issued by the management plane 11, and to feedback test data and test results; the second industrial computer 124 is used to configure the test environment, test scenarios, and instrument parameters;

[0085] In this embodiment, the first industrial computer 121 and the second industrial computer 124 are both connected to the management plane 11. The management plane 11 configures the test environment, test scenario and instrument parameters through the second industrial computer 124. The test instrument 123 is located in the shielding box. Through the test environment, test scenario, instrument parameters and shielding box, various industrial scenarios can be simulated.

[0086] The first industrial computer 121 receives the test cases and test scripts issued by the management plane 11. The business plane 12 is responsible for the collection and real-time transmission of data flows. The first industrial computer 121 feeds back test data and test results to the management plane 11, so that the data flows generated during the test can be monitored throughout and analyzed in detail.

[0087] The test instrument 123 is connected to the first industrial computer 121 and the second industrial computer 124 through the industrial terminal 122, and is used to perform test processing on the industrial terminal 122 based on test cases and test scripts.

[0088] The test instrument 123 is connected to the first industrial computer 121 and the second industrial computer 124 through the industrial terminal 122 . The first industrial computer 121 controls the test instrument 123 to perform test processing on the industrial terminal 122 based on the test cases and test scripts received from the management plane 11 .

[0089] The industrial terminal testing system provided in the present application determines the optimal scenario parameters in a dynamically changing environment based on the test data of multiple dimensions monitored in real time by the business side through the scenario management module of the system, thereby improving the adaptability and accuracy of the simulation test. The instrument management module of the system also adjusts and records the instrument parameters of the test instrument in real time, so that the test instrument can maintain stable operation in a complex environment, reduce errors caused by environmental changes, and improve test accuracy and stability.

[0090] Figure 3 A schematic diagram of a process for testing an industrial terminal provided in an embodiment of the present application Figure 1 ,like Figure 3 As shown, the execution subject may be, for example, Figure 1 or Figure 2 The test system shown in the figure, a test method for an industrial terminal provided in this embodiment, includes:

[0091] S301. The management plane determines test parameters based on the test task and configures the test parameters of the business plane.

[0092] The test task may be input through a human-computer interaction interface, or may be pre-set and stored in the management plane.

[0093] Based on the test task, the management plane determines the test environment, test scenario, test case, test script, etc. corresponding to the test task, and configures the test parameters for the business plane, including sending the test case and test script to the first industrial computer, configuring the test environment, test scenario and instrument parameters through the second industrial computer, and simulating the industrial scenario corresponding to the test task.

[0094] S302: The business plane tests the industrial terminal according to the test parameters and collects test data;

[0095] The business side tests industrial terminals and collects test data in industrial scenarios based on test environments, test scenarios, and instrument parameter simulations.

[0096] S303: The business analyzes the test data to obtain a test result.

[0097] The business plane analyzes the collected test data, obtains the test results, and feeds the test data and test results back to the management plane. In addition, during the test process, the test data can also be fed back to the management plane, so that the data flow generated during the test process can be monitored throughout the process and analyzed in detail.

[0098] In a possible implementation, when performing industrial terminal testing, instrument parameters can also be adjusted in real time. In this embodiment, the test process includes multiple time steps, and the test data includes the test instrument operation status data corresponding to each time step. The specific process is as follows:

[0099] Based on the test task, the use case management module determines the test target corresponding to each time step;

[0100] According to the test task, the case management module determines the test case, wherein the test case includes a test target corresponding to each time step.

[0101] The instrument management module determines the actual output of the test instrument corresponding to each time step according to the test instrument operation status data corresponding to each time step monitored in real time by the business plane;

[0102] Among them, the test instrument operating status data includes signal output, signal frequency, voltage, current, noise, etc.

[0103] The instrument management module determines the actual output of the test instrument at each time step based on the test instrument operating status data such as signal output, signal frequency, voltage, current, noise, etc. corresponding to each time step monitored in real time by the business side.

[0104] The difference between the test target and the actual output corresponding to each time step is taken as the error corresponding to each time step, and the corresponding error change rate is calculated;

[0105] Among them, the error and error change rate are used to indicate the deviation between the actual output of the test instrument and the target output; the error change rate is the rate of change of the error over time.

[0106] The error corresponding to each time step is calculated using the following formula:

[0107]

[0108] in, is the error; is the actual output; For the test target.

[0109] In order to adjust the instrument parameters more accurately, the following formula is used to calculate the error change rate:

[0110]

[0111] in, is the error change rate.

[0112] According to the error and the corresponding second learning rate, the error change rate and the corresponding third learning rate, the instrument parameters are adjusted in real time;

[0113] The second learning rate is used to control the influence of the error on the adjustment of the instrument parameters, and the third learning rate is used to control the influence of the error change rate on the adjustment of the instrument parameters.

[0114] The following formula is used to adjust the instrument parameters in real time:

[0115]

[0116] Among them, P i (t+1) is the i-th parameter of the test instrument after adjustment; P i (t) is the i-th parameter of the test instrument before adjustment, α is the second learning rate, and β is the third learning rate.

[0117] Among them, the initial instrument parameter set is automatically generated through the task mapping function:

[0118]

[0119] in, is the initial instrument parameter set, each parameter represents a physical quantity related to the test instrument, It is a test task. is the initial environmental condition.

[0120] By adjusting and recording the instrument parameters of the test instrument in real time, the test instrument can maintain stable operation in a complex environment, reduce errors caused by environmental changes, and automatically adjust according to real-time errors, avoiding the limitations of fixed parameter presets.

[0121] In a possible implementation, when adjusting the instrument parameters, the adjustment speed of the instrument parameters can also be adjusted, and the specific process is as follows: the instrument management module determines an initial second learning rate and an initial third learning rate; adjusts the second learning rate by the initial second learning rate and the first feedback parameter; adjusts the third learning rate by the initial third learning rate and the second feedback parameter;

[0122] The first feedback parameter and the second feedback parameter are used to control the adjustment speed of the error and the error change rate respectively.

[0123] The second learning rate is adjusted using the following formula:

[0124]

[0125] Among them, α 0 is the initial second learning rate; k 1 is the first feedback parameter;

[0126] The third learning rate is adjusted using the following formula:

[0127]

[0128] Among them, β 0 is the initial second learning rate; k 2 is the first feedback parameter.

[0129] By dynamically adjusting the second learning rate and the third learning rate according to the error, the adjustment speed is further optimized to avoid too fast or too slow adjustment, thereby improving the test accuracy.

[0130] The testing method for industrial terminals provided in this application manages the test parameters corresponding to each test subtask on the management plane and configures the test parameters on the business plane. The business plane tests the industrial terminal according to the test parameters and collects test data to implement the testing of the industrial terminal. The linkage between the management plane and the business plane increases the flexibility of the environment, meets the testing requirements of the industrial private network, and ensures that the simulation effect is closer to the actual industrial scenario.

[0131] Figure 4 A schematic diagram of a process for testing an industrial terminal provided in an embodiment of the present application Figure 2 , the test data includes feedback data of multiple dimensions, and the test task includes multiple test subtasks. Figure 4 As shown, in this embodiment, in this embodiment, Figure 3Based on the embodiment, the management plane determines the scenario parameters based on the test task and configures the test scenario of the business plane. The method includes:

[0132] S401, for any one of the multiple test subtasks, the scenario management module generates a corresponding initial parameter cluster;

[0133] The initial parameter cluster includes a plurality of scene parameters and a weight corresponding to each scene parameter;

[0134] For any one of the multiple test subtasks, the scenario management module generates a corresponding initial parameter cluster according to the test requirements of the test subtask. The initial parameter cluster includes multiple scenario parameters and the weight corresponding to each scenario parameter. The scenario parameters may be, for example, electromagnetic interference intensity, signal shielding level, etc. The initial parameter cluster is the basic adjustment factor in the test process.

[0135] S402: Based on the feedback data of the multiple dimensions monitored in real time by the business plane, weight analysis is performed on each scenario parameter, and a weight corresponding to each scenario parameter is adjusted;

[0136] The dimension is used to indicate a first correlation relationship between the feedback data and the scenario parameters; the feedback data may be, for example, signal interference, network performance, etc., wherein the network performance includes network rate, network delay, etc.

[0137] In a possible implementation, based on the feedback data of the multiple dimensions monitored in real time on the business plane, a weight analysis is performed on each scenario parameter, and a specific process of adjusting the weight corresponding to each scenario parameter is described in detail:

[0138] Determine a feedback matrix based on the feedback data of the multiple dimensions monitored in real time by the business plane;

[0139] Among them, the feedback matrix is ​​used to indicate the actual overall performance of the test scenario.

[0140] After each test task is completed, the feedback data of the multiple dimensions monitored in real time by the business plane are summarized into a multi-dimensional feedback matrix F t :

[0141] The specific representation is as follows:

[0142]

[0143] Among them, F t is the feedback matrix at time t, and the elements in the matrix , Etc. represent feedback data of different dimensions.

[0144] For feedback data of any one dimension among the feedback data of the multiple dimensions, the gradient of the feedback matrix with respect to the feedback data is calculated; and the weight corresponding to each scene parameter is adjusted according to the gradient and the first learning rate.

[0145] Among them, the first learning rate is used to control the weight adjustment amplitude.

[0146] For feedback data of any one dimension among the feedback data of multiple dimensions, the gradient of the feedback matrix with respect to the feedback data is calculated.

[0147] The following formula is used to adjust the weight corresponding to each scene parameter:

[0148]

[0149] in, is the learning rate; is the feedback matrix F t Each dimension in the parameter p i impact.

[0150] By adjusting the weights corresponding to each scenario parameter, the authenticity and flexibility of the test can be improved.

[0151] In a possible implementation, when adjusting the weights corresponding to the scene parameters according to the feedback data of multiple dimensions, the multiple feedback data may be jointly processed to achieve the weight adjustment. The specific process is as follows:

[0152] For feedback data of any one dimension among the feedback data of the multiple dimensions, the instrument management module determines the related feedback data of the feedback data in other dimensions, and determines a second association relationship between the feedback data and the feedback data; based on the second association relationship, the feedback data and the related feedback data are jointly processed, and based on the associated feedback data after the joint processing, the weight corresponding to each scene parameter is adjusted.

[0153] Exemplarily, electromagnetic interference and signal shielding may be related to each other, and a second correlation relationship between electromagnetic interference and signal shielding is determined. Based on the second correlation relationship, electromagnetic interference and signal shielding are jointly processed, and based on the associated feedback data after the joint processing, the weight corresponding to each scene parameter is adjusted.

[0154] By collaboratively optimizing related parameters, the optimal combination of parameters can be found more efficiently, thereby improving test results and test accuracy.

[0155] S403, performing iterative optimization processing on the initial parameter cluster based on the adjusted weights until the initial parameter cluster converges, and taking the converged initial parameter cluster as an optimal parameter set;

[0156] According to the adjusted weights, the initial parameter cluster is iteratively optimized. The system performs iterative optimization through multiple rounds and converges to the optimal parameter set. The converged initial parameter cluster is used as the optimal parameter set, which can automatically adapt to changes in complex industrial scenarios during the execution of test tasks.

[0157] S404: Determine a test scenario based on the optimal parameter set, and configure the test scenario for the service plane.

[0158] The testing method for industrial terminals provided in the present application adjusts the weights corresponding to each scenario parameter based on feedback data of multiple dimensions monitored in real time by the business side, and determines the optimal scenario parameters based on the adjusted weights. It can automatically adapt to changes in complex industrial scenarios during the execution of simulation tasks, determine the optimal scenario parameters in a dynamically changing environment, improve the adaptability and accuracy of simulation tests, and enable the simulation system to be continuously optimized in complex scenarios.

[0159] Figure 5 This is a schematic diagram of the structure of a test device for an industrial terminal provided in an embodiment of the present application. Figure 5 As shown, the electronic device 50 provided in this embodiment includes: at least one processor 501 and a memory 502. Optionally, the device 50 also includes a communication component 503. The processor 501, the memory 502 and the communication component 503 are connected via a bus 504.

[0160] In a specific implementation process, at least one processor 501 executes the computer-executable instructions stored in the memory 502, so that at least one processor 501 executes the above method.

[0161] The specific implementation process of the processor 501 can be found in the above method embodiment, and its implementation principle and technical effect are similar, so this embodiment will not be repeated here.

[0162] In the above embodiments, it should be understood that the processor can be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), etc. A general-purpose processor can be a microprocessor or any conventional processor. The steps of the method disclosed in the invention can be directly implemented as a hardware processor, or can be implemented by a combination of hardware and software modules in the processor.

[0163] The memory may include a high-speed memory (Random Access Memory, RAM), and may also include a non-volatile memory (NVM), such as at least one disk storage.

[0164] The bus can be an Industry Standard Architecture (ISA) bus, a Peripheral Component Interconnect (PCI) bus, or an Extended Industry Standard Architecture (EISA) bus, etc. The bus can be divided into an address bus, a data bus, a control bus, etc. For ease of representation, the bus in the drawings of this application is not limited to only one bus or one type of bus.

[0165] The present application also provides a computer program product, including a computer program, which implements the above method when executed by a processor.

[0166] The present application also provides a computer-readable storage medium, in which computer-executable instructions are stored. When a processor executes the computer-executable instructions, the above method is implemented.

[0167] The above-mentioned readable storage medium can be implemented by any type of volatile or non-volatile storage device or a combination thereof, such as static random access memory (SRAM), electrically erasable programmable read-only memory (EEPROM), erasable programmable read-only memory (EPROM), programmable read-only memory (PROM), read-only memory (ROM), magnetic memory, flash memory, magnetic disk or optical disk. The readable storage medium can be any available medium that can be accessed by a general or special-purpose computer.

[0168] An exemplary readable storage medium is coupled to a processor so that the processor can read information from the readable storage medium and write information to the readable storage medium. Of course, the readable storage medium can also be a component of the processor. The processor and the readable storage medium can be located in an application specific integrated circuit (Application Specific Integrated Circuits, referred to as: ASIC). Of course, the processor and the readable storage medium can also exist in the device as discrete components.

[0169] The division of units is only a logical function division, and there may be other divisions in actual implementation, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be an indirect coupling or communication connection through some interface, device or unit, which can be electrical, mechanical or other forms.

[0170] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0171] In addition, each functional unit in each embodiment of the present invention may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit.

[0172] If the function is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention, or the part that contributes to the prior art, or the part of the technical solution, can be embodied in the form of a software product. The computer software product is stored in a storage medium, including several instructions for a computer device (which can be a personal computer, server, or network device, etc.) to perform all or part of the steps of the methods of each embodiment of the present invention. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), disk or optical disk, etc. Various media that can store program codes.

[0173] Those skilled in the art can understand that all or part of the steps of implementing the above-mentioned method embodiments can be completed by hardware related to program instructions. The aforementioned program can be stored in a computer-readable storage medium. When the program is executed, the steps of the above-mentioned method embodiments are executed; and the aforementioned storage medium includes: ROM, RAM, disk or optical disk and other media that can store program codes.

[0174] Finally, it should be noted that those skilled in the art will readily conceive of other embodiments of the present invention after considering the specification and practicing the invention disclosed herein. The present invention is intended to cover any variations, uses or adaptations of the present invention, which follow the general principles of the present invention and include common knowledge or customary technical means in the art not disclosed by the present invention, are not limited to the precise structure described above and shown in the drawings, and may be modified and changed in various ways without departing from the scope thereof. The scope of the present invention is limited only by the appended claims.

Claims

1. A test system for an industrial terminal, characterized in that: The test system comprises: a management plane and a business plane, wherein the management plane is connected to the business plane; The management plane is used to configure the test parameters of the business plane, and the test parameters include a test environment, a test scenario, a test case, and a test script; The business plane is used to test the industrial terminal based on the test parameters, collect and analyze test data, obtain test results, and feed back the test data and test results to the management plane; The management plane includes: an environment management module, a scenario management module, a use case management module, a script management module, an instrument management module and an indicator collection module; The environment management module is used to configure basic environment parameters; The scenario management module is used to determine the optimal scenario parameters according to the test data of multiple dimensions monitored in real time by the test tasks and the business plane; The test case management module is used for test case management; The script management module is used for test script management; The instrument management module is used to adjust and record instrument parameters of the test instrument in real time; The indicator collection module is used to receive test data and test results sent by the business plane.

2. The system according to claim 1, characterized in that The business plane includes a first industrial computer, an industrial terminal, a test instrument, and a second industrial computer; The first industrial computer and the second industrial computer are both connected to the management plane, and the first industrial computer is used to receive test cases and test scripts issued by the management plane, and to feed back test data and test results; The second industrial computer is used to configure the test environment, test scenarios and instrument parameters; The test instrument is connected to the first industrial computer and the second industrial computer through the industrial terminal, and is used to perform test processing on the industrial terminal based on the test case and the test script.

3. A method for testing an industrial terminal, characterized in that: Applied to the test system as claimed in claim 1 or 2, the method comprises: The management plane determines the test parameters based on the test tasks and configures the test parameters of the business plane. The test parameters include the test environment, test scenarios, test cases, and test scripts. The business plane tests the industrial terminal according to the test parameters and collects test data; The business side performs data analysis on the test data to obtain test results.

4. The method according to claim 3, characterized in that The test data includes feedback data of multiple dimensions, the test task includes multiple test subtasks, and the management plane determines scenario parameters based on the test task and configures the test scenario of the business plane, including: For any one of the plurality of test subtasks, the scenario management module generates a corresponding initial parameter cluster, wherein the initial parameter cluster includes a plurality of scenario parameters and a weight corresponding to each scenario parameter; Based on the feedback data of the multiple dimensions monitored in real time by the business plane, weight analysis is performed on each scenario parameter, and a weight corresponding to each scenario parameter is adjusted, wherein the dimension is used to indicate a first association relationship between the feedback data and the scenario parameter; Based on the adjusted weights, the initial parameter cluster is iteratively optimized until the initial parameter cluster converges, and the converged initial parameter cluster is used as the optimal parameter set; Based on the optimal parameter set, a test scenario is determined, and the test scenario of the service plane is configured.

5. The method according to claim 4, characterized in that The step of performing weight analysis on each scenario parameter based on the feedback data of the multiple dimensions monitored in real time by the business plane, and adjusting the weight corresponding to each scenario parameter, includes: Determine a feedback matrix based on the feedback data of the multiple dimensions monitored in real time by the business plane; For feedback data of any one dimension among the feedback data of the multiple dimensions, calculating the gradient of the feedback matrix with respect to the feedback data; The weight corresponding to each scene parameter is adjusted according to the gradient and a first learning rate, wherein the first learning rate is used to control the magnitude of the weight adjustment.

6. The method according to claim 3, characterized in that The test process includes multiple time steps, the test data includes test instrument operation status data corresponding to each time step, and the method further includes: Based on the test task, the use case management module determines the test target corresponding to each time step; The instrument management module determines the actual output of the test instrument corresponding to each time step according to the test instrument operation status data corresponding to each time step monitored in real time by the business plane; The difference between the test target and the actual output corresponding to each time step is taken as the error corresponding to each time step, and the corresponding error change rate is calculated, wherein the error and the error change rate are used to indicate the deviation between the actual output and the target output of the test instrument, and the error change rate is the rate of change of the error over time; The instrument parameters are adjusted in real time according to the error and the corresponding second learning rate, the error change rate and the corresponding third learning rate, the second learning rate is used to control the influence of the error on the instrument parameter adjustment, and the third learning rate is used to control the influence of the error change rate on the instrument parameter adjustment.

7. The method according to claim 6, characterized in that The method further comprises: The instrument management module determines an initial second learning rate and an initial third learning rate; Adjusting the second learning rate by using the initial second learning rate and the first feedback parameter; The third learning rate is adjusted by an initial third learning rate and a second feedback parameter, wherein the first feedback parameter and the second feedback parameter are used to control the adjustment speed of the error and the error change rate, respectively.

8. The method according to claim 5, characterized in that The method further comprises: For feedback data of any one dimension among the feedback data of the multiple dimensions, the instrument management module determines related feedback data of the feedback data in other dimensions, and determines a second association relationship between the feedback data and the feedback data; Based on the second association relationship, the feedback data and the related feedback data are jointly processed, and based on the associated feedback data after the joint processing, the weight corresponding to each scene parameter is adjusted.

9. A test device for an industrial terminal, characterized in that: include: Memory, processor; The memory stores computer-executable instructions; The processor executes the computer-executable instructions stored in the memory, so that the processor performs the method according to any one of claims 3 to 8.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores computer-executable instructions, which are used to implement the method according to any one of claims 3 to 8 when executed by a processor.

Citation Information

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