Current calibration method, current calibration device, test system and storage medium

Abstract

The invention discloses a current calibration method, a current calibration device, a test system and a storage medium, and the current calibration method comprises the steps: obtaining a first current value of a tested component and a resistance value of a calibration component; calibrating the first current value by using the calibration coefficient to obtain a second current value; determining a theoretical current value by using the resistance value; and comparing the second current value with the theoretical current value to obtain a current calibration result of the tested component. Through the above mode, the calibration component can be used to carry out current calibration on the plurality of tested components, the utilization rate of the calibration component is high, the accuracy of the calibration coefficient obtained in advance is high, the current calibration process can be accelerated, and the current calibration efficiency and accuracy can be improved.

Description

Technical Field

[0001] The present application relates to the technical field of integrated circuit testing, and in particular to a current calibration method, a current calibration device, a testing system and a storage medium. Background Art

[0002] During chip testing, current testing under various working conditions is essential, and almost every test board contains a current testing circuit. To ensure the accuracy of chip current testing, the current testing circuit on the test board itself must achieve a certain degree of accuracy.

[0003] The current calibration technology in the related art can only calibrate one component under test. When a large number of components under test need to be calibrated, the entire process will be more complicated and the operation complexity will be relatively high. If it is applied to a large number of components under test, the workload of operators will be multiplied. Summary of the invention

[0004] The present application provides a current calibration method, a current calibration device, a test system and a storage medium, which can use calibration components to perform current calibration on multiple components under test. The utilization rate of the calibration components is high, and the calibration coefficients obtained in advance are of high accuracy, which can not only speed up the current calibration process, but also improve the efficiency and accuracy of the current calibration.

[0005] In order to solve the above technical problems, a technical solution adopted in the present application is: to provide a current calibration method, which includes: obtaining a first current value of the component under test and a resistance value of the calibration component; calibrating the first current value using a calibration coefficient to obtain a second current value; determining a theoretical current value using the resistance value; and comparing the second current value with the theoretical current value to obtain a current calibration result of the component under test.

[0006] The use of the resistance value to determine the theoretical current value includes: determining the current voltage value of the calibration component; and determining the theoretical current value of the calibration component based on the current voltage value and the resistance value.

[0007] Among them, comparing the second current value and the theoretical current value to obtain the current calibration result of the component under test includes: determining a first absolute value of the difference between the second current value and the theoretical current value; in response to the first absolute value being less than or equal to a preset threshold, the current calibration result of the component under test is a successful calibration; in response to the first absolute value being greater than the preset threshold, the current calibration result of the component under test is a failed calibration.

[0008] The step of obtaining the calibration coefficient includes: before current calibration, measuring the third current value of the calibration component at multiple current levels; and determining the calibration coefficient using the multiple third current values.

[0009] Wherein, using the plurality of third current values ​​to determine the calibration coefficient includes: performing linear fitting on the plurality of third current values ​​to obtain a fitting line; and using the slope of the fitting line as the calibration coefficient. Or

[0010] Determine the second absolute value of the difference between each third current value and the corresponding current gear current; perform linear fitting on multiple second absolute values ​​to obtain a fitting line; and use the slope of the fitting line as a calibration coefficient.

[0011] In order to solve the above technical problems, another technical solution adopted by the present application is: to provide a current calibration device, which includes a sampling unit and a processing unit. The sampling unit is used to obtain a first current value of the component under test and a resistance value of the calibration component; the processing unit is used to calibrate the first current value using the calibration coefficient to obtain a second current value, and to determine a theoretical current value using the resistance value, and to compare the second current value with the theoretical current value to obtain a current calibration result of the component under test.

[0012] Among them, the sampling unit is also used to obtain the first current value of multiple components under test and the resistance value of the calibration component; the processing unit is also used to calibrate the first current value of each component under test using the calibration coefficient to obtain the second current value, and to determine the theoretical current value using the resistance value, and to compare the second current value with the theoretical current value to obtain the current calibration result of each component under test.

[0013] In order to solve the above technical problems, another technical solution adopted by the present application is: to provide a test system, which includes a test device and a current calibration device. The test device is used to test the components under test; the current calibration device is coupled to the test device, and the current calibration device is the current calibration device described above.

[0014] In order to solve the above technical problem, another technical solution adopted by the present application is: providing a computer-readable storage medium, the computer-readable storage medium stores a computer program, and the computer program is used to implement the above current calibration method when executed by a processor.

[0015] The beneficial effects of the present application are as follows: Different from the prior art, the present application obtains the first current value of the measured component and the resistance value of the calibration component; calibrates the first current value using the calibration coefficient to obtain the second current value; determines the theoretical current value using the resistance value; and compares the second current value with the theoretical current value to obtain the current calibration result of the measured component. The calibration component can be used to perform current calibration on multiple measured components, the utilization rate of the calibration component is high, and the calibration coefficient obtained in advance has a high accuracy, which can not only speed up the current calibration process, but also improve the efficiency and accuracy of the current calibration. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work. Among them:

[0017] Figure 1 is a flow chart of the first embodiment of the current calibration method provided by the present application;

[0018] Figure 2 It is a flowchart of an embodiment of the calibration coefficient acquisition step 1 provided in the present application;

[0019] Figure 3 It is a schematic diagram of an embodiment of a preset table 1 provided in the present application;

[0020] Figure 4 is a flow chart of a second embodiment of the current calibration method provided by the present application;

[0021] Figure 5 It is a structural schematic diagram of an embodiment of a current calibration device provided by the present application;

[0022] Figure 6 It is a structural schematic diagram of an embodiment of a test system provided by the present application;

[0023] Figure 7 It is a structural schematic diagram of an embodiment of a computer-readable storage medium provided by the present application. DETAILED DESCRIPTION

[0024] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0025] See also Figure 1 , Figure 1 : is a flow chart of a first embodiment of a current calibration method provided by the present application, and the current calibration method comprises:

[0026] Step 11: Obtain a first current value of the component under test and a resistance value of the calibration component.

[0027] The tested component can be a circuit board, such as a PCB (Printed Circuit Board), a BIB (Burn-In Board), or other chips. The calibration component can be a chip with a resistor element encapsulated inside, such as the CH701W series products.

[0028] In some embodiments, a host computer (such as a PC) communicates with the component under test and the calibration component. The host computer can be used to sample the first current value of the component under test and identify the resistance value of the calibration component.

[0029] It is worth noting that there is a correlation between the first current value of the measured component and the resistance value of the calibration component. Specifically, when the voltage of the measured component or the calibration component is fixed, when the resistance value of the calibration component is large, the first current value of the measured component is correspondingly small. Conversely, when the resistance value of the calibration component is small, the first current value of the measured component is correspondingly large. For example, the voltage is fixed at 3.3V, the resistance value of the calibration component is 3Ω, and the first current value of the measured component can be determined in the data in A as 1.1A; for another example, the voltage is fixed at 3.3V, the resistance value of the calibration component is 10Ω, and the first current value of the measured component can be determined in the data in mA as 330mA.

[0030] Step 12: Calibrate the first current value using the calibration coefficient to obtain the second current value.

[0031] In some embodiments, see Figure 2 , the steps of obtaining the calibration coefficient may include:

[0032] Step 21: Before current calibration, measure the third current value of the calibration component at multiple current levels.

[0033] The current range refers to the current size, that is, one current value can be considered as one current range, such as 1mA and 2mA are two ranges.

[0034] After determining the resistance value of the calibration component, the third current value of the calibration component at different current levels can be measured. For example, if the current level ranges from 10 to 1000 mA, at least one current value is selected from 10 to 1000 mA, and then the actual current value of the calibration component at the selected current level, i.e., the third current value, is measured.

[0035] It is worth noting that for currents of different gears, calibration components with different resistance values ​​are used for testing, that is, different current gears correspond to calibration components with different resistance values, such as gear A corresponds to calibration components with resistance value a, and gear B corresponds to calibration components with resistance value b.

[0036] In addition, when only one resistor element is encapsulated in the calibration component, multiple calibration components with built-in resistor elements with different resistance values ​​are required to correspond to different current gears, so as to measure the third current value of each calibration component at the corresponding current gear, that is, when switching the current gear, the measurement object (calibration component) is switched at the same time; when resistor elements with multiple resistance values ​​are encapsulated in the calibration component, only the third current value of one calibration component at multiple current gears can be measured, that is, when switching the current gear, the measurement object (resistance element) is switched at the same time.

[0037] Step 22: Determine a calibration coefficient using a plurality of third current values.

[0038] In some embodiments, a fitting line is obtained by performing linear fitting on a plurality of third current values, and the slope of the fitting line is used as a calibration coefficient.

[0039] Specifically, after obtaining multiple third current values ​​of the calibration component at different current gears, a linear curve of the third current value of the calibration component at different current gears can be obtained, that is, the current gear is used as the x-axis / y-axis, and the third current value is used as the y-axis / x-axis, so as to obtain the slope of the fitting line based on the xy curve graph, and use the slope as the calibration coefficient. For example, when the current gear is 10mA, the third current value of the calibration component is 9.8mA; when the current gear is 16mA, the third current value of the calibration component is 14.6mA, and the corresponding slope of the fitting line can be obtained as 1.25, that is, the calibration coefficient is 1.25.

[0040] In other embodiments, a second absolute value of the difference between each third current value and the corresponding current level current is determined, and then a linear fit is performed on the plurality of second absolute values ​​to obtain a fitting line, and the slope of the fitting line is used as the calibration coefficient.

[0041] Specifically, after obtaining multiple third current values ​​of the calibration component at different current levels, the second absolute value of the difference between the third current value and the corresponding current level can be determined, and then a linear curve of the second absolute value at different current levels can be obtained, that is, the current level is the x-axis / y-axis, and the second absolute value is the y-axis / x-axis, so as to obtain the slope of the fitting line based on the xy curve graph, and use the slope as the calibration coefficient. For example, when the current level is 10mA, the third current value of the calibration component is 9.8mA, and the second absolute value is 0.2 at this time; when the current level is 16mA, the third current value of the calibration component is 14.6mA, and the second absolute value is 1.4 at this time, and then the slope of the corresponding fitting line can be obtained as 5.

[0042] Step 13: Use the resistance value to determine the theoretical current value.

[0043] In some embodiments, the current voltage value of the calibration component is determined, and then the theoretical current value of the calibration component is determined according to the current voltage value and the resistance value.

[0044] Among them, the voltage value of the calibration component can be a fixed value, such as 3.3V; the voltage value of the calibration component can also be a non-fixed value, that is, the voltage value of the calibration component corresponding to two adjacent calibrations is different. At this time, the current voltage value of the calibration component can be identified by the software on the upper computer / host.

[0045] Step 14: Compare the second current value with the theoretical current value to obtain a current calibration result of the component under test.

[0046] In some embodiments, the difference between the second current value and the theoretical current value is compared with a preset threshold value to determine whether the current calibration of the component under test is successful. The preset threshold value may be 5, 6 or other values, which are determined according to actual conditions and are not limited here.

[0047] Specifically, a first absolute value of the difference between the second current value and the theoretical current value is determined, and the magnitude relationship between the first absolute value and a preset threshold is compared. In response to the first absolute value being less than or equal to the preset threshold, the current calibration result of the component under test is a successful calibration, or, in response to the first absolute value being greater than the preset threshold, the current calibration result of the component under test is a failed calibration.

[0048] In addition, in some embodiments, a preset table can be used to record the second current value and the theoretical current value, and the second current value can be displayed using different colors. When the first absolute value of the difference between the second current value and the theoretical current value is less than or equal to the preset threshold, the second current value is displayed using color A. When the first absolute value of the difference between the second current value and the theoretical current value is greater than the preset threshold, the second current value is displayed using color B that is different from color A. In other embodiments, other methods can be used to display the second current value, such as Figure 3 As shown, in Figure 3 In the table, the theoretical current value is 100mA, the preset threshold is 5mA, and when the first absolute value of the difference between the second current value and the theoretical current value is less than or equal to the preset threshold, the second current value is covered and displayed with a shadow, and when the first absolute value of the difference between the second current value and the theoretical current value is greater than the preset threshold, the second current value in the table has no shadow.

[0049] Based on this, the current calibration results of the components under test can be determined by directly observing the preset table, which is more intuitive and simple, and can be traced back in the event of a misjudgment in the future.

[0050] Different from the related art, the current calibration method provided by the present application obtains the first current value of the measured component and the resistance value of the calibration component; calibrates the first current value using the calibration coefficient to obtain the second current value; determines the theoretical current value using the resistance value; and compares the second current value with the theoretical current value to obtain the current calibration result of the measured component. Through the above method, the calibration components can be used to perform current calibration on multiple measured components. The utilization rate of the calibration components is high, and the calibration coefficients obtained in advance have high accuracy, which can not only speed up the current calibration process, but also improve the efficiency and accuracy of the current calibration. In addition, through the above method, the components that failed the current calibration can be excluded, so as to avoid using these components that failed the current calibration in the subsequent process and avoid other effects.

[0051] See also Figure 4 , Figure 4 : is a flow chart of a second embodiment of a current calibration method of the present application, the current calibration method comprising:

[0052] Step 41: Obtain a first current value of the component under test and a resistance value of the calibration component.

[0053] Step 42: Calibrate the first current value using the calibration coefficient to obtain a second current value.

[0054] Step 43: Determine the current voltage value of the calibration component, so as to determine the theoretical current value of the calibration component based on the current voltage value and the resistance value.

[0055] Step 44: Determine a first absolute value of a difference between the second current value and the theoretical current value.

[0056] Step 45: Determine whether the first absolute value is less than or equal to a preset threshold.

[0057] If so, it means that the consistency requirement is met, and the current calibration result of the measured component is determined to be a successful calibration; otherwise, it means that the consistency requirement is not met, and the current calibration result of the measured component is determined to be a failed calibration.

[0058] Different from the related art, the current calibration method provided in the present application can use calibration components to perform current calibration on multiple components under test. The utilization rate of the calibration components is high, and the calibration coefficients obtained in advance are of high accuracy. It can not only speed up the current calibration process, but also improve the efficiency and accuracy of current calibration.

[0059] See also Figure 5 , Figure 5 is a schematic structural diagram of an embodiment of a current calibration device provided in the present application. The current calibration device 50 includes a sampling unit 501 and a processing unit 502 .

[0060] In some embodiments, the sampling unit 501 is used to obtain a first current value of the component under test and a resistance value of the calibration component; the processing unit 502 is used to calibrate the first current value using the calibration coefficient to obtain a second current value, and to determine a theoretical current value using the resistance value, and to compare the second current value with the theoretical current value to obtain a current calibration result of the component under test.

[0061] In other embodiments, the sampling unit 501 is also used to obtain the first current values ​​of multiple components under test and the resistance values ​​of the calibration components; the processing unit 502 is also used to calibrate the first current value of each component under test using the calibration coefficient to obtain the second current value, and to determine the theoretical current value using the resistance value, and to compare the second current value with the theoretical current value to obtain the current calibration result of each component under test.

[0062] In addition, considering that hardware aging and other issues may cause inaccurate calibration coefficients, at this time, the upper computer / host end or other modules can be used to obtain new calibration coefficients. The new calibration coefficients are obtained through other components that meet the consistency. Meeting the consistency means that the corresponding current calibration result shows that the calibration is successful. For example, the calibration coefficient x1 is used to calibrate devices A1, A2, ...An, and the current calibration result shows that the calibration is successful. After a period of time, the calibration coefficient x1 is used to calibrate devices A1, A2, ...An. It is found that the current calibration result shows that the calibration failed, which means that the calibration coefficient x1 is no longer applicable to the current calibration of devices A1, A2, ...An. At this time, the calibration coefficient can be re-acquired to obtain the calibration coefficient x2, and the calibration coefficient x2 can be used to perform current calibration on one of the devices A1, A2, ...An, such as A1, to obtain the calibration result. If the current calibration result shows that the calibration is successful, the calibration coefficient x2 can be used to perform current calibration on the remaining devices such as A2, ...An. It can be understood that devices A1, A2, ...An all meet the consistency requirement, and the consistency requirement is to meet the requirement of the same calibration coefficient. That is to say, the above-mentioned current calibration method can first re-calibrate the current of one of the devices for the components that meet the same calibration process. After the current calibration of the device is successful, the remaining devices in the same batch are calibrated again. This can avoid repeatedly obtaining the calibration coefficient, and only using one of the devices as a reference can reduce the reuse of the calibration coefficient, improve the progress of the entire current calibration process, and reduce the calibration time.

[0063] Different from the related art, the current calibration device 50 provided in the present application can realize the current calibration of the components under test.

[0064] See also Figure 6 , Figure 61 is a schematic diagram of a structure of an embodiment of a test system provided by the present application, wherein the test system 60 comprises a test device 601 and a current calibration device 50. The test device 601 is used to test the components under test, and the current calibration device 50 is coupled to the test device 601. The current calibration device 50 is as described in the above embodiment and will not be described again here.

[0065] Different from the related art, the test system 60 provided in the present application can realize current calibration of the components under test.

[0066] See also Figure 7 , Figure 7 It is a structural diagram of an embodiment of a computer-readable storage medium provided in the present application. The computer-readable storage medium 70 stores a computer program 701. When the computer program 701 is executed by a processor, it is used to implement the current calibration method of any of the above embodiments, which will not be repeated here.

[0067] The storage media used in this application include various media that can store program codes, such as a USB flash drive, a mobile hard disk, a read-only memory (ROM), a random access memory (RAM), or a CD.

[0068] In summary, calibration components can be used to perform current calibration on multiple components under test. The utilization rate of calibration components is high, and the calibration coefficients obtained in advance have high accuracy, which can not only speed up the current calibration process, but also improve the efficiency and accuracy of current calibration.

[0069] In addition, the current calibration technology in the related art can only calibrate one component under test. When a large number of components under test need to be calibrated, the entire process will be more complicated. For example, when it is necessary to eliminate the influence of resistance on the sampling current (i.e., the first current value), one uA gear requires at least two resistors for calibration. The same is true for the currents of other gears. Moreover, the current calibration coefficients in different current ranges may have large deviations, so it is necessary to increase the calibration resistor. This calibration method is relatively complex for one component under test. If it is applied to a large number of components under test, the workload of the operator will be multiplied.

[0070] In addition, it is worth noting that after long-term research by the applicant of this application, it was found that the current calibration method of this application is also applicable to temperature calibration and voltage calibration, that is, converting current into temperature / voltage can also achieve temperature / voltage calibration.

[0071] The above description is only an implementation method of the present application, and does not limit the patent scope of the present application. Any equivalent structure or equivalent process transformation made using the contents of the present application specification and drawings, or directly or indirectly used in other related technical fields, are also included in the patent protection scope of the present application.

Claims

1. A current calibration method, characterized in that: The method comprises: Obtaining a first current value of the component under test and a resistance value of the calibration component; Calibrate the first current value using a calibration coefficient to obtain a second current value; Determining a theoretical current value using the resistance value; The second current value is compared with the theoretical current value to obtain a current calibration result of the component under test.

2. The method according to claim 1, characterized in that Determining the theoretical current value by using the resistance value includes: Determining a current voltage value of the calibration component; Based on the current voltage value and the resistance value, a theoretical current value of the calibration component is determined.

3. The method according to claim 1, characterized in that The comparing the second current value with the theoretical current value to obtain the current calibration result of the component under test includes: determining a first absolute value of a difference between the second current value and the theoretical current value; In response to the first absolute value being less than or equal to a preset threshold, the current calibration result of the component under test is a successful calibration; In response to the first absolute value being greater than the preset threshold, the current calibration result of the component under test is calibration failure.

4. The method according to claim 1, characterized in that: The step of obtaining the calibration coefficient comprises: Before current calibration, measuring a third current value of the calibration component at a plurality of current levels; The calibration coefficient is determined using a plurality of the third current values.

5. The method according to claim 4, characterized in that The step of determining the calibration coefficient by using the plurality of third current values ​​comprises: Performing linear fitting on the plurality of third current values ​​to obtain a fitting line; The slope of the fitting line is taken as the calibration coefficient.

6. The method according to claim 4, characterized in that The step of determining the calibration coefficient by using the plurality of third current values ​​comprises: Determine a second absolute value of the difference between each of the third current values ​​and the corresponding current gear current; Performing linear fitting on the plurality of second absolute values ​​to obtain a fitting line; The slope of the fitting line is taken as the calibration coefficient.

7. A current calibration device, characterized in that: The current calibration device comprises: A sampling unit, used to obtain a first current value of the component under test and a resistance value of the calibration component; The processing unit is used to calibrate the first current value using a calibration coefficient to obtain a second current value; and determine a theoretical current value using the resistance value; and compare the second current value with the theoretical current value to obtain a current calibration result of the component under test.

8. The current calibration device according to claim 7, characterized in that: The sampling unit is also used to obtain first current values ​​of multiple components under test and resistance values ​​of calibration components; The processing unit is further used to calibrate the first current value of each of the components under test using the calibration coefficient to obtain a second current value; and to determine a theoretical current value using the resistance value; And compare the second current value with the theoretical current value to obtain the current calibration result of each of the components under test.

9. A testing system, characterized in that: The test system comprises: A testing device, wherein the testing device is used to test the components under test; A current calibration device is coupled to the test device, wherein the current calibration device is the current calibration device as described in any one of claims 7-8.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the computer program is used to implement the method according to any one of claims 1 to 6.

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