Active test method and system for circuit breaker

Abstract

The invention relates to the technical field of data analysis, in particular to an active test method and system for a circuit breaker. The method comprises the following steps: acquiring the peak voltage of the circuit breaker and the test data of the circuit breaker; determining a fluctuation data group at each moment; determining data related indexes according to the distribution of the fluctuation data groups; determining a test fluctuation index of the circuit breaker according to the data related index and the fluctuation data set; determining a fluctuation trend index by combining adjacent data fluctuations in a time sequence; and according to the peak voltage and fluctuation trend indexes of all circuit breaker test data, determining an abnormal degree, and according to the abnormal degrees at all moments, carrying out fault test on the circuit breaker to obtain a test result. According to the method, the circuit breaker test data fluctuation caused by the change of the peak voltage can be effectively analyzed, the accurate abnormal degree at each moment is determined in combination with the analysis result, the reliability and accuracy of the fault test of the circuit breaker are improved, and the test result is optimized.

Description

Technical Field

[0001] The present invention relates to the technical field of data analysis, and particularly relates to an active test method and system for a circuit breaker. Background Art

[0002] The purpose of the active test of the circuit breaker is to sense the state of the circuit breaker in an automated manner when the circuit breaker cannot work properly and is in a certain uncertain fault, and perform analysis and report output according to the test results to ensure the safety and accuracy of the circuit breaker test.

[0003] The active test of the circuit breaker usually uses professional test equipment, such as a multifunctional tester, a large current injection tester, a circuit breaker mechanical life test bench, etc. By analyzing the various data obtained from the test, the fault condition of the circuit breaker is determined. During the test, since the peak voltage will fluctuate when the circuit breaker is in the energized state, and the fluctuating peak voltage will affect the test data during the test, causing corresponding changes in the test data itself. Therefore, analyzing only based on the various data obtained from the test will result in poor reliability and accuracy of the active fault test of the circuit breaker. Summary of the Invention

[0004] In order to solve the technical problem that the peak voltage of the circuit breaker fluctuates when it is in the energized state, and the fluctuation affects the credibility of the test data, and the reliability and accuracy of the fault test of the circuit breaker are poor when analyzing only based on the various data obtained from the test, the present invention provides an active test method and system for a circuit breaker, and the technical solutions adopted are as follows: The present invention proposes an active test method for a circuit breaker, and the method includes: Obtain the peak voltage of the circuit breaker and at least two types of circuit breaker test data at different times; select any one of the circuit breaker test data as the data to be tested, and determine the fluctuation data group at each moment according to the data values of the peak voltage and the data to be tested at each moment; Determine the data-related index at each moment according to the distribution of the fluctuation data groups at all times; select any one moment as the moment to be tested, and other moments as the comparison moments, and determine the data fluctuation coefficient of the moment to be tested according to the data-related index of the moment to be tested and the fluctuation data groups of the moment to be tested and all the comparison moments; Determine the circuit breaker test fluctuation index according to the data fluctuation coefficients at all times; determine the fluctuation trend index of the moment to be tested according to the fluctuation data groups of the preset number of other moments closest to the moment to be tested and the circuit breaker test fluctuation index; According to the correlation between the peak voltage at the time to be tested and the fluctuation trend index of all circuit breaker test data, the abnormality degree at the time to be tested is determined, and the circuit breaker is fault tested according to the abnormality degree at all times to obtain the test result.

[0005] Further, determining the fluctuation data group at each moment according to the peak voltage and the data value of the measured data at each moment includes: A two-dimensional coordinate system is constructed with the peak voltage as the horizontal coordinate and the measured data as the vertical coordinate, the coordinate point of the corresponding data at each moment in the two-dimensional coordinate system is determined, and the coordinate value corresponding to the coordinate point is used as the fluctuation data group at each moment.

[0006] Furthermore, determining the data-related index at each moment according to the distribution of the fluctuation data group at all moments includes: Perform density analysis on the coordinate points corresponding to the fluctuation data set at all times in the two-dimensional coordinate system, and determine the center point with the largest density as a reference point; The Euclidean distance between the coordinate point corresponding to each moment and the reference point is normalized to obtain the data-related indicators at each moment.

[0007] Further, determining the data fluctuation coefficient of the time to be measured according to the data-related index of the time to be measured and the fluctuation data group of the time to be measured and all the comparison times includes: Calculate the mean of all the fluctuation data sets at the comparison moments on each coordinate axis to obtain the mean coordinates; The Euclidean distance between the coordinates corresponding to the fluctuation data set at the time to be measured and the mean coordinates is used as the initial fluctuation coefficient; The normalized value of the product of the data-related index and the initial fluctuation coefficient is calculated to obtain the data fluctuation coefficient at the time to be measured.

[0008] Furthermore, the circuit breaker test fluctuation index is determined according to the data fluctuation coefficient at all times, including: Calculate the mean of the data volatility coefficients at all times as the circuit breaker test volatility indicator.

[0009] Further, the determining of the fluctuation trend index at the time to be tested according to the fluctuation data groups of a preset number of other time periods closest to the time to be tested and the circuit breaker test fluctuation index comprises: Taking a preset number of other moments closest to the moment to be measured as neighboring moments; Based on the inverse tangent function, the function values ​​of the coordinate points corresponding to the time to be measured and each neighboring time are calculated respectively, wherein the function value of the coordinate point corresponding to the time to be measured is the fluctuation index to be measured, and the function value of the coordinate point corresponding to the neighboring time is the neighborhood fluctuation index; Calculating the absolute value of the difference between the volatility index to be measured and the neighborhood volatility index to obtain the neighborhood volatility difference; Normalizing the mean values ​​of all neighborhood fluctuation differences to obtain the fluctuation difference coefficient at the time to be measured; The fluctuation trend index at the time to be tested is determined according to the circuit breaker test fluctuation index and the fluctuation difference coefficient at the time to be tested.

[0010] Furthermore, the circuit breaker test fluctuation index is positively correlated with the fluctuation trend index at the time to be tested, the fluctuation difference coefficient at the time to be tested is positively correlated with the fluctuation trend index at the time to be tested, and the value range of the fluctuation trend index at the time to be tested is the normalized range.

[0011] Further, the abnormality degree at the time to be tested is determined according to the correlation between the peak voltage at the time to be tested and the fluctuation trend index of all circuit breaker test data, including: Calculate the variance of the peak voltage at the time to be tested and the fluctuation trend index of all circuit breaker test data to obtain the degree of dispersion of the fluctuation trend; Calculate the mean of the peak voltage at the time to be tested and the fluctuation trend index of all circuit breaker test data to obtain the fluctuation trend average coefficient; The normalized value of the product of the fluctuation trend dispersion degree and the fluctuation trend average coefficient is used as the abnormality degree at the time to be measured.

[0012] Further, the circuit breaker is subjected to a fault test according to the abnormality degree at all times to obtain a test result, including: The moment when the value of the abnormality level is greater than a preset abnormality threshold is taken as the target moment; The ratio of the number at the target time to the number at all times is calculated to obtain the degree of failure, and the degree of failure is used as the test result.

[0013] The present invention also proposes an active testing system for a circuit breaker, the system comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the steps of the active testing method for a circuit breaker as described above when executing the computer program.

[0014] The present invention has the following beneficial effects: The present invention obtains the peak voltage of the circuit breaker and the circuit breaker test data; determines the fluctuation data group; determines the data related index according to the distribution of the fluctuation data group at all times; because the peak voltage of the circuit breaker is correlated with the circuit breaker test data, the present invention determines the data related index, analyzes the correlation, and determines the data fluctuation coefficient at the time to be tested in combination with the data related index; the data fluctuation coefficient represents the characteristic value of the data fluctuation, and the fluctuation of the circuit breaker itself, that is, the circuit breaker test fluctuation index, can be determined according to the data fluctuation coefficient at all times; then, because the data fluctuations affect each other in adjacent time periods, the present invention determines the fluctuation trend index at the time to be tested according to the fluctuation data group and the circuit breaker test fluctuation index at other times with adjacent time series; then, in combination with different types of circuit breaker test data, the abnormality degree at each time is analyzed to determine the abnormality degree at the time to be tested, and the circuit breaker is subjected to a fault test according to the abnormality degree at all times to obtain a test result. In summary, the present invention can effectively analyze the circuit breaker test fluctuation caused by the change in peak voltage, and determine the accurate abnormality degree at each moment based on the analysis results, thereby improving the reliability and accuracy of fault testing of circuit breakers and optimizing test results. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] In order to more clearly illustrate the technical solutions and advantages in the embodiments of the present invention or the prior art, the drawings required for use in the embodiments or the prior art descriptions are briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0016] Figure 1 A flow chart of an active testing method for a circuit breaker provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0017] In order to further explain the technical means and effects adopted by the present invention to achieve the predetermined invention purpose, the following is a detailed description of the active testing method and system for circuit breakers proposed by the present invention, its specific implementation, structure, features and effects, in combination with the accompanying drawings and preferred embodiments. In the following description, different "one embodiment" or "another embodiment" does not necessarily refer to the same embodiment. In addition, specific features, structures or characteristics in one or more embodiments may be combined in any suitable form.

[0018] Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs.

[0019] A specific solution of an active testing method for a circuit breaker provided by the present invention is described in detail below with reference to the accompanying drawings.

[0020] See also Figure 1 , which shows a flow chart of an active testing method for a circuit breaker provided by an embodiment of the present invention, the method comprising: S101: Acquire peak voltages of circuit breakers at different times and at least two types of circuit breaker test data; select any one type of circuit breaker test data as test data, and determine a fluctuation data group at each time according to the peak voltage and the data value of the test data at each time.

[0021] A specific implementation scenario of the present invention includes: the circuit breaker cannot work normally, and the circuit breaker is actively tested for faults, wherein the fault usually refers to a problem with a component or circuit on the circuit breaker, which causes the circuit breaker to fail to work normally or performance degradation. Active testing usually refers to the test system actively detecting and diagnosing the circuit breaker, and this test is usually implemented using professional testing equipment and software, such as an oscilloscope, a multi-function tester, etc. It should be noted that since the circuit breaker may still be in operation when performing a fault test, it will have a corresponding peak voltage during its operation. The load corresponding to the circuit breaker at different times will be different, resulting in the peak voltage may fluctuate, and then the applied peak voltage and circuit breaker test data at different times will change, making the accuracy and reliability of circuit breaker testing based on a unified fault standard insufficient.

[0022] Therefore, the present invention can periodically obtain the peak voltage of the circuit breaker at different times and at least two types of circuit breaker test data when performing a fault test on the circuit breaker. The circuit breaker test data can be specifically, for example, the signal amplitude generated by the oscilloscope, the voltage value of the circuit breaker test point, and other data. The present invention can obtain the peak voltage and circuit breaker test data every 0.01 seconds, wherein the acquisition period of the circuit breaker test data can also be adjusted according to the actual detection requirements, and there is no limitation on this.

[0023] Furthermore, in some embodiments of the present invention, the fluctuation data group at each moment is determined based on the peak voltage and the data value of the data to be measured at each moment, including: constructing a two-dimensional coordinate system with the peak voltage as the horizontal coordinate and the data to be measured as the vertical coordinate, determining the coordinate point of the corresponding data at each moment in the two-dimensional coordinate system, and taking the coordinate value corresponding to the coordinate point as the fluctuation data group at each moment.

[0024] Among them, a two-dimensional coordinate system is constructed with the peak voltage as the horizontal coordinate and the data to be measured as the vertical coordinate, that is to say, the peak voltage and the data to be measured are used as the horizontal and vertical coordinates respectively, so as to realize the relationship analysis between the peak voltage and the data to be measured. For example, at a certain moment, the peak voltage is 0.5 volts, and the value of the data to be measured is 2, then the coordinate value of the corresponding coordinate point is (0.5, 2), then the present invention uses (0.5, 2) as the fluctuation data group, thereby determining the coordinate points at each moment, and counting them all in the two-dimensional coordinate system, so as to obtain the corresponding relationship between the peak voltage and the data to be measured, as well as the numerical distribution characteristics under normal circumstances.

[0025] S102: Determine the data-related index at each moment according to the distribution of the fluctuation data groups at all moments; select any moment as the moment to be tested and the other moments as the comparison moments, and determine the data fluctuation coefficient of the moment to be tested according to the data-related index at the moment to be tested and the fluctuation data groups between the moment to be tested and all the comparison moments.

[0026] Furthermore, in some embodiments of the present invention, data-related indicators at each moment are determined based on the distribution of fluctuation data groups at all moments, including: performing density analysis on the coordinate points corresponding to the fluctuation data groups at all moments in the two-dimensional coordinate system, and determining the center point with the largest density as the reference point; normalizing the Euclidean distance between the coordinate point corresponding to each moment and the reference point to obtain the data-related indicators at each moment.

[0027] Among them, it can be understood that the coordinate point distribution corresponding to the fluctuation data group at all times in the two-dimensional coordinate system can characterize the corresponding data analysis characteristics, and the area with the highest density is also the area under normal conditions. Therefore, the present invention performs cluster analysis on it to determine the area with the highest density, and uses the center point corresponding to the area with the highest density as the point of peak voltage and data to be measured under normal conditions. It should be noted that the cluster analysis of the present invention is density cluster analysis, and density analysis is used to eliminate the influence of abnormal points on reference points, so as to obtain more accurate and effective reference points. Density clustering is a technology well known in the art, and no further limitation or elaboration is made on it.

[0028] The reference point of the embodiment of the present invention is the center point of the area with the highest density, which can effectively characterize the peak voltage and the characteristic points of the data to be measured under normal circumstances. Therefore, the farther the distance between other coordinate points and the reference point, the greater the corresponding abnormality. The present invention normalizes the Euclidean distance between the coordinate point and the reference point to obtain the data-related index at each moment, that is, the larger the data-related index, the more the corresponding coordinate point conforms to the numerical characteristics of the abnormal peak voltage-reference data.

[0029] In one embodiment of the present invention, the normalization processing can be specifically, for example, maximum and minimum value normalization processing, and the normalization in subsequent steps can all adopt maximum and minimum value normalization processing. In other embodiments of the present invention, other normalization methods can be selected according to the specific range of numerical values, which will not be described in detail.

[0030] In the embodiment of the present invention, the Euclidean distance may be normalized to its maximum and minimum values ​​to obtain a data-related index.

[0031] In the embodiment of the present invention, any moment is used as the time to be measured, and other moments except the time to be measured are used as comparison moments, thereby analyzing the time to be measured.

[0032] Furthermore, in some embodiments of the present invention, the data fluctuation coefficient of the time to be measured is determined based on data-related indicators at the time to be measured and the fluctuation data groups at the time to be measured and all comparison times, including: calculating the mean of the fluctuation data groups at all comparison times on each coordinate axis to obtain the mean coordinates; taking the Euclidean distance between the coordinates corresponding to the fluctuation data group at the time to be measured and the mean coordinates as the initial fluctuation coefficient; calculating the normalized value of the product of the data-related indicators and the initial fluctuation coefficient to obtain the data fluctuation coefficient at the time to be measured.

[0033] In the embodiment of the present invention, since the peak voltage is the horizontal coordinate and the data to be measured is the vertical coordinate, the mean of the fluctuation data group at all comparison moments on each coordinate axis is calculated, that is, the mean of the peak voltage and the mean of the data to be measured at all comparison moments are calculated, and the two means are used as the horizontal and vertical coordinate values ​​of the mean coordinate respectively. The mean coordinate characterizes the numerical mean characteristics of the peak voltage and the data to be measured at the comparison moment, and the Euclidean distance between the coordinate corresponding to the fluctuation data group at the time to be measured and the mean coordinate is used as the initial fluctuation coefficient. The larger the initial fluctuation coefficient, the greater the difference between the time to be measured and all other comparison moments, that is, the greater the abnormality of the time to be measured itself.

[0034] In an embodiment of the present invention, the data-related index represents the abnormal situation at the density distribution level, and the initial fluctuation coefficient represents the abnormal situation at the numerical level. They are combined, that is, the normalized value of the product of the data-related index and the initial fluctuation coefficient is calculated to obtain the data fluctuation coefficient of the time to be measured. The larger the data fluctuation coefficient of the time to be measured, the greater the degree of abnormality in the correlation distribution and numerical direction of the horizontal and vertical coordinates at the time to be measured.

[0035] S103: determining a circuit breaker test fluctuation index according to data fluctuation coefficients at all times; determining a fluctuation trend index at the time to be tested according to fluctuation data groups of a preset number of other times closest to the time to be tested and the circuit breaker test fluctuation index.

[0036] Further, in some embodiments of the present invention, determining the circuit breaker test fluctuation index according to the data fluctuation coefficients at all times includes: calculating the average of the data fluctuation coefficients at all times as the circuit breaker test fluctuation index.

[0037] Each moment has a corresponding data fluctuation coefficient. Therefore, the present invention calculates the mean value of the data fluctuation coefficients at all moments as the circuit breaker test fluctuation index. The circuit breaker test fluctuation index characterizes the abnormality of the circuit breaker itself in the peak voltage and the data to be tested. The higher the degree of circuit breaker failure, the lower the regularity of the distribution of the coordinate points of the peak voltage and the data to be tested at all moments, the larger the distribution range, and the larger the value of the corresponding circuit breaker test fluctuation index. Fault analysis can be achieved based on the circuit breaker test fluctuation index.

[0038] Further, in some embodiments of the present invention, the fluctuation trend index of the time to be measured is determined based on the fluctuation data groups of a preset number of other times closest to the time to be measured and the circuit breaker test fluctuation index, including: taking the preset number of other times closest to the time to be measured as neighborhood times; calculating the function values ​​of the coordinate points corresponding to the time to be measured and each neighborhood time based on the inverse tangent function, wherein the function value of the coordinate point corresponding to the time to be measured is the fluctuation index to be measured, and the function value of the coordinate point corresponding to the neighborhood time is the neighborhood fluctuation index; calculating the absolute value of the difference between the fluctuation index to be measured and the neighborhood fluctuation index to obtain the neighborhood fluctuation difference; normalizing the mean values ​​of all neighborhood fluctuation differences to obtain the fluctuation difference coefficient of the time to be measured; determining the fluctuation trend index of the time to be measured based on the circuit breaker test fluctuation index and the fluctuation difference coefficient of the time to be measured.

[0039] Among them, the preset number is the number of preset neighborhood moments, which can be used to characterize the impact moment of the moment to be measured within its local timing range. In an embodiment of the present invention, the preset number can be specifically 5, for example, or can also be adjusted according to actual detection requirements.

[0040] It is understandable that since the peak voltage and circuit breaker test data at adjacent moments will affect the moment to be tested, that is, will further affect the abnormal performance of the circuit breaker at the moment to be tested, the present invention analyzes the values ​​of the moment to be tested and all neighboring moments. The function values ​​of the coordinate points corresponding to the moment to be tested and each neighboring moment are calculated based on the inverse tangent function, and then the absolute value of the difference between the fluctuation index to be tested and the neighboring fluctuation index is calculated to obtain the neighborhood fluctuation difference.

[0041] The present invention calculates the mean normalization processing of all neighborhood fluctuation differences to obtain the fluctuation difference coefficient at the time to be tested. The larger the fluctuation difference coefficient, the greater the data fluctuation between the time to be tested and the corresponding neighborhood time, the less it conforms to the normal circuit breaker test data fluctuation characteristics, and the greater the abnormality of the time to be tested itself.

[0042] Therefore, the fluctuation trend index at the time to be tested can be determined by combining the circuit breaker test fluctuation index and the fluctuation difference coefficient at the time to be tested.

[0043] Further, in some embodiments of the present invention, the circuit breaker test fluctuation index is positively correlated with the fluctuation trend index at the time to be tested, the fluctuation difference coefficient at the time to be tested is positively correlated with the fluctuation trend index at the time to be tested, and the value range of the fluctuation trend index at the time to be tested is the normalized range. Among them, the positive correlation relationship means that the dependent variable will increase with the increase of the independent variable, and the dependent variable will decrease with the decrease of the independent variable. The specific relationship can be a multiplication relationship, an addition relationship, and the power of an exponential function, which is determined by actual application; the negative correlation relationship means that the dependent variable will decrease with the increase of the independent variable, and the dependent variable will increase with the decrease of the independent variable. It can be a subtraction relationship, a division relationship, etc., which is determined by actual application.

[0044] The present invention can calculate the sum of the circuit breaker test fluctuation index and the fluctuation difference coefficient at the time to be tested, and normalize it to obtain the fluctuation trend index at the time to be tested, or can also calculate the product of the circuit breaker test fluctuation index and the fluctuation difference coefficient at the time to be tested, and normalize it to obtain the fluctuation trend index at the time to be tested.

[0045] S104: Determine the abnormality degree at the time to be tested according to the correlation between the peak voltage at the time to be tested and the fluctuation trend index of all circuit breaker test data, perform a fault test on the circuit breaker according to the abnormality degree at all times, and obtain a test result.

[0046] Further, in some embodiments of the present invention, the abnormality degree at the time to be measured is determined according to the correlation between the peak voltage at the time to be measured and the fluctuation trend index of all circuit breaker test data, including: calculating the variance of the peak voltage at the time to be measured and the fluctuation trend index of all circuit breaker test data respectively, to obtain the dispersion degree of the fluctuation trend; calculating the mean of the peak voltage at the time to be measured and the fluctuation trend index of all circuit breaker test data respectively, to obtain the average coefficient of the fluctuation trend; and taking the normalized value of the product of the dispersion degree of the fluctuation trend and the average coefficient of the fluctuation trend as the abnormality degree at the time to be measured.

[0047] In the embodiment of the present invention, the degree of dispersion of the fluctuation trend represents the degree of dispersion of the fluctuation characteristics of each data at the time to be tested. The larger the value, the more discrete the fluctuation at the same time, that is, the greater the impact of the abnormality. The average coefficient of the fluctuation trend represents the numerical abnormality of all the circuit breaker test data itself. Therefore, the present invention calculates the normalized value of the product of the degree of dispersion of the fluctuation trend and the average coefficient of the fluctuation trend as the degree of abnormality at the time to be tested.

[0048] It can be understood that the abnormality degree in the embodiment of the present invention is a numerical distribution of the fluctuation trend index of all circuit breaker test data at the same time, so that fluctuation analysis can be performed on each type of circuit breaker test data, and the discrete situation and overall numerical characteristics of the fluctuation trend can be further analyzed, so as to ensure that the abnormality degree can effectively combine the abnormal situations of all circuit breaker test data, so that the abnormality degree has a more effective characterization effect.

[0049] Furthermore, in some embodiments of the present invention, a fault test is performed on the circuit breaker according to the abnormality degree at all times to obtain a test result, including: taking the moment when the abnormality degree is greater than a preset abnormality threshold as the target moment; calculating the ratio of the number of target moments to the number of all moments to obtain the fault degree, and taking the fault degree as the test result.

[0050] In the embodiment of the present invention, the preset abnormal threshold is a threshold value of the abnormality degree. Optionally, the preset abnormal threshold can be specifically, for example, 0.8, that is, the moment when the value of the abnormality degree is greater than 0.8 is taken as the target moment. Since the greater the abnormality degree, the more abnormal the value representing each circuit breaker test data at the corresponding moment, that is, the greater the possibility of circuit breaker failure at the corresponding moment, therefore, the present invention takes the target moment as the fault moment, calculates the ratio of the number of target moments to the number of all moments, obtains the fault degree, and takes the fault degree as the test result.

[0051] The present invention obtains the peak voltage of the circuit breaker and the circuit breaker test data; determines the fluctuation data group; determines the data related index according to the distribution of the fluctuation data group at all times; because the peak voltage of the circuit breaker is correlated with the circuit breaker test data, the present invention determines the data related index, analyzes the correlation, and determines the data fluctuation coefficient at the time to be tested in combination with the data related index; the data fluctuation coefficient represents the characteristic value of the data fluctuation, and the fluctuation of the circuit breaker itself, that is, the circuit breaker test fluctuation index, can be determined according to the data fluctuation coefficient at all times; then, because the data fluctuations affect each other in adjacent time periods, the present invention determines the fluctuation trend index at the time to be tested according to the fluctuation data group and the circuit breaker test fluctuation index at other times with adjacent time series; then, in combination with different types of circuit breaker test data, the abnormality degree at each time is analyzed to determine the abnormality degree at the time to be tested, and the circuit breaker is subjected to a fault test according to the abnormality degree at all times to obtain a test result. In summary, the present invention can effectively analyze the circuit breaker test fluctuation caused by the change in peak voltage, and determine the accurate abnormality degree at each moment based on the analysis results, thereby improving the reliability and accuracy of fault testing of circuit breakers and optimizing test results.

[0052] The present invention also proposes an active testing system for a circuit breaker. The system includes a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, the steps of an active testing method for a circuit breaker as described above are implemented.

[0053] It should be noted that the above-described embodiments are only used to illustrate the technical solutions of the present application, rather than to limit them. Although the present application has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. These modifications or replacements do not deviate the essence of the corresponding technical solutions from the scope of the technical solutions of the embodiments of the present application, and should all be included in the protection scope of the present application.

[0054] The various embodiments in this specification are described in a progressive manner, and the same or similar parts between the various embodiments can be referenced to each other, and each embodiment focuses on the differences from other embodiments.

Claims

1. An active testing method for a circuit breaker, characterized in that: The method comprises: Acquire the peak voltage of the circuit breaker at different times and at least two types of circuit breaker test data; select any one type of circuit breaker test data as the data to be tested, and determine the fluctuation data group at each moment according to the peak voltage and the data value of the data to be tested at each moment; Determine the data-related index at each moment according to the distribution of the fluctuation data group at all moments; select one moment as the moment to be tested and the other moments as the comparison moments, and determine the data fluctuation coefficient of the moment to be tested according to the data-related index at the moment to be tested and the fluctuation data group at the moment to be tested and all the comparison moments; Determine the circuit breaker test fluctuation index according to the data fluctuation coefficients at all times; determine the fluctuation trend index at the time to be tested according to the fluctuation data groups of a preset number of other times closest to the time to be tested and the circuit breaker test fluctuation index; According to the correlation between the peak voltage at the time to be tested and the fluctuation trend index of all circuit breaker test data, the abnormality degree at the time to be tested is determined, and the circuit breaker is fault tested according to the abnormality degree at all times to obtain the test result.

2. An active testing method for a circuit breaker according to claim 1, characterized in that: The step of determining the fluctuation data group at each moment according to the peak voltage and the data value of the data to be measured at each moment comprises: A two-dimensional coordinate system is constructed with the peak voltage as the horizontal coordinate and the measured data as the vertical coordinate, the coordinate point of the corresponding data at each moment in the two-dimensional coordinate system is determined, and the coordinate value corresponding to the coordinate point is used as the fluctuation data group at each moment.

3. An active testing method for a circuit breaker according to claim 2, characterized in that: Determining the data-related index at each moment according to the distribution of the fluctuation data group at all moments includes: Perform density analysis on the coordinate points corresponding to the fluctuation data set at all times in the two-dimensional coordinate system, and determine the center point with the largest density as a reference point; The Euclidean distance between the coordinate point corresponding to each moment and the reference point is normalized to obtain the data-related indicators at each moment.

4. An active testing method for a circuit breaker according to claim 2, characterized in that: Determining the data fluctuation coefficient of the time to be measured according to the data-related index of the time to be measured and the fluctuation data group of the time to be measured and all the comparison times includes: Calculate the mean of all the fluctuation data sets at the comparison moments on each coordinate axis to obtain the mean coordinates; The Euclidean distance between the coordinates corresponding to the fluctuation data set at the time to be measured and the mean coordinates is used as the initial fluctuation coefficient; The normalized value of the product of the data-related index and the initial fluctuation coefficient is calculated to obtain the data fluctuation coefficient at the time to be measured.

5. An active testing method for a circuit breaker according to claim 1, characterized in that: Determining the circuit breaker test fluctuation index according to the data fluctuation coefficient at all times includes: Calculate the mean of the data volatility coefficients at all times as the circuit breaker test volatility indicator.

6. An active testing method for a circuit breaker according to claim 2, characterized in that: The step of determining the fluctuation trend index at the time to be tested based on the fluctuation data groups at a preset number of other time points closest to the time to be tested and the circuit breaker test fluctuation index comprises: Taking a preset number of other moments closest to the moment to be measured as neighboring moments; Based on the inverse tangent function, the function values ​​of the coordinate points corresponding to the time to be measured and each neighboring time are calculated respectively, wherein the function value of the coordinate point corresponding to the time to be measured is the fluctuation index to be measured, and the function value of the coordinate point corresponding to the neighboring time is the neighborhood fluctuation index; Calculating the absolute value of the difference between the volatility index to be measured and the neighborhood volatility index to obtain the neighborhood volatility difference; Normalizing the mean values ​​of all neighborhood fluctuation differences to obtain the fluctuation difference coefficient at the time to be measured; The fluctuation trend index at the time to be tested is determined according to the circuit breaker test fluctuation index and the fluctuation difference coefficient at the time to be tested.

7. An active testing method for a circuit breaker according to claim 6, characterized in that: The circuit breaker test fluctuation index is positively correlated with the fluctuation trend index at the time to be tested, the fluctuation difference coefficient at the time to be tested is positively correlated with the fluctuation trend index at the time to be tested, and the value range of the fluctuation trend index at the time to be tested is the normalized range.

8. An active testing method for a circuit breaker according to claim 1, characterized in that: Determining the abnormality degree at the time to be tested according to the correlation between the peak voltage at the time to be tested and the fluctuation trend index of all circuit breaker test data includes: Calculate the variance of the peak voltage at the time to be tested and the fluctuation trend index of all circuit breaker test data to obtain the degree of dispersion of the fluctuation trend; Calculate the mean of the peak voltage at the time to be tested and the fluctuation trend index of all circuit breaker test data to obtain the fluctuation trend average coefficient; The normalized value of the product of the fluctuation trend dispersion degree and the fluctuation trend average coefficient is used as the abnormality degree at the time to be measured.

9. An active testing method for a circuit breaker according to claim 1, characterized in that: The method of performing a fault test on the circuit breaker according to the abnormality degree at all times to obtain a test result includes: The moment when the value of the abnormality level is greater than a preset abnormality threshold is taken as the target moment; The ratio of the number at the target time to the number at all times is calculated to obtain the degree of failure, and the degree of failure is used as the test result.

10. An active testing system for a circuit breaker, the system comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that: When the processor executes the computer program, the steps of an active testing method for a circuit breaker as claimed in any one of claims 1 to 9 are implemented.

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