Device for measuring contact resistivity between short samples of multi-parameter superconducting strip

Abstract

The invention discloses a device for measuring the contact resistivity between short samples of a multi-parameter superconducting tape, and belongs to the technical field of measurement of the contact resistivity between the short samples of the superconducting tape. In the device, a pressure loading device is mounted in the center of a mounting base, and the inner wall of the pressure loading device clings to the short samples of the superconducting tape; the temperature loading device is located at the bottom of the superconducting strip short sample, and two ends are connected with the heating power supply; the magnetic field loading device is located outside; the sensor is located at the top of the superconducting strip short sample; the current loading base is mounted on the mounting base, and the inner wall of the current loading base clings to the end part of the superconducting strip short sample and is connected with a loading power supply through a current lead; the signal acquisition system is connected with two ends of the sensor and the superconducting strip short sample. The method can comprehensively evaluate the influence of pressure, pressure circulation, temperature, magnetic field, current and other factors on the contact resistivity, and has the advantages of high measurement precision, wide application range and convenient operation.

Description

Technical Field

[0001] The present invention belongs to the technical field of measuring the contact resistivity between short samples of superconducting tapes, and particularly relates to a device for measuring the contact resistivity between short samples of multi-parameter superconducting tapes. Background Art

[0002] Superconductors are widely used to manufacture superconducting magnets to generate strong magnetic fields due to their zero-resistance effect, which enables them to carry huge currents with almost no heat generation, thus avoiding high operating costs. In recent years, with the development of high-temperature superconducting technology, the operating temperature of superconducting magnets has been raised from below 4.2 K to 20 - 77 K, significantly reducing their operating costs and expanding their applicable scenarios.

[0003] Early high-temperature superconducting magnets were wound using insulation technology, achieving inter-turn insulation by wrapping insulating materials on the tape surface. However, due to the wrapped insulating materials, insulated superconducting magnets have poor thermal conductivity, and it is difficult for heat to dissipate quickly during a quench, which may cause damage to the entire magnet and result in huge economic losses. Therefore, scientists have proposed non-insulation technology and metal-insulation technology, which remove the inter-turn insulation layer between superconducting tapes and directly wind superconducting magnets with bare wires to achieve the effect of self-protection during a quench.

[0004] However, non-insulation and metal-insulation high-temperature superconducting magnets will produce a radial shunt effect during charge and discharge processes, which will cause additional magnetic field delay and charging loss in the magnet. The radial shunt effect of the magnet is directly affected by the contact resistivity between superconducting tapes. In addition, the contact resistivity is also affected by many parameters such as current, temperature, magnetic field, pressure, and number of cycles. Existing contact resistivity measurement devices cannot simultaneously consider the above-mentioned many parameters for simultaneous measurement. Summary of the Invention

[0005] To solve the above technical problems, the present invention provides a device for measuring the contact resistivity between short samples of multi-parameter superconducting tapes, which can simultaneously consider the effects of current, temperature, magnetic field, pressure, and number of cycles on the measurement results of contact resistivity during the measurement process and has wide applicability.

[0006] To achieve the above object, the present invention adopts the following technical solutions:

[0007] A device for measuring the contact resistivity between short samples of multi-parameter superconducting tapes includes a pressure loading device, a temperature loading device, a magnetic field loading device, sensors, a current loading base, current leads, a loading power supply, a heating power supply, a signal acquisition system, and a mounting base;

[0008] The pressure loading device is installed at the center of the installation base, and its inner wall is closely attached to the measurement loading area of the short sample of the superconducting tape, for applying pressure; the temperature loading device is located at the bottom of the measurement loading area of the short sample of the superconducting tape, for applying heat and adjusting the temperature, and its two ends are connected to the heating power supply; the magnetic field loading device is located at a preset distance from the short sample of the superconducting tape, for applying a background magnetic field; the sensor is located at the top of the measurement loading area of the short sample of the superconducting tape, for collecting pressure, temperature, and magnetic field signals; the current loading base is installed on the installation base, and its inner wall is closely attached to the end of the short sample of the superconducting tape, and at the same time is connected to the loading power supply through the current lead, for applying current; the signal acquisition system is connected to the sensor and both ends of the short sample of the superconducting tape, for measuring the magnitudes of pressure, temperature, magnetic field, and voltage, and at the same time passing a constant current into the sensor.

[0009] Further, the pressure loading device includes a measurement loading fixing seat, a pressure adjusting device, and a buffer block. The measurement loading fixing seat is installed at the center of the installation base, and is designed as a hollow structure. The short sample of the superconducting tape, the temperature loading device, and the sensor are installed inside it, playing a role of support and fixation; a threaded hole is provided at the top of the measurement loading fixing seat, and the pressure adjusting device passes through the measurement loading fixing seat through the threaded hole, and its lower end is closely attached to the buffer block, playing a role of adjusting the loading pressure; the buffer block is located inside the measurement loading fixing seat, its lower end is closely attached to the measurement loading area of the short sample of the superconducting tape, and its upper end is closely attached to the pressure adjusting device, playing a role of uniformly applying pressure and buffering pressure.

[0010] Specifically, during the measurement process, generally a torque wrench is used to control the pressure of the pressure adjusting device, and by adjusting the tightness of the pressure adjusting device, the fitting degree between the buffer block and the measurement loading area of the short sample of the superconducting tape is adjusted to achieve the purpose of precisely adjusting the pressure.

[0011] Further, after each application of pressure is completed, the pressure adjustment cycle times can be achieved by loosening and then tightening the pressure adjusting device again, which is convenient and fast.

[0012] Further, several pressure adjusting devices can be set in actual measurement. Correspondingly, several threaded holes need to be provided at the top of the measurement loading fixing seat, and the pressure adjusting devices act together to adjust the pressure, improving the uniformity of the pressure.

[0013] It should be particularly noted that for measurements with high requirements for the accuracy of the loading pressure and a large number of pressure cycle times, the pressure adjusting device can be replaced by a torque motor drive to improve the accuracy of the loading pressure and achieve program control for multiple cycles.

[0014] Furthermore, the measurement loading fixture, the pressure regulating device, and the buffer block are all made of cryogenic non-magnetic metal materials, and a polytetrafluoroethylene film is sprayed on the side wall of the buffer block to ensure insulation.

[0015] Furthermore, enameled nickel-chromium wire is wound around the surface of the temperature loading device. The enameled nickel-chromium wire is wound around the temperature loading device in a non-inductive manner, and its two ends are directly connected to the heating power supply. The enameled nickel-chromium wire has the characteristic of high resistance. By heating the enameled nickel-chromium wire to apply heat, the temperature of the short sample of the superconducting tape is adjusted.

[0016] Furthermore, the surface of the temperature loading device close to the short sample of the superconducting tape is covered with Kapton tape to ensure insulation and avoid current interference between the two.

[0017] Furthermore, the temperature loading device is made of oxygen-free copper material with high thermal conductivity to ensure the thermal conductivity.

[0018] Furthermore, the magnetic field loading device adopts a conventional water-cooled magnet or a superconducting magnet, and specifically needs to be further confirmed according to the required magnitude of the background magnetic field.

[0019] Furthermore, the magnetic field loading device needs an external power supply. By energizing the external power supply, the magnetic field loading device is excited to generate a background magnetic field, and the magnitude of the background magnetic field of the short sample of the superconducting tape is adjusted by adjusting the magnitude of the current of the external power supply.

[0020] Furthermore, the magnetic field loading device needs to reserve a sufficient aperture in the center to accommodate the measuring device, and the distance between the signal acquisition system and the magnetic field loading device needs to be noted during the measurement to ensure that the magnetic field signal does not affect the signal collected by the signal acquisition system.

[0021] Furthermore, the magnetic field loading device needs to ensure a certain magnetic field uniformity to guarantee the magnetic field uniformity in the measurement loading area of the short sample of the superconducting tape.

[0022] Furthermore, the sensor includes a pressure sensor, a temperature sensor, and a magnetic field sensor. The pressure sensor usually adopts a strain gauge, the temperature sensor usually adopts a platinum resistance thermometer or a rhodium-iron resistance thermometer, and the magnetic field sensor usually adopts a Hall element, and specifically needs to be selected according to the ranges of the measured pressure, temperature, and magnetic field.

[0023] Furthermore, a constant current usually needs to be applied during the operation of the sensor, and then the pressure, temperature, and magnetic field signals are converted into voltage signals.

[0024] Furthermore, the signal acquisition system internally includes a constant current source module and a signal acquisition module. The constant current source module is used to apply a constant current to the sensor, and the signal acquisition module is used to collect the terminal voltage of the measurement loading area of the signal sensor and the superconducting tape short sample. After collecting the voltage signal of the sensor, the signal acquisition module further converts it into pressure, temperature, and magnetic field signals.

[0025] Furthermore, the current loading base and the current lead are made of high-conductivity copper, and the two are fixed by welding or screw connection.

[0026] Furthermore, the multi-parameter superconducting tape short sample inter-contact resistivity measurement device of the present invention measures the contact resistivity of the superconducting tape short sample by the four-wire method.

[0027] Furthermore, the contact resistivity of the high-temperature superconducting tape short sample can be measured by stacking multiple short samples to reduce the measurement deviation. It is only necessary to convert the total contact resistance obtained by measurement into the contact resistance between two short samples.

[0028] Furthermore, the measurement temperature range of the multi-parameter superconducting tape short sample inter-contact resistivity measurement device is usually between the liquid helium temperature range and the liquid nitrogen temperature range. Therefore, its test environment is usually a liquid nitrogen immersion environment or a conduction cooling environment. When the minimum value of the measurement temperature range of the multi-parameter superconducting tape short sample inter-contact resistivity measurement device is greater than 77 K, liquid nitrogen immersion is used for cooling; when the minimum value of the measurement temperature range of the multi-parameter superconducting tape short sample inter-contact resistivity measurement device is lower than 77 K, a refrigerator conduction cooling method is usually required, and a corresponding heat conduction structure needs to be set up to provide cooling for the superconducting tape short sample.

[0029] It should be noted that although the contact resistivity between superconducting tape short samples is affected by various factors, generally only the influence of one or two factors needs to be studied during the research process. In this case, the corresponding loading device and measurement device can be removed to improve convenience.

[0030] Furthermore, the mounting base is made of insulating non-metallic materials such as epoxy resin.

[0031] Furthermore, the measurement loading area is located in the overlapping area of the high-temperature superconducting tape short sample.

[0032] The beneficial effects of the present invention are as follows:

[0033] (1) The multi-parameter superconducting tape short sample inter-contact resistivity measurement device designed by the present invention can comprehensively evaluate the influence of various factors such as pressure, pressure cycle, temperature, magnetic field, and current on the contact resistivity between superconducting tape short samples, and has a wide range of applications;

[0034] (2) The contact resistivity measurement device for short samples of multi-parameter superconducting tapes designed by the present invention applies a load through a dedicated loading device and monitors the real-time state of the short samples through sensors, with the advantages of high loading accuracy and good measurement effect;

[0035] (3) The loading devices designed in the contact resistivity measurement device for short samples of multi-parameter superconducting tapes designed by the present invention do not interfere with each other, are easy to disassemble, and are simple to operate. Description of the Drawings

[0036] Figure 1 is a schematic structural diagram of a contact resistivity measurement device for short samples of multi-parameter superconducting tapes of the present invention;

[0037] Figure 2 is a schematic installation diagram of the pressure loading device and the current loading base in an embodiment of the present invention;

[0038] Figure 3 is a schematic structural and layout diagram of a short sample of a REBCO high-temperature superconducting tape, which is a typical embodiment of the present invention.

[0039] Reference Numerals:

[0040] 1: Short sample of superconducting tape; 2: Pressure loading device; 3: Temperature loading device; 4: Magnetic field loading device; 5: Sensor; 6: Current loading base; 7: Current lead; 8: Loading power supply; 9: Heating power supply; 10: Signal acquisition system; 11: Installation base; 101: Copper layer of REBCO tape; 102: Silver layer of REBCO tape; 103: Buffer layer and base layer of REBCO tape; 104: Superconducting layer of REBCO tape; 105: Measurement loading area; 201: Measurement loading fixing seat; 202: Pressure regulating device; 203: Buffer block. Detailed Embodiments

[0041] The present invention will be further described below with reference to the drawings and embodiments.

[0042] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention. Obviously, the described embodiments are some, but not all, of the embodiments of the present invention. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present invention without creative efforts shall fall within the protection scope of the present invention.

[0043] In the drawings, components with the same structure are denoted by the same reference numerals, and components with similar structures or functions everywhere are denoted by similar reference numerals. The dimensions and thicknesses of each component shown in the drawings are arbitrarily shown, and the present invention does not limit the dimensions and thicknesses of each component. To make the illustration clearer, the thicknesses of the components are appropriately exaggerated in some places in the drawings.

[0044] Figure 1 The figure shows a schematic structural diagram of a multi-parameter superconducting tape short sample inter-contact resistivity measurement device according to an embodiment of the present invention, including a superconducting tape short sample 1, a pressure loading device 2, a temperature loading device 3, a magnetic field loading device 4, a sensor 5, a current loading base 6, a current lead 7, a loading power supply 8, a heating power supply 9, and a signal acquisition system 10. The pressure loading device 2 is installed on the installation base 11, and its inner wall is closely attached to the measurement loading area 105 of the superconducting tape short sample 1 for applying pressure; the temperature loading device 3 is located at the bottom of the measurement loading area 105 of the superconducting tape short sample 1 for applying heat and adjusting the temperature, and its two ends are connected to the heating power supply 9; the magnetic field loading device 4 is located outside for applying a background magnetic field; the sensor 5 is located at the top of the measurement loading area 105 of the superconducting tape short sample 1 for collecting pressure, temperature, and magnetic field signals; the current loading base 6 is installed on the installation base 11, and its inner wall is closely attached to the end of the superconducting tape short sample 1, and at the same time is connected to the loading power supply 8 through the current lead 7 for applying current; the signal acquisition system 10 is connected to the sensor 5 and both ends of the superconducting tape short sample 1 for measuring the magnitudes of pressure, temperature, magnetic field, and voltage, and at the same time passing a constant current into the sensor 5.

[0045] The surface of the temperature loading device 3 is wound with enameled nickel-chromium wire, and the enameled nickel-chromium wire is wound on the temperature loading device 3 in a non-inductive manner, and its two ends are directly connected to the heating power supply 8. The enameled nickel-chromium wire has the characteristic of high resistance, and heat is applied by heating the enameled nickel-chromium wire to adjust the temperature of the superconducting tape short sample 1.

[0046] One side surface of the temperature loading device 3 close to the superconducting tape short sample 1 is covered with Kapton tape to ensure insulation and avoid current interference between the two.

[0047] The temperature loading device 3 is made of oxygen-free copper material with high thermal conductivity to ensure the thermal conductivity.

[0048] The magnetic field loading device 4 uses a conventional water-cooled magnet or a superconducting magnet, and specifically needs to be further confirmed according to the magnitude of the required background magnetic field.

[0049] The magnetic field loading device 4 needs an external power supply. By energizing the external power supply, the magnetic field loading device is excited to generate a background magnetic field, and the magnitude of the background magnetic field of the short sample 1 of the superconducting tape is adjusted by adjusting the magnitude of the current of the external power supply.

[0050] The magnetic field loading device 4 needs to reserve a sufficient aperture in the center to accommodate the measuring device. During the measurement process, attention should be paid to the distance between the signal acquisition system 10 and the magnetic field loading device 4 to ensure that the magnetic field signal does not affect the signal collected by the signal acquisition system 10.

[0051] The magnetic field loading device 4 needs to ensure a certain magnetic field uniformity to guarantee the magnetic field uniformity of the measurement loading area 105 of the short sample 1 of the superconducting tape.

[0052] The sensor 5 includes a pressure sensor, a temperature sensor, and a magnetic field sensor. The pressure sensor usually uses a strain gauge, the temperature sensor usually uses a platinum resistance thermometer or a rhodium-iron resistance thermometer, and the magnetic field sensor usually uses a Hall element, which specifically needs to be selected according to the ranges of measured pressure, temperature, and magnetic field.

[0053] During operation, the sensor 5 usually needs to apply a constant current, and then converts the pressure, temperature, and magnetic field signals into voltage signals.

[0054] The signal acquisition system 10 internally includes a constant current source module and a signal acquisition module. The constant current source module is used to apply a constant current to the sensor 5, and the signal acquisition module is used to collect the terminal voltages of the signal sensor 5 and the measurement loading area 105 of the short sample 1 of the superconducting tape. After collecting the voltage signal of the sensor 5, the signal acquisition module further converts it into pressure, temperature, and magnetic field signals.

[0055] The current loading base 6 and the current lead 7 are made of high-conductivity copper, and are fixed by welding or screw connection between them.

[0056] The multi-parameter superconducting tape short sample inter-contact resistivity measuring device of the present invention measures the contact resistivity of the short sample 1 of the superconducting tape by the four-wire method. Specifically, a loading current I is applied to the short sample 1 of the superconducting tape through the loading power supply 8, and the terminal voltage U of the measurement loading area 105 of the short sample 1 of the superconducting tape is measured through the signal acquisition system 10. The contact resistance R between the short samples of the superconducting tape c Satisfies:

[0057] ,

[0058] wherein, the contact resistance R between the short samples of the superconducting tape cIt is related to the pressure P, the number of pressure cycles C, the temperature T, the magnetic field B, and the current I. Therefore, the multi-parameter superconducting tape short sample contact resistivity measurement device of the present invention can comprehensively consider the influence of various parameters on the contact resistivity between short samples of superconducting tape, and improve the measurement accuracy.

[0059] Furthermore, the contact resistivity of the short sample 1 of the high-temperature superconducting tape can be measured by stacking multiple short samples to reduce the measurement deviation. It is only necessary to convert the total measured contact resistance into the contact resistance between two short samples.

[0060] Furthermore, the contact resistivity ρ between short samples of superconducting tape c satisfies:

[0061] ,

[0062] where l and w are the length and width of the measurement loading area 105 of the short sample 1 of the superconducting tape, respectively.

[0063] The measurement temperature range of the multi-parameter superconducting tape short sample contact resistivity measurement device is usually between the liquid helium temperature range and the liquid nitrogen temperature range. Therefore, its test environment is usually a liquid nitrogen immersion environment or a conduction cooling environment. When the minimum value of the measurement temperature range of the multi-parameter superconducting tape short sample contact resistivity measurement device is greater than 77 K, liquid nitrogen immersion is used for cooling; when the minimum value of the measurement temperature range of the multi-parameter superconducting tape short sample contact resistivity measurement device is lower than 77 K, a cryocooler conduction cooling method is usually required, and a corresponding heat conduction structure needs to be set up to provide cooling for the short sample 1 of the superconducting tape.

[0064] It should be noted that although the contact resistivity between short samples of superconducting tape is affected by various factors, generally only the influence of one or two factors needs to be studied during the research process. In this case, the corresponding loading device and measurement device can be removed to improve convenience.

[0065] Figure 2The following is an installation schematic diagram of the pressure loading device and the current loading base in an embodiment of the present invention, including a short sample of superconducting tape 1, a current loading base 6, a mounting base 11, a measurement loading fixing base 201, a pressure adjusting device 202, and a buffer block 203. The measurement loading fixing base 201 is installed at the center of the mounting base 11 and is designed as a hollow structure. The short sample of superconducting tape 1, the temperature loading device 3, and the sensor 5 are installed inside it to play a role in support and fixation; a threaded hole is provided at the top of the measurement loading fixing base 201, and the pressure adjusting device 202 passes through the measurement loading fixing base 201 through the threaded hole, and its lower end is closely attached to the buffer block 203 to play a role in adjusting the loading pressure; the buffer block 203 is located inside the measurement loading fixing base 201, its lower end is closely attached to the measurement loading area 105 of the short sample of superconducting tape 1, and its upper end is closely attached to the pressure adjusting device 202 to play a role in uniformly applying pressure and buffering pressure.

[0066] Specifically, during the measurement process, generally a torque wrench is used to control the pressure of the pressure adjusting device 202, and the degree of fit between the buffer block 203 and the measurement loading area 105 of the short sample of superconducting tape 1 is adjusted by adjusting the tightness of the pressure adjusting device 202 to achieve the purpose of precisely adjusting the pressure P.

[0067] Further, after each application of pressure, the number of pressure cycle times C can be adjusted by loosening and then tightening the pressure adjusting device 202 again, which is convenient and fast.

[0068] Further, several pressure adjusting devices 202 can be provided in actual measurement. Correspondingly, several threaded holes need to be provided at the top of the measurement loading fixing base 201, and the pressure adjusting devices 202 act together to adjust the pressure to improve the uniformity of the pressure P.

[0069] It should be particularly noted that for measurements with higher requirements for the accuracy of the loading pressure P and more requirements for the number of pressure cycle times C, the pressure adjusting device 202 can be replaced by a torque motor drive to improve the accuracy of the loading pressure P and achieve program-controlled multiple cycles.

[0070] The measurement loading fixing base 201, the pressure adjusting device 202, and the buffer block 203 are all made of low-temperature resistant non-magnetic metal materials, and the side wall of the buffer block 203 is sprayed with a polytetrafluoroethylene film to ensure insulation.

[0071] The mounting base 11 is made of an insulating non-metallic material such as epoxy resin.

[0072] Figure 3The figure shows a schematic diagram of the structure and layout of a short sample of a REBCO high-temperature superconducting tape according to a typical embodiment of the present invention, including a copper layer 101 of the REBCO tape, a silver layer 102 of the REBCO tape, a buffer layer and a base layer 103 of the REBCO tape, a superconducting layer 104 of the REBCO tape, and a measurement and loading area 105. The structure of the REBCO high-temperature superconducting tape is asymmetrically distributed, with the copper layer 101 of the REBCO tape and the silver layer 102 of the REBCO tape wrapped on both sides respectively, and the buffer layer and the base layer 103 of the REBCO tape and the superconducting layer 104 of the REBCO tape are located in the middle of the REBCO high-temperature superconducting tape. The measurement and loading area 105 is located in the overlapping area of the short sample of the REBCO high-temperature superconducting tape.

[0073] For the REBCO high-temperature superconducting tape, the side where the superconducting layer 104 of the REBCO tape is close to is called the superconducting surface, and the other side is called the non-superconducting surface. During the test, it is necessary to ensure that the superconducting surface of a short sample of the REBCO high-temperature superconducting tape faces the non-superconducting surface of another short sample of the REBCO high-temperature superconducting tape to approximate the actual operating environment.

[0074] A multi-parameter superconducting tape short sample inter-contact resistivity measurement device of the present invention can measure the inter-contact resistivity between various superconducting tape short samples. When using the present invention to measure the inter-contact resistivity of other tapes, only need to Figure 3 replace the short sample of the REBCO high-temperature superconducting tape shown with the short sample of other tapes to be measured.

[0075] The specific embodiments described above further elaborate on the purpose, technical solutions, and beneficial effects of the present invention. It should be understood that the above are only specific embodiments of the present invention and are not used to limit the present invention. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principles of the present invention shall be included within the protection scope of the present invention.

Claims

1. A multi-parameter superconducting tape short sample contact resistivity measurement device, characterized in that: It comprises a pressure loading device (2), a temperature loading device (3), a magnetic field loading device (4), a sensor (5), a loading power supply (8), and a signal acquisition system (10); The superconducting tape short sample (1) is located inside the pressure loading device (2), and the pressure loading device (2) is used to apply pressure; The temperature loading device (3) is located at the bottom of the superconducting tape short sample (1) and is used to apply heat and adjust the temperature; The magnetic field loading device (4) is located at a preset distance from the superconducting tape short sample (1) and is used to apply a background magnetic field; The sensor (5) is located on the upper part of the superconducting tape short sample (1) and is used to collect pressure, temperature and magnetic field signals of the superconducting tape short sample (1); The loading power source (8) is connected to both ends of the superconducting tape short sample (1) to apply current; The signal acquisition system (10) is connected to the sensor (5) and two ends of the superconducting tape short sample (1) and is used to collect the magnitudes of pressure, temperature, magnetic field and voltage.

2. A multi-parameter superconducting tape short sample contact resistivity measurement device according to claim 1, characterized in that: It also includes a current loading base (6), a current lead (7), and a mounting base (11). The current loading base (6) is mounted on the mounting base (11), and its inner wall is closely attached to the ends of both ends of the superconducting tape short sample (1). The current lead (7) is connected to the loading power supply (8) to apply current.

3. A multi-parameter superconducting tape short sample contact resistivity measurement device according to claim 1, characterized in that: It also includes a heating power source (9), and both ends of the temperature loading device (3) are connected to the heating power source (9).

4. A multi-parameter superconducting tape short sample contact resistivity measurement device according to claim 2, characterized in that: The pressure loading device (2) comprises a measurement loading fixing seat (201), a pressure regulating device (202), and a buffer block (203); the measurement loading fixing seat (201) is mounted at the center of the mounting base (11); the pressure regulating device (202) passes through the measurement loading fixing seat (201) through a threaded hole and is connected to the buffer block (203); the buffer block (203) is located inside the hollow measurement loading fixing seat (201); the lower end of the buffer block (203) is connected to the measurement loading area (105) of the superconducting tape short sample (1); and the degree of fit between the buffer block (203) and the measurement loading area (105) of the superconducting tape short sample (1) is adjusted by adjusting the tightness of the pressure regulating device (202).

5. A multi-parameter superconducting tape short sample contact resistivity measurement device according to claim 4, characterized in that: The superconducting tape short sample (1), the temperature loading device (3), and the sensor (5) are all located inside the measurement loading fixing seat (201).

6. A multi-parameter superconducting tape short sample contact resistivity measurement device according to claim 4, characterized in that: When a plurality of the pressure regulating devices (202) are provided, a plurality of threaded holes are correspondingly provided on the top of the measurement loading fixing seat (201).

7. A multi-parameter superconducting tape short sample contact resistivity measurement device according to claim 4, characterized in that: The measurement loading fixing seat (201), the pressure regulating device (202), and the buffer block (203) are all made of low-temperature resistant non-magnetic metal materials, and the side wall of the buffer block (203) is sprayed with a polytetrafluoroethylene film to ensure insulation.

8. A multi-parameter superconducting tape short sample contact resistivity measurement device according to claim 3, characterized in that: The surface of the temperature loading device (3) is wound with an enameled nickel-chromium wire, and both ends of the enameled nickel-chromium wire are directly connected to the heating power source (9). The enameled nickel-chromium wire has the characteristic of high resistance. By heating the enameled nickel-chromium wire to apply heat, the temperature of the superconducting tape short sample (1) is adjusted.

9. A multi-parameter superconducting tape short sample contact resistivity measurement device according to claim 3, characterized in that: The temperature loading device (3) is made of oxygen-free copper material with high thermal conductivity; the surface of one side of the temperature loading device (3) close to the superconducting tape short sample (1) is covered with Kapton tape to ensure insulation.

10. A multi-parameter superconducting tape short sample contact resistivity measurement device according to claim 1, characterized in that: The magnetic field loading device (4) uses a water-cooled magnet or a superconducting magnet, which is connected to an external power supply. By energizing the external power supply, the magnetic field loading device (4) is excited to generate a background magnetic field. By adjusting the current of the external power supply, the background magnetic field size of the superconducting tape short sample (1) is adjusted.

11. A multi-parameter superconducting tape short sample contact resistivity measurement device according to claim 1, characterized in that: The sensor (5) comprises a pressure sensor, a temperature sensor and a magnetic field sensor. The pressure sensor uses a strain gauge, the temperature sensor uses a platinum resistance thermometer or a rhodium iron resistance thermometer, and the magnetic field sensor usually uses a Hall element. The sensor (5) converts the collected pressure, temperature and magnetic field signals into voltage signals.

12. A multi-parameter superconducting tape short sample contact resistivity measurement device according to claim 1, characterized in that: The signal acquisition system (10) comprises a constant current source module and a signal acquisition module, wherein the constant current source module is used to apply a constant current to the sensor (5), and the signal acquisition module is used to collect the voltage signal of the sensor (5) and convert it into pressure, temperature and magnetic field signals, and collect the terminal voltage of the measurement loading area (105) of the superconducting tape short sample (1).

13. A multi-parameter superconducting tape short sample contact resistivity measurement device according to claim 2, characterized in that: The current loading base (6) and the current lead (7) are made of high-conductivity copper and are connected and fixed by welding or screws; the mounting base (11) is made of epoxy resin.

14. A multi-parameter superconducting tape short sample contact resistivity measurement device according to claim 1, characterized in that: The contact resistivity of the superconducting tape short sample (1) is measured using a four-lead method.

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