Surgical system haptic feedback system

Abstract

Systems and methods for controlling a surgical system are provided. Haptic feedback is provided to an input device of a surgical system. A moment at a reference location of a distal portion of an instrument of a surgical system is determined. Deflection of the reference position is then determined based on the torque. In a first condition in which the deflection is greater than the deflection threshold, an indication is provided to an operator of the input device that a constraint of haptic feedback is provided or available to be provided to the input device.

Description

[0001] CROSS-REFERENCE TO RELATED APPLICATIONS

[0002] This application claims priority and filing date benefit of U.S. Provisional Patent Application No. 63 / 415,487, filed on October 12, 2022, entitled “Surgical System Haptic Feedback Systems and Methods,” the disclosure of which is incorporated herein by reference in its entirety. Technical Field

[0003] Embodiments described herein relate to surgical systems, and more particularly, to teleoperated surgical systems that operate at least in part with computer assistance. More particularly, embodiments described herein relate to systems and methods for determining deflection of a medical device for controlling a surgical system that includes force feedback provided to a human system operator. Background Art

[0004] Known techniques for minimally invasive surgery (MIS) employ instruments that can be controlled manually or via a mechanically grounded remotely operated medical system ("telesurgical system") that is handheld or operated at least partially with computer assistance to manipulate tissue. Many known MIS instruments include a therapeutic or diagnostic end effector (e.g., forceps, cutting tools, or cauterization tools) mounted on an optional wrist mechanism at the distal end of a shaft. During a MIS procedure, the end effector, wrist mechanism, and distal end of the shaft are typically inserted into a small incision or natural orifice in a patient to position the end effector at a working site within the patient's body. The optional wrist mechanism can be used to change the position and orientation of the end effector relative to the shaft to perform a desired procedure at the working site. In known instruments, the movement of the instrument as a whole provides the mechanical degrees of freedom (DOF) for movement of the end effector, and the wrist mechanism typically provides the desired DOF for movement of the end effector relative to the shaft of the instrument. For example, for forceps or other grasping tools, known wrist mechanisms are capable of changing the pitch and yaw of the end effector relative to the shaft. The wrist may optionally provide a roll DOF for the end effector, or the roll DOF may be implemented by rolling the axis. The end effector may optionally have additional mechanical DOF, such as gripping or blade motion. In some cases, the wrist and end effector mechanical DOF may be combined. For example, U.S. Patent No. 5,792,135 (filed May 16, 1997) discloses a mechanism in which the wrist and end effector grip DOF are combined.

[0005] Force sensing surgical instruments are known and, together with associated telesurgery systems, deliver tactile feedback to a surgeon performing an MIS procedure. Tactile feedback can increase the immersion, realism, and intuitiveness of the procedure for the surgeon. For effective tactile rendering and accuracy, a force sensor can be placed on the medical instrument and as close as possible to the interaction of anatomical tissue. One approach is to include a force sensor unit having an electrical sensor element (e.g., a strain sensor or strain gauge) at the distal end of the medical instrument shaft to measure the strain applied to the medical instrument. The measured strain can be used to determine the force applied to the medical instrument, and as an input, a desired tactile feedback can be generated based on the input.

[0006] Figure 1A An example of a known force sensor unit is shown, which includes a cantilever beam 810 attached between an instrument distal tip component 510 (e.g., in some cases, a U-clip or other wrist or end effector component) and an instrument shaft 410 extending back into the mechanical structure. As illustrated, a strain sensor 830 is coupled to the beam to measure strain in the X and Y directions (arbitrary Cartesian directions that are orthogonal to each other and to the longitudinal axis of the beam and the instrument shaft) as shown. For example, the strain sensor may optionally include a full Wheatstone bridge (full bridge). In some cases, in order to suppress common modes such as temperature, the strain sensors are each divided into two groups, one at the distal end of the beam and the other at the proximal end of the beam. Because the beam is fixed to the distal portion of the instrument shaft, the strain sensor senses strain on the beam that is orthogonal to the longitudinal axis AA of the shaft. The force component F applied orthogonal to the beam A ( Figure 1B ) (i.e., a force in the XY plane, such as an X or Y force) is determined by subtracting the strain measurements determined by the full bridge at the proximal and distal portions of that side of the beam.

[0007] However, during employment of a medical device, certain operating conditions may be encountered under which the output of the force sensor unit may inaccurately indicate the force applied to the medical device. The operating conditions may correspond, for example, to the positioning of the medical device, the operation being performed by the medical device, and / or a fault condition. The inaccuracies that may be encountered may limit the ability of the telesurgery system to deliver accurate tactile feedback to the surgeon performing the procedure.

[0008] For example, in certain orientations, the strain indicated by the strain sensor may be less than the strain in response to the applied force F affecting the distal tip member 510 when the distal tip member 510 is not in those orientations. AThe strain applied to the medical device. More specifically, some known force sensing medical devices may include or be used with a substantially rigid structure 901 that at least partially surrounds the beam 810 and, when in contact, either stops further deflection of the beam 810 or effectively changes the stiffness and resulting deflection characteristics of the beam 810. For example, some known force sensing medical devices may include a protective structure (e.g., a shield) that covers the strain sensor 830 and its associated wires during use. In other words, structure 901 is a structure that does not deflect to the same extent as beam 810. In order to ensure that beam 810 remains cantilevered for accurate force sensing, structure 901 may not be directly coupled to distal tip assembly 510. Instead, structure 901 may be separate from the distal tip assembly to allow the beam to deflect when subjected to an applied force F. A deflection (see Figure 1B ). However, in some cases, the distal end of structure 901 may contact the beam (or a portion of the medical device surrounding the beam) or the distal tip component, thereby limiting the deflection of the beam. Figure 1B An example is shown in which beam 810 deflects in the X direction such that it contacts one side of the distal end of structure 901 (e.g., a shield), which limits or prevents further bending of beam 810 in the X direction, with the amount of bending being limited or prevented depending on the stiffness of structure 901 and the relative stiffness between structure 901 and beam 810.

[0009] While limiting the displacement of the beam can advantageously prevent overloading of the beam 810 and / or the strain sensor 830, we have discovered that such known systems that join the beam at a single point can result in a change in the strain distribution over the length of the beam 810. In other words, the beam 810 no longer acts as a cantilever beam anchored at only one end. The contact point between the structure 901 and the beam 810 acts as a fulcrum about which the beam 810 bends. As a result, the strain sensor 830 generates a strain that does not accurately represent the applied force F. A Specifically, we have found that, in some cases, contact between the distal end of structure 901 and beam 810 can cause distortion of the signal generated by strain sensor 830. In some cases, the distortion can cause the force sensed by strain sensor 830 to be inconsistent with the applied force F. A in the opposite direction of the force (this phenomenon may be referred to as “force reversal” because the human operator's tactile sensation of force direction based on erroneous strain sensor signals will be reversed from the correct force direction).

[0010] Figure 2A and Figure 2B yes Figure 1A and Figure 1B An example of a known rigid body mechanics diagram of a force sensing medical device is provided to further illustrate this example of force distortion and reversal. Figure 2AAs shown, the contact between the shield and the beam can be modeled as a single point contact (at GND2). Figure 2A , distance L represents the distance from the base of beam 810 (point GND 1) to the point where the shield (e.g., substantially rigid structure 901) contacts beam 810 (point GND 2). Distance D represents the point where the shield contacts beam 810 (point GND 2) and the applied force F. A The distance between locations where application is made to or by the distal tip component 510 .

[0011] Figure 2B is a rigid body mechanics diagram of the beam showing the exaggerated deflection of the beam due to contact at point GND 2. As shown, we have discovered that the strain distribution along the top surface of the beam transitions from a proximal compression region to a more distal tension region, which causes the signal from the strain sensor 830 to inaccurately represent the applied force F A .

[0012] Figure 2C Shown are the modeled forces if the beam is "cut" at point GND 2 for the purpose of analyzing the forces and pure moments of the beam. Figure 2C The reaction force F generated by a single point contact according to rigid body mechanics is shown as R , (such as can be Figure 1B The combined force F (indicated by the strain sensor 830) and the pure moment (M) generated by the opposing force vector of equal magnitude (e.g., a couple). By modeling the beam at the contact point (at GND 2), the additional deflection (i.e., beyond this contact point away from the axis) can be considered to be zero. Using the static and deflection equations, it is shown that there are two different strain curves over the entire length of the beam. For beam lengths l between 0 and L, the strain curve (ε) on the top side of the beam is given by equation (1), where E is the elastic modulus of the beam, I is the moment of inertia of the XY cross-section of the beam, and r is the perpendicular distance of the strain gauge from the neutral axis of the beam:

[0013] Equation (1) For beam lengths l between L and L+D, the strain curve (ε) on the top side of the beam is given by equation (2):

[0014] Equation (2)

[0015] Thus, at certain locations along beam 810, strain sensor 830 produces an indication of force F and not necessarily an indication of the applied force F. A The signal associated with the force F includes the signal related to the applied force F A and reaction force F R This results in the determined force being relative to the actual applied force F acting on the beam.A distortion (and even reversal of force direction).

[0016] Figure 3A is a graph showing the strain along the top of beam 810 along the length of the beam based on equation (1) and equation (2) for the condition when beam 810 substantially contacts structure 901 at a single contact point (GND 2). To further illustrate force distortion, Figure 3B is a graph showing measured force (e.g., determined force based on a strain signal) as a function of actual force applied. As shown, when beam 810 is not in contact with a shield (e.g., substantially rigid structure 901), e.g., when the actual force applied does not cause sufficient bending of beam 810 to cause displacement of beam 810 to be affected by the shield, the relationship between the measured force (e.g., force measurement derived from the strain gauge) and the applied force (e.g., actual force component in the XY plane) is linear, which allows for accurate calibration (i.e., based on the slope of the line). However, under conditions where beam 810 is in contact with the shield (e.g., substantially rigid structure 901), the relationship between the measured force (e.g., force measurement derived from the strain gauge) and the applied force (e.g., actual force component in the XY plane) is linear. Figure 1B Shown and Figure 2B As illustrated), the measured force decreases as the actual force increases. It should be understood that force distortion is not limited to sensors using strain gauges, and any force sensor technology implemented on a cantilever beam architecture can experience force distortion.

[0017] When the measured force is used to generate tactile feedback to a person operating an instrument including a beam (e.g., tactile feedback at an input device used by the person to control the instrument), this measured force distortion / force reversal problem can result in an undesirable positive feedback loop, which can result in unexpected or undesired movement at the input device. This discovery is more fully described in U.S. Patent Publication No. US 2021 / 0353373 (filed May 17, 2021), entitled “Hard Stop that Produces a Reactive Moment Upon Engagement for Cantilever-Based Force Sensing,” which is incorporated herein by reference in its entirety for all purposes.

[0018] In view of this situation, the art is continually seeking new and improved systems and methods for controlling surgical systems. Summary of the invention

[0019] This summary introduces certain aspects of the embodiments described herein to provide a basic understanding. This summary is not an extensive overview of the inventive subject matter.

[0020] The present disclosure includes systems and methods for facilitating providing tactile feedback to an input unit of a surgical system under constrained feedback and unconstrained feedback conditions. Thus, the systems and methods disclosed herein can be employed to determine whether a deflection of a portion of a medical device of a surgical system is sufficient to necessitate the implementation of a constrained feedback condition. The magnitude of the deflection is determined based on a determined moment at a reference position.

[0021] In one aspect, the present disclosure relates to a method for controlling a surgical system. The surgical system includes a controller, an input device, and a medical device. The medical device is operably connected to the input device via the controller. The controller converts an operator's input to the input device into movement and / or operation of the medical device. The method includes providing tactile feedback to the input device via the controller. The tactile feedback provides a kinesthetic input representing the force encountered by the medical device to an operator of the system (e.g., a surgeon). The controller also determines a moment at a reference position of a distal portion of the instrument. A deflection of the reference position is then determined based on the moment. Under the condition that the determined deflection is greater than a deflection threshold, the controller provides an indication of a restriction of tactile feedback to or can be provided to the input device to the operator of the input device. The constraints of the tactile feedback may include limited, filtered, modified, and / or modeled feedback provided to the input device automatically or in response to a user selection.

[0022] In some embodiments, the reference position is located at a longitudinal location along the medical device that is coplanar with a hard stop location that limits deflection of the reference position.

[0023] In some embodiments, the medical device includes an end effector coupled to a distal portion of the device and a force sensor unit. The force sensor unit includes a beam and one or more strain sensors coupled to the beam. The torque is determined based on the output of the strain sensor(s).

[0024] In some embodiments, the strain sensor(s) include a first bridge circuit and a second bridge circuit. The first bridge circuit includes a first strain gauge resistor and a second strain gauge resistor. The second bridge circuit includes a third strain gauge resistor and a fourth strain gauge resistor. The torque is determined based on an output voltage of the first bridge circuit and an output voltage of the second bridge circuit.

[0025] In some embodiments, the controller determines an estimated applied force on the medical device based on the moment and the determined force. The controller then performs an operation of the surgical system based on the estimated applied force.

[0026] For example, in some embodiments, the magnitude of the tactile feedback delivered to the operator of the input device is based on the estimated applied force.As an additional example, in some embodiments, if the estimated applied force exceeds a threshold, the controller interrupts the operation of the surgical system.

[0027] In some embodiments, a surgical system includes an input device, a controller, and a medical instrument supported by a manipulator unit. The medical instrument is operably coupled to the input device. The controller is operably coupled to the manipulator unit and the input device. The controller includes at least one processor and a tactile feedback module configured to perform a plurality of operations. The operations include providing tactile feedback to the input device; determining a moment at a reference position of a distal portion of the instrument; and determining a deflection of the reference position based on the moment. Under a first condition that the deflection is greater than a deflection threshold, a constraint to provide tactile feedback to an operator of the input device is provided or can be used to provide an indication to the input device.

[0028] In some embodiments, the reference position is located at a longitudinal location along the medical device that is coplanar with a hard stop location that limits deflection of the reference position.

[0029] In some embodiments, the medical device includes an end effector coupled to a distal portion of the device and a force sensor unit. The force sensor unit includes a beam and one or more strain sensors coupled to the beam. A torque (e.g., a force couple) is determined based on the output of the strain sensor(s).

[0030] In some embodiments, the plurality of operations optionally include any of the methods or operations disclosed herein. In addition, the medical device optionally includes any of the structures or combinations of structures disclosed herein.

[0031] These and other features, aspects and advantages of the present invention will become better understood with reference to the following description and accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0032] Figure 1A and Figure 1B is in the first configuration ( Figure 1A ) and the second configuration ( Figure 1B ) is an illustration of a portion of a known medical device including a force sensor unit.

[0033] Figure 2A and Figure 2B yes Figure 1A and Figure 1B Shown in a first configuration ( Figure 2A ) and shows exaggerated beam displacement ( Figure 2B ) is a rigid body mechanics diagram of a portion of a medical device.

[0034] Figure 2C The analysis is performed at the contact point Figure 1A and Figure 1B Rigid body mechanics diagram of a portion of the medical device shown.

[0035] Figure 3Ais a graph showing the surface strain along the length of the beam of the force sensor unit when single point contact occurs.

[0036] Figure 3B is a graph showing the determined force (Y-axis) as a function of the actual force (X-axis) to demonstrate the determined force distortion.

[0037] Figure 4 is a diagrammatic plan view of a minimally invasive teleoperated medical system for performing a medical procedure, such as surgery, according to one embodiment.

[0038] Figure 5 yes Figure 4 An illustrated plan view of a minimally invasive, teleoperated medical system for performing medical procedures such as surgery.

[0039] Figure 6 According to an embodiment Figure 5 A front perspective view of a user console for a minimally invasive teleoperated surgical system is shown.

[0040] Figure 7 yes Figure 6 A perspective view of the input devices of a user console is shown.

[0041] Figure 8 Description by Figure 6 The user console shown presents a display view of the surgical site to an operator of the minimally invasive teleoperated surgical system.

[0042] Fig. 9 yes Figure 5 A front perspective view of an optional auxiliary unit of a minimally invasive teleoperated surgical system is shown.

[0043] Fig. 10A yes Figure 5 A side elevation view of a manipulator unit including a plurality of manipulators and instruments of a minimally invasive teleoperated surgical system is shown.

[0044] Fig. 10B Is Fig. 10A Illustration of a medical device supported by a manipulator unit is shown.

[0045] Fig.11A is a diagrammatic illustration of a portion of a medical device positioned within a cannula and including a force sensor unit.

[0046] Fig. 11B is an illustration of a portion of a medical device including a force sensor unit in a neutral orientation.

[0047] Fig.12 It is composed of area K 1 Indicated Fig. 11B An enlarged view of a portion of a medical device.

[0048] Fig.13 is a force sensor unit comprising a force sensor unit in a deflection orientation Fig. 11B A graphical illustration of a part of a medical device.

[0049] Fig.14 It is by Fig.13 Area K in 1 Indicates the deflection orientation Fig.13 An enlarged view of a portion of a medical device.

[0050] Fig.15 is a graph showing the beam deflection under the condition that the beam deflection is less than the deflection threshold and the beam deflection under the condition that the beam deflection is greater than the deflection threshold. Fig. 11B A graph of the force determined during operation of a medical device (Y-axis) as a function of the actual force (X-axis).

[0051] Fig.16 yes Fig. 11B A rigid body mechanics diagram of a medical device is shown, illustrating the applied forces at the end effector.

[0052] Fig.17 yes Fig. 11B The rigid body mechanics diagram of the medical device shown in FIG. Fig.16 The applied force in is resolved into the applied force and the resulting moment at a reference position.

[0053] Fig.18 Figure 11- Fig.14 A diagrammatic illustration of one configuration of strain gauge resistors for a force sensor unit is shown.

[0054] Fig.19 Figure 11- Fig.14 A diagrammatic illustration of one configuration of a force sensor unit is shown, showing two half-bridge circuits formed by strain gauge resistors.

[0055] Fig. 20 is a perspective view of a medical device assembly according to one embodiment.

[0056] Fig.21 According to an embodiment Fig. 20 A side view of a medical device assembly showing exposed selected device portions.

[0057] Fig. 22 yes Fig.21 A side view of one configuration of a force sensor unit is shown.

[0058] Fig.23 yes Fig. 22 An electrical schematic illustration of one configuration of a force sensor unit is shown.

[0059] Fig.24A Is Fig. 22 Area K in 2 Indicated Fig. 22 An enlarged illustration of the proximal portion of the force sensor unit is shown.

[0060] Fig. 24B Is Fig. 22 Area K in 3 Indicated Fig. 22 An enlarged illustration of the distal portion of the force sensor unit is shown.

[0061] Fig.25 yes Fig. 22 An enlarged illustration of a portion of a force sensor unit is shown illustrating an alternative arrangement of strain gauge resistors.

[0062] Fig.26 yes Fig. 22 An enlarged illustration of a portion of a force sensor unit is shown illustrating an alternative arrangement of strain gauge resistors.

[0063] Fig. 27 is a diagrammatic illustration of a controller for use with a minimally invasive teleoperated surgical system, according to one embodiment.

[0064] Fig.28 is a flow chart of a method for controlling a surgical system according to one embodiment. DETAILED DESCRIPTION

[0065] Reference will now be made in detail to embodiments of the present invention, one or more examples of which are illustrated in the accompanying drawings. Each example is provided by way of explaining the present invention rather than limiting the present invention. In fact, it will be apparent to those skilled in the art that various modifications and variations may be made in the present invention without departing from the scope or spirit of the present invention. For example, a feature illustrated or described as a part of an embodiment may be used together with another embodiment to produce a further embodiment. Thus, the present invention is intended to cover such modifications and variations as fall within the scope of the appended claims and their equivalents.

[0066] The embodiments described herein can be advantageously used for various operations associated with minimally invasive surgery, including grasping, cutting, and otherwise manipulating tissue. The medical device or apparatus of the present application enables movement with three or more degrees of freedom (DOF). For example, in some embodiments, the end effector of the medical device can move with three mechanical DOFs relative to the body of the instrument, such as pitch, yaw, and roll (axis roll). There can also be one or more mechanical DOFs in the end effector itself, such as two jaws, each jaw rotates relative to the U-shaped clamp (2 DOFs), and the U-shaped clamp can optionally rotate relative to the more proximal U-shaped clamp (one DOF) or relative to other mechanical references. Thus, in some embodiments, the medical device or apparatus of the present application can enable movement with six or more DOFs (including all six Cartesian DOFs). Further, the embodiments described herein are used to transmit modified force feedback to the system operator in response to the force applied to (or applied by) the distal portion of the instrument during use under certain operating conditions.

[0067] It will be appreciated by those skilled in the art that during surgery, various forces will be applied to the distal end of the surgical instrument. In some cases, the applied force may act directly on the instrument, in some cases, the applied force may be a reaction force caused by the instrument acting on another object, and in some cases, the applied force may be a combination of a direct force and a reaction force. The weight of the retracted tissue and another instrument that strikes the instrument are examples of forces acting directly on the instrument. Alternatively, the force applied by elastic or hard tissue or when tightening the suture is an example of a reaction force acting on the instrument when the instrument moves against these objects. In this specification, any of the direct force, reaction force, or combined direct force and reaction force is referred to as the applied force on the instrument. When a manually operated instrument is used, the clinician experiences this applied force as a direct sense of touch through the instrument. But when a motor-driven instrument is used, this applied force is isolated from the human clinical operator, and therefore the applied force is detected, measured, and fed back to the clinical operator via a tactile force feedback system.

[0068] In general, the present disclosure relates to systems and methods for controlling surgical systems, such as minimally invasive teleoperated surgical systems. In particular, the present disclosure may include systems and methods that may facilitate constrained feedback conditions regarding the surgical system to modify tactile feedback delivered to an operator of the surgical system. The constrained feedback conditions may correspond to conditions of the surgical system in which tactile feedback generated based on determined forces may not accurately reflect the forces acting on the instrument. For example, the constrained feedback conditions may correspond to a portion of the operating range of the medical device in which the forces measured by the surgical system deviate from the actual forces applied to (or by) the distal end of the medical device.

[0069] For example, a constrained feedback condition may correspond to an operating condition of a surgical system in which a deflection of one structure of an instrument causes a portion of the instrument to contact another structure of the instrument (e.g., a hard stop position that limits further deflection of the structure). Under such operating conditions, the limiting structure applies a reaction force on the deflected portion of the instrument. The reaction force is opposite to the applied force that generates the deflection. Therefore, the indication of the force received from the instrument may not accurately reflect the applied force. Therefore, it is desirable to detect when the deflected portion of the instrument contacts the deflection limiting structure because the measured value of the applied force may not correspond to the actual magnitude of the applied force. As described herein, the magnitude of the torque (and force) of the end effector of the instrument provides an indication of contact between a portion of the instrument and a more rigid structure. The systems and methods disclosed herein facilitate detecting such operating conditions and generating corresponding modifications to the tactile feedback delivered to the operator of the surgical system.

[0070] To determine the magnitude of the moment (and force), and thus the deflection of the instrument, a measured output voltage (e.g., a voltage difference) is received from the first half-bridge circuit, and a measured output voltage (e.g., a voltage difference) is received from the second half-bridge circuit. This pair of output voltages can be used with Equation 12 and Equation 13 to solve two equations for two unknowns, namely the measured force and pure moment (e.g., a couple) at a reference position. Based on the resultant values ​​of the measured force and pure moment, the deflection can be determined using Equation 5. Since the gap between the various parts of the medical device is known, a deflection greater than the gap determined using Equation 5 indicates contact between a portion of the instrument and another structure of the instrument (e.g., a hard stop position that limits further deflection of the structure).

[0071] As disclosed herein, when the orientation, condition, and / or operation of a medical device of a surgical system is in a constrained feedback condition, force feedback (e.g., tactile, visual, or auditory feedback) delivered to an operator of the surgical system can be reduced / limited relative to the designed tactile feedback. The reduction / limitation (e.g., disabling) of tactile feedback facilitates continuous, accurate control of the surgical system by the operator under conditions where feedback may otherwise be inaccurate and / or unreliable.

[0072] In addition to affecting the tactile feedback provided to the operator of the surgical system, the systems and methods disclosed herein can also pause (e.g., hold in place) the operation of the surgical system when it is at or near a transition between a constrained feedback condition and an unconstrained feedback condition (e.g., a designed feedback type, amplitude, and / or direction under given conditions of the instrument). In an optional embodiment, an indication of the transition is presented to the operator. After the operator confirms the indication, the operation of the surgical system is resumed and appropriate tactile feedback is provided to the operator. For example, when transitioning from an unconstrained feedback condition to a constrained feedback condition, upon confirmation, the tactile feedback delivered to the operator can be reduced or disabled. Similarly, when transitioning from a constrained feedback condition to an unconstrained feedback condition, upon confirmation, the designed tactile feedback can be delivered to the operator. It should be understood that pausing the operation of the surgical system until confirmation of the modification of the tactile feedback is received can facilitate the transition between feedback conditions and thus facilitate accurate control of the surgical system.

[0073] As used herein, when used in conjunction with a reference number, the term "about" means the reference number plus or minus 10% of the reference number. For example, the language "about 50" covers a range of 45 to 55. Similarly, the language "about 5" covers a range of 4.5 to 5.5.

[0074] As used in this specification and the appended claims, the word "distal" refers to a direction toward a working site, and the word "proximal" refers to a direction away from a working site. Thus, for example, the end of the tool closest to the target tissue is the distal end of the tool, and the end opposite the distal end (i.e., the end manipulated by the user or coupled to the actuation shaft) is the proximal end of the tool.

[0075] Further, the specific words selected for describing one or more embodiments and optional elements or features are not intended to limit the present invention. For example, spatial relative terms, such as "below", "below", "lower", "above", "upper", "near side", "distal side", etc., can be used to describe the relationship between an element or feature and another element or feature, as illustrated in the figure. In addition to the position and orientation shown in the figure, these spatial relative terms are intended to cover the different positions (i.e., translation placement) and orientations (i.e., rotation placement) of the device in use or operation. For example, if the device in the figure is flipped, the element described as "below" or "below" other elements or features will be "above" or "above" other elements or features. Thus, the term "below" can cover the position and orientation of the top and bottom. The device can be oriented in other ways (e.g., rotated 90 degrees or in other orientations), and the spatial relative descriptors used herein are interpreted accordingly. Similarly, the description of the movement along each axis (translation) and around it (rotation) includes various spatial device positions and orientations. The combination of the position and orientation of the body defines the posture of the body.

[0076] Similarly, unless the context indicates otherwise, geometric terms, such as "parallel," "perpendicular," "circular," or "quadratic," are not intended to require absolute mathematical precision. Rather, such geometric terms allow for variations due to manufacturing or equivalent functions. For example, if an element is described as "circular" or "substantially circular," components that are not exactly circular (e.g., components that are slightly elliptical or multi-sided polygons) are still encompassed by this description.

[0077] In addition, unless the context indicates otherwise, the singular forms "a", "an", and "the" are intended to include the plural forms as well. The terms "comprising", "including", "having", etc. specify the presence of stated features, steps, operations, elements, components, etc., but do not exclude the presence or addition of one or more other features, steps, operations, elements, components, or groups.

[0078] Aspects of the present invention use da The surgical system (commercialized by Intuitive Surgical, Sunnyvale, California) is described as an example surgical system form. Those skilled in the art will appreciate that the inventive aspects disclosed herein may be embodied and implemented in a variety of ways, including computer-assisted, non-computer-assisted, and hybrid combinations of manual and computer-assisted embodiments and implementations. Implementation on a surgical system should not be viewed as limiting the scope of the inventive aspects disclosed herein.Where applicable, inventive aspects may be embodied and implemented in both relatively small, handheld, manually operated devices and relatively larger systems with additional mechanical support.

[0079] Figure 4 and Figure 5Is a planar illustration of a remotely operated surgical system 1000 (“remote surgical system”) that operates at least in part with computer assistance. The remote surgical system 1000 and its components are considered medical devices. The remote surgical system 1000 is a minimally invasive robotic surgery (MIRS) system for performing minimally invasive diagnostic or surgical procedures on a patient (P) lying on an operating table 1010. The system consists of various optional components (such as a user control unit 1100 used by a surgeon or other skilled clinician (S) (e.g., the operator of the surgical system) during the procedure). The remote surgical system 1000 further includes a manipulator unit 1200 (commonly referred to as a surgical robot) and an optional auxiliary equipment unit 1150. The manipulator unit 1200 includes an arm assembly 1300 and an instrument (e.g., a surgical instrument tool assembly) optionally removably coupled to the arm assembly. The manipulator unit 1200 can manipulate at least one removably coupled instrument 1400 through a minimally invasive incision in the patient's (P) body or natural orifice while the surgeon (S) observes the surgical site and controls the movement of the instrument 1400 through the control unit 1100 with the assistance of the controller 1800. Further details of the controller 1800 are described below with reference to Fig. 27 Images of the surgical site are obtained by an endoscope (such as a stereoscopic endoscope), which can be manipulated by the manipulator unit 1200 to orient the endoscope. The auxiliary equipment unit 1150 can be used to process the images of the surgical site for subsequent display to the surgeon (S) via the display system 1110 of the user control unit 1100. The number of single-use instruments 1400 will typically depend on factors such as the diagnostic or surgical procedure and space constraints in the operating room. If one or more of the instruments 1400 being used need to be changed during the procedure, the assistant removes the instrument 1400 from the manipulator unit 1200 and replaces it with another instrument 1400 from a tray 1020 in the operating room. Although shown for use with the instrument 1400, any of the instruments described herein can be used with the remote surgical system 1000. It should be understood that the surgical site is either at the skin surface or within at least a portion of the patient's (P) body.

[0080] The user control unit 1100 is shown in Figure 4 and Figure 5 to be in the same room as the patient (P) so that the surgeon (S) can directly monitor the procedure, be present in person if necessary, and talk directly to the assistant rather than through a telephone or other communication medium. However, in other embodiments, the user control unit 1100 and the surgeon (S) can be in different rooms, completely different buildings, or other locations remote from the patient (P), thus allowing for a remote surgical procedure.

[0081] Figure 61 is a perspective view of the control unit 1100. The user control unit 1100 includes one or more input control devices 1116 configured to be held by the surgeon (S), which in turn enables the manipulator unit 1200 to manipulate one or more instruments (e.g., tools, medical devices, and / or surgical instruments). The input control devices 1116 provide at least the same degrees of freedom as the instruments 1400 to which they are associated to provide the surgeon (S) with telepresence, or the perception that the input control devices 1116 are integral with the instruments 1400. In this manner, the user control unit 1100 provides the surgeon (S) with a strong sense of directly controlling the instruments 1400. To this end, the perception (e.g., tactile feedback) of position, force, strain, or tactile feedback sensors (not shown), or any combination of such perceptions, is transmitted from the instruments 1400 back to the surgeon (S) via the one or more input control devices 1116.

[0082] Figure 7 is a perspective view of an input control device 1116 configured to be held by at least a portion of a surgeon's (S) hand, according to one embodiment. In such a configuration, the links are interconnected in a gimbaled arrangement such that the input control device 1116 includes a first link 1118 (which functions as a first gimbaled link), a second link 1120 (which functions as a second gimbaled link), a third link 1122 (which functions as a third gimbaled link), and an input handle 1124. The input control device 1116 is mounted to a base portion 1126, which is a distal portion of a kinematic arm, which itself is part of a user control unit (such as the user control unit 1100 described herein). Although an individual mechanically grounded hand input control device is shown for purposes of illustration, other alternative gimbaled and non-gimbaled configurations, as well as mechanically grounded and ungrounded configurations, are known and may be used in accordance with the inventive aspects described herein.

[0083] As shown, the input handle 1124 includes a handle portion 1128, an optional first grip bar input 1130, an optional second grip bar input 1132, and a handle input shaft 1134. In one embodiment, the major axis of the handle input shaft 1134 defines a first rotation axis A. 1 (which is used as the roll axis in this specification; the term roll is arbitrary) and is rotatably coupled to the first link 1118. The handle portion 1128 is supported on a handle input shaft 1134 and is configured to rotate about a first axis of rotation A 1The first and second handle inputs 1130 and 1132 can be manipulated to produce a desired action at an instrument end effector (not shown) operably connected to the input device 1116 and its handle 1124. For example, in some embodiments, the first grip rod input 1130 and the second grip rod input 1132 can be squeezed together to produce a gripping movement at the end effector. The first grip rod input 1130 and the second grip rod input 1132 are similar to the gripping members shown and described in U.S. Patent Application Publication No. US2020 / 0015917 A1 (filed on June 14, 2019) entitled "Actuated Grips for Controller", which is incorporated herein by reference in its entirety for all purposes. However, in other embodiments, the input handle 1124 need not include a grip bar input, or the grip bar input is illustrative of other alternative manually-operated control inputs (e.g., buttons, levers, switches, wheels) that may be used in other configurations.

[0084] like Figure 6 As depicted, in one embodiment, at least one of the user control units 1100 can be configured to be engaged via a portion of at least one foot of the surgeon (S). In such a configuration, the user control unit 1100 can include at least one pedal assembly 1136 and / or at least one foot-activated switch assembly 1138. Each pedal assembly 1136 and / or foot-activated switch assembly 1138 can include at least one switch (not shown) activated by the respective assembly. The surgical system 1000 can detect that one or more electrosurgical tools are mounted to the manipulator unit 1200 and can assign appropriate control functions to the pedal assembly 1136 and / or the foot-activated switch assembly 1138.

[0085] In some embodiments, the user control unit 1100 includes one or more optional touch pads 1140 configured to receive input from the surgeon (S). The touch pad(s) 1140 may be, for example, a liquid crystal display (LCD) screen. Figure 6 As depicted, the touchpad(s) 1140 may be mounted in the armrest or at another suitable location of the user control unit 1100. The surgeon (S) may utilize the touchpad(s) 1140 to access various operations, protocols, and / or settings of the surgical system 1000, such as user accounts, ergonomic settings, preferences, equipment configurations, operational status commands, and / or other similar processes as described herein. In addition, the human clinical operator may use the touchpad(s) 1140 to acknowledge various system messages, warnings, and / or alarms as described herein.

[0086] like Figure 6 As further depicted, the user control unit 1100 includes a display system 1110. In other user control unit examples, the display is separate from the console structure and can be mounted, for example, on a wall or other supporting structure. Figure 8 As depicted, display system 1110 defines a field of view 1142 for an operator (S). In some embodiments, display system 1110 is stereoscopic and includes a left eye display 1112 and a right eye display 1114 for presenting to the surgeon (S) a coordinated stereoscopic view of the surgical site that enables depth perception. In other embodiments, a monoscopic display may be used. Various other stereoscopic and monoscopic display systems are known and are contemplated as being within the scope of the various inventive aspects described herein. True three-dimensional displays are contemplated. Such stereoscopic and monoscopic display systems may be mechanically grounded as shown, or they may be mechanically ungrounded and embodied in a device such as a head mounted display. Although in Figure 8 Not shown, but well understood, display system 1110 can optionally display various messages to the operator including information as described herein (eg, information regarding the status of the haptic feedback system).

[0087] Fig. 9 is a perspective view of the auxiliary equipment unit 1150. In some embodiments, the auxiliary equipment unit 1150 is coupled to the endoscope and includes one or more processors to process the captured images for subsequent display, such as via a display system 1110 of the user control unit 1100, or on another suitable display located locally (e.g., on the unit 1150 itself, on a wall-mounted display as shown) and / or remotely. For example, if a stereoscopic endoscope is used, the auxiliary equipment unit 1150 processes the captured images to present a coordinated stereoscopic image of the surgical site to the surgeon (S) via a left eye display 1112 and a right eye display 1114. Such coordination optionally includes alignment between relative images and optionally includes adjusting the stereo working distance of the stereoscopic endoscope. As another example, the image processing may include compensating for imaging errors of the image capture device, such as optical aberrations, using previously determined camera calibration parameters.

[0088] Fig. 10A1 is a side view of the manipulator unit 1200. The manipulator unit 1200 includes components (e.g., arms, linkages, motors, sensors, etc.) that provide for manipulating the instrument 1400 and an imaging device (e.g., an endoscope) for capturing images of the site of the procedure. Specifically, the instrument 1400 and the imaging device can be manipulated by a remote operating mechanism having one or more mechanical joints. In addition, the instrument 1400 and the imaging device are positioned and manipulated through an incision or natural orifice in the patient (P) in a manner such that a center of motion that is remote from the manipulator and typically located at a position along the axis of the instrument is maintained at the incision or orifice by either kinematic mechanical or software constraints. In this way, the size of the incision can be minimized and tissue damage can be minimized at the incision.

[0089] Fig. 10B 1 is a diagrammatic illustration of a cannula structure 1600 and an instrument 1400 supported by an arm assembly 1300. As depicted, the arm assembly 1300 includes an instrument bracket 1330. The instrument bracket 1330 includes a remotely operated actuator (not shown) to provide controller motion to the instrument 1400, which is converted into various movements of one or more tools at the end effector 1460 of the instrument 1400. The instrument bracket 1330 can also translate relative to the arm assembly 1300, for example, along an insertion axis extending between the proximal and distal ends of the arm assembly 1300, for inserting and removing the instrument from the patient's body. The translation of the instrument bracket 1330 develops a corresponding linear motion relative to the longitudinal axis of the end effector 1460 (e.g., in the distal or proximal direction). As depicted, the arm assembly 1300 has a mechanical ground connection GND 3 through the manipulator unit 1200. In some embodiments, the cannula structure 1600 is removably coupled to the arm assembly 1300. In other words, cannula structure 1600 can be rigidly coupled to arm assembly 1300. Cannula 1600 is configured to surround at least a portion of instrument 1400 to facilitate entry of end effector 1460 into a surgical site.

[0090] Fig.11A is an illustration of a portion of instrument 2400 positioned within cannula 2600 according to one embodiment. Fig. 11B is a schematic illustration of a distal portion of a surgical instrument 2400 according to one embodiment, and Fig.12 It is composed of area K 1 Indicated Fig. 11B2600 . As depicted, the instrument 2400 extends through the sleeve structure 2600, and a portion of the surgical instrument 2400 is surrounded by the sleeve 2600. The sleeve structure 2600 has a proximal end 2620 and a distal end 2640. The sleeve structure 2600 has a central channel 2660 extending between the proximal end 2620 and the distal end 2640, through which the surgical instrument 2400 is inserted during the medical procedure. The sleeve structure 2600 can be a straight sleeve as shown. In additional embodiments, the sleeve structure 2600 can optionally be a curved sleeve with a combination of linear and non-linear sections, a sleeve with multiple non-parallel linear sections, a sleeve with multiple curved sections with different characteristics, and / or a sleeve with other combinations of linear and non-linear sections. The sleeve structure 2600 has a mechanical ground connection GND 4 through an arm assembly (e.g., arm assembly 1300) of the surgical system.

[0091] The surgical instrument 2400 includes a shaft 2410 and a force sensor unit 2800 (e.g., a force sensor assembly) that includes an elastically deflectable beam 2810 and one or more strain sensors 2830 mounted on a surface along the beam 2810 to sense strain caused by deflection of the beam 2810. The shaft 2410 includes a distal portion, and a proximal portion 2822 of the beam 2810 is coupled to the distal portion of the shaft. In some embodiments, the proximal portion of the beam is directly coupled to the distal portion of the shaft 2410, and in other embodiments, the proximal portion 2822 of the beam is coupled to the proximal portion 2822 of the beam via another coupling component (such as a mechanical anchor or coupler, not shown). In some embodiments, the proximal portion of the shaft 2410 is coupled to a mechanical structure (not shown) that is configured to move one or more components of the surgical instrument, such as, for example, an end effector 2460. In other words, in some embodiments, the shaft 2410 has a mechanical ground connection GND 5 through an arm assembly of the surgical system (e.g., via an instrument bracket). Thus, the beam 2810 couples the connecting link 2510 (and the end effector 2460) to the shaft 2410 in a cantilever configuration anchored at the proximal end portion 2822 of the beam.

[0092] One or more distal components of the instrument (e.g., surgical end effector, wrist assembly, etc.) are connected to the distal portion 2824 of the beam 2810 via the connecting link 2510. As shown, the example end effector 2460 can be connected to the distal portion 2824 of the beam 2810 (i.e., at the distal portion of the surgical instrument 2400). The end effector 2460 can include, for example, an articulated jaw, a cautery instrument, and / or any other suitable surgical tool connected to the link 2510 (e.g., a proximal clevis pin). In some embodiments, the link 2510 can be included in a wrist assembly having multiple articulated links. In some embodiments, the link 2510 is included as part of the end effector 2460.

[0093] The one or more strain sensors 2830 are optionally coupled to one or more electrical strain sensing circuits (e.g., bridge circuit 2831—see Fig.18 and 19 ), and other strain sensor configurations are contemplated (e.g., fiber Bragg grating sensors, piezoelectric sensors, etc.). As described herein, each bridge circuit 2831 (and each strain sensor) includes one or more strain gauges (e.g., (one or more) tensile strain gauge resistors or (one or more) compressive strain gauge resistors). It should be understood that beam 2810 can include any number of strain sensors 2830 in various arrangements.

[0094] In some embodiments, the shroud 2420 optionally surrounds at least a portion of the beam 2810 .

[0095] As shown, the beam 2810 of the force sensor unit 2800 includes an intermediate portion 2820 between a proximal portion 2822 and a distal portion 2824. The central axis (A) of the beam 2810 is B ) is defined by the ends 2822, 2824 and is centered on the beam. In some embodiments, the central axis A B The beam is aligned (co-linear) with a similar central axis (not shown) of the instrument shaft 2410, and in other embodiments, the two axes are not co-linear. As described below, in the undeflected state of the beam (as measured by the strain sensor 2830), the beam is deflected from the axis A. B The deflection can be related to the applied force applied to the end effector 2460.

[0096] Typically, Cartesian X, Y, and Z forces (direct forces or reaction forces) are applied to the end effector 2460. In practice, the applied forces can be resolved into their Cartesian components. The resolved moments (M) corresponding to these X, Y, or Z forces are F ) is also applied to the end effector, and the magnitude of such torque depends on the origin of the torque definition. For example, as shown in FIG3 , the applied force F in the X direction isA The resulting analytical moment (M) around the Y axis F ). More specifically, as described herein, substantially perpendicular to the beam center axis A B The applied forces acting (ie, forces in the X and Y directions as shown) will produce corresponding moments on the beam 2810. B Forces acting in the Z direction are a special case because they pass through the central axis A. B acts, and thus acts by defining the origin, where the magnitude of the resulting moment is zero.

[0097] refer to Fig.18 and Fig.19 , a strain gauge resistor R included in the strain sensor and arranged into one or more bridge circuits 2831 (eg, a Wheatstone bridge) 1 , R 2 , R 3 and R 4 The strain in the beam 2810 can be measured, which can be used to determine the forces applied to the end effector 2460 in the X and Y axis directions perpendicular to the beam. These X and Y axis forces are transverse (e.g., perpendicular) to the Z axis (which is perpendicular to the longitudinal center axis (A) of the beam 2810). B ) parallel or co-linear). Such lateral forces acting on the end effector 2460 cause deflection (e.g., bending) of the beam 2810 (about either or both of the X-axis or the Y-axis), which, due to its cantilever configuration, results in tensile strain applied to one side of the beam 2810 and compressive strain applied to the opposite side of the beam 2810. The strain gauge resistor R on the beam 2810 1 , R 2 , R 3 and R 4 Used to determine such tensile and compressive strains.

[0098] It should be understood that because the location along the length of the instrument at which the force (or force component) is applied is unknown, the exact location on the instrument at which the applied force (or force component) is applied is not determined. For example, since an infinite number of force and torque pairs will result in the same strain, a force applied directly to the distal tip of the end effector will result in the same sensed strain as a slightly larger force applied a short distance proximal to the distal tip of the end effector. This is also the case for manually operated instruments. In practice, this determined force effectively simulates similar conditions in a handheld instrument and can be effectively used in a tactile force feedback system for a human clinical operator because the difference in the location of the applied force at the distal portion of the instrument is relatively small.

[0099] Therefore, the strain gauge resistor R on beam 2810 1 , R 2 , R3 and R 4 The output of is related to the determined force (F). In addition, as described herein, depending on the strain gauge resistor R 1 , R 2 , R 3 and R 4 arrangement (ie, in two half-bridge circuits 2831), the strain gauge resistor R 1 , R 2 , R 3 and R 4 It can be used to determine the torque (M) generated by the applied force on the instrument. It should be understood that the output of the force sensor unit 2800 can be used by a controller (such as the controller 1800 of the system 1000 described above) to determine the tactile feedback delivered to the surgeon (S) via the input control device (s).

[0100] Although shown as including only the force sensor unit 2800, in some embodiments, the instrument 2400 (or any of the instruments described herein) optionally includes an additional force sensor unit to measure the axial force(s) applied to the end effector 2460 (i.e., in an axis parallel to the beam center axis (A)). B ) in the Z-axis direction. The axial force sensor unit in the example surgical instrument can include a deflectable planar diaphragm sensor that deflects in response to force. Alternatively, for example, a deflectable ferrite core that can be used within an inductive coil can be used, or a fiber Bragg grating formed within an optical fiber can be used. Other axial force sensor units can be used to sense elastic axial displacement of the shaft 2410 (e.g., relative to a proximally mounted mechanical structure, not shown). The axial force F applied to the end effector 2460 Z This may cause the shaft 2410 to be aligned along the shaft's central axis (substantially parallel to the beam's central axis (A B )) Axial displacement in the direction of . Axial force F Z This may be in the proximal direction (eg, reaction force generated by pushing against tissue using an end effector), or it may be in the distal direction (eg, reaction force generated by pulling tissue grasped using an end effector).

[0101] Under some conditions, when beam 2810 deflects (δ) (eg, elastically displaces), such as Fig.13 The X and / or Y forces depicted as being applied to the end effector 2460 can result in strain in the beam 2810. In other words, the X and / or Y forces cause the central axis (A) of the beam 2810 to B ) away from the center axis (A B ) of the zero-force design position (A B(N) ) deflects, and thus causes the central axis AB Deflection relative to the longitudinal center axis of shaft 2410. In other words, distal portion 2824 of beam 2810 can bend relative to proximal portion 2822 of beam 2810 so that distal portion 2824 of beam 2810 is deflected relative to the center axis (A B ) design orientation (A B(N) )Displacement deflection distance.

[0102] In some embodiments, beam deflection is limited by the position of a hard stop. For example, shield 2420 and / or sleeve structure 2600 can limit the displacement of beam 2810. Such deflection limitation generates a reaction force (F R ). Thus, in some embodiments, the shield 2420 functions as a deflection limiting hard stop 2430. Similarly, in some embodiments, the sleeve 2600 functions as a deflection limiting hard stop 2430. In some embodiments, the instrument can include one or more hard stop structures that function as deflection limiting hard stops 2430. It should be understood that the hard stop 2430 can be a known point of contact between a structure of the instrument and / or a structure coupled to the instrument 2400 at a specific longitudinal location to limit the deflection of the beam 2810.

[0103] As described above, in embodiments where the displacement of the beam 2810 is limited by the hard stop 2430 and / or the sleeve structure 2600, the strain distribution over the length of the beam 2810 may deviate from that of the beam 2810 when the displacement is unrestricted. Similarly stated, when the beam 2810 contacts the hard stop 2430, the beam 2810 no longer behaves as a cantilever beam. Under such conditions, the deflection (δ) of the distal end of the beam is greater than the maximum deflection allowed at the location of the hard stop 2430. As a result, the strain sensor(s) 2830 produce strain that does not accurately represent the applied force (F) affecting the end effector 2460. A ) signal, and thus the force determined by an incorrect strain sensor signal can have significant errors. Fig.15 As shown, when the applied force (F A ) increases to cause a deflection (δ) (which results in the generation of a reaction force (F R )(It starts at point GP FR When the magnitude of the strain sensor (depicted at 280) is less than that of the strain sensor (depicted at 280), the signal from the strain sensor (depicted at 280) may cause the determined force (F) to decrease, while the applied force (F) acting on the end effector 2460 increases. A ) actually increases (e.g., a force reversal condition may exist). In the case where the controller 1800 can use the signal from the strain sensor(s) 2830 to generate tactile feedback to the surgeon (S), the applied force (F) that results in inaccurate tactile feedback A) (i.e., inaccurately determined force (F)) is undesirable. Therefore, it should be understood that detecting such conditions of inaccurately determined force and mitigating the effects of inaccurate tactile feedback is beneficial to the operation of surgical system 1000.

[0104] Therefore, the controller 1800 (combined with the strain gauge sensor R 1 , R 2 , R 3 and R 4 The arrangement of the instrument 2400 can be configured to (i) detect the occurrence of a condition where the beam deflection (δ) is greater than a deflection threshold (Tδ) at which contact with the hard stop occurs, (ii) provide an indication of this condition to the surgical system and / or a human clinical operator, and (iii) in some cases, automatically take other actions in the surgical system. According to aspects of the invention, this process is performed by determining a reference position of the distal portion of the instrument 2400 (see, e.g., Fig.12 The moment (M) is a couple (i.e., a couple, a pure moment, or a moment-of-couple) of the instrument 2400 according to rigid body mechanics (e.g., expressed in a free body diagram). Based at least on this moment (M), the deflection (δ) of the reference position can be estimated or otherwise determined. Fig.16 and Fig.17 A free body diagram of the apparatus 2400 is shown, and the following description provides details of the structure and method for identifying the condition where the deflection (δ) of the beam 2810 is greater than a deflection threshold (Tδ).

[0105] Specifically, in some embodiments, a controller of surgical system 1000 (such as controller 1800) is configured to detect when the displacement of beam 2810 is limited by hard stop 2430 and thereby relieve the applied force (F A ) and the resulting tactile feedback to the human operator. Therefore, the controller determines a torque (M) at the reference position 2440 of the distal portion 2824 of the instrument 2400. For example, the torque is determined based on the output of the strain sensor(s) 2830.

[0106] As shown in Figure 11- Fig.13 As depicted, in some embodiments, the reference position 2440 is located along the longitudinal direction (LP) of the medical device 2400 in some embodiments. 1 ). Longitudinal position (LP) 1 ) is coplanar with the hard stop 2430. The reference position 2440 can be a portion of the outer surface of the beam 2810 that is opposite to and faces the hard stop 2430. For example, the reference position 2440 can be relative to the central axis (A B) on the radially inner side of the hard stop 2430.

[0107] The positioning of the hard stop 2430 limits the deflection (δ) of the reference position 2440. In other words, the distal portion 2824 of the beam 2810 can bend relative to the proximal portion 2822 of the beam 2810 so that the distal portion 2824 of the beam 2810 responds to the applied force (F A ) and relative to the central axis (A B ) design orientation (A B(N) ) displacement deflection distance. However, if Fig.13 and Fig.14 As depicted, when beam 2810 encounters hard stop 2430 , this bending is limited because hard stop 2430 and / or the supporting structure are more rigid than beam 2810 .

[0108] Fig.16 yes Fig. 11B A free body diagram of the medical device shown, which shows the applied force (F) developed at the end effector 2460 A ). The applied force (F A ) can be developed through the interaction between the end effector 2460 and the object. For example, the applied force (F A ) can be developed through interaction (e.g., pressing, pushing, pulling, and / or lifting) between the end effector 2460 and a part of the patient's (P) body or an object therein. As depicted, the applied force (F A ) is developed at a distance (d) distally from a reference location 2440. The reference location 2440 is cantilevered from a mechanical ground (eg, shaft 2410) by a beam length (L B ). Fig.16 The beam 2810 is shown in a deflected orientation, wherein the beam 2810 is substantially in contact with the hard stop 2430 of the shield 2420. Due to the contact between the beam 2810 in the hard stop 2430, a force (F) corresponding to the applied force (F) is developed at the reference position 2440. A ) Opposite reaction force (F R ).

[0109] In order to detect the condition where the displacement of the beam 2810 is limited by the hard stop 2430, it is desirable to resolve the applied force (F) at the reference position 2440 rather than at the end effector 2460. A ).therefore, Fig.17 yes Fig. 11B The free body diagram of the medical device shown shows the Fig.16 The applied force (F A ) is resolved to the applied force (F) at the reference position 2440 A Specifically, the force applied at the tip of the instrument (e.g. Fig.16 ) can be resolved as the applied force (F A ) and the torque (M) provided by equation (3):

[0110] Equation (3) M = F A *d

[0111] where the distance (d) is unknown and if Fig.17 As explained above, in the presence of a reaction force (F R ), the applied force (F A ) has a magnitude that is different from the determined force (F) (as indicated by (one or more) strain sensors 2830).

[0112] like Fig.16 and Fig.17 As depicted, the output (OP) of the strain sensor(s) 2830 is at least partially related to the determined force (F). A ) deflection (δ) does not result in a reaction force (F R ) develops (e.g., when beam 2810 is substantially not in contact with hard stop 2430), the determined force (F) is effectively the same as the applied force (F A ) is related. However, when the beam 2810 responds to the applied force (F A ) causes the beam 2810 to substantially contact the hard stop 2430 (eg Fig.16 and 17 As shown), the force (F) determined is the applied force (F A ) and reaction force (F R ), which is provided by equation (4):

[0113] Equation (4) F = F A -F R

[0114] According to equation (4), due to the reaction force (F) acting on beam 2810 in the opposite direction when beam 2810 is in substantial contact with hard stop 2430, R ) (which is also unknown), so the magnitude of the determined force (F) as indicated by the strain sensor(s) 2830 is less than the actual applied force (F A )'s magnitude (which is unknown).

[0115] Because the contact between the beam 2810 and the hard stop 2430 can affect the force indication from the strain sensor(s) 2830, a deflection threshold (Tδ) is established in some embodiments. Fig.12As depicted, the deflection threshold (Tδ) can be established at a magnitude of deflection (δ) that is greater than zero but prevents contact between the outer surface 2812 of the beam 2810 and the face 2432 (e.g., the radially inner face) of the hard stop 2430. For example, the deflection threshold (Tδ) can correspond to a distance from the center axis (A B ) design orientation (A B(N) ) of the first radial distance (RD 1 ), which is smaller than the distance between the surface 2432 of the hard stop 2430 and the central axis (A B ) design orientation (A B(N) ) of the second radial distance (RD 2 However, in some embodiments, the first radial distance (RD 1 ) may be equal to the second radial distance (RD 2 ), such that the deflection threshold (Tδ) corresponds to a deflection (δ) that causes the outer surface 2812 to contact the surface 2432 but prevents the hard stop 2430 from exerting a reaction force on the beam 2810.

[0116] In some embodiments, the controller determines the deflection (δ) (e.g., the magnitude of the deflection) based on the moment (M). Under a first condition that the deflection (δ) is greater than a deflection threshold (Tδ), the controller provides an indication of a constraint on tactile feedback to an operator (S) of the input device, such as via the input device 1116. The indication can be a visual indication, a tactile indication, and / or an audible indication. For example, in one embodiment, the controller 1800 can be configured to generate a graphical indication of the deviation of the constrained tactile feedback from the designed tactile feedback (e.g., via the indicator module 1812). The controller 1800 can maintain the graphical indication in the field of view 1142 (see, e.g., via the display system 1110) of the operator / surgeon (S). Figure 8 ) within a context, as long as constraints on tactile feedback are provided or available to be provided to an input device.

[0117] The magnitude of the moment (M) and the resulting deflection (δ) is determined by the controller based on the output of the strain sensor(s) 2830. Specifically, by resolving the applied force (F A ) and by configuring the strain sensor 2830 into a plurality of half bridges (e.g., Fig.19 The depicted half bridges 2831A and 2831B), the resulting moment (M) can be determined as follows. The deflection (δ) of the beam 2810 can be determined based on the determined force (F) and moment (M) derived from the output of the strain sensor 2830. The relationship of the deflection (δ) to the moment (M) and the determined force (F) is provided by equation (5), where "E" is the elastic modulus of the beam 2810, "I" is the moment of inertia of the XY cross section of the beam 2810, and "LB ” is the distance between the mechanical ground and the reference position 2440.

[0118] Equation (5)

[0119] According to equation (5), when beam 2810 is subjected to the applied force (F A ), the deflection of beam 2810 can be determined primarily based on the physical properties of beam 2810, the magnitude of the determined force (F), and the measured moment (M). A ) results in an increase in deflection (δ). However, when the deflection (δ) is limited (eg, stopped or resisted) by the hard stop 2430, the applied force (F A ) is further increased by the reaction force (F R ) is offset by a corresponding increase in the force (which results in a change in the determined force (F) that is less than the applied force (F A ) changes, and in some cases even to the contrary). At the same time, the magnitude of the moment (M) changes according to equation (3) based on the larger applied force (F A ). In such cases, the deflection (δ) determined using Equation 5 may have a magnitude that appears to be greater than the calculated gap between the beam 2810 and the hard stop 2430, and thus may indicate that the determined force (F) may not accurately represent the applied force (F A ).

[0120] To determine the moment (M) and the determined force (F) at the reference location 2440, the controller is configured to receive an indication of strain from the strain sensor 2830. Fig.18 and Fig.19 As depicted, in some embodiments, the strain sensor 2830 includes a strain gauge resistor R 1 , R 2 , R 3 and R 4 , which acts as a strain sensor and can be arranged into one or more bridge circuits 2831 (e.g., a Wheatstone bridge). In such embodiments, the first strain gauge resistor (R 1 ) is configured to output a first strain indication (ε 1 ). The first strain indicator (ε 1 ) is related to the determined force (F) and moment (M) by equation (6): Equation (6)

[0121] in:

[0122] F = the force determined by equation (4)

[0123] L1 = First strain gauge resistor (R 1 ) and the third strain gauge resistor (R 3 )

[0124] L 2 = The third strain gauge resistor (R 3 ) and the distance between the reference position 2440

[0125] r = half the thickness of beam 2810

[0126] E = elastic modulus of beam 2810

[0127] I = moment of inertia of the XY cross section of beam 2810

[0128] M = moment described by equation (3)

[0129] F z = longitudinal force along the z-axis

[0130] A = area of ​​the cross section of beam 2810 in the XY plane

[0131] The second strain gauge resistor (R 2 ) is configured to output a second strain indication (ε 2 ). The second strain indicator (ε 2 ) is related to the determined force (F) and moment (M) by equation (7):

[0132] Equation (7)

[0133] The third strain gauge resistor (R 3 ) is configured to output a third strain indication (ε 3 ). The third strain indicator (ε 3 ) is related to the determined force (F) and moment (M) by equation (8):

[0134] Equation (8)

[0135] The fourth strain gauge resistor (R 4 ) is configured to output a fourth strain indication (ε 4 ). The fourth strain indicator (ε 4 ) is related to the determined force (F) and moment (M) by equation (9):

[0136] Equation (9)

[0137] like Fig.18 and Fig.19As depicted, the strain sensor 2830 may be arranged into at least two half-bridge circuits 2831. Each half-bridge circuit 2831A, 2831B may include a strain gauge resistor R 1 , R 2 , R 3 and R 4 In some embodiments, the half-bridge circuit 2831 can be arranged along a single face of the beam 2810. However, in additional embodiments, the half-bridge circuit 2831 can be arranged along adjacent, separate, or opposing faces of the beam 2810. In addition, as Fig.19 As depicted, in some embodiments, the first half-bridge circuit 2831A includes a proximally positioned strain gauge resistor (e.g., strain gauge resistor R 1 and R 2 ), while the second half-bridge circuit 2831B includes a far-side located strain gauge resistor (e.g., strain gauge resistor R 3 and R 4 ). However, in additional embodiments, each half-bridge circuit 2831 may include at least one proximally positioned strain gauge resistor and at least one distally positioned strain gauge resistor.

[0138] Fig.19 28 is a diagrammatic illustration of one configuration of the strain sensor 2830, which shows a first half-bridge circuit 2831A and a second half-bridge circuit 2831B. The first half-bridge circuit 2831A may include a first strain gauge resistor (R 1 ) and the second strain gauge resistor (R 2 ) and can be electrically connected to at least one precision resistor (R P ).(One or more) precision resistors (R P ) is configured as a reference resistor and may have a fixed resistance value or an adjustable resistance value (eg, a potentiometer). The second half-bridge circuit 2831B may include a third strain gauge resistor (R 3 ) and the fourth strain gauge resistor (R 4 ) and can be electrically connected to (one or more) precision resistors (R P To detect strain, the input voltage (V IN ) is provided to the first half-bridge circuit 2831A and / or the second half-bridge circuit 2831B. Then, the first output voltage (V A ). The first output voltage (V A ) corresponds to the first half-bridge strain indication (ε 1 -ε 2 ), as described by equation (10). The second output voltage (V B ). The second output voltage (V B) corresponds to the second half-bridge strain indicator (ε 3 -ε 4 ), as described by equation (11).

[0139] Equation (10) (ε 1 -ε 2 )∝V A

[0140] Equation (11) (ε 3 -ε 4 )∝V B

[0141] Since the first half-bridge strain indicator (ε 1 -ε 2 ) and the measured first output voltage (V A ), so the first half-bridge strain indicator (ε 1 -ε 2 ) and the determined force (F) and moment (M) can be determined by combining the strain equations for the corresponding strain gauge resistors (specifically, equations (6) and (7)). The first half-bridge strain indication (ε 1 -ε 2 ) is solved as equation (12):

[0142] Equation (12) The analysis of equations (6) and (7) eliminates the longitudinal force (F) along the z-axis. Z ). However, the magnitude of the determined force (F) and moment (M) remains unknown.

[0143] Similarly, due to the second half-bridge strain indication (ε 3 -ε 4 ) and the measured second output voltage (V B ), so the second half-bridge strain indicator (ε 3 -ε 4 ) and the determined force (F) and moment (M) can be determined by combining the strain equations for the corresponding strain gauge resistors (specifically, equations (8) and (9)). The second half-bridge strain indication (ε 3 -ε 4 ) is solved as equation (13): Equation (13) The analysis of equations (8) and (9) eliminates the longitudinal force (F) along the z-axis. Z ), where the magnitudes of the determined forces (F) and moments (M) remain unknown.

[0144] With the strain sensor 2830 arranged as at least two half-bridge circuits 2831, and resolving the applied force (F) at the reference position 2440 A ), the controller is configured to use the measured voltage output (e.g., the first output voltage (V A ) and the second output voltage (V B )) to determine the magnitude of the determined force (F) and moment (M). Specifically, the controller is configured to determine the magnitude of the determined force (F) and moment (M) based on the measured first output voltage (V A ) and the measured second output voltage (V B ) solves two strain equations for the two unknown variables (e.g., Eq. (12) and Eq. (13)) to determine the magnitude of the determined force (F) and moment (M).

[0145] After determining the magnitude of the determined force (F) and moment (M) by solving the strain equations (e.g., Equation (12) and Equation (13)) of the half-bridge circuit 2831 based on the measured output voltage of the half-bridge circuit 2831, the controller is configured to determine the deflection (δ) of the beam 2810. Specifically, the controller is configured to utilize the determined magnitude of the determined force (F) and moment (M) to determine the deflection (δ) of the beam 2810 based on the relationship of the deflection (δ) to the moment (M) and the determined force (F) described by Equation (5).

[0146] Under a first condition where the deflection (δ) is greater than the deflection threshold (Tδ), the controller provides an indication to an operator (S) of a surgical system (e.g., surgical system 1000) that a constraint of tactile feedback is provided to or can be provided to an input device. In some embodiments, the constraint of tactile feedback corresponds to an interruption of the operation of the surgical system. For example, when the deflection (δ) is greater than the deflection threshold (Tδ), the controller can interrupt the movement of the medical device 2400 so that the end effector 2460 is maintained in a fixed orientation until the operator (S) confirms the constraint of tactile feedback.

[0147] After the first condition, and under the second condition that the deflection (δ) is less than the deflection threshold (Tδ), the controller can remove the constraint of the tactile feedback. In other words, when the applied force (F A ) decreases to a point where the deflection (δ) of the beam 2810 returns to a magnitude less than the deflection threshold (Tδ), the force (F) determined is equal to the applied force (F A ), and can provide unconstrained tactile feedback to the operator (S).

[0148] During the first condition, in some embodiments, the controller is configured to determine an estimated applied force (F A ). Estimated applied force (F A) can be based on the moment (M). Specifically, the estimated applied force (F A ) is assumed to develop at a distance (d) distal to the reference location 2440. To generate an estimated applied force (F A ), the distance (d) is assumed to correspond to the distance between the reference position 2440 and a specified location along the end effector 2460 (such as a contact surface of a tool member). The estimated applied force (F) can then be determined by dividing the moment (M) (determined based on the output of the strain sensor 2830) by the assumed distance (d). A ), as described by equation (3). When the deflection is less than the deflection threshold (Tδ), the moment (M) can be simply divided by the force (F A ) to calculate the assumed distance (d). In other words, when the beam 2410 is not in hard stop contact, the load position (e.g., assumed distance (d)) can be estimated. When the beam 2410 is in hard stop contact, the last estimated load distance can be used to estimate the applied force (F A ).

[0149] In some embodiments, the estimated reaction force (F) developed by the interaction between the beam 2810 and the hard stop 2430 may be used. R ) to determine the estimated applied force (F A ). In order to determine the estimated reaction force (F R ), the controller determines the indicated deflection (δ) based on the moment (M) and the determined force (F) according to equation (5). However, the gap between the hard stop 2430 and the beam 2810 (e.g., Fig.12 The second radial distance (RD 2 )) establishes a maximum deflection for the beam 2810. Thus, the portion of the indicated deflection (δ) that would otherwise exceed the maximum deflection corresponds to the resisting deflection portion. The controller is then configured to determine an estimated reaction force (F) by multiplying the magnitude of the resisting deflection portion by the stiffness factor (e.g., spring constant) of the hard stop 2430. R Finally, the estimated reaction force (F) can be subtracted from the determined force (F) R ) to determine the applied force (F) according to equation (4) A ).

[0150] In some embodiments, the controller is configured to determine the applied force (F) based on the estimated applied force (F A ) to perform the operation of the surgical system. For example, the controller may A) is transmitted to an operator (S) of an input device (e.g., input device 1116) of the surgical system. In additional embodiments, based on the estimated applied force (F A ) Performing an operation of the surgical system may, for example, include limiting the movement of the medical device 2400, performing a predefined movement of the medical device 2400, and / or performing a load relief operation. As an illustration, in some embodiments, when the estimated applied force (F A ) exceeds a threshold, the controller can interrupt the operation of the surgical system.

[0151] In some embodiments, the constrained haptic feedback corresponds to a full constraint of the designed haptic feedback. In such embodiments, the magnitude of the constrained haptic feedback along each axis is each less than the corresponding magnitude of the designed haptic feedback. However, in some embodiments, the constrained haptic feedback corresponds to a partial constraint of the designed haptic feedback. For example, in such embodiments, the magnitude of the constrained haptic feedback HF along one axis is less than the magnitude of the designed haptic feedback. R The amplitude of can be smaller than the corresponding designed tactile feedback amplitude, while the amplitude along other axes is not affected.

[0152] Fig. 20 and Fig.21 Depicting perspective and side views of medical device 3400 and cannula 3600 (with the outer shaft and shield removed for clarity), and Figure 22-Figure 26 Additional views and enlarged views of a force sensor unit 3800 depicting the instrument 3400. In some embodiments, the instrument 3400 or any of the components therein are optionally part of a surgical system for performing a surgical procedure. The surgical system may include a manipulator unit, a series of kinematic linkages, a series of cannulas, etc. The instrument 3400 (and any of the instruments described herein) may be used in any suitable surgical system, such as the MIRS system 1000 shown and described above.

[0153] The instrument 3400 includes a proximal mechanical structure (not shown), an outer shaft 3910, a shaft 3410, a force sensor unit 3800 including a beam 3810, a wrist assembly 3500, and an end effector 3460. As depicted, in one embodiment, a shield 3420 can surround at least a portion of the beam 3810. Although not shown, the instrument 3400 can also include a plurality of cables coupling the mechanical structure to the wrist assembly 3500 and the end effector 3460. The instrument 3400 is configured such that selected movement of the cables produces a rotation of the wrist assembly 3500 about a rotation axis (which serves as a pitch axis, the term pitch being arbitrary) (i.e., a pitch rotation), a yaw rotation of the end effector 3460 about an additional rotation axis (which serves as a yaw axis, the term yaw being arbitrary), a cutting rotation of a tool member of the end effector 3460, or any combination of these movements. Changing the pitch or yaw of the apparatus 3400 can be performed by manipulating cables in a manner similar to that described, for example, in U.S. Patent No. 8,821,480 B2 (filed on July 16, 2008), entitled “Four-Cable Wrist with Solid Surface Cable Channels,” which is incorporated herein by reference in its entirety.

[0154] In some embodiments, the end effector 3460 may include at least one tool member 3462 having a contact portion configured to engage or manipulate a target tissue during a surgical procedure. For example, in some embodiments, the contact portion may include an engagement surface used as a clamp, a cutter, a tissue manipulator, etc. In other embodiments, the contact portion may be an energized tool member for a cautery or electrosurgical procedure. The end effector 3460 may be operably coupled to a proximal mechanical structure so that the tool member 3462 rotates relative to the shaft 3410. In this way, the contact portion of the tool member 3462 may be actuated to engage or manipulate a target tissue during a surgical procedure. The tool member 3462 (or any one of the tool members described herein) may be any suitable medical tool member. In addition, although only one tool member 3462 is identified, as shown, the instrument 3400 may include two tool members that cooperate to perform a grasping or shearing function. In other embodiments, the end effector may include more than two tool members.

[0155] In some embodiments, the force sensor unit 3800 includes one or more strain sensors 3830 mounted on the beam 3810. The strain sensors 3830 can be, for example, strain gauges, and can be used to measure the forces applied to the surgical instrument during a surgical procedure, as described in more detail herein. In some embodiments, the beam 3810 can define at least three side surfaces that are disposed at acute angles to each other. In additional embodiments, the beam 3810 can define at least four side surfaces that are disposed perpendicular to each other. The strain sensor(s) 3830 can be mounted to the side surfaces at appropriate locations. The beam 3810 defines a beam center axis (A) that can be aligned within a center axis (not shown) of the instrument shaft 3410. B )(See Figure 24A-Figure 26 ). Beam center axis (A B ) is a neutral axis equidistant from a side (eg, face) of beam 3810.

[0156] In use, the end effector 3460 can contact anatomical tissue, which can cause forces in the X, Y, or Z directions (similar to those applied to Fig.13 The contact may also cause forces about various axes. The strain sensor 3830 may be used to measure the strain in the beam 3810 due to such forces applied to the end effector 3460. More specifically, the strain sensor 3830 may measure forces applied to the end effector 3460 that are transverse (e.g., perpendicular) to the central axis of the beam 3810 because such forces are transferred to the beam 3810 in the X and Y directions (see FIG. Fig. 11B ). Specifically, lateral forces acting on end effector 3460 can cause slight bending of beam 3810, which can result in tensile strain applied to one side of beam 3810 and compressive strain applied to the opposite side of beam 3810. Strain sensor 3830 can be coupled to beam 3810 to measure such tensile and compressive forces, with the resulting measurements transmitted to the controller via a communication coupling therebetween.

[0157] More specifically, when in the X or Y direction (for X, Y and Z directions, see Fig. 11B ), such lateral forces can cause the beam 3810 to bend (about either or some combination of the X-axis or the Y-axis), which can result in tensile strain applied to one side of the beam 3810 and compressive strain applied to the opposite side of the beam 3810. The strain sensors 3830 on the beam 3810 can measure such tensile and compressive strains.

[0158] In some embodiments, the force sensor unit 3800 includes a beam 3810 having one or more bridge circuits 3831 (see, for example, FIG. 24- Fig.26 ), which can form one or more strain sensors 3830 (which can be Wheatstone bridges) mounted on a surface along the beam 3810. As described herein, each bridge circuit 3831 (and each strain sensor) can include one or more strain gauges (e.g., (one or more) tensile strain gauge resistors or (one or more) compression strain gauge resistors). In some embodiments, the shield 3420 can surround at least a portion of the beam 3810, and the end effector 3460 can be coupled to the distal portion 3824 of the beam 3810 (e.g., at the distal portion of the surgical instrument 3400). The end effector 3460 can include, for example, an articulatable jaw, a cautery instrument, and / or any other suitable surgical tool 3462 coupled to the link 3510 (e.g., a proximal clevis pin). In some embodiments, the link 3510 can be included in a wrist assembly having multiple articulating links. In some embodiments, the link 3510 is included as part of the end effector 3460. The shaft 3410 includes a distal portion coupled to the proximal portion 3822 of the beam 3810. In some embodiments, the distal portion of the shaft 3410 is coupled to the proximal portion 3822 of the beam via another coupling component (such as an anchor or a coupler, not shown). The shaft 3410 may also be coupled at the proximal portion to a mechanical structure (not shown) that is configured to move one or more components of the surgical instrument, such as, for example, the end effector 3460.

[0159] refer to Figure 23-Figure 26 , strain gauge resistors (such as strain gauge resistors R 1 , R 2 , R 3 , R 4 , R 5 , R 6 , R 7 , R 8 , R 9 , R 10 , R 11 , R 12 , R 13 , R 14 , R 15 and R 16 (R 1-16 ), which forms part of the strain sensor and can be arranged as one or more bridge circuits 3831 (e.g., one or more Wheatstone bridges) can measure the strain in the beam 3810, which can be used to determine the force applied to the end effector 3460 in the X and Y axis directions according to any of the methods described herein (including the methods described above with reference to the instrument 2400) (see Fig.18 These X and Y axis forces are transverse (eg, perpendicular) to the Z axis (which is perpendicular to the longitudinal center axis (A) of the beam 3810).B ) parallel or co-linear). Such lateral forces acting on the end effector 3460 can cause deflection (e.g., bending) of the beam 3810 (about either or both of the X-axis or the Y-axis), which can result in tensile strain applied to one side of the beam 3810 and compressive strain applied to the opposite side of the beam 3810. The strain gauge resistor R on the beam 3810 1-16 Such tensile and compressive strains can be measured. The strain gauge resistor R on beam 3810 1-16 The output of can be related to the determined force (see, e.g. Fig.17 ). In addition, as described in this article, depending on the strain gauge resistor R 1-16 arrangement (ie, in at least two bridge circuits 3831 (eg, eight half bridges 3831), the strain gauge resistor R 1-16 It will be appreciated that the output of the force sensor unit 3800 may be utilized by a controller (such as the controller 1800 of the system 1000 described above) to determine tactile feedback delivered to the surgeon (S) via the input control device(s) 1116 .

[0160] Although shown as including only the force sensor unit 3800, in some embodiments, the instrument 3400 (or any of the instruments described herein) may include an additional force sensor unit to measure the axial force(s) applied to the end effector 3460 (i.e., in an axis parallel to the beam center axis (A)). B ) in the Z-axis direction. The axial force sensor unit in the example surgical instrument can include a deflectable planar diaphragm sensor that deflects in response to force. Alternatively, for example, a deflectable ferrite core that can be used within an inductive coil can be used, or a fiber Bragg grating formed within an optical fiber can be used. Other axial force sensor units can be used to sense elastic axial displacement of the shaft 3410 (e.g., relative to a proximally mounted mechanical structure, not shown). The axial force F applied to the end effector 3460 Z This may cause the shaft 3410 to be aligned along the shaft's central axis (substantially parallel to the beam's central axis (A B )) Axial displacement in the direction of . Axial force F Z This may be in the proximal direction (eg, reaction force generated by advancing against tissue using the end effector), or it may be in the distal direction (eg, reaction force generated by pulling on tissue grasped using the end effector).

[0161] In some embodiments, the X and / or Y forces applied to the end effector 3460 can cause strain in the beam 3810 when the beam 3810 deflects (e.g., displaces or bends). In other words, the X and / or Y forces cause the central axis (A) of the beam 3810 to move. B) away from the center axis (A B ) design orientation (A B(N) ) deflection (similar to Fig.14 The deflection shown in the beam 2810 shown in FIG. 28A and thus deflects relative to the central axis of the shaft 3410. In other words, the distal portion 3824 of the beam 3810 can bend relative to the proximal portion 3822 of the beam 3810 so that the end portion 3824 of the beam 3810 is bent relative to the central axis (A B ) design orientation (A B(N) )Displacement deflection distance.

[0162] In some embodiments, the shield 3420 and / or the sleeve structure 3600 can limit the displacement of the beam 3810 and generate a reaction force applied to the beam 3810. For example, the shield 3420 may include or function as a hard stop (e.g., similar to that shown in FIG. 11- Fig.14 3810 is limited by the hard stop and / or sleeve structure 3600. In embodiments where the displacement of the beam 3810 is limited by the hard stop and / or sleeve structure 3600, the strain distribution over the length of the beam 3810 may deviate from the unrestricted displacement of the beam 3810. Similarly stated, when the beam 3810 contacts the hard stop, the beam 3810 no longer behaves as a cantilever beam. In this condition, the deflection is greater than the maximum deflection allowed at the location of the hard stop. As a result, the (one or more) strain sensors 3830 may produce signals that do not accurately represent the applied force affecting the end effector 3460. For example, when the applied force causes a deflection that results in the generation of a reaction force, the signal from the (one or more) strain sensors 3830 may indicate a reduced force, while the applied force acting on the end effector 3460 actually increases (e.g., a force reversal condition may exist). In situations where the controller 1800 may utilize signals from the strain sensor(s) 3830 to generate tactile feedback to the surgeon (S), an inaccurate representation of the applied force resulting in inaccurate tactile feedback may be undesirable. Therefore, it should be appreciated that detecting such conditions and mitigating the effects of inaccurate tactile feedback may be beneficial to the operation of the surgical system 1000.

[0163] Therefore, the controller 1800 (combined with the strain gauge sensor R 1-16 3400) can be configured to implement any of the methods and procedures described herein. Specifically, the controller can utilize the force sensor unit 3800 to detect the occurrence of a condition where the deflection of the beam is greater than a deflection threshold, and provide an indication of this condition (and, in some cases, take other actions). This is done by determining a reference position of the distal portion of the instrument 3400 (see, e.g., Fig.12Based on this moment, the deflection of the reference position can be estimated or otherwise determined.

[0164] like Figure 22-Figure 26 As depicted, the strain sensor 3830 may be arranged into at least two half-bridge circuits 3831 (eg, eight half-bridge circuits 3831 (AH) as depicted in FIG. 24 ). Each half-bridge circuit 3831 may include a strain gauge resistor R 1-16 The half-bridge circuit 3831 may be arranged along a single face of the beam 3810, such as Fig. 22 However, in additional embodiments, the half-bridge circuit 3831 can be arranged along adjacent, separate, or opposing sides of the beam 3810. In addition, as Fig.24A As depicted, in some embodiments, the first half-bridge circuit 3831A includes a proximally positioned strain gauge resistor (e.g., strain gauge resistor R 3 and R 4 ),and Fig. 24B The depicted second half-bridge circuit 3831B includes a distally located strain gauge resistor (e.g., strain gauge resistor R 1 and R 2 ). However, in additional embodiments, each half-bridge circuit 3831 may include at least one proximally positioned strain gauge resistor and at least one distally positioned strain gauge resistor.

[0165] Fig.23 3831 is a diagrammatic illustration of a configuration of a strain sensor 3830, which shows eight half-bridge circuits 3831A-3831H. The eight half-bridge circuits 3831 include a first half-bridge circuit 3831A, a second half-bridge circuit 3831B, a third half-bridge circuit 3831C, a fourth half-bridge circuit 3831D, a fifth half-bridge circuit 3831E, a sixth half-bridge circuit 3831F, a seventh half-bridge circuit 3831G, and an eighth half-bridge circuit 3831H. In order to detect strain, an input voltage (V IN ) is provided to the eight half-bridge circuits 3831 (AH), and then the output voltage (e.g., V A 、V B 、V C 、V D 、V E 、V F 、V G and V H (V A-H)). As mentioned earlier, the controller can use the output voltage (V A-H ) to determine the measured forces and moments.

[0166] In some embodiments, the first half bridge circuit 3831A and the third half bridge circuit 3831C are arranged as a primary proximal bridge circuit combination 3832, while the second half bridge circuit 3831B and the fourth half bridge circuit 3831D are arranged as a primary distal bridge circuit combination 3834. In addition, in some embodiments, the fifth half bridge circuit 3831E and the seventh half bridge circuit 3831G are arranged as a secondary proximal bridge circuit combination 3836, while the sixth half bridge circuit 3831F and the eighth half bridge circuit 3831H are arranged as a secondary distal bridge circuit combination 3838. The output of the secondary proximal bridge circuit combination 3836 is redundant with the corresponding output of the primary proximal bridge circuit combination 3832. Similarly, the output of the secondary distal bridge circuit combination 3838 is redundant with the corresponding output of the primary distal bridge circuit combination 3834. In other words, in the absence of a sensor failure, the outputs of the secondary proximal bridge circuit combination 3836 and the secondary distal bridge circuit combination 3838 are equal to the outputs of the primary proximal bridge circuit combination 3832 and the primary distal bridge circuit combination 3834 .

[0167] like Fig.23 and Fig.24A As depicted, the first half-bridge circuit 3831A may include a third strain gauge resistor (R 3 ) and the fourth strain gauge resistor (R 4 ).like Fig.24A As depicted, the third strain gauge resistor (R 3 ) and the fourth strain gauge resistor (R 4 ) can be positioned on the beam center axis (A B ) and on the opposite side of the central axis (A B ) are equidistant. For example, the third strain gauge resistor (R 3 ) and the fourth strain gauge resistor (R 4 ) can be positioned equidistantly on the beam center axis (A B ) and the side edge of the surface to which they are mounted. In some embodiments, the third strain gauge resistor (R 3 ) and the fourth strain gauge resistor (R 4 ) can be positioned along the beam center axis (A B ). As depicted in the figure, in some embodiments, the third strain gauge resistor (R 3 ) and the fourth strain gauge resistor (R 4 ) Both are the same type of strain gauge resistor (e.g., both are tension strain gauge resistors).

[0168] like Fig.23 and Fig.24A As further depicted, the third half-bridge circuit 3831C may include a seventh strain gauge resistor (R 7 ) and the eighth strain gauge resistor (R 8 ).like Fig.24A As depicted, the seventh strain gauge resistor (R 7 ) and the eighth strain gauge resistor (R 8 ) is positioned with the beam center axis (A B ) is axially aligned. In some embodiments, the eighth strain gauge resistor (R 8 ) is axially positioned on the seventh strain gauge resistor (R 7 ) part, and the seventh strain gauge resistor (R 7 ) is axially positioned on the eighth strain gauge resistor (R 8 ) between the parts. As depicted in the figure, the seventh strain gauge resistor (R 7 ) and the eighth strain gauge resistor (R 8 ) is a tensile strain gauge resistor and the other is a compressive strain gauge resistor.

[0169] like Fig.23 and Fig. 24B As depicted, the second half-bridge circuit 3831B may include a first strain gauge resistor (R 1 ) and the second strain gauge resistor (R 2 ).like Fig. 24B As depicted, the first strain gauge resistor (R 1 ) and the second strain gauge resistor (R 2 ) can be positioned on the beam center axis (A B ) and on the opposite side of the central axis (A B ) are equidistant. For example, the first strain gauge resistor (R 1 ) and the second strain gauge resistor (R 2 ) can be positioned equidistantly on the beam center axis (A B ) and the side edge of the surface to which they are mounted. In some embodiments, the first strain gauge resistor (R 1 ) and the second strain gauge resistor (R 2 ) can be positioned along the beam center axis (A B ). As depicted, in some embodiments, the first strain gauge resistor (R 1 ) and the second strain gauge resistor (R 2 ) Both are the same type of strain gauge resistor (e.g., both are tension strain gauge resistors).

[0170] like Fig.23 and Fig. 24BAs further depicted, the fourth half-bridge circuit 3831D may include a fifth strain gauge resistor (R 5 ) and the sixth strain gauge resistor (R 6 ).like Fig. 24B As depicted, the fifth strain gauge resistor (R 5 ) and the sixth strain gauge resistor (R 6 ) is positioned with the beam center axis (A B ) is axially aligned. In some embodiments, the sixth strain gauge resistor (R 6 ) is axially positioned on the fifth strain gauge resistor (R 5 ) part, and the fifth strain gauge resistor (R 5 ) is axially positioned on the sixth strain gauge resistor (R 6 ) between the parts. As depicted in the figure, the fifth strain gauge resistor (R 5 ) and the sixth strain gauge resistor (R 6 ) is a tensile strain gauge resistor and the other is a compressive strain gauge resistor.

[0171] Reference again Fig.23 and Fig.24A As depicted in the figure, the fifth half-bridge circuit 3831E may include an eleventh strain gauge resistor (R 11 ) and the twelfth strain gauge resistor (R 12 ).like Fig.24A As depicted, the eleventh strain gauge resistor (R 11 ) and the twelfth strain gauge resistor (R 12 ) can be positioned on the beam center axis (A B ) and on the opposite side of the central axis (A B ) are equidistant. For example, the eleventh strain gauge resistor (R 11 ) and the twelfth strain gauge resistor (R 12 ) can be positioned equidistantly on the beam center axis (A B ) and the side edge of the surface on which they are mounted. In some embodiments, the eleventh strain gauge resistor (R 11 ) and the twelfth strain gauge resistor (R 12 ) can be positioned along the beam center axis (A B ). As depicted in the figure, in some embodiments, the eleventh strain gauge resistor (R 11 ) and the twelfth strain gauge resistor (R 12 ) Both are the same type of strain gauge resistors (eg, both are tension strain gauge resistors). The fifth half-bridge circuit 3831E is positioned distally relative to the first half-bridge circuit 3831A.

[0172] like Fig.23 and Fig.24A As further depicted, the seventh half-bridge circuit 3831G may include a fifteenth strain gauge resistor (R 15 ) and the sixteenth strain gauge resistor (R 16 ).like Fig.24A As depicted, the fifteenth strain gauge resistor (R 15 ) and the sixteenth strain gauge resistor (R 16 ) is positioned with the beam center axis (A B ) is axially aligned. In some embodiments, the fifteenth strain gauge resistor (R 15 ) is axially positioned at the sixteenth strain gauge resistor (R 16 ) part, and the sixteenth strain gauge resistor (R 16 ) is axially positioned at the fifteenth strain gauge resistor (R 15 ) between the parts. As depicted in the figure, the fifteenth strain gauge resistor (R 15 ) and the sixteenth strain gauge resistor (R 16 ) is a tensile strain gauge resistor and the other is a compressive strain gauge resistor. The seventh half-bridge circuit 3831G is positioned distally relative to the third half-bridge circuit 3831C.

[0173] like Fig.23 and Fig. 24B As depicted, the sixth half-bridge circuit 3831F may include a ninth strain gauge resistor (R 9 ) and the tenth strain gauge resistor (R 10 ).like Fig. 24B As depicted, the ninth strain gauge resistor (R 9 ) and the tenth strain gauge resistor (R 10 ) can be positioned on the beam center axis (A B ) and on the opposite side of the central axis (A B ) are equidistant. For example, the ninth strain gauge resistor (R 9 ) and the tenth strain gauge resistor (R 10 ) can be positioned equidistantly on the beam center axis (A B ) and the side edge of the surface on which they are mounted. In some embodiments, the ninth strain gauge resistor (R 9 ) and the tenth strain gauge resistor (R 10 ) can be positioned along the beam center axis (A B ). As depicted in the figure, in some embodiments, the ninth strain gauge resistor (R 9 ) and the tenth strain gauge resistor (R 10) Both are the same type of strain gauge resistors (eg, both are tension strain gauge resistors). The sixth half-bridge circuit 3831F is positioned distally relative to the second half-bridge circuit 3831B.

[0174] like Fig.23 and Fig. 24B As further depicted, the eighth half-bridge circuit 3831H may include a thirteenth strain gauge resistor (R 13 ) and the fourteenth strain gauge resistor (R 14 ).like Fig. 24B As depicted, the thirteenth strain gauge resistor (R 13 ) and the fourteenth strain gauge resistor (R 14 ) is positioned with the beam center axis (A B ) is axially aligned. In some embodiments, the thirteenth strain gauge resistor (R 13 ) is axially positioned at the fourteenth strain gauge resistor (R 14 ) part, and the fourteenth strain gauge resistor (R 14 ) is axially positioned at the thirteenth strain gauge resistor (R 13 ) between the parts. As depicted in the figure, the thirteenth strain gauge resistor (R 13 ) and the fourteenth strain gauge resistor (R 14 ) is a tensile strain gauge resistor and the other is a compressive strain gauge resistor. The eighth half-bridge circuit 3831H is positioned distally relative to the fourth half-bridge circuit 3831D.

[0175] Fig.25 is an enlarged illustration of the distal portion of force sensor unit 3800, which illustrates Fig. 24B An alternative arrangement of strain gauge resistors is depicted. Fig.25 As depicted, the first strain gauge resistor (R 1 ) and the second strain gauge resistor (R 2 ) can be positioned on the beam center axis (A B ) and on the opposite side of the central axis (A B ) are equidistant. For example, the first strain gauge resistor (R 1 ) and the second strain gauge resistor (R 2 ) can be positioned equidistantly on the beam center axis (A B ) and the side edge of the surface to which they are mounted. In some embodiments, the first strain gauge resistor (R 1 ) and the second strain gauge resistor (R 2 ) can be positioned along the beam center axis (A B ). As depicted, in some embodiments, the first strain gauge resistor (R1 ) and the second strain gauge resistor (R 2 ) are both the same type of strain gauge resistor (for example, both are tension strain gauge resistors). Fig.25 As further depicted, the fifth strain gauge resistor (R 5 ) and the sixth strain gauge resistor (R 6 ) is positioned with the beam center axis (A B ) is axially aligned. As depicted, the sixth strain gauge resistor (R 6 ) relative to the fifth strain gauge resistor (R 5 ) is positioned distally. As depicted, the fifth strain gauge resistor (R 5 ) is a tensile strain gauge resistor, and the sixth strain gauge resistor (R 6 ) is the compression strain gauge resistor.

[0176] like Fig.25 As further depicted, the ninth strain gauge resistor (R 9 ) and the tenth strain gauge resistor (R 10 ) can be positioned on the beam center axis (A B ) and on the opposite side of the central axis (A B ) are equidistant. For example, the ninth strain gauge resistor (R 9 ) and the tenth strain gauge resistor (R 10 ) can be positioned equidistantly on the beam center axis (A B ) and the side edge of the surface on which they are mounted. In some embodiments, the ninth strain gauge resistor (R 9 ) and the tenth strain gauge resistor (R 10 ) can be positioned along the beam center axis (A B ). As depicted in the figure, in some embodiments, the ninth strain gauge resistor (R 9 ) and the tenth strain gauge resistor (R 10 ) are both the same type of strain gauge resistors (e.g., both are tensile strain gauge resistors). The sixth half-bridge circuit 3831F is positioned distally relative to the second half-bridge circuit 3831B. In addition, the thirteenth strain gauge resistor (R 13 ) and the fourteenth strain gauge resistor (R 14 ) is positioned with the beam center axis (A B ) is axially aligned. As depicted, the thirteenth strain gauge resistor (R 13 ) relative to the fourteenth strain gauge resistor (R 14 ) is positioned at the far side. As depicted in the figure, the thirteenth strain gauge resistor (R 13) is the tensile strain gauge resistor, and the fourteenth strain gauge resistor (R 14 ) is a compression strain gauge resistor. The eighth half-bridge circuit 3831H is positioned at the far side relative to the fourth half-bridge circuit 3831D.

[0177] although Fig.25 The description is made with reference to the primary distal bridge circuit combination 3834 and the secondary distal bridge circuit combination 3838, but the strain gauge resistors of the primary proximal bridge circuit combination 3832 and the secondary proximal bridge circuit combination 3836 may be similarly arranged in the alternative arrangement.

[0178] Fig.26 is an enlarged illustration of the distal portion of force sensor unit 3800, which illustrates Fig. 24B An alternative arrangement of strain gauge resistors is depicted. Fig.26 As depicted, the first strain gauge resistor (R 1 ) and the second strain gauge resistor (R 2 ) can be positioned on the beam center axis (A B ) and on the opposite side of the central axis (A B ) are equidistant. For example, the first strain gauge resistor (R 1 ) and the second strain gauge resistor (R 2 ) can be positioned equidistantly on the beam center axis (A B ) and the side edge of the surface to which they are mounted. In some embodiments, the first strain gauge resistor (R 1 ) and the second strain gauge resistor (R 2 ) can be positioned along the beam center axis (A B ). As depicted, in some embodiments, the first strain gauge resistor (R 1 ) and the second strain gauge resistor (R 2 ) are both the same type of strain gauge resistor (for example, both are tension strain gauge resistors). Fig.26 As further depicted, the fifth strain gauge resistor (R 5 ) and the sixth strain gauge resistor (R 6 ) is positioned with the beam center axis (A B ) is axially aligned. As depicted, the sixth strain gauge resistor (R 6 ) is positioned on the fifth strain gauge resistor (R 5 ) between the parts. As depicted in the figure, the fifth strain gauge resistor (R 5 ) is the tensile strain gauge resistor, and the sixth strain gauge resistor (R 6 ) is the compression strain gauge resistor.

[0179] As Fig.26 Further depicted, the ninth strain gauge resistor (R 9 ) and the tenth strain gauge resistor (R 10 ) of the sixth half-bridge circuit 3831F can be positioned on opposite sides of the beam central axis (A B ) and equidistant from the central axis (A B ). For example, the ninth strain gauge resistor (R 9 ) and the tenth strain gauge resistor (R 10 ) can be positioned equidistantly between the beam central axis (A B ) and the side edges of the surface on which they are mounted. In some embodiments, the ninth strain gauge resistor (R 9 ) and the tenth strain gauge resistor (R 10 ) can be positioned at the same proximal orientation along the beam central axis (A B ). As depicted, in some embodiments, both the ninth strain gauge resistor (R 9 ) and the tenth strain gauge resistor (R 10 ) are strain gauge resistors of the same type (e.g., both are tensile strain gauge resistors). The sixth half-bridge circuit 3831F is positioned distally relative to the second half-bridge circuit 3831B. Additionally, the thirteenth strain gauge resistor (R 13 ) and the fourteenth strain gauge resistor (R 14 ) of the eighth half-bridge circuit 3831H are positioned axially aligned with the beam central axis (A B ). As depicted, the fourteenth strain gauge resistor (R 14 ) is positioned between portions of the thirteenth strain gauge resistor (R 13 ). As depicted, the thirteenth strain gauge resistor (R 13 ) is a tensile strain gauge resistor, while the fourteenth strain gauge resistor (R 14 ) is a compressive strain gauge resistor. The eighth half-bridge circuit 3831H is positioned distally relative to the fourth half-bridge circuit 3831D.

[0180] Although Fig.26 described with reference to the primary distal bridge circuit combination 3834 and the secondary distal bridge circuit combination 3838, the strain gauge resistors of the primary proximal bridge circuit combination 3832 and the secondary proximal bridge circuit combination 3836 can be similarly arranged in the alternative arrangement.

[0181] As Fig. 27, a schematic diagram illustrating one embodiment of suitable components that may be included within controller 1800 is particularly shown in FIG. In some embodiments, controller 1800 is located within a component of surgical system 1000, such as user control unit 1100 and / or optional auxiliary equipment unit 1150. However, controller 1800 may also include a distributed computing system in which at least one aspect of controller 1800 is located at a different location from the rest of surgical system 1000, for example, at least a portion of controller 1800 may be an online controller.

[0182] As depicted, controller 1800 includes one or more processors 1802 and associated (one or more) memory devices 1804, which are configured to perform various computer-implemented functions (e.g., perform methods, steps, calculations, etc., and store related data as disclosed herein). In addition, in some embodiments, controller 1800 includes a communication module 1806 to facilitate communication between controller 1800 and various components of surgical system 1000.

[0183] As used herein, the term "processor" refers not only to what is known in the art as an integrated circuit included in a computer, but also to controllers, microcontrollers, microcomputers, programmable logic controllers (PLCs), application specific integrated circuits, and other programmable circuits. Further, (one or more) memory devices 1804 may generally include (one or more) memory elements, including but not limited to computer-readable media (e.g., random access memory (RAM)), computer-readable non-volatile media (e.g., flash memory), floppy disks, compact disk read-only memories (CD ROMs), magneto-optical disks (MODs), digital versatile disks (DVDs), and / or other suitable memory elements. Such (one or more) memory devices 1804 may generally be configured to store suitable computer-readable instructions that configure the controller 1800 to perform various functions when implemented by (one or more) processors 1802.

[0184] In some embodiments, the controller 1800 includes a tactile feedback module 1820. The tactile feedback module 1820 can be configured to sense the tactile feedback of the instrument 1400 based on the force sensor unit (e.g., the force sensor unit 3800, including the strain sensor 3830 ( Fig.13 )) receives input to deliver tactile feedback to the operator (S). In some embodiments, the tactile feedback module 1820 can be a separate module of the controller 1800. However, in some embodiments, the tactile feedback module 1820 can be included in (one or more) memory devices 1804.

[0185] The communication module 1806 may include a control input module 1808 configured to receive control inputs from the operator / surgeon (S), such as via the input device 1116 of the user control unit 1100. The communication module may also include an indicator module 1812 configured to generate various indications to alert the operator (S).

[0186] The communication module 1806 may also include a sensor interface 1810 (eg, one or more analog-to-digital converters) to allow for communication from one or more sensors (eg, the force sensor unit 2800 ( Fig.12 ) to convert signals transmitted by strain sensors 2830 of the processor 1802 into signals that can be understood and processed by the processor 1802. The sensor can be communicatively coupled to the communication module 1806 using any suitable means. For example, the sensor can be coupled to the communication module 1806 via a wired connection and / or via a wireless connection, such as by using any suitable wireless communication protocol known in the art. Additionally, in some embodiments, the communication module 1806 includes a device control module 1814 configured to modify the operating state of the instrument 1400 (and / or any of the instruments described herein (e.g., 2400, 3400). Thus, the communication module is communicatively coupled to the manipulator 1200 and / or the instrument 1400. For example, the communication module 1806 can transmit to the manipulator 1200 and / or the instrument 1400 an excitation voltage for (one or more) strain sensors, a handshake and / or excitation voltage for an orientation sensor (e.g., for detecting the orientation of a specified portion relative to a cannula), a cauterization control, an orientation set point, and / or an end effector operation set point (e.g., a grasping, cutting, and / or other similar operation performed by the end effector).

[0187] Fig.28 FIG. 4 is a flow chart of a method 4000 for controlling a surgical system according to one embodiment. In one embodiment, the method 4000 may be controlled via a remote operating system (such as a reference Figure 4-Figure 27 1000). However, it should be understood that in various embodiments, aspects of method 4000 may be implemented via additional embodiments of system 1000 or components thereof (such as apparatus 2400 and / or apparatus 3400 described herein). Thus, method 4000 may be implemented on any suitable device as described herein. Thus, method 4000 is described below with reference to medical device 2400 and controller 1800 of system 1000 as previously described, but it should be understood that method 4000 may be employed using any of the medical devices / apparatuses and controllers described herein.

[0188] like Fig.28As depicted at 4002, the controller provides haptic feedback to an input device of the surgical system. As depicted at 4004, the controller determines a moment at a reference position of a distal portion of the instrument. As depicted at 4006, the controller then determines a deflection of the reference position based on the moment (and force). Under a first condition where the deflection is greater than a deflection threshold, as depicted at 4008, the controller provides an indication that a constraint of the haptic feedback is provided to or available for providing to an operator of the input device.

[0189] Although various embodiments have been described above, it should be understood that these embodiments are presented by way of example and not limitation. In cases where the above methods and / or diagrams indicate a particular order of particular events and / or process patterns, the order of the particular events and / or operations may be modified. Although embodiments have been particularly shown and described, it should be understood that various changes may be made in form and detail.

[0190] For example, any one of the instruments described herein (and components thereof) is optionally a part of a surgical assembly for performing minimally invasive surgical procedures, and it may include a manipulator unit, a series of kinematic linkages, a series of cannulas, etc. Thus, any one of the instruments described herein can be used in any suitable surgical system, such as the MIRS system 1000 shown and described above. Additionally, any one of the instruments shown and described herein can be used to manipulate target tissue during a surgical procedure. Such target tissue can be cancer cells, tumor cells, lesions, vascular occlusions, thrombi, stones, uterine fibroids, bone metastases, adenomyosis, or any other body tissue. The examples presented of target tissue are not an exhaustive list. Additionally, the target structure can also include artificial substances (or non-tissue) within or associated with the body, such as a stent within the body, a portion of an artificial tube, a fastener, etc.

[0191] For example, any one of the components of the surgical instrument described herein can be constructed of any material (such as medical grade stainless steel, nickel alloy, titanium alloy, etc.). Further, any one of the linkages, tool members, beams, shafts, cables, or other components described herein can be constructed of multiple parts that are joined together later. For example, in some embodiments, a linkage can be constructed by joining separately constructed components. However, in other embodiments, any one of the linkages, tool members, beams, shafts, cables, or components described herein can be constructed as a unitary piece.

[0192] Although various embodiments are described as having specific features and / or component combinations, other embodiments can also have any combination of features and / or components from any of the embodiments discussed above. Aspects have been described in the general context of medical devices (and more specifically surgical instruments), but the inventive aspects are not necessarily limited to use in medical devices.

Claims

1. A method for controlling a surgical system, the surgical system comprising a controller, an input device, and a medical instrument, the medical instrument being operably connected to be controlled by the input device via the controller, the method comprising: providing tactile feedback to the input device via the controller; determining, via the controller, a torque at a reference position of a distal portion of the instrument; determining, via the controller, a deflection of the reference position based on the moment; as well as Under a first condition in which the deflection is greater than a deflection threshold, an indication is provided to an operator of the input device via the controller that the tactile feedback is constrained from being provided or available to be provided to the input device.

2. The method according to claim 1, in: The reference position is located at a longitudinal location along the medical device that is coplanar with a hard stop location that limits deflection of the reference position.

3. The method according to any one of claims 1 or 2, in: The medical device includes an end effector and a force sensor unit coupled to the distal portion of the device; The force sensor unit includes a beam and one or more strain sensors coupled to the beam; and Determining the torque includes determining the torque based on outputs of the one or more strain sensors.

4. The method according to claim 3, in: The one or more strain sensors include a first bridge circuit and a second bridge circuit; The first bridge circuit includes a first gauge resistor and a second gauge resistor; and The second bridge circuit includes a third gauge resistor and a fourth gauge resistor.

5. The method according to claim 3, in: The one or more strain sensors include a first bridge circuit and a second bridge circuit; and The torque is determined based on an output voltage of the first bridge circuit and an output voltage of the second bridge circuit.

6. The method according to claim 5, in: The method further includes determining, via the controller, the determined force at the reference position based on the output voltage of the first bridge circuit and the output voltage of the second bridge circuit.

7. The method according to any one of claims 1 or 2, in: The method further includes determining, via the controller, an estimated applied force on the medical device based on the moment; as well as The method further includes performing, by the controller, an operation of the surgical system based on the estimated applied force.

8. The method according to claim 7, in: The method further includes transmitting a magnitude of haptic feedback corresponding to the estimated applied force to an operator of the input device.

9. The method according to claim 7, in: The method further includes interrupting, via the controller, operation of the surgical system when the estimated applied force exceeds a threshold.

10. The method according to any one of claims 1 or 2, in: The indication includes one or more of a visual indication, an audible indication, or a tactile indication.

11. The method according to any one of claims 1 or 2, in: The restriction of the tactile feedback corresponds to an interruption of operation of the surgical system.

12. The method according to any one of claims 1 or 2, in: After the first condition and under a second condition in which the deflection is less than the deflection threshold, the method includes removing, via the controller, the constraint of the haptic feedback.

13. A surgical system, comprising: a medical device, which is supported by the manipulator unit; an input device operably coupled to the medical device; and a controller operably coupled to the manipulator unit and the input device, the controller comprising at least one processor and a tactile feedback module configured to perform a plurality of operations comprising: providing tactile feedback to the input device, determining a moment at a reference position of the distal portion of the instrument, determining a deflection of the reference position based on the moment, and Under a first condition where the deflection is greater than a deflection threshold, an indication is provided to an operator of the input device that a constraint on the tactile feedback is provided or available to be provided to the input device.

14. The surgical system according to claim 13, in: The reference position is located at a longitudinal location along the medical device that is coplanar with a hard stop location that limits deflection of the reference position.

15. The surgical system according to any one of claims 13 or 14, in: The medical device includes an end effector and a force sensor unit coupled to the distal portion of the device; The force sensor unit includes a beam and one or more strain sensors coupled to the beam; and Determining the torque includes determining the torque based on outputs of the one or more strain sensors.

16. The surgical system according to claim 15, in: The one or more strain sensors include a first bridge circuit and a second bridge circuit; The first bridge circuit includes a first gauge resistor and a second gauge resistor; and The second bridge circuit includes a third gauge resistor and a fourth gauge resistor.

17. The surgical system according to claim 15, in: The one or more strain sensors include a first bridge circuit and a second bridge circuit; and The torque is determined based on an output voltage of the first bridge circuit and an output voltage of the second bridge circuit.

18. The surgical system according to claim 17, in: The plurality of operations further include determining the determined force at the reference location based on the output voltage of the first bridge circuit and the output voltage of the second bridge circuit.

19. The surgical system according to any one of claims 13 or 14, in: The plurality of operations further include: determining an estimated applied force on the medical device based on the moment, and An operation of the surgical system is performed based on the estimated applied force.

20. The surgical system according to claim 19, in: The plurality of operations further includes transmitting a magnitude of haptic feedback corresponding to the estimated applied force to an operator of the input device.

21. The surgical system according to claim 19, in: The plurality of operations further include interrupting operation of the surgical system when the estimated applied force exceeds a threshold value.

22. The surgical system according to any one of claims 13 or 14, in: The indication includes one or more of a visual indication, an audible indication, or a tactile indication.

23. The surgical system according to any one of claims 13 or 14, in: The restriction of the tactile feedback corresponds to an interruption of operation of the surgical system.

24. The surgical system according to any one of claims 13 or 14, in: After the first condition and under a second condition that the deflection is less than the deflection threshold, the plurality of operations include removing the constraint of the haptic feedback.

Images