Standard resistor double-station test fixture and test method thereof

Abstract

The invention discloses a standard resistor double-station test fixture and a test method thereof. The test fixture comprises a base, a limiting assembly, a driving cylinder and a conductive contact knife, wherein the limiting assembly and the conductive contact knife are mounted on the base. A first station and a second station are formed on the base. The limiting assembly comprises a main body fixing base and an end movable base, the main body fixing base is fixedly arranged at the first station of the base, and the end movable base is arranged on one side of the main body fixing base in a sliding mode. The limiting assembly is used for limiting the standard resistor, and the standard resistor comprises a middle resistor body and a protective shell; the main body fixing base is provided with a positioning groove used for containing the protective shell. The driving cylinder is provided with a telescopic rod capable of movably stretching into the main body fixing seat; and two ends of the middle resistor body are respectively erected on the telescopic rod and the end part movable seat. The test fixture can conveniently simulate and realize packaging and disassembling states, so that the test working efficiency is improved and the workload is reduced on the basis of ensuring the resistance test accuracy.

Description

Technical Field

[0001] The present invention relates to the technical field of test fixtures, and in particular to a standard resistor double-station test fixture and a test method thereof. Background Art

[0002] Standard resistors are measuring instruments of the basic unit of resistance, Ω (ohm). They are required to have high precision, low temperature coefficient, good stability, etc., and are used for value transfer in precision measurement and metrology verification departments. Figure 1 and Figure 2 As shown, the main structure of the standard resistor 10 includes an intermediate resistor body 11 and a protective shell 12. The intermediate resistor body 11 is encapsulated in the protective shell 12. Pole pieces 13 are provided at both ends of the intermediate resistor body 11. End caps 14 are provided at both ends of the protective shell 12. The pole pieces 13 protrude from the end caps 14 to facilitate subsequent connection with the wires.

[0003] At present, for the test of the above-mentioned standard resistor 10, it is necessary to test the resistance of the intermediate resistor 11 after it is packaged. When there is a deviation in the measured resistance, the standard resistor 10 needs to be disassembled, and the intermediate resistor 11 needs to be polished and adjusted; after the resistance adjustment is completed, the intermediate resistor 11 is packaged in the protective shell 12. Since the ambient temperature and heat dissipation performance of the intermediate resistor 11 after packaging will be affected by the protective shell 12, it is necessary to test the resistance again after packaging; if there is a deviation in the resistance, it needs to be disassembled and polished again, and this is repeated many times. In this case, reciprocating disassembly and assembly will lead to low test efficiency and increase the workload of the staff.

[0004] Therefore, how to design a standard resistor dual-station test fixture and its test method so that it can easily simulate the packaging and disassembly states, thereby improving the test efficiency and reducing the workload while ensuring the accuracy of the resistance test, is a technical problem that technicians in this field need to solve. Summary of the invention

[0005] The purpose of the present invention is to overcome the deficiencies in the prior art and provide a standard resistor dual-station test fixture and a test method thereof, so that it can conveniently simulate the packaging and disassembly states, thereby improving the test efficiency and reducing the workload on the basis of ensuring the accuracy of the resistance test.

[0006] The objective of the present invention is achieved through the following technical solutions:

[0007] A standard resistance double-station test fixture, comprising: a base, a limit assembly, a driving cylinder and a conductive touch knife, wherein the limit assembly and the conductive touch knife are installed on the base, and the driving cylinder is arranged on one side of the limit assembly;

[0008] A first station and a second station are formed on the base;

[0009] The limiting assembly includes a main body fixed seat and an end movable seat, wherein the main body fixed seat is fixedly arranged at the first station of the base, and the end movable seat is slidably arranged on one side of the main body fixed seat;

[0010] The limit assembly is used to limit the standard resistor, and the standard resistor includes an intermediate resistor body and a protective shell; the main body fixing seat is provided with a positioning groove for accommodating the protective shell;

[0011] The driving cylinder is provided with a telescopic rod which can movably penetrate into the main body fixing seat, and the two ends of the intermediate resistor are respectively mounted on the telescopic rod and the end movable seat.

[0012] In this embodiment, there are two conductive contact knives, one of which is disposed between the first station and the second station, and the other is disposed at the end of the second station; the end movable seat slides between the two conductive contact knives.

[0013] In this embodiment, a bracket is provided on the base, and the conductive contact blade is rotatably provided on the bracket; a brush head is provided at the end of the conductive contact blade, and the brush head contacts or separates from the end of the intermediate resistor.

[0014] In this embodiment, a conductive contact is provided at the end of the driving cylinder, and the conductive contact is in contact with the end of the intermediate resistor; a negative test wire and a positive test wire are provided on the base, the negative test wire is electrically connected to the conductive contact, and the positive test wire is electrically connected to the brush heads of the two conductive contact knives.

[0015] In this embodiment, pole pieces are provided at both ends of the intermediate resistor, and end covers are provided at both ends of the protective housing, and the pole pieces protrude out of the end covers.

[0016] In this embodiment, stepped grooves are provided at both ends of the positioning groove, the stepped grooves are adapted to the end covers, and both ends of the protective shell are blocked by the stepped grooves; a slot cooperating with the pole piece is provided on the end movable seat.

[0017] In this embodiment, the end cover is an insulating plastic structure, and the end movable seat is made of insulating rubber material.

[0018] In this embodiment, a waste opening is provided at the second work station of the base.

[0019] A standard resistance test method is implemented by the above-mentioned standard resistance double-station test fixture, comprising the following steps:

[0020] Place the assembled standard resistor into the main body fixing seat, and place the protective shell into the positioning groove; one end of the middle resistor body is clamped in the clamping groove of the end movable seat, and the other end of the resistor is mounted on the telescopic rod of the driving cylinder;

[0021] When the end movable seat moves to the first station, the end movable seat fits the main body fixed seat, and the middle resistor is accommodated in the protective shell, and the end covers are sealed at both ends; the conductive contact knife is rotated so that the brush head of the conductive contact knife contacts the electrode piece on the end movable seat, so that the negative electrode test wire is connected with the positive electrode test wire, and the resistance value of the standard resistor can be measured by the connected external instrument;

[0022] If the measured resistance value has deviation and needs to be polished and adjusted, the telescopic rod pushes the middle resistor and the end movable seat to slide to the second station; after sliding into place, the middle resistor is completely exposed outside the protective shell, one end of the middle resistor is mounted on the end movable seat and is under the conductive contact knife, and the other end is clamped on the end edge of the protective shell through the end cover; at this time, the conductive contact knife is rotated to make it contact with the corresponding electrode piece to achieve conductivity, and then the resistance value of the middle resistor in the unpackaged state is measured; the middle resistor is polished and adjusted according to the measurement situation;

[0023] After the resistance adjustment is completed, the middle resistor is put back into the protective housing again under the driving of the telescopic rod, so that the middle resistor returns to the packaged state. In this case, the middle resistor is tested again;

[0024] After reaching the standard, the standard resistor is taken out as a whole for the next step of packaging.

[0025] In summary, the standard resistor dual-station test fixture of the present invention can conveniently simulate the packaging and disassembly states, thereby improving the test efficiency and reducing the test workload on the basis of ensuring the accuracy of the resistance test. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required for use in the embodiments are briefly introduced below. It should be understood that the following drawings only show certain embodiments of the present invention and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without creative work.

[0027] Figure 1 It is a schematic diagram of the structure of a standard resistor in the prior art involved in the present invention;

[0028] Figure 2 for Figure 1 An exploded schematic diagram of a standard resistor in the prior art is shown;

[0029] Figure 3 It is a structural schematic diagram of the standard resistance double-station test fixture of the present invention;

[0030] Figure 4 for Figure 3 The partial structural diagram of the standard resistance double-station test fixture shown;

[0031] Figure 5 for Figure 4 The structural schematic diagram of the limit assembly shown;

[0032] Figure 6 This is a schematic diagram of the state of the standard resistor in the first working position during the test;

[0033] Figure 7 This is a schematic diagram of the state of the standard resistor in the second position during testing. DETAILED DESCRIPTION

[0034] In order to facilitate the understanding of the present invention, the present invention will be described more fully below with reference to the relevant drawings. The preferred embodiments of the present invention are given in the drawings. However, the present invention can be implemented in many different forms and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the disclosure of the present invention more thoroughly understood.

[0035] It should be noted that when an element is referred to as being "fixed to" another element, it may be directly on the other element or there may be a central element. When an element is considered to be "connected to" another element, it may be directly connected to the other element or there may be a central element at the same time. The terms "vertical", "horizontal", "left", "right" and similar expressions used herein are for illustrative purposes only and do not represent the only implementation method.

[0036] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art of the present invention. The terms used herein in the specification of the present invention are only for the purpose of describing specific embodiments and are not intended to limit the present invention. The term "and / or" used herein includes any and all combinations of one or more related listed items.

[0037] The present invention provides a standard resistance double-station test fixture 20, such as Figure 3 As shown, it includes: a base 100, a limiting component 200, a driving cylinder 300 and a conductive contact knife 400, the limiting component 200 and the conductive contact knife 400 are installed on the base 100, and the driving cylinder 300 is arranged on one side of the limiting component 200.

[0038] A first workstation 101 and a second workstation 102 are formed on the base 100 .

[0039] like Figure 4 and Figure 5 As shown, the limit assembly 200 includes a main body fixed seat 210 and an end movable seat 220. The main body fixed seat 210 is fixed at the first station 101 of the base 100, and the end movable seat 220 is slidably arranged on one side of the main body fixed seat 210, and the end movable seat 220 slides between the first station 101 and the second station 102. The limit assembly 200 is used to limit the standard resistor 10 to be tested. The standard resistor 10 includes an intermediate resistor body 11 and a protective shell 12; a positioning groove 211 for accommodating the protective shell 12 is opened on the main body fixed seat 210.

[0040] The driving cylinder 300 is provided with a telescopic rod 310 (such as Figure 3 As shown in FIG. 1 , the two ends of the middle resistor 11 are respectively mounted on the telescopic rod 310 and the end movable seat 220. When in use, the telescopic rod 310 of the driving cylinder 300 causes the end movable seat 220 and the middle resistor 11 to slide on the base 100, thereby changing the position of the middle resistor 11.

[0041] The standard resistor 10 involved in the present invention is as follows Figure 1 and Figure 2 As shown, pole pieces 13 are provided at both ends of the intermediate resistor 11, and end caps 14 are provided at both ends of the protective shell 12. During packaging, the intermediate resistor 11 is accommodated in the protective shell 12, and the end caps 14 are provided at both ends of the protective shell 12, so that the intermediate resistor 11 is in a relatively sealed environment; at the same time, the pole piece 13 protrudes from the end cap 14 to facilitate subsequent connection with the wire. Preferably, the end cap 14 is an insulating plastic structure, and the end movable seat 220 is made of insulating rubber.

[0042] In this embodiment, if Figure 3 and Figure 4 As shown, there are two conductive contact knives 400, one of which is disposed between the first station 101 and the second station 102, and the other conductive contact knives 400 is disposed at the end of the second station 102; the end movable seat 220 slides between the two conductive contact knives 400. Preferably, a bracket 110 is disposed on the base 100, and the conductive contact knives 400 are rotatably disposed on the bracket 110. In addition, a brush head 401 is disposed at the end of the conductive contact knives 400, and the brush head 401 contacts or separates from the end of the intermediate resistor 11 (i.e., the pole piece 13). When the two are in contact and connected, the brush head 401 and the intermediate resistor 11 are electrically conductively connected.

[0043] In this embodiment, a conductive contact piece (not shown) is provided at the end of the driving cylinder 300, and the conductive contact piece contacts the end of the intermediate resistor 11 (i.e., the pole piece 13) to achieve electrical connection. Figure 4 As shown in FIG. 1 , the negative electrode test lead 120 is electrically connected to the conductive contact sheet, and the positive electrode test lead 130 is electrically connected to the brush heads 401 of the two conductive contact blades 400. During the test, the conductive contact sheet is always in contact with the middle resistor 11, that is, the negative electrode test lead 120 is always electrically connected to the middle resistor 11; and only after the middle resistor 11 moves into position, the brush head 401 contacts the middle resistor 11, so that the positive electrode test lead 130 is electrically connected to the middle resistor 11.

[0044] In this embodiment, if Figure 5 As shown, stepped grooves 212 are provided at both ends of the positioning groove 211, and the stepped grooves 212 are adapted to the end cover 14. Both ends of the protective shell 12 are blocked by the stepped grooves 212, so that the protective shell 12 can only be accommodated in the positioning groove 211, that is, the protective shell 12 can only be located at the first workstation 101; a clamping groove 221 cooperating with the pole piece 13 is provided on the end movable seat 220, and when placed, one of the pole pieces 13 of the intermediate resistor 11 is clamped in the clamping groove 221.

[0045] Next, in combination with the above structure, the working principle of the standard resistance dual-station test fixture 20 of the present invention is explained:

[0046] It should be noted in advance that the present invention aims to ensure the accuracy of resistance testing while enabling the test fixture 20 to conveniently simulate the state of resistor packaging and disassembly, thereby improving work efficiency. Specifically, when testing the standard resistor 10, it is necessary to test the resistance of the intermediate resistor 11 after it is packaged. This is because the ambient temperature and heat dissipation performance after packaging will be affected by the protective housing 12, which will cause the resistance of the intermediate resistor 11 to change. To this end, the existing testing method is to test the packaged product. When there is a deviation in the measured resistance, it is necessary to disassemble the standard resistor 10 and grind and adjust the resistance of the intermediate resistor 11; after the resistance is adjusted, the packaged standard resistor 10 is measured again; if there is still a deviation in the resistance, it is necessary to disassemble and grind again, and repeat this process many times until the resistance meets the standard. In this case, the reciprocating disassembly and assembly leads to low test efficiency;

[0047] The test fixture 20 of the present invention is provided with a first station 101 and a second station 102 on the base 100, and the main body fixing seat 210 is located at the first station 101 (such as Figure 6During the test, first, the staff places the assembled standard resistor 10 into the main body fixing seat 210, and the protective shell 12 is accommodated in the positioning groove 211; the pole piece 13 at one end of the middle resistor 11 is clamped in the clamping groove 221 of the end movable seat 220, and the pole piece 13 at the other end is mounted on the telescopic rod 310 of the driving cylinder 300;

[0048] When the end movable seat 220 moves to the first station 101, the end movable seat 220 fits the main body fixed seat 210. At this time, the intermediate resistor 11 is housed in the protective shell 12, and the end covers 14 are sealed at both ends. In this way, a real environment (ambient temperature and heat dissipation performance) is created to simulate the packaging of the intermediate resistor 11. Testing under this condition can more accurately test the resistance value of the standard resistor 10. During the test, the staff rotates the conductive contact knife 400 so that the brush head 401 of the conductive contact knife 400 contacts the electrode 13 on the end movable seat 220. In this way, the negative test wire 120 is connected to the positive test wire 130, and the resistance value of the standard resistor 10 can be measured by the connected external instrument;

[0049] If the measured resistance value has deviations and needs to be polished and adjusted, the telescopic rod 310 pushes the middle resistor 11 and the end movable seat 220 to slide to the second station 102. After sliding into place, the middle resistor 11 is completely exposed to the outside of the protective shell 12. One end of the middle resistor 11 is mounted on the end movable seat 220 and is under the conductive contact knife 400, and the other end is clamped on the end edge of the protective shell 12 by the end cover 14. At this time, turning the conductive contact knife 400 to make it contact with the corresponding pole piece 13 can achieve conductivity, and then measure the resistance of the middle resistor 11 in the unpackaged state. The staff polishes and adjusts the resistance of the middle resistor 11 according to the measurement situation;

[0050] After the resistance adjustment is completed, the intermediate resistor 11 is retracted into the protective housing 12 under the drive of the telescopic rod 310, so that the intermediate resistor 11 returns to the packaged state. In this case, the intermediate resistor 11 is tested again to ensure the accuracy of the resistance value after polishing. After reaching the standard, the staff takes out the standard resistor 10 as a whole for the next step of packaging.

[0051] Compared with the prior art, the test fixture 20 of the present invention can freely move the intermediate resistor 11 back and forth between the first station 101 and the second station 102 by driving the cylinder 300, thereby realizing free switching between the packaged state and the disassembled state. In this way, the real environment (ambient temperature and heat dissipation performance) of the simulated package condition is realized to ensure the accuracy of the resistance measurement; and convenient disassembly and assembly operations are realized, thereby improving the measurement efficiency and reducing the difficulty of the test work.

[0052] In the present invention, if there is a deviation in the measured resistance value, the intermediate resistor 11 needs to be pushed out to the second station 102 for grinding. Dust will be generated during the grinding process, and the generated dust will easily enter the inside of the protective shell 12, thereby causing product defects. In order to solve the problem that dust easily enters the inside of the protective shell 12, the present invention is designed as follows: during the movement of the intermediate resistor 11, the two end caps 14 are respectively clamped at the two ends of the intermediate resistor 11, and will move with the intermediate resistor 11. During the movement of the intermediate resistor 11 to the second station 102, one of the end caps 14 will slide into the protective shell 12, and the end cap 14 provides a support for the intermediate resistor 11, so that the intermediate resistor 11 can maintain a horizontal state during movement; when it is moved into place, the end cap 14 is at the end of the protective shell 12, which just blocks the opening of the protective shell 12, so that the generated debris can be prevented from entering the inside of the protective shell 12 during the grinding and resistance adjustment process, thereby ensuring the cleanliness of the protective shell 12, so as not to affect the subsequent packaging use.

[0053] In this embodiment, a waste opening 140 (such as Figure 6 During the grinding and resistance adjustment process, the generated debris will fall into the waste port 140, thereby reducing the accumulation of debris on the base 100 to avoid affecting the sliding of the end movable seat 220.

[0054] In summary, the standard resistor dual-station test fixture 20 of the present invention can conveniently simulate the packaging and disassembly states, thereby improving the test efficiency and reducing the test workload on the basis of ensuring the accuracy of the resistance test.

[0055] The present invention also discloses a standard resistance testing method, which is implemented by the above-mentioned standard resistance double-station testing fixture, and includes the following steps:

[0056] Place the assembled standard resistor into the main body fixing seat, and place the protective shell into the positioning groove; one end of the middle resistor body is clamped in the clamping groove of the end movable seat, and the other end of the resistor is mounted on the telescopic rod of the driving cylinder;

[0057] When the end movable seat moves to the first station, the end movable seat fits the main body fixed seat, and the middle resistor is accommodated in the protective shell, and the end covers are sealed at both ends; the conductive contact knife is rotated so that the brush head of the conductive contact knife contacts the electrode piece on the end movable seat, so that the negative electrode test wire is connected with the positive electrode test wire, and the resistance value of the standard resistor can be measured by the connected external instrument;

[0058] If the measured resistance value has deviation and needs to be polished and adjusted, the telescopic rod pushes the middle resistor and the end movable seat to slide to the second station; after sliding into place, the middle resistor is completely exposed outside the protective shell, one end of the middle resistor is mounted on the end movable seat and is under the conductive contact knife, and the other end is clamped on the end edge of the protective shell through the end cover; at this time, the conductive contact knife is rotated to make it contact with the corresponding electrode piece to achieve conductivity, and then the resistance value of the middle resistor in the unpackaged state is measured; the middle resistor is polished and adjusted according to the measurement situation;

[0059] After the resistance adjustment is completed, the middle resistor is put back into the protective housing again under the driving of the telescopic rod, so that the middle resistor returns to the packaged state. In this case, the middle resistor is tested again;

[0060] After reaching the standard, the standard resistor is taken out as a whole for the next step of packaging.

[0061] The above-mentioned embodiments only express several implementation methods of the present invention, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the invention patent. It should be pointed out that, for ordinary technicians in this field, several variations and improvements can be made without departing from the concept of the present invention, and these all belong to the protection scope of the present invention. Therefore, the protection scope of the patent of the present invention shall be subject to the attached claims.

Claims

1. A standard resistance double-station test fixture, characterized in that: include: A base, a limit assembly, a driving cylinder and a conductive contact knife, wherein the limit assembly and the conductive contact knife are installed on the base, and the driving cylinder is arranged on one side of the limit assembly; A first station and a second station are formed on the base; The limiting assembly includes a main body fixed seat and an end movable seat, wherein the main body fixed seat is fixedly arranged at the first station of the base, and the end movable seat is slidably arranged on one side of the main body fixed seat; The limit assembly is used to limit the standard resistor, and the standard resistor includes an intermediate resistor body and a protective shell; the main body fixing seat is provided with a positioning groove for accommodating the protective shell; The driving cylinder is provided with a telescopic rod which can movably penetrate into the main body fixing seat, and the two ends of the intermediate resistor are respectively mounted on the telescopic rod and the end movable seat.

2. The standard resistance double-station test fixture according to claim 1, characterized in that: There are two conductive contact knives, one of which is arranged between the first station and the second station, and the other is arranged at the end of the second station; the end movable seat slides between the two conductive contact knives.

3. The standard resistance double-station test fixture according to claim 2, characterized in that: A bracket is arranged on the base, and the conductive contact knife is rotatably arranged on the bracket; a brush head is arranged at the end of the conductive contact knife, and the brush head contacts or separates from the end of the intermediate resistor.

4. The standard resistance double-station test fixture according to claim 3, characterized in that: A conductive contact is provided at the end of the driving cylinder, and the conductive contact is in contact with the end of the intermediate resistor; a negative test wire and a positive test wire are provided on the base, the negative test wire is electrically connected to the conductive contact, and the positive test wire is electrically connected to the brush heads of the two conductive contact knives.

5. The standard resistance double-station test fixture according to claim 1, characterized in that: Both ends of the intermediate resistor are provided with pole pieces, and both ends of the protective shell are provided with end covers, and the pole pieces protrude out of the end covers.

6. The standard resistance double-station test fixture according to claim 5, characterized in that: Both ends of the positioning groove are provided with stepped grooves, the stepped grooves are adapted to the end covers, and both ends of the protective shell are blocked by the stepped grooves; and the end movable seat is provided with a slot matched with the pole piece.

7. The standard resistance double-station test fixture according to claim 5, characterized in that: The end cover is an insulating plastic structure, and the end movable seat is made of insulating rubber material.

8. The standard resistance double-station test fixture according to claim 1, characterized in that: A waste opening is provided at the second workstation of the base.

9. A standard resistance test method, characterized in that: The method is implemented by the standard resistance double-station test fixture described in any one of claims 1 to 8, comprising the following steps: Place the assembled standard resistor into the main body fixing seat, and place the protective shell into the positioning groove; one end of the middle resistor body is clamped in the clamping groove of the end movable seat, and the other end of the pole piece is mounted on the telescopic rod of the driving cylinder; When the end movable seat moves to the first station, the end movable seat fits the main body fixed seat, and the middle resistor is accommodated in the protective shell, and the end caps are sealed at both ends; Rotate the conductive contact knife so that the brush head of the conductive contact knife contacts the electrode piece on the end movable seat, so that the negative electrode test wire is connected with the positive electrode test wire, and the resistance value of the standard resistor can be measured by the connected external instrument; If the measured resistance value has deviation and needs to be polished and adjusted, the telescopic rod pushes the middle resistor and the end movable seat to slide to the second station; after sliding into place, the middle resistor is completely exposed outside the protective shell, one end of the middle resistor is mounted on the end movable seat and is under the conductive contact knife, and the other end is clamped on the end edge of the protective shell through the end cover; at this time, the conductive contact knife is rotated to make it contact with the corresponding electrode piece to achieve conductivity, and then the resistance value of the middle resistor in the unpackaged state is measured; the middle resistor is polished and adjusted according to the measurement situation; After the resistance adjustment is completed, the middle resistor is put back into the protective housing again under the driving of the telescopic rod, so that the middle resistor returns to the packaged state. In this case, the middle resistor is tested again; After reaching the standard, the standard resistor is taken out as a whole for the next step of packaging.

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