Voltage and current error checking method and system for quantum mutual inductor

Abstract

The invention discloses a voltage and current error verification method and system for a quantum mutual inductor, and belongs to the technical field of electric measurement and metering. The method comprises the following steps: simulating different operating environments of a quantum mutual inductor field through a three-phase test conductor, and applying test voltage and test current to a C-phase primary conductor of the three-phase test conductor in the different operating environments; testing voltage and testing current passing through the measured sub-mutual inductor are measured through the measured sub-mutual inductor, the standard voltage transformer and the standard current transformer, and a measurement result is used as a secondary signal to be input into the quantum mutual inductor calibrator; and through the quantum mutual inductor calibrator, according to the secondary signal, verifying the voltage error and the current error of the quantum mutual inductor. The method can be used for checking the error of the quantum mutual inductor in a laboratory by a mutual inductor and a third-party inspection and detection mechanism, and can also be used for checking the error of the quantum mutual inductor in a transformer substation or a convertor station field.

Description

Technical Field

[0001] The present invention relates to the technical field of electrical measurement and metering, and more specifically, to a voltage and current error calibration method and system for a quantum mutual inductor. Background Art

[0002] As a measuring device for basic electrical quantities in the power system, current / voltage transformers are used to sense core electrical parameters of the power grid such as voltage and current. They are widely used in important links such as metering, line protection monitoring, etc. in the power system. Their measurement data is the direct basis for electricity trade settlement and electricity carbon trading. When facing the measurement requirements of wide dynamic, fast time-varying, and strong random signals in the new power system, current / voltage transformers face huge technical challenges such as "inaccurate measurement", "unable to manufacture" high-end equipment, and "unclear" operating status. Due to the need for insulation, traditional electromagnetic induction transformers are often large in size and mass, with high construction and operation and maintenance costs, narrow measurement frequency band, small dynamic range, and analog output. They are difficult to adapt to the development requirements of smart grids. Electronic transformers have problems such as anti-interference problems of electronic and optical devices, temperature problems, and integral drift. Accuracy and stability problems have become the biggest bottleneck and obstacle to their normal use. At the same time, in-service power transformers need to be calibrated regularly to ensure the accuracy of their values. Calibration technologies such as live calibration, offline calibration, and online status evaluation have shortcomings in terms of cost and large-scale application. Traditional power measurement equipment has gradually shown technical bottlenecks in calibration-free and reliability. The quantum mutual inductor based on the principles of electromagnetic induced transparency and light detection magnetic resonance uses quantum control technology to break through many limitations of traditional mutual inductors. It has the advantages of fast response time, simple insulation structure, wide measurement range, good frequency response characteristics, and multi-parameter sensing. It can realize the integrated measurement of voltage and current, and is particularly suitable for the measurement needs of new power systems.

[0003] At present, the transformers in the power system include two separate devices, namely the voltage transformer and the current transformer, and there are also integrated power transformers, but they all perform voltage error verification or current error verification separately, and there is no integrated voltage and current error verification method yet.

[0004] At present, the transformers in the power system are basically separated into voltage transformers and current transformers. The voltage transformer performs voltage error verification, using a booster, a standard voltage transformer, and a transformer calibrator as test equipment, while the current transformer performs current error verification, using a booster, a standard current transformer, and a transformer calibrator as test equipment. For voltage and current integrated transformers, the voltage error and current error are usually verified separately. Traditional voltage and current integrated transformers use ferromagnetic windings or loop integration principles, and are insensitive to bypass primary conductor interference. Quantum transformers are mostly based on magnetic field or electric field measurements to achieve voltage and current measurements. The shielding effect of quantum transformers or the influence of bypass current conductors is also one of the indicators for error verification and evaluating its reliability. Therefore, the error verification method of traditional transformers is not very suitable for quantum transformers. Summary of the invention

[0005] In view of the above problems, the present invention proposes a voltage and current error calibration method for a quantum mutual inductor, comprising:

[0006] Through the three-phase test conductor, different operating environments of the quantum mutual inductor on site are simulated, and under the different operating environments, the test voltage and test current are applied to the C-phase primary conductor of the three-phase test conductor;

[0007] The test voltage and the test current passing through the measured sub-transformer are measured through the measured sub-transformer, the standard voltage transformer and the standard current transformer, and the measurement result is input into the quantum transformer calibrator as a secondary signal;

[0008] Using the quantum mutual inductor calibrator, calibrating the voltage error and current error of the quantum mutual inductor according to the secondary signal;

[0009] Wherein, the C-phase conductor of the three-phase test conductor is sequentially connected to the measured sub-transformer, the standard voltage transformer and the standard current transformer;

[0010] The other ends of the measured quantum mutual inductor, the standard voltage mutual inductor and the standard current mutual inductor are connected to a quantum mutual inductor tester.

[0011] Optionally, three-phase test conductors A, B, and C and different spatial layouts are used to simulate the field operating environment of the quantum mutual inductor, and the amplitude and phase of the test voltage and current in each phase test conductor can be controlled separately.

[0012] Optionally, the C-phase conductor of the three-phase test conductor is sequentially connected to the measured sub-transformer, the standard voltage transformer and the standard current transformer, including:

[0013] Two primary terminals of the measured sub-transformer are connected in series with the primary conductor, the high-voltage side grading ring of the standard voltage transformer is connected in parallel to the primary conductor, and the primary conductor passes through the primary sensor ring of the standard current transformer.

[0014] Optional, secondary signals include:

[0015] IEC 61850 format message frame output by the measured sub-transformer, simulated secondary output voltage of the standard voltage transformer and standard current transformer;

[0016] Among them, after the measured sub-transformer measures the voltage and current on the primary conductor of phase C, it is converted into an IEC 61850 format message frame output, the standard voltage transformer converts the voltage on the primary conductor into a simulated secondary output voltage, and the standard current transformer converts the current on the primary conductor into a simulated secondary output voltage;

[0017] The IEC 61850 format message frame includes: a voltage sampling value and a current sampling value of the measured sub-transformer.

[0018] On the other hand, the present invention also proposes a voltage and current error calibration system for a quantum mutual inductor, comprising:

[0019] An environmental unit is constructed to simulate different operating environments of the quantum mutual inductor on site through a three-phase test conductor, and a test voltage and a test current are applied to the C-phase primary conductor of the three-phase test conductor under the different operating environments;

[0020] A measuring unit, used to measure the test voltage and test current passing through the measured sub-transformer through the measured sub-transformer, the standard voltage transformer and the standard current transformer, and input the measurement result as a secondary signal to the quantum mutual inductor calibrator;

[0021] A verification unit, used to verify the voltage error and current error of the quantum mutual inductor according to the secondary signal through the quantum mutual inductor verification instrument;

[0022] Wherein, the C-phase conductor of the three-phase test conductor is sequentially connected to the measured sub-transformer, the standard voltage transformer and the standard current transformer;

[0023] The other ends of the measured quantum mutual inductor, the standard voltage mutual inductor and the standard current mutual inductor are connected to a quantum mutual inductor tester.

[0024] Optionally, three-phase test conductors A, B, and C and different spatial layouts are used to simulate the field operating environment of the quantum mutual inductor, and the amplitude and phase of the test voltage and current in each phase test conductor can be controlled separately.

[0025] Optionally, the C-phase conductor of the three-phase test conductor is sequentially connected to the measured sub-transformer, the standard voltage transformer and the standard current transformer, including:

[0026] Two primary terminals of the measured sub-transformer are connected in series with the primary conductor, the high-voltage side grading ring of the standard voltage transformer is connected in parallel to the primary conductor, and the primary conductor passes through the primary sensor ring of the standard current transformer.

[0027] Optional, secondary signals include:

[0028] IEC 61850 format message frame output by the measured sub-transformer, simulated secondary output voltage of the standard voltage transformer and standard current transformer;

[0029] Among them, after the measured sub-transformer measures the voltage and current on the primary conductor of phase C, it is converted into an IEC 61850 format message frame output, the standard voltage transformer converts the voltage on the primary conductor into a simulated secondary output voltage, and the standard current transformer converts the current on the primary conductor into a simulated secondary output voltage;

[0030] The IEC 61850 format message frame includes: a voltage sampling value and a current sampling value of the measured sub-transformer.

[0031] In yet another aspect, the present invention further provides a computing device, comprising: one or more processors;

[0032] a processor for executing one or more programs;

[0033] When the one or more programs are executed by the one or more processors, the above-described method is implemented.

[0034] In yet another aspect, the present invention further provides a computer-readable storage medium having a computer program stored thereon, wherein when the computer program is executed, the method described above is implemented.

[0035] Compared with the prior art, the present invention has the following beneficial effects:

[0036] The present invention provides a voltage and current error calibration method for quantum mutual inductors, including: simulating different operating environments of quantum mutual inductors on site through three-phase test conductors, applying test voltage and test current to the C-phase primary conductor of the three-phase test conductor under the different operating environments; measuring the test voltage and test current passing through the measured sub-mutual inductor, standard voltage transformer and standard current transformer through the measured sub-mutual inductor, and inputting the measurement result into the quantum mutual inductor calibration instrument as a secondary signal; calibrating the voltage error and current error of the quantum mutual inductor according to the secondary signal through the quantum mutual inductor calibration instrument; wherein the C-phase conductor of the three-phase test conductor is connected to the measured sub-mutual inductor, standard voltage transformer and standard current transformer in sequence; the other end of the measured sub-mutual inductor, standard voltage transformer and standard current transformer is connected to the quantum mutual inductor calibration instrument. The present invention can be used for mutual inductors and third-party inspection and testing institutions to carry out error calibration of quantum mutual inductors in laboratories, and can also be used to calibrate the errors of quantum mutual inductors on site at substations or converter stations. BRIEF DESCRIPTION OF THE DRAWINGS

[0037] Figure 1 is a flow chart of the method of the present invention;

[0038] Figure 2 It is the experimental principle diagram of the method of the present invention;

[0039] Figure 3 Different layout diagrams of the method of the present invention;

[0040] Figure 4 It is a structural diagram of the system of the present invention. DETAILED DESCRIPTION

[0041] Now, exemplary embodiments of the present invention are described with reference to the accompanying drawings. However, the present invention can be implemented in many different forms and is not limited to the embodiments described herein. These embodiments are provided to disclose the present invention in detail and completely and to fully convey the scope of the present invention to those skilled in the art. The terms used in the exemplary embodiments shown in the accompanying drawings are not intended to limit the present invention. In the accompanying drawings, the same units / elements are marked with the same reference numerals.

[0042] Unless otherwise specified, the terms (including technical terms) used herein have the commonly understood meanings to those skilled in the art. In addition, it is understood that the terms defined in commonly used dictionaries should be understood to have the same meanings as those in the context of the relevant fields, and should not be understood as idealized or overly formal meanings.

[0043] Embodiment 1:

[0044] The present invention proposes a voltage and current error calibration method for quantum mutual inductor, such as Figure 1 As shown, including:

[0045] Step 1: Using a three-phase test conductor, simulate different operating environments of the quantum mutual inductor on site. Under the different operating environments, apply a test voltage and a test current to the C-phase primary conductor of the three-phase test conductor;

[0046] Step 2: measuring the test voltage and test current passing through the measured sub-transformer through the measured sub-transformer, the standard voltage transformer and the standard current transformer, and inputting the measurement result as a secondary signal into the quantum transformer calibrator;

[0047] Step 3, using the quantum mutual inductor calibrator to calibrate the voltage error and current error of the quantum mutual inductor according to the secondary signal;

[0048] Wherein, the C-phase conductor of the three-phase test conductor is sequentially connected to the measured sub-transformer, the standard voltage transformer and the standard current transformer;

[0049] The other ends of the measured quantum mutual inductor, the standard voltage mutual inductor and the standard current mutual inductor are connected to a quantum mutual inductor tester.

[0050] Among them, three-phase test conductors A, B, and C and different spatial layouts are used to simulate the on-site operating environment of the quantum mutual inductor. The amplitude and phase of the test voltage and current in each phase test conductor can be controlled separately.

[0051] The C phase of the three-phase test conductor is connected in sequence to the measured sub-transformer, the standard voltage transformer and the standard current transformer, including:

[0052] Two primary terminals of the measured sub-transformer are connected in series with the primary conductor, the high-voltage side grading ring of the standard voltage transformer is connected in parallel to the primary conductor, and the primary conductor passes through the primary sensor ring of the standard current transformer.

[0053] Among them, the secondary signals include:

[0054] IEC 61850 format message frame output by the measured sub-transformer, simulated secondary output voltage of the standard voltage transformer and standard current transformer;

[0055] Among them, after the measured sub-transformer measures the voltage and current on the primary conductor of phase C, it is converted into an IEC 61850 format message frame output, the standard voltage transformer converts the voltage on the primary conductor into a simulated secondary output voltage, and the standard current transformer converts the current on the primary conductor into a simulated secondary output voltage;

[0056] The IEC 61850 format message frame includes: a voltage sampling value and a current sampling value of the measured sub-transformer.

[0057] The present invention is further described below with reference to specific cases:

[0058] The specific steps of the case include:

[0059] A three-phase test conductor is used to simulate different on-site operating environments of the quantum transformer. The test voltage and test current are applied to the measured sub-transformer on the primary conductor at the same time. The standard voltage transformer and the standard current transformer are used as reference standards. The secondary signals of the measured sub-transformer, the standard voltage transformer and the standard current transformer are simultaneously input into the quantum transformer calibrator. The voltage error and current error are calculated and displayed in the quantum transformer calibrator, thereby realizing the integrated calibration of the voltage and current errors of the quantum transformer.

[0060] The measured sub-transformer, standard voltage transformer and standard current transformer are connected to the primary conductor, such as Figure 2 As shown, the two primary terminals of the measured sub-transformer are connected in series with the primary conductor, the high-voltage side grading ring of the standard voltage transformer is connected in parallel to the primary conductor, and the primary conductor passes through the primary sensor ring of the standard current transformer. After the measured sub-transformer measures the voltage and current on the primary conductor, it is converted into an IEC 61850 format message frame output, which contains the voltage sampling value and current sampling value of the quantum transformer. The standard voltage transformer converts the voltage on the primary conductor into a simulated secondary output voltage, and the standard current transformer converts the current on the primary conductor into a simulated secondary output voltage. The IEC 61850 format message frame output by the measured sub-transformer, the simulated secondary output voltage of the standard voltage transformer, and the simulated secondary output voltage of the standard current transformer are connected to the quantum transformer calibrator for error calculation.

[0061] Among them, the three-phase test conductors A, B, and C and different spatial layouts are used to simulate the on-site operating environment of the quantum mutual inductor. The amplitude and phase of the test voltage and current in each phase test conductor can be controlled separately, which can simulate the error verification of the measured quantum mutual inductor under different load conditions and different bypass conductor electromagnetic interference. For example, when simulating the individual voltage error verification of the measured quantum mutual inductor under zero load and no bypass conductor electromagnetic interference, only the C-phase primary conductor is injected with a certain amount of test voltage, and its test current is zero. The test voltage and test current of phases A and B are both zero. When simulating the individual voltage error verification of the measured quantum mutual inductor under real load, a certain amount of test voltage and test current are injected into the C-phase primary conductor, and the test voltage and test current of phases A and B are both zero. Therefore, the movement environment of the measured quantum mutual inductor under different load conditions and different bypass conductor electromagnetic interference can be simulated by separately controlling the amplitude and phase of the test voltage and current in each phase test conductor, and corresponding error verification can be performed. In addition, the spatial layout of the three-phase test conductors A, B, and C can also be adjusted to simulate the complex on-site operating environment, such as Figure 3 Figure 2 shows examples of different spatial arrangements of three-phase test conductors.

[0062] The principle of the integrated calibration of the quantum transformer voltage and current errors of the quantum transformer calibrator is as follows: Assume that the nominal proportional coefficients of the primary test voltage and secondary output voltage and the primary test current and secondary output voltage of the measured quantum transformer are K10 and K20 respectively, the nominal proportional coefficient of the primary test voltage and secondary output voltage of the standard voltage transformer is K1, and the nominal proportional coefficient of the primary test current and secondary output voltage of the standard current transformer is K2. When the test voltage and test current are injected into the primary conductor, the quantum transformer calibrator triggers and samples the secondary output voltages of the standard voltage transformer and the standard current transformer at the same pulse trigger moment, and receives the IEC61850 format message frame output by the measured quantum transformer, and obtains the sampling value data of 10 signal cycles of the standard voltage transformer, the standard current transformer and the measured quantum transformer starting at the same trigger moment. The quantum transformer calibrator calculates the secondary output voltage amplitude Up and phase of the standard voltage transformer based on Fourier transform. Secondary output voltage amplitude Uc and phase of standard current transformer The voltage amplitude Ux1 and phase in the IEC 61850 format message frame signal output by the measured sub-transformer Current amplitude Ux2 and phase The voltage amplitude error ε1 and phase error δ1, and the current amplitude error ε2 and phase error δ2 of the measured sub-transformer are further calculated.

[0063] ε1=(K10×Ux1-K1×Up) / K1×Up

[0064]

[0065] ε2=(K20×Ux2-K2×Uc) / K2×Uc

[0066]

[0067] The present invention uses three-phase conductors to simulate different on-site operating environments of quantum transformers, and uses standard voltage transformers and standard current transformers as reference standards, and uses a quantum transformer calibrator to synchronously measure the voltage error and current error of the quantum transformer. Compared with the traditional transformer error method, this patent can realize the integrated verification of the voltage error and current error of the quantum transformer under different simulated load operating environments, assess the external shielding effect of the quantum transformer, improve the accuracy and reliability of the quantum transformer error verification, and improve the error verification efficiency. This patent can be used for transformers and third-party inspection and testing institutions to carry out error verification of quantum transformers in laboratories, and can also be used to verify the errors of quantum transformers on-site at substations or converter stations.

[0068] The present invention can simultaneously realize the verification of voltage error and current error, and at the same time simulate the on-site grid operation environment of the quantum mutual inductor, fully examine the bypass interference influence and electromagnetic shielding performance of the quantum mutual inductor, support accurate and reliable evaluation of the measurement performance of the quantum mutual inductor, and greatly improve the error verification efficiency.

[0069] Embodiment 2:

[0070] The present invention also proposes a voltage and current error checking system 200 for a quantum mutual inductor, such as Figure 4 As shown, including:

[0071] An environment unit 201 is constructed to simulate different operating environments of the quantum mutual inductor on site through a three-phase test conductor, and a test voltage and a test current are applied to the C-phase primary conductor of the three-phase test conductor under the different operating environments;

[0072] The measuring unit 202 is used to measure the test voltage and test current passing through the measured sub-transformer through the measured sub-transformer, the standard voltage transformer and the standard current transformer, and input the measurement result as a secondary signal to the quantum transformer calibrator;

[0073] A verification unit 203, configured to verify the voltage error and current error of the quantum mutual inductor according to the secondary signal through the quantum mutual inductor verification instrument;

[0074] Wherein, the C-phase conductor of the three-phase test conductor is sequentially connected to the measured sub-transformer, the standard voltage transformer and the standard current transformer;

[0075] The other ends of the measured quantum mutual inductor, the standard voltage mutual inductor and the standard current mutual inductor are connected to a quantum mutual inductor tester.

[0076] Among them, three-phase test conductors A, B, and C and different spatial layouts are used to simulate the on-site operating environment of the quantum mutual inductor. The amplitude and phase of the test voltage and current in each phase test conductor can be controlled separately.

[0077] The C phase of the three-phase test conductor is connected in sequence to the measured sub-transformer, the standard voltage transformer and the standard current transformer, including:

[0078] Two primary terminals of the measured sub-transformer are connected in series with the primary conductor, the high-voltage side grading ring of the standard voltage transformer is connected in parallel to the primary conductor, and the primary conductor passes through the primary sensor ring of the standard current transformer.

[0079] Among them, the secondary signals include:

[0080] IEC 61850 format message frame output by the measured sub-transformer, simulated secondary output voltage of the standard voltage transformer and standard current transformer;

[0081] Among them, after the measured sub-transformer measures the voltage and current on the primary conductor of phase C, it is converted into an IEC 61850 format message frame output, the standard voltage transformer converts the voltage on the primary conductor into a simulated secondary output voltage, and the standard current transformer converts the current on the primary conductor into a simulated secondary output voltage;

[0082] The IEC 61850 format message frame includes: a voltage sampling value and a current sampling value of the measured sub-transformer.

[0083] The present invention can be used for error verification of quantum mutual inductors by mutual inductors and third-party inspection and testing organizations in laboratories, and can also be used for error verification of quantum mutual inductors on-site at substations or converter stations.

[0084] Embodiment 3:

[0085] Based on the same inventive concept, the present invention also provides a computer device, which includes a processor and a memory, wherein the memory is used to store a computer program, the computer program includes program instructions, and the processor is used to execute the program instructions stored in the computer storage medium. The processor may be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA) or other programmable logic devices, discrete gates or transistor logic devices, discrete hardware components, etc. It is the computing core and control core of the terminal, which is suitable for implementing one or more instructions, and is specifically suitable for loading and executing one or more instructions in the computer storage medium to implement the corresponding method flow or corresponding functions, so as to implement the steps of the method in the above embodiment.

[0086] Embodiment 4:

[0087] Based on the same inventive concept, the present invention also provides a storage medium, specifically a computer-readable storage medium (Memory), which is a memory device in a computer device for storing programs and data. It is understandable that the computer-readable storage medium here can include both a built-in storage medium in a computer device and an extended storage medium supported by the computer device. The computer-readable storage medium provides a storage space, which stores the operating system of the terminal. In addition, one or more instructions suitable for being loaded and executed by a processor are also stored in the storage space, and these instructions can be one or more computer programs (including program codes). It should be noted that the computer-readable storage medium here can be a high-speed RAM memory or a non-volatile memory, such as at least one disk memory. The processor can load and execute one or more instructions stored in the computer-readable storage medium to implement the steps of the method in the above embodiment.

[0088] It will be appreciated by those skilled in the art that embodiments of the present invention may be provided as methods, systems, or computer program products. Therefore, the present invention may take the form of a complete hardware embodiment, a complete software embodiment, or an embodiment combining software and hardware. Moreover, the present invention may take the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) containing computer-usable program codes. The schemes in the embodiments of the present invention may be implemented in various computer languages, for example, object-oriented programming language Java and literal scripting language JavaScript, etc.

[0089] The present invention is described with reference to flowcharts and / or block diagrams of methods, devices (systems), and computer program products according to embodiments of the present invention. It should be understood that each process and / or block in the flowchart and / or block diagram, as well as the combination of processes and / or blocks in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing device to produce a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate instructions for implementing the processes in the flowchart and / or block diagram. Figure 1 A process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.

[0090] These computer program instructions may also be stored in a computer-readable memory capable of directing a computer or other programmable data processing device to operate in a specific manner, so that the instructions stored in the computer-readable memory produce an article of manufacture comprising an instruction device, which implements the process Figure 1 A process or multiple processes and / or boxes Figure 1 A function specified in one or more boxes.

[0091] These computer program instructions can also be loaded onto a computer or other programmable data processing device so that a series of operating steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing instructions for implementing the process. Figure 1 A process or multiple processes and / or boxes Figure 1 The steps for the functions specified in one or more boxes.

[0092] Although the preferred embodiments of the present invention have been described, those skilled in the art may make other changes and modifications to these embodiments once they have learned the basic creative concept. Therefore, the appended claims are intended to be interpreted as including the preferred embodiments and all changes and modifications that fall within the scope of the present invention.

[0093] Obviously, those skilled in the art can make various changes and modifications to the present invention without departing from the spirit and scope of the present invention. Thus, if these modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalents, the present invention is also intended to include these modifications and variations.

Claims

1. A voltage and current error calibration method for a quantum mutual inductor, characterized in that: include: Through the three-phase test conductor, different operating environments of the quantum mutual inductor on site are simulated, and under the different operating environments, the test voltage and test current are applied to the C-phase primary conductor of the three-phase test conductor; The test voltage and the test current passing through the measured sub-transformer are measured through the measured sub-transformer, the standard voltage transformer and the standard current transformer, and the measurement result is input into the quantum transformer calibrator as a secondary signal; Using the quantum mutual inductor calibrator, calibrating the voltage error and current error of the quantum mutual inductor according to the secondary signal; Wherein, the C-phase conductor of the three-phase test conductor is sequentially connected to the measured sub-transformer, the standard voltage transformer and the standard current transformer; The other ends of the measured quantum mutual inductor, the standard voltage mutual inductor and the standard current mutual inductor are connected to a quantum mutual inductor tester.

2. The voltage and current error calibration method according to claim 1, characterized in that: A, B, and C three-phase test conductors and different spatial layouts are used to simulate the on-site operating environment of the quantum mutual inductor. The amplitude and phase of the test voltage and current in each phase of the test conductor can be controlled separately.

3. The voltage and current error checking method according to claim 1, characterized in that: The C phase of the three-phase test conductor is sequentially connected to the measured sub-transformer, the standard voltage transformer and the standard current transformer, including: Two primary terminals of the measured sub-transformer are connected in series with the primary conductor, the high-voltage side grading ring of the standard voltage transformer is connected in parallel to the primary conductor, and the primary conductor passes through the primary sensor ring of the standard current transformer.

4. The voltage and current error checking method according to claim 1, characterized in that: The secondary signal includes: IEC 61850 format message frame output by the measured sub-transformer, simulated secondary output voltage of the standard voltage transformer and standard current transformer; Among them, after the measured sub-transformer measures the voltage and current on the primary conductor of phase C, it is converted into an IEC 61850 format message frame output, the standard voltage transformer converts the voltage on the primary conductor into a simulated secondary output voltage, and the standard current transformer converts the current on the primary conductor into a simulated secondary output voltage; The IEC 61850 format message frame includes: a voltage sampling value and a current sampling value of the measured sub-transformer.

5. A voltage and current error calibration system for quantum mutual inductor, characterized in that: include: An environmental unit is constructed to simulate different operating environments of the quantum mutual inductor on site through a three-phase test conductor, and a test voltage and a test current are applied to the C-phase primary conductor of the three-phase test conductor under the different operating environments; A measuring unit, used to measure the test voltage and test current passing through the measured sub-transformer through the measured sub-transformer, the standard voltage transformer and the standard current transformer, and input the measurement result as a secondary signal to the quantum mutual inductor calibrator; A verification unit, used to verify the voltage error and current error of the quantum mutual inductor according to the secondary signal through the quantum mutual inductor verification instrument; Wherein, the C-phase conductor of the three-phase test conductor is sequentially connected to the measured sub-transformer, the standard voltage transformer and the standard current transformer; The other ends of the measured quantum mutual inductor, the standard voltage mutual inductor and the standard current mutual inductor are connected to a quantum mutual inductor tester.

6. The voltage and current error checking system according to claim 5, characterized in that: A, B, and C three-phase test conductors and different spatial layouts are used to simulate the on-site operating environment of the quantum mutual inductor. The amplitude and phase of the test voltage and current in each phase of the test conductor can be controlled separately.

7. The voltage and current error checking system according to claim 5, characterized in that: The C phase of the three-phase test conductor is sequentially connected to the measured sub-transformer, the standard voltage transformer and the standard current transformer, including: Two primary terminals of the measured sub-transformer are connected in series with the primary conductor, the high-voltage side grading ring of the standard voltage transformer is connected in parallel to the primary conductor, and the primary conductor passes through the primary sensor ring of the standard current transformer.

8. The voltage and current error checking system according to claim 5, characterized in that: The secondary signal includes: IEC 61850 format message frame output by the measured sub-transformer, simulated secondary output voltage of the standard voltage transformer and standard current transformer; Among them, after the measured sub-transformer measures the voltage and current on the primary conductor of phase C, it is converted into an IEC 61850 format message frame output, the standard voltage transformer converts the voltage on the primary conductor into a simulated secondary output voltage, and the standard current transformer converts the current on the primary conductor into a simulated secondary output voltage; The IEC 61850 format message frame includes: a voltage sampling value and a current sampling value of the measured sub-transformer.

9. A computer device, characterized in that: include: one or more processors; a processor for executing one or more programs; When the one or more programs are executed by the one or more processors, the method according to any one of claims 1 to 4 is implemented.

10. A computer-readable storage medium, characterized in that: A computer program is stored thereon, and when the computer program is executed, the method according to any one of claims 1 to 4 is implemented.

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