Spectrum screening method, electronic device, storage medium, and program

Abstract

The embodiment of the invention discloses a spectrum screening method, electronic equipment, a storage medium and a program, and the method comprises the steps: obtaining spectrum data obtained by carrying out spectrum analysis on a target spectrum screening object through a target spectrometer; determining a characteristic peak of a target reference element in each channel of the target spectrometer according to the spectral data of the target spectrum screening object; calculating a spectrum screening threshold value of each channel of the target spectrometer according to the characteristic peak of the target reference element of each channel; and screening the spectrum data of the target spectrum screening object in each channel according to the spectrum screening threshold value corresponding to each channel. According to the technical scheme of the embodiment of the invention, the adaptability and accuracy of spectrum screening can be improved.

Description

Technical Field

[0001] The embodiments of the present invention relate to the technical field of spectral analysis, and in particular to a spectral screening method, electronic equipment, storage medium and program. Background Art

[0002] Gas-solid two-phase flow is widely present in nature and industrial production processes, such as pneumatic conveying and particulate pollution control. Online analysis of particle composition in gas-solid two-phase flow is extremely important for improving production efficiency, reducing energy consumption and strengthening environmental monitoring.

[0003] In the prior art, Laser-Induced Breakdown Spectroscopy (LIBS), as a technology for material composition analysis based on laser ablation, has been widely used in online analysis of particle composition in gas-solid two-phase flow. However, in the process of spectral analysis using LIBS, the collected spectral data may contain a large number of invalid spectra with unclear characteristic information. Therefore, it is necessary to identify the invalid spectra. Traditional spectral identification methods mainly rely on the absolute intensity value of the element characteristic spectral line, the signal-to-noise ratio of the element characteristic spectral line, or the standard deviation (SD) value of the intensity of a single characteristic peak.

[0004] In the process of realizing the present invention, the inventors found that the prior art has the following defects: (1) Spectral screening that relies on the absolute intensity value of the characteristic spectral line of the element is easily affected by the fluctuation of laser energy, the change of the sample matrix and the change of the measurement conditions, resulting in the fluctuation of the overall intensity of the spectrum and poor adaptability; (2) Spectral screening that relies on the signal-to-noise ratio of the characteristic spectral line of the element is likely to identify the valid spectrum as an invalid spectrum when the change of the sample matrix causes the signal-to-noise ratio of the characteristic spectral line to change; (3) Spectral screening that relies on the SD value of the intensity of a single characteristic peak has poor adaptability and is likely to increase the risk of misjudgment. Summary of the invention

[0005] The embodiments of the present invention provide a spectrum screening method, electronic equipment, storage medium and program, which can improve the adaptability and accuracy of spectrum screening.

[0006] According to one aspect of the present invention, there is provided a spectral screening method, comprising:

[0007] Acquiring spectral data obtained by spectrally analyzing a target spectral screening object through a target spectrometer;

[0008] Determine the characteristic peaks of the target reference elements in each channel of the target spectrometer according to the spectral data of the target spectral screening object;

[0009] Calculating the spectral screening threshold of each channel of the target spectrometer according to the characteristic peak of the target reference element of each channel;

[0010] The spectrum data of the target spectrum screening object in each of the channels is screened according to the spectrum screening threshold corresponding to each of the channels.

[0011] According to another aspect of the present invention, there is provided a spectral screening device, comprising:

[0012] A spectral data acquisition module, used to acquire spectral data obtained by spectrally analyzing a target spectral screening object through a target spectrometer;

[0013] A characteristic peak acquisition module for a target reference element, used to determine the characteristic peaks of the target reference element in each channel of the target spectrometer according to the spectral data of the target spectral screening object;

[0014] A spectral screening threshold acquisition module, used for calculating the spectral screening threshold of each channel of the target spectrometer according to the characteristic peak of the target reference element of each channel;

[0015] The spectral data screening module is used to screen the spectral data of the target spectral screening object in each of the channels according to the spectral screening threshold corresponding to each of the channels.

[0016] According to another aspect of the present invention, an electronic device is provided, the electronic device comprising:

[0017] at least one processor; and

[0018] a memory communicatively connected to the at least one processor; wherein,

[0019] The memory stores a computer program executable by the at least one processor, and the computer program is executed by the at least one processor so that the at least one processor can perform the spectral screening method described in any embodiment of the present invention.

[0020] According to another aspect of the present invention, a computer-readable storage medium is provided, wherein the computer-readable storage medium stores computer instructions, and the computer instructions are used to implement the spectral screening method described in any embodiment of the present invention when executed by a processor.

[0021] According to another aspect of the present invention, a computer program product is provided, comprising a computer program, wherein when the computer program is executed by a processor, the spectral screening method described in any embodiment of the present invention is implemented.

[0022] The embodiment of the present invention obtains spectral data obtained by spectrally analyzing the target spectral screening object through the target spectrometer, so as to determine the characteristic peaks of the target reference elements in each channel of the target spectrometer according to the spectral data of the target spectral screening object. Furthermore, the spectral screening thresholds of each channel of the target spectrometer are calculated according to the characteristic peaks of the target reference elements in each channel, so as to screen the spectral data of the target spectral screening object in each channel according to the spectral screening thresholds corresponding to each channel. The above method solves the problem of poor adaptability of the existing spectral screening methods, and can improve the adaptability and accuracy of spectral screening.

[0023] It should be understood that the contents described in this section are not intended to identify the key or important features of the embodiments of the present invention, nor are they intended to limit the scope of the present invention. Other features of the present invention will become easily understood through the following description. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0025] Figure 1 is a flow chart of a spectral screening method provided in Example 1 of the present invention;

[0026] Figure 2 is a flow chart of a spectral screening method provided in Embodiment 2 of the present invention;

[0027] Figure 3 This is a schematic diagram of extracting a set number of pixels provided by Embodiment 2 of the present invention;

[0028] Figure 4 This is a flow chart of a fly ash sample spectral screening method provided in Embodiment 2 of the present invention;

[0029] Figure 5 This is a schematic diagram of using the absolute intensity method to screen the spectrum data of the same sample collected at different times, provided in the second embodiment of the present invention;

[0030] Figure 6 This is a schematic diagram of using a signal-to-noise ratio method to screen spectral data of the same sample collected at different times, provided in the second embodiment of the present invention;

[0031] Figure 7 This is a schematic diagram of using a spectral screening method to screen spectral data of the same sample collected at different times, provided in the second embodiment of the present invention;

[0032] Figure 8is a schematic diagram of a spectral screening device provided in Embodiment 3 of the present invention;

[0033] Fig. 9 A schematic diagram of the structure of an electronic device provided in Embodiment 4 of the present invention. DETAILED DESCRIPTION

[0034] In order to enable those skilled in the art to better understand the scheme of the present invention, the technical scheme in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work should fall within the scope of protection of the present invention.

[0035] It should be noted that the term "target" and the like in the specification and claims of the present invention and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the data used in this way can be interchanged where appropriate, so that the embodiments of the present invention described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions, for example, a process, method, system, product or device that includes a series of steps or units is not necessarily limited to those steps or units that are clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.

[0036] Embodiment 1

[0037] Figure 1 This is a flow chart of a spectrum screening method provided by the first embodiment of the present invention. This embodiment is applicable to the case where spectrum screening is performed according to the characteristic peaks of the reference elements of each channel of the spectrometer. The method can be executed by a spectrum screening device, which can be implemented by software and / or hardware, and can generally be integrated in an electronic device. The electronic device can be a terminal device or a server device. As long as it can execute the spectrum screening method, the embodiment of the present invention does not limit the specific device type of the electronic device. Accordingly, Figure 1 As shown, the method includes the following operations:

[0038] S110, acquiring spectral data obtained by performing spectral analysis on a target spectral screening object through a target spectrometer.

[0039] Among them, the target spectrometer can be a scientific instrument with multiple channels for measuring and analyzing the intensity of spectra of different wavelengths. The target spectrum screening object can be an object to be subjected to spectral analysis. Exemplarily, the target spectrum screening object can include but is not limited to particle objects in gas-solid two-phase flow, such as fly ash particles, suspended particles and catalyst particles, etc. The embodiment of the present invention does not limit the specific type of the target spectrum screening object. The spectral data can be data obtained by performing spectral analysis on the target spectrum screening object through the target spectrometer. It is understandable that the spectral data can include invalid spectra and valid spectra, etc.

[0040] In the embodiment of the present invention, when screening the spectrum, firstly, the target spectrum screening object can be spectrally analyzed by the target spectrometer to obtain a series of detailed spectrum data, so that the spectrum graph of the target spectrum screening object can be obtained according to the spectrum data. The spectrum data includes valid spectrum and invalid spectrum, and further, the spectrum data can be screened to retain the valid spectrum and eliminate the invalid spectrum.

[0041] It is understandable that the target spectrometer can collect light signals of multiple wavelength channels at the same time and provide spectrum data in multiple wavelength ranges. Therefore, the wavelength ranges of the spectrum data provided by each channel of the target spectrometer are different.

[0042] S120, determining characteristic peaks of target reference elements in each channel of the target spectrometer according to the spectral data of the target spectral screening object.

[0043] The target reference element may be a reference element used for spectral screening in each channel of the target spectrometer. The characteristic peak of the target reference element may be a peak value of a spectral signal generated by the target reference element within a specific wavelength range due to electronic transition or other physical processes.

[0044] Accordingly, after obtaining the spectral data of the target spectral screening object, the obtained spectral data can first be preprocessed, for example, noise removal, background correction, and spectral smoothing, etc., to improve the quality and reliability of the spectral data. In the preprocessed spectral data, the target reference element can be identified and located according to the characteristics of the spectral data of the target spectral screening object and each channel of the target spectrometer, and then the spectral data of each channel of the target spectrometer can be analyzed, so as to determine the characteristic peaks of the target reference element in each channel of the target spectrometer. The above method can fully consider the influence of the response differences of different channels of the target spectrometer and enhance the adaptability and stability of spectral screening.

[0045] It should be noted that the target reference elements of each channel of the target spectrometer may be the same or different.

[0046] S130, calculating the spectral screening threshold of each channel of the target spectrometer according to the characteristic peak of the target reference element of each channel.

[0047] The spectrum screening threshold may be a reference value used to distinguish between valid spectra and invalid spectra during the spectrum screening process.

[0048] Correspondingly, after determining the characteristic peaks of the target reference elements in each channel of the target spectrometer, the spectral screening thresholds of each channel of the target spectrometer can be calculated according to the characteristic peaks of the target reference elements in each channel. By setting appropriate spectral screening thresholds for each channel of the target spectrometer, invalid spectra and valid spectra of specific characteristic information can be screened out. Among them, invalid spectra can be spectral data that cannot provide effective information or cannot be used for accurate analysis due to noise, background interference, instrument error or poor measurement conditions. Valid spectra can be spectral data that can provide effective information and can be used for accurate analysis within a specified accuracy range. It can be seen that the above scheme can improve the accuracy and reliability of spectral data analysis, and can also better adapt to different target spectrum screening objects and measurement conditions.

[0049] S140, screening the spectrum data of the target spectrum screening object in each of the channels according to the spectrum screening threshold corresponding to each of the channels.

[0050] Correspondingly, after calculating the spectral screening threshold of each channel of the target spectrometer, the spectral data of the target spectral screening object in each channel can be screened according to the screening threshold corresponding to each channel. By setting a suitable spectral screening threshold for each channel, accurate screening of the spectral data of the target spectral screening object in each channel can be achieved, thereby significantly improving the efficiency, adaptability and accuracy of spectral analysis. It can be seen that the above scheme avoids the influence of the response differences of different channels of the target spectrometer by setting a spectral screening threshold for each channel of the target spectrometer, and can improve the adaptability and stability of spectral screening.

[0051] The embodiment of the present invention obtains spectral data obtained by spectrally analyzing the target spectral screening object through the target spectrometer, so as to determine the characteristic peaks of the target reference elements in each channel of the target spectrometer according to the spectral data of the target spectral screening object. Furthermore, the spectral screening thresholds of each channel of the target spectrometer are calculated according to the characteristic peaks of the target reference elements in each channel, so as to screen the spectral data of the target spectral screening object in each channel according to the spectral screening thresholds corresponding to each channel. The above method solves the problem of poor adaptability of the existing spectral screening methods, and can improve the adaptability and accuracy of spectral screening.

[0052] Embodiment 2

[0053] Figure 2is a flow chart of a spectral screening method provided by the second embodiment of the present invention. This embodiment is specific based on the above embodiment. In this embodiment, a plurality of specific optional implementation methods are provided for obtaining spectral data obtained by spectral analysis of a target spectral screening object through a target spectrometer, determining characteristic peaks of target reference elements in each channel of the target spectrometer according to the spectral data of the target spectral screening object, and calculating spectral screening thresholds of each channel of the target spectrometer according to the characteristic peaks of the target reference elements in each channel. Accordingly, as Figure 2 As shown, the method of this embodiment may include:

[0054] S210, collecting the target spectrum screening object from the target collection environment.

[0055] Among them, the target acquisition environment can be the environment where the target spectral screening object is located. For example, the target acquisition environment can be a gas-solid two-phase flow environment, or it can be other scenes that require spectral screening. The embodiment of the present invention does not limit the target acquisition environment.

[0056] In an embodiment of the present invention, in order to implement the screening of spectral data of a target spectral screening object, the target spectral screening object may be firstly collected from a target collection environment, and then the target spectral screening object may be processed to obtain its spectral data.

[0057] S220: Perform laser ablation on the target spectral screening object by using the LIBS system to obtain spectral data of the target spectral screening object.

[0058] Among them, the LIBS system can be a spectral analysis system based on the interaction between laser and matter. The LIBS system can be used to directly analyze the particle composition in gas-solid two-phase flow without complicated sample preparation process, and multiple elements can be analyzed simultaneously. Laser ablation can be a technology that uses a high-energy laser beam to remove or process the surface of the target spectral screening object.

[0059] Accordingly, after collecting the target spectral screening object from the target collection environment, the LIBS system can be used to perform laser ablation on the target spectral screening object, so that the spectral data of the target spectral screening object can be obtained. In a specific example, the LIBS system can focus a high-energy pulsed laser on the surface of the target spectral screening object, so that the target spectral screening object locally absorbs the laser energy and heats up instantly, thereby forming a plasma. During the cooling of the plasma, excited atoms and ions will transition to a lower energy level or ground state and emit light radiation of a specific wavelength. These light signals can be collected and transmitted to the target spectrometer through an optical system. Furthermore, the target spectrometer can decompose the light signal into spectral data of different wavelengths and record its intensity.

[0060] S230, determining the target reference element of each channel of the target spectrometer according to the component structure of the target spectrum screening object.

[0061] The composition structure of the target spectral screening object may be the chemical elements and their relative contents included in the target spectral screening object.

[0062] Correspondingly, after the spectral data of the target spectral screening object is acquired, the target reference elements of each channel of the target spectrometer can be determined according to the component structure of the target spectral screening object.

[0063] In an optional embodiment of the present invention, determining the target reference element of each channel of the target spectrometer according to the composition structure of the target spectral screening object may include: determining the concentration of each constituent element of the target spectral screening object in each channel; for each channel, screening out the constituent element with the largest concentration from the constituent elements of the target spectral screening object as the target reference element of each channel of the target spectrometer.

[0064] In the embodiment of the present invention, in the process of determining the target reference element of each channel of the target spectrometer according to the composition structure of the target spectral screening object, the concentration of each component element of the target spectral screening object in each channel can be determined first, and further, for each channel, the component element with the largest concentration can be screened out from the components of the target spectral screening object as the target reference element of each channel of the target spectrometer. In the LIBS process, the element with the highest content can produce a stronger characteristic spectral line signal, which can provide a more reliable basis for subsequent spectral screening.

[0065] In a specific example, assuming that the target spectral screening object is a fly ash sample, if the concentration of silicon is the highest in channel A of the target spectrometer, silicon can be selected as the target reference element for channel A of the target spectrometer; if the concentration of calcium is the highest in channel B of the target spectrometer, calcium can be selected as the target reference element for channel B of the target spectrometer.

[0066] S240. Determine a characteristic peak of a target reference element in each channel of the target spectrometer according to the target reference element and the spectral data.

[0067] Specifically, after determining the target reference element of each channel of the target spectrometer, the spectral data can be analyzed first to identify all spectral peaks of the target reference element. Furthermore, the spectral peaks of the target reference element that do not overlap with the spectral peaks of other elements and have a high signal-to-noise ratio can be selected from all spectral peaks of the target reference element within the wavelength range of each channel of the target spectrometer as the characteristic peaks of the target reference element. The characteristic peaks of the target reference element do not overlap with the spectral peaks of other elements, which can avoid interference from other components. At the same time, the characteristic peaks of the target reference element have a higher signal-to-noise ratio, that is, the characteristic peaks of the target reference element have a higher signal intensity and lower background noise, which can improve the accuracy and reliability of spectral screening.

[0068] In a specific example, the selection of the characteristic peak of the target reference element can refer to the American Atomic Standard Database. For example, in the fly ash sample, if silicon is selected as the target reference element, the spectral peak of silicon at 288.16nm can be selected as the characteristic peak of the target reference element.

[0069] S250, extracting spectral intensity values ​​of a set number of pixel points from the characteristic peak of each of the target reference elements.

[0070] Specifically, after determining the characteristic peak of the target reference element, a number of pixels can be extracted from the characteristic peak. The set number of pixels is related to factors such as the resolution of the target spectrometer and the selected characteristic peak. The higher the resolution of the target spectrometer, the wider the characteristic peak line is, and the more pixels are set. Exemplarily, the set number of pixels can be 5 or 7, and the embodiment of the present invention does not limit the specific value of the set number of pixels. In a specific example, Figure 3 Schematic diagram of extracting a set number of pixels provided by Embodiment 2 of the present invention. Figure 3 As shown, after determining the characteristic peak of the target reference element, the spectral intensity values ​​of 7 pixel points can be extracted from the characteristic peak.

[0071] S260 , calculating the spectral intensity SD value of the characteristic peak of the target reference element according to the spectral intensity values ​​of the set number of pixel points.

[0072] The spectral intensity SD value may be an indicator for measuring the fluctuation or dispersion of signal intensity in spectral measurement.

[0073] Specifically, after extracting the spectral intensity values ​​of a set number of pixel points from the characteristic peak of each target reference element, the spectral intensity SD value of the characteristic peak of the target reference element may be calculated according to the spectral intensity values ​​of the set number of pixel points.

[0074] In an optional embodiment of the present invention, calculating the spectral intensity SD value of the characteristic peak of the target reference element according to the spectral intensity values ​​of the set number of pixel points may include: calculating the spectral intensity SD value of the characteristic peak of the target reference element based on the following formula:

[0075]

[0076] Among them, N is the set number of pixels, X i is the absolute intensity of the i-th pixel, is the mean of the absolute intensity of the pixel points, and SD is the spectral intensity SD value.

[0077] S270, using the spectral intensity SD value of the characteristic peak of the target reference element in each of the channels as the spectral screening threshold of each of the channels.

[0078] Specifically, after calculating the spectral intensity SD value of the characteristic peak of the target reference element, the spectral intensity SD value of the characteristic peak of the target reference element in each channel can be used as the spectral screening threshold of each channel. The spectral data of different channels may have different noise levels, signal intensities, and characteristic peak distributions. Therefore, compared with setting a unified spectral screening threshold for all channels of the target spectrometer, setting a spectral screening threshold for each channel of the target spectrometer can improve the accuracy and reliability of spectral screening and reduce the phenomenon of false rejection and missed rejection.

[0079] S280 , screening the spectrum data of the target spectrum screening object in each of the channels according to the spectrum screening threshold corresponding to each of the channels.

[0080] In an optional embodiment of the present invention, the screening of the spectral data of the target spectral screening object in each of the channels according to the spectral screening threshold corresponding to each of the channels may include: when it is determined that the spectral intensity SD value of at least one characteristic peak of the current spectrum of the channel is less than the spectral screening threshold corresponding to the channel, determining the current spectrum as an invalid spectrum; when it is determined that the spectral intensity SD values ​​of all characteristic peaks of the current spectrum of the channel are greater than or equal to the spectral screening threshold corresponding to the channel, determining the current spectrum as a valid spectrum.

[0081] In an embodiment of the present invention, in the process of screening the spectral data of the target spectrum screening object in each channel according to the spectral screening threshold corresponding to each channel, the spectral intensity SD value of the characteristic peak of the current spectrum of each channel of the target spectrometer can be calculated first. Further, the spectral intensity SD value of the characteristic peak of the current spectrum of each channel of the target spectrometer can be compared with the screening threshold corresponding to the channel. If there is at least one characteristic peak in the current spectrum whose spectral intensity SD value is less than the spectral screening threshold corresponding to the channel, the current spectrum can be regarded as an invalid spectrum and eliminated; if the spectral intensity SD values ​​of all characteristic peaks of the current spectrum are greater than or equal to the spectral screening threshold corresponding to the channel, the current spectrum can be determined as a valid spectrum for subsequent analysis.

[0082] The embodiment of the present invention acquires the target spectral screening object from the target acquisition environment, and uses the LIBS system to perform laser ablation on the target spectral screening object to acquire the spectral data of the target spectral screening object. Furthermore, the target reference element of each channel of the target spectrometer can be determined according to the composition structure of the target spectral screening object, thereby determining the characteristic peak of the target reference element in each channel of the target spectrometer according to the target reference element and the spectral data. After acquiring the characteristic peak of the target reference element, the spectral intensity value of a set number of pixel points can be extracted from the characteristic peak of each target reference element, and the spectral intensity SD value of the characteristic peak of the target reference element can be calculated according to the spectral intensity value of the set number of pixel points, and used as the spectral screening threshold of each channel, thereby screening the spectral data of the target spectral screening object in each channel according to the spectral screening threshold corresponding to each channel. The above method solves the problem of poor adaptability of the existing spectral screening method, and can improve the adaptability and accuracy of spectral screening.

[0083] Specific application scenarios

[0084] In order to more clearly describe the technical solution provided by the embodiment of the present invention, the second embodiment of the present invention provides a fly ash sample spectral screening method, Figure 4 is a flow chart of a fly ash sample spectral screening method provided by the second embodiment of the present invention. In a specific example, Figure 4 The fly ash sample spectrum screening method may include the following steps:

[0085] Step 1: Collect 1500 spectra for each fly ash sample. According to the concentration characteristics of each component element in fly ash, the spectral line selected for effective spectral screening is the 288.16nm spectral line of silicon element, and then calculate the spectral intensity SD value of 5 pixel points around the 288.16nm characteristic peak of silicon element.

[0086] Step 2: Spectral intensity SD value is calculated as 120, and is used as the spectral screening threshold for spectral screening. Spectral data with characteristic peak spectral intensity SD value less than 120 are judged as invalid spectra and eliminated; spectral data with all characteristic peak spectral intensity SD values ​​greater than or equal to 120 are judged as valid spectra.

[0087] Step 3: Calculate the rejection rate, false rejection rate and missed rejection rate of spectral screening based on the following formula:

[0088]

[0089] Among them, RR is the rejection rate, FRR is the false rejection rate, FAR is the missed rejection rate, X TF is the number of valid spectra in the spectral data used for screening, X T is the number of spectral data used for screening, X FR is the number of spectra that were mistakenly rejected as invalid spectra but are actually valid spectra, X FA X is the number of spectra that were judged as valid spectra but were actually invalid spectra. TA is the number of invalid spectra in the spectral data used for screening.

[0090] Table 1 Spectral screening method Characteristic line intensity RSD (%) before and after screening

[0091]

[0092] The rejection rate of the above fly ash sample spectral screening method is 37.67%, and the false rejection rate and missed rejection rate are both 0%. Further, the relative standard deviation (RSD) values ​​of the different characteristic spectral line intensities of the remaining spectral data are calculated and compared with the spectral data before screening. Table 1 shows the RSD of the characteristic spectral line intensity before and after the spectral screening method. As shown in Table 1, since the spectral data before screening contains a large amount of invalid data, the RSD of the 247.86nm spectral line of the carbon element in the original spectral data without spectral screening is 62.50%, and the RSD of the 288.16nm spectral line of the silicon element is 53.27%. After the spectral data is screened and eliminated using the spectral screening method, the RSD of the 247.86nm spectral line of the carbon element is reduced to 37.90%, and the RSD of the 288.16nm spectral line of the silicon element is 29.86%. This shows that the spectral intensity fluctuation of the characteristic spectral lines of the fly ash sample spectral is greatly reduced after screening by the spectral screening method.

[0093] Table 2 Results of spectral screening threshold selection for the same sample measured within three days

[0094]

[0095] In order to verify the stability of the spectral screening method of the embodiment of the present invention relative to the absolute intensity method and the signal-to-noise ratio method, the same sample was measured three times within three days to simulate the influence of the change of the measurement environment on the selection of the spectral screening threshold of each spectral screening method. Table 2 shows the selection results of the spectral screening threshold of the same sample measured within three days. As shown in Table 2, for the same sample, the spectral screening thresholds of the absolute intensity method and the signal-to-noise ratio method change with the change of the measurement time, while the spectral screening threshold of the fly ash sample spectral screening method of the embodiment of the present invention has been stable at 120.

[0096] Figure 5 is a schematic diagram of using the absolute intensity method to screen the spectrum data of the same sample collected at different times, provided in the second embodiment of the present invention. Figure 6 is a schematic diagram of using the signal-to-noise ratio method to screen the spectral data of the same sample collected at different times, provided in the second embodiment of the present invention. Figure 7 FIG. 2 is a schematic diagram of a method for screening spectral data of the same sample collected at different times using a spectral screening method provided by Embodiment 2 of the present invention. Figure 5 , Figure 6 and Figure 7 As shown, on the first day of measurement, when the characteristic peak absolute intensity value reaches 370 counts, a very obvious characteristic peak has appeared at 288.16nm of silicon element, and on the second and third days of measurement, due to the fluctuation of background and signal intensity, when the characteristic peak absolute intensity value reaches 370 counts, there is no characteristic peak at 288.16nm of silicon element that is obviously different from the background. Similarly, the same phenomenon also exists for the signal-to-noise ratio method. On the first and third days of measurement, when the signal-to-noise ratio value reaches 11.8, the characteristic peak at 288.16nm of silicon element is already very obvious, but on the second day, it is only slightly higher than the background. As for the spectral screening method of the present invention, within three days of measurement, as long as the SD value of the characteristic peak pixel intensity reaches 120, there will be a very obvious 288.16nm characteristic peak of silicon element. The above results show that the spectral screening threshold of the spectral screening method proposed by the present invention is not affected by the changes in experimental parameters and external environmental conditions. Once the characteristic peak is selected, it will no longer change, has good stability, and can adapt well to the fluctuation of the field environment.

[0097] The embodiment of the present invention obtains the spectral data of the fly ash sample to determine the characteristic peaks of the target reference elements in each channel of the target spectrometer according to the spectral data of the fly ash sample. Furthermore, the spectral intensity SD value of each channel of the target spectrometer is calculated according to the characteristic peaks of the target reference elements in each channel as the spectral screening threshold, so that the spectral data of the fly ash sample in each channel is screened according to the spectral screening threshold corresponding to each channel. The above method solves the problem of poor adaptability of the existing spectral screening method and can improve the adaptability and accuracy of spectral screening.

[0098] In the technical solution of the present disclosure, the collection, storage, use, processing, transmission, provision and disclosure of user personal information are in compliance with the relevant laws and regulations and do not violate public order and good morals.

[0099] It should be noted that any arrangement and combination of the technical features in the above embodiments also falls within the protection scope of the present invention.

[0100] Embodiment 3

[0101] Figure 8 is a schematic diagram of a spectral screening device provided in Embodiment 3 of the present invention, such as Figure 8 As shown, the device includes: a spectral data acquisition module 310, a characteristic peak acquisition module 320 of a target reference element, a spectral screening threshold acquisition module 330 and a spectral data screening module 340, wherein:

[0102] The spectral data acquisition module 310 is used to acquire spectral data obtained by performing spectral analysis on a target spectral screening object through a target spectrometer.

[0103] The target reference element characteristic peak acquisition module 320 is used to determine the characteristic peak of the target reference element in each channel of the target spectrometer according to the spectral data of the target spectral screening object.

[0104] The spectrum screening threshold acquisition module 330 is used to calculate the spectrum screening threshold of each channel of the target spectrometer according to the characteristic peak of the target reference element of each channel.

[0105] The spectral data screening module 340 is used to screen the spectral data of the target spectral screening object in each of the channels according to the spectral screening threshold corresponding to each of the channels.

[0106] The embodiment of the present invention obtains spectral data obtained by spectrally analyzing the target spectral screening object through the target spectrometer, so as to determine the characteristic peaks of the target reference elements in each channel of the target spectrometer according to the spectral data of the target spectral screening object. Furthermore, the spectral screening thresholds of each channel of the target spectrometer are calculated according to the characteristic peaks of the target reference elements in each channel, so as to screen the spectral data of the target spectral screening object in each channel according to the spectral screening thresholds corresponding to each channel. The above method solves the problem of poor adaptability of the existing spectral screening methods, and can improve the adaptability and accuracy of spectral screening.

[0107] Optionally, the target spectral screening object includes a particle object in a gas-solid two-phase flow; the spectral data acquisition module 310 is specifically used to: collect the target spectral screening object from a target collection environment; use a LIBS system to perform laser ablation on the target spectral screening object to obtain spectral data of the target spectral screening object.

[0108] Optionally, the target reference element characteristic peak acquisition module 320 is specifically used to: determine the target reference element of each channel of the target spectrometer according to the component structure of the target spectral screening object; determine the characteristic peak of the target reference element in each channel of the target spectrometer according to the target reference element and the spectral data.

[0109] Optionally, the characteristic peak acquisition module 320 of the target reference element is also used to: determine the concentration of each constituent element of the target spectrum screening object in each of the channels; for each of the channels, screen out the constituent element with the largest concentration from the constituent elements of the target spectrum screening object as the target reference element of each of the channels of the target spectrometer.

[0110] Optionally, the spectral screening threshold acquisition module 330 is specifically used to: extract the spectral intensity values ​​of a set number of pixel points from the characteristic peak of each of the target reference elements; calculate the spectral intensity SD value of the characteristic peak of the target reference element based on the spectral intensity values ​​of the set number of pixel points; and use the spectral intensity SD value of the characteristic peak of the target reference element in each of the channels as the spectral screening threshold of each of the channels.

[0111] Optionally, the spectrum screening threshold acquisition module 330 is further used to calculate the spectrum intensity SD value of the characteristic peak of the target reference element based on the following formula:

[0112]

[0113] Among them, N is the set number of pixels, X i is the absolute intensity of the i-th pixel, is the mean of the absolute intensity of the pixel points, and SD is the spectral intensity SD value.

[0114] Optionally, the spectral data screening module 340 is specifically used to: when it is determined that the spectral intensity SD value of at least one characteristic peak of the current spectrum of the channel is less than the spectral screening threshold corresponding to the channel, determine the current spectrum as an invalid spectrum; when it is determined that the spectral intensity SD values ​​of all characteristic peaks of the current spectrum of the channel are greater than or equal to the spectral screening threshold corresponding to the channel, determine the current spectrum as a valid spectrum.

[0115] The above-mentioned spectrum screening device can execute the spectrum screening method provided by any embodiment of the present invention, and has the corresponding functional modules and beneficial effects of the execution method. For technical details not described in detail in this embodiment, please refer to the spectrum screening method provided by any embodiment of the present invention.

[0116] Since the spectral screening device described above is a device that can execute the spectral screening method in the embodiment of the present invention, based on the spectral screening method described in the embodiment of the present invention, the technical personnel in the field can understand the specific implementation of the spectral screening device of the present embodiment and its various variations, so how the spectral screening device implements the spectral screening method in the embodiment of the present invention is not described in detail here. As long as the technical personnel in the field implement the device used in the spectral screening method in the embodiment of the present invention, it belongs to the scope of protection of this application.

[0117] Embodiment 4

[0118] Fig. 9 A schematic diagram of the structure of an electronic device 10 that can be used to implement an embodiment of the present invention is shown. The electronic device is intended to represent various forms of digital computers, such as laptop computers, desktop computers, workstations, personal digital assistants, servers, blade servers, mainframe computers, and other suitable computers. The electronic device can also represent various forms of mobile devices, such as personal digital processing, cellular phones, smart phones, wearable devices (such as helmets, glasses, watches, etc.) and other similar computing devices. The components shown herein, their connections and relationships, and their functions are merely examples and are not intended to limit the implementation of the present invention described and / or required herein.

[0119] like Fig. 9As shown, the electronic device 10 includes at least one processor 11, and a memory connected to the at least one processor 11, such as a read-only memory (ROM) 12, a random access memory (RAM) 13, etc., wherein the memory stores a computer program that can be executed by at least one processor, and the processor 11 can perform various appropriate actions and processes according to the computer program stored in the read-only memory (ROM) 12 or the computer program loaded from the storage unit 18 to the random access memory (RAM) 13. In the RAM 13, various programs and data required for the operation of the electronic device 10 can also be stored. The processor 11, the ROM 12, and the RAM 13 are connected to each other through a bus 14. An input / output (I / O) interface 15 is also connected to the bus 14.

[0120] A number of components in the electronic device 10 are connected to the I / O interface 15, including: an input unit 16, such as a keyboard, a mouse, etc.; an output unit 17, such as various types of displays, speakers, etc.; a storage unit 18, such as a disk, an optical disk, etc.; and a communication unit 19, such as a network card, a modem, a wireless communication transceiver, etc. The communication unit 19 allows the electronic device 10 to exchange information / data with other devices through a computer network such as the Internet and / or various telecommunication networks.

[0121] The processor 11 may be a variety of general and / or special processing components with processing and computing capabilities. Some examples of the processor 11 include, but are not limited to, a central processing unit (CPU), a graphics processing unit (GPU), various dedicated artificial intelligence (AI) computing chips, various processors running machine learning model algorithms, a digital signal processor (DSP), and any appropriate processor, controller, microcontroller, etc. The processor 11 performs the various methods and processes described above, such as a spectral screening method.

[0122] In some embodiments, the spectral screening method can be implemented as a computer program, which is tangibly contained in a computer-readable storage medium, such as a storage unit 18. In some embodiments, part or all of the computer program can be loaded and / or installed on the electronic device 10 via the ROM 12 and / or the communication unit 19. When the computer program is loaded into the RAM 13 and executed by the processor 11, one or more steps of the spectral screening method described above can be performed. Alternatively, in other embodiments, the processor 11 can be configured to perform the spectral screening method in any other suitable manner (for example, by means of firmware).

[0123] Optionally, the spectral screening method may include: acquiring spectral data obtained by performing spectral analysis on a target spectral screening object through a target spectrometer; determining characteristic peaks of target reference elements in each channel of the target spectrometer based on the spectral data of the target spectral screening object; calculating spectral screening thresholds of each channel of the target spectrometer based on the characteristic peaks of the target reference elements in each channel; and screening the spectral data of the target spectral screening object in each channel according to the spectral screening threshold corresponding to each channel.

[0124] Various implementations of the systems and techniques described above herein can be implemented in digital electronic circuit systems, integrated circuit systems, field programmable gate arrays (FPGAs), application specific integrated circuits (ASICs), application specific standard products (ASSPs), systems on chips (SOCs), load programmable logic devices (CPLDs), computer hardware, firmware, software, and / or combinations thereof. These various implementations can include: being implemented in one or more computer programs that can be executed and / or interpreted on a programmable system including at least one programmable processor, which can be a special purpose or general purpose programmable processor that can receive data and instructions from a storage system, at least one input device, and at least one output device, and transmit data and instructions to the storage system, the at least one input device, and the at least one output device.

[0125] Computer programs for implementing the methods of the present invention may be written in any combination of one or more programming languages. These computer programs may be provided to a processor of a general-purpose computer, a special-purpose computer, or other programmable data processing device, so that when the computer program is executed by the processor, the functions / operations specified in the flow chart and / or block diagram are implemented. The computer program may be executed entirely on the machine, partially on the machine, partially on the machine and partially on a remote machine as a stand-alone software package, or entirely on a remote machine or server.

[0126] In the context of the present invention, a computer-readable storage medium may be a tangible medium that may contain or store a computer program for use by or in combination with an instruction execution system, device or equipment. A computer-readable storage medium may include, but is not limited to, electronic, magnetic, optical, electromagnetic, infrared, or semiconductor systems, devices or equipment, or any suitable combination of the foregoing. Alternatively, a computer-readable storage medium may be a machine-readable signal medium. A more specific example of a machine-readable storage medium may include an electrical connection based on one or more lines, a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.

[0127] To provide interaction with a user, the systems and techniques described herein may be implemented on an electronic device having: a display device (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor) for displaying information to the user; and a keyboard and a pointing device (e.g., a mouse or trackball) through which the user can provide input to the electronic device. Other types of devices may also be used to provide interaction with the user; for example, the feedback provided to the user may be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user may be received in any form (including acoustic input, voice input, or tactile input).

[0128] The systems and techniques described herein may be implemented in a computing system that includes backend components (e.g., as a data server), or a computing system that includes middleware components (e.g., an application server), or a computing system that includes frontend components (e.g., a user computer with a graphical user interface or a web browser through which a user can interact with implementations of the systems and techniques described herein), or a computing system that includes any combination of such backend components, middleware components, or frontend components. The components of the system may be interconnected by any form or medium of digital data communication (e.g., a communication network). Examples of communication networks include: a local area network (LAN), a wide area network (WAN), a blockchain network, and the Internet.

[0129] A computing system may include a client and a server. The client and the server are generally remote from each other and usually interact through a communication network. The client and server relationship is generated by computer programs running on the corresponding computers and having a client-server relationship with each other. The server may be a cloud server, also known as a cloud computing server or cloud host, which is a host product in the cloud computing service system to solve the defects of difficult management and weak business scalability in traditional physical hosts and VPS services.

[0130] It should be understood that the various forms of processes shown above can be used to reorder, add or delete steps. For example, the steps recorded in this disclosure can be executed in parallel, sequentially or in different orders, as long as the desired results of the technical solutions disclosed in this disclosure can be achieved, and this document does not limit this.

[0131] The above specific implementations do not constitute a limitation on the protection scope of the present disclosure. It should be understood by those skilled in the art that various modifications, combinations, sub-combinations and substitutions can be made according to design requirements and other factors. Any modification, equivalent substitution and improvement made within the spirit and principle of the present disclosure shall be included in the protection scope of the present disclosure.

Claims

1. A spectral screening method, characterized in that: include: Acquiring spectral data obtained by spectrally analyzing a target spectral screening object through a target spectrometer; Determine the characteristic peaks of the target reference elements in each channel of the target spectrometer according to the spectral data of the target spectral screening object; Calculating the spectral screening threshold of each channel of the target spectrometer according to the characteristic peak of the target reference element of each channel; The spectrum data of the target spectrum screening object in each of the channels is screened according to the spectrum screening threshold corresponding to each of the channels.

2. The method according to claim 1, characterized in that The target spectral screening objects include particle objects in gas-solid two-phase flow; The step of obtaining spectral data obtained by performing spectral analysis on a target spectral screening object through a target spectrometer includes: Collect the target spectrum screening object from the target collection environment; The target spectral screening object is laser ablated using a laser induced breakdown spectroscopy (LIBS) system to obtain spectral data of the target spectral screening object.

3. The method according to claim 1, characterized in that The step of determining the characteristic peaks of the target reference elements in each channel of the target spectrometer according to the spectral data of the target spectral screening object comprises: Determine the target reference element of each channel of the target spectrometer according to the component structure of the target spectral screening object; The characteristic peak of the target reference element in each channel of the target spectrometer is determined according to the target reference element and the spectral data.

4. The method according to claim 3, characterized in that The step of determining the target reference element of each channel of the target spectrometer according to the component structure of the target spectrum screening object includes: Determining the concentration of each constituent element of the target spectral screening object in each of the channels; For each of the channels, the component element with the largest concentration is screened out from the component elements of the target spectrum screening object as the target reference element of each of the channels of the target spectrometer.

5. The method according to claim 1, characterized in that The step of calculating the spectral screening threshold of each channel of the target spectrometer according to the characteristic peak of the target reference element of each channel comprises: Extracting spectral intensity values ​​of a set number of pixel points from the characteristic peak of each target reference element; Calculate the spectral intensity standard deviation SD value of the characteristic peak of the target reference element according to the spectral intensity values ​​of the set number of pixel points; The spectral intensity SD value of the characteristic peak of the target reference element in each channel is used as the spectral screening threshold of each channel.

6. The method according to claim 4, characterized in that The calculating the spectral intensity SD value of the characteristic peak of the target reference element according to the spectral intensity values ​​of the set number of pixel points includes: The spectral intensity SD value of the characteristic peak of the target reference element is calculated based on the following formula: in, N is the set number of pixels, Xi For the i The absolute intensity of the pixel point, is the mean value of the absolute intensity of the pixel points, SD is the SD value of the spectral intensity.

7. The method according to claim 1, characterized in that The screening of the spectral data of the target spectral screening object in each of the channels according to the spectral screening threshold corresponding to each of the channels includes: In the case where it is determined that the spectral intensity SD value of at least one characteristic peak of the current spectrum of the channel is less than the spectrum screening threshold corresponding to the channel, the current spectrum is determined as an invalid spectrum; When it is determined that the spectral intensity SD values ​​of all characteristic peaks of the current spectrum of the channel are greater than or equal to the spectrum screening threshold corresponding to the channel, the current spectrum is determined as a valid spectrum.

8. An electronic device, characterized in that: The electronic device comprises: at least one processor; and a memory communicatively connected to the at least one processor; wherein, The memory stores a computer program executed by the at least one processor, and the computer program is executed by the at least one processor so that the at least one processor can perform the spectral screening method described in any one of claims 1-7.

9. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores computer instructions, and the computer instructions are used to implement the spectral screening method described in any one of claims 1 to 7 when executed by a processor.

10. A computer program product comprising a computer program / instructions, wherein: When the computer program / instructions are executed by a processor, the spectral screening method according to any one of claims 1 to 7 is implemented.

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