Photovoltaic cell test method, device, equipment and storage medium

By using task queues to manage the test process of photovoltaic cells in the photovoltaic cell testing system, the existing photovoltaic cell testing process is solved, and the automated testing and orderly management of photovoltaic cells are realized, which reduces manual intervention and improves the testing efficiency.

CN119891950APending Publication Date: 2025-04-25HANGZHOU MEIJIA INNOVATION TECHNOLOGY CO LTD
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Patent Information

Application Number
CN202411898866.9
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-12-20
Publication Date
2025-04-25

AI Technical Summary

Technical Problem

The IV test and EL test of existing photovoltaic cells are carried out on different operating tables respectively, resulting in cumbersome and complex testing processes, increasing the workload of testers, and making the test time longer.

Method used

By receiving the in-place signal of the photovoltaic cell, the instance objects of the photovoltaic cell are added to the task queue in the order of the in-place signals, and the hardware test process is triggered to obtain the hardware test information. Then, in the order in the task queue, the hardware test information of each instance object is processed algorithmically, the preset attribute identification of the instance object is updated, and the instance objects that meet the preset conditions are removed.

Benefits of technology

The orderly management of multiple photovoltaic cells is achieved, which reduces manual intervention, shortens the test cycle, and facilitates subsequent traceability of the test process and screening and classification of photovoltaic cells.

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Abstract

The invention provides a photovoltaic cell testing method, device and equipment and a storage medium, and the method comprises the steps: receiving an in-place signal that a current photovoltaic cell is located at a detection position, adding an instance object corresponding to the current photovoltaic cell in a task queue according to the sequence of receiving the in-place signals of different photovoltaic cells, triggering a hardware test process for the current photovoltaic cell to obtain hardware test information; the instance object is configured with a preset attribute identifier; performing algorithm processing on the hardware test information of the photovoltaic cell corresponding to each instance object according to the adding sequence of each instance object in the task queue, and updating a preset attribute identifier of the instance object based on an algorithm processing result; and listing the instance objects with the preset attribute identifiers meeting the preset conditions in the task queue. Therefore, the automatic testing process of the photovoltaic cell is realized, the manual intervention is reduced, and the testing period is shortened.
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Description

Technical Field

[0001] The present application relates to the field of photovoltaic cell testing technology, and in particular to a photovoltaic cell testing method, device, equipment and storage medium. Background Art

[0002] Current-voltage (IV) testing refers to the test that measures the relationship between the current and voltage of a photovoltaic cell to evaluate its performance. Electroluminescence (EL) testing refers to a non-destructive test based on the photovoltaic effect and electroluminescence phenomenon, used to detect defects inside photovoltaic cells.

[0003] At present, the IV test and EL test of photovoltaic cells are carried out on different operating tables. This situation means that testers need to move back and forth between the two devices, manually operate and coordinate to complete the entire photovoltaic cell test. Such a test process is not only cumbersome and complicated, greatly increasing the workload of testers, but also requires frequent manual intervention, making the test time relatively long. Summary of the invention

[0004] In view of this, the present application provides a photovoltaic cell testing method, device, equipment and storage medium.

[0005] A first aspect provides a photovoltaic cell testing method, comprising: receiving an arrival signal indicating that a current photovoltaic cell is at a detection position, adding an instance object corresponding to the current photovoltaic cell to a task queue in the order in which arrival signals of different photovoltaic cells are received, and triggering a hardware test process for the current photovoltaic cell to obtain hardware test information; the instance object is configured with a preset attribute identifier; according to the order in which the instance objects in the task queue are added, algorithmically processing the hardware test information of the photovoltaic cell corresponding to each instance object, and updating the preset attribute identifier of the instance object based on the algorithm processing result; and dequeuing the instance object whose preset attribute identifier in the task queue meets the preset condition.

[0006] The second aspect provides a photovoltaic cell testing device, including: an entry and test module, which is used to add an instance object corresponding to the current photovoltaic cell in the task queue according to the order of receiving the arrival signal of the current photovoltaic cell at the detection position, and trigger a hardware test process for the current photovoltaic cell to obtain hardware test information; the instance object is configured with a preset attribute identifier; an algorithm processing module, which is used to perform algorithmic processing on the hardware test information of the photovoltaic cell corresponding to each instance object according to the order in which each instance object is added to the task queue, and update the preset attribute identifier of the instance object based on the algorithm processing result; and a dequeue control module, which is used to dequeue the instance object whose preset attribute identifier in the task queue meets the preset condition.

[0007] The third aspect provides an electronic device, which may include a processor, a memory, and a program stored in the memory and executable on the processor, wherein when the program is executed by the processor, the steps of any photovoltaic cell testing method provided in the embodiments of the present application are implemented.

[0008] A fourth aspect provides a computer-readable storage medium storing instructions, which, when executed by a processor, implement the steps of any one of the photovoltaic cell testing methods provided in the embodiments of the present application.

[0009] In summary, the photovoltaic cell testing method, device, equipment and computer-readable storage medium provided by the present application have the following beneficial effects:

[0010] By receiving the arrival signal of the current photovoltaic cell at the detection position, according to the order of receiving the arrival signals of different photovoltaic cells, the instance object corresponding to the current photovoltaic cell is added to the corresponding position in the task queue, and the hardware test process is triggered for the current photovoltaic cell to obtain hardware test information, and according to the order in which each instance object is added to the task queue, the hardware test information of the photovoltaic cell corresponding to each instance object is processed by algorithm, and the preset attribute identifier of the instance object is updated based on the algorithm processing result, and the instance object whose preset attribute identifier in the task queue meets the preset conditions is dequeued. In this way, the present application realizes the orderly management of multiple photovoltaic cell tests and the automated test process of photovoltaic cells through the task queue, reduces manual intervention, and shortens the test cycle. Each photovoltaic cell has a corresponding instance object, which is convenient for the subsequent tracing of the test process and helps the subsequent screening and classification of photovoltaic cells. BRIEF DESCRIPTION OF THE DRAWINGS

[0011] In order to more clearly illustrate the specific implementation methods of the present application or the technical solutions in the prior art, the drawings required for use in the specific implementation methods or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are some implementation methods of the present application. For those skilled in the art, other drawings can be obtained based on these drawings without paying any creative work.

[0012] Figure 1 A schematic diagram of the structure of a photovoltaic cell testing system provided in an embodiment of the present application is shown;

[0013] Figure 2 A schematic diagram showing a process flow of a photovoltaic cell testing method provided in an embodiment of the present application;

[0014] Figure 3 A quality classification condition setting page provided in an embodiment of the present application is shown;

[0015] Figure 4 A schematic diagram showing a counting result display page according to an embodiment of the present application is shown;

[0016] Figure 5 A schematic diagram showing the structure of a photovoltaic cell testing device provided in an embodiment of the present application is shown;

[0017] Figure 6 A schematic structural diagram of an electronic device provided according to an embodiment of the present application is shown. DETAILED DESCRIPTION

[0018] In order to make the above and other features and advantages of the present application more clear, the present application is further described below in conjunction with the accompanying drawings. It should be understood that the specific embodiments given herein are for the purpose of explaining to those skilled in the art and are only exemplary and not restrictive.

[0019] In the following description, many specific details are set forth to provide a thorough understanding of the present application. However, it is apparent to those skilled in the art that specific details need not be adopted to practice the present application. In other cases, well-known steps or operations are not described in detail to avoid blurring the present application.

[0020] The present application provides a photovoltaic cell testing system. Figure 1 A schematic diagram of the structure of a photovoltaic cell testing system provided in an embodiment of the present application is shown. Figure 1 As shown, the photovoltaic cell testing system 10 may include a photovoltaic cell testing device 11 , a detection device 12 and a base 14 .

[0021] The base 14 is used to install and fix the detection device 12. The base 14 may include a test bench for placing a plurality of photovoltaic cells.

[0022] The photovoltaic cell testing device 11 communicates with the detection device 12 and the base 14. When a photovoltaic cell reaches the detection position of the test bench, the base sends a position signal to the photovoltaic cell testing device 11. The photovoltaic cell testing device 11 executes any photovoltaic cell testing method provided in the embodiment of the present application based on the received position signal, realizes multiple detection steps of the photovoltaic cell, reduces manual intervention, and shortens the test cycle.

[0023] The photovoltaic cell testing device 11 can also be used to display a visualization interface. The visualization interface includes a test operation interface and a test result display interface. Among them, the test operation interface can be used to configure test-related information, which may include but is not limited to test recipe configuration information and software and hardware trigger configuration information. The test result display interface is used to display hardware test information, photovoltaic cell note labels and screening information.

[0024] The detection device 12 may include a variety of devices for different types of detection of photovoltaic cells, such as an image acquisition device and an IV device. The image acquisition device is used to perform EL testing on photovoltaic cells. The IV device is used to perform IV testing on photovoltaic cells.

[0025] Another aspect of the present application provides a photovoltaic cell testing method for use in Figure 1 The photovoltaic cell testing device 11 is shown. Figure 2 A schematic diagram of a photovoltaic cell testing method provided in an embodiment of the present application is shown, such as Figure 2 As shown, the photovoltaic cell testing method includes the following steps.

[0026] S21, receiving a signal indicating that the current photovoltaic cell is at the detection position, adding an instance object corresponding to the current photovoltaic cell to the task queue in the order of receiving the signal of arrival of different photovoltaic cells, and triggering a hardware test process for the current photovoltaic cell to obtain hardware test information.

[0027] The arrival signal involved in the embodiment of the present application is used to indicate that a photovoltaic cell has arrived at the detection position. The task queue is used to store and manage hardware test tasks for multiple photovoltaic cells, and supports the first-in-first-out feature to ensure that the tasks can be executed in an orderly manner according to the order in which the photovoltaic cells reach the detection position. The instance object represents a photovoltaic cell and is used to store information and test results related to the photovoltaic cell. The instance object is configured with a preset attribute identifier, which is an attribute identifier pre-set by the device and can be used to indicate whether the hardware test is completed and the hardware test results. In other words, a set of preset attribute identifiers is configured when the instance object is created.

[0028] The hardware test process involved in the embodiment of the present application can be any test process related to photovoltaic cell testing, which can include but is not limited to EL testing and IV testing. The hardware test information is information generated based on the execution results of the hardware test process, and can include test information of at least two tests.

[0029] In one embodiment of the present application, when the photovoltaic cell testing device 11 receives a signal indicating that the current photovoltaic cell is at the detection position, it will add an instance object corresponding to the current photovoltaic cell to the task queue according to the order of the received signals of different photovoltaic cells. At the same time, it triggers the hardware test process for the current photovoltaic cell to obtain hardware test information.

[0030] It should be noted that the hardware test information can be stored in the instance object. After the current photovoltaic cell completes the hardware test process, the photovoltaic cell testing device controls the next photovoltaic cell to move to the testing position, takes the next photovoltaic cell as the current photovoltaic cell, and continues to execute S21.

[0031] S22, performing algorithm processing on the hardware test information of the photovoltaic cells corresponding to each instance object according to the order in which each instance object is added to the task queue, and updating the preset attribute identifier of the instance object based on the algorithm processing result.

[0032] The algorithm processing involved in the embodiment of the present application may include but is not limited to data analysis, quality assessment, performance prediction, etc. The value of the preset attribute identifier may be determined according to the algorithm processing result.

[0033] In one embodiment of the present application, after the test is completed, the photovoltaic cell testing device 11 traverses the task queue, and takes out the hardware test information of the photovoltaic cell corresponding to each instance object in turn according to the order in which each instance object is added, performs algorithmic processing on the hardware information of each instance object, obtains the algorithmic processing result of each instance object, and updates the preset attribute identifier of the corresponding instance object according to each algorithmic processing result.

[0034] In another embodiment of the present application, while executing S21, that is, executing the hardware test process, the photovoltaic cell testing device 11 takes out the instance object that first enters the task queue from the task queue according to the order in which the instance objects in the task queue are added, performs algorithm processing on the hardware information of the instance object, obtains the algorithm processing result, and updates the preset attribute identifier of the instance object according to the algorithm processing result. Repeat the above operation until there is no instance object with unprocessed hardware test information in the task queue.

[0035] S23, dequeueing the instance objects whose preset attribute identifiers satisfy the preset conditions in the task queue.

[0036] The preset conditions involved in the embodiments of the present application can be used to screen the conditions of photovoltaic cells that meet user needs, for example, to remove the instance objects whose preset attribute identifiers have been updated, or to remove the instance objects whose algorithm processing results meet a certain preset condition.

[0037] In an embodiment of the present application, the photovoltaic cell testing device 11 can check whether the preset attribute identifier of the instance object in the task queue meets the preset condition. If the preset condition is met, it is removed from the task queue and output to the database.

[0038] It should be noted that the photovoltaic cell testing device 11 can check whether the preset attribute identifier of the instance object in the task queue meets the preset conditions. This can be done after the preset attribute identifiers of all instance objects in the task queue are updated, or after the preset attribute identifier of one instance object is updated.

[0039] In the above embodiment, by receiving the arrival signal of the current photovoltaic cell at the detection position, according to the order of receiving the arrival signals of different photovoltaic cells, the instance object corresponding to the current photovoltaic cell is added to the corresponding position in the task queue, and the hardware test process is triggered for the current photovoltaic cell to obtain hardware test information, and according to the order in which each instance object is added to the task queue, the hardware test information of the photovoltaic cell corresponding to each instance object is algorithmically processed, and the preset attribute identifier of the instance object is updated based on the algorithm processing result, and the instance object whose preset attribute identifier in the task queue meets the preset conditions is dequeued. In this way, the present application realizes the orderly management of multiple photovoltaic cell tests and the automated test process of photovoltaic cells through the task queue, reduces manual intervention, shortens the test cycle, and each photovoltaic cell has a corresponding instance object, which is convenient for the subsequent tracing of the test process and helps the subsequent screening and classification of photovoltaic cells.

[0040] In some embodiments, if the hardware test information includes test information of at least two tests. S22, according to the order in which each instance object is added to the task queue, the hardware test information of the photovoltaic cell corresponding to each instance object is processed by algorithm, and the preset attribute identifier of the instance object is updated based on the algorithm processing result, which may include:

[0041] For the photovoltaic cells corresponding to each instance object, after obtaining test information of one test of the photovoltaic cells, algorithmic processing is performed on the test information of one test of the photovoltaic cells, and a preset attribute identifier of the instance object is updated based on the algorithmic processing result; and after obtaining test information of another test of the photovoltaic cells, algorithmic processing is performed on the test information of another test of the photovoltaic cells, and a preset attribute identifier of the instance object is updated based on the algorithmic processing result, until no test information of the photovoltaic cell is obtained.

[0042] In some embodiments, the preset attribute identifier includes a test completion identifier corresponding to at least two tests, wherein the test refers to a test related to a photovoltaic cell, such as an IV test and an EL test. The test completion identifier can be used to identify whether a certain test is completed.

[0043] In S21, a hardware test process is triggered for the current photovoltaic cell to obtain hardware test information, including: detecting whether the test completion mark corresponding to each test of the current photovoltaic cell is valid; in the case that one of the test completion marks corresponding to at least two tests of the current photovoltaic cell is invalid, triggering the corresponding hardware test process for the current photovoltaic cell according to the invalid test completion mark in a preset test order to obtain hardware test information.

[0044] The test completion mark involved in the embodiment of the present application as valid can be used to indicate that the test is completed. The test completion mark as invalid can be used to indicate that the test is not completed. The preset test sequence can refer to the sequence of at least two tests on the photovoltaic cell. For example, the photovoltaic cell is first tested with EL, and then with IV. In the embodiment of the present application, the preset test sequence can be pre-set in the device, or determined according to user input.

[0045] In one embodiment of the present application, the photovoltaic cell testing device 11 detects whether the test completion mark corresponding to each test of the current photovoltaic cell is valid. In the case that at least one test completion mark is invalid, the test process corresponding to all invalid test completion marks corresponding to the current photovoltaic cell is triggered according to the preset test order according to the at least one invalid test completion mark, thereby obtaining hardware test information.

[0046] For example, when the EL test completion mark of the current photovoltaic cell is invalid, the IV test completion mark is invalid, and the preset test sequence is to perform the EL test first and then the IV test, the EL test and the IV test are triggered in sequence on the current photovoltaic cell to obtain hardware test information. Alternatively, when the EL test completion mark of the current photovoltaic cell is valid and the IV test completion mark is invalid, the IV test is triggered on the current photovoltaic cell to obtain hardware test information.

[0047] In S22, updating the preset attribute identifier of the instance object based on the algorithm processing result may include: after obtaining the algorithm processing result of the test information of a certain test, updating the test completion identifier corresponding to the test based on the algorithm processing result.

[0048] In one embodiment of the present application, when at least two tests are triggered on the current photovoltaic cell, after obtaining the test information of one test, the test information is algorithmically processed to obtain the algorithm processing result, and the test completion flag corresponding to the test in the instance object is updated based on the algorithm processing result, that is, the test completion flag is updated from invalid to valid. While performing the algorithm processing, another test can also be performed on the current photovoltaic cell to obtain the test information of another test. After obtaining the other test information, the test information is algorithmically processed to obtain the algorithm processing result, and the test completion flag corresponding to the test in the instance object is updated based on the algorithm processing result, that is, the test completion flag is updated from invalid to valid. Repeat the above operation until the test information of the last test is obtained, the last test information is algorithmically processed to obtain the algorithm processing result, and the test completion flag corresponding to the last test in the instance object is updated based on the algorithm processing result. In this way, the asynchronous call of test and calculation is realized through the queue, which can shorten the test time and improve the test efficiency.

[0049] In S22, updating the preset attribute identifier of the instance object based on the algorithm processing result may also include: after obtaining the algorithm processing result of the test information of all tests, updating the test completion identifiers corresponding to all tests based on the algorithm processing result.

[0050] In one embodiment of the present application, when at least two tests are triggered on the current photovoltaic cell, after obtaining the test information of all tests, algorithmic processing is performed on the test information of all tests to obtain the algorithmic processing results, and the test completion flag corresponding to each test in the instance object is updated based on the algorithmic processing results, that is, the test completion flag is updated from invalid to valid.

[0051] S24, dequeueing instance objects whose preset attribute identifiers satisfy preset conditions in the task queue, including: dequeueing instance objects whose test completion identifiers of all types are valid in the task queue.

[0052] The preset condition involved in the embodiment of the present application is that all types of test completion marks are valid. All types of test completion marks may refer to test completion marks of all test types.

[0053] In an example of the present application, the photovoltaic cell testing device 11 detects whether all test completion flags of each instance object are valid. If all completion flags of an instance object are valid, it is removed from the task queue and output to the database.

[0054] In the above embodiment, by detecting the test completion mark, the corresponding hardware test process is triggered, thereby realizing a personalized test process, reducing repeated test steps for photovoltaic cells, and improving test efficiency.

[0055] In some embodiments, in order to further improve the test efficiency, a test trigger completion flag may be added to the preset attribute flag, so that after each test is completed, the next test can be performed in time. The test trigger completion flag may be used to indicate whether the test information has been collected.

[0056] In S21, triggering a hardware test process for the current photovoltaic cell and obtaining hardware test information may include: in the case where at least two test completion marks are invalid, triggering a test process of the first test for the current photovoltaic cell according to a preset test order based on at least one invalid test completion mark, and after obtaining the test information of the first test, updating the test trigger completion mark corresponding to the first test, that is, updating the test trigger completion mark to be valid. In the case where the test trigger completion mark corresponding to the first test is valid, triggering a test process of the second test for the current photovoltaic cell according to the preset test order, and after obtaining the test information of the second test, updating the test trigger completion mark corresponding to the second test. This continues until the test completion mark corresponding to the last test is updated.

[0057] It should be noted that the test trigger completion flag is updated after the test device completes the test and obtains the hardware test information, while the test completion flag is updated after the hardware test information is processed by an algorithm.

[0058] For example, when triggering EL test and IV test on the current photovoltaic cell, the EL test is triggered on the current photovoltaic cell according to the preset test order. After the EL test is completed, the EL test trigger completion flag in the instance object corresponding to the current photovoltaic cell is updated to valid, and the EL test information is obtained, and the IV test is continued to be triggered on the current photovoltaic cell. After the IV test is completed, the IV test information is obtained.

[0059] In this way, by adding a test trigger completion mark, the collection of another test information can be performed immediately after the collection of one test information is completed, without having to wait until the processing of one test information is completed before performing another test, thereby shortening the test time and improving the test efficiency.

[0060] The triggering methods of the test process can be divided into soft triggering and hard triggering. Among them, the soft triggering method refers to using the host computer to trigger the test equipment, and because the CPU timing is used, the test time accuracy can be accurate to 1ms, thus meeting the current test requirements. The hard triggering method refers to directly triggering the test equipment.

[0061] In addition, the two triggering modes can be used flexibly, which not only meets the requirements of test system stability, but also meets the scalability and flexibility of the test system.

[0062] It should be noted that some test processes, such as the IV test process, can use two triggering methods, while some test processes, such as the EL test process, can only use the soft triggering method. Users can select the triggering method for each test process on the operation interface.

[0063] In some embodiments, in S21, triggering a hardware test process for the current photovoltaic cell to obtain hardware test information includes soft-triggering a hardware test process for the current photovoltaic cell to obtain hardware test information.

[0064] For the current photovoltaic cell soft trigger hardware test process, hardware test information is obtained, specifically including: when the hardware test process is an IV test process, determine whether there is a flash parameter in the test recipe parameter; if there is a flash parameter, trigger the light source to start working, and the light source starts working at t1; send the test recipe parameter to the IV device so that the IV device is set according to the device test parameter; receive the IV device parameter setting completion signal, and record the parameter setting completion time as t2. After waiting for the target time, send a timing signal to the IV device, where the target time is calculated based on the light intensity recipe parameter, t1 and t2.

[0065] The test recipe parameters involved in the embodiments of the present application are used to set the working parameters of the IV test process. Among them, the test recipe parameters at least include light intensity recipe parameters and equipment test parameters. The light intensity recipe parameters are used to set light intensity parameters, test delay, test duration, and scan switching time. The equipment test parameters are used to set the working parameters of the IV equipment. The equipment test parameters may include but are not limited to the load control range and the test range.

[0066] The test recipe parameters may also include light source parameters, which may be used to configure the working parameters of the light source, such as light source thresholds and light source settings, wherein the light source settings are configured using light intensity recipe parameters.

[0067] The determination of whether there is a flash parameter in the test formula parameters involved in the implementation of the present application can be understood as whether a light source is required when performing the IV test process. The light source can be a flash lamp.

[0068] In one embodiment of the present application, the photovoltaic cell testing device 11 completes parameter configuration according to the test recipe parameters. When the test recipe parameters contain flash parameters, that is, when a light source is needed to assist in the test, the light source is triggered to start working, and the current light source start time is recorded as t1. The photovoltaic cell testing device 11 sends the test recipe parameters to the IV device so that the IV device is set according to the device test parameters. When the configuration completion signal sent by the IV device is received, it can be determined that the IV device parameter setting is complete, and the parameter setting completion time is recorded as t2. The photovoltaic cell testing device 11 calculates the target time based on the light intensity recipe parameters, t1 and t2, and after waiting for the target time, sends a timing signal to the IV device.

[0069] The timing signal involved in the embodiment of the present application is used to instruct the IV device to perform timing so as to wait for the delay time in the light intensity formula parameter to reach the trigger moment and start the first scanning test, and after the first scanning test is completed, wait for the scanning switching time in the light intensity formula parameter to start the second scanning test.

[0070] In one embodiment of the present application, the IV device receives a timing signal and starts timing. After the timing reaches the delay time, that is, the trigger moment is reached, and the first scan test is started. After the timing reaches the delay time, the scan test time, and the scan switching time, the second scan test is started.

[0071] In addition, the IV device sends IV test information to the photovoltaic cell testing apparatus 11 after all scanning tests are completed.

[0072] In the above embodiment, the IV test is triggered by a soft triggering method, so that the test time can be accurately controlled and flexible configuration of the IV test can be achieved.

[0073] In some embodiments, calculating the target time according to the light intensity recipe parameters, t1 and t2 includes: taking the difference between the soft trigger delay time in the light intensity configuration parameters and t1 and t2 as the calculated target time.

[0074] In an embodiment of the present application, the target time T can be expressed as:

[0075] T=T1-(t2-t1) (1)

[0076] Among them, T1 represents the soft trigger delay.

[0077] For example, if T1 is 5ms, the difference between t1 and t2 is 2ms, then T is 3ms.

[0078] In some embodiments, the first scan test may be a forward scan test, and the second scan test may be a reverse scan test. The scan test time may be 15 ms, and the scan switching time may be 5 ms.

[0079] In some embodiments, in S21, triggering a hardware test process for the current photovoltaic cell to obtain hardware test information includes hard triggering a hardware test process for the current photovoltaic cell to obtain hardware test information.

[0080] For the current photovoltaic cell hard-triggered hardware test process, hardware test information is obtained, specifically including: when the hardware test process is an IV test process, a delay parameter is sent to an IV device.

[0081] The delay parameters involved in the embodiments of the present application include hard trigger delay, measurement delay and scan switching delay, so that the IV device controls the operation of the light source device and starts the first scan test of the IV device after waiting for the total delay, wherein the total delay is the sum of the hard trigger delay and the measurement delay, and after the first scan test is completed, the IV device starts the second scan test after waiting for the scan switching delay.

[0082] In one embodiment of the present application, after the photovoltaic cell testing device 11 sends the delay parameter to the IV device, the IV device automatically times after receiving the delay parameter and triggers the light source to turn on. After the timing time reaches the total delay, the IV device starts the first scanning test. When the timing time reaches the sum of the total delay, the first scanning time and the scanning switching delay, the IV device starts the second scanning test. In addition, after all scanning tests are completed, the IV device sends IV test information to the photovoltaic cell testing device 11.

[0083] In the above embodiment, the IV test process is triggered by hard triggering, so that the IV device can directly control the operation of the light source and reduce the burden on the device.

[0084] In some embodiments, in S21, triggering a hardware test process for the current photovoltaic cell to obtain hardware test information may include: executing the hardware test process for the current photovoltaic cell according to the input test type and test sequence of the photovoltaic cell to obtain hardware test information.

[0085] The test sequence involved in the embodiment of the present application is determined according to the type of hardware test. For example, if the type of hardware test is EL test and IV test, the test sequence can be EL test and IV test.

[0086] In one embodiment of the present application, the photovoltaic cell testing device 11 receives the type and test sequence of the photovoltaic cell hardware test input by the user from the visual interface, and then triggers the test process of each test for the current photovoltaic cell in turn according to the test sequence to obtain the test information of each test.

[0087] In the above embodiment, the order of multiple tests can be determined by inputting the test type and test order, so that the test process of each test is triggered in turn for the current photovoltaic cell according to the determined order, and hardware test information is obtained, thereby following the correct test order and steps, which helps to more accurately evaluate the performance and quality of the photovoltaic cell and ensure the standardization and accuracy of the test process.

[0088] In some embodiments, the preset attribute identifier includes: a quality classification identifier, wherein the quality classification identifier can be used to identify the quality of the photovoltaic cell.

[0089] In S23, updating the preset attribute identifier of the instance object based on the algorithm processing result may include: updating the quality classification identifier of the photovoltaic cell according to the quality classification condition and the algorithm processing result.

[0090] The quality classification conditions involved in the embodiments of the present application can be set according to the industry standards of photovoltaic cells, customer needs or production quality control requirements. Figure 3 A quality classification condition setting page provided in an embodiment of the present application is shown, such as Figure 3 As shown, the quality classification condition includes multiple classification condition Lines, and each Line includes a range of multiple variables Variable, such as the maximum value Max and the minimum value Min of each Variable. Each variable represents a quality characteristic of a photovoltaic cell.

[0091] The quality classification mark involved in the embodiment of the present application can be a grade (such as grade A, grade B, grade C, etc.), a score, or any other identification method that can reflect the quality level of the photovoltaic cell. Updating the quality classification mark of the photovoltaic cell can be to update the quality classification mark in the instance object corresponding to the photovoltaic cell to a specific parameter.

[0092] In one embodiment of the present application, the photovoltaic cell testing device 11 verifies whether the parameter values ​​corresponding to multiple variables in the algorithm processing results of the photovoltaic cell meet the variable range of the first grading condition. If not, the device continues to verify whether the parameter values ​​corresponding to multiple variables in the algorithm processing results meet the variable range of the second grading condition, and stops verifying until the parameter values ​​corresponding to multiple variables in the algorithm processing results meet the variable range of the Nth grading condition. The quality grading result of the photovoltaic cell is obtained as N, the quality grading identifier is updated to N, and the corresponding multiple quality parameters are saved in the preset attribute identifier of the instance object.

[0093] In this way, by assigning a quality classification mark to photovoltaic cells, the test results of photovoltaic cells can be made more intuitive and easy to understand, which helps users quickly understand the quality level of photovoltaic cells, and facilitates the subsequent analysis of photovoltaic cells with different quality classifications to find performance bottlenecks and provide a basis for product improvement. In addition, after the photovoltaic cells are delisted after completing the quality classification, the photovoltaic cells can be associated with the quality classification results, which is convenient for the management and screening of subsequent data.

[0094] In some embodiments, the photovoltaic cell testing method further includes: counting the photovoltaic cells whose quality classification identifications have been updated, and displaying the counting results.

[0095] In an embodiment of the present application, the photovoltaic cell testing device 11 counts the number of photovoltaic cells that have completed the update of the quality classification identification, obtains the counting result, and displays the counting result on the visual interface. The counting result may include the number of photovoltaic cells in each quality classification. In this way, by displaying the counting result, the quality and quantity of the photovoltaic cells can be intuitively understood.

[0096] For example, the quality classification mark is represented by the quality grade, and four photovoltaic cells with the quality classification mark of 3 are counted, and the relevant information of these four photovoltaic cells is displayed.

[0097] Figure 4 A schematic diagram showing a counting result display page according to an embodiment of the present application is shown. Figure 4 As shown, the counting result display page is divided into two parts. The first part can be used to display detailed information of a single photovoltaic cell. The second part can be used to display the counting results of photovoltaic cells, such as displaying the quality parameters of all photovoltaic cells of the first quality grade. Or, displaying the number of photovoltaic cells of each quality grade, etc.

[0098] In some embodiments, the preset attribute identifier includes a remark tag. The photovoltaic cell testing method further includes: receiving a user's editing operation on the remark tag to determine the content of the remark tag; receiving a photovoltaic cell screening request based on the remark tag, and performing a screening operation on the photovoltaic cells based on the content of the remark tag.

[0099] The editing operation involved in the embodiment of the present application can be a selection operation or an input operation performed by the user on the note page. The note page may include necessary elements such as an input box and a button. The note page can be as follows: Figure 4 shown.

[0100] The content of the remark tag involved in the embodiment of the present application may include product evaluation, production shift or operator, etc.

[0101] In the first embodiment of the present invention, when the photovoltaic cell testing device 11 is in maintenance mode, it can receive the user's editing operation on the remark tag to determine the content of the remark tag. And in the case of receiving a photovoltaic cell screening request based on the remark tag, the photovoltaic cell screening request is parsed to obtain the screening conditions of the photovoltaic cells, and the photovoltaic cells in the database can be screened based on string matching, keyword matching or semantic matching, and the screening results are displayed to the user, specifically, the detailed information and remark tags of the photovoltaic cells can be displayed.

[0102] For example, the photovoltaic cell with the remark tag numbered M satisfies the product demand of Company X. When the photovoltaic cell testing device 11 receives a request for obtaining photovoltaic cells that meet the product demand of Company X, it selects the photovoltaic cell with the number M.

[0103] For another example, the photovoltaic cell numbered M is annotated with the tag of the Lth shift. When the photovoltaic cell testing device 11 receives a request to obtain photovoltaic cells of the Lth shift, it selects the photovoltaic cell numbered M.

[0104] For another example, the photovoltaic cell numbered M is noted as being operated by person xx. When the photovoltaic cell testing device 11 receives a request to obtain photovoltaic cells from person xx, it selects the photovoltaic cell numbered M.

[0105] In the above embodiment, screening photovoltaic cells by using remark tags can meet the user's demand for flexible screening of photovoltaic cells.

[0106] Another aspect of the embodiments of the present application provides a photovoltaic cell testing device. Figure 5 A schematic diagram of the structure of a photovoltaic cell testing device provided in an embodiment of the present application is shown. Figure 5 As shown, the photovoltaic cell testing device 50 may include the following modules.

[0107] The queuing and testing module 51 is used to add the instance object corresponding to the current photovoltaic cell in the task queue according to the order of receiving the arrival signal of the current photovoltaic cell at the detection position, and trigger the hardware test process for the current photovoltaic cell to obtain hardware test information; the instance object is configured with a preset attribute identifier.

[0108] The algorithm processing module 52 is used to perform algorithm processing on the hardware test information of the photovoltaic cells corresponding to each instance object according to the order in which each instance object is added to the task queue, and update the preset attribute identifier of the instance object based on the algorithm processing result.

[0109] The dequeue control module 53 is used to dequeue the instance objects whose preset attribute identifiers in the task queue meet the preset conditions.

[0110] In the above embodiment, by receiving the arrival signal of the current photovoltaic cell at the detection position, according to the order of receiving the arrival signals of different photovoltaic cells, the instance object corresponding to the current photovoltaic cell is added to the corresponding position in the task queue, and the hardware test process is triggered for the current photovoltaic cell to obtain hardware test information, and according to the order in which each instance object is added to the task queue, the hardware test information of the photovoltaic cell corresponding to each instance object is algorithmically processed, and the preset attribute identifier of the instance object is updated based on the algorithm processing result, and the instance object whose preset attribute identifier in the task queue meets the preset conditions is dequeued. In this way, the present application realizes the orderly management of multiple photovoltaic cell tests and the automated test process of photovoltaic cells through the task queue, reduces manual intervention, shortens the test cycle, and each photovoltaic cell has a corresponding instance object, which is convenient for the subsequent tracing of the test process and helps the subsequent screening and classification of photovoltaic cells.

[0111] In some embodiments, the preset attribute identifier includes: a test completion identifier corresponding to at least two tests. The queueing and testing module 51 includes a testing unit for detecting whether the test completion identifier corresponding to each test of the current photovoltaic cell is valid; if there is an invalid test completion identifier among the test completion identifiers corresponding to at least two tests of the current photovoltaic cell, the corresponding hardware test process is triggered for the current photovoltaic cell according to the invalid test completion identifier in the preset test order to obtain hardware test information.

[0112] The dequeue control module 53 is specifically used to dequeue instance objects whose test completion flags of all types are valid in the task queue.

[0113] In some embodiments, the queuing and testing module 51 includes a soft trigger test unit, which is used to determine whether there are light source parameters in the test recipe parameters when the hardware test process is an IV test process, and the test recipe parameters include at least light intensity recipe parameters and device test parameters; in the case of light source parameters, trigger the light source to start working, and the light source start working time is t1; send the test recipe parameters to the IV device so that the IV device is set according to the device test parameters; receive the IV device parameter setting completion signal, and record the parameter setting completion time as t2; after waiting for the target time, send a timing signal to the IV device, wherein the target time is calculated based on the light intensity recipe parameters, t1 and t2; the timing signal is used to instruct the IV device to perform timing, so as to wait for the delay time in the light intensity recipe parameters, start the first scan test, and after the first scan test is completed, wait for the scan switching time in the light intensity recipe parameters, and start the second scan test; obtain the IV test information sent by the IV device.

[0114] In some embodiments, the queuing and testing module 51 includes a hard trigger test unit, which is used to send delay parameters to the IV device when the hardware test process is an IV test process, and the delay parameters include hard trigger delay, measurement delay and scan switching delay, so that the IV device controls the light source device to work and the IV device starts the first scan test after waiting for the total delay, and the total delay is the sum of the hard trigger delay and the measurement delay, and after the first scan test is completed, the IV device starts the second scan test after waiting for the scan switching delay; obtain the IV test information sent by the IV device.

[0115] In some embodiments, the queuing and testing module 51 is specifically used to execute the hardware testing process of the current photovoltaic cell according to the input hardware test type and test sequence of the photovoltaic cell to obtain hardware test information.

[0116] In some embodiments, the preset attribute identifier includes: a quality classification identifier. The algorithm processing module 52 is specifically used to update the quality classification identifier of the photovoltaic cell according to the quality classification condition and the algorithm processing result.

[0117] In some embodiments, the photovoltaic cell testing device 50 may further include a counting module for counting the photovoltaic cells that have completed the update of the quality classification identification and displaying the counting result.

[0118] In some embodiments, the preset attribute identifier includes a remark tag. The photovoltaic cell testing device 50 may also include a remark module and a screening module.

[0119] The remark module is used to receive the user's editing operation on the remark tag to determine the content of the remark tag.

[0120] The screening module is used to receive a photovoltaic cell screening request based on the remark tag, and perform a screening operation on the photovoltaic cells based on the content of the remark tag.

[0121] It should be understood that the specific features, operations and details described hereinabove with respect to the method of the present application may also be similarly applied to the device and system of the present application, or vice versa. In addition, each step of the method of the present application described above may be performed by a corresponding component or unit of the device or system of the present application.

[0122] It should be understood that each module / unit of the device of the present application can be implemented in whole or in part by software, hardware, firmware or a combination thereof. Each module / unit can be embedded in the processor of the electronic device or independent of the processor in the form of hardware or firmware, or can be stored in the memory of the electronic device in the form of software for the processor to call to perform the operation of each module / unit. Each module / unit can be implemented as an independent component or module, or two or more modules / units can be implemented as a single component or module.

[0123] In yet another aspect of the present application, an electronic device is provided. Figure 6 A schematic diagram of the structure of an electronic device provided according to an embodiment of the present application is shown. Figure 6 As shown, the electronic device 60 includes a processor 61, a memory 62 and a program stored in the memory and executable on the processor. When the program is executed by the processor, the steps of the photovoltaic cell testing method provided in any of the above embodiments are implemented.

[0124] The electronic device 60 can be broadly a server, a terminal, or any other electronic device with necessary computing and / or processing capabilities.

[0125] In one embodiment, the electronic device 60 may include a processor, a memory, a network interface, a communication interface, etc. connected through a system bus. The processor of the electronic device 60 may be used to provide necessary computing, processing and / or control capabilities. The memory of the electronic device 60 may include a non-volatile storage medium and an internal memory. The non-volatile storage medium may store an operating system, a computer program, etc. The internal memory may provide an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The network interface and the communication interface of the electronic device 60 may be used to connect and communicate with external devices through a network.

[0126] In another aspect, the present application provides a computer-readable storage medium, on which instructions are stored, wherein when the instructions are executed by a processor, the steps of the photovoltaic cell testing method provided in any of the above embodiments are implemented.

[0127] Those skilled in the art will appreciate that the method steps of the present application can be completed by instructing related hardware such as electronic devices or processors through a computer program, and the computer program can be stored in a non-temporary computer-readable storage medium, and the computer program causes the steps of the present application to be executed when it is executed. Depending on the circumstances, any reference to memory, storage or other media herein may include non-volatile or volatile memory. Examples of non-volatile memory include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM), flash memory, magnetic tape, floppy disk, magneto-optical data storage device, optical data storage device, hard disk, solid state disk, etc. Examples of volatile memory include random access memory (RAM), external cache memory, etc.

[0128] The various technical features described above can be combined arbitrarily. Although all possible combinations of these technical features are not described, any combination of these technical features should be considered to be covered by this specification as long as there is no contradiction in such combination.

[0129] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present application, rather than to limit it. Although the present application has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or replace some or all of the technical features therein by equivalents. However, these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of the present application.

Claims

1. A photovoltaic cell testing method, characterized in that: The method comprises: Receive a signal indicating that the current photovoltaic cell is at a detection position, add an instance object corresponding to the current photovoltaic cell to a task queue in the order of receiving the signals of arrival of different photovoltaic cells, and trigger a hardware test process for the current photovoltaic cell to obtain hardware test information; the instance object is configured with a preset attribute identifier; According to the order in which the instance objects are added to the task queue, the hardware test information of the photovoltaic cells corresponding to each instance object is processed by algorithm, and the preset attribute identifier of the instance object is updated based on the algorithm processing result; Dequeue the instance objects whose preset attribute identifiers in the task queue meet the preset conditions.

2. The method according to claim 1, characterized in that The preset attribute identifiers include: test completion identifiers corresponding to at least two tests respectively; The triggering of the hardware test process for the current photovoltaic cell to obtain hardware test information includes: Detecting whether a test completion mark corresponding to each test of the current photovoltaic cell is valid; In the case where one of the test completion marks corresponding to the at least two tests of the current photovoltaic cell is invalid, triggering a corresponding hardware test process for the current photovoltaic cell in accordance with a preset test sequence according to the invalid test completion mark, to obtain hardware test information; The step of dequeuing the instance object whose preset attribute identifier meets the preset condition in the task queue includes: Dequeue all instance objects whose test completion flags are valid in the task queue.

3. The method according to claim 1, characterized in that: The triggering of the hardware test process for the current photovoltaic cell to obtain the hardware test information includes soft-triggering the hardware test process for the current photovoltaic cell to obtain the hardware test information, specifically including: When the hardware test process is an IV test process, determining whether there is a light source parameter in the test recipe parameters, the test recipe parameters at least including a light intensity recipe parameter and a device test parameter; In the case where the light source parameters exist, the light source is triggered to start working, and the light source starts working at time t1; sending test recipe parameters to an IV device so that the IV device is set according to the device test parameters; Receive a signal that the IV device parameter setting is completed, and record the parameter setting completion time as t2; After waiting for the target time, a timing signal is sent to the IV device, wherein the target time is calculated according to the light intensity formula parameters, the t1 and t2; the timing signal is used to instruct the IV device to perform timing, so as to wait for the delay time in the light intensity formula parameters, start the first scanning test, and after the first scanning test is completed, wait for the scanning switching time in the light intensity formula parameters, and start the second scanning test; Obtain IV test information sent by the IV device.

4. The method according to claim 3, characterized in that Calculating the target time according to the light intensity recipe parameters, t1 and t2 includes: The difference between the soft trigger delay time in the light intensity configuration parameter and t1 and t2 is used as the calculated target time.

5. The method according to claim 1, characterized in that The triggering of the hardware test process for the current photovoltaic cell to obtain the hardware test information includes triggering the hardware test process for the current photovoltaic cell to obtain the hardware test information, specifically including: When the hardware test process is an IV test process, a delay parameter is sent to the IV device, wherein the delay parameter includes a hard trigger delay, a measurement delay, and a scan switching delay, so that the IV device controls the light source device to work and the IV device starts the first scan test after waiting for the total delay, wherein the total delay is the sum of the hard trigger delay and the measurement delay, and after the first scan test is completed, the IV device starts the second scan test after waiting for the scan switching delay; Obtain IV test information sent by the IV device.

6. The method according to any one of claims 1 to 5, characterized in that: The triggering of the hardware test process for the current photovoltaic cell to obtain the hardware test information includes: The hardware test process for the current photovoltaic cell is executed according to the inputted hardware test type and test sequence of the photovoltaic cell to obtain hardware test information.

7. The method according to any one of claims 1 to 5, characterized in that: The preset attribute identifier includes: a quality classification identifier, and updating the preset attribute identifier of the instance object based on the algorithm processing result includes: The quality classification identification of the photovoltaic cell is updated according to the quality classification conditions and the algorithm processing result.

8. The method according to claim 7, characterized in that The method further comprises: The photovoltaic cells for which the quality classification identification has been updated are counted, and the counting result is displayed.

9. The method according to any one of claims 1 to 5, characterized in that: The preset attribute identifier includes: a remark tag; the method further includes: receiving a user's editing operation on the note tag to determine the content of the note tag; A photovoltaic cell screening request based on the remark tag is received, and a photovoltaic cell screening operation is performed based on the content of the remark tag.

10. A photovoltaic cell testing device, characterized in that: The device comprises: The queue entry and test module is used to add the instance object corresponding to the current photovoltaic cell in the task queue according to the order of receiving the arrival signal of the current photovoltaic cell at the detection position, and trigger the hardware test process for the current photovoltaic cell to obtain hardware test information; the instance object is configured with a preset attribute identifier; An algorithm processing module, used to perform algorithm processing on the hardware test information of the photovoltaic cells corresponding to each instance object in the order in which each instance object is added to the task queue, and update the preset attribute identifier of the instance object based on the algorithm processing result; The dequeue control module is used to dequeue the instance objects whose preset attribute identifiers in the task queue meet the preset conditions.

11. An electronic device, characterized in that: The method comprises a processor, a memory and a program stored in the memory and executable on the processor, wherein when the program is executed by the processor, the steps of the photovoltaic cell testing method according to any one of claims 1 to 9 are implemented.

12. A computer-readable storage medium, characterized in that: The computer-readable storage medium includes instructions stored therein, and when the instructions are executed by a processor, the steps of the photovoltaic cell testing method according to any one of claims 1 to 9 are implemented.