Satellite load communication test platform, darkroom and method

Abstract

The invention discloses a satellite load communication test platform, darkroom and method, and belongs to the field of satellite load communication tests.The platform comprises a control system, a test instrument, test system equipment and a mechanical control system; the test system equipment comprises a multi-feed source group, a first signal conditioning module, a second signal conditioning module and a switch matrix, and the mechanical control system comprises a multi-axis turntable for placing a satellite to be tested and a motion axis group for placing the multi-feed source group. The multi-axis turntable, the motion axis group, the switch matrix and the like are controlled by the control system to perform attitude adjustment, link switching and the like, so that full-automatic testing of single-beam multi-target-point beam hopping and multi-beam multi-target-point beam hopping bidirectional communication can be realized, and the functions of point-to-point communication testing and multi-target testing are met; meanwhile, various far-field performance tests of a load satellite, a phased-array antenna and a passive antenna are compatible, the test is convenient and fast, and the test efficiency is high.

Description

Technical Field

[0001] The present invention relates to the field of satellite payload communication testing, and in particular to a satellite payload communication testing platform, darkroom and method. Background Art

[0002] As satellite communications, commercial aerospace and other systems become more powerful and complex, in various scenarios, the research and development, production, and debugging of satellite payload systems require more reliable and real test equipment to effectively evaluate the performance indicators of the entire system. With the mass production of payload satellites, a set of fully automated and highly compatible satellite payload communication test system equipment will effectively improve efficiency, accuracy, practicality and other aspects to meet the needs of scientific research, production and testing.

[0003] Satellite payload communication testing is a necessary means to diagnose and verify the comprehensive performance of satellites, especially the performance diagnosis of each phased array antenna and forwarding antenna distributed on the satellite. Through the darkroom system and feed source simulation test, the corresponding data indicators of the satellite test are obtained, and then the performance of the whole satellite is comprehensively analyzed to see whether it meets the launch requirements.

[0004] At present, most of the existing darkroom test systems are mainly used to test single phased array antennas or passive antennas. The environment is relatively limited, and only single-beam synthesis tests can be performed. Multi-antenna and multi-beam tests cannot be performed. If some large darkrooms need to perform satellite payload communication tests, the test environment needs to be manually built or simulated. The artificial construction of the test environment will introduce large installation errors and there are certain safety factors. In addition, every time the test beam or category is changed, the test environment needs to be manually changed, which greatly affects the test efficiency. The random errors introduced during the test will also directly affect the test results, and the test coverage, consistency, and test efficiency cannot be guaranteed. Furthermore, when testing different satellites or antennas, the original test environment needs to be dismantled and built, which wastes manpower and time, and it is difficult to ensure the accuracy of the test environment and test data. Summary of the invention

[0005] The purpose of the present invention is to overcome the problems of the prior art and to provide a satellite payload communication test platform, a darkroom and a method.

[0006] The object of the present invention is achieved through the following technical solutions: a satellite payload communication test platform, which works in a darkroom and includes a control system, a test instrument, a test system device and a mechanical control system;

[0007] The test instruments include signal source, spectrum analyzer and oscilloscope;

[0008] The test system equipment includes a multi-feed source group, a first signal conditioning module, a second signal conditioning module and a switch matrix. The multi-feed source group includes multiple transmitting feed sources and multiple receiving feed sources. The switch matrix, the first signal conditioning module and the transmitting feed sources are connected in sequence to form a transmitting feed source link; the receiving feed source, the switch matrix and the second signal conditioning module are connected in sequence to form a receiving feed source link; the switch matrix is ​​connected to the signal source and the control system, and the second signal conditioning module is connected to the oscilloscope or the spectrum analyzer;

[0009] The mechanical control system includes a multi-axis turntable and a motion axis group. The multi-axis turntable and the motion axis group are connected to the control system. The multi-axis turntable is used to place the satellite to be tested, and the motion axis group is used to place the multi-feed group. The control system controls the motion axis group to independently adjust the attitude of each transmitting feed and receiving feed in the multi-feed group.

[0010] In one example, the test system device further includes a signal adapter board, the switch matrix is ​​connected to the first signal conditioning module via the signal adapter board, and the receiving feed source is connected to the switch matrix via the signal adapter board.

[0011] In one example, the second signal conditioning module, the switch matrix, the signal adapter board, and the test instrument are replaced and work outside the darkroom.

[0012] It should be further explained that the technical features corresponding to the various examples of the above-mentioned test platform can be combined or replaced with each other to form a new technical solution.

[0013] The present invention also includes a satellite payload communication test chamber, which is used to place the test platform formed by any one of the above examples or a combination of multiple examples, and the chamber includes a shielding shell, on which an absorbing material is provided; a workbench, a satellite control cabinet and an equipment control cabinet are provided in the shielding shell;

[0014] The workbench is used to place the control system;

[0015] The satellite control cabinet is used to place the control equipment of the satellite to be tested, and the control equipment is connected with the control system and the satellite to be tested;

[0016] The equipment control cabinet is used to place mechanical control systems, test system equipment and test instruments.

[0017] In one example, the shielding shell is provided with a shielding door, a ventilation waveguide window, a maintenance passage, and a fan, and a wave absorbing walkway is also provided inside the shielding shell.

[0018] It should be further explained that the technical features corresponding to the above-mentioned test chamber examples can be combined or replaced with each other to form a new technical solution.

[0019] The present invention also includes a satellite payload communication test method, which is implemented based on the platform formed by any one of the above examples or a combination of multiple examples, and the test platform works in the test chamber formed by any one of the above examples or a combination of multiple examples. The test method is a two-way communication test, and the execution subject is a control system, including the following sub-steps:

[0020] Determine whether it is forward communication;

[0021] If it is forward communication, switch the connection state of the switch matrix path so that the signal source is connected to the QV transmitting feed link, and the spectrum analyzer or oscilloscope is connected to the KU receiving feed link. At this time, the signal source outputs the RF signal, which is transmitted to the QV transmitting feed after signal conditioning, and then radiated to the QV antenna of the satellite to be tested. The satellite to be tested forwards the RF signal received by the QV antenna, and radiates it through the KU antenna after signal conditioning. The KU receiving feed receives the RF signal radiated by the satellite to be tested, performs signal conditioning, and then outputs it to the spectrum analyzer or oscilloscope for data analysis and processing.

[0022] If it is reverse communication, switch the connection state of the switch matrix path to connect the signal source to the KU transmitting feed link and the spectrum analyzer or oscilloscope to the QV receiving feed link. At this time, the signal source outputs the RF signal, which is transmitted to the QV transmitting feed after signal conditioning, and then radiated to the KU antenna of the satellite to be tested. The satellite to be tested will forward the RF signal received by the KU antenna, and radiate it through the QV antenna after signal conditioning. The QV receiving feed receives the RF signal radiated by the satellite to be tested, performs signal conditioning, and then outputs it to the spectrum analyzer or oscilloscope for data analysis and processing.

[0023] In one example, performing a multi-beam test based on a bidirectional communication test includes the following steps:

[0024] The control system selects the corresponding feed source according to the beam angle of the test configuration;

[0025] The control system calculates the test position and test angle of each feed source based on the feed source position, the position of the satellite to be tested, the angle of the multi-axis turntable, and the beam pointing;

[0026] The control system controls each feed source and multi-axis turntable to move to the corresponding position and test angle;

[0027] The control system controls the corresponding transmitting and receiving feed source links to conduct forward or reverse communication tests;

[0028] The satellite to be tested performs cyclic switching or radiates multi-beam signals simultaneously according to the beam angle configured for the test, and the time synchronizer synchronizes the switching beam time of the satellite to be tested when performing cyclic switching;

[0029] The control system controls the different transmitting and receiving feed source links of the switch matrix beam cutting test, and controls the multi-axis turntable and motion axis group to adjust the posture for the next round of forward or reverse communication test.

[0030] In one example, a measured antenna in the measured satellite corresponds to the first feed, the second feed, the third feed and the fourth feed. The second feed has the same X-axis coordinate as the first feed, but a different Y-axis coordinate. The third feed has the same Y-axis coordinate as the first feed, but a different X-axis coordinate. The fourth feed has different X-axis and Y-axis coordinates from the first feed. The coordinates of the first feed, the second feed, the third feed, the fourth feed and the measured antenna are A(X A ,Y A ,Z A )、B(X B ,Y B ,Z B )、C(X C ,Y C ,Z C )、D(X D ,Y D ,Z D )、E(X 天线 ,Y 天线 ,Z 天线 ), the calculation expression of the first feed source test position is:

[0031] X-axis movement displacement 运动 =X A -X 天线 *COSθ, θ is the test angle of the multi-axis turntable; Y axis motion displacement Y 运动 =0;

[0032] The calculation expression of the second feed source test position is:

[0033] X-axis movement displacement 运动 =X B -X 天线 +(X 天线 -X 天线 *COS(-θ))–TAN(90–ATAN(D / (X B -X 天线 )))*(DX 天线 *SIN(-θ)), D is the darkroom test distance; Y axis motion displacement Y 运动 =0;

[0034] The calculation expression of the third feed source test position is:

[0035] X-axis movement displacement 运动 =X C -X C *COSθ; Y-axis motion displacement Y运动 =(D+X 天线* SIN(θ))*(Y C -Y 天线 ) / DY C +Y 天线 ;

[0036] The calculation expression of the fourth feed source test position is:

[0037] X-axis movement displacement 运动 =X D -X 天线 +(X 天线 -X 天线 *COS(-θ))–TAN(90–ATAN(D / (X D -X 天线 )))*(DX 天线 *SIN(-θ)); Y axis motion displacement Y 运动 =(D+X 天线* SIN(θ))*(Y D -Y 天线 ) / D–Y D +Y 天线 .

[0038] In one example, the calculation expression of the first feed source test angle is:

[0039] Feed azimuth = 0; Feed elevation = 0; Test off-axis angle = ABS (θ); Test rotation angle = 180;

[0040] The calculation expression of the second feed test angle is:

[0041] Feed azimuth = 0-ATAN(D / (X B -X 天线 )); Feed pitch angle = 0; Test off-axis angle = θ–90 + ATAN (D / (X B -X 天线 )); Test rotation angle = 0;

[0042] The calculation expression of the third feed test angle is:

[0043] Feed azimuth = 0; feed elevation = ATAN((Y C -Y 天线 ) / D); test off-axis angle = ACOS(COS(ATAN((Y C -Y 天线 ) / D))*COS(θ)); Test rotation angle = 180+(ATAN(((D-SIN(θ)*X 天线 )*(Y C -Y 天线) / D) / (SIN(θ)*(D-SIN(θ)*X 天线 )));

[0044] The calculation expression of the fourth feed test angle is:

[0045] Feed azimuth = 0-ATAN(D / (X D -X 天线 )); Feed source elevation angle = ATAN((Y D -Y 天线 ) / SQRT((X D -X 天线 ) 2 +D 2 )); Test off-axis angle = ACOS(COS((θ-(90-ATAN(D / (X D -X 天线 )))))*COS(ATAN((Y D -Y 天线 ) / SQRT((X D -X 天线 ) 2 +D 2 )))); Test rotation angle = 180 + ACOS (TAN ((θ-(90-ATAN (D / (X D -X 天线 ))))) / TAN((ACOS(COS((θ-(90-ATAN(D / (X D -X 天线 )))))*COS(ATAN((X D -X 天线 ) / SQRT((X D -X 天线 ) 2 +D 2 )))))))).

[0046] It should be further explained that the technical features corresponding to the various examples of the above-mentioned testing methods can be combined or replaced with each other to form a new technical solution.

[0047] Compared with the prior art, the present invention has the following beneficial effects:

[0048] The test system equipment in the test platform of the present invention includes a multi-feed source group and a bidirectional link (transmitting and receiving feed source link), which meets the bidirectional communication test function. The satellite to be tested can work in the receiving / transmitting state, and the switching is convenient; at the same time, the control system controls the multi-axis turntable, the motion axis group, the switch matrix, etc. to perform attitude adjustment, link switching, etc., so as to realize the fully automated test of single-beam multi-target point hopping beam and multi-beam multi-target point hopping beam bidirectional communication, that is, it can realize the communication performance index tests such as equivalent isotropic radiated power EIRP, satellite quality factor G / T, error vector amplitude EVM, adjacent channel power ratio ACPR, and transceiver isolation, and has the beam hopping time accuracy function test, provides a far-field or mid-field measurement environment, meets the point-to-point communication test and multi-target test functions, and is compatible with various far-field performance tests of payload satellites, phased array antennas, and passive antennas.

[0049] Furthermore, the test platform of the present invention integrates the control system, test instruments, test system equipment and mechanical control system. It only needs to place the test platform in a darkroom and install the satellite to be tested on a multi-axis turntable to perform fully automated performance index testing. There is no need to set up a complicated test environment or manually move the test source, which provides test convenience and test efficiency, and does not require manual operation, thereby reducing random errors introduced by humans and ensuring test accuracy. BRIEF DESCRIPTION OF THE DRAWINGS

[0050] The specific implementation methods of the present invention are further described in detail below in conjunction with the accompanying drawings. The accompanying drawings described herein are used to provide a further understanding of the present application and constitute a part of the present application. The same reference numerals are used in these drawings to represent the same or similar parts. The schematic embodiments of the present application and their descriptions are used to explain the present application and do not constitute improper limitations on the present application.

[0051] Figure 1 A schematic diagram of the connection between a test system and a satellite to be tested provided in an example of the present invention;

[0052] Figure 2 A schematic diagram of a darkroom structure provided for an example of the present invention;

[0053] Figure 3 A schematic diagram of the structure of an absorbing material provided as an example of the present invention;

[0054] Figure 4 A schematic diagram of a workbench provided for an example of the present invention;

[0055] Figure 5 A schematic diagram of the installation of a multi-feed source group, a motion axis group, a satellite to be tested, and a multi-axis mounting platform provided as an example of the present invention;

[0056] Figure 6 A schematic diagram of the installation of a satellite to be tested and a multi-axis mounting platform provided as an example of the present invention;

[0057] Figure 7 A schematic diagram of a motion axis group provided for an example of the present invention;

[0058] Figure 8 A schematic diagram of a shielding door provided as an example of the present invention;

[0059] Fig. 9 A schematic diagram of a shielding door provided as an example of the present invention;

[0060] Fig.10 A two-way communication test flow chart provided for an example of the present invention;

[0061] Fig.11 A multi-beam test flow chart provided for an example of the present invention;

[0062] Fig.12 A schematic diagram of the connection between a test system and a satellite to be tested provided in another example of the present invention;

[0063] Fig.13 A schematic diagram of the relationship between the position of the satellite antenna under test and the feed source provided as an example of the present invention;

[0064] Fig.14 A performance test flow chart provided for an example of the present invention.

[0065] In the figure: 1-shielding door; 2-pulley; 3-shielding small door; 4-workbench; 5-satellite control cabinet; 6-equipment control cabinet; 7-ventilation waveguide window; 8-maintenance channel; 9-fan; 10-signal adapter board; 11-shielding shell; 12-wave-absorbing walkway; 13-satellite to be tested; 14-multi-axis turntable; 15-motion axis group; 16-multi-feed source group; 17-wave-absorbing material; 18-switch matrix. DETAILED DESCRIPTION

[0066] The technical solution of the present invention is described clearly and completely below in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0067] In the description of the present invention, it should be noted that the directions or positional relationships indicated by "center", "up", "down", "left", "right", "vertical", "horizontal", "inside", "outside", etc. are directions or positional relationships based on the drawings, which are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present invention. In addition, the use of ordinal numbers (e.g., "first and second", "first to fourth", etc.) is to distinguish objects, and is not limited to this order, and cannot be understood as indicating or implying relative importance.

[0068] In the description of the present invention, it should be noted that, unless otherwise clearly specified and limited, "installation", "connection" and "connection" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, or it can be the internal communication of two components. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0069] In addition, the technical features involved in the different embodiments of the present invention described below can be combined with each other as long as they do not conflict with each other.

[0070] In one example, a satellite payload communication test platform includes a control system, test instruments, test system equipment and a mechanical control system. The test platform is preferably directly set up in a darkroom, and there is no need to further build a test environment, thereby improving test efficiency.

[0071] Specifically, the control system includes a ground beam controller and a control module connected in communication. The ground beam controller is used to realize the control of the antenna beam, such as beam pointing control, beam forming and scanning, signal processing and compensation, multi-channel control, etc. The control module is the core control and data processing unit of the entire system, which is used to realize the functions of sending instructions to the ground beam controller, status monitoring, data acquisition, etc. Preferably, the control module is connected to a monitoring display. Furthermore, the control module is connected in communication with a workstation, which can be a computer or other terminal device for upper control of the control module. Preferably, the workstation is connected to a monitoring display. During satellite testing, the staff can monitor the test conditions in the darkroom at the workstation, and can control and test the inside of the darkroom through the control system and the workstation, so as to ensure the efficiency and convenience of the test work of the testers.

[0072] Furthermore, the test instruments include a signal source, a spectrum analyzer and an oscilloscope, etc. The signal source, the spectrum analyzer and the oscilloscope can be connected to the control module in the control system to facilitate automated testing and measurement to improve test efficiency and test accuracy.

[0073] Further, the test system equipment includes a multi-feed group, a first signal conditioning module, a second signal conditioning module and a switch matrix. The multi-feed design is mainly aimed at the test of each antenna to be tested in the satellite to be tested. It is not only necessary to test the horizontal installation of the satellite to be tested, that is, the multi-axis turntable is not rotated, but also to meet the multi-feed test of different beams after the multi-axis turntable is rotated at different angles. The multi-feed group includes multiple transmitting feeds and multiple receiving feeds. Optionally, the multi-feed group of the present invention includes the number of Ku feed modules and the number of Qv feed modules, wherein the number of Ku feed modules adopts 4*4 groups of feed modules, and the number of Qv feed modules adopts 1*2 groups of feed modules, and 16 satellite beam tests can be performed simultaneously. The first signal conditioning module and the second signal conditioning module include one or more of a filter module, a power amplifier module, a low noise amplifier module, a detector, etc. The switch matrix supports simultaneous conduction of any port path, which is mainly used for satellite multi-beam testing, and quickly switches the corresponding beam alignment module for data acquisition or transmission, and the switch response time is 1us. Optionally, the present invention is configured with two sets of switch matrices, namely, a 16-to-8 switch matrix and an 8-to-8 switch matrix. Further, the switch matrix, the first signal conditioning module (such as a power amplifier module), and the transmitting feed source are connected in sequence to form a transmitting feed source link; the receiving feed source, the switch matrix, and the second signal conditioning module (such as a power amplifier module, a detector, or a low noise amplifier module connected in sequence) are connected in sequence to form a receiving feed source link. Further, the switch matrix is ​​connected to the signal source and the control system, and the second signal conditioning module is connected to the oscilloscope or the spectrum analyzer.

[0074] Furthermore, the mechanical control system includes a multi-axis turntable and a motion axis group, and the multi-axis turntable and the motion axis group are connected to the control system. Specifically, the multi-axis turntable is used to place the satellite to be tested, and then adjust the various postures of the satellite to be tested under the control of the control system to cooperate to complete various test tasks. The multi-axis turntable includes an azimuth axis, a flip mechanism, and a polarization axis from bottom to top, with an accuracy of ±0.1° and a load of 1200Kg, to ensure that the center of the front surface of the satellite to be tested coincides with the rotation center of the multi-axis turntable. The motion control of the turntable is completed by the control system of the present invention, and independent posture adjustment of each transmitting feed and receiving feed is realized to meet the test requirements. The motion axis group is used to place a multi-feed source group, and each feed source module includes four motion axes, namely, an X-axis, a Y-axis, an azimuth axis, and a pitch axis, and the positioning accuracy can reach ±0.03mm and ±0.05°. The motion axis adopts a waterproof and dust-free closed module to prevent dust from entering the module during use to affect the screw and the slider, thereby reducing the number of maintenance times. Each module can be independently controlled through the control system of the present invention to achieve an independent motion mode, cover multiple types of test modes, and realize different test requirements.

[0075] In one example, the test system equipment also includes a signal adapter board, a waveguide tube, etc. Various types of cable adapter connectors are arranged on the signal adapter board for the transfer of radio frequency cables, network port cables, serial port cables and other control cables inside and outside the darkroom to ensure the shielding effectiveness of the darkroom. The waveguide tube can be used to pass a large number of mechanical control cables and cables with special connectors through the wall to complete the signal transmission inside and outside the darkroom. Specifically, the switch matrix is ​​connected to the first signal conditioning module via the signal adapter board, and the receiving feed source is connected to the switch matrix via the signal adapter board.

[0076] Optionally, the second signal conditioning module, the switch matrix, the signal adapter board, and the test instrument can be replaced to work outside the darkroom.

[0077] The above examples are combined to obtain the preferred test platform of the present invention. The test platform is placed in a dark room. Taking the forward communication test as an example, the working process is as follows:

[0078] 1) According to Figure 1 Connect the test system shown in the figure, and then connect the control system, test instruments, test system equipment and each device in the mechanical control system;

[0079] 2) Turn on the power of all equipment, instruments, and test accessories to make all equipment operational;

[0080] 3) Switch the switch matrix link path through the control system and adjust the test signal transmission direction;

[0081] 4) Install the satellite to be tested on the test multi-axis turntable, adjust the angle of the test multi-axis turntable, and move it to the test posture;

[0082] 5) Select the current communication test process, satellite working status, test indicators, etc. through the control system and satellite terminal control system;

[0083] 6) Control the motion axis group to move to the test position and point to the center of the corresponding satellite antenna to be tested through the control system;

[0084] 7) The control system controls the signal source to output the corresponding frequency and power, and then enters the power amplifier module for signal amplification through the darkroom signal adapter board. The QV transmitting feed (QV speaker) radiates the RF signal into the test space and transmits it to the QV antenna aperture of the satellite to be tested;

[0085] 8) After the QV antenna of the satellite under test receives the RF signal, the RF signal is forwarded, demodulated, amplified, and processed inside the satellite under test. Finally, it is radiated into the test space by multiple KU transmitting antennas of the satellite under test and transmitted to the mouth of the feed module KU feed antenna (KU horn);

[0086] 9) After the KU feed module receives the RF signal of the corresponding beam, it transmits it to the switch matrix through the RF cable and the darkroom signal adapter board;

[0087] 10) The control system automatically controls the switch matrix to switch links, so that the multi-feed module collects signals and transmits them back to the spectrum analyzer for data analysis;

[0088] 11) After the switch matrix completes the link conduction and controls the relevant parameters of the spectrum analyzer (frequency, frequency span SPAN, video bandwidth VBW, resolution bandwidth RBW and other parameter configurations), the RF signal is amplified by the low noise amplifier module and transmitted back to the spectrum analyzer for data acquisition and storage;

[0089] 12) If the satellite to be tested needs to switch to a test beam in another orientation, the control system will control the test multi-axis turntable to move to the origin of the next test beam;

[0090] 12) At the same time, the control system determines the test point of the multi-feed group, uses the spatial function algorithm to calculate the position, and controls the multi-feed module to move to the corresponding point to prepare for the next round of testing;

[0091] 14) Repeat the above steps 7)-11) to complete the test beam data acquisition;

[0092] 15) The control system processes and analyzes the data collected by the spectrum analyzer, and calculates the corresponding performance indicators of the satellite to be tested through the indicator algorithm, thereby realizing the communication performance indicator tests such as equivalent isotropic radiated power EIRP, satellite quality factor G / T, error vector magnitude EVM, adjacent channel power ratio ACPR, and transmit-receive isolation;

[0093] 16) Save all test data and test results to complete this round of testing;

[0094] 17) For reverse communication and other performance index tests, it is only necessary to control the control system to switch the test link and call different test modules to complete other functions or performance index tests.

[0095] The present invention also includes a satellite payload communication test chamber, which is used to place a test platform formed by any one of the above examples or a combination of multiple examples, such as Figure 2As shown, the darkroom includes a shielding shell 11, and the shielding shell 11 is provided with an absorbing material 17. Among them, the shielding shell is used for shielding and isolation. It is built into a closed space by galvanized steel plates, and then the structure is fixed by a keel frame, and then the absorbing material is affixed to reduce signal reflection, so as to finally achieve a test environment and ensure good shielding effectiveness. Different functional areas are divided in the shielding shell, and corresponding functional modules are constructed, and finally the division and construction of the entire darkroom are completed. Furthermore, the absorbing material is mainly used to reduce the reflection effect of radio frequency signals in space and reduce the interference problem between electromagnetic waves. The absorbing material is fixed by environmentally friendly strong glue, which can not only achieve the absorbing performance, but also ensure the overall aesthetics of the darkroom. As shown Figure 3 As shown, the present invention adopts a pointed cone-shaped absorbing material, which has good absorbing reflectivity and can effectively absorb invalid signals, clutter, etc. in the darkroom space through different incident angles, thereby providing better protection for the test environment.

[0096] Furthermore, if Figure 2 , Figure 4 As shown, a workbench 4, a satellite control cabinet 5 and an equipment control cabinet 6 are arranged in the shielding shell. The workbench is used to place the control system, and preferably the workbench can also place a workstation, a monitoring display, etc. The satellite control cabinet is used to place the control equipment, instruments, power supply, etc. of the satellite to be tested. The control equipment is connected to the control system and the satellite to be tested. During the test, the control system can control the equipment in the satellite control cabinet to remotely control the working state of the satellite and enter the test control process. Figure 2 As shown, the equipment control cabinet is used to place the mechanical control system (multi-axis turntable 14, motion axis group 15), test system equipment (switch matrix 17, power amplifier module, low noise amplifier module, etc.) and test instruments (vector signal source, spectrum analyzer, oscilloscope, etc.). During testing, the mechanical control system, test instruments, and test system equipment are jointly controlled by the system workstation to realize various system function and performance tests. Figure 5-Figure 6 As shown, the multi-axis turntable 14 is used to place the satellite 13 to be tested, which includes an azimuth axis, a flip mechanism, and a polarization axis from bottom to top, thereby realizing the adjustment of various postures of the satellite to be tested and cooperating to complete various test tasks. Figure 5 , Figure 7As shown, a multi-feed source group 16 is provided on the motion axis group 15, and the motion axis group includes multiple motion axes, and each feed source group mainly includes four motion axes, and the motion axes include X-axis, Y-axis, azimuth axis, and pitch axis, and a waterproof and dust-free closed module can be used. The satellite to be tested is installed on the multi-axis turntable, and the installation position of the satellite control multi-axis turntable and the multi-feed source group is determined by laser positioning. The communication satellite is installed on the satellite control multi-axis turntable through a gantry crane and a fixture, and the test feed is installed on the multi-feed source module platform, so that the center of the front surface of the satellite to be tested coincides with the rotation center of the multi-axis turntable, and the attitude of the multi-axis turntable and the motion axis is adjusted through the control system, thereby realizing the feed selection to complete various test tasks, such as single-beam or multi-beam communication testing.

[0097] In one example, if Figure 2 As shown, the shielding shell is provided with a shielding door, a ventilation waveguide window 7, a maintenance passage 8, and a fan 9. An absorbing walkway is also provided inside the shielding shell, and darkroom auxiliary facilities such as lighting, fire protection, ventilation, monitoring, and signal transfer systems are installed by screwing, and the corresponding electrical cables and control cables are connected. The shielding door includes a shielding door and / or a shielding door. The shielding door in this example includes a shielding door and a shielding door. The shielding door is the most critical part of the shielding room. It is the weakest component to keep the shielding performance of the darkroom from degradation, and it is also the part in the shielding room that often needs to move. As shown in FIG. Figure 2 , Figure 8 As shown, the present invention is equipped with a manual double-opening shielding door 1 on the side. The shielding door is made of steel. Two copper reeds are installed on the rigid door frame of the shielding door. The reed installation size is crimped and installed. If the local reed is damaged, it can be easily replaced. In order to facilitate the product loading vehicle to enter and exit the shielding darkroom, the shielding door adopts a threshold-free design, and the civil engineering does not need to be excavated. The bottom of the shielding door is equipped with a pulley to facilitate the opening and closing of the shielding door. Further, as Figure 8 As shown, a pulley 2 is provided at the bottom of the shielding door. By providing the pulley, the friction of the shielding door switch is reduced. When the test product needs to be transported, the shielding door can be moved smoothly under manual push, and one person can easily open or close the shielding door. The use of the pulley also eliminates the need for track or slide design, ensuring the flatness of the ground and facilitating the safety of satellite loading trolley transportation. Fig. 9 As shown, the shielding door 3 has a hinged structure, which is hinged on the shielding shell and is mainly used as an access channel for debugging personnel. When there is no need to carry the test satellite, the shielding door can be used to enter and exit the darkroom for debugging, which is convenient and fast. At the same time, the shielding door can be opened manually from the inside to ensure the safety of debugging personnel entering the darkroom alone.

[0098] Furthermore, the ventilation waveguide window is a channel for ventilation of the darkroom while ensuring shielding performance, and is composed of a honeycomb six-sided waveguide window and a fan assembly.

[0099] Furthermore, the maintenance passage can be a maintenance ladder and walkway, and the ladder can be a steel ladder. The top of the darkroom is equipped with facilities such as light boxes, ventilation waveguide windows and fans, which need to be maintained regularly. According to the layout of the darkroom and the characteristics of the parent building, a steel ladder is installed at an appropriate position on the northern side wall of the darkroom. Personnel can use it to reach the top of the darkroom to perform operations such as lamp maintenance. A fence is set around the top of the darkroom with a height of 0.8m, and a maintenance and inspection walkway is built on the top keel according to the position of the waveguide windows, lamps, etc.

[0100] Furthermore, the fan is installed on the top of the darkroom, and is mainly used for ventilation in the darkroom to ensure ventilation efficiency and a good air environment in the darkroom.

[0101] Furthermore, if Figure 2 As shown, a signal transfer board 10 is also provided in the darkroom for transferring radio frequency cables, network port cables, serial port cables and other control cables inside and outside the darkroom.

[0102] Furthermore, if Figure 2 As shown, the darkroom is also provided with an absorbing walkway 12 for walking inside the darkroom, which meets the carrying capacity of personnel and equipment and is also convenient for personnel to test and adjust the feed group.

[0103] The present invention also includes a satellite payload communication test method, which is implemented based on a test platform formed by any one of the above examples or a combination of multiple examples, and the test platform is arranged in a darkroom formed by any one of the above examples or a combination of multiple examples. The test includes a two-way communication test. For the two-way communication test, the communication satellite usually has the ability to transmit and receive two-way communication, so the communication satellite can be divided into a transmitting antenna area, a receiving antenna area, a signal forwarding frequency conversion antenna area, etc. The multi-feed source group is divided into a signal transmitting area, a signal receiving area, and a signal forwarding area corresponding to the satellite frame to be tested. The multi-channel switch matrix is ​​controlled to switch the internal RF link, so that the multi-channel signal generator transmits the RF signal to the multi-feed source signal transmitting area through the RF cable and the signal switching system, radiates the signal to the satellite receiving antenna area through the feed source, and transmits the signal to the corresponding multi-feed source signal forwarding area after the satellite receiving antenna is transmitted to the repeater frequency conversion through the signal forwarding antenna. The feed forwarding signal is transmitted to the signal spectrum analyzer by controlling the multi-channel switch matrix to switch the internal RF link and the RF cable and the signal switching system to form a complete closed loop of the RF signal. When the receiving and transmitting state of the satellite antenna under test changes, it is only necessary to switch the internal RF link connection state of the multi-channel switch matrix to connect the multi-channel signal generator to the multi-feed signal forwarding area, transmit the RF signal to the satellite signal forwarding antenna area, and after frequency conversion, radiate the signal from the satellite transmitting area back to the multi-feed signal receiving area; by controlling the multi-channel switch matrix to switch the internal RF link and the RF cable and signal switching system, each receiving feed signal is transmitted to the signal spectrum analyzer respectively, forming a complete closed loop of the RF signal, and completing the receiving and transmitting state switching test of the satellite antenna under test.

[0104] In this example, the two-way communication test method is as follows Fig.10 As shown, the execution subject is the control system, which includes the following sub-steps:

[0105] 1) Determine whether it is forward communication;

[0106] 2) If it is forward communication, switch the connection state of the switch matrix path so that the signal source is connected to the QV transmitting feed link, and the spectrum analyzer or oscilloscope is connected to the KU receiving feed link. At this time, the signal source outputs the RF signal, which is transmitted to the QV transmitting feed after signal conditioning, and then radiated to the QV antenna of the satellite to be tested. The satellite to be tested forwards the RF signal received by the QV antenna, and radiates it through the KU antenna after signal conditioning. The KU receiving feed receives the RF signal radiated by the satellite to be tested, performs signal conditioning, and then outputs it to the spectrum analyzer or oscilloscope for data analysis and processing;

[0107] 3) If it is reverse communication, switch the connection state of the switch matrix path so that the signal source is connected to the KU transmitting feed link and the spectrum analyzer or oscilloscope is connected to the QV receiving feed link. At this time, the signal source outputs the RF signal, which is transmitted to the QV transmitting feed after signal conditioning, and then radiated to the KU antenna of the satellite to be tested. The satellite to be tested forwards the RF signal received by the KU antenna, and radiates it through the QV antenna after signal conditioning. The QV receiving feed receives the RF signal radiated by the satellite to be tested, performs signal conditioning, and then outputs it to the spectrum analyzer or oscilloscope, and then performs data acquisition, processing, analysis and storage.

[0108] Furthermore, during the same round of testing, the same feed source may alternately work in the transmitting state and the receiving state. The existing switching of two-way communication mostly uses the method of manually changing the cable connection state, and manually switching the communication direction, which wastes manpower and also reduces the test efficiency. The present invention adopts a control system (FPGA control board) to control the connectivity state and interface of the radio frequency cable, adopts a multi-channel switch matrix, outputs a control signal through the FPGA control board to switch the path, connects to the system software of the control system through the network port or serial port, and performs interactive control of the system software, and finally achieves the link conduction state and connection mode of the switch matrix controlled by the system software signal, and the simultaneous conduction mode performs automatic control of multi-link communication and two-way communication.

[0109] When the present invention performs two-way communication control, it is not necessary to manually replace or intervene in the cables, and the system software of the control system can be used to control the internal link connection state of the switch matrix. For example, the switch matrix IN1 port is connected to the signal source, and the IN2 port is connected to the spectrum analyzer. When the OUT1 port feed source is a signal transmission source, and the OUT2 port feed source is a receiving source, the control system will automatically control the switch matrix to switch the IN1 port to connect to the OUT1 port, and the IN2 port to connect to the OUT2 port; when the OUT2 port feed source is a signal transmission source, and the OUT1 port feed source is a receiving source, the control system will automatically control the switch matrix to switch the IN1 port to connect to the OUT2 port, and the IN2 port to connect to the OUT1 port, and complete the forward / reverse automatic control two-way communication test.

[0110] When there are multiple transmitting feeds or receiving feeds working at the same time, the transmitting feed and receiving feed links corresponding to the transmitting signal source and the receiving spectrum analyzer are automatically switched in a cycle through the control timing preset in the system software of the control system, and then the link conduction state of the system software data sampling and matching control timing is controlled to complete data matching, data analysis, data processing, etc. between the sampled data and the test link.

[0111] Preferably, before determining whether it is a forward communication step, it also includes test preparation and test configuration steps. Among them, test preparation is to connect the test system, and then connect the control system, test instruments, test system equipment and each device in the mechanical control system, that is, through the pre-laid RF cables and signal adapters, connect the multi-axis turntable, multi-feed source group, multi-channel switch matrix, time synchronization system, signal source, spectrum analyzer, oscilloscope and other related test equipment instruments; test configuration is to make each device enter the corresponding working state, etc., and select the current communication test process, satellite working state, test indicators, etc. through the control system and satellite terminal control system.

[0112] The present invention discloses a satellite payload communication test method, specifically a multi-beam / beam hopping test. A plurality of feeds with different angles can be allocated to correspond to a satellite transmitting antenna area, a receiving antenna area, and a signal forwarding frequency conversion antenna area through a multi-feed combination, so as to realize a satellite multi-beam / beam hopping test. The control system is set to confirm the beam test to be currently performed and the angle of rotation of the multi-axis turntable, and the multi-axis turntable is controlled to move to the corresponding angle. The multi-feed position is automatically calculated by the current angle of the multi-axis turntable and the beam angle of the satellite to be tested, and the multi-feed group is automatically controlled to move to the corresponding test position, so that the satellite test beam is aligned with the corresponding feed. When the satellite transmitting antenna is working, the satellite performs a test multi-beam signal output, and the multi-feed receives the corresponding beam signal. The control system uses a time synchronization system to ensure that the control multi-channel switch matrix switches the corresponding beam test link uninterruptedly, transmits the test beam signal back to the signal spectrum analyzer, obtains the signal spectrum analyzer acquisition data and the current test beam state, and performs data analysis and processing. It should be noted that when conducting a satellite beam hopping test, under the above state, the control system controls the multi-channel switch matrix to simultaneously connect the corresponding feed beam paths to each signal output port of the switch matrix, and connects each signal output port of the switch matrix to a multi-channel oscilloscope. At the same time, the software system automatically detects the satellite multi-beam, beam hopping signal size and switching time to complete the beam hopping time accuracy test.

[0113] like Fig.11 As shown, in this example, a multi-beam test is performed based on a two-way communication test, including the following steps:

[0114] 1) The control system selects the corresponding feed source according to the beam angle of the test configuration;

[0115] 2) The control system calculates the test position and test angle of each feed source based on the feed source position, the position of the satellite to be tested, the angle of the multi-axis turntable, and the beam pointing;

[0116] 3) The control system controls each feed source and the multi-axis turntable to move to the corresponding position and test angle, and each feed source points to the center of the antenna under test of the satellite under test;

[0117] 4) The control system controls the corresponding transmitting and receiving feed source links to conduct forward or reverse communication tests; specifically, the control system controls the signal source to output the corresponding frequency and power, and enters the power amplifier module through the darkroom signal adapter board for signal amplification, and then the transmitting feed source radiates the RF signal into the test space and transmits it to the QV antenna aperture of the satellite to be tested; the ground wave controller controls the beam to be tested to align the receiving feed source horn according to different beam directions in time division; the receiving feed source module receives the RF signal of the corresponding beam and then transmits it to the switch matrix through the RF cable and the darkroom signal adapter board; the control system automatically controls the switch matrix to switch the link, so as to realize the multi-feed source module to collect the signal cycle and transmit it back to the oscilloscope or spectrum analyzer for data analysis. Preferably, the feed source signal is connected to the oscilloscope through the detector through the switch matrix link switching to capture the time domain signal (one channel is connected to PPS) and compare the time domain timing, and the time domain signal is analyzed after the test is completed to determine whether the beam hopping time accuracy meets the system performance requirements.

[0118] 5) The satellite to be tested performs cyclic switching or radiates multi-beam signals simultaneously according to the beam angle configured for the test, and the time synchronizer synchronizes the switching beam time of the satellite to be tested when performing cyclic switching;

[0119] 6) The control system controls the multi-axis turntable to move to the origin of the next test beam, controls the switch matrix to switch the different transmit and receive feed links of the beam test, and controls the movement axis to move to the corresponding point to perform the next round of forward or reverse communication test. After the test is completed, the multi-beam signal is collected through a spectrum analyzer or oscilloscope to facilitate subsequent data processing, analysis and storage, and the corresponding performance indicators of the satellite to be tested are calculated through the indicator algorithm, all the test data and test results are saved, and the multi-beam communication test is completed.

[0120] Preferably, before the control system selects the corresponding feed source step according to the beam angle of the test configuration, it also includes test preparation and test configuration steps. Fig.12The test system shown in the figure is connected. At this time, the transmitting link includes a signal source, a switch matrix, a power amplifier module and a transmitting feed connected in sequence, and the receiving link includes a receiving feed connected in sequence, a switch matrix, multiple power amplifier modules, multiple detectors and an oscilloscope. By inputting a time synchronization signal PPS (Pulse Per Second) to the oscilloscope, the time base of the oscilloscope is synchronized with the clock of the satellite to be tested. Then, the control system, the test instrument, the test system equipment and the mechanical control system are connected to connect the satellite to be tested, the multi-feed source group, the test system, the mechanical system, the control system and the power supply system to complete the communication control. The test configuration is to turn on the power of all equipment, instruments and test accessories to make all equipment enter a working state, select the current communication test process, satellite working state, test indicators, etc. through the control system and the satellite terminal control system, and preset the multi-beam hopping beam pointing to be tested by the system software of the control system, and set the multi-beam hopping beam time interval.

[0121] In one example, the feed positions corresponding to different test beam angles can be calculated based on the three-dimensional spatial coordinate relationship between the antenna under test and each feed on the satellite under test, thereby completing the effective transmission of the RF signal. Fig.13 As shown, a test antenna in the test satellite corresponds to four feed sources in the four directions for explanation. The feed sources in the four directions are the first feed source A, the second feed source B, the third feed source C and the fourth feed source D. The intersection of the midline of the motion axis group and the height of the center of the satellite test antenna is taken as the origin of the space coordinate. At this time, the second feed source has the same X-axis coordinate as the first feed source, but different Y-axis coordinates. The third feed source has the same Y-axis coordinate as the first feed source, but different X-axis coordinates. The fourth feed source has different X-axis and Y-axis coordinates from the first feed source. The initial coordinates of the first feed, the second feed, the third feed, the fourth feed and the test antenna are A(X A ,Y A ,Z A )、B(X B ,Y B ,Z B )、C(X C ,Y C ,Z C )、D(X D ,Y D ,Z D )、E(X 天线 ,Y 天线 ,Z 天线), when the multi-axis turntable is at different test angles θ, it is necessary to keep the feeds pointing to the exact center of the satellite antenna to be tested, and the test position, motion position, feed azimuth angle, feed pitch angle, test beam off-axis angle, test beam rotation angle, etc. of each feed group can be calculated through spatial three-dimensional coordinates and transformation. Now, based on four azimuth feeds and a test angle θ≥0, how to determine the feed motion position when testing the beam is explained.

[0122] The calculation expression of the test position of the first feed source A is: The motion displacement X of the X-axis 运动 =X A -X 天线 *COSθ, θ is the test angle of the multi-axis turntable; Y axis motion displacement Y 运动 =0.

[0123] The calculation expression of the test position of the second feed source B is: The motion displacement X of the X-axis 运动 =X B -X 天线 +(X 天线 -X 天线 *COS(-θ))–TAN(90–ATAN(D / (X B -X 天线 )))*(DX 天线 *SIN(-θ)), D is the darkroom test distance; Y axis motion displacement Y 运动 =0.

[0124] The calculation expression of the test position of the third feed source C is: The motion displacement X of the X-axis 运动 =X C -X C *COSθ; Y-axis motion displacement Y 运动 =(D+X 天线* SIN(θ))*(Y C -Y 天线 ) / DY C +Y 天线 .

[0125] The calculation expression of the test position of the fourth feed source D is: The motion displacement X of the X axis 运动 =X D -X 天线 +(X 天线 -X 天线 *COS(-θ))–TAN(90–ATAN(D / (X D -X 天线 )))*(DX 天线 *SIN(-θ)); Y axis motion displacement Y 运动 =(D+X 天线* SIN(θ))*(Y D -Y天线 ) / D–Y D +Y 天线 .

[0126] Preferably, based on four azimuth feeds and a test angle θ ≥ 0, it is described how to determine the feed attitude when testing the beam. At this time:

[0127] The calculation expression of the test angle of the first feed source A is: feed source azimuth angle = 0; feed source pitch angle = 0; test off-axis angle = ABS (θ); test rotation angle = 180.

[0128] The calculation expression of the test angle of the second feed source B is: Feed source azimuth angle = 0-ATAN (D / (X B -X 天线 )); Feed pitch angle = 0; Test off-axis angle = θ–90 + ATAN (D / (X B -X 天线 )); Test rotation angle = 0.

[0129] The calculation expression of the test angle of the third feed source C is: feed source azimuth angle = 0; feed source pitch angle = ATAN ((Y C -Y 天线 ) / D); test off-axis angle = ACOS(COS(ATAN((Y C -Y 天线 ) / D))*COS(θ)); Test rotation angle = 180+(ATAN(((D-SIN(θ)*X 天线 )*(Y C -Y 天线 ) / D) / (SIN(θ)*(D-SIN(θ)*X 天线 ))).

[0130] The calculation expression of the fourth feed source D test angle is: feed source azimuth angle = 0-ATAN (D / (X D -X 天线 )); Feed source elevation angle = ATAN((Y D -Y 天线 ) / SQRT((X D -X 天线 ) 2 +D 2 )); Test off-axis angle = ACOS(COS((θ-(90-ATAN(D / (X D -X 天线 )))))*COS(ATAN((Y D -Y 天线 ) / SQRT((X D -X 天线 ) 2 +D 2)))); Test rotation angle = 180 + ACOS (TAN ((θ-(90-ATAN (D / (X D -X 天线 ))))) / TAN((ACOS(COS((θ-(90-ATAN(D / (X D -X 天线 )))))*COS(ATAN((X D -X 天线 ) / SQRT((X D -X 天线 ) 2 +D 2 )))))))).

[0131] Furthermore, the remaining feeds can be inferred through the above-mentioned calculation methods of feeds in different azimuths to obtain the test position, motion position, feed azimuth angle, feed pitch angle, test beam off-axis angle, test beam rotation angle, etc. of the current test feed group. The above-mentioned test method can quickly calculate the beam angles of each feed and satellite antenna test under different multi-axis turntable azimuth angles, and the control system automatically performs beam synthesis and distribution of the satellite antenna, controls the switch matrix to switch the test link, and finally completes the comprehensive automatic test of multiple feeds and multiple beams of the payload satellite.

[0132] In one example, a satellite payload communication test method is specifically a performance test, including equivalent isotropic radiated power EIRP, satellite quality factor G / T, error vector magnitude EVM, adjacent channel power ratio ACPR, transceiver isolation test, etc. During the performance test, according to the requirements of the satellite performance test items and the principle of two-way communication test, the internal link of the multi-channel switch matrix is ​​controlled to ensure the normal communication of the satellite performance test link, and the corresponding instruments and equipment are connected; according to the multi-beam / beam hopping test principle, the satellite multi-axis turntable and multi-feed system are controlled to move to the corresponding position, and the alignment control of the test beam is performed; according to the corresponding performance test item test method, the corresponding instruments and equipment, multi-axis turntable, multi-feed and satellite working status are gradually controlled, and the corresponding test data of the satellite working in different states are collected; finally, the satellite test data, link loss and other data under different current states are statistically analyzed, and the corresponding satellite performance test results are calculated.

[0133] In this example, Fig.14 As shown, the performance test includes the following steps:

[0134] 1) Complete the position and angle control of the feed and turntable according to the multi-beam test;

[0135] 2) Connecting the corresponding communication link according to the two-way communication test;

[0136] 3) Perform corresponding configuration of the test instrument and read the carrier file;

[0137] 4) The control system controls the satellite under test to operate in the corresponding state;

[0138] 5) The control system controls the instrument to carry out the corresponding test process;

[0139] 6) The control system reads instrument acquisition data and system link calibration data;

[0140] 7) Calculate the corresponding performance indicators of the satellite under test, including equivalent isotropic radiated power EIRP, satellite quality factor G / T, error vector magnitude EVM, adjacent channel power ratio ACPR, transmit-receive isolation, etc.; take the satellite quality factor G / T test as an example, at this time, by using a spectrum analyzer to measure the noise power P1 (the satellite under test is turned off), P2 (the satellite under test is working in the nominal state), and P3 (adding an uplink signal state) within the bandwidth B of the receiving feed horn, calculate the transmit feed horn mouth radiation power EIRPe, and combine the formula G / T = 10lg[Y1(Y2-1) / (Y1-1)]+10lg(kB)+Ltu-EIRPe to realize the satellite quality factor G / T test, where Y1 = P2 / P1; Y2 = P3 / P2; k is the Boltzmann constant, which is 1.38*10-23J / K; Ltu is the total uplink transmission path loss.

[0141] 8) Data processing, analysis and storage.

[0142] Optionally, before completing the position and angle control steps of the feed source and the turntable according to the multi-beam test process, test preparation and test configuration steps are also included.

[0143] The present invention provides a fully automated, highly compatible satellite payload communication test platform, darkroom and method. To meet the performance test requirements of a satellite payload to be tested, the satellite to be tested is used as a test object. Under the comprehensive conditions of the darkroom test, the satellite payload communication test system, vector signal source, signal spectrum analyzer, oscilloscope, switch matrix and general instruments are precisely controlled and a motion control algorithm is used to realize satellite multi-beam beam hopping test, EIRP, G / T, EVM, ACPR, transceiver isolation performance and other index tests. The platform has the functions of automatic control of two-way communication test, data processing, image analysis and processing, etc., to ensure the adequacy, saturation and reliability of test data.

[0144] The above specific implementation methods are detailed descriptions of the present invention. It cannot be determined that the specific implementation methods of the present invention are limited to these descriptions. For ordinary technicians in the technical field to which the present invention belongs, several simple deductions and substitutions can be made without departing from the concept of the present invention, which should be regarded as belonging to the protection scope of the present invention.

Claims

1. A satellite payload communication test platform, characterized in that: The platform works in a darkroom and includes a control system, a test instrument, a test system device and a mechanical control system; The test instruments include signal source, spectrum analyzer and oscilloscope; The test system equipment includes a multi-feed source group, a first signal conditioning module, a second signal conditioning module and a switch matrix. The multi-feed source group includes multiple transmitting feed sources and multiple receiving feed sources. The switch matrix, the first signal conditioning module and the transmitting feed sources are connected in sequence to form a transmitting feed source link; the receiving feed source, the switch matrix and the second signal conditioning module are connected in sequence to form a receiving feed source link; the switch matrix is ​​connected to the signal source and the control system, and the second signal conditioning module is connected to the oscilloscope or the spectrum analyzer; The mechanical control system includes a multi-axis turntable and a motion axis group. The multi-axis turntable and the motion axis group are connected to the control system. The multi-axis turntable is used to place the satellite to be tested, and the motion axis group is used to place the multi-feed group. The control system controls the motion axis group to independently adjust the attitude of each transmitting feed and receiving feed in the multi-feed group.

2. The satellite payload communication test platform according to claim 1, characterized in that: The test system equipment also includes a signal adapter board, the switch matrix is ​​connected to the first signal conditioning module via the signal adapter board, and the receiving feed source is connected to the switch matrix via the signal adapter board.

3. The satellite payload communication test platform according to claim 2, characterized in that: The second signal conditioning module, switch matrix, signal adapter board, and test instrument are replaced and work outside the darkroom.

4. A satellite payload communication test chamber, used to place the platform according to any one of claims 1-2, characterized in that: The darkroom comprises a shielding shell, on which a wave-absorbing material is arranged; a workbench, a satellite control cabinet and an equipment control cabinet are arranged in the shielding shell; The workbench is used to place the control system; The satellite control cabinet is used to place the control equipment of the satellite to be tested, and the control equipment is connected with the control system and the satellite to be tested; The equipment control cabinet is used to place mechanical control systems, test system equipment and test instruments.

5. The satellite payload communication test chamber according to claim 4, characterized in that: The shielding shell is provided with a shielding door, a ventilation waveguide window, a maintenance passage, and a fan, and a wave absorbing walkway is also provided inside the shielding shell.

6. A satellite payload communication test method, implemented based on the platform described in any one of claims 1-2, and the platform works in the darkroom described in any one of claims 4-5, characterized in that: The test method is a two-way communication test, and the execution subject is the control system, which includes the following sub-steps: Determine whether it is forward communication; If it is forward communication, switch the connection state of the switch matrix path so that the signal source is connected to the QV transmitting feed link, and the spectrum analyzer or oscilloscope is connected to the KU receiving feed link. At this time, the signal source outputs the RF signal, which is transmitted to the QV transmitting feed after signal conditioning, and then radiated to the QV antenna of the satellite to be tested. The satellite to be tested forwards the RF signal received by the QV antenna, and radiates it through the KU antenna after signal conditioning. The KU receiving feed receives the RF signal radiated by the satellite to be tested, performs signal conditioning, and then outputs it to the spectrum analyzer or oscilloscope for data analysis and processing. If it is reverse communication, switch the connection state of the switch matrix path to connect the signal source to the KU transmitting feed link and the spectrum analyzer or oscilloscope to the QV receiving feed link. At this time, the signal source outputs the RF signal, which is transmitted to the QV transmitting feed after signal conditioning, and then radiated to the KU antenna of the satellite to be tested. The satellite to be tested will forward the RF signal received by the KU antenna, and radiate it through the QV antenna after signal conditioning. The QV receiving feed receives the RF signal radiated by the satellite to be tested, performs signal conditioning, and then outputs it to the spectrum analyzer or oscilloscope for data analysis and processing.

7. The satellite payload communication test method according to claim 6, characterized in that: Performing multi-beam testing based on two-way communication testing includes the following steps: The control system selects the corresponding feed source according to the beam angle of the test configuration; The control system calculates the test position and test angle of each feed source based on the feed source position, the position of the satellite to be tested, the angle of the multi-axis turntable, and the beam pointing; The control system controls each feed source and multi-axis turntable to move to the corresponding position and test angle; The control system controls the corresponding transmitting and receiving feed source links to conduct forward or reverse communication tests; The satellite to be tested performs cyclic switching or radiates multi-beam signals simultaneously according to the beam angle configured for the test, and the time synchronizer synchronizes the switching beam time of the satellite to be tested when performing cyclic switching; The control system controls the different transmitting and receiving feed source links of the switch matrix beam cutting test, and controls the multi-axis turntable and motion axis group to adjust the posture for the next round of forward or reverse communication test.

8. The satellite payload communication test method according to claim 7, characterized in that: A measured antenna in the measured satellite corresponds to the first feed, the second feed, the third feed and the fourth feed. The second feed has the same X-axis coordinate as the first feed, but a different Y-axis coordinate. The third feed has the same Y-axis coordinate as the first feed, but a different X-axis coordinate. The fourth feed has different X-axis and Y-axis coordinates from the first feed. The coordinates of the first feed, the second feed, the third feed, the fourth feed and the measured antenna are A(X A ,Y A ,Z A )、B(X B ,Y B ,Z B )、C(X C ,Y C ,Z C )、D(X D ,Y D ,Z D )、E(X 天线 ,Y 天线 ,Z 天线 ), the calculation expression of the first feed source test position is: X-axis movement displacement 运动 =X A -X 天线 *COSθ, θ is the test angle of the multi-axis turntable; Y axis motion displacement Y 运动 =0; The calculation expression of the second feed source test position is: X-axis movement displacement 运动 =X B -X 天线 +(X 天线 -X 天线 *COS(-θ))–TAN(90–ATAN(D / (X B -X 天线 )))*(DX 天线 *SIN(-θ)), D is the darkroom test distance; Y axis motion displacement Y 运动 =0; The calculation expression of the third feed source test position is: X-axis movement displacement 运动 =X C -X C *COSθ; Y-axis motion displacement Y 运动 =(D+X 天线* SIN(θ))*(Y C -Y 天线 ) / DY C +Y 天线 ; The calculation expression of the fourth feed source test position is: X-axis movement displacement 运动 =X D -X 天线 +(X 天线 -X 天线 *COS(-θ))–TAN(90–ATAN(D / (X D -X 天线 )))*(DX 天线 *SIN(-θ)); Y axis motion displacement Y 运动 =(D+X 天线* SIN(θ))*(Y D -Y 天线 ) / D–Y D +Y 天线 .

9. The satellite payload communication test method according to claim 8, characterized in that: The calculation expression of the first feed source test angle is: Feed azimuth = 0; Feed elevation = 0; Test off-axis angle = ABS (θ); Test rotation angle = 180; The calculation expression of the second feed source test angle is: Feed azimuth = 0-ATAN(D / (X B -X 天线 )); Feed pitch angle = 0; Test off-axis angle = θ–90 + ATAN (D / (X B -X 天线 )); Test rotation angle = 0; The calculation expression of the third feed test angle is: Feed azimuth = 0; feed elevation = ATAN((Y C -Y 天线 ) / D); test off-axis angle = ACOS(COS(ATAN((Y C -Y 天线 ) / D))*COS(θ)); Test rotation angle = 180+(ATAN(((D-SIN(θ)*X 天线 )*(Y C -Y 天线 ) / D) / (SIN(θ)*(D-SIN(θ)*X 天线 ))); The calculation expression of the fourth feed test angle is: Feed azimuth = 0-ATAN(D / (X D -X 天线 )); Feed source elevation angle = ATAN((Y D -Y 天线 ) / SQRT((X D -X 天线 ) 2 +D 2 )); Test off-axis angle = ACOS(COS((θ-(90-ATAN(D / (X D -X 天线 )))))*COS(ATAN((Y D -Y 天线 ) / SQRT((X D -X 天线 ) 2 +D 2 )))); Test rotation angle = 180 + ACOS (TAN ((θ-(90-ATAN (D / (X D -X 天线 ))))) / TAN((ACOS(COS((θ-(90-ATAN(D / (X D -X 天线 )))))*COS(ATAN((X D -X 天线 ) / SQRT((X D -X 天线 ) 2 +D 2 )))))))).

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